ATE73541T1 - Optische bestimmung der oberflaechenprofile. - Google Patents
Optische bestimmung der oberflaechenprofile.Info
- Publication number
- ATE73541T1 ATE73541T1 AT86903148T AT86903148T ATE73541T1 AT E73541 T1 ATE73541 T1 AT E73541T1 AT 86903148 T AT86903148 T AT 86903148T AT 86903148 T AT86903148 T AT 86903148T AT E73541 T1 ATE73541 T1 AT E73541T1
- Authority
- AT
- Austria
- Prior art keywords
- pct
- cross
- profile
- detected
- datum
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Transplanting Machines (AREA)
- Absorbent Articles And Supports Therefor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AUPH103985 | 1985-06-14 | ||
| PCT/AU1986/000150 WO1986007443A1 (en) | 1985-06-14 | 1986-05-27 | Optical determination of surface profiles |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE73541T1 true ATE73541T1 (de) | 1992-03-15 |
Family
ID=3771148
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT86903148T ATE73541T1 (de) | 1985-06-14 | 1986-05-27 | Optische bestimmung der oberflaechenprofile. |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US4801207A (de) |
| EP (1) | EP0227701B1 (de) |
| JP (1) | JP2502554B2 (de) |
| KR (1) | KR940007111B1 (de) |
| AT (1) | ATE73541T1 (de) |
| AU (1) | AU589651B2 (de) |
| CA (1) | CA1252211A (de) |
| DE (1) | DE3684267D1 (de) |
| WO (1) | WO1986007443A1 (de) |
| ZA (1) | ZA864374B (de) |
Families Citing this family (58)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5119205A (en) * | 1963-03-11 | 1992-06-02 | Lemelson Jerome H | Methods and apparatus for scanning and analyzing selected images areas |
| GB2091526B (en) * | 1981-01-13 | 1985-10-02 | Harris Corp | Digital map generator and display system |
| FR2627423A1 (fr) * | 1988-02-23 | 1989-08-25 | Cerisy Sa | Systeme de tranchage a masse constante d'un produit |
| US4925308A (en) * | 1988-08-09 | 1990-05-15 | Robotic Vision System, Inc. | Calibration of three-dimensional space |
| US5083867A (en) * | 1988-11-28 | 1992-01-28 | Allegheny Ludlum Corporation | Slab surface contour monitor |
| JPH0641851B2 (ja) * | 1989-04-05 | 1994-06-01 | 日本鋼管株式会社 | 3次元曲面形状の測定装置 |
| DE3923275A1 (de) * | 1989-07-14 | 1991-01-24 | Fraunhofer Ges Forschung | Vorrichtung zur optischen messung von werkstueckprofilen profilerzeugender maschinen |
| DE4002743A1 (de) * | 1990-01-31 | 1991-08-08 | Fraunhofer Ges Forschung | Vorrichtung zum messen der position eines filamentbuendels |
| FR2670283B1 (fr) * | 1990-12-05 | 1994-10-14 | Commissariat Energie Atomique | Procede d'etalonnage d'un systeme de metrologie tridimensionnelle. |
| US5619587A (en) * | 1991-05-10 | 1997-04-08 | Aluminum Company Of America | System and method for contactlessly gauging the thickness of a contoured object, such as a vehicle wheel |
| US5311289A (en) * | 1991-09-09 | 1994-05-10 | Honda Giken Kogyo Kabushiki Kaisha | Picture processing method in optical measuring apparatus |
| US5245409A (en) * | 1991-11-27 | 1993-09-14 | Arvin Industries, Inc. | Tube seam weld inspection device |
| US5379106A (en) * | 1992-04-24 | 1995-01-03 | Forensic Technology Wai, Inc. | Method and apparatus for monitoring and adjusting the position of an article under optical observation |
| DE4218971C2 (de) * | 1992-06-10 | 1994-09-22 | Grecon Greten Gmbh & Co Kg | Verfahren zur Kalibrierung eines Bildverarbeitungssystems |
| FR2707008A1 (en) * | 1993-06-21 | 1994-12-30 | Peugeot | Method for inspecting a weld bead, in particular on a motor-vehicle suspension sphere and device for implementing this method |
| US6407817B1 (en) * | 1993-12-20 | 2002-06-18 | Minolta Co., Ltd. | Measuring system with improved method of reading image data of an object |
| US5557410A (en) * | 1994-05-26 | 1996-09-17 | Lockheed Missiles & Space Company, Inc. | Method of calibrating a three-dimensional optical measurement system |
| US5675407A (en) * | 1995-03-02 | 1997-10-07 | Zheng Jason Geng | Color ranging method for high speed low-cost three dimensional surface profile measurement |
| US5691815A (en) * | 1996-01-02 | 1997-11-25 | Lockheed Missiles & Space Co., Inc. | Laser inspection tool system |
| US5892808A (en) * | 1996-06-28 | 1999-04-06 | Techne Systems, Inc. | Method and apparatus for feature detection in a workpiece |
| CN1266581A (zh) * | 1997-07-21 | 2000-09-13 | 声学定位研究公司 | 虚拟定位媒体控制系统 |
| US6272437B1 (en) | 1998-04-17 | 2001-08-07 | Cae Inc. | Method and apparatus for improved inspection and classification of attributes of a workpiece |
| US6882434B1 (en) | 1999-04-20 | 2005-04-19 | Formax, Inc. | Automated product profiling apparatus and product slicing system using same |
| US7034272B1 (en) * | 1999-10-05 | 2006-04-25 | Electro Scientific Industries, Inc. | Method and apparatus for evaluating integrated circuit packages having three dimensional features |
| ITVE20000036A1 (it) * | 2000-07-18 | 2002-01-18 | Tecnogamma S A S Di Zanini E & | Apparecchiatura di rilevamento dei parametri caratteristici di una linea aerea ferrotramviaria. |
| SE520060C2 (sv) * | 2000-10-12 | 2003-05-13 | Latronix Ab | System och förfarande för kontinuerlig bestämning av storleken på ett objekt vars storlek varierar i tiden |
| GB2371866A (en) * | 2001-01-31 | 2002-08-07 | Hewlett Packard Co | Measuring apparatus |
| CA2460674A1 (en) * | 2001-10-02 | 2003-04-10 | Quantum Dot Corporation | Method of semiconductor nanoparticle synthesis |
| GB2399165B (en) * | 2003-03-06 | 2006-01-11 | Aea Technology Plc | Calibration of optical profile scanner |
| DE10334651A1 (de) * | 2003-07-28 | 2005-03-03 | BFI VDEh-Institut für angewandte Forschung GmbH | Messverfahren für optisch erfassbare Eigenschaften eines Walzstahls und Messvorrichtung mit einer Kamera und mehreren Lichtleitern |
| US7460250B2 (en) * | 2003-10-24 | 2008-12-02 | 3Dm Devices Inc. | Laser triangulation system |
| US7876455B2 (en) * | 2004-08-03 | 2011-01-25 | TechnoDream21 Co., Ltd. | Three-dimensional shape measuring method and apparatus for the same |
| DE102004057092A1 (de) * | 2004-11-25 | 2006-06-01 | Hauni Maschinenbau Ag | Messen des Durchmessers von stabförmigen Artikeln der Tabak verarbeitenden Industrie |
