ATE366641T1 - Prozesssteuerung beim elektrochemischen mechanischen polieren - Google Patents

Prozesssteuerung beim elektrochemischen mechanischen polieren

Info

Publication number
ATE366641T1
ATE366641T1 AT03703929T AT03703929T ATE366641T1 AT E366641 T1 ATE366641 T1 AT E366641T1 AT 03703929 T AT03703929 T AT 03703929T AT 03703929 T AT03703929 T AT 03703929T AT E366641 T1 ATE366641 T1 AT E366641T1
Authority
AT
Austria
Prior art keywords
processing
electrochemically
exposed layer
process control
mechanical polishing
Prior art date
Application number
AT03703929T
Other languages
English (en)
Inventor
Alain Duboust
Yan Wang
Siew Neo
Liang-Yuh Chen
Antoine Manens
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of ATE366641T1 publication Critical patent/ATE366641T1/de

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • B24B37/013Devices or means for detecting lapping completion
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23HWORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H5/00Combined machining
    • B23H5/06Electrochemical machining combined with mechanical working, e.g. grinding or honing
    • B23H5/08Electrolytic grinding
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/02Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
    • B24B49/04Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/10Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Weting (AREA)
AT03703929T 2002-01-22 2003-01-21 Prozesssteuerung beim elektrochemischen mechanischen polieren ATE366641T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/056,316 US6837983B2 (en) 2002-01-22 2002-01-22 Endpoint detection for electro chemical mechanical polishing and electropolishing processes

Publications (1)

Publication Number Publication Date
ATE366641T1 true ATE366641T1 (de) 2007-08-15

Family

ID=22003599

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03703929T ATE366641T1 (de) 2002-01-22 2003-01-21 Prozesssteuerung beim elektrochemischen mechanischen polieren

Country Status (9)

Country Link
US (2) US6837983B2 (de)
EP (1) EP1467840B1 (de)
JP (2) JP2005516383A (de)
KR (1) KR101011095B1 (de)
CN (2) CN100425404C (de)
AT (1) ATE366641T1 (de)
DE (1) DE60314841T2 (de)
TW (1) TWI278378B (de)
WO (1) WO2003061905A1 (de)

