WO2022244595A1 - 電流検出装置 - Google Patents
電流検出装置 Download PDFInfo
- Publication number
- WO2022244595A1 WO2022244595A1 PCT/JP2022/018552 JP2022018552W WO2022244595A1 WO 2022244595 A1 WO2022244595 A1 WO 2022244595A1 JP 2022018552 W JP2022018552 W JP 2022018552W WO 2022244595 A1 WO2022244595 A1 WO 2022244595A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- resistor
- detection device
- current detection
- voltage
- slits
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 161
- 238000010586 diagram Methods 0.000 description 9
- 239000000758 substrate Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000003466 welding Methods 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- 239000007772 electrode material Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 239000000956 alloy Substances 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910000599 Cr alloy Inorganic materials 0.000 description 3
- 229910000914 Mn alloy Inorganic materials 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 3
- 208000032366 Oversensing Diseases 0.000 description 2
- 239000000788 chromium alloy Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 229910000570 Cupronickel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- UPHIPHFJVNKLMR-UHFFFAOYSA-N chromium iron Chemical compound [Cr].[Fe] UPHIPHFJVNKLMR-UHFFFAOYSA-N 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- HPDFFVBPXCTEDN-UHFFFAOYSA-N copper manganese Chemical compound [Mn].[Cu] HPDFFVBPXCTEDN-UHFFFAOYSA-N 0.000 description 1
- YOCUPQPZWBBYIX-UHFFFAOYSA-N copper nickel Chemical compound [Ni].[Cu] YOCUPQPZWBBYIX-UHFFFAOYSA-N 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910000623 nickel–chromium alloy Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C1/00—Details
- H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C13/00—Resistors not provided for elsewhere
Definitions
- the present invention relates to a current detection device, particularly to a current detection device using a shunt resistor.
- Shunt resistors are widely used for current sensing applications.
- Such a shunt resistor comprises a resistor and electrodes joined across the resistor.
- resistors are made of resistance alloys such as copper-nickel alloys, copper-manganese alloys, iron-chromium alloys, and nickel-chromium alloys
- electrodes are made of highly conductive metals such as copper. It is configured.
- a voltage detection section is provided on the electrode, and the voltage generated at both ends of the resistor is detected by connecting a conducting wire (for example, an aluminum wire) to the voltage detection section.
- the temperature coefficient of resistance (TCR) characteristics are important in order to enable current detection under conditions where the influence of temperature fluctuations is small.
- the temperature coefficient of resistance is an index that indicates the rate of change in resistance value due to temperature.
- a current detection device used for current detection includes a resistor and a pair of electrodes connected to both ends of the resistor, wherein the current detection device includes a pair of first slits and A pair of second slits connected to the pair of first slits are formed, and each first slit hangs over each electrode and the resistor along a first direction that is the arrangement direction of the pair of electrodes.
- each second slit is formed in each of the electrodes along a second direction perpendicular to the first direction, and each of the electrodes includes each of the first slits,
- a detection area is defined by each of the second slits and a contact surface at least partially in contact with the resistor, and each of the electrodes further includes a voltage detection unit disposed in the detection area.
- a current sensing device is provided.
- the voltage detection section is arranged closer to the resistor than the center of the detection region. In one aspect, the detection region protrudes from the resistor in the thickness direction of the current detection device. In one aspect, the voltage detection section is arranged adjacent to the contact surface and the first slits. In one aspect, the current detection device further includes a wiring board, and the wiring board includes a detection member connected to the voltage detection section. In one aspect, the pair of first slits are connected.
- the temperature coefficient of resistance can be reduced by arranging the voltage detection section in the detection area defined by the first slit, the second slit, and the contact surface at least partially in contact with the resistor.
- FIG. 1 is a perspective view showing an embodiment of a current detection device as a shunt-type current detection device
- FIG. FIG. 2 is a side view of the current detection device shown in FIG. 1
- FIG. 4 is a partially enlarged view of the shunt resistor, and is a top view of the shunt resistor
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 4 is a schematic diagram showing another embodiment of a current detection device
- FIG. 1 is a perspective view showing one embodiment of a current detection device 30 as a shunt-type current detection device
- FIG. 2 is a side view of the current detection device 30 shown in FIG. Part of the current detection device 30 is omitted in FIG.
- the current detection device 30 has a shunt resistor 1 .
- the current detection device 30 of this embodiment is the shunt resistor 1 itself.
- the shunt resistor 1 includes a resistor 5 made of a resistor alloy plate material having a predetermined thickness and width, and both ends (that is, both side connection surfaces) 5a of the resistor 5 in the first direction.
- the electrode 6 has a contact surface 6a at least partially in contact with one end (one connection surface) 5a of the resistor 5, and the electrode 7 at least partially has the other end (the other connection surface) of the resistor 5. It has a contact surface 7a that contacts the surface 5b.
- Fastening holes 8 and 9 for fixing the shunt resistor 1 with screws or the like are formed in the electrodes 6 and 7, respectively.
- the first direction is the length direction of the current detection device 30, that is, the length direction of the shunt resistor 1, and is the direction in which the electrode 6, the resistor 5, and the electrode 7 are arranged in this order.
- the first direction is the direction in which current flows.
- the direction perpendicular to this first direction is the second direction.
- the second direction is the width direction of the current detection device 30 , that is, the width direction of the shunt resistor 1 .
- electrodes 6 and 7 have the same structure and are arranged symmetrically with respect to resistor 5 .
- Both ends 5a and 5b of the resistor 5 are connected (bonded) to electrodes 6 and 7 by means of welding (for example, electron beam welding, laser beam welding, or brazing).
- welding for example, electron beam welding, laser beam welding, or brazing.
- materials for the resistor 5 include low-resistance alloy materials such as Cu--Mn alloys and Ni--Cr alloys.
- An example of the material of the electrodes 6 and 7 is copper (Cu). Cu--Mn alloys and Ni--Cr alloys have higher resistivity than copper.
- the electrodes 6 and 7 are thicker than the resistor 5 in this embodiment.
- the back surfaces of the electrodes 6 and 7 and the back surface of the resistor 5 are on the same plane.
- Surfaces 6b and 7b of electrodes 6 and 7 are positioned higher than surface 5c of resistor 5 in the thickness direction of current detection device 30 (shunt resistor 1).
- the thickness direction of the current detection device 30 is a direction perpendicular to both the first direction and the second direction.
- a step 18 is formed by the surface 6b of the electrode 6, the contact surface 6a, and the surface 5c of the resistor 5, and a step 19 is formed by the surface 7b of the electrode 7, the contact surface 7a, and the surface 5c of the resistor 5. It is A space SP is formed by the steps 18 and 19 and the surface 5c.
- the shunt resistor 1 of the current detection device 30 has a pair of slits 12 and 13 formed therein.
- Slit 12 includes first slit 16 and second slit 26
- slit 13 includes first slit 17 and second slit 27 . That is, the shunt resistor 1 of the current detection device 30 is formed with a pair of first slits 16 and 17 and a pair of second slits 26 and 27 .
- FIG. 3 is a partially enlarged view of the shunt resistor 1, and is a view of the shunt resistor 1 viewed from above.
- the first slit 16 is formed in the first direction to extend over the electrode 6 and the resistor 5, and the second slit 26 is formed in the electrode 6 in the second direction.
- the first slit 17 is formed in the first direction so as to extend over the electrode 7 and the resistor 5, and the second slit 27 is formed in the electrode 7 in the second direction.
- the first slit 16 is formed from the electrode 6 to a part of the resistor 5 along the first direction
- the first slit 17 is formed from the electrode 7 to the resistor 5 along the first direction. formed over part of the
- the second slits 26, 27 are connected to the first slits 16, 17, respectively. Specifically, one ends of the first slits 16 and 17 are connected to central portions of the second slits 26 and 27, respectively.
- the slits 12 and 13 pass through the shunt resistor 1 in the thickness direction, and have a convex shape toward the resistor 5 when the shunt resistor 1 is viewed from above.
- the electrode 6 has detection regions 24a and 24b defined by the first slit 16, the second slit 26, and the contact surface 6a. Detection areas 25a and 25b are defined by the slit 27 and the contact surface 7a. Detection regions 24 a and 24 b are formed on surface 6 b of electrode 6 , and detection regions 25 a and 25 b are formed on surface 7 b of electrode 7 .
- the detection regions 24a, 24b, 25a, and 25b project more than the resistor 5 in the thickness direction of the current detection device 30 (thickness direction of the shunt resistor 1).
- the electrodes 6 and 7 respectively have voltage detectors 20 and 21 for measuring voltages generated across the resistor 5 (voltage across the resistor 5).
- the voltage detection section 20 is arranged on the detection region 24a, and the voltage detection section 21 is arranged on the detection region 25a.
- voltage detectors 20 and 21 may be arranged on detection regions 24b and 25b, respectively.
- the slits 12 and 13 are formed away from the resistor 5 in order to avoid such concentration of current, the detection area moves away from the resistor 5, and the material of the electrodes 6 and 7 during voltage measurement. (Electrode material) is affected by the temperature characteristics of the resistance value. In order to measure the voltage of the resistor 5 while reducing the influence of the temperature characteristics of the electrode material, it is desirable to extract the voltage from a position close to the resistor 5 .
- the first slit 16 is formed so as to cover the electrode 6 and the resistor 5
- the first slit 17 is formed so as to cover the electrode 7 and the resistor 5 .
- the voltage detection positions (the positions of the voltage detection portions 20 and 21) can be aligned using the edge portions as base points. can. As a result, it is possible to reduce the voltage measurement error due to the voltage detection position and to specify the voltage detection position with good temperature characteristics, so that stable voltage measurement can be performed. Further, by controlling the voltage detection positions (the positions of the voltage detection units 20 and 21), it is possible to correct temperature characteristics for material characteristics and manufacturing variations.
- the slits 12 and 13 have a convex shape, but in one embodiment, the corners of the slits 12 and 13 may have R-planes or C-planes.
- the voltage detection units 20 and 21 are arranged closer to the resistor 5 than the centers (center lines CL1 and CL2) of the detection regions 24a and 25a in the first direction. In one embodiment, the voltage detection units 20 and 21 may be arranged closer to the resistor 5 than the centers (center lines CL1 and CL2) of the detection regions 24b and 25b in the first direction. As a result, the influence of the temperature characteristics of the resistance value of the electrode material can be reduced, and the voltage of the resistor 5 can be measured with higher accuracy.
- the voltage detection unit 20 is arranged adjacent to the contact surface 6a and the sidewall 16a of the first slit 16, and the voltage detection unit 21 is arranged adjacent to the contact surface 7a and the sidewall 17a of the first slit 17. placed adjacent to each other.
- the voltage sensing portion 20 may be arranged adjacent to the contact surface 6a and the side wall 16b of the first slit 16, and the voltage sensing portion 21 may be located adjacent to the contact surface 7a and the side wall 17b of the first slit 17. may be located adjacent to the As a result, the influence of the temperature characteristics of the resistance value of the electrode material can be further reduced, and the voltage of the resistor 5 can be measured with higher accuracy.
- the electrodes 6 and 7 may further have voltage detectors 22 and 23 for measuring the voltage of the resistor 5, as shown in FIG.
- the voltage detection section 22 is arranged on the detection region 24b, and the voltage detection section 23 is arranged on the detection region 25b.
- the voltage detection units 22 and 23 are arranged closer to the resistor 5 than the centers (center lines CL1 and CL2) of the detection regions 24b and 25b in the first direction. More specifically, the voltage detector 22 is arranged adjacent to the contact surface 6a and the sidewall 16b of the first slit 16, and the voltage detector 23 is arranged adjacent to the contact surface 7a and the sidewall 17b of the first slit 17. placed adjacent to each other.
- the voltage detection section 20 and the voltage detection section 22 have the same potential, and the voltage detection section 21 and the voltage detection section 23 have the same potential.
- the shunt resistor 1 is formed by subjecting a long joining material, which consists of a plate-like resistor and a plurality of copper plates joined to both ends of the resistor, to shape processing using a mold, wire cutting, or the like.
- a long joining material which consists of a plate-like resistor and a plurality of copper plates joined to both ends of the resistor.
- the slits 12 and 13 are formed by punching out the shunt resistor 1 with a die or by performing shape processing by wire cutting.
- the shape of the slits 12, 13 can be adjusted to control the TCR characteristic function.
- FIG. 5 is a schematic diagram showing another embodiment of the current detection device 30.
- FIG. Part of the current detection device 30 is omitted in FIG.
- the configuration of this embodiment, which is not particularly described, is the same as that of the embodiment described with reference to FIGS.
- the current detection device 30 of this embodiment includes a shunt resistor 1 and a wiring substrate 31.
- the wiring board 31 includes detection members 36a and 36b.
- Wirings 40 and 41 for transmitting a voltage signal (voltage of the resistor 5) from the shunt resistor 1 are formed on the surface of the substrate body 33 of the wiring substrate 31, and the detection members 36a and 36b are formed through via holes. It is connected to wirings 40 and 41 via 38a and 38b.
- the detection members 36a and 36b are connected to the voltage detection units 20 and 21, respectively.
- An example of the detection members 36a and 36b is a metal pad formed by patterning a copper foil.
- the detection members 36a and 36b are connected to the voltage detection portions 20 and 21 across the steps 18 and 19 (so as to cover the contact surfaces 6a and 7a).
- metal lead frames plate-shaped conductive material or wires may be used instead of the detection members 36a and 36b.
- the shunt resistor 1 of this embodiment has steps 18 and 19, and the detection regions 24a, 24b, 25a, and 25b are wider than the resistor 5 in the thickness direction of the shunt resistor 1. Protruding. Thereby, the detection members 36 a and 36 b can be arranged across the steps 18 and 19 . With such a configuration, the voltage detection position can be brought closer to the resistor 5 . As a result, the voltage of the resistor 5 can be measured with higher accuracy. Further, the steps 18 and 19 can prevent the detection members 36a and 36b from coming into contact with the resistor 5. FIG.
- the resistor 5 is connected to the electrodes 6 and 7 by means such as welding.
- the shunt resistor 1 has steps 18, 19, so that the welding marks are not formed.
- the detection members 36a and 36b can be connected across the steps 18 and 19 without being affected.
- the space SP is formed above the resistor 5 , it is possible to avoid direct transfer of the heat generated by the resistor 5 to the wiring substrate 31 .
- the wiring board 31 includes four detection members 36a, 36b, 36c, and 36d respectively connected to the voltage detection units 20, 21, 22, and 23 (see FIG. 4). may be Via holes 38a, 38b, 38c and 38d connected to wirings (not shown) are connected to the four detection members 36a, 36b, 36c and 36d, respectively.
- illustration of the substrate body 33 is omitted.
- the detection members 36a, 36b, 36c, and 36d are arranged across the steps 18 and 19 as well.
- FIG. 7 is a perspective view showing still another embodiment of the current detection device 30.
- FIG. The configuration of this embodiment, which is not particularly described, is the same as that of the embodiment described with reference to FIGS.
- one ends of the first slits 16 and 17 are connected to one ends of the second slits 26 and 27, respectively.
- the slits 12 and 13 have an L-shape when the shunt resistor 1 is viewed from above.