| US7633635B2 (en) * | 2006-08-07 | 2009-12-15 | GII Acquisitions, LLC | Method and system for automatically identifying non-labeled, manufactured parts |
| JP2008309714A (ja) * | 2007-06-15 | 2008-12-25 | Yokohama Rubber Co Ltd:The | 長尺物の外観検査方法及びその装置 |
| WO2008153141A1 (ja) * | 2007-06-15 | 2008-12-18 | The Yokohama Rubber Co., Ltd. | 長尺物の外観検査方法及びその装置 |
| JP4544272B2 (ja) * | 2007-06-15 | 2010-09-15 | 横浜ゴム株式会社 | 長尺物の外観検査方法及びその装置 |
| DE102008016736A1 (de) | 2008-03-31 | 2009-10-01 | Urban Gmbh & Co Maschinenbau Kg | Bearbeitungsmaschine für Tür- beziehungsweise Fensterrahmenprofile |
| ATE494529T1 (de) * | 2008-07-04 | 2011-01-15 | Sick Ivp Ab | Kalibrierung eines profilmesssystems |
| EP3483553A1 (de) | 2009-10-27 | 2019-05-15 | Formax, Inc. | Automatische produktprofilierungsvorrichtung und produktschneidesystem mit verwendung davon |
| DE102009059855A1 (de) | 2009-12-21 | 2011-06-22 | Weber Maschinenbau GmbH, 35236 | Abtasteinrichtung |
| US8134717B2 (en) * | 2010-05-21 | 2012-03-13 | LTS Scale Company | Dimensional detection system and associated method |
| US8428392B1 (en) * | 2010-09-08 | 2013-04-23 | Xiagen Feng | Systems and methods for measuring geometry parameters with a reference object whose thickness can not be ignored in images |
| CN103808277B (zh) * | 2013-12-23 | 2016-07-06 | 天津大学 | 一种多传感器点云拼接误差的修正方法 |
| WO2015134794A2 (en) | 2014-03-05 | 2015-09-11 | Smart Picture Technologies, Inc. | Method and system for 3d capture based on structure from motion with simplified pose detection |
| JP6409307B2 (ja) * | 2014-04-07 | 2018-10-24 | 大同特殊鋼株式会社 | 形状計測装置 |
| US20160044301A1 (en) * | 2014-08-06 | 2016-02-11 | Dejan JOVANOVICH | 3d modeling of imaged objects using camera position and pose to obtain accuracy with reduced processing requirements |
| US20160134860A1 (en) * | 2014-11-12 | 2016-05-12 | Dejan Jovanovic | Multiple template improved 3d modeling of imaged objects using camera position and pose to obtain accuracy |
| US10083522B2 (en) | 2015-06-19 | 2018-09-25 | Smart Picture Technologies, Inc. | Image based measurement system |
| ITUB20155673A1 (it) * | 2015-11-18 | 2017-05-18 | Gd Spa | Unita di ispezione di un elemento allungato. |
| ITUB20155646A1 (it) * | 2015-11-18 | 2017-05-18 | Gd Spa | Metodo di ispezione di un elemento allungato. |
| DE102016121659A1 (de) * | 2016-11-11 | 2018-05-17 | New Np Gmbh | Vorrichtung und Verfahren zur Erfassung und/oder Untersuchung eines Abtrages an einer Oberfläche eines zylindrischen Bauteiles |
| US10304254B2 (en) | 2017-08-08 | 2019-05-28 | Smart Picture Technologies, Inc. | Method for measuring and modeling spaces using markerless augmented reality |
| KR102104982B1 (ko) * | 2018-12-21 | 2020-04-28 | 동국대학교 산학협력단 | 음식 재료에 대한 썰기 능력 평가 지원 장치 및 그 동작 방법 |
| US11138757B2 (en) | 2019-05-10 | 2021-10-05 | Smart Picture Technologies, Inc. | Methods and systems for measuring and modeling spaces using markerless photo-based augmented reality process |
| JP7495121B2 (ja) * | 2020-12-21 | 2024-06-04 | 株式会社シーマイクロ | 治具及びこれを用いた画像処理システム |
| US11568614B1 (en) | 2021-08-02 | 2023-01-31 | Bank Of America Corporation | Adaptive augmented reality system for dynamic processing of spatial component parameters based on detecting accommodation factors in real time |
| CN116793257B (zh) * | 2023-08-28 | 2023-10-27 | 成都量芯集成科技有限公司 | 一种三维测量系统和方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3854822A (en) * | 1973-06-27 | 1974-12-17 | Vsi Corp | Electro-optical scanning system for dimensional gauging of parts |
| DE2412359A1 (de) * | 1974-03-14 | 1975-09-25 | Dornier System Gmbh | Verfahren und geraet zur beruehrungslosen vermessung von objektkonturen |
| DE2514930A1 (de) * | 1975-04-05 | 1976-10-14 | Opto Produkte Ag | Verfahren zur optischen ermittlung und zum vergleich von formen und lagen von objekten |
| US4188544A (en) * | 1977-08-22 | 1980-02-12 | Weyerhaeuser Company | Method and apparatus for automatically processing a workpiece employing calibrated scanning |
| US4246606A (en) * | 1979-04-17 | 1981-01-20 | Hajime Industries Ltd. | Inspection apparatus |
| US4375921A (en) * | 1980-03-13 | 1983-03-08 | Selective Electronic Co. Ab | Dimension measuring apparatus |
| US4498778A (en) * | 1981-03-30 | 1985-02-12 | Technical Arts Corporation | High speed scanning method and apparatus |
| WO1983000738A1 (en) * | 1981-08-14 | 1983-03-03 | Kenyon, Michael | Optical determination of surface profiles |
| JPS59112211A (ja) * | 1982-09-29 | 1984-06-28 | テクニカル、ア−ツ、コ−ポレ−シヨン | 加工物の空間座標決定方法および装置 |
| JPS59203904A (ja) * | 1983-05-02 | 1984-11-19 | Sumitomo Electric Ind Ltd | 非接触断面寸法測定法 |
| JPS6052703A (ja) * | 1983-08-31 | 1985-03-26 | Agency Of Ind Science & Technol | 3次元位置・姿勢検出方式 |
| US4682894A (en) * | 1985-03-21 | 1987-07-28 | Robotic Vision Systems, Inc. | Calibration of three-dimensional space |
-
1986
- 1986-05-27 KR KR1019870700131A patent/KR940007111B1/ko not_active Expired - Fee Related
- 1986-05-27 JP JP61503087A patent/JP2502554B2/ja not_active Expired - Lifetime
- 1986-05-27 US US07/014,052 patent/US4801207A/en not_active Expired - Fee Related
- 1986-05-27 DE DE86903148T patent/DE3684267D1/de not_active Expired - Fee Related
- 1986-05-27 WO PCT/AU1986/000150 patent/WO1986007443A1/en not_active Ceased
- 1986-05-27 AT AT86903148T patent/ATE73541T1/de not_active IP Right Cessation
- 1986-05-27 AU AU59552/86A patent/AU589651B2/en not_active Ceased
- 1986-05-27 EP EP86903148A patent/EP0227701B1/de not_active Expired - Lifetime
- 1986-06-03 CA CA000510747A patent/CA1252211A/en not_active Expired
- 1986-06-11 ZA ZA864374A patent/ZA864374B/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR940007111B1 (ko) | 1994-08-05 |
| DE3684267D1 (en) | 1992-04-16 |
| JP2502554B2 (ja) | 1996-05-29 |
| US4801207A (en) | 1989-01-31 |
| EP0227701A1 (de) | 1987-07-08 |
| CA1252211A (en) | 1989-04-04 |
| AU589651B2 (en) | 1989-10-19 |
| EP0227701A4 (en) | 1990-09-05 |
| JPS62503121A (ja) | 1987-12-10 |
| KR880700244A (ko) | 1988-02-22 |
| AU5955286A (en) | 1987-01-07 |
| EP0227701B1 (de) | 1992-03-11 |
| WO1986007443A1 (en) | 1986-12-18 |
| ZA864374B (en) | 1987-02-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification | ||
| REN | Ceased due to non-payment of the annual fee |