ATE404992T1 - Herstellungsmethode von öffnungen mit hohem aspektverhältnis - Google Patents

Herstellungsmethode von öffnungen mit hohem aspektverhältnis

Info

Publication number
ATE404992T1
ATE404992T1 AT99921465T AT99921465T ATE404992T1 AT E404992 T1 ATE404992 T1 AT E404992T1 AT 99921465 T AT99921465 T AT 99921465T AT 99921465 T AT99921465 T AT 99921465T AT E404992 T1 ATE404992 T1 AT E404992T1
Authority
AT
Austria
Prior art keywords
sccm
production method
aspect ratio
high aspect
ratio openings
Prior art date
Application number
AT99921465T
Other languages
English (en)
Inventor
Kevin Donohoe
David Becker
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE404992T1 publication Critical patent/ATE404992T1/de

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • H10P50/283—

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
AT99921465T 1998-04-24 1999-04-23 Herstellungsmethode von öffnungen mit hohem aspektverhältnis ATE404992T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US8290898P 1998-04-24 1998-04-24
US09/099,090 US6123862A (en) 1998-04-24 1998-06-17 Method of forming high aspect ratio apertures

Publications (1)

Publication Number Publication Date
ATE404992T1 true ATE404992T1 (de) 2008-08-15

Family

ID=26767985

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99921465T ATE404992T1 (de) 1998-04-24 1999-04-23 Herstellungsmethode von öffnungen mit hohem aspektverhältnis

Country Status (8)

Country Link
US (5) US6123862A (de)
EP (1) EP1090413B1 (de)
JP (1) JP2002517895A (de)
KR (1) KR100388570B1 (de)
AT (1) ATE404992T1 (de)
AU (1) AU3866999A (de)
DE (1) DE69939318D1 (de)
WO (1) WO1999056305A2 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6123862A (en) 1998-04-24 2000-09-26 Micron Technology, Inc. Method of forming high aspect ratio apertures
US6635335B1 (en) 1999-06-29 2003-10-21 Micron Technology, Inc. Etching methods and apparatus and substrate assemblies produced therewith
JP3485504B2 (ja) * 1999-09-09 2004-01-13 沖電気工業株式会社 半導体装置のドライエッチング方法
US8048806B2 (en) * 2000-03-17 2011-11-01 Applied Materials, Inc. Methods to avoid unstable plasma states during a process transition
US20070048882A1 (en) * 2000-03-17 2007-03-01 Applied Materials, Inc. Method to reduce plasma-induced charging damage
US8617351B2 (en) 2002-07-09 2013-12-31 Applied Materials, Inc. Plasma reactor with minimal D.C. coils for cusp, solenoid and mirror fields for plasma uniformity and device damage reduction
TW552669B (en) * 2000-06-19 2003-09-11 Infineon Technologies Corp Process for etching polysilicon gate stacks with raised shallow trench isolation structures
US6407002B1 (en) * 2000-08-10 2002-06-18 Taiwan Semiconductor Manufacturing Company Partial resist free approach in contact etch to improve W-filling
WO2002021586A1 (en) * 2000-09-07 2002-03-14 Daikin Industries, Ltd. Dry etching gas and method for dry etching
US6610608B1 (en) * 2001-03-16 2003-08-26 Advanced Micro Devices, Inc. Plasma etching using combination of CHF3 and CH3F
US6921725B2 (en) 2001-06-28 2005-07-26 Micron Technology, Inc. Etching of high aspect ratio structures
US6727183B1 (en) 2001-07-27 2004-04-27 Taiwan Semiconductor Manufacturing Company Prevention of spiking in ultra low dielectric constant material
US6451647B1 (en) 2002-03-18 2002-09-17 Advanced Micro Devices, Inc. Integrated plasma etch of gate and gate dielectric and low power plasma post gate etch removal of high-K residual
TWI283899B (en) * 2002-07-09 2007-07-11 Applied Materials Inc Capacitively coupled plasma reactor with magnetic plasma control
US20040018741A1 (en) * 2002-07-26 2004-01-29 Applied Materials, Inc. Method For Enhancing Critical Dimension Uniformity After Etch
US7713431B2 (en) * 2004-06-10 2010-05-11 Tokyo Electron Limited Plasma processing method
US20060118519A1 (en) * 2004-12-03 2006-06-08 Applied Materials Inc. Dielectric etch method with high source and low bombardment plasma providing high etch rates
KR100801308B1 (ko) * 2005-11-12 2008-02-11 주식회사 하이닉스반도체 고선택비 하드마스크를 이용한 트렌치 형성 방법 및 그를이용한 반도체소자의 소자분리 방법
US7749400B2 (en) * 2005-12-16 2010-07-06 Jason Plumhoff Method for etching photolithographic substrates
US20080119055A1 (en) * 2006-11-21 2008-05-22 Lam Research Corporation Reducing twisting in ultra-high aspect ratio dielectric etch
US8614151B2 (en) * 2008-01-04 2013-12-24 Micron Technology, Inc. Method of etching a high aspect ratio contact
JP2009193988A (ja) * 2008-02-12 2009-08-27 Tokyo Electron Ltd プラズマエッチング方法及びコンピュータ記憶媒体
US8563095B2 (en) * 2010-03-15 2013-10-22 Applied Materials, Inc. Silicon nitride passivation layer for covering high aspect ratio features
US9487600B2 (en) 2010-08-17 2016-11-08 Uchicago Argonne, Llc Ordered nanoscale domains by infiltration of block copolymers
US9684234B2 (en) 2011-03-24 2017-06-20 Uchicago Argonne, Llc Sequential infiltration synthesis for enhancing multiple-patterning lithography
US8980418B2 (en) * 2011-03-24 2015-03-17 Uchicago Argonne, Llc Sequential infiltration synthesis for advanced lithography
KR102554014B1 (ko) 2018-06-15 2023-07-11 삼성전자주식회사 저온 식각 방법 및 플라즈마 식각 장치
US12104249B2 (en) 2019-07-18 2024-10-01 Uchicago Argonne, Llc Sequential infiltration synthesis of group 13 oxide electronic materials
JP7308876B2 (ja) * 2021-05-07 2023-07-14 東京エレクトロン株式会社 基板処理方法および基板処理装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5556501A (en) * 1989-10-03 1996-09-17 Applied Materials, Inc. Silicon scavenger in an inductively coupled RF plasma reactor
US6165311A (en) 1991-06-27 2000-12-26 Applied Materials, Inc. Inductively coupled RF plasma reactor having an overhead solenoidal antenna
US5198725A (en) * 1991-07-12 1993-03-30 Lam Research Corporation Method of producing flat ecr layer in microwave plasma device and apparatus therefor
US5658425A (en) * 1991-10-16 1997-08-19 Lam Research Corporation Method of etching contact openings with reduced removal rate of underlying electrically conductive titanium silicide layer
US5423945A (en) * 1992-09-08 1995-06-13 Applied Materials, Inc. Selectivity for etching an oxide over a nitride
US5286344A (en) * 1992-06-15 1994-02-15 Micron Technology, Inc. Process for selectively etching a layer of silicon dioxide on an underlying stop layer of silicon nitride
JPH07147273A (ja) 1993-11-24 1995-06-06 Tokyo Electron Ltd エッチング処理方法
JPH07263415A (ja) * 1994-03-18 1995-10-13 Fujitsu Ltd 半導体装置の製造方法
JPH0950986A (ja) * 1995-05-29 1997-02-18 Sony Corp 接続孔の形成方法
US5731565A (en) * 1995-07-27 1998-03-24 Lam Research Corporation Segmented coil for generating plasma in plasma processing equipment
US5626716A (en) * 1995-09-29 1997-05-06 Lam Research Corporation Plasma etching of semiconductors
EP0777267A1 (de) * 1995-11-28 1997-06-04 Applied Materials, Inc. Verfahren zum Ätzen von Oxid mit hoher Selektivität für Nitrid, geeignet für Oberflächen mit unebener Topographie
JP3700231B2 (ja) 1996-01-25 2005-09-28 ソニー株式会社 接続孔の形成方法
US5880005A (en) * 1997-10-23 1999-03-09 Taiwan Semiconductor Manufacturing Company, Ltd. Method for forming a tapered profile insulator shape
US5965035A (en) * 1997-10-23 1999-10-12 Applied Materials, Inc. Self aligned contact etch using difluoromethane and trifluoromethane
US6095159A (en) 1998-01-22 2000-08-01 Micron Technology, Inc. Method of modifying an RF circuit of a plasma chamber to increase chamber life and process capabilities
US5998931A (en) 1998-02-09 1999-12-07 Micron Technology, Inc. Method and apparatus for controlling electrostatic coupling to plasmas
US6516742B1 (en) 1998-02-26 2003-02-11 Micron Technology, Inc. Apparatus for improved low pressure inductively coupled high density plasma reactor
US6123862A (en) * 1998-04-24 2000-09-26 Micron Technology, Inc. Method of forming high aspect ratio apertures
JP3485504B2 (ja) * 1999-09-09 2004-01-13 沖電気工業株式会社 半導体装置のドライエッチング方法

Also Published As

Publication number Publication date
US7608196B2 (en) 2009-10-27
US7163641B2 (en) 2007-01-16
US6342165B1 (en) 2002-01-29
US6123862A (en) 2000-09-26
US20020084256A1 (en) 2002-07-04
EP1090413B1 (de) 2008-08-13
US20030192858A1 (en) 2003-10-16
AU3866999A (en) 1999-11-16
KR20010042983A (ko) 2001-05-25
EP1090413A1 (de) 2001-04-11
EP1090413A4 (de) 2006-07-26
WO1999056305A3 (en) 2001-09-20
US6610212B2 (en) 2003-08-26
JP2002517895A (ja) 2002-06-18
US20070084826A1 (en) 2007-04-19
KR100388570B1 (ko) 2003-06-25
WO1999056305A2 (en) 1999-11-04
DE69939318D1 (de) 2008-09-25

Similar Documents

Publication Publication Date Title
ATE404992T1 (de) Herstellungsmethode von öffnungen mit hohem aspektverhältnis
KR100361399B1 (ko) 기판의이방성플라즈마에칭방법및그방법에의해제조되는전자부품
KR100465947B1 (ko) 불화 가스 및 산소를 함유한 가스 혼합물을 사용하는텅스텐의 플라즈마 공정
WO2002080230A3 (en) Method of plasma etching low-k organosilicate materials
WO1999036931A3 (en) Low ceiling temperature process for a plasma reactor with heated source of a polymer-hardening precursor material
TW473864B (en) Sidewall polymer forming gas additives for etching processes
EP0159621A3 (de) Konisch verlaufendes Trockenätzungsverfahren
KR940022724A (ko) 드라이에칭방법
TW200503055A (en) Method for forming pattern and drop discharge apparatus
WO1999009587A3 (en) Method of etching copper for semiconductor devices
TW345682B (en) Method for etching polycide structures
WO2004109772A3 (en) Method and system for etching a high-k dielectric material
KR950703074A (ko) 박막형성방법
WO2003030238A1 (en) Processing method
DK1268622T3 (da) Fremgangsmåde til overfladebehandling af polymersubstrater
WO2002019408A3 (en) Method of etching carbon-containing silicon oxide films
KR960035858A (ko) 실리콘에 테이퍼진 개구부를 형성하기 위한 방법
KR970065771A (ko) 금속막의 에칭방법
JPS6415933A (en) Etching
TW363220B (en) Etching organic antireflective coating from a substrate
MY136313A (en) Process to fabricate an integrated micro-fluidic system on a single wafer
WO2005062885A3 (en) Selectivity control in a plasma processing system
WO2005011011A8 (en) Etching method for making chalcogenide memory elements
TW374203B (en) A method for forming a fine contact hole in a semiconductor device
KR970023712A (ko) 반도체장치의 폴리사이드 게이트 형성방법

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties