CN110785802A - 电连接装置及测试机台 - Google Patents

电连接装置及测试机台 Download PDF

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Publication number
CN110785802A
CN110785802A CN201780092156.9A CN201780092156A CN110785802A CN 110785802 A CN110785802 A CN 110785802A CN 201780092156 A CN201780092156 A CN 201780092156A CN 110785802 A CN110785802 A CN 110785802A
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CN
China
Prior art keywords
tested
workpiece
connection device
arc
electrical connection
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Pending
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CN201780092156.9A
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English (en)
Inventor
董晓雪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Royole Technologies Co Ltd
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Shenzhen Royole Technologies Co Ltd
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Publication date
Application filed by Shenzhen Royole Technologies Co Ltd filed Critical Shenzhen Royole Technologies Co Ltd
Publication of CN110785802A publication Critical patent/CN110785802A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

一种电连接装置(10)和测试机台(100)，用于与待测试工件(200)连接。待测试工件(200)包括第一连接面(210)和形成于第一连接面(210)上的测试区域(220)。测试区域(220)包括多个焊盘(222)。电连接装置(10)包括与待测试工件(200)相对设置的柔性电路板(12)。柔性电路板(12)包括与第一连接面(210)相对的第二连接面(122)和自第二连接面(122)朝第一连接面(210)突出的多个弧形弹性电极(124)。弧形弹性电极(124)用于在压接电连接装置(10)和待测试工件(200)时受压抵压在测试区域(220)上。多个弧形弹性电极(124)与多个焊盘(222)一一对应连接。

Description

PCT国内申请，说明书已公开。

Claims (13)

  1. PCT国内申请，权利要求书已公开。
CN201780092156.9A 2017-10-18 2017-10-18 电连接装置及测试机台 Pending CN110785802A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2017/106702 WO2019075663A1 (zh) 2017-10-18 2017-10-18 电连接装置及测试机台

Publications (1)

Publication Number Publication Date
CN110785802A true CN110785802A (zh) 2020-02-11

Family

ID=66172998

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780092156.9A Pending CN110785802A (zh) 2017-10-18 2017-10-18 电连接装置及测试机台

Country Status (2)

Country Link
CN (1) CN110785802A (zh)
WO (1) WO2019075663A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113933641A (zh) * 2021-12-20 2022-01-14 国网辽宁省电力有限公司电力科学研究院 配电网间隙时变弧光接地故障模拟试验方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1506692A (zh) * 2002-12-12 2004-06-23 聿勤科技股份有限公司 具有弹性接点的ic测试工具
US20050099194A1 (en) * 2003-11-07 2005-05-12 Nihon Denshizairyo Kabushiki Kaisha Arch type probe and probe card using same
CN201138366Y (zh) * 2008-01-10 2008-10-22 环国科技股份有限公司 面板测试结构
CN201909918U (zh) * 2010-12-30 2011-07-27 京东方科技集团股份有限公司 液晶面板检测装置
CN202383975U (zh) * 2011-10-10 2012-08-15 深圳市精锐通实业有限公司 显示屏的通用测试装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1168129C (zh) * 2000-11-23 2004-09-22 崇越科技股份有限公司 晶片测试载架
CN1916643A (zh) * 2005-08-17 2007-02-21 段超毅 集成电路测试装置
JP2009193710A (ja) * 2008-02-12 2009-08-27 Jsr Corp 異方導電性コネクターおよびこの異方導電性コネクターを用いた回路装置の検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1506692A (zh) * 2002-12-12 2004-06-23 聿勤科技股份有限公司 具有弹性接点的ic测试工具
US20050099194A1 (en) * 2003-11-07 2005-05-12 Nihon Denshizairyo Kabushiki Kaisha Arch type probe and probe card using same
CN201138366Y (zh) * 2008-01-10 2008-10-22 环国科技股份有限公司 面板测试结构
CN201909918U (zh) * 2010-12-30 2011-07-27 京东方科技集团股份有限公司 液晶面板检测装置
CN202383975U (zh) * 2011-10-10 2012-08-15 深圳市精锐通实业有限公司 显示屏的通用测试装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113933641A (zh) * 2021-12-20 2022-01-14 国网辽宁省电力有限公司电力科学研究院 配电网间隙时变弧光接地故障模拟试验方法

Also Published As

Publication number Publication date
WO2019075663A1 (zh) 2019-04-25

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Application publication date: 20200211