WO2019075663A1 - 电连接装置及测试机台 - Google Patents

电连接装置及测试机台 Download PDF

Info

Publication number
WO2019075663A1
WO2019075663A1 PCT/CN2017/106702 CN2017106702W WO2019075663A1 WO 2019075663 A1 WO2019075663 A1 WO 2019075663A1 CN 2017106702 W CN2017106702 W CN 2017106702W WO 2019075663 A1 WO2019075663 A1 WO 2019075663A1
Authority
WO
WIPO (PCT)
Prior art keywords
tested
workpiece
electrical connection
connection device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2017/106702
Other languages
English (en)
French (fr)
Inventor
董晓雪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Royole Technologies Co Ltd
Original Assignee
Shenzhen Royole Technologies Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Royole Technologies Co Ltd filed Critical Shenzhen Royole Technologies Co Ltd
Priority to CN201780092156.9A priority Critical patent/CN110785802A/zh
Priority to PCT/CN2017/106702 priority patent/WO2019075663A1/zh
Publication of WO2019075663A1 publication Critical patent/WO2019075663A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes

Definitions

  • the present invention relates to the field of detection technology, and in particular, to an electrical connection device and a test machine.
  • the display panel needs to be tested during the production process, and the test machine platform includes a connector, the connector includes a first pad, and the display panel is formed with a second pad, and the first pad is aligned with the second pad by crimping A test machine and a display panel are connected to apply a test signal to the display panel.
  • the first pad and the second pad are crimped, it is easy to slide the misalignment or the virtual connection, resulting in an error in the test result and low accuracy of the test.
  • embodiments of the present invention provide an electrical connection device and a test machine.
  • An electrical connection device for connecting to a workpiece to be tested includes a first connection surface and a test area formed on the first connection surface, the test area includes a plurality of a pad
  • the electrical connection device comprising a flexible circuit board disposed opposite the workpiece to be tested, the flexible circuit board including a second connection face opposite the first connection face and from the second connection a plurality of arcuate elastic electrodes protruding toward the first connecting surface, the arcuate elastic electrodes being pressed against the test area when being pressed while crimping the electrical connecting device and the workpiece to be tested
  • the plurality of arcuate elastic electrodes are connected to the plurality of pads in one-to-one correspondence.
  • the flexible circuit board is made of a polyimide or polyester film.
  • an orthographic projection of the curved resilient electrode on the first connecting surface falls within the test area.
  • the curved elastic electrode protrudes from the second connecting face toward the first connecting face and is bent toward a side of the flexible circuit board.
  • the curved resilient electrode comprises a resilient piece.
  • the curved elastic electrode is made of copper.
  • a testing machine is used for testing a workpiece to be tested, and the testing machine includes:
  • a support table for supporting the workpiece to be tested
  • the electrical connection device is disposed on the indenter and located between the indenter and the component to be tested, and the indenter is used to crimp the electrical device Connecting the device and the workpiece to be tested.
  • the workpiece to be tested includes a display panel.
  • the support table includes an upper surface, and the upper surface is formed with a positioning groove for receiving and positioning the workpiece to be tested.
  • the ram includes a lower surface opposite the upper surface, the electrical connection device is attached to the lower surface, and the second attachment surface is opposite the lower surface.
  • the indenter includes a gripping device that includes a vacuum gripping device.
  • the test machine includes a slide bar coupled to the ram for driving the ram movement.
  • the test machine includes an alignment detecting device for detecting whether the curved elastic electrode and the pad are aligned accurately.
  • the arc-shaped elastic electrode is deformed by force to be pressed against the test area to be connected to the pad of the workpiece to be tested.
  • the connection between the curved elastic electrode and the pad is more stable, and the problem of sliding misalignment or virtual connection during the crimping can be avoided, thereby avoiding affecting the test result and improving the accuracy of the test.
  • FIG. 1 is a schematic perspective view of a test machine according to an embodiment of the present invention.
  • FIG. 2 is a schematic perspective view of a workpiece to be tested according to an embodiment of the present invention
  • FIG. 3 is a perspective view of an electrical connection device according to an embodiment of the present invention.
  • FIG. 4 is a schematic plan view showing the working state of the electrical connecting device and the workpiece to be tested according to the embodiment of the present invention.
  • Test machine 100 electrical connection device 10, flexible circuit board 12, second connection surface 122, curved elastic electrode 124, support table 20, positioning groove 22, indenter 30, slide bar 40, alignment detecting device 50, The workpiece 200, the first connection surface 210, the test area 220, and the pads 222 are tested.
  • first and second are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated.
  • features defining “first” or “second” may include one or more of the described features either explicitly or implicitly.
  • connection In the description of the present invention, it should be noted that the terms “installation”, “connected”, and “connected” are to be understood broadly, and may be fixed or detachable, for example, unless otherwise explicitly defined and defined. Connected, or integrally connected; may be mechanically connected, may be electrically connected or may communicate with each other; may be directly connected, or may be indirectly connected through an intermediate medium, may be internal communication of two elements or interaction of two elements relationship.
  • Connected, or integrally connected may be mechanically connected, may be electrically connected or may communicate with each other; may be directly connected, or may be indirectly connected through an intermediate medium, may be internal communication of two elements or interaction of two elements relationship.
  • the specific meanings of the above terms in the present invention can be understood on a case-by-case basis.
  • the first feature "on” or “under” the second feature may include direct contact of the first and second features, and may also include first and second features, unless otherwise specifically defined and defined. It is not in direct contact but through additional features between them.
  • the first feature "above”, “above” and “above” the second feature includes the first feature directly above and above the second feature, or merely indicating that the first feature level is higher than the second feature.
  • the first feature “below”, “below” and “below” the second feature includes the first feature directly below and below the second feature, or merely the first feature level being less than the second feature.
  • the electrical connection device 10 of the embodiment of the present invention can be used for testing the machine table 100 and for connecting with the workpiece 200 to be tested.
  • the test machine 100 includes an electrical connection device 10.
  • the workpiece 200 to be tested includes a first connection surface 210 and a test area 220 formed on the first connection surface 210.
  • Test area 220 includes a plurality of pads 222.
  • the electrical connection device 10 of the embodiment of the present invention includes a workpiece disposed opposite to the workpiece 200 to be tested.
  • the flexible circuit board 12 includes a second connection surface 122 opposite to the first connection surface 210 and a plurality of curved elastic electrodes 124 protruding from the second connection surface 122 toward the first connection surface 210.
  • the curved elastic electrode 124 is used to be pressed against the test area 220 when the electrical connection device 10 and the workpiece 200 to be tested are crimped.
  • the plurality of curved elastic electrodes 124 are connected to the plurality of pads 222 in one-to-one correspondence.
  • the curved elastic electrode 124 is deformed against the test area 220 to be connected to the pad 222 of the workpiece 200 to be tested.
  • the connection between the curved elastic electrode 124 and the pad 222 is more stable, and the problem of sliding misalignment or virtual connection during the crimping can be avoided, thereby avoiding affecting the test result and improving the accuracy of the test.
  • the electrical connection device 10 and the test machine 100 provided by the embodiments of the present invention can be used for testing of electronic products, and the workpiece 200 to be tested can be an electronic product or a component of an electronic product.
  • the workpiece 200 to be tested can be a component of a display panel or display panel.
  • the electrical connection device 10 and the test machine 100 can be used for the lighting test of the workpiece 200 to be tested.
  • the workpiece 200 to be tested is a diced Active-Matrix Organic Light Emitting Diode (AMOLED) display panel.
  • AMOLED Active-Matrix Organic Light Emitting Diode
  • the quality of the lighting control panel is the key link in the production process of the display panel.
  • the cut display panel is to be tested for lighting.
  • the test apparatus 100 connected to the electrical connection device 10 sequentially transmits signals to the arc-shaped elastic electrodes 124 of the electrical connection device 10 and the pads 222 of the display panel, thereby lighting the display panel for detection.
  • the workpiece 200 to be tested may also be other types of display panels, such as a liquid crystal display (LCD) display panel, a light emitting diode (LED) display panel, and an organic light emitting diode (Organic).
  • LCD liquid crystal display
  • LED light emitting diode
  • Organic organic light emitting diode
  • OLED Light Emitting Diode
  • the electrical connection device 10 and the test machine 100 may not be limited to the embodiments discussed above, but may be applied to other test situations as needed.
  • the application of the electrical connection device 10 should not be limited to the test machine 100, and may be applied to other suitable applications in other embodiments.
  • the electrical connection device 10 can be directly applied to electronic products as components of electronic products, so that the electrical connection between the internal components of the electronic products is more stable and reliable, thereby improving the quality of the electronic products.
  • the flexible circuit board 12 is fabricated from a polyimide or polyester film.
  • the flexible circuit board 12 made of polyimide or polyester film is flexible, and the technology is mature, the material is easy to obtain, and the cost is low.
  • the flexible circuit board 12 may not be limited to the above embodiment, but in other embodiments, it may be selected according to requirements. Use other suitable substrates.
  • the orthographic projection of the curved resilient electrode 124 on the first attachment surface 210 falls within the test area 220.
  • the orthographic projection of the curved resilient electrode 124 on the first connecting surface 210 falls within the test area 220.
  • the curved resilient electrode 124 can be aligned accurately with the pad 222 in the test area 220.
  • the curved resilient electrode 124 it is generally necessary to align the curved resilient electrode 124 with the pad 222 prior to testing.
  • the orthographic projection of the curved resilient electrode 124 on the first attachment surface 210 falls within the test area 220 to align the curved resilient electrode 124 with the pad 222.
  • the alignment is accurate and the pressure head 30 is pressed down to perform pressure bonding, it can be ensured that the plurality of arc-shaped elastic electrodes 124 are connected to the plurality of pads 222 in one-to-one correspondence without being short-circuited.
  • the arcuate resilient electrode 124 protrudes from the second attachment surface 122 toward the first connection surface 210 and is curved toward the sides of the flexible circuit board 12.
  • the curved arcuate resilient electrode 124 is coupled to the pad 222 in the test region 220 on the first connection surface 210.
  • the curved resilient electrode 124 includes a resilient piece.
  • the elastic properties of the shrapnel are good.
  • the indenter 30 presses the curved elastic electrode 124 against the test area 220.
  • the curved elastic electrode 124 is subjected to a large deformation by force, so that the connection of the curved elastic electrode 124 to the pad 222 in the test area 220 is more stable. In this way, the problem of sliding misalignment or virtual connection during crimping can be avoided.
  • the curved resilient electrode 124 is fabricated from a copper material.
  • the copper material has good electrical conductivity and does not oxidize in dry air. As such, the service life of the curved elastic electrode 124 can be extended.
  • the raw material of the curved elastic electrode 124 may not be limited to the above embodiment, and in other embodiments, other suitable materials may be employed as needed.
  • the test machine 100 of the embodiment of the present invention includes a support table 20 for supporting the workpiece 200 to be tested, a pressure head 30 disposed opposite the support table 20, and an electrical connection device 10.
  • the electrical connection device 10 is disposed on the ram 30 and between the ram 30 and the workpiece 200 to be tested.
  • the ram 30 is used to crimp the electrical connection device 10 and the workpiece 200 to be tested.
  • testing machine 100 is used to test whether the workpiece 200 to be tested can work normally. Specifically, the test machine 100 determines whether the workpiece 200 to be tested can work normally by the connection conduction result of the electrical connection device 10 and the workpiece 200 to be tested.
  • the workpiece 200 to be tested includes a display panel.
  • test machine 100 can be used to detect whether the display panel has a display abnormality. Through the lighting test, it is possible to screen out defective products that display abnormalities. The relevant staff analyzed the cause of the abnormality of the defective product to find the corresponding solution, thereby improving the product yield.
  • the terminal leads are provided on the pads 222 of the display panel.
  • the curved elastic electrode 124 is pressed against the test area 220.
  • the curved elastic electrode 124 is force-induced to be deformed to be connected to the terminal lead on the pad 222 for a lighting test to illuminate the display panel.
  • the support table 20 includes an upper surface with a positioning groove 22 formed therein.
  • the positioning slot 22 is configured to receive and position the workpiece 200 to be tested.
  • the workpiece to be tested 200 is placed in the positioning groove 22, and the workpiece 200 to be tested is received and positioned in the positioning groove 22. In this way, the workpiece 200 to be tested is prevented from moving, and the electrical connection device 10 is conveniently connected to the connection, and the test signal is input.
  • the size of the positioning groove 22 can be made according to the size of the workpiece 200 to be tested.
  • the indenter 30 includes a lower surface opposite the upper surface, the flexible circuit board 12 is attached to the lower surface, and the second attachment surface 122 is opposite the lower surface.
  • the flexible circuit board 12 is attached to the lower surface of the indenter 30 and the second connecting surface 122 is opposite to the lower surface, and the flexible circuit board 12 can be connected to the workpiece 200 to be tested accommodated in the positioning groove 22 of the support table 20.
  • the indenter 30 includes a gripping device (not shown) that includes a vacuum gripping device.
  • the clamping device clamps the flexible circuit board 12 to the lower surface of the indenter 30.
  • the negative pressure clamping device enables flexible clamping to avoid damage to the flexible circuit board 12.
  • the ram 30 and the flexible circuit board can be connected by fasteners.
  • the fastener can be a fastening screw.
  • the lower surface of the ram 30 is provided with a screw hole
  • the flexible circuit board 12 is provided with a through hole. The fastening screw penetrates the through hole through the through hole to fix the flexible circuit board 12 to the lower surface of the ram 30.
  • the test machine 100 includes a slide bar 40 coupled to the ram 30.
  • the slide bar 40 is used to drive the ram 30 to move.
  • the slide bar 40 drives the ram 30 to move down to connect the curved elastic electrode 124 and the pad 222.
  • the ram 30 can move up and down along the slide bar 40.
  • the test machine 100 controls the slide bar 40 to drive the ram 30 to move up and down by the control system.
  • the control system controls the slide bar 40 to drive the ram 30 down to connect the electrical connection device 10 with the workpiece 200 to be tested.
  • the control system controls the slide bar 40 to drive the ram 30 up, and then fixes the ram 30 at a certain distance from the support table 20.
  • the test machine 100 includes an alignment detection device 50.
  • the alignment detecting device 50 is for detecting whether the curved elastic electrode 124 and the pad 222 are aligned accurately.
  • the arcuate resilient electrode 124 on the flexible circuit board 12 and the pad 222 of the workpiece 200 to be tested are to be aligned during testing.
  • the alignment detecting device 50 detects whether the curved elastic electrode 124 and the pad 222 are aligned accurately. If the alignment is not accurate, the alignment detecting device 50 adjusts to make the final alignment accurate. After the alignment is completed, the indenter 30 is pressed down to make more The arc-shaped elastic electrodes 124 and the plurality of pads 222 are connected in one-to-one correspondence, and the input signals are tested by the workpiece to be tested 200.
  • the alignment detecting device 50 includes a CCD lens and a registration calibration unit.
  • the curved elastic electrode 124 is aligned with the pad 222, and the CCD lens acquires the alignment state information and transmits the alignment state information to the alignment calibration unit.
  • the alignment calibration unit determines whether the alignment is accurate. If the alignment is not correct, the alignment calibration unit performs calibration until the curved elastic electrode 124 is aligned with the pad 222.
  • the workpiece 200 to be tested is placed in the positioning groove 22, and the electrical connection device 10 is fixed to the lower surface of the ram 30.
  • the alignment detecting device 50 detects whether the curved elastic electrode 124 and the pad 222 are aligned accurately. If the alignment is not accurate, the alignment detecting device 50 adjusts to make the final alignment accurate.
  • the sliding rod 40 drives the indenter 30 to move down, so that the plurality of arc-shaped elastic electrodes 124 and the plurality of pads 222 are connected to conduct, and the test signal is input to test the workpiece 200 to be tested.
  • the curved elastic electrode 124 is deformed against the test area 220 to be connected to the pad 222 of the workpiece 200 to be tested.
  • the connection between the curved elastic electrode 124 and the pad 222 is more stable, and the problem of sliding misalignment or virtual connection during the crimping can be avoided, thereby avoiding affecting the test result and improving the accuracy of the test.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

一种电连接装置(10)和测试机台(100)，用于与待测试工件(200)连接。待测试工件(200)包括第一连接面(210)和形成于第一连接面(210)上的测试区域(220)。测试区域(220)包括多个焊盘(222)。电连接装置(10)包括与待测试工件(200)相对设置的柔性电路板(12)。柔性电路板(12)包括与第一连接面(210)相对的第二连接面(122)和自第二连接面(122)朝第一连接面(210)突出的多个弧形弹性电极(124)。弧形弹性电极(124)用于在压接电连接装置(10)和待测试工件(200)时受压抵压在测试区域(220)上。多个弧形弹性电极(124)与多个焊盘(222)一一对应连接。

Description

电连接装置及测试机台 技术领域
本发明涉及检测技术领域，特别涉及一种电连接装置及测试机台。
背景技术
显示面板生产过程中需要进行测试，采用的测试机台包括连接器，连接器包括有第一焊盘，显示面板形成有第二焊盘，通过将第一焊盘与第二焊盘对齐压接连接测试机台和显示面板从而对显示面板施加测试信号。然而第一焊盘和第二焊盘压接时容易滑动错位或者虚接，导致测试结果出错，测试的准确度低。
发明内容
有鉴于此，本发明的实施方式提供了一种电连接装置及测试机台。
本发明实施方式的一种电连接装置，用于与待测试工件连接，所述待测试工件包括第一连接面和形成于所述第一连接面上的测试区域，所述测试区域包括多个焊盘，所述电连接装置包括用于与所述待测试工件相对设置的柔性电路板，所述柔性电路板包括与所述第一连接面相对的第二连接面和自所述第二连接面朝所述第一连接面突出的多个弧形弹性电极，所述弧形弹性电极用于在压接所述电连接装置和所述待测试工件时受压时抵压在所述测试区域上，所述多个弧形弹性电极与所述多个焊盘一一对应连接。
在某些实施方式中，所述柔性电路板采用聚酰亚胺或聚酯薄膜制成。
在某些实施方式中，所述弧形弹性电极在所述第一连接面上的正投影落入所述测试区域内。
在某些实施方式中，所述弧形弹性电极自所述第二连接面朝所述第一连接面突出且向所述柔性电路板的侧边弯曲。
在某些实施方式中，所述弧形弹性电极包括弹片。
在某些实施方式中，所述弧形弹性电极采用铜材制成。
本发明实施方式的一种测试机台，用于测试待测试工件，所述测试机台包括：
用于支撑所述待测试工件的支撑台；
与所述支撑台相对设置的压头；和
上述任一实施方式所述的电连接装置，所述电连接装置设置在所述压头上且位于所述压头和所述待测试元件之间，所述压头用于压接所述电连接装置和所述待测试工件。
在某些实施方式中，所述待测试工件包括显示面板。
在某些实施方式中，所述支撑台包括上表面，所述上表面形成有定位槽，所述定位槽用于收容并定位所述待测试工件。
在某些实施方式中，所述压头包括与所述上表面相对的下表面，所述电连接装置附设在所述下表面，所述第二连接面与所述下表面相背。
在某些实施方式中，所述压头包括夹持装置，所述夹持装置包括负压夹持装置。
在某些实施方式中，所述测试机台包括与所述压头连接的滑动杆，所述滑动杆用于驱动所述压头移动。
在某些实施方式中，所述测试机台包括对准检测装置，所述对准检测装置用于检测所述弧形弹性电极和所述焊盘是否对位准确。
本发明实施方式的电连接装置和测试机台在测试过程中，弧形弹性电极受力产生形变抵压在测试区域上而与待测试工件的焊盘连接。如此，由于弹力的存在，使得弧形弹性电极与焊盘的连接更加稳定，可以避免压接时出现滑动错位或者虚接的问题，从而避免影响测试结果，提高了测试的准确度。
本发明的附加方面和优点将在下面的描述中部分给出，部分将从下面的描述中变得明显，或通过本发明的实践了解到。
附图说明
本发明的上述和/或附加的方面和优点从结合下面附图对实施方式的描述中将变得明显和容易理解，其中：
图1是本发明实施方式的测试机台的立体示意图；
图2是本发明实施方式的待测试工件的立体示意图；
图3是本发明实施方式的电连接装置的立体示意图；和
图4是本发明实施方式的电连接装置与待测试工件的工作状态平面示意图。
主要元件符号说明：
测试机台100、电连接装置10、柔性电路板12、第二连接面122、弧形弹性电极124、支撑台20、定位槽22、压头30、滑动杆40、对准检测装置50、待测试工件200、第一连接面210、测试区域220、焊盘222。
具体实施方式
下面详细描述本发明的实施方式，所述实施方式的示例在附图中示出，其中自始至终相同或类似的标号表示相同或类似的元件或具有相同或类似功能的元件。下面通过参考附图描述的实施方式是示例性的，仅用于解释本发明，而不能理解为对本发明的限制。
在本说明书的描述中，参考术语“某些实施方式”、“一个实施方式”、“一些实施方式”、“示意性实施方式”、“示例”、“具体示例”、或“一些示例”的描述意指结合实施方式或示例描述的具体特征、结构、材料或者特点包含于本发明的至少一个实施方式或示例中。在本说明书中，对上述术语的示意性表述不一定指的是相同的实施方式或示例。而且，描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施方式或示例中以合适的方式结合。
在本发明的描述中，需要理解的是术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。
在本发明的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接或可以相互通讯；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本发明中的具体含义。
