ATE274693T1 - Eichvorrichtung für einen optischen scanner - Google Patents

Eichvorrichtung für einen optischen scanner

Info

Publication number
ATE274693T1
ATE274693T1 AT00911998T AT00911998T ATE274693T1 AT E274693 T1 ATE274693 T1 AT E274693T1 AT 00911998 T AT00911998 T AT 00911998T AT 00911998 T AT00911998 T AT 00911998T AT E274693 T1 ATE274693 T1 AT E274693T1
Authority
AT
Austria
Prior art keywords
detector
excitation beam
gain
power
settings
Prior art date
Application number
AT00911998T
Other languages
English (en)
Inventor
Mack Schermer
Hans Bengtsson
Marcus Weber
Original Assignee
Gen Scanning Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Scanning Inc filed Critical Gen Scanning Inc
Application granted granted Critical
Publication of ATE274693T1 publication Critical patent/ATE274693T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4785—Standardising light scatter apparatus; Standards therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
AT00911998T 1999-02-26 2000-02-25 Eichvorrichtung für einen optischen scanner ATE274693T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/258,872 US6075613A (en) 1999-02-26 1999-02-26 Optical scanner calibration device
PCT/US2000/004928 WO2000050875A1 (en) 1999-02-26 2000-02-25 Optical scanner calibration device

Publications (1)

Publication Number Publication Date
ATE274693T1 true ATE274693T1 (de) 2004-09-15

Family

ID=22982485

Family Applications (1)

Application Number Title Priority Date Filing Date
AT00911998T ATE274693T1 (de) 1999-02-26 2000-02-25 Eichvorrichtung für einen optischen scanner

Country Status (6)

Country Link
US (1) US6075613A (de)
EP (1) EP1155306B1 (de)
JP (1) JP2002538427A (de)
AT (1) ATE274693T1 (de)
DE (1) DE60013256T2 (de)
WO (1) WO2000050875A1 (de)

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US7684051B2 (en) * 2006-04-18 2010-03-23 Halliburton Energy Services, Inc. Fiber optic seismic sensor based on MEMS cantilever
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WO2015064436A1 (ja) * 2013-10-28 2015-05-07 富士フイルム株式会社 キャリブレーション方法及び内視鏡システム
US9739799B2 (en) * 2014-02-28 2017-08-22 Bruker Nano, Inc. Method and apparatus to compensate for deflection artifacts in an atomic force microscope
US10184835B2 (en) * 2015-09-23 2019-01-22 Agilent Technologies, Inc. High dynamic range infrared imaging spectroscopy
RU2687303C1 (ru) * 2018-09-28 2019-05-13 Федеральное государственное унитарное предприятие "ВСЕРОССИЙСКИЙ НАУЧНО-ИССЛЕДОВАТЕЛЬСКИЙ ИНСТИТУТ ОПТИКО-ФИЗИЧЕСКИХ ИЗМЕРЕНИЙ" (ФГУП "ВНИИОФИ") Способ калибровки/поверки средств измерения мощности лазерного излучения
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Also Published As

Publication number Publication date
DE60013256D1 (de) 2004-09-30
EP1155306A1 (de) 2001-11-21
JP2002538427A (ja) 2002-11-12
WO2000050875A1 (en) 2000-08-31
US6075613A (en) 2000-06-13
EP1155306B1 (de) 2004-08-25
DE60013256T2 (de) 2005-01-13

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