- the electrode 6 has a detection area 24a defined by the first slit 16, the second slit 26 and the contact surface 6a, and the electrode 7 has the detection area 24a by the first slit 17, the second slit 27 and the contact surface 7a.
- a region 25a is defined.
- FIG. 8 is a perspective view showing still another embodiment of the current detection device 30.
- FIG. The configuration of this embodiment which is not particularly described, is the same as that of the embodiment described with reference to FIG. 7, so redundant description thereof will be omitted.
- the position of the first slit 16 in the second direction is different from the position of the first slit 17 in the second direction, and the second slits 26 and 27 extend in opposite directions. That is, the orientation of the L-shaped slits 12 and 13 is reversed vertically and horizontally when the shunt resistor 1 is viewed from above.
- This embodiment can also achieve the effects described with reference to FIGS. 1 to 4, and the embodiments described with reference to FIGS. 5 and 6 can also be applied to this embodiment.
- FIG. 9 is a perspective view showing still another embodiment of the current detection device 30.
- FIG. Part of the current detection device 30 is omitted in FIG. Since the configuration of this embodiment, which is not particularly described, is the same as that of the embodiment described with reference to FIG. 4, redundant description thereof will be omitted.
- a current detection device 30 of this embodiment includes a shunt resistor 1 and voltage detection terminals 50 , 51 , 52 and 53 .
- the shunt resistor 1 of this embodiment differs from the shunt resistor 1 of FIG. 4 in that it does not have steps 18 and 19 . That is, in this embodiment, the electrodes 6 and 7 and the resistor 5 have the same thickness.
- the voltage detection terminals 50, 51, 52, 53 are provided on the voltage detection units 20, 21, 22, 23, respectively.
- An example of the voltage detection terminals 50, 51, 52, 53 is a pin terminal. This embodiment can also achieve the effects described with reference to FIGS. 1 to 4, and the embodiments described with reference to FIGS. 7 and 8 can also be applied to this embodiment.
- FIG. 10 is a perspective view showing still another embodiment of the current detection device 30, and FIG. 11 is a partially enlarged view of the current detection device 30. As shown in FIG. FIG. 11 is a top view of the current detection device 30. FIG. The configuration of this embodiment, which is not particularly described, is the same as that of the embodiment described with reference to FIGS. 10 and 11, the illustration of part of the current detection device 30 is omitted.
- the first slit 16 and the first slit 17 are connected. That is, the first slit 16 and the first slit 17 are connected to each other.
- the first slit 16 is formed from the electrode 6 to the electrode 7 and the second slits 26 and 27 are connected to both ends of the first slit 16 .
- the first slit 17 is formed from the electrode 7 to the electrode 6 and the second slits 26 and 27 are connected to both ends of the first slit 17 .
- the electrode 6 may further have a voltage sensing portion 22 located on the sensing area 24b, and the electrode 7 may have a voltage sensing portion 22 located on the sensing area 25b.
- a detection unit 23 may be further provided. In this embodiment, voltage is detected from two pairs of voltage detection units.
- electrode 6 has a voltage sensing portion 20 located over sensing region 24a and electrode 7 has a voltage sensing portion 23 located over sensing region 25b. may have. In this embodiment, the voltage of the resistor 5 is measured on the diagonal line across the first slits 16 and 17 .
- the present invention can be used for current detection devices, particularly current detection devices using shunt resistors.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Details Of Resistors (AREA)
Abstract
Description
一態様では、前記検出領域は、前記電流検出装置の厚さ方向において前記抵抗体よりも突出している。
一態様では、前記電圧検出部は、前記接触面および前記各第1スリットに隣接して配置されている。
一態様では、前記電流検出装置は、配線基板をさらに備え、前記配線基板は、前記電圧検出部に接続される検出部材を備えている。
一態様では、前記一対の第1スリットは繋がっている。
特に説明しない本実施形態の構成は、図1乃至図3を参照して説明した実施形態と同じであるので、その重複する説明を省略する。図10および図11では、電流検出装置30の一部の図示は省略されている。
5 抵抗体
5a,5b 両端(両側接続面)
5c 表面
6,7 電極
6a,7a 接触面
6b,7b 表面
8,9 締結穴
12,13 スリット
16,17 第1スリット
16a,16b,17a,17b 側壁
18,19 段差
20,21,22,23 電圧検出部
24a,24b,25a,25b 検出領域
26,27 第2スリット
30 電流検出装置
31 配線基板
33 基板本体
36a,36b,36c,36d 検出部材
38a,38b,38c,38d ビアホール
40,41 配線
50,51,52,53 電圧検出端子
Claims (6)
- 電流検出に用いられる電流検出装置であって、
抵抗体と、
前記抵抗体の両端に接続された一対の電極と、を備え、
前記電流検出装置には、一対の第1スリットと前記一対の第1スリットに接続された一対の第2スリットが形成されており、
各第1スリットは、前記一対の電極の配置方向である第1方向に沿って各電極および前記抵抗体に掛かるように形成されており、
各第2スリットは、前記第1方向に垂直な方向である第2方向に沿って前記各電極に形成されており、
前記各電極には、前記各第1スリット、前記各第2スリット、および少なくとも一部が前記抵抗体に接触する接触面によって検出領域が区画されており、
前記各電極は、前記検出領域に配置された電圧検出部をさらに有している、電流検出装置。 - 前記電圧検出部は、前記検出領域の中心よりも前記抵抗体に近い側に配置されている、請求項1に記載の電流検出装置。
- 前記検出領域は、前記電流検出装置の厚さ方向において前記抵抗体よりも突出している、請求項1または2に記載の電流検出装置。
- 前記電圧検出部は、前記接触面および前記各第1スリットに隣接して配置されている、請求項1乃至3のいずれか一項に記載の電流検出装置。
- 配線基板をさらに備え、
前記配線基板は、前記電圧検出部に接続される検出部材を備えている、請求項1乃至4のいずれか一項に記載の電流検出装置。 - 前記一対の第1スリットは繋がっている、請求項1乃至5のいずれか一項に記載の電流検出装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112022002646.4T DE112022002646T5 (de) | 2021-05-18 | 2022-04-22 | Stromerfassungsvorrichtung |
CN202280035456.4A CN117378018A (zh) | 2021-05-18 | 2022-04-22 | 电流检测装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021-083739 | 2021-05-18 | ||
JP2021083739A JP2022177468A (ja) | 2021-05-18 | 2021-05-18 | 電流検出装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2022244595A1 true WO2022244595A1 (ja) | 2022-11-24 |
Family
ID=84141356
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2022/018552 WO2022244595A1 (ja) | 2021-05-18 | 2022-04-22 | 電流検出装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2022177468A (ja) |
CN (1) | CN117378018A (ja) |
DE (1) | DE112022002646T5 (ja) |
WO (1) | WO2022244595A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117095886A (zh) * | 2023-08-11 | 2023-11-21 | 钧崴电子科技股份有限公司 | 一种分流器的加工方法及分流器 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009250731A (ja) * | 2008-04-04 | 2009-10-29 | Taiyosha Electric Co Ltd | 電流検出用抵抗器及び電流検出用抵抗器の実装構造 |
CN201429643Y (zh) * | 2009-07-06 | 2010-03-24 | 山东山大奥太电气有限公司 | 一种新型分流器 |
JP2016537637A (ja) * | 2013-11-26 | 2016-12-01 | スマート エレクトロニクス インク | 電流測定素子及び電流測定素子アセンブリ |
JP2020027847A (ja) * | 2018-08-10 | 2020-02-20 | Koa株式会社 | シャント装置 |
JP2020145365A (ja) * | 2019-03-08 | 2020-09-10 | サンコール株式会社 | シャント抵抗器及びその製造方法 |
JP2022027164A (ja) * | 2020-07-31 | 2022-02-10 | 株式会社デンソー | 電流検出装置 |
-
2021
- 2021-05-18 JP JP2021083739A patent/JP2022177468A/ja active Pending
-
2022
- 2022-04-22 CN CN202280035456.4A patent/CN117378018A/zh active Pending
- 2022-04-22 DE DE112022002646.4T patent/DE112022002646T5/de active Pending
- 2022-04-22 WO PCT/JP2022/018552 patent/WO2022244595A1/ja active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009250731A (ja) * | 2008-04-04 | 2009-10-29 | Taiyosha Electric Co Ltd | 電流検出用抵抗器及び電流検出用抵抗器の実装構造 |
CN201429643Y (zh) * | 2009-07-06 | 2010-03-24 | 山东山大奥太电气有限公司 | 一种新型分流器 |
JP2016537637A (ja) * | 2013-11-26 | 2016-12-01 | スマート エレクトロニクス インク | 電流測定素子及び電流測定素子アセンブリ |
JP2020027847A (ja) * | 2018-08-10 | 2020-02-20 | Koa株式会社 | シャント装置 |
JP2020145365A (ja) * | 2019-03-08 | 2020-09-10 | サンコール株式会社 | シャント抵抗器及びその製造方法 |
JP2022027164A (ja) * | 2020-07-31 | 2022-02-10 | 株式会社デンソー | 電流検出装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117095886A (zh) * | 2023-08-11 | 2023-11-21 | 钧崴电子科技股份有限公司 | 一种分流器的加工方法及分流器 |
Also Published As
Publication number | Publication date |
---|---|
JP2022177468A (ja) | 2022-12-01 |
CN117378018A (zh) | 2024-01-09 |
DE112022002646T5 (de) | 2024-02-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4138215B2 (ja) | チップ抵抗器の製造方法 | |
JP6384211B2 (ja) | シャント抵抗器 | |
US9305687B2 (en) | Current sensing resistor | |
WO2021220895A1 (ja) | 電流検出装置 | |
US10267824B2 (en) | Shunt resistor | |
JP7491723B2 (ja) | シャント抵抗器 | |
JP7173755B2 (ja) | シャント抵抗器の実装構造 | |
WO2022244595A1 (ja) | 電流検出装置 | |
JP7491727B2 (ja) | シャント抵抗器 | |
US20230187105A1 (en) | Shunt resistor and current detection apparatus | |
JP2002184601A (ja) | 抵抗器 | |
JP4712943B2 (ja) | 抵抗器の製造方法および抵抗器 | |
JP5445193B2 (ja) | 抵抗器、抵抗器の実装方法、抵抗器の測定方法 | |
WO2024111254A1 (ja) | シャント抵抗器 | |
WO2023199611A1 (ja) | シャント抵抗器およびシャント抵抗装置 | |
JP7446798B2 (ja) | シャント抵抗モジュール | |
WO2023112438A1 (ja) | シャント抵抗器および電流検出装置 | |
JP3670593B2 (ja) | 抵抗器を用いる電子部品及びその使用方法 | |
JP6709584B2 (ja) | 抵抗値測定用導電材、導電材の抵抗値測定装置、および電流検出装置 | |
JP7490351B2 (ja) | シャント抵抗モジュール及び、シャント抵抗モジュールの実装構造 | |
US20230326633A1 (en) | Structure of resistor device and system for measuring resistance of same | |
WO2022070623A1 (ja) | ジャンパー素子、シャント抵抗装置、および電流検出用シャント抵抗装置の特性調整方法 | |
JP2023083751A (ja) | 抵抗器 | |
JP2018018915A (ja) | 抵抗器 | |
JP2022123430A (ja) | 電流検出装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 22804509 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 18559922 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 202280035456.4 Country of ref document: CN |
|
WWE | Wipo information: entry into national phase |
Ref document number: 112022002646 Country of ref document: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 22804509 Country of ref document: EP Kind code of ref document: A1 |