DK0502005T3 - Optisk scanning-mikroskop med fasemåling - Google Patents

Optisk scanning-mikroskop med fasemåling

Info

Publication number
DK0502005T3
DK0502005T3 DK90916789.2T DK90916789T DK0502005T3 DK 0502005 T3 DK0502005 T3 DK 0502005T3 DK 90916789 T DK90916789 T DK 90916789T DK 0502005 T3 DK0502005 T3 DK 0502005T3
Authority
DK
Denmark
Prior art keywords
image
phase measurement
optical scanning
scanning microscope
light
Prior art date
Application number
DK90916789.2T
Other languages
English (en)
Inventor
John Graham Walker
Edward Roy Pike
Original Assignee
Secr Defence Brit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Secr Defence Brit filed Critical Secr Defence Brit
Application granted granted Critical
Publication of DK0502005T3 publication Critical patent/DK0502005T3/da

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46—Systems using spatial filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/50—Optics for phase object visualisation
DK90916789.2T 1989-11-22 1990-11-20 Optisk scanning-mikroskop med fasemåling DK0502005T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB898926435A GB8926435D0 (en) 1989-11-22 1989-11-22 Phase measuring scanning optical microscope

Publications (1)

Publication Number Publication Date
DK0502005T3 true DK0502005T3 (da) 1995-11-06

Family

ID=10666744

Family Applications (1)

Application Number Title Priority Date Filing Date
DK90916789.2T DK0502005T3 (da) 1989-11-22 1990-11-20 Optisk scanning-mikroskop med fasemåling

Country Status (10)

Country Link
EP (1) EP0502005B1 (da)
JP (1) JPH05501617A (da)
AT (1) ATE127594T1 (da)
CA (1) CA2077754A1 (da)
DE (1) DE69022243T2 (da)
DK (1) DK0502005T3 (da)
ES (1) ES2077081T3 (da)
GB (2) GB8926435D0 (da)
GR (1) GR3018072T3 (da)
WO (1) WO1991007682A1 (da)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4429416A1 (de) * 1994-08-19 1996-02-22 Velzel Christiaan H F Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung)
US5969855A (en) * 1995-10-13 1999-10-19 Olympus Optical Co., Ltd. Microscope apparatus
DE19908883A1 (de) 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
US7057806B2 (en) * 2003-05-09 2006-06-06 3M Innovative Properties Company Scanning laser microscope with wavefront sensor
DE102007009661A1 (de) * 2006-08-31 2008-03-13 Carl Zeiss Sms Gmbh Verfahren und Vorrichtung zur ortsaufgelösten Bestimmung der Phase und Amplitude des elektromagnetischen Feldes in der Bildebene einer Abbildung eines Objektes
DE102013226932A1 (de) * 2013-12-20 2015-06-25 Carl Zeiss Ag Verfahren zur Ermittlung der Phasenverteilung
DE102019120668A1 (de) * 2019-07-31 2021-02-04 Leica Camera Aktiengesellschaft Sensoreinheit

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8702071A (nl) * 1987-09-03 1989-04-03 Philips Nv Inrichting voor het puntsgewijs aftasten van een voorwerp.

Also Published As

Publication number Publication date
JPH05501617A (ja) 1993-03-25
ATE127594T1 (de) 1995-09-15
CA2077754A1 (en) 1991-05-23
GB2253762A (en) 1992-09-16
GB2253762B (en) 1994-09-21
GB8926435D0 (en) 1990-01-10
WO1991007682A1 (en) 1991-05-30
DE69022243T2 (de) 1996-07-25
EP0502005B1 (en) 1995-09-06
ES2077081T3 (es) 1995-11-16
DE69022243D1 (de) 1995-10-12
EP0502005A1 (en) 1992-09-09
GR3018072T3 (en) 1996-02-29
GB9209554D0 (en) 1992-07-01

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