在本发明中，除非另有明确的规定和限定，第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触，也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且，第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方，或仅仅表示第一特征水平高度小于第二特征。
下文的公开提供了许多不同的实施方式或例子用来实现本发明的不同结构。为了简化本发明的公开，下文中对特定例子的部件和设置进行描述。当然，它们仅仅为示例，并且目的不在于限制本发明。此外，本发明可以在不同例子中重复参考数字和/或参考字母，这种重复是为了简化和清楚的目的，其本身不指示所讨论各种实施方式和/或设置之间的关系。此外，本发明提供了的各种特定的工艺和材料的例子，但是本领域普通技术人员可以意识到其他工艺的应用和/或其他材料的使用。
请参阅图1，本发明实施方式的电连接装置10可以用于测试机台100并用于与待测试工件200连接。或者说，测试机台100包括电连接装置10。
请一并参阅图2，待测试工件200包括第一连接面210和形成于第一连接面210上的测试区域220。测试区域220包括多个焊盘222。
请一并参阅图3，本发明实施方式的电连接装置10包括与待测试工件200相对设置的 柔性电路板12。柔性电路板12包括与第一连接面210相对的第二连接面122和自第二连接面122朝第一连接面210突出的多个弧形弹性电极124。弧形弹性电极124用于在压接电连接装置10和待测试工件200时受压抵压在测试区域220上。多个弧形弹性电极124与多个焊盘222一一对应连接。
本发明实施方式的电连接装置10和测试机台100在测试过程中，弧形弹性电极124受力产生形变抵压在测试区域220上而与待测试工件200的焊盘222连接。如此，由于弹力的存在，使得弧形弹性电极124与焊盘222的连接更加稳定，可以避免压接时出现滑动错位或者虚接的问题，从而避免影响测试结果，提高了测试的准确度。
在电子制造业，为了确保电子产品的品质，通常需要对电子产品进行测试以确定产品能否正常工作。本发明的实施方式提供的电连接装置10和测试机台100正是可以用于电子产品的测试，待测试工件200可以是电子产品或者电子产品的零部件。
在某些实施方式中，待测试工件200可以是显示面板或者显示面板的零部件。而电连接装置10和测试机台100可以用于待测试工件200的点灯测试。例如，在某些实施方式中，待测试工件200是切割后的柔性有源矩阵有机发光二极管(Active-matrix Organic Light Emitting Diode，AMOLED)显示面板。
可以理解，点灯测试管控显示面板的质量，是显示面板制作过程中的关键环节。切割后的显示面板要进行点灯测试。具体地，通过与电连接装置10连接的测试机台100，依次传输信号至电连接装置10的弧形弹性电极124和显示面板的焊盘222，进而将显示面板点亮进行检测。
当然，在其他实施方式中，待测试工件200也可以是其他类型的显示面板，例如液晶(Liquid Crystal Display，LCD)显示面板、发光二极管(light emitting diode，LED)显示面板和有机发光二极管(Organic Light Emitting Diode，OLED)显示面板，而不限于上述的实施方式。
当然，电连接装置10和测试机台100可以不限于上面讨论的实施方式，而可以根据需要应用于其他的测试场合。
另外，电连接装置10的应用还应该不限于测试机台100，可以在其他实施方式中应用于其他合适的场合。例如，电连接装置10可以直接作为电子产品的零部件应用于电子产品中，使电子产品内部零部件之间的电连接更加稳定、可靠，从而提升电子产品的品质。
在某些实施方式中，柔性电路板12采用聚酰亚胺或聚酯薄膜制成。
可以理解，以聚酰亚胺或聚酯薄膜为基材制成的柔性电路板12可挠性强，而且技术成熟，材料容易获取，成本低。
当然，柔性电路板12可以不限于上述实施方式，而在其他实施方式中可以根据需求采 用其他合适的基材。
在某些实施方式中，弧形弹性电极124在第一连接面210上的正投影落入测试区域220内。
可以理解，弧形弹性电极124在第一连接面210上的正投影落入测试区域220内。如此，弧形弹性电极124才能与测试区域220内的焊盘222对位准确。
具体地，在测试时通常需要先将弧形弹性电极124与焊盘222对位。弧形弹性电极124在第一连接面210上的正投影落入测试区域220内以使弧形弹性电极124与焊盘222对位准确。对位准确后压头30下压进行压接时，才能保证多个弧形弹性电极124与多个焊盘222一一对应连接导通而不会短接。
在某些实施方式中，弧形弹性电极124自第二连接面122朝第一连接面210突出且向柔性电路板12的侧边弯曲。
如此，方便弧形弹性电极124与第一连接面210上的测试区域220内的焊盘222连接。
在某些实施方式中，弧形弹性电极124包括弹片。
可以理解，弹片的弹性性能好。在压接电连接装置10与待测试工件200时，压头30把弧形弹性电极124抵压在测试区域220上。弧形弹性电极124受力产生较大的形变，使得弧形弹性电极124与测试区域220内的焊盘222的连接更加稳定。如此，可以避免压接时出现滑动错位或者虚接的问题。
在某些实施方式中，弧形弹性电极124采用铜材制成。
可以理解，铜材的导电性能良好且在干燥空气中不氧化。如此，可以延长弧形弹性电极124的使用寿命。
当然，弧形弹性电极124的原材料可以不限于上述实施方式，而在其他实施方式中可以根据需求采用其他合适的材料。
本发明实施方式的测试机台100包括用于支撑待测试工件200的支撑台20、与支撑台20相对设置的压头30和电连接装置10。电连接装置10设置在压头30上且位于压头30和待测试工件200之间。压头30用于压接电连接装置10和待测试工件200。
可以理解，测试机台100用于测试待测试工件200是否能正常工作。具体地，测试机台100通过电连接装置10与待测试工件200的连接导通结果来判断待测试工件200能否正常工作。
在某些实施方式中，待测试工件200包括显示面板。
可以理解，测试机台100可用于检测显示面板是否存在显示异常。通过点灯测试，可以筛选出显示异常的不良品。相关工作人员对不良品显示异常的原因进行分析以寻找对应的解决方案，从而提高产品良率。
具体地，当待测试工件200为显示面板时，显示面板的焊盘222上设置有端子引线。在压头30压接电连接装置10与待测试工件200时，弧形弹性电极124受压抵压在测试区域220上。弧形弹性电极124受力产生形变与焊盘222上的端子引线连接进行点灯测试以点亮显示面板。
在某些实施方式中，支撑台20包括上表面，上表面形成有定位槽22。定位槽22用于收容并定位所述待测试工件200。
可以理解，待测试工件200放置在定位槽22内，定位槽22内收容并定位待测试工件200。如此，避免待测试工件200移动，方便电连接装置10与其连接导通，输入测试信号。
可以理解，定位槽22的尺寸可以根据待测试工件200的尺寸制作。
在某些实施方式中，压头30包括与所述上表面相对的下表面，柔性电路板12附设在下表面，第二连接面122与下表面相背。
可以理解，柔性电路板12附设在压头30的下表面且第二连接面122与下表面相背，柔性电路板12才能与收容在支撑台20定位槽22内的待测试工件200连接。
在某些实施方式中，压头30包括夹持装置(图未示)，夹持装置包括负压夹持装置。
如此，夹持装置将柔性电路板12夹持固定在压头30下表面。负压夹持装置能够实现柔性夹持，从而避免对柔性电路板12造成损坏。
在另一实施方式中，压头30与柔性电路板可采用紧固件连接。紧固件可为紧固螺钉。在这一实施方式中，压头30的下表面开设有螺孔，柔性电路板12开设有通孔。紧固螺钉穿过通孔穿入螺孔内，将柔性电路板12固定在压头30的下表面。
在某些实施方式中，测试机台100包括与压头30连接的滑动杆40。滑动杆40用于驱动所述压头30移动。
可以理解，在测试过程中，滑动杆40驱动压头30移动下压，以使弧形弹性电极124和焊盘222连接。
具体地，压头30可沿滑动杆40上下移动。测试机台100通过控制系统控制滑动杆40驱动压头30上下移动。测试机台100进行测试时，控制系统控制滑动杆40驱动压头30下压将电连接装置10和待测试工件200连接。测试机台100测试完成后，控制系统控制滑动杆40驱动压头30上移，然后将压头30固定在与支撑台20有一定距离的位置。
在某些实施方式中，测试机台100包括对准检测装置50。对准检测装置50用于检测弧形弹性电极124和焊盘222是否对位准确。
可以理解，测试时，柔性电路板12上的弧形弹性电极124和待测试工件200的焊盘222要进行对位。对准检测装置50检测弧形弹性电极124和焊盘222是否对位准确，如若对位不准，对准检测装置50则进行调整，使之最终对位准确。对位完成后，压头30下压，使多 个弧形弹性电极124和多个焊盘222一一对应连接导通，输入信号以对待测试工件200进行测试。
具体地，对准检测装置50包括CCD镜头和对位校准单元。测试时，弧形弹性电极124与焊盘222进行对位，CCD镜头获取对位状态信息并将对位状态信息传送给对位校准单元。对位校准单元判读对位是否准确，如若对位不准，对位校准单元进行校准直至弧形弹性电极124与焊盘222对位准确。
以下说明利用本发明实施方式的测试机台100进行测试的原理：
首先，将待测试工件200放置在定位槽22中定位，并将电连接装置10固定在压头30的下表面。
接着，将柔性电路板12上的弧形弹性电极124和待测试工件200的焊盘222进行对位。对准检测装置50检测弧形弹性电极124和焊盘222是否对位准确，如若对位不准，对准检测装置50则进行调整，使之最终对位准确。
然后，请参阅图4，对位完成后，滑动杆40驱动压头30移动下压，使多个弧形弹性电极124和多个焊盘222连接导通，输入测试信号测试待测试工件200。
本发明实施方式的电连接装置10和测试机台100在测试过程中，弧形弹性电极124受力产生形变抵压在测试区域220上而与待测试工件200的焊盘222连接。如此，由于弹力的存在，使得弧形弹性电极124与焊盘222的连接更加稳定，可以避免压接时出现滑动错位或者虚接的问题，从而避免影响测试结果，提高了测试的准确度。
尽管上面已经示出和描述了本发明的实施例，可以理解的是，上述实施例是示例性的，不能理解为对本发明的限制，本领域的普通技术人员在本发明的范围内可以对上述实施例进行变化、修改、替换和变型，本发明的范围由权利要求及其等同物限定。

Claims (13)

  1. 一种电连接装置，用于与待测试工件连接，所述待测试工件包括第一连接面和形成于所述第一连接面上的测试区域，所述测试区域包括多个焊盘，其特征在于，所述电连接装置包括用于与所述待测试工件相对设置的柔性电路板，所述柔性电路板包括与所述第一连接面相对的第二连接面和自所述第二连接面朝所述第一连接面突出的多个弧形弹性电极，所述弧形弹性电极用于在压接所述电连接装置和所述待测试工件时受压时抵压在所述测试区域上，所述多个弧形弹性电极与所述多个焊盘一一对应连接。
  2. 如权利要求1所述的电连接装置，其特征在于，所述柔性电路板采用聚酰亚胺或聚酯薄膜制成。
  3. 如权利要求1所述的电连接装置，其特征在于，所述弧形弹性电极在所述第一连接面上的正投影落入所述测试区域内。
  4. 如权利要求1所述的电连接装置，其特征在于，所述弧形弹性电极自所述第二连接面朝所述第一连接面突出且向所述柔性电路板的侧边弯曲。
  5. 如权利要求4所述的电连接装置，其特征在于，所述弧形弹性电极包括弹片。
  6. 如权利要求4所述的电连接装置，其特征在于，所述弧形弹性电极采用铜材制成。
  7. 一种测试机台，用于测试待测试工件，其特征在于，所述测试机台包括：
    用于支撑所述待测试工件的支撑台；
    与所述支撑台相对设置的压头；和
    如权利要求1-6任意一项所述的电连接装置，所述电连接装置设置在所述压头上且位于所述压头和所述待测试元件之间，所述压头用于压接所述电连接装置和所述待测试工件。
  8. 如权利要求7所述的测试机台，其特征在于，所述待测试工件包括显示面板。
  9. 如权利要求7所述的测试机台，其特征在于，所述支撑台包括上表面，所述上表面形成有定位槽，所述定位槽用于收容并定位所述待测试工件。
  10. 如权利要求7所述的测试机台，其特征在于，所述压头包括与所述上表面相对的下表面，所述柔性电路板附设在所述下表面，所述第二连接面与所述下表面相背。
  11. 如权利要求7所述的测试机台，其特征在于，所述压头包括夹持装置，所述夹持装置包括负压夹持装置。
  12. 如权利要求7所述的测试机台，其特征在于，所述测试机台包括与所述压头连接的滑动杆，所述滑动杆用于驱动所述压头移动。
  13. 如权利要求7所述的测试机台，其特征在于，所述测试机台包括对准检测装置，所述对准检测装置用于检测所述弧形弹性电极和所述焊盘是否对位准确。
PCT/CN2017/106702 2017-10-18 2017-10-18 电连接装置及测试机台 Ceased WO2019075663A1 (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201780092156.9A CN110785802A (zh) 2017-10-18 2017-10-18 电连接装置及测试机台
PCT/CN2017/106702 WO2019075663A1 (zh) 2017-10-18 2017-10-18 电连接装置及测试机台

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2017/106702 WO2019075663A1 (zh) 2017-10-18 2017-10-18 电连接装置及测试机台

Publications (1)

Publication Number Publication Date
WO2019075663A1 true WO2019075663A1 (zh) 2019-04-25

Family

ID=66172998

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2017/106702 Ceased WO2019075663A1 (zh) 2017-10-18 2017-10-18 电连接装置及测试机台

Country Status (2)

Country Link
CN (1) CN110785802A (zh)
WO (1) WO2019075663A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113391620A (zh) * 2021-06-18 2021-09-14 格力电器(南京)有限公司 测试治具、治具调节固定装置、测试设备及切换测试方法
CN118731430A (zh) * 2024-07-31 2024-10-01 武汉精立电子技术有限公司 一种可垂直升降的压接机构

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113933641A (zh) * 2021-12-20 2022-01-14 国网辽宁省电力有限公司电力科学研究院 配电网间隙时变弧光接地故障模拟试验方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1355559A (zh) * 2000-11-23 2002-06-26 崇越科技股份有限公司 晶片测试载架
CN1916643A (zh) * 2005-08-17 2007-02-21 段超毅 集成电路测试装置
CN201138366Y (zh) * 2008-01-10 2008-10-22 环国科技股份有限公司 面板测试结构
JP2009193710A (ja) * 2008-02-12 2009-08-27 Jsr Corp 異方導電性コネクターおよびこの異方導電性コネクターを用いた回路装置の検査装置
CN202383975U (zh) * 2011-10-10 2012-08-15 深圳市精锐通实业有限公司 显示屏的通用测试装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1506692A (zh) * 2002-12-12 2004-06-23 聿勤科技股份有限公司 具有弹性接点的ic测试工具
JP4008408B2 (ja) * 2003-11-07 2007-11-14 日本電子材料株式会社 プローブカード
CN201909918U (zh) * 2010-12-30 2011-07-27 京东方科技集团股份有限公司 液晶面板检测装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1355559A (zh) * 2000-11-23 2002-06-26 崇越科技股份有限公司 晶片测试载架
CN1916643A (zh) * 2005-08-17 2007-02-21 段超毅 集成电路测试装置
CN201138366Y (zh) * 2008-01-10 2008-10-22 环国科技股份有限公司 面板测试结构
JP2009193710A (ja) * 2008-02-12 2009-08-27 Jsr Corp 異方導電性コネクターおよびこの異方導電性コネクターを用いた回路装置の検査装置
CN202383975U (zh) * 2011-10-10 2012-08-15 深圳市精锐通实业有限公司 显示屏的通用测试装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113391620A (zh) * 2021-06-18 2021-09-14 格力电器(南京)有限公司 测试治具、治具调节固定装置、测试设备及切换测试方法
CN118731430A (zh) * 2024-07-31 2024-10-01 武汉精立电子技术有限公司 一种可垂直升降的压接机构

Also Published As

Publication number Publication date
CN110785802A (zh) 2020-02-11

Similar Documents

Publication Publication Date Title
CN110191578B (zh) 一种柔性电路板及测试治具
WO2017202098A1 (zh) 电路板结构、绑定测试方法及显示装置
CN113253100B (zh) 一种测试装置和检测系统
CN111123170A (zh) 显示模组、显示模组的绑定测试装置和绑定装置
WO2019075663A1 (zh) 电连接装置及测试机台
US10716221B2 (en) Method of manufacturing electronic device
KR101160076B1 (ko) 패널 테스트를 위한 필름타입 프로브블록
KR20140110344A (ko) 압착 품질 검사용 저항 측정 장치 및 이를 이용한 측정 방법
TWI641839B (zh) 偵測裝置
CN109754732A (zh) 基板、面板、检测装置以及对准检测方法
KR200459631Y1 (ko) 필름을 이용하여 테스트하는 프로브카드
CN108594483A (zh) 显示屏测试工装及显示屏的测试方法
CN213122024U (zh) 一种压接机构
KR101895034B1 (ko) 논-포고 타입 커넥터를 포함하는 프로브 검사 장치
CN1324321C (zh) 测试软性电路板接合合格率方法及具有测试垫软性电路板
TW200422627A (en) Method of testing FPC bonding yield and FPC having testing pads thereon
CN100556230C (zh) 电路焊垫结构
CN103499894B (zh) 信号线连接口、显示面板检测装置及检测方法
JPH0782032B2 (ja) 表示パネル用プローブとその組み立て方法
CN220040561U (zh) 探针测试装置
JPH08304846A (ja) 液晶表示素子の検査装置
JP4487519B2 (ja) 電子機器の機能検査装置
KR101020625B1 (ko) 필름타입 프로브유닛 및 그의 제조방법
KR200458562Y1 (ko) 필름 시트 형 프로브를 가진 액정 패널 테스트 프로브 장치
CN218213088U (zh) 一种芯片定位测试结构

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17929199

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17929199

Country of ref document: EP

Kind code of ref document: A1