Families Citing this family (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6848970B2 (en) 2002-09-16 2005-02-01 Applied Materials, Inc. Process control in electrochemically assisted planarization
US7077721B2 (en) * 2000-02-17 2006-07-18 Applied Materials, Inc. Pad assembly for electrochemical mechanical processing
US6991526B2 (en) 2002-09-16 2006-01-31 Applied Materials, Inc. Control of removal profile in electrochemically assisted CMP
JP2002046024A (ja) * 2000-08-04 2002-02-12 Sony Corp 電解研磨装置、電解研磨方法および被研磨ウエハ
US7129160B2 (en) * 2002-08-29 2006-10-31 Micron Technology, Inc. Method for simultaneously removing multiple conductive materials from microelectronic substrates
US6896776B2 (en) * 2000-12-18 2005-05-24 Applied Materials Inc. Method and apparatus for electro-chemical processing
US6899804B2 (en) * 2001-04-10 2005-05-31 Applied Materials, Inc. Electrolyte composition and treatment for electrolytic chemical mechanical polishing
US20060169597A1 (en) * 2001-03-14 2006-08-03 Applied Materials, Inc. Method and composition for polishing a substrate
US7582564B2 (en) * 2001-03-14 2009-09-01 Applied Materials, Inc. Process and composition for conductive material removal by electrochemical mechanical polishing
US7128825B2 (en) * 2001-03-14 2006-10-31 Applied Materials, Inc. Method and composition for polishing a substrate
US7323416B2 (en) * 2001-03-14 2008-01-29 Applied Materials, Inc. Method and composition for polishing a substrate
JP3807295B2 (ja) * 2001-11-30 2006-08-09 ソニー株式会社 研磨方法
US6837983B2 (en) * 2002-01-22 2005-01-04 Applied Materials, Inc. Endpoint detection for electro chemical mechanical polishing and electropolishing processes
US6752916B1 (en) * 2002-02-01 2004-06-22 Lsi Logic Corporation Electrochemical planarization end point detection
US7112270B2 (en) 2002-09-16 2006-09-26 Applied Materials, Inc. Algorithm for real-time process control of electro-polishing
US20050061674A1 (en) * 2002-09-16 2005-03-24 Yan Wang Endpoint compensation in electroprocessing
WO2004041467A1 (ja) * 2002-11-08 2004-05-21 Ebara Corporation 電解加工装置及び電解加工方法
US7084466B1 (en) * 2002-12-09 2006-08-01 Novellus Systems, Inc. Liquid detection end effector sensor and method of using the same
US7842169B2 (en) 2003-03-04 2010-11-30 Applied Materials, Inc. Method and apparatus for local polishing control
JP2004327561A (ja) * 2003-04-22 2004-11-18 Ebara Corp 基板処理方法及び基板処理装置
US7390429B2 (en) * 2003-06-06 2008-06-24 Applied Materials, Inc. Method and composition for electrochemical mechanical polishing processing
US20050121141A1 (en) * 2003-11-13 2005-06-09 Manens Antoine P. Real time process control for a polishing process
TWI392003B (zh) * 2003-11-26 2013-04-01 Acm研究股份有限公司 監視金屬層的電解拋光製程的方法與系統、電解拋光形成在晶圓上的金屬層之系統與其監視方法與系統
US20060021974A1 (en) * 2004-01-29 2006-02-02 Applied Materials, Inc. Method and composition for polishing a substrate
US7153777B2 (en) * 2004-02-20 2006-12-26 Micron Technology, Inc. Methods and apparatuses for electrochemical-mechanical polishing
JP2005340600A (ja) * 2004-05-28 2005-12-08 Renesas Technology Corp 研磨装置及び半導体装置の製造方法
US7084064B2 (en) 2004-09-14 2006-08-01 Applied Materials, Inc. Full sequence metal and barrier layer electrochemical mechanical processing
KR100905561B1 (ko) * 2004-09-14 2009-07-02 어플라이드 머티어리얼스, 인코포레이티드 금속 및 배리어 층의 전기화학적 기계적 프로세싱 공정
US7655565B2 (en) 2005-01-26 2010-02-02 Applied Materials, Inc. Electroprocessing profile control
US20060219663A1 (en) * 2005-03-31 2006-10-05 Applied Materials, Inc. Metal CMP process on one or more polishing stations using slurries with oxidizers
US20060249395A1 (en) * 2005-05-05 2006-11-09 Applied Material, Inc. Process and composition for electrochemical mechanical polishing
US20060249394A1 (en) * 2005-05-05 2006-11-09 Applied Materials, Inc. Process and composition for electrochemical mechanical polishing
US7416648B2 (en) * 2005-05-12 2008-08-26 Taiwan Semiconductor Manufacturing Company, Ltd. Image sensor system for monitoring condition of electrode for electrochemical process tools
US20080029400A1 (en) * 2005-05-13 2008-02-07 Stephen Mazur Selective electroplating onto recessed surfaces
US20070034526A1 (en) * 2005-08-12 2007-02-15 Natsuki Makino Electrolytic processing apparatus and method
US20070108066A1 (en) * 2005-10-28 2007-05-17 Applied Materials, Inc. Voltage mode current control
US20070096315A1 (en) * 2005-11-01 2007-05-03 Applied Materials, Inc. Ball contact cover for copper loss reduction and spike reduction
US20070158201A1 (en) * 2006-01-06 2007-07-12 Applied Materials, Inc. Electrochemical processing with dynamic process control
US20070243709A1 (en) * 2006-04-14 2007-10-18 Applied Materials, Inc. Planarization of substrates at a high polishing rate using electrochemical mechanical polishing
US20070254485A1 (en) * 2006-04-28 2007-11-01 Daxin Mao Abrasive composition for electrochemical mechanical polishing
US20080067077A1 (en) * 2006-09-04 2008-03-20 Akira Kodera Electrolytic liquid for electrolytic polishing and electrolytic polishing method
US20080277787A1 (en) * 2007-05-09 2008-11-13 Liu Feng Q Method and pad design for the removal of barrier material by electrochemical mechanical processing
KR101016237B1 (ko) * 2008-07-03 2011-02-25 홍익대학교 산학협력단 전해연마의 종료시점 결정방법
DE102009046750B4 (de) * 2008-12-31 2019-02-14 Globalfoundries Dresden Module One Limited Liability Company & Co. Kg Elektrochemisches Einebnungssystem mit verbesserter Elektrolytströmung
EP2719800B1 (de) * 2011-06-09 2018-03-21 Tokyo Stainless Grinding Co., Ltd. Verfahren zur stahlherstellung
CN103389428B (zh) * 2013-07-31 2016-03-23 杭州士兰微电子股份有限公司 微机电工艺监控结构和监控方法
CN104440513A (zh) * 2013-09-22 2015-03-25 盛美半导体设备(上海)有限公司 硅片加工装置及方法
JP6228613B2 (ja) * 2013-12-25 2017-11-08 株式会社日立製作所 ナノポア形成方法、ナノポア形成装置及びセット
US9676075B2 (en) 2015-06-12 2017-06-13 Globalfoundries Inc. Methods and structures for achieving target resistance post CMP using in-situ resistance measurements
SG11201803236VA (en) * 2015-10-30 2018-05-30 Acm Research Shanghai Inc Method for electrochemical polish in constant voltage mode
JP6774244B2 (ja) * 2016-07-22 2020-10-21 株式会社ディスコ 研削装置
CN109641342A (zh) * 2016-08-31 2019-04-16 应用材料公司 具有环形工作台或抛光垫的抛光系统
US10682738B2 (en) * 2017-09-29 2020-06-16 Uchicago Argonne, Llc Channel cut polishing machine
CN108550515B (zh) * 2018-04-11 2019-11-08 江阴市光科光电精密设备有限公司 离子注入工艺腔体的研磨工艺
CN108608314B (zh) * 2018-06-08 2019-10-11 大连理工大学 一种用于双面电化学机械抛光平面构件的设备及方法
US11491611B2 (en) * 2018-08-14 2022-11-08 Illinois Tool Works Inc. Splash guards for grinder/polisher machines and grinder/polisher machines having splash guards
US10800004B2 (en) * 2018-09-28 2020-10-13 Taiwan Semiconductor Manufacturing Company, Ltd. System and method of chemical mechanical polishing
CN110257895B (zh) * 2019-06-24 2021-03-23 江苏守航实业有限公司 一种半导体材料的电解抛光方法及装置
CN110465842B (zh) * 2019-08-09 2020-06-23 湖北华宁防腐技术股份有限公司 一种用于防腐胶板生产线的打磨装置及其使用方法
CN113399766B (zh) * 2021-06-02 2022-06-14 贵州大学 一种高速钢轧辊材质电解磨削所用电解液的试验方法
JP7812623B2 (ja) * 2021-08-18 2026-02-10 住友化学株式会社 導電性半導体基板の製造方法および研磨方法
TWI867477B (zh) * 2022-06-22 2024-12-21 美商應用材料股份有限公司 用於控制研磨處理的方法與電腦可讀取媒體
US12576475B2 (en) 2023-04-25 2026-03-17 Applied Materials, Inc. Determining the orientation of a substrate in-situ

Family Cites Families (110)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3162588A (en) 1961-04-17 1964-12-22 Hammond Machinery Builders Inc Belt type electrolytic grinding machine
US3448023A (en) 1966-01-20 1969-06-03 Hammond Machinery Builders Inc Belt type electro-chemical (or electrolytic) grinding machine
US3873512A (en) 1973-04-30 1975-03-25 Martin Marietta Corp Machining method
GB1539309A (en) 1976-12-14 1979-01-31 Inoue Japax Res Electrochemical polishing
JPS62127492A (ja) 1985-11-26 1987-06-09 Shigeo Hoshino カ−ボン繊維を用いる電気めつきの方法
US4839993A (en) 1986-01-28 1989-06-20 Fujisu Limited Polishing machine for ferrule of optical fiber connector
US4793895A (en) 1988-01-25 1988-12-27 Ibm Corporation In situ conductivity monitoring technique for chemical/mechanical planarization endpoint detection
JPH01193166A (ja) 1988-01-28 1989-08-03 Showa Denko Kk 半導体ウェハ鏡面研磨用パッド
US4934102A (en) 1988-10-04 1990-06-19 International Business Machines Corporation System for mechanical planarization
CH678156A5 (de) 1989-03-20 1991-08-15 Exnii Metallorezh Stankov
US5136817A (en) 1990-02-28 1992-08-11 Nihon Dempa Kogyo Co., Ltd. Automatic lapping apparatus for piezoelectric materials
US5081421A (en) 1990-05-01 1992-01-14 At&T Bell Laboratories In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection
US5096550A (en) 1990-10-15 1992-03-17 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for spatially uniform electropolishing and electrolytic etching
US5217586A (en) 1992-01-09 1993-06-08 International Business Machines Corporation Electrochemical tool for uniform metal removal during electropolishing
US5225034A (en) 1992-06-04 1993-07-06 Micron Technology, Inc. Method of chemical mechanical polishing predominantly copper containing metal layers in semiconductor processing
MY114512A (en) 1992-08-19 2002-11-30 Rodel Inc Polymeric substrate with polymeric microelements
US5562529A (en) 1992-10-08 1996-10-08 Fujitsu Limited Apparatus and method for uniformly polishing a wafer
US5461007A (en) * 1994-06-02 1995-10-24 Motorola, Inc. Process for polishing and analyzing a layer over a patterned semiconductor substrate
US5534106A (en) 1994-07-26 1996-07-09 Kabushiki Kaisha Toshiba Apparatus for processing semiconductor wafers
US5567300A (en) 1994-09-02 1996-10-22 Ibm Corporation Electrochemical metal removal technique for planarization of surfaces
US6017265A (en) 1995-06-07 2000-01-25 Rodel, Inc. Methods for using polishing pads
US5486282A (en) 1994-11-30 1996-01-23 Ibm Corporation Electroetching process for seed layer removal in electrochemical fabrication of wafers
US5893796A (en) 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
JPH08304010A (ja) * 1995-04-28 1996-11-22 Sony Corp デプスセンサー
US6024630A (en) 1995-06-09 2000-02-15 Applied Materials, Inc. Fluid-pressure regulated wafer polishing head
US5863412A (en) * 1995-10-17 1999-01-26 Canon Kabushiki Kaisha Etching method and process for producing a semiconductor element using said etching method
US5804507A (en) 1995-10-27 1998-09-08 Applied Materials, Inc. Radially oscillating carousel processing system for chemical mechanical polishing
US5738574A (en) 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
JPH09134904A (ja) * 1995-11-09 1997-05-20 Nissan Motor Co Ltd 半導体基板の研磨方法
US5575706A (en) 1996-01-11 1996-11-19 Taiwan Semiconductor Manufacturing Company Ltd. Chemical/mechanical planarization (CMP) apparatus and polish method
US5766446A (en) * 1996-03-05 1998-06-16 Candescent Technologies Corporation Electrochemical removal of material, particularly excess emitter material in electron-emitting device
US5871392A (en) 1996-06-13 1999-02-16 Micron Technology, Inc. Under-pad for chemical-mechanical planarization of semiconductor wafers
JP3354794B2 (ja) 1996-06-27 2002-12-09 東芝テック株式会社 記録ヘッドの駆動方法
US5846882A (en) 1996-10-03 1998-12-08 Applied Materials, Inc. Endpoint detector for a chemical mechanical polishing system
FR2758285B3 (fr) 1997-01-13 1998-12-04 Struers As Procede de fixation d'un agent abrasif ou de polissage, sous forme de feuille, sur un support magnetique
US6020264A (en) 1997-01-31 2000-02-01 International Business Machines Corporation Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing
US5938801A (en) 1997-02-12 1999-08-17 Micron Technology, Inc. Polishing pad and a method for making a polishing pad with covalently bonded particles
US5807165A (en) 1997-03-26 1998-09-15 International Business Machines Corporation Method of electrochemical mechanical planarization
US5911619A (en) 1997-03-26 1999-06-15 International Business Machines Corporation Apparatus for electrochemical mechanical planarization
US5990010A (en) 1997-04-08 1999-11-23 Lsi Logic Corporation Pre-conditioning polishing pads for chemical-mechanical polishing
WO1998049723A1 (en) 1997-04-30 1998-11-05 Minnesota Mining And Manufacturing Company Method of planarizing the upper surface of a semiconductor wafer
JPH10329007A (ja) 1997-05-28 1998-12-15 Sony Corp 化学的機械研磨装置
JPH1142554A (ja) 1997-07-25 1999-02-16 Nec Corp 研磨量制御装置
US5931719A (en) 1997-08-25 1999-08-03 Lsi Logic Corporation Method and apparatus for using pressure differentials through a polishing pad to improve performance in chemical mechanical polishing
US6103096A (en) 1997-11-12 2000-08-15 International Business Machines Corporation Apparatus and method for the electrochemical etching of a wafer
AU1468199A (en) 1997-11-25 1999-06-15 Johns Hopkins University, The Electrochemical-control of abrasive polishing and machining rates
US6153043A (en) 1998-02-06 2000-11-28 International Business Machines Corporation Elimination of photo-induced electrochemical dissolution in chemical mechanical polishing
AU2233399A (en) 1998-02-12 1999-08-30 Acm Research, Inc. Plating apparatus and method
US6004880A (en) 1998-02-20 1999-12-21 Lsi Logic Corporation Method of single step damascene process for deposition and global planarization
AU3553599A (en) 1998-04-13 1999-11-01 Acm Research, Inc. Method and apparatus for enhancing adhesion between barrier layer and metal layer formed by plating
JP3295888B2 (ja) 1998-04-22 2002-06-24 株式会社藤森技術研究所 ケミカルマシンポリッシャの研磨盤用研磨ドレッサ
US6210257B1 (en) 1998-05-29 2001-04-03 Micron Technology, Inc. Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
US6447668B1 (en) 1998-07-09 2002-09-10 Acm Research, Inc. Methods and apparatus for end-point detection
US6395152B1 (en) * 1998-07-09 2002-05-28 Acm Research, Inc. Methods and apparatus for electropolishing metal interconnections on semiconductor devices
US6159079A (en) 1998-09-08 2000-12-12 Applied Materials, Inc. Carrier head for chemical mechanical polishing a substrate
US6248222B1 (en) 1998-09-08 2001-06-19 Acm Research, Inc. Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces
US6176992B1 (en) 1998-11-03 2001-01-23 Nutool, Inc. Method and apparatus for electro-chemical mechanical deposition
JP2000141215A (ja) 1998-11-05 2000-05-23 Sony Corp 平坦化研磨装置及び平坦化研磨方法
US6541381B2 (en) 1998-11-06 2003-04-01 Beaver Creek Concepts Inc Finishing method for semiconductor wafers using a lubricating boundary layer
US6726823B1 (en) 1998-11-28 2004-04-27 Acm Research, Inc. Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces
WO2000033356A2 (en) 1998-11-28 2000-06-08 Acm Research, Inc Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces
US6328872B1 (en) 1999-04-03 2001-12-11 Nutool, Inc. Method and apparatus for plating and polishing a semiconductor substrate
US6409904B1 (en) 1998-12-01 2002-06-25 Nutool, Inc. Method and apparatus for depositing and controlling the texture of a thin film
US6251235B1 (en) 1999-03-30 2001-06-26 Nutool, Inc. Apparatus for forming an electrical contact with a semiconductor substrate
US6413388B1 (en) 2000-02-23 2002-07-02 Nutool Inc. Pad designs and structures for a versatile materials processing apparatus
US6497800B1 (en) 2000-03-17 2002-12-24 Nutool Inc. Device providing electrical contact to the surface of a semiconductor workpiece during metal plating
JP3047904B1 (ja) 1999-02-03 2000-06-05 日本電気株式会社 研磨装置
US6244935B1 (en) 1999-02-04 2001-06-12 Applied Materials, Inc. Apparatus and methods for chemical mechanical polishing with an advanceable polishing sheet
US6066030A (en) 1999-03-04 2000-05-23 International Business Machines Corporation Electroetch and chemical mechanical polishing equipment
JP3777495B2 (ja) * 1999-03-31 2006-05-24 株式会社荏原製作所 ポリッシング方法及び装置
US6217426B1 (en) 1999-04-06 2001-04-17 Applied Materials, Inc. CMP polishing pad
US6238271B1 (en) 1999-04-30 2001-05-29 Speed Fam-Ipec Corp. Methods and apparatus for improved polishing of workpieces
US20020077037A1 (en) 1999-05-03 2002-06-20 Tietz James V. Fixed abrasive articles
US6156124A (en) 1999-06-18 2000-12-05 Applied Materials, Inc. Wafer transfer station for a chemical mechanical polisher
US6224460B1 (en) * 1999-06-30 2001-05-01 Vlsi Technology, Inc. Laser interferometry endpoint detection with windowless polishing pad for chemical mechanical polishing process
US6381169B1 (en) 1999-07-01 2002-04-30 The Regents Of The University Of California High density non-volatile memory device
US6297159B1 (en) 1999-07-07 2001-10-02 Advanced Micro Devices, Inc. Method and apparatus for chemical polishing using field responsive materials
US6234870B1 (en) 1999-08-24 2001-05-22 International Business Machines Corporation Serial intelligent electro-chemical-mechanical wafer processor
US6406363B1 (en) 1999-08-31 2002-06-18 Lam Research Corporation Unsupported chemical mechanical polishing belt
JP4513145B2 (ja) * 1999-09-07 2010-07-28 ソニー株式会社 半導体装置の製造方法および研磨方法
US6159075A (en) * 1999-10-13 2000-12-12 Vlsi Technology, Inc. Method and system for in-situ optimization for semiconductor wafers in a chemical mechanical polishing process
US6379223B1 (en) * 1999-11-29 2002-04-30 Applied Materials, Inc. Method and apparatus for electrochemical-mechanical planarization
US6368184B1 (en) 2000-01-06 2002-04-09 Advanced Micro Devices, Inc. Apparatus for determining metal CMP endpoint using integrated polishing pad electrodes
US6630059B1 (en) 2000-01-14 2003-10-07 Nutool, Inc. Workpeice proximity plating apparatus
US6368190B1 (en) * 2000-01-26 2002-04-09 Agere Systems Guardian Corp. Electrochemical mechanical planarization apparatus and method
US7066800B2 (en) 2000-02-17 2006-06-27 Applied Materials Inc. Conductive polishing article for electrochemical mechanical polishing
US20030213703A1 (en) 2002-05-16 2003-11-20 Applied Materials, Inc. Method and apparatus for substrate polishing
US6991528B2 (en) * 2000-02-17 2006-01-31 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7374644B2 (en) * 2000-02-17 2008-05-20 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
JP2001244223A (ja) 2000-02-29 2001-09-07 Hitachi Chem Co Ltd 研磨パッド
JP2001326204A (ja) * 2000-03-09 2001-11-22 Sony Corp 半導体装置の製造方法および研磨方法
US6797623B2 (en) 2000-03-09 2004-09-28 Sony Corporation Methods of producing and polishing semiconductor device and polishing apparatus
US6482307B2 (en) 2000-05-12 2002-11-19 Nutool, Inc. Method of and apparatus for making electrical contact to wafer surface for full-face electroplating or electropolishing
JP2001269862A (ja) 2000-03-27 2001-10-02 Toshiba Corp 研磨パッド、研磨装置及び研磨方法
US6402591B1 (en) 2000-03-31 2002-06-11 Lam Research Corporation Planarization system for chemical-mechanical polishing
US7112121B2 (en) 2000-08-30 2006-09-26 Micron Technology, Inc. Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
US7160176B2 (en) 2000-08-30 2007-01-09 Micron Technology, Inc. Methods and apparatus for electrically and/or chemically-mechanically removing conductive material from a microelectronic substrate
WO2002023616A1 (en) 2000-09-18 2002-03-21 Acm Research, Inc. Integrating metal with ultra low-k dielectrics
JP2002093761A (ja) 2000-09-19 2002-03-29 Sony Corp 研磨方法、研磨装置、メッキ方法およびメッキ装置
US6736952B2 (en) 2001-02-12 2004-05-18 Speedfam-Ipec Corporation Method and apparatus for electrochemical planarization of a workpiece
US6899804B2 (en) 2001-04-10 2005-05-31 Applied Materials, Inc. Electrolyte composition and treatment for electrolytic chemical mechanical polishing
US6811680B2 (en) 2001-03-14 2004-11-02 Applied Materials Inc. Planarization of substrates using electrochemical mechanical polishing
US6638863B2 (en) 2001-04-24 2003-10-28 Acm Research, Inc. Electropolishing metal layers on wafers having trenches or vias with dummy structures
EP1399956A2 (de) 2001-06-21 2004-03-24 Micron Technology, Inc. Methoden und vorrichtung zur elektrisch-, mechanisch- und/oder chemischen entfernung eines leitenden materials von einem mikroelektronischen substrat
JP2003029038A (ja) 2001-07-17 2003-01-29 Nitto Denko Corp 光学フィルム、偏光板及び表示装置
US6776693B2 (en) 2001-12-19 2004-08-17 Applied Materials Inc. Method and apparatus for face-up substrate polishing
US6837983B2 (en) * 2002-01-22 2005-01-04 Applied Materials, Inc. Endpoint detection for electro chemical mechanical polishing and electropolishing processes
US6866559B2 (en) * 2002-02-04 2005-03-15 Kla-Tencor Technologies Windows configurable to be coupled to a process tool or to be disposed within an opening in a polishing pad
JP4205914B2 (ja) * 2002-08-27 2009-01-07 株式会社ルネサステクノロジ 半導体装置の製造方法及び製造装置
US6739953B1 (en) * 2003-04-09 2004-05-25 Lsi Logic Corporation Mechanical stress free processing method

Also Published As

Publication number Publication date
US20030136684A1 (en) 2003-07-24
WO2003061905A1 (en) 2003-07-31
CN100425404C (zh) 2008-10-15
CN1652898A (zh) 2005-08-10
EP1467840B1 (de) 2007-07-11
JP2005516383A (ja) 2005-06-02
TWI278378B (en) 2007-04-11
DE60314841D1 (de) 2007-08-23
KR20040078131A (ko) 2004-09-08
US6837983B2 (en) 2005-01-04
EP1467840A1 (de) 2004-10-20
TW200302150A (en) 2003-08-01
KR101011095B1 (ko) 2011-01-25
JP2010147489A (ja) 2010-07-01
US20050077188A1 (en) 2005-04-14
CN101176988A (zh) 2008-05-14
DE60314841T2 (de) 2008-03-13

Similar Documents

Publication Publication Date Title
DE60314841D1 (de) Prozesssteuerung beim elektrochemischen mechanischen polieren
TW200610045A (en) Full sequence metal and barrier layer electrochemical mechanical processing
WO2002084714A3 (en) Method and apparatus for electrochemically depositing a material onto a workpiece surface
WO2003001581A3 (en) Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
DE69608579D1 (de) Elektrolytisches verfahren zur reinigung von elektrisch leitenden oberflächen
MY127655A (en) Process and apparatus for recovering of sealed type battery
AU2003263014A1 (en) Method for detecting electrical defects in membrane electrode assemblies
IL132165A (en) Article, method, and apparatus for electrochemical fabrication
ATE527015T1 (de) Verfahren zur akne- und rosaceabehandlung durch elektrochemische erzeugung von zinkionen
WO2003088316A3 (en) Electropolishing and electroplating methods
WO2003093524A3 (en) Apparatus and method for regulating the electrical power applied to a substrate during immersion
KR970063504A (ko) 반도체 장치 제조 방법 및 제조 장치
WO2001046497A3 (de) Verfahren zur elektrochemischen reduktion von reduzierbaren farbstoffen
EP1074515A3 (de) Elektrochemische Behandlung einer wässrigen Lösung
WO2004078411A3 (en) Method and apparatus for local polishing control
TW342522B (en) Contactless real-time in-situ monitoring of a chemical etching process
TW200707643A (en) Semiconductor device having through electrode and method of manufacturing the same
CA2405177A1 (en) Method of manufacturing a photovoltaic foil
AU2003249927A1 (en) Device and method for monitoring an electrolytic process
TW429592B (en) Manufacturing method for semiconductor device
AUPO671597A0 (en) Electrochemical regeneration of ion exchange resin
WO2003012417A3 (en) Voltammetric ion-selective biosensor
FR2898138B1 (fr) Procede de structuration electrochimique d'un materiau conducteur ou semi-conducteur, et dispositif de mise en oeuvre.
MXPA03000615A (es) Proceso y metodo para recuperacion de halogenos.
DK1480038T3 (da) Potentiometrisk, ionselectiv elektrode

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties