ATE73541T1 - Optische bestimmung der oberflaechenprofile. - Google Patents

Optische bestimmung der oberflaechenprofile.

Info

Publication number
ATE73541T1
ATE73541T1 AT86903148T AT86903148T ATE73541T1 AT E73541 T1 ATE73541 T1 AT E73541T1 AT 86903148 T AT86903148 T AT 86903148T AT 86903148 T AT86903148 T AT 86903148T AT E73541 T1 ATE73541 T1 AT E73541T1
Authority
AT
Austria
Prior art keywords
pct
cross
profile
detected
datum
Prior art date
Application number
AT86903148T
Other languages
English (en)
Inventor
Daryl Noel Williams
Original Assignee
Broken Hill Pty Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Broken Hill Pty Co Ltd filed Critical Broken Hill Pty Co Ltd
Application granted granted Critical
Publication of ATE73541T1 publication Critical patent/ATE73541T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Transplanting Machines (AREA)
  • Absorbent Articles And Supports Therefor (AREA)
  • Image Processing (AREA)
AT86903148T 1985-06-14 1986-05-27 Optische bestimmung der oberflaechenprofile. ATE73541T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPH103985 1985-06-14
PCT/AU1986/000150 WO1986007443A1 (en) 1985-06-14 1986-05-27 Optical determination of surface profiles

Publications (1)

Publication Number Publication Date
ATE73541T1 true ATE73541T1 (de) 1992-03-15

Family

ID=3771148

Family Applications (1)

Application Number Title Priority Date Filing Date
AT86903148T ATE73541T1 (de) 1985-06-14 1986-05-27 Optische bestimmung der oberflaechenprofile.

Country Status (10)

Country Link
US (1) US4801207A (de)
EP (1) EP0227701B1 (de)
JP (1) JP2502554B2 (de)
KR (1) KR940007111B1 (de)
AT (1) ATE73541T1 (de)
AU (1) AU589651B2 (de)
CA (1) CA1252211A (de)
DE (1) DE3684267D1 (de)
WO (1) WO1986007443A1 (de)
ZA (1) ZA864374B (de)

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DE10334651A1 (de) * 2003-07-28 2005-03-03 BFI VDEh-Institut für angewandte Forschung GmbH Messverfahren für optisch erfassbare Eigenschaften eines Walzstahls und Messvorrichtung mit einer Kamera und mehreren Lichtleitern
US7460250B2 (en) * 2003-10-24 2008-12-02 3Dm Devices Inc. Laser triangulation system
WO2006013635A1 (ja) * 2004-08-03 2006-02-09 Techno Dream 21 Co., Ltd. 3次元形状計測方法及びその装置
DE102004057092A1 (de) * 2004-11-25 2006-06-01 Hauni Maschinenbau Ag Messen des Durchmessers von stabförmigen Artikeln der Tabak verarbeitenden Industrie
US7633635B2 (en) * 2006-08-07 2009-12-15 GII Acquisitions, LLC Method and system for automatically identifying non-labeled, manufactured parts
JP2008309714A (ja) * 2007-06-15 2008-12-25 Yokohama Rubber Co Ltd:The 長尺物の外観検査方法及びその装置
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US8428392B1 (en) * 2010-09-08 2013-04-23 Xiagen Feng Systems and methods for measuring geometry parameters with a reference object whose thickness can not be ignored in images
CN103808277B (zh) * 2013-12-23 2016-07-06 天津大学 一种多传感器点云拼接误差的修正方法
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JP6409307B2 (ja) * 2014-04-07 2018-10-24 大同特殊鋼株式会社 形状計測装置
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US20160134860A1 (en) * 2014-11-12 2016-05-12 Dejan Jovanovic Multiple template improved 3d modeling of imaged objects using camera position and pose to obtain accuracy
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ITUB20155673A1 (it) * 2015-11-18 2017-05-18 Gd Spa Unita di ispezione di un elemento allungato.
DE102016121659A1 (de) * 2016-11-11 2018-05-17 New Np Gmbh Vorrichtung und Verfahren zur Erfassung und/oder Untersuchung eines Abtrages an einer Oberfläche eines zylindrischen Bauteiles
US10304254B2 (en) 2017-08-08 2019-05-28 Smart Picture Technologies, Inc. Method for measuring and modeling spaces using markerless augmented reality
KR102104982B1 (ko) * 2018-12-21 2020-04-28 동국대학교 산학협력단 음식 재료에 대한 썰기 능력 평가 지원 장치 및 그 동작 방법
US11138757B2 (en) 2019-05-10 2021-10-05 Smart Picture Technologies, Inc. Methods and systems for measuring and modeling spaces using markerless photo-based augmented reality process
US11568614B1 (en) 2021-08-02 2023-01-31 Bank Of America Corporation Adaptive augmented reality system for dynamic processing of spatial component parameters based on detecting accommodation factors in real time
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Also Published As

Publication number Publication date
US4801207A (en) 1989-01-31
AU589651B2 (en) 1989-10-19
KR880700244A (ko) 1988-02-22
CA1252211A (en) 1989-04-04
JPS62503121A (ja) 1987-12-10
DE3684267D1 (en) 1992-04-16
KR940007111B1 (ko) 1994-08-05
WO1986007443A1 (en) 1986-12-18
EP0227701A1 (de) 1987-07-08
AU5955286A (en) 1987-01-07
JP2502554B2 (ja) 1996-05-29
ZA864374B (en) 1987-02-25
EP0227701B1 (de) 1992-03-11
EP0227701A4 (en) 1990-09-05

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UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee