ATE273520T1 - System und verfahren zur prüfung von integrierten schaltungen - Google Patents

System und verfahren zur prüfung von integrierten schaltungen

Info

Publication number
ATE273520T1
ATE273520T1 AT01950619T AT01950619T ATE273520T1 AT E273520 T1 ATE273520 T1 AT E273520T1 AT 01950619 T AT01950619 T AT 01950619T AT 01950619 T AT01950619 T AT 01950619T AT E273520 T1 ATE273520 T1 AT E273520T1
Authority
AT
Austria
Prior art keywords
test
integrated circuit
tests
component blocks
random logic
Prior art date
Application number
AT01950619T
Other languages
English (en)
Inventor
Laurence H Cooke
Christopher K Lennard
Original Assignee
Cadence Design Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cadence Design Systems Inc filed Critical Cadence Design Systems Inc
Application granted granted Critical
Publication of ATE273520T1 publication Critical patent/ATE273520T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/40—Transformation of program code
    • G06F8/41—Compilation
    • G06F8/44—Encoding
    • G06F8/443—Optimisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Software Systems (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Fats And Perfumes (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
AT01950619T 2000-06-28 2001-06-28 System und verfahren zur prüfung von integrierten schaltungen ATE273520T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US21492800P 2000-06-28 2000-06-28
US21674600P 2000-07-03 2000-07-03
US09/888,054 US6701474B2 (en) 2000-06-28 2001-06-22 System and method for testing integrated circuits
PCT/US2001/020641 WO2002001237A2 (en) 2000-06-28 2001-06-28 System and method for testing integrated circuits

Publications (1)

Publication Number Publication Date
ATE273520T1 true ATE273520T1 (de) 2004-08-15

Family

ID=27396047

Family Applications (3)

Application Number Title Priority Date Filing Date
AT04014596T ATE360217T1 (de) 2000-06-28 2001-06-28 Intelligenter prüfadapter
AT01950619T ATE273520T1 (de) 2000-06-28 2001-06-28 System und verfahren zur prüfung von integrierten schaltungen
AT07106336T ATE433119T1 (de) 2000-06-28 2001-06-28 System und verfahren zum testen integrierter schaltungen

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AT04014596T ATE360217T1 (de) 2000-06-28 2001-06-28 Intelligenter prüfadapter

Family Applications After (1)

Application Number Title Priority Date Filing Date
AT07106336T ATE433119T1 (de) 2000-06-28 2001-06-28 System und verfahren zum testen integrierter schaltungen

Country Status (6)

Country Link
US (1) US6701474B2 (de)
EP (1) EP1299739B1 (de)
AT (3) ATE360217T1 (de)
AU (1) AU2001271590A1 (de)
DE (3) DE60128014T2 (de)
WO (1) WO2002001237A2 (de)

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Also Published As

Publication number Publication date
AU2001271590A1 (en) 2002-01-08
ATE360217T1 (de) 2007-05-15
EP1299739B1 (de) 2004-08-11
US20020091979A1 (en) 2002-07-11
DE60138933D1 (de) 2009-07-16
DE60104854T2 (de) 2005-09-15
ATE433119T1 (de) 2009-06-15
DE60128014D1 (de) 2007-05-31
US6701474B2 (en) 2004-03-02
EP1299739A2 (de) 2003-04-09
DE60104854D1 (de) 2004-09-16
WO2002001237A2 (en) 2002-01-03
WO2002001237A3 (en) 2002-08-15
DE60128014T2 (de) 2008-01-03

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