ATE400405T1 - Verfahren zur herstellung eines schleifgegenstands - Google Patents
Verfahren zur herstellung eines schleifgegenstandsInfo
- Publication number
- ATE400405T1 ATE400405T1 AT06000630T AT06000630T ATE400405T1 AT E400405 T1 ATE400405 T1 AT E400405T1 AT 06000630 T AT06000630 T AT 06000630T AT 06000630 T AT06000630 T AT 06000630T AT E400405 T1 ATE400405 T1 AT E400405T1
- Authority
- AT
- Austria
- Prior art keywords
- producing
- backing
- coating composition
- grinding article
- abrasive coating
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
- B24D11/005—Making abrasive webs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/205—Lapping pads for working plane surfaces provided with a window for inspecting the surface of the work being lapped
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/726,064 US20020072296A1 (en) | 2000-11-29 | 2000-11-29 | Abrasive article having a window system for polishing wafers, and methods |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE400405T1 true ATE400405T1 (de) | 2008-07-15 |
Family
ID=24917074
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT06000630T ATE400405T1 (de) | 2000-11-29 | 2001-04-11 | Verfahren zur herstellung eines schleifgegenstands |
| AT01926874T ATE320881T1 (de) | 2000-11-29 | 2001-04-11 | Schleifmittel mit einem fenstersystem zum polieren von wafern und verfahren hierfür |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT01926874T ATE320881T1 (de) | 2000-11-29 | 2001-04-11 | Schleifmittel mit einem fenstersystem zum polieren von wafern und verfahren hierfür |
Country Status (13)
| Country | Link |
|---|---|
| US (3) | US20020072296A1 (de) |
| EP (2) | EP1337380B1 (de) |
| JP (1) | JP2004516947A (de) |
| KR (1) | KR100711160B1 (de) |
| CN (1) | CN1238161C (de) |
| AT (2) | ATE400405T1 (de) |
| AU (1) | AU2001253382A1 (de) |
| CA (1) | CA2430377A1 (de) |
| DE (2) | DE60118171T2 (de) |
| IL (1) | IL155856A0 (de) |
| MY (1) | MY126929A (de) |
| TW (1) | TW564202B (de) |
| WO (1) | WO2002043925A1 (de) |
Families Citing this family (70)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6179709B1 (en) * | 1999-02-04 | 2001-01-30 | Applied Materials, Inc. | In-situ monitoring of linear substrate polishing operations |
| US7824244B2 (en) * | 2007-05-30 | 2010-11-02 | Corning Incorporated | Methods and apparatus for polishing a semiconductor wafer |
| US6609950B2 (en) * | 2000-07-05 | 2003-08-26 | Ebara Corporation | Method for polishing a substrate |
| US7070480B2 (en) * | 2001-10-11 | 2006-07-04 | Applied Materials, Inc. | Method and apparatus for polishing substrates |
| US6702866B2 (en) * | 2002-01-10 | 2004-03-09 | Speedfam-Ipec Corporation | Homogeneous fixed abrasive polishing pad |
| US7267607B2 (en) * | 2002-10-28 | 2007-09-11 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| US7435165B2 (en) | 2002-10-28 | 2008-10-14 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| US7311862B2 (en) * | 2002-10-28 | 2007-12-25 | Cabot Microelectronics Corporation | Method for manufacturing microporous CMP materials having controlled pore size |
| US6960120B2 (en) | 2003-02-10 | 2005-11-01 | Cabot Microelectronics Corporation | CMP pad with composite transparent window |
