WO2020226866A1 - Procédés et appareil pour mémoire flash non-et - Google Patents

Procédés et appareil pour mémoire flash non-et Download PDF

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Publication number
WO2020226866A1
WO2020226866A1 PCT/US2020/028367 US2020028367W WO2020226866A1 WO 2020226866 A1 WO2020226866 A1 WO 2020226866A1 US 2020028367 W US2020028367 W US 2020028367W WO 2020226866 A1 WO2020226866 A1 WO 2020226866A1
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Prior art keywords
data
bit line
bit lines
cell
voltage
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PCT/US2020/028367
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English (en)
Inventor
Fu-Chang Hsu
Original Assignee
Hsu Fu Chang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Priority claimed from US16/687,556 external-priority patent/US11056190B2/en
Application filed by Hsu Fu Chang filed Critical Hsu Fu Chang
Priority to CN202211064837.3A priority Critical patent/CN115346585A/zh
Priority to CN202080009779.7A priority patent/CN113490983B/zh
Publication of WO2020226866A1 publication Critical patent/WO2020226866A1/fr

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1057—Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5671—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge trapping in an insulator
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/24—Bit-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1069—I/O lines read out arrangements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G11C7/1084—Data input buffers, e.g. comprising level conversion circuits, circuits for adapting load
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines

Definitions

  • the exemplary embodiments of the present invention relate generally to the field of semiconductors and integrated circuits, and more specifically to the design and operation of NAND flash memory.
  • Memory devices are extensively used in industrial and consumer electronics. In many cases, the limitations of the memory affect the size, performance, or cost of an industrial or consumer device, such as a mobile phone.
  • NAND flash memory One type of memory that is used in many devices is called a NAND flash memory. This type of memory is organized as one or more blocks and each block includes strings of memory cells that are accessed by word lines and bit lines. Data is programmed into the memory cells or read from the memory cells using page buffers that are coupled to the bit lines.
  • page buffers In a typical NAND flash memory, the number of bit lines that can be program or read at one time is equal to the number of page buffers. This is referred to as‘page-programming’ or ‘page-reading’. Increasing the number of page buffers may increase the data read/write throughput, to enhance the memory performance.
  • the page buffer’ s circuit size is quite large and typically occupies about 20% to 40% of the memory’s die size. Therefore, a typical number of page buffers is limited to a range of 16KB to 64KB in today’s 512Gb to 1Tb products, which limits the read/write performance of the NAND flash memory.
  • NAND flash memory architectures and methods are provided for use with two-dimensional (2D) or three-dimensional (3D) NAND memory arrays.
  • Embodiments can also be applied to single-level cell (SLC), multi-level cell (MLC), triple-level cell (TLC), quad-level cell (QLC), or any number of bits per cell technology.
  • SLC single-level cell
  • MLC multi-level cell
  • TLC triple-level cell
  • QLC quad-level cell
  • a NAND architecture include bit line select gates that connect page buffers to a large number of bit lines to increase read/write throughput.
  • the bit line select gates couple the page buffer to non-adjacent bit lines to mitigate capacitive coupling.
  • additional pass gates and data registers are used to enhance the operation of the NAND memory.
  • novel programming and reading operations are provided that result in increased performance.
  • a method for programming a NAND flash memory includes setting programming conditions on word lines to set up programming of multiple memory cells associated with multiple bit lines, and sequentially enabling bit line select gates to load data from a page buffer to the multiple bit lines of the memory. After each bit line is loaded with selected data, an associated bit line select gate is disabled so that the selected data is maintained on the bit line using bit line capacitance. The method also includes waiting for a programming interval to complete after all the bit lines are loaded with data to program the multiple memory cells associated with the multiple bit lines. At least a portion of the multiple memory cells are programmed simultaneously.
  • a NAND flash memory comprising a memory array having a plurality of bit lines and a plurality of word lines, and a page buffer that stores data to be written into the memory array or data read from the memory array.
  • the page buffer includes a plurality of data lines and is configured to simultaneously program memory cells in multiple cell strings of the memory array.
  • the memory also comprises bit line select gates that selectively connect each data line of the page buffer to two or more bit lines of the memory array.
  • a method for programming a NAND flash memory.
  • the method includes precharging selected bit lines of selected memory cells with a bias voltage level while unselected bit lines maintain the inhibit voltage, applying a verify voltage to a selected word line that is coupled to the selected memory cells, and discharging the selected bit lines that are coupled to on-cells over a first time interval.
  • the method also includes sensing a sensed voltage level on a selected bit line, loading the selected bit line with the inhibit voltage level when the sensed voltage level is above a threshold level and a program voltage when the sensed voltage level is equal to or below the threshold level, and repeating the operations of sensing and loading for each of the selected bit lines.
  • a method for reading a multiple level cell NAND flash memory.
  • the NAND flash memory comprises strings of memory cells that are coupled to bit lines and word lines and a single bit data latch coupled to the bit lines.
  • the method comprises reading a bit of the cell by performing operation of: applying a selected word line voltage level to the cell to sense an output of the cell; flipping the latch to a first data value when the output indicates that the cell is an off-cell; and repeating the operations of applying and flipping until all word line voltages have been applied to the cell so that the value of the bit is stored in the latch.
  • the method also comprises repeating the operation of reading for each bit of the cell to be read.
  • FIG. 1A shows an exemplary block diagram of NAND flash memory architecture in accordance with embodiments of the invention.
  • FIG. IB shows another embodiment of a NAND flash memory architecture constructed in accordance with embodiments of the invention.
  • FIG. 1C shows a detailed embodiment of a conventional 3D NAND flash memory cell array and page buffers.
  • FIG. ID shows a configuration of the conventional structure of a 3D NAND memory array.
  • FIG. IE shows an embodiment of an array structure in accordance with the invention.
  • FIG. IF shows an embodiment of a 3D array structure in accordance with the invention.
  • FIG. 2A shows an embodiment of a page buffer and bit line select gate configuration in accordance with embodiments of the invention.
  • FIG. 2B shows another embodiment of the page buffer configuration in accordance with embodiments of the invention.
  • FIGS. 2C-E show embodiments illustrating bit line select gates in accordance with the invention.
  • FIGS. 3A-D shows embodiments of a page buffer circuit.
  • FIGS. 4A-D show the operation of a page buffer and bit line select gates in accordance with the invention.
  • FIGS. 5A-E shows exemplary waveforms for multiple-page programming in accordance with the invention.
  • FIGS. 6A-C show multiple-page read operations in accordance with embodiments of the invention.
  • FIG. 6D shows an exemplary embodiment of a page buffer, bit line select gates, and data registers in accordance with the invention.
  • FIG. 6E shows an exemplary embodiment of a page buffer and bit line select gates in accordance with the invention.
  • FIG. 6F shows an exemplary embodiment of a single-level-chip page buffer and bit line select gates in accordance with the invention.
  • FIGS. 7A-D show embodiments of read operation waveforms in accordance with the invention.
  • FIGS. 8A-C show embodiments of program and program- verify operations.
  • FIGS. 9A-D show NAND flash memory array architectures that are divided into sub-arrays.
  • FIGS. 10A-E show embodiments of 3D array architectures in accordance with the invention.
  • FIG. 11A shows an embodiment of a 3D array wherein the bit lines are used as temporary data storage in accordance with the invention.
  • FIG. 11B shows an embodiment of waveforms that illustrate how data is loaded into multiple bit lines in accordance with the invention.
  • FIG. llC shows another embodiment of waveforms to load data to multiple bit lines in accordance with the invention.
  • FIG. 11D shows exemplary waveforms illustrating data reads from the bit line capacitors in accordance with the invention.
  • FIGS. 12A-B shows embodiments of a 3D array that provide SLC and TLC programming in accordance with the invention.
  • FIG. 13 shows an embodiment of a NAND flash memory array that illustrates bit line to bit line capacitance.
  • FIG. 14 shows an array having bit line shielding that is used to prevent bit line coupling.
  • FIGS. 15A-B show another embodiment of a circuit and corresponding waveforms for mitigating bit line-to-bit line coupling.
  • FIG. 16 shows an exemplary embodiment of a circuit that resolves the last bit line coupling issue as described with reference to FIGS. 15A-B.
  • FIG. 17A shows an embodiment of a circuit that comprises even and odd page buffers as illustrated in FIG. 16.
  • FIGS. 17B-C show embodiments of 2D and 3D versions of an array (or sub array) for use in the circuit of FIG. 17A.
  • FIGS. 18A-B show circuits having a divided bit line structure.
  • FIGS. 19A-B show another embodiment of a bit line select gate circuit and its corresponding operating waveforms in accordance with the invention.
  • FIGS. 20A-B show an embodiment of a circuit and associated read waveforms that address bit line coupling without sacrificing read data throughput.
  • FIGS. 21A-B show embodiments of a sensing circuit and associated operating waveforms in accordance with the invention.
  • FIGS. 22A-B show exemplary embodiments of a sensing circuit and associated waveforms in accordance with the invention.
  • FIGS. 23A-B show exemplary embodiments of a sensing circuit and associated waveforms in accordance with the invention.
  • FIGS. 24A-B show exemplary embodiments of a sensing circuit and associated waveforms in accordance with the invention.
  • FIGS. 25A-C show exemplary embodiments of a page buffer and bit line decoder circuit in accordance with the invention.
  • FIG. 26A shows an exemplary embodiment of a circuit according to the invention that utilizes only one data latch to perform
  • FIG. 26B shows a program- verify operation for use with the circuit shown in
  • FIG. 26 A is a diagrammatic representation of FIG. 26 A.
  • FIG. 26C shows an embodiment of a circuit implementation of a data buffer shown in FIG. 26 A.
  • FIGS. 27A-B shows another embodiment using the sensing circuit shown in
  • FIG. 27C shows another embodiment of the program- verify operation according to the invention using the page buffer circuit shown in FIG. 3C.
  • FIGS. 28A-B shows exemplary embodiments of waveforms for read operations.
  • FIG. 29A shows a layout arrangement of a page buffer circuit of a conventional
  • FIG. 29B shows a conventional array configuration having two adjacent sub arrays 601a and 601b.
  • FIG. 30A shows an embodiment of a layout arrangement of page buffers and circuits for a 3D array according to the invention.
  • FIG. 30B shows an exemplary embodiment of a tile formed by two adjacent sub-arrays as shown in FIG. 30A.
  • FIGS. 31A-B show embodiments of page buffer configurations in accordance with the invention.
  • FIG. 32 shows an exemplary embodiment of a page buffer and bit line select gate structure in accordance with the invention.
  • FIG. 33A shows another embodiment of a page buffer and bit line select gate structure in accordance with the invention.
  • FIGS. 33B-C shows an embodiment configured for MLC programming.
  • FIG. 34A shows a conventional 3D NAND flash memory’s page buffers and bit line connections.
  • FIGS. 34B-C show a 3D NAND flash memory’s page buffers and bit line connections in accordance with the invention.
  • FIG. 35 shows an exemplary Vt distribution of a triple-level cell TLC.
  • FIG. 36 shows an embodiment of a single latch page buffer circuit in accordance with the invention.
  • FIGS. 37A-C show methods for reading a bit using the single latch page buffer shown in FIG. 36.
  • FIGS. 37D-E show exemplary diagrams associated with the operation of the circuit shown in FIG. 36.
  • FIGS. 38A-B shows an embodiment of waveforms that illustrate signals for reading a bit using the circuit shown in FIG. 36.
  • FIG. 39 shows another embodiment of a page buffer circuit in accordance with the invention.
  • FIG. 40 shows an embodiment of waveforms that illustrate signals for reading a bit using the circuit shown in FIG. 39.
  • FIG. 41A shows an exemplary alternative embodiment of the page buffer circuit shown in FIG. 36 implemented using complementary logic.
  • FIGS. 41B-D show exemplary method and diagrams associated with the operation of the page buffer circuit shown in FIG. 41A.
  • FIGS. 42A-F shows diagrams that provide word line voltages for reading various configurations of multiple level cells using a single bit latch in accordance with the invention.
  • FIG. 43 shows an exemplary method for reading a multiple level cell using a single bit latch in accordance with the invention.
  • FIGS. 44A-B shows an exemplary array structure and data loading and output sequences in accordance with the invention.
  • FIGS. 45A-C shows an exemplary array structure and data loading and output sequences in accordance with the invention.
  • FIGS. 46A-C shows an exemplary array structure and data loading and output sequences in accordance with the invention.
  • FIGS. 47A-B illustrate embodiments of refresh operations according to the invention.
  • methods and apparatus for the design and operation of NAND flash memory architectures are provided that can be used with two- dimensional (2D) or three-dimensional (3D) NAND arrays.
  • Embodiments can also be applied to single-level cell (SLC), multi-level cell (MLC), triple-level cell (TLC), quad-level cell (QLC), or any number of bits per cell technology.
  • FIG. 1A shows an exemplary block diagram of NAND flash memory architecture 100 in accordance with embodiments of the invention.
  • the architecture 100 includes a 2D or 3D NAND flash memory array 101 that that can be accessed using multiple word lines (WL[0-m]), and bit lines (BL[0-k]).
  • the architecture 100 includes row decoder 102 and page buffer 103.
  • the page buffer 103 contains multiple page buffers, such as page buffers 200 shown in FIG. 2A and FIG. 3A.
  • the page buffer 103 performs both functions of a program buffer for program operations and a sense amplifier for read operations.
  • each page buffer is connected to one-bit line, which is referred to as an all bit line (ABL) structure, or two-bit lines, which is referred to as a half bit line (HBL) structure.
  • ABL all bit line
  • HBL half bit line
  • the number of the bit lines that can be program and read together is equal to the number of page buffers. This is referred to as‘page-programming’ or ‘page-read’ .
  • Increasing the number of page buffers may increase the data read/write throughput, to enhance the memory performance.
  • the page buffer’ s circuit size is quite large. It typically occupies about 20% to 40% of the die size. Therefore, the typical number of page buffers is limited to a range of 16KB to 64KB in today’s 512Gb to 1Tb products, which limits the read/write performance of the NAND flash memory.
  • the architecture 100 comprises a bit line select gate block 106.
  • the bit line select gate block 106 contains multiple bit line select gates, such as select gate 210 shown in FIG. 2A and FIG. 2B.
  • the bit line select gates allows a page buffer to be coupled to multiple bit lines.
  • multiple bit lines may be programmed and read together. This is called‘multiple-page programming’ and ‘multiple-page read’. This can significantly increase the data read/write throughput without increasing the number of page buffers.
  • data registers 104a-d are provided and may also be referred to as data cache. Although four data registers are shown, there can be any desired number of data registers.
  • the data registers allow for parallelism between the operations of the array 101 and the data input/output (I/O). During operation, when the array 101 performs a read or write operation using the page buffer 103, the new data may be loaded into the data registers 104a-d or output from the data registers. This can enhance the performance of the memory.
  • the architecture 100 includes an input/output (I/O) buffer 106 that connects to an external data bus DQ[0-n].
  • FIG. IB shows another embodiment of a NAND flash memory architecture 107 constructed in accordance with embodiments of the invention.
  • the array is divided into multiple sub-arrays 101a to lOlp.
  • Each sub-array has its own row decoders 102a to 102p, bit line select gates 106a to 106p, and page buffers 103a to 103p.
  • each sub-array has the same number of bit lines as the array 101 shown in FIG. 1A, such as BLa[0-k] for sub-array 101a and BLp[0-k] for sub-array lOlp.
  • the total number of the page buffers is the same as the embodiment shown in FIG.
  • FIG. 1C shows a detailed embodiment of a conventional 3D NAND flash memory cell array 101 and page buffers 103.
  • the memory array 101 contains bit lines BL[0- K]. Each bit line is connected to one of the page buffers 200a to 200k.
  • FIG. ID shows a configuration of the conventional structure of a 3D NAND memory array.
  • the 3D memory cell array 101 is located on top of the page buffer circuits 103 to save silicon area.
  • FIG. IE shows an embodiment of an array structure in accordance with the invention.
  • the bit lines BL[0-k] are connected to the page buffers 103 through bit line select gates 106. Therefore, the number of the page buffers 103 can be reduced when compared to a conventional architecture. For example, two bit-lines are connected to each page buffer, which reduces the number of page buffers that are used.
  • FIG. IF shows an embodiment of a 3D array structure in accordance with the invention.
  • the 3D cell array is divided into sub-arrays 101a to lOld that are located on top of the page buffers 103a to 103d.
  • the sub- arrays 101a to 10 Id are accessed through the bit line select gates 106a to 106d.
  • Each sub-array is connected to one page buffer.
  • FIG. 2A shows an embodiment of a page buffer and bit line select gate configuration in accordance with embodiments of the invention.
  • the bit lines 201a to 201n are multiple bit lines BL[0] to BL[n] in an array or sub-array.
  • the bit line may contain multiple strings of NAND flash memory cells such as strings 211a to 211n.
  • the strings may be formed using 2D or 3D array architectures.
  • the bit lines are connected to a page buffer 200 through a bit line select gates 210 that comprises individual select gates 202a to 202n.
  • Each of the bit line select gates 202a to 202n can be selectively enabled or disabled by select gate signals BSG[0] to BSG[n], respectively.
  • the number of the bit lines connected to one page buffer may be any number, such as 2, 4, 8, 16, etc. There is no limitation for the number of the bit lines that can be connected to one page buffer.
  • the page buffer 200 functions as both a program buffer and a sense amplifier.
  • the page buffer 200 contains multiple latches 207a to 207n to store program data.
  • a sense amplifier 208 operates to read the data from the cells. In program mode, the latches 207a to 207n apply the program data to the bit lines. In program- verify mode, the sense amplifier 208 reads the data from the cells, and updates the program data stored in the latches 207a to 207n. In read mode, the sense amplifier 208 reads the data from the cells and stores the data in the latches 207a to 207b, and then the data may be transferred to an output buffer.
  • one page buffer may only provide one data value to one bit line at one time.
  • one page buffer may only read data from one bit line at one time. Therefore, the total bit lines in programming, verification, and read are equal to the number of page buffers.
  • each bit line is connected to one page buffer. This is called an All Bit Line (ABL) architecture.
  • ABL All Bit Line
  • two bit lines are shared with one page buffer. This architecture is referred to as a Half Bit Line (HBL) architecture. This architecture reduces by half number of the page buffers.
  • HBL Half Bit Line
  • a novel architecture is disclosed to read and write multiple bit lines with one page buffer simultaneously, and therefore the data throughput may be significantly increased.
  • the word line WL[m] is selected, the cells 204a to 204n may be read and programmed simultaneously by one page buffer 200.
  • the number of the page buffers may be reduced and the read and write data throughput may be increased.
  • the cells 204a to 204n may belong to different pages.
  • the pages may be selected by the bit line select gate signals BSG[0] to BSG[n].
  • the architecture may provide multiple bit-line read and write operations, or multiple-page read and write operations.
  • the number of the latches in a page buffer is determined by the number of bits stored in one cell.
  • the page buffer may have only one latch to store 1-bit of data.
  • the page buffer may have two latches to store 2-bits of data.
  • the page buffer may have 3 latches to store 3 -bits of data.
  • the page buffer may have 4 latches to store 4-bits of data.
  • extra latches may be added to further enhance the advantages of the multiple-page read and write operations.
  • FIG. 2B shows another embodiment of the page buffer configuration in accordance with embodiments of the invention.
  • the array may have multiple layers of bit line select gates, such as 202a to 202n and 205a to 205k.
  • the select gates 202a to 202n are the first layer of bit line select gates that are connected to control signals BSGA[0] to BSGA[n].
  • the select gates 205a to 205k are the second layer of bit line select gates that are connected to control signals BSGB[0] to BSGB[k].
  • this embodiment reduces the number of control signals. For example, assuming 16 bit lines share one page buffer, the embodiment in FIG.
  • bit line select gates there is no limitation on the number of the layers of bit line select gates that can be used.
  • the array may have 2, 3, 4, etc. layers of bit line select gates.
  • the bit line select gates may be implemented using any suitable devices. They are not limited to only NMOS devices.
  • FIGS. 2C-E show embodiments illustrating bit line select gates in accordance with the invention.
  • FIG. 2C shows a circuit that illustrates how the bit line select gates 202a to 202n may be implemented by native devices or depletion-mode devices to increase the bit line pre-charged voltage and current.
  • FIG. 2D shows a circuit that illustrates how the bit line select gates 202a to 202n may be implemented by PMOS devices.
  • FIG. 2E shows a circuit that illustrates how the bit line select gates 202a to 202n may be implemented by PMOS-NMOS pairs. Moreover, the bit line select gates may be implemented by high voltage (HV) devices or low voltage (LV) devices. These modifications and variations are within the scope of the embodiments.
  • HV high voltage
  • LV low voltage
  • FIG. 3A shows an embodiment of the page buffer circuit 200.
  • the page buffer 200 circuit is configured both as a program buffer and a sense amplifier.
  • the program buffer comprises three latches 207a to 207c.
  • the latches 207a to 207c store the data in Q0, Ql, and Q2 nodes as shown.
  • the data of the latches 207a to 207c can be set to 0 (0V) by turning on the set devices 311a to 311c, and reset to 1 (VDD) by turning on the reset devices 312a to 312c.
  • Latch pass gates 220a to 220d are also shown.
  • 3 bits of data, DO, Dl, and D2 are first loaded into the three latches 207a to 207c.
  • the signals P0 to P3 select and turn on one of the pass gates 220a to 220d to pass the data of the latches 207a to 207c to the selected bit line according to the programmed Vt level to program the selected cell. Also shown is sense amplifier 208.
  • the data may be read from the cells by the sense amplifier 208, and then latched in the three latches 207a to 207c.
  • the sense amplifier’s sensing node 302 is denoted by (SA).
  • the sensing node 302 is connected to the gate of a sensing device 310.
  • the sense amplifier 208 includes a pre-charge device 303 and a discharge device 304.
  • the pre-charge device 303 is turned on to precharge SA node 302 and the bit line to VDD.
  • the signal PREB is applied with VDD to turn off the pre-charge device 303, or a reference voltage, Vref, to limit the pull-up current of the pre charge device 303.
  • the pull-up current is designed to be lower than the on-cell current, thus the on-cell can discharge the bit line to pull low the SA node 302.
  • the selected signal of SO to S2 is applied with a pulse to turn on the set devices 311a to 311c to set the latch 207a to 207c.
  • the latches 207a to 207c are previously reset to data 1 (VDD).
  • the bit line and SA node 302 are discharged to below Vt of the sensing device 310, which turns off the sensing device 310, thus the data of the latch remain at 1 (VDD).
  • the SA node 302 remains at VDD, which turns on the sensing device 310 and allow the latches to be set to data 0 (VDD).
  • FIG. 3A does not have a bias device.
  • FIG. 3B illustrates an alternative circuit that includes bias device 306.
  • the bias device 306 is used as a cascade stage to control the pre-charge voltage of the bit line.
  • the function of the bias device is performed by the bit line select gates, which is illustrated by the read operation waveforms shown in FIG. 7D and
  • FIGS. 20A-B are identical to FIGS. 20A-B.
  • the page buffer circuit shown in FIG. 3A can be modified as shown in FIG. 3D to include bias device 306.
  • a BIAS signal applies a bias voltage to the bias device 306 to control the bit line precharge voltage.
  • the signals of the bit line select gates may be supplied with VDD level.
  • FIG. 3B shows another embodiment of the page buffer circuit 200.
  • the page buffer 200 shown in FIG. 3B is used for current-sensing, while the embodiment shown in FIG. 3A is used for voltage-sensing.
  • a gain stage such as comparator 305
  • the comparator 305 is replaced by invertor.
  • a bias device 306 may be added to become a cascade stage. The bias device 306 limits the bit line’ s pre-charge voltage to (BIAS - Vt) rather than VDD, thus it reduces the pre-charging time.
  • FIG. 3C shows another embodiment of the page buffer circuit 200 that uses a single data latch for SLC applications.
  • the page buffer 200 circuit is configured both as a program buffer and a sense amplifier.
  • the program buffer comprises a data latch 207.
  • Latch pass gate 220 is also shown.
  • sense amplifier 208 During read mode, the data may be read from the cell by the sense amplifier 208, and then latched in the data latch 207.
  • the sense amplifier’s sensing node 302 is denoted by (SA).
  • SA sensing node 302
  • the signal PREB turns on the pre-charge device 303 to charge up the SA node to VDD, and also charges up the selected bit line through the bias device 306.
  • the signal BIAS is applied to the bias device 306 to control the pre-charge voltage of the selected bit line.
  • the bit line will be precharged to BIAS-Vt, where Vt is the threshold voltage of the bias device 306.
  • the selected cell is read by applying a read voltage to the selected word line. If the selected cell is an on-cell, it will discharge the bit line voltage. When the bit line voltage is discharged to below BIAS-Vt, the bias device 306 will be turned on and will pull down the SA node to the same voltage as the bit line.
  • the sensing device 310 When the bit line voltage is discharged to below Vt of the sensing device 310, the sensing device 310 is turned off. If the cell is an off-cell, the bit line will remain at the pre-charge voltage and the SA node will remain at VDD. The SA node voltage will turn on the sensing device 310.
  • Set 311 and reset 312 devices are used to set and reset the Q and QB nodes of the latch 207. When the device 310 is turned on, the signals SET or RES can be supplied with a VDD level pulse to turn on the devices 311 or 312 to set the Q node of the latch 207 to data 0 (0V) or data 1 (VDD), respectively.
  • FIGS. 4A-D show the operation of the page buffer and bit line select gates in accordance with the invention.
  • FIG. 4A shows an exemplary embodiment that uses a TLC page buffer 200.
  • the TLC page buffer 200 comprises three data latches 207a to 207c and a sense amplifier 208.
  • the page buffer may contain two and four data latches, respectively.
  • the page buffer 200 is connected to multiple bite lines 201a to 201c through the bit line select gates 202a to 202c.
  • Bit line capacitances 206a to 206c represents the bit line capacitance of the bit lines 201a to 201c, respectively.
  • FIG. 4B illustrates basic TLC program operations.
  • the TLC programming operations program three bits of data into one selected cell.
  • the TLC programming may contain multiple program steps to program the cell from the erased Vt into eight Vt levels to represent the three bits of data. Assume that the cell 204a is selected. In each program step, one of the data latches 207a to 207c may be selected to load data to the selected bit line 201a to program the cell 204a, depending on which Vt level is programed. For example, when programming the DO bit, the data stored in the Latch 0 207a is loaded to the selected bit line 201a to program the selected cell 204a.
  • FIG. 4C shows multiple-page programing operations in accordance with the invention.
  • the data stored in the latches 207a to 207c are programmed to multiple cells 204a to 204c on multiple bit lines 201a to 201c simultaneously. If the page buffer has N data latches, it may program N cells simultaneously. This significantly increases the program data throughput N times.
  • the bit line select gates 202a to 202c may be sequentially turned on to load the data from the latches 207a to 207c to the bit lines 201a to 201c, respectively, as shown by the arrowed lines. After the data is loaded to the bit lines 201a to 201c, the bit line select gates 202a to 202c are turned off, then the data is held by the bit line capacitance 206a to 206c. After that, a program condition is applied to the selected word line, WL[m], to program the selected cells 204a to 204c according to the data stored in the bit line capacitance 206a to 206c. By using these operations, the data of the multiple bit lines may be programmed simultaneously.
  • the page buffer performs two programming function modes.
  • One is TLC programming and the other is SLC programming.
  • the data latches 207a to 207c are used to store three bits data, DO, Dl, and D2 for one cell, and the three data bits are programmed into a single cell.
  • SLC programming the three data latches may be used to store three single-bit data, and then this data is programmed into three cells. This is referred as‘multiple-page programming’ .
  • the data throughput may be significantly increased. Therefore, this mode may be used to program the data into the cells at high speed. Later in idle time, the data may be read out from the SLC cells and re -programmed to other cells using TLC mode, and then the SLC cells may be erased to increase the storage capacity of the memory.
  • the disclosed multiple-page programming operations may be applied not only to SLC, but also to multiple level cells such as MLC, TLC, and QLC, etc.
  • MLC multiple level cells
  • TLC multiple level cells
  • QLC QLC
  • FIG. 4C assume three pages’ data is programmed into the selected cells 204a to 204c using TLC mode. Each cell may store one of eight Vt levels to represent three data bits, DO, Dl, and D2.
  • the first page’s data is loaded into the data latches 207a to 207c.
  • the data are sequentially loaded to the bit lines 201a to 201c using the previously described operation, and then the program condition is applied to the cells 204a to 204c to program each cell according to the bit line data.
  • the cells will be programmed to the Vt levels corresponding to DO bit.
  • a program-verify operation may be performed to check the cells’ Vt. The program-verify operation will be described later in reference to FIGS. 6A-C. After the data is successfully programmed, the data in the latches 207a to 207c may be cleared.
  • the second page’s data is loaded into the three latches 207a to 207c, then sequentially loaded to the bit lines 201a to 201c to program the cells 204a to 204c to the Vt levels corresponding to Dl bit. After the second page’s data is successfully programmed, the data in the latches 207a to 207c may be cleared.
  • the third page’s data is loaded to the latches 207a to 207c, and then applied to the bit lines 201a to 201c to program the cells 204a to 204c to the Vt levels corresponding to D2 bit.
  • the cells may be programmed to any number of multiple-level cells such as MLC, TLC, QLC, etc.
  • FIG. 4D shows another exemplary programming embodiment in accordance with the invention.
  • the chip has multiple data registers 212a to 212c.
  • Each data register contains multiple-bit latches such as Reg 0 to Reg 2.
  • the data of the first data register 212a is loaded to the latches 207a to 207c, and then loaded to the bit lines 201a to 201c to program the cells 204a to 204c, respectively.
  • the data of the next register 212b may be loaded to the latches 207a to 207c, and then loaded to the bit lines 201a to 201c to program another page such as cells 214a to 214b, respectively.
  • the multiple pages’ data can be programmed simultaneously to increase program data throughput.
  • the data stored in the first data register 212a may be transferred to the latches 207a to 207c, and then programmed to the Vt levels corresponding to DO bit of the selected cells 204a to 204c. Then, the data stored in the second data register 212b may be transferred to the latched 207a to 207c, and then programmed to the Vt levels corresponding to the Dl bit of the selected cells 204a to 204c. The operation may be repeated to program the data of the third data register 212c to the D2 bit of the selected cells
  • the data in the data registers 212a to 212c may be programmed to the cells in any suitable orders.
  • the data stored in the Reg 0 of the data registers 212a to 212c may be sequentially transferred to the data latch 207a, then loaded to the bit lines 201a to 201c, and then programmed to the Vt level for the DO bit of the cells 204a to 204c.
  • the data stored in the Reg 1 of the data registers 212a to 212c may be sequentially transferred to the data latch 207b, then loaded to the bit lines 201a to 201c, and then programmed to the Vt level for the D1 bit in the cells 204a to 204c.
  • the data stored in the Reg 2 of the data registers 212a to 212c may be sequentially transferred to the data latch 207c, then loaded to the bit lines 201a to 201c, and then programmed to the Vt level for the D2 bit in the cells 204a to 204c.
  • FIG. 5A shows exemplary waveforms for multiple-page programming of the circuit as shown in FIG. 4C.
  • BSG[0] to BSG[2] may go high to turn on the bit line select gates 202a to 202c.
  • the page buffer (PB) may apply VDD to all the bit lines BL[0] to BL[2].
  • the selected cell strings’ drain select gate (DSG) is supplied with VDD.
  • the source select gate (SSG) is supplied with 0V. Therefore, the channel region of the strings STRG[0] to STRG[2] may be charged to VDD - Vt of the drain select gate.
  • the selected word line, WL[m], and the other unselected word lines are supplied with the program voltage, such as 20V, and an inhibit voltage such as 10V, respectively.
  • the word lines’ voltage may couple the channel region of all the strings STRG[0] to STRG[2] to a voltage of about 8V. This voltage may inhibit the programming of the cells. Due to the bit lines being supplied with VDD, the drain select gates are reverse- biased. Thus, the drain select gates will be turned off to prevent the channel voltage from leaking to the bit lines.
  • bit line select gates BSG[0] to BSG[2] are turned off.
  • the first bit line select gate BSG[0] is turned on, and the page buffer (PB) applies the first data to the first bit line BL[0]. If the data is‘G (VDD), the channel of the string STRG[0] will remain at the inhibit voltage such as 8V. If the data is ⁇ ’ (0V), it will turn on the drain select gate and discharge the string STRG[0] to 0V. This will cause the first selected cell 204a to be programmed. After the first bit line select gate BSG[0] is turned off at T5 time, the bit line BL[0] and the string STRG[0] may remain at 0V due to the bit line capacitance 206a.
  • the steps may be repeated to sequentially turn on the bit line select gates BSG[1] to BSG[2] to load the data from the page buffer (PB) to bit lines BL[1] and BL[2] and their strings STRG[1] and STRG[2].
  • a timer may start to count the program pulse, Tpgm, over a time interval from lOus to 30us. Then, the program pulse is ended.
  • the waveform of FIG. 5A is for illustration and not drawn on scale.
  • the total program time is dominated by Tpgm.
  • the data loading time may be negligible. Therefore, the multiple-page programming may significantly reduce the total programming time and increase the program data throughput.
  • FIG. 5B shows another embodiment of waveforms for multiple-page programming in accordance with the invention. These waveforms are similar to the waveforms shown in FIG. 5A except that the bit line select gates BSG[0] to BSG[2] may be turned off (as illustrated at 506) after pre-charging the bit lines to VDD at time Tl. Therefore, the bit lines’ voltage is held by the bit line capacitance.
  • FIG. 5C shows another embodiment of waveforms for multiple-page programming in accordance with the invention. These waveforms are similar to FIG. 5A except that the drain select gate (DSG) of the selected string may be turned off after the data is loaded to the multiple bit line (as illustrated at 508) at T6 time. In this way, if the floating bit lines have leakage, the bit line voltage needs to be drop from VDD to lower than Vt of the drain select gate to turn on the drain select gate. Therefore, this approach provides a higher margin of failure for the string’s inhibit voltage.
  • DSG drain select gate
  • FIG. 5D shows another embodiment of waveforms for multiple-page programming wherein the operations shown in FIG. 5C are applied to the waveforms shown in FIG. 5B to produce the waveforms shown in FIG. 5D.
  • the selected string’s drain select gate (DSG) is turned off after the strings are pre-charged (as illustrated at 510) at T1 time.
  • the DSG can be turned on (as illustrated at 512) at T3 time to load the multiple pages’ data into the stings, and then turned off (as illustrated at 514) at T6 time to increase the floating bit lines’ leakage margin.
  • FIG. 5E shows another embodiment of waveforms for multiple-page programming in accordance with the invention.
  • the selected drain select gate (DSG) is turned on, and the source select gate (SSG) is off.
  • the page buffer (PB) supplies multiple-page data, Data 0, Data 1, and Data 2.
  • the bit line select gates BSG[0] to BSG[2] are turned on sequentially to load the data into BL[0] to BL[2] and STRG[0] to STRG[2].
  • the selected word line and unselected word lines are supplied with the program voltage 20V and the inhibit voltage 10V, respectively.
  • the word lines’ voltage will couple the channel region of STRG[0] to STRG[2] with data value of‘1’ to a voltage about 8V, to inhibit the programming of the cells.
  • the drain select gate is on, thus it will cause charge- sharing between the string’s capacitance and the bit line capacitance. Since the bit line capacitance is much higher than the string’s capacitance, as a result, the string’s voltage is very closed to 0V. This will cause the selected cell to be programmed.
  • the circuit shown in FIG. 2A allows multiple-page cells to be program-verified and read simultaneously by using the page buffer 200.
  • FIGS. 6A-C show multiple-page read operations in accordance with embodiments of the invention.
  • the multiple-page read operations comprise three steps. The three steps are pre-charging the bit line, discharging the bit line, and sensing.
  • FIG. 6A shows an exemplary circuit that performs the pre-charge bit line step.
  • all the bit line select gates 202a to 202c are turned on, and a pre-charge device, such as device 303 in the sense amplifier 208 as shown in FIG. 3A, is turned on to pre charge the bit line capacitances 206a to 206c to a pre-charge voltage such as VDD or Vbias- Vt, for example, as shown by the dashed lines.
  • a pre-charge device such as device 303 in the sense amplifier 208 as shown in FIG. 3A
  • FIG. 6B shows an exemplary circuit that performs the discharge bit line step.
  • the bit line select gates 201a to 202c are turned off.
  • the read bias conditions are applied to the selected cells 204a to 204c.
  • the selected word line such as WL[m]
  • the on-cells will discharge the bit lines simultaneously. It will be assumed that the cells 204a and 204b are an on-cell and an off-cell, respectively.
  • the on-cell 204a will discharge the bit line capacitance 206a to 0V.
  • the off-cell 204b will not discharge the bit line, and thus the bit line capacitance 206b will remain at the pre-charged voltage. Since the on-cell current is very low (e.g., only about luA), and the bit line capacitance is high due to its connection to many strings, this bit line discharging step may take about 25us to 35us. Thus, the read time is dominated by the bit line discharging time. Thus, by using multiple bit lines discharging according to the invention, the total read time is reduced and the read data throughput is significantly increased.
  • FIG. 6C shows an exemplary circuit that performs the sensing step.
  • the bit line select gates 202a to 202c are sequentially turned on to allow the data stored by the bit line capacitance 206a to 206c to be sensed by the sense amplifier 208 of the page buffer, as shown by the dashed lines.
  • a bit line select gate When a bit line select gate is turned on, it will cause charge-sharing between the bit line capacitance and the sensing node 302 of the page buffer circuit as shown in FIG. 3A. Because the capacitance of the sensing node 302 is much lower than the bit line capacitance, the sensing node 302 will be pull up or down in very short time. Therefore, each bit line’s data may be read in very short time.
  • the data may be transferred to the data register, and then the data register may start to output the data.
  • the page buffer may start to read the next page’s data from the cells. If the chip does not have data register, the data may be output directly from the data latches of the page buffer, and then the page buffer may start to read the next page’s data from the cells.
  • the operations illustrated in FIGS. 6A-C may be also used for multiple-page program- verification.
  • the program-verify operation is very similar to the read operation. The only differences are the word line voltage and the data latches’ operation.
  • read mode the data read from the cells are stored in the data latches directly.
  • program- verify mode the data read from the cells are used to update the data in the data latches.
  • the selected word line may be supplied with a program-verify voltage instead of a read voltage in order to check the cells’ Vt.
  • the data will be used to update the data stored in the latches 207a to 207c for the next program pulse.
  • the logic operation of updating the latches is well known, thus it is not described here.
  • FIG. 6D shows an exemplary embodiment of a page buffer, bit line select gates, and data registers in accordance with the invention.
  • the page buffer 200 and bit line select gates 202 increase program and read data throughput in accordance with the invention.
  • the chip contains multiple data registers 212a to 212n. Also shown are NAND flash memory cell strings 211a to 21 If, the page buffer 200 that comprises a sense amplifier 208 and multiple data latches 207a to 207c, and bit line select gates 202a to 202f.
  • first data register 212a is transferred to the data latches 207a to 207c and then loaded to bit lines 201a to 201c through the bit line select gates 202a to 202c to program the first group of strings 215a
  • second data register 212n is transferred to the data latches 207a to 207c and then loaded to bit lines 201d to 201f through the bit line select gates 202d to 202f to program the second group of strings 215b.
  • the data of the first group of strings 215a is read and stored in the capacitance of the bit lines 201a to 201c.
  • the data is sensed by the sense amplifier 208 through the bit line select gates 202a to 202c and latched in the data latches 207a to 207c. Then, the data of the data latches 207a to 207c are transferred to the first data register 212a.
  • the data of the second group of strings 215b are read and transferred to the second data register 212n. Then, the data can be output from the data registers 212a to 212n to an I/O circuit.
  • FIG. 6E shows an exemplary embodiment of a page buffer and bit line select gates in accordance with the invention.
  • the page buffer 200 and bit line select gates 202 operate to increase program and read data throughput in accordance with the invention.
  • This embodiment is similar to the embodiment shown in FIG. 6D except that the data registers 212a to 212n are eliminated.
  • the page buffer 200 includes multiple data latches 207a to 207c.
  • the data latches 207a to 207c are directly connected to I/O (input/output) bus 600.
  • I/O input/output
  • data is sequentially loaded from the I/O bus 600 to the data latches 207a to 207c, and then loaded to the bit lines 201a to 201o and string groups 215a to 215m.
  • the data of the string groups 215a to 215m is read from the bit lines 201a to 201o and sequentially loaded to the data latches 207a to 207c, and then output to the I/O bus
  • FIG. 6F shows an exemplary embodiment of a single-level-cell (SLC) page buffer and bit line select gates in accordance with the invention.
  • the page buffer 200 and bit line select gates 202 operate to increase program and read data throughput in accordance with the invention.
  • This embodiment is similar to the embodiment shown in FIG. 6A except the page buffer 200 has single data latch 207 for SLC applications.
  • the page buffer 200 is connected to multiple bit lines 201a to 201n through the bit line select gates 202a to 202n.
  • the bit line select gates 202a to 202n can be sequentially turned on by the signals BSG[0] to BSG[n] to load program data from the page buffer 200 to the bit lines 201a to 201n, respectively.
  • the data is stored in the bit line capacitances 206a to 206n, and programmed to the selected cells 204a to 204n, respectively. Because multiple cells 204a to 204n can be simultaneously programmed by using one program pulse, this embodiment significantly increases program throughput.
  • FIG. 7A shows an embodiment of read operation waveforms for the embodiments shown in FIG. 6A-C in accordance with the invention.
  • the detailed circuit of the page buffer 200 is shown in FIG. 3A.
  • a selected word line is supplied with a read voltage, Vread, to read the selected cell and the unselected word lines are supplied with a pass voltage, Vpass, that is higher than the Vt of unselected cells in the NAND cell string to turn on the unselected cells.
  • the drain select gate (DSG) and the source select gate (SSG) are turned on.
  • the source line (SL) is supplied with 0V. These conditions turn on on-cells and turn off off-cells.
  • bit line select gates BSG[0] to BSG[2] are turned on and a pre charge signal PREB, as shown in the page buffer circuit in FIG. 3A, is activated to pre-charge BL[0] to BL[2] to VDD-Vt (of the bit line select gate) or a pre-determined voltage.
  • bit line select gates BSG[0] to BSG[2] are turned off.
  • the bit lines BL[0] to BL[2] will become floating and the selected cells will start to discharge the bit lines.
  • the cell will conduct current to discharge the cell string and the bit line to 0V.
  • the bit line will remain at the pre-charged voltage due to the cell being turned off.
  • the on-cell current is very low, which may be only luA to 5uA, and the bit line capacitance is large, it may take long time to discharge the bit line.
  • a time to discharge the bit line is in a range of about 25us to 35us.
  • the bit line discharge time shown Tdis, may dominate the entire read time.
  • all the BL[0] to BL[2] are discharged simultaneously, thus the total read time is significantly reduced.
  • the first bit line select gate BSG[0] may be turned on. This causes charge- sharing to occur between the sensing node (SA) and BL[0]. Because BL[0] has much higher capacitance than the Sense Amplifier’s sensing node (SA), the sensing node (SA) may be charged to almost VDD or discharged to almost 0V in very short time. Then, a first set signal SO is activated to latch the data to the first data latch of the page buffer. After the data is latched, the BSG[0] may be turn off to isolate BL[0] from the sensing node (SA). [00154] Referring to the page buffer circuit shown in FIG.
  • the latches 207a to 207c are reset to data 1 at beginning of the read operation.
  • the set signal SO turns on the set device 311a. If the sensing node (SA) voltage is near VDD, it will turn on the sensing device 310 and allow the signal SO to set the latch 207a to data 0 (off-cell). If the sensing node (SA) voltage is near 0V, it will turn off the sensing device 310, thus the set signal SO will not set the latch 207a and the latch 207a remain at data 1 (on-cell).
  • the pre-charge signal PREB is activated to pre-charge the sensing node (SA) to VDD.
  • the second bit line select gate BSG[1] is turned on to read the data of the second bit line BL[1].
  • the steps from T4 to T5 are repeated to read the data from BL[1] and BL[2], and using set signals SI and S2 to latch the data in data latches 207b and 207c, respectively.
  • the data may be output from the page buffer directly. If the chip has data registers, as shown at 212a to 212c in FIG. 4D, the data may be transferred from the page buffer to the data register. Thus, the data register may output the data to the I/O buffer while the next bit line’s data is read by the page buffer.
  • the multiple bit lines may be read by using only one page buffer circuit. Since the bit lines BL[0] to BL[2] are discharged simultaneously, the total read time and the read data throughput are increased by three times.
  • the waveforms shown in FIG. 7A are for reading one Vt level.
  • the waveforms may be repeated multiple times with different selected word line voltages to read the multiple bits of the selected cells.
  • the waveforms shown in FIG. 7A demonstrate the fundamental concepts of the embodiments.
  • the waveforms may be modified according to many design considerations or requirements.
  • the word lines’ voltage may be applied after T3 instead of at Tl.
  • the signals BSG[0] to BSG[2] are supplied with a bias voltage, Vbias, to limit the pre-charge voltage of the bit lines.
  • the bit lines BL[0:2] will be pre-charged to Vbias-Vt of the bit line select gates. Because the bit line is precharged to lower voltage, this reduces the bit line discharge time, Tdis.
  • Vbias may be slightly higher than Vt of the sensing device 310 shown in FIG. 3A. This condition reduces the time for an on-cell to discharge the bit line voltage to below Vt of the sensing device 310. For an off-cell, because the bit line pre charge voltage is higher than the Vt of the sensing device 310, the sensing device will turn on to allow the signal SO to set the latch 207a.
  • the precharge voltage of the bit line may be limited by the bias device 306.
  • the signal BIAS are supplied with a bias voltage, Vbias, to precharge the bit lines BL[0] to BL[2] to Vbias-Vt of the bias device 306.
  • the signals BSG[0] to BSG[0] are supplied with a VDD level. This reduces the bit line discharge time, Tdis.
  • Vbias may be slightly higher than Vtl+Vt2, where Vtl and Vt2 are the threshold voltage of the bias device 306 and sensing device 310, respectively. In this way, the bit line is precharged to slightly higher than the Vt of the sensing device 310, thus reducing the bit line discharge time.
  • FIG. 7B shows another embodiment of read operation waveforms in accordance with the invention. This embodiment is similar to the embodiment shown in FIG. 7A except that at time Tl, the source line (SL) is supplied with a positive voltage such as VDD.
  • SL source line
  • a discharge signal (DIS), as shown in the page buffer circuit in FIG. 3A, is activated to discharge the sensing node (SA) and the bit lines BL[0] to BL[2] to 0V.
  • bit line select gates BSG[0] to BSG[2] are turned off, and thus the bit lines BL[0] to BL[n] become floating.
  • the on-cells may start to charge up the bit lines.
  • the bit line may be charged to Vread - Vt (of on-cells).
  • a pre-charge signal PREB is activated to pre-charge the sensing node (SA) to VDD. Then, the bit line select gate BSG[0] is turned on. The voltage of BSG[0] may not be higher than the bit line voltage + Vt (of the bit line select gate). Therefore, for on- cells, the bit line select gate will be turned off. The sensing node (SA) will remain at VDD.
  • the bit line select gate will be turned on.
  • the sensing node (SA) will be discharged to almost 0V due to the charge- sharing between the bit line and the sensing node.
  • a latch signal LAT is activated to latch the data of the sensing node in the page buffer. Then, the steps from times T4 to T5 may be repeated to read the data from the next bit line.
  • FIG. 7C shows another embodiment of read operation waveforms in accordance with the invention.
  • This embodiment uses current-sensing operations.
  • the page buffer circuit shown in FIG. 3B may be used to perform current-sensing.
  • the operations shown in FIG. 7C are similar to those shown in FIG. 7A except that at time Tl, the pre-charge signal PREB is activate to pre-charge the sensing node (SA) and bit lines BL[0] to BL[2].
  • SA sensing node
  • bit lines BL[0] to BL[2] bit lines BL[0] to BL[2].
  • a BIAS voltage is applied to the bias device 306 shown in FIG. 3B to limit the bit line pre-charge voltage to Vbias - Vt (of the bias device).
  • the bit line discharge time between times T3 and T4 is much shorter, because current-sensing does not require the bit line voltage to discharge to near 0V. It only needs to discharge the bit line voltage to lower than Vbias - Vt to turn on the bias device.
  • the pre-charge signal PREB is supplied with a reference voltage, Vref, to limit the pull-up current of the pre-charge device 303 shown in FIG. 3B.
  • the pull-up current is lower than the on-cells’ current.
  • the sensing node (SA) may be discharged to the same bit line voltage as the on-cells’ voltage.
  • the sensing node (SA) remains at VDD.
  • the gain stage of the comparator 305 amplifies the SA voltage to full VDD and 0V. Then, the operations as described in FIG. 7A are performed.
  • FIG. 7D shows another embodiment of read operation waveforms in accordance with the invention that utilize current-sensing.
  • This embodiment is similar to the embodiment shown in FIG. 7C except that the bias device 306 shown in FIG. 3B is removed. Therefore, the function of the bias device is performed by the bit line select gates 202a to 202n.
  • the bit line select gates BSG[0] to BSG[n] are supplied with a bias voltage, Vbias, as shown in FIG. 7D.
  • FIG. 8A shows an embodiment of program and program-verify pulses. As shown in FIG. 8A, the word line (WL) experiences a program pulse 801 and a program-verify pulse 802.
  • the word line is supplied with a program voltage and verify voltage during these times accordingly.
  • program pulse 801 the data of multiple pages are loaded sequentially (as shown at 803) and then programmed simultaneously (as shown at 804).
  • verify pulse 802 the bit lines of multiple pages are discharged simultaneously (as shown at 805), and then the bit lines’ data is sensed sequentially (as shown at 806).
  • FIG. 8B shows an embodiment of a read operation. As shown in FIG. 8B, the bit lines of multiple pages are discharged simultaneously (as shown at 807), and then the bit lines’ data is sensed sequentially (as shown at 808).
  • FIG. 8C shows an embodiment of MLC read or program-verify operations.
  • the word line is supplied with multiple-level voltages 809a to 809c.
  • multiple bit lines are discharged simultaneously, as shown at 801a to 801c, and sequential sensed, as shown at 811a to 811c.
  • FIG. 9A shows a traditional NAND flash memory array architecture.
  • an array 901 is accessed using M word lines and N bit lines.
  • a page buffer 902 is provided that contains the same number of buffers as the number of the bit lines.
  • FIG. 9B shows an embodiment of an array architecture in accordance with the invention. As shown in FIG. 9B, the array is divided into two sub-arrays 901a and 901b.
  • Each sub-array is accessed using M/2 word lines and N bit lines.
  • Each sub-array is connected to one of the page buffers 902a and 902b through 2-to-l bit line select gates 903a and 903b. Therefore, the number of the page buffers 902a and 902b each may be N/2. As a result, the number of total page buffers is N, which is the same as in the array shown in FIG. 9A.
  • the array architecture in FIG. 9B may double the read data throughput, compared with the array shown in FIG. 9A.
  • the bit line length of the array architecture shown in FIG. 9B is 1/2 of the BL length of the array shown in FIG. 9A, and thus its BL capacitance is 1 ⁇ 2 as much. Therefore, the BL discharge time may be reduced to 1/2. Because the BL discharge time dominates the total read time, the total read time may be reduced by about 1/2. Please notice, this read time reduction may benefit both random read and sequential read operations.
  • the sub-arrays 901a and 901b may be read and programmed independently. This results in 2-plane operations.
  • FIG. 9C shows another embodiment of an array architecture that uses 4 sub arrays 901a to 901d.
  • Each sub-array utilizes N/4 page buffers, such as 902a to 902d.
  • the bit lines are connected to the page buffer through 4-to-l BL select gates, such as 903a to 903d.
  • the total page buffer number is the same as the array shown in FIG. 9A.
  • the silicon area of this array architecture is similar to the array shown in FIG. 9A.
  • this array has 4 times the read data throughput compared with the array of FIG. 9A.
  • the bit line length becomes 1/4 for this array architecture, its bit line capacitance as well as the bit line discharge time become 1/4 as well.
  • the read latency also becomes 1/4.
  • the 4 sub-arrays 901a to 901d can be read and programmed independently, resulting in 4-plane operations.
  • the array is divided into any number of sub arrays. The more sub-arrays, the shorter read latency, and higher data throughput may be obtained.
  • FIG. 9D assumed that array is divided into K sub-arrays.
  • the read latency becomes 1/K and the data throughput become K times the array as shown in FIG. 9A.
  • typical SLC NAND flash memory read latency is about 25us and data throughput is about 640MB/s.
  • This high data throughput may saturate the I/O speed when using a low I/O pin count such as 8 or 16. Therefore, it may be most advantageous for use with products having high I/O pin counts, such as Hybrid Memory Cube (HMC) and High Bandwidth Memory (HBM), etc.
  • HMC Hybrid Memory Cube
  • HBM High Bandwidth Memory
  • FIGS. 10A-E show embodiments of 3D array architectures.
  • FIG. 10A shows an array architecture having a 3D array 1001 that contain multiple WL layers and bit lines that run in the Y direction.
  • a page buffer circuit 1002 is located under the array 1001. This configuration may reduce the die size and also allow more page buffers to be integrated.
  • the page buffers may be connected to the bit lines through the bit line contacts 1003.
  • FIG. 10B shows an embodiment of a 3D array architecture that comprises 4 sub-arrays 1001a to lOOld.
  • the page buffers may be divided into 4 groups 1002a to 1002d. Each page buffer group may be connected to a corresponding sub-arrays through the bit line contacts 1003a to 1003d as shown.
  • the die size for this architecture remains about the same as the array shown in FIG. 10A, however, the read latency may be reduced by 1/4 and the read data throughput may be increased by 4 times.
  • FIG. IOC shows another embodiment of a 3D array architecture in accordance with the invention.
  • the array in FIG. IOC is divided into K sub-arrays 1001a to 1001k.
  • the page buffers are also divided into K groups 1002a to 1002k.
  • the die size may remain about the same as the array in FIG. 10A, however, the read latency may be reduced by 1/K and the read data throughput may be increased by K times.
  • FIG. 10D shows an embodiment of the 3D sub-array 1001a and its page buffer circuit 1002a as shown in FIG. IOC.
  • the sub-array 1001a includes multiple bit lines 1004a to 1004n and each bit line is coupled to strings, for instance, bit line 1004n is coupled to strings 1005a to 1005m. Also shown are page buffer circuit 1002a that includes bit line decoders.
  • the page buffer and bit line decoder 1002a are located under the 3D sub-array 1001a to save silicon area.
  • the bit lines 1004a to 1004n are connected to the page buffer and bit line decoders 1002a through contacts 1003a to 1003a’.
  • the number of the page buffers must be equal to the number of bit lines to perform all-bit-line (ABL) programing and read, of half number of the bit lines to perform half-bit-line (HBL) programming and read.
  • the number of the page buffers may be 1/K of the bit lines, where, K is the number of bit line select gate signals, such as BSG[0:K-1].
  • K is the number of bit line select gate signals, such as BSG[0:K-1].
  • all the bit lines still can be programmed and read simultaneously.
  • the array can be divided into K sub-arrays as shown in FIG. 10D.
  • the sub-arrays may be arranged as shown in FIG. IOC.
  • FIG. 10E shows another embodiment of the 3D sub-array 1001a and its page buffer circuit 1002a.
  • the page buffer and bit line decoder 1002a is located on top of the 3D sub-array 1001a.
  • the page buffer and bit line decoder 1002a is formed by using a 3D process such as Silicon-on- Insulator (SOI), etc.
  • SOI Silicon-on- Insulator
  • the page buffer and bit line decoder 1002a are formed on another die or wafer.
  • the die or wafer can connected to the 3D sub-array 1001a by using a 3D integration process, such as copper pillar, micro-bump, Cu-Cu bond, through- silicon via (TSV), and other suitable technologies.
  • TSV through- silicon via
  • FIG. 11A shows another embodiment of a 3D array in accordance with the invention.
  • the bit line is used as temporary data storage.
  • data may be loaded from the page buffer 200 into multiple bit lines, such as 201a to 201c and held by the bit line capacitance, such as 206a to 206c.
  • FIG. 11B shows waveforms that illustrate how data is loaded into multiple bit lines BL[0] to BL[2] as illustrated in FIG. 11A.
  • the drain select gates may be turned off to isolate the strings from the bit lines.
  • FIG. llC shows another embodiment of waveforms to load data to multiple bit lines.
  • the drain select gates (DSG) of multiple or all strings on the bit lines are turned on, and the word lines of multiple or all strings on the bit lines are supplied with a pass voltage (Vpass), such as 6V, to turn on all the cells.
  • Vpass pass voltage
  • the source select gates (SSG) are turned off.
  • FIG. 11D shows waveforms illustrating data reads from the bit line capacitors (e.g., 206).
  • bit lines BL[0] to BL[2] store Data 0 to Data 2 in their bit line capacitance.
  • BSG[0] to BSG[2] charge sharing may occur between the bit line capacitance and the sensing node 302 of the page buffer circuit 200, as shown in FIG. 3A. Because the bit line capacitance is much larger than the sensing node 302, the sensing node 302 will become almost the bit line voltage in a very short time. Therefore, the bit line select gates BSG[0] to BSG[2] may be switched very fast to read the data of BL[0] to BL[2] in very high speed.
  • bit line capacitance 206a to 206c may be read by using the sensing operation as described in FIG. 6C. Therefore, the bit line capacitors may be used to store the data.
  • FIG. 9D assume an array is divided into K sub-arrays. Each array contains N bit lines. Thus, the entire array contains K x N bit lines. In accordance with the invention, storage of K x N bits of data using the bit line capacitors can be achieved.
  • the array stores data in the bit line capacitance which may be used as working memory, such as DRAM.
  • the system may read, write, and refresh the data like DRAM.
  • the data may be read from the bit line capacitors to the page buffer, as shown in FIG. 6C, and then programmed to NAND flash memory cells, as described in FIGS. 4B-5C.
  • the bit lines may be used as data registers to temporary store the input data.
  • the data may be read from the bit lines using the operations of FIG. 6C, and then programmed to selected page of NAND flash memory cells.
  • the input data may be temporarily stored to the bit lines in the sub-arrays 901a to 901c.
  • the data may be read from the bit lines of these sub-arrays and programmed to the sub-array 901d. This storage operation provides a large capacity of‘free’ data registers without increasing the area of the circuits.
  • FIG. 12A shows another embodiment of a 3D array in accordance with the invention.
  • This circuit is capable to perform both TLC and SLC programming modes.
  • the array in FIG. 12A comprises bit line select gates 202a to 202c and data latches 207a to 207c that store data bits DO, Dl, and D2 for TLC programming, respectively. Also shown are latch pass gates 220a to 220c, which are also shown in FIGS. 3A-B.
  • TLC mode the page buffer will program three bits data, DO to D2, to single cell.
  • SLC mode the page buffer will program the three bits data, DO to D2, to three different cells located in three bit lines.
  • the SLC signal turns off the pass gates 221a to 221c.
  • bit select gate signals BSG[0] to BSG[2] selectively turn on one of the bit line select gates 202a to 202c.
  • the signals P0 to P2 selectively turn on one of the pass gates 220a to 220c to pass the data of the latches to the selected bit line according to the programmed Vt level.
  • bit line select gates 202a to 202c and the latch pass gates 220a to 220c may be all turned off.
  • the signal SLC turns on the pass gates 221a to 221c.
  • the data of the latches 207a to 207c is passed to the bit lines 201a to 201c, respectively.
  • the multiple bit lines may be programmed by using the data stored in the multiple latches in the page buffer simultaneously.
  • FIG. 12B shows another embodiment of a 3D array in accordance with the invention.
  • the array comprises bit line select gates 202a to 202c and data latches 207a to 207c that store data bits DO, Dl, and D2 for TLC programming, respectively.
  • latch pass gates 220a to 220c are also shown in FIGS. 3A-B.
  • the SLCB signal turns on the pass gates 222a and 222b.
  • the signals BSG[0] to BSG[2] selectively turn on one of the bit line select gates 202a to 202c.
  • the signals P0 to P2 selectively turn on one of the pass gates 220a to 220c to pass the data of the latches to the selected bit line according to the programmed Vt level.
  • bit line select gates 202a to 202c and the latch pass gates 220a to 220c may be all turned on.
  • the SLCB signal turns off the pass gates 222a and 222b.
  • the data of the latches 207a to 207c may be passed to the bit lines 201a to 201c, respectively. In this way, multiple bit line may be programmed by using the data stored in the multiple latches in the page buffer simultaneously.
  • FIG. 13 shows an embodiment of a NAND flash memory array.
  • the bit line-to-bit line capacitance such as 401a to 401c may dominate the parasitic capacitance of bit lines.
  • the bit lines may be very long and the bit line pitch may be very tight. This may cause bit line-to bit line coupling problems when loading the data to the multiple bit lines.
  • the select gate 202a is turned off.
  • Next select gate 202b is turned on to load the next data from the page buffer 200 to BL[1] 201b.
  • BL[0] is floating with the previously loaded data. Therefore, the data of BL[1] 201b may couple the BL[0] 201a through the capacitance 401a. As a result, the data of BL[0] 201a may be changed due to this coupling.
  • the select gate 202b is turned off.
  • the select gate 202c is turned on to load the next data from the page buffer 200 to BL[2] 201c.
  • the data of BL[2] 201c may couple to BL[1] 201b to change the data of BL[1].
  • FIG. 14 shows an array having bit line shielding that is used to prevent bit line coupling as described above.
  • the array comprises shielding devices 402a to 402d that are added to the bit lines.
  • the page buffer 200 operates to only load data to the even bit lines, such as BL[0] and BL[2] or the odd bit lines such as BL[1] and BL[3].
  • the signal SHD[1] turns on the devices 402b and 402d, to pass VDD from the VSHD signal to the odd bit lines BL[1] and BL[3].
  • bit lines such as BL[0] and BL[2]
  • odd bit lines BL[1] and BL[3] are supplied with the inhibit data, VDD
  • the cells on the odd bit lines may not be programmed.
  • only half of the bit lines may be programmed at one time, which may reduce the program throughput by half.
  • the program throughput may be increased many times, so that using the bit line shielding described above may be acceptable.
  • FIG. 15A shows another embodiment of a circuit for mitigating bit line- to-hit line coupling.
  • multiple bit lines BL[0] to BL[5] are alternatively connected to page buffers 200a and 200b through the bit line select gates 202a to 202f as shown.
  • Each page buffer comprises three data latches as described above.
  • the page buffers provide data to either odd or even bit lines so that when one set of bit lines is in use, shielding is provided by the other set of bit lines.
  • the number of the bit lines and bit line select gates shown in FIG. 15A are exemplary. The invention may be applied to any number of bit lines and bit line select gates.
  • FIG.15B shows waveforms illustrating how data is loaded into the bit lines of FIG. 15A to mitigate coupling.
  • the signals BSG[0], BSG[2], and BSG[4] are sequentially turned on to load data D[0], D[2], and D[4] to the bit lines BL[0], BL[2], and BL[4].
  • the signals BSG[1], BSG[3], and BSG[5] are sequentially turned on to load data D[l], D[3], and D[5] to the bit lines BL[1], BL[3], and BL[5].
  • the timing of the lines BSG[0] to BSG[5] should be noted.
  • BSG[1] is turned on to load D[l] to BL[1]
  • BSG[0] is still on, and therefore BL[0] is not floating.
  • BL[1] couples BL[0], the page buffer 200a
  • FIG. 16 shows an exemplary embodiment of a circuit that resolves the last bit line coupling issue as described with reference to FIGS. 15A-B.
  • the circuit of FIG. 16 comprises two adjacent groups 403a and 403b of bit lines. For these groups, their bit line select gates 202a to 202f and 202a’ to 202F are mirrored.
  • the group 403a is loading data from BL[0] to BL[5]
  • the group 403b is loading data from BL[0]’ to BL[5]’.
  • the data of BL[5] and BL[5]’ are loaded at the same time, which resolves the coupling problem between BL[5] and BL[5]’.
  • FIG. 17A shows an embodiment of a circuit that comprises even and odd page buffers 200a-d, as illustrated in FIG. 16, and that are placed on both side of an array 404.
  • the array 404 may also be a sub-array as shown at 901a in FIG. 9D.
  • FIGS. 17B-C show embodiments of 2D and 3D versions of an array (or sub array) 404 for use in the circuit of FIG. 17A.
  • FIGS. 18A-B show circuits having a divided bit line structure.
  • FIG. 18A shows the circuit comprising multiple page buffers 200a to 200d that are connected to global bit lines, GBL[0] to GBL[3].
  • the global bit lines are connected to multiple blocks 405a to 405n. Each block receives bit line select gate signals, such as BSG0[0:5] to BSGn[0:5].
  • FIG. 18B shows an embodiment of a circuit of one block, such as block 405a, shown in FIG. 18A.
  • the global bit line such as GBL[1] for example, is connected to sub-bit lines, BL[1], BL[3], and BL[5] through the bit line decoders 202a to 202c.
  • the bit line select gates’ structure is similar to the one shown in FIG. 17A. Therefore, the data may be applied to the sub-bit lines, BL[0] to BL[5] and BL[0]’ to BL[5]’, using the waveform shown in FIG. 15B to solve the bit line coupling issue.
  • FIG. 19A shows another embodiment of a bit line select gate circuit according to the invention.
  • the circuit in this embodiment is similar to the one shown in FIG. 15A except that four page-buffers 200a to 200d are used, and data for two bit- lines may be loaded at one time.
  • FIG. 19B shows waveforms illustrating the operation of the circuit of FIG. 19A.
  • BSG[0] goes high, it will turn on two bit line select gates 202a and 202a’ to load data D[0] and D[l] from the page buffers 200a and 200b to BL[0] and BL[1], respectively.
  • BSG[1] goes high, it will turn on two bit line select gates 202b and 202b’ to load data D[2] and D[3] from the page buffers 200c and 200d to BL[2] and BL[3], respectively.
  • BSG[1] is turned on, BSG[0] is still turned on. Therefore, the coupling between the BL[1] and BL[2] is eliminated. This same mechanism is applied to all the other select gates. As a result, the bit line coupling problem is resolved.
  • the bit line coupling issue described in FIG. 13 may not only occur when loading data in a write operation, but also in a read operation.
  • the bit line with on-cell will be discharged by the on- cell. It may couple the adjacent bit line with off-cell through the bit line-to-bit line capacitance, as 401a to 401c shown in FIG. 13. Therefore, the adjacent bit line’s voltage may be pulled low and cause the off-cell being mistakenly read as an on-cell.
  • the shielding device as shown in FIG.
  • FIG. 20A shows an embodiment of a circuit that addresses bit line coupling without sacrificing the read data throughput.
  • the circuit of FIG. 20A comprises bit line select gates 202a to 202c that are connected to bit lines, BL[0] to BL[2].
  • a pull-up device 501 is a PMOS pull-up device that is coupled to the bit line select gates 202a to 202c. In another embodiment, the pull-up device 501 may be a NMOS.
  • FIG. 20B shows waveforms to perform read operations by the circuit shown in FIG. 20A.
  • the time interval T1 is a“developing phase” and the time interval T2 is an “evaluating phase.”
  • VREF is supplied with 0V and the bit line select gates, BSG[0] to BSG[2], are supplied with Vbias. This charges up the bit lines, BL[0] to BL[2], to a predetermined voltage, Vbias - Vt.
  • Vt is the threshold voltage is the select gates 202a to 202c.
  • the signal VREF may be supplied with a voltage that limits the current of the pull-up device 501 to below the on-cell current, such as lOnA to lOOnA.
  • BSG[0] to BSG[2] are turned off and then sequentially turned on to connect the bit lines BL[0] to BL[2] to the sensing node SA, respectively. If the bit line has an on-cell, the bit line voltage may below Vbias - Vt, due to the on-cell current. Therefore, the sensing node SA may be pulled low to be the same as the bit line voltage.
  • the sensing node SA will go to VDD.
  • the signal SA may be sent to the input of a comparator or the gate of a PMOS transistor to determine the data.
  • FIG. 21A shows another embodiment of the sensing circuit according to the invention. This embodiment is similar to FIGS. 20A-B except that a large pull-up device 502 may be used to pre-charge the bit lines.
  • FIG. 21B shows waveforms that illustrate the operation of the circuit of FIG. 21A.
  • FIG. 22A shows another embodiment of the sensing circuit according to the invention. This embodiment is similar to FIGS. 21A-B except that a bias device 503 is used to limit the pre-charge voltage of the bit lines.
  • the bit line select gate signals, BSG[0] to BSG[2] are supplied with digital signals VDD and 0V.
  • FIG. 22B shows waveforms that illustrate the operation of the circuit of FIG.
  • FIG. 23A shows another embodiment of the sensing circuit according to the invention. This embodiment is similar to FIGS. 22A-B except that the bit lines are pre charged by using pull-up device 504a to 504c.
  • FIG. 23B shows waveforms that illustrate the operation of the circuit of FIG.
  • FIG. 24A shows another embodiment of the sensing circuit according to the invention. This embodiment uses‘source sensing’.
  • FIG. 24B shows waveforms illustrating the operation of the sensing circuit shown in FIG. 24A, where T1 is the“developing” phase and T2 is the“evaluating” phase.
  • the selected word line is supplied with a read voltage (Vrd) and the unselected word line is supplied with a pass voltage (Vpass).
  • the selected cell string s source line (SL) is supplied with VDD.
  • a discharge device 505 is added to discharge the bit lines.
  • the bit line select gates, BSG[0] to BSG[2], are supplied with a bias voltage (Vbias) to limit the discharge current to below the on-cell’s current, such as lOnA to lOOnA.
  • Vbias bias voltage
  • the on-cell conducts current from the source line SL to the bit line and charges the bit line up to about Vrd - Vt (cell), where Vt (cell) is the on-cell’s threshold voltage.
  • Vt (cell) is the on-cell’s threshold voltage.
  • the bit line will be discharged to 0V.
  • FIG. 24B when on-cell’s bit line is charged up, it may couple to the off-cell’s bit line. However, after the coupling stops, the off-cell’s bit line will be discharged to 0V by the discharge device 505.
  • the discharge device 505 is turned off.
  • the bias device 503 is turned on.
  • the bit line select gates, BSG[0] to BSG[2] are sequentially tuned on to connect bit lines to the sensing node SA to determine the data according to the bit line voltage.
  • FIG. 25A shows another embodiment of the page buffer and bit line decoder circuit according to the invention.
  • FIG. 25A shows the page buffer circuit 200 and bit line select gates 202a to 202f.
  • the even bit line select gates 202a, 202c, and 202e are connected to PB[0]
  • the odd bit line select gates 202b, 202d, and 202f are connected to PB[1].
  • the page buffer 200 is coupled to PB[0] and PB[1] through the shielding voltage select gates 230a and 203b, respectively.
  • the shielding voltage select gates 230a and 230b control the page buffer 200 to load data to or read data from PB[0] or PB[1], respectively.
  • PB[0] and PB [1] are coupled to a‘shielding’ voltage source (VSH) through the select gates 231a and 231b, respectively.
  • VSH a‘shielding’ voltage source
  • the shielding voltage may be 0V, VDD, or any other suitable voltage.
  • the shielding voltage select gate 230a is turned on and 230b is turned off.
  • the even bit line select gates, BSG[0], BSG[2], and BSG[4] are sequentially turned on to read data from the even bit lines, BL[0], BL[2], and BL[4] to the page buffer 200, or to load data from the page buffer 200 to the even bit lines.
  • the select gate 231a is turned off and 231b is turned on. This applies the shielding voltage, VSH, to PB [ 1 ] .
  • bit line select gates, BSG[1], BSG[3], and BSG[5] are all turned on to pass the shielding voltage, VSH, to the odd bit lines, BL[1], BL[3], and BL[5]. Using these operations, the even bit lines are shielded from each other by the odd bit lines, thus bit line capacitance coupling is eliminated.
  • FIG. 25B shows another embodiment of the page buffer and bit line decoder circuit according to the invention. This embodiment is similar to the embodiment shown in FIG. 25A except that the bit line shielding voltage, VSH, is applied by the select gates 232a to 232f.
  • the even select gates 232a, 232c, and 232e are connected to a control signal SB1
  • the odd select gates 232b, 232d, and 232f are connected to a control signal SB2.
  • the shielding voltage select gate 230a is turned on and the gate 230b is turned off.
  • the control signal SB1 will turn off the even select gates 232a, 232c, and 232e.
  • the control signal SB2 will turn on the odd select gates 232b, 232d, and 232f to pass the shielding voltage, VSH, to the odd bit lines, BL[1], BL[3], and BL[5].
  • VSH shielding voltage
  • FIG. 25C shows another embodiment of the page buffer and bit line decoder circuit according to the invention.
  • the bit line select gates 202a to 202f are all connected to the page buffer 200.
  • the even and odd bit lines are coupled to the shielding voltage, VSH, through the select gates 232a to 232f.
  • VSH shielding voltage
  • the even select gates 232a, 232c, and 232e are turned off.
  • the even bit line select gates 202a, 202c, and 202e may be sequentially turned on, to read data from the even bit lines to the page buffer 200 or to load data from the page buffer 200 to the even bit lines.
  • odd bit line select gates 202b, 202d, and 202f are turned off.
  • the odd select gates 232b, 232d, and 232f are turned on to pass the shielding voltage, VSH, to the odd bit lines, BL[1], BL[3], and BL[5].
  • VSH shielding voltage
  • the chip may contain multiple data latches to store multiple pages of data during program and read.
  • FIG. 26A shows an exemplary embodiment of a circuit according to the invention that only requires one data latch to perform the same operations as described above that use multiple data latches.
  • the circuit of FIG. 26A can be configured to utilize no data latch.
  • four bit lines BL[0] to BL[3] are connected to page buffer 506 through four bit line select gates 202a to 202d.
  • the bit line select gates are connected to signals BSG[0] to BSG[3].
  • the array may use the even/odd bit line architecture shown in FIGS. 25A-C.
  • the unselected even or odd bit lines are supplied with a DC voltage to shield those bit lines from bit line coupling.
  • circuit shown in FIG. 26A only shows the selected bit lines.
  • the data line 510 is connected to a bias device 508.
  • the bias device 508 is used to pre-charge the data line 510 and the selected bit line to a bias voltage.
  • the gate of the bias device 508 is connected to a bias voltage, BIAS, or a feedback circuit, or a comparator to increase pre-charging speed.
  • the device 507 is a loading device.
  • the gate of the loading device 507 is connected to a reference voltage, VREF, to generate the desired loading current for the sensing operation.
  • the loading device 507 may be implemented by an NMOS device.
  • the loading device may comprise multiple devices with different sizes, such as a larger device for fast pre-charging, and a smaller device for data sensing.
  • bit lines BL[0] and BL[1] are loaded with 0V to program Cell 0 and Cell 1.
  • the bit lines BL[2] and BL[3] are loaded with VDD to inhibit Cell 2 and Cell 3.
  • the bit line data is loaded sequentially by sequentially turning on the bit line select gates 202a to 202d to store the bit line data using the bit line capacitance.
  • a program- verification is performed to check the programmed cells’ Vt and determine the next program data.
  • Cell 0 to Cell 3 are assumed to have four different conditions. Assume Cell 0 is still an on-cell. That means that Cell 0 is not successfully programmed yet.
  • the next data for BL[0] shall be 0V to keep on programing Cell 0. Assume Cell 1 has been successfully programmed to a desired Vt, thus it will become an off-cell during verification. That means that the next data for BL[1] shall be changed to VDD in order to inhibit Cell 1. Assuming Cell 2 and Cell 3 are an on-cell and an off-cell, respectively, because their current program data is VDD, which means they don’t need to be programmed. The next data for BL[2] and BL[3] shall be kept at VDD to inhibit Cell 2 and Cell 3.
  • FIG. 26B shows a program- verify operation for use with the circuit shown in FIG. 26A.
  • the operation basically contains three steps, namely: pre-changing bit line step 511, discharging bit line step 512, and sensing and updating bit line data step 513.
  • pre-charging bit line at time TO, BSG[0] to BSG[3] are supplied with VDD to turn on all the bit line select gates 202a to 202d.
  • VREF is supplied with 0V to fully turn on the loading device 507 for fast pre-charging.
  • BIAS is supplied with a bias voltage, Vbias. This condition will pre-charge BL[0] to BL[1] from 0V to Vbias - Vt.
  • Vt is the threshold voltage of the bias device 508. Meanwhile, BL[2] and BL[3] are remained at VDD. Generally, the BIAS signal has a range of approximately Vt to VDD and should be greater than Vt to turn on the bias device (e.g., device 508 shown in FIG. 26A). The BL voltage is precharged to BIAS voltage minus Vt of the device 508 shown in FIG. 26A. [00230] For step 512, discharging bit line, at time Tl, all the bit line select gates BSG[0] to BSG[3] are turned off. The source select gate, SSG 516, and the drain select gate, DSG 515, of the selected strings are turned on.
  • the selected word line 509 and the other unselected word lines are supplied with a verify voltage and a pass voltage, respectively.
  • the source line 518 is supplied with 0V. This will turn on the on-cells, Cell 0 and Cell 2, to discharge BL[0] and BL[2], respectively.
  • the BL[0] will be discharged from Vbias - Vt to a voltage lower than Vbias - Vt.
  • BL[2] may be still higher than Vbias- Vt, because BL[2]’s initial voltage is VDD. Due to large bit line capacitance, it will take very long time to discharge BL[2] to below Vbias-Vt using the on-cell current.
  • BL[1] and BL[3] will remain at the pre charged voltage Vbias-Vt and VDD, respectively. Because Cell 1 and Cell 3 are off-cells, they will not discharge BL[1] and BL[3].
  • the source select gate 516 or the drain select gate 515 is turned off to stop Cell 0 and Cell 2 from discharging BL[0] and BL[2]. After that, the bit line voltage will be maintained by the large bit line capacitance.
  • the source select gate, SSG 516, and drain select gate, DSG 515 remain at a high level from T2 to T9. This will cause the on-cells, Cell 0 and Cell 2, to keep on discharging BL[0] and BL[2]. However, because the sensing time (T2 to T9) is very short, the current of Cell 2 will not discharge BL[2] to below Vbias-Vt before the end of the verification.
  • step 513 sensing and updating bit line data, at time T2, VREF is supplied with a reference voltage, Vref, to control the loading current of the loading device 507.
  • the loading current is preferred to be lower than the on-cell current.
  • the bit line select gates BSG[0] to BSG[3] are sequentially turned on to connect the sensing circuit to BL[0] to BL[3], respectively.
  • the sensing circuit will verify the bit line voltages and, according to the result, load the next data to the bit lines.
  • the select gate signal BSG[0] will turn on the bit line select gate 202a shown in FIG. 26A. This causes charge sharing to occur between BL[0] and the data line, DL 510, and the signal node, SA 514. Because the capacitance of BL[0] is much larger than the capacitances of the data line 510 and SA 514, both data line 510 and SA 514 will be pulled low to near BL[0]’s voltage, which is below Vbias-Vt, in a very short time.
  • the SA 514 node is connected to a data buffer 506.
  • the data buffer 506 will determine the verify data is 1 based on SA’s level.
  • the LOAD signal will go high to load 0V back to BL[0]. Then, BSG[0] will go low to isolate BL[0] from the data line 510 and sensing circuit. As a result, because BL[0] is loaded with 0V, the Cell 0 will be programmed again by the next programming pulse.
  • BSG[0] is supplied with VDD+Vt. This allows the page buffer to load full VDD to the bit line if the next data is VDD.
  • BSG[0] may be supplied with VDD, that will only load the bit line to VDD-Vt.
  • BSG[0] may use a two-step pulse with VDD for verification and VDD+Vt for loading the next data.
  • BSG[1] will turn on the next bit line select gate 202b to connect the sensing circuit to BL[1] to verify the voltage of BL[1].
  • BL[1] is previously pre-charged to Vbias-Vt. Because the capacitance of data line 510 is much smaller than the capacitance of BL[1], the charge- sharing result will cause the data line 510 voltage to become very close to BL[l]’s voltage (e.g., Vbias-Vt). This will make the bias device 508 to turn off. Therefore,
  • SA node 514 will be charged up by the loading current of the loading device 507 to full VDD. This indicates that the next data will be 1.
  • BSG[1] will go low to isolate BL[1] from the page buffer circuit. As a result, Cell 1 will be inhibited from the next programming since it already passes the program- verification.
  • BSG[2] will turn on the next bit line select gate 202c to verify the voltage of BL[2]. Because BL[2] remains at a voltage higher than Vbias-Vt, the bias device 508 will be turn off. The SA node will be charged up by the loading current of the device 507 to full VDD, if the previous bit line pulls SA low. This indicates that the next data will be 1.
  • BSG[2] will go low to isolate BL[2] from the page buffer circuit.
  • the Cell 2 will be inhibited again for the next program pulse.
  • BSG[3] will turn on the next bit line select gate 202d to verify the voltage of BL[3]. Because BL[3] re ains at VDD, the bias device 508 will be turn off.
  • the SA node will be charged up by the loading current of the device 507 to full VDD, if the previous bit line pulls SA low. This indicates that the next data will be 1.
  • the LOAD signal will go high to load VDD to BL[3]. Then,
  • BSG[3] will go low to isolate BL[3] from the page buffer circuit.
  • the Cell 3 will be inhibited again for the next program pulse.
  • the selected word line may be raised to the program voltage, such as 20V, to perform the next program pulse, as shown at time T3 in FIG. 5E.
  • the data line 510 voltage after charge-sharing may be slightly lower than Vbias -Vt. This may cause the bias device 508 to turn on. If the selected bit line has an off- cell, the loading current of the loading device 507 will charge up the bit line and data line to Vbias - Vt, and pull the SA node 514 to VDD. However, this may cause a delay. To resolve this issue, in another embodiment, the VBIAS voltage may be slightly lowered during the sensing step 513, as shown by the dashed line 517 in FIG. 26B. This will prevent the bias device 507 from turning on by the slightly lower data line 510.
  • the bias device 508 may contain two devices, one for pre-charging, and the other one for sensing.
  • the device for sensing may have a longer channel length or a different Vt adjust implantation to make its Vt slightly higher.
  • the gates of the two bias devices may be connected to different bias voltages.
  • the bias voltage for sensing may be slightly lower than the bias voltage for pre-charging.
  • the data buffer 506 may apply a short pulse to discharge the data line 510 to 0V, and then let the bias device 508 pre-charge the data line 510 to Vbias-Vt. This may provide the desired initial voltage for data line 510 before each charge sharing.
  • a discharge device as shown 505 in FIG. 24A, may be connected to data line 510 to perform the discharging.
  • FIGS. 26A-B are examples that demonstration one embodiment of the invention. It shown be known that the circuit and operational waveforms may be modified in many other ways. For example, the sensing circuits shown in FIG. 20A to FIG. 24B may be used to replace the sensing circuit shown in FIG. 26A. These modifications and variations are within the scope of the invention.
  • FIG. 26C shows an embodiment of a circuit implementation of the data buffer 506 in FIG. 26A.
  • the circuit includes a data latch 520.
  • the data latch 520 is reset by applying a RES pulse to turn on the NMOS 521. This will pull low the DA node 525 to 0V.
  • the SA node of the previous stage sensing circuit is connected to PMOS 523. As described in FIG. 26B, for bit lines with off-cell, SA node will be pulled up to VDD. This will turn off PMOS 523. For bit lines with on-cell, SA node will be pulled down to below Vbias - Vt. This will turn on PMOS 523. After the SA voltage is ready, a LATB pulse may be applied to turn on PMOS 522.
  • SA If SA is low, it will pull up DA node 525 to VDD. If SA is high, DA node 525 will remain at 0V. After that, a LOAD pulse can be applied to load the data of the latch 520 into the data line DL.
  • FIG. 26C is an exemplary circuit targeted at minimizing circuit size. It is obvious that more complicated circuits, such as a sense amplifier or a comparator circuit, may be used to replace the input stage formed of PMOS 522 and 523. These variations and modifications shall remain in the scope of the invention.
  • FIG. 27A shows another embodiment of a circuit implementation that uses the sensing circuit shown in FIG. 20A.
  • the bias device 508, as shown in FIG. 26A is eliminated.
  • the function of the bias device is performed by BSG[0] to BSG[3], as shown by the waveforms in FIG. 27B.
  • the program data are loaded into the bit lines and stored in the bit line capacitance during programming. During verification, the data of the cells are directly verified from the bit lines and load the next program data back to the bit line.
  • FIG. 27C shows another embodiment of program-verify operations according to the invention using the embodiment of the page buffer 200 and bit line select gates 202a to 202n shown in FIG. 6F.
  • a detailed embodiment of the page buffer 200 is shown in FIG. 3C.
  • the page buffer circuit 200 includes a bias device 306 and a pre-charge device 303 that are connected to the SA node. Also shown are sensing device 310, latch pass gate 220, set device 311, reset device 312, and data latch 207 having Q and QB nodes.
  • sensing device 310 latch pass gate 220, set device 311, reset device 312, and data latch 207 having Q and QB nodes.
  • bit lines BL[0] to BL[3] are used to perform program-verify operations. Assume BL[0] and BL[1] are programmed bit lines and BL[2] and BL[3] are inhibit bit lines. The data stored in BL[0] and BL[1] is 0 (0V) and the data stored in BL[2] and BL[3] is 1 (VDD), respectively.
  • the signals BSG[0:3] are supplied with VDD to turn on the bit line select gates 202a to 202d.
  • the signal PREB supplies 0V to turn on pre-charge device 303 to charge the SA node to VDD.
  • the signal BIAS supplies a bias voltage, Vbias. This will charge up the programmed bit lines BL[0] and BL[1] from 0V to Vbias- Vt of the bias device 306, while the inhibit bit lines BL[2] and BL[3] remain at VDD.
  • Vbias may be slightly higher than Vtl+Vt2, where Vtl and Vt2 are the threshold voltages of the bias device 306 and sensing device 310. This allows on-cells to quickly discharge the bit line voltage to below Vt of the sensing device 310.
  • the signal SET is supplied with a pulse to set the Q node of the latch 207 to 0V.
  • the signals BSG[0:3] go low to turn off the bit line select gates 202a to 202d.
  • the selected word line (WL) is supplied with a verify voltage, VR.
  • the signal DSG goes high to turn on the drain select gate of the selected string.
  • the selected cells on BL[0] and BL[2] are on-cells (Vt ⁇ VR) and the cells on BL[1] and BL[3] are off-cells (Vt > VR).
  • the on-cells discharge the voltage of BL[0] and BL[2]. Because the initial voltage of BL[0] and BL[2] are different, after a time period, BL[0] is discharged to below Vt, while BL[2] is above Vt or even Vbias-Vt.
  • the signal BSG[0] goes high to turn on the bit line select gate 202a to couple BL[0] to the page buffer 200. Because the voltage of BL[0] is lower than Vbias-Vt, the bias device 306 is turned on to pull low the SA node of the page buffer to the same voltage of BL[0]. The SA voltage turns off the sensing device 310.
  • the signal RES is supplied with a pulse to turn on the reset device 312.
  • the sensing device 310 is turned off by the voltage of S A node, the latch 207 will not be reset and the Q node of the latch 207 remains 0V.
  • the signals PGM, BIAS, and PREB are supplied with pulses to update the program data on BL[0]. It will load the data 0 (0V) from the Q node of the latch 207 to BL[0]. Thus, the program data on BL[0] is updated to 0 (0V). Because the cell on the programmed bit line BL[0] is an on-cell, it indicates that the cell is not successfully programmed yet, thus it will be programmed again by the next program pulse.
  • the signal BSG[0] goes low to turn off the bit line select gate 202a of BL[0].
  • the signal BSG[1] goes high to turn on the bit line select gate 202b of BL[1] to couple BL[1] to the page buffer. Because the cell on BL[1] is an off-cell, the voltage of BL[1] remain at the precharge voltage, Vbias-Vt, which turns off the bias device 306. Therefore, the SA node of the page buffer is pulled up to VDD to turn on the sensing device 310.
  • the signal RES is supplied with a pulse to turn on the reset device 312. Because the sensing device 310 is turned on by the voltage of SA node, the reset device 312 will reset the Q node of the latch 207 to VDD.
  • the signals PGM, BIAS, and PREB are supplied with pulses to update the program data on BL[1]. It will load the data 1 (VDD) from the Q node of the latch 207 to BL[1]. In order to load VDD to BL[1], the level of the signals PGM, BIAS, and PREB may be VDD+Vt. Thus, the program data on BL[1] is updated from 0 (0V) to 1 (VDD). Because the cell on the programmed bit line BL[1] is an off-cell, it indicates that the cell is successfully programmed. Thus, it will be inhibited during the next program pulse.
  • the signals BSG[2] and BSG[3] go high to turn on the bit line select gates 202c and 202d on BL[2] and BL[3], respectively.
  • the previously-described operations from T3 to T6 time are repeated to verify the cells and update the bit line data for BL[2] and BL[3], respectively. Because both BL[2] and BL[3] voltage is higher than Vbias- Vt, the bias device 306 is turned off and the SA node is pulled up to VDD.
  • the Q node of the latch 207 for both BL[2] and BL[3] will be reset by the reset pulse RES to data 1 (VDD), and updated by the PGM, BIAS, and PREB pulses to charge BL[2] and BL[3] to data 1 (VDD).
  • the originally inhibited BL[2] and BL[3] remain at inhibit voltage VDD.
  • VDD is used as an inhibit voltage.
  • the inhibit voltage may be VDD-Vt.
  • the pulse can be at a VDD level, which will charge the BL to VDD-Vt.
  • FIG. 28A shows an exemplary embodiment of waveforms for read operations. These waveforms are similar to the program- verification waveforms shown in FIG. 26B, except that the steps of loading the next data back to the bit line are eliminated. Moreover, the selected word line is supplied with a read voltage instead of a verify voltage.
  • the read waveforms illustrate how four cells, Cell 0 to Cell 3, are read sequentially. In this example, Cell 0 and Cell 2 are on-cells and Cell 1 and Cell 3 are off-cells.
  • pre charging bit line all the bit lines BL[0] to BL[3] are pre-charged to Vbias-Vt.
  • step 512 discharging bit line
  • the on-cells will discharge BL[0] and BL[1] to a voltage lower than Vbias-Vt.
  • step 513 sensing, the bit line select gates, BSG[0] to BSG[3], are sequentially turned on to connect the sensing circuit to BL[0] to BL[3]. This causes charge- sharing to occur between the capacitance of the data line 510 and the bit line. Due to the capacitance of data line 510 being much smaller than the bit line capacitance, the SA node 514 will be pulled up and down in very short time.
  • FIG. 28B shows another embodiment of waveforms for read operations for use with the circuit embodiment shown in FIG. 17A.
  • the waveforms are similar to the verification waveforms shown in FIG. 27B, except that the steps of loading the next data back to the bit lines are eliminated.
  • FIG. 29A shows a layout arrangement of a page buffer circuit of a conventional 3D NAND flash memory.
  • the flash memory comprises a 3D NAND flash memory sub-array 601.
  • the sub-array 601 contains multiple cell strings, as the equivalent circuit shown in FIG. 17C.
  • the bit lines are located on top of the array 601 and run in the Y direction.
  • Page buffers 602 are connected to the bit lines through the contacts 603a to 603n.
  • ABL All-Bit-Line
  • HBL Half-Bit- Line
  • Circuits 604 are for data path, redundancy, page buffer drivers, word line drives, etc.
  • the page buffers 602 and circuits 604 are located below the array 601 to reduce the die size.
  • FIG. 29B shows a conventional array configuration having two adjacent sub arrays 601a and 601b. It should be noted that the page buffers 602a and 602b and circuits 604a and 604b are interleaved, so that the circuits 604a and 604b can drive the page buffers 602b and 602a, respectively.
  • the structure shown in FIG. 29B is called a‘tile’.
  • a large memory array can be formed by arranging multiple tiles in both the X and Y directions.
  • FIG. 30A shows an embodiment of a layout arrangement of page buffers and circuits for a 3D array according to the invention.
  • the 3D sub-array is divided into multiple sectors 601a to 601d. The bit lines between the sectors are separated.
  • bit lines of sectors 601a to 601d are connected to the page buffers 602a to 602d,
  • Circuits 604a to 604d are circuits for data path, redundancy, page buffer drivers, word line drives, etc.
  • the number of the bit lines is 1KB.
  • the 1KB bit lines are connected to 1KB page buffers in 602 to perform program, verify, and read operations simultaneously.
  • FIG. 30A assume the sub-array is divided into 4 sectors, as shown 601a to 601d. Each sector will contain 1KB bit lines, and each bit line’s length is 1/4 of the conventional art’s bit line length.
  • each group contains 256B page buffers.
  • 4 bit line select gates such as 202a to 202d shown in FIG. 27A
  • each group of 256B page buffers can be connected to each sector’s 1KB bit lines, and perform simultaneous program, verify, and read operations to all the bit lines.
  • the invention can perform read and write operations to total 4KB bit lines simultaneously.
  • the read and verification speed may be significantly improved due to the bit line length of each sector being only 1/4 of the conventional circuit. This reduces the bit line capacitance to about 1/4, thus drastically reduces the bit line charging and discharging time.
  • the sub-array can be divided into any number of sectors. The more sectors are used, the more pages may performed read and write
  • bit line select gates which is very low and may be negligible.
  • FIG. 30B shows an exemplary embodiment of a tile formed by two adjacent sub-arrays as shown in FIG. 30A.
  • the page buffers 602e to 602h and circuits 604e to 604h of the second sub-array may be interleaved with those of the first sub-array.
  • the circuits 604a to 604d can drive the page buffers 602e to 602h
  • the circuits 604e to 604h can drive the page buffers 602a to 602d, respectively.
  • FIG. 31A-B show embodiments of page buffer configurations in accordance with the invention. These embodiments are similar to FIG.
  • FIG. 30A-B show 3D array structures, it would be obvious to those with skill in the art that the invention may be implemented in 2D array structures.
  • the page buffers and circuits are located on the sides of the sectors.
  • FIG. 32 shows an exemplary embodiment of a page buffer and bit line select gate structure in accordance with the invention.
  • a page buffer 701 is connected to multiple array sectors 702a to 702d through a data line 703.
  • the number of the sectors may be any number.
  • bit line select gates such as 704a to 704h and 705a to 705h.
  • bit line select gates such as BSG0[0] to BSG0[7] and BSG3[0] to BSG3[7] are used.
  • the bit line select gates, such as 704a to 704h and 705a to 705h, page buffer 701, and the data line 703 may be located under the array sectors 702a and 702d.
  • the divided sector structure in this embodiment provides multiple advantages.
  • the total bit line capacitance will become the capacitance of 1/8 bit line length plus the data line capacitance since the data line 703 pitch is much larger than the bit line pitch.
  • the total bit line capacitance is much smaller than that of conventional arrays. This will significantly increase the speed for pre-charging and discharging bit lines in read and verify operations.
  • the page buffer 701 can load different data to the bit lines in multiple sectors 702a to 702d to preform multiple page program and verify operations using the previously described operations. This will significantly increase the program data throughput.
  • the page buffer 701 can perform simultaneous pre-charge and discharge operations to the bit lines in the multiple sectors 702a to 702d using the previously described operations. This will significantly increase the read data throughput. Although the length of the data line 703 is longer than the data line 510 of the previous embodiment shown in FIG. 26A, due to the capacitance of the data line 703 being relatively smaller than the bit line capacitance, the read and verify operations described in FIG. 26A will still operate for this embodiment. However, the speed may be slower due to the larger capacitance of the data line 703.
  • the bit line capacitance of the multiple sectors can be used as data caches to store data for multiple pages using the waveforms shown in FIGS. 11B-C.
  • the data for the next three pages can be input and stored in the bit lines of Sector 1, Sector 2, and Sector 3.
  • the data stored in the Sectors 1, Sector 2, and Sector 3 can be programmed into a page in Sector 0 using TLC Triple Level Cell mode.
  • the program data can be directly stored in the bit line capacitance. This reduces the number of data latches required for each bit line’s page buffer. Therefore, more page buffers may be packed inside a chip to increase the read and write data throughput.
  • ‘Program Suspend’ if the request data is located in the sector during program, the data stored in the bit lines may need to be moved to other unselected sector, before the read operation may be performed.
  • the data may be read from the unselected sector, and loaded back to the selected sector to continue the program operation.
  • one sector may be reserved.
  • the data of the selected sector may be transferred to the reserved sector. After the requested data is read from the selected sector, the data stored in the reserved sector can be transferred back to the selected sector to continue the programming.
  • FIG. 33A shows another embodiment of a page buffer and bit line select gate structure in accordance with the invention.
  • a page buffer 820 is connected to the first group of bit lines 821a to 821n through the bit line select gates 823a to 823n.
  • the page buffer 820 is connected to the second group of bit lines 822a to 822n through the bit line select gates 824a to 824n.
  • the second bit line group 822a to 822n can be used to store the program data.
  • the multiple-page programming may be performed by using the following steps. First, input data D[0] to D[N] are sequentially loaded into the second bit line groups 822a to 822n by using the operations described in FIGS. 11A-C. The data will be held by the bit line capacitance. Second, the data held by the second bit line group may be sequentially read by the page buffer 820 using the operations described in FIG. 11D and loaded to the first bit line group 821a to 821n to program the selected page 825 by using the operations described in FIGS. 5A-E.
  • a program- verify operation can be performed to read the data from the programmed cells in the selected page 825 by using the operations described in FIGS. 7A-D.
  • the data of the first bit line group 821a to 821n can be compared with the input data stored in the second bit line group 822a to 822n to generate the next program data, and to load the next program data back to the first bit line group 821a to 821n.
  • the next program pulse is then applied.
  • the program and program-verify operations can be alternately repeated until the data read from the selected page 825 equals to the input data stored in the second bit line group 822a to 822n. Then, the program operation is completed. The data stored in the first bit line group 821a to 821n and the second bit line group 822a to 822n can be cleared.
  • the input data can be loaded to the first bit line group 821a to 821n and stored by the bit line capacitance.
  • the input data can be used to verify the programmed data of the selected page in the second bit line group 822a to 822n.
  • both the bit line select gates 823a to 823n and 824a to 824n when loading the input data, can be sequentially turned on together to load the input data to both the first bit line group 821a to 821n and the second bit line group 822a to 822n, because the first program data may be the same as the input data.
  • the operations described in FIGS. 7A-D can be applied to pre-charge and discharge the first group’s bit lines 821a to 821n in parallel.
  • the bit line select gates 823a to 823n can be sequentially turned on to sense the data of the bit lines 821a to 821n to the page buffer 820.
  • the embodiment shown in FIG. 33A can be also applied to multi-level cell (MLC), triple-level cell (TLC), quad-level cell (QLC), or any other level cell’s programming.
  • FIG. 33B shows an embodiment configured for MLC programming. It will be assumed that the page 825 in the first bit line group 821a to 821n is selected. The first page (upper page) of input data may be sequentially loaded to the even bit lines such as 822a, 822c,
  • the second page (lower page) of input data may be sequentially loaded to the odd bit lines such as 822b, 822d, ..., to 822n of the second bit line group and stored by the bit line capacitance.
  • the upper page data stored in the even bit line 822a and the lower page data stored in the odd bit line 822b are sequentially read to the page buffer 820.
  • the page buffer 820 may contain two data latches to store the two-bit data.
  • the pager buffer 820 will determine the program data for the first cell’s threshold voltage level (Vt) according to the two-bit data, and then loads the program data to the first even bit line 821a of the first bit line group 821a to 821n.
  • Vt threshold voltage level
  • next program data is determined by the data stored in the second bit line group’s bit line 822c and 822d, and then loaded to the second even bit line 821c of the first bit line group. This operation is repeated until all the program data are loaded to the even bit lines 821a, 821c, ..., to 821m of the first bit line group. Then, a program pulse is applied to program the even cells on the selected word line 825.
  • the two-bit data stored in the second bit line group 822a to 822n are sequentially read to the page buffer 820 to be compared with the data read from the select page 825 to determine the next program data.
  • the next program data are loaded back to the even bit lines of the first bit line group 821a to 821n. Then, the next program pulse will be applied. These operations are repeated until all the three Vt levels for MLC are successfully programmed, and then the program operation is completed.
  • the next upper page’s and lower page’s data may be loaded to the even and odd bit lines of the second bit line group 822a to 822n, respectively.
  • the above- described operations are applied to program the data into the odd bit lines 821b, 821d, ..., to 821n of the first bit line group.
  • the even bit lines and odd bit lines of the first bit line group 821a to 821n belong to two pages.
  • the word line of the select page 825 is supplied with the first read voltage to read the upper page’s data by using the operations described in FIGS. 7A-D.
  • the data is sequentially stored to the even bit lines of the second bit line group 822a to 822n.
  • the second read voltage is supplied to the word line of the selected page 825 to read the lower page’ s data by using the operations described in FIGS. 7A-D.
  • the upper page’s data stored in the even bit lines of the second bit line group 822a to 822n may be read to the page buffer 820 to be compared with the data stored in the first bit line group to determine the lower page’s data.
  • the lower page’s data then is stored in the odd bit lines of the second bit line group 822a to 822n.
  • the third read voltage is applied to the word line of the selected page 825 to read the lower page’s data again by using the operations described in FIGS. 7A-D.
  • the upper page’s data stored in the even bit lines of the second bit line group 822a to 822n and the previously read lower page’s data stored in the odd bit lines of the second bit line group 822a to 822n may be read to the page buffer 820 to be compared with the data stored in the first bit line group to determine the lower page’s data.
  • the lower page’s data then is stored in the odd bit lines of the second bit line group 822a to 822n.
  • the first bit line group 821a to 821n can be used to store the input data and output data, respectively.
  • FIG. 33C shows another embodiment of the application for TLC programming. This operation is similar to the one shown in FIG. 33B except that the three input pages, i.e., upper page, middle page, and lower page, for the TLC cells are loaded to 822a, 822b, 822c to 8221, 822m, and 822n, respectively.
  • the page buffer 820 contains three data latches to store the three-bit data read from the second bit line group, such as bit lines 822a, 822b, and 822c. The page buffer 820 will determine the program data according to the three-bit data and load the program data to the first bit line group.
  • the data stored in the second group’s bit lines 822a, 822b, and 822c are programed to the first group’s bit line 821a.
  • the three-bit data read from the cell on the first group’s bit line 821a will be stored in the second group’s bit lines 822a, 822b, and 822c, respectively. Since the TLC program and read operations are similar to the MLC operations described in FIG. 33B, the detailed operations will not be repeated.
  • the embodiments shown in FIG. 33A-C can perform a‘program suspend’ function.
  • the input data is stored in the second bit line group 822a to 822n. If the system wants to read another page of the first bit line group 821a to 821n, the program operation can be suspended.
  • the program data in the first group of bit lines 821a to 821n are cleared, and a read operation is performed to read the data from the selected page using the operations described in FIGS. 7A-D. After the read operation completes, the program operation may be resumed.
  • the input data stored in the second bit line group 822a to 822n can be read to generate the program data for the first bit line group 821a to 821n again.
  • the data of the first bit line group 821a to 821n may be cleared.
  • the data stored in the second bit line group 822a to 822n may be read and transferred to the first bit line group 821a to 821n.
  • the selected page in the second bit line group 822a to 822n is read.
  • the data stored in the first bit line group 821a to 821n may be transferred back to the second bit line group 822a to 822n. Then, the program operation may be resumed.
  • FIGS. 33A-C can also perform‘simultaneous read/write’ or‘read while write’ operations.
  • the first bit line group 821a to 821n is performing a program operation using the method described in FIG. 26A to FIG. 28B.
  • This approach stores the input data in the selected bit lines and updates the data directly in the bit lines during program-verification. It does not require storage of the input data in another place. Therefore, when programming the first bit line group 821a to 821n, the second bit line group 822a to 822n can perform a read operation simultaneously using the operations described in FIGS. 7A-D.
  • FIGS. 33A-C can also perform a‘data folding’ operation that converts data stored in SLC pages into MLC or TLC pages.
  • This mode is used to enhance the program data throughput.
  • the system can write the data using the SLC mode. This significantly reduces the write time.
  • the data stored in the SLC pages then is read and re-programmed to other pages using the MLC or TLC mode. After that, the SLC pages are erased. This can increase the data storage density.
  • the page 826 is the SLC page.
  • the data of SLC page 826 is read by using the operations described in FIGS. 7A-D.
  • the second group of bit lines 822a to 822n are pre-charged and discharged by the cells on the SLC page 826.
  • the data of the second group of bit lines 822a to 822n are sequentially read by the page buffer 820 to determine the program data for the TLC page 825 by using the MLC and TLC program operations described in FIGS. 33B-C.
  • the data of the second bit lines 822a, 822b, and 822c is used to determine the program data of the first group’s bit line 821a.
  • the data stored in the SLC page 826 is programmed to 1/3 bit lines of the TLC page 825, such as bit lines 821a,
  • next SLC page in the second bit line group 822a to 822n can be read, and the above-described operations are repeated to program the data into next 1/3 bit lines of the TLC page 825, such as bit lines 821b, 821e, ... , to 821m.
  • the third SLC page in the second bit line group 822a to 822n can be read programed into the next 1/3 bit lines of the TLC page 825, such as bit lines 821c, 821f, ..., to 821n.
  • FIG. 34A shows a conventional 3D NAND flash memory’s page buffers and bit line connections.
  • Metal bit lines 901a to 901d run on top of the 3D cell array.
  • the 3D cell is not shown in FIG. 34A but a detailed 3D array structure can be seen in FIG. 10D, FIG. 10E, and FIG. 17C.
  • Page buffer circuits 902a to 902d are located under the 3D array.
  • the bit lines 901a to 901d are connected the page buffers 902a to 902d through the vertical contacts 903a to 903d.
  • FIG. 34A shows the pitch of the page buffers 902a to 902d in the X-direction is four times that of the bit lines 901a to 901d
  • the figure is just an example for demonstration purpose only.
  • the real proportion is determined by the actual layout size and technology. For example, if the X-pitch of the page buffers 902a to 902d is 32 times that of the bit lines 901a to 901d, the number of the page buffers along the Y direction will become 32, instead of 4.
  • FIG. 34B shows an embodiment of page buffers and bit line connections in accordance with the invention. This embodiment shows bit line select gates 904a to 904d.
  • the bit line select gates 904a connect the bit lines 901a to 901d to the page buffer 902a.
  • the bit line select gates 904d connect the bit lines 901m to 901p to the page buffer 902d.
  • bit line length is reduced to 1/4
  • bit line capacitance is reduced to 1/4.
  • bit line discharging time which dominates the read time for read operations and program- verify operations, may be roughly reduced to about 1/4. If the X-pitch of the page buffer is 32 times of that the bit lines, the data throughput may be increased by 32 times. The read and program-verify time may be roughly reduced to about 1/32.
  • FIG. 34C shows another embodiment of page buffer and bit line connections for the embodiment shown in FIG. 33A-C.
  • the first group of bit lines 901a to 901d are connected to the page buffer 902a through the bit line select gates 904a.
  • the second group of bit lines 901e to 901h are connected to the page buffer 902a through the bit line select gates 904b.
  • This embodiment s bit line length is 1/2 that of the embodiment shown in FIG. 34B.
  • FIG. 35 shows an exemplary Vt distribution of a triple-level cell TLC.
  • the cells have eight Vt levels, VtO to Vt7, to represent three bits data, DO to D2 as shown.
  • the DO to D2 bits of a cell can belong to three pages, Page 0 to Page 2.
  • the data of these three pages can be read independently.
  • the dark bars indicate the word line voltage levels that are utilized to read each bit.
  • the selected word line is supplied with voltage VR1 and VR5 sequentially.
  • the unselected word lines are supplied with a pass voltage, VP AS, which is higher than Vt7, to turn on all the other unselected cells on the NAND cell string.
  • the selected word line is supplied with voltage VR2, VR4, and VR6 sequentially.
  • the control logic performs the XOR function to the three data read out by VR2, VR4, and VR6 to determine the D1 bit data.
  • the selected word line is supplied with the voltage VR3 and VR7 sequentially.
  • the control logic performs the XOR function on the two data read out by VR3 and VR7 to determine the D2 bit data.
  • the page buffer has three data latches to store the two data read out for DO and D2 bits, and three data read out for D1 bit.
  • the data stored in the data latches can be used to perform XOR functions to generate the final data of DO to D2 bits.
  • the data assignment shown in FIG. 35 is exemplary and not limiting since there are many other ways to assign DO to D2 bits.
  • the various embodiments can be adjusted or modified to apply to virtually any data assignment.
  • the TLC cells can be read by using one data latch in the page buffer.
  • FIG. 36 shows an embodiment of a single bit latch page buffer circuit in accordance with the invention.
  • a data latch 918 (comprising two inverters having Q and QB nodes) stores the data in the Q node.
  • a bias device 910 is connected to the bit line BL.
  • a pre charge device 911 is connected to the sensing node SA.
  • a latch pass gate 912. Reset 913 and set 914 devices are provided for the latch 918.
  • the gate of the sensing device 915 is connected to the SA node.
  • FIG. 37A shows a method for reading a DO bit using the single bit latch page buffer shown in FIG. 36.
  • a control unit or state machine located on the same integrated circuit as the memory array generates the various control signals shown in FIG. 36 and FIG. 41A.
  • the Q node of the data latch 918 is reset to data 1 (VDD) by turning on devices 913 and 915, as shown by dashed line 916.
  • the sensing device 915 is turned on by turning on pre-charge device 911 to pull up SA node to VDD.
  • the selected word line is supplied with VR1 to read the cell coupled to the bit line (BL). If the cell is an off-cell, the sensing node SA will be pulled high and will turn on the sensing device 915 as shown by dashed line 919.
  • a SET pulse will be applied to the set device 914 to set (or flip) the Q node of the latch to data 0 (0V), as shown by dashed line 917. If the cell is an on-cell, the sensing node SA will be pulled low and will turn off the sensing device 915 as shown by dashed line 919, thus the Q node of the latch will remain at data 1 (VDD).
  • VDD voltage 1
  • FIG. 37D as shown in STEP 1, when applying voltage VR1 to the select word line, VtO cells will be turned on, and Vtl to Vt7 cells will be turned off. Therefore, the previously described operations will set the latch for VtO cell to data 1 and Vtl to Vt7 cells to data 0.
  • step 920d the selected word line is supplied with VR5 to read the cell. If the cell is an off-cell, the sensing node SA will be pulled high and will turn on the sensing device 915. A RES pulse will be applied to the reset device 913 to reset (or flip) the Q node of the latch to data 1 (VDD), as shown in step 920e. If the cell is an on-cell, the sensing node SA will be pulled low and will turn off the sensing device 915, then the data of the Q node will remain unchanged. Referring again to FIG.
  • FIG. 37B shows an exemplary method for reading a D1 bit using the single latch page buffer shown in FIG. 36.
  • step 921a the Q node of the data latch 918 is reset to data 1 (VDD) by turning on devices 913 and 915, as shown by dashed line 916.
  • step 921b the selected word line is supplied with VR2 to read the cell. If the cell is an off-cell, the sensing node SA will be pulled high and will turn on the sensing device 915. A SET pulse will be applied to the set device 914 to set the Q node of the latch to data 0 (0V), as shown in step 921c.
  • the sensing node SA will be pulled low and will turn off the sensing device 915, thus the Q node of the latch will remain at data 1 (VDD).
  • VDD data 1
  • the previously described operations will set the latch for VtO and Vtl cells to data 1 and Vt2 to Vt7 cells to data 0.
  • step 921d the selected word line is supplied with VR4 to read the cell. If the cell is an off-cell, the sensing node SA will be pulled high and will turn on the sensing device 915. A RES pulse will be applied to the reset device 913 to reset the Q node of the latch to data 1 (VDD), as shown in step 921e. If the cell is an on-cell, the sensing node SA will be pulled low and will turn off the sensing device 915, then the data of the Q node will remain unchanged. Referring again to FIG.
  • step 921f the selected word line is applied with VR6 to read the cell. If the cell is an off-cell, the sensing node SA will be pulled high and turn on the sensing device 915. A SET pulse will be applied to the set device 914 to set the Q node of the latch to data 0 (0V), as shown in step 921g. If the cell is an on-cell, the sensing node SA will be pulled low and turn off the sensing device 915, then the data of the Q node will remain unchanged. Referring to FIG. 37E, as shown in STEP 3, when applying VR6 to the select word line, VtO to Vt5 cells will be turned on, and Vt6 to Vt7 cells will be turned off. Therefore, the previous described operation will reset the latch for Vt6 to Vt7 cells to data 0, while the data for VtO to Vt5 remain unchanged. As a result, the D1 bit data shown in FIG. 35 is successfully read by using single data latch.
  • FIG. 37C shows an exemplary method for reading a D2 bit using the single latch page buffer shown in FIG. 36. This operation is basically the same as FIG. 37A except that the word line voltage applied in steps 922b and 922d are VR3 and VR7, respectively. For simplicity, the description can be found with reference to FIG. 37A and will not be repeated here.
  • FIG. 38A shows an embodiment of waveforms that illustrate signals for reading the DO bit using the single latch page buffer circuit shown in FIG. 36 in accordance with the invention.
  • the waveforms from time T1 to T5 illustrate the operation of the steps 920a to 920c shown in FIG. 37A.
  • the waveforms from time T5 to T8 illustrate the operation of the steps 920d and 920e in FIG. 37A.
  • the RES pulse goes high to reset the Q node of the latch to data 1 (VDD).
  • the BIAS signal goes high to VDD or a voltage Vpre to pre-charge the bit line, BL, to VDD-Vt or Vpre-Vt.
  • Vt is the threshold voltage of the bias device 910.
  • the PREB signal goes high to VDD to turn off the pre-charge device 911 or a voltage Vref to provide a loading current from the pre-charge device 911.
  • the loading current may be lower than the on-cell’s current.
  • the selected word line, WL is supplied with the first read voltage VR1. This will turn on VtO cell and start to discharge the bit line, BL, as shown. The Vtl to Vt7 cells will remain off, thus their bit lines will not be discharged.
  • the BIAS voltage is lower to a voltage Vbias. This will turn off the bias device 910.
  • the bias device 910 When the bit line is discharged below Vbias-Vt, the bias device 910 will be turned on to discharge the SA node, as shown in T3 time.
  • the BIAS signal goes to 0V at T2 time to turn off the bias device 910 and goes to Vbias or VDD at T3 time to turn on the bias device 910. This will discharge the SA node to the BL voltage.
  • the voltage Vbias -Vt is designed to be lower than the threshold voltage of the sensing device 915. Thus, for on-cell, the sensing device 915 will be turned off. In contrast, for off-cell, the BL and SA node will remain at high, thus the sensing device 915 is turned on.
  • a SET pulse is applied to the set device 914 to set the off-cells’ data latch, Q, to data 0 (0V).
  • the on-cells’ data latch will remain at data 1 (VDD).
  • the steps 920a to 920c shown in FIG. 37A are completed.
  • the PREB signal goes low again to turn on the pre-charge device 911.
  • the BIAS signal goes to VDD or Vpre to pre-charge the bit line to VDD-Vt or Vpre-Vt.
  • the PREB signal goes high to VDD to turn off the pre-charge device 911 or a voltage Vref to provide a loading current from the charging device 911.
  • the selected word line, WL is supplied with the second read voltage VR5. This will turn on VtO to Vt4 cells and start to discharge the bit line.
  • the Vt5 to Vt7 cells will remain off, thus their bit line will not be discharged.
  • the bias device 910 When the bit line is discharged below Vbias-Vt, the bias device 910 will be turned on to discharge the SA node, as shown at time T7.
  • the BIAS signal goes to 0V at time T6 to turn off the bias device 910 and goes to Vbias or VDD at time T7 to turn on the bias device 910.
  • This will discharge the SA node to the BL voltage and turn off the sensing device 915.
  • both BL and SA node will remain high, thus the device 915 is turned on.
  • a RES pulse is applied to the reset device 913 to reset the off-cells’ data latch, Q, to data 1 (VDD).
  • the on-cells’ data latch will remain unchanged.
  • the steps 920d to 920e shown in FIG. 37A are completed.
  • FIG. 38B an embodiment of waveforms that illustrate signals for reading a D1 bit using the single latch page buffer circuit shown in FIG. 36.
  • the operation is similar to reading the DO bit except that the selected word line is sequentially supplied with three voltages, VR2, VR4, and VR6.
  • the steps 921a to 921c in FIG. 37B are performed.
  • the steps 921d and 921e in FIG. 37B are performed.
  • the steps 921f and 921g in FIG. 37B are performed.
  • FIG. 39 shows another embodiment of a page buffer circuit in accordance with the invention.
  • the illustrated page buffer contains three data latches 918a to 918c.
  • the three data latches store three data Q[0] to Q[2].
  • the data latches are reset and set by signals R0 to R2 and SO to S2, respectively.
  • the page buffer circuit is connected to three bit lines, BL[0] to BL[2], through bit line select gates 924a to 924c.
  • the signals P0 to P2 and BSG[0] to BSG[2] are sequentially turned on to apply the program data from Q[0] to Q[2] to the bit lines BL[0] to BL[2], respectively.
  • the signals BSG[0] to BSG[2] are sequentially turned on to connect the bit lines BL[0] to BL[2] to the sensing node SA, respectively.
  • the sensing node SA will turn on or off the device 915 depending on the voltages of BL[0] to BL[2].
  • the reset and set pulses R0 to R2 and SO to S2 will be applied to reset or set the corresponded data latches, respectively.
  • FIG. 40 shows an embodiment of waveforms that illustrate signals for reading a DO bit from bit lines BL[0] to BL[2] using the page buffer circuit shown in FIG. 39.
  • the operation is similar to FIG. 38A except that during the time T1 to T2, BSG[0] to BSG[2] are turned on together to pre-charge BL[0] to BL[2].
  • the selected word line is supplied with the first read voltage VR1.
  • BSG[0] to BSG[2] are turned off to allow BL[0] to BL[2] to be simultaneously discharged by on-cells.
  • T3 to T5 shows an embodiment of waveforms that illustrate signals for reading a DO bit from bit lines BL[0] to BL[2] using the page buffer circuit shown in FIG. 39.
  • the operation is similar to FIG. 38A except that during the time T1 to T2, BSG[0] to BSG[2] are turned on together to pre-charge BL[0] to BL[2].
  • BSG[0] to BSG[2] are sequentially turned on to connect BL[0] to BL[2] to the SA node, respectively.
  • the corresponded set pulse SO to S2 are applied to set the off-cells’ data latches, Q[0] to Q[2], to data 0 (0V).
  • the steps 920a to 920c shown in FIG. 37A are completed.
  • BSG[0] to BSG[2] are turned on to pre-charge BL[0] to BL[2] again.
  • the selected word line is supplied with the second read voltage VR5.
  • BSG[0] to BSG[2] are turned off to allow BL[0] to BL[2] to be
  • operations similar to those shown in FIG. 40 may be applied to read D1 and D2 bits from BL[0] to BL[2].
  • the selected word line may be sequentially supplied with three voltages, VR2, VR4, and VR6, as shown in FIG. 38B.
  • the operation is similar to FIG. 40 except that the selected word line is sequentially supplied with voltages VR3 and VR7.
  • the number of the data latches in the page buffer may be reduced to 1/3 while keeping the same data throughput. This allows the array to have more‘planes’ to further increase the data throughput, and reduce the read latency due to shorter bit line length that causes shorter bit line discharging time.
  • the page buffer may contain two data latches to read from two bit lines simultaneously.
  • the page buffer may contain four data latches to read data from four bit lines simultaneously.
  • FIG. 41A shows an exemplary alternative embodiment of the page buffer circuit shown in FIG. 36 implemented using complementary logic.
  • the set and reset devices 933, 934, and 935 are changed from NMOS to PMOS transistors, and the power level connected to device 935 is changed from 0V to VDD. In this way, the operation of the circuit will be changed to using an on-cell condition rather than an off-cell condition to flip the latch 938.
  • FIGS. 41B-D show exemplary method and diagrams associated with the operation of the page buffer circuit shown in FIG. 41A.
  • FIG. 41B shows an exemplary method for reading the D1 bit using the page buffer circuit shown in FIG. 41A.
  • the selected word line voltage is changed from ramping-up to ramping-down from VR6, VR4, to VR2 as shown in steps 941b, 941d, and 941f.
  • step 941a the latch is reset to data 0 by turning in devices 933 and 940.
  • the device 940 will pull the SA node to 0V to turn on the device 935 to pull node QB to VDD.
  • step 941b the selected word line is supplied with the read voltage VR6. If the cell is an on-cell, it will discharge the bit line and the sensing node SA as shown by dashed line 939. When the sensing node SA is discharged below VDD-Vt, it will turn on the device
  • step 941c a SETB pulse is applied to the device 934 to set the Q node of the latch to data 1 (VDD). If the cell is an off-cell, the sensing node SA will be pulled high to VDD, which turns off the device 935, and thus the Q node of the latch will remain at data 0 (0V).
  • step 941d the selected word line is supplied with VR4.
  • the on-cells will discharge the bit line and sensing node SA to below VDD-Vt to turn on device 935, while the off-cells’ sensing node SA will be pulled up to VDD to turn off device 935.
  • step 941e a RESB pulse is applied to the device 933 to reset the on-cells’ Q node of the latch to data 0 (0V), while off-cells’ Q node of the latch remains unchanged.
  • step 941f the selected word line is supplied with VR2.
  • the on-cells will discharge the bit line and sensing node SA to below VDD-Vt to turn on device 935, while the off-cells’ sensing node SA will be pulled up to VDD to turn off device 935.
  • step 941g a SETB pulse is applied to the device 934 to set the on-cells’ Q node of the latch to data 1 (VDD), while off-cells’ Q node of the latch remains unchanged.
  • VtO and Vtl cells will be turned on, and Vt2 to Vt7 cells will be turned off.
  • the data of the latch for VtO and Vtl will be set to 1, and the data of the latch for Vt4 to Vt7 will remain unchanged.
  • FIG. 41C shows a waveform diagram for reading the D1 bit for use in this embodiment with the circuit of FIG. 41A.
  • the waveform in FIG. 41C is similar to the waveform shown in FIG. 38B except that the word line voltage is ramped down from VR6, VR4, to VR2 rather than ramped up, and the data latch is initially reset to data 0 (0V) rather than data 1 (VDD).
  • a DIS signal is shown that controls the device 940 in FIG. 41A.
  • the page buffer circuit shown in FIG. 41A may be applied to implement the 3-bit data latch page buffer circuit, as shown in FIG. 39, and operated by using ramp-down instead of ramp-up word line voltages on the waveform shown in FIG. 40.
  • FIGS. 42A-B shows diagrams that provide word line voltage levels for reading various types of multiple level cells using a single bit latch in accordance with the invention.
  • FIG. 42A shows a diagram for reading a multilevel cell (MLC).
  • FIG. 42B shows a diagram for reading a quad level cell (QLC).
  • the dark bars indicate the word line voltage levels that are utilized to read each bit.
  • to read DO the word line voltage VR2 is used, and to read Dl, the word line voltages VR1 and VR3 are used.
  • the bits DO, Dl, D2 are read independently. For example, if the system only needs to read the D2 data from a cell shown in FIG. 35, then the operations shown and described with reference to FIG. 37C are used to read the D2 data. The data for DO and Dl are not read. Therefore, a generic process flow can be implemented to utilize the word line voltage levels shown to read any one or more of the data bits.
  • the data assignments for multiple-level cells is not limited to one configuration. Therefore, the read operations are configured according to the data assignment.
  • FIG. 42C-F show four exemplary configurations for assigning D0-D2 for TLC. Assume the page buffer circuit shown in FIG. 36 is used to implement the TLC read operation. In FIG. 42C shows a configuration where the D0-D1 data for VtO is assigned to 1. Therefore, the data can be read by setting the initial data of the latch 918 to 1, applying ramp-up word line voltages, and then for each word line voltage level, flipping the data of off-cells.
  • the ramp-up word line voltages are VR3, VR7 for reading DO; VR2, VR4, VR6 for reading Dl; and VR1, VR5 for reading D2.
  • FIG. 42D shows a configuration where the D0-D1 data for VtO is assigned to 0. Therefore, the data can be read by setting initial data of the latch 918 to 0, applying ramp-up word line voltages, and then for each word line voltage level, flipping the data of off-cells.
  • the ramp-up word line voltages are the same as FIG. 42C.
  • FIG. 42E shows another configuration where the D0-D1 data for Vt7 is assigned to 1. Therefore, the data can be read by setting initial data of the latch 918 to 1, applying ramp-down word line voltages, and then flipping the data of on-cells for each word line voltage level.
  • the ramp-down word line voltages for reading DO are VR7 and then VR3; for reading Dl are VR6, VR4, and then VR2; for reading D2 are VR5 and then VR1.
  • FIG. 42F shows a configuration where the D0-D1 data for Vt7 is assigned to 0. Therefore, the data can be read by setting initial data of the latch 918 to 0, applying ramp-down word line voltages, and then flipping the data of on-cells for each word line voltage level.
  • the ramp-up word line voltages are the same as FIG. 42E.
  • FIG. 43 shows an exemplary method 4300 for reading bits in a multiple level cell using a single bit latch in accordance with the invention.
  • the method is suitable for use to read a multiple level cell with the single bit latch circuit shown in FIG. 36.
  • one or more bits to be read from a multiple level cell are identified. For example, the bits DO, Dl, and D2 as illustrated in FIG. 35 are identified to be read.
  • word line voltage levels to be used to read each of the identified bits are identified. For example, the word line voltage levels shown in FIG. 35 are identified to read the bits DO, Dl, and D2. For example, to read DO, word line voltage levels VR1 and VR5 are identified. To read Dl, word line voltage levels VR2, VR4, and VR6 are identified, and to read D2, word line voltage levels VR3 and VR7 are identified.
  • bit DO is selected to be read.
  • bit DO is selected to be read.
  • a first word line voltage level is selected to be used to read the selected bit.
  • word line voltage level VR1 is selected to read bit DO, as illustrated in FIG. 35.
  • a latch output of the single bit latch is set to an initial level. For example, as shown in FIG. 36, the Q output of the latch 918 is set to an initial value of 1.
  • the selected word line level is applied to the cell.
  • the word line voltage level VR1 is applied to read the cell.
  • the output of the cell is sensed and the latch is flipped if the cell is determined to be an off-cell.
  • the output of the cell is sensed at the SA node. If the cell is an off-cell, the Q output of the latch is flipped.
  • the Q output of the latch 918 is flipped to a value of 0 by the RES signal.
  • the latch circuit can be implemented using complementary logic as illustrated in FIG. 41A and in that case, the latch is flipped if the cell is an on-cell.
  • the next word line voltage level to be applied is selected.
  • the method then proceeds to block 4312. It should be noted that when the method proceeds back to block 4314, if the cell is an off-cell, the Q output of the latch 918 is flipped again to a value of 1 by the SET signal. Thus, the output of the latch 918 is flipped (or toggled) by each adjustment.
  • the latch holds the value of the data bit. For example, since there are no more word line voltage levels to apply to the cell, the latch 918 holds the value of the selected data bit.
  • the method 4300 operates to read bits in a multiple level cell using a single bit latch in accordance with the invention. It should be noted that the operations provided are exemplary and that additions, deletions, changes, and/or modifications are within the scope of the embodiments.
  • bit line capacitance to store program and read data
  • page buffers to load and sense the data to increase data throughput.
  • bit line capacitance needs time to charge and discharge, when data is directly loaded into the bit line capacitance, a slower clock rate may be used for the I/O bus to ensure that data is loaded correctly. This may slow down the I/O bus speed.
  • FIGS. 44A-B show an exemplary array structure and data loading and output sequences in accordance with the invention.
  • FIG. 44A shows an exemplary architecture comprising a memory cell array 101 and a page buffer block 103 that contains page buffers 207a to 207m.
  • the architecture also comprises bit line select gates 106 that connect the page buffers to bit lines BLa[0:n] to BLm[0:n].
  • An I/O bus 600 is shown that has bandwidth from 8 bits to 64 bits.
  • FIG. 44B shows a data loading sequence for the circuit shown in FIG. 44A.
  • the bit line select gate signals BSG[0:n] are sequentially turned on to load data from the I/O bus 600 to BLa[0] to BLm[n], respectively.
  • the signal BSG[0] goes high to select BLa[0] to BLm[0] to be connected to the page buffers 207a to 207m, respectively.
  • the data is sequentially loaded from I/O bus 600 to the page buffers 207a to 207m, and then loaded to BLa[0] to BLm[0], which is defined as PAGE[0]. It will be assumed that there are 4KB page buffers, and the I/O bus width is one byte. It will further be assumed that the I/O bus clock period is 10ns.
  • the 4KB data are loaded from the I/O bus 600 into the 4KB page buffers 106 and then BLa[0] to BLm[0] from the first byte data to the last byte.
  • Each byte takes 10ns, thus the time interval T1 for loading the 4KB page will be 40 microsecond (us). This time is far more than enough for the first byte of data to be loaded into the bit lines. However, the last byte of data has just 10ns to be loaded into the bit lines before the signal BSG[0] goes low.
  • the same waveform shown in FIG. 44B can be used.
  • the signal BSG[0] selects the BLa[0] to BLm[0] to be connected to the page buffers 207a to 207m.
  • the I/O bus outputs the data from the page buffers 207a to 207m.
  • one solution is to delay the time when BSG[0] goes low. However, this reduces I/O speed, and thus is not preferred.
  • Another technique is to add extra data registers, as shown 104a to 104d in FIG. 1A. However, this increases the die size.
  • FIGS. 45A-C show an exemplary array structure and data loading and output sequences in accordance with the invention.
  • FIG. 45A shows an exemplary architecture according to the invention.
  • the array 101 is divided into two sub-arrays, namely, ARRAY1 101a and ARRAY2 101b.
  • the ARRAY 1 and ARRAY2 are connected to page buffer blocks 103a and 103b through the bit line select gate blocks 106a and 106b, respectively.
  • the bit line select gate blocks 106a and 106b are connected to different select gate signals BSGl[0:n] and BSG2[0:n], respectively.
  • FIG. 45B shows an exemplary data loading sequence for use with the architecture shown in FIG. 45A.
  • the signals BSGl[0:n] and BSG2[0:n] are interleaved as shown.
  • the I/O bus 600 alternatively loads data to the page buffer blocks 103a and 103b. For example, during the time interval Tl, the I/O bus loads the first page of data (PG1[0]) to the first page buffer block 103a. Then, the page buffer 103a loads the data to the bit lines selected by BSG1[0].
  • the I/O bus loads the second page of data (PG2[0]) to the second page buffer block 103b. Meanwhile, because the signal BSG1[0] is till high, the first page buffer block 103a continues loading the first page of data to the bit lines selected by BSG1 [0]. As a result, the insufficient loading time problem for the last byte of data shown in FIGS. 44A-B is eliminated.
  • the page buffer blocks 103a and 103b are 2KB page buffers each.
  • the length of the time interval T2 is 20 microsecond (us), which is far more than enough time for the last byte of the first page buffer 103a to load into the bit lines.
  • the clock rate of the PO bus may be increased to enhance the data transfer rate.
  • FIG. 45C shows a data output sequence of the embodiment shown in FIG.
  • the signal BSG1[0] goes high to select bit lines in the ARRAY 1 to be connected to the first page buffer block 103a to read the first page of data (PG1[0]).
  • the signal BSG2[0] goes high to select bit lines in the ARRAY2 to be connected to the second page buffer block 103b to read the second page of data (PG2[0]).
  • the PO bus outputs the first page of data from the page buffer block 103a.
  • the T3 time length is 20 microsecond (us), which is sufficient for reading data from the bit lines to the page buffers.
  • the clock rate of the PO bus may be increased to enhance the data transfer rate.
  • FIGS. 46A-C show an exemplary array structure and data loading and output sequences in accordance with the invention.
  • FIG. 46A shows another embodiment of an exemplary architecture according to the invention.
  • the array is further divided into four sub-arrays, namely, ARRAY 1 101a to ARRAY4 lOld.
  • the four sub-arrays are connected to four page buffer blocks 103a to 103d through four bit line select gate blocks 106a to 106d, respectively.
  • the bit line select gate blocks 106a to 106d are controlled by four groups of select gate signals BSGl[0:n] to BSG4[0:n], respectively.
  • FIG. 46B shows a data loading sequence for use with the architecture shown in FIG. 46A.
  • the select gate signal groups BSGl[0:n] to BSG4[0:n] for the bit line select gate blocks 106a to 106d are interleaved as shown.
  • Tl the first page of data is loaded into the first page buffer block 103a.
  • T2 the first page of data is continued to be loaded to the bit lines selected by the signal BSG1[0].
  • the time intervals Tl and T2 are 10 microsecond (us) and 30 microsecond (us), respectively. Therefore, for this embodiment, the data has more time to be loaded into the bit line capacitance.
  • the I/O clock rate can be further increased to increase the data transfer rate.
  • FIG. 46C shows an output data sequence for use with the architecture shown in FIG. 46A.
  • the first page of data is read from the bit lines selected by BSG1[0] to the first page buffer block 103a.
  • the first page of data is output from the page buffer block 103a to the I/O bus.
  • the time intervals T3 and T4 time are 30 microsecond (us) and 10 microsecond (us), respectively. Therefore, for this embodiment, the data has more time to read from the bit lines to the page buffers.
  • the I/O clock rate can be further increased to increase the data transfer rate.
  • the number of sub-arrays used is not limited, for example, the number of sub-arrays may be 2, 4, 8, 16, or any suitable number.
  • program data is loaded to multiple bit lines and stored in the bit line capacitances to perform the program operation. If the inhibit voltage (VDD) on a bit line is leaked below VDD-Vt, it may turn on the drain select gate (DSG) of the selected string, and cause the inhibit voltage (8V) stored in the channel of the string to leak to the bit line. As a result, the inhibited cell may be accidentally programmed.
  • VDD inhibit voltage
  • DSG drain select gate
  • a bit line capacitance is approximately lpF to 5pF. If the leakage current is higher than 20nA, it may leak the bit line voltage from VDD to below VDD- Vt during a program pulse time interval. Typically the junction leakage current of a bit line is much lower than 20nA. However, when bit line length is reduced, the bit line capacitance is reduced and the margin becomes smaller.
  • a‘refresh’ operation can be performed to maintain the bit line voltages.
  • the program data are stored in the bit line capacitances 206a to 206n.
  • a refresh operation may be performed to sequentially turn on bit line select gates 202a to 202n to connect the page buffer 200 to the bit lines 201a to 201n, respectively, to use the sense amplifier 208 to sense the selected bit line voltage and restore the voltage back to full VDD or 0V levels.
  • FIGS. 47A-B shows an embodiment of waveforms for refresh operations according to the invention. The provided waveforms are discussed with reference to the detailed page buffer circuit shown in FIG. 3C.
  • FIG. 47A shows operations for refreshing a bit line that stores inhibit data 1 (VDD). Assuming the bit line (BL) has leakage and the voltage is dropped to VDD-dV, where dV is a delta voltage lower than Vt.
  • both the PREB and BIAS signals are supplied with 0V to turn on the pre-charge device 303 and turn off the bias device 306 to charge up the SA node to VDD.
  • a SET pulse is applied to set the Q node of the latch 207 to 0V.
  • the BIAS signal is supplied with Vbias to turn on bias device 306 to sense BL voltage.
  • PREB is supplied with Vref to limit the pull-up current of pre-charge device 303.
  • the bias device 306 is turned off, and the SA node remains VDD to turn on sensing device 310.
  • a RES pulse is applied to turn on reset device 312. Because the sensing device 310 is turned on, this will reset the Q node of the latch 207 to VDD.
  • the PGM, BIAS, and PREB signals are supplied with a pulse of VDD+Vt. This will turn on the pass gate 220 and the bias device 306, and turn off the pre-charge device 303, respectively.
  • the BL will be charged by the Q node of the latch 207 from VDD-dV to VDD. Therefore, the refresh operation for the selected bit line is complete.
  • the current bit line select gate (BSG) is turned off and the next bit line select gate (BSG) may be turned on to repeat the operations from TO to T5 time to refresh the next bit line.
  • FIG. 47B shows operations for refreshing a bit line that stores program data 0 (0V). Assuming the bit line (BL) has leakage and the voltage is increased to dV, where dV is a delta voltage lower than Vt. At TO time, both the PREB and BIAS signals are supplied with 0V to turn on the pre-charge device 303 and turn off the bias device 306 to charge up the SA node to VDD. At T1 time, a SET pulse is applied to reset the Q node of the latch 207 to 0V.
  • the BIAS is supplied with Vbias to turn on bias device 306 to sense the BL voltage.
  • PREB is supplied with a Vref to limit the pull-up current of pre-charge device 303. Because the BL voltage is lower than Vbias-Vt, the bias device 306 is turned on and pulls low the SA node to the same voltage as the BL. Because the SA voltage is lower than Vt, it turns off the sensing device 310.
  • a RES pulse is applied to turn on reset device 312. However, the Q node of the latch 207 will remain at 0V because the sensing device 310 is turned off.
  • the PGM, BIAS, and PREB signals are supplied with a pulse of VDD+Vt.
  • the BL will be discharged by the Q node of the latch 207 from dV to 0V. As a result, the refresh operation for the selected bit line is complete.
  • the current bit line select gate (BSG) is turned off and the next bit line select gate (BSG) may be turned and repeat the operations from TO to T5 time to refresh the next bit line.
  • VDD is used as an inhibit voltage.
  • the inhibit voltage may be VDD-Vt.
  • the pulse can be at the VDD level, which will charge the BL to VDD-Vt.
  • FIGS. 47A-B illustrate embodiments of refresh operations according to the invention.
  • the frequency of the refresh operations depends on the bit line capacitance and bit line leakage current.
  • the refresh operations may be repeatedly perform to refresh all the selected bit lines during the entire program pulse.

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  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)

Abstract

L'invention concerne des procédés et un appareil pour une mémoire flash NON-ET. Dans un mode de réalisation, l'invention concerne un procédé de programmation d'une mémoire flash NON-ET. Le procédé comprend les étapes suivantes consistant à : précharger des lignes de bits sélectionnées de cellules de mémoire sélectionnées avec un niveau de tension de polarisation tandis que des lignes de bits non sélectionnées maintiennent la tension d'inhibition, appliquer une tension de vérification à une ligne de mots sélectionnée qui est couplée aux cellules de mémoire sélectionnées, et décharger les lignes de bits sélectionnées qui sont couplées aux cellules sur un premier intervalle de temps. Le procédé comprend également les étapes suivantes consistant à : détecter un niveau de tension détecté sur une ligne de bits sélectionnée, charger la ligne de bits sélectionnée avec le niveau de tension d'inhibition lorsque le niveau de tension détecté est supérieur à un niveau de seuil et une tension de programme lorsque le niveau de tension détecté est égal ou inférieur au niveau de seuil, et répéter les opérations de détection et de chargement pour chacune des lignes de bits sélectionnées.
PCT/US2020/028367 2019-05-05 2020-04-15 Procédés et appareil pour mémoire flash non-et WO2020226866A1 (fr)

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US201962871198P 2019-07-07 2019-07-07
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US201962884139P 2019-08-07 2019-08-07
US62/884,139 2019-08-07
US16/687,556 US11056190B2 (en) 2018-11-18 2019-11-18 Methods and apparatus for NAND flash memory
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