ZA864374B - Measurement method and apparatus - Google Patents
Measurement method and apparatusInfo
- Publication number
- ZA864374B ZA864374B ZA864374A ZA864374A ZA864374B ZA 864374 B ZA864374 B ZA 864374B ZA 864374 A ZA864374 A ZA 864374A ZA 864374 A ZA864374 A ZA 864374A ZA 864374 B ZA864374 B ZA 864374B
- Authority
- ZA
- South Africa
- Prior art keywords
- pct
- cross
- profile
- detected
- datum
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Transplanting Machines (AREA)
- Absorbent Articles And Supports Therefor (AREA)
- Image Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPH103985 | 1985-06-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
ZA864374B true ZA864374B (en) | 1987-02-25 |
Family
ID=3771148
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ZA864374A ZA864374B (en) | 1985-06-14 | 1986-06-11 | Measurement method and apparatus |
Country Status (10)
Country | Link |
---|---|
US (1) | US4801207A (xx) |
EP (1) | EP0227701B1 (xx) |
JP (1) | JP2502554B2 (xx) |
KR (1) | KR940007111B1 (xx) |
AT (1) | ATE73541T1 (xx) |
AU (1) | AU589651B2 (xx) |
CA (1) | CA1252211A (xx) |
DE (1) | DE3684267D1 (xx) |
WO (1) | WO1986007443A1 (xx) |
ZA (1) | ZA864374B (xx) |
Families Citing this family (57)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5119205A (en) * | 1963-03-11 | 1992-06-02 | Lemelson Jerome H | Methods and apparatus for scanning and analyzing selected images areas |
GB2091526B (en) * | 1981-01-13 | 1985-10-02 | Harris Corp | Digital map generator and display system |
FR2627423A1 (fr) * | 1988-02-23 | 1989-08-25 | Cerisy Sa | Systeme de tranchage a masse constante d'un produit |
US4925308A (en) * | 1988-08-09 | 1990-05-15 | Robotic Vision System, Inc. | Calibration of three-dimensional space |
US5083867A (en) * | 1988-11-28 | 1992-01-28 | Allegheny Ludlum Corporation | Slab surface contour monitor |
JPH0641851B2 (ja) * | 1989-04-05 | 1994-06-01 | 日本鋼管株式会社 | 3次元曲面形状の測定装置 |
DE3923275A1 (de) * | 1989-07-14 | 1991-01-24 | Fraunhofer Ges Forschung | Vorrichtung zur optischen messung von werkstueckprofilen profilerzeugender maschinen |
DE4002743A1 (de) * | 1990-01-31 | 1991-08-08 | Fraunhofer Ges Forschung | Vorrichtung zum messen der position eines filamentbuendels |
FR2670283B1 (fr) * | 1990-12-05 | 1994-10-14 | Commissariat Energie Atomique | Procede d'etalonnage d'un systeme de metrologie tridimensionnelle. |
US5619587A (en) * | 1991-05-10 | 1997-04-08 | Aluminum Company Of America | System and method for contactlessly gauging the thickness of a contoured object, such as a vehicle wheel |
US5311289A (en) * | 1991-09-09 | 1994-05-10 | Honda Giken Kogyo Kabushiki Kaisha | Picture processing method in optical measuring apparatus |
US5245409A (en) * | 1991-11-27 | 1993-09-14 | Arvin Industries, Inc. | Tube seam weld inspection device |
US5379106A (en) * | 1992-04-24 | 1995-01-03 | Forensic Technology Wai, Inc. | Method and apparatus for monitoring and adjusting the position of an article under optical observation |
DE4218971C2 (de) * | 1992-06-10 | 1994-09-22 | Grecon Greten Gmbh & Co Kg | Verfahren zur Kalibrierung eines Bildverarbeitungssystems |
FR2707008A1 (en) * | 1993-06-21 | 1994-12-30 | Peugeot | Method for inspecting a weld bead, in particular on a motor-vehicle suspension sphere and device for implementing this method |
US6407817B1 (en) * | 1993-12-20 | 2002-06-18 | Minolta Co., Ltd. | Measuring system with improved method of reading image data of an object |
US5557410A (en) * | 1994-05-26 | 1996-09-17 | Lockheed Missiles & Space Company, Inc. | Method of calibrating a three-dimensional optical measurement system |
US5675407A (en) * | 1995-03-02 | 1997-10-07 | Zheng Jason Geng | Color ranging method for high speed low-cost three dimensional surface profile measurement |
US5691815A (en) * | 1996-01-02 | 1997-11-25 | Lockheed Missiles & Space Co., Inc. | Laser inspection tool system |
US5892808A (en) * | 1996-06-28 | 1999-04-06 | Techne Systems, Inc. | Method and apparatus for feature detection in a workpiece |
