WO2020185835A1 - Methods of manufacturing electrostatic chucks - Google Patents

Methods of manufacturing electrostatic chucks Download PDF

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Publication number
WO2020185835A1
WO2020185835A1 PCT/US2020/021996 US2020021996W WO2020185835A1 WO 2020185835 A1 WO2020185835 A1 WO 2020185835A1 US 2020021996 W US2020021996 W US 2020021996W WO 2020185835 A1 WO2020185835 A1 WO 2020185835A1
Authority
WO
WIPO (PCT)
Prior art keywords
dielectric material
layer
depositing
layers
dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2020/021996
Other languages
English (en)
French (fr)
Inventor
Angus Mcfadden
Jason Wright
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Technetics Group LLC
Original Assignee
Technetics Group LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technetics Group LLC filed Critical Technetics Group LLC
Priority to IL286108A priority Critical patent/IL286108B2/en
Priority to SG11202109712U priority patent/SG11202109712UA/en
Priority to EP20769276.5A priority patent/EP3939157A4/en
Priority to MYPI2021005117A priority patent/MY210488A/en
Priority to CN202080020969.9A priority patent/CN113647009B/zh
Priority to KR1020217032437A priority patent/KR102796742B1/ko
Priority to JP2021554687A priority patent/JP7547359B2/ja
Publication of WO2020185835A1 publication Critical patent/WO2020185835A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/72Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
    • H10P72/722Details of electrostatic chucks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/002Processes for applying liquids or other fluent materials the substrate being rotated
    • B05D1/005Spin coating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D1/00Processes for applying liquids or other fluent materials
    • B05D1/02Processes for applying liquids or other fluent materials performed by spraying
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/15Devices for holding work using magnetic or electric force acting directly on the work
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N13/00Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7616Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating, a hardness or a material

Definitions

  • ESC electrostatic chuck
  • electrostatic chucks 100 typically include a handle or base plate 1 10 upon which multiple layers of a dielectric material are deposited to form the chuck body 120. Dispersed between adjacent layers of dielectric material may be patterned metal sheets 130 that serve as electrical components (e.g., electrodes, heaters, etc.).
  • Conventional means for manufacturing an ESC having the configuration described above generally include using tape casting techniques to form the multiple layers of dielectric material on the handle.
  • tape casting methods generally involve providing a moving belt onto which liquid dielectric material is dispersed from a reservoir. A doctor blade is used to ensure a constant height of the material dispersed from the reservoir on to the belt. As the dispersed material moves forward on the belt, it passes under a dryer in order to harden the material. Multiple tape casting passes can be used in order to build up the thickness of the chuck body.
  • the method includes depositing at least one layer of a first dielectric material on a handle using spin coating and/or direct spraying, depositing a functional electric layer on the at least one layer of first dielectric material, and depositing at least one layer of a second dielectric material on the functional electric layer using spin coating and/or direct spraying. Additional optional steps, such as depositing a mechanical dielectric layer on the at least one layer of second dielectric material and patterning the mechanical dielectric layer, may also be carried out.
  • the material of the handle is AI2O3, AIN or Y2O3.
  • the first dielectric material and the second dielectric material are the same dielectric material, and the dielectric material is a material having a high dielectric constant.
  • the material of the mechanical dielectric layer is the same material as the handle.
  • Figure 1 illustrates a configuration of an electrostatic chuck according to the prior art.
  • Figure 2 illustrates a tape casting technique according to the prior art.
  • Figure 3 is a flow diagram illustrating a method of manufacturing an electrostatic chuck according to various embodiments described herein.
  • Figure 4 illustrates an electrostatic chuck manufactured in accordance with methods described herein. DETAILED DESCRIPTION
  • a method 300 for manufacturing an electrostatic chuck includes a step 310 of depositing at least one layer of first dielectric material on a handle using spin coating and/or direct spraying, a step 320 of depositing a functional electric layer on the at least one layer of a first dielectric material, and a step 330 of depositing at least one layer of a second dielectric material on the functional electric layer using spin coating and/or direct spraying.
  • step 310 at least one layer of a first dielectric material is deposited on a handle using spin coating and/or direct spraying.
  • Spin coating techniques generally call for a small amount of liquid dielectric material to be applied to the center of the handle, followed by rotating the handle at relatively high speeds in order to spread the liquid dielectric material by centrifugal force.
  • Any apparatus known to be suitable for carrying out spin coating e.g., a spin coater or a spinner
  • any suitable rotating speed that causes the dielectric material to spread may be used.
  • the amount of material applied to the center of the handle is not limited and is generally determined based on the desired thickness of the layer being formed on the handle. In the event multiple layers of first dielectric material are deposited on the handle, the first layer is deposited directly on the handle using spin coating, and subsequent layers are formed on the preceding layer of dielectric material using spin coating.
  • Direct spraying may generally be carried out using a spray gun.
  • the spray gun is loaded with the liquid dielectric material and is then used to spray the liquid dielectric material directly onto the handle (or preceding layer of dielectric material when multiple layers are deposited).
  • the direct spraying is generally carried out such that the layer of material deposited has a uniform thickness.
  • the deposited layer will generally be cured after deposition in order to harden the material. Any suitable curing technique and parameters may be used. In some embodiments, the deposited material is cured by heating the material at a temperature of 600°C or higher.
  • the deposition method may be exclusively spin coating, exclusively direct spraying, or some layers may be deposited using spin coating while other layers are deposited using direct spraying.
  • the first dielectric material is generally not limited and may be any material known to be suitable for use as the chuck body of an ESC.
  • the first dielectric material is a dielectric material having a dielectric constant higher than 3.
  • the first dielectric material having a dielectric constant higher than 3 is a siloxane-based material.
  • Such dielectric materials may further include a metal oxide component, such as AI2O3. However, a metal oxide component is not required.
  • the high dielectric constant dielectric material can be made up of an oxide, nitride, boride, carbide or fluoride of any combination of yttrium, iridium, scandium, erbium, hafnium, silicon carbide, zirconium oxide, or any lanthanoid. However, such compounds are not required.
  • the handle (also sometimes referred to as a plate or base plate) on which the first layer of first dielectric material is deposited may be made of any material known to be suitable for use as a handle of an ESC.
  • the material of the handle is a ceramic material.
  • Exemplary ceramic materials include, but are not limited to, AI2O3, AIN and Y2O3.
  • Other suitable materials can be glass or silicon.
  • Step 310 is carried out until the desired thickness of the first portion of the ESC is obtained.
  • the desired thickness can be reached by depositing a single layer of first dielectric material having the desired thickness or by depositing multiple layers of the first dielectric material such that the thickness of the individual layers adds up to the desired overall thickness.
  • step 320 is performed, in which a functional electric layer is deposited on the layer or layers of first dielectric material.
  • a functional electric layer is deposited on the layer or layers of first dielectric material.
  • Any material known to be suitable for use as a functional electric layer in an ESC can be used.
  • the material is a metal material.
  • the thickness of the metal layer is generally not limited and can be selected based on the electrical component being formed.
  • the manner of forming the electrical layer can be, for example, via known PVD methods or by screen printing.
  • the electric layer can be patterned as desired using any known patterning techniques.
  • step 330 is performed, in which at least one layer of a second dielectric material is deposited on top of the functional electric layer.
  • the at least one layer of second dielectric material is deposited on the functional electric layer using the same spin coating and/or direct spraying techniques as described above with respect to step 310.
  • a single layer or multiple layers of second dielectric material can be deposited, so long as the desired thickness of the second portion of the chuck body is achieved.
  • the second dielectric material is the same as the first dielectric material.
  • steps 310, 320 and 330 may be repeated more than once such that the ESC includes multiple functional electric layers sandwiched between dielectric layers.
  • a mechanical dielectric layer is formed on top of the at least one layer of second dielectric material.
  • This mechanical dielectric layer serves as a sort of cap to the ESC structure. Any manner of depositing the mechanical dielectric layer on the at least one layer of second dielectric material can be used, including deposition via plasma spray, PVD, or a bonding process using ultra thin material.
  • the material of the mechanical dielectric layer is not limited.
  • the mechanical dielectric layer is the same material as the handle. Thus, for example, when the handle is made from AI2O3, AIN or Y2O3, the mechanical dielectric material can be made from the same AI2O3, AIN or Y2O3 material.
  • the manufacturing method can further include a patterning step wherein the mechanical dielectric layer is patterned based on the desired application.
  • Any suitable patterning techniques can be used, such as subtractive manufacturing.
  • CNC grinding can be used to form helium channels, mesas, etc. on top of which the wafers can rest during use of the ESC.
  • the ESC 400 includes a handle 410 on top of which is deposited a layer 420 of first dielectric material. While Figure 4 shows a single layer, it should be appreciated that layer 420 may actually be made of up several layers. On top of layer 420 is a patterned functional electric layer 430. On top of functional electric layer 430 is a layer 440 of the second dielectric material. While Figure 4 shows a single layer, it should be appreciated that layer 440 may actually be made up of several layers. On top of layer 440 is patterned mechanical dielectric layer 450. While Figure 4 shows a single layer 420, a single layer 430 and a single layer 440, it should be appreciated that the ESC could include one or more repeated stacks of layers 420, 430 and 440 on top of the stack shown in Figure 4.
  • the ESC manufacturing methods described herein can provide numerous benefits over previously known ESC manufacturing methods. For example, the disclosed method utilizing spin coating and/or spraying reduces manufacturing costs as compared to methods that employ tape casting. Additionally, the ESC produced by manufacturing methods described herein may also have improved characteristics as compared to an ESC manufactured by previously known methods. For example, the ESC produced by the methods described herein may provide increased clamp force, reduced ESC voltage (which reduces electrostatic particle attraction), reduced electron mobility to improve chucking and dechucking performance at high temperatures, reduced or eliminated residual charging (which is also related to improved chucking and dechucking performance at high temperatures), increased operating temperatures, increased thermal response, and/or high heat flow.
  • reduced ESC voltage which reduces electrostatic particle attraction
  • reduced electron mobility to improve chucking and dechucking performance at high temperatures
  • reduced or eliminated residual charging which is also related to improved chucking and dechucking performance at high temperatures
  • increased operating temperatures increased thermal response, and/or high heat flow.

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Formation Of Insulating Films (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
PCT/US2020/021996 2019-03-11 2020-03-11 Methods of manufacturing electrostatic chucks Ceased WO2020185835A1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL286108A IL286108B2 (en) 2019-03-11 2020-03-11 Methods for manufacturing electrostatic chucks
SG11202109712U SG11202109712UA (en) 2019-03-11 2020-03-11 Methods of manufacturing electrostatic chucks
EP20769276.5A EP3939157A4 (en) 2019-03-11 2020-03-11 METHOD OF MAKING ELECTROSTATIC CHUCKS
MYPI2021005117A MY210488A (en) 2019-03-11 2020-03-11 Methods of manufacturing electrostatic chucks
CN202080020969.9A CN113647009B (zh) 2019-03-11 2020-03-11 制造静电吸盘的方法
KR1020217032437A KR102796742B1 (ko) 2019-03-11 2020-03-11 정전 척을 제조하는 방법
JP2021554687A JP7547359B2 (ja) 2019-03-11 2020-03-11 静電チャックの製造方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962816687P 2019-03-11 2019-03-11
US62/816,687 2019-03-11

Publications (1)

Publication Number Publication Date
WO2020185835A1 true WO2020185835A1 (en) 2020-09-17

Family

ID=72423932

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2020/021996 Ceased WO2020185835A1 (en) 2019-03-11 2020-03-11 Methods of manufacturing electrostatic chucks

Country Status (10)

Country Link
US (1) US11673161B2 (https=)
EP (1) EP3939157A4 (https=)
JP (1) JP7547359B2 (https=)
KR (1) KR102796742B1 (https=)
CN (1) CN113647009B (https=)
IL (1) IL286108B2 (https=)
MY (1) MY210488A (https=)
SG (1) SG11202109712UA (https=)
TW (1) TWI843819B (https=)
WO (1) WO2020185835A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119153287B (zh) * 2024-11-19 2025-10-14 海拓创新技术(杭州)有限公司 一种静电卡盘的制造方法

Citations (9)

