ATE370264T1 - Verfahren zur herstellung von substraten, insbesondere für die optik, elektronik und optoelektronik - Google Patents
Verfahren zur herstellung von substraten, insbesondere für die optik, elektronik und optoelektronikInfo
- Publication number
- ATE370264T1 ATE370264T1 AT03763891T AT03763891T ATE370264T1 AT E370264 T1 ATE370264 T1 AT E370264T1 AT 03763891 T AT03763891 T AT 03763891T AT 03763891 T AT03763891 T AT 03763891T AT E370264 T1 ATE370264 T1 AT E370264T1
- Authority
- AT
- Austria
- Prior art keywords
- ingot
- support
- front face
- optoelectronics
- optics
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/36—Carbides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Chemically Coating (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0209021A FR2842650B1 (fr) | 2002-07-17 | 2002-07-17 | Procede de fabrication de substrats notamment pour l'optique, l'electronique ou l'opto-electronique |
US46150403P | 2003-04-09 | 2003-04-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE370264T1 true ATE370264T1 (de) | 2007-09-15 |
Family
ID=30117030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT03763891T ATE370264T1 (de) | 2002-07-17 | 2003-07-16 | Verfahren zur herstellung von substraten, insbesondere für die optik, elektronik und optoelektronik |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1537258B9 (de) |
JP (1) | JP4708185B2 (de) |
AT (1) | ATE370264T1 (de) |
AU (1) | AU2003246718A1 (de) |
DE (1) | DE60315670T2 (de) |
TW (1) | TWI273659B (de) |
WO (1) | WO2004007816A1 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1962340A3 (de) * | 2004-11-09 | 2009-12-23 | S.O.I. TEC Silicon | Verfahren zur Herstellung von zusammengesetzten Wafern |
DE102006061167A1 (de) | 2006-04-25 | 2007-12-20 | Osram Opto Semiconductors Gmbh | Optoelektronisches Halbleiterbauelement |
FR2906077B1 (fr) * | 2006-09-18 | 2009-03-06 | Michel Roche | Procede et appareillages associes, destine a la fabrication de substrats semiconducteurs poly ou monocristallins minces |
WO2009092926A1 (fr) * | 2008-01-21 | 2009-07-30 | Michel Roche | Procédé et appareillages associés, destiné à la fabrication de substrats semiconducteurs, poly ou monocristallins minces |
EP2123721B1 (de) | 2008-04-15 | 2013-11-27 | Eckart GmbH | Perlglanzpigmente auf Basis von feinen und dünnen Substraten |
EP2177215A1 (de) | 2008-10-17 | 2010-04-21 | Laboratorios Del. Dr. Esteve, S.A. | Co-Kristalle von Tramadol und NSARs |
DE102009031266A1 (de) | 2009-06-30 | 2011-01-13 | Eckart Gmbh | Tintenstrahltinte enthaltend Perlglanzpigmente auf Basis von feinen und dünnen Substraten |
KR102323184B1 (ko) * | 2019-10-22 | 2021-11-09 | 주식회사 쎄닉 | 적층체, 잉곳의 제조방법 및 웨이퍼의 제조방법 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02102514A (ja) * | 1988-10-12 | 1990-04-16 | Hitachi Ltd | 半導体基板の製造方法 |
FR2681472B1 (fr) * | 1991-09-18 | 1993-10-29 | Commissariat Energie Atomique | Procede de fabrication de films minces de materiau semiconducteur. |
JP2903916B2 (ja) * | 1992-11-30 | 1999-06-14 | 信越半導体株式会社 | 半導体インゴット加工方法 |
JPH1093122A (ja) * | 1996-09-10 | 1998-04-10 | Nippon Telegr & Teleph Corp <Ntt> | 薄膜太陽電池の製造方法 |
US5877070A (en) * | 1997-05-31 | 1999-03-02 | Max-Planck Society | Method for the transfer of thin layers of monocrystalline material to a desirable substrate |
JP4075021B2 (ja) * | 1997-12-26 | 2008-04-16 | ソニー株式会社 | 半導体基板の製造方法および薄膜半導体部材の製造方法 |
FR2774510B1 (fr) * | 1998-02-02 | 2001-10-26 | Soitec Silicon On Insulator | Procede de traitement de substrats, notamment semi-conducteurs |
US6503321B2 (en) * | 1998-02-17 | 2003-01-07 | The Trustees Of Columbia University In The City Of New York | Slicing of single-crystal films using ion implantation |
US6120597A (en) * | 1998-02-17 | 2000-09-19 | The Trustees Of Columbia University In The City Of New York | Crystal ion-slicing of single-crystal films |
JP3932369B2 (ja) * | 1998-04-09 | 2007-06-20 | 信越半導体株式会社 | 剥離ウエーハを再利用する方法および再利用に供されるシリコンウエーハ |
EP1158581B1 (de) * | 1999-10-14 | 2016-04-27 | Shin-Etsu Handotai Co., Ltd. | Soi-scheibenherstellung undsoi-scheibe |
FR2807074B1 (fr) * | 2000-04-03 | 2002-12-06 | Soitec Silicon On Insulator | Procede et dispositif de fabrication de substrats |
JP2002043552A (ja) * | 2000-07-27 | 2002-02-08 | Toshiba Ceramics Co Ltd | ウェーハの製造方法 |
JP2002141327A (ja) * | 2000-10-31 | 2002-05-17 | Canon Inc | 結晶薄膜の製造方法 |
-
2003
- 2003-07-16 EP EP03763891A patent/EP1537258B9/de not_active Expired - Lifetime
- 2003-07-16 TW TW092119455A patent/TWI273659B/zh not_active IP Right Cessation
- 2003-07-16 JP JP2005505073A patent/JP4708185B2/ja not_active Expired - Lifetime
- 2003-07-16 WO PCT/EP2003/007854 patent/WO2004007816A1/en active IP Right Grant
- 2003-07-16 DE DE60315670T patent/DE60315670T2/de not_active Expired - Lifetime
- 2003-07-16 AU AU2003246718A patent/AU2003246718A1/en not_active Abandoned
- 2003-07-16 AT AT03763891T patent/ATE370264T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE60315670T2 (de) | 2008-06-05 |
WO2004007816A1 (en) | 2004-01-22 |
JP2005533396A (ja) | 2005-11-04 |
TW200409247A (en) | 2004-06-01 |
DE60315670D1 (de) | 2007-09-27 |
AU2003246718A1 (en) | 2004-02-02 |
EP1537258A1 (de) | 2005-06-08 |
EP1537258B1 (de) | 2007-08-15 |
JP4708185B2 (ja) | 2011-06-22 |
TWI273659B (en) | 2007-02-11 |
EP1537258B9 (de) | 2008-10-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |