ZA953289B - Method and device for the optical determination of a physical quantity - Google Patents

Method and device for the optical determination of a physical quantity

Info

Publication number
ZA953289B
ZA953289B ZA953289A ZA953289A ZA953289B ZA 953289 B ZA953289 B ZA 953289B ZA 953289 A ZA953289 A ZA 953289A ZA 953289 A ZA953289 A ZA 953289A ZA 953289 B ZA953289 B ZA 953289B
Authority
ZA
South Africa
Prior art keywords
physical quantity
optical determination
determination
optical
physical
Prior art date
Application number
ZA953289A
Other languages
English (en)
Inventor
Klaus Bohnert
Juergen Nehring
Original Assignee
Abb Research Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Research Ltd filed Critical Abb Research Ltd
Publication of ZA953289B publication Critical patent/ZA953289B/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
ZA953289A 1994-05-09 1995-04-24 Method and device for the optical determination of a physical quantity ZA953289B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4416298A DE4416298A1 (de) 1994-05-09 1994-05-09 Verfahren und Vorrichtung zur optischen Ermittlung einer physikalischen Größe

Publications (1)

Publication Number Publication Date
ZA953289B true ZA953289B (en) 1996-01-11

Family

ID=6517657

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA953289A ZA953289B (en) 1994-05-09 1995-04-24 Method and device for the optical determination of a physical quantity

Country Status (8)

Country Link
US (1) US5715058A (xx)
EP (1) EP0682261A3 (xx)
JP (1) JP3677314B2 (xx)
CN (1) CN1128862A (xx)
BR (1) BR9501973A (xx)
CA (1) CA2148310A1 (xx)
DE (1) DE4416298A1 (xx)
ZA (1) ZA953289B (xx)

Families Citing this family (62)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19547021A1 (de) 1995-12-15 1997-06-19 Siemens Ag Optisches Meßverfahren und optische Meßanordnung zum Messen einer Wechselgröße mit Intensitätsnormierung
US6043648A (en) * 1996-06-14 2000-03-28 Siemens Aktiengesellschaft Method for temperature calibration of an optical magnetic field measurement array and measurement array calibrated by the method
DE19624922A1 (de) * 1996-06-21 1998-01-08 Siemens Ag Optisches Meßverfahren und optische Meßanordnung zum Messen einer Wechselgröße mit Temperaturkompensation mit Hilfe von Gleichsignalanteilen
DE19634251A1 (de) * 1996-08-26 1998-03-05 Abb Patent Gmbh Spannungswandler
DE19638645A1 (de) * 1996-09-20 1998-03-26 Siemens Ag Nach dem Prinzip des Pockels-Effekt arbeitende optische Meßvorrichtung für elektrische Feldstärke-/Spannungsmessung mit minimaler Temperaturabhängigkeit
DE19639944A1 (de) * 1996-09-27 1998-04-09 Siemens Ag Optische Meßvorrichtung für elektrische Felder/Spannungen mit verringerter Temperaturabhängigkeit
DE19639948C1 (de) * 1996-09-27 1998-05-20 Siemens Ag Optische Meßvorrichtung für elektrische Felder/Spannungen mit planarem Aufbau und optimierter Kleinsignalempfindlichkeit und insbesondere linearer Kennlinie
DE19701221C1 (de) * 1997-01-16 1998-04-23 Abb Research Ltd Verfahren zur Temperaturkompensation von Meßsignalen eines faseroptischen Sensors
DE19716477B4 (de) 1997-03-05 2011-11-10 Areva T&D Sa Verfahren und Einrichtung zur Messung einer elektrischen Spannung
US6031615A (en) * 1997-09-22 2000-02-29 Candela Instruments System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness
US6897957B2 (en) * 2001-03-26 2005-05-24 Candela Instruments Material independent optical profilometer
US6665078B1 (en) * 1997-09-22 2003-12-16 Candela Instruments System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers
US6909500B2 (en) * 2001-03-26 2005-06-21 Candela Instruments Method of detecting and classifying scratches, particles and pits on thin film disks or wafers
US7123357B2 (en) * 1997-09-22 2006-10-17 Candela Instruments Method of detecting and classifying scratches and particles on thin film disks or wafers
US6930765B2 (en) * 2001-03-26 2005-08-16 Kla-Tencor Technologies Multiple spot size optical profilometer, ellipsometer, reflectometer and scatterometer
US6757056B1 (en) * 2001-03-26 2004-06-29 Candela Instruments Combined high speed optical profilometer and ellipsometer
DE19820202C2 (de) * 1998-05-06 2001-07-19 Linos Photonics Gmbh Transversaler elektrooptischer Modulator (EOM)
US6122415A (en) * 1998-09-30 2000-09-19 Blake; James N. In-line electro-optic voltage sensor
DE19920428A1 (de) * 1999-05-04 2000-11-30 Siemens Ag Vorrichtung zur Messung von elektrischen Feldstärken
US7061601B2 (en) * 1999-07-02 2006-06-13 Kla-Tencor Technologies Corporation System and method for double sided optical inspection of thin film disks or wafers
US6421614B1 (en) 1999-07-26 2002-07-16 Donald S. Goldman Photometer system for obtaining reliable data
DE10005164A1 (de) * 2000-02-08 2001-08-09 Abb Research Ltd Durchführung für eine Hochspannungseinrichtung
DE10039455A1 (de) * 2000-08-12 2002-02-21 Abb Patent Gmbh Spannungswandler
US6882437B2 (en) * 2002-04-19 2005-04-19 Kla-Tencor Technologies Method of detecting the thickness of thin film disks or wafers
EP1418452A1 (de) 2002-11-07 2004-05-12 Abb Research Ltd. Hochspannungsbauteil mit optischer Faser und Verfahren zu seiner Herstellung
EP1462811A1 (de) 2003-03-28 2004-09-29 Abb Research Ltd. Elektrooptischer Spannungssensor für hohe Spannungen
EP1462810B1 (de) * 2003-03-28 2015-09-09 ABB Research Ltd. Temperaturkompensierter elektrooptischer Spannungssensor
US7075741B1 (en) 2004-06-14 2006-07-11 Kla Tencor Technologues Corporation System and method for automatically determining magnetic eccentricity of a disk
US7396022B1 (en) 2004-09-28 2008-07-08 Kla-Tencor Technologies Corp. System and method for optimizing wafer flatness at high rotational speeds
CN100363745C (zh) * 2004-11-16 2008-01-23 山东科技大学 基于位相调制的光纤电压测量装置
US7201799B1 (en) 2004-11-24 2007-04-10 Kla-Tencor Technologies Corporation System and method for classifying, detecting, and counting micropipes
US7684032B1 (en) 2005-01-06 2010-03-23 Kla-Tencor Corporation Multi-wavelength system and method for detecting epitaxial layer defects
FR2902522B1 (fr) 2006-06-16 2008-09-05 Inst Nat Polytech Grenoble Sonde electro-optique de mesure de temperature et de champ electromagnetique
CA2672399A1 (en) 2006-12-22 2008-07-03 Abb Research Ltd Optical voltage sensor
EP2095136B1 (en) * 2006-12-22 2014-04-30 ABB Research LTD Method for measuring high voltage and production of optical fiber used in said method
CN100470193C (zh) * 2007-06-08 2009-03-18 中国科学院上海光学精密机械研究所 石英波片厚度的测量装置和测量方法
KR101489187B1 (ko) 2007-12-21 2015-02-03 에이비비 리써치 리미티드 광 전류 센서를 갖는 가스로 절연된 개폐기 장치
CN101251427B (zh) * 2008-03-28 2011-06-08 苏州光环科技有限公司 全光纤偏振式压力测量方法及传感装置
DE102008026967B3 (de) * 2008-06-05 2010-01-28 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zum Messen der Temperatur unter einer Wärmedämmschicht
CN101408558B (zh) * 2008-09-10 2011-07-06 湾世伟 微型光学直流交流电场传感器
US8395372B2 (en) * 2009-10-28 2013-03-12 Optisense Network, Llc Method for measuring current in an electric power distribution system
WO2011154029A1 (en) 2010-06-07 2011-12-15 Abb Research Ltd High-voltage sensor with axially overlapping electrodes
CN103403528B (zh) * 2011-02-28 2015-05-13 国立大学法人香川大学 光学特性测量装置以及光学特性测量方法
JP5858629B2 (ja) * 2011-03-10 2016-02-10 株式会社東芝 光電圧測定装置
DE112012002258B4 (de) 2011-05-27 2019-10-24 Abb Research Ltd. Faseroptischer Spannungssensor
CN102240848B (zh) * 2011-06-15 2013-10-23 中科中涵激光设备(福建)股份有限公司 一种调节激光束产生动态横向位移的方法
US9647454B2 (en) 2011-08-31 2017-05-09 Aclara Technologies Llc Methods and apparatus for determining conditions of power lines
CN103163351B (zh) * 2011-12-13 2015-08-05 北京航天时代光电科技有限公司 一种三相共用光源的光学电压传感器
WO2013123055A1 (en) 2012-02-14 2013-08-22 Tollgrade Communications, Inc. Power line management system
US9535097B2 (en) 2012-07-19 2017-01-03 Gridview Optical Solutions, Llc. Electro-optic current sensor with high dynamic range and accuracy
US9146358B2 (en) 2013-07-16 2015-09-29 Gridview Optical Solutions, Llc Collimator holder for electro-optical sensor
ES2654679T3 (es) 2013-12-20 2018-02-14 Abb Schweiz Ag Sensor óptico
RU2677126C2 (ru) 2014-02-21 2019-01-15 Абб Швайц Аг Интерферометрический датчик
CN106062506B (zh) 2014-02-21 2021-06-01 Abb电网瑞士股份公司 干涉测定传感器
EP4212885A3 (en) * 2014-03-31 2023-11-01 Aclara Technologies LLC Optical voltage sensing for underground medium voltage wires
WO2016033443A1 (en) 2014-08-29 2016-03-03 Tollgrade Communications, Inc. Power extraction for a medium voltage sensor using a capacitive voltage divider
EP3271734B1 (en) 2015-03-19 2019-10-23 ABB Schweiz AG Assembly of gas-tight compartment and optical voltage sensor
CN104820122A (zh) * 2015-04-16 2015-08-05 厦门时变光纤传感技术有限公司 一种光纤电压传感系统及获取与电压相关相位差的方法
WO2018035313A1 (en) 2016-08-17 2018-02-22 Micatu Inc. An optical pockels voltage sensor assembly device and methods of use thereof
RU2635831C1 (ru) * 2016-12-13 2017-11-16 Общество с ограниченной ответственностью "Масса" Оптический измерительный трансформатор напряжения на основе электрооптического эффекта поккельса
CN107015668B (zh) * 2017-05-04 2023-08-15 游军 信号输入系统及其应用的电子系统
CN116908515B (zh) * 2023-09-14 2023-12-05 合肥工业大学 用于雷电流检测的差分式光学电流传感器

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3516727A (en) * 1966-10-20 1970-06-23 Technical Operations Inc Multipass interferometric optical modulator
FR2067547A5 (xx) * 1969-11-06 1971-08-20 Alsthom Savoisienne
CH510265A (de) * 1969-12-10 1971-07-15 Bbc Brown Boveri & Cie Anordnung zur potentialfreien Messung einer elektrischen Leistung
CH509597A (de) * 1969-12-23 1971-06-30 Bbc Brown Boveri & Cie Verfahren und Anordnung zur Messung eines Magnetfeldes
CH513413A (de) * 1970-02-25 1971-09-30 Bbc Brown Boveri & Cie Verfahren zur elektronischen Auswertung modulierter Lichtbündel
IT946051B (it) * 1970-12-04 1973-05-21 Hoffmann La Roche Cellula ottica
JPS58137768A (ja) * 1982-02-09 1983-08-16 Mitsubishi Electric Corp 光電圧電界センサ
JPS61124834A (ja) * 1984-11-21 1986-06-12 Sharp Corp 光応用センサ
DE3607462A1 (de) * 1986-03-07 1987-09-10 Philips Patentverwaltung Anordnung zur messung der spannungsdoppelbrechung eines optischen sensors
JPH0695111B2 (ja) * 1987-06-05 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
JPS63308572A (ja) * 1987-06-10 1988-12-15 Hamamatsu Photonics Kk 電圧検出装置
DE3742878A1 (de) * 1987-08-07 1989-07-06 Siemens Ag Optischer magnetfeldsensor
DE3729382A1 (de) * 1987-09-03 1989-03-16 Philips Patentverwaltung Optische sensoranordnung
JPH01158326A (ja) * 1987-09-11 1989-06-21 Toshiba Corp 温度測定装置
DE3829103A1 (de) * 1988-08-27 1990-03-01 Philips Patentverwaltung Optische sensoranordnung
US4904931A (en) * 1988-09-28 1990-02-27 Westinghouse Electric Corp. Electro-optical voltage measuring system incorporating a method and apparatus to derive the measured voltage waveform from two phase shifted electrical signals
DE3924369A1 (de) * 1989-07-22 1991-01-31 Asea Brown Boveri Verfahren zur messung eines elektrischen feldes oder einer elektrischen spannung und einrichtung zur durchfuehrung des verfahrens
DE3927885A1 (de) * 1989-08-23 1991-02-28 Victor Company Of Japan Vorrichtung zum erfassen von elektrostatischem oberflaechenpotential
JPH03154875A (ja) * 1989-11-13 1991-07-02 Dainippon Printing Co Ltd 電気光学結晶を用いた電位センサ及び電位測定方法
DK108691D0 (da) * 1991-06-07 1991-06-07 Allan Goettsche Maaling af induceret dobbeltbrydning
DE4205509A1 (de) * 1992-02-24 1993-08-26 Mwb Pruefsysteme Gmbh Verfahren und sensor zum messen von elektrischen spannungen und/oder elektrischen feldstaerken

Also Published As

Publication number Publication date
CN1128862A (zh) 1996-08-14
BR9501973A (pt) 1995-12-12
CA2148310A1 (en) 1995-11-10
EP0682261A2 (de) 1995-11-15
EP0682261A3 (de) 1996-12-27
JPH085462A (ja) 1996-01-12
DE4416298A1 (de) 1995-11-16
US5715058A (en) 1998-02-03
JP3677314B2 (ja) 2005-07-27

Similar Documents

Publication Publication Date Title
ZA953289B (en) Method and device for the optical determination of a physical quantity
GB2300072B (en) Microcooling device and method for the production thereof
GB2242863B (en) Fixing method and device
EP0781419A4 (en) METHOD AND DEVICE FOR MAKING CONNECTIONS
IL110095A0 (en) System and method for measuring the operation of a device
AU2989595A (en) Device and method for evaluation of refraction of the eye
EP0689085A3 (en) Display device and method for its manufacture
EP0717294A3 (en) Fiber optic sensor and method of manufacturing the same
GB9610618D0 (en) Optical device
AU6958696A (en) A device and method for determining the length of a urethra
EP0990146A4 (en) DEVICE AND METHOD FOR CLEANING BIOMOLECULES
GB9326429D0 (en) An optical device and method of making the same
HUT77918A (hu) Berendezés és alkalmazása oxiklórozáshoz
EP0725270A4 (en) OPTICAL MEASUREMENT METHOD AND APPARATUS THEREOF
GB2299404B (en) Process and device for the optical testing of a surface
HU913084D0 (en) Method and device for making documentation
EP0780003A4 (en) METHOD AND APPARATUS FOR DETERMINING THE POSITION OF A REFLECTIVE OBJECT WITHIN A VIDEO FIELD
GB2304204B (en) Optical device
GB9517089D0 (en) Optical device and method for coating an optical substance
EP0704742A3 (en) Optical control device and method for its manufacture
SG52711A1 (en) Optical device
ZA956311B (en) Deposition sensing method and apparatus
EP0848352A4 (en) DEVICE AND METHOD FOR TREATING A MEDIUM
GB2305504B (en) An improved optical sensor and method
EP0708307A3 (en) Measuring method for extremely small height steps