TW351808B - Duel refraction apparatus for measuring optical data carrier and its measuring method - Google Patents

Duel refraction apparatus for measuring optical data carrier and its measuring method

Info

Publication number
TW351808B
TW351808B TW086106123A TW86106123A TW351808B TW 351808 B TW351808 B TW 351808B TW 086106123 A TW086106123 A TW 086106123A TW 86106123 A TW86106123 A TW 86106123A TW 351808 B TW351808 B TW 351808B
Authority
TW
Taiwan
Prior art keywords
data carrier
photo data
refraction
calibration
photo
Prior art date
Application number
TW086106123A
Other languages
English (en)
Inventor
Hakan Bergstrom
Ulf Wilhelmson
Lars Jonsson
Original Assignee
Ifunga Test Equipment B V
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ifunga Test Equipment B V filed Critical Ifunga Test Equipment B V
Application granted granted Critical
Publication of TW351808B publication Critical patent/TW351808B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW086106123A 1996-05-09 1997-05-08 Duel refraction apparatus for measuring optical data carrier and its measuring method TW351808B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9601760A SE506286C2 (sv) 1996-05-09 1996-05-09 Anordning för mätning av dubbelbrytning i en optisk databärare

Publications (1)

Publication Number Publication Date
TW351808B true TW351808B (en) 1999-02-01

Family

ID=20402504

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086106123A TW351808B (en) 1996-05-09 1997-05-08 Duel refraction apparatus for measuring optical data carrier and its measuring method

Country Status (7)

Country Link
US (1) US6023332A (zh)
EP (1) EP0897533A1 (zh)
JP (1) JP2000510235A (zh)
KR (1) KR20000010871A (zh)
SE (1) SE506286C2 (zh)
TW (1) TW351808B (zh)
WO (1) WO1997042491A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109564156A (zh) * 2017-05-31 2019-04-02 法国圣戈班玻璃厂 用于分析装配玻璃质量的光学装置的校准以及相关方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2297672A1 (en) 1997-07-28 1999-02-04 Hinds Instruments, Inc. Measurement of waveplate retardation using a photoelastic modulator
JP4629869B2 (ja) 1998-02-20 2011-02-09 ハインズ インスツルメンツ インコーポレイテッド 複屈折特性測定方法および装置
US6697157B2 (en) * 1999-05-24 2004-02-24 Hinds Instruments Birefringence measurement
US6268914B1 (en) * 2000-01-14 2001-07-31 Hinds Instruments, Inc. Calibration Process For Birefringence Measurement System
AU2001238147A1 (en) * 2000-02-10 2001-08-20 The Regents Of The University Of California Method and apparatus for measuring birefringent particles
JP4249608B2 (ja) * 2001-06-18 2009-04-02 ハインズ インスツルメンツ インコーポレイテッド 深紫外波長での複屈折測定
EP1202039A1 (en) * 2001-07-27 2002-05-02 Agilent Technologies, Inc. (a Delaware corporation) Calibration and/or verification of a measurement setup
US20040233434A1 (en) * 2001-10-16 2004-11-25 Baoliang Wang Accuracy calibration of birefringence measurement systems
JP3679774B2 (ja) * 2002-03-29 2005-08-03 キヤノン株式会社 複屈折測定装置及び方法
JP5880957B2 (ja) * 2012-04-11 2016-03-09 国立研究開発法人産業技術総合研究所 レーザー光により表面の変化を検出する装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5257092A (en) * 1990-06-27 1993-10-26 Asahi Kogaku Kogyo Kabushiki Kaisha Apparatus for measuring polarization and birefringence
JP3004036B2 (ja) * 1990-08-07 2000-01-31 旭光学工業株式会社 光ディスク装置のｆ／ｔクロストーク補正方法
US5227623A (en) * 1992-01-31 1993-07-13 Hewlett-Packard Company Method and apparatus for measuring polarization mode dispersion in optical devices
JPH06337243A (ja) * 1993-03-31 1994-12-06 New Oji Paper Co Ltd 光学的測定装置
DE4434473A1 (de) * 1994-09-27 1996-03-28 Basler Gmbh Verfahren und Vorrichtung zur Qualitätskontrolle von Gegenständen mit polarisiertem Licht
US5864403A (en) * 1998-02-23 1999-01-26 National Research Council Of Canada Method and apparatus for measurement of absolute biaxial birefringence in monolayer and multilayer films, sheets and shapes

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109564156A (zh) * 2017-05-31 2019-04-02 法国圣戈班玻璃厂 用于分析装配玻璃质量的光学装置的校准以及相关方法

Also Published As

Publication number Publication date
JP2000510235A (ja) 2000-08-08
SE9601760D0 (sv) 1996-05-09
US6023332A (en) 2000-02-08
WO1997042491A1 (en) 1997-11-13
SE506286C2 (sv) 1997-12-01
EP0897533A1 (en) 1999-02-24
KR20000010871A (ko) 2000-02-25
SE9601760L (sv) 1997-11-10

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