WO2020114015A1 - 补偿装置、显示屏、显示装置和补偿方法 - Google Patents
补偿装置、显示屏、显示装置和补偿方法 Download PDFInfo
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- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
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- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
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- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
- G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
- G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
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Definitions
- the present disclosure relates to the field of display technology, and in particular, to a compensation device, a display screen, a display device, and a compensation method.
- the flexible display technology based on LTPS can manufacture folding display screens, such as folding flexible OLED (Organic Light Emitting Diode, organic light emitting diode) display screens.
- LTPS technology can be used to form a TFT (Thin Film Transistor, thin film transistor) on a PI (Polyimide, polyimide) substrate to form a flexible display substrate.
- a compensation device for a display screen including: a detection circuit including a resistance sensitive member disposed in a deformation region of the display screen, the detection circuit configured to detect the resistance A resistance change amount of the sensitive member, wherein when the resistance sensitive member is deformed, the resistance of the resistance sensitive member changes; and a processor configured to obtain a drive in the deformation region according to the resistance change amount The drift amount of the characteristic curve of the transistor, and adjusts the driving voltage signal output to the driving transistor according to the drift amount.
- the detection circuit includes: a Huygens bridge circuit, including the resistance-sensitive element, configured to generate a bridge current when the resistance-sensitive element deforms; a current-voltage conversion circuit , Configured to convert the bridge current into an analog voltage; and an analog-to-digital conversion circuit, configured to convert the analog voltage into a digital quantity, and transmit the digital quantity to the processor, wherein , The digital quantity represents the resistance change amount.
- the Huygens bridge circuit further includes a first resistor, a second resistor, and a third resistor; wherein, the first end of the first resistor, the second resistor The first end of the power supply is electrically connected to one end of the power supply; the first end of the third resistor, one end of the resistance sensitive member and the other end of the power supply are electrically connected; the second end of the first resistor, The second end of the second resistor, the second end of the third resistor, and the other end of the resistance sensor are electrically connected, and are electrically connected to the input end of the current-voltage conversion circuit.
- the processor is configured to obtain the degree of bending of the deformation region according to the resistance change amount, and obtain the amount of drift of the characteristic curve of the driving transistor in the deformation region according to the degree of bending.
- the processor is configured to adjust the voltage value or the duty cycle of the driving voltage signal output to the driving transistor according to the drift amount.
- the processor is configured to determine whether the drift amount of the characteristic curve is greater than a threshold, and in the case where the drift amount is greater than the threshold, adjust the voltage value of the driving voltage signal according to the drift amount Or duty cycle.
- the processor is configured to obtain a change in the driving current flowing from the driving transistor according to the drift amount, and increase the driving voltage signal when the driving current decreases The voltage value or duty ratio, and when the drive current increases, the voltage value or duty ratio of the drive voltage signal is reduced.
- the processor is further configured to determine the number of times the deformation zone is bent according to the number of times the resistance change occurs, and obtain the characteristic curve according to the degree of bending and the number of times The amount of drift.
- the resistance sensitive member includes a piezoelectric thin film structure layer or a piezoresistive material layer.
- the resistance-sensitive member includes a first electrode layer, a second electrode layer, a first optically transparent adhesive layer, a second optically transparent adhesive layer, and a piezoelectric film layer, wherein the first An optically transparent adhesive layer and the second optically transparent adhesive layer are between the first electrode layer and the second electrode layer, and the piezoelectric thin film layer is bonded to the first optically transparent layer Between the agent layer and the second optically transparent adhesive layer.
- a display screen including: the aforementioned compensation device.
- the display screen is a folding display screen
- the deformation area includes a folding area
- a display device including: the display screen as described above.
- a compensation method for a display screen including: detecting a resistance change amount of a resistance sensitive member provided in a deformation region of the display screen, wherein the occurrence of the resistance sensitive member During deformation, the resistance of the resistance-sensitive member changes; the drift amount of the characteristic curve of the driving transistor in the deformation region is obtained according to the resistance change amount; and the drive output to the driving transistor is adjusted according to the drift amount Voltage signal.
- the step of detecting the amount of resistance change of the resistance-sensitive component includes: generating a bridge current under the condition that the resistance-sensitive component is deformed by using a Huygens bridge circuit; converting the bridge current into an analog A voltage quantity; and converting the analog voltage quantity into a digital quantity, wherein the digital quantity represents the resistance change quantity.
- the step of obtaining the drift of the characteristic curve of the driving transistor in the deformation region according to the resistance change includes: obtaining the degree of bending of the deformation region according to the resistance change; and according to the The degree of bending obtains the amount of drift of the characteristic curve of the driving transistor in the deformation region.
- the step of adjusting the driving voltage signal output to the driving transistor according to the drift amount includes adjusting the voltage value or the duty ratio of the driving voltage signal output to the driving transistor according to the drift amount.
- the step of adjusting the voltage value or duty ratio of the driving voltage signal according to the drift amount includes: determining whether the drift amount of the characteristic curve is greater than a threshold value; and when the drift amount is greater than the threshold value Next, the voltage value or the duty ratio of the driving voltage signal is adjusted according to the drift amount.
- the step of adjusting the voltage value or the duty ratio of the driving voltage signal according to the drift amount includes: obtaining the variation of the driving current flowing from the driving transistor according to the drift amount; When the driving current is reduced, the voltage value or duty ratio of the driving voltage signal is increased; and when the driving current is increased, the voltage value or duty ratio of the driving voltage signal is reduced.
- the step of obtaining the drift of the characteristic curve of the driving transistor in the deformation region according to the resistance change includes: obtaining the degree of bending of the deformation region according to the resistance change, and according to the The number of times the resistance change amount occurs determines the number of times the deformation zone is bent; and the amount of drift of the characteristic curve of the driving transistor in the deformation zone is obtained according to the degree of bending and the number of times.
- FIG. 1A is a schematic cross-sectional view showing the structure of a thin film transistor according to an embodiment
- FIG. 1B is a schematic cross-sectional view illustrating a thin film transistor under compressive stress according to an embodiment
- 1C is a schematic cross-sectional view showing a thin film transistor under tensile stress according to an embodiment
- FIG. 2 is a connection diagram illustrating a compensation device for a display screen according to an embodiment of the present disclosure
- 3A is a top view showing a folding display screen according to an embodiment of the present disclosure.
- FIG. 3B is a schematic cross-sectional view showing a structure of a folding display screen taken along line A-A' in FIG. 3A according to an embodiment of the present disclosure
- FIG. 4 is a connection diagram illustrating a compensation device for a display screen according to another embodiment of the present disclosure.
- FIG. 5 is a characteristic diagram illustrating a driving transistor according to an embodiment of the present disclosure
- FIG. 6 is a schematic cross-sectional view showing the structure of a resistance-sensitive member according to an embodiment of the present disclosure
- FIG. 7 is a flowchart illustrating a compensation method for a display screen according to an embodiment of the present disclosure.
- first”, “second” and similar words used in this disclosure do not indicate any order, quantity or importance, but are only used to distinguish different parts. Similar words such as “include” or “include” mean that the elements before the word cover the elements listed after the word, and do not exclude the possibility of covering other elements. “Up”, “down”, “left”, “right”, etc. are only used to indicate the relative positional relationship. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.
- a specific device when it is described that a specific device is located between the first device and the second device, there may or may not be an intervening device between the specific device and the first device or the second device.
- the specific device When it is described that a specific device is connected to another device, the specific device may be directly connected to the other device without an intervening device, or may be directly connected to the other device without an intervening device.
- the inventor of the present disclosure discovered that during the process of repeated bending or folding of certain display screens (for example, folding display screens), due to the presence of mechanical stress, the characteristics of the TFT may drift, resulting in changes in the brightness, making the display screen The problem of uneven light emission in the deformed area (such as the folded area) occurs during display.
- FIG. 1A is a schematic cross-sectional view showing the structure of a thin film transistor according to an embodiment.
- the thin film transistor includes a substrate (for example, a PI substrate) 101, a semiconductor layer 102 on the substrate 101, a source 104 and a drain 105 on the semiconductor layer 102, and a source 104 and a drain
- the thin film transistor is a top-gate TFT structure.
- FIG. 1B is a schematic cross-sectional view illustrating a thin film transistor under compressive stress according to an embodiment.
- FIG. 1C is a schematic cross-sectional view illustrating a thin film transistor under tensile stress according to an embodiment.
- thin film transistors will produce different stress states due to different bending directions. For example, as shown in FIG. 1B, the thin film transistor bends toward the gate side under the action of compressive stress. For another example, as shown in FIG. 1C, the thin film transistor bends toward the side of the substrate under the action of tensile stress.
- TFT characteristics for example, current-voltage characteristics (IV characteristics) of transistors
- IV characteristics current-voltage characteristics
- the threshold voltage V th of the transistor becomes larger and the mobility becomes smaller, resulting in a smaller current (for example, source-drain current I DS ).
- the threshold voltage V th of the transistor will become smaller, and the mobility will become larger, resulting in a larger current.
- the drift is a process of gradually drifting as the number of bending increases.
- a thin film transistor can be applied as a driving transistor in a TFT pixel circuit.
- TFT pixel circuits There are various schemes for the design of TFT pixel circuits, and the basic calculation formula is as follows:
- I DS is the drive current (that is, source-drain current) output by the drive transistor to drive the OLED to emit light
- ⁇ is the effective carrier mobility
- C OX is the capacitance of the drive transistor
- W/L is the aspect ratio of the drive transistor
- V gs is the gate-source voltage of the driving transistor
- V th is the threshold voltage of the driving transistor.
- the folding display screen has a deformation area, for example, the deformation area is a folding area.
- the driving transistor in the folding area will change its threshold voltage and mobility due to folding and bending, which affects the driving current, which may cause different OLEDs to emit different brightness, which may cause uneven light emission in the deformation area during display .
- the embodiments of the present disclosure provide a compensation device for a display screen to compensate for the light emission brightness, so that the light emission in the deformation area is more uniform.
- the compensation device according to some embodiments of the present disclosure will be described in detail below with reference to the drawings.
- the compensation device can be used to fold the display screen.
- the compensation device may include a detection circuit 220 and a processor 240.
- the detection circuit 220 may include a resistance sensitive member (not shown in FIG. 1A) disposed in a deformation area (eg, folding area) of the display screen. When the resistance-sensitive member deforms (for example, bends), the resistance of the resistance-sensitive member changes. The detection circuit 220 is configured to detect the resistance change amount of the resistance-sensitive element. The detection circuit 220 transmits the resistance change amount to the processor 240.
- a resistance sensitive member not shown in FIG. 1A
- the detection circuit 220 transmits the resistance change amount to the processor 240.
- the processor 240 is configured to obtain the drift amount of the characteristic curve (eg, IV characteristic curve) of the driving transistor in the deformation region according to the resistance change amount, and adjust the driving voltage signal output to the driving transistor according to the drift amount.
- the characteristic curve eg, IV characteristic curve
- a compensation device according to some embodiments of the present disclosure is provided.
- the detection circuit detects the resistance change amount of the resistance sensitive member in the deformation area and transmits the resistance change amount to the processor.
- the processor obtains the drift amount of the characteristic curve of the driving transistor in the deformation region according to the resistance change amount, and adjusts the driving voltage signal output to the driving transistor according to the drift amount. By adjusting the driving voltage signal, the brightness compensation of the deformation area can be achieved, so that the light emission of the deformation area is more uniform.
- the processor 240 may be configured to obtain the bending degree of the deformation region according to the resistance change amount, and obtain the drift amount of the characteristic curve of the driving transistor in the deformation region according to the bending degree.
- the degree of curvature of the deformation region may also mean the degree of curvature of the driving transistor in the deformation region.
- the processor may pre-store a correspondence table between the degree of bending and the amount of drift. After obtaining the bending degree of the deformation zone, the processor queries the corresponding relationship table to obtain the corresponding drift amount.
- the processor 240 may be configured to adjust the voltage value or duty cycle of the driving voltage signal output to the driving transistor according to the amount of drift.
- the gate-source voltage of the driving transistor can be adjusted, thereby adjusting the light-emission brightness of the pixels in the deformation region. This can achieve brightness compensation in the deformation zone, so that the light emission in the deformation zone is more uniform.
- the light-emitting time of the pixels in the deformation region can be adjusted. Since the human eye's perception of brightness is an integral of the brightness over a period of time, at a fixed brightness, the longer the light-emitting time, the brighter the human eye feels. Therefore, adjusting the light-emitting time of the pixel is also equivalent to adjusting the light-emitting brightness of the pixel, thereby achieving brightness compensation in the deformation region.
- the frequency of the driving voltage signal can be made higher (for example, above 200 Hz), so that the human eye can be prevented from perceiving the flicker phenomenon.
- the processor 240 may be configured to determine whether the drift amount of the characteristic curve of the driving transistor is greater than a threshold value (or referred to as a drift amount threshold value), and when the drift amount is greater than the threshold value, adjust according to the drift amount The voltage value or duty ratio of the driving voltage signal.
- the threshold may range from 0.001V to 0.01V.
- the threshold may be 0.003V.
- the threshold can be determined according to actual needs.
- the degree of bending of the deformation region is not large, resulting in a small amount of drift in the characteristic curve of the driving transistor.
- the drift amount does not exceed the threshold.
- the drift of the emission luminance is not large, so the voltage value or the duty ratio of the driving voltage signal may not be adjusted.
- the brightness compensation can be achieved by adjusting the voltage value or the duty ratio of the driving voltage signal.
- the processor 240 may be configured to obtain the change (eg, increase or decrease) of the driving current flowing from the driving transistor according to the drift amount of the characteristic curve of the driving transistor.
- the processor may pre-store the correspondence between the drift amount of the characteristic curve and the change of the driving current.
- different drift amounts may correspond to different increases or decreases in drive current.
- the processor 240 can obtain the change of the driving current according to the drift amount of the characteristic curve of the driving transistor.
- the processor 240 is further configured to increase the voltage value or duty cycle of the driving voltage signal when the driving current decreases, and decrease the voltage value or duty of the driving voltage signal when the driving current increases Air ratio.
- the processor can obtain the variation of the driving current that drives the light emitting device (eg, OLED) to emit light according to the drift amount of the characteristic curve.
- the driving current that drives the light emitting device (eg, OLED) to emit light according to the drift amount of the characteristic curve.
- the processor can obtain the variation of the driving current that drives the light emitting device (eg, OLED) to emit light according to the drift amount of the characteristic curve.
- the voltage value or duty ratio of the driving voltage signal when the driving current is reduced it is possible to increase the luminous brightness when the luminous brightness of the light emitting device of the deformation region is reduced.
- By reducing the voltage value or the duty ratio of the driving voltage signal when the driving current is increased it is possible to reduce the light emitting luminance when the light emitting luminance of the light emitting device in the deformation region increases. This can achieve uniform light emission throughout the deformation zone.
- the processor 240 may be further configured to determine the number of times the deformation zone is bent according to the number of times the resistance change occurs, and obtain the drift of the characteristic curve according to the degree of bending of the deformation zone and the number of times the amount.
- the drift of the characteristic curve of the driving transistor may be related not only to the bending degree of the deformation region, but also to the bending number of the deformation region.
- the drift of the characteristic curve is a process of gradually drifting with the increase of the number of bending. Therefore, in this embodiment, the processor can record the number of bending times of the deformation area according to the number of occurrences of the resistance change amount (ie, the number of resistance change). For example, the resistance of the resistance sensitive element changes once, and the processor records the deformation zone (or the driving transistor of the deformation zone) bending once.
- the processor may pre-store a correspondence table between the degree of bending, the number of bending times and the drift of the characteristic curve. After obtaining the bending degree and the number of bending times of the deformation zone, the processor obtains the drift amount of the characteristic curve by querying the table.
- FIG. 3A is a top view showing a folding display screen according to an embodiment of the present disclosure.
- the folding display screen includes a deformation area (for example, a folding area) 310 and rigid body areas 320 on both sides of the deformation area 310.
- the aforementioned resistance-sensitive member is disposed in the structural layer of the deformation region.
- FIG. 3B is a schematic cross-sectional view showing a structure of a folding display screen taken along line A-A' in FIG. 3A according to an embodiment of the present disclosure.
- the folding display screen includes a display panel 331, a resistance sensitive member 332 on the display panel 331, and other structural layers 333 covering the resistance sensitive member 332.
- the other structural layer 333 includes a touch layer and the like.
- the resistance-sensitive element 332 is located at the deformation region 310. When the deformation zone is bent or folded, the resistance-sensitive member bends. The resistance sensor 332 changes its resistance due to the change of the compressive stress or tensile stress when it is bent.
- the compensation device may include a detection circuit 220 and a processor 240.
- the driving transistor 260 is also shown in FIG. 4.
- the detection circuit 220 may include a Huygens bridge circuit 221, a current-voltage conversion circuit (abbreviated as I/V conversion circuit) 222, and an analog-to-digital conversion circuit 223.
- the Huygens bridge circuit 221 may include a resistance-sensitive member 332.
- the Huygens bridge circuit 221 is configured to generate a bridge current I when the resistance sensitive element 332 is deformed. Furthermore, the Huygens bridge circuit 221 transmits the bridge current I to the current-voltage conversion circuit 222.
- the Huygens bridge circuit 221 may further include a first resistor R1, a second resistor R2, and a third resistor R3.
- the first end of the first resistor R1, the first end of the second resistor R2, and one end (eg, the negative terminal) of the power supply 2211 are electrically connected.
- the first end of the third resistor R3, one end of the resistance sensitive member 332, and the other end (eg, positive terminal) of the power supply 2211 are electrically connected.
- the second end of the first resistor R1, the second end of the second resistor R2, the second end of the third resistor R3 and the other end of the resistance sensor 332 are electrically connected and converted with the current voltage
- the input terminal of the circuit 222 is electrically connected.
- the resistances of the first resistor R1, the second resistor R2, and the third resistor R3 are all known resistances.
- the resistance-sensitive member bends, the resistance of the resistance-sensitive member changes, and the balance of the Huygens bridge circuit is broken, so that a current I is generated. And the current I is transmitted to the input terminal of the current-voltage conversion circuit 222.
- the power supply 2211 may be provided as an external power supply outside the Huygens bridge circuit, or as an internal power supply inside the Huygens bridge circuit.
- the current-voltage conversion circuit 222 is configured to convert the bridge current I into an analog voltage amount. In addition, the current-voltage conversion circuit 222 transmits the analog voltage to the analog-to-digital conversion circuit 223.
- the analog-to-digital conversion circuit 223 is configured to convert the analog voltage amount into a digital amount, and transmit the digital amount to the processor 240.
- This digital quantity represents the amount of resistance change of the resistance sensor 332.
- the acquisition of the resistance change amount of the resistance sensitive member is realized.
- the processor 240 adjusts the voltage value or the duty ratio of the driving voltage signal output to the driving transistor 260 according to the resistance change amount. This realizes the compensation of the brightness of the deformation zone, so that the light emission of the deformation zone is more uniform.
- FIG. 5 is a characteristic diagram illustrating a driving transistor according to an embodiment of the present disclosure.
- Figure 5 shows several characteristic curves. Each characteristic curve corresponds to a driving transistor.
- the abscissa of the characteristic curve is the gate voltage (ie, driving voltage) V G of the driving transistor, and the ordinate is the source-drain current of the driving transistor (ie, the driving current driving the light emitting device (eg, OLED) to emit light) I DS .
- the characteristic curve may drift left or right after being bent or folded several times in the deformation zone.
- the processor adjusts the voltage value or the duty ratio of the driving voltage signal, so that the drift characteristic curve returns to the original position, that is, the brightness compensation is realized.
- the resistance-sensitive member includes a piezoelectric thin-film structure layer.
- the structure of the piezoelectric thin film structure layer can refer to FIG. 6.
- the resistance sensitive member 332 may include a first electrode layer 3321, a second electrode layer 3322, a first OCA (Optically Clear Adhesive) layer 3323, a second OCA layer 3324, and a piezoelectric Thin film layer 3325.
- the first OCA layer 3323 and the second OCA layer 3324 are between the first electrode layer 3321 and the second electrode layer 3322.
- the piezoelectric thin film layer 3325 is between the first OCA layer 3323 and the second OCA layer 3324.
- the material of the first electrode layer 3321 and the second electrode layer 3322 may be ITO (Indium Tin Oxide).
- the first electrode layer 3321 may serve as one end of the resistance-sensitive member
- the second electrode layer 3322 may serve as the other end of the resistance-sensitive member.
- the resistance sensitive element adopts the form of a piezoelectric thin film structure layer.
- the piezoelectric thin film structure layer When the piezoelectric thin film structure layer is bent, its resistance will change. For example, the greater the degree of bending of the piezoelectric thin-film structure layer, the greater the stress it bears, and the more obvious the corresponding piezoelectric effect. In this case, the resistance of the piezoelectric thin-film structure layer changes accordingly.
- the proportional relationship between the resistance change amount and the bending degree can be determined by the actually measured bending degree-resistance change curve.
- the resistance sensitive member may include a layer of piezoresistive material.
- the material of the piezoresistive material layer is a composite material with piezoresistive properties, which mainly includes resin and metalized fibers dispersed in the resin. When the layer of piezoresistive material bends, the resistance of the layer of piezoresistive material changes.
- a display screen is also provided.
- the display screen may include a compensation device as described above (for example, the compensation device shown in FIG. 2 or FIG. 4).
- the display screen may be a folding display screen, and the deformation area may include a folding area.
- a display device may include a display screen as described above (eg, a folding display screen).
- the display device may be any product or component with a display function such as a display, a mobile phone, a tablet computer, a notebook computer, a television or a navigator.
- the compensation method may include steps S702 to S706.
- step S702 the resistance change amount of the resistance sensitive member provided in the deformation area of the display screen is detected.
- the resistance of the resistance-sensitive member changes.
- this step S702 may include: using a Huygens bridge circuit to generate a bridge current when the resistance-sensitive component is deformed; converting the bridge current into an analog voltage; and the analog voltage Convert to digital.
- the digital quantity represents the resistance change amount.
- step S704 the drift amount of the characteristic curve of the driving transistor in the deformation region is obtained according to the resistance change amount.
- this step S704 may include: obtaining the degree of bending of the deformation region according to the resistance change amount; and obtaining the amount of drift of the characteristic curve of the driving transistor in the deformation region according to the degree of bending.
- this step S704 may include: obtaining the bending degree of the deformation zone according to the resistance change amount, and determining the number of times the deformation zone is bent according to the number of occurrences of the resistance change amount; and obtaining according to the bending degree and the number of times The drift amount of the characteristic curve of the driving transistor in this deformation region.
- step S706 the driving voltage signal output to the driving transistor is adjusted according to the amount of drift.
- this step S706 may include adjusting the voltage value or the duty cycle of the driving voltage signal output to the driving transistor according to the drift amount.
- the voltage value of the driving voltage signal By adjusting the voltage value of the driving voltage signal, the gate-source voltage of the driving transistor can be adjusted, thereby adjusting the light emission brightness of the deformation region.
- the duty ratio of the driving voltage signal By adjusting the duty ratio of the driving voltage signal, the light-emitting time of the pixels in the deformation area is adjusted. Both of these methods can achieve brightness compensation in the deformation area, so that the light emission in the deformation area is more uniform.
- the step of adjusting the voltage value or the duty ratio of the driving voltage signal according to the drift amount may include: determining whether the drift amount of the characteristic curve is greater than the threshold value; and if the drift amount is greater than the threshold value, according to the drift amount Adjust the voltage value or duty cycle of the drive voltage signal.
- the step of adjusting the voltage value or the duty cycle of the driving voltage signal according to the drift amount may include: obtaining a change in the driving current flowing from the driving transistor according to the drift amount; increasing when the driving current decreases The voltage value or duty ratio of the large driving voltage signal; and when the driving current increases, the voltage value or duty ratio of the driving voltage signal is reduced.
- a compensation method for a display screen has been provided.
- the resistance change amount of the resistance-sensitive member provided in the deformation region of the display screen is detected.
- the drift amount of the characteristic curve of the driving transistor in the deformation region is obtained according to the resistance change amount.
- the driving voltage signal output to the driving transistor is adjusted according to the drift amount. By adjusting the driving voltage signal, the brightness compensation in the deformation area can be achieved, so that the light emission in the deformation area is more uniform.
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Abstract
Description
Claims (20)
- 一种用于显示屏的补偿装置,包括:检测电路,包含设置在显示屏的形变区的电阻敏感件,所述检测电路被配置为检测所述电阻敏感件的电阻变化量,其中,在所述电阻敏感件发生形变时,所述电阻敏感件的电阻发生变化;以及处理器,被配置为根据所述电阻变化量,获得在所述形变区的驱动晶体管的特性曲线的漂移量,并根据所述漂移量,调整输出到所述驱动晶体管的驱动电压信号。
- 根据权利要求1所述的补偿装置,其中,所述检测电路包括:惠更斯电桥电路,包括所述电阻敏感件,被配置为在所述电阻敏感件发生形变的情况下,产生电桥电流;电流电压转换电路,被配置为将所述电桥电流转换成模拟电压量;以及模数转换电路,被配置为将所述模拟电压量转换成数字量,并将所述数字量传输到所述处理器,其中,所述数字量表示所述电阻变化量。
- 根据权利要求2所述的补偿装置,其中,所述惠更斯电桥电路还包括第一电阻器、第二电阻器和第三电阻器;其中,所述第一电阻器的第一端、所述第二电阻器的第一端和电源的一端电连接;所述第三电阻器的第一端、所述电阻敏感件的一端和所述电源的另一端电连接;所述第一电阻器的第二端、所述第二电阻器的第二端、所述第三电阻器的第二端和所述电阻敏感件的另一端电连接,并且与所述电流电压转换电路的输入端电连接。
- 根据权利要求1至3任意一项所述的补偿装置,其中,所述处理器被配置为根据所述电阻变化量获得所述形变区的弯曲程度,并根据所述弯曲程度获得在所述形变区的驱动晶体管的特性曲线的漂移量。
- 根据权利要求1至4任意一项所述的补偿装置,其中,所述处理器被配置为根据所述漂移量调整输出到所述驱动晶体管的驱动电压信号的电压值或占空比。
- 根据权利要求5所述的补偿装置,其中,所述处理器被配置为判断所述特性曲线的漂移量是否大于阈值,在所述漂移量大于所述阈值的情况下,根据所述漂移量调整所述驱动电压信号的电压值或占空比。
- 根据权利要求5或6所述的补偿装置,其中,所述处理器被配置为根据所述漂移量获得从所述驱动晶体管流出的驱动电流的变化情况,在所述驱动电流减小的情况下增大所述驱动电压信号的电压值或占空比,以及在所述驱动电流增大的情况下减小所述驱动电压信号的电压值或占空比。
- 根据权利要求4至7任意一项所述的补偿装置,其中,所述处理器还被配置为根据所述电阻变化量出现的次数确定所述形变区被弯折的次数,并根据所述弯曲程度和所述次数获得所述特性曲线的漂移量。
- 根据权利要求1至8任意一项所述的补偿装置,其中,所述电阻敏感件包括压电薄膜结构层或压阻材料层。
- 根据权利要求1至9任意一项所述的补偿装置,其中,所述电阻敏感件包括第一电极层、第二电极层、第一光学透明粘合剂层、第二光学透明粘合剂层和压电薄膜层,其中,所述第一光学透明粘合剂层和所述第二光学透明粘合剂层在所述第一电极层与所述第二电极层之间,所述压电薄膜层在所述第一光学透明粘合剂层和所述第二光学透明粘合剂层之间。
- 一种显示屏,包括:如权利要求1至10任意一项所述的补偿装置。
- 根据权利要求11所述的显示屏,其中,所述显示屏为折叠显示屏,所述形变区包括折叠区。
- 一种显示装置,包括:如权利要求11或12所述的显示屏。
- 一种用于显示屏的补偿方法,包括:检测设置在显示屏的形变区的电阻敏感件的电阻变化量,其中,在所述电阻敏感件发生形变时,所述电阻敏感件的电阻发生变化;根据所述电阻变化量获得在所述形变区的驱动晶体管的特性曲线的漂移量;以及根据所述漂移量调整输出到所述驱动晶体管的驱动电压信号。
- 根据权利要求14所述的补偿方法,其中,检测所述电阻敏感件的电阻变化量的步骤包括:利用惠更斯电桥电路在电阻敏感件发生形变的情况下产生电桥电流;将所述电桥电流转换成模拟电压量;以及将所述模拟电压量转换成数字量,其中,所述数字量表示所述电阻变化量。
- 根据权利要求14或15所述的补偿方法,其中,根据所述电阻变化量获得在所述形变区的驱动晶体管的特性曲线的漂移量的步骤包括:根据所述电阻变化量获得所述形变区的弯曲程度;以及根据所述弯曲程度获得在所述形变区的驱动晶体管的特性曲线的漂移量。
- 根据权利要求14至16任意一项所述的补偿方法,其中,根据所述漂移量调整输出到所述驱动晶体管的驱动电压信号的步骤包括:根据所述漂移量调整输出到所述驱动晶体管的驱动电压信号的电压值或占空比。
- 根据权利要求17所述的补偿方法,其中,根据所述漂移量调整所述驱动电压信号的电压值或占空比的步骤包括:判断所述特性曲线的漂移量是否大于阈值;以及在所述漂移量大于所述阈值的情况下,根据所述漂移量调整所述驱动电压信号的电压值或占空比。
- 根据权利要求17或18所述的补偿方法,其中,根据所述漂移量调整所述驱动电压信号的电压值或占空比的步骤包括:根据所述漂移量获得从所述驱动晶体管流出的驱动电流的变化情况;在所述驱动电流减小的情况下增大所述驱动电压信号的电压值或占空比;以及在所述驱动电流增大的情况下减小所述驱动电压信号的电压值或占空比。
- 根据权利要求14至19任意一项所述的补偿方法,其中,根据所述电阻变化量获得在所述形变区的驱动晶体管的特性曲线的漂移量的步骤包括:根据所述电阻变化量获得所述形变区的弯曲程度,并根据所述电阻变化量出现的次数确定所述形变区被弯折的次数;以及根据所述弯曲程度和所述次数获得在所述形变区的驱动晶体管的特性曲线的漂移量。
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