ZA200608630B - Device for the analysis of elements - Google Patents
Device for the analysis of elements Download PDFInfo
- Publication number
- ZA200608630B ZA200608630B ZA200608630A ZA200608630A ZA200608630B ZA 200608630 B ZA200608630 B ZA 200608630B ZA 200608630 A ZA200608630 A ZA 200608630A ZA 200608630 A ZA200608630 A ZA 200608630A ZA 200608630 B ZA200608630 B ZA 200608630B
- Authority
- ZA
- South Africa
- Prior art keywords
- tube
- case
- opening
- measuring region
- measuring
- Prior art date
Links
- 238000004458 analytical method Methods 0.000 title claims description 4
- 238000004876 x-ray fluorescence Methods 0.000 claims description 30
- 230000005855 radiation Effects 0.000 claims description 26
- 239000000126 substance Substances 0.000 claims description 18
- 239000001307 helium Substances 0.000 claims description 16
- 229910052734 helium Inorganic materials 0.000 claims description 16
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 16
- 238000011010 flushing procedure Methods 0.000 claims description 12
- 239000007789 gas Substances 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 12
- 230000005284 excitation Effects 0.000 claims description 8
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 2
- 229910052726 zirconium Inorganic materials 0.000 claims description 2
- 239000013013 elastic material Substances 0.000 claims 2
- 238000010521 absorption reaction Methods 0.000 description 11
- 239000000428 dust Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 235000002918 Fraxinus excelsior Nutrition 0.000 description 3
- 239000002956 ash Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910052790 beryllium Inorganic materials 0.000 description 2
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- WHBHBVVOGNECLV-OBQKJFGGSA-N 11-deoxycortisol Chemical compound O=C1CC[C@]2(C)[C@H]3CC[C@](C)([C@@](CC4)(O)C(=O)CO)[C@@H]4[C@@H]3CCC2=C1 WHBHBVVOGNECLV-OBQKJFGGSA-N 0.000 description 1
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004019030A DE102004019030A1 (de) | 2004-04-17 | 2004-04-17 | Vorrichtung für die Elementanalyse |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA200608630B true ZA200608630B (en) | 2007-09-26 |
Family
ID=34966049
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA200608630A ZA200608630B (en) | 2004-04-17 | 2006-10-16 | Device for the analysis of elements |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US7688942B2 (fr) |
| EP (1) | EP1738157B1 (fr) |
| AU (1) | AU2005233722B2 (fr) |
| CA (1) | CA2563462C (fr) |
| DE (1) | DE102004019030A1 (fr) |
| LT (1) | LT1738157T (fr) |
| PL (1) | PL1738157T3 (fr) |
| WO (1) | WO2005100963A1 (fr) |
| ZA (1) | ZA200608630B (fr) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011005732B4 (de) * | 2011-03-17 | 2013-08-22 | Carl Zeiss Microscopy Gmbh | Einrichtung zur Röntgenspektroskopie |
| JP6096418B2 (ja) * | 2012-04-12 | 2017-03-15 | 株式会社堀場製作所 | Ｘ線検出装置 |
| JP6096419B2 (ja) * | 2012-04-12 | 2017-03-15 | 株式会社堀場製作所 | Ｘ線検出装置 |
| JP6081260B2 (ja) * | 2013-03-28 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光ｘ線分析装置 |
| CN105247354A (zh) * | 2013-05-27 | 2016-01-13 | 株式会社岛津制作所 | 荧光x射线分析装置 |
| US9594033B2 (en) * | 2014-07-22 | 2017-03-14 | The Boeing Company | Visible X-ray indication and detection system for X-ray backscatter applications |
| DE102015221323B3 (de) | 2015-10-30 | 2016-08-04 | Airbus Defence and Space GmbH | Verfahren zum Nachweis von Oberflächenverunreinigungen mittels Röntgenfluoreszenzanalyse |
| JP6933120B2 (ja) * | 2017-12-14 | 2021-09-08 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| AU2019268796A1 (en) * | 2018-05-18 | 2020-12-17 | Enersoft Inc. | Systems, devices, and methods for analysis of geological samples |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3710104A (en) * | 1969-11-04 | 1973-01-09 | Republic Steel Corp | Method and apparatus for x-ray interrogation of a sample |
| US3889113A (en) * | 1973-05-03 | 1975-06-10 | Columbia Scient Ind Inc | Radioisotope-excited, energy-dispersive x-ray fluorescence apparatus |
| US4185202A (en) * | 1977-12-05 | 1980-01-22 | Bell Telephone Laboratories, Incorporated | X-ray lithography |
| US4484339A (en) * | 1981-02-09 | 1984-11-20 | Battelle Development Corporation | Providing X-rays |
| FI97647C (fi) * | 1994-11-14 | 1997-01-27 | Ima Engineering Ltd Oy | Menetelmä ja laitteisto alkuaineen pitoisuuden määrittämiseksi |
| EP0781992B1 (fr) * | 1995-12-21 | 2006-06-07 | Horiba, Ltd. | Appareil d'analyse de fluorescence à rayons X |
| US6052429A (en) * | 1997-02-20 | 2000-04-18 | Dkk Corporation | X-ray analyzing apparatus |
| DE19820321B4 (de) * | 1998-05-07 | 2004-09-16 | Bruker Axs Gmbh | Kompaktes Röntgenspektrometer |
| JP3921872B2 (ja) * | 1999-05-20 | 2007-05-30 | 株式会社島津製作所 | 蛍光ｘ線分析用データ処理装置 |
| JP4646418B2 (ja) * | 2000-04-06 | 2011-03-09 | エスアイアイ・ナノテクノロジー株式会社 | 蛍光ｘ線分析装置 |
| JP3521425B2 (ja) * | 2001-04-04 | 2004-04-19 | 株式会社島津製作所 | Ｘ線分析装置 |
| AU2002324849B2 (en) * | 2001-09-04 | 2008-01-24 | Quality Control, Inc. | X-ray fluorescence measuring system and methods for trace elements |
| JP3724424B2 (ja) * | 2002-01-16 | 2005-12-07 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| JP2003222698A (ja) * | 2002-01-31 | 2003-08-08 | Seiko Instruments Inc | Ｘ線分析装置 |
| DE10230990A1 (de) * | 2002-07-10 | 2004-02-05 | Elisabeth Katz | Vorrichtung zur Durchführung einer Online-Elementanalyse |
| GB0321039D0 (en) * | 2003-09-09 | 2003-10-08 | Council Cent Lab Res Councils | Ionising particle analyser |
| US7233643B2 (en) * | 2005-05-20 | 2007-06-19 | Oxford Instruments Analytical Oy | Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy |
-
2004
- 2004-04-17 DE DE102004019030A patent/DE102004019030A1/de not_active Withdrawn
-
2005
- 2005-04-15 CA CA2563462A patent/CA2563462C/fr not_active Expired - Fee Related
- 2005-04-15 PL PL05735820T patent/PL1738157T3/pl unknown
- 2005-04-15 WO PCT/EP2005/003976 patent/WO2005100963A1/fr active Application Filing
- 2005-04-15 LT LTEP05735820.2T patent/LT1738157T/lt unknown
- 2005-04-15 AU AU2005233722A patent/AU2005233722B2/en not_active Ceased
- 2005-04-15 EP EP05735820.2A patent/EP1738157B1/fr not_active Not-in-force
- 2005-04-15 US US11/578,537 patent/US7688942B2/en not_active Expired - Fee Related
-
2006
- 2006-10-16 ZA ZA200608630A patent/ZA200608630B/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP1738157A1 (fr) | 2007-01-03 |
| CA2563462A1 (fr) | 2005-10-27 |
| WO2005100963A1 (fr) | 2005-10-27 |
| US20080212736A1 (en) | 2008-09-04 |
| PL1738157T3 (pl) | 2018-06-29 |
| DE102004019030A1 (de) | 2005-11-03 |
| EP1738157B1 (fr) | 2018-01-03 |
| CA2563462C (fr) | 2014-04-01 |
| LT1738157T (lt) | 2018-05-25 |
| AU2005233722A1 (en) | 2005-10-27 |
| US7688942B2 (en) | 2010-03-30 |
| AU2005233722B2 (en) | 2011-03-17 |
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