| US6832947B2 (en) * | 2003-02-10 | 2004-12-21 | Cabot Microelectronics Corporation | CMP pad with composite transparent window |
| US7704125B2 (en) | 2003-03-24 | 2010-04-27 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US9278424B2 (en) | 2003-03-25 | 2016-03-08 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US8864859B2 (en) | 2003-03-25 | 2014-10-21 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US7160178B2 (en) * | 2003-08-07 | 2007-01-09 | 3M Innovative Properties Company | In situ activation of a three-dimensional fixed abrasive article |
| US20050054277A1 (en) * | 2003-09-04 | 2005-03-10 | Teng-Chun Tsai | Polishing pad and method of polishing wafer |
| DE10346254A1 (de) * | 2003-09-25 | 2005-05-12 | Supfina Grieshaber Gmbh & Co | Verfahren zur Bearbeitung von Werkstückoberflächen |
| JP2005150235A (ja) | 2003-11-12 | 2005-06-09 | Three M Innovative Properties Co | 半導体表面保護シート及び方法 |
| JP4646526B2 (ja) * | 2004-02-18 | 2011-03-09 | 株式会社日立製作所 | 記憶制御システム及び同システムの制御方法 |
| US6951509B1 (en) * | 2004-03-09 | 2005-10-04 | 3M Innovative Properties Company | Undulated pad conditioner and method of using same |
| US20060025046A1 (en) * | 2004-07-28 | 2006-02-02 | 3M Innovative Properties Company | Abrasive article splicing system and methods |
| US7090560B2 (en) * | 2004-07-28 | 2006-08-15 | 3M Innovative Properties Company | System and method for detecting abrasive article orientation |
| US20060025048A1 (en) * | 2004-07-28 | 2006-02-02 | 3M Innovative Properties Company | Abrasive article detection system and method |
| US20060025047A1 (en) * | 2004-07-28 | 2006-02-02 | 3M Innovative Properties Company | Grading system and method for abrasive article |
| US8075372B2 (en) * | 2004-09-01 | 2011-12-13 | Cabot Microelectronics Corporation | Polishing pad with microporous regions |
| TWI385050B (zh) * | 2005-02-18 | 2013-02-11 | Nexplanar Corp | 用於cmp之特製拋光墊及其製造方法及其用途 |
| US7179159B2 (en) * | 2005-05-02 | 2007-02-20 | Applied Materials, Inc. | Materials for chemical mechanical polishing |
| US20070197147A1 (en) * | 2006-02-15 | 2007-08-23 | Applied Materials, Inc. | Polishing system with spiral-grooved subpad |
| US7410413B2 (en) * | 2006-04-27 | 2008-08-12 | 3M Innovative Properties Company | Structured abrasive article and method of making and using the same |
| US20080014532A1 (en) * | 2006-07-14 | 2008-01-17 | 3M Innovative Properties Company | Laminate body, and method for manufacturing thin substrate using the laminate body |
| JP4941735B2 (ja) * | 2007-03-30 | 2012-05-30 | 東洋ゴム工業株式会社 | 研磨パッドの製造方法 |
| JP4888905B2 (ja) * | 2007-03-30 | 2012-02-29 | 東洋ゴム工業株式会社 | 研磨パッドの製造方法 |
| JP5004701B2 (ja) * | 2007-07-11 | 2012-08-22 | 株式会社荏原製作所 | 研磨装置 |
| US20090017248A1 (en) * | 2007-07-13 | 2009-01-15 | 3M Innovative Properties Company | Layered body and method for manufacturing thin substrate using the layered body |
| US20090017323A1 (en) * | 2007-07-13 | 2009-01-15 | 3M Innovative Properties Company | Layered body and method for manufacturing thin substrate using the layered body |
| US8357286B1 (en) | 2007-10-29 | 2013-01-22 | Semcon Tech, Llc | Versatile workpiece refining |
| WO2009070352A1 (en) * | 2007-11-30 | 2009-06-04 | Innopad, Inc. | Chemical-mechanical planarization pad having end point detection window |
| US7967661B2 (en) * | 2008-06-19 | 2011-06-28 | Micron Technology, Inc. | Systems and pads for planarizing microelectronic workpieces and associated methods of use and manufacture |
| WO2009158665A1 (en) | 2008-06-26 | 2009-12-30 | 3M Innovative Properties Company | Polishing pad with porous elements and method of making and using the same |
| JP5809053B2 (ja) * | 2008-07-03 | 2015-11-10 | スリーエム イノベイティブ プロパティズ カンパニー | 固定研磨粒子及びそれから作製される物品 |
| KR20110033277A (ko) * | 2008-07-18 | 2011-03-30 | 쓰리엠 이노베이티브 프로퍼티즈 캄파니 | 플로팅 요소를 구비한 연마 패드 및 이 연마 패드의 제작 방법과 이용 방법 |
| EP2147745A1 (de) * | 2008-07-25 | 2010-01-27 | Supfina Grieshaber GmbH & Co. KG | Superfinishmaschine mit Schleifband und Verfahren zum Betrieben einer Superfinishmaschine |
| EP2327088B1 (de) | 2008-08-28 | 2019-01-09 | 3M Innovative Properties Company | Strukturierter schleifartikel, herstellungsverfahren dafür und verwendung in der waferplanarisierung |
| US20100112919A1 (en) * | 2008-11-03 | 2010-05-06 | Applied Materials, Inc. | Monolithic linear polishing sheet |
| JP5680621B2 (ja) * | 2009-04-17 | 2015-03-04 | スリーエム イノベイティブ プロパティズ カンパニー | 転写物品を使用して作製される平面状の研磨物品及びその作製方法 |
| CN102148178A (zh) * | 2009-12-16 | 2011-08-10 | 第一毛织株式会社 | 电路小片粘性膜、卷筒、安装设备和电子产品 |
| CN102686362A (zh) | 2009-12-30 | 2012-09-19 | 3M创新有限公司 | 包括分相共混聚合物的抛光垫及其制备和使用方法 |
| US9017140B2 (en) | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
| US8647171B2 (en) * | 2010-03-12 | 2014-02-11 | Wayne O. Duescher | Fixed-spindle floating-platen workpiece loader apparatus |
| US8758088B2 (en) | 2011-10-06 | 2014-06-24 | Wayne O. Duescher | Floating abrading platen configuration |
| US8602842B2 (en) * | 2010-03-12 | 2013-12-10 | Wayne O. Duescher | Three-point fixed-spindle floating-platen abrasive system |
| US8647172B2 (en) | 2010-03-12 | 2014-02-11 | Wayne O. Duescher | Wafer pads for fixed-spindle floating-platen lapping |
| US8500515B2 (en) * | 2010-03-12 | 2013-08-06 | Wayne O. Duescher | Fixed-spindle and floating-platen abrasive system using spherical mounts |
| US8740668B2 (en) * | 2010-03-12 | 2014-06-03 | Wayne O. Duescher | Three-point spindle-supported floating abrasive platen |
| US8647170B2 (en) | 2011-10-06 | 2014-02-11 | Wayne O. Duescher | Laser alignment apparatus for rotary spindles |
| US8641476B2 (en) | 2011-10-06 | 2014-02-04 | Wayne O. Duescher | Coplanar alignment apparatus for rotary spindles |
| US8696405B2 (en) | 2010-03-12 | 2014-04-15 | Wayne O. Duescher | Pivot-balanced floating platen lapping machine |
| US8360823B2 (en) * | 2010-06-15 | 2013-01-29 | 3M Innovative Properties Company | Splicing technique for fixed abrasives used in chemical mechanical planarization |
| US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| US8337280B2 (en) | 2010-09-14 | 2012-12-25 | Duescher Wayne O | High speed platen abrading wire-driven rotary workholder |
| US8758659B2 (en) | 2010-09-29 | 2014-06-24 | Fns Tech Co., Ltd. | Method of grooving a chemical-mechanical planarization pad |
| US8430717B2 (en) | 2010-10-12 | 2013-04-30 | Wayne O. Duescher | Dynamic action abrasive lapping workholder |
| BR112013021631B1 (pt) * | 2011-02-24 | 2020-12-08 | 3M Innovative Properties Company | artigo abrasivo revestido e suporte de espuma de poliuretano |
| CN102689270B (zh) * | 2011-03-22 | 2015-04-01 | 中芯国际集成电路制造(上海)有限公司 | 固结磨料抛光垫及其制备方法 |
| JP6432497B2 (ja) * | 2015-12-10 | 2018-12-05 | 信越半導体株式会社 | 研磨方法 |
| JP6920849B2 (ja) * | 2017-03-27 | 2021-08-18 | 株式会社荏原製作所 | 基板処理方法および装置 |
| WO2019022961A1 (en) * | 2017-07-28 | 2019-01-31 | Applied Materials, Inc. | METHOD FOR IDENTIFYING AND MONITORING ROLLER ROLL POLISHING PAD MATERIALS DURING PROCESSING |
| JP7186770B2 (ja) | 2017-10-04 | 2022-12-09 | サンーゴバン アブレイシブズ,インコーポレイティド | 研磨用物品およびその形成方法 |
| US11331767B2 (en) | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
| AU2020253350A1 (en) | 2019-03-29 | 2021-10-28 | Saint-Gobain Abrasives, Inc. | Performance grinding solutions |
| BR112021019766A2 (pt) | 2019-04-03 | 2021-12-07 | Saint Gobain Abrasifs Sa | Artigo abrasivo, sistema abrasivo e método para uso e formação dos mesmos |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03234467A (ja) * | 1990-02-05 | 1991-10-18 | Canon Inc | スタンパの金型取付面の研磨方法およびその研磨機 |
| US5380390B1 (en) * | 1991-06-10 | 1996-10-01 | Ultimate Abras Systems Inc | Patterned abrasive material and method |
| US5437754A (en) * | 1992-01-13 | 1995-08-01 | Minnesota Mining And Manufacturing Company | Abrasive article having precise lateral spacing between abrasive composite members |
| US5219462A (en) * | 1992-01-13 | 1993-06-15 | Minnesota Mining And Manufacturing Company | Abrasive article having abrasive composite members positioned in recesses |
| US5499733A (en) | 1992-09-17 | 1996-03-19 | Luxtron Corporation | Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
| US5658183A (en) | 1993-08-25 | 1997-08-19 | Micron Technology, Inc. | System for real-time control of semiconductor wafer polishing including optical monitoring |
| US5433651A (en) | 1993-12-22 | 1995-07-18 | International Business Machines Corporation | In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
| US5607345A (en) * | 1994-01-13 | 1997-03-04 | Minnesota Mining And Manufacturing Company | Abrading apparatus |
| JP3270282B2 (ja) * | 1994-02-21 | 2002-04-02 | 株式会社東芝 | 半導体製造装置及び半導体装置の製造方法 |
| DE69635816T2 (de) * | 1995-03-28 | 2006-10-12 | Applied Materials, Inc., Santa Clara | Verfahren zum Herstellen einer Vorrichtung zur In-Situ-Kontrolle und Bestimmung des Endes von chemisch-mechanischen Planiervorgängen |
| US5964643A (en) | 1995-03-28 | 1999-10-12 | Applied Materials, Inc. | Apparatus and method for in-situ monitoring of chemical mechanical polishing operations |
| US5893796A (en) * | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| US5605760A (en) | 1995-08-21 | 1997-02-25 | Rodel, Inc. | Polishing pads |
| US6074287A (en) * | 1996-04-12 | 2000-06-13 | Nikon Corporation | Semiconductor wafer polishing apparatus |
| KR100494605B1 (ko) * | 1997-03-07 | 2005-06-10 | 미네소타 마이닝 앤드 매뉴팩춰링 캄파니 | 유리상에 투명한 표면 마무리 상태를 제공하기 위한 연마용품 |
| DE19720623C1 (de) | 1997-05-16 | 1998-11-05 | Siemens Ag | Poliervorrichtung und Poliertuch |
| US6111634A (en) | 1997-05-28 | 2000-08-29 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing |
| US6108091A (en) | 1997-05-28 | 2000-08-22 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing |
| US6146248A (en) | 1997-05-28 | 2000-11-14 | Lam Research Corporation | Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher |
| US5985679A (en) | 1997-06-12 | 1999-11-16 | Lsi Logic Corporation | Automated endpoint detection system during chemical-mechanical polishing |
| TW374050B (en) | 1997-10-31 | 1999-11-11 | Applied Materials Inc | Method and apparatus for modeling substrate reflectivity during chemical mechanical polishing |
| TW421620B (en) | 1997-12-03 | 2001-02-11 | Siemens Ag | Device and method to control an end-point during polish of components (especially semiconductor components) |
| US6068539A (en) | 1998-03-10 | 2000-05-30 | Lam Research Corporation | Wafer polishing device with movable window |
| US5897426A (en) * | 1998-04-24 | 1999-04-27 | Applied Materials, Inc. | Chemical mechanical polishing with multiple polishing pads |
| EP1025955B1 (de) * | 1999-02-04 | 2005-04-13 | Applied Materials, Inc. | Chemisch-mechanisches Polieren mit einem bewegenden Poliertuch |
| JP2000271854A (ja) * | 1999-03-25 | 2000-10-03 | Hitachi Ltd | 加工方法及びその装置並びに半導体基板の加工方法 |
-
2000
- 2000-11-29 US US09/726,064 patent/US20020072296A1/en not_active Abandoned
-
2001
- 2001-04-11 WO PCT/US2001/011841 patent/WO2002043925A1/en not_active Ceased
- 2001-04-11 AU AU2001253382A patent/AU2001253382A1/en not_active Abandoned
- 2001-04-11 DE DE60118171T patent/DE60118171T2/de not_active Expired - Lifetime
- 2001-04-11 KR KR1020037007133A patent/KR100711160B1/ko not_active Expired - Fee Related
- 2001-04-11 EP EP01926874A patent/EP1337380B1/de not_active Expired - Lifetime
- 2001-04-11 IL IL15585601A patent/IL155856A0/xx unknown
- 2001-04-11 AT AT06000630T patent/ATE400405T1/de not_active IP Right Cessation
- 2001-04-11 AT AT01926874T patent/ATE320881T1/de not_active IP Right Cessation
- 2001-04-11 JP JP2002545888A patent/JP2004516947A/ja active Pending
- 2001-04-11 DE DE60134797T patent/DE60134797D1/de not_active Expired - Lifetime
- 2001-04-11 CN CNB018195334A patent/CN1238161C/zh not_active Expired - Fee Related
- 2001-04-11 EP EP06000630A patent/EP1655103B1/de not_active Expired - Lifetime
- 2001-04-11 CA CA002430377A patent/CA2430377A1/en not_active Abandoned
- 2001-11-21 MY MYPI20015332A patent/MY126929A/en unknown
- 2001-11-28 TW TW090129432A patent/TW564202B/zh not_active IP Right Cessation
-
2002
- 2002-09-24 US US10/253,559 patent/US6786810B2/en not_active Expired - Lifetime
- 2002-11-07 US US10/289,750 patent/US6604985B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| MY126929A (en) | 2006-10-31 |
| EP1337380A1 (de) | 2003-08-27 |
| US20030022598A1 (en) | 2003-01-30 |
| WO2002043925A1 (en) | 2002-06-06 |
| EP1655103B1 (de) | 2008-07-09 |
| DE60134797D1 (de) | 2008-08-21 |
| EP1337380B1 (de) | 2006-03-22 |
| IL155856A0 (en) | 2003-12-23 |
| DE60118171D1 (de) | 2006-05-11 |
| US6604985B2 (en) | 2003-08-12 |
| CN1476368A (zh) | 2004-02-18 |
| KR100711160B1 (ko) | 2007-05-16 |
| TW564202B (en) | 2003-12-01 |
| ATE320881T1 (de) | 2006-04-15 |
| US6786810B2 (en) | 2004-09-07 |
| US20020072296A1 (en) | 2002-06-13 |
| CA2430377A1 (en) | 2002-06-06 |
| US20030064663A1 (en) | 2003-04-03 |
| JP2004516947A (ja) | 2004-06-10 |
| CN1238161C (zh) | 2006-01-25 |
| AU2001253382A1 (en) | 2002-06-11 |
| DE60118171T2 (de) | 2007-01-25 |
| KR20030048484A (ko) | 2003-06-19 |
| EP1655103A1 (de) | 2006-05-10 |
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