Classifications

• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
  • H01J37/32—Gas-filled discharge tubes
  • H01J37/32431—Constructional details of the reactor
  • H01J37/32458—Vessel
  • H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
  • H01J37/32495—Means for protecting the vessel against plasma
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C24/00—Coating starting from inorganic powder
  • C23C24/08—Coating starting from inorganic powder by application of heat or pressure and heat
  • C23C24/082—Coating starting from inorganic powder by application of heat or pressure and heat without intermediate formation of a liquid in the layer
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C24/00—Coating starting from inorganic powder
  • C23C24/08—Coating starting from inorganic powder by application of heat or pressure and heat
  • C23C24/082—Coating starting from inorganic powder by application of heat or pressure and heat without intermediate formation of a liquid in the layer
  • C23C24/085—Coating with metallic material, i.e. metals or metal alloys, optionally comprising hard particles, e.g. oxides, carbides or nitrides
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
  • H01J37/32—Gas-filled discharge tubes
  • H01J37/32431—Constructional details of the reactor
  • H01J37/32458—Vessel
  • H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
  • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
  • H10P72/04—Apparatus for manufacture or treatment
  • H10P72/0402—Apparatus for fluid treatment
  • H10P72/0418—Apparatus for fluid treatment for etching
  • H10P72/0421—Apparatus for fluid treatment for etching for drying etching
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
  • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
• • H—ELECTRICITY
  • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
  • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
  • H10W74/00—Encapsulations, e.g. protective coatings
  • H10W74/01—Manufacture or treatment

Definitions

• the present disclosure relates generally to tools and components for use in a plasma processing chamber apparatus. More specifically, the present disclosure relates to a method for producing a plasma processing chamber component that is resistive to a corrosive plasma environment.
• Semiconductor processing involves a number of different chemical and physical processes whereby minute integrated circuits are created on a substrate. Layers of materials which make up the integrated circuit are created by chemical vapor deposition, physical vapor deposition, epitaxial growth, and the like. Some of the layers of material are patterned using photoresist masks and wet or dry etching techniques.
• the substrate utilized to form integrated circuits may be silicon, gallium arsenide, indium phosphide, glass, or other appropriate material.
• a typical semiconductor processing chamber includes a chamber body defining a process zone, a gas distribution assembly adapted to supply a gas from a gas supply into the process zone, a gas energizer, e.g., a plasma generator, utilized to energize the process gas to process a substrate positioned on a substrate support assembly, and a gas exhaust.
• a gas energizer e.g., a plasma generator
• the energized gas is often comprised of ions and highly reactive species which etches and erodes exposed portions of the processing chamber components, for example, an electrostatic chuck that holds the substrate during processing.
• processing by-products are often deposited on chamber components which are periodically cleaned typically with highly reactive fluorine.
• In-situ cleaning procedures used to remove the processing byproducts from within the chamber body may further erode the integrity of the processing chamber components. Attack from the reactive species during processing and cleaning reduces the lifespan of the chamber components and increase service frequency. Additionally, flakes from the eroded parts of the chamber components may become a source of particulate contamination during substrate processing. Further, trace metals from the base material of a chamber component may leach out of the chamber component and contaminate the substrate. As such, the chamber components are generally replaced after a number of process cycles and before the chamber components provide inconsistent or undesirable properties during substrate processing. However, frequent replacement of chamber components reduces service life of the processing chamber, increases chamber downtime, increases maintenance frequency, and reduces substrate yields
• Embodiments described herein generally relate to a method and apparatus for fabricating a chamber component for a plasma process chamber in one embodiment a chamber component used within a plasma processing chamber is provided that includes a metallic base material comprising a roughened non-planar first surface, wherein the roughened non- planar surface has an Ra surface roughness of between 4 micro-inches and 80 micro-inches, a planar silica coating formed over the roughened non- planar surface, wherein the planar silica coating has a surface that has an Ra surface roughness that is less than the Ra surface roughness of the roughened non-planar surface, a thickness between about 0.2 microns and about 10 microns, less than 1% porosity by volume, and contains less than 2E 12 atoms/centimeters 2 of aluminum
• Figure 1A illustrates a sectional view of one embodiment of a plasma processing chamber component that may be used within a processing chamber.
• Figure 1 B is an enlarged view of the plasma processing chamber component of Figure 1A.
• FIG. 2 schematically illustrates a plasma processing system.
• Figure 3 is a data sheet showing testing of the plasma resistant coating on the chamber component as described herein.
• Figure 1A illustrates a sectional view of one embodiment of a plasma processing chamber component 100 that may be used within a processing chamber.
• Figure 1 B is an enlarged view of the plasma processing chamber component 100 of Figure 1 A.
• the chamber component 100 is shown in Figure 1A as having a rectangular cross-section, for the purposes of discussion it is understood that the chamber component 100 may take the form of any chamber part, including, but not limited to, a chamber body, a chamber body upper liner, a chamber body lower liner, chamber body plasma door, a cathode liner, a chamber lid gas ring, a throttling gate valve spool, a plasma screen, a pedestal, a substrate support assembly, a showerhead, a gas nozzle, and the like.
• the chamber component 100 has at least one exposed surface 114 that is exposed to the plasma environment within the processing chamber when in use.
• the chamber component 100 includes a body 102 having a plasma resistant coating 104 disposed on an outer surface 112 of a non- pianar (roughened) surface 106 of the body 102.
• the plasma resistant coating 104 fills in pits and valleys of the non-planar surface 106 (e.g., planarizes the non-planar surface 106) to create a surface that is much smoother than the non-planar surface 106.
• the body 102 of the chamber component 100 is a metallic material, such as aluminum, stainless steel as well as alloys thereof, or a ceramic material.
• the plasma resistant coating 104 is a silica material (e.g., silicon dioxide (S1O2)) material that is fully crystallized.
• a thickness 116 of the plasma resistant coating 104 is about 0.2 microns (pm) to about 10 pm, or greater.
• the plasma resistant coating 104 has a porosity of less than about 1 % by volume.
• the outer surface 112 is finished to an average surface roughness (Ra) of about 4 micro-inches (p”) to about 80 m”. However, the plasma resistant coating 104 has an Ra less than the Ra of the outer surface 112.
• the plasma resistant coating 104 is applied using techniques such as painting, spreading, or spraying the outer surface 112 with a silica material. Then, the plasma resistant coating 104 is annealed by placing the coated chamber component 100 in a furnace. The heating relieves surface tension in the plasma resistant coating 104 which makes the plasma resistant coating 104 conformal or flat as well as smooth. The heating may be at a temperature of about 200 degrees Celsius, or less. The heating may be performed for about one hour.
• FIG. 2 schematically illustrates a plasma processing system 200.
• the plasma processing system 200 including a chamber body 225 defining a processing volume 241
• the chamber body 225 includes a sealable slit valve tunnel 224 to allow entry and egress of a substrate 201 from the processing volume 241.
• the chamber body 225 includes sidewalls 226 and a lid 243.
• the sidewalls 226 and lid 243 may be fabricated from metals or ceramic materials and include the plasma resistant coating 104 as described herein.
• the plasma processing system 200 further comprises an antenna assembly 270 disposed over the lid 243 of the chamber body 225.
• a radio frequency (RF) power source 215 and a matching network 217 are coupled to the antenna assembly 270 to provide energy for plasma generation.
• RF radio frequency
• the antenna assembly 270 comprises one or more coil antennas disposed coaxial with an axis of symmetry 273 (e.g. a longitudinal axis) of the plasma processing system 200.
• the plasma processing system 200 includes an outer coil antenna 271 and an inner coil antenna 272 disposed over the lid 243.
• the coil antennas 271 , 272 may be independently controlled. It should be noted, even though two coaxial antennas are described in the plasma processing system 200, other configurations, such as one coil antenna, three or more coil antenna configurations may be contemplated.
• the inner coil antenna 272 includes one or more electrical conductors wound as a spiral with small pitch and forming an inner antenna volume 274.
• a magnetic field establishes in an inner antenna volume 274 of the inner coil antenna 272 when an electrical current goes through the one or more electrical conductors.
• embodiments of the present disclosure provide a chamber extension volume within the inner antenna volume 274 of the inner coil antenna 272 to generate plasma using the magnetic field in the inner antenna volume 274.
• the inner coil antenna 272 and the outer coil antenna 271 may have other shapes according to application, for example to match a certain shape of a chamber wall, or to achieve symmetry or asymmetry within the chamber body 225.
• the inner coil antenna 272 and the outer coil antenna 271 may form inner antenna volumes in the shape of hyper-rectangle.
• the plasma processing system 200 further includes a substrate support 240 disposed in the processing volume 241.
• the substrate support 240 supports the substrate 201 during processing.
• the substrate support 240 is an electrostatic chuck.
• a bias power source 220 and a matching network 221 may be connected to the substrate support 240.
• the bias power source 220 provides bias potential to a plasma generated in the processing volume 241.
• the substrate support 240 is surrounded by a ring-shaped cathode liner 256.
• a plasma containment screen or baffle 252 covers the top of the cathode liner 256 and covers a peripheral portion of the substrate support 240.
• the substrate support 240 may contain materials that are incompatible or vulnerable to a corrosive plasma processing environment, and the cathode liner 256 and the baffle 252 isolate substrate support 240 from the plasma and contain the plasma within the processing volume 241 , respectively.
• the cathode liner 256 and baffles 252 may include a high purity plasma resistant coating 104 that is resistive to the plasma contained within the processing volume 241.
• the plasma resistant coating 104 on the cathode liner 256 and baffles 252 as described above improves the service life of the cathode liner 256 and baffles 252.
• a plasma screen 250 is disposed on top of the substrate support 240 to control the spatial distribution of charged and neutral species of the plasma across the surface of the substrate 201.
• the plasma screen 250 includes a substantially flat member electrically isolated from the chamber walls and comprises a plurality of apertures that vertically extend through the flat member.
• the plasma screen 250 may include a high purity plasma resistant coating 104 as described above which resists the process environment within the processing volume 241.
• the lid 243 has an opening 244 to allow entrance of one or more processing gases.
• the opening 244 may be disposed near a center axis of the plasma processing system 200 that corresponds to the center of the substrate 201 being processed
• the plasma processing system 200 includes a chamber extension 251 disposed over the lid 243 covering the opening 244.
• the chamber extension 251 is disposed inside a coil antenna of the antenna assembly 270.
• the chamber extension 251 defines an extension volume 242 in fluid communication with the processing volume 241 via the opening 244.
• the plasma processing system 200 includes a gas distribution showerhead shown as a baffle nozzle assembly 255 disposed adjacent to the opening 244 in the processing volume 241 and the extension volume 242.
• the baffle nozzle assembly 255 directs one or more processing gases into the processing volume 241 through the extension volume 242.
• the baffle nozzle assembly 255 has a by-pass path allowing a processing gas to enter the processing volume 241 without going through the extension volume 242.
• the baffle nozzle assembly 255 may be fabricated from aluminum and include the plasma resistant coating 104 as described above.
• extension volume 242 is within the inner antenna volume 274, processing gas in the extension volume 242 is exposed to the magnetic field of the inner coil antenna 272 prior to entering the processing volume 241.
• the usage of the extension volume 242 increases the plasma intensity within the processing volume 241 without an increase in power applied to the inner coil antenna 272 or the outer coil antenna 271.
• the plasma processing system 200 includes a pump 230, and a throttle valve 235 to provide vacuum and exhaust the processing volume 241.
• the throttle valve 235 may include a gate valve spool 254.
• the gate valve spool 254 may be fabricated from aluminum.
• the plasma processing system 200 further includes a chiller 245 to control the temperature of the plasma processing system 200.
• the throttle valve 235 may be disposed between the pump 230 and the chamber body 225 and may be operable to control pressure within the chamber body 225.
• the plasma processing system 200 also includes a gas delivery system 202 to provide one or more processing gases to the processing volume 241.
• the gas delivery system 202 is located in a housing 205 disposed directly adjacent to, such as under, the chamber body 225.
• the gas is located in a housing 205 disposed directly adjacent to, such as under, the chamber body 225.
• delivery system 202 selectively couples one or more gas sources located in one or more gas panels 204 to the baffle nozzle assembly 255 to provide process gases to the chamber body 225.
• the gas delivery system 202 is connected to the baffle nozzle assembly 255 to provide gases to the processing volume 241.
• the housing 205 is located in close proximity to the chamber body 225 to reduce gas transition time when changing gases, minimize gas usage, and minimize gas waste.
• the plasma processing system 200 further includes a lift system 227 for raising and lowering the substrate support 240 that supports the substrate 201 in the chamber body 225.
• the chamber body 225 is protected by a lower liner 222 and an upper liner 223 which may be aluminum and include the plasma resistant coating 104 as described above.
• the gas delivery system 202 may be used to supply at least two different gas mixtures to the chamber body 225 at an instantaneous rate as further described below.
• the plasma processing system 200 may include a spectral monitor operable to measure the depth of an etched trench and a deposited film thickness as the trench is being formed in the chamber body 225, with the ability to use other spectral features to determine the state of the reactor.
• the plasma processing system 200 may accommodate a variety of substrate sizes, for example a substrate diameter of up to about 300 m or greater.
• FIG. 1 is a data sheet 300 showing testing of the plasma resistant coating 104 on the chamber component 100.
• the testing of the plasma resistant coating 104 showed low levels of trace metals in or on the plasma resistant coating 104. This evidences that the plasma resistant coating 104 effectively blocks metal atoms from the body 102 of the chamber component 100 from leaching into the coating 104.
• aluminum concentration in the plasma resistant coating 104 was less than about 2E 12 atoms/centimeter squared (atoms/cm 2 ). Many other trace metals were present in or on the plasma resistant coating 104 but were below critical levels.
• the disclosed process chamber and components thereof may be used in one or more substrate processing operations.
• the below description provides one such exemplary process, but other processes are contemplated.
• a process chamber such as the chamber body 225
• a H2 plasma without a substrate placed therein.
• the plasma treatment of the chamber body 225 prior to introducing a substrate to the chamber may be referred to as Plasma Every Wafer (PEW).
• PEW Plasma Every Wafer
• the plasma treating of the process chamber, or PEW may include introducing one or more gases, such as O 2 , N 2 , N H3, Ar, H 2 , He, or combinations thereof, into the chamber body 225, and energizing the one or more gases to form a plasma.
• PEW' may include introducing a plasma containing radicals and/or ions of oxygen, nitrogen, hydrogen, ammonia, hydroxide or combination thereof into the chamber body 225, and the plasma is formed in a remote plasma source outside of the chamber body 225.
• N H3 and Ar gases are introduced into the chamber body 225.
• 0 2 and H 2 gases are introduced into the chamber body 225.
• 0 2 and Ar gases are introduced into the chamber body 225.
• 0 2 gas is introduced into the chamber body 225.
• N 2 gas is introduced into the chamber body 225.
• the plasma treatment of the chamber body 225 prior to introducing the substrate involves introducing or forming a plasma containing oxygen or nitrogen in the process chamber.
• the one or more gases are energized by an RF power source.
• the RF power may be pulsed at 2% to 70% duty cycle and may range from about 100 W to about 2500 W.
• the RF power may be a continuous wave ranging from about 100 W to about 2500 W.
• the chamber body 225 may have a chamber pressure ranging from about 10 milli Torr (mT) to about 200 mT during the plasma treatment of the chamber body 225.
• the process temperature which may be the temperature of the substrate support pedestal, such as the substrate support 240, may range from 20 degrees C to about 500 degrees C.
• a substrate is treated by a hydrogen containing plasma within the chamber body 225.
• the hydrogen-containing plasma treatment of the substrate may include introducing a hydrogen containing gas, such as H 2 gas, or a hydrogen containing gas and an inert gas, such as Ar gas, into the chamber body 225, and energizing the H 2 gas or H 2 /Ar gases to form a hydrogen containing plasma.
• Ar gas may be added to the H 2 gas in order to improve the service lifetime of the chamber body 225 (further mitigating the hydrogen containing plasma attack of components inside the chamber body 225) and to modulate the H* radical concentrations in some embodiments, the H 2 gas or H 2 /Ar gases are energized by an RF power source, such as the RF power source 215.
• the RF power may be pulsed at 2% to 60% duty cycle and may range from about 100 W to about 2500 W.
• the RF power may be a continuous wave ranging from about 100 W to about 2500 W.
• the chamber body 225 may have a chamber pressure ranging from about 10 mT to about 200 mT during the hydrogen containing plasma treatment of the substrate.
• the process temperature which may be the temperature of the substrate support, may range from 20 °C to about 500 °C.
• the substrate may be treated by the hydrogen containing plasma for about 10 to 360 seconds.
• the chamber pressure is about 100 mT
• the H 2 gas is flowed into the chamber body 225 at about 25 standard cubic centimeters per minute (seem) and Ar gas is flowed into the chamber body 225 at about 975 seem
• the RF power is about 500 W
• the process temperature is about 400 degrees C
• the substrate is treated by the hydrogen containing plasma for about 30 to 90 seconds.
• the substrate may be removed from the chamber body 225.

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• 2019
  • 2019-05-21 WO PCT/US2019/033259 patent/WO2019240915A1/en not_active Ceased
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