ATE222349T1 - Verbesserungen an oberflächenkrümmungsmessungen - Google Patents
Verbesserungen an oberflächenkrümmungsmessungenInfo
- Publication number
- ATE222349T1 ATE222349T1 AT96101238T AT96101238T ATE222349T1 AT E222349 T1 ATE222349 T1 AT E222349T1 AT 96101238 T AT96101238 T AT 96101238T AT 96101238 T AT96101238 T AT 96101238T AT E222349 T1 ATE222349 T1 AT E222349T1
- Authority
- AT
- Austria
- Prior art keywords
- beams
- curvage
- measurements
- curvature
- radius
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9502710.8A GB9502710D0 (en) | 1995-02-11 | 1995-02-11 | Improvements in or relating to surface curvature measurement |
| GB9524883A GB2297836B (en) | 1995-02-11 | 1995-12-05 | Improvements in or relating to surface curvature measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE222349T1 true ATE222349T1 (de) | 2002-08-15 |
Family
ID=26306488
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT96101238T ATE222349T1 (de) | 1995-02-11 | 1996-01-26 | Verbesserungen an oberflächenkrümmungsmessungen |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5633718A (de) |
| EP (1) | EP0726446B1 (de) |
| JP (1) | JP3294985B2 (de) |
| AT (1) | ATE222349T1 (de) |
| AU (1) | AU4225796A (de) |
| DE (1) | DE69622896T2 (de) |
| ES (1) | ES2181814T3 (de) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19851176B4 (de) * | 1998-11-06 | 2010-10-14 | Carl Zeiss Meditec Ag | Anordnung zur Bestimmung von Krümmungsradien |
| US6075604A (en) * | 1998-11-10 | 2000-06-13 | International Business Machines Corporation | Apparatus for measuring curvature of magnetic read/write head sliders |
| US6538817B1 (en) * | 1999-10-25 | 2003-03-25 | Aculight Corporation | Method and apparatus for optical coherence tomography with a multispectral laser source |
| KR100556612B1 (ko) * | 2002-06-29 | 2006-03-06 | 삼성전자주식회사 | 레이저를 이용한 위치 측정 장치 및 방법 |
| DE20306904U1 (de) * | 2003-05-02 | 2003-09-04 | Otto-von-Guericke-Universität Magdeburg, 39106 Magdeburg | Vorrichtung zur Messung der Schichtdicke und der Krümmung von mindestens teilweise reflektierenden Oberflächen von Schichten |
| DK1528411T3 (da) * | 2003-10-27 | 2010-05-17 | Bea Sa | Sensor til afstandsmåling |
| US7570368B2 (en) * | 2004-05-12 | 2009-08-04 | Veeco Instruments Inc. | Method and apparatus for measuring the curvature of reflective surfaces |
| FR2879736B1 (fr) * | 2004-12-20 | 2007-02-02 | Essilor Int | Procede et dispositif de mesure sans contact de la courbure d'un objet ophtalmique |
| JP5611168B2 (ja) * | 2011-10-24 | 2014-10-22 | 信越化学工業株式会社 | 光ファイバの曲率の測定方法 |
| JP6430307B2 (ja) * | 2014-03-27 | 2018-11-28 | 株式会社ニューフレアテクノロジー | 曲率測定装置及び曲率測定方法 |
| TWI506242B (zh) * | 2014-12-12 | 2015-11-01 | Ind Tech Res Inst | 薄膜曲率量測裝置及其方法 |
| TWI624643B (zh) * | 2016-08-19 | 2018-05-21 | 財團法人工業技術研究院 | 一種薄膜曲率量測裝置及其方法 |
| US20180059219A1 (en) * | 2016-08-31 | 2018-03-01 | Qualcomm Incorporated | Multi-beam position sensing devices |
| CN110709204B (zh) | 2017-03-29 | 2022-02-01 | 新泽西鲁特格斯州立大学 | 小样品曲率半径和热膨胀实时测量系统和方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4735508A (en) * | 1986-06-02 | 1988-04-05 | Honeywell Inc. | Method and apparatus for measuring a curvature of a reflective surface |
| US5067817A (en) * | 1990-02-08 | 1991-11-26 | Bauer Associates, Inc. | Method and device for noncontacting self-referencing measurement of surface curvature and profile |
| GB9205655D0 (en) | 1992-03-14 | 1992-04-29 | Roke Manor Research | Improvements in or relating to surface curvature measurement |
-
1996
- 1996-01-26 DE DE69622896T patent/DE69622896T2/de not_active Expired - Fee Related
- 1996-01-26 AT AT96101238T patent/ATE222349T1/de not_active IP Right Cessation
- 1996-01-26 EP EP96101238A patent/EP0726446B1/de not_active Expired - Lifetime
- 1996-01-26 ES ES96101238T patent/ES2181814T3/es not_active Expired - Lifetime
- 1996-01-30 AU AU42257/96A patent/AU4225796A/en not_active Abandoned
- 1996-02-05 US US08/597,085 patent/US5633718A/en not_active Expired - Fee Related
- 1996-02-09 JP JP02395396A patent/JP3294985B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP3294985B2 (ja) | 2002-06-24 |
| US5633718A (en) | 1997-05-27 |
| JPH08247741A (ja) | 1996-09-27 |
| EP0726446A2 (de) | 1996-08-14 |
| EP0726446A3 (de) | 1997-12-10 |
| DE69622896D1 (de) | 2002-09-19 |
| EP0726446B1 (de) | 2002-08-14 |
| AU4225796A (en) | 1996-08-22 |
| DE69622896T2 (de) | 2002-12-05 |
| ES2181814T3 (es) | 2003-03-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |