WO2020184567A1 - Dispositif et procédé d'inspection d'image - Google Patents

Dispositif et procédé d'inspection d'image Download PDF

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Publication number
WO2020184567A1
WO2020184567A1 PCT/JP2020/010331 JP2020010331W WO2020184567A1 WO 2020184567 A1 WO2020184567 A1 WO 2020184567A1 JP 2020010331 W JP2020010331 W JP 2020010331W WO 2020184567 A1 WO2020184567 A1 WO 2020184567A1
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WIPO (PCT)
Prior art keywords
light
unit
image
image inspection
emission direction
Prior art date
Application number
PCT/JP2020/010331
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English (en)
Japanese (ja)
Inventor
和志 吉岡
加藤　豊
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オムロン株式会社
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Publication of WO2020184567A1 publication Critical patent/WO2020184567A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Definitions

  • the present invention relates to an image inspection device and an image inspection method.
  • an image inspection device may be installed in the product manufacturing line to inspect parts and finished products.
  • the direction of lighting is adjusted in advance so that the state of an object such as a part or a finished product can be appropriately photographed.
  • Patent Document 1 there is a method of photographing an object illuminated by a pattern selected from a pattern that combines the presence / absence of lighting of a plurality of illumination blocks and the intensity of irradiation light of each illumination block. It is disclosed.
  • the object is not always photographed in the same position and posture.
  • the position and posture of the object may change in the process of being conveyed, and the position and posture at the time of shooting may not be constant. Therefore, it may not be possible to take an appropriate image of the object in the illumination direction optimized for a specific position and posture.
  • the present invention provides an image inspection device and an image inspection method capable of taking an appropriate image of an object and inspecting the image even when the position and posture of the object are not constant.
  • the image inspection apparatus includes a measuring unit that measures placement information including at least one of the position and orientation of an object, and a plurality of lighting elements arranged in a matrix, and a plurality of lighting elements. Based on the lighting unit that irradiates the object with light by controlling the emission direction of the light according to the arrangement information, the photographing unit that captures the illuminated object, and the image captured by the photographing unit. It is equipped with an inspection unit that inspects the condition of the object.
  • the position and orientation of the object are measured by measuring the arrangement information including at least one of the position and orientation of the object and controlling the emission direction of light by the plurality of lighting elements according to the arrangement information. Even when the value is not constant, an appropriate image of the object can be taken and an image inspection can be performed.
  • the lighting unit may irradiate the object with light by correcting the emission direction of the light designed in advance for the object according to the arrangement information.
  • the object by correcting the emission direction of the pre-designed light according to the arrangement information, the object can be calculated with a smaller amount of calculation as compared with the case where the emission direction of the pre-designed light is not referred to.
  • the light emission direction can be controlled so that an appropriate image can be taken.
  • the measuring unit may include a distance measuring sensor that measures the distance to the object.
  • the arrangement information of the object can be measured more accurately, and even when the position and posture of the object are not constant, an appropriate image of the object can be taken and an image inspection can be performed. ..
  • the measuring unit extracts the shape feature of the object based on the test image taken by the photographing unit of the object irradiated with the predetermined light by the lighting unit, and arranges the object based on the shape feature. May be measured.
  • the arrangement information of the object can be measured based on the test image, and the hardware configuration of the measuring unit can be simplified.
  • the illumination unit when a test image is taken by the photographing unit, the illumination unit emits either light directed at the contour of the object, line-shaped light crossing the object, or striped light covering the object. You may irradiate.
  • the shape feature of the object can be extracted more accurately based on the test image, and the arrangement information of the object can be measured more accurately.
  • the measuring unit may include an auxiliary photographing unit that photographs an object from a direction different from that of the photographing unit.
  • the arrangement information of the object can be measured more accurately, and even when the position and posture of the object are not constant, an appropriate image of the object can be taken and an image inspection can be performed. ..
  • the illumination unit the light from a plurality of illumination elements is used so that the light reflected at the normal portion of the object is incident on the photographing unit and the light reflected at the abnormal portion of the object is not incident on the photographing unit.
  • the object may be irradiated with light by controlling the emission direction of the object according to the arrangement information.
  • the image of the object satisfies the bright field condition that the normal part of the object appears bright and the abnormal part of the object appears dark. Can be photographed and image inspection can be performed.
  • the illumination unit is provided with a plurality of illumination elements so that the light reflected at the normal portion of the object does not enter the photographing unit and the light reflected at the abnormal portion of the object is incident on the photographing unit.
  • the light emission direction may be controlled according to the arrangement information to irradiate the object with light.
  • the image of the object satisfies the dark field condition that the normal part of the object appears dark and the abnormal part of the object appears bright. Can be photographed and image inspection can be performed.
  • the image inspection apparatus includes a plurality of illuminating elements arranged in a matrix in which the emission direction of light can be controlled, and a plurality of illuminating elements with respect to an object. Based on the characteristics of the illumination unit that irradiates light multiple times at an angle, the photographing unit that photographs the object each time the light is irradiated, and the characteristics of the plurality of images of the photographed object, at least one from the plurality of images. It is provided with a selection unit for selecting an image of light, and an inspection unit for inspecting the state of an object based on at least one image.
  • the position and orientation of the object are not constant by irradiating the object with light at a plurality of angles to capture a plurality of images and selecting at least one image. Also, an appropriate image of the object can be taken and an image inspection can be performed.
  • An image inspection method is to measure arrangement information including at least one of the position and orientation of an object, and to measure light from an illumination unit including a plurality of illumination elements arranged in a matrix.
  • the emission direction is controlled according to the arrangement information, the object is irradiated with light, the illuminated object is photographed, and the state of the object is inspected based on the photographed image. Including that.
  • the position and orientation of the object are measured by measuring the arrangement information including at least one of the position and orientation of the object and controlling the emission direction of light by the plurality of lighting elements according to the arrangement information. Even when the value is not constant, an appropriate image of the object can be taken and an image inspection can be performed.
  • the emission direction of light can be controlled, and light is emitted from an object at a plurality of angles with respect to an object by an illumination unit including a plurality of illumination elements arranged in a matrix. At least one image is selected from the plurality of images based on the characteristics of the multiple images of the object being photographed and the object being photographed each time the light is irradiated. This includes inspecting the condition of the object based on at least one image.
  • the position and orientation of the object are not constant by irradiating the object with light at a plurality of angles to capture a plurality of images and selecting at least one image. Also, an appropriate image of the object can be taken and an image inspection can be performed.
  • an image inspection device and an image inspection method capable of taking an appropriate image of an object and inspecting the image even when the position and posture of the object are not constant. It becomes.
  • FIG. 1 is a schematic view showing an outline of the image inspection apparatus 100 according to the first embodiment of the present invention.
  • the image inspection device 100 takes an image of the object 1 transported by the transport unit 50 and performs an image inspection.
  • the image inspection device 100 according to the present embodiment includes an auxiliary photographing unit 10, a lighting unit 20, an imaging unit 30, and an information processing device 40.
  • the auxiliary photographing unit 10 is an example of a measuring unit that measures arrangement information including at least one of the position and posture of the object 1, and photographs the object 1 from a direction different from that of the photographing unit 30.
  • the auxiliary photographing unit 10 may be composed of a general-purpose camera, and in the case of this example, the object 1 is photographed from the direction along the conveying surface of the conveying unit 50.
  • the illumination unit 20 includes a plurality of illumination elements arranged in a matrix, controls the emission direction of light by the plurality of illumination elements according to the arrangement information, and irradiates the object 1 with light.
  • the lighting unit 20 is arranged so as to cover a backlight composed of, for example, an LED (Light Emitting Diode) and the backlight, and a liquid crystal panel constituting a plurality of pixels and a liquid crystal panel so as to cover the liquid crystal panel. It may have a microlens array.
  • the illumination unit 20 may control a plurality of pixels of the liquid crystal panel to transmit or block light, and emit light in a specific direction by a microlens array.
  • the lighting unit 20 may have another configuration.
