SE9601760D0 - Anordning för mätning av dubbelbrytning i en optisk databärare - Google Patents

Anordning för mätning av dubbelbrytning i en optisk databärare

Info

Publication number
SE9601760D0
SE9601760D0 SE9601760A SE9601760A SE9601760D0 SE 9601760 D0 SE9601760 D0 SE 9601760D0 SE 9601760 A SE9601760 A SE 9601760A SE 9601760 A SE9601760 A SE 9601760A SE 9601760 D0 SE9601760 D0 SE 9601760D0
Authority
SE
Sweden
Prior art keywords
data carrier
optical data
birefringence
calibration
photodetector
Prior art date
Application number
SE9601760A
Other languages
English (en)
Other versions
SE506286C2 (sv
SE9601760L (sv
Inventor
Haakan Bergstroem
Lars Joensson
Ulf Wilhelmson
Original Assignee
Audio Dev Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Audio Dev Ab filed Critical Audio Dev Ab
Priority to SE9601760A priority Critical patent/SE506286C2/sv
Publication of SE9601760D0 publication Critical patent/SE9601760D0/sv
Priority to KR1019980709015A priority patent/KR20000010871A/ko
Priority to JP09539845A priority patent/JP2000510235A/ja
Priority to PCT/SE1997/000746 priority patent/WO1997042491A1/en
Priority to EP97922268A priority patent/EP0897533A1/en
Priority to TW086106123A priority patent/TW351808B/zh
Publication of SE9601760L publication Critical patent/SE9601760L/sv
Publication of SE506286C2 publication Critical patent/SE506286C2/sv
Priority to US09/180,261 priority patent/US6023332A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SE9601760A 1996-05-09 1996-05-09 Anordning för mätning av dubbelbrytning i en optisk databärare SE506286C2 (sv)

Priority Applications (7)

Application Number Priority Date Filing Date Title
SE9601760A SE506286C2 (sv) 1996-05-09 1996-05-09 Anordning för mätning av dubbelbrytning i en optisk databärare
KR1019980709015A KR20000010871A (ko) 1996-05-09 1997-05-06 광 데이터 캐리어에서의 복굴절 측정 장치 및방법
JP09539845A JP2000510235A (ja) 1996-05-09 1997-05-06 光学データ媒体における複屈折を測定するための装置と方法
PCT/SE1997/000746 WO1997042491A1 (en) 1996-05-09 1997-05-06 Device and method for measuring birefringence in an optical data carrier
EP97922268A EP0897533A1 (en) 1996-05-09 1997-05-06 Device and method for measuring birefringence in an optical data carrier
TW086106123A TW351808B (en) 1996-05-09 1997-05-08 Duel refraction apparatus for measuring optical data carrier and its measuring method
US09/180,261 US6023332A (en) 1996-05-09 1999-01-14 Device and method for measuring birefringence in an optical data carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9601760A SE506286C2 (sv) 1996-05-09 1996-05-09 Anordning för mätning av dubbelbrytning i en optisk databärare

Publications (3)

Publication Number Publication Date
SE9601760D0 true SE9601760D0 (sv) 1996-05-09
SE9601760L SE9601760L (sv) 1997-11-10
SE506286C2 SE506286C2 (sv) 1997-12-01

Family

ID=20402504

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9601760A SE506286C2 (sv) 1996-05-09 1996-05-09 Anordning för mätning av dubbelbrytning i en optisk databärare

Country Status (7)

Country Link
US (1) US6023332A (sv)
EP (1) EP0897533A1 (sv)
JP (1) JP2000510235A (sv)
KR (1) KR20000010871A (sv)
SE (1) SE506286C2 (sv)
TW (1) TW351808B (sv)
WO (1) WO1997042491A1 (sv)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6473181B1 (en) 1997-07-28 2002-10-29 Hinds Instruments, Inc. Measurement of waveplate retardation using a photoelastic modulator
CA2319729A1 (en) 1998-02-20 1999-08-26 Hinds Instruments, Inc. Birefringence measurement system
US6697157B2 (en) * 1999-05-24 2004-02-24 Hinds Instruments Birefringence measurement
US6268914B1 (en) * 2000-01-14 2001-07-31 Hinds Instruments, Inc. Calibration Process For Birefringence Measurement System
AU2001238147A1 (en) * 2000-02-10 2001-08-20 The Regents Of The University Of California Method and apparatus for measuring birefringent particles
JP4249608B2 (ja) * 2001-06-18 2009-04-02 ハインズ インスツルメンツ インコーポレイテッド 深紫外波長での複屈折測定
EP1202039A1 (en) * 2001-07-27 2002-05-02 Agilent Technologies, Inc. (a Delaware corporation) Calibration and/or verification of a measurement setup
CN100541149C (zh) * 2001-10-16 2009-09-16 海因兹仪器公司 双折射测量系统的精度校准
JP3679774B2 (ja) * 2002-03-29 2005-08-03 キヤノン株式会社 複屈折測定装置及び方法
JP5880957B2 (ja) * 2012-04-11 2016-03-09 国立研究開発法人産業技術総合研究所 レーザー光により表面の変化を検出する装置
FR3067111B1 (fr) * 2017-05-31 2019-08-30 Saint-Gobain Glass France Dispositifs optiques pour l'analyse qualite d'un vitrage.

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5257092A (en) * 1990-06-27 1993-10-26 Asahi Kogaku Kogyo Kabushiki Kaisha Apparatus for measuring polarization and birefringence
JP3004036B2 (ja) * 1990-08-07 2000-01-31 旭光学工業株式会社 光ディスク装置のｆ／ｔクロストーク補正方法
US5227623A (en) * 1992-01-31 1993-07-13 Hewlett-Packard Company Method and apparatus for measuring polarization mode dispersion in optical devices
JPH06337243A (ja) * 1993-03-31 1994-12-06 New Oji Paper Co Ltd 光学的測定装置
DE4434473A1 (de) * 1994-09-27 1996-03-28 Basler Gmbh Verfahren und Vorrichtung zur Qualitätskontrolle von Gegenständen mit polarisiertem Licht
US5864403A (en) * 1998-02-23 1999-01-26 National Research Council Of Canada Method and apparatus for measurement of absolute biaxial birefringence in monolayer and multilayer films, sheets and shapes

Also Published As

Publication number Publication date
SE506286C2 (sv) 1997-12-01
EP0897533A1 (en) 1999-02-24
US6023332A (en) 2000-02-08
TW351808B (en) 1999-02-01
KR20000010871A (ko) 2000-02-25
WO1997042491A1 (en) 1997-11-13
JP2000510235A (ja) 2000-08-08
SE9601760L (sv) 1997-11-10

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