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Publication number Priority date Publication date Assignee Title
US5753132A (en) 1994-01-31 1998-05-19 Applied Materials, Inc. Method of making electrostatic chuck with conformal insulator film
US6225240B1 (en) 1998-11-12 2001-05-01 Advanced Micro Devices, Inc. Rapid acceleration methods for global planarization of spin-on films
US20020045011A1 (en) * 1999-07-07 2002-04-18 Shinji Nagashima Substrate processing method
US20080185738A1 (en) * 2007-02-01 2008-08-07 Samsung Electronics Co., Ltd. Semiconductor device and method of manufacturing the same
US20140042716A1 (en) 2011-04-27 2014-02-13 Sumitomo Osaka Cement Co., Ltd. Electrostatic chuck device
US20140218711A1 (en) * 2011-03-17 2014-08-07 Asml Netherlands B.V. Electrostatic Clamp, Lithographic Apparatus, and Device Manufacturing Method
US20160170314A1 (en) * 2011-02-18 2016-06-16 Asml Netherlands B.V. Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder
US20160268048A1 (en) * 2015-03-09 2016-09-15 Blackberry Limited Thin film dielectric stack
US20170242345A1 (en) * 2014-08-26 2017-08-24 Asml Holding N.V. An Electrostatic Clamp and a Method for Manufacturing the Same

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JP2008016795A (ja) * 2006-07-06 2008-01-24 Momentive Performance Materials Inc 耐腐食性ウェーハプロセス装置およびその作製方法
US8206829B2 (en) * 2008-11-10 2012-06-26 Applied Materials, Inc. Plasma resistant coatings for plasma chamber components
NL2008630A (en) * 2011-04-27 2012-10-30 Asml Netherlands Bv Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder.
US8941969B2 (en) * 2012-12-21 2015-01-27 Applied Materials, Inc. Single-body electrostatic chuck
WO2015013142A1 (en) * 2013-07-22 2015-01-29 Applied Materials, Inc. An electrostatic chuck for high temperature process applications
CN107078086B (zh) * 2014-02-07 2021-01-26 恩特格里斯公司 静电夹具以及制造其之方法
DE102015210736B3 (de) * 2015-06-11 2016-10-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung mit folie zum elektrostatischen koppeln eines substrats mit einem substratträger
JP2017216443A (ja) * 2016-05-20 2017-12-07 ラム リサーチ コーポレーションLam Research Corporation 再配線層における均一性を実現するためのシステム及び方法
JP6796531B2 (ja) * 2017-03-31 2020-12-09 日本特殊陶業株式会社 基板保持装置の補修方法

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5753132A (en) 1994-01-31 1998-05-19 Applied Materials, Inc. Method of making electrostatic chuck with conformal insulator film
US6225240B1 (en) 1998-11-12 2001-05-01 Advanced Micro Devices, Inc. Rapid acceleration methods for global planarization of spin-on films
US20020045011A1 (en) * 1999-07-07 2002-04-18 Shinji Nagashima Substrate processing method
US20080185738A1 (en) * 2007-02-01 2008-08-07 Samsung Electronics Co., Ltd. Semiconductor device and method of manufacturing the same
US20160170314A1 (en) * 2011-02-18 2016-06-16 Asml Netherlands B.V. Substrate holder, lithographic apparatus, device manufacturing method, and method of manufacturing a substrate holder
US20140218711A1 (en) * 2011-03-17 2014-08-07 Asml Netherlands B.V. Electrostatic Clamp, Lithographic Apparatus, and Device Manufacturing Method
US20140042716A1 (en) 2011-04-27 2014-02-13 Sumitomo Osaka Cement Co., Ltd. Electrostatic chuck device
US20170242345A1 (en) * 2014-08-26 2017-08-24 Asml Holding N.V. An Electrostatic Clamp and a Method for Manufacturing the Same
US20160268048A1 (en) * 2015-03-09 2016-09-15 Blackberry Limited Thin film dielectric stack

Non-Patent Citations (1)

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Title
See also references of EP3939157A4

Also Published As

Publication number Publication date
EP3939157A1 (en) 2022-01-19
TWI843819B (zh) 2024-06-01
CN113647009B (zh) 2024-06-28
CN113647009A (zh) 2021-11-12
KR20220006507A (ko) 2022-01-17
MY210488A (en) 2025-09-25
JP2022524811A (ja) 2022-05-10
KR102796742B1 (ko) 2025-04-15
SG11202109712UA (en) 2021-10-28
US11673161B2 (en) 2023-06-13
EP3939157A4 (en) 2023-01-18
TW202101657A (zh) 2021-01-01
JP7547359B2 (ja) 2024-09-09
IL286108A (en) 2021-10-31
IL286108B1 (en) 2024-11-01
IL286108B2 (en) 2025-03-01
US20200290081A1 (en) 2020-09-17

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