  • the illumination unit 20 is arranged so as to cover a backlight composed of, for example, LEDs or the like, a first liquid crystal panel that constitutes a plurality of pixels, and a plurality of illumination units 20 that are arranged so as to cover the first liquid crystal panel. It may have a second liquid crystal panel constituting the pixels of. In this case, the illumination unit 20 may control a plurality of pixels of the first liquid crystal panel and the second liquid crystal panel to transmit or block light and emit light in a specific direction.
  • the lighting unit 20 may irradiate the object 1 with light by correcting the light emission direction designed in advance for the object 1 according to the arrangement information.
  • the pre-designed light emission direction for the object 1 is the direction of illumination optimized when the object 1 is in a specific position and orientation.
  • the lighting unit 20 calculates how much the position and orientation of the object 1 deviates from a specific position and orientation designed in advance based on the arrangement information, and corrects the light emission direction according to the deviation. Good.
  • the photographing unit 30 photographs the illuminated object 1.
  • the photographing unit 30 may be composed of a general-purpose camera, and in the case of this example, the object 1 is photographed from a direction perpendicular to the conveying surface of the conveying unit 50.
  • the information processing device 40 functions as an inspection unit that inspects the state of the object 1 based on the image captured by the photographing unit 30.
  • the information processing device 40 performs known image processing on the image captured by the photographing unit 30, inspects the object 1 for any abnormality, displays the inspection result, and transmits the inspection result to an external device.
  • the arrangement information including at least one of the position and the posture of the object 1 is measured, and the light emission direction by the plurality of illumination elements is measured according to the arrangement information.
  • the arrangement information of the object 1 is measured more accurately, and an appropriate image of the object 1 is photographed even when the position and the posture of the object 1 are not constant. be able to.
  • the object 1 is suitable with a smaller amount of calculation as compared with the case where the emission direction of the light designed in advance is not referred to.
  • the light emission direction can be controlled so that an image can be taken.
  • FIG. 2 is a diagram showing a physical configuration of an information processing device 40 included in the image inspection device 100 according to the first embodiment.
  • the information processing device 40 includes a CPU (Central Processing Unit) 10a corresponding to a calculation unit, a RAM (Random Access Memory) 10b corresponding to a storage unit, a ROM (Read only Memory) 10c corresponding to a storage unit, and a communication unit. It has a 10d, an input unit 10e, and a display unit 10f. Each of these configurations is connected to each other via a bus so that data can be transmitted and received.
  • the information processing device 40 is composed of one computer will be described, but the information processing device 40 may be realized by combining a plurality of computers.
  • the configuration shown in FIG. 10 is an example, and the information processing apparatus 40 may have configurations other than these, or may not have a part of these configurations.
  • the CPU 10a is a control unit that controls execution of a program stored in the RAM 10b or ROM 10c, calculates data, and processes data.
  • the CPU 10a is a calculation unit that executes a program (image inspection program) for inspecting the state of the object based on the image of the object 1 taken with illumination according to the arrangement information of the object 1 measured by the measuring unit. Is.
  • the CPU 10a receives various data from the input unit 10e and the communication unit 10d, displays the calculation result of the data on the display unit 10f, and stores it in the RAM 10b or the ROM 10c.
  • the CPU 10a functions as an inspection unit 41 by executing an image inspection program.
  • the inspection unit 41 inspects the state of the object 1 based on the image taken by the photographing unit 30.
  • the CPU 10a may function as a correction unit that corrects the light emission direction designed in advance for the object 1 according to the arrangement information by executing the image inspection program.
  • the RAM 10b is a storage unit in which data can be rewritten, and may be composed of, for example, a semiconductor storage element.
  • the RAM 10b may store data such as an image inspection program executed by the CPU 10a and an image of an object. It should be noted that these are examples, and data other than these may be stored in the RAM 10b, or a part of these may not be stored.
  • the ROM 10c is a storage unit capable of reading data, and may be composed of, for example, a semiconductor storage element.
  • the ROM 10c may store, for example, an image inspection program or data that is not rewritten.
  • the communication unit 10d is an interface for connecting the information processing device 40 to another device.
  • the communication unit 10d may be connected to a communication network such as the Internet.
  • the input unit 10e receives data input from the user, and may include, for example, a keyboard and a touch panel.
  • the display unit 10f visually displays the calculation result by the CPU 10a, and may be configured by, for example, an LCD (Liquid Crystal Display).
  • the display unit 10f may display, for example, an image of the object 1 or an inspection result by the inspection unit 41.
  • the image inspection program may be stored in a storage medium readable by a computer such as RAM 10b or ROM 10c and provided, or may be provided via a communication network connected by the communication unit 10d.
  • the operation of the inspection unit 41 and the like is realized by the CPU 10a executing the image inspection program.
  • the information processing device 40 may include an LSI (Large-Scale Integration) in which the CPU 10a and the RAM 10b or ROM 10c are integrated.
  • FIG. 3 is a diagram showing a first example in which an object is photographed so as to satisfy a bright visual field condition by the image inspection apparatus 100 according to the first embodiment.
  • the bright visual field condition is an illumination condition in which the normal portion of the object 1 appears bright and the abnormal portion of the object 1 appears dark.
  • the light L1 emitted in the pre-designed direction is reflected by the normal portion of the object 1 and the reflected light R1. Is incident on the photographing unit 30.
  • the object 1 has an abnormal portion, the light reflected by the abnormal portion does not enter the photographing unit 30 (or even if it does, the intensity is smaller than the reflected light R1 from the normal portion).
  • FIG. 4 is a diagram showing a second example in which an object is photographed so as to satisfy a bright visual field condition by the image inspection device 100 according to the first embodiment.
  • the object 1 is not placed horizontally on the transport unit 50, and the posture is tilted.
  • the illumination unit 20 has a plurality of illumination elements so that the light R2 reflected at the normal portion of the object 1 is incident on the photographing unit 30 and the light reflected at the abnormal portion of the object 1 is not incident on the photographing unit 30.
  • the light L2 may be applied to the object 1 by controlling the light emission direction according to the arrangement information.
  • the illumination unit 20 corrects the light emission direction (light L1 shown in FIG. 3) designed in advance for the object 1 according to the arrangement information of the object 1 with respect to the object 1.
  • Light L2 may be irradiated.
  • the object can satisfy the bright field condition that the normal part of the object 1 appears bright and the abnormal part of the object 1 appears dark.
  • the image of 1 can be taken. Therefore, according to the image inspection device 100 according to the present embodiment, an appropriate image inspection can be performed even when the position and posture of the object 1 are not constant.
  • FIG. 5 is a diagram showing a first example of photographing an object so as to satisfy the dark field condition by the image inspection apparatus 100 according to the first embodiment.
  • the dark field condition is an illumination condition in which the normal portion of the object 1 appears dark and the abnormal portion of the object 1 appears bright.
  • the light L3 emitted in the pre-designed direction is reflected by the normal portion of the object 1 and the reflected light R3. Does not enter the photographing unit 30.
  • the object 1 has an abnormal portion, the light reflected by the abnormal portion is incident on the photographing unit 30 (or light having a higher intensity than the reflected light R3 from the normal portion is incident).
  • FIG. 6 is a diagram showing a second example of photographing an object so as to satisfy the dark field condition by the image inspection apparatus 100 according to the first embodiment.
  • the object 1 is not placed horizontally on the transport unit 50, and the posture is tilted.
  • the illumination unit 20 has a plurality of illuminations so that the light R4 reflected at the normal portion of the object 1 does not enter the photographing unit 30 and the light reflected at the abnormal portion of the object 1 incident on the photographing unit 30.
  • the light L4 may be applied to the object 1 by controlling the light emission direction of the element according to the arrangement information.
  • the illumination unit 20 corrects the light emission direction (light L3 shown in FIG. 5) designed in advance for the object 1 according to the arrangement information of the object 1 with respect to the object 1.
  • Light L4 may be irradiated.
  • the image inspection device 100 According to the present embodiment, an appropriate image inspection can be performed even when the position and posture of the object 1 are not constant.
  • FIG. 7 is a schematic view showing an outline of the image inspection device 101 according to the second embodiment of the present invention.
  • the image inspection device 101 according to the second embodiment has the first embodiment in that it includes the distance measuring sensors 15a, 15b, 15c as a measuring unit for measuring the arrangement information including at least one of the position and the posture of the object 1. It is different from the image inspection device 100 and has the same configuration as the image inspection device 100 according to the first embodiment.
  • the distance measuring sensors 15a, 15b, and 15c each measure the distance to the object 1.
  • the distance measuring sensors 15a, 15b, and 15c measure the distances of the different points of the object 1 in the direction perpendicular to the transport surface of the transport unit 50.
  • the distance measuring sensors 15a, 15b, and 15c measure the arrangement information of the object 1 more accurately, and even when the position and posture of the object 1 are not constant, an appropriate image of the object 1 is obtained. Can be photographed and image inspection can be performed.
  • the distance measuring sensor is not limited to a sensor that measures the distance at one point, but is a sensor that measures the distance at multiple points, a sensor that measures the distance on a line, or measures a distance on a two-dimensional area. It may be a sensor that does.
  • FIG. 8 is a diagram showing an example in which the object 1 is photographed by the image inspection device 102 according to the third embodiment of the present invention.
  • the image inspection device 102 according to the present embodiment irradiates a predetermined light with a lighting unit 20 to take a test image of the object 1, extracts the shape feature of the object 1 based on the test image, and converts the shape feature into the shape feature. It differs from the image inspection device 100 according to the first embodiment in that the arrangement information of the object 1 is measured based on the above, and has the same configuration as the image inspection device 100 according to the first embodiment in other respects.
  • the image inspection device 102 irradiates a predetermined light L5 with the lighting unit 20, and takes a test image of the object 1 with the photographing unit 30. More specifically, when the illuminating unit 20 captures a test image by the photographing unit 30, the light directed toward the contour of the object 1, the line-shaped light crossing the object 1, and the stripes covering the object 1 are covered. You may irradiate any of the light.
  • the image inspection device 102 calculates the position and distortion of the contour of the object 1 based on the test image, and calculates the position and distortion of the contour of the object 1 based on the position of the contour.
  • the position of 1 may be measured, and the posture of the object 1 may be measured based on the distortion of the contour.
  • the image inspection device 102 may measure the position and the posture of the object 1 by the light cutting method.
  • the image inspection device 102 may measure the position and orientation of the object 1 by the phase shift method.
  • the shape feature of the object 1 can be extracted more accurately based on the test image, and the arrangement information of the object 1 can be measured more accurately. ..
  • FIG. 9 is a diagram showing an example of a test image IMG taken by the image inspection device 102 according to the third embodiment.
  • the measuring unit of the image inspection device 102 according to the present embodiment extracts the shape feature of the object 1 based on the test image IMG taken by the photographing unit 30 of the object 1 irradiated with the predetermined light by the lighting unit 20. , The arrangement information of the object 1 is measured based on the shape feature.
  • FIG. 9 shows an example of a test image IMG taken by irradiating the contour of the object 1 with light by the illumination unit 20.
  • the image inspection device 102 may extract the contour shape of the object 1 as a shape feature of the object 1.
  • the image inspection device 102 may calculate the distortion of the contour based on the shape of the contour of the extracted object 1, and measure the posture of the object 1 based on the distortion of the contour. In this way, the arrangement information of the object 1 can be measured based on the test image IMG, and the hardware configuration of the measuring unit can be simplified.
  • the image inspection device 102 may extract edges other than the pattern of the object 1 and the contour of the object 1 and measure the position and posture of the object 1 based on them.
  • FIG. 10 is a schematic view showing an outline of the image inspection apparatus 103 according to the fourth embodiment of the present invention.
  • the image inspection device 103 according to the fourth embodiment does not include a measuring unit such as an auxiliary photographing unit 10, and has a point that the illumination unit 20 illuminates the object 1 multiple times at a plurality of angles, and an imaging unit 30 allows the object 1 to be illuminated.
  • the point of taking a plurality of images of the above and the point of selecting at least one image from the plurality of images by the information processing apparatus 40 are different from the image inspection device 100 according to the first embodiment, and the other points are described in the first embodiment. It has the same configuration as the image inspection device 100.
  • the illumination unit 20 of the image inspection device 103 can control the light emission direction, includes a plurality of illumination elements arranged in a matrix, and the plurality of illumination elements with respect to the object 1. , Irradiate light multiple times at multiple angles. Then, the photographing unit 30 photographs the object 1 each time the light is irradiated. For example, when the illumination unit 20 irradiates the object 1 with light at 10 different angles, the photographing unit 30 captures 10 images of the object 1.
  • the illumination unit 20 may irradiate light at a plurality of angles a plurality of times by varying the emission direction of the light designed in advance. In this case, the illumination unit 20 may randomly change the emission direction of the light designed in advance, or may change it by a predetermined angle.
  • the information processing device 40 determines the state of the object 1 based on the selection unit that selects at least one image from the plurality of images and the state of the object 1 based on the characteristics of the plurality of images of the captured object 1. It functions as an inspection unit for inspection.
  • the selection unit selects, for example, at least one image from the plurality of images based on the contrast of the plurality of images, or at least one image from the plurality of images based on the sharpness of the edge of the captured object 1.
  • An image may be selected, or at least one image may be selected from a plurality of images based on the sharpness of a predetermined shape of the captured object 1.
  • the photographing unit 30 photographs a plurality of images of the object 1 at different telephoto magnifications
  • the selection unit selects at least one of the plurality of images based on whether or not the entire object 1 is contained in the image. You may select an image.
  • the selection unit may select the brightest image among the plurality of images of the object 1. Further, when capturing an image satisfying the dark field condition, the selection unit may select the darkest image among the plurality of images of the object 1.
  • the position of the object 1 is determined by irradiating the object 1 with light at a plurality of angles to capture a plurality of images and selecting at least one image. And even when the posture is not constant, an appropriate image of the object can be taken and an image inspection can be performed.
  • FIG. 11 is a diagram showing a physical configuration of the information processing device 40 included in the image inspection device 103 according to the fourth embodiment of the present invention. Hereinafter, the differences from the information processing device 40 included in the image inspection device 100 according to the first embodiment will be described.
  • the CPU 10a functions as an inspection unit 41 and a selection unit 42 by executing an image inspection program.
  • the selection unit 42 selects at least one image from the plurality of images based on the characteristics of the plurality of images of the captured object 1.
  • the characteristics of the image may be the contrast of the image, the sharpness of the edge of the object 1 captured in the image, the sharpness of the predetermined shape of the object 1 captured in the image, and the like.
  • the image inspection program may be stored in a storage medium readable by a computer such as RAM 10b or ROM 10c and provided, or may be provided via a communication network connected by the communication unit 10d.
  • the operation of the inspection unit 41 and the selection unit 42 is realized by the CPU 10a executing the image inspection program.
  • the information processing device 40 may include an LSI in which the CPU 10a is integrated with the RAM 10b and the ROM 10c.
  • FIG. 12 is a flowchart of an image inspection process executed by the image inspection device 103 according to the fourth embodiment.
  • the image inspection device 103 irradiates the object 1 with light a plurality of times at a plurality of angles (S10), and photographs the object 1 each time the light is irradiated (S11).
  • the image inspection device 103 selects at least one image from the plurality of images based on the characteristics of the plurality of images of the captured object (S12). Finally, the image inspection device 103 performs an image inspection based on the selected image (S13). As a matter of course, the image inspection device 103 may display the result of the image inspection or transmit it to an external device. With the above, the image inspection process is completed.
  • Illumination in which the emission direction of light can be controlled includes a plurality of illumination elements arranged in a matrix, and the plurality of illumination elements irradiate the object (1) with light at a plurality of angles. Part (20) and Each time the light is irradiated, the photographing unit (30) that photographs the object (1) and A selection unit (42) that selects at least one image from the plurality of images based on the characteristics of the plurality of images of the captured object (1). An inspection unit (41) that inspects the state of the object (1) based on at least one image, An image inspection device (103).
  • the emission direction of light can be controlled, and the object (1) is irradiated with light at a plurality of angles by an illumination unit (20) including a plurality of illumination elements arranged in a matrix.
  • an illumination unit (20) including a plurality of illumination elements arranged in a matrix.
  • the object (1) is photographed, and To select at least one image from the plurality of images based on the characteristics of the plurality of images of the captured object (1). Inspecting the state of the object (1) based on the at least one image, and Image inspection methods including.

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Abstract

L'invention concerne un dispositif et un procédé d'inspection d'image permettant de capturer une image appropriée d'un sujet et d'effectuer une inspection d'image, même si la position ou la posture du sujet n'est pas constante. Le dispositif d'inspection d'image comprend : une unité de mesure qui mesure des informations d'agencement comprenant au moins la position ou la posture du sujet ; une unité d'éclairage comprenant plusieurs éléments d'éclairage agencés dans une matrice, qui commande la direction de la lumière émise par lesdits plusieurs éléments d'éclairage conformément aux informations d'agencement, et qui éclaire le sujet ; une unité d'imagerie qui capture des images du sujet éclairé ; et une unité d'inspection qui inspecte l'état du sujet, sur la base d'images capturées par l'unité d'imagerie.
PCT/JP2020/010331 2019-03-14 2020-03-10 Dispositif et procédé d'inspection d'image WO2020184567A1 (fr)

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JP2019047185A JP7164836B2 (ja) 2019-03-14 2019-03-14 画像検査装置及び画像検査方法
JP2019-047185 2019-03-14

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WO2020184567A1 true WO2020184567A1 (fr) 2020-09-17

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0487856U (fr) * 1990-12-12 1992-07-30
JPH0979988A (ja) * 1995-09-11 1997-03-28 Nissan Motor Co Ltd 表面欠陥検査装置
JPH1082613A (ja) * 1996-09-09 1998-03-31 Matsushita Electric Ind Co Ltd 視覚認識方法及び装置
JPH11108844A (ja) * 1997-10-01 1999-04-23 Asahi Glass Co Ltd 鏡面材料並びに透過材料の検査用光源装置
JP2005300529A (ja) * 2004-03-15 2005-10-27 Omron Corp センサ装置
JP2012058091A (ja) * 2010-09-09 2012-03-22 Ipro Llc 表面検査装置
US20130147947A1 (en) * 2011-12-09 2013-06-13 Andrea Terreno Method for monitoring the quality of the primer layer applied to a motor-vehicle body prior to painting
JP2020046310A (ja) * 2018-09-19 2020-03-26 アンリツインフィビス株式会社 外観検査装置および外観検査方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2588339Y2 (ja) * 1993-05-28 1999-01-06 三菱自動車工業株式会社 車体面検査装置
JP2001215108A (ja) * 2000-02-02 2001-08-10 Seiko Epson Corp 電気光学装置用基板の検査方法及び検査装置
JP6371044B2 (ja) * 2013-08-31 2018-08-08 国立大学法人豊橋技術科学大学 表面欠陥検査装置および表面欠陥検査方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0487856U (fr) * 1990-12-12 1992-07-30
JPH0979988A (ja) * 1995-09-11 1997-03-28 Nissan Motor Co Ltd 表面欠陥検査装置
JPH1082613A (ja) * 1996-09-09 1998-03-31 Matsushita Electric Ind Co Ltd 視覚認識方法及び装置
JPH11108844A (ja) * 1997-10-01 1999-04-23 Asahi Glass Co Ltd 鏡面材料並びに透過材料の検査用光源装置
JP2005300529A (ja) * 2004-03-15 2005-10-27 Omron Corp センサ装置
JP2012058091A (ja) * 2010-09-09 2012-03-22 Ipro Llc 表面検査装置
US20130147947A1 (en) * 2011-12-09 2013-06-13 Andrea Terreno Method for monitoring the quality of the primer layer applied to a motor-vehicle body prior to painting
JP2020046310A (ja) * 2018-09-19 2020-03-26 アンリツインフィビス株式会社 外観検査装置および外観検査方法

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