WO2021189874A1 - 一种SiP晶体生长调控方法 - Google Patents
一种SiP晶体生长调控方法 Download PDFInfo
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- WO2021189874A1 WO2021189874A1 PCT/CN2020/129202 CN2020129202W WO2021189874A1 WO 2021189874 A1 WO2021189874 A1 WO 2021189874A1 CN 2020129202 W CN2020129202 W CN 2020129202W WO 2021189874 A1 WO2021189874 A1 WO 2021189874A1
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- sip
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/005—Growth of whiskers or needles
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/60—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
- C30B29/62—Whiskers or needles
Definitions
- the invention relates to the growth regulation and control of single crystal materials, in particular to a regulation and control method for the growth of large-size and high-crystallinity SiP crystals.
- SiP As a P-type direct band gap semiconductor, SiP is already a "star" material in the field of optical communications, and is considered a semiconductor material with great potential for the development of silicon photonics technology.
- the band gap of bulk SiP is 1.69 eV.
- the orthogonal crystal structure of SiP often results in a two-dimensional layered structure, and the band gap width of SiP will increase as the layered structure becomes thinner. It is reported in the literature that a single-layer thickness of nano-SiP is expected to be used for blue LED light emission. Shandong University uses a high-temperature melting method to prepare SiP single crystals and use them to make optoelectronic devices.
- Single crystal materials are popular because of their high crystallinity, good orientation and stable structure.
- the chemical vapor transport method is an effective and universal method for preparing single crystal materials.
- the preparation of single crystals by purely using raw materials and transport agents often requires a long time and high reaction temperature, and this often only yields small-sized single crystals.
- the reaction energy barrier can be effectively reduced, and large-size single crystals can be obtained.
- the purpose of the present invention is to provide a method for effectively regulating the growth of SiP crystals by using a chemical vapor transport method, and adding a suitable regulating agent to obtain a centimeter-level size and high crystallinity SiP linear crystal.
- the method for preparing a SiP crystal material provided by the present invention includes the following:
- the quartz tube is vacuum-sealed and sintered at a high temperature in a heating device for a certain period of time;
- the amount ratio of Si in the silicon source: P in the phosphorus source: transport agent: regulator in step (1) is 1:1: (0.005-0.5): (0.01-0.1);
- the silicon source includes one or a combination of crystalline silicon, amorphous silicon, and silicon tetraiodide;
- the phosphorus source includes one or a combination of crystalline phosphorus, amorphous phosphorus, and phosphorus triiodide;
- the transport agent is iodine elementary substance and iodide, characterized in that the iodide is solid, including metal iodide and non-metal iodide;
- the control agent includes one or a combination of elemental sulfur, elemental selenium, and elemental tellurium.
- the heating equipment mentioned in step (2) is one of a single temperature zone tube furnace, a multi-temperature zone tube furnace (dual temperature zone and above) muffle furnace, a box furnace, a microwave oven or a single crystal furnace;
- the calcination conditions are as follows: the temperature is set at 900-1200°C, and the sintering time is 12-680h;
- the solvents mentioned in step (3) are acetone and ethanol respectively.
- the present invention has the following beneficial effects:
- the SiP crystal growth preparation method provided by the present invention has a simple and mature process, a wide range of raw materials sources and is cheap, and a high yield.
- Figure 1 shows the XRD (a) and Raman spectrum (b) of the SiP crystal in Example 1 of the present invention.
- FIG. 2 shows the SEM (a) and SEM Mapping (b) of the SiP crystal in Example 1 of the present invention.
- amorphous silicon powder 2.06g of phosphorus triiodide, 14.8mg of bismuth triiodide, 2mg of sulfur and 16mg of tellurium powder in the glove box.
- the sealed quartz tube is placed in a single crystal furnace with a sintering temperature of 950°C and a reaction time of 96h. After the furnace body is cooled down, SiP linear crystals are obtained, which are cleaned with acetone and ethanol, and vacuum dried.
- amorphous silicon powder 2.06g of phosphorus triiodide, 14.8mg of bismuth triiodide, 2mg of sulfur and 16mg of tellurium powder in the glove box. Grind and mix the raw materials evenly, and add them to a quartz tube with a length of 15cm and an inner diameter of 26mm. , After vacuuming, seal the quartz tube with a hydrogen oxygen machine. The sealed quartz tube was placed in a single crystal furnace, the sintering temperature was 950°C, and the reaction time was 96h. After the furnace body was cooled down, the SiP linear crystals could not be obtained.
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (9)
- 一种调控SiP晶体生长的方法,其特征在于,包括以下步骤:将硅源、磷源按照SiP化学计量比称量混匀,加入一定物质的量比例的输运剂和调控剂,进行抽真空密封于石英管中,在加热装置中高温烧结一定温度和时长得到SiP晶体。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述硅源中Si:磷源中P:输运剂:调控剂按照物质的量比为1 : 1:(0.005-0.5):(0.01-0.1)称量混合。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述硅源包括结晶态硅、无定形硅、四碘化硅中的一种或几种的组合。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述磷源包括晶态磷、无定形磷、三碘化磷中的一种或几种的组合。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述的输运剂为碘单质及碘化物。
- 根据权利要求5所述的碘化物,其特征在于,碘化物为固态,包括金属碘化物和非金属碘化物。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述调控剂包括单质硫、单质硒、单质碲中的一种或几种的组合。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述加热装置为单温区管式炉、多温区(双温区及以上)管式炉、马弗炉、箱式炉、微波炉或单晶炉中的一种。
- 根据权利要求1所述的SiP晶体制备方法,其特征在于,所述烧结温度为900~1200℃,烧结时长12~680h。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010217905.XA CN111334857B (zh) | 2020-03-25 | 2020-03-25 | 一种SiP晶体生长调控方法 |
| CN202010217905.X | 2020-03-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2021189874A1 true WO2021189874A1 (zh) | 2021-09-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/CN2020/129202 Ceased WO2021189874A1 (zh) | 2020-03-25 | 2020-11-16 | 一种SiP晶体生长调控方法 |
Country Status (2)
| Country | Link |
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| CN (1) | CN111334857B (zh) |
| WO (1) | WO2021189874A1 (zh) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111334857B (zh) * | 2020-03-25 | 2021-04-16 | 深圳先进技术研究院 | 一种SiP晶体生长调控方法 |
| CN114318520A (zh) * | 2020-10-09 | 2022-04-12 | 天津理工大学 | 基于化学气相输运法制备针状磷化硅晶体的方法 |
| CN115491760B (zh) * | 2022-09-05 | 2024-01-05 | 陕西科技大学 | 一种单晶Hittorf’s磷材料的制备方法 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5296998A (en) * | 1976-02-10 | 1977-08-15 | Furukawa Kogyo Kk | Process for preparing silicon arsenide |
| CN105506742A (zh) * | 2015-12-11 | 2016-04-20 | 山东大学 | 一种正交相二维层状SiP2单晶薄膜及其制备方法和应用 |
| CN106119960A (zh) * | 2016-07-25 | 2016-11-16 | 山东大学 | 正交相二维层状SiP单晶及薄膜的制备方法及其应用 |
| CN110424054A (zh) * | 2019-09-03 | 2019-11-08 | 山东大学 | 二维层状GeP单晶纳米薄膜的制备方法及应用 |
| CN111334857A (zh) * | 2020-03-25 | 2020-06-26 | 深圳先进技术研究院 | 一种SiP晶体生长调控方法 |
| CN111330603A (zh) * | 2020-03-25 | 2020-06-26 | 深圳先进技术研究院 | 一种新型高效光催化材料及其应用 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109295496B (zh) * | 2018-09-18 | 2020-08-25 | 中国科学院合肥物质科学研究院 | 一种二元磷族化合物材料的合成方法 |
-
2020
- 2020-03-25 CN CN202010217905.XA patent/CN111334857B/zh active Active
- 2020-11-16 WO PCT/CN2020/129202 patent/WO2021189874A1/zh not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5296998A (en) * | 1976-02-10 | 1977-08-15 | Furukawa Kogyo Kk | Process for preparing silicon arsenide |
| CN105506742A (zh) * | 2015-12-11 | 2016-04-20 | 山东大学 | 一种正交相二维层状SiP2单晶薄膜及其制备方法和应用 |
| CN106119960A (zh) * | 2016-07-25 | 2016-11-16 | 山东大学 | 正交相二维层状SiP单晶及薄膜的制备方法及其应用 |
| CN110424054A (zh) * | 2019-09-03 | 2019-11-08 | 山东大学 | 二维层状GeP单晶纳米薄膜的制备方法及应用 |
| CN111334857A (zh) * | 2020-03-25 | 2020-06-26 | 深圳先进技术研究院 | 一种SiP晶体生长调控方法 |
| CN111330603A (zh) * | 2020-03-25 | 2020-06-26 | 深圳先进技术研究院 | 一种新型高效光催化材料及其应用 |
Non-Patent Citations (4)
| Title |
|---|
| BARRETEAU C.; MICHON B.; BESNARD C.; GIANNINI E.: "High-pressure melt growth and transport properties of SiP, SiAs, GeP, and GeAs 2D layered semiconductors", JOURNAL OF CRYSTAL GROWTH, ELSEVIER, AMSTERDAM, NL, vol. 443, 15 March 2016 (2016-03-15), AMSTERDAM, NL, pages 75 - 80, XP029510791, ISSN: 0022-0248, DOI: 10.1016/j.jcrysgro.2016.03.019 * |
| LI CHUNLONG, WANG SHANPENG, ZHANG XIXIA, JIA NING, YU TONGTONG, ZHU MIN, LIU DUO, TAO XUTANG: "Controllable seeded flux growth and optoelectronic properties of bulk o-SiP crystals", CRYSTENGCOMM, vol. 19, no. 46, 1 January 2017 (2017-01-01), pages 6986 - 6991, XP055852844, DOI: 10.1039/C7CE01676J * |
| LI CHUNLONG: "Crystal Growth and Characteristic of Silicon Phosphides", CHINESE DOCTORAL DISSERTATIONS FULL-TEXT DATABASE, UNIVERSITY OF CHINESE ACADEMY OF SCIENCES, CN, 15 January 2019 (2019-01-15), CN, XP055852845, ISSN: 1674-022X * |
| REINHOLD R., MIKHAILOVA D., GEMMING T., MISSYUL A. B., NOWKA C., KASKEL S., GIEBELER L.: "Silicon monophosphide as a possible lithium battery anode material", JOURNAL OF MATERIALS CHEMISTRY A, ROYAL SOCIETY OF CHEMISTRY, GB, vol. 6, no. 41, 23 October 2018 (2018-10-23), GB, pages 19974 - 19978, XP055852843, ISSN: 2050-7488, DOI: 10.1039/C8TA06983B * |
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| Publication number | Publication date |
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| CN111334857B (zh) | 2021-04-16 |
| CN111334857A (zh) | 2020-06-26 |
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