DE60128014D1 - Intelligenter Prüfadapter - Google Patents

Intelligenter Prüfadapter

Info

Publication number
DE60128014D1
DE60128014D1 DE60128014T DE60128014T DE60128014D1 DE 60128014 D1 DE60128014 D1 DE 60128014D1 DE 60128014 T DE60128014 T DE 60128014T DE 60128014 T DE60128014 T DE 60128014T DE 60128014 D1 DE60128014 D1 DE 60128014D1
Authority
DE
Germany
Prior art keywords
test
integrated circuit
tests
component blocks
random logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60128014T
Other languages
English (en)
Other versions
DE60128014T2 (de
Inventor
Laurence H Cooke
Christopher K Lennard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cadence Design Systems Inc
Original Assignee
Cadence Design Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cadence Design Systems Inc filed Critical Cadence Design Systems Inc
Publication of DE60128014D1 publication Critical patent/DE60128014D1/de
Application granted granted Critical
Publication of DE60128014T2 publication Critical patent/DE60128014T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/40—Transformation of program code
    • G06F8/41—Compilation
    • G06F8/44—Encoding
    • G06F8/443—Optimisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
DE60128014T 2000-06-28 2001-06-28 Intelligenter Prüfadapter Expired - Lifetime DE60128014T2 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US21492800P 2000-06-28 2000-06-28
US214928P 2000-06-28
US21674600P 2000-07-03 2000-07-03
US216746P 2000-07-03
US09/888,054 US6701474B2 (en) 2000-06-28 2001-06-22 System and method for testing integrated circuits
US888054 2001-06-22

Publications (2)

Publication Number Publication Date
DE60128014D1 true DE60128014D1 (de) 2007-05-31
DE60128014T2 DE60128014T2 (de) 2008-01-03

Family

ID=27396047

Family Applications (3)

Application Number Title Priority Date Filing Date
DE60104854T Expired - Lifetime DE60104854T2 (de) 2000-06-28 2001-06-28 System und Verfahren zum Testen integrierter Schaltungen
DE60138933T Expired - Lifetime DE60138933D1 (de) 2000-06-28 2001-06-28 System und Verfahren zum Testen integrierter Schaltungen
DE60128014T Expired - Lifetime DE60128014T2 (de) 2000-06-28 2001-06-28 Intelligenter Prüfadapter

Family Applications Before (2)

Application Number Title Priority Date Filing Date
DE60104854T Expired - Lifetime DE60104854T2 (de) 2000-06-28 2001-06-28 System und Verfahren zum Testen integrierter Schaltungen
DE60138933T Expired - Lifetime DE60138933D1 (de) 2000-06-28 2001-06-28 System und Verfahren zum Testen integrierter Schaltungen

Country Status (6)

Country Link
US (1) US6701474B2 (de)
EP (1) EP1299739B1 (de)
AT (3) ATE433119T1 (de)
AU (1) AU2001271590A1 (de)
DE (3) DE60104854T2 (de)
WO (1) WO2002001237A2 (de)

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US8572528B1 (en) * 2009-11-25 2013-10-29 Xilinx, Inc. Method and apparatus for analyzing a design of an integrated circuit using fault costs
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US9331869B2 (en) 2010-03-04 2016-05-03 Nvidia Corporation Input/output request packet handling techniques by a device specific kernel mode driver
US8887136B2 (en) * 2010-05-04 2014-11-11 Synopsys, Inc. Context-based evaluation of equations
US8918686B2 (en) 2010-08-18 2014-12-23 Kingtiger Technology (Canada) Inc. Determining data valid windows in a system and method for testing an integrated circuit device
CN103109275B (zh) * 2010-09-07 2016-02-03 爱德万测试公司 在半导体测试环境中使用虚拟仪器的系统、方法和设备
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US8924801B2 (en) * 2013-02-14 2014-12-30 Lsi Corporation At-speed scan testing of interface functional logic of an embedded memory or other circuit core
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CN104614659B (zh) * 2013-11-01 2017-08-29 普诚科技股份有限公司 自动化测试系统和方法
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Also Published As

Publication number Publication date
WO2002001237A2 (en) 2002-01-03
DE60138933D1 (de) 2009-07-16
ATE360217T1 (de) 2007-05-15
WO2002001237A3 (en) 2002-08-15
ATE273520T1 (de) 2004-08-15
AU2001271590A1 (en) 2002-01-08
US20020091979A1 (en) 2002-07-11
DE60104854D1 (de) 2004-09-16
US6701474B2 (en) 2004-03-02
DE60104854T2 (de) 2005-09-15
EP1299739B1 (de) 2004-08-11
DE60128014T2 (de) 2008-01-03
EP1299739A2 (de) 2003-04-09
ATE433119T1 (de) 2009-06-15

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