AU8329098A (en) * | 1997-07-21 | 1999-02-16 | Will N. Bauer | Virtual positioning media control system |
US6272437B1 (en) | 1998-04-17 | 2001-08-07 | Cae Inc. | Method and apparatus for improved inspection and classification of attributes of a workpiece |
US6882434B1 (en) | 1999-04-20 | 2005-04-19 | Formax, Inc. | Automated product profiling apparatus and product slicing system using same |
US7034272B1 (en) * | 1999-10-05 | 2006-04-25 | Electro Scientific Industries, Inc. | Method and apparatus for evaluating integrated circuit packages having three dimensional features |
ITVE20000036A1 (it) * | 2000-07-18 | 2002-01-18 | Tecnogamma S A S Di Zanini E & | Apparecchiatura di rilevamento dei parametri caratteristici di una linea aerea ferrotramviaria. |
SE520060C2 (sv) * | 2000-10-12 | 2003-05-13 | Latronix Ab | System och förfarande för kontinuerlig bestämning av storleken på ett objekt vars storlek varierar i tiden |
GB2371866A (en) * | 2001-01-31 | 2002-08-07 | Hewlett Packard Co | Measuring apparatus |
EP1440458B1 (en) * | 2001-10-02 | 2007-01-10 | Invitrogen Corporation | Method of semiconductor nanoparticle synthesis |
GB2399165B (en) * | 2003-03-06 | 2006-01-11 | Aea Technology Plc | Calibration of optical profile scanner |
DE10334651A1 (de) * | 2003-07-28 | 2005-03-03 | BFI VDEh-Institut für angewandte Forschung GmbH | Messverfahren für optisch erfassbare Eigenschaften eines Walzstahls und Messvorrichtung mit einer Kamera und mehreren Lichtleitern |
US7460250B2 (en) * | 2003-10-24 | 2008-12-02 | 3Dm Devices Inc. | Laser triangulation system |
EP1777485A4 (en) * | 2004-08-03 | 2012-09-19 | Techno Dream 21 Co Ltd | METHOD AND DEVICE FOR MEASURING THREE-DIMENSIONAL FORMS |
DE102004057092A1 (de) * | 2004-11-25 | 2006-06-01 | Hauni Maschinenbau Ag | Messen des Durchmessers von stabförmigen Artikeln der Tabak verarbeitenden Industrie |
US7633635B2 (en) * | 2006-08-07 | 2009-12-15 | GII Acquisitions, LLC | Method and system for automatically identifying non-labeled, manufactured parts |
JP2008309714A (ja) * | 2007-06-15 | 2008-12-25 | Yokohama Rubber Co Ltd:The | 長尺物の外観検査方法及びその装置 |
JP4544272B2 (ja) * | 2007-06-15 | 2010-09-15 | 横浜ゴム株式会社 | 長尺物の外観検査方法及びその装置 |
WO2008153141A1 (ja) * | 2007-06-15 | 2008-12-18 | The Yokohama Rubber Co., Ltd. | 長尺物の外観検査方法及びその装置 |
DE102008016736A1 (de) | 2008-03-31 | 2009-10-01 | Urban Gmbh & Co Maschinenbau Kg | Bearbeitungsmaschine für Tür- beziehungsweise Fensterrahmenprofile |
DE602008004330D1 (de) * | 2008-07-04 | 2011-02-17 | Sick Ivp Aktiebolag | Kalibrierung eines Profilmesssystems |
EP3483553A1 (en) | 2009-10-27 | 2019-05-15 | Formax, Inc. | Automated product profiling apparatus and product slicing system using the same |
DE102009059855A1 (de) | 2009-12-21 | 2011-06-22 | Weber Maschinenbau GmbH, 35236 | Abtasteinrichtung |
US8134717B2 (en) * | 2010-05-21 | 2012-03-13 | LTS Scale Company | Dimensional detection system and associated method |
US8428392B1 (en) * | 2010-09-08 | 2013-04-23 | Xiagen Feng | Systems and methods for measuring geometry parameters with a reference object whose thickness can not be ignored in images |
CN103808277B (zh) * | 2013-12-23 | 2016-07-06 | 天津大学 | 一种多传感器点云拼接误差的修正方法 |
US10068344B2 (en) | 2014-03-05 | 2018-09-04 | Smart Picture Technologies Inc. | Method and system for 3D capture based on structure from motion with simplified pose detection |
JP6409307B2 (ja) * | 2014-04-07 | 2018-10-24 | 大同特殊鋼株式会社 | 形状計測装置 |
US20160044301A1 (en) * | 2014-08-06 | 2016-02-11 | Dejan JOVANOVICH | 3d modeling of imaged objects using camera position and pose to obtain accuracy with reduced processing requirements |
US20160134860A1 (en) * | 2014-11-12 | 2016-05-12 | Dejan Jovanovic | Multiple template improved 3d modeling of imaged objects using camera position and pose to obtain accuracy |
US10083522B2 (en) | 2015-06-19 | 2018-09-25 | Smart Picture Technologies, Inc. | Image based measurement system |
