ATE294648T1 - Verfahren zur herstellung von submikron mustern auf filmen - Google Patents

Verfahren zur herstellung von submikron mustern auf filmen

Info

Publication number
ATE294648T1
ATE294648T1 AT00988323T AT00988323T ATE294648T1 AT E294648 T1 ATE294648 T1 AT E294648T1 AT 00988323 T AT00988323 T AT 00988323T AT 00988323 T AT00988323 T AT 00988323T AT E294648 T1 ATE294648 T1 AT E294648T1
Authority
AT
Austria
Prior art keywords
flowable medium
film
interface
flowable
producing submicron
Prior art date
Application number
AT00988323T
Other languages
English (en)
Inventor
Ullrich Steiner
Thomas Thurn-Albrecht
Erik Schaffer
Thomas P Russel
Jurgen Mylnek
Original Assignee
Univ Massachusetts
Univ Konstanz
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Massachusetts, Univ Konstanz filed Critical Univ Massachusetts
Application granted granted Critical
Publication of ATE294648T1 publication Critical patent/ATE294648T1/de

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/08Planarisation of organic insulating materials
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24479Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness
    • Y10T428/24521Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness with component conforming to contour of nonplanar surface

Landscapes

  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Formation Of Insulating Films (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Treatments Of Macromolecular Shaped Articles (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
AT00988323T 1999-12-23 2000-12-22 Verfahren zur herstellung von submikron mustern auf filmen ATE294648T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17300199P 1999-12-23 1999-12-23
PCT/US2000/035139 WO2001047003A2 (en) 1999-12-23 2000-12-22 Methods and apparatus for forming submicron patterns on films

Publications (1)

Publication Number Publication Date
ATE294648T1 true ATE294648T1 (de) 2005-05-15

Family

ID=22630090

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00988323T ATE294648T1 (de) 1999-12-23 2000-12-22 Verfahren zur herstellung von submikron mustern auf filmen

Country Status (9)

Country Link
US (2) US6391217B2 (de)
EP (1) EP1251974B1 (de)
JP (1) JP3774739B2 (de)
KR (1) KR100675074B1 (de)
AT (1) ATE294648T1 (de)
AU (1) AU779699B2 (de)
CA (1) CA2395760A1 (de)
DE (1) DE60019974T2 (de)
WO (1) WO2001047003A2 (de)

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US6391217B2 (en) 2002-05-21
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US20020170879A1 (en) 2002-11-21
CA2395760A1 (en) 2001-06-28
EP1251974A2 (de) 2002-10-30
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DE60019974T2 (de) 2005-11-10
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AU2454001A (en) 2001-07-03
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