ES2077081T3 - Medicion de fase en microscopios opticos de exploracion. - Google Patents

Medicion de fase en microscopios opticos de exploracion.

Info

Publication number
ES2077081T3
ES2077081T3 ES90916789T ES90916789T ES2077081T3 ES 2077081 T3 ES2077081 T3 ES 2077081T3 ES 90916789 T ES90916789 T ES 90916789T ES 90916789 T ES90916789 T ES 90916789T ES 2077081 T3 ES2077081 T3 ES 2077081T3
Authority
ES
Spain
Prior art keywords
image
phase measurement
microscopes
optical scanning
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES90916789T
Other languages
English (en)
Inventor
John Graham Walker
Edward Roy Pike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Secretary of State for Defence
Original Assignee
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Secretary of State for Defence filed Critical UK Secretary of State for Defence
Application granted granted Critical
Publication of ES2077081T3 publication Critical patent/ES2077081T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46—Systems using spatial filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/50—Optics for phase object visualisation

Abstract

LA INVENCION PROPORCIONA UNA MEDICION DE FASE EN MICROSCOPIOS OPTICOS DE EXPLORACION DE TRANSMISION Y REFLEXION. EN ESTOS MICROSCOPIOS SE ENFOCA UN RAYO DE LASER PARALELO (1) EN UNA PEQUEÑA PARTE DE UN OBJETO (4). LA LUZ DESDE ESTA PEQUEÑA PARTE FORMA IMAGENES A TRAVES DE UN ORIFICIO DIMINUTO (8) A UN SOLO DETECTOR (10). LA IMAGEN SE CREA EXPLORANDO EL OBJETO Y GRABANDO LA SALIDA DESDE EL DETECTOR PARA CADA POSICION DEL OBJETO. EN ESTA INVENCION LA IMAGEN DE FASE SE RECUPERA POR UN PROCESADO SUBSECUENTE DE DOS O MAS IMAGENES DE AMPLITUD. UNA IMAGEN SE MIDE DE LA FORMA USUAL; LA OTRA U OTRAS SE RECUPERAN CON FILTROS APROPIADOS (2, 7) SITUADOS EN EL FOURNIER O PLANOS DE SALIDA DE LAS LENTES DE ILUMINACION (3) Y DE FORMACION DE, IMAGENES (6). LOS DOS FILTROS OPTICOS (2, 7) TIENEN FUNCIONES DE MEDICION DE AMPLITUD G (X, Y) QUE PREFERIBLEMENTE IGUALAN A C, EJE., (AX + BY), DONDE A, B Y C SON CONSTANTES REALES.
ES90916789T 1989-11-22 1990-11-20 Medicion de fase en microscopios opticos de exploracion. Expired - Lifetime ES2077081T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB898926435A GB8926435D0 (en) 1989-11-22 1989-11-22 Phase measuring scanning optical microscope

Publications (1)

Publication Number Publication Date
ES2077081T3 true ES2077081T3 (es) 1995-11-16

Family

ID=10666744

Family Applications (1)

Application Number Title Priority Date Filing Date
ES90916789T Expired - Lifetime ES2077081T3 (es) 1989-11-22 1990-11-20 Medicion de fase en microscopios opticos de exploracion.

Country Status (10)

Country Link
EP (1) EP0502005B1 (es)
JP (1) JPH05501617A (es)
AT (1) ATE127594T1 (es)
CA (1) CA2077754A1 (es)
DE (1) DE69022243T2 (es)
DK (1) DK0502005T3 (es)
ES (1) ES2077081T3 (es)
GB (2) GB8926435D0 (es)
GR (1) GR3018072T3 (es)
WO (1) WO1991007682A1 (es)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4429416A1 (de) * 1994-08-19 1996-02-22 Velzel Christiaan H F Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung)
US5969855A (en) * 1995-10-13 1999-10-19 Olympus Optical Co., Ltd. Microscope apparatus
DE19908883A1 (de) 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
US7057806B2 (en) 2003-05-09 2006-06-06 3M Innovative Properties Company Scanning laser microscope with wavefront sensor
DE102007009661A1 (de) * 2006-08-31 2008-03-13 Carl Zeiss Sms Gmbh Verfahren und Vorrichtung zur ortsaufgelösten Bestimmung der Phase und Amplitude des elektromagnetischen Feldes in der Bildebene einer Abbildung eines Objektes
DE102013226932A1 (de) * 2013-12-20 2015-06-25 Carl Zeiss Ag Verfahren zur Ermittlung der Phasenverteilung
DE102019120668A1 (de) * 2019-07-31 2021-02-04 Leica Camera Aktiengesellschaft Sensoreinheit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8702071A (nl) * 1987-09-03 1989-04-03 Philips Nv Inrichting voor het puntsgewijs aftasten van een voorwerp.

Also Published As

Publication number Publication date
GR3018072T3 (en) 1996-02-29
DK0502005T3 (da) 1995-11-06
EP0502005A1 (en) 1992-09-09
WO1991007682A1 (en) 1991-05-30
DE69022243T2 (de) 1996-07-25
CA2077754A1 (en) 1991-05-23
ATE127594T1 (de) 1995-09-15
JPH05501617A (ja) 1993-03-25
DE69022243D1 (de) 1995-10-12
GB2253762A (en) 1992-09-16
GB8926435D0 (en) 1990-01-10
EP0502005B1 (en) 1995-09-06
GB9209554D0 (en) 1992-07-01
GB2253762B (en) 1994-09-21

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