ITUB20155673A1 (it) * | 2015-11-18 | 2017-05-18 | Gd Spa | Unita di ispezione di un elemento allungato. |
ITUB20155646A1 (it) * | 2015-11-18 | 2017-05-18 | Gd Spa | Metodo di ispezione di un elemento allungato. |
DE102016121659A1 (de) * | 2016-11-11 | 2018-05-17 | New Np Gmbh | Vorrichtung und Verfahren zur Erfassung und/oder Untersuchung eines Abtrages an einer Oberfläche eines zylindrischen Bauteiles |
US10304254B2 (en) | 2017-08-08 | 2019-05-28 | Smart Picture Technologies, Inc. | Method for measuring and modeling spaces using markerless augmented reality |
KR102104982B1 (ko) * | 2018-12-21 | 2020-04-28 | 동국대학교 산학협력단 | 음식 재료에 대한 썰기 능력 평가 지원 장치 및 그 동작 방법 |
EP3966789A4 (en) | 2019-05-10 | 2022-06-29 | Smart Picture Technologies, Inc. | Methods and systems for measuring and modeling spaces using markerless photo-based augmented reality process |
US11568614B1 (en) | 2021-08-02 | 2023-01-31 | Bank Of America Corporation | Adaptive augmented reality system for dynamic processing of spatial component parameters based on detecting accommodation factors in real time |
CN116793257B (zh) * | 2023-08-28 | 2023-10-27 | 成都量芯集成科技有限公司 | 一种三维测量系统和方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3854822A (en) * | 1973-06-27 | 1974-12-17 | Vsi Corp | Electro-optical scanning system for dimensional gauging of parts |
DE2412359A1 (de) * | 1974-03-14 | 1975-09-25 | Dornier System Gmbh | Verfahren und geraet zur beruehrungslosen vermessung von objektkonturen |
DE2514930A1 (de) * | 1975-04-05 | 1976-10-14 | Opto Produkte Ag | Verfahren zur optischen ermittlung und zum vergleich von formen und lagen von objekten |
US4188544A (en) | 1977-08-22 | 1980-02-12 | Weyerhaeuser Company | Method and apparatus for automatically processing a workpiece employing calibrated scanning |
US4246606A (en) * | 1979-04-17 | 1981-01-20 | Hajime Industries Ltd. | Inspection apparatus |
US4375921A (en) * | 1980-03-13 | 1983-03-08 | Selective Electronic Co. Ab | Dimension measuring apparatus |
US4498778A (en) * | 1981-03-30 | 1985-02-12 | Technical Arts Corporation | High speed scanning method and apparatus |
DE3280272D1 (de) * | 1981-08-14 | 1991-01-17 | Broken Hill Pty Co Ltd | Optische bestimmung von oberflaechenprofilen. |
JPS59112211A (ja) * | 1982-09-29 | 1984-06-28 | テクニカル、ア−ツ、コ−ポレ−シヨン | 加工物の空間座標決定方法および装置 |
JPS59203904A (ja) * | 1983-05-02 | 1984-11-19 | Sumitomo Electric Ind Ltd | 非接触断面寸法測定法 |
JPS6052703A (ja) * | 1983-08-31 | 1985-03-26 | Agency Of Ind Science & Technol | 3次元位置・姿勢検出方式 |
US4682894A (en) * | 1985-03-21 | 1987-07-28 | Robotic Vision Systems, Inc. | Calibration of three-dimensional space |
-
1986
- 1986-05-27 AU AU59552/86A patent/AU589651B2/en not_active Ceased
- 1986-05-27 EP EP86903148A patent/EP0227701B1/en not_active Expired - Lifetime
- 1986-05-27 US US07/014,052 patent/US4801207A/en not_active Expired - Fee Related
- 1986-05-27 DE DE86903148T patent/DE3684267D1/de not_active Expired - Fee Related
- 1986-05-27 KR KR1019870700131A patent/KR940007111B1/ko not_active IP Right Cessation
- 1986-05-27 WO PCT/AU1986/000150 patent/WO1986007443A1/en active IP Right Grant
- 1986-05-27 AT AT86903148T patent/ATE73541T1/de not_active IP Right Cessation
- 1986-05-27 JP JP61503087A patent/JP2502554B2/ja not_active Expired - Lifetime
- 1986-06-03 CA CA000510747A patent/CA1252211A/en not_active Expired
- 1986-06-11 ZA ZA864374A patent/ZA864374B/xx unknown
Also Published As
Publication number | Publication date |
---|---|
WO1986007443A1 (en) | 1986-12-18 |
CA1252211A (en) | 1989-04-04 |
US4801207A (en) | 1989-01-31 |
JP2502554B2 (ja) | 1996-05-29 |
EP0227701A4 (en) | 1990-09-05 |
JPS62503121A (ja) | 1987-12-10 |
DE3684267D1 (en) | 1992-04-16 |
EP0227701A1 (en) | 1987-07-08 |
ATE73541T1 (de) | 1992-03-15 |
KR880700244A (ko) | 1988-02-22 |
AU5955286A (en) | 1987-01-07 |
KR940007111B1 (ko) | 1994-08-05 |
AU589651B2 (en) | 1989-10-19 |
EP0227701B1 (en) | 1992-03-11 |
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