ATE243850T1 - Verfahren zur wellenformanalyse - Google Patents
Verfahren zur wellenformanalyseInfo
- Publication number
- ATE243850T1 ATE243850T1 AT95914140T AT95914140T ATE243850T1 AT E243850 T1 ATE243850 T1 AT E243850T1 AT 95914140 T AT95914140 T AT 95914140T AT 95914140 T AT95914140 T AT 95914140T AT E243850 T1 ATE243850 T1 AT E243850T1
- Authority
- AT
- Austria
- Prior art keywords
- waveform
- area
- signal
- points
- determining
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
- G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/216,409 US5485078A (en) | 1994-03-23 | 1994-03-23 | Method for analyzing a circuit board waveform for faults |
PCT/US1995/003533 WO1995025960A1 (en) | 1994-03-23 | 1995-03-17 | Method and apparatus for analyzing a waveform |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE243850T1 true ATE243850T1 (de) | 2003-07-15 |
Family
ID=22806955
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT95914140T ATE243850T1 (de) | 1994-03-23 | 1995-03-17 | Verfahren zur wellenformanalyse |
Country Status (7)
Country | Link |
---|---|
US (2) | US5485078A (de) |
EP (1) | EP0752106B1 (de) |
JP (1) | JPH09510783A (de) |
KR (1) | KR100296085B1 (de) |
AT (1) | ATE243850T1 (de) |
DE (1) | DE69531149T2 (de) |
WO (1) | WO1995025960A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5805460A (en) * | 1994-10-21 | 1998-09-08 | Alliedsignal Inc. | Method for measuring RF pulse rise time, fall time and pulse width |
JP3707105B2 (ja) * | 1995-08-29 | 2005-10-19 | ソニー株式会社 | 信号測定方法及び信号測定装置 |
JP3486015B2 (ja) * | 1995-08-30 | 2004-01-13 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | Fftアナライザのトリガ発生方法及び装置 |
US5953009A (en) * | 1997-05-27 | 1999-09-14 | Hewlett-Packard Company | Graphical system and method for invoking measurements in a signal measurement system |
JP3410035B2 (ja) * | 1998-01-28 | 2003-05-26 | テクトロニクス・インコーポレイテッド | 傾斜カーソル表示方法 |
US6320577B1 (en) * | 1998-11-03 | 2001-11-20 | Agilent Technologies, Inc. | System and method for graphically annotating a waveform display in a signal-measurement system |
US6407756B1 (en) * | 1999-04-29 | 2002-06-18 | Agilent Technologies, Inc. | Graphical user interface for a logic analyzer which allows simplified clock selection |
US6477476B1 (en) | 1999-12-06 | 2002-11-05 | Koninklijke Philips Electronics N.V. | Periodic-signal analysis via correlation |
US6791545B2 (en) * | 2001-12-11 | 2004-09-14 | Lecroy Corporation | Measurement icons for digital oscilloscopes |
KR100726841B1 (ko) | 2004-04-17 | 2007-06-11 | 주식회사 이노와이어리스 | 신호 측정 및 감시 장치 |
DE102014003774B4 (de) * | 2014-03-15 | 2019-01-24 | Vector Informatik Gmbh | Analysevorrichtung und Verfahren zur Analyse eines Prüfsignals |
CN107390034B (zh) * | 2017-06-28 | 2019-01-08 | 北京金风科创风电设备有限公司 | 脉冲波形幅值变化的分析方法和装置 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2059195A1 (de) * | 1970-12-02 | 1972-06-08 | Ver Flugtechnische Werke | Messanordnung zum Analysieren dynamischer Prozesse |
US4142146A (en) * | 1975-07-07 | 1979-02-27 | Nicolet Instrument Corporation | Digital apparatus for waveform measurement |
AU2796877A (en) * | 1976-08-16 | 1979-02-22 | Doherty L E | Digital signal analyser |
US4625283A (en) * | 1982-05-07 | 1986-11-25 | Cooper Industries, Inc. | Method and apparatus for digitally measuring alternating current |
US4837502A (en) * | 1983-11-04 | 1989-06-06 | Grumman Aerospace Corporation | Computer-aided, logic pulsing probe for locating faulty circuits on a printed circuit card |
US4625823A (en) * | 1984-09-17 | 1986-12-02 | Aisin Seiki Kabushiki Kaisha | Control system and method for a flywheel type power delivery system |
JPS6170773U (de) * | 1984-10-15 | 1986-05-14 | ||
US4755951A (en) * | 1986-03-03 | 1988-07-05 | Tektronix, Inc. | Method and apparatus for digitizing a waveform |
US4799165A (en) * | 1986-03-03 | 1989-01-17 | Tektronix, Inc. | Level detecting waveform sampling system |
US4855722A (en) * | 1986-08-01 | 1989-08-08 | Intersil, Inc. | Alternating current power loss detector |
US4779028A (en) * | 1986-09-09 | 1988-10-18 | Tektronix, Inc. | Digital storage oscilloscope with marker for trigger location |
US4821030A (en) * | 1986-12-19 | 1989-04-11 | Tektronix, Inc. | Touchscreen feedback system |
US4857833A (en) * | 1987-08-27 | 1989-08-15 | Teradyne, Inc. | Diagnosis of faults on circuit board |
US4873647A (en) * | 1988-01-11 | 1989-10-10 | Minc Incorporated | Digital waveform analyzer |
GB2222285A (en) * | 1988-08-23 | 1990-02-28 | Ibm | Display system |
US5027285A (en) * | 1989-02-28 | 1991-06-25 | Oneac Corporation | Power line waveform measurement system |
US5153501A (en) * | 1990-03-19 | 1992-10-06 | Yokogawa Electric Corporation | Waveform measuring device |
US5222028A (en) * | 1990-10-12 | 1993-06-22 | Westinghouse Electric Corp. | Pulse analysis system and method |
-
1994
- 1994-03-23 US US08/216,409 patent/US5485078A/en not_active Expired - Lifetime
-
1995
- 1995-03-17 DE DE69531149T patent/DE69531149T2/de not_active Expired - Lifetime
- 1995-03-17 JP JP7524778A patent/JPH09510783A/ja active Pending
- 1995-03-17 AT AT95914140T patent/ATE243850T1/de not_active IP Right Cessation
- 1995-03-17 WO PCT/US1995/003533 patent/WO1995025960A1/en active IP Right Grant
- 1995-03-17 EP EP95914140A patent/EP0752106B1/de not_active Expired - Lifetime
- 1995-03-17 KR KR1019960704869A patent/KR100296085B1/ko not_active IP Right Cessation
- 1995-09-29 US US08/536,443 patent/US5592390A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0752106A1 (de) | 1997-01-08 |
EP0752106B1 (de) | 2003-06-25 |
JPH09510783A (ja) | 1997-10-28 |
US5485078A (en) | 1996-01-16 |
EP0752106A4 (de) | 1998-04-22 |
KR100296085B1 (ko) | 2001-10-24 |
DE69531149D1 (de) | 2003-07-31 |
KR970701865A (ko) | 1997-04-12 |
DE69531149T2 (de) | 2003-12-11 |
US5592390A (en) | 1997-01-07 |
WO1995025960A1 (en) | 1995-09-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |