WO2019070031A1 - Sputtering device - Google Patents

Sputtering device Download PDF

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Publication number
WO2019070031A1
WO2019070031A1 PCT/JP2018/037229 JP2018037229W WO2019070031A1 WO 2019070031 A1 WO2019070031 A1 WO 2019070031A1 JP 2018037229 W JP2018037229 W JP 2018037229W WO 2019070031 A1 WO2019070031 A1 WO 2019070031A1
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WO
WIPO (PCT)
Prior art keywords
mask frame
mask
stock
support
chamber
Prior art date
Application number
PCT/JP2018/037229
Other languages
French (fr)
Japanese (ja)
Inventor
吉田 大介
豪 清水
高橋 誠
明 湯山
雄亮 佐藤
Original Assignee
株式会社アルバック
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社アルバック filed Critical 株式会社アルバック
Priority to CN201880005318.5A priority Critical patent/CN110114502B/en
Priority to KR1020197022549A priority patent/KR102223849B1/en
Priority to JP2019516003A priority patent/JP6742513B2/en
Publication of WO2019070031A1 publication Critical patent/WO2019070031A1/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • C23C14/566Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber

Definitions

  • the present invention relates to a sputtering apparatus, and more particularly to a preferred technique used for replacing a mask frame in a vertical transport sputtering apparatus.
  • Priority is claimed on Japanese Patent Application No. 2017-195211, filed Oct. 5, 2017, the content of which is incorporated herein by reference.
  • a film forming apparatus (sputtering apparatus) which performs heat treatment, film forming process and the like in a vacuum environment on a substrate made of glass or the like.
  • a cathode for sputtering is provided in a chamber, and an object to be processed (substrate) is disposed to face a target attached to the cathode at a predetermined distance in a reduced pressure chamber.
  • Ar gas inert gas
  • Ar gas or the like is introduced into the chamber, and a negative voltage is applied to the target in a state where the object to be treated is connected to ground to discharge the Ar ion ionized from Ar gas by the discharge. Collide with the target. And the film-forming process is performed by making the to-be-processed object the particle
  • the mask used for sputtering has an opening for controlling the deposition region in the substrate surface.
  • the mask needs to be replaced frequently because the shape of the opening of the mask changes due to the deposition of deposition particles.
  • the operation time required to replace the mask increases.
  • the mask replacement frequency is low, the frequency of performing mask alignment is low, but as the number of mask replacements increases, the time required for mask alignment increases. Therefore, there has been a demand to reduce these work hours.
  • the positional accuracy between the adhesion preventing plate and the substrate is about 0.1 mm to several mm.
  • the positional accuracy between the mask and the substrate used to control the film formation region on the substrate is about several micrometers to several tens of micrometers. Therefore, the position accuracy between the mask and the substrate is required to be such that the operator can not directly perform the alignment. Therefore, the time required for the alignment operation may be enormous. Therefore, there has been a demand to automate the alignment between the mask and the substrate to reduce the time required for the alignment operation. There is also a demand to improve the accuracy of alignment between the mask and the substrate.
  • the weight of the mask placed on the substrate is 500 kg to several tons.
  • the weight increases and it becomes difficult for workers to handle it directly and perform replacement work.
  • the mask alignment mechanism including the end effector is very complicated and heavy, and the burden on maintenance work is large. For this reason, there is a demand to automate such maintenance work.
  • the present invention has been made in view of the above circumstances, and aims to achieve the following objects. 1. Allowing easy replacement of heavy-duty vertical transfer masks with a simple configuration. 2. Automate mask replacement. 3. Allowing mask replacement without releasing the film formation chamber to the atmosphere. 4. Reduce the time required to replace a mask. 5. When replacing a mask, enable accurate alignment of the mask with the substrate.
  • a sputtering apparatus is a sputtering apparatus, and has a mask exchanging unit that enables exchange of a mask frame substantially vertically held with respect to a substrate to be deposited by sputtering in a chamber.
  • a mask selected from a plurality of the mask frames that can be sealed, and a sealable stock chamber in which a plurality of mask frames can be stocked with the plurality of mask frames substantially parallel to one another
  • Conveying means for conveying the frame to a mask chamber which is a film forming position in the chamber, and a plurality of the mask frames are arranged in the stock chamber such that the surfaces of the mask frame are substantially parallel to each other Supportable and substantially orthogonal to the face of the mask frame.
  • the stock support portion includes a stock placement portion having a plurality of stock grooves capable of supporting the lower ends of the plurality of mask frames, and raising, lowering and moving back and forth.
  • a plurality of supports wherein the stock lower support portion extends in a direction substantially parallel to the surface of the stocked mask frame and supports the lower end of the mask frame It is possible to have a groove and a stock position exchange driving unit capable of moving the plurality of support grooves back and forth in a direction substantially orthogonal to the surface of the mask frame.
  • the stock upper support portion is rotatable around an axis extending in a direction orthogonal to the surface of the mask frame, and the upper end of the mask frame It is possible to have a sandwiching portion capable of sandwiching from both sides in a direction orthogonal to the surface of the mask frame, and the sandwiching portion can be moved back and forth along a direction parallel to the axis.
  • the stock support portion has a stock placement portion having a plurality of stock grooves capable of supporting the positions of lower ends of the plurality of mask frames
  • the drive support portion has an axis parallel to a direction substantially orthogonal to the surface of the mask frame and has a drive roller which can be driven by a rotational drive portion, and the rotational drive portion rotationally drives the drive roller.
  • the transport upper support portion has an upper magnet portion, and the upper magnet portion attracts the magnet portion provided on the upper end of the mask frame.
  • the magnet can be arranged to have a magnetic circuit formed in a vertical plane substantially orthogonal to the direction parallel to the plane of the mask frame.
  • the stock chamber may be the mask frame stocked in the stock chamber and the mask frame regardless of whether the mask frame is unused or used. When replacing the mask frame in the mask chamber, which is the film forming position in the chamber, the stock chamber is sealed from the outside and the mask frame is transported in a state of being in communication with the chamber.
  • the mask frame stocked in the stock chamber is carried in or out from the outside, the mask frame is sealed in a state in which the chamber is sealed and the stock chamber is communicated with the outside. It is possible to have sealing means that make it possible to carry in or out.
  • the stock chamber can be respectively connected to a plurality of the chambers so that the stocked mask frame can be replaced.
  • a mask frame according to a second aspect of the present invention is a mask frame which can be transported between the stock chamber and the mask chamber in the sputtering apparatus, and is provided on the transport upper support portion. It is possible to have the magnet unit in which the magnet is disposed to attract the upper magnet unit and to have a magnetic circuit formed in a vertical plane substantially orthogonal to the direction parallel to the surface of the mask frame. .
  • the sputtering apparatus comprises exchange means for making it possible to exchange a mask frame substantially vertically held with respect to a substrate to be deposited by sputtering in a chamber, the exchange means comprising a plurality of the above A sealable stock chamber capable of stocking a plurality of mask frames substantially parallel to each other of the mask frame, and a mask frame selected from the plurality of stocked mask frames are deposited in the chamber.
  • a transport upper support is provided that can support the upper end of the mask frame so as not to tilt when the frame is moved.
  • the exchange means simultaneously moves the plurality of mask frames back and forth by the stock support to select one of the plurality of mask frames to be in contact with the drive support.
  • the exchanging means drives the lower end of one mask frame by the drive support to make the one mask frame selected to be in contact with the drive support from the stock chamber to the film forming position in the chamber. Transport to the mask room where At this time, the exchange means supports the upper end of the mask frame so as not to tilt by the transport upper support portion. Further, the exchanging means moves the stock support portion back and forth to open the position abutted against the drive support portion. In this state, the exchange means drives the drive support in the reverse direction to transport the mask frame from the mask chamber to the stock chamber.
  • the stock support portion includes a stock placement portion having a plurality of stock grooves capable of supporting the lower ends of the plurality of mask frames, and raising, lowering and moving back and forth. It is possible to lift the plurality of mask frames by coming into contact with the lower ends of the plurality of mask frames placed in the stock grooves of the stock placement portion at the time of ascent and separating from the stock placement portions The lower end of the mask frame after supporting the plurality of mask frames as a raised position and moving the plurality of mask frames supported as the raised position back and forth in a direction substantially orthogonal to the surface of the mask frame And lower the plurality of mask frames onto the stock grooves of the stock placement portion until they are separated from A lower stock support portion capable of being supported and an upper position of the plurality of mask frames stocked in the stock placement portion can be supported and released and on the same surface of the mask frame as the lower stock support portion And a stock upper support portion movable back and forth in substantially orthogonal directions.
  • the stock placement portion is provided with a plurality of parallel placement grooves on the upper surface thereof in a state of being separated in the direction substantially orthogonal to the surface of the mask frame.
  • the used and the used in the stock placement portion such that the faces of the plurality of mask frames are parallel and the plurality of mask frames are separated from each other.
  • a plurality of mask frames that are unused and / or unused can be stocked.
  • the plurality of stock mask frames are moved up and back and forth by the stock lower support portion while the upper position is supported by the stock upper support portion. -By lowering, it is possible to move the stock groove on which the mask frame is placed in the stock placement unit.
  • the mask frame moved by the stock groove supported by the stock lower support portion and the stock upper support portion can select and drive one piece contacting the drive support portion.
  • a plurality of supports wherein the stock lower support portion extends in a direction substantially parallel to the surface of the stocked mask frame and supports the lower end of the mask frame It has a groove and a stock position exchange driving unit which can move the plurality of support grooves back and forth in a direction substantially orthogonal to the surface of the mask frame.
  • the mask frame which is a heavy object, is placed in the support groove while maintaining the parallel state stocked in the stock placement portion so that the faces are equidistant in the front-rear direction (horizontal direction).
  • the mask frame can be moved in the front-rear direction by the position exchange driving unit.
  • the support groove may be moved in a direction substantially orthogonal to the mask surface of the mask frame so that only a corresponding mask frame is positioned to be driven by the drive support portion. It becomes possible.
  • the stock upper support portion is rotatable around an axis extending in a direction orthogonal to the surface of the mask frame, and the upper end of the mask frame It is possible to have a sandwiching portion capable of sandwiching from both sides in a direction orthogonal to the surface of the mask frame, and the sandwiching portion can be moved back and forth along a direction parallel to the axis.
  • the holding portion is rotated and held at a predetermined angle around the axis, whereby the upper end of the plurality of mask frames mounted in the stock groove of the stock mounting portion or in the support groove of the stock lower support portion. Can be supported not to tilt.
  • the plurality of mask frames can be placed on the stock placement portion or the understock support portion so that the plurality of mask frames do not interfere with each other.
  • the plurality of mask frames can be moved to the stock position of the stock lower support portion without interference with each other.
  • the stock support portion has a stock placement portion having a plurality of stock grooves capable of supporting the positions of lower ends of the plurality of mask frames
  • the drive support portion has an axis parallel to a direction substantially orthogonal to the surface of the mask frame and has a drive roller which can be driven by a rotational drive portion, and the rotational drive portion rotationally drives the drive roller.
  • Select the mask frame in contact with the drive roller among the mask frames placed in the stock groove of the stock placement unit, and select the mask frame in a direction parallel to the surface of the mask frame.
  • the mask frame can be made drivable.
  • the transport upper support portion has an upper magnet portion, and the upper magnet portion attracts the magnet portion provided on the upper end of the mask frame.
  • the magnet may be disposed to have a magnetic circuit formed in a vertical plane substantially orthogonal to a direction parallel to the plane of the mask frame.
  • the stock chamber may be the mask frame stocked in the stock chamber and the mask frame regardless of whether the mask frame is unused or used.
  • the stock chamber is sealed from the outside and the mask frame is transported in a state of being in communication with the chamber.
  • the mask frame stocked in the stock chamber is carried in or out from the outside, the mask frame is sealed in a state in which the chamber is sealed and the stock chamber is communicated with the outside.
  • the stock chamber can be connected to a plurality of the chambers so that the stocked mask frame can be replaced.
  • the apparatus configuration can be simplified as compared to the case where the number of film formation chambers (chambers) and the number of installation of the stock chambers are the same. Therefore, space saving can be achieved.
  • the mask chamber which is a film forming position in the chamber, in two directions parallel to the surface of the mask frame and orthogonal to the surface of the mask frame. It is possible to have a mask alignment unit that enables the mask frame to be aligned in six degrees of freedom by three axial directions in the orthogonal direction and three rotation directions around the three axial directions. This makes it possible to sequentially exchange the mask frame of the mask corresponding to different types of substrates. Then, such film formation can be performed continuously. At the same time, it is possible to automate the alignment between the mask and the substrate involved in the mask replacement, and to perform film formation that can facilitate more accurate alignment.
  • the mask alignment means can enable alignment of the mask frame with respect to the substrate.
  • the mask alignment means may be provided on the engagement portions provided at both ends of the lower portion of the mask frame and at the lower portions of both ends at the film forming position of the mask frame to be able to support the mask frame.
  • a support alignment portion engaged with the engagement portion and capable of alignment, and an upper alignment for supporting an upper portion of the mask frame React in the direction.
  • the upper alignment portion causes the upper portion of the mask frame to reciprocate in the front-rear direction orthogonal to the surface of the mask frame.
  • six degrees of freedom in two directions parallel to the surface of the mask frame three axial directions in a direction orthogonal to the surface of the mask frame, and three rotational directions around the three axial directions.
  • the mask frame can be made as alignable.
  • the mask alignment means may be provided at lower portions of engagement portions provided at both ends of the lower surface of the mask frame and at both ends of the film formation position of the mask frame so as to support the mask frame. Supporting and releasing the mask frame by setting the upper position of the mask frame in the direction orthogonal to the surface of the mask frame and the support alignment portion that can be aligned by engaging with the engaging portion And a possible upper alignment portion.
  • a driving unit that performs alignment in a lateral direction parallel to the surface of the mask frame in the support alignment unit and in a direction orthogonal to the surface is provided in the chamber.
  • control of the position of the mask frame is performed with higher accuracy than in the case of using a high output servomotor. It becomes possible. Furthermore, the space-saving type stepping motor can be used, and the stepper motor can be sealed by the cover in the chamber. Therefore, it is possible to prevent dust and the like from being generated with respect to driving, and it is possible to improve the film forming characteristics, to improve the yield, and to reduce the manufacturing cost.
  • a drive unit performing alignment in the vertical direction in the support alignment unit and a drive unit performing alignment in a direction orthogonal to the surface of the mask frame in the upper alignment unit It is provided outside the chamber. This makes it possible to support the mask frame having a weight that may be 500 kg or more, and to use a high-output drive unit without worrying about the space in the chamber when directly driving the mask frame. . Furthermore, although dust generated from the driving unit falls downward by gravity, the dust may be generated because the driving unit is positioned outside the chamber at the upper position of the mask frame that affects the film formation characteristics. It is possible to prevent the adverse effect on the film formation characteristics.
  • the engagement portion is disposed at one end of the lower surface of the mask frame and engaged with the convex portion of the support alignment portion, and the mask frame And an engaging groove portion disposed at the other end of the lower surface and engaged with the convex portion of the support alignment portion, and the engaging groove portion is provided along the lower end of the mask frame.
  • the engagement recess is engaged with the convex portion of the support alignment portion at one end of the lower surface of the mask frame, and the engagement groove is engaged with the convex portion of the support alignment at the other end of the lower surface of the mask frame.
  • the engagement groove portion allows a certain degree of freedom, so that alignment can be performed according to the length dimension of the engagement groove portion even if the mask frame is slightly shifted with respect to the support alignment portion. It becomes. Further, by engaging the engagement recess and the engagement groove with the support alignment portion, the mask frame can be supported finely adjustable.
  • the upper alignment portion is rotatable around an axis extending in a direction perpendicular to the surface of the mask frame, and the upper end of the mask frame is the mask It has a clamping part which can be clamped from the both sides of the direction which intersects perpendicularly with the field of a frame, and the clamping part is made movable along the above-mentioned axial direction.
  • the support of the mask frame is restricted by pivoting the holding part around the axis line from the state where the restriction on the upper part of the mask frame is released.
  • the sandwiching portion by moving the sandwiching portion along the axis, by controlling the position of the mask frame in the direction orthogonal to the plane of the mask frame, three axial directions and three rotational directions around the three lines can be obtained.
  • the mask frame can be aligned in six degrees of freedom in
  • a mask frame according to a second aspect of the present invention is a mask frame which can be transported between the stock chamber and the mask chamber in the sputtering apparatus, and is provided on the transport upper support portion.
  • the magnet unit may have a magnet unit in which the magnet is disposed so as to attract the upper magnet unit and to have a magnetic circuit formed in a vertical plane substantially orthogonal to a direction parallel to the surface of the mask frame.
  • the mask frame according to the second aspect of the present invention is a mask frame of a mask which is held substantially vertically by the mask alignment means with respect to a substrate to be deposited by sputtering in a chamber of a sputtering apparatus.
  • the sputtering apparatus has a support alignment portion provided below the both ends of the deposition position of the mask frame in the sputtering apparatus and capable of supporting the mask frame. The engagement is possible by engaging with the support alignment portion. Portions are provided at both ends of the lower surface of the mask frame.
  • the engagement portion is disposed at one end of the lower surface of the mask frame and engaged with the convex portion of the support alignment portion, and the mask frame And an engaging groove portion disposed at the other end of the lower surface and engaged with the convex portion of the support alignment portion, and the engaging groove portion is provided along the lower end of the mask frame.
  • the engagement concave portion is engaged with the convex portion of the support alignment portion, and at the same time, the other end side (the opposite side to the first end)
  • the rough position setting to the film formation position of the mask frame can be performed in one operation.
  • the engagement groove portion allows a certain degree of freedom, so that alignment can be performed according to the length dimension of the engagement groove portion even if the mask frame is slightly shifted with respect to the support alignment portion. It becomes.
  • the mask frame can be supported finely adjustable.
  • the simple configuration makes it possible to easily replace the heavy-duty vertical transport mask frame with a small number of steps, and improve the mask alignment accuracy in the mask frame replacement. It is possible to realize automation in replacement, to replace the mask frame without releasing the film formation chamber to the atmosphere, and to reduce the time required for replacing the mask frame.
  • FIG. 1 is a schematic plan view showing a sputtering apparatus in the present embodiment.
  • reference numeral 1 denotes a sputtering apparatus.
  • the sputtering apparatus 1 is, for example, a processing object made of glass or resin, such as when forming a TFT (Thin Film Transistor) on a target substrate (substrate) S made of glass or the like in a manufacturing process of a liquid crystal display.
  • the substrate S is an inter-back type or in-line type vacuum processing apparatus that performs heat processing, film formation processing, etching processing, and the like in a vacuum environment.
  • the sputtering apparatus 1 includes, as shown in FIG. 1, a load / unload chamber (chamber) 2 for carrying in / out a substantially rectangular glass substrate (substrate to be processed) S, and
  • the film-forming chamber 4 is a pressure-resistant film-forming chamber for forming a film such as a ZnO or In 2 O 3 -based transparent conductive film by sputtering, and located between the film-forming chamber 4 and the load / unload chamber 2
  • a transfer chamber (chamber) 3 and a stock chamber 50 for stocking the mask frame F to be replaced are provided.
  • the sputtering apparatus 1 which concerns on this embodiment is shown as a side sputter type in the figure.
  • the sputtering apparatus 1 includes a mask exchanging unit 100 capable of exchanging the mask frame F held substantially vertically.
  • the mask replacement means 100 includes a stock chamber 50 and a transfer means 60 for transferring the mask frame F to a mask chamber 43 which is a film forming position in the chamber.
  • the sputtering apparatus 1 is provided with a film forming chamber 4 B substantially equivalent to the film forming chamber 4.
  • the film forming chamber 4 ⁇ / b> B is connected to the transfer chamber 3 similarly to the film forming chamber 4, and is configured symmetrically with respect to the stock chamber 50.
  • the plurality of load / unload chambers (chambers) 2, the film forming chamber (chambers) 4, and the film forming chamber (chambers) 4 B are connected to the transfer chamber 3.
  • Such chambers 2, 4, 4B are, for example, a load / unload chamber (chamber) 2 formed adjacent to the transfer chamber 3 so as to perform the film forming process with each other, and a plurality of processing chambers (chambers) 4, 4B. It will be configured as
  • a load / unload chamber equivalent to the load / unload chamber (chamber) 2 can be provided to be connected to the transfer chamber 3.
  • one load / unload chamber 2 is a load chamber for loading the glass substrate S from the outside toward the vacuum processing apparatus (sputtering apparatus) 1, and the other load / unload chamber is a vacuum processing apparatus It can be an unloading chamber from which the glass substrate S is unloaded from 1 to the outside.
  • the film forming chamber 4 and the film forming chamber 4B may be configured to perform different film forming processes.
  • a partition valve may be formed between each of the chambers 2 and the transfer chamber 3, between the transfer chamber 3 and the chamber 4, and between the transfer chamber 3 and the chamber 4B. Further, between the chamber 4 and the stock chamber 50, and between the chamber 4B and the stock chamber 50, partition valves 58a and 58a serving as sealing means 58 are formed.
  • a positioning member capable of setting and positioning the mounting position of the glass substrate S carried in from the outside may be disposed.
  • the load / unload chamber 2 can also be provided with rough evacuation means such as a rotary pump for roughly evacuating the chamber.
  • a transfer device (transfer robot) 3a is disposed inside the transfer chamber 3, as shown in FIG. 1, a transfer device (transfer robot) 3a is disposed.
  • the transfer device 3a includes a rotation shaft, a robot arm attached to the rotation shaft, a robot hand formed at one end of the robot arm, and a vertical movement device.
  • the robot arm is composed of first and second active arms which can be bent relative to each other, and first and second driven arms.
  • the transfer device 3a can move the glass substrate S, which is a transferred object, between the chambers 2, 3, 4, and 4B.
  • an additional moving means may be provided to move the robot arm to the horizontal position or to move the glass substrate S in the horizontal direction.
  • a target 7 provided upright inside the film forming chamber 4 and a backing plate (cathode electrode) 6 for holding the target 7.
  • the backing plate 6 is provided at a position farthest from the transfer chamber 3.
  • the target 7 is fixed to the backing plate 6 on the front side facing the glass substrate S substantially in parallel.
  • the backing plate (cathode electrode) 6 plays the role of an electrode for applying a sputtering voltage of negative potential to the target 7.
  • the backing plate 6 is connected to a power supply that applies a sputtering voltage of negative potential.
  • a magnetron magnetic circuit for forming a predetermined magnetic field on the target 7 is disposed on the back side of the cathode electrode 6. Further, the magnetron magnetic circuit may be mounted on a swing mechanism and configured to be able to swing by a drive device for swinging the magnetic circuit.
  • the film forming chamber 4 has a sputtering space 41 on the film forming surface side of the glass substrate S during film forming, a back side space 42 on the back surface side of the glass substrate S during film forming, and these sputtering spaces. And a mask chamber 43 between the rear side space 42 and the rear side space 42.
  • a backing plate (cathode electrode) 6 to which the target 7 is fixed is disposed in the sputtering space 41.
  • a stock chamber 50 is connected to the mask chamber 43 via a dividing valve 58 a serving as a sealing unit 58.
  • a substrate holding means 48 for holding the glass substrate S so as to face the target 7 during film formation is provided.
  • a mask alignment unit 10 is provided in the mask chamber 43 as described later.
  • a mask frame F for holding a mask is provided in the mask chamber 43 and the stock chamber 50.
  • the mask chamber 43 and the stock chamber 50 are provided with transport means 60 for transporting the mask frame F between them.
  • FIG. 2 is a perspective view showing a mask frame in the present embodiment.
  • the mask frame F has a configuration in which a mask for limiting a film formation region (not shown) is stretched inside a substantially rectangular frame body Fa.
  • the mask is a thin metal, and is provided in a stretched state with respect to the frame Fa.
  • the mask frame F is configured to be arranged in a vertical format and transported. That is, the mask frame F has a substantially rectangular frame (frame) Fa made of a nonmagnetic material such as aluminum and a magnet provided to extend along the upper side of the frame (frame) Fa
  • the upper frame support F6 and the slider F5 formed as a round bar extending along the lower side of the frame Fa.
  • the surface of the mask frame F is set to be substantially parallel to the YZ surface, and both ends of the lower end of the frame (frame) Fa in the mask frame F, that is, the Y direction at the lower side in the Z direction
  • the engaging portion F1 and the engaging portion F2 are respectively provided at both end positions in.
  • FIG. 3 is a perspective view showing a stock chamber in the sputtering apparatus in the present embodiment.
  • FIG. 4 is a schematic side view showing the stock support portion, the drive support portion, and the sealing means in the stock chamber in the present embodiment.
  • the stock chamber 50 has a substantially rectangular cross-sectional shape.
  • high-vacuum evacuation means such as a turbo molecular pump for drawing a high vacuum in the stock chamber 50 as in the film forming chamber 4 and introducing a gas into the stock chamber 50 Means for introducing a gas.
  • the stock room 50 can support a plurality of mask frames F such that the faces of the mask frame F are parallel to each other as shown in FIGS.
  • the stock support portions 51A, 51, 52A, 52, 53, 54 movable back and forth to make the plurality of mask frames F reciprocate in the orthogonal direction (X direction) are provided.
  • a mask frame F selected from the mask frames F stocked in the stock support portions 51A, 51, 52A, 52, 53, 54 is a mask frame
  • a drive support 55 is provided which can be driven in the direction (Y direction) parallel to the plane of F.
  • the upper end of the mask frame F is placed in the stock chamber 50 so that the mask frame F is not inclined when moving the mask frame F in the X direction, Y direction or Z direction.
  • a transportable upper support portion 56 is provided which can be supported.
  • the stock chamber 50 is provided with a sealing means 58 capable of sealing the stock chamber 50.
  • the stock support portions 51A, 51, 52A, 52, 53, 54 are, as shown in FIGS. 3 and 4, a stock placement portion 51A, a stock placement portion 52A, a stock lower support portion 51, 52, and a stock And upper support portions 53, 54.
  • the stock placement portion 51A has a plurality of stock grooves (placement grooves) 51Aa capable of supporting the lower ends of the plurality of mask frames F in the stock chamber 50, and a drive groove 51Ab.
  • the stock placement section 52A includes a plurality of stock grooves (loading grooves) 52Aa capable of supporting the lower ends of the plurality of mask frames F, and a drive groove 52Ab.
  • the stock lower support portions 51, 52 can be raised, lowered, and moved back and forth.
  • the stock lower support portions 51 and 52 contact the lower ends of the plurality of mask frames F placed on the stock grooves 51Aa and 52Aa of the stock placement portions 51A and 52A when the stock lower support portions 51 and 52 ascend in the Z direction.
  • the mask frame F is lifted and can be supported as a raised position in which the mask frame F is separated from the stock placement portions 51A and 52A.
  • the stock lower support portions 51 and 52 are capable of moving back and forth in the direction (X direction) substantially orthogonal to the plane of the mask frame F with the plurality of mask frames F in the raised position.
  • the stock lower support portions 51 and 52 place the mask frame F in the stock grooves 51Aa and 52Aa of the stock placement portions 51A and 52A so that the stock frame support portion 51 and 52 descends in the Z direction after moving the mask frame F back and forth in the X direction.
  • the support of the mask frame F can be released.
  • the stock upper support portions 53, 54 can support and release the upper positions of the plurality of mask frames F which are stocked in the stock placement portions 51A, 52A or supported by the lower stock support portions 51, 52.
  • FIG. 4 there is the structure which abbreviate
  • the stock placement units 51A and 52A are arranged such that mask frames F to be stocked in the stock chamber 50 can be placed in contact with the lower end surfaces of the stock frame 50 respectively. It is disposed at the bottom 50 a of the stock chamber 50 with a spacing in the direction.
  • the placement groove 51Aa extends in the Y direction (horizontal direction) substantially parallel to the surface of the mask frame F so as to be able to support the lower end of the placed mask frame F.
  • a plurality of placement grooves 51Aa are also provided at positions on top of the block-like stock placement portion 51A so as to be separated in the X direction. These placement grooves 51Aa have an equal interval in the X direction.
  • the mounting grooves 51Aa have depths substantially the same, and are provided at substantially the same height direction (Z direction).
  • the drive groove 51Ab is provided at the top of the stock placement portion 51A at a position in the X direction corresponding to a drive roller 55a described later among the plurality of placement grooves 51Aa.
  • the drive groove 51Ab is disposed to coincide with a straight line in the Y direction connecting drive rollers 55a and 55a described later.
  • Drive groove 51Ab is made into the shape which expanded mounting groove 51Aa.
  • the drive groove 51Ab has a shape obtained by enlarging the placement groove 51Aa means that the depth dimension and the width dimension of the drive groove 51Ab are set larger than the depth dimension and the width dimension of the placement groove 51Aa.
  • the drive groove 51Ab has a shape in which the mounting groove 51Aa is enlarged, the shape of the drive groove 51Ab is a stock mounting of the mask frame F driven when the mask frame F is driven by the driving roller 55a described later. It means that it can be transported without interfering with the placement unit 51A.
  • the mask frame F is mounted on a drive roller 55a described later in the lane at the position in the X direction corresponding to the drive groove 51Ab.
  • the stock lower support portions 51 and 52 are disposed at the bottom 50 a of the stock chamber 50 as shown in FIGS. 3 and 4.
  • the stock lower support portion 51 and the stock lower support portion 52 are located inside the contact positions of the stock mounting portions 51A and 52A at both end positions of the lower end of the mask frame F mounted on the stock mounting portions 51A and 52A. In order to be able to abut on the position, it is disposed at an interval slightly narrower than the X-direction interval between the stock placement portion 51A and the stock placement portion 52A.
  • the stock lower support portion 51 is provided at the bottom portion 50 a of the stock chamber 50 as shown in FIGS. 3 and 4.
  • the stock lower support portion 51 has a plurality of concave support grooves 51a, 51a extending in the Y direction substantially parallel to the surface of the mask frame F and spaced apart in the X direction.
  • the stock lower support portion 51 can support the mask frame F in contact with the lower ends of the mask frame F in the support grooves 51a, 51a.
  • the plurality of support grooves 51a, 51a are provided at the top of the groove support base 51b so that the plurality of mask frames F can be moved integrally.
  • the support grooves 51a and 51a are provided at equal intervals in the X direction, similarly to the placement groove 51Aa. In addition, the support grooves 51a, 51a both have substantially the same depth dimension. In each of the support grooves 51a, 51a, the bottom position is set to the substantially same height direction (Z direction) position.
  • the support grooves 51a, 51a are movable from a position higher than the height position of the mounting groove 51Aa to a lower position when the groove support base 51b moves up and down in the Z direction.
  • the support grooves 51a, 51a abut the lower ends of the plurality of mask frames F placed in the stock grooves 51Aa of the stock placement portion 51A, and further the groove supports
  • the base 51b can rise in the Z direction to support the stock groove 51Aa at a distance from the lower ends of the plurality of mask frames F.
  • the plurality of mask frames F are reciprocated in a direction (X direction) substantially orthogonal to the surface of the mask frame F so that the mask frame F does not abut the stock placement portion 51A. Back and forth movement is possible. Further, when the groove support base 51b is lowered in the Z direction, the support grooves 51a, 51a are separated from the lower ends of the plurality of mask frames F, and the plurality of mask frames F can be mounted on the stock grooves 51Aa.
  • the support groove 51a of the stock lower support portion 51 can be disposed smaller than the mounting groove 51Aa of the stock mounting portion 51A. In the present embodiment, while four mounting grooves 51Aa are provided, three support grooves 51a can be provided.
  • the groove support base 51b has an X-direction dimension larger than the arrangement dimension of the support grooves 51a and 51a in the X-direction.
  • the groove support base 51 b is mounted on the X direction restricting portion 51 c extending in the X direction so as to be capable of reciprocating in the X direction.
  • the moving direction of the groove support base 51b is restricted in the X direction by the X-direction restricting portion 51c.
  • the groove support base 51 b is connected to an X drive shaft 51 b 1 extending in the X direction.
  • the X drive shaft 51b1 is connected to an X drive motor 51b2 fixed on the X direction regulating portion 51c.
  • the X-direction restricting portion 51c has an X-direction dimension larger than the dimension of the groove support base 51b in the X-direction.
  • the X-direction restricting portion 51 c is provided in the vicinity of the bottom portion 50 a of the stock chamber 50 so as to extend in the X direction.
  • the X-direction restricting portion 51c is connected to a Z drive shaft 51d erected substantially vertically.
  • the Z drive shaft 51 d is a ball screw or the like.
  • the Z drive shaft 51 d penetrates the bottom portion 50 a of the stock chamber 50 in a sealable manner.
  • the Z drive shaft 51 d is connected to a Z drive motor 51 e disposed outside the chamber 50.
  • the X-direction restricting portion 51 c is attached to a Z-direction restricting portion 51 f erected at the bottom 50 a of the stock chamber 50. The movement in the X-direction restricting portion 51c is restricted in the Z direction by the Z-direction restricting portion 51f.
  • the groove support base 51b, the X drive shaft 51b1, and the X drive motor 51b2, the X direction control unit 51c, the Z drive shaft 51d, the Z drive motor 51e, and the Z direction control unit 51f constitute a stock position exchange drive unit.
  • the stock position exchange driving unit enables the plurality of support grooves 51a and 51a to reciprocate in the X direction and / or the Z direction while maintaining the distance between the plurality of support grooves 51a and 51a in the X direction.
  • X drive motor 51b2 drives X drive shaft 51b1
  • movement of groove support base portion 51b is reciprocated in the X direction with movement direction restricted by X direction restricting portion 51c.
  • Z drive motor 51e drives Z drive shaft 51d, and the movement direction is restricted by Z direction restriction unit 51f. To reciprocate.
  • the stock placement unit 51A for stocking the mask frame F for example, five placement grooves 51Aa are provided, and five mask frames F can be simultaneously supported.
  • the groove support base 51b for moving and replacing the stock position in the mask frame F for example, three support grooves 51a are provided, and three mask frames F can be moved simultaneously.
  • the stock placement unit 51A and the stock placement unit 52A have substantially the same configuration except that the arrangement position in the Y direction is different.
  • the stock placement unit 52A is arranged to be separated by a distance corresponding to the dimension of the stock placement unit 51A and the mask frame F in the Y direction.
  • the stock placement unit 52A is provided such that the positions in the X direction and the Z direction are substantially the same as that of the stock placement unit 51A.
  • the placement groove 52Aa extends in the Y direction (horizontal direction) substantially parallel to the surface of the mask frame F so as to be able to support the lower end of the placed mask frame F.
  • a plurality of placement grooves 52Aa are also provided at the top of the block-shaped stock placement portion 52A so as to be separated in the X direction. These placement grooves 52Aa have an equal interval in the X direction, similarly to the placement grooves 51Aa.
  • the placement grooves 52Aa have depths that are substantially the same and are provided at substantially the same height direction (Z direction). Thus, the plurality of mask frames F are set to be in a substantially parallel state.
  • the drive groove 52Ab is provided at the top of the stock placement portion 52A at a position in the X direction corresponding to a drive roller 55a described later among the plurality of placement grooves 52Aa.
  • Drive groove 52Ab is made into the shape which expanded mounting groove 52Aa.
  • that the drive groove 52Ab has a shape obtained by enlarging the placement groove 52Aa means that the depth dimension and the width dimension of the drive groove 52Ab are set larger than the placement groove 52Aa.
  • the drive groove 52Ab has a shape in which the mounting groove 52Aa is enlarged, the shape of the drive groove 52Ab is the stock mounting of the mask frame F driven when the mask frame F is driven by the driving roller 55a described later. It means that it can be transported without interference with the placement portion 52A.
  • the mask frame F is mounted on a drive roller 55a described later in the lane which is the position in the X direction corresponding to the drive groove 52Ab.
  • the stock lower support portion 52 and the stock lower support portion 51 have substantially the same configuration except that the arrangement position in the Y direction is different.
  • Stock lower support portion 52 is arranged to be separated in the Y direction by a distance corresponding to the Y direction dimension of stock lower support portion 51 and mask frame F.
  • the stock lower support portion 52 is provided such that the positions in the X direction and the Z direction are substantially the same as the positions of the stock lower support portion 51.
  • the stock lower support 52 is provided at the bottom 50 a of the stock chamber 50 as shown in FIGS. 3 and 4.
  • the stock lower support 52 has a plurality of concave support grooves 52a, 52a extending in the Y direction substantially parallel to the surface of the mask frame F and spaced apart in the X direction.
  • the stock lower support portion 52 can support the mask frame F in contact with the lower ends of the mask frame F in the support grooves 52a and 52a.
  • the plurality of support grooves 52a and 52a are provided at the top of the groove support base 52b so that the plurality of mask frames F can be moved integrally.
  • the support grooves 52a, 52a are provided at equal intervals in the X direction, similarly to the support groove 51a.
  • the support grooves 52a and 52a both have substantially the same depth dimension.
  • the bottom position of each of the support grooves 52a and 52a is set to the substantially same height direction (Z direction) position.
  • the support grooves 52a and 52a are movable from a position higher than the height position of the mounting groove 52Aa to a position lower than the height position of the mounting groove 52Aa when the groove support base 52b moves up and down in the Z direction.
  • the support grooves 52a and 52a abut the lower ends of the plurality of mask frames F placed in the stock grooves 52Aa of the stock placement portion 52A, and further the groove support The base 52b can rise in the Z direction to support the stock groove 52Aa at a distance from the lower ends of the plurality of mask frames F.
  • the plurality of mask frames F are reciprocated in a direction (X direction) substantially orthogonal to the surface of the mask frame F so that the mask frame F does not abut the stock placement portion 52A. Back and forth movement is possible. Further, when the groove support base 52b descends in the Z direction, the support grooves 52a, 52a are separated from the lower ends of the plurality of mask frames F, and the plurality of mask frames F can be mounted on the stock grooves 52Aa.
  • the support groove 52a of the stock lower support portion 52 can be disposed smaller than the mounting groove 52Aa of the stock mounting portion 52A.
  • the support groove 52Aa of the stock mounting portion 52A similarly to the under-stock support portion 51 and the stock placement portion 51A, while four placement grooves 52Aa are provided, three support grooves 52a can be provided.
  • the groove support base 52b has an X-direction dimension larger than the arrangement dimension of the support grooves 52a and 52a in the X-direction.
  • the groove support base 52 b is mounted on the X direction restricting portion 52 c extending in the X direction so as to be capable of reciprocating in the X direction.
  • the moving direction of the groove support base 52b is restricted in the X direction by the X-direction restricting portion 52c.
  • the groove support base 52b is connected to an X drive shaft 52b1 extending in the X direction.
  • the X drive shaft 52b1 is connected to an X drive motor 5122 fixed on the X direction restricting portion 52c.
  • the X-direction restricting portion 52c has an X-direction dimension larger than the dimension of the groove support base 52b in the X-direction.
  • the X-direction restricting portion 52c is provided in the vicinity of the bottom portion 50a of the stock chamber 50 so as to extend in the X direction.
  • the X-direction restricting portion 52c is connected to a Z drive shaft 52d erected substantially vertically.
  • the Z drive shaft 52 d is a ball screw or the like.
  • the Z drive shaft 52 d penetrates the bottom portion 50 a of the stock chamber 50 in a sealable manner.
  • the Z drive shaft 52 d is connected to a Z drive motor 52 e disposed outside the chamber 50.
  • the X-direction restricting portion 52 c is attached to a Z-direction restricting portion 52 f erected at the bottom 50 a of the stock chamber 50. The movement in the X-direction restricting portion 52c is restricted in the Z direction by the Z-direction restricting portion 52f.
  • the groove support base 52b, the X drive shaft 52b1, and the X drive motor 52b2, the X direction restricting portion 52c, the Z drive shaft 52d, the Z drive motor 52e, and the Z direction restricting portion 52f constitute a stock position exchange drive portion.
  • the stock position exchange driving unit enables the plurality of support grooves 52a and 52a to reciprocate in the X direction and / or the Z direction while maintaining the distance between the plurality of support grooves 52a and 52a in the X direction.
  • X drive motor 52b2 drives X drive shaft 52b1
  • movement of groove support base 52b is reciprocated in the X direction with movement direction restricted by X direction restricting unit 52c.
  • Z drive motor 52e drives Z drive shaft 52d
  • the movement direction is regulated by Z direction regulation unit 52f
  • X direction regulation unit 52c is in the Z direction.
  • the stock placement unit 52A for stocking the mask frame F for example, five placement grooves 52Aa are provided, and it is possible to simultaneously support five mask frames F.
  • the groove support base 52b for moving and exchanging the stock position in the mask frame F for example, three support grooves 52a are provided, and three mask frames F can be moved simultaneously.
  • the stock position exchange driving units 51b to 51f and the stock position exchange driving units 52b to 52f can be driven synchronously.
  • the support grooves 51a, 51a and the support grooves 52a, 52a can be synchronously driven in the Z direction and the X direction.
  • the drive units synchronized in the lower stock support portions 51 and 52 such as the X drive motor 51b2 and the X drive motor 52b2, the Z drive motor 51e and the Z drive motor 52e, can be driven by one motor. You can also.
  • the stock lower support portions 51 and 52 can support the vicinity of both ends of one mask frame F in the Y direction by the support grooves 51a and the support grooves 52a located at corresponding positions in the X direction. Further, in the stock lower support portions 51 and 52, the vicinity of both ends of one mask frame F in the Y direction can be moved by the support grooves 51a and the support grooves 52a located at corresponding positions in the X direction. That is, the mask frame F is mounted on the support groove 51a of the groove support base 51b and the support groove 52a of the groove support base 52b by driving the stock position exchange driving units 51b to 52f, and the stock placement portion 51A and the stock The placement position can be changed by moving in the X direction with respect to the placement unit 52A.
  • the support groove 51a and the support groove 52a are at corresponding positions in the X direction means that the support groove 51a and the support groove 52a are located on the same straight line extending in the Y direction.
  • the drive groove 51Ab and the drive groove 52Ab are provided at corresponding positions in the X direction.
  • the drive groove 51Ab and the drive groove 52Ab are at corresponding positions in the X direction means that the drive groove 51Ab and the drive groove 52Ab are positioned on the same straight line extending in the Y direction. means.
  • a support groove 51a illustrated on the rightmost side of the stock lower support portion 51 and a support groove 52a illustrated on the rightmost side of the stock lower support portion 52 are mutually corresponding positions in the X direction.
  • the support groove 51a illustrated n-th from the right in the stock lower support portion 51 and the n-th illustrated in the right in the stock lower support portion 52 The support grooves 52a are at positions corresponding to each other in the X direction.
  • n is a natural number.
  • the number of support grooves 51a is smaller than the total number of placement grooves 51Aa (including drive grooves 51Ab) which are stock numbers set in advance and the take-out support grooves 58ga of the take-out support portion 58g described later.
  • the number of support grooves 52a is smaller than the total number of mounting grooves 52Aa (including drive grooves 52Ab), which are stock numbers set in advance, and the take-out support grooves 58ga of the take-out support portion 58g described later.
  • a single mask frame F is supported by the corresponding support grooves 51a and 52a.
  • the single mask frame F is movable in the X direction while being supported by the support grooves 51a and the support grooves 52a.
  • the stock upper support portion 53 and the stock upper support portion 54 can support and release the upper side of the plurality of mask frames F stocked in the lower stock support portion 51 and the lower stock support portion 52 as shown in FIGS. 3 and 4. Be done. Further, the stock upper support portion 53 and the stock upper support portion 54 can reciprocate in the X direction in synchronization with the operation of the stock lower supports 51 and 52 in the X direction. Note that, in FIG. 4, the configuration of the stock upper support portion 53 and the stock upper support portion 54 is omitted.
  • the stock upper support portion 53 has a plurality of sandwiching portions 53a.
  • the plurality of sandwiching portions 53a sandwich and support the vicinity of the upper end of the mask frame F.
  • the plurality of sandwiching portions 53a sandwich and support the vicinity of the corner portions located at both ends in the left-right direction (Y direction) at the upper end of the mask frame F.
  • the stock upper support portion 53 has an X rotation drive portion 53rx.
  • the X rotation drive unit 53 rx drives the holding unit 53 a in a substantially horizontal direction (X direction) perpendicular to the mask surface (ZY plane).
  • the X rotation drive unit 53 rx can adjust the position in the X direction by driving the holding unit 53 a.
  • the X rotation drive unit 53rx also rotates the holding unit 53a in the YZ plane substantially parallel to the mask surface.
  • the X rotation drive unit 53 rx enables locking and releasing of the mask frame F by the holding unit 53 a.
  • the stock upper support portion 53 has a rotation shaft 53 c extending in the X direction.
  • a pinching portion 53a is provided at the tip of the rotary shaft 53c.
  • the sandwiching portion 53a has a plurality of sandwiching pieces 53b and 53b.
  • the plurality of sandwiching pieces 53b, 53b abut on the front surface and the rear surface of the mask frame F at the upper end of the stocked mask frame F, respectively.
  • the plurality of sandwiching pieces 53b, 53b are spaced apart in the axial direction of the rotation shaft 53c.
  • the distance between the holding pieces 53b and 53b in the axial direction of the rotation shaft 53c is substantially equal to or slightly larger than the thickness of the mask frame F.
  • the plurality of sandwiching pieces 53b, 53b are both fixed in parallel to each other in the YZ direction which is the radial direction of the rotation shaft 53c.
  • an X rotation drive unit 53rx is connected to the base end side of the rotation shaft 53c.
  • the rotation shaft 53c extends in the X direction.
  • the proximal end side of the rotation shaft 53 c is arranged to extend to the outside of the stock chamber 50.
  • the rotating shaft 53c and the sandwiching pieces 53b and 53b are disposed to intersect with each other so as to be substantially orthogonal to each other.
  • the tip end side of the rotating shaft 53c is connected to the sandwiching pieces 53b, 53b.
  • the rotation shaft 53c For example, four holding pieces 53b and 53b are provided on the rotation shaft 53c.
  • a single mask frame F can be held between the adjacent clamping pieces 53b and 53b. Therefore, the sandwiching portion 53a can hold three mask frames F.
  • the number of holding pieces 53b corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 51A.
  • the height in the Z direction at which the rotation shaft 53c is disposed is a height position at which the upper end of the mask frame F, which is raised and lowered by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction, does not abut.
  • the length dimension of the holding pieces 53b, 53b is such that the upper end of the mask frame F can be supported even if the mask frame F is moved up and down by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction. .
  • the holding portion 53a can maintain the upper end of the mask frame F.
  • convex portions 53e may be provided so as to be positioned on the inner side surfaces facing each other.
  • the convex portions 53 e in point contact with the front surface and the rear surface of the mask frame F.
  • the convex portions 53e facing each other can be urged in the direction in which they approach each other, similarly to the convex portions 13Ad and 13Ae described later.
  • the rotation shaft 53c extends in a substantially horizontal direction (X direction) perpendicular to the mask surface, and is rotatable around the axis of the rotation shaft 53c.
  • the rotation shaft 53c can be advanced and retracted in the axial direction (X direction) of the rotation shaft 53c.
  • a plurality of sandwiching pieces 53b, 53b to be the sandwiching part 53a are fixedly connected in the direction of the axis of the rotating shaft 53c so as to protrude in the radial direction of the rotating shaft 53c.
  • the motor of the X rotation drive unit 53rx is connected to the base end of the rotation shaft 53c, and the rotation shaft 53c can be driven around the axis of the rotation shaft 53c.
  • a motor (not shown) is fixed to a flat plate portion extending in parallel with the mask surface (YZ surface).
  • the rotation shaft 53 c is driven in the X direction by driving the flat plate unit by the X drive unit.
  • the sandwiching portion 53a is driven in the X direction integrally with the rotating shaft 53c when the rotating shaft 53c is driven in the X direction.
  • An X drive unit (not shown) is screwed with an X motor, which is a stepping motor, an X rotation shaft rotationally driven by the X motor and extending in the X direction, and in the axial direction of the X rotation shaft. It has an X position restricting portion capable of relative movement, and an X restricting portion that restricts the movement of the X position restricting portion and the X motor in the X direction.
  • the X position regulation unit connected to the tip of the X rotation shaft is flat when the tip of the X rotation shaft can be turned by turning the X rotation shaft by the X motor. Move in the X direction with respect to the part.
  • the movement direction of the X position regulating unit is regulated by the X regulating unit.
  • the flat plate portion (not shown) is a side portion of the stock chamber (chamber) 50.
  • the stock upper support portion 53 can adjust the position of the holding portion 53a with the degree of freedom in the X direction.
  • the stock upper support portion 53 is fixed to the side of the stock chamber (chamber) 50.
  • illustration of X rotation drive part 53rx etc. is abbreviate
  • the X drive unit of the X rotation drive unit 53rx is movable in the X direction.
  • the operation in the X direction in the X drive portion of the X rotation drive portion 53rx is the stock position change drive portion of the stock position exchange drive portions 51b, 51c, 51d, 51e, 51f of the stock lower support portion 51 and / or the stock lower support portion 52. It can be synchronized with the operation in the X direction at 52b, 52c, 52d, 52e, 52f. Thereby, the stock mask frame F is moved in the X direction.
  • the X rotation driving unit 53rx is not limited to the above configuration as long as the holding unit 53a can be reciprocated in the X direction and can be rotated around the rotation shaft 53c.
  • the rotation shaft 53c is driven around the axis of the rotation shaft 53c by the X rotation drive portion 53rx.
  • the angular position of the holding portion 53a around the axis of the rotating shaft 53c is set.
  • the angle of the holding portion 53a is set so as not to interfere with the mask frame F carried into the stock position from the outside.
  • the holding piece 53b can be upward in the Z direction with respect to the rotation shaft 53c.
  • the X rotation axis is rotated by the X motor of the X drive unit to move the X position regulation unit in the X direction.
  • the rotary shaft 53c is driven in the X direction to set the position of the holding portion 53a in the X direction, and the upper end of the mask frame F is positioned between the predetermined holding pieces 53b and 53b.
  • the X rotation driver 53 rx rotates the rotation shaft 53 c around the axis of the rotation shaft 53 c.
  • the pinching pieces 53b and the pinching pieces 53b adjacent to each other in the pinching portion 53a abut on the front and back surfaces of the upper end of the mask frame F.
  • the angular position of the holding portion 53a around the axis of the rotation shaft 53c is set by the X rotation driving portion 53rx.
  • the convex part 53e abuts near the upper end of the front surface and the rear surface of the mask frame F.
  • the holding portion 53a holds the upper end of the mask frame F.
  • the X rotation driving unit 53rx In this state, in the X rotation driving unit 53rx, the X rotation axis is rotated by the X driving unit to move the X position regulating unit in the X direction. Thereby, the rotating shaft 53c is driven in the X direction. At this time, the drive in the X direction on the rotating shaft 53 c is synchronized with the drive in the X direction on the stock lower support portions 51 and 52. This makes it possible to set the position of the mask frame F in the X direction in the stocked state. As a drive range in the axial direction (X direction) of the rotation shaft 53c, the position in the YZ plane is shifted from the takeout upper support portion 58h described later. As a result, the rotation shaft 53c and the holding portion 53a are set in a range that does not interfere with the upper support portion 58h.
  • a motor of an X rotation drive portion 53rx which is a drive system of the stock upper support portion 53 and an X motor of the X drive portion are disposed outside the stock chamber (chamber) 50. Therefore, the adjustment of the angular position of the sandwiching portion 53a around the axis of the rotating shaft 53c is performed from the outside of the stock chamber (chamber) 50. Further, the position adjustment of the holding portion 53a in the direction parallel to the axis of the rotating shaft 53c is also performed from the outside of the stock chamber (chamber) 50. Thereby, the dust generated from the drive system of the stock upper support portion 53 can be prevented from diffusing (falling) into the stock chamber (chamber) 50.
  • the stock upper support portion 54 and the stock upper support portion 53 are arranged side by side in the Y direction which is the left-right direction.
  • the stock upper support portion 54 and the stock upper support portion 53 are provided so as to have a substantially symmetrical configuration with respect to the center line (Z direction, gravity direction) of the mask frame F, as shown in FIG. .
  • the stock upper support portion 54 has a plurality of sandwiching portions 54 a.
  • the plurality of sandwiching portions 54 a sandwich and support the vicinity of the upper end of the mask frame F.
  • the plurality of sandwiching portions 54a sandwich and support the vicinity of the corner portions at positions which are both ends in the left-right direction (Y direction) at the upper end of the mask frame F.
  • the stock upper support portion 54 includes an X rotation drive portion 54rx.
  • the X rotation drive unit 54rx drives the holding unit 54a in a substantially horizontal direction (X direction) perpendicular to the mask surface (ZY plane).
  • the X rotation drive unit 54 rx can adjust the position in the X direction by driving the holding unit 54 a.
  • the X rotation drive unit 54rx also rotates the holding unit 54a in the YZ plane substantially parallel to the mask surface.
  • the X rotation driving unit 54rx enables locking and releasing of the mask frame F by the holding unit 54a.
  • the stock upper support portion 54 has a rotation axis 54c extending in the X direction.
  • a pinching portion 54a is provided at the tip of the rotary shaft 54c.
  • the sandwiching portion 54a has a plurality of sandwiching pieces 54b and 54b.
  • the plurality of sandwiching pieces 54b, 54b abut on the front surface and the rear surface at the end of the stocked mask frame F, respectively.
  • the plurality of sandwiching pieces 54b, 54b are disposed apart from each other on a rotating shaft 54c extending in the X direction.
  • the holding pieces 54b, 54b are arranged such that the distance between them in the axial direction of the rotating shaft 54c is substantially equal to or slightly larger than the thickness of the mask frame F.
  • the plurality of sandwiching pieces 54b, 54b are both fixed in parallel to each other in the YZ direction in which the base ends thereof are in the radial direction of the rotation shaft 54c.
  • an X rotation drive unit 54rx is connected to the base end side of the rotation shaft 54c.
  • the rotation axis 54c extends in the X direction.
  • the proximal end side of the rotating shaft 54 c is arranged to extend to the outside of the stock chamber 50.
  • the rotating shaft 54c and the holding pieces 54b, 54b are disposed to intersect with each other so as to be substantially orthogonal to each other.
  • the tip end side of the rotating shaft 54c is connected to the holding pieces 54b and 54b.
  • the number of holding pieces 54b corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 52A.
  • the height in the Z direction at which the rotation shaft 54c is disposed is a height position at which the upper end of the mask frame F, which is raised and lowered by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction, does not abut.
  • the length dimension of the holding pieces 54b, 54b is such that the upper end of the mask frame F can be supported even if the mask frame F is raised or lowered by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction. .
  • the sandwiching portion 54a can maintain the upper end of the mask frame F.
  • a convex portion 54e may be provided so as to be positioned on the inner side facing each other.
  • the convex portions 54 e in point contact with the front surface and the back surface of the mask frame F, respectively.
  • the convex portions 54e facing each other can be urged in the direction in which they approach each other so as to sandwich the mask frame F, similarly to the convex portions 14Ad and 14Ae described later.
  • the rotation shaft 54c extends in a substantially horizontal direction (X direction) perpendicular to the surface of the mask frame F, as shown in FIG. 3, and is rotatable around the axis of the rotation shaft 54c.
  • the rotating shaft 54c can be advanced and retracted in a direction (X direction) which is an axis of the rotating shaft 54c.
  • a plurality of sandwiching pieces 54b, 54b to be the sandwiching part 54a are connected and fixed to the tip of the rotary shaft 54c in the direction of the axis of the rotary shaft 54c so as to protrude in the radial direction of the rotary shaft 54c.
  • the motor of the X rotation drive unit 54rx is connected to the base end of the rotation shaft 54c, and the rotation shaft 54c can be driven around the axis of the rotation shaft 54c.
  • a motor (not shown) is fixed to a flat plate portion extending in parallel with the mask surface (YZ surface).
  • the rotation shaft 54c is driven in the X direction by driving the flat plate unit by the X drive unit.
  • the sandwiching portion 54a is driven in the X direction integrally with the rotary shaft 54c when the rotary shaft 54c is driven in the X direction.
  • An X drive unit (not shown) is screwed with an X motor, which is a stepping motor, an X rotation shaft rotationally driven by the X motor and extending in the X direction, and in the axial direction of the X rotation shaft. It has an X position restricting portion capable of relative movement, and an X restricting portion that restricts the movement of the X position restricting portion and the X motor in the X direction.
  • the X position regulation unit connected to the tip of the X rotation shaft is flat when the tip of the X rotation shaft can be turned by turning the X rotation shaft by the X motor. Move in the X direction with respect to the part.
  • the movement direction of the X position regulating unit is regulated by the X regulating unit.
  • the flat plate portion (not shown) is a side portion of the stock chamber (chamber) 50.
  • the stock upper support portion 54 can adjust the position of the holding portion 54 a with the freedom in the X direction, and is fixed to the side of the stock chamber (chamber) 50.
  • the X drive unit of the X rotation drive unit 54rx is movable in the X direction.
  • the operation in the X direction in the X drive portion of the X rotation drive portion 54rx is the X drive portion of the X rotation drive portion 53rx, stock position exchange drive portions 51b, 51c, 51d, 51e, 51f of the stock lower support portion 51, and stock It is possible to synchronize with the operation in the X direction in the stock position exchange driving units 52b, 52c, 52d, 52e, 52f of the lower support unit 52.
  • the X rotation driving unit 54rx, the X rotation driving unit 53rx, the stock position exchange driving units 51b, 51c, 51d, 51e and 51f, and the stock position exchange driving units 52b, 52c, 52d, 52e and 52f are synchronized in the X direction.
  • the stock mask frame F is moved in the X direction.
  • the X rotation drive unit 54rx is not limited to the above configuration as long as the holding unit 54a can be reciprocated in the X direction and can be rotated around the rotation shaft 54c.
  • the rotation shaft 54c is driven around the axis of the rotation shaft 54c by the X rotation drive portion 54rx.
  • the angular position of the holding portion 54a is set around the axis of the rotation shaft 54c.
  • the angle of the holding portion 54a is set to a position that does not interfere with the mask frame F carried to the stock position from the outside.
  • the holding piece 54b can be upward in the Z direction with respect to the rotation shaft 54c.
  • the X rotation axis is rotated by the X motor of the X driving unit to move the X position regulating unit in the X direction.
  • the rotary shaft 54c is driven in the X direction to set the position of the holding portion 54a in the X direction so that the upper end of the mask frame F is positioned between the predetermined holding pieces 54b and 54b.
  • the rotation shaft 54c is rotated about the axis by the X rotation drive unit 54rx.
  • the pinching pieces 54b and the pinching pieces 54b adjacent to each other in the pinching portion 54a contact the front and back surfaces of the upper end of the mask frame F.
  • the angular position of the sandwiching portion 54a around the axis of the rotating shaft 54c is set by the X rotation drive portion 54rx.
  • the convex part 54e abuts near the upper end of the front surface and the rear surface of the mask frame F.
  • the holding portion 54a holds the upper end of the mask frame F.
  • the X rotation axis is rotated by the X driving unit to move the X position regulating unit in the X direction.
  • the rotating shaft 54c is driven in the X direction.
  • the drive of the rotation shaft 54c in the X direction is synchronized with the drive of the stock lower support portions 51 and 52 in the X direction.
  • the position of the mask frame F in the X direction in the stocked state is set.
  • the position in the YZ plane is a position shifted from the takeout upper support portion 58h described later.
  • the rotation shaft 54c and the holding portion 54a are set in a range that does not interfere with the removal upper support portion 58h.
  • the motor of the X rotation drive portion 54rx and the X motor of the X drive portion are disposed at the outside position of the stock chamber (chamber) 50. Therefore, the angular position adjustment around the axis of the rotating shaft 54c in the holding portion 54a is performed from the outside of the stock chamber (chamber) 50. Further, position adjustment in the axial direction of the rotating shaft 54 c in the holding portion 54 a is performed from the outside of the stock chamber (chamber) 50. Thereby, it is possible to prevent the dust generated from the drive system of the stock upper support portion 54 from diffusing (falling) into the stock chamber (chamber) 50.
  • the mask frame F at the position in the X direction corresponding to the drive groove 51Ab and the drive groove 52Ab can be mounted.
  • the drive support portion 55 abuts on the lower end of the placed mask frame F, and can drive the mask frame F in the surface direction (Y direction).
  • the drive support unit 55 includes a drive roller 55 a and a rotation drive unit 55 b that rotationally drives the drive roller 55 a.
  • FIG. 4 there is the structure which abbreviate
  • the drive support portion 55 is the drive groove 51Ab and the second drive lane from the right, that is, the third lane (stock position) from the left. It arrange
  • the lower end of the mask frame F placed in the placement groove 51Aa and the placement groove 52Aa and the lower end of the mask frame F placed on the plurality of drive rollers 55a all have the same height.
  • the upper end position of the drive roller 55a is set so as to be the vertical (Z direction) position.
  • a plurality of drive support portions 55 are provided in the Y direction in the stock chamber (chamber) 50.
  • axial directions of the plurality of drive rollers 55a are provided in parallel.
  • the drive support portion 55 is located between the stock placement portion 51A and the stock placement portion 52A.
  • the drive support portion 55 is capable of moving the mask frame F in the Y direction. Although three drive support portions 55 are shown in FIG. 3, the number of drive support portions 55 is not limited to this.
  • the drive support portion 55 in addition to the position between the stock placement portion 51A and the stock placement portion 52A in the Y direction, the outside of the stock placement portion 51A and the stock placement portion 52A in the Y direction
  • the drive support portion 55 may be provided at the following position. Even in this case, in the drive support portion 55, in the stock placement portions 51A and 52A of the figure, a straight line connecting the second placement groove 51Aa and the placement groove 52Aa from the right, that is, the third from the left, is extended.
  • the drive roller 55a is disposed to be positioned on a straight line.
  • the arrangement interval of the drive support portions 55 in the Y direction is set smaller than the length dimension of the mask frame F in the Y direction. Furthermore, the arrangement interval of the drive support portions 55 in the Y direction can be appropriately set according to the weight of the mask frame F, the accuracy of position control, and the like. The plurality of drive support portions 55 are driven and controlled appropriately in synchronization with the position of the mask frame F to be transported.
  • the drive roller 55a has an axis extending in the X direction, which is the direction in which the plurality of placement grooves 51Aa are disposed.
  • the drive roller 55a has an axis extending in the X direction orthogonal to a straight line connecting the drive groove 51Ab and the drive groove 52Ab.
  • the rotation drive unit 55 b supports the drive roller 55 a so as to be rotationally drivable. The upper end of the drive roller 55a is projected from the top of the rotation drive unit 55b.
  • a rotation drive motor 55e is connected to the rotation drive unit 55b.
  • the rotary drive motor 55 e is fixed to the outside of the bottom 50 a of the stock chamber 50.
  • the rotary drive motor 55 e may be fixed to the outside of the side portion 50 b of the stock chamber 50.
  • the drive roller 55 a is fixed in position in the XY plane with respect to the stock chamber 50.
  • the driving roller 55a is at such a height position that the mask frame F placed on the support grooves 51a and 52a does not interfere when the mask frame F placed on the support grooves 51a and 52a moves in the X direction. Provided.
  • the driving of the respective driving rollers 55a is synchronized with each other, and it is possible to drive one mask frame F in which the plurality of driving rollers 55a are simultaneously in contact in the Y direction.
  • the transport upper support portion 56 is provided at the top 50 c of the stock chamber 50 as shown in FIGS. 3 and 4.
  • the transport upper support portion 56 is provided at a position between the stock upper support portion 53 and the stock upper support portion 54 in the Y direction.
  • the transport upper support portion 56 supports the upper end of the mask frame F so as not to tilt when the mask frame F is moved in the Y direction.
  • the transport upper support portion 56 can release the support of the mask frame F when moving the stock mask frame F in the X direction by the stock support portions 51, 52, 53, 54.
  • the transport upper support portion 56 includes an upper magnet portion 56a, sandwiching portions 56b and 56c, and a Z drive portion 56f.
  • the upper magnet portion 56a is provided at a position in the X direction corresponding to the drive roller 55a.
  • the upper magnet portion 56a is vertically movable in the Z direction.
  • the upper magnet portion 56a extends in the Y direction.
  • the holding portions 56 b and 56 c are separated from the upper magnet portion 56 a in the X direction and the Y direction.
  • the holding portions 56b and 56c can be moved up and down in the Z direction as an integral part of the upper magnet portion 56a.
  • the Z drive unit 56f reciprocates the upper magnet unit 56a and the holding units 56b and 56c in the Z direction.
  • the Z drive unit 56f enables locking and releasing of the mask frame F.
  • the sandwiching portion 56 b and the sandwiching portion 56 c are arranged side by side in the Y direction which is the left-right direction.
  • the holding portion 56 b and the holding portion 56 c are respectively located at both ends of the upper magnet portion 56 a.
  • the holding portion 56 b and the holding portion 56 c are provided so as to have a substantially symmetrical configuration with respect to the center line (Z direction, gravity direction) of the upper magnet portion 56 a.
  • the sandwiching portion 56b is provided with a plurality of sandwiching pieces 56b1 and 56b1 that project downward in the Z direction with respect to the upper magnet portion 56a.
  • the plurality of sandwiching pieces 56b1 and 56b1 can be in contact with the front and back surfaces at the end of the stocked mask frame F, respectively.
  • the plurality of sandwiching pieces 56b1 and 56b1 are provided at the connecting portion 56b2 extending in the X direction.
  • the holding pieces 56b1 and 56b1 are in parallel with each other.
  • the distance in the X direction between the holding pieces 56b1 and 56b1 is set to be substantially equal to or slightly larger than the thickness of the mask frame F.
  • the sandwiching pieces 56b1 and 56b1 are spaced apart in the extending X direction of the connection portion 56b2.
  • connection portion 56b2 extends in a substantially horizontal direction (X direction) perpendicular to the surface of the mask frame F, as shown in FIG. Further, the upper side of the connection portion 56b2 is connected to one end of the Z support portion 56d in the Y direction.
  • the Z support portion 56 d extends to the outside of the stock chamber 50.
  • the upper end side of the Z support portion 56d is connected to the Z drive portion 56f.
  • the Z support portion 56d can be moved up and down in the Z direction by the Z drive portion 56f.
  • the proximal ends of the plurality of sandwiching pieces 56b1 and 56b1 are all connected and fixed to the connection portion 56b2.
  • the plurality of holding pieces 56b1 and 56b1 are in parallel with each other. For example, four holding pieces 56b1 and 56b1 are provided.
  • a single mask frame F can be held between the adjacent holding pieces 56b1 and 56b1.
  • the number of holding pieces 56b1 corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 52A.
  • convex portions 56e may be provided so as to be positioned on the inner side surfaces facing each other.
  • the convex portions 56 e face each other in point contact with the front surface and the back surface of the mask frame F.
  • the convex portions 56e facing each other can be urged in the direction in which they approach each other so as to sandwich the mask frame F, similarly to the convex portions 14Ad and 14Ae described later.
  • the sandwiching portion 56c is provided with a plurality of sandwiching pieces 56c1 and 56c1 that project downward in the Z direction with respect to the upper magnet portion 56a.
  • the plurality of sandwiching pieces 56c1 and 56c1 can be in contact with the front surface and the back surface at the end of the stocked mask frame F, respectively.
  • the plurality of sandwiching pieces 56c1 and 56c1 are provided at a connecting portion 56c2 extending in the X direction.
  • the holding pieces 56c1 and 56c1 are in parallel with each other.
  • the distance in the X direction between the holding pieces 56c1 and 56c1 is substantially equal to or slightly larger than the thickness of the mask frame F.
  • the sandwiching pieces 56c1 and 56c1 are spaced apart in the extending X direction of the connection portion 56c2.
  • connection portion 56c2 extends in a substantially horizontal direction (X direction) perpendicular to the surface of the mask frame F, as shown in FIG. Further, the upper side of the connection portion 56c2 is connected to the Z support portion 56d at a position opposite to the end portion of the Z support portion 56d connected to the connection portion 56b2 in the Y direction.
  • the connecting portion 56c2 is movable in the Z direction integrally with the connecting portion 56b2 and the Z support portion 56d.
  • the clamping pieces 56b1 and 56b1 and the clamping pieces 56c1 and 56c1 all extend in the Z direction. Therefore, even when the connection portion 56c2, the connection portion 56b2 and the Z support portion 56d move up and down in the Z direction, the extending directions of the holding pieces 56b1 and 56b1 and the holding pieces 56c1 and 56c1 do not change.
  • the bases of the sandwiching pieces 56c1 and 56c1 are both connected and fixed to the connection portion 56c2.
  • the plurality of sandwiching pieces 56c1 and 56c1 are in parallel with each other.
  • four sandwiching pieces 56c1 and 56c1 are provided.
  • the mask frame F can be held one by one between the pinching piece 56c1 and the pinching piece 56c1 adjacent to each other.
  • the number of holding pieces 56c1 corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 52A.
  • the protrusions 56e may be provided on the tips of the holding pieces 56c1 and 56c1 so as to be positioned on the inner side surfaces facing each other.
  • the convex portions 56 e face each other in point contact with the front surface and the back surface of the mask frame F.
  • the convex portions 56e facing each other can be urged in the direction in which they approach each other so as to sandwich the mask frame F, similarly to the convex portions 14Ad and 14Ae described later.
  • the Z drive unit 56 f is disposed outside the stock chamber 50.
  • the Z support portion 56d penetrates the top 50c of the stock chamber 50 so as to maintain the sealed state.
  • the Z support portion 56d is disposed so as to be extensible and retractable by the Z drive portion 56f.
  • the Z support unit 56d and the holding units 56b and 56c are integrally made movable in the Z direction.
  • the Z support unit 56d and the holding units 56b and 56c can be advanced and retracted in the Z direction so as not to change their postures.
  • the Z drive unit 56f causes the upper magnet unit 56a and the sandwiching units 56b and 56c of the transport upper support unit 56 to move in the Z direction in advance when the upper stock support units 53 and 54 and the lower stock support units 51 and 52 operate in the X direction. Move upwards. Thereby, the upper magnet portion 56a, the holding piece 56b1 and the holding piece 56c1 do not interfere with the mask frame F moved in the X direction. As a result, one or a plurality of mask frames F are supported by the sliders F5 at the lower end by the support grooves 51a and 52a of the stock lower support portions 51 and 52, and at the same time, the upper end is moved by the upper stock support 53 and 54. In the supported state, the one or a plurality of mask frames F are moved in the X direction by the Z drive unit 56f, the upper magnet unit 56a, the sandwiching piece 56b1 and the sandwiching piece 56c1.
  • the upper stock support portions 53 and 54 and the lower stock support portions 51 and 52 are moved in the X direction.
  • the mask frame F supported at the lower end portion of the slider F5 by the support grooves 51a and 52a is moved in the X direction.
  • the upper magnet unit 56a and the sandwiching units 56b and 56c are moved downward in the Z direction.
  • the mask frame F is again supported by the transport upper support portion 56.
  • the upper magnet portion 56 a has a plurality of magnets extending in the Y direction parallel to the transport direction of the mask frame F.
  • the magnets of the upper magnet portion 56a attract each other with the upper frame support F6 provided at the upper end of the mask frame F as described later. Further, the magnet of the upper magnet portion 56a forms a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
  • the upper magnet portion 56 a is arranged to have substantially the same cross section in the entire length of the transport upper support portion 56 in the Y direction.
  • the upper magnet portion 56a attracts the upper frame support F6 of the mask frame F by a magnetic circuit formed in the XZ plane.
  • a magnetic circuit formed between the upper magnet portion 56a and the upper frame support F6 is formed along the entire length of the transport upper support portion 56 in the Y direction.
  • the upper magnet portion 56a and the mask frame F are attracted to each other and supported. At this time, it is necessary that the upper magnet portion 56a and the mask frame F have a predetermined Z-direction distance, and that the upper frame support F6 of the mask frame F be positioned directly below the upper magnet portion 56a.
  • the upper magnet portion 56a attracts and supports the upper side of the mask frame F in the transport upper support portion 56. . Thereby, the mask frame F can be moved in the Y direction.
  • the mask frame F supported at the lower end portion of the slider F5 by the mounting grooves 51Aa and 52Aa also supports the upper side of the mask frame F.
  • the Z support portion 56d is raised by the Z drive portion 56f. Thereby, the distance between the upper end of the mask frame F and the upper magnet portion 56a is separated. Thus, the magnetic circuit formed in the XZ plane by the upper magnet portion 56a and the upper frame support F6 is released. Thereby, the upper magnet portion 56a releases the attraction and support of the upper portion of the mask frame F.
  • the Z driving unit 56 f lowers the Z support unit 56 d. Thereby, the distance between the upper end of the mask frame F and the upper magnet portion 56a is reduced. Thereby, the magnetic circuit formed in the XZ plane by the upper magnet portion 56a and the upper frame support F6 is reformed. Thus, the upper magnet portion 56a starts attracting and supporting the mask frame F.
  • the upper magnet portion 56a of the transport upper support portion 56 and the upper frame support F6 of the mask frame F form a magnetic circuit in the XZ plane in substantially the same manner as the entire length in the Y direction.
  • the upper magnet portion 56a and the upper frame support F6 it is possible to uniformly set the attraction force to each other over the entire length of the upper frame support F6 in the Y direction. Therefore, the inclination of the mask frame F can be prevented reliably.
  • the sealing means 58 As the sealing means 58, as shown in FIG.1, FIG.3, FIG.4, it has the carrying-in / out port 58b and the mask taking-out filling port 58c.
  • the loading / unloading port 58 b has a dividing valve 58 a that connects the stock chamber 50 and the film forming chamber 4.
  • the loading / unloading port 58 b is provided at the position of the side portion 50 b in the Y direction of the stock chamber 50.
  • the mask take-out and filling port 58 c is provided at the position of the side portion 50 b in the X direction of the stock chamber 50.
  • the loading / unloading port 58b is connected to the film forming chamber (chamber) 4 via the dividing valve 58a, as shown in FIGS.
  • the loading / unloading port 58b closes the mask take-out / filling port 58c and brings the stock chamber 50 into a sealed state with the outside.
  • the loading / unloading port 58b is opened at the time of mask replacement with respect to the film forming position in the chamber 4. Thereby, the loading / unloading port 58 b communicates with the chamber 4.
  • the mask frame F is transported through the loading / unloading port 58b.
  • the loading / unloading port 58 b is closed to seal the chamber 4, the unused and used mask frame F in the stock chamber 50 is carried in and out of the stock chamber 50.
  • the mask take-out and filling port 58c can switch between a state in which the stock chamber 50 is connected to the outside and a state in which the stock chamber 50 is sealed to the outside.
  • the mask take-out and filling port 58c is opened.
  • the loading / unloading port 58 b is closed to seal the chamber 4.
  • the mask take-out and filling port 58 c is closed. In this case, the loading / unloading port 58 b is opened and communicated with the chamber 4.
  • the mask take-out / filling port 58c is connected to a plate-like opening / closing portion 58d provided at a position in the X direction of the side portions 50b of the stock chamber 50 and a lower portion of the opening / closing portion 58d in the Y direction. It has a swing shaft 58e which extends, and a swing drive portion 58f which is connected to the swing shaft 58e and swings and drives the swing shaft 58e.
  • the opening / closing portion 58d is provided with a takeout support portion 58g at the lower end side which is both ends in the Y direction.
  • a takeout upper support 58h is provided at a position that is the upper side of the takeout support 58g and at both ends in the Y direction.
  • a plurality of support convex portions 58k that are in contact with and supported by the mask frame F are provided at positions that become the peripheral edge of the flat opening / closing portion 58d.
  • the plurality of support convex portions 58k are all located inside the stock chamber 50 in the opening and closing portion 58d.
  • the plurality of support convex portions 58k are provided so as to protrude in the X direction.
  • the positions at which the support convex portions 58 k are disposed at the opening and closing portion 58 d are set to correspond to the positions to be the peripheral edge of the mask frame F.
  • the opening / closing portion 58 d rotates around the swinging shaft 58 e.
  • the support convex portion 58k, the takeout support portion 58g and the takeout upper support portion 58h support the mask frame F to be carried out so as to rotate in synchronization with the opening and closing portion 58d.
  • the support convex portion 58k, the takeout support portion 58g and the takeout upper support portion 58h are the groove support bases 51b, 52b and the holding portions 53a, 34 of the mask frame F Provided in a position that does not affect the operation of supporting the
  • the takeout support portion 58g protrudes in the X direction inside the stock chamber 50 of the opening / closing portion 58d.
  • a takeout support groove 58ga is provided on the upper side of the takeout support portion 58g.
  • the lower end of the mask frame F can be placed on the takeout support groove 58ga.
  • the takeout support groove 58ga is arranged to correspond to the placement grooves 51Aa and 52Aa in the stock placement portions 51A and 52A when the opening and closing portion 58d closes the stock chamber 50, as described later. It is done.
  • the takeout support grooves 58ga are arranged to correspond to the placement grooves 51Aa, 52Aa, the stock lower support portions 51, 52 are placed on the mask frame F placed in the takeout support grooves 58ga and the placement grooves 51Aa, 52Aa It means that the mask frame F placed on can be supported at the same time.
  • the positional relationship between the takeout support groove 58ga and the placement grooves 51Aa, 52Aa in the X direction and the Z direction is such that when the stock lower support portions 51, 52 are driven, the placement grooves 51Aa, 52Aa are placed.
  • the mask frame F placed and the mask frame F placed in the takeout support groove 58ga are simultaneously positioned in the X and Z directions that can be supported by the stock below support portions 51 and 52.
  • the takeout support groove 58ga and the placement grooves 51Aa and 52Aa are set to the same position (height) in the Z direction.
  • the distance between the takeout support groove 58ga and the adjacent placement groove 51Aa in the X direction is substantially equal to the distance between the placement groove 51Aa and the placement groove 51Aa adjacent to each other in the stock placement portion 51A.
  • the takeout support groove 58ga is disposed close to the placement groove 51Aa.
  • the takeout upper support portion 58h has a Z axis 58h1 and a support piece 58h2.
  • the Z-axis 58h1 is provided inside the stock chamber 50 at the opening / closing portion 58d.
  • the Z axis 58h1 protrudes in the X direction.
  • the Z axis 58h1 is rotatably provided.
  • the support piece 58h2 is provided at a position inside the stock chamber 50 at the tip end of the Z axis 58h1.
  • the support piece 58h2 is provided so as to protrude outward in the radial direction of the Z axis 58h1.
  • the support piece 58h2 is rotatable around the Z axis 58h1.
  • the Z axis 58h1 can set the angle and the position of the support piece 58h2 from the outside of the stock chamber 50 in the opening / closing portion 58d by a rotation drive unit (not shown).
  • the lower end of the mask frame F is placed on the takeout support portion 58g.
  • the support piece 58h2 pivots around the Z axis 58h1 and abuts on the upper surface of the mask frame F.
  • the mask frame F swings in synchronization with the opening and closing portion 58d.
  • the mask frame F abuts on the plurality of support convex portions 58k.
  • the mask frame F is supported by the opening and closing portion 58d.
  • the mask frame F swings integrally with the opening and closing portion 58d.
  • the opening and closing portion 58d swings, and the opening and closing portion 58d closes the mask take-out and filling port 58c.
  • the opening / closing portion 58 d swings to carry the mask frame F into the stock chamber 50.
  • the carried-in mask frame F is moved to place the mask frame F on the placement grooves 51Aa and 52Aa.
  • the mask frame F carried in by this is stocked in the stock room 50. The operation of stocking the mask frame F in the stock chamber 50 by the mask exchanging means 100 will be described below.
  • the mask replacement unit 100 is brought into a carried in / out state.
  • the upper surface of the opening and closing portion 58d is horizontal.
  • the mask taking out and filling port 58c is entirely opened.
  • the mask replacement unit 100 is put in a closed state in which the opening / closing portion 58d swings from the loading / unloading state to close the mask take-out / filling port 58c.
  • the stock upper support portions 53 and 54 are rotationally driven between the loading and unloading state of the mask replacing unit 100 and the closing state of the mask replacing unit 100 in which the closing of the mask take-out and filling port 58c is completed.
  • the stock upper support portions 53 and 54 are pivoted to an outward angular position where the holding pieces 53 b and 54 b do not interfere with the mask frame F. As a result, in the stock upper support portions 53 and 54, the holding pieces 53b and 54b are retracted.
  • the lower end of the mask frame F is placed on the takeout support groove 58ga of the takeout support portion 58g.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to bring out the support grooves 51ga and 52a from the loading / unloading state to the closed state. And a lower position (a lower position in the Z direction) than the mounting grooves 51Aa and 52Aa.
  • the opening and closing portion 58d is rocked to close the mask take-out and filling port 58c, and the mask replacement unit 100 is brought into a closed state.
  • the mask frame F In the closed state, the mask frame F is in the vertical position standing in the Z direction. At this time, positions on both sides of the lower end of the mask frame F are placed on the takeout support grooves 58ga. Further, positions on both sides of the upper end of the mask frame F are in contact with the support piece 58h2 of the takeout upper support portion 58h.
  • the opening / closing portion 58d side of the mask frame F is in contact with the support convex portion 58k. Thereby, the mask frame F is supported in a state of standing upright in parallel with the opening and closing portion 58d.
  • the stock upper support portions 53 and 54 are driven to bring the sandwiching pieces 53 b and 54 b close to the opening / closing portion 58 d in the X direction.
  • the holding pieces 53b and 54b are driven by the holding pieces 53b and 54b in the X direction to positions capable of holding positions on both sides of the upper end of the mask frame F placed in the takeout support groove 58ga.
  • the stock upper support portions 53 and 54 are driven to rotate the holding pieces 53b and 54b in the YZ plane.
  • the holding pieces 53b and 54b are rotated to a position where they can be held in contact with the front surface and the rear surface on both sides of the upper end of the mask frame F placed in the takeout support groove 58ga.
  • the support piece 58h2 is pivoted around the Z axis 58h1 in the takeout upper support portion 58h. As a result, the support piece 58h2 does not contact the upper surface of the mask frame F at an angle. Thereby, the mask frame F can be moved in the X direction.
  • the groove support bases 51b and 52b are driven to the position closest to the opening / closing portion 58d in the X direction.
  • a straight line connecting the takeout support groove 58ga and the takeout support groove 58ga arranged at positions on both sides of the lower end of the opening / closing portion 58d coincides with a straight line drawn in the extending direction of the support grooves 51a and 52a.
  • the groove support bases 51b, 52b of the stock lower support portions 51, 52 are driven to rise in the Z direction.
  • the support grooves 51a and 52a are positioned in the Z direction higher than the straight line connecting the takeout support groove 58ga and the takeout support groove 58ga.
  • the lower end of the mask frame F is placed in the support grooves 51a and 52a in a supported state. At this time, the lower end of the mask frame F is separated upward from the takeout support groove 58ga.
  • the distance in the Z direction in which the groove support bases 51b and 52b are driven to rise is in such a range that the upper end of the mask frame F does not interfere with the rotation shafts 53c and 54c of the stock upper support portions 53 and 54.
  • the Z-direction distance for driving the groove support bases 51 b and 52 b upward is a range in which the upper end of the mask frame F does not interfere with the upper magnet portion 56 a of the transport upper support portion 56.
  • the stock lower support portions 51 and 52 and the stock upper support portions 53 and 54 are driven synchronously in the X direction.
  • the moving distance of the stock lower support portion 51, 52 in the X direction is equal to the moving distance of the stock upper support portion 53, 54.
  • the moving distance of the stock lower support portion 51, 52 in the X direction and the moving distance of the stock upper support portion 53, 54 are set in the X direction so that the mask frame F can be mounted on the mounting grooves 51Aa, 52Aa.
  • the positions correspond to the positions of the grooves 51Aa and 52Aa.
  • the groove support bases 51b and 52b are driven in the Z direction so as to descend.
  • the support grooves 51a and 52a are positioned lower than the placement grooves 51Aa and 52Aa.
  • the lower end of the mask frame F is placed on the placement grooves 51Aa and 52Aa while the groove support bases 51b and 52b are being lowered.
  • the mounting grooves 51Aa and 52Aa for mounting the lower end of the mask frame F can be appropriately selected as long as it is a driving range of the stock lower support portions 51 and 52.
  • the mask frame F can be mounted on the mounting grooves 51Aa and 52Aa which is the position in the X direction closest to the opening / closing portion 58d.
  • the moving distance in the X direction of the lower stock support portions 51 and 52 and the upper stock support portions 53 and 54 is shortest.
  • the mask frame F moved in the X direction is placed on the placement grooves 51Aa and 52Aa in the mask replacement unit 100 for the purpose of description.
  • the movement of the mask frame F in the mask replacement unit 100 includes the case where the mask frame F moved in the X direction is placed on the drive rollers 55a and 55a.
  • the drive rollers 55a, 55a coincide with the drive grooves 51Ab, 52Ab in the X direction.
  • the lower end of the mask frame F is placed on the drive rollers 55a, 55a corresponding to the second drive grooves 51Ab, 52Ab from the right in FIGS. it can.
  • the lower end of the mask frame F is at the same height position as the mask frame F in the case where the lower end of the mask frame F is placed on the placement grooves 51Aa and 52Aa.
  • the upper magnet 56a of the transport upper support portion 56 and the upper support 56 are all The holding portions 56b and 56c are lowered, and the holding pieces 56b1 and 56c1 of the holding portions 56b and 56c hold positions at both ends of the upper end of the mask frame F.
  • the upper end of the mask frame F can be held between the holding portions 56b1 and 56c1 of the holding portions 56b and 56c, and can be released from the support by the stock upper support portions 53 and 54.
  • the lower end of the mask frame F is placed on the drive rollers 55a, 55a corresponding to the second drive grooves 51Ab, 52Ab from the right in FIGS.
  • the upper end of the mask frame F is supported by the upper magnet portion 56a.
  • the mask frame F whose upper end is supported by the upper magnet portion 56 a can be transported by the drive roller 55 a of the drive support portion 55.
  • the sealing means 58 in the mask replacing means 100 brings the unused and used mask frame F between the stock chamber 50 and the outside with the chamber 4 in a sealed state, and unused and used.
  • Mask frame F can be carried out between the stock chamber 50 and the outside.
  • the transport means 60 transports the mask frame F stocked in the stock chamber 50 from the stock chamber 50 to the mask chamber 43 serving as the film forming position in the chamber 4 as shown in FIG.
  • the transport means 60 has a transport drive unit 65 and a transport upper support portion 66.
  • the transport drive unit 65 is provided along the transport path of the mask frame F.
  • the transport drive unit 65 supports the upper portion of the mask frame F.
  • the transport upper support portion 66 supports the upper portion of the mask frame F.
  • the transport drive unit 65 supports the mask frame F as shown in FIG. At this time, the transport driving unit 65 abuts on the slider F5 at the lower end of the mask frame F. Further, the conveyance drive unit 65 includes a drive roller 65 a that can drive the mask frame F in the surface direction (Y direction), and a rotation drive unit 65 b that rotationally drives the drive roller 65 a.
  • a plurality of transport driving units 65 are provided along the transport path of the mask frame F in the mask chamber 43 from the stock chamber 50 to the film forming position.
  • the transport drive unit 65 can move the mask frame F continuously.
  • the arrangement interval of the transport driving unit 65 in the transport path of the mask frame F is set smaller than the length dimension of the mask frame F in the Y direction.
  • the arrangement interval of the transport driving unit 65 in the transport path of the mask frame F may be set shorter according to the weight of the mask frame F, the accuracy of position control, and the like.
  • the plurality of transport driving units 65 are controlled to be appropriately synchronized in response to the position of the mask frame F to be transported.
  • the drive roller 65 a has an axis extending in the X direction orthogonal to the transport path of the mask frame F.
  • the rotation drive unit 65 b rotationally drives the drive roller 65 a.
  • the upper end of the drive roller 65a is in a protruding state.
  • the drive roller 65 a is disposed inside the chambers 50 and 4. It is preferable that the rotary drive unit 65 b be disposed outside the chambers 50 and 4.
  • the transport upper support portion 66 has substantially the same configuration as the upper magnet portion 56 a of the transport upper support portion 56.
  • the upper transport support 66 has a magnet that attracts the upper frame support F6.
  • the magnets of the transport upper support portion 66 form a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
  • the transport upper support portion 66 supports the upper portion of the mask frame F being transported.
  • the transport upper support portion 66 has a plurality of magnets attracting each other to the upper frame support F6 provided at the upper end of the mask frame F.
  • the transport upper support portion 66 has a plurality of magnets forming a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
  • the plurality of magnets of the transport upper support portion 66 extend in the Y direction parallel to the transport direction of the mask frame F.
  • the transport upper support portion 66 has a cross-sectional shape that is substantially the same in the entire length of the transport upper support portion 66 in the Y direction.
  • the magnetic circuit formed in the XZ plane with the upper frame support F6 of the mask frame F is substantially the same in the Y direction over the entire length of the transport upper support portion 66 in the Y direction.
  • the transport upper support portion 66 and the upper frame support F6 are attracted substantially uniformly in the Y direction by the magnetic circuit.
  • the transport upper support 66 and the mask frame F attract each other with the transport upper support 66 having a predetermined distance in the Z direction from the mask frame F.
  • the transport upper support portion 66 supports the mask frame F.
  • the transport upper support portion 66 and the mask frame F attract each other.
  • the transport upper support portion 66 supports the mask frame F.
  • the transport upper support portion 66 moves the mask frame F driven by the drive rollers 65 a and 65 a in the Y direction in the transport path from the stock chamber 50 to the mask chamber 43. At this time, the upper side of the mask frame F is drawn by the upper transport support portion 66 extending along the transport path so as not to fall down. That is, the lower end portion of the mask frame F is supported by the drive rollers 65 a and 65 a, and the mask frame F is transported in a state where the upper side of the mask frame F is supported by the transport upper support portion 66.
  • FIG. 5A to 5E are schematic plan views showing a mask replacement procedure in the sputtering apparatus in the present embodiment.
  • 6A to 6F are schematic plan views showing the mask replacement procedure in the sputtering apparatus in the present embodiment.
  • 7A to 7E are schematic plan views showing a mask replacement procedure in the sputtering apparatus in the present embodiment.
  • a mask frame FA is disposed in the mask chamber 43 of the film forming chamber 4.
  • the mask frame FA is in use.
  • film formation by sputtering is performed.
  • a mask frame FB is disposed in the mask chamber 43 of the film forming chamber 4B.
  • the mask frame FB is in use.
  • film formation by sputtering is performed.
  • the unused mask frame FC used in the film forming chamber 4 is carried into the stock chamber 50.
  • the opening / closing portion 58d of the sealing means 58 shown in FIG. 3 is brought into the open state.
  • the mask frame FC is supported by the opening / closing portion 58d by the removal support portions 58g and 58g, the removal upper support portions 58h and 58h, and the support convex portion 58k.
  • the transport upper support portion 56 and the holding portions 53a and 54a of the stock upper support portions 53 and 54 shown in FIG. 3 are in the retracted state.
  • the transport upper support portion 56 in the retracted state is at a position that does not interfere with the movement of the mask frame FC accompanying the swing of the opening / closing portion 58 d.
  • the holding portions 53a, 54a of the stock upper support portions 53, 54 in the retracted state are at positions where they do not interfere with the movement of the mask frame FC accompanying the swing of the opening / closing portion 58d.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are in the retracted state.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 in the retracted state are at positions where they do not interfere with the movement of the mask frame FC accompanying the swing of the opening and closing portion 58d.
  • the loading / unloading port 58b is closed by the partition valve 58a.
  • the opening and closing portion 58d is rocked around the rocking shaft 58e by the rocking driving portion 58f shown in FIG. As a result, the opening and closing portion 58d is erected.
  • the opening and closing portion 58d seals the mask take-out and filling port 58c.
  • the mask frame FC supported by the opening and closing portion 58d is brought into a vertical state in which the mask frame FC is raised.
  • the sandwiching portions 53a and 54a of the stock upper support portions 53 and 54 are rotationally driven.
  • the holding portions 53a and 54a abut on positions on both sides of the upper end of the mask frame FC to hold the mask frame FC.
  • the stock upper support portions 53 and 54 support positions on both sides of the upper end of the mask frame FC.
  • the takeout upper support portions 58h, 58h are pivoted to release the support on the both sides of the upper end of the mask frame FC by the takeout upper support portions 58h, 58h.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to ascend.
  • the lower end of the mask frame FC is placed on the support grooves 51a and 52a.
  • the lower end of the mask frame FC is taken out of the support groove 58ga.
  • the stock lower support portions 51 and 52 and the stock upper support portions 53 and 54 are driven synchronously in the X direction.
  • the mask frame FC is moved in the X direction.
  • the mask frame FC is set to a position in the X direction that matches the placement grooves 51Aa and 52Aa closest to the opening / closing portion 58d.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to descend. Thereby, the lower end of the mask frame FC is placed on the placement grooves 51Aa and 52Aa. Further, the support grooves 51a and 52a are separated from the lower end of the mask frame FC.
  • the transport upper support portion 56 is lowered. Thereby, the upper end of the mask frame FC is supported by the holding portions 56 b and 56 c. At the same time, the support on the both sides of the upper end of the mask frame FC by the stock upper supports 53 and 54 is released.
  • the holding portions 56b and 56c of the transport upper support portion 56 are set to a position in the X direction that does not interfere with the takeout upper support portion 58h and a position in a direction parallel to the YZ plane.
  • the mask frame FC is moved in the X direction by the stock lower support portions 51 and 52, the stock upper support portions 53 and 54, and the transport upper support portion 56 to change the mask frame FC.
  • the stock position (lane) corresponding to the takeout support groove 58ga is vacant.
  • the unused mask frame FD used in the film forming chamber 4B is carried into the stock chamber 50.
  • the loading of the mask frame FD is performed in the same manner as the loading of the mask frame FC described above.
  • the opening and closing portion 58d of the sealing means 58 shown in FIG. 3 is brought into the open state.
  • the mask frame FD is supported on the opening / closing portion 58d by the removal support portions 58g, 58g, the removal upper support portions 58h, 58h, and the support convex portion 58k.
  • the rocking shaft 58e is rocked by the rocking drive unit 58f shown in FIG.
  • the mask taking out filling port 58c is sealed by the opening and closing part 58d.
  • the mask frame FD is set upright.
  • the mask frame FD is stocked in the lane adjacent to the mask frame FC.
  • the mask frame FC and the mask frame FD are carried into the stock chamber 50. Furthermore, the lanes of the mask frame FC and the mask frame FD are changed, and as shown in FIG. 6A, the side closer to the sputtering space 41 in the X direction among the plurality of lanes formed by the stock support portions 51 to 54 and Stock in 2 lanes. Thereafter, the film forming process by sputtering in the film forming chamber 4 is completed.
  • the used mask frame FA used in the film forming chamber 4 is carried into the stock chamber 50 from the film forming chamber 4.
  • the mask take-out / filling port 58c is sealed by the opening / closing unit 58d shown in FIG.
  • the inside of the stock chamber 50 is made a vacuum atmosphere equivalent to the inside of the film forming chamber 4 by a high vacuum evacuation unit and a gas introduction unit (not shown).
  • the loading / unloading port 58b in communication with the film forming chamber 4 is opened by the partition valve 58a.
  • the mask frame FA supported by the mask alignment means 10 described later is carried out.
  • the upper frame support F6 at the upper end of the mask frame FA is supported by the upper transport support portion 66 of the transport means 60 shown in FIG.
  • the drive roller 65 a is driven by the rotation drive unit 65 b of the conveyance drive unit 65. Thereby, the mask frame FA is transported along the transport path formed by the plurality of transport driving units 65 and the transport upper support portion 66.
  • the transferred mask frame FA passes through the loading / unloading port 58b shown in FIG. Thereafter, the drive roller 55a of the drive support portion 55 abuts on the slider F5 at the lower end of the mask frame FA. At the same time, the drive roller 55a is rotationally driven by the rotational drive motor 55e. At this time, the rotation of the drive roller 55 a by the rotation drive motor 55 e is synchronized with the rotation of the drive roller 65 a by the rotation drive unit 65 b of the conveyance drive unit 65. Thereby, the mask frame FA is transported to the position in the Y direction corresponding to the placement groove 51Aa and the placement groove 52Aa for the slider F5 of the mask frame FA. Thereby, the mask frame FA is mounted on the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab.
  • the transport upper support portion 56 is continuous with the transport upper support portion 66 to form a transport path.
  • the upper magnet portion 56 a of the transport upper support portion 56 supports the upper end of the mask frame FA.
  • the open state of the loading / unloading port 58b in communication with the film forming chamber 4 is maintained by the partition valve 58a. After the mask frame FA passes through the loading / unloading port 58b, the loading / unloading port 58b is closed.
  • the mask frame FA is stocked in the lane adjacent to the mask frame FC.
  • the mask frames FA, FC, and FD are changed by one lane in the X direction.
  • the stock upper support portions 53 and 54 are moved to the opening / closing portion 58 d side in the X direction.
  • positions on both sides of the upper ends of the mask frames FA, FC, FD are simultaneously held by the stock upper support portions 53, 54.
  • the transport upper support portion 66 is raised to release the support at the upper end of the mask frames FA, FC.
  • the support on the both sides of the upper end of the mask frame FD by the takeout upper support 58h is released.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to ascend.
  • the lower ends of the mask frames FA, FC, and FD are simultaneously placed on the support grooves 51a and 52a.
  • the lower end of the mask frame FA is separated from the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab.
  • the lower end of the mask frame FC is separated from the mounting grooves 51Aa and 52Aa.
  • the lower end of the mask frame FD is taken out of the support groove 58ga.
  • the stock lower support portions 51 and 52 and the stock upper support portions 53 and 54 are driven synchronously in the X direction.
  • the mask frame FC is moved by one lane in the X direction to a position where the mask frame FC contacts the drive roller 55a of the drive support portion 55.
  • the mask frames FA and FD are moved by one lane in the X direction together with the mask frame FC.
  • the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to descend.
  • the lower ends of the mask frames FA and FD are mounted on the mounting grooves 51Aa and 52Aa.
  • the lower end of the mask frame FC is placed on the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab.
  • the descent of the groove support bases 51b and 52b of the stock lower support portions 51 and 52 is continued.
  • the support grooves 51a and 52a are separated from the lower ends of the mask frames FA, FC and FD.
  • a lane serving as a stock position corresponding to the takeout support groove 58ga and a lane serving as the stock position closest to the back space 42 in the X direction are vacant.
  • the unused mask frame FC is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4.
  • the transport upper support portion 56 is lowered.
  • the holding portions 56b and 56c support the positions on both sides of the upper ends of the mask frames FA, FC, and FD.
  • the upper magnet portion 56a supports the upper frame support F6 at the upper end of the mask frame FC.
  • the holding portions 53a and 54a are rotationally driven in the stock upper support portions 53 and 54. As a result, the support by the stock upper support portions 53 and 54 at positions on both sides of the upper ends of the mask frames FA, FC, and FD is released.
  • the drive roller 55a and the drive roller 65a are driven.
  • the mask frame FC is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4 along the transport path.
  • the upper magnet portion 56a and the transport upper support portion 66 shown in FIG. 3 maintain the upper frame support F6 at the upper end of the mask frame FC.
  • the mask frame FC passes through the loading / unloading port 58b, and the mask frame FC is unloaded from the stock chamber 50. Thereafter, the loading / unloading port 58b is closed by the partition valve 58a. Thereby, the film forming chamber 4 is sealed from the stock chamber 50 by the dividing valve 58 a.
  • the mask frame FC arrives at the film forming position in the mask chamber 43 of the film forming chamber 4.
  • the mask frame FC is aligned by the mask alignment means 10 at the film forming position of the mask chamber 43 of the film forming chamber 4 as described later.
  • the mask frame FC is supported by the mask alignment means 10. After the alignment is completed, film formation by sputtering is started in the film formation chamber 4. At this time, in the X direction, a lane serving as a stock position located between the mask frame FA supported by the stock support portions 51 to 54 and the mask frame FD is vacant.
  • the used mask frame FB used in the film forming chamber 4B is carried into the stock chamber 50.
  • the loading / unloading port 58b communicating with the film forming chamber 4B is opened by the partition valve 58a shown in FIG.
  • the drive roller 55a of the drive support portion 55 is located in a lane that is open between the mask frame FA supported by the stock support portions 51 to 54 and the mask frame FD. Therefore, the drive roller 55a of the drive support portion 55 abuts on the slider F5 at the lower end of the mask frame FB carried into the lane.
  • the used mask frame FB supported by the mask alignment unit 10 described later is unloaded.
  • the upper frame support F6 at the upper end is supported by the upper transport support portion 66 of the transport means 60 shown in FIG.
  • the driving roller 65a is driven by the rotation driving unit 65b of the conveyance driving unit 65.
  • the mask frame FB is transported along the transport path formed by the plurality of transport driving units 65 and the transport upper support portion 66.
  • the transferred mask frame FB passes through the loading / unloading port 58b on the film forming chamber 4B side. Thereafter, the drive roller 55a of the drive support portion 55 shown in FIG. 3 abuts on the slider F5 at the lower end of the mask frame FB. At the same time, the drive roller 55a is rotationally driven by the rotation drive motor 55e. At this time, the rotation of the drive roller 55 a by the rotation drive motor 55 e is synchronized with the rotation of the drive roller 65 a by the rotation drive unit 65 b of the conveyance drive unit 65. As a result, the mask frame FB is transported to the position in the Y direction where the slider F5 of the mask frame FB can abut the placement groove 51Aa and the placement groove 52Aa. As a result, the mask frame FB is placed on the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab.
  • the mask frame FB is stocked in the lane located between the mask frame FA and the mask frame FD.
  • the transport upper support portion 56 is continuous with the transport upper support portion 66 to form a transport path.
  • the upper magnet portion 56 a of the transport upper support portion 56 supports the upper end of the mask frame FB.
  • the loading / unloading port 58b in communication with the film forming chamber 4B is maintained in the open state by the partition valve 58a. After the mask frame FB passes through the loading / unloading port 58b, the loading / unloading port 58b is closed.
  • the mask frames FA, FB, and FD are laned so as to be ready to transport the unused mask frame FD used in the film forming chamber 4B from the stock chamber 50 to the film forming chamber 4B. Change.
  • the loading / unloading port 58b in communication with the film forming chamber 4B is opened or closed by the dividing valve 58a.
  • the transport upper support portion 56 shown in FIG. 3 is raised.
  • the upper end support state of the holding parts 56 b and 56 c in the mask frame FA, FB, and FD is released.
  • the rotary shafts 53c and 54c are rotationally driven to set an angle around the rotary shafts 53c and 54c.
  • the holding portions 53a and 54a simultaneously support the upper ends of the mask frames FA, FB, and FD.
  • the support grooves 51a, 51a and the holding portions 53a, 54a are moved in the X direction by the stock support portions 51, 52, 53, 54 shown in FIG.
  • the lane change of the mask frames FA, FB, and FD is performed.
  • the position in the X direction is set such that the mask frame FD is in a lane state in which the mask frame FD abuts on the drive roller 55a. In this way, the mask frames FA, FB, and FD are changed lanes.
  • One lane is vacant.
  • the mask frame FA is stocked in the lane which is the stock position closest to the back space 42 side in the X direction. Therefore, the lane which is the stock position closest to the back space 42 in the X direction is not vacant.
  • the conveyance upper support portion 56 is lowered to support the upper ends of the mask frames FA, FB, and FD by the holding portions 56b and 56c.
  • the holding portions 53a and 54a are rotationally driven around the rotation shafts 53c and 54c to set an angle.
  • the support of the upper ends of the mask frames FA, FB, and FD by the holding portions 53a and 54a is released.
  • the upper magnet portion 56a of the transport upper support portion 56 supports the upper frame support F6 at the upper end of the mask frame FD.
  • the unused mask frame FD is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4B.
  • the loading / unloading port 58b in communication with the film forming chamber 4B is opened or maintained by the partition valve 58a.
  • the transport upper support portion 56 shown in FIG. 3 is lowered.
  • the upper magnet portion 56a supports the upper frame support F6 at the upper end of the mask frame FD.
  • the support of the upper end of the mask frame FD by the holding portions 53a and 54a is released.
  • the drive roller 55a and the drive roller 65a are driven.
  • the mask frame FD is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4B along the transport path.
  • the mask frame FD passes through the loading / unloading port 58b, and the mask frame FD is unloaded from the stock chamber 50. Thereafter, the loading / unloading port 58b is closed by the partition valve 58a. Thus, the film forming chamber 4B is sealed from the stock chamber 50 by the dividing valve 58a.
  • the mask frame FD arrives at the film forming position in the mask chamber 43 of the film forming chamber 4B.
  • the mask frame FD is aligned by the mask alignment means 10 at the film forming position of the mask chamber 43 of the film forming chamber 4B as described later.
  • the mask frame FD is supported by the mask alignment means 10. After the alignment is completed, film formation by sputtering is started in the film formation chamber 4B. At this time, all lanes located closer to the sputtering space 41 than the mask frame FB supported by the stock support portions 51, 52, 53, 54 are vacant.
  • the support grooves 51a, 52a are lowered in the Z direction by the stock support portions 51, 52, 53, 54.
  • the sandwiching portions 53a and 54a are moved toward the sputtering space 41 in the X direction in synchronization with the support grooves 51a and 52a.
  • the mask frames FA, FB move in the X direction in the direction approaching the opening / closing portion 58 d in the sealed state.
  • the mask frames FA and FB are changed by the stock support portions 51, 52, 53, and 54.
  • the mask frame FB is placed on the takeout support groove 58ga of the takeout support portion 58g.
  • the position of the mask frame FB in the X direction is set so that the mask frame FB is placed on the placement grooves 51Aa and 52Aa closest to the opening and closing portion 58d in the X direction.
  • the mask frame FA is located in a lane which is a stock position adjacent to the mask frame FB in the X direction.
  • the support pieces 58h2 of the takeout upper support portions 58h located on the left and right of the mask frame FB are respectively pivoted inward around the Z axis 58h1.
  • the upper side of the mask frame FB is supported by the support piece 58h2.
  • the transport upper support portion 56 shown in FIG. 3 is lowered. Thereby, the upper side of the mask frame FA is supported by the holding parts 56b and 56c. This prevents the mask frame FA from falling down.
  • the holding portions 53a and 54a of the stock upper support portions 53 and 54 shown in FIG. 3 are pivoted. As a result, the holding portions 53a and 54a are in the retracted state. As a result, the upper support of the mask frames FA and FB by the holding portions 53a and 54a is released.
  • the opening and closing portion 58d is rocked around the rocking shaft 58e by the rocking driving portion 58f shown in FIG. Thereby, as shown in FIG. 7C, the mask take-out and filling port 58c is brought into the open state.
  • the mask frame FB is supported by the opening / closing portion 58d by the removal support portions 58g, 58g and the removal upper support portions 58h, 58h.
  • the takeout upper support portions 58h, 58h are pivoted outward around the Z axis 58h1.
  • the support of the mask frame FB by the upper pick-up support portions 58h and 58h is released. Thereafter, the mask frame FB is removed from the opening / closing portion 58d and carried out to the outside.
  • the mask frame FA In carrying out the mask frame FA, first, it is rotationally driven around the rotation axes 53c and 54c shown in FIG. Thereby, the angle setting of the holding portions 53a and 54a around the rotation shafts 53c and 54c is performed. Thus, the upper end of the mask frame FA is simultaneously supported by the holding portions 53a and 54a. At the same time, the transport upper support portion 56 is raised to be in the retracted state. Then, similar to the lane change of the mask frame FB described above, the support grooves 51a and 52a are raised in the Z direction by the stock support portions 51, 52, 53, and 54. Thereafter, the support grooves 51a and 52a are moved toward the sputtering space 41 in the X direction by the stock support portions 51, 52, 53, and 54.
  • the support grooves 51a, 52a are lowered in the Z direction by the stock support portions 51, 52, 53, 54.
  • the sandwiching portions 53a and 54a are moved toward the sputtering space 41 in the X direction in synchronization with the support grooves 51a and 52a.
  • the mask frame FA is moved in the direction in which the mask frame FA approaches the open / close portion 58d in the sealed state.
  • the mask frame FA is placed on the takeout support groove 58ga of the takeout support portion 58g by the stock support portions 51, 52, 53, 54 as shown in FIG. 7D. Thereby, the position of the mask frame FA in the X direction is set.
  • the mask frame FA is changed.
  • the support pieces 58h2 of the removal upper support portions 58h positioned on the left and right of the mask frame FA are respectively pivoted inward around the Z axis 58h1.
  • the upper side of the mask frame FA is supported by the support piece 58h2.
  • the opening and closing portion 58d is rocked around the rocking shaft 58e by the rocking driving portion 58f shown in FIG.
  • the mask take-out and filling port 58c is brought into the open state.
  • the mask frame FA is supported by the opening / closing portion 58d by the removal support portions 58g, 58g and the removal upper support portions 58h, 58h.
  • the takeout upper support portions 58h, 58h are pivoted outward around the Z axis 58h1.
  • the support of the mask frame FA by the upper pick-up support portions 58h, 58h is released.
  • the mask frame FA is removed from the opening and closing portion 58d and carried out to the outside.
  • the mask replacement procedure in the mask replacement unit 100 is completed.
  • a plurality of unused mask frames F are stocked by the mask exchanging unit 100. Furthermore, in the sputtering apparatus 1 of the present embodiment, one is selected from the plurality of stocked unused mask frames F as necessary. In the sputtering apparatus 1 of the present embodiment, the selected unused mask frame F is transported to the mask chamber 43 which is the film forming position. Thus, in the sputtering apparatus 1 of the present embodiment, mask exchange for the film forming chamber (chamber) 4 and mask exchange for the film forming chamber (chamber) 4B can be automated. In the sputtering apparatus 1 of the present embodiment, a plurality of mask replacements for the film forming chamber 4 can be continued.
  • a plurality of mask replacements for the film forming chamber 4B can be continued. Further, in the sputtering apparatus 1 of the present embodiment, the mask replacement for the film forming chamber 4 and the mask replacement for the film forming chamber 4B can be continued. Thereby, in the sputtering apparatus 1 of this embodiment, the time required for mask replacement can be shortened.
  • the mask exchange can be performed without opening the film forming chamber 4 and the film forming chamber 4B to the atmosphere.
  • particles and the like attached to the mask frame F or the substrate S inside the film forming chamber 4 and the film forming chamber 4B due to the mask replacement can be reduced.
  • the used mask frame F is stocked in the stock chamber 50. Further, in the sputtering apparatus 1 of the present embodiment, the used mask frame F can be taken out of the stock chamber 50 to the outside of the apparatus by selecting the timing at which the stock chamber 50 can be opened to the outside. That is, in the sputtering apparatus 1 of the present embodiment, the mask frame F used from the stock chamber 50 to the outside of the apparatus is selected by selecting a time during which the loading / unloading port 58b is closed during processing in the film forming chambers 4, 4B. It can be taken out. Thereby, the tact time of the sputtering apparatus 1 of this embodiment can be shortened.
  • the mask frame F is supported by the method in which the transport upper supports 56 and 66 and the upper frame support F6 attract each other by the magnetic circuit.
  • the mask frame F does not perform an unexpected movement such as vibration generation at the time of transfer.
  • the possibility of dust and particles falling on the mask frame F can be reduced. Therefore, in the sputtering apparatus 1 of the present embodiment, the deposition quality does not deteriorate.
  • the stock support portions 51, 52, 53, 54 lane-change the plurality of mask frames F being stocked.
  • one of the plurality of mask frames F can be selected and transported to the film forming chambers 4, 4B. For this reason, in the sputtering apparatus 1 of the present embodiment, when performing different film formations on a plurality of types of substrates S, the predetermined mask frame F is transported to the film formation position corresponding to each setting condition. It becomes possible.
  • mask replacement can be automated.
  • different types of mask frames F can be sequentially exchanged in correspondence with different types of substrates S.
  • film formation processing using different types of mask frames F can be continuously performed corresponding to different types of substrates S.
  • the drive system located above the mask frame F with respect to the transport and the lane change of the mask frame F includes the stock upper support portion 53 and 54, the transport upper support portion 56, and the takeout upper support portion. It will be 58h.
  • the upper stock support portions 53 and 54, the upper transfer support portion 56, and the upper removal support portion 58h are all located outside the stock chamber 50.
  • the stock upper supports 53 and 54, the transfer upper support 56, and the removal upper support 58h do not have the function of moving the mask frame F in the vertical direction to support the weight of the mask frame F which is a heavy load. .
  • the mask frame F which is a heavy material, is transported in the chambers 4 and 50 by the drive roller 55a of the drive support portion 55 located below the mask frame F. That is, in the sputtering apparatus 1 of the present embodiment, the stock upper support portions 53 and 54, the transport upper support portion 56, and the takeout upper support portion 58h located above the mask frame F may adopt a motor with a small output. . At the same time, the lower side of the mask frame F is driven by the drive support portion 55 located below the mask frame F. With these driving systems, mask replacement is possible in the sputtering apparatus 1 of the present embodiment.
  • the chambers 4 and 50 can be saved in space. Furthermore, in the sputtering apparatus 1 of the present embodiment, the entire apparatus can be saved in space.
  • FIG. 8 is a perspective view showing the mask alignment means in the mask chamber of the sputtering apparatus in the present embodiment.
  • the mask alignment means 10 supports the mask frame F shown in FIG. 2 in the mask chamber 43 and is orthogonal in two directions parallel to the plane of the mask frame F and orthogonal to the plane of the mask frame F.
  • the alignment of the mask frame F is enabled in six degrees of freedom with three axial directions of direction and three rotational directions around these three axial axes.
  • the mask alignment means 10 supports the support alignment sections 11 and 12 which support the lower end positions of the mask frame F, and the upper position of the mask frame F
  • the upper alignment portions 13 and 14 capable of supporting and releasing the mask frame F and the upper support portions 16 and 16 are provided so as to be set in a direction orthogonal to the plane.
  • the film formation position is set such that the mask frame F shown in FIG. 2 is substantially parallel to the YZ plane. Further, as shown in FIG. 8, as the mask alignment means 10, the engagement portion F1 and the engagement used at the time of alignment at both ends of the lower end of the mask frame F, that is, both ends in the Y direction on the lower side in the Z direction. Parts F2 are provided respectively.
  • FIG. 9 is a perspective view showing a support alignment portion of the sputtering apparatus in the present embodiment.
  • FIG. 10 is a perspective view showing a support alignment portion of the sputtering apparatus in the present embodiment.
  • the support alignment unit 11 has a convex portion 11a, an X drive unit 11X, a Y drive unit 11Y, and a Z drive unit 11Z.
  • the convex portion 11a engages with an engaging portion F1 provided on a mask frame F described later.
  • the convex portion 11 a is provided to project upward at the top of the support alignment portion 11.
  • the X driving unit 11X can be driven when adjusting the position of the convex portion 11a in a substantially horizontal direction (X direction) perpendicular to the mask surface.
  • the Y drive portion 11Y can be driven when adjusting the position of the convex portion 11a in a substantially horizontal direction (Y direction) parallel to the mask surface.
  • the Z drive unit 11Z can be driven when adjusting the position of the convex portion 11a in the vertical direction (Z direction).
  • the support alignment unit 11 is located at the end of the mask frame F at the film forming position in the mask chamber 43 shown in FIG.
  • the position of the convex portion 11a is set so as to overlap the transfer path of the mask frame F defined by the plurality of transfer means 60, as shown in FIG.
  • the position of the support alignment unit 11 in the XY direction is set so that the position of the convex portion 11 a in the XY direction substantially coincides with the line connecting the drive rollers 65 a of the conveyance drive unit 65 provided in the conveyance path. Be done.
  • the convex portion 11a in the Z direction is lower than the line connecting the drive rollers 65a of the plurality of conveyance driving units 65 provided in the conveyance path in a state where the convex portion 11a is lowered.
  • the upper side of 11a is a low position.
  • the upper side of the convex portion 11a is higher than the line connecting the drive rollers 65a of the plurality of transport drive units 65 provided in the transport path.
  • the convex part 11a is provided in the state urged
  • the upper side of the convex portion 11a has a spherical or hemispherical shape, and the convex portion 11a is made of, for example, a metal, and can support the mask frame F having a weight.
  • the X drive unit 11X has a motor 11Xa, a rotation shaft 11Xb, an X position regulation unit 11Xc, and a regulation unit 11Xd.
  • the motor 11Xa is configured by a stepping motor.
  • the rotation shaft 11Xb extends in the X direction and is rotationally driven by the motor 11Xa.
  • the X position restricting portion 11Xc is screwed to the rotary shaft 11Xb and is relatively movable in the axial direction of the rotary shaft 11Xb.
  • the regulating unit 11Xd regulates movement of the X position regulating unit 11Xc and the motor 11Xa.
  • the base 11b connected to the tip of the rotary shaft 11Xb in a state where the front end of the rotary shaft 11Xb can be turned by rotating the rotary shaft 11Xb by the motor 11Xa It is configured to move in the X direction with respect to 11Xc.
  • the movement direction of the base 11b is restricted by the restriction part 11Xd.
  • the lower end of the X position restricting portion 11Xc is connected and fixed to a substantially flat horizontal plate 11c.
  • the weight of the base 11b is supported by the horizontal plate 11c, and the base 11b is movable relative to the horizontal plate 11c.
  • the Y driving unit 11Y includes a motor 11Ya, a rotation shaft 11Yb, a Y position regulating unit 11Yc, and a regulating unit 11Yd.
  • the motor 11Ya is configured by a stepping motor.
  • the rotating shaft 11Yb extends in the Y direction and is rotationally driven by the motor 11Ya.
  • the Y position restricting portion 11Yc is screwed to the rotating shaft 11Yb and is relatively movable in the axial direction of the rotating shaft 11Yb.
  • the regulating unit 11Yd regulates movement of the Y position regulating unit 11Yc and the motor 11Ya.
  • the pedestal 11d connected to the tip of the rotary shaft 11Yb in a state in which the distal end of the rotary shaft 11Yb can be pivoted by pivoting the rotary shaft 11Yb by the motor 11Ya 11 Yc is configured to move in the X direction.
  • the movement direction of the pedestal 11d is restricted by the restriction part 11Yd.
  • the upper end of the Y position restricting portion 11Yc is connected and fixed to a substantially flat horizontal plate 11c.
  • the weight of the members disposed on the horizontal plate 11c is supported by the pedestal 11d, and the horizontal plate 11c is movable with respect to the pedestal 11d.
  • the Z driving unit 11Z has a motor 11Za, a rotating shaft 11Zb, a Z position regulating unit 11Zc, and a regulating unit 11Zd.
  • the motor 11Za is configured by a stepping motor or a servomotor.
  • the rotating shaft 11Zb extends in the Z direction and is rotationally driven by the motor 11Za.
  • the Z position restricting portion 11Zc is screwed to the rotating shaft 11Zb and is relatively movable in the axial direction of the rotating shaft 11Zb.
  • the regulating unit 11Zd regulates movement of the Z position regulating unit 11Zc and the motor 11Za.
  • the pedestal 11d connected to the tip of the rotary shaft 11Zb in a state in which the distal end of the rotary shaft 11Zb can be pivoted by rotating the rotary shaft 11Zb by the motor 11Za 11 Zc is configured to move in the Z direction.
  • the movement direction of the pedestal 11d is restricted by the restriction part 11Zd.
  • the Z position control unit 11 Zc is a bottom portion of the film forming chamber (chamber) 4.
  • the support alignment unit 11 can adjust the position of the convex portion 11 a with the degrees of freedom in the X, Y, and Z directions, and is fixed to the bottom of the film forming chamber 4.
  • both the motor 11Xa and the motor 11Ya are disposed in the chamber 4 and positioned below the mask frame F which is a film formation region.
  • neither the X drive unit 11X nor the Y drive unit 11Y has the function of driving while supporting the weight of the mask frame F, which is a heavy object, and performs only horizontal alignment. Since a small output motor may be employed, it can be disposed in the chamber 4.
  • the X drive unit 11X and Y drive unit 11Y since both the motor 11Xa and the motor 11Ya are formed by stepping motors, the drive controllability can be improved.
  • the X driving unit 11X and the Y driving unit 11Y can be disposed at a position close to the mask frame F, which is a driven object, inside the chamber 4.
  • the X drive unit 11X and Y drive unit 11Y are more accurate than the mask frame with high accuracy, for example, as compared to the case of driving at a distance from the outside of the chamber 4 It becomes possible to set the position of F.
  • the Z drive unit 11Z needs to be a large-sized motor with high output in order to drive while supporting the weight of the mask frame F, which is a heavy load, and at the same time, it is disposed outside the chamber 4 There is no limit on space.
  • the support alignment unit 12 includes a convex portion 12 a, an X drive unit 12 X, a Y drive unit 12 Y, and a Z drive unit 12 Z.
  • the convex portion 12a engages with an engaging portion F2 provided on a mask frame F described later.
  • the convex portion 12 a is provided so as to project upward at the top of the support alignment portion 12.
  • the X drive portion 12X can be driven when adjusting the position of the convex portion 12a in a substantially horizontal direction (X direction) perpendicular to the mask surface.
  • the Y drive portion 12Y can be driven when adjusting the position of the convex portion 12a in a substantially horizontal direction (Y direction) parallel to the mask surface.
  • the Z drive unit 12Z can be driven when adjusting the position of the convex portion 12a in the vertical direction (Z direction).
  • the support alignment unit 12 is located at the end of the mask frame F at the film forming position in the mask chamber 43 shown in FIG.
  • the arrangement of the support alignment unit 12 in the X and Y directions is such that, as shown in FIG. It is set.
  • the positions of the convex portions 12 a in the XY direction substantially coincide with a straight line connecting the drive rollers 65 a Set to
  • the convex portion 12a in the Z direction is lower than the line connecting the drive rollers 65a of the plurality of conveyance drive units 65 provided in the conveyance path in a state where the convex portion 12a is lowered.
  • the upper side of 12a is a low position.
  • the upper side of the convex portion 12a is higher than the line connecting the drive rollers 65a of the plurality of conveyance drive units 65 provided in the conveyance path.
  • the convex portion 12a has a configuration equivalent to that of the convex portion 11a, and is provided in a state of being biased upward with respect to the base 12b, as shown in FIGS.
  • the upper side of the convex portion 12a has a spherical or hemispherical shape, and the convex portion 12a is made of, for example, a metal, and can support the mask frame F having a weight.
  • the X drive unit 12X has a motor 12Xa, a rotation shaft 12Xb, an X position control unit 12Xc, and a control unit 12Xd.
  • the motor 12Xa is configured by a stepping motor.
  • the rotation shaft 12Xb extends in the X direction and is rotationally driven by the motor 12Xa.
  • the X position restricting portion 12Xc is screwed to the rotation shaft 12Xb and is relatively movable in the axial direction of the rotation shaft 12Xb.
  • the regulating unit 12Xd regulates movement of the X position regulating unit 12Xc and the motor 12Xa.
  • the base 12b connected to the tip of the rotary shaft 12Xb in a state in which the tip of the rotary shaft 12Xb can turn by rotating the rotary shaft 12Xb by the motor 12Xa It is configured to move in the X direction with respect to 12Xc.
  • the movement direction of the base 12b is restricted by the restriction part 12Xd.
  • the lower end of the X position restricting portion 12Xc is connected and fixed to a substantially flat horizontal plate 12c.
  • the weight of the base 12b is supported by the horizontal plate 12c, and the base 12b is movable relative to the horizontal plate 12c.
  • the Y drive unit 12Y has a motor 12Ya, a rotation shaft 12Yb, a Y position control unit 12Yc, and a control unit 12Yd.
  • the motor 12Ya is configured by a stepping motor.
  • the rotating shaft 12Yb extends in the Y direction and is rotationally driven by the motor 12Ya.
  • the Y position restricting portion 12Yc is screwed to the rotation shaft 12Yb and is relatively movable in the axial direction of the rotation shaft 12Yb.
  • the regulating unit 12Yd regulates movement of the Y position regulating unit 12Yc and the motor 12Ya.
  • the pedestal 12d connected to the tip of the rotary shaft 12Yb in a state where the tip of the rotary shaft 12Yb can be turned by pivoting the rotary shaft 12Yb by the motor 12Ya It is configured to move in the X direction with respect to 12Yc.
  • the movement direction of the pedestal 12d is restricted by the restriction part 12Yd.
  • the upper end of the Y position restricting portion 12Yc is connected and fixed to a substantially flat horizontal plate 12c.
  • the weight of the member disposed on the horizontal plate 12c is supported by the pedestal 12d, and the horizontal plate 12c is movable with respect to the pedestal 12d.
  • the Z driving unit 12Z has a motor 12Za, a rotating shaft 12Zb, a Z position regulating unit 12Zc, and a regulating unit 12Zd.
  • the motor 12Za is configured by a stepping motor or a servomotor.
  • the rotating shaft 12Zb extends in the Z direction and is rotationally driven by the motor 12Za.
  • the Z position restricting portion 12Zc is screwed to the rotation shaft 12Zb and is relatively movable in the axial direction of the rotation shaft 12Zb.
  • the regulating unit 12Zd regulates movement of the Z position regulating unit 12Zc and the motor 12Za.
  • the pedestal 12d connected to the tip of the rotation shaft 12Zb in a state in which the tip of the rotation shaft 12Zb can be rotated by rotating the rotation shaft 12Zb by the motor 12Za It is configured to move in the Z direction with respect to 12Zc.
  • the movement direction of the pedestal 12d is restricted by the restriction part 12Zd.
  • the Z position restricting portion 12Zc is a bottom portion of the film forming chamber (chamber) 4.
  • the support alignment unit 12 can adjust the position of the convex portion 12 a with the degrees of freedom in the X, Y, and Z directions, and is fixed to the bottom of the film forming chamber 4.
  • both the motor 12Xa and the motor 12Ya are disposed in the chamber 4 and located below the mask frame F which is a film formation region.
  • neither the X drive unit 12X nor the Y drive unit 12Y has the function of driving while supporting the weight of the mask frame F, which is a heavy object, and performs only horizontal alignment. Since a small output motor may be employed, it can be disposed in the chamber 4.
  • the drive controllability can be improved.
  • the X driving unit 12X and the Y driving unit 12Y can be disposed at a position close to each other in the chamber 4 with respect to the mask frame F which is a driven object. Therefore, when using a drive mechanism provided with a shaft, an arm, etc., the X drive unit 12X and Y drive unit 12Y can achieve a mask frame with high accuracy as compared with, for example, driving at a distance from the outside of the chamber 4 It becomes possible to set the position of F.
  • the Z drive unit 12Z needs to be a large-sized motor with high output in order to drive while supporting the weight of the mask frame F, which is a heavy load, and at the same time, it is disposed outside the chamber 4 There is no limit on space.
  • the support alignment unit 11 and the support alignment unit 12 have substantially the same configuration, and are disposed at positions on both sides in the left-right direction of the film formation position of the mask frame F.
  • FIG. 11 is a perspective view showing the upper alignment portion of the sputtering apparatus in the present embodiment.
  • FIG. 12 is a perspective view showing the upper alignment portion of the sputtering apparatus in the present embodiment.
  • the upper alignment unit 13 includes a holding unit 13A, an X drive unit 13X, and a rotation drive unit 13R.
  • the holding portion 13A can hold and lock a portion in the vicinity of a corner which is an end portion in the left-right direction (Y direction) at the upper end of the mask frame F.
  • the X drive unit 13X is drivable so as to adjust the position by driving the holding unit 13A in a substantially horizontal direction (X direction) perpendicular to the mask surface.
  • the rotation drive unit 13R can rotate the holding unit 13A in the YZ plane substantially parallel to the mask surface.
  • the sandwiching portion 13A includes sandwiching pieces 13Aa and 13Ab and a base 13Ac.
  • the clamping pieces 13Aa and 13Ab abut on the front and back surfaces of the mask frame F at the end of the mask frame F, respectively.
  • the base 13Ac maintains the sandwiching pieces 13Aa and 13Ab in parallel, and sets the distance between the sandwiching pieces 13Aa and 13Ab substantially equal to the thickness of the mask frame F.
  • the base ends of the holding pieces 13Aa and 13Ab are fixed to the base 13Ac.
  • the sandwiching pieces 13Aa and 13Ae intersect at a position opposite to the protrusions 13Ad and 13Ae in the extending direction of the sandwiching pieces 13Aa and 13Ab so as to intersect the sandwiching pieces 13Aa and 13Ab substantially orthogonally and rotate.
  • the tip of the shaft 13B is connected.
  • Convex parts 13Ad and 13Ae are provided at the tips of the holding pieces 13Aa and 13Ab so as to be positioned on the inner side surfaces facing each other.
  • the convex portions 13Ad and 13Ae are biased in the direction in which the holding pieces 13Aa and 13Ab and the mask frame F are close to each other so that the holding members 13Aa and 13Ab and the mask frame F do not shift in the X direction. There is. Further, when the holding pieces 13Aa and 13Ab hold the mask frame F, the convex portions 13Ad and 13Ae absorb the deviation when the holding members 13Aa and 13Ab and the mask frame F are shifted in the X direction. In order to be able to maintain the mask frame F between the sandwiching piece 13Aa and the sandwiching piece 13Ab, they are urged in the direction in which they approach each other.
  • Each of the convex portions 13Ad and 13Ae has a spherical or hemispherical shape projecting in a direction close to each other, and is made of, for example, a metal, and can support the weight of the mask frame F.
  • the rotation axis 13B extends in a substantially horizontal direction (X direction) perpendicular to the mask surface, and is rotatable around the axis of the rotation axis 13B. Further, the rotary shaft 13B can be advanced and retracted in the axial direction (X direction).
  • the base 13Ac of the holding portion 13A is connected and fixed to the tip of the rotary shaft 13B so as to project in the radial direction.
  • the motor 13Ra of the rotation drive unit 13R is connected to the base end of the rotation shaft 13B, and can be driven around the axis of the rotation shaft 13B.
  • the motor 13Ra of the rotational drive unit 13R is fixed to a flat plate portion 13C extending in parallel with the mask surface.
  • the rotation shaft 13B and the sandwiching portion 13A can be driven in the axial direction of the rotation shaft 13B by driving the X position control unit 13Xc with respect to the flat plate portion 13C by the X drive unit 13X.
  • the X drive unit 13X has a motor 13Xa, a rotation shaft 13Xb, an X position control unit 13Xc, and a control unit 13Xd.
  • the motor 13Xa is configured by a stepping motor.
  • the rotation shaft 13Xb extends in the X direction and is rotationally driven by the motor 13Xa.
  • the X position restricting portion 13Xc is screwed to the rotation shaft 13Xb and is relatively movable in the axial direction of the rotation shaft 13Xb.
  • the regulating unit 13Xd regulates movement of the X position regulating unit 13Xc and the motor 13Xa in the X direction.
  • the X position regulation unit 13Xc connected to the base end side of the rotation shaft 13Xb moves in the X direction with respect to the flat plate portion 13C. Is configured.
  • the moving direction of the X position restricting portion 13Xc is restricted by the restricting portion 13Xd.
  • the flat plate portion 13C is a side portion of the film forming chamber (chamber) 4.
  • the upper alignment unit 13 can adjust the position of the sandwiching unit 13A with a degree of freedom in the X direction, and is fixed to the side of the film forming chamber (chamber) 4.
  • the rotation shaft 13B is driven around the axis by the motor 13Ra of the rotation drive unit 13R.
  • the angular position around the axis of the rotation shaft 13B is set so that the sandwiching portion 13A does not interfere with the mask frame F, which is the film formation position.
  • the rotary shaft 13Xb is rotated by the motor 13Xa of the X drive unit 13X to move the X position regulation unit 13Xc in the X direction.
  • the rotary shaft 13B is driven in the axial direction to set the position of the holding portion 13A in the X direction so that the upper end of the mask frame F is positioned between the holding pieces 13Aa and 13Ab.
  • the upper end of the mask frame F is held between the holding pieces 13Aa and 13Ab in the holding portion 13A by rotating the rotation shaft 13B around the axis by the motor 13Ra of the rotation driving portion 13R.
  • the angular position around the axis of the rotary shaft 13B in the sandwiching portion 13A is set so as to be positioned.
  • the rotary shaft 13Xb is rotated by the motor 13Xa of the X drive unit 13X to move the X position regulating unit 13Xc in the X direction, thereby driving the rotary shaft 13B in the axial direction to move the upper end of the mask frame F It is possible to finely adjust the position in the X direction in.
  • the motor 13 Ra of the rotation drive unit 13 R is disposed at the outer position of the film forming chamber 4, and the motor 13 Xa of the X drive unit 13 X is at the outer side of the film forming chamber 4. It is placed in position. Therefore, the adjustment of the angular position of the sandwiching portion 13A around the axis of the rotation shaft 13B is performed from the outside of the film forming chamber (chamber) 4. Further, adjustment of the position of the sandwiching portion 13A in the axial direction of the rotating shaft 13B is also performed from the outside of the film forming chamber (chamber) 4. Thereby, the dust generated in the chamber 4 can be prevented from diffusing.
  • the upper alignment portions 13 and 14 are arranged in line in the Y direction which is the left and right direction.
  • the upper alignment portions 13 and 14 are provided so as to have a substantially symmetrical configuration with respect to the center line (Z direction, gravity direction) of the mask frame F, as shown in FIG.
  • the upper alignment unit 14 is described only with reference numerals below, and there is also a configuration in which it is hidden in the figure.
  • the upper alignment unit 14 includes a holding unit 14A, an X drive unit 14X, and a rotation drive unit 14R.
  • the holding portion 14A can hold and lock a portion in the vicinity of a corner which is an end portion in the left-right direction (Y direction) at the upper end of the mask frame F.
  • the X drive unit 14X can be driven when adjusting the position by driving the sandwiching unit 14A in a substantially horizontal direction (X direction) perpendicular to the mask surface.
  • the rotation drive unit 14R is capable of rotating the holding unit 14A in the YZ plane substantially parallel to the mask surface.
  • the sandwiching portion 14A includes sandwiching pieces 14Aa and 14Ab and a base 14Ac.
  • the clamping pieces 14Aa and 14Ab abut on the front surface and the back surface of the mask frame F at the end of the mask frame F, respectively.
  • the base 14Ac maintains the sandwiching pieces 14Aa and 14Ab in parallel, and sets the distance between the sandwiching pieces 14Aa and 14Ab substantially equal to the thickness of the mask frame F.
  • the base ends of the sandwiching pieces 14a and 14Ab are fixed to the base 14Ac.
  • the holding pieces 14Aa and 14Ab cross at a position opposite to the convex portions 14Ad and 14Ae in the extension direction so as to intersect the holding pieces 14Aa and 14Ab substantially orthogonally
  • the tip of the shaft 14B is connected.
  • Convex parts 14Ad and 14Ae are provided at the tips of the sandwiching pieces 14Aa and 14Ab so as to be positioned on the inner side surfaces facing each other.
  • the convex portions 14Ad and 14Ae are biased in a direction in which the holding pieces 14Aa and 14Ab and the mask frame F move close to each other in the X direction while the holding pieces 14Aa and 14Ab hold the mask frame F. There is.
  • the convex portions 14Ad and 14Ae absorb the misalignment when the sandwiching pieces 14Aa and 14Ab shift from the mask frame F in the X direction, In order to be able to maintain the mask frame F between the sandwiching piece 14Aa and the sandwiching piece 14Ab, they are urged in the direction in which they approach each other.
  • Each of the convex portions 14Ad and 14Ae has a spherical or hemispherical shape projecting in a direction close to each other, and is made of, for example, a metal, and can support the weight of the mask frame F.
  • the rotation axis 14B extends in a substantially horizontal direction (X direction) perpendicular to the mask surface, and is rotatable around the axis of the rotation axis 14B. Further, the rotation shaft 14B can be advanced and retracted in the axial direction (X direction).
  • the base 14Ac of the holding portion 14A is connected and fixed to the tip of the rotation shaft 14B so as to project in the radial direction.
  • the motor 14Ra of the rotation drive unit 14R is connected to the base end of the rotation shaft 14B, and can be driven around the axis of the rotation shaft 14B.
  • the motor 14Ra of the rotational drive unit 14R is fixed to a flat plate portion 14C extending in parallel with the mask surface.
  • the rotation shaft 14B and the sandwiching portion 14A can be driven in the axial direction of the rotation shaft 14B by driving the X position control unit 14Xc with respect to the flat plate portion 14C by the X drive unit 14X.
  • the X drive unit 14X includes a motor 14Xa, a rotation shaft 14Xb, an X position control unit 14Xc, and a control unit 14Xd.
  • the motor 14Xa is configured by a stepping motor.
  • the rotating shaft 14Xb extends in the X direction and is rotationally driven by the motor 14Xa.
  • the X position restricting portion 14Xc is screwed to the rotary shaft 14Xb and is relatively movable in the axial direction of the rotary shaft 14Xb.
  • the restricting unit 14Xd restricts the movement of the X position restricting unit 14Xc and the motor 14Xa in the X direction.
  • the X position regulation unit 14Xc to which the base end side of the rotation shaft 14Xb is connected moves in the X direction with respect to the flat plate portion 14C. Is configured.
  • the moving direction of the X position restricting portion 14Xc is restricted by the restricting portion 14Xd.
  • the flat plate portion 14C is a side portion of the film formation chamber (chamber) 4.
  • the upper alignment unit 14 can adjust the position of the holding unit 14A with the freedom in the X direction, and is fixed to the side of the film forming chamber (chamber) 4.
  • the rotation shaft 14B is driven around the axis by the motor 14Ra of the rotation drive unit 14R.
  • the angular position around the axis of the rotation shaft 14B is set so that the sandwiching portion 14A does not interfere with the mask frame F, which is the film formation position.
  • the rotary shaft 14Xb is rotated by the motor 14Xa of the X drive unit 14X to move the X position regulation unit 14Xc in the X direction.
  • the rotary shaft 14B is driven in the axial direction to set the position of the holding portion 14A in the X direction so that the upper end of the mask frame F is positioned between the holding pieces 14Aa and 14Ab.
  • the rotary shaft 14B is pivoted about the axis by the motor 14Ra of the rotary drive unit 14R.
  • the angular position around the axis of the rotation shaft 13B in the holding portion 13A is set so that the upper end of the mask frame F is positioned between the holding pieces 14Aa and 14Ab in the holding portion 14A.
  • convex part 14Ad, 14Ae each contact
  • the rotary shaft 14Xb is rotated by the motor 14Xa of the X drive unit 14X to move the X position regulating unit 14Xc in the X direction, thereby driving the rotary shaft 14B in the axial direction to move the upper end of the mask frame F It is possible to finely adjust the position in the X direction in.
  • the motor 14Ra of the rotational drive unit 14R is disposed at the outside position of the film forming chamber 4 and the motor 14Xa of the X drive unit 14X is outside the film forming chamber 4 It is placed in position. Therefore, angular position adjustment around the axis of the rotary shaft 14B in the sandwiching portion 14A and axial position adjustment of the rotary shaft 14B in the sandwiching portion 14A are both performed from the outside of the film forming chamber (chamber) 4. Thereby, the dust generated in the chamber 4 can be prevented from diffusing.
  • FIG. 13 is a perspective view showing the engaging portion of the mask frame in the present embodiment.
  • FIG. 14 is a perspective view showing the engagement portion of the mask frame in the present embodiment.
  • FIG. 15 is a perspective view showing an engaged state of the support alignment portion in the sputtering apparatus in the present embodiment and the engagement portion in the mask frame.
  • FIG. 16 is a perspective view showing an engaged state of the support alignment portion in the sputtering apparatus in the present embodiment and the engagement portion in the mask frame.
  • the mask frame F is engaged at both ends of the lower end of the substantially rectangular frame Fa, that is, at both ends in the Y direction on the lower side in the Z direction.
  • the part F1 and the engaging part F2 are provided, respectively.
  • the engaging portion F1 is provided on one end side of the mask frame F, as shown in FIGS. 8 and 13, and protrudes below the lower end of the frame body Fa.
  • An engagement recess F1a is provided on the bottom surface of the engagement portion F1.
  • the engagement recess F1a has a substantially spherical surface shape, and is formed so that the projection 11a of the support alignment portion 11 can be engaged and position regulation can be performed in the X and Y directions. It is done.
  • the convex portion 11a and the engaging concave portion F1a are closest to each other in the Z direction, that is, in the state where the engaging concave portion F1a is placed on the convex portion 11a,
  • the entire circumference of the portion 11a is in line contact with the entire circumference of the engagement recess F1a so as to form a circle.
  • the position of the mask frame F is set so that the center position of the convex portion 11a matches the XY position with respect to the central position of the engagement concave portion F1a in plan view.
  • the shapes of the engagement concave portion F1a and the convex portion 11a are not limited to the above-described shapes as long as they can set the center position in the X and Y directions with each other, and other shapes may be used. It is possible. For example, a structure may be employed in which the concavo-convex shape in which the engagement concave portion F1a and the convex portion 11a are fitted to each other is set reverse to the embodiment described above. Specifically, a structure in which a convex member is provided on the mask frame F and a concave member is provided on the support alignment unit 11 may be employed. Also, as the shape of either the engagement concave portion F1a or the convex portion 11a, a shape formed in a conical shape instead of a spherical shape, or a shape such as a polygonal pyramid may be adopted.
  • the engaging portion F2 is provided on one end side of the mask frame F, as shown in FIGS. 8 and 14, and protrudes below the lower end of the frame body Fa.
  • An engagement groove F2a is provided on the bottom surface of the engagement portion F2.
  • the engagement groove F2a extends so as to have substantially the same shape in the direction in which the lower end of the frame Fa extends, that is, in the Y direction. Furthermore, the engaging groove F2a has an arc-shaped surface shape in which the cross section in the XZ direction of the engaging groove F2a is substantially the same in the extending direction of the engaging groove F2a.
  • the arc shape of the engagement groove F2a is formed so that the convex portion 12a of the support alignment portion 12 engages and has freedom in the Y direction so that the position of the convex portion 12a in the X direction can be set. There is.
  • the convex portion 12a is engaged with the central position of the convex portion 12a in either the X direction or Y direction which is the radial direction of the convex portion 12a with respect to the central position of the engagement groove portion F2a. Even when contacting the mating groove F2a, the outer surface of the convex 12a moves in the X and Y directions along the inner surface of the engagement groove F2a as the convex 12a and the engagement groove F2a approach in the Z direction. .
  • the convex portion 12a and the engaging groove portion F2a are closest to each other in the Z direction, that is, in the state where the engaging groove portion F2a is mounted on the convex portion 12a.
  • An arc in a cross section along the X direction of the portion 12a makes line contact with the inner surface of the engagement groove F2a so as to coincide with the cross section along the X direction of the engagement groove F2a.
  • the position of the mask frame F is set such that the central position of the convex portion 12a coincides with the X direction with respect to the X direction central position of the engagement groove F2a in a plan view.
  • the position of the protrusion 12a in the Y direction with respect to the engagement groove F2a extending in the Y direction has a degree of freedom corresponding to the length of the engagement groove F2a in the Y direction and is set to the position in the Y direction Be done.
  • the upper support portions 16 are provided between the upper alignment portion 13 and the upper alignment portion 14 in the Y direction at a central position on the upper side of the mask frame F, as shown in FIG.
  • the upper support portions 16, 16 support the mask frame F by the support alignment portions 11, 12, and the mask frame F is prevented from falling immediately before the upper alignment portions 13, 14 support and align the mask frame F. Support the upper side of F.
  • the upper side support parts 16 and 16 have the magnet part 16a and the Z drive part 16Z, as shown in FIG.
  • the magnet portion 16 a is provided in a portion including the central portion of the upper end of the mask frame F, specifically, the entire length of the mask frame F excluding the positions of both left and right ends of the mask frame F.
  • the magnet portion 16 a can support the weight of the mask frame F by attracting the upper frame support F 6 such as a magnet that constitutes the mask frame F.
  • the Z drive unit 16Z can drive the magnet unit 16a in the Z direction.
  • the transport path of the mask frame F and the magnet portion 16a, in which the position of the magnet portion 16a in the X direction is defined by the plurality of transport means 60 in plan view Are set to overlap. Further, the position of the upper support portion 16 in the Z direction is set so that the magnet portion 16a in the lowermost position substantially coincides with the line connecting the transport upper support portion 66 provided in the transport path.
  • the cross-sectional configuration in the XZ plane of the magnet portion 16a is set to have the cross-sectional configuration in the XZ plane equivalent to the above-described transport upper support portions 56, 66.
  • the magnet portion 16a attracts each other with the upper frame support F6 provided at the upper end of the mask frame F.
  • the magnet portion 16a and the upper frame support F6 form a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
  • the magnet portion 16a of the upper support portion 16 has a configuration equivalent to that of the upper magnet portion 56a of the transport upper support portion 56 shown in FIG. 3, and the symbol 56a in the figure should be read as 16a.
  • the magnet unit 16a includes a plurality of magnets extending in the Y direction parallel to the conveyance direction of the mask frame F, as in the upper magnet unit 56a described above.
  • the magnets of the magnet portion 16a attract each other with the upper frame support F6 provided at the upper end of the mask frame F.
  • the magnet of the magnet unit 16a forms a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
  • the magnet section 16a has substantially the same cross-sectional configuration over the entire length of the upper support section 16 in the Y direction.
  • the magnetic circuit formed between the upper frame support F6 and the magnet portion 16a is formed substantially the same over the entire length of the upper support portion 16 in the Y direction. Therefore, in the entire length of the upper support portion 16 in the Y direction, it is possible to substantially equalize the attraction of the upper frame support F6 and the magnet portion 16a to attract each other.
  • the upper frame support F6 In order to support the upper side of the mask frame F by the upper support portion 16, it is necessary to set the Z-direction distance between the magnet portion 16a and the upper frame support F6 within a predetermined range. At the same time, in order to support the upper side of the mask frame F by the upper support portion 16, the upper frame support F6 needs to be positioned directly below the magnet portion 16a. When these conditions are satisfied, the magnet portion 16 a and the upper frame support F 6 attract each other, and the mask frame F is supported by the upper support 16.
  • the plurality of magnet portions 16a may be disposed along the upper end of the mask frame F located in the transport path extending in the Y direction.
  • the magnet portion 16 a in the upper support portions 16 and 16, can be divided into two.
  • the magnet portion 16a may be divided into three or more.
  • the Z driving unit 16Z has a motor 16Za, a rotating shaft 16Zb, a Z plate unit 16c, a regulating unit 16Zd, a connecting unit 16b, and a Z position regulating unit 16Zc.
  • the motor 16Za is configured by a stepping motor or a servomotor.
  • the rotating shaft 16Zb extends in the Z direction and is rotationally driven by the motor 16Za.
  • the Z plate portion 16c is screwed to the rotary shaft 16Zb and is relatively movable in the axial direction of the rotary shaft 16Zb.
  • the restricting portion 16Zd restricts the movement of the Z plate portion 16c and the motor 16Za.
  • the connection part 16b connects the Z plate part 16c and the magnet part 16a.
  • the lower end (front end) of the rotating shaft 16Zb is connected to the Z position restricting portion 16Zc.
  • the lower end (tip) of the rotary shaft 16Zb is connected to the Z position restricting unit 16Zc in a rotatable state.
  • the rotation shaft 16Zb By rotating the rotation shaft 16Zb by the motor 16Za, the rotation shaft 16Zb is rotated so as not to move in the Z direction with respect to the Z position restricting portion 16Zc.
  • the moving direction of the Z plate portion 16c is restricted by the restricting portion 16Zd.
  • the Z plate portion 16c is configured to move in the Z direction with respect to the Z position restricting portion 16Zc.
  • the Z position control unit 16 Zc is a top of the film forming chamber (chamber) 4.
  • the Z drive unit 16Z can extend or retract the magnet unit 16a in the Z direction, and is fixed to the top of the film forming chamber (chamber) 4.
  • the motor 16 Za is disposed outside the Z position restricting portion 16 Zc located at the top of the film forming chamber 4, that is, outside the chamber 4.
  • FIG. 17 is a front view showing a state before alignment in the mask chamber of the sputtering apparatus in the present embodiment.
  • FIG. 18 is a front view showing the alignment state in the mask chamber of the sputtering apparatus in the present embodiment.
  • the Z driving unit 16Z is driven in the upper side support portions 16 and 16 to bring the magnet portion 16a close to the upper end of the mask frame F.
  • the magnet unit 16a is lowered to the lowermost position. Thereby, the magnet portion 16 a is positioned on the line connecting the transport upper support portion 66.
  • the upper support portion 16 and the magnet portion 26 attract each other.
  • the upper end of the mask frame F is supported so as not to fall down.
  • the slider F5 is not in contact with the support alignment portions 11, 12, and the slider F5 is in contact with the drive rollers 65a, 65a of the transport drive portion 65.
  • the straight line connecting the tops of the plurality of drive rollers 65a forming the conveyance path is set at a position higher than the positions of the convex portions 11a and 12a of the support alignment portions 11 and 12 at the Z direction position. It can set so that it may become a position lower than the upper stop point of convex part 11a, 12a which rises with alignment operation of alignment parts 11 and 12.
  • the support alignment units 11 and 12 are set in the Z drive units 11Z and 12Z such that the positions of the convex portions 11a and 12a become the lowest position in the Z direction as shown in FIG. ing.
  • the convex portions 11a and 12a may be located close to the film forming position in the in-plane direction of the XY plane. This is because the protrusion 11a can contact any position of the inner surface of the engagement recess F1a with the rise of the protrusion 11a, and the engagement groove F2a with the rise of the protrusion 12a. It means that the convex part 12a can abut on any position on the inner surface.
  • the upper alignment unit 13 forms the mask frame F at the deposition position where the angle of the sandwiching portion 13A around the axis of the rotation shaft 13B in the rotational drive unit 13R.
  • the position of the holding portion 13A be set such that the holding portion 13A is positioned near the mask frame F and the holding portion 13A is inclined at least upward around the axis of the rotation shaft 13B. .
  • the upper end of the mask frame F is set so as to be located between the holding pieces 13Aa and 13Ab in the holding unit 13A in the X drive unit 13X.
  • the upper alignment unit 14 forms a film of the mask frame F with the angle of the sandwiching portion 14A around the axis of the rotation shaft 14B in the rotation drive unit 14R.
  • the angle does not interfere with the mask frame F.
  • the position of the sandwiching portion 13A be set such that the sandwiching portion 14A is located near the mask frame F and the sandwiching portion 14A is inclined at least upward around the axis of the rotation shaft 14B. .
  • the upper end of the mask frame F is set to be positioned between the sandwiching pieces 14Aa and 14Ab in the sandwiching part 14A in the X drive unit 14X.
  • the rotation drive unit 13R of the upper alignment unit 13 is driven to hold the holding unit 13A around the axis of the rotation shaft 13B as shown by the arrow r13 in FIG. To rotate.
  • the angle of the holding portion 13A is determined by bringing the convex portion 13Ad and the convex portion 13Ae provided on the two opposing surfaces located between the holding piece 13Aa and the holding piece 13Ab into contact with the front and back surfaces of the mask frame F, respectively. Supportable angle.
  • the rotation drive portion 14R of the upper alignment portion 14 is driven to hold the holding portion 14A around the axis of the rotation shaft 14B as shown by arrow r14 in FIG. To rotate.
  • the angle of the holding portion 14A is determined by bringing the convex portion 14Ad and the convex portion 14Ae provided on the two opposing surfaces located between the holding piece 14Aa and the holding piece 14Ab into contact with the front and back surfaces of the mask frame F, respectively. Supportable angle.
  • the Z drive units 11Z and 12Z in the support alignment units 11 and 12 respectively.
  • the raised portions 11a and 12a are raised to bring the raised portion 11a into contact with the inner surface of the engaging recessed portion F1a, and the raised portion 12a is provided on the inner surface of the engaging groove F2a. Abut on.
  • the slider F5 is separated from the drive rollers 65a and 65a of the transport means 60 by the operations of the Z drive units 11Z and 12Z indicated by arrows r11 and r12 in FIG.
  • the weight of the mask frame F is supported by the support alignment units 11 and 12.
  • the Z drive unit 16Z in the upper support units 16 and 16 is driven.
  • the magnet unit 16a is lifted, and the magnet unit 16a is operated so as not to abut on the rising mask frame F.
  • the convex portion 11a abuts on the inner surface of the engagement recess F1a
  • the convex portion 12a abuts on the inner surface of the engagement groove F2a.
  • the lower end of the mask frame F is restricted to the position in the XY plane set by the convex portions 11a and 12a.
  • the convex portion 13Ad of the holding piece 13Aa and the convex portion 13Ae of the holding piece 13Ab respectively abut the front and back surfaces of the mask frame F.
  • the holding piece 14Aa convex portion 14Ad and the convex portion 14Ae of the holding piece 14Ab respectively abut on the front surface and the back surface of the mask frame F.
  • the upper end of the mask frame F is restricted to the X direction position set by the holding portions 13A and 14A.
  • the mask alignment means 10 is operated. As a result, the positional relationship between the glass substrate S and the mask frame F is controlled to be at a predetermined film formation position for sputtering.
  • the X drive units 11X and 12X, the Y drive units 11Y and 12Y, and the Z drive units 11Z and 12Z are driven. Furthermore, the X drive unit 13X in the upper alignment units 13 and 14 is driven. Thereby, the positions in two directions of the mask frame F in the ZY plane and the positions in the X direction orthogonal to the ZY plane of the mask frame F, that is, the positions in the three axial directions and three around the three axial axes. Alignment of the mask frame F is performed in six degrees of freedom with one rotation direction (angle).
  • position setting in three directions in the X, Y, and Z directions of the side end of the engagement portion F1 at the lower end of the mask frame F by the support alignment portion 11 and engagement at the lower end of the mask frame F by the support alignment portion 12 Position setting in three directions in the X, Y, and Z directions of the side end of the portion F 2, position setting in the X direction of the side end of the engaging portion F 1 at the upper end of the mask frame F by the upper alignment portion 13, mask by the upper alignment portion 14
  • frame F is performed.
  • the X driving units 11X and 12X and the Y driving units 11Y and 12Y are provided in the chamber 4.
  • the drive units 11X, 12X, 11Y, and 12Y are provided outside the chamber 4, from the drive units 11X, 12X, 11Y, and 12Y to the mask frame F whose position is controlled by the drive units.
  • Distance can be shortened. This makes it possible to control the position of the mask frame F with higher precision.
  • the drive units 11X, 12X, 11Y, and 12Y can be sealed in the chamber 4 using a space-saving type stepping motor. For this reason, it is possible to prevent the generation of dust and the like with respect to the driving of the driving units 11X, 12X, 11Y, and 12Y. As a result, it is possible to improve the film formation characteristics of sputtering on the glass substrate S, to improve the yield, and to reduce the manufacturing cost.
  • the Z drive units 11Z and 12Z in the support alignment units 11 and 12 and the rotational drive units 13R and 14R and the X drive units 13X and 14X in the upper alignment units 13 and 14 are provided outside the chamber 4. Be Thereby, it is possible to support the mask frame F having a weight which may be 500 kg or more, and to use a high output motor without worrying about the space in the chamber 4 when directly driving the mask frame F It becomes.
  • the mask frame F is supported by the convex portions 11 a and 12 a by the engagement portions F 1 and F 2 and the convex portions 11 a and 12 a of the support alignment portions 11 and 12 having the above configuration.
  • the position setting at the lower end portion of the mask frame F can be performed only by driving the Z driving units 11Z and 12Z in the support alignment units 11 and 12.
  • the mask frame F can be supported finely adjustable only by engaging the engagement recess F1a and the engagement groove F2a with the projections 11a and 12a of the support alignment portions 11 and 12, respectively.
  • the X drive units 13X and 14X move the sandwiching units 13A and 14A along the rotation axes 13B and 14B, thereby moving in the X direction.
  • the position of the mask frame F can be controlled, whereby the mask frame F can be aligned in the six degrees of freedom described above.
  • the mask frame F in the space-saving sputtering apparatus 1, can be easily aligned with a simple configuration and no dust, and excellent film forming characteristics can be reduced. Can be realized.
  • the mask frame F is driven and controlled, respectively.
  • a means to do it is not limited to this composition.
  • the vertical conveyance / vertical film formation in which the substrate S and the mask frame F are in the standing position has been described, but horizontal conveyance in which the mask frame F is in the horizontal position may be used.
  • FIG. 19 is a schematic plan view showing a part of the sputtering apparatus in the present embodiment.
  • the difference from the first embodiment described above relates to the arrangement of the stock chamber and the film forming chamber,
  • symbol is attached
  • two stock chambers 50 and 50A are connected to one film forming chamber 4.
  • the load / unload chamber 2, the transfer chamber 3 and the like are omitted.
  • the mask frame F having a predetermined type and a predetermined number of sheets can be sequentially carried into the film forming chamber 4 from the outside as one of the stock chambers 50 as a load chamber for the mask frame F.
  • the mask frame F having a predetermined type and a predetermined number of sheets can be sequentially taken out from the film forming chamber 4 as an unloading chamber for the mask frame F on the other stock chamber 50A.
  • automated mask replacement can be performed without opening the film formation chamber 4 to the atmosphere.
  • the mask frame F after film formation is transported to different load / unload chambers with respect to the mask frame F before film formation. For this reason, it is possible to reduce adhesion of particles to the mask frame F before film formation and to suppress the influence of particles in sputtering.
  • Vapor deposition, CVD, etching and the like can be mentioned as application examples of the present invention.
  • Connecting part 56d Z supporting part 56e: Convex part 56f: Z driving part 58: Sealing means 58a: Partitioning valve 58b: Loading port 58c: Mask taking out filling port 58d: opening and closing part 58e: rocking shaft 58f: rocking driving part 58g .. Take-out support part 58 ga ...
  • Drive portion 65a Drive roller 65b: Rotational drive portion 66: Transport upper support portion 661, 662, 663, 664: Magnet 665: Magnetic portion 666: Nonmagnetic portion 667: Lower surface 10: Mask alignment means 11, 12: Support alignment portion 11a, 12a: convex portion 13, 14: upper alignment portion 13A, 14A: pinching portion 16: upper support portion 16a: magnet portion

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Abstract

This sputtering device (1) has a mask exchanging means (100) which makes it possible to replace a mask frame (F) held approximately perpendicularly with respect to a substrate (S) on which film formation is performed by sputtering within a chamber. The mask replacement means comprises: a stock chamber (50) which can be enclosed in an airtight manner to enable a plurality of mask frames to be stocked in a plane-parallel state; and a conveyance means (60) which conveys the plurality of stocked mask frames to the mask chamber (43) which is in a film-forming position within the chamber (4). The stock chamber is provided with: stock support units (51, 52, 53, 54) which enable front-rear movement in an approximately orthogonal direction to the mask surface of a mask frame; drive support units (55, 65) which can select a mask frame stocked in a stock support unit and drive said frame in the planar direction; and conveyance support units (56, 66) which can support the upper edge of the mask frame so as not to tilt when the mask frame is being moved by a drive support unit.

Description

スパッタリング装置Sputtering device
 本発明は、スパッタリング装置に関し、特に、縦型搬送のスパッタリング装置におけるマスクフレームの交換に用いられる好適な技術に関する。
 本願は、2017年10月5日に日本に出願された特願2017-195211号に基づき優先権を主張し、その内容をここに援用する。
The present invention relates to a sputtering apparatus, and more particularly to a preferred technique used for replacing a mask frame in a vertical transport sputtering apparatus.
Priority is claimed on Japanese Patent Application No. 2017-195211, filed Oct. 5, 2017, the content of which is incorporated herein by reference.
 例えば、有機ELディスプレイなどの製造工程において、ガラス等からなる基板上に対して、真空環境下で加熱処理、成膜処理等を行う成膜装置(スパッタリング装置)が用いられる。 For example, in a manufacturing process of an organic EL display or the like, a film forming apparatus (sputtering apparatus) is used which performs heat treatment, film forming process and the like in a vacuum environment on a substrate made of glass or the like.
 一般的なスパッタリング装置では、チャンバ内にスパッタリング用のカソードが設けられ、減圧したチャンバ内において、カソードに取り付けられたターゲットと所定の間隔を空けて対向するように被処理体(基板)が配置される。 In a general sputtering apparatus, a cathode for sputtering is provided in a chamber, and an object to be processed (substrate) is disposed to face a target attached to the cathode at a predetermined distance in a reduced pressure chamber. Ru.
 次に、チャンバ内にArガス(不活性ガス)等を導入し、被処理体をグラウンドに接続した状態でターゲットに負の電圧を印加することにより放電させ、放電によりArガスから電離したArイオンをターゲットに衝突させる。
 そして、ターゲットから飛び出す粒子を被処理体に付着させることにより、成膜処理が行われる。
Next, Ar gas (inert gas) or the like is introduced into the chamber, and a negative voltage is applied to the target in a state where the object to be treated is connected to ground to discharge the Ar ion ionized from Ar gas by the discharge. Collide with the target.
And the film-forming process is performed by making the to-be-processed object the particle | grains which fly out of a target.
 従来のスパッタリングでは基板の周囲に配置される防着板が使用されることはあったが、基板面内での成膜領域を細かく制御するためのマスクは使用されることがなかった。基板とマスクとのアライメントは、ほぼ固定されたマスク(防着板)に対して基板側を位置制御することでおこなわれていた。(特許文献1) In the conventional sputtering, an adhesion preventing plate disposed around the substrate has been used in some cases, but a mask for finely controlling the film formation area in the substrate surface has not been used. The alignment between the substrate and the mask is performed by controlling the position of the substrate side with respect to the substantially fixed mask (adhesion prevention plate). (Patent Document 1)
 最近、特許文献2に記載されるような有機ELディスプレイの製造においては、従来までは蒸着でしか成膜できなかった膜種がスパッタでも成膜できるようになった。このため、装置構造が複雑でコストもかかる装置が用いられていた蒸着にかえて、スパッタリングによって成膜を行うことが検討されている。 Recently, in the manufacture of an organic EL display as described in Patent Document 2, it has become possible to form a film type even by sputtering, which conventionally has been able to form a film only by vapor deposition. For this reason, in place of vapor deposition in which the device structure is complicated and expensive, the film formation is considered to be performed by sputtering.
 蒸着による成膜では、特許文献3に記載されるように、エンドエフェクタのように、マスクアライメントのための駆動系を設けてアライメントをおこなっていた。 In the film formation by vapor deposition, as described in Patent Document 3, a drive system for mask alignment is provided as in the end effector to perform alignment.
日本国特許第5309150号公報Japanese Patent No. 5309150 日本国特許第5634522号公報Japanese Patent No. 5634522 日本国特許第5074368号公報Japanese Patent No. 5074368
 しかし、スパッタリングで使用するマスクは、基板面内での成膜領域を制御する開口を有する。このマスクを使用する場合には、成膜粒子の付着によりマスクの開口の形状が変わるために、マスクを頻繁に交換する必要が生じる。その結果、マスクの交換回数が増加するに伴って、マスクの交換に必要な作業時間が増大してしまう。さらに、マスクの交換頻度が低い場合にはマスクの位置合わせを行う頻度も少なかったが、マスクの交換回数が増加することに伴って、マスクの位置あわせに必要な作業時間が増大する。したがって、これらの作業時間を削減したいという要求が出てきた。 However, the mask used for sputtering has an opening for controlling the deposition region in the substrate surface. When this mask is used, the mask needs to be replaced frequently because the shape of the opening of the mask changes due to the deposition of deposition particles. As a result, as the number of times of mask replacement increases, the operation time required to replace the mask increases. Furthermore, when the mask replacement frequency is low, the frequency of performing mask alignment is low, but as the number of mask replacements increases, the time required for mask alignment increases. Therefore, there has been a demand to reduce these work hours.
 また、基板の周囲を囲むいわゆる枠として機能する防着板を用いる場合、防着板と基板との間の位置精度は0.1mm~数mm程度である。これに対し、基板上の成膜領域を規制するために用いられるマスクと基板との間の位置精度は、ほぼ数μmから数十μm程度である。したがって、このマスクと基板との間の位置精度としては、作業員がアライメントを直接おこなうことができない精度が求められる。このため、アライメント作業に必要な時間が膨大になるおそれがある。
 このため、マスクと基板との間のアライメントを自動化して、アライメント作業に必要な時間を短縮したいという要求があった。また、マスクと基板との間のアライメントの精度を向上したいという要求があった。
In addition, in the case of using an adhesion preventing plate that functions as a so-called frame surrounding the periphery of the substrate, the positional accuracy between the adhesion preventing plate and the substrate is about 0.1 mm to several mm. On the other hand, the positional accuracy between the mask and the substrate used to control the film formation region on the substrate is about several micrometers to several tens of micrometers. Therefore, the position accuracy between the mask and the substrate is required to be such that the operator can not directly perform the alignment. Therefore, the time required for the alignment operation may be enormous.
Therefore, there has been a demand to automate the alignment between the mask and the substrate to reduce the time required for the alignment operation. There is also a demand to improve the accuracy of alignment between the mask and the substrate.
 また、有機ELディスプレイなどの製造では、基板サイズが2000mmを越える場合、基板に対して設置されるマスクの重量が500kg~数トンである。特に、エンドエフェクタのように、マスクアライメントのための駆動系をマスクに設けた場合には、重量が増大して作業員が直接取り扱って交換作業を行うことが難しくなる。さらに、このエンドエフェクタを含めたマスクアライメント機構が非常に複雑であり、かつ重量が大きい構成であるためにメンテナンス作業に対する負担が大きい。このため、このようなメンテナンス作業を自動化したいという要求があった。 In the manufacture of an organic EL display or the like, when the substrate size exceeds 2000 mm, the weight of the mask placed on the substrate is 500 kg to several tons. In particular, when a drive system for mask alignment is provided on the mask as in the end effector, the weight increases and it becomes difficult for workers to handle it directly and perform replacement work. Furthermore, the mask alignment mechanism including the end effector is very complicated and heavy, and the burden on maintenance work is large. For this reason, there is a demand to automate such maintenance work.
 さらに、異なる種類の基板を製造可能としたいという要求があった。この場合、それぞれ異なる種類の基板の製造に対応した異なる形状のマスクを次々に交換できることが必要である。このため、異なる形状のマスクの交換にかかる作業の時間を短縮して、異なる形状のマスクの交換にかかる作業の工程数を削減することにより、異なる種類の基板の製造コストを低減したいという要求があった。 Furthermore, there has been a demand to be able to manufacture different types of substrates. In this case, it is necessary that masks of different shapes corresponding to the manufacture of different types of substrates can be exchanged one after another. For this reason, there is a demand to reduce the manufacturing cost of different types of substrates by shortening the time for work of replacing masks of different shapes and reducing the number of steps of work for replacing masks of different shapes. there were.
 さらにまた、成膜工程終了時に、成膜室を大気解放してマスクを交換した場合には、マスクの表面、および、カソード側の表面が大気に接触する。この大気接触によってマスクの表面、および、カソード側の表面に悪影響が及ぶ。この悪影響は従来許容範囲とされていたが、最近、成膜特性の要求が厳しくなってきているため、マスクの交換を、密閉を維持した真空中で実現したいという要求が発生してきた。 Furthermore, when the film formation chamber is opened to the atmosphere and the mask is replaced at the end of the film formation process, the surface of the mask and the surface on the cathode side come in contact with the atmosphere. This atmospheric contact adversely affects the surface of the mask and the surface on the cathode side. Although this adverse effect has been considered to be within the allowable range in the past, recently there has been a demand for realizing mask replacement in a sealed vacuum while the requirements for film formation characteristics are becoming stricter.
 本発明は、上記の事情に鑑みてなされたもので、以下の目的を達成しようとするものである。
1.重量物である縦型搬送用マスクの交換を簡単な構成で容易に可能とすること。
2.マスクの交換を自動化すること。
3.成膜室(チャンバ)を大気解放しないでマスクの交換を可能とすること。
4.マスクの交換に必要な時間を短縮すること。
5.マスクを交換する際に、基板に対してマスクを精度よくアライメント可能とすること。
The present invention has been made in view of the above circumstances, and aims to achieve the following objects.
1. Allowing easy replacement of heavy-duty vertical transfer masks with a simple configuration.
2. Automate mask replacement.
3. Allowing mask replacement without releasing the film formation chamber to the atmosphere.
4. Reduce the time required to replace a mask.
5. When replacing a mask, enable accurate alignment of the mask with the substrate.
 本発明の第1態様に係るスパッタリング装置は、スパッタリング装置であって、チャンバ内でスパッタリングにより成膜する基板に対し、略垂直保持されたマスクフレームを交換可能とするマスク交換手段を有し、前記マスク交換手段が、複数の前記マスクフレームを前記マスクフレームの面どうしが略平行な状態に複数ストック可能とする密閉可能なストック室と、複数ストックされた前記マスクフレームから選択された一枚のマスクフレームを前記チャンバ内の成膜位置となるマスク室まで搬送する搬送手段と、を有し、前記ストック室には、複数の前記マスクフレームを前記マスクフレームの前記面どうしが略平行な状態に複数支持可能とされるとともにこれら複数の前記マスクフレームを前記マスクフレームの前記面に略直交する方向に前後移動可能とするストック支持部と、前記ストック支持部にストックされた前記マスクフレームから選択された一枚のマスクフレームを前記マスクフレームの前記面に平行な略水平方向に駆動可能とする駆動支持部と、前記駆動支持部により前記マスクフレームが移動される際に前記マスクフレームの上端を傾かないように支持可能とする搬送上支持部と、が設けられることにより上記課題を解決した。
 本発明の第1態様に係るスパッタリング装置においては、前記ストック支持部が、複数の前記マスクフレームの下端を支持可能とされた複数のストック溝を有するストック載置部と、上昇、下降および前後移動可能とされ、上昇時に前記ストック載置部の前記ストック溝に載置された複数の前記マスクフレームの下端に当接して複数の前記マスクフレームを持ち上げ、前記ストック載置部から離間した状態である上昇位置として複数の前記マスクフレームを支持するとともに、前記上昇位置として支持している複数の前記マスクフレームを前記マスクフレームの前記面に略直交する方向に前後移動した後に、前記マスクフレームの下端から離間するまで下降して、複数の前記マスクフレームを前記ストック載置部の前記ストック溝に載置可能とするストック下支持部と、前記ストック載置部にストックされた複数の前記マスクフレームの上側の位置を支持および解放可能とされるとともに前記ストック下支持部と同じ前記マスクフレームの前記面に略直交する方向に前後移動可能なストック上支持部と、を有することが可能となる。
 本発明の第1態様に係るスパッタリング装置においては、前記ストック下支持部が、ストックされた前記マスクフレームの前記面に略平行な方向に延在して前記マスクフレームの下端を支持する複数の支持溝と、これら複数の前記支持溝を、前記マスクフレームの前記面に略直交する方向に前後移動可能とするストック位置交換駆動部と、を有することが可能となる。
 本発明の第1態様に係るスパッタリング装置においては、前記ストック上支持部が、前記マスクフレームの前記面に直交する方向に延在する軸線周りに回動可能とされるとともに、前記マスクフレームの上端を前記マスクフレームの前記面に直交する方向の両側から挟持可能な挟持部を有し、前記挟持部が、前記軸線と平行な方向に沿って前後移動可能とされることが可能となる。
 また、本発明の第1態様に係るスパッタリング装置においては、前記ストック支持部が、複数の前記マスクフレームの下端の位置を支持可能とされた複数のストック溝を有するストック載置部を有し、前記駆動支持部が、前記マスクフレームの前記面に略直交する方向と平行な軸線を有するとともに回転駆動部により駆動可能な駆動ローラを有し、前記回転駆動部により前記駆動ローラを回転駆動することによって、前記ストック載置部の前記ストック溝に載置されている前記マスクフレームのうち、前記駆動ローラに当接している前記マスクフレームを選択して前記マスクフレームの前記面に平行な方向に前記マスクフレームを駆動可能とされることが可能となる。
 また、本発明の第1態様に係るスパッタリング装置においては、前記搬送上支持部が上マグネット部を有し、前記上マグネット部には、前記マスクフレームの上端に設けられたマグネット部と互いに引き付け合うとともに、前記マスクフレームの前記面に平行な方向と略直交する鉛直面内に形成される磁気回路を有するようにマグネットが配置されることが可能となる。
 また、本発明の第1態様に係るスパッタリング装置においては、前記ストック室が、前記マスクフレームが未使用であるか使用済みであるかにかかわらず、前記ストック室にストックされた前記マスクフレームと前記チャンバ内の成膜位置となる前記マスク室にある前記マスクフレームとの交換を行う場合には、外部に対して前記ストック室を密閉し、かつ、前記チャンバに連通した状態で前記マスクフレームを搬送可能とするとともに、前記ストック室にストックされた前記マスクフレームを外部に対して搬入または搬出する場合には、前記チャンバを密閉するとともに前記外部に対して前記ストック室を連通した状態で前記マスクフレームを搬入可能または搬出可能とする密閉手段を有することが可能となる。
 また、本発明の第1態様に係るスパッタリング装置においては、前記ストック室が、ストックされた前記マスクフレームを交換可能なように複数の前記チャンバに対してそれぞれ接続されることが可能となる。
 また、本発明の第1態様に係るスパッタリング装置においては、前記チャンバ内の成膜位置となる前記マスク室において、前記マスクフレームの前記面に平行な二方向および前記マスクフレームの前記面に直交する直交方向の三つの軸方向と、前記三つの軸方向の軸線周りの三つの回転方向とによる六自由度にて、前記マスクフレームをアライメント可能とするマスクアライメント手段を有することができる。
 本発明の第2態様に係るマスクフレームにおいては、上記のスパッタリング装置における前記ストック室と前記マスク室との間で搬送可能とされるマスクフレームであって、前記搬送上支持部に設けられた前記上マグネット部と互いに引き付け合うとともに、前記マスクフレームの前記面に平行な方向と略直交する鉛直面内に形成される磁気回路を有するようにマグネットが配置されたマグネット部を有することが可能となる。
A sputtering apparatus according to a first aspect of the present invention is a sputtering apparatus, and has a mask exchanging unit that enables exchange of a mask frame substantially vertically held with respect to a substrate to be deposited by sputtering in a chamber. A mask selected from a plurality of the mask frames that can be sealed, and a sealable stock chamber in which a plurality of mask frames can be stocked with the plurality of mask frames substantially parallel to one another Conveying means for conveying the frame to a mask chamber which is a film forming position in the chamber, and a plurality of the mask frames are arranged in the stock chamber such that the surfaces of the mask frame are substantially parallel to each other Supportable and substantially orthogonal to the face of the mask frame. Drive capable of driving one mask frame selected from the stock support portion which can be moved back and forth and the mask frame stocked in the stock support portion in a substantially horizontal direction parallel to the surface of the mask frame The above problem is solved by providing a support portion and a transport upper support portion capable of supporting the upper end of the mask frame so as not to tilt when the mask frame is moved by the drive support portion.
In the sputtering apparatus according to the first aspect of the present invention, the stock support portion includes a stock placement portion having a plurality of stock grooves capable of supporting the lower ends of the plurality of mask frames, and raising, lowering and moving back and forth. It is possible to lift the plurality of mask frames by coming into contact with the lower ends of the plurality of mask frames placed in the stock grooves of the stock placement portion at the time of ascent and separating from the stock placement portions From the lower end of the mask frame after supporting the plurality of mask frames as the elevated position and moving the plurality of mask frames supported as the elevated position back and forth in the direction substantially orthogonal to the surface of the mask frame It can be lowered until it separates and a plurality of the mask frames can be placed on the stock grooves of the stock placement portion The lower stock support portion and the upper positions of the plurality of mask frames stocked in the stock placement portion can be supported and released, and substantially orthogonal to the same surface of the mask frame as the lower stock support portion It is possible to have a stock upper support which can move back and forth in the direction of movement.
In the sputtering apparatus according to the first aspect of the present invention, a plurality of supports, wherein the stock lower support portion extends in a direction substantially parallel to the surface of the stocked mask frame and supports the lower end of the mask frame It is possible to have a groove and a stock position exchange driving unit capable of moving the plurality of support grooves back and forth in a direction substantially orthogonal to the surface of the mask frame.
In the sputtering apparatus according to the first aspect of the present invention, the stock upper support portion is rotatable around an axis extending in a direction orthogonal to the surface of the mask frame, and the upper end of the mask frame It is possible to have a sandwiching portion capable of sandwiching from both sides in a direction orthogonal to the surface of the mask frame, and the sandwiching portion can be moved back and forth along a direction parallel to the axis.
In the sputtering apparatus according to the first aspect of the present invention, the stock support portion has a stock placement portion having a plurality of stock grooves capable of supporting the positions of lower ends of the plurality of mask frames, The drive support portion has an axis parallel to a direction substantially orthogonal to the surface of the mask frame and has a drive roller which can be driven by a rotational drive portion, and the rotational drive portion rotationally drives the drive roller. Select the mask frame in contact with the drive roller among the mask frames placed in the stock groove of the stock placement unit, and select the mask frame in a direction parallel to the surface of the mask frame. It is possible to drive the mask frame.
In the sputtering apparatus according to the first aspect of the present invention, the transport upper support portion has an upper magnet portion, and the upper magnet portion attracts the magnet portion provided on the upper end of the mask frame. At the same time, the magnet can be arranged to have a magnetic circuit formed in a vertical plane substantially orthogonal to the direction parallel to the plane of the mask frame.
Further, in the sputtering apparatus according to the first aspect of the present invention, the stock chamber may be the mask frame stocked in the stock chamber and the mask frame regardless of whether the mask frame is unused or used. When replacing the mask frame in the mask chamber, which is the film forming position in the chamber, the stock chamber is sealed from the outside and the mask frame is transported in a state of being in communication with the chamber. In the case where the mask frame stocked in the stock chamber is carried in or out from the outside, the mask frame is sealed in a state in which the chamber is sealed and the stock chamber is communicated with the outside. It is possible to have sealing means that make it possible to carry in or out.
In the sputtering apparatus according to the first aspect of the present invention, the stock chamber can be respectively connected to a plurality of the chambers so that the stocked mask frame can be replaced.
Further, in the sputtering apparatus according to the first aspect of the present invention, in the mask chamber, which is a film forming position in the chamber, in two directions parallel to the surface of the mask frame and orthogonal to the surface of the mask frame It is possible to have a mask alignment unit that enables the mask frame to be aligned in six degrees of freedom by three axial directions in the orthogonal direction and three rotation directions around the three axial directions.
A mask frame according to a second aspect of the present invention is a mask frame which can be transported between the stock chamber and the mask chamber in the sputtering apparatus, and is provided on the transport upper support portion. It is possible to have the magnet unit in which the magnet is disposed to attract the upper magnet unit and to have a magnetic circuit formed in a vertical plane substantially orthogonal to the direction parallel to the surface of the mask frame. .
 本発明の第1態様に係るスパッタリング装置は、チャンバ内でスパッタリングにより成膜する基板に対し、略垂直保持されたマスクフレームを交換可能とする交換手段を有し、前記交換手段が、複数の前記マスクフレームを前記マスクフレームの面どうしが略平行な状態に複数ストック可能とする密閉可能なストック室と、複数ストックされた前記マスクフレームから選択された一枚のマスクフレームを前記チャンバ内の成膜位置となるマスク室まで搬送する搬送手段と、を有し、前記ストック室には、複数の前記マスクフレームを前記マスクフレームの前記面どうしが略平行な状態に複数支持可能とされるとともにこれら複数の前記マスクフレームを前記マスクフレームの前記面に略直交する方向に前後移動可能とするストック支持部と、前記ストック支持部にストックされた前記マスクフレームから選択された一枚のマスクフレームを前記マスクフレームの前記面に平行な略水平方向に駆動可能とする駆動支持部と、前記駆動支持部により前記マスクフレームが移動される際に前記マスクフレームの上端を傾かないように支持可能とする搬送上支持部と、が設けられる。これにより、交換手段は、ストック室において、複数のマスクフレームをストック支持部のストック溝に載置してストックする。交換手段は、この複数のマスクフレームをストック支持部によって同時に前後移動させることで、複数のマスクフレームのうち一枚のマスクフレームを選択して駆動支持部に接する状態とする。この状態で、交換手段は、一枚のマスクフレームの下端を駆動支持部によって駆動することで、駆動支持部に接するように選択された一枚のマスクフレームをストック室からチャンバ内の成膜位置となるマスク室に向けて搬送する。このとき、交換手段は、搬送上支持部によってマスクフレームの上端を傾かないように支持しておく。さらに、交換手段は、ストック支持部を前後移動させて駆動支持部に当接する位置を空けた状態とする。この状態で、交換手段は、駆動支持部を逆向きに駆動して、マスク室からストック室へとマスクフレームを搬送する。交換手段におけるこれらの動作により、作業者がクレーン等を用いて直接手を触れることなく、マスクフレームの交換を自動化しておこなうことが可能となる。同時に、密閉されたストック室とチャンバ内の成膜位置となるマスク室との間でマスクフレームの交換を自動化しておこなうことができる。このマスクフレームの交換を自動化することにより、作業員が直接交換する場合に比べて真空チャンバ内で、成膜に伴う付着物等から発生するパーティクルを極めて少なくすることが可能となる。また、スパッタリング装置における省スペース化を図ることができる。 The sputtering apparatus according to the first aspect of the present invention comprises exchange means for making it possible to exchange a mask frame substantially vertically held with respect to a substrate to be deposited by sputtering in a chamber, the exchange means comprising a plurality of the above A sealable stock chamber capable of stocking a plurality of mask frames substantially parallel to each other of the mask frame, and a mask frame selected from the plurality of stocked mask frames are deposited in the chamber. A transfer means for transferring to a mask chamber at a position, and a plurality of the plurality of mask frames can be supported in the stock chamber such that the surfaces of the mask frame are substantially parallel to one another; And a stock support portion capable of moving the mask frame back and forth in a direction substantially orthogonal to the surface of the mask frame A drive support portion capable of driving a single mask frame selected from the mask frame stocked in the stock support portion in a substantially horizontal direction parallel to the surface of the mask frame; and the mask by the drive support portion A transport upper support is provided that can support the upper end of the mask frame so as not to tilt when the frame is moved. Thereby, the exchanging means places and stocks the plurality of mask frames in the stock grooves of the stock support section in the stock chamber. The exchange means simultaneously moves the plurality of mask frames back and forth by the stock support to select one of the plurality of mask frames to be in contact with the drive support. In this state, the exchanging means drives the lower end of one mask frame by the drive support to make the one mask frame selected to be in contact with the drive support from the stock chamber to the film forming position in the chamber. Transport to the mask room where At this time, the exchange means supports the upper end of the mask frame so as not to tilt by the transport upper support portion. Further, the exchanging means moves the stock support portion back and forth to open the position abutted against the drive support portion. In this state, the exchange means drives the drive support in the reverse direction to transport the mask frame from the mask chamber to the stock chamber. By these operations in the replacing means, it becomes possible to automate the replacement of the mask frame without directly touching the operator with a crane or the like. At the same time, it is possible to automate the exchange of the mask frame between the sealed stock chamber and the mask chamber which is the deposition position in the chamber. By automating the replacement of the mask frame, it is possible to extremely reduce the number of particles generated from the deposit or the like accompanying the film formation in the vacuum chamber as compared with the case where the worker directly replaces the mask frame. In addition, space saving can be achieved in the sputtering apparatus.
 さらに、上記のようにマスクフレームの交換を自動化することにより、異なる種類の基板に対応するマスクを順次交換することが可能となる。これにより、この異なる種類の基板に対して順次成膜を連続しておこなうことが可能となる。同時に、マスクの交換を行う度に必要となる成膜処理前におけるマスクと基板とのアライメントを、全ての成膜処理で自動化することが可能となる。さらに、より精密なマスクと基板とのアライメントを容易に可能にすることができる。 Further, by automating the replacement of the mask frame as described above, it becomes possible to sequentially replace the masks corresponding to different types of substrates. This makes it possible to successively perform film formation sequentially on the different types of substrates. At the same time, it becomes possible to automate alignment between the mask and the substrate before film formation which is necessary each time mask replacement is performed in all film formation. Furthermore, more precise alignment of the mask with the substrate can be easily enabled.
 本発明の第1態様に係るスパッタリング装置においては、前記ストック支持部が、複数の前記マスクフレームの下端を支持可能とされた複数のストック溝を有するストック載置部と、上昇、下降および前後移動可能とされ、上昇時に前記ストック載置部の前記ストック溝に載置された複数の前記マスクフレームの下端に当接して複数の前記マスクフレームを持ち上げ、前記ストック載置部から離間した状態である上昇位置として複数の前記マスクフレームを支持するとともに、前記上昇位置として支持している複数の前記マスクフレームを前記マスクフレームの前記面面に略直交する方向に前後移動した後に、前記マスクフレームの下端から離間するまで下降して、複数の前記マスクフレームを前記ストック載置部の前記ストック溝に載置可能とするストック下支持部と、前記ストック載置部にストックされた複数の前記マスクフレームの上側の位置を支持および解放可能とされるとともに前記ストック下支持部と同じ前記マスクフレームの前記面に略直交する方向に前後移動可能なストック上支持部と、を有することができる。これにより、ストック載置部は、その上面に、マスクフレームの面と略直交方向に複数離間した状態で複数の平行な載置溝が設けられる。この載置溝にマスクフレームを載置することによって、複数のマスクフレームの面どうしが平行な状態でかつ複数のマスクフレームが互いに離間した状態となるように、ストック載置部において、使用済みおよび/または未使用である複数のマスクフレームをストックすることができる。さらに、このような状態にストック載置部に載置・支持することで、複数ストックされたマスクフレームを、ストック上支持部によって上側の位置を支持した状態でストック下支持部によって上昇・前後移動・下降させることで、ストック載置部において、マスクフレームの載置されるストック溝を移動させることができる。ストック下支持部とストック上支持部とによって載置されるストック溝を移動されたマスクフレームは、駆動支持部に当接する一枚を選択して駆動することが可能となる。これにより、ストックされた複数のマスクフレームから、駆動支持部によって、一枚を選択して成膜室の成膜位置まで搬送することが可能となる。同時に、ストック室内および成膜室におけるマスクフレームの付着物等から発生するパーティクルを極めて少なくすることが可能となる。さらに、マスクフレームを駆動するための駆動部分から発生するパーティクルを極めて少なくすることを可能とすることができる。これにより、マスクフレームなどへのパーティクル再付着を防止して、成膜室内における成膜特性の低下を防止することができる。 In the sputtering apparatus according to the first aspect of the present invention, the stock support portion includes a stock placement portion having a plurality of stock grooves capable of supporting the lower ends of the plurality of mask frames, and raising, lowering and moving back and forth. It is possible to lift the plurality of mask frames by coming into contact with the lower ends of the plurality of mask frames placed in the stock grooves of the stock placement portion at the time of ascent and separating from the stock placement portions The lower end of the mask frame after supporting the plurality of mask frames as a raised position and moving the plurality of mask frames supported as the raised position back and forth in a direction substantially orthogonal to the surface of the mask frame And lower the plurality of mask frames onto the stock grooves of the stock placement portion until they are separated from A lower stock support portion capable of being supported and an upper position of the plurality of mask frames stocked in the stock placement portion can be supported and released and on the same surface of the mask frame as the lower stock support portion And a stock upper support portion movable back and forth in substantially orthogonal directions. Thus, the stock placement portion is provided with a plurality of parallel placement grooves on the upper surface thereof in a state of being separated in the direction substantially orthogonal to the surface of the mask frame. By placing the mask frame in the placement groove, the used and the used in the stock placement portion such that the faces of the plurality of mask frames are parallel and the plurality of mask frames are separated from each other. A plurality of mask frames that are unused and / or unused can be stocked. Furthermore, by placing and supporting the stock mounting portion in such a state, the plurality of stock mask frames are moved up and back and forth by the stock lower support portion while the upper position is supported by the stock upper support portion. -By lowering, it is possible to move the stock groove on which the mask frame is placed in the stock placement unit. The mask frame moved by the stock groove supported by the stock lower support portion and the stock upper support portion can select and drive one piece contacting the drive support portion. As a result, it is possible to select one sheet from the stocked mask frames and transport it to the film forming position of the film forming chamber by the drive support portion. At the same time, it is possible to extremely reduce particles generated from deposits on the mask frame in the stock chamber and the film forming chamber. Furthermore, it is possible to make it possible to extremely reduce the particles generated from the drive portion for driving the mask frame. Accordingly, it is possible to prevent the reattachment of particles to the mask frame or the like, and to prevent the deterioration of the film forming characteristic in the film forming chamber.
 本発明の第1態様に係るスパッタリング装置においては、前記ストック下支持部が、ストックされた前記マスクフレームの前記面に略平行な方向に延在して前記マスクフレームの下端を支持する複数の支持溝と、これら複数の前記支持溝を、前記マスクフレームの前記面に略直交する方向に前後移動可能とするストック位置交換駆動部と、を有する。これにより、重量物であるマスクフレームを互いに面どうしが前後方向(水平方向)に等距離になるようにストック載置部にストックされた平行状態を維持したまま支持溝に載置して、ストック位置交換駆動部によってマスクフレームを前後方向に移動可能とする。また、マスクフレームを搬送する際には、該当する一枚のマスクフレームのみを駆動支持部により駆動される位置となるように、支持溝をマスクフレームのマスク面と略直交方向に移動させることが可能となる。 In the sputtering apparatus according to the first aspect of the present invention, a plurality of supports, wherein the stock lower support portion extends in a direction substantially parallel to the surface of the stocked mask frame and supports the lower end of the mask frame It has a groove and a stock position exchange driving unit which can move the plurality of support grooves back and forth in a direction substantially orthogonal to the surface of the mask frame. Thus, the mask frame, which is a heavy object, is placed in the support groove while maintaining the parallel state stocked in the stock placement portion so that the faces are equidistant in the front-rear direction (horizontal direction). The mask frame can be moved in the front-rear direction by the position exchange driving unit. In addition, when transporting the mask frame, the support groove may be moved in a direction substantially orthogonal to the mask surface of the mask frame so that only a corresponding mask frame is positioned to be driven by the drive support portion. It becomes possible.
 本発明の第1態様に係るスパッタリング装置においては、前記ストック上支持部が、前記マスクフレームの前記面に直交する方向に延在する軸線周りに回動可能とされるとともに、前記マスクフレームの上端を前記マスクフレームの前記面に直交する方向の両側から挟持可能な挟持部を有し、前記挟持部が、前記軸線と平行な方向に沿って前後移動可能とされることが可能となる。これにより、挟持部を回動して軸線周りに所定の角度として保持することにより、ストック載置部のストック溝、または、ストック下支持部の支持溝に載置された複数のマスクフレームの上端を傾かないように支持することができる。これにより、複数のマスクフレームが互いに干渉することがないように、複数のマスクフレームをストック載置部またはストック下支持部に載置することができる。同時に、駆動支持部によるマスクフレームの搬入搬出の際に、複数のマスクフレームが互いに干渉することなくストック下支持部のストック位置まで移動するようにすることができる。 In the sputtering apparatus according to the first aspect of the present invention, the stock upper support portion is rotatable around an axis extending in a direction orthogonal to the surface of the mask frame, and the upper end of the mask frame It is possible to have a sandwiching portion capable of sandwiching from both sides in a direction orthogonal to the surface of the mask frame, and the sandwiching portion can be moved back and forth along a direction parallel to the axis. Thus, the holding portion is rotated and held at a predetermined angle around the axis, whereby the upper end of the plurality of mask frames mounted in the stock groove of the stock mounting portion or in the support groove of the stock lower support portion. Can be supported not to tilt. Thereby, the plurality of mask frames can be placed on the stock placement portion or the understock support portion so that the plurality of mask frames do not interfere with each other. At the same time, when loading and unloading the mask frame by the drive support portion, the plurality of mask frames can be moved to the stock position of the stock lower support portion without interference with each other.
 また、本発明の第1態様に係るスパッタリング装置においては、前記ストック支持部が、複数の前記マスクフレームの下端の位置を支持可能とされた複数のストック溝を有するストック載置部を有し、前記駆動支持部が、前記マスクフレームの前記面に略直交する方向と平行な軸線を有するとともに回転駆動部により駆動可能な駆動ローラを有し、前記回転駆動部により前記駆動ローラを回転駆動することによって、前記ストック載置部の前記ストック溝に載置されている前記マスクフレームのうち、前記駆動ローラに当接している前記マスクフレームを選択して前記マスクフレームの前記面に平行な方向に前記マスクフレームを駆動可能とされることができる。これにより、前記マスクフレームの前記面が平行な状態に複数支持してストックされた複数のマスクフレームのうち、駆動ローラを当接することで選択した一枚のマスクフレームのみ、その下端に回当接した駆動ローラを動駆動部により駆動することで、該当する一枚のマスクフレームのみをストック室外に搬送することができる。 In the sputtering apparatus according to the first aspect of the present invention, the stock support portion has a stock placement portion having a plurality of stock grooves capable of supporting the positions of lower ends of the plurality of mask frames, The drive support portion has an axis parallel to a direction substantially orthogonal to the surface of the mask frame and has a drive roller which can be driven by a rotational drive portion, and the rotational drive portion rotationally drives the drive roller. Select the mask frame in contact with the drive roller among the mask frames placed in the stock groove of the stock placement unit, and select the mask frame in a direction parallel to the surface of the mask frame. The mask frame can be made drivable. Thereby, only one mask frame selected by contacting the drive roller among the plurality of mask frames stocked by supporting a plurality of the surfaces of the mask frame in parallel is abut against the lower end of the mask frame. By driving the drive roller with the motion drive unit, it is possible to transport only one corresponding mask frame out of the stock room.
 また、本発明の第1態様に係るスパッタリング装置においては、前記搬送上支持部が上マグネット部を有し、前記上マグネット部には、前記マスクフレームの上端に設けられたマグネット部と互いに引き付け合うとともに、前記マスクフレームの前記面に平行な方向と略直交する鉛直面内に形成される磁気回路を有するようにマグネットが配置されることができる。この上マグネット部とマグネット部と互いに引き付け合うことにより、ストック室内において、上マグネット部によりマスクフレームの上端を支持して傾くことを防止した状態を維持することが可能となる。同時に、上マグネット部によりストック室と成膜室との搬送経路において、マスクフレームの上端を支持して傾くことを防止した状態を維持することが可能となる。 In the sputtering apparatus according to the first aspect of the present invention, the transport upper support portion has an upper magnet portion, and the upper magnet portion attracts the magnet portion provided on the upper end of the mask frame. In addition, the magnet may be disposed to have a magnetic circuit formed in a vertical plane substantially orthogonal to a direction parallel to the plane of the mask frame. By attracting the upper magnet portion and the magnet portion to each other, it is possible to maintain a state in which the upper magnet portion supports and holds the upper end of the mask frame in the stock chamber. At the same time, the upper magnet portion can support the upper end of the mask frame in the transport path between the stock chamber and the film forming chamber to maintain a state in which tilting is prevented.
 また、本発明の第1態様に係るスパッタリング装置においては、前記ストック室が、前記マスクフレームが未使用であるか使用済みであるかにかかわらず、前記ストック室にストックされた前記マスクフレームと前記チャンバ内の成膜位置となる前記マスク室にある前記マスクフレームとの交換を行う場合には、外部に対して前記ストック室を密閉し、かつ、前記チャンバに連通した状態で前記マスクフレームを搬送可能とするとともに、前記ストック室にストックされた前記マスクフレームを外部に対して搬入または搬出する場合には、前記チャンバを密閉するとともに前記外部に対して前記ストック室を連通した状態で前記マスクフレームを搬入可能または搬出可能とする密閉手段を有することができる。これにより、密閉手段により外部への密閉を維持した状態で、ストック室と成膜室との間で成膜雰囲気に準じた真空雰囲気でマスク交換を可能とすることができる。同時に、密閉手段により成膜室の密閉を維持した状態で、ストック室と外部との間で未使用のマスクの搬入および使用済みのマスクの搬出をおこなうことが可能となる。これにより、バッキングプレートなどの成膜室側における内表面を大気解放することなく、マスクフレームの交換を可能とすることができる。したがって、成膜特性の低下を防止することができる。また、マスクフレーム交換にかかる作業時間を短縮することができる。さらに、スパッタリング装置のメンテナンスにかかる作業時間および施行コストを削減できる。そして、製造コストの低減を図ることが可能となる。 Further, in the sputtering apparatus according to the first aspect of the present invention, the stock chamber may be the mask frame stocked in the stock chamber and the mask frame regardless of whether the mask frame is unused or used. When replacing the mask frame in the mask chamber, which is the film forming position in the chamber, the stock chamber is sealed from the outside and the mask frame is transported in a state of being in communication with the chamber. In the case where the mask frame stocked in the stock chamber is carried in or out from the outside, the mask frame is sealed in a state in which the chamber is sealed and the stock chamber is communicated with the outside. Can be provided with sealing means that make it possible to carry in or out. Thus, it is possible to make mask exchange possible between the stock chamber and the film forming chamber in a vacuum atmosphere according to the film forming atmosphere while maintaining the sealing to the outside by the sealing means. At the same time, it is possible to carry in an unused mask and carry out a used mask between the stock chamber and the outside while keeping the film formation chamber sealed by the sealing means. Thus, the mask frame can be replaced without releasing the inner surface of the film forming chamber such as the backing plate to the atmosphere. Therefore, the film formation characteristics can be prevented from being degraded. In addition, it is possible to shorten the work time required to replace the mask frame. Furthermore, the work time and maintenance cost for maintenance of the sputtering apparatus can be reduced. And it becomes possible to aim at reduction of manufacturing cost.
 また、本発明の第1態様に係るスパッタリング装置においては、前記ストック室が、ストックされた前記マスクフレームを交換可能なように複数の前記チャンバに対してそれぞれ接続されることができる。これにより、1つのストック室によって複数のチャンバに対してマスクフレームを自動的に交換することが可能となる。これにより、成膜室(チャンバ)とストック室との設置数を同じにした場合に比べて装置構成を簡略化することができる。したがって、省スペース化を図ることができる。また、ストック室などに対するメンテナンス回数を削減することができる。同時に、スパッタリング装置の製造コストを低減することが可能となる。 In the sputtering apparatus according to the first aspect of the present invention, the stock chamber can be connected to a plurality of the chambers so that the stocked mask frame can be replaced. This makes it possible to automatically change the mask frame for a plurality of chambers by one stock chamber. Thus, the apparatus configuration can be simplified as compared to the case where the number of film formation chambers (chambers) and the number of installation of the stock chambers are the same. Therefore, space saving can be achieved. In addition, it is possible to reduce the number of maintenance for the stock room and the like. At the same time, the manufacturing cost of the sputtering apparatus can be reduced.
 また、本発明の第1態様に係るスパッタリング装置においては、前記チャンバ内の成膜位置となる前記マスク室において、前記マスクフレームの前記面に平行な二方向および前記マスクフレームの前記面に直交する直交方向の三つの軸方向と、前記三つの軸方向の軸線周りの三つの回転方向とによる六自由度にて、前記マスクフレームをアライメント可能とするマスクアライメント手段を有することができる。これにより、異なる種類の基板に対応するマスクのマスクフレームを順次交換することが可能となる。そして、このような成膜を連続しておこなうことが可能となる。同時に、マスク交換に伴うマスクと基板とのアライメントを自動化して、より精密なアライメントを容易に可能な成膜をおこなうことができる。 Further, in the sputtering apparatus according to the first aspect of the present invention, in the mask chamber, which is a film forming position in the chamber, in two directions parallel to the surface of the mask frame and orthogonal to the surface of the mask frame It is possible to have a mask alignment unit that enables the mask frame to be aligned in six degrees of freedom by three axial directions in the orthogonal direction and three rotation directions around the three axial directions. This makes it possible to sequentially exchange the mask frame of the mask corresponding to different types of substrates. Then, such film formation can be performed continuously. At the same time, it is possible to automate the alignment between the mask and the substrate involved in the mask replacement, and to perform film formation that can facilitate more accurate alignment.
 また、マスクアライメント手段によって、基板に対して、マスクフレームのアライメントを可能とすることができる。ここで、前記マスクアライメント手段が、マスクフレームの下部における両端に設けられた係合部と、前記マスクフレームの成膜位置における両端の下部に設けられて前記マスクフレームを支持可能とされるとともに前記係合部に係合してアライメント可能とされる支持アライメント部と、マスクフレームの上部を支持する上部アライメントと、を有し、前記アライメント手段によって、前記マスクフレームを上下方向および前後左右となる水平方向に徴動させる。さらに、この状態で、上部アライメント部によってマスクフレームの上部をマスクフレームの前記面と直交する前後方向に徴動させる。これにより、前記マスクフレームの前記面に平行な二方向および前記マスクフレームの前記面に直交する方向の三つの軸方向と、前記三つの軸方向の軸線周りの三つの回転方向とによる六自由度として、前記マスクフレームをアライメント可能とすることができる。 Further, the mask alignment means can enable alignment of the mask frame with respect to the substrate. Here, the mask alignment means may be provided on the engagement portions provided at both ends of the lower portion of the mask frame and at the lower portions of both ends at the film forming position of the mask frame to be able to support the mask frame. A support alignment portion engaged with the engagement portion and capable of alignment, and an upper alignment for supporting an upper portion of the mask frame React in the direction. Further, in this state, the upper alignment portion causes the upper portion of the mask frame to reciprocate in the front-rear direction orthogonal to the surface of the mask frame. Thereby, six degrees of freedom in two directions parallel to the surface of the mask frame, three axial directions in a direction orthogonal to the surface of the mask frame, and three rotational directions around the three axial directions. The mask frame can be made as alignable.
 具体的には、前記マスクアライメント手段が、前記マスクフレームの下面における両端に設けられた係合部と、前記マスクフレームの成膜位置における両端の下部に設けられて前記マスクフレームを支持可能とされるとともに前記係合部に係合してアライメント可能とされる支持アライメント部と、前記マスクフレームの面に直交する方向における前記マスクフレームの上側の位置を設定可能として、前記マスクフレームを支持および解放可能な上部アライメント部と、を有することができる。 Specifically, the mask alignment means may be provided at lower portions of engagement portions provided at both ends of the lower surface of the mask frame and at both ends of the film formation position of the mask frame so as to support the mask frame. Supporting and releasing the mask frame by setting the upper position of the mask frame in the direction orthogonal to the surface of the mask frame and the support alignment portion that can be aligned by engaging with the engaging portion And a possible upper alignment portion.
 本発明の第1態様に係るスパッタリング装置において、前記支持アライメント部における前記マスクフレームの前記面に平行な横方向および面に直交する方向においてアライメントを行う駆動部が、前記チャンバ内に設けられる。これにより、駆動部がチャンバの外部にある場合に比べて、駆動部から当該駆動部によって位置制御されるマスクフレームまでの距離を短縮することができる。これにより、マスクフレームの位置の制御をより高精度におこなうことが可能となる。同時に、500kg以上となる場合もある重量を有するマスクフレームを直接支持された状態で、重力方向にマスクフレームを変位させる必要がない。このため、高出力が求められる駆動部を用いる必要がなく、ステッピングモータを用いることが可能となるため、高出力なサーボモータを用いる場合に比べてマスクフレームの位置の制御をより高精度におこなうことが可能となる。さらに、省スペース型のステッピングモータを用いて、かつ、チャンバ内でステッピングモータをカバーにより密閉することが可能となる。このため、駆動に関してゴミ等の発塵を防止することが可能となり、成膜特性を向上するとともに、歩留まりを向上し、製造コストを低減することが可能となる。 In the sputtering apparatus according to the first aspect of the present invention, a driving unit that performs alignment in a lateral direction parallel to the surface of the mask frame in the support alignment unit and in a direction orthogonal to the surface is provided in the chamber. Thereby, the distance from the drive unit to the mask frame whose position is controlled by the drive unit can be shortened as compared with the case where the drive unit is outside the chamber. This makes it possible to control the position of the mask frame with higher precision. At the same time, it is not necessary to displace the mask frame in the direction of gravity, with the mask frame having a weight that may exceed 500 kg being directly supported. For this reason, it is not necessary to use a drive unit that requires high output, and it becomes possible to use a stepping motor. Therefore, control of the position of the mask frame is performed with higher accuracy than in the case of using a high output servomotor. It becomes possible. Furthermore, the space-saving type stepping motor can be used, and the stepper motor can be sealed by the cover in the chamber. Therefore, it is possible to prevent dust and the like from being generated with respect to driving, and it is possible to improve the film forming characteristics, to improve the yield, and to reduce the manufacturing cost.
 本発明の第1態様に係るスパッタリング装置においては、前記支持アライメント部における上下方向においてアライメントを行う駆動部および前記上部アライメント部における前記マスクフレームの前記面に直交する方において向アライメントを行う駆動部が前記チャンバの外部に設けられる。これにより、500kg以上となる場合もある重量を有するマスクフレームを支持して、マスクフレームを直接駆動する際に、チャンバ内のスペースを気にせずに高出力の駆動部を用いることが可能となる。さらに、駆動部から発生したゴミは、重力によって下方に落下するが、成膜特性に影響するマスクフレームの上側位置では、駆動部がチャンバの外側に位置することで、このゴミが発生することがなく、成膜特性に悪影響を及ぼすことが防止できる。 In the sputtering apparatus according to the first aspect of the present invention, a drive unit performing alignment in the vertical direction in the support alignment unit and a drive unit performing alignment in a direction orthogonal to the surface of the mask frame in the upper alignment unit It is provided outside the chamber. This makes it possible to support the mask frame having a weight that may be 500 kg or more, and to use a high-output drive unit without worrying about the space in the chamber when directly driving the mask frame. . Furthermore, although dust generated from the driving unit falls downward by gravity, the dust may be generated because the driving unit is positioned outside the chamber at the upper position of the mask frame that affects the film formation characteristics. It is possible to prevent the adverse effect on the film formation characteristics.
 また、本発明の第1態様に係るスパッタリング装置においては、前記係合部が、前記マスクフレームの下面における一端に配置され前記支持アライメント部の凸部に係合する係合凹部と、前記マスクフレームの下面における他端に配置され前記支持アライメント部の凸部に係合する係合溝部とを有し、前記係合溝部が、前記マスクフレームの下端に沿って設けられる。これにより、マスクフレームの下面における一端側で、係合凹部を支持アライメント部の凸部に係合すると同時に、マスクフレームの下面における他端側で、係合溝部を支持アライメント部の凸部に係合することで、マスクフレームの成膜位置へのおおまかな位置設定を一動作でおこなうことができる。また、係合溝部により、多少の自由度を持たせて、マスクフレームが支持アライメント部に対して多少ずれた状態であっても、係合溝部の長さ寸法に応じてアライメントを行うことが可能となる。また、係合凹部および係合溝部を支持アライメント部に係合させることによって、マスクフレームを微調整可能に支持することが可能となる。 In the sputtering apparatus according to the first aspect of the present invention, the engagement portion is disposed at one end of the lower surface of the mask frame and engaged with the convex portion of the support alignment portion, and the mask frame And an engaging groove portion disposed at the other end of the lower surface and engaged with the convex portion of the support alignment portion, and the engaging groove portion is provided along the lower end of the mask frame. Thus, the engagement recess is engaged with the convex portion of the support alignment portion at one end of the lower surface of the mask frame, and the engagement groove is engaged with the convex portion of the support alignment at the other end of the lower surface of the mask frame. By doing so, the rough position setting to the deposition position of the mask frame can be performed in one operation. In addition, the engagement groove portion allows a certain degree of freedom, so that alignment can be performed according to the length dimension of the engagement groove portion even if the mask frame is slightly shifted with respect to the support alignment portion. It becomes. Further, by engaging the engagement recess and the engagement groove with the support alignment portion, the mask frame can be supported finely adjustable.
 また、本発明の第1態様に係るスパッタリング装置においては、前記上部アライメント部が、前記マスクフレームの面に直交する方向に延在する軸線周りに回動可能とされ前記マスクフレームの上端を前記マスクフレームの面に直交する方向の両側から挟持可能な挟持部を有し、前記挟持部が、前記軸線方向に沿って移動可能とされる。これにより、マスクフレームの上部の規制が解除された状態から挟持部を軸線周りに回動することで、マスクフレームの支持が規制された状態となす。さらに、挟持部を軸線に沿って移動することで、マスクフレームの面に直交する方向にてマスクフレームの位置を制御することにより、三つの軸方向と前記三つの線周りの三つの回転方向とにおける六自由度にて前記マスクフレームをアライメント可能とすることができる。 In the sputtering apparatus according to the first aspect of the present invention, the upper alignment portion is rotatable around an axis extending in a direction perpendicular to the surface of the mask frame, and the upper end of the mask frame is the mask It has a clamping part which can be clamped from the both sides of the direction which intersects perpendicularly with the field of a frame, and the clamping part is made movable along the above-mentioned axial direction. Thus, the support of the mask frame is restricted by pivoting the holding part around the axis line from the state where the restriction on the upper part of the mask frame is released. Furthermore, by moving the sandwiching portion along the axis, by controlling the position of the mask frame in the direction orthogonal to the plane of the mask frame, three axial directions and three rotational directions around the three lines can be obtained. The mask frame can be aligned in six degrees of freedom in
 本発明の第2態様に係るマスクフレームにおいては、上記のスパッタリング装置における前記ストック室と前記マスク室との間で搬送可能とされるマスクフレームであって、前記搬送上支持部に設けられた前記上マグネット部と互いに引き付け合うとともに、前記マスクフレームの前記面に平行な方向と略直交する鉛直面内に形成される磁気回路を有するようにマグネットが配置されたマグネット部を有することができる。これにより、ストック室の内部での搬送経路、ストック室と成膜室との間の搬送経路、および、成膜室の内部におけるアライメント位置までの搬送経路において、マスクフレームの上端を支持して傾くことを防止した状態を維持することが可能となる。また、スパッタリング処理の前あるいはスパッタリング処理の後において、マスクを交換する際などにおいて、マスクフレームの上端を支持して傾くことを防止した状態を維持することが可能となる。 A mask frame according to a second aspect of the present invention is a mask frame which can be transported between the stock chamber and the mask chamber in the sputtering apparatus, and is provided on the transport upper support portion. The magnet unit may have a magnet unit in which the magnet is disposed so as to attract the upper magnet unit and to have a magnetic circuit formed in a vertical plane substantially orthogonal to a direction parallel to the surface of the mask frame. Thus, the upper end of the mask frame is supported and tilted in the transport path inside the stock chamber, the transport path between the stock chamber and the film forming chamber, and the transport path to the alignment position inside the film forming chamber It becomes possible to maintain the state which prevented that. In addition, before or after the sputtering process, when replacing the mask, it is possible to support the upper end of the mask frame and maintain a state in which tilting is prevented.
 本発明の第2態様に係るマスクフレームは、スパッタリング装置のチャンバ内でスパッタリングにより成膜する基板に対してマスクアライメント手段によって略垂直保持されるマスクのマスクフレームであって、前記マスクアライメント手段が、前記スパッタリング装置において前記マスクフレームの成膜位置における両端の下部に設けられて前記マスクフレームを支持可能とされる支持アライメント部を有し
 前記支持アライメント部に係合してアライメント可能とされる係合部が、前記マスクフレームの下面における両端に設けられる。これにより、省スペース化された支持アライメント部およびゴミのでない上部アライメント部を有するスパッタリング装置において、容易にアライメント可能で成膜特性に優れたマスクフレームを低コストに提供することが可能となる。
The mask frame according to the second aspect of the present invention is a mask frame of a mask which is held substantially vertically by the mask alignment means with respect to a substrate to be deposited by sputtering in a chamber of a sputtering apparatus. The sputtering apparatus has a support alignment portion provided below the both ends of the deposition position of the mask frame in the sputtering apparatus and capable of supporting the mask frame. The engagement is possible by engaging with the support alignment portion. Portions are provided at both ends of the lower surface of the mask frame. As a result, in a sputtering apparatus having a space-saving support alignment portion and an upper alignment portion free of dust, it is possible to provide a mask frame which can be easily aligned and has excellent film forming properties at low cost.
 また、本発明の第2態様に係るマスクフレームにおいては、前記係合部が、前記マスクフレームの下面における一端に配置され前記支持アライメント部の凸部に係合する係合凹部と、前記マスクフレームの下面における他端に配置され前記支持アライメント部の凸部に係合する係合溝部とを有し、前記係合溝部が、前記マスクフレーム下端に沿って設けられる。これにより、マスクフレームの下面における一端側(第1端)で、係合凹部を支持アライメント部の凸部に係合すると同時に、マスクフレームの下面における他端側(第1端とは反対側に位置する第2端)で、係合溝部を支持アライメント部の凸部に係合することで、マスクフレームの成膜位置へのおおまかな位置の設定を一動作でおこなうことができる。さらに、係合溝部により、多少の自由度を持たせて、マスクフレームが支持アライメント部に対して多少ずれた状態であっても、係合溝部の長さ寸法に応じてアライメントを行うことが可能となる。また、係合凹部および係合溝部を支持アライメント部に係合させることによって、マスクフレームを微調整可能に支持することが可能となる。 In the mask frame according to the second aspect of the present invention, the engagement portion is disposed at one end of the lower surface of the mask frame and engaged with the convex portion of the support alignment portion, and the mask frame And an engaging groove portion disposed at the other end of the lower surface and engaged with the convex portion of the support alignment portion, and the engaging groove portion is provided along the lower end of the mask frame. Thereby, at the one end side (first end) of the lower surface of the mask frame, the engagement concave portion is engaged with the convex portion of the support alignment portion, and at the same time, the other end side (the opposite side to the first end) By engaging the engaging groove portion with the convex portion of the support alignment portion at the second end located), the rough position setting to the film formation position of the mask frame can be performed in one operation. Furthermore, the engagement groove portion allows a certain degree of freedom, so that alignment can be performed according to the length dimension of the engagement groove portion even if the mask frame is slightly shifted with respect to the support alignment portion. It becomes. Further, by engaging the engagement recess and the engagement groove with the support alignment portion, the mask frame can be supported finely adjustable.
 本発明の態様によれば、簡単な構成により、重量物である縦型搬送のマスクフレームの交換を少ない工程数で容易に可能とし、マスクフレームの交換におけるマスクアライメント精度の向上し、マスクフレームの交換における自動化を可能とし、成膜室を大気解放しないでマスクフレームの交換を可能とし、マスクフレームの交換に必要な時間を短縮することができるという効果を奏することが可能となる。 According to an aspect of the present invention, the simple configuration makes it possible to easily replace the heavy-duty vertical transport mask frame with a small number of steps, and improve the mask alignment accuracy in the mask frame replacement. It is possible to realize automation in replacement, to replace the mask frame without releasing the film formation chamber to the atmosphere, and to reduce the time required for replacing the mask frame.
本発明に係るスパッタリング装置の第1実施形態を示す模式平面図である。It is a model top view which shows 1st Embodiment of the sputtering device concerning this invention. 本発明に係るマスクフレームの第1実施形態を示す斜視図である。It is a perspective view showing a 1st embodiment of a mask frame concerning the present invention. 本発明に係るスパッタリング装置の第1実施形態におけるストック室を示す斜視図である。It is a perspective view showing the stock room in a 1st embodiment of the sputtering device concerning the present invention. 本発明に係るスパッタリング装置の第1実施形態のストック室におけるストック支持部、駆動支持部および密閉手段を示す模式側面図である。It is a model side view which shows the stock support part in the stock chamber of 1st Embodiment of the sputtering device concerning this invention, a drive support part, and sealing means. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスク交換手順を示す模式平面図である。It is a model top view which shows the mask exchange procedure in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるマスクアライメント手段を示す斜視図である。It is a perspective view which shows the mask alignment means in 1st Embodiment of the sputtering device which concerns on this invention. 本発明に係るスパッタリング装置の第1実施形態における支持アライメント部の係合状態を示す斜視図である。It is a perspective view which shows the engagement state of the support alignment part in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態における支持アライメント部の係合状態を示す斜視図である。It is a perspective view which shows the engagement state of the support alignment part in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態における上部アライメント部の解放状態を示す斜視図である。It is a perspective view which shows the open state of the upper alignment part in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態における上部アライメント部の係止状態を示す斜視図である。It is a perspective view which shows the latching state of the upper alignment part in 1st Embodiment of the sputtering device which concerns on this invention. 本発明に係るマスクフレームの第1実施形態における係合部を示す斜視図である。It is a perspective view showing the engaging part in a 1st embodiment of the mask frame concerning the present invention. 本発明に係るマスクフレームの第1実施形態における係合部を示す斜視図である。It is a perspective view showing the engaging part in a 1st embodiment of the mask frame concerning the present invention. 本発明に係るスパッタリング装置の第1実施形態における支持アライメント部と係合部との係合状態を示す斜視図である。It is a perspective view which shows the engagement state of the support alignment part and engaging part in 1st Embodiment of the sputtering device which concerns on this invention. 本発明に係るスパッタリング装置の第1実施形態における支持アライメント部と係合部との係合状態を示す斜視図である。It is a perspective view which shows the engagement state of the support alignment part and engaging part in 1st Embodiment of the sputtering device which concerns on this invention. 本発明に係るスパッタリング装置の第1実施形態におけるアライメント手段の支持前状態を示す正面図である。It is a front view which shows the pre-supporting state of the alignment means in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第1実施形態におけるアライメント手段の支持状態を示す正面図である。It is a front view which shows the support state of the alignment means in 1st Embodiment of the sputtering device concerning this invention. 本発明に係るスパッタリング装置の第2実施形態を示す模式平面図である。It is a model top view which shows 2nd Embodiment of the sputtering device which concerns on this invention.
 以下、本発明に係るスパッタリング装置の第1実施形態を、図面に基づいて説明する。なお、本実施形態は、発明の趣旨をより良く理解させるために具体的に説明するものであり、特に指定のない限り、本発明を限定するものではない。
 図1は、本実施形態におけるスパッタリング装置を示す模式平面図である。図1において、符号1は、スパッタリング装置である。
Hereinafter, a first embodiment of a sputtering apparatus according to the present invention will be described based on the drawings. In addition, this embodiment is concretely described in order to understand the meaning of invention better, and unless there is particular specification, it does not limit this invention.
FIG. 1 is a schematic plan view showing a sputtering apparatus in the present embodiment. In FIG. 1, reference numeral 1 denotes a sputtering apparatus.
 本実施形態に係るスパッタリング装置1は、例えば、液晶ディスプレイの製造工程においてガラス等からなる被処理基板(基板)S上にTFT(Thin Film Transistor)を形成する場合など、ガラスや樹脂からなる被処理基板Sに対して、真空環境下で加熱処理、成膜処理、エッチング処理等をおこなうインターバック式あるいはインライン式の真空処理装置とされる。 The sputtering apparatus 1 according to the present embodiment is, for example, a processing object made of glass or resin, such as when forming a TFT (Thin Film Transistor) on a target substrate (substrate) S made of glass or the like in a manufacturing process of a liquid crystal display. The substrate S is an inter-back type or in-line type vacuum processing apparatus that performs heat processing, film formation processing, etching processing, and the like in a vacuum environment.
 本実施形態に係るスパッタリング装置1は、図1に示すように、略矩形のガラス基板(被処理基板)Sを搬入/搬出するロード・アンロード室(チャンバ)2と、ガラス基板S上に例えば、ZnO系やIn系の透明導電膜などの被膜をスパッタ法により形成する耐圧の成膜室(チャンバ)4と、成膜室4とロード・アンロード室2との間に位置する搬送室(チャンバ)3と、交換するマスクフレームFをストックするためのストック室50と、を備えている。本実施形態に係るスパッタリング装置1は、図において、サイドスパッタ式として示している。 The sputtering apparatus 1 according to the present embodiment includes, as shown in FIG. 1, a load / unload chamber (chamber) 2 for carrying in / out a substantially rectangular glass substrate (substrate to be processed) S, and The film-forming chamber 4 is a pressure-resistant film-forming chamber for forming a film such as a ZnO or In 2 O 3 -based transparent conductive film by sputtering, and located between the film-forming chamber 4 and the load / unload chamber 2 A transfer chamber (chamber) 3 and a stock chamber 50 for stocking the mask frame F to be replaced are provided. The sputtering apparatus 1 which concerns on this embodiment is shown as a side sputter type in the figure.
 スパッタリング装置1は、略垂直保持されたマスクフレームFを交換可能なマスク交換手段100を備える。マスク交換手段100としては、ストック室50と、マスクフレームFをチャンバ内の成膜位置となるマスク室43まで搬送する搬送手段60と、を有するものとされる。 The sputtering apparatus 1 includes a mask exchanging unit 100 capable of exchanging the mask frame F held substantially vertically. The mask replacement means 100 includes a stock chamber 50 and a transfer means 60 for transferring the mask frame F to a mask chamber 43 which is a film forming position in the chamber.
 また、スパッタリング装置1には、成膜室4と略同等の成膜室4Bが設けられている。成膜室4Bは、成膜室4と同様に搬送室3に接続され、ストック室50に対して対称に構成されている。 Further, the sputtering apparatus 1 is provided with a film forming chamber 4 B substantially equivalent to the film forming chamber 4. The film forming chamber 4 </ b> B is connected to the transfer chamber 3 similarly to the film forming chamber 4, and is configured symmetrically with respect to the stock chamber 50.
 なお、スパッタリング装置1は、これら複数のロード・アンロード室(チャンバ)2,成膜室(チャンバ)4,成膜室(チャンバ)4Bがそれぞれ搬送室3に接続されている。こうしたチャンバ2,4,4Bは、例えば、互いに成膜工程をおこなうように搬送室3に隣接して形成されたロード・アンロード室(チャンバ)2と、複数の処理室(チャンバ)4,4Bとして構成されることになる。 Incidentally, in the sputtering apparatus 1, the plurality of load / unload chambers (chambers) 2, the film forming chamber (chambers) 4, and the film forming chamber (chambers) 4 B are connected to the transfer chamber 3. Such chambers 2, 4, 4B are, for example, a load / unload chamber (chamber) 2 formed adjacent to the transfer chamber 3 so as to perform the film forming process with each other, and a plurality of processing chambers (chambers) 4, 4B. It will be configured as
 さらに、ロード・アンロード室(チャンバ)2と同等のロード・アンロード室を搬送室3に接続するように設けることもできる。この場合、例えば、一方のロード・アンロード室2は、外部から真空処理装置(スパッタリング装置)1に向けてガラス基板Sを搬入するロード室とし、他方のロード・アンロード室は、真空処理装置1から外部にガラス基板Sを搬出するアンロード室とすることができる。また、成膜室4と成膜室4Bとが異なる成膜工程をおこなう構成とすることもできる。 Furthermore, a load / unload chamber equivalent to the load / unload chamber (chamber) 2 can be provided to be connected to the transfer chamber 3. In this case, for example, one load / unload chamber 2 is a load chamber for loading the glass substrate S from the outside toward the vacuum processing apparatus (sputtering apparatus) 1, and the other load / unload chamber is a vacuum processing apparatus It can be an unloading chamber from which the glass substrate S is unloaded from 1 to the outside. In addition, the film forming chamber 4 and the film forming chamber 4B may be configured to perform different film forming processes.
 こうしたそれぞれのチャンバ2と搬送室3の間、搬送室3とチャンバ4の間、および、搬送室3とチャンバ4Bの間には、それぞれ仕切りバルブが形成されていればよい。
 また、チャンバ4とストック室50との間、及び、チャンバ4Bとストック室50との間には、それぞれ密閉手段58となる仕切りバルブ58a,58aが形成される。
A partition valve may be formed between each of the chambers 2 and the transfer chamber 3, between the transfer chamber 3 and the chamber 4, and between the transfer chamber 3 and the chamber 4B.
Further, between the chamber 4 and the stock chamber 50, and between the chamber 4B and the stock chamber 50, partition valves 58a and 58a serving as sealing means 58 are formed.
 ロード・アンロード室2には、外部から搬入されたガラス基板Sの載置位置を設定してアライメント可能な位置決め部材が配置されていてもよい。
 ロード・アンロード室2には、また、この室内を粗真空引きするロータリーポンプ等の粗引き排気手段が設けられることができる。
In the load / unload chamber 2, a positioning member capable of setting and positioning the mounting position of the glass substrate S carried in from the outside may be disposed.
The load / unload chamber 2 can also be provided with rough evacuation means such as a rotary pump for roughly evacuating the chamber.
 搬送室3の内部には、図1に示すように、搬送装置(搬送ロボット)3aが配置されている。
 搬送装置3aは、回転軸と、この回転軸に取り付けられたロボットアームと、ロボットアームの一端に形成されたロボットハンドと、上下動装置とを有している。ロボットアームは、互いに屈曲可能な第一、第二の能動アームと、第一、第二の従動アームとから構成されている。搬送装置3aは、被搬送物であるガラス基板Sを、チャンバ2,3,4,4B間で移動させることができる。なお、搬送装置3aとして、ロボットアームを水平方向の位置に移動させるか、水平方向にガラス基板Sを移動させる追加移動手段を設けることもできる。
Inside the transfer chamber 3, as shown in FIG. 1, a transfer device (transfer robot) 3a is disposed.
The transfer device 3a includes a rotation shaft, a robot arm attached to the rotation shaft, a robot hand formed at one end of the robot arm, and a vertical movement device. The robot arm is composed of first and second active arms which can be bent relative to each other, and first and second driven arms. The transfer device 3a can move the glass substrate S, which is a transferred object, between the chambers 2, 3, 4, and 4B. As the transfer device 3a, an additional moving means may be provided to move the robot arm to the horizontal position or to move the glass substrate S in the horizontal direction.
 成膜室4には、図1に示すように、成膜材料を供給する手段として、成膜室4の内部に立設されたターゲット7と、ターゲット7を保持するバッキングプレート(カソード電極)6と、バッキングプレート6に負電位のスパッタ電圧を印加する電源と、成膜室4の内部にガスを導入するガス導入手段8と、成膜室4の内部を高真空引きするターボ分子ポンプ等の高真空排気手段9と、を備える。成膜室4の内部において、例えば、バッキングプレート6が搬送室3から最も遠い位置に立設される。 In the film forming chamber 4, as shown in FIG. 1, as a means for supplying a film forming material, a target 7 provided upright inside the film forming chamber 4 and a backing plate (cathode electrode) 6 for holding the target 7. A power supply for applying a sputtering voltage of negative potential to the backing plate 6, a gas introducing means 8 for introducing a gas into the film forming chamber 4, a turbo molecular pump for drawing a high vacuum in the film forming chamber High evacuation means 9; In the inside of the film forming chamber 4, for example, the backing plate 6 is provided at a position farthest from the transfer chamber 3.
 バッキングプレート6には、ガラス基板Sと略平行に対面する前面側にターゲット7が固定される。バッキングプレート(カソード電極)6は、ターゲット7に対して負電位のスパッタリング電圧を印加する電極の役割を果たす。バッキングプレート6は、負電位のスパッタリング電圧を印加する電源に接続されている。
 カソード電極6の裏側には、ターゲット7上に所定の磁場を形成するためのマグネトロン磁気回路が設置されている。また、マグネトロン磁気回路は、揺動機構に装着され、磁気回路揺動用駆動装置により揺動できるように構成されていてもよい。
The target 7 is fixed to the backing plate 6 on the front side facing the glass substrate S substantially in parallel. The backing plate (cathode electrode) 6 plays the role of an electrode for applying a sputtering voltage of negative potential to the target 7. The backing plate 6 is connected to a power supply that applies a sputtering voltage of negative potential.
A magnetron magnetic circuit for forming a predetermined magnetic field on the target 7 is disposed on the back side of the cathode electrode 6. Further, the magnetron magnetic circuit may be mounted on a swing mechanism and configured to be able to swing by a drive device for swinging the magnetic circuit.
 成膜室4は、図1に示すように、成膜時にガラス基板Sの成膜表面側となるスパッタ空間41と、成膜時にガラス基板Sの裏面側となる裏側空間42と、これらスパッタ空間41と裏側空間42との間のマスク室43と、を備える。スパッタ空間41には、ターゲット7が固定されたバッキングプレート(カソード電極)6が配置される。
 マスク室43には、図1に示すように、密閉手段58となる仕切りバルブ58aを介してストック室50が接続されている。
As shown in FIG. 1, the film forming chamber 4 has a sputtering space 41 on the film forming surface side of the glass substrate S during film forming, a back side space 42 on the back surface side of the glass substrate S during film forming, and these sputtering spaces. And a mask chamber 43 between the rear side space 42 and the rear side space 42. In the sputtering space 41, a backing plate (cathode electrode) 6 to which the target 7 is fixed is disposed.
As shown in FIG. 1, a stock chamber 50 is connected to the mask chamber 43 via a dividing valve 58 a serving as a sealing unit 58.
 裏側空間42内部には、成膜中にターゲット7と対向するようにガラス基板Sを保持する基板保持手段48が設けられている。 Inside the backside space 42, a substrate holding means 48 for holding the glass substrate S so as to face the target 7 during film formation is provided.
 マスク室43には、後述するようにマスクアライメント手段10が設けられる。
 マスク室43とストック室50とには、マスクを保持するマスクフレームFが設けられている。マスク室43とストック室50とには、後述するように、これらの間でマスクフレームFを搬送する搬送手段60が設けられている。
A mask alignment unit 10 is provided in the mask chamber 43 as described later.
A mask frame F for holding a mask is provided in the mask chamber 43 and the stock chamber 50. As described later, the mask chamber 43 and the stock chamber 50 are provided with transport means 60 for transporting the mask frame F between them.
 図2は、本実施形態におけるマスクフレームを示す斜視図である。
 マスクフレームFは、図2に示すように、略矩形の枠体Faの内側に、図示しない成膜領域を制限するマスクが張られた構成を有する。マスクは金属の薄体であり、枠体Faに対して引張された状態で設けられている。
FIG. 2 is a perspective view showing a mask frame in the present embodiment.
As shown in FIG. 2, the mask frame F has a configuration in which a mask for limiting a film formation region (not shown) is stretched inside a substantially rectangular frame body Fa. The mask is a thin metal, and is provided in a stretched state with respect to the frame Fa.
 マスクフレームFは、縦型に配置されて搬送されるように構成されている。即ち、マスクフレームFは、アルミニウムなどの非磁性体から構成される略矩形の枠体(フレーム)Faと、枠体(フレーム)Faの上辺に沿って延在するように設けられたマグネットを有する上側フレーム支持体F6と、枠体(フレーム)Faの下辺に沿うように延在して設けられた丸棒とされたスライダF5と、を備える。
 図2において、YZ面と略平行となるようにマスクフレームFの面が設定されており、マスクフレームFにおける枠体(フレーム)Faの下端の両端部、つまり、Z方向における下側でY方向における両端位置に、後述するように、係合部F1及び係合部F2がそれぞれ設けられている。
The mask frame F is configured to be arranged in a vertical format and transported. That is, the mask frame F has a substantially rectangular frame (frame) Fa made of a nonmagnetic material such as aluminum and a magnet provided to extend along the upper side of the frame (frame) Fa The upper frame support F6 and the slider F5 formed as a round bar extending along the lower side of the frame Fa.
In FIG. 2, the surface of the mask frame F is set to be substantially parallel to the YZ surface, and both ends of the lower end of the frame (frame) Fa in the mask frame F, that is, the Y direction at the lower side in the Z direction As described later, the engaging portion F1 and the engaging portion F2 are respectively provided at both end positions in.
 図3は、本実施形態におけるスパッタリング装置におけるストック室を示す斜視図である。図4は、本実施形態におけるストック室におけるストック支持部、駆動支持部および密閉手段を示す模式側面図である。
 ストック室50は、図3,図4に示すように、略矩形の断面形状を有する。ストック室50には、図示していないが、このストック室50の内部を成膜室4と同様に高真空引きするターボ分子ポンプ等の高真空排気手段と、ストック室50の内部にガスを導入するガス導入手段と、が設けられる。
FIG. 3 is a perspective view showing a stock chamber in the sputtering apparatus in the present embodiment. FIG. 4 is a schematic side view showing the stock support portion, the drive support portion, and the sealing means in the stock chamber in the present embodiment.
As shown in FIGS. 3 and 4, the stock chamber 50 has a substantially rectangular cross-sectional shape. In the stock chamber 50, although not shown, high-vacuum evacuation means such as a turbo molecular pump for drawing a high vacuum in the stock chamber 50 as in the film forming chamber 4 and introducing a gas into the stock chamber 50 Means for introducing a gas.
 ストック室50には、図3,図4に示すように、マスクフレームFの面が互いに平行な状態となるように、複数のマスクフレームFを支持可能であるとともに、マスクフレームFの面に略直交する方向(X方向)に、これら複数のマスクフレームFを往復させる前後移動可能であるストック支持部51A,51,52A,52,53,54が設けられる。
 ストック室50には、図3,図4に示すように、ストック支持部51A,51,52A,52,53,54にストックされたマスクフレームFから選択した一枚のマスクフレームFを、マスクフレームFの面に平行な方向(Y方向)に駆動可能とする駆動支持部55が設けられる。
 また、ストック室50には、図3,図4に示すように、マスクフレームFをX方向、Y方向またはZ方向に移動する際に、マスクフレームFが傾かないようにマスクフレームFの上端を支持可能とする搬送上支持部56が設けられる。さらに、ストック室50には、図3,図4に示すように、ストック室50を密閉可能とする密閉手段58が設けられる。
The stock room 50 can support a plurality of mask frames F such that the faces of the mask frame F are parallel to each other as shown in FIGS. The stock support portions 51A, 51, 52A, 52, 53, 54 movable back and forth to make the plurality of mask frames F reciprocate in the orthogonal direction (X direction) are provided.
In the stock room 50, as shown in FIGS. 3 and 4, a mask frame F selected from the mask frames F stocked in the stock support portions 51A, 51, 52A, 52, 53, 54 is a mask frame A drive support 55 is provided which can be driven in the direction (Y direction) parallel to the plane of F.
In addition, as shown in FIGS. 3 and 4, the upper end of the mask frame F is placed in the stock chamber 50 so that the mask frame F is not inclined when moving the mask frame F in the X direction, Y direction or Z direction. A transportable upper support portion 56 is provided which can be supported. Furthermore, as shown in FIG. 3 and FIG. 4, the stock chamber 50 is provided with a sealing means 58 capable of sealing the stock chamber 50.
 ストック支持部51A,51,52A,52,53,54は、図3,図4に示すように、ストック載置部51Aと、ストック載置部52Aと、ストック下支持部51,52と、ストック上支持部53,54と、を有する。
 ストック載置部51Aは、ストック室50内において、複数のマスクフレームFの下端を支持可能とされた複数のストック溝(載置溝)51Aaと、駆動溝51Abと、を有する。
 ストック載置部52Aは、ストック載置部51Aと同様に、複数のマスクフレームFの下端を支持可能とされた複数のストック溝(載置溝)52Aaと、駆動溝52Abと、を有する。
 ストック下支持部51,52は、上昇、下降および前後移動可能とされる。ストック下支持部51,52は、Z方向に上昇した際に、ストック載置部51A,52Aのストック溝51Aa,52Aaに載置された複数のマスクフレームFの下端に当接して、これら複数のマスクフレームFを持ち上げ、ストック載置部51A,52AからマスクフレームFが離間した状態である上昇位置として支持可能である。ストック下支持部51,52は、上昇位置にあるこれら複数のマスクフレームFを、マスクフレームFの面に略直交する方向(X方向)に往復する前後移動が可能である。さらに、ストック下支持部51,52は、マスクフレームFをX方向に前後移動した後にZ方向に下降するように、マスクフレームFをストック載置部51A,52Aのストック溝51Aa,52Aaに載置してマスクフレームFの支持を解除可能である。
 ストック上支持部53,54は、ストック載置部51A,52Aにストックされるかストック下支持部51,52に支持された複数のマスクフレームFの上側となる位置を支持および解放可能とされるとともに、ストック下支持部51,52と同期して同じ方向(X方向)に往復動作(前後移動)可能とされる。
 なお、図4においては、ストック下支持部51,52のうち図示を省略した構成がある。
The stock support portions 51A, 51, 52A, 52, 53, 54 are, as shown in FIGS. 3 and 4, a stock placement portion 51A, a stock placement portion 52A, a stock lower support portion 51, 52, and a stock And upper support portions 53, 54.
The stock placement portion 51A has a plurality of stock grooves (placement grooves) 51Aa capable of supporting the lower ends of the plurality of mask frames F in the stock chamber 50, and a drive groove 51Ab.
Similar to the stock placement section 51A, the stock placement section 52A includes a plurality of stock grooves (loading grooves) 52Aa capable of supporting the lower ends of the plurality of mask frames F, and a drive groove 52Ab.
The stock lower support portions 51, 52 can be raised, lowered, and moved back and forth. The stock lower support portions 51 and 52 contact the lower ends of the plurality of mask frames F placed on the stock grooves 51Aa and 52Aa of the stock placement portions 51A and 52A when the stock lower support portions 51 and 52 ascend in the Z direction. The mask frame F is lifted and can be supported as a raised position in which the mask frame F is separated from the stock placement portions 51A and 52A. The stock lower support portions 51 and 52 are capable of moving back and forth in the direction (X direction) substantially orthogonal to the plane of the mask frame F with the plurality of mask frames F in the raised position. Furthermore, the stock lower support portions 51 and 52 place the mask frame F in the stock grooves 51Aa and 52Aa of the stock placement portions 51A and 52A so that the stock frame support portion 51 and 52 descends in the Z direction after moving the mask frame F back and forth in the X direction. The support of the mask frame F can be released.
The stock upper support portions 53, 54 can support and release the upper positions of the plurality of mask frames F which are stocked in the stock placement portions 51A, 52A or supported by the lower stock support portions 51, 52. In addition, it is possible to reciprocate (move forward and backward) in the same direction (X direction) in synchronization with the stock lower support portions 51 and 52.
In addition, in FIG. 4, there is the structure which abbreviate | omitted illustration among the stock lower support parts 51 and 52. As shown in FIG.
 ストック載置部51A,52Aは、図3,図4に示すように、ストック室50にストックするマスクフレームFをその下端面の両端となる位置にそれぞれ当接して載置可能なように、X方向に間隔を有してストック室50の底部50aに配置される。 As shown in FIGS. 3 and 4, the stock placement units 51A and 52A are arranged such that mask frames F to be stocked in the stock chamber 50 can be placed in contact with the lower end surfaces of the stock frame 50 respectively. It is disposed at the bottom 50 a of the stock chamber 50 with a spacing in the direction.
 載置溝51Aaは、載置されたマスクフレームFの下端を支持可能なようにマスクフレームFの面に略平行なY方向(水平方向)に延在する。載置溝51Aaは、また、X方向に離間するようにブロック状のストック載置部51Aの頂部となる位置に複数設けられている。これらの載置溝51Aaは、X方向に均等な間隔を有する。載置溝51Aaは、いずれも略同一の深さ寸法とされ、かつ、ほぼ同じ高さ方向(Z方向)位置に設けられる。
 駆動溝51Abは、複数の載置溝51Aaのうち、後述する駆動ローラ55aに対応するX方向の位置となるストック載置部51A頂部に設けられる。つまり、後述する駆動ローラ55a,55aを結ぶY方向の直線に一致するように、駆動溝51Abが配置される。
 駆動溝51Abは、載置溝51Aaを拡大した形状とされる。ここで、駆動溝51Abが載置溝51Aaを拡大した形状であるとは、駆動溝51Abの深さ寸法および幅寸法を、載置溝51Aaの深さ寸法および幅寸法に比べて大きく設定することを意味する。同時に、駆動溝51Abが載置溝51Aaを拡大した形状であるとは、駆動溝51Abの形状が、後述する駆動ローラ55aによってマスクフレームFを駆動する際に、駆動されるマスクフレームFがストック載置部51Aと干渉しないで搬送可能なことを意味する。
 駆動溝51Abに対応するX方向の位置となるレーンにおいては、マスクフレームFが、後述する駆動ローラ55aに載置される。
The placement groove 51Aa extends in the Y direction (horizontal direction) substantially parallel to the surface of the mask frame F so as to be able to support the lower end of the placed mask frame F. A plurality of placement grooves 51Aa are also provided at positions on top of the block-like stock placement portion 51A so as to be separated in the X direction. These placement grooves 51Aa have an equal interval in the X direction. The mounting grooves 51Aa have depths substantially the same, and are provided at substantially the same height direction (Z direction).
The drive groove 51Ab is provided at the top of the stock placement portion 51A at a position in the X direction corresponding to a drive roller 55a described later among the plurality of placement grooves 51Aa. That is, the drive groove 51Ab is disposed to coincide with a straight line in the Y direction connecting drive rollers 55a and 55a described later.
Drive groove 51Ab is made into the shape which expanded mounting groove 51Aa. Here, that the drive groove 51Ab has a shape obtained by enlarging the placement groove 51Aa means that the depth dimension and the width dimension of the drive groove 51Ab are set larger than the depth dimension and the width dimension of the placement groove 51Aa. Means At the same time, the drive groove 51Ab has a shape in which the mounting groove 51Aa is enlarged, the shape of the drive groove 51Ab is a stock mounting of the mask frame F driven when the mask frame F is driven by the driving roller 55a described later. It means that it can be transported without interfering with the placement unit 51A.
The mask frame F is mounted on a drive roller 55a described later in the lane at the position in the X direction corresponding to the drive groove 51Ab.
 ストック下支持部51,52は、図3,図4に示すように、ストック室50の底部50aに配置されている。ストック下支持部51とストック下支持部52とは、ストック載置部51A、52Aに載置されたマスクフレームFの下端の両端位置において、ストック載置部51A、52Aの当接位置よりも内側位置に当接可能なように、ストック載置部51Aとストック載置部52AとのX方向間隔よりもやや狭い間隔に配置される。 The stock lower support portions 51 and 52 are disposed at the bottom 50 a of the stock chamber 50 as shown in FIGS. 3 and 4. The stock lower support portion 51 and the stock lower support portion 52 are located inside the contact positions of the stock mounting portions 51A and 52A at both end positions of the lower end of the mask frame F mounted on the stock mounting portions 51A and 52A. In order to be able to abut on the position, it is disposed at an interval slightly narrower than the X-direction interval between the stock placement portion 51A and the stock placement portion 52A.
 ストック下支持部51は、図3,図4に示すように、ストック室50の底部50aに設けられる。ストック下支持部51は、マスクフレームFの面に略平行なY方向に延在し、かつ、X方向に離間する複数の凹状である支持溝51a,51aを有する。ストック下支持部51は、支持溝51a,51aにマスクフレームFの下端に当接してマスクフレームFを支持可能である。これら複数の支持溝51a,51aは、複数のマスクフレームFを一体として移動可能なように、溝支持基部51bの頂部位置に設けられている。 The stock lower support portion 51 is provided at the bottom portion 50 a of the stock chamber 50 as shown in FIGS. 3 and 4. The stock lower support portion 51 has a plurality of concave support grooves 51a, 51a extending in the Y direction substantially parallel to the surface of the mask frame F and spaced apart in the X direction. The stock lower support portion 51 can support the mask frame F in contact with the lower ends of the mask frame F in the support grooves 51a, 51a. The plurality of support grooves 51a, 51a are provided at the top of the groove support base 51b so that the plurality of mask frames F can be moved integrally.
 支持溝51a,51aは、載置溝51Aaと同様にそれぞれがX方向に均等な間隔を有して設けられている。また、支持溝51a,51aは、いずれも略同一の深さ寸法を有する。それぞれの支持溝51a,51aにおいては、その底部位置が、いずれもほぼ同じ高さ方向(Z方向)位置に設定される。 The support grooves 51a and 51a are provided at equal intervals in the X direction, similarly to the placement groove 51Aa. In addition, the support grooves 51a, 51a both have substantially the same depth dimension. In each of the support grooves 51a, 51a, the bottom position is set to the substantially same height direction (Z direction) position.
 支持溝51a,51aは、溝支持基部51bがZ方向に上下動した際に、載置溝51Aaの高さ位置よりも高い位置から低い位置まで移動可能である。
 これにより、溝支持基部51bがZ方向に上昇した際に、ストック載置部51Aのストック溝51Aaに載置された複数のマスクフレームFの下端に支持溝51a,51aが当接し、さらに溝支持基部51bがZ方向に上昇して、ストック溝51Aaを複数のマスクフレームFの下端から離間して支持可能である。また、溝支持基部51bが上昇した状態で、ストック載置部51AにマスクフレームFが当接しないように、マスクフレームFの面と略直交方向(X方向)にこれら複数のマスクフレームFを往復する前後移動が可能である。また、溝支持基部51bがZ方向に下降した際に、支持溝51a,51aが複数のマスクフレームFの下端から離間して、複数のマスクフレームFをストック溝51Aaに載置可能である。
The support grooves 51a, 51a are movable from a position higher than the height position of the mounting groove 51Aa to a lower position when the groove support base 51b moves up and down in the Z direction.
Thus, when the groove support base 51b ascends in the Z direction, the support grooves 51a, 51a abut the lower ends of the plurality of mask frames F placed in the stock grooves 51Aa of the stock placement portion 51A, and further the groove supports The base 51b can rise in the Z direction to support the stock groove 51Aa at a distance from the lower ends of the plurality of mask frames F. Further, in a state where the groove support base 51b is lifted, the plurality of mask frames F are reciprocated in a direction (X direction) substantially orthogonal to the surface of the mask frame F so that the mask frame F does not abut the stock placement portion 51A. Back and forth movement is possible. Further, when the groove support base 51b is lowered in the Z direction, the support grooves 51a, 51a are separated from the lower ends of the plurality of mask frames F, and the plurality of mask frames F can be mounted on the stock grooves 51Aa.
 ストック下支持部51の支持溝51aは、ストック載置部51Aの載置溝51Aaよりも少なく配置することができる。本実施形態では、4本の載置溝51Aaを設けるのに対し、3本の支持溝51aを設けることができる。 The support groove 51a of the stock lower support portion 51 can be disposed smaller than the mounting groove 51Aa of the stock mounting portion 51A. In the present embodiment, while four mounting grooves 51Aa are provided, three support grooves 51a can be provided.
 溝支持基部51bは、X方向における支持溝51a,51aの配置寸法よりも大きなX方向寸法を有している。溝支持基部51bは、X方向に延在しているX方向規制部51c上にX方向往復動可能に載置される。溝支持基部51bは、X方向規制部51cによっての移動方向をX方向に規制されている。
 溝支持基部51bは、X方向に延在するX駆動軸51b1に接続されている。X駆動軸51b1は、X方向規制部51c上に固定されたX駆動モータ51b2に接続されている。
The groove support base 51b has an X-direction dimension larger than the arrangement dimension of the support grooves 51a and 51a in the X-direction. The groove support base 51 b is mounted on the X direction restricting portion 51 c extending in the X direction so as to be capable of reciprocating in the X direction. The moving direction of the groove support base 51b is restricted in the X direction by the X-direction restricting portion 51c.
The groove support base 51 b is connected to an X drive shaft 51 b 1 extending in the X direction. The X drive shaft 51b1 is connected to an X drive motor 51b2 fixed on the X direction regulating portion 51c.
 X方向規制部51cは、X方向における溝支持基部51bの寸法よりも大きなX方向寸法を有している。X方向規制部51cは、X方向に延在するようにストック室50の底部50a近傍に設けられている。 The X-direction restricting portion 51c has an X-direction dimension larger than the dimension of the groove support base 51b in the X-direction. The X-direction restricting portion 51 c is provided in the vicinity of the bottom portion 50 a of the stock chamber 50 so as to extend in the X direction.
 X方向規制部51cは、略鉛直に立設されたZ駆動軸51dに接続されている。Z駆動軸51dはボールネジ等とされる。Z駆動軸51dはストック室50の底部50aを密閉可能に貫通している。Z駆動軸51dは、チャンバ50外に配置されたZ駆動モータ51eに接続されている。
 X方向規制部51cは、ストック室50の底部50aに立設されたZ方向規制部51fに取り付けられる。X方向規制部51cは、Z方向規制部51fによって移動がZ方向に規制されている。
The X-direction restricting portion 51c is connected to a Z drive shaft 51d erected substantially vertically. The Z drive shaft 51 d is a ball screw or the like. The Z drive shaft 51 d penetrates the bottom portion 50 a of the stock chamber 50 in a sealable manner. The Z drive shaft 51 d is connected to a Z drive motor 51 e disposed outside the chamber 50.
The X-direction restricting portion 51 c is attached to a Z-direction restricting portion 51 f erected at the bottom 50 a of the stock chamber 50. The movement in the X-direction restricting portion 51c is restricted in the Z direction by the Z-direction restricting portion 51f.
 溝支持基部51b,X駆動軸51b1,X駆動モータ51b2,X方向規制部51c,Z駆動軸51d,Z駆動モータ51e,Z方向規制部51fは、ストック位置交換駆動部を構成する。ストック位置交換駆動部は、X方向における複数の支持溝51a,51aの間隔を維持した状態で、これら複数の支持溝51a,51aをX方向および/またはZ方向に往復動作可能とする。 The groove support base 51b, the X drive shaft 51b1, and the X drive motor 51b2, the X direction control unit 51c, the Z drive shaft 51d, the Z drive motor 51e, and the Z direction control unit 51f constitute a stock position exchange drive unit. The stock position exchange driving unit enables the plurality of support grooves 51a and 51a to reciprocate in the X direction and / or the Z direction while maintaining the distance between the plurality of support grooves 51a and 51a in the X direction.
 ストック位置交換駆動部51b~51fにおいては、X駆動モータ51b2がX駆動軸51b1を駆動して、X方向規制部51cによって移動方向が規制された状態で、溝支持基部51bをX方向に往復動作する。ストック位置交換駆動部51b~51fにおいては、また、Z駆動モータ51eがZ駆動軸51dを駆動して、Z方向規制部51fによって移動方向が規制された状態で、X方向規制部51cをZ方向に往復動作する。 In stock position exchange driving units 51b to 51f, X drive motor 51b2 drives X drive shaft 51b1, and movement of groove support base portion 51b is reciprocated in the X direction with movement direction restricted by X direction restricting portion 51c. Do. In stock position exchange driving units 51b to 51f, Z drive motor 51e drives Z drive shaft 51d, and the movement direction is restricted by Z direction restriction unit 51f. To reciprocate.
 同時に、マスクフレームFをストックするストック載置部51Aにおいては、例えば、5本の載置溝51Aaが設けられており、同時に5枚のマスクフレームFを支持可能とされている。マスクフレームFにおけるストック位置の移動交換をおこなう溝支持基部51bにおいては、例えば、3本の支持溝51aが設けられており、同時に3枚のマスクフレームFを移動可能とされている。 At the same time, in the stock placement unit 51A for stocking the mask frame F, for example, five placement grooves 51Aa are provided, and five mask frames F can be simultaneously supported. In the groove support base 51b for moving and replacing the stock position in the mask frame F, for example, three support grooves 51a are provided, and three mask frames F can be moved simultaneously.
 ストック載置部51Aとストック載置部52Aとは、図3に示すように、Y方向における配置位置が異なるだけで、略同一の構成とされている。ストック載置部52Aは、ストック載置部51AとマスクフレームFのY方向寸法に対応する距離だけ離間するように配置される。ストック載置部52Aは、X方向およびZ方向における位置が、ストック載置部51Aとほぼ同じ配置となるように設けられている。 As shown in FIG. 3, the stock placement unit 51A and the stock placement unit 52A have substantially the same configuration except that the arrangement position in the Y direction is different. The stock placement unit 52A is arranged to be separated by a distance corresponding to the dimension of the stock placement unit 51A and the mask frame F in the Y direction. The stock placement unit 52A is provided such that the positions in the X direction and the Z direction are substantially the same as that of the stock placement unit 51A.
 載置溝52Aaは、載置されたマスクフレームFの下端を支持可能なようにマスクフレームFの面に略平行なY方向(水平方向)に延在する。載置溝52Aaは、また、X方向に離間するようにブロック状のストック載置部52Aの頂部位置に複数設けられている。これらの載置溝52Aaは、載置溝51Aaと同様にX方向に均等な間隔を有する。載置溝52Aaは、いずれも略同一の深さ寸法とされ、かつ、ほぼ同じ高さ方向(Z方向)位置に設けられる。これにより、複数載置されたマスクフレームFが略平行状態となるように設定されている。
 駆動溝52Abは、複数の載置溝52Aaのうち、後述する駆動ローラ55aに対応するX方向の位置にストック載置部52A頂部位置に設けられる。駆動溝52Abは、載置溝52Aaを拡大した形状とされる。ここで、駆動溝52Abが載置溝52Aaを拡大した形状であるとは、駆動溝52Abにおいて、載置溝52Aaに比べて深さ寸法および幅寸法を大きく設定することを意味する。同時に、駆動溝52Abが載置溝52Aaを拡大した形状であるとは、駆動溝52Abの形状が、後述する駆動ローラ55aによってマスクフレームFを駆動する際に、駆動されるマスクフレームFがストック載置部52Aと干渉しないで搬送可能な形状なことを意味する。
 駆動溝52Abに対応するX方向の位置となるレーンにおいては、マスクフレームFが、後述する駆動ローラ55aに載置される。
The placement groove 52Aa extends in the Y direction (horizontal direction) substantially parallel to the surface of the mask frame F so as to be able to support the lower end of the placed mask frame F. A plurality of placement grooves 52Aa are also provided at the top of the block-shaped stock placement portion 52A so as to be separated in the X direction. These placement grooves 52Aa have an equal interval in the X direction, similarly to the placement grooves 51Aa. The placement grooves 52Aa have depths that are substantially the same and are provided at substantially the same height direction (Z direction). Thus, the plurality of mask frames F are set to be in a substantially parallel state.
The drive groove 52Ab is provided at the top of the stock placement portion 52A at a position in the X direction corresponding to a drive roller 55a described later among the plurality of placement grooves 52Aa. Drive groove 52Ab is made into the shape which expanded mounting groove 52Aa. Here, that the drive groove 52Ab has a shape obtained by enlarging the placement groove 52Aa means that the depth dimension and the width dimension of the drive groove 52Ab are set larger than the placement groove 52Aa. At the same time, the drive groove 52Ab has a shape in which the mounting groove 52Aa is enlarged, the shape of the drive groove 52Ab is the stock mounting of the mask frame F driven when the mask frame F is driven by the driving roller 55a described later. It means that it can be transported without interference with the placement portion 52A.
The mask frame F is mounted on a drive roller 55a described later in the lane which is the position in the X direction corresponding to the drive groove 52Ab.
 ストック下支持部52とストック下支持部51とは、図3に示すように、Y方向における配置位置が異なるだけで、略同一の構成とされている。ストック下支持部52は、ストック下支持部51とマスクフレームFのY方向寸法に対応する距離だけY方向に離間するように配置される。ストック下支持部52は、X方向およびZ方向における位置が、ストック下支持部51とほぼ同じ配置となるように設けられている。 As shown in FIG. 3, the stock lower support portion 52 and the stock lower support portion 51 have substantially the same configuration except that the arrangement position in the Y direction is different. Stock lower support portion 52 is arranged to be separated in the Y direction by a distance corresponding to the Y direction dimension of stock lower support portion 51 and mask frame F. The stock lower support portion 52 is provided such that the positions in the X direction and the Z direction are substantially the same as the positions of the stock lower support portion 51.
 ストック下支持部52は、図3,図4に示すように、ストック室50の底部50aに設けられる。ストック下支持部52は、マスクフレームFの面に略平行なY方向に延在し、かつ、X方向に離間する複数の凹状である支持溝52a,52aを有する。ストック下支持部52は、支持溝52a,52aにマスクフレームFの下端に当接してマスクフレームFを支持可能である。これら複数の支持溝52a,52aは、複数のマスクフレームFを一体として移動可能なように、溝支持基部52bの頂部位置に設けられている。 The stock lower support 52 is provided at the bottom 50 a of the stock chamber 50 as shown in FIGS. 3 and 4. The stock lower support 52 has a plurality of concave support grooves 52a, 52a extending in the Y direction substantially parallel to the surface of the mask frame F and spaced apart in the X direction. The stock lower support portion 52 can support the mask frame F in contact with the lower ends of the mask frame F in the support grooves 52a and 52a. The plurality of support grooves 52a and 52a are provided at the top of the groove support base 52b so that the plurality of mask frames F can be moved integrally.
 支持溝52a,52aは、支持溝51aと同様にそれぞれがX方向に均等な間隔を有して設けられている。また、支持溝52a,52aは、いずれも略同一の深さ寸法を有する。それぞれの支持溝52a,52aにおいては、その底部位置が、いずれもほぼ同じ高さ方向(Z方向)位置に設定される。 The support grooves 52a, 52a are provided at equal intervals in the X direction, similarly to the support groove 51a. In addition, the support grooves 52a and 52a both have substantially the same depth dimension. The bottom position of each of the support grooves 52a and 52a is set to the substantially same height direction (Z direction) position.
 支持溝52a,52aは、溝支持基部52bがZ方向に上下動する際に、載置溝52Aaの高さ位置よりも高い位置から低い位置まで移動可能である。
 これにより、溝支持基部52bがZ方向に上昇した際に、ストック載置部52Aのストック溝52Aaに載置された複数のマスクフレームFの下端に支持溝52a,52aが当接し、さらに溝支持基部52bがZ方向に上昇して、ストック溝52Aaを複数のマスクフレームFの下端から離間して支持可能である。また、溝支持基部52bが上昇した状態で、ストック載置部52AにマスクフレームFが当接しないように、マスクフレームFの面と略直交方向(X方向)にこれら複数のマスクフレームFを往復する前後移動が可能である。また、溝支持基部52bがZ方向に下降した際に、支持溝52a,52aが複数のマスクフレームFの下端から離間して、複数のマスクフレームFをストック溝52Aaに載置可能である。
The support grooves 52a and 52a are movable from a position higher than the height position of the mounting groove 52Aa to a position lower than the height position of the mounting groove 52Aa when the groove support base 52b moves up and down in the Z direction.
Thus, when the groove support base 52b ascends in the Z direction, the support grooves 52a and 52a abut the lower ends of the plurality of mask frames F placed in the stock grooves 52Aa of the stock placement portion 52A, and further the groove support The base 52b can rise in the Z direction to support the stock groove 52Aa at a distance from the lower ends of the plurality of mask frames F. Further, in a state where the groove support base 52b is raised, the plurality of mask frames F are reciprocated in a direction (X direction) substantially orthogonal to the surface of the mask frame F so that the mask frame F does not abut the stock placement portion 52A. Back and forth movement is possible. Further, when the groove support base 52b descends in the Z direction, the support grooves 52a, 52a are separated from the lower ends of the plurality of mask frames F, and the plurality of mask frames F can be mounted on the stock grooves 52Aa.
 ストック下支持部52の支持溝52aは、ストック載置部52Aの載置溝52Aaよりも少なく配置することができる。本実施形態では、ストック下支持部51およびストック載置部51Aと同様に、4本の載置溝52Aaを設けるのに対し、3本の支持溝52aを設けることができる。 The support groove 52a of the stock lower support portion 52 can be disposed smaller than the mounting groove 52Aa of the stock mounting portion 52A. In the present embodiment, similarly to the under-stock support portion 51 and the stock placement portion 51A, while four placement grooves 52Aa are provided, three support grooves 52a can be provided.
 溝支持基部52bは、X方向における支持溝52a,52aの配置寸法よりも大きなX方向寸法を有している。溝支持基部52bは、X方向に延在しているX方向規制部52c上にX方向往復動可能に載置される。溝支持基部52bは、X方向規制部52cによって移動方向をX方向に規制されている。
 溝支持基部52bは、X方向に延在するX駆動軸52b1に接続されている。X駆動軸52b1は、X方向規制部52c上に固定されたX駆動モータ5122に接続されている。
The groove support base 52b has an X-direction dimension larger than the arrangement dimension of the support grooves 52a and 52a in the X-direction. The groove support base 52 b is mounted on the X direction restricting portion 52 c extending in the X direction so as to be capable of reciprocating in the X direction. The moving direction of the groove support base 52b is restricted in the X direction by the X-direction restricting portion 52c.
The groove support base 52b is connected to an X drive shaft 52b1 extending in the X direction. The X drive shaft 52b1 is connected to an X drive motor 5122 fixed on the X direction restricting portion 52c.
 X方向規制部52cは、X方向における溝支持基部52bの寸法よりも大きなX方向寸法を有する。X方向規制部52cは、X方向に延在するようにストック室50の底部50a近傍に設けられている。 The X-direction restricting portion 52c has an X-direction dimension larger than the dimension of the groove support base 52b in the X-direction. The X-direction restricting portion 52c is provided in the vicinity of the bottom portion 50a of the stock chamber 50 so as to extend in the X direction.
 X方向規制部52cは、略鉛直に立設されたZ駆動軸52dに接続されている。Z駆動軸52dは、ボールネジ等とされる。Z駆動軸52dは、ストック室50の底部50aを密閉可能に貫通している。Z駆動軸52dは、チャンバ50外に配置されたZ駆動モータ52eに接続されている。
 X方向規制部52cは、ストック室50の底部50aに立設されたZ方向規制部52fに取り付けられる。X方向規制部52cは、Z方向規制部52fによって移動がZ方向に規制されている。
The X-direction restricting portion 52c is connected to a Z drive shaft 52d erected substantially vertically. The Z drive shaft 52 d is a ball screw or the like. The Z drive shaft 52 d penetrates the bottom portion 50 a of the stock chamber 50 in a sealable manner. The Z drive shaft 52 d is connected to a Z drive motor 52 e disposed outside the chamber 50.
The X-direction restricting portion 52 c is attached to a Z-direction restricting portion 52 f erected at the bottom 50 a of the stock chamber 50. The movement in the X-direction restricting portion 52c is restricted in the Z direction by the Z-direction restricting portion 52f.
 溝支持基部52b,X駆動軸52b1,X駆動モータ52b2,X方向規制部52c,Z駆動軸52d,Z駆動モータ52e,Z方向規制部52fは、ストック位置交換駆動部を構成している。ストック位置交換駆動部は、X方向における複数の支持溝52a,52aの間隔を維持した状態で、これら複数の支持溝52a,52aをX方向および/またはZ方向に往復動作可能とする。 The groove support base 52b, the X drive shaft 52b1, and the X drive motor 52b2, the X direction restricting portion 52c, the Z drive shaft 52d, the Z drive motor 52e, and the Z direction restricting portion 52f constitute a stock position exchange drive portion. The stock position exchange driving unit enables the plurality of support grooves 52a and 52a to reciprocate in the X direction and / or the Z direction while maintaining the distance between the plurality of support grooves 52a and 52a in the X direction.
 ストック位置交換駆動部52b~52fにおいては、X駆動モータ52b2がX駆動軸52b1を駆動して、X方向規制部52cによって移動方向が規制された状態で、溝支持基部52bをX方向に往復動作する。ストック位置交換駆動部52b~52fにおいては、また、Z駆動モータ52eがZ駆動軸52dを駆動して、Z方向規制部52fによって移動方向が規制された状態で、X方向規制部52cがZ方向に往復動作する。 In stock position exchange driving units 52b to 52f, X drive motor 52b2 drives X drive shaft 52b1, and movement of groove support base 52b is reciprocated in the X direction with movement direction restricted by X direction restricting unit 52c. Do. In stock position exchange driving units 52b to 52f, Z drive motor 52e drives Z drive shaft 52d, and the movement direction is regulated by Z direction regulation unit 52f, and X direction regulation unit 52c is in the Z direction. To reciprocate.
 同時に、マスクフレームFをストックするストック載置部52Aにおいては、例えば、5本の載置溝52Aaが設けられており、同時に5枚のマスクフレームFを支持可能とされている。マスクフレームFにおけるストック位置の移動交換をおこなう溝支持基部52bにおいては、例えば、3本の支持溝52aが設けられており、同時に3枚のマスクフレームFを移動可能とされている。 At the same time, in the stock placement unit 52A for stocking the mask frame F, for example, five placement grooves 52Aa are provided, and it is possible to simultaneously support five mask frames F. In the groove support base 52b for moving and exchanging the stock position in the mask frame F, for example, three support grooves 52a are provided, and three mask frames F can be moved simultaneously.
 ストック下支持部51,52においては、ストック位置交換駆動部51b~51fとストック位置交換駆動部52b~52fとが同期して駆動可能とされている。これにより、支持溝51a,51aおよび支持溝52a,52aが同期してZ方向およびX方向に駆動可能になる。
 なお、X駆動モータ51b2とX駆動モータ52b2、Z駆動モータ51eとZ駆動モータ52e等、ストック下支持部51,52において駆動が同期された駆動部を1つのモータによって駆動可能な構成とすることもできる。
In the stock lower support portions 51 and 52, the stock position exchange driving units 51b to 51f and the stock position exchange driving units 52b to 52f can be driven synchronously. As a result, the support grooves 51a, 51a and the support grooves 52a, 52a can be synchronously driven in the Z direction and the X direction.
In addition, the drive units synchronized in the lower stock support portions 51 and 52, such as the X drive motor 51b2 and the X drive motor 52b2, the Z drive motor 51e and the Z drive motor 52e, can be driven by one motor. You can also.
 ストック下支持部51,52においては、X方向において対応する位置にある支持溝51aと支持溝52aとによって、一枚のマスクフレームFのY方向両端付近を支持できる。また、ストック下支持部51,52においては、X方向において対応する位置にある支持溝51aと支持溝52aとによって、一枚のマスクフレームFのY方向両端付近を移動できる。つまり、ストック位置交換駆動部51b~52fを駆動することにより、溝支持基部51bの支持溝51aおよび溝支持基部52bの支持溝52aにマスクフレームFを載置して、ストック載置部51Aおよびストック載置部52Aに対してX方向に移動して、載置位置を変更することができる。
 ここで、支持溝51aと支持溝52aとが、X方向において対応する位置にあるとは、Y方向に延在する同一の直線上に支持溝51aと支持溝52aとが位置していることを意味する。
 また、ストック下支持部51,52においては、駆動溝51Abと駆動溝52Abとが、X方向において対応する位置に設けられている。
 同様に、駆動溝51Abと駆動溝52Abとが、X方向において対応する位置にあるとは、Y方向に延在する同一の直線上に駆動溝51Abと駆動溝52Abとが位置していることを意味する。
The stock lower support portions 51 and 52 can support the vicinity of both ends of one mask frame F in the Y direction by the support grooves 51a and the support grooves 52a located at corresponding positions in the X direction. Further, in the stock lower support portions 51 and 52, the vicinity of both ends of one mask frame F in the Y direction can be moved by the support grooves 51a and the support grooves 52a located at corresponding positions in the X direction. That is, the mask frame F is mounted on the support groove 51a of the groove support base 51b and the support groove 52a of the groove support base 52b by driving the stock position exchange driving units 51b to 52f, and the stock placement portion 51A and the stock The placement position can be changed by moving in the X direction with respect to the placement unit 52A.
Here, that the support groove 51a and the support groove 52a are at corresponding positions in the X direction means that the support groove 51a and the support groove 52a are located on the same straight line extending in the Y direction. means.
In the stock lower support portions 51 and 52, the drive groove 51Ab and the drive groove 52Ab are provided at corresponding positions in the X direction.
Similarly, that the drive groove 51Ab and the drive groove 52Ab are at corresponding positions in the X direction means that the drive groove 51Ab and the drive groove 52Ab are positioned on the same straight line extending in the Y direction. means.
 具体的には、図3,図4に示すように、ストック下支持部51における一番右に図示された支持溝51aと、ストック下支持部52における一番右に図示された支持溝52aとが、X方向において互いに対応する位置とされる。以下、駆動溝51Abと駆動溝52Abとをのぞいて、同様に、ストック下支持部51における右からn番目に図示された支持溝51aと、ストック下支持部52における右からn番目に図示された支持溝52aとが、X方向において互いに対応する位置とされる。ここで、nは自然数とされる。 Specifically, as shown in FIGS. 3 and 4, a support groove 51a illustrated on the rightmost side of the stock lower support portion 51 and a support groove 52a illustrated on the rightmost side of the stock lower support portion 52. Are mutually corresponding positions in the X direction. Hereinafter, except for the drive groove 51Ab and the drive groove 52Ab, similarly, the support groove 51a illustrated n-th from the right in the stock lower support portion 51 and the n-th illustrated in the right in the stock lower support portion 52 The support grooves 52a are at positions corresponding to each other in the X direction. Here, n is a natural number.
 同様に、ストック載置部51Aとストック載置部52Aとにおいては、X方向において対応する位置にある載置溝51Aaと載置溝52Aaとによって、一枚のマスクフレームFのY方向における両端付近を支持することができる。
 支持溝51aは、いずれも、あらかじめ設定されたストック数である載置溝51Aa(駆動溝51Abを含む)と後述する取り出し支持部58gの取り出し支持溝58gaとの合計本数よりも少ない本数として配置される。
 同様に、支持溝52aは、いずれも、あらかじめ設定されたストック数である載置溝52Aa(駆動溝52Abを含む)と後述する取り出し支持部58gの取り出し支持溝58gaとの合計本数よりも少ない本数として配置される。
Similarly, in the stock placement portion 51A and the stock placement portion 52A, the vicinity of both ends in the Y direction of one mask frame F by the placement grooves 51Aa and the placement grooves 52Aa located at corresponding positions in the X direction. Can support.
The number of support grooves 51a is smaller than the total number of placement grooves 51Aa (including drive grooves 51Ab) which are stock numbers set in advance and the take-out support grooves 58ga of the take-out support portion 58g described later. Ru.
Similarly, the number of support grooves 52a is smaller than the total number of mounting grooves 52Aa (including drive grooves 52Ab), which are stock numbers set in advance, and the take-out support grooves 58ga of the take-out support portion 58g described later. Will be placed as
 ストック下支持部51およびストック下支持部52においては、一枚のマスクフレームFが、それぞれ対応する支持溝51aおよび支持溝52aによって支持される。この一枚のマスクフレームFは、支持溝51aおよび支持溝52aによって支持された状態で、X方向に移動可能である。 In the lower stock support portion 51 and the lower stock support portion 52, a single mask frame F is supported by the corresponding support grooves 51a and 52a. The single mask frame F is movable in the X direction while being supported by the support grooves 51a and the support grooves 52a.
 ストック上支持部53およびストック上支持部54は、図3,図4に示すように、ストック下支持部51およびストック下支持部52にストックされた複数のマスクフレームF上側を支持および解放可能とされる。また、ストック上支持部53およびストック上支持部54は、ストック下支持部51,52のX方向動作と同期してX方向に往復動作可能である。
 なお、図4においては、ストック上支持部53およびストック上支持部54のうち図示を省略した構成がある。
The stock upper support portion 53 and the stock upper support portion 54 can support and release the upper side of the plurality of mask frames F stocked in the lower stock support portion 51 and the lower stock support portion 52 as shown in FIGS. 3 and 4. Be done. Further, the stock upper support portion 53 and the stock upper support portion 54 can reciprocate in the X direction in synchronization with the operation of the stock lower supports 51 and 52 in the X direction.
Note that, in FIG. 4, the configuration of the stock upper support portion 53 and the stock upper support portion 54 is omitted.
 ストック上支持部53は、複数の挟持部53aを有する。複数の挟持部53aは、マスクフレームFの上端付近を挟持して支持する。特に、複数の挟持部53aは、マスクフレームFの上端における左右方向(Y方向)の両端となる位置にある角部の付近を挟持して支持する。
 また、ストック上支持部53は、X回転駆動部53rxを有する。X回転駆動部53rxは、挟持部53aをマスク面(ZY平面)に垂直な略水平方向(X方向)に駆動する。X回転駆動部53rxは、挟持部53aを駆動してX方向に位置調整が可能である。X回転駆動部53rxは、また、挟持部53aをマスク面に略平行なYZ面内で回動する。X回転駆動部53rxは、挟持部53aによるマスクフレームFの係止および解放を可能とする。
The stock upper support portion 53 has a plurality of sandwiching portions 53a. The plurality of sandwiching portions 53a sandwich and support the vicinity of the upper end of the mask frame F. In particular, the plurality of sandwiching portions 53a sandwich and support the vicinity of the corner portions located at both ends in the left-right direction (Y direction) at the upper end of the mask frame F.
Further, the stock upper support portion 53 has an X rotation drive portion 53rx. The X rotation drive unit 53 rx drives the holding unit 53 a in a substantially horizontal direction (X direction) perpendicular to the mask surface (ZY plane). The X rotation drive unit 53 rx can adjust the position in the X direction by driving the holding unit 53 a. The X rotation drive unit 53rx also rotates the holding unit 53a in the YZ plane substantially parallel to the mask surface. The X rotation drive unit 53 rx enables locking and releasing of the mask frame F by the holding unit 53 a.
 ストック上支持部53は、図3,図4に示すように、X方向に延在する回転軸53cを有する。回転軸53cの先端には、挟持部53aが設けられる。挟持部53aは、複数の挟持片53b,53bを有する。複数の挟持片53b,53bは、ストックされたマスクフレームFの上端において、マスクフレームFの表面および裏面のそれぞれに当接する。
 複数の挟持片53b,53bは、回転軸53cの軸線方向に離間して配置される。回転軸53cの軸線方向における挟持片53b,53bの間の距離が、マスクフレームFの厚さとほぼ同等か、あるいは、少し大きな状態とされる。複数の挟持片53b,53bは、いずれも、回転軸53cの径方向となるYZ方向に互いに平行状態に固定される。
As shown in FIGS. 3 and 4, the stock upper support portion 53 has a rotation shaft 53 c extending in the X direction. A pinching portion 53a is provided at the tip of the rotary shaft 53c. The sandwiching portion 53a has a plurality of sandwiching pieces 53b and 53b. The plurality of sandwiching pieces 53b, 53b abut on the front surface and the rear surface of the mask frame F at the upper end of the stocked mask frame F, respectively.
The plurality of sandwiching pieces 53b, 53b are spaced apart in the axial direction of the rotation shaft 53c. The distance between the holding pieces 53b and 53b in the axial direction of the rotation shaft 53c is substantially equal to or slightly larger than the thickness of the mask frame F. The plurality of sandwiching pieces 53b, 53b are both fixed in parallel to each other in the YZ direction which is the radial direction of the rotation shaft 53c.
 また、回転軸53cの基端側にはX回転駆動部53rxが接続される。回転軸53cは、X方向に延在する。回転軸53cの基端側は、ストック室50の外側まで延長するように配置されている。
 回転軸53cと、挟持片53b,53bとは、互いに略直交するように交差して配置される。回転軸53cの先端側は、挟持片53b,53bに接続される。
Further, an X rotation drive unit 53rx is connected to the base end side of the rotation shaft 53c. The rotation shaft 53c extends in the X direction. The proximal end side of the rotation shaft 53 c is arranged to extend to the outside of the stock chamber 50.
The rotating shaft 53c and the sandwiching pieces 53b and 53b are disposed to intersect with each other so as to be substantially orthogonal to each other. The tip end side of the rotating shaft 53c is connected to the sandwiching pieces 53b, 53b.
 挟持片53b,53bは、回転軸53cに、例えば、4個設けられる。隣接する挟持片53bと挟持片53bとの間には、一枚のマスクフレームFを保持可能である。したがって、挟持部53aは、三枚のマスクフレームFを保持可能である。挟持片53bの個数は、ストック載置部51AにストックされるマスクフレームFのうち、支持溝51aおよび支持溝52aによって移動されるマスクフレームFの枚数に対応している。 For example, four holding pieces 53b and 53b are provided on the rotation shaft 53c. A single mask frame F can be held between the adjacent clamping pieces 53b and 53b. Therefore, the sandwiching portion 53a can hold three mask frames F. The number of holding pieces 53b corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 51A.
 回転軸53cが配置されるZ方向における高さは、ストック下支持部51およびストック下支持部52のZ方向の動作によって昇降するマスクフレームFの上端が当接しない高さ位置とされる。挟持片53b,53bの長さ寸法は、ストック下支持部51およびストック下支持部52のZ方向の動作によってマスクフレームFが昇降しても、マスクフレームFの上端を支持可能な長さである。これにより、挟持部53aは、ストック下支持部51およびストック下支持部52のZ方向の動作によってマスクフレームFが昇降しても、マスクフレームFの上端を支持する状態を維持できる。 The height in the Z direction at which the rotation shaft 53c is disposed is a height position at which the upper end of the mask frame F, which is raised and lowered by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction, does not abut. The length dimension of the holding pieces 53b, 53b is such that the upper end of the mask frame F can be supported even if the mask frame F is moved up and down by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction. . Thus, even if the mask frame F moves up and down by the movement of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction, the holding portion 53a can maintain the upper end of the mask frame F.
 挟持片53b,53bの先端には、互いに対向する内側面に位置するように凸部53eが設けられてもよい。この凸部53eは、マスクフレームFを挟持する際に、互いに対向する凸部53eがマスクフレームFの表面および裏面のそれぞれに点接触する。互いに対向する凸部53eは、後述する凸部13Ad,13Aeと同様に、マスクフレームFを挟持する際に互いに近接する方向に付勢されることが可能である。 At the tips of the holding pieces 53b, 53b, convex portions 53e may be provided so as to be positioned on the inner side surfaces facing each other. When holding the mask frame F, the convex portions 53 e in point contact with the front surface and the rear surface of the mask frame F. When holding the mask frame F, the convex portions 53e facing each other can be urged in the direction in which they approach each other, similarly to the convex portions 13Ad and 13Ae described later.
 回転軸53cは、図3,図4に示すように、マスク面に垂直な略水平方向(X方向)に延在して、回転軸53cの軸線の周りに回動可能とされる。回転軸53cは、回転軸53cの軸線方向(X方向)に進退可能とされる。
 回転軸53cの先端には、挟持部53aとなる挟持片53b、53bが回転軸53cの径方向に突出するように、回転軸53cの軸線の方向に複数接続固定される。回転軸53cの基端には、X回転駆動部53rxのモータが接続され、回転軸53cを回転軸53cの軸線の周りに駆動可能とされている。
As shown in FIGS. 3 and 4, the rotation shaft 53c extends in a substantially horizontal direction (X direction) perpendicular to the mask surface, and is rotatable around the axis of the rotation shaft 53c. The rotation shaft 53c can be advanced and retracted in the axial direction (X direction) of the rotation shaft 53c.
A plurality of sandwiching pieces 53b, 53b to be the sandwiching part 53a are fixedly connected in the direction of the axis of the rotating shaft 53c so as to protrude in the radial direction of the rotating shaft 53c. The motor of the X rotation drive unit 53rx is connected to the base end of the rotation shaft 53c, and the rotation shaft 53c can be driven around the axis of the rotation shaft 53c.
 また、X回転駆動部53rxにおいては、例えば、図示しないモータがマスク面(YZ面)と平行に延在する平板部に固定される。X回転駆動部53rxにおいては、平板部をX駆動部によって駆動することで、回転軸53cが、X方向に駆動される。挟持部53aは、回転軸53cがX方向に駆動された際に、回転軸53cと一体としてX方向に駆動される。 Further, in the X rotation drive unit 53rx, for example, a motor (not shown) is fixed to a flat plate portion extending in parallel with the mask surface (YZ surface). In the X rotation drive unit 53 rx, the rotation shaft 53 c is driven in the X direction by driving the flat plate unit by the X drive unit. The sandwiching portion 53a is driven in the X direction integrally with the rotating shaft 53c when the rotating shaft 53c is driven in the X direction.
 図示しないX駆動部は、ステッピングモータとされるXモータと、このXモータによって回転駆動されX方向に延在するX回転軸と、X回転軸に螺合されてこのX回転軸の軸線方向に相対移動可能なX位置規制部と、このX位置規制部およびXモータの移動をX方向に規制するX規制部と、を有する。 An X drive unit (not shown) is screwed with an X motor, which is a stepping motor, an X rotation shaft rotationally driven by the X motor and extending in the X direction, and in the axial direction of the X rotation shaft. It has an X position restricting portion capable of relative movement, and an X restricting portion that restricts the movement of the X position restricting portion and the X motor in the X direction.
 図示しないX駆動部においては、XモータによってX回転軸を回動することで、このX回転軸の先端が回動可能な状態でX回転軸の先端に接続されたX位置規制部が、平板部に対してX方向に移動する。X規制部によって、X位置規制部の移動方向が規制されている。図示しない平板部は、ストック室(チャンバ)50の側部とされている。ストック上支持部53は、挟持部53aの位置をX方向の自由度にて調整可能である。ストック上支持部53は、ストック室(チャンバ)50の側部に固定されている。
 なお、図4においては、X回転駆動部53rx等の図示を省略している。
In an X drive unit (not shown), the X position regulation unit connected to the tip of the X rotation shaft is flat when the tip of the X rotation shaft can be turned by turning the X rotation shaft by the X motor. Move in the X direction with respect to the part. The movement direction of the X position regulating unit is regulated by the X regulating unit. The flat plate portion (not shown) is a side portion of the stock chamber (chamber) 50. The stock upper support portion 53 can adjust the position of the holding portion 53a with the degree of freedom in the X direction. The stock upper support portion 53 is fixed to the side of the stock chamber (chamber) 50.
In addition, in FIG. 4, illustration of X rotation drive part 53rx etc. is abbreviate | omitted.
 X回転駆動部53rxのX駆動部は、X方向に移動可能である。X回転駆動部53rxのX駆動部におけるX方向の動作は、ストック下支持部51のストック位置交換駆動部51b,51c,51d,51e,51fおよび/またはストック下支持部52のストック位置交換駆動部52b,52c,52d,52e,52fにおけるX方向の動作と同期可能である。これにより、ストックしているマスクフレームFを、X方向に移動する。
 なお、X回転駆動部53rxにおいては、挟持部53aをX方向に往復動可能、かつ、回転軸53cの周りに回動可能な構成であれば、上記の構成に限定されない。
The X drive unit of the X rotation drive unit 53rx is movable in the X direction. The operation in the X direction in the X drive portion of the X rotation drive portion 53rx is the stock position change drive portion of the stock position exchange drive portions 51b, 51c, 51d, 51e, 51f of the stock lower support portion 51 and / or the stock lower support portion 52. It can be synchronized with the operation in the X direction at 52b, 52c, 52d, 52e, 52f. Thereby, the stock mask frame F is moved in the X direction.
The X rotation driving unit 53rx is not limited to the above configuration as long as the holding unit 53a can be reciprocated in the X direction and can be rotated around the rotation shaft 53c.
 ストック上支持部53においては、まず、X回転駆動部53rxによって回転軸53cを回転軸53cの軸線の周りに駆動する。これにより、ストック上支持部53においては、回転軸53cの軸線の周りにおける挟持部53aの角度位置を設定する。挟持部53aの角度は、外部からストック位置に搬入されるマスクフレームFと干渉しない位置となるように設定する。ここで、挟持部53aが、外部からストック位置に搬入されるマスクフレームFと干渉しない位置としては、例えば、挟持片53bが、回転軸53cに対してZ方向の上向きとされることができる。 In the stock upper support portion 53, first, the rotation shaft 53c is driven around the axis of the rotation shaft 53c by the X rotation drive portion 53rx. Thereby, in the stock upper support portion 53, the angular position of the holding portion 53a around the axis of the rotating shaft 53c is set. The angle of the holding portion 53a is set so as not to interfere with the mask frame F carried into the stock position from the outside. Here, as a position at which the holding portion 53a does not interfere with the mask frame F carried to the stock position from the outside, for example, the holding piece 53b can be upward in the Z direction with respect to the rotation shaft 53c.
 次に、X回転駆動部53rxにおいて、X駆動部のXモータによってX回転軸を回動して、X位置規制部をX方向に移動させる。これにより、回転軸53cをX方向に駆動して挟持部53aのX方向の位置を設定し、所定の挟持片53b,53bの間にマスクフレームFの上端が位置するようにする。 Next, in the X rotation drive unit 53 rx, the X rotation axis is rotated by the X motor of the X drive unit to move the X position regulation unit in the X direction. Thus, the rotary shaft 53c is driven in the X direction to set the position of the holding portion 53a in the X direction, and the upper end of the mask frame F is positioned between the predetermined holding pieces 53b and 53b.
 この状態で、X回転駆動部53rxによって回転軸53cを回転軸53cの軸線の周りに回動する。これにより、挟持部53aにおいて隣接する挟持片53bおよび挟持片53bが、マスクフレームFの上端における表面および裏面に当接する。さらに、X回転駆動部53rxによって、回転軸53cの軸線の周りにおける挟持部53aの角度位置を設定する。これにより、隣接して対向する挟持片53bおよび挟持片53bの先端においては、凸部53eが、マスクフレームFの表面および裏面における上端付近にそれぞれ当接する。これにより、挟持部53aがマスクフレームFの上端を挟持する状態となる。 In this state, the X rotation driver 53 rx rotates the rotation shaft 53 c around the axis of the rotation shaft 53 c. Thereby, the pinching pieces 53b and the pinching pieces 53b adjacent to each other in the pinching portion 53a abut on the front and back surfaces of the upper end of the mask frame F. Further, the angular position of the holding portion 53a around the axis of the rotation shaft 53c is set by the X rotation driving portion 53rx. As a result, at the tips of the sandwiching piece 53b and the sandwiching piece 53b which are adjacent and opposed to each other, the convex part 53e abuts near the upper end of the front surface and the rear surface of the mask frame F. As a result, the holding portion 53a holds the upper end of the mask frame F.
 この状態で、X回転駆動部53rxにおいて、X駆動部によってX回転軸を回動して、X位置規制部をX方向に移動させる。これにより、回転軸53cをX方向に駆動する。このとき、回転軸53cにおけるX方向の駆動を、ストック下支持部51,52におけるX方向の駆動と同期する。これにより、ストックされた状態におけるマスクフレームFのX方向の位置を設定することが可能となる。
 なお、回転軸53cにおける軸線方向(X方向)の駆動範囲として、YZ平面内の位置が後述する取り出し上支持部58hとずれた位置とされる。これにより、回転軸53cおよび挟持部53aが取り出し上支持部58hに干渉しない範囲に設定される。
In this state, in the X rotation driving unit 53rx, the X rotation axis is rotated by the X driving unit to move the X position regulating unit in the X direction. Thereby, the rotating shaft 53c is driven in the X direction. At this time, the drive in the X direction on the rotating shaft 53 c is synchronized with the drive in the X direction on the stock lower support portions 51 and 52. This makes it possible to set the position of the mask frame F in the X direction in the stocked state.
As a drive range in the axial direction (X direction) of the rotation shaft 53c, the position in the YZ plane is shifted from the takeout upper support portion 58h described later. As a result, the rotation shaft 53c and the holding portion 53a are set in a range that does not interfere with the upper support portion 58h.
 ストック上支持部53において、ストック上支持部53の駆動系であるX回転駆動部53rxのモータおよびX駆動部のXモータが、ストック室(チャンバ)50の外側に配置される。したがって、回転軸53cの軸線の周りにおける挟持部53aの角度位置の調整は、いずれも、ストック室(チャンバ)50の外側からおこなわれる。また、回転軸53cの軸線と平行な方向における挟持部53aの位置調整も、ストック室(チャンバ)50の外側からおこなわれる。これにより、ストック上支持部53の駆動系から発生したゴミがストック室(チャンバ)50内に拡散(落下)することを防止できる。 In the stock upper support portion 53, a motor of an X rotation drive portion 53rx which is a drive system of the stock upper support portion 53 and an X motor of the X drive portion are disposed outside the stock chamber (chamber) 50. Therefore, the adjustment of the angular position of the sandwiching portion 53a around the axis of the rotating shaft 53c is performed from the outside of the stock chamber (chamber) 50. Further, the position adjustment of the holding portion 53a in the direction parallel to the axis of the rotating shaft 53c is also performed from the outside of the stock chamber (chamber) 50. Thereby, the dust generated from the drive system of the stock upper support portion 53 can be prevented from diffusing (falling) into the stock chamber (chamber) 50.
 ストック上支持部54とストック上支持部53とは、左右方向であるY方向において並ぶように配置されている。ストック上支持部54とストック上支持部53とは、図3に示すように、マスクフレームFの中心線(Z方向、重力方向)に対して、略対称な構成を有するように設けられている。 The stock upper support portion 54 and the stock upper support portion 53 are arranged side by side in the Y direction which is the left-right direction. The stock upper support portion 54 and the stock upper support portion 53 are provided so as to have a substantially symmetrical configuration with respect to the center line (Z direction, gravity direction) of the mask frame F, as shown in FIG. .
 ストック上支持部54は、複数の挟持部54aを有する。複数の挟持部54aは、マスクフレームFの上端付近を挟持して支持する。特に、複数の挟持部54aは、マスクフレームFの上端における左右方向(Y方向)の両端となる位置にある角部付近を挟持して支持する。
 また、ストック上支持部54は、X回転駆動部54rxを有する。X回転駆動部54rxは、挟持部54aをマスク面(ZY平面)に垂直な略水平方向(X方向)に駆動する。X回転駆動部54rxは、挟持部54aを駆動してX方向に位置調整が可能である。X回転駆動部54rxは、また、挟持部54aをマスク面に略平行なYZ面内で回動する。X回転駆動部54rxは、挟持部54aによるマスクフレームFの係止および解放を可能とする。
The stock upper support portion 54 has a plurality of sandwiching portions 54 a. The plurality of sandwiching portions 54 a sandwich and support the vicinity of the upper end of the mask frame F. In particular, the plurality of sandwiching portions 54a sandwich and support the vicinity of the corner portions at positions which are both ends in the left-right direction (Y direction) at the upper end of the mask frame F.
In addition, the stock upper support portion 54 includes an X rotation drive portion 54rx. The X rotation drive unit 54rx drives the holding unit 54a in a substantially horizontal direction (X direction) perpendicular to the mask surface (ZY plane). The X rotation drive unit 54 rx can adjust the position in the X direction by driving the holding unit 54 a. The X rotation drive unit 54rx also rotates the holding unit 54a in the YZ plane substantially parallel to the mask surface. The X rotation driving unit 54rx enables locking and releasing of the mask frame F by the holding unit 54a.
 ストック上支持部54は、図3に示すように、X方向に延在する回転軸54cを有する。回転軸54cの先端には挟持部54aが設けられる。挟持部54aは、複数の挟持片54b,54bを有する。複数の挟持片54b,54bは、ストックされたマスクフレームFの端部において表面および裏面のそれぞれに当接する。
 複数の挟持片54b,54bは、X方向に延在する回転軸54cに離間して配置される。これらの挟持片54b、54bは、回転軸54cの軸線方向における互いの距離がほぼマスクフレームFの厚さと等しいかやや大きな状態とされる。複数の挟持片54b、54bは、いずれも、それらの基端が回転軸54cの径方向となるYZ方向に互いに平行状態に固定されている。
As shown in FIG. 3, the stock upper support portion 54 has a rotation axis 54c extending in the X direction. A pinching portion 54a is provided at the tip of the rotary shaft 54c. The sandwiching portion 54a has a plurality of sandwiching pieces 54b and 54b. The plurality of sandwiching pieces 54b, 54b abut on the front surface and the rear surface at the end of the stocked mask frame F, respectively.
The plurality of sandwiching pieces 54b, 54b are disposed apart from each other on a rotating shaft 54c extending in the X direction. The holding pieces 54b, 54b are arranged such that the distance between them in the axial direction of the rotating shaft 54c is substantially equal to or slightly larger than the thickness of the mask frame F. The plurality of sandwiching pieces 54b, 54b are both fixed in parallel to each other in the YZ direction in which the base ends thereof are in the radial direction of the rotation shaft 54c.
 また、回転軸54cの基端側には、X回転駆動部54rxが接続される。回転軸54cは、X方向に延在する。回転軸54cの基端側は、ストック室50の外側まで延長するように配置される。
 回転軸54cと、挟持片54b,54bとは、互いに略直交するように交差して配置される。回転軸54cの先端側は、挟持片54b,54bに接続される。
Further, an X rotation drive unit 54rx is connected to the base end side of the rotation shaft 54c. The rotation axis 54c extends in the X direction. The proximal end side of the rotating shaft 54 c is arranged to extend to the outside of the stock chamber 50.
The rotating shaft 54c and the holding pieces 54b, 54b are disposed to intersect with each other so as to be substantially orthogonal to each other. The tip end side of the rotating shaft 54c is connected to the holding pieces 54b and 54b.
 挟持片54b,54bは、回転軸54cに、例えば、4個設けられる。隣接する挟持片54bと挟持片54bとの間には、一枚のマスクフレームFを保持可能である。したがって、挟持部54aは、三枚のマスクフレームFを保持可能である。挟持片54bの個数は、ストック載置部52AにストックされるマスクフレームFのうち、支持溝51aおよび支持溝52aによって移動されるマスクフレームFの枚数に対応している。 For example, four holding pieces 54b and 54b are provided on the rotation shaft 54c. A single mask frame F can be held between the adjacent clamping pieces 54b and 54b. Therefore, the sandwiching portion 54a can hold three mask frames F. The number of holding pieces 54b corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 52A.
 回転軸54cが配置されるZ方向における高さは、ストック下支持部51およびストック下支持部52のZ方向の動作によって昇降するマスクフレームFの上端が当接しない高さ位置とされる。挟持片54b,54bの長さ寸法は、ストック下支持部51およびストック下支持部52のZ方向の動作によってマスクフレームFが昇降しても、マスクフレームFの上端を支持可能な長さである。これにより、挟持部54aは、ストック下支持部51およびストック下支持部52のZ方向の動作によってマスクフレームFが昇降しても、マスクフレームFの上端を支持する状態を維持できる。 The height in the Z direction at which the rotation shaft 54c is disposed is a height position at which the upper end of the mask frame F, which is raised and lowered by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction, does not abut. The length dimension of the holding pieces 54b, 54b is such that the upper end of the mask frame F can be supported even if the mask frame F is raised or lowered by the operation of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction. . Thus, even if the mask frame F moves up and down by the movement of the stock lower support portion 51 and the stock lower support portion 52 in the Z direction, the sandwiching portion 54a can maintain the upper end of the mask frame F.
 挟持片54b,54bの先端には、互いに対向する内側面に位置するように凸部54eが設けられていてもよい。この凸部54eは、マスクフレームFを挟持する際に、互いに対向する凸部54eがマスクフレームFの表面および裏面にそれぞれ点接触する。互いに対向する凸部54eは、後述する凸部14Ad,14Aeと同様に、マスクフレームFを挟持するように互いに近接する方向に付勢可能である。 At the tips of the holding pieces 54b, 54b, a convex portion 54e may be provided so as to be positioned on the inner side facing each other. When sandwiching the mask frame F, the convex portions 54 e in point contact with the front surface and the back surface of the mask frame F, respectively. The convex portions 54e facing each other can be urged in the direction in which they approach each other so as to sandwich the mask frame F, similarly to the convex portions 14Ad and 14Ae described later.
 回転軸54cは、図3に示すように、マスクフレームFの面に垂直な略水平方向(X方向)に延在して、回転軸54cの軸線の周りに回動可能とされる。回転軸54cは、回転軸54cの軸線となる方向(X方向)に進退可能とされる。
 回転軸54cの先端には、挟持部54aとなる挟持片54b、54bが回転軸54cの径方向に突出するように、回転軸54cの軸線となる方向に複数接続固定される。回転軸54cの基端には、X回転駆動部54rxのモータが接続され、回転軸54cを回転軸54cの軸線の周りに駆動可能とされている。
The rotation shaft 54c extends in a substantially horizontal direction (X direction) perpendicular to the surface of the mask frame F, as shown in FIG. 3, and is rotatable around the axis of the rotation shaft 54c. The rotating shaft 54c can be advanced and retracted in a direction (X direction) which is an axis of the rotating shaft 54c.
A plurality of sandwiching pieces 54b, 54b to be the sandwiching part 54a are connected and fixed to the tip of the rotary shaft 54c in the direction of the axis of the rotary shaft 54c so as to protrude in the radial direction of the rotary shaft 54c. The motor of the X rotation drive unit 54rx is connected to the base end of the rotation shaft 54c, and the rotation shaft 54c can be driven around the axis of the rotation shaft 54c.
 また、X回転駆動部54rxにおいては、例えば、図示しないモータがマスク面(YZ面)と平行に延在する平板部に固定される。X回転駆動部54rxにおいては、この平板部をX駆動部によって駆動することで、回転軸54cが、X方向に駆動される。挟持部54aは、回転軸54cがX方向に駆動された際に、回転軸54cと一体としてX方向に駆動される。 Further, in the X rotation drive unit 54rx, for example, a motor (not shown) is fixed to a flat plate portion extending in parallel with the mask surface (YZ surface). In the X rotation drive unit 54rx, the rotation shaft 54c is driven in the X direction by driving the flat plate unit by the X drive unit. The sandwiching portion 54a is driven in the X direction integrally with the rotary shaft 54c when the rotary shaft 54c is driven in the X direction.
 図示しないX駆動部は、ステッピングモータとされるXモータと、このXモータによって回転駆動されX方向に延在するX回転軸と、X回転軸に螺合されてこのX回転軸の軸線方向に相対移動可能なX位置規制部と、このX位置規制部およびXモータの移動をX方向に規制するX規制部と、を有する。 An X drive unit (not shown) is screwed with an X motor, which is a stepping motor, an X rotation shaft rotationally driven by the X motor and extending in the X direction, and in the axial direction of the X rotation shaft. It has an X position restricting portion capable of relative movement, and an X restricting portion that restricts the movement of the X position restricting portion and the X motor in the X direction.
 図示しないX駆動部においては、XモータによってX回転軸を回動することで、このX回転軸の先端が回動可能な状態でX回転軸の先端に接続されたX位置規制部が、平板部に対してX方向に移動する。X規制部によって、X位置規制部の移動方向が規制されている。図示しない平板部は、ストック室(チャンバ)50の側部とされている。ストック上支持部54は、挟持部54aの位置をX方向の自由度にて調整可能であり、ストック室(チャンバ)50の側部に固定されている。 In an X drive unit (not shown), the X position regulation unit connected to the tip of the X rotation shaft is flat when the tip of the X rotation shaft can be turned by turning the X rotation shaft by the X motor. Move in the X direction with respect to the part. The movement direction of the X position regulating unit is regulated by the X regulating unit. The flat plate portion (not shown) is a side portion of the stock chamber (chamber) 50. The stock upper support portion 54 can adjust the position of the holding portion 54 a with the freedom in the X direction, and is fixed to the side of the stock chamber (chamber) 50.
 X回転駆動部54rxのX駆動部は、X方向に移動可能である。X回転駆動部54rxのX駆動部におけるX方向の動作は、X回転駆動部53rxのX駆動部、ストック下支持部51のストック位置交換駆動部51b,51c,51d,51e,51f、および、ストック下支持部52のストック位置交換駆動部52b,52c,52d,52e,52fにおけるX方向の動作と同期可能である。X回転駆動部54rx、X回転駆動部53rx、ストック位置交換駆動部51b,51c,51d,51e,51f、および、ストック位置交換駆動部52b,52c,52d,52e,52fが同期してX方向に動作することにより、ストックしているマスクフレームFを、X方向に移動する。
 なお、X回転駆動部54rxにおいては、挟持部54aをX方向に往復動可能、かつ、回転軸54cの周りに回動可能な構成であれば、上記の構成に限定されるものではない。
The X drive unit of the X rotation drive unit 54rx is movable in the X direction. The operation in the X direction in the X drive portion of the X rotation drive portion 54rx is the X drive portion of the X rotation drive portion 53rx, stock position exchange drive portions 51b, 51c, 51d, 51e, 51f of the stock lower support portion 51, and stock It is possible to synchronize with the operation in the X direction in the stock position exchange driving units 52b, 52c, 52d, 52e, 52f of the lower support unit 52. The X rotation driving unit 54rx, the X rotation driving unit 53rx, the stock position exchange driving units 51b, 51c, 51d, 51e and 51f, and the stock position exchange driving units 52b, 52c, 52d, 52e and 52f are synchronized in the X direction. By operating, the stock mask frame F is moved in the X direction.
The X rotation drive unit 54rx is not limited to the above configuration as long as the holding unit 54a can be reciprocated in the X direction and can be rotated around the rotation shaft 54c.
 ストック上支持部54においては、まず、X回転駆動部54rxによって回転軸54cを回転軸54cの軸線の周りに駆動する。これにより、ストック上支持部54においては、回転軸54cの軸線の周りで挟持部54aの角度位置を設定する。挟持部54aの角度は、外部からストック位置に搬入されるマスクフレームFと干渉しない位置に設定する。ここで、挟持部54aが、外部からストック位置に搬入されるマスクフレームFと干渉しない位置としては、例えば、挟持片54bが、回転軸54cに対してZ方向の上向きとされることができる。 In the stock upper support portion 54, first, the rotation shaft 54c is driven around the axis of the rotation shaft 54c by the X rotation drive portion 54rx. Thereby, in the stock upper support portion 54, the angular position of the holding portion 54a is set around the axis of the rotation shaft 54c. The angle of the holding portion 54a is set to a position that does not interfere with the mask frame F carried to the stock position from the outside. Here, as a position at which the holding portion 54a does not interfere with the mask frame F carried to the stock position from the outside, for example, the holding piece 54b can be upward in the Z direction with respect to the rotation shaft 54c.
 次に、X回転駆動部54rxにおいて、X駆動部のXモータによってX回転軸を回動して、X位置規制部をX方向に移動させる。これにより、回転軸54cをX方向に駆動して挟持部54aのX方向の位置を設定し、所定の挟持片54b,54bの間にマスクフレームFの上端が位置するようにする。 Next, in the X rotation driving unit 54rx, the X rotation axis is rotated by the X motor of the X driving unit to move the X position regulating unit in the X direction. Thus, the rotary shaft 54c is driven in the X direction to set the position of the holding portion 54a in the X direction so that the upper end of the mask frame F is positioned between the predetermined holding pieces 54b and 54b.
 この状態で、X回転駆動部54rxによって回転軸54cを軸線周りに回動する。これにより、挟持部54aにおいて隣接する挟持片54bおよび挟持片54bが、マスクフレームFの上端における表面および裏面に当接する。さらに、X回転駆動部54rxによって、回転軸54cの軸線の周りにおける挟持部54aの角度位置を設定する。これにより、隣接して対向する挟持片54bおよび挟持片54bにおける先端において、凸部54eが、マスクフレームFの表面および裏面における上端付近にそれぞれ当接する。これにより、挟持部54aがマスクフレームFの上端を挟持する状態となる。 In this state, the rotation shaft 54c is rotated about the axis by the X rotation drive unit 54rx. As a result, the pinching pieces 54b and the pinching pieces 54b adjacent to each other in the pinching portion 54a contact the front and back surfaces of the upper end of the mask frame F. Furthermore, the angular position of the sandwiching portion 54a around the axis of the rotating shaft 54c is set by the X rotation drive portion 54rx. As a result, at the tips of the sandwiching piece 54b and the sandwiching piece 54b that are adjacent and opposed to each other, the convex part 54e abuts near the upper end of the front surface and the rear surface of the mask frame F. As a result, the holding portion 54a holds the upper end of the mask frame F.
 この状態で、X回転駆動部53rxにおいて、X駆動部によってX回転軸を回動して、X位置規制部をX方向に移動させる。これにより、回転軸54cをX方向に駆動する。このとき、X方向における回転軸54cの駆動を、X方向におけるストック下支持部51,52の駆動と同期する。これにより、ストックされた状態におけるマスクフレームFのX方向の位置を設定する。
 なお、回転軸54cにおける軸線方向(X方向)の駆動範囲としては、YZ平面内の位置が後述する取り出し上支持部58hとずれた位置とされる。これにより、回転軸54cおよび挟持部54aが取り出し上支持部58hに干渉しない範囲に設定される。
In this state, in the X rotation driving unit 53rx, the X rotation axis is rotated by the X driving unit to move the X position regulating unit in the X direction. Thereby, the rotating shaft 54c is driven in the X direction. At this time, the drive of the rotation shaft 54c in the X direction is synchronized with the drive of the stock lower support portions 51 and 52 in the X direction. Thereby, the position of the mask frame F in the X direction in the stocked state is set.
In addition, as a drive range in the axial direction (X direction) of the rotation shaft 54c, the position in the YZ plane is a position shifted from the takeout upper support portion 58h described later. Thus, the rotation shaft 54c and the holding portion 54a are set in a range that does not interfere with the removal upper support portion 58h.
 ストック上支持部54においては、X回転駆動部54rxのモータおよびX駆動部のXモータがストック室(チャンバ)50の外側位置に配置されている。したがって、挟持部54aにおける回転軸54cの軸線周りの角度位置調整は、ストック室(チャンバ)50の外側からおこなわれる。また、挟持部54aにおける回転軸54cの軸線方向の位置調整は、ストック室(チャンバ)50の外側からおこなわれる。これにより、ストック上支持部54の駆動系から発生したゴミがストック室(チャンバ)50内に拡散(落下)することを防止できる。 In the stock upper support portion 54, the motor of the X rotation drive portion 54rx and the X motor of the X drive portion are disposed at the outside position of the stock chamber (chamber) 50. Therefore, the angular position adjustment around the axis of the rotating shaft 54c in the holding portion 54a is performed from the outside of the stock chamber (chamber) 50. Further, position adjustment in the axial direction of the rotating shaft 54 c in the holding portion 54 a is performed from the outside of the stock chamber (chamber) 50. Thereby, it is possible to prevent the dust generated from the drive system of the stock upper support portion 54 from diffusing (falling) into the stock chamber (chamber) 50.
 駆動支持部55には、図3,図4に示すように、駆動溝51Ab,駆動溝52Abに対応するX方向の位置にあるマスクフレームFが載置可能とされる。駆動支持部55は、載置されたマスクフレームFの下端に当接して、このマスクフレームFを面方向(Y方向)に駆動可能とする。駆動支持部55は、駆動ローラ55aと、駆動ローラ55aを回転駆動する回転駆動部55bと、を有する。
 なお、図4においては、駆動支持部55のうち図示を省略した構成があり、駆動ローラ55aのみを示している。
As shown in FIGS. 3 and 4, on the drive support portion 55, the mask frame F at the position in the X direction corresponding to the drive groove 51Ab and the drive groove 52Ab can be mounted. The drive support portion 55 abuts on the lower end of the placed mask frame F, and can drive the mask frame F in the surface direction (Y direction). The drive support unit 55 includes a drive roller 55 a and a rotation drive unit 55 b that rotationally drives the drive roller 55 a.
In addition, in FIG. 4, there is the structure which abbreviate | omitted illustration among the drive support parts 55, and only the drive roller 55a is shown.
 具体的には、駆動支持部55は、図3および図4に示すストック載置部51A,52Aにおいて、右から2本目、つまり、左から3本目のレーン(ストック位置)となる駆動溝51Abおよび駆動溝52Abを結んだ線上に配置される。駆動支持部55においては、載置溝51Aaおよび載置溝52Aaに載置されたマスクフレームFの下端と、複数の駆動ローラ55aに載置されたマスクフレームFの下端とが、いずれも同じ高さ(Z方向)位置となるように、駆動ローラ55aの上端位置が設定されている。 Specifically, in the stock placement portions 51A and 52A shown in FIGS. 3 and 4, the drive support portion 55 is the drive groove 51Ab and the second drive lane from the right, that is, the third lane (stock position) from the left. It arrange | positions on the line which connected drive groove 52Ab. In the drive support portion 55, the lower end of the mask frame F placed in the placement groove 51Aa and the placement groove 52Aa and the lower end of the mask frame F placed on the plurality of drive rollers 55a all have the same height. The upper end position of the drive roller 55a is set so as to be the vertical (Z direction) position.
 駆動支持部55は、ストック室(チャンバ)50内のY方向に複数設けられる。駆動支持部55においては、複数の駆動ローラ55aの軸線方向が平行となるように設けられる。駆動支持部55は、ストック載置部51Aとストック載置部52Aとの間に位置する。駆動支持部55は、マスクフレームFをY方向に移動可能とされている。図3において、3つの駆動支持部55が示されているが、この個数に限るものではない。 A plurality of drive support portions 55 are provided in the Y direction in the stock chamber (chamber) 50. In the drive support portion 55, axial directions of the plurality of drive rollers 55a are provided in parallel. The drive support portion 55 is located between the stock placement portion 51A and the stock placement portion 52A. The drive support portion 55 is capable of moving the mask frame F in the Y direction. Although three drive support portions 55 are shown in FIG. 3, the number of drive support portions 55 is not limited to this.
 さらに、駆動支持部55においては、Y方向におけるストック載置部51Aとストック載置部52Aとの間の位置に加えて、Y方向におけるストック載置部51Aとストック載置部52Aとの外側となる位置に駆動支持部55を設けてもよい。この場合でも、駆動支持部55においては、図のストック載置部51A,52Aにおいて、右から2本目、つまり、左から3本目の載置溝51Aaおよび載置溝52Aaを結んだ直線を延長した直線上に位置するように駆動ローラ55aを配置する。 Furthermore, in the drive support portion 55, in addition to the position between the stock placement portion 51A and the stock placement portion 52A in the Y direction, the outside of the stock placement portion 51A and the stock placement portion 52A in the Y direction The drive support portion 55 may be provided at the following position. Even in this case, in the drive support portion 55, in the stock placement portions 51A and 52A of the figure, a straight line connecting the second placement groove 51Aa and the placement groove 52Aa from the right, that is, the third from the left, is extended. The drive roller 55a is disposed to be positioned on a straight line.
 Y方向における駆動支持部55の配置間隔は、Y方向におけるマスクフレームFの長さ寸法よりも小さく設定される。さらに、Y方向における駆動支持部55の配置間隔は、マスクフレームFの重量、位置制御の精度等によって適宜設定することができる。
 複数の駆動支持部55は、搬送されるマスクフレームFの位置に対応して、適宜同期して駆動制御されるようになっている。
The arrangement interval of the drive support portions 55 in the Y direction is set smaller than the length dimension of the mask frame F in the Y direction. Furthermore, the arrangement interval of the drive support portions 55 in the Y direction can be appropriately set according to the weight of the mask frame F, the accuracy of position control, and the like.
The plurality of drive support portions 55 are driven and controlled appropriately in synchronization with the position of the mask frame F to be transported.
 駆動ローラ55aは、載置溝51Aaが複数配置される方向であるなX方向に延在する軸線を有する。駆動ローラ55aは、駆動溝51Abおよび駆動溝52Abを結んだ直線と直交するX方向に延在する軸線を有する。
 回転駆動部55bは、駆動ローラ55aを回転駆動可能に支持する。回転駆動部55bの頂部には、駆動ローラ55aの上端が突出した状態とされる。
The drive roller 55a has an axis extending in the X direction, which is the direction in which the plurality of placement grooves 51Aa are disposed. The drive roller 55a has an axis extending in the X direction orthogonal to a straight line connecting the drive groove 51Ab and the drive groove 52Ab.
The rotation drive unit 55 b supports the drive roller 55 a so as to be rotationally drivable. The upper end of the drive roller 55a is projected from the top of the rotation drive unit 55b.
 回転駆動部55bには回転駆動モータ55eが接続される。回転駆動モータ55eは、ストック室50の底部50a外側に固定される。なお、回転駆動モータ55eは、ストック室50の側部50b外側に固定されてもよい。 A rotation drive motor 55e is connected to the rotation drive unit 55b. The rotary drive motor 55 e is fixed to the outside of the bottom 50 a of the stock chamber 50. The rotary drive motor 55 e may be fixed to the outside of the side portion 50 b of the stock chamber 50.
 駆動ローラ55aは、ストック室50に対してXY面内における位置が固定されている。駆動ローラ55aは、支持溝51a,52aに載置されたマスクフレームFがX方向へ移動する際に、この支持溝51a,52aの上に載置されたマスクフレームFが干渉しない高さ位置に設けられる。 The drive roller 55 a is fixed in position in the XY plane with respect to the stock chamber 50. The driving roller 55a is at such a height position that the mask frame F placed on the support grooves 51a and 52a does not interfere when the mask frame F placed on the support grooves 51a and 52a moves in the X direction. Provided.
 複数の回転駆動部55bにおいては、それぞれの駆動ローラ55aの駆動が互いに同期され、複数の駆動ローラ55aが同時に当接している1枚のマスクフレームFをY方向に駆動可能とされている。 In the plurality of rotation driving units 55b, the driving of the respective driving rollers 55a is synchronized with each other, and it is possible to drive one mask frame F in which the plurality of driving rollers 55a are simultaneously in contact in the Y direction.
 搬送上支持部56は、図3,図4に示すように、ストック室50の頂部50cに設けられる。搬送上支持部56は、Y方向においてストック上支持部53およびストック上支持部54の間の位置に設けられる。搬送上支持部56は、マスクフレームFがY方向に移動される際にマスクフレームFの上端を傾かないように支持する。搬送上支持部56は、ストック支持部51,52,53,54によって、ストックされているマスクフレームFをX方向に移動する際に、このマスクフレームFの支持を解除可能とされる。 The transport upper support portion 56 is provided at the top 50 c of the stock chamber 50 as shown in FIGS. 3 and 4. The transport upper support portion 56 is provided at a position between the stock upper support portion 53 and the stock upper support portion 54 in the Y direction. The transport upper support portion 56 supports the upper end of the mask frame F so as not to tilt when the mask frame F is moved in the Y direction. The transport upper support portion 56 can release the support of the mask frame F when moving the stock mask frame F in the X direction by the stock support portions 51, 52, 53, 54.
 搬送上支持部56は、図3,図4に示すように、上マグネット部56aと、挟持部56b、56cと、Z駆動部56fと、を有する。
 上マグネット部56aは、駆動ローラ55aに対応するX方向の位置に設けられる。上マグネット部56aは、Z方向に昇降可能とされる。上マグネット部56aは、Y方向に延在する。
 挟持部56b、56cは、上マグネット部56aに対してX方向およびY方向に離間する。挟持部56b、56cは、上マグネット部56aと一体としてZ方向に昇降可能とされる。
 Z駆動部56fは、これら上マグネット部56aおよび挟持部56b、56cをZ方向に往復動作する。これにより、Z駆動部56fは、マスクフレームFの係止および解放を可能とする。
As shown in FIGS. 3 and 4, the transport upper support portion 56 includes an upper magnet portion 56a, sandwiching portions 56b and 56c, and a Z drive portion 56f.
The upper magnet portion 56a is provided at a position in the X direction corresponding to the drive roller 55a. The upper magnet portion 56a is vertically movable in the Z direction. The upper magnet portion 56a extends in the Y direction.
The holding portions 56 b and 56 c are separated from the upper magnet portion 56 a in the X direction and the Y direction. The holding portions 56b and 56c can be moved up and down in the Z direction as an integral part of the upper magnet portion 56a.
The Z drive unit 56f reciprocates the upper magnet unit 56a and the holding units 56b and 56c in the Z direction. Thus, the Z drive unit 56f enables locking and releasing of the mask frame F.
 図3に示すように、挟持部56bおよび挟持部56cは、左右方向であるY方向において並ぶように配置されている。挟持部56bおよび挟持部56cは、それぞれ上マグネット部56aの両端に位置する。挟持部56bおよび挟持部56cは、上マグネット部56aの中心線(Z方向、重力方向)に対して、略対称な構成を有するように設けられている。 As shown in FIG. 3, the sandwiching portion 56 b and the sandwiching portion 56 c are arranged side by side in the Y direction which is the left-right direction. The holding portion 56 b and the holding portion 56 c are respectively located at both ends of the upper magnet portion 56 a. The holding portion 56 b and the holding portion 56 c are provided so as to have a substantially symmetrical configuration with respect to the center line (Z direction, gravity direction) of the upper magnet portion 56 a.
 挟持部56bには、上マグネット部56aよりもZ方向下側に突出する複数の挟持片56b1,56b1が設けられる。複数の挟持片56b1,56b1は、ストックされたマスクフレームFの端部において表面および裏面のそれぞれに当接可能である。複数の挟持片56b1,56b1は、X方向に延在する接続部56b2に設けられる。
 挟持片56b1,56b1は、互いに平行状態とされる。挟持片56b1,56b1におけるX方向の距離は、マスクフレームFの厚さとほぼ同等かやや大きく設定される。挟持片56b1,56b1は、接続部56b2の延在するX方向に離間して配置される。
The sandwiching portion 56b is provided with a plurality of sandwiching pieces 56b1 and 56b1 that project downward in the Z direction with respect to the upper magnet portion 56a. The plurality of sandwiching pieces 56b1 and 56b1 can be in contact with the front and back surfaces at the end of the stocked mask frame F, respectively. The plurality of sandwiching pieces 56b1 and 56b1 are provided at the connecting portion 56b2 extending in the X direction.
The holding pieces 56b1 and 56b1 are in parallel with each other. The distance in the X direction between the holding pieces 56b1 and 56b1 is set to be substantially equal to or slightly larger than the thickness of the mask frame F. The sandwiching pieces 56b1 and 56b1 are spaced apart in the extending X direction of the connection portion 56b2.
 接続部56b2は、図3に示すように、マスクフレームFの面に垂直な略水平方向(X方向)に延在する。また、接続部56b2の上側は、Z支持部56dにおけるY方向の一方の端部に接続される。Z支持部56dは、ストック室50の外側まで延在する。
 Z支持部56dの上端側は、Z駆動部56fに接続される。Z支持部56dは、Z駆動部56fによってZ方向に昇降可能とされる。
The connection portion 56b2 extends in a substantially horizontal direction (X direction) perpendicular to the surface of the mask frame F, as shown in FIG. Further, the upper side of the connection portion 56b2 is connected to one end of the Z support portion 56d in the Y direction. The Z support portion 56 d extends to the outside of the stock chamber 50.
The upper end side of the Z support portion 56d is connected to the Z drive portion 56f. The Z support portion 56d can be moved up and down in the Z direction by the Z drive portion 56f.
 複数の挟持片56b1,56b1の基端は、いずれも接続部56b2に接続固定されている。複数の挟持片56b1,56b1は、互いに平行状態とされている。挟持片56b1,56b1は、例えば、4個設けられる。隣接する挟持片56b1と挟持片56b1との間には、一枚のマスクフレームFを保持可能である。挟持片56b1の個数は、ストック載置部52AにストックされるマスクフレームFのうち、支持溝51aおよび支持溝52aによって移動されるマスクフレームFの枚数に対応する。 The proximal ends of the plurality of sandwiching pieces 56b1 and 56b1 are all connected and fixed to the connection portion 56b2. The plurality of holding pieces 56b1 and 56b1 are in parallel with each other. For example, four holding pieces 56b1 and 56b1 are provided. A single mask frame F can be held between the adjacent holding pieces 56b1 and 56b1. The number of holding pieces 56b1 corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 52A.
 挟持片56b1,56b1の長さ寸法は、ストック下支持部51,52のZ方向動作によってマスクフレームFが移動した際に、マスクフレームFの上端が上マグネット部56aおよび接続部56b2に当接しないようになっている。 When the mask frame F is moved by the operation of the stock lower support portions 51 and 52 in the Z direction of the holding pieces 56b1 and 56b1, the upper end of the mask frame F does not abut the upper magnet portion 56a and the connection portion 56b2 It is supposed to be.
 挟持片56b1,56b1の先端には、互いに対向する内側面に位置するように凸部56eが設けられてもよい。この凸部56eは、マスクフレームFを挟持する際に、互いに対向する凸部56eがマスクフレームFの表面および裏面にそれぞれ点接触する。互いに対向する凸部56eは、後述する凸部14Ad,14Aeと同様にマスクフレームFを挟持するように互いに近接する方向に付勢されることが可能である。 At the tips of the holding pieces 56b1 and 56b1, convex portions 56e may be provided so as to be positioned on the inner side surfaces facing each other. When sandwiching the mask frame F, the convex portions 56 e face each other in point contact with the front surface and the back surface of the mask frame F. The convex portions 56e facing each other can be urged in the direction in which they approach each other so as to sandwich the mask frame F, similarly to the convex portions 14Ad and 14Ae described later.
 挟持部56cには、上マグネット部56aよりもZ方向下側に突出する複数の挟持片56c1,56c1が設けられる。複数の挟持片56c1,56c1は、ストックされたマスクフレームFの端部において表面および裏面のそれぞれに当接可能である。複数の挟持片56c1,56c1は、X方向に延在する接続部56c2に設けられる。
 挟持片56c1,56c1は、互いに平行状態とされる。挟持片56c1,56c1におけるX方向の距離は、ほぼマスクフレームFの厚さと等しいかやや大きな状態とされる。挟持片56c1,56c1は、接続部56c2の延在するX方向に離間して配置される。
The sandwiching portion 56c is provided with a plurality of sandwiching pieces 56c1 and 56c1 that project downward in the Z direction with respect to the upper magnet portion 56a. The plurality of sandwiching pieces 56c1 and 56c1 can be in contact with the front surface and the back surface at the end of the stocked mask frame F, respectively. The plurality of sandwiching pieces 56c1 and 56c1 are provided at a connecting portion 56c2 extending in the X direction.
The holding pieces 56c1 and 56c1 are in parallel with each other. The distance in the X direction between the holding pieces 56c1 and 56c1 is substantially equal to or slightly larger than the thickness of the mask frame F. The sandwiching pieces 56c1 and 56c1 are spaced apart in the extending X direction of the connection portion 56c2.
 接続部56c2は、図3に示すように、マスクフレームFの面に垂直な略水平方向(X方向)に延在する。また、接続部56c2の上側は、Y方向における接続部56b2の接続されたZ支持部56dの端部と反対側の端部となる位置においてZ支持部56dに接続される。
 接続部56c2は、接続部56b2およびZ支持部56dと一体としてZ方向に昇降可能とされる。挟持片56b1,56b1および挟持片56c1,56c1は、いずれもZ方向に延在している。このため、接続部56c2、接続部56b2およびZ支持部56dがZ方向に昇降した場合でも、挟持片56b1,56b1および挟持片56c1,56c1の延在する方向は変化しない。
The connection portion 56c2 extends in a substantially horizontal direction (X direction) perpendicular to the surface of the mask frame F, as shown in FIG. Further, the upper side of the connection portion 56c2 is connected to the Z support portion 56d at a position opposite to the end portion of the Z support portion 56d connected to the connection portion 56b2 in the Y direction.
The connecting portion 56c2 is movable in the Z direction integrally with the connecting portion 56b2 and the Z support portion 56d. The clamping pieces 56b1 and 56b1 and the clamping pieces 56c1 and 56c1 all extend in the Z direction. Therefore, even when the connection portion 56c2, the connection portion 56b2 and the Z support portion 56d move up and down in the Z direction, the extending directions of the holding pieces 56b1 and 56b1 and the holding pieces 56c1 and 56c1 do not change.
 挟持片56c1,56c1の基部は、いずれも接続部56c2に接続固定されている。複数の挟持片56c1,56c1は、互いに平行状態とされる。挟持片56c1,56c1は、例えば、4個設けられる。隣接する挟持片56c1と挟持片56c1との間には、一枚ずつのマスクフレームFを保持可能である。挟持片56c1の個数は、ストック載置部52AにストックされるマスクフレームFのうち、支持溝51aおよび支持溝52aによって移動されるマスクフレームFの枚数に対応する。 The bases of the sandwiching pieces 56c1 and 56c1 are both connected and fixed to the connection portion 56c2. The plurality of sandwiching pieces 56c1 and 56c1 are in parallel with each other. For example, four sandwiching pieces 56c1 and 56c1 are provided. The mask frame F can be held one by one between the pinching piece 56c1 and the pinching piece 56c1 adjacent to each other. The number of holding pieces 56c1 corresponds to the number of mask frames F moved by the support grooves 51a and the support grooves 52a among the mask frames F stocked in the stock placement portion 52A.
 挟持片56c1,56c1の長さ寸法は、ストック下支持部51,52のZ方向動作によってマスクフレームFが移動した際に、マスクフレームFの上端が上マグネット部56aおよび接続部56c2に当接しないようになっている。 When the mask frame F is moved by the operation of the stock lower support portions 51 and 52 in the Z direction of the holding pieces 56c1 and 56c1, the upper end of the mask frame F does not abut the upper magnet portion 56a and the connection portion 56c2 It is supposed to be.
 挟持片56c1,56c1の先端にも、互いに対向する内側面に位置するように凸部56eが設けられてもよい。この凸部56eは、マスクフレームFを挟持する際に、互いに対向する凸部56eがマスクフレームFの表面および裏面にそれぞれ点接触する。互いに対向する凸部56eは、後述する凸部14Ad,14Aeと同様にマスクフレームFを挟持するように互いに近接する方向に付勢されることが可能である。 The protrusions 56e may be provided on the tips of the holding pieces 56c1 and 56c1 so as to be positioned on the inner side surfaces facing each other. When sandwiching the mask frame F, the convex portions 56 e face each other in point contact with the front surface and the back surface of the mask frame F. The convex portions 56e facing each other can be urged in the direction in which they approach each other so as to sandwich the mask frame F, similarly to the convex portions 14Ad and 14Ae described later.
 Z駆動部56fは、ストック室50の外部に配置される。Z支持部56dは、密閉状態を維持するようにストック室50の頂部50cを貫通する。Z支持部56dは、Z駆動部56fによって伸退可能に配置される。
 また、Z駆動部56fにおいては、Z支持部56dおよび挟持部56b,56cが一体としてZ方向に進退可能とされている。Z駆動部56fにおいては、Z支持部56dおよび挟持部56b,56cが、互いの姿勢を変えないようにZ方向に進退可能とされている。
The Z drive unit 56 f is disposed outside the stock chamber 50. The Z support portion 56d penetrates the top 50c of the stock chamber 50 so as to maintain the sealed state. The Z support portion 56d is disposed so as to be extensible and retractable by the Z drive portion 56f.
Further, in the Z drive unit 56f, the Z support unit 56d and the holding units 56b and 56c are integrally made movable in the Z direction. In the Z drive unit 56f, the Z support unit 56d and the holding units 56b and 56c can be advanced and retracted in the Z direction so as not to change their postures.
 Z駆動部56fは、ストック上支持部53,54およびストック下支持部51,52がX方向に動作する際に、あらかじめ搬送上支持部56の上マグネット部56aおよび挟持部56b,56cをZ方向上向きに移動する。これにより、上マグネット部56a、挟持片56b1および挟持片56c1が、X方向に移動されるマスクフレームFと干渉しない。
 これにより、一枚あるいは複数枚のマスクフレームFが、ストック下支持部51,52の支持溝51a,52aによって下端部のスライダF5を支持され、同時に、ストック上支持部53,54によって上端部を支持された状態で、Z駆動部56f、上マグネット部56a、挟持片56b1および挟持片56c1によって、この一枚あるいは複数枚のマスクフレームFがX方向に移動される。
The Z drive unit 56f causes the upper magnet unit 56a and the sandwiching units 56b and 56c of the transport upper support unit 56 to move in the Z direction in advance when the upper stock support units 53 and 54 and the lower stock support units 51 and 52 operate in the X direction. Move upwards. Thereby, the upper magnet portion 56a, the holding piece 56b1 and the holding piece 56c1 do not interfere with the mask frame F moved in the X direction.
As a result, one or a plurality of mask frames F are supported by the sliders F5 at the lower end by the support grooves 51a and 52a of the stock lower support portions 51 and 52, and at the same time, the upper end is moved by the upper stock support 53 and 54. In the supported state, the one or a plurality of mask frames F are moved in the X direction by the Z drive unit 56f, the upper magnet unit 56a, the sandwiching piece 56b1 and the sandwiching piece 56c1.
 同様に、まず、ストック上支持部53,54およびストック下支持部51,52がX方向に移動される。これにより、支持溝51a,52aによって下端部のスライダF5を支持されたマスクフレームFがX方向に移動される。
 その後、Z駆動部56fを駆動することにより、上マグネット部56aおよび挟持部56b,56cがZ方向下向きに移動される。これにより、マスクフレームFが搬送上支持部56によって再度支持される。
Similarly, first, the upper stock support portions 53 and 54 and the lower stock support portions 51 and 52 are moved in the X direction. Thus, the mask frame F supported at the lower end portion of the slider F5 by the support grooves 51a and 52a is moved in the X direction.
Thereafter, by driving the Z drive unit 56f, the upper magnet unit 56a and the sandwiching units 56b and 56c are moved downward in the Z direction. Thereby, the mask frame F is again supported by the transport upper support portion 56.
 上マグネット部56aは、マスクフレームFの搬送方向と平行なY方向に延在する複数のマグネットを有する。上マグネット部56aのマグネットは、後述するようにマスクフレームFの上端に設けられた上側フレーム支持体F6と互いに引き付け合う。また、上マグネット部56aのマグネットは、マスクフレームFの面内方向(YZ面内方向)と略直交する鉛直面内(XZ面内)で磁気回路を形成する。 The upper magnet portion 56 a has a plurality of magnets extending in the Y direction parallel to the transport direction of the mask frame F. The magnets of the upper magnet portion 56a attract each other with the upper frame support F6 provided at the upper end of the mask frame F as described later. Further, the magnet of the upper magnet portion 56a forms a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
 上マグネット部56aは、搬送上支持部56のY方向における全長において略同一断面を有するように配置される。上マグネット部56aは、マスクフレームFの上側フレーム支持体F6と互いにXZ面内で形成される磁気回路によって引き付け合う。上マグネット部56aと上側フレーム支持体F6との間で形成される磁気回路は、搬送上支持部56のY方向における全長において形成される。 The upper magnet portion 56 a is arranged to have substantially the same cross section in the entire length of the transport upper support portion 56 in the Y direction. The upper magnet portion 56a attracts the upper frame support F6 of the mask frame F by a magnetic circuit formed in the XZ plane. A magnetic circuit formed between the upper magnet portion 56a and the upper frame support F6 is formed along the entire length of the transport upper support portion 56 in the Y direction.
 搬送上支持部56においては、上マグネット部56aとマスクフレームFとが互いに引き付け合って支持される。このとき、上マグネット部56aとマスクフレームFとが所定のZ方向距離であることと、上マグネット部56aの直下にマスクフレームFの上側フレーム支持体F6が位置することが必要である。 In the transport upper support portion 56, the upper magnet portion 56a and the mask frame F are attracted to each other and supported. At this time, it is necessary that the upper magnet portion 56a and the mask frame F have a predetermined Z-direction distance, and that the upper frame support F6 of the mask frame F be positioned directly below the upper magnet portion 56a.
 ストック室50の内部において、駆動ローラ55aによって駆動されたマスクフレームFがY方向に移動される際に、搬送上支持部56においては、上マグネット部56aによってマスクフレームFの上側を引きつけて支持する。これにより、マスクフレームFをY方向に移動できる。同時に、搬送上支持部56においては、載置溝51Aa,52Aaによって下端部のスライダF5を支持されたマスクフレームFも、マスクフレームFの上側を支持する。 When the mask frame F driven by the drive roller 55a is moved in the Y direction inside the stock chamber 50, the upper magnet portion 56a attracts and supports the upper side of the mask frame F in the transport upper support portion 56. . Thereby, the mask frame F can be moved in the Y direction. At the same time, in the transport upper support portion 56, the mask frame F supported at the lower end portion of the slider F5 by the mounting grooves 51Aa and 52Aa also supports the upper side of the mask frame F.
 また、ストック上支持部53,54およびストック下支持部51,52によってマスクフレームFをX方向に移動する際には、Z駆動部56fによって、Z支持部56dを上昇させる。これにより、マスクフレームFの上端と上マグネット部56aとの距離を離間させる。これにより、上マグネット部56aと上側フレーム支持体F6とによってXZ面内で形成される磁気回路を解除する。これにより、上マグネット部56aがマスクフレームFの上部を引き付けて支持することを解除する。 When the mask frame F is moved in the X direction by the stock upper support portions 53 and 54 and the stock lower support portions 51 and 52, the Z support portion 56d is raised by the Z drive portion 56f. Thereby, the distance between the upper end of the mask frame F and the upper magnet portion 56a is separated. Thus, the magnetic circuit formed in the XZ plane by the upper magnet portion 56a and the upper frame support F6 is released. Thereby, the upper magnet portion 56a releases the attraction and support of the upper portion of the mask frame F.
 また、マスクフレームFのX方向への移動が終了した後には、Z駆動部56fによって、Z支持部56dを下降させる。これにより、マスクフレームFの上端と上マグネット部56aとの距離を近接させる。これにより、上マグネット部56aと上側フレーム支持体F6とによってXZ面内で形成される磁気回路を再形成する。これにより、上マグネット部56aがマスクフレームFを引き付けて支持することを開始する。 Further, after the movement of the mask frame F in the X direction is completed, the Z driving unit 56 f lowers the Z support unit 56 d. Thereby, the distance between the upper end of the mask frame F and the upper magnet portion 56a is reduced. Thereby, the magnetic circuit formed in the XZ plane by the upper magnet portion 56a and the upper frame support F6 is reformed. Thus, the upper magnet portion 56a starts attracting and supporting the mask frame F.
 搬送上支持部56の上マグネット部56aとマスクフレームFの上側フレーム支持体F6とは、Y方向の全長でほぼ同じように磁気回路をXZ面内で形成する。これにより、上マグネット部56aと上側フレーム支持体F6との間では、互いに引き合う力をY方向における上側フレーム支持体F6の全長で均等に設定できる。このため、マスクフレームFの傾斜防止を確実におこなえる。 The upper magnet portion 56a of the transport upper support portion 56 and the upper frame support F6 of the mask frame F form a magnetic circuit in the XZ plane in substantially the same manner as the entire length in the Y direction. As a result, between the upper magnet portion 56a and the upper frame support F6, it is possible to uniformly set the attraction force to each other over the entire length of the upper frame support F6 in the Y direction. Therefore, the inclination of the mask frame F can be prevented reliably.
 密閉手段58としては、図1,図3,図4に示すように、搬入出口58bと、マスク取出充填口58cとを有する。搬入出口58bは、ストック室50と成膜室4とを接続する仕切りバルブ58aを有する。搬入出口58bは、ストック室50のY方向となる側部50bの位置に設けられる。マスク取出充填口58cは、ストック室50のX方向となる側部50bの位置に設けられる。 As the sealing means 58, as shown in FIG.1, FIG.3, FIG.4, it has the carrying-in / out port 58b and the mask taking-out filling port 58c. The loading / unloading port 58 b has a dividing valve 58 a that connects the stock chamber 50 and the film forming chamber 4. The loading / unloading port 58 b is provided at the position of the side portion 50 b in the Y direction of the stock chamber 50. The mask take-out and filling port 58 c is provided at the position of the side portion 50 b in the X direction of the stock chamber 50.
 搬入出口58bは、図1,図3に示すように、仕切りバルブ58aを介して成膜室(チャンバ)4に接続される。搬入出口58bは、マスク取出充填口58cを閉状態としてストック室50を外部と密閉状態とする搬入出口58bは、チャンバ4内の成膜位置に対するマスク交換時には開放される。これにより、搬入出口58bがチャンバ4と連通する。搬入出口58bを通って、マスクフレームFが搬送される。また、搬入出口58bが閉塞されてチャンバ4を密閉状態とした場合には、ストック室50内の未使用および使用済みのマスクフレームFがストック室50外部へ搬入および搬出される。 The loading / unloading port 58b is connected to the film forming chamber (chamber) 4 via the dividing valve 58a, as shown in FIGS. The loading / unloading port 58b closes the mask take-out / filling port 58c and brings the stock chamber 50 into a sealed state with the outside. The loading / unloading port 58b is opened at the time of mask replacement with respect to the film forming position in the chamber 4. Thereby, the loading / unloading port 58 b communicates with the chamber 4. The mask frame F is transported through the loading / unloading port 58b. When the loading / unloading port 58 b is closed to seal the chamber 4, the unused and used mask frame F in the stock chamber 50 is carried in and out of the stock chamber 50.
 マスク取出充填口58cは、図3に示すように、ストック室50が外部に連結した状態と、ストック室50が外部に密閉した状態と、を切り替えできる。
 マスクフレームFを外部に搬送する場合には、マスク取出充填口58cが開放される。この場合、搬入出口58bが閉状態とされてチャンバ4を密閉する。
 さらに、マスクフレームFをチャンバ4に搬送する場合には、マスク取出充填口58cが閉塞される。この場合、搬入出口58bが開状態とされてチャンバ4と連通される。
As shown in FIG. 3, the mask take-out and filling port 58c can switch between a state in which the stock chamber 50 is connected to the outside and a state in which the stock chamber 50 is sealed to the outside.
When the mask frame F is transported to the outside, the mask take-out and filling port 58c is opened. In this case, the loading / unloading port 58 b is closed to seal the chamber 4.
Furthermore, when the mask frame F is transported to the chamber 4, the mask take-out and filling port 58 c is closed. In this case, the loading / unloading port 58 b is opened and communicated with the chamber 4.
 具体的には、マスク取出充填口58cは、ストック室50の側部50bのうちX方向となる位置に設けられた板状の開閉部58dと、開閉部58dの下部に接続されてY方向に延在する揺動軸58eと、揺動軸58eに接続されて揺動軸58eを揺動駆動する揺動駆動部58fと、を有する。 Specifically, the mask take-out / filling port 58c is connected to a plate-like opening / closing portion 58d provided at a position in the X direction of the side portions 50b of the stock chamber 50 and a lower portion of the opening / closing portion 58d in the Y direction. It has a swing shaft 58e which extends, and a swing drive portion 58f which is connected to the swing shaft 58e and swings and drives the swing shaft 58e.
 開閉部58dには、図3に示すように、Y方向の両端となる下端側の位置に取り出し支持部58gが設けられる。開閉部58dには、取り出し支持部58gの上側となる位置でY方向における両端となる位置に取り出し上支持部58hが設けられる。また、平板状の開閉部58dの周縁となる位置には、マスクフレームFに当接して支持する複数の支持凸部58kが設けられる。複数の支持凸部58kは、いずれも開閉部58dにおけるストック室50の内側に位置する。複数の支持凸部58kは、いずれもX方向に突出して設けられる。
 支持凸部58kは、マスクフレームFの周縁となる位置に対応するように開閉部58dにおいて配置される位置が設定される。
As shown in FIG. 3, the opening / closing portion 58d is provided with a takeout support portion 58g at the lower end side which is both ends in the Y direction. In the opening and closing portion 58d, a takeout upper support 58h is provided at a position that is the upper side of the takeout support 58g and at both ends in the Y direction. In addition, a plurality of support convex portions 58k that are in contact with and supported by the mask frame F are provided at positions that become the peripheral edge of the flat opening / closing portion 58d. The plurality of support convex portions 58k are all located inside the stock chamber 50 in the opening and closing portion 58d. The plurality of support convex portions 58k are provided so as to protrude in the X direction.
The positions at which the support convex portions 58 k are disposed at the opening and closing portion 58 d are set to correspond to the positions to be the peripheral edge of the mask frame F.
 ストック室50から外部にマスクフレームFを搬出する際に、開閉部58dは、揺動軸58eを中心として回動する。この際、支持凸部58k、取り出し支持部58gおよび取り出し上支持部58hは、搬出するマスクフレームFが、開閉部58dと同期して回動するように支持する。また、外部からストック室50にマスクフレームFを搬入する際に、支持凸部58k、取り出し支持部58gおよび取り出し上支持部58hは、溝支持基部51b,52bおよび挟持部53a,34がマスクフレームFを支持する動作に影響を及ぼさない位置に設けられる。 When the mask frame F is carried out from the stock chamber 50 to the outside, the opening / closing portion 58 d rotates around the swinging shaft 58 e. At this time, the support convex portion 58k, the takeout support portion 58g and the takeout upper support portion 58h support the mask frame F to be carried out so as to rotate in synchronization with the opening and closing portion 58d. Further, when the mask frame F is carried into the stock chamber 50 from the outside, the support convex portion 58k, the takeout support portion 58g and the takeout upper support portion 58h are the groove support bases 51b, 52b and the holding portions 53a, 34 of the mask frame F Provided in a position that does not affect the operation of supporting the
 取り出し支持部58gは、図3に示すように、開閉部58dのストック室50の内側でX方向に突出する。取り出し支持部58gの上側には、取り出し支持溝58gaが設けられる。取り出し支持溝58gaは、マスクフレームFの下端を載置可能である。取り出し支持部58gにおいて、取り出し支持溝58gaは、開閉部58dがストック室50を閉塞した際に、後述するように、ストック載置部51A,52Aにおける載置溝51Aa,52Aaと対応するように配置されている。 As shown in FIG. 3, the takeout support portion 58g protrudes in the X direction inside the stock chamber 50 of the opening / closing portion 58d. A takeout support groove 58ga is provided on the upper side of the takeout support portion 58g. The lower end of the mask frame F can be placed on the takeout support groove 58ga. In the takeout support portion 58g, the takeout support groove 58ga is arranged to correspond to the placement grooves 51Aa and 52Aa in the stock placement portions 51A and 52A when the opening and closing portion 58d closes the stock chamber 50, as described later. It is done.
 取り出し支持溝58gaが載置溝51Aa,52Aaと対応するように配置されるとは、ストック下支持部51,52が、取り出し支持溝58gaに載置されたマスクフレームFと載置溝51Aa,52Aaに載置されたマスクフレームFとを同時に支持できることを意味する。
 具体的には、X方向およびZ方向における取り出し支持溝58gaと載置溝51Aa,52Aaとの位置関係が、ストック下支持部51,52が駆動された際に、載置溝51Aa,52Aaに載置されたマスクフレームFと、取り出し支持溝58gaに載置されたマスクフレームFとを、同時にストック下支持部51,52で支持可能なX方向およびZ方向の位置とされる。
 このとき、取り出し支持溝58gaと載置溝51Aa,52Aaとは、Z方向における同じ位置(高さ)に設定される。また、取り出し支持溝58gaと、隣接した載置溝51AaとのX方向の間隔は、ストック載置部51Aにおける互いに隣接した載置溝51Aaと載置溝51AaとのX方向の間隔にほぼ等しい。このように、取り出し支持溝58gaは載置溝51Aaに近接した配置とされる。
When the takeout support grooves 58ga are arranged to correspond to the placement grooves 51Aa, 52Aa, the stock lower support portions 51, 52 are placed on the mask frame F placed in the takeout support grooves 58ga and the placement grooves 51Aa, 52Aa It means that the mask frame F placed on can be supported at the same time.
Specifically, the positional relationship between the takeout support groove 58ga and the placement grooves 51Aa, 52Aa in the X direction and the Z direction is such that when the stock lower support portions 51, 52 are driven, the placement grooves 51Aa, 52Aa are placed. The mask frame F placed and the mask frame F placed in the takeout support groove 58ga are simultaneously positioned in the X and Z directions that can be supported by the stock below support portions 51 and 52.
At this time, the takeout support groove 58ga and the placement grooves 51Aa and 52Aa are set to the same position (height) in the Z direction. The distance between the takeout support groove 58ga and the adjacent placement groove 51Aa in the X direction is substantially equal to the distance between the placement groove 51Aa and the placement groove 51Aa adjacent to each other in the stock placement portion 51A. Thus, the takeout support groove 58ga is disposed close to the placement groove 51Aa.
 取り出し上支持部58hは、図3に示すように、Z軸58h1と、支持片58h2とを有する。Z軸58h1は、開閉部58dにおけるストック室50の内側にもうけられる。Z軸58h1は、X方向に突出する。Z軸58h1は、回動可能に設けられる。支持片58h2は、Z軸58h1におけるストック室50の内側で先端となる位置に設けられる。支持片58h2は、Z軸58h1における径方向の外側に突出して設けられる。支持片58h2は、Z軸58h1周りに回動可能とされる。Z軸58h1は、図示しない回転駆動部により、開閉部58dにおけるストック室50の外側から支持片58h2の角度と位置とを設定可能とされる。 As shown in FIG. 3, the takeout upper support portion 58h has a Z axis 58h1 and a support piece 58h2. The Z-axis 58h1 is provided inside the stock chamber 50 at the opening / closing portion 58d. The Z axis 58h1 protrudes in the X direction. The Z axis 58h1 is rotatably provided. The support piece 58h2 is provided at a position inside the stock chamber 50 at the tip end of the Z axis 58h1. The support piece 58h2 is provided so as to protrude outward in the radial direction of the Z axis 58h1. The support piece 58h2 is rotatable around the Z axis 58h1. The Z axis 58h1 can set the angle and the position of the support piece 58h2 from the outside of the stock chamber 50 in the opening / closing portion 58d by a rotation drive unit (not shown).
 開閉部58dを揺動する際には、取り出し支持部58gにマスクフレームFの下端が載置される。同時に、開閉部58dを揺動する際には、支持片58h2がZ軸58h1周りに回動して、マスクフレームF上側表面に当接する。これにより、マスクフレームFが開閉部58dと同期して揺動する。また、開閉部58dを揺動する際には、マスクフレームFが、複数の支持凸部58kに当接する。これらにより、マスクフレームFが開閉部58dに支持される。これにより、マスクフレームFが開閉部58dと一体に揺動する。 When swinging the opening and closing portion 58d, the lower end of the mask frame F is placed on the takeout support portion 58g. At the same time, when swinging the open / close portion 58d, the support piece 58h2 pivots around the Z axis 58h1 and abuts on the upper surface of the mask frame F. Thereby, the mask frame F swings in synchronization with the opening and closing portion 58d. Further, when swinging the opening and closing portion 58d, the mask frame F abuts on the plurality of support convex portions 58k. Thus, the mask frame F is supported by the opening and closing portion 58d. Thereby, the mask frame F swings integrally with the opening and closing portion 58d.
 開閉部58dが揺動して、開閉部58dによりマスク取出充填口58cを閉塞する。同時に、開閉部58dが揺動して、マスクフレームFをストック室50に搬入する。その後、搬入されたマスクフレームFを移動して、マスクフレームFを載置溝51Aa,52Aaに載置する。これにより搬入されたマスクフレームFをストック室50にストックする。
 以下、マスク交換手段100によって、マスクフレームFをストック室50にストックする際の動作を説明する。
The opening and closing portion 58d swings, and the opening and closing portion 58d closes the mask take-out and filling port 58c. At the same time, the opening / closing portion 58 d swings to carry the mask frame F into the stock chamber 50. Thereafter, the carried-in mask frame F is moved to place the mask frame F on the placement grooves 51Aa and 52Aa. The mask frame F carried in by this is stocked in the stock room 50.
The operation of stocking the mask frame F in the stock chamber 50 by the mask exchanging means 100 will be described below.
 まず、マスクフレームFを搬入する前においては、マスク交換手段100が搬入搬出状態とされる。マスク交換手段100の搬入搬出状態では、開閉部58dの上面が水平である。これにより、マスク交換手段100の搬入搬出状態では、マスク取出充填口58cが全面開放される。マスク交換手段100は、搬入搬出状態から開閉部58dが揺動してマスク取出充填口58cを閉塞する閉塞状態とされる。マスク交換手段100の搬入搬出状態からマスク取出充填口58cの閉塞が完了するマスク交換手段100の閉塞状態までの間に、ストック上支持部53,54が回転駆動される。ストック上支持部53,54は、挟持片53b,54bがマスクフレームFと干渉しない外向き角度位置まで回動される。これにより、ストック上支持部53,54においては、挟持片53b,54bが退避した状態となる。 First, before the mask frame F is carried in, the mask replacement unit 100 is brought into a carried in / out state. In the loading and unloading state of the mask replacement unit 100, the upper surface of the opening and closing portion 58d is horizontal. Thereby, in the carrying in / out state of the mask replacement means 100, the mask taking out and filling port 58c is entirely opened. The mask replacement unit 100 is put in a closed state in which the opening / closing portion 58d swings from the loading / unloading state to close the mask take-out / filling port 58c. The stock upper support portions 53 and 54 are rotationally driven between the loading and unloading state of the mask replacing unit 100 and the closing state of the mask replacing unit 100 in which the closing of the mask take-out and filling port 58c is completed. The stock upper support portions 53 and 54 are pivoted to an outward angular position where the holding pieces 53 b and 54 b do not interfere with the mask frame F. As a result, in the stock upper support portions 53 and 54, the holding pieces 53b and 54b are retracted.
 また、マスク交換手段100の閉塞状態においては、マスクフレームFの下端が取り出し支持部58gの取り出し支持溝58gaに載置される。なお、マスク交換手段100において、搬入搬出状態から閉塞状態までの間においては、ストック下支持部51,52の溝支持基部51b,52bを駆動して、支持溝51a,52aが、取り出し支持溝58gaおよび載置溝51Aa,52Aaよりも低い位置(Z方向下側位置)とされる。 Further, in the closed state of the mask replacement unit 100, the lower end of the mask frame F is placed on the takeout support groove 58ga of the takeout support portion 58g. In the mask replacement means 100, the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to bring out the support grooves 51ga and 52a from the loading / unloading state to the closed state. And a lower position (a lower position in the Z direction) than the mounting grooves 51Aa and 52Aa.
 この状態で、開閉部58dを揺動してマスク取出充填口58cを閉塞して、マスク交換手段100の閉塞状態とする。閉塞状態においては、マスクフレームFがZ方向に立っている縦位置となる。
 このとき、マスクフレームFの下端における両側となる位置は、それぞれ取り出し支持溝58gaに載置されている。また、マスクフレームFの上端における両側となる位置は、取り出し上支持部58hの支持片58h2に当接している。同時に、マスクフレームFの開閉部58d側が支持凸部58kに当接している。これにより、マスクフレームFが開閉部58dに対して平行に屹立した状態で支持される。
In this state, the opening and closing portion 58d is rocked to close the mask take-out and filling port 58c, and the mask replacement unit 100 is brought into a closed state. In the closed state, the mask frame F is in the vertical position standing in the Z direction.
At this time, positions on both sides of the lower end of the mask frame F are placed on the takeout support grooves 58ga. Further, positions on both sides of the upper end of the mask frame F are in contact with the support piece 58h2 of the takeout upper support portion 58h. At the same time, the opening / closing portion 58d side of the mask frame F is in contact with the support convex portion 58k. Thereby, the mask frame F is supported in a state of standing upright in parallel with the opening and closing portion 58d.
 次いで、ストック上支持部53,54を駆動して、X方向において挟持片53b,54bを開閉部58dに近接させる。挟持片53b,54bは、この挟持片53b,54bによって、取り出し支持溝58gaに載置されたマスクフレームFの上端の両側となる位置を挟持可能な位置までX方向に駆動される。さらに、ストック上支持部53,54を駆動して、挟持片53b,54bをYZ面内で回動させる。挟持片53b,54bは、取り出し支持溝58gaに載置されたマスクフレームFの上端における両側で表面および裏面のそれぞれに当接して挟持可能な位置まで回動される。 Next, the stock upper support portions 53 and 54 are driven to bring the sandwiching pieces 53 b and 54 b close to the opening / closing portion 58 d in the X direction. The holding pieces 53b and 54b are driven by the holding pieces 53b and 54b in the X direction to positions capable of holding positions on both sides of the upper end of the mask frame F placed in the takeout support groove 58ga. Further, the stock upper support portions 53 and 54 are driven to rotate the holding pieces 53b and 54b in the YZ plane. The holding pieces 53b and 54b are rotated to a position where they can be held in contact with the front surface and the rear surface on both sides of the upper end of the mask frame F placed in the takeout support groove 58ga.
 同時に、取り出し上支持部58hにおいて、支持片58h2がZ軸58h1の周りに回動される。これにより、支持片58h2がマスクフレームF上側表面に当接しない角度となる。これにより、マスクフレームFがX方向に移動可能となる。 At the same time, the support piece 58h2 is pivoted around the Z axis 58h1 in the takeout upper support portion 58h. As a result, the support piece 58h2 does not contact the upper surface of the mask frame F at an angle. Thereby, the mask frame F can be moved in the X direction.
 次いで、ストック下支持部51,52において、溝支持基部51b,52bを最も開閉部58dに近接したX方向の位置まで駆動する。これにより、開閉部58dの下端の両側となる位置に配置された取り出し支持溝58gaおよび取り出し支持溝58gaを結んだ直線と、支持溝51a,52aの延在する方向に引いた直線と、が一致する。 Next, in the stock lower support portions 51 and 52, the groove support bases 51b and 52b are driven to the position closest to the opening / closing portion 58d in the X direction. Thus, a straight line connecting the takeout support groove 58ga and the takeout support groove 58ga arranged at positions on both sides of the lower end of the opening / closing portion 58d coincides with a straight line drawn in the extending direction of the support grooves 51a and 52a. Do.
 さらに、最も開閉部58dに近接した支持溝51a,52aと取り出し支持溝58gaとがX方向に一致した状態で、ストック下支持部51,52の溝支持基部51b,52bをZ方向に上昇駆動する。これにより、支持溝51a,52aが取り出し支持溝58gaおよび取り出し支持溝58gaを結んだ直線よりも高いZ方向の位置となる。これにより、マスクフレームFの下端を支持溝51a,52aに載置した支持状態となる。このとき、マスクフレームFの下端は、取り出し支持溝58gaから上方に離間する。 Furthermore, with the support grooves 51a, 52a closest to the opening / closing portion 58d and the takeout support grooves 58ga aligned in the X direction, the groove support bases 51b, 52b of the stock lower support portions 51, 52 are driven to rise in the Z direction. . As a result, the support grooves 51a and 52a are positioned in the Z direction higher than the straight line connecting the takeout support groove 58ga and the takeout support groove 58ga. As a result, the lower end of the mask frame F is placed in the support grooves 51a and 52a in a supported state. At this time, the lower end of the mask frame F is separated upward from the takeout support groove 58ga.
 なお、溝支持基部51b,52bを上昇駆動するZ方向の距離は、マスクフレームFの上端がストック上支持部53,54の回転軸53c,54cと干渉しない範囲とされる。同時に、溝支持基部51b,52bを上昇駆動するZ方向距離は、マスクフレームFの上端が搬送上支持部56の上マグネット部56aと干渉しない範囲とされる。 The distance in the Z direction in which the groove support bases 51b and 52b are driven to rise is in such a range that the upper end of the mask frame F does not interfere with the rotation shafts 53c and 54c of the stock upper support portions 53 and 54. At the same time, the Z-direction distance for driving the groove support bases 51 b and 52 b upward is a range in which the upper end of the mask frame F does not interfere with the upper magnet portion 56 a of the transport upper support portion 56.
 次いで、ストック下支持部51,52およびストック上支持部53,54をX方向に同期して駆動する。ここで、X方向におけるストック下支持部51,52の移動距離は、ストック上支持部53,54の移動距離に等しくなる。また、X方向におけるストック下支持部51,52の移動距離およびストック上支持部53,54の移動距離は、マスクフレームFを載置溝51Aa,52Aaに載置できるように、X方向における載置溝51Aa,52Aaの位置に対応する位置とされる。 Then, the stock lower support portions 51 and 52 and the stock upper support portions 53 and 54 are driven synchronously in the X direction. Here, the moving distance of the stock lower support portion 51, 52 in the X direction is equal to the moving distance of the stock upper support portion 53, 54. Further, the moving distance of the stock lower support portion 51, 52 in the X direction and the moving distance of the stock upper support portion 53, 54 are set in the X direction so that the mask frame F can be mounted on the mounting grooves 51Aa, 52Aa. The positions correspond to the positions of the grooves 51Aa and 52Aa.
 その後、ストック下支持部51,52において溝支持基部51b,52bを下降するようにZ方向に駆動する。これにより、支持溝51a,52aが載置溝51Aa,52Aaよりも低い位置とされる。すると、溝支持基部51b,52bの下降途中で、マスクフレームFの下端が載置溝51Aa,52Aaに載置される。 Thereafter, in the stock lower support portions 51 and 52, the groove support bases 51b and 52b are driven in the Z direction so as to descend. As a result, the support grooves 51a and 52a are positioned lower than the placement grooves 51Aa and 52Aa. Then, the lower end of the mask frame F is placed on the placement grooves 51Aa and 52Aa while the groove support bases 51b and 52b are being lowered.
 ここで、マスクフレームFの下端を載置する載置溝51Aa,52Aaは、ストック下支持部51,52の駆動範囲であれば適宜選択することができる。例えば、開閉部58dに最も近接したX方向の位置である載置溝51Aa,52AaにマスクフレームFを載置できる。この場合、ストック下支持部51,52およびストック上支持部53,54のX方向における移動距離は、最も短くなる。
 ここでは説明のため、マスク交換手段100において、X方向に移動したマスクフレームFを載置溝51Aa,52Aaに載置した。マスク交換手段100におけるマスクフレームFの移動としては、X方向に移動したマスクフレームFを駆動ローラ55a,55aに載置する場合も含める。駆動ローラ55a,55aは、X方向において駆動溝51Ab,52Abに一致している。
Here, the mounting grooves 51Aa and 52Aa for mounting the lower end of the mask frame F can be appropriately selected as long as it is a driving range of the stock lower support portions 51 and 52. For example, the mask frame F can be mounted on the mounting grooves 51Aa and 52Aa which is the position in the X direction closest to the opening / closing portion 58d. In this case, the moving distance in the X direction of the lower stock support portions 51 and 52 and the upper stock support portions 53 and 54 is shortest.
Here, the mask frame F moved in the X direction is placed on the placement grooves 51Aa and 52Aa in the mask replacement unit 100 for the purpose of description. The movement of the mask frame F in the mask replacement unit 100 includes the case where the mask frame F moved in the X direction is placed on the drive rollers 55a and 55a. The drive rollers 55a, 55a coincide with the drive grooves 51Ab, 52Ab in the X direction.
 また、マスク交換手段100においてマスクフレームFを移動する際に、マスクフレームFの下端を、図3,図4の右から2番目の駆動溝51Ab,52Abに対応した駆動ローラ55a,55aに載置できる。この場合には、マスクフレームFの下端が、載置溝51Aa,52Aaに載置した場合におけるマスクフレームFと同じ高さ位置となる。
 同時に、マスク交換手段100においてマスクフレームFを移動する際に、マスクフレームFの下端を載置溝51Aa,52Aaに載置した場合には、いずれも、搬送上支持部56の上マグネット部56aおよび挟持部56b,56cを下降して、挟持部56b,56cの挟持片56b1,56c1でマスクフレームFにおける上端の両端となる位置を挟持する。これにより、マスクフレームFの上端を挟持部56b,56cの挟持片56b1,56c1で挟持して、ストック上支持部53,54による支持から開放できる。
Further, when moving the mask frame F in the mask exchanging means 100, the lower end of the mask frame F is placed on the drive rollers 55a, 55a corresponding to the second drive grooves 51Ab, 52Ab from the right in FIGS. it can. In this case, the lower end of the mask frame F is at the same height position as the mask frame F in the case where the lower end of the mask frame F is placed on the placement grooves 51Aa and 52Aa.
At the same time, when the lower end of the mask frame F is placed on the placement grooves 51Aa and 52Aa when moving the mask frame F in the mask exchanging means 100, the upper magnet 56a of the transport upper support portion 56 and the upper support 56 are all The holding portions 56b and 56c are lowered, and the holding pieces 56b1 and 56c1 of the holding portions 56b and 56c hold positions at both ends of the upper end of the mask frame F. Thus, the upper end of the mask frame F can be held between the holding portions 56b1 and 56c1 of the holding portions 56b and 56c, and can be released from the support by the stock upper support portions 53 and 54.
 さらに、マスク交換手段100においてマスクフレームFを移動する際に、マスクフレームFの下端を、図3,図4の右から2番目の駆動溝51Ab,52Abに対応した駆動ローラ55a,55aに載置した場合には、マスクフレームFの上端を上マグネット部56aによって支持する。これにより、上端を上マグネット部56aによって支持したマスクフレームFを、駆動支持部55の駆動ローラ55aによって搬送できる。 Furthermore, when moving the mask frame F in the mask exchanging means 100, the lower end of the mask frame F is placed on the drive rollers 55a, 55a corresponding to the second drive grooves 51Ab, 52Ab from the right in FIGS. In this case, the upper end of the mask frame F is supported by the upper magnet portion 56a. As a result, the mask frame F whose upper end is supported by the upper magnet portion 56 a can be transported by the drive roller 55 a of the drive support portion 55.
 マスク交換手段100におけるマスクフレームFの搬出には、上記の手順を逆にしておこなう。 In order to carry out the mask frame F in the mask exchanging means 100, the above procedure is reversed.
 これにより、マスク交換手段100における密閉手段58は、チャンバ4を密閉状態として、未使用および使用済みのマスクフレームFをストック室50と外部との間で搬入すること、および、未使用および使用済みのマスクフレームFをストック室50と外部との間で搬出することができる。 Thereby, the sealing means 58 in the mask replacing means 100 brings the unused and used mask frame F between the stock chamber 50 and the outside with the chamber 4 in a sealed state, and unused and used. Mask frame F can be carried out between the stock chamber 50 and the outside.
 搬送手段60は、図3に示すように、ストック室50にストックされたマスクフレームFを、ストック室50からチャンバ4内の成膜位置となるマスク室43まで搬送する。搬送手段60は、搬送駆動部65と、搬送上支持部66と、を有する。
 搬送駆動部65は、マスクフレームFの搬送経路に沿って設けられる。搬送駆動部65は、マスクフレームF上部を支持する。搬送上支持部66は、マスクフレームF上部を支持する。
The transport means 60 transports the mask frame F stocked in the stock chamber 50 from the stock chamber 50 to the mask chamber 43 serving as the film forming position in the chamber 4 as shown in FIG. The transport means 60 has a transport drive unit 65 and a transport upper support portion 66.
The transport drive unit 65 is provided along the transport path of the mask frame F. The transport drive unit 65 supports the upper portion of the mask frame F. The transport upper support portion 66 supports the upper portion of the mask frame F.
 搬送駆動部65は、図3に示すように、マスクフレームFを支持する。このとき、搬送駆動部65は、マスクフレームFの下端のスライダF5に当接する。また、搬送駆動部65は、マスクフレームFを面方向(Y方向)に駆動可能とする駆動ローラ65aと、駆動ローラ65aを回転駆動する回転駆動部65bと、を有する。 The transport drive unit 65 supports the mask frame F as shown in FIG. At this time, the transport driving unit 65 abuts on the slider F5 at the lower end of the mask frame F. Further, the conveyance drive unit 65 includes a drive roller 65 a that can drive the mask frame F in the surface direction (Y direction), and a rotation drive unit 65 b that rotationally drives the drive roller 65 a.
 搬送駆動部65は、ストック室50から成膜位置となるマスク室43におけるマスクフレームFの搬送経路に沿って複数設けられる。これにより、搬送駆動部65は、マスクフレームFを持続的に移動可能とされる。なお、マスクフレームFの搬送経路における搬送駆動部65の配置間隔は、Y方向におけるマスクフレームFの長さ寸法よりも小さく設定される。マスクフレームFの搬送経路における搬送駆動部65の配置間隔は、マスクフレームFの重量、位置制御の精度等によってさらに短く設定されてもよい。
 複数の搬送駆動部65は、搬送されるマスクフレームFの位置に対応して、適宜同期して駆動制御されるようになっている。
A plurality of transport driving units 65 are provided along the transport path of the mask frame F in the mask chamber 43 from the stock chamber 50 to the film forming position. Thus, the transport drive unit 65 can move the mask frame F continuously. The arrangement interval of the transport driving unit 65 in the transport path of the mask frame F is set smaller than the length dimension of the mask frame F in the Y direction. The arrangement interval of the transport driving unit 65 in the transport path of the mask frame F may be set shorter according to the weight of the mask frame F, the accuracy of position control, and the like.
The plurality of transport driving units 65 are controlled to be appropriately synchronized in response to the position of the mask frame F to be transported.
 駆動ローラ65aは、マスクフレームFの搬送経路と直交するX方向に延在する軸線を有する。
 回転駆動部65bは、駆動ローラ65aを回転駆動する。搬送駆動部65の頂部において、駆動ローラ65aの上端が突出した状態とされる。駆動ローラ65aは、いずれもチャンバ50,4の内側に配置される。回転駆動部65bは、いずれもチャンバ50,4の外側に配置されることが好ましい。
The drive roller 65 a has an axis extending in the X direction orthogonal to the transport path of the mask frame F.
The rotation drive unit 65 b rotationally drives the drive roller 65 a. At the top of the conveyance drive unit 65, the upper end of the drive roller 65a is in a protruding state. The drive roller 65 a is disposed inside the chambers 50 and 4. It is preferable that the rotary drive unit 65 b be disposed outside the chambers 50 and 4.
 搬送上支持部66は、搬送上支持部56の上マグネット部56aとほぼ同等の構成を有する。搬送上支持部66は、上側フレーム支持体F6と互いに引き付け合うマグネットを有する。搬送上支持部66のマグネットは、マスクフレームFの面内方向(YZ面内方向)と略直交する鉛直面内(XZ面内)で磁気回路を形成する。これにより、搬送上支持部66は、搬送中のマスクフレームF上部を支持する。 The transport upper support portion 66 has substantially the same configuration as the upper magnet portion 56 a of the transport upper support portion 56. The upper transport support 66 has a magnet that attracts the upper frame support F6. The magnets of the transport upper support portion 66 form a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F. Thus, the transport upper support portion 66 supports the upper portion of the mask frame F being transported.
 搬送上支持部66は、マスクフレームF上端に設けられた上側フレーム支持体F6と互いに引き付け合う複数のマグネットを有する。搬送上支持部66は、マスクフレームFの面内方向(YZ面内方向)と略直交する鉛直面内(XZ面内)で磁気回路を形成する複数のマグネットを有する。搬送上支持部66の複数のマグネットは、マスクフレームFの搬送方向と平行なY方向に延在する。 The transport upper support portion 66 has a plurality of magnets attracting each other to the upper frame support F6 provided at the upper end of the mask frame F. The transport upper support portion 66 has a plurality of magnets forming a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F. The plurality of magnets of the transport upper support portion 66 extend in the Y direction parallel to the transport direction of the mask frame F.
 搬送上支持部66は、搬送上支持部66のY方向における全長において略同一となる断面形状を有する。搬送上支持部66は、搬送上支持部66のY方向における全長において、マスクフレームFの上側フレーム支持体F6と互いにXZ面内で形成される磁気回路がY方向に略同一となる。これにより、搬送上支持部66と上側フレーム支持体F6とは、磁気回路によってY方向に略均一に引き付け合う。 The transport upper support portion 66 has a cross-sectional shape that is substantially the same in the entire length of the transport upper support portion 66 in the Y direction. In the transport upper support portion 66, the magnetic circuit formed in the XZ plane with the upper frame support F6 of the mask frame F is substantially the same in the Y direction over the entire length of the transport upper support portion 66 in the Y direction. As a result, the transport upper support portion 66 and the upper frame support F6 are attracted substantially uniformly in the Y direction by the magnetic circuit.
 搬送上支持部66は、マスクフレームFと所定のZ方向の距離を有する状態で、搬送上支持部66とマスクフレームFとが互いに引き付け合う。これにより、搬送上支持部66は、マスクフレームFを支持する。また、搬送上支持部66の直下となる搬送経路にマスクフレームFの上側フレーム支持体F6が位置した状態で、搬送上支持部66とマスクフレームFとが互いに引き付け合う。これにより、搬送上支持部66は、マスクフレームFを支持する。 The transport upper support 66 and the mask frame F attract each other with the transport upper support 66 having a predetermined distance in the Z direction from the mask frame F. Thus, the transport upper support portion 66 supports the mask frame F. Further, in a state where the upper frame support F6 of the mask frame F is positioned in the transport path directly below the transport upper support portion 66, the transport upper support portion 66 and the mask frame F attract each other. Thus, the transport upper support portion 66 supports the mask frame F.
 搬送上支持部66は、ストック室50からマスク室43までの搬送経路において、駆動ローラ65a,65a等によって駆動されたマスクフレームFをY方向に移動する。この際、搬送経路に沿って延在する搬送上支持部66によって、マスクフレームFの上側を引きつけて倒れないようにする。つまり、駆動ローラ65a,65aによってマスクフレームFの下端部が支持されるとともに、搬送上支持部66によってマスクフレームFの上側が支持された状態で、マスクフレームFを搬送する。 The transport upper support portion 66 moves the mask frame F driven by the drive rollers 65 a and 65 a in the Y direction in the transport path from the stock chamber 50 to the mask chamber 43. At this time, the upper side of the mask frame F is drawn by the upper transport support portion 66 extending along the transport path so as not to fall down. That is, the lower end portion of the mask frame F is supported by the drive rollers 65 a and 65 a, and the mask frame F is transported in a state where the upper side of the mask frame F is supported by the transport upper support portion 66.
 以下、本実施形態のスパッタリング装置1のマスク交換手段100によるマスク交換手順を説明する。 Hereinafter, the mask replacement procedure by the mask replacement unit 100 of the sputtering apparatus 1 of the present embodiment will be described.
 図5A~図5Eは、本実施形態におけるスパッタリング装置におけるマスク交換手順を示す模式平面図である。図6A~図6Fは、本実施形態におけるスパッタリング装置におけるマスク交換手順を示す模式平面図である。図7A~図7Eは、本実施形態におけるスパッタリング装置におけるマスク交換手順を示す模式平面図である。
 本実施形態のスパッタリング装置1のマスク交換手段100において、マスク交換をおこなう際には、次の状態を想定する。
 まず、図5Aに示すように、成膜室4のマスク室43にはマスクフレームFAが配置される。マスクフレームFAは、使用中である。成膜室4では、スパッタリングによる成膜がおこなわれる。同時に、成膜室4Bのマスク室43にはマスクフレームFBが配置される。マスクフレームFBは、使用中である。成膜室4Bでは、スパッタリングによる成膜がおこなわれる。
5A to 5E are schematic plan views showing a mask replacement procedure in the sputtering apparatus in the present embodiment. 6A to 6F are schematic plan views showing the mask replacement procedure in the sputtering apparatus in the present embodiment. 7A to 7E are schematic plan views showing a mask replacement procedure in the sputtering apparatus in the present embodiment.
In mask exchange means 100 of sputtering apparatus 1 of the present embodiment, the following state is assumed when performing mask exchange.
First, as shown in FIG. 5A, a mask frame FA is disposed in the mask chamber 43 of the film forming chamber 4. The mask frame FA is in use. In the film forming chamber 4, film formation by sputtering is performed. At the same time, a mask frame FB is disposed in the mask chamber 43 of the film forming chamber 4B. The mask frame FB is in use. In the film forming chamber 4B, film formation by sputtering is performed.
 この状態で、図5Bに示すように、ストック室50に、成膜室4で用いる未使用のマスクフレームFCを搬入する。
 マスクフレームFCをストック室50に搬入するには、まず、図3に示す密閉手段58の開閉部58dを開放状態とする。そして、取り出し支持部58g,58gと取り出し上支持部58h,58hと支持凸部58kとによって、マスクフレームFCが開閉部58dに支持される。
In this state, as shown in FIG. 5B, the unused mask frame FC used in the film forming chamber 4 is carried into the stock chamber 50.
In order to carry the mask frame FC into the stock chamber 50, first, the opening / closing portion 58d of the sealing means 58 shown in FIG. 3 is brought into the open state. The mask frame FC is supported by the opening / closing portion 58d by the removal support portions 58g and 58g, the removal upper support portions 58h and 58h, and the support convex portion 58k.
 このとき、図3に示す搬送上支持部56、ストック上支持部53,54の挟持部53a,54aは、退避状態とされる。退避状態とされた搬送上支持部56は、開閉部58dの揺動にともなったマスクフレームFCの移動に対して干渉しない位置にある。退避状態とされたストック上支持部53,54の挟持部53a,54aは、開閉部58dの揺動にともなったマスクフレームFCの移動に対して干渉しない位置にある。同時に、ストック下支持部51,52の溝支持基部51b,52bは、退避状態とされている。退避状態とされたストック下支持部51,52の溝支持基部51b,52bは、開閉部58dの揺動にともなったマスクフレームFCの移動に対して干渉しない位置にある。
 同時に、仕切りバルブ58aによって、搬入出口58bが閉状態とされる。
At this time, the transport upper support portion 56 and the holding portions 53a and 54a of the stock upper support portions 53 and 54 shown in FIG. 3 are in the retracted state. The transport upper support portion 56 in the retracted state is at a position that does not interfere with the movement of the mask frame FC accompanying the swing of the opening / closing portion 58 d. The holding portions 53a, 54a of the stock upper support portions 53, 54 in the retracted state are at positions where they do not interfere with the movement of the mask frame FC accompanying the swing of the opening / closing portion 58d. At the same time, the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are in the retracted state. The groove support bases 51b and 52b of the stock lower support portions 51 and 52 in the retracted state are at positions where they do not interfere with the movement of the mask frame FC accompanying the swing of the opening and closing portion 58d.
At the same time, the loading / unloading port 58b is closed by the partition valve 58a.
 次いで、図3に示す揺動駆動部58fによって揺動軸58eの周りに開閉部58dを揺動させる。これにより、開閉部58dが屹立する。開閉部58dは、マスク取出充填口58cを密閉する。同時に、図5Cに示すように、開閉部58dに支持されたマスクフレームFCを立ち上がった縦状態とする。
 この状態で、まず、ストック上支持部53,54の挟持部53a,54aを回転駆動する。これにより、挟持部53a,54aがマスクフレームFCにおける上端の両側となる位置に当接してマスクフレームFCを挟持する。これにより、ストック上支持部53,54がマスクフレームFCにおける上端の両側となる位置を支持する。
Next, the opening and closing portion 58d is rocked around the rocking shaft 58e by the rocking driving portion 58f shown in FIG. As a result, the opening and closing portion 58d is erected. The opening and closing portion 58d seals the mask take-out and filling port 58c. At the same time, as shown in FIG. 5C, the mask frame FC supported by the opening and closing portion 58d is brought into a vertical state in which the mask frame FC is raised.
In this state, first, the sandwiching portions 53a and 54a of the stock upper support portions 53 and 54 are rotationally driven. As a result, the holding portions 53a and 54a abut on positions on both sides of the upper end of the mask frame FC to hold the mask frame FC. Thus, the stock upper support portions 53 and 54 support positions on both sides of the upper end of the mask frame FC.
 次いで、取り出し上支持部58h,58hを回動して、取り出し上支持部58h,58hによるマスクフレームFCの上端における両側となる位置の支持を解除する。
 この状態で、ストック下支持部51,52の溝支持基部51b,52bを上昇駆動する。これにより、支持溝51a,52aにマスクフレームFCの下端を載置する。同時に、マスクフレームFCの下端を取り出し支持溝58gaから離間させる。
Then, the takeout upper support portions 58h, 58h are pivoted to release the support on the both sides of the upper end of the mask frame FC by the takeout upper support portions 58h, 58h.
In this state, the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to ascend. Thereby, the lower end of the mask frame FC is placed on the support grooves 51a and 52a. At the same time, the lower end of the mask frame FC is taken out of the support groove 58ga.
 次いで、ストック下支持部51,52およびストック上支持部53,54をX方向に同期して駆動する。これにより、マスクフレームFCをX方向に移動する。マスクフレームFCを、図5Dに示すように、開閉部58dに1番近い載置溝51Aa,52Aaに一致したX方向の位置とする。 Then, the stock lower support portions 51 and 52 and the stock upper support portions 53 and 54 are driven synchronously in the X direction. Thereby, the mask frame FC is moved in the X direction. As shown in FIG. 5D, the mask frame FC is set to a position in the X direction that matches the placement grooves 51Aa and 52Aa closest to the opening / closing portion 58d.
 この状態で、ストック下支持部51,52の溝支持基部51b,52bを下降駆動する。これにより、載置溝51Aa,52AaにマスクフレームFCの下端を載置する。さらに、マスクフレームFCの下端から支持溝51a,52aを離間させる。 In this state, the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to descend. Thereby, the lower end of the mask frame FC is placed on the placement grooves 51Aa and 52Aa. Further, the support grooves 51a and 52a are separated from the lower end of the mask frame FC.
 次に、搬送上支持部56を下降させる。これにより、マスクフレームFCの上端を挟持部56b,56cによって支持する。同時に、ストック上支持部53,54によるマスクフレームFCの上端における両側となる位置の支持を解除する。
 ここで、搬送上支持部56の挟持部56b,56cは、取り出し上支持部58hと干渉しないX方向の位置およびYZ面に平行な方向の位置とされる。
Next, the transport upper support portion 56 is lowered. Thereby, the upper end of the mask frame FC is supported by the holding portions 56 b and 56 c. At the same time, the support on the both sides of the upper end of the mask frame FC by the stock upper supports 53 and 54 is released.
Here, the holding portions 56b and 56c of the transport upper support portion 56 are set to a position in the X direction that does not interfere with the takeout upper support portion 58h and a position in a direction parallel to the YZ plane.
 このように、ストック下支持部51,52、ストック上支持部53,54および搬送上支持部56によって、マスクフレームFCをX方向に移動して、マスクフレームFCをレーンチェンジする。このとき、取り出し支持溝58gaに対応するストック位置(レーン)は、空いている。 As described above, the mask frame FC is moved in the X direction by the stock lower support portions 51 and 52, the stock upper support portions 53 and 54, and the transport upper support portion 56 to change the mask frame FC. At this time, the stock position (lane) corresponding to the takeout support groove 58ga is vacant.
 次に、図5Eに示すように、ストック室50に、成膜室4Bで用いる未使用のマスクフレームFDを搬入する。
 このマスクフレームFDの搬入は、上述したマスクフレームFCの搬入と同様におこなう。まず、図3に示す密閉手段58の開閉部58dを開放状態とする。次いで、取り出し支持部58g,58gと取り出し上支持部58h,58hと支持凸部58kとによって、マスクフレームFDを開閉部58dに支持する。
Next, as shown in FIG. 5E, the unused mask frame FD used in the film forming chamber 4B is carried into the stock chamber 50.
The loading of the mask frame FD is performed in the same manner as the loading of the mask frame FC described above. First, the opening and closing portion 58d of the sealing means 58 shown in FIG. 3 is brought into the open state. Next, the mask frame FD is supported on the opening / closing portion 58d by the removal support portions 58g, 58g, the removal upper support portions 58h, 58h, and the support convex portion 58k.
 次いで、図3に示す揺動駆動部58fによって揺動軸58eを揺動させる。これにより開閉部58dによって、マスク取出充填口58cを密閉する。同時に、図6Aに示すように、マスクフレームFDを立設した縦状態とする。 Next, the rocking shaft 58e is rocked by the rocking drive unit 58f shown in FIG. Thereby, the mask taking out filling port 58c is sealed by the opening and closing part 58d. At the same time, as shown in FIG. 6A, the mask frame FD is set upright.
 これにより、マスクフレームFCに隣接するレーンにマスクフレームFDがストックされる。 Thus, the mask frame FD is stocked in the lane adjacent to the mask frame FC.
 上記のように、マスクフレームFCおよびマスクフレームFDをストック室50へ搬入する。さらにマスクフレームFCおよびマスクフレームFDをレーンチェンジして、図6Aに示すように、ストック支持部51~54,取り出し支持部58gで形成される複数レーンのうち、X方向においてスパッタ空間41に近い側である2箇所のレーンにストックする。
 その後、成膜室4におけるスパッタリングによる成膜処理を終了する。
As described above, the mask frame FC and the mask frame FD are carried into the stock chamber 50. Furthermore, the lanes of the mask frame FC and the mask frame FD are changed, and as shown in FIG. 6A, the side closer to the sputtering space 41 in the X direction among the plurality of lanes formed by the stock support portions 51 to 54 and Stock in 2 lanes.
Thereafter, the film forming process by sputtering in the film forming chamber 4 is completed.
 次いで、図6Bに示すように、ストック室50に、成膜室4で用いた使用済のマスクフレームFAを成膜室4から搬入する。 Next, as shown in FIG. 6B, the used mask frame FA used in the film forming chamber 4 is carried into the stock chamber 50 from the film forming chamber 4.
 まず、成膜室4での成膜処理が終了した後、図3に示す開閉部58dによってマスク取出充填口58cを密閉状態とする。その後、図示しない高真空排気手段とガス導入手段とによって、ストック室50内を成膜室4内と同等の真空雰囲気とする。さらに、仕切りバルブ58aによって、成膜室4に連通する搬入出口58bを開状態とする。 First, after the film forming process in the film forming chamber 4 is completed, the mask take-out / filling port 58c is sealed by the opening / closing unit 58d shown in FIG. After that, the inside of the stock chamber 50 is made a vacuum atmosphere equivalent to the inside of the film forming chamber 4 by a high vacuum evacuation unit and a gas introduction unit (not shown). Further, the loading / unloading port 58b in communication with the film forming chamber 4 is opened by the partition valve 58a.
 次いで、成膜室4のマスク室43において、後述するマスクアライメント手段10によって支持されていたマスクフレームFAを搬出する。マスクフレームFAの搬出においては、図3に示す搬送手段60の搬送上支持部66によってマスクフレームFAの上端の上側フレーム支持体F6を支持する。マスクフレームFAの搬出においては、搬送駆動部65の回転駆動部65bによって駆動ローラ65aを駆動する。これにより、マスクフレームFAが、複数の搬送駆動部65および搬送上支持部66によって形成される搬送経路に沿って搬送される。 Next, in the mask chamber 43 of the film forming chamber 4, the mask frame FA supported by the mask alignment means 10 described later is carried out. In carrying out the mask frame FA, the upper frame support F6 at the upper end of the mask frame FA is supported by the upper transport support portion 66 of the transport means 60 shown in FIG. In carrying out the mask frame FA, the drive roller 65 a is driven by the rotation drive unit 65 b of the conveyance drive unit 65. Thereby, the mask frame FA is transported along the transport path formed by the plurality of transport driving units 65 and the transport upper support portion 66.
 搬送されるマスクフレームFAは、図3に示す搬入出口58bを通過する。その後、駆動支持部55の駆動ローラ55aがマスクフレームFAの下端のスライダF5に当接する。同時に、駆動ローラ55aは、回転駆動モータ55eによって回転駆動される。このとき、回転駆動モータ55eによる駆動ローラ55aの回転は、搬送駆動部65の回転駆動部65bによる駆動ローラ65aの回転と同期される。これにより、マスクフレームFAのスライダF5が載置溝51Aa,載置溝52Aaに対応するY方向の位置までマスクフレームFAが搬送される。これにより、マスクフレームFAが駆動溝51Ab,52Abに対応した駆動ローラ55a,55aに載置される。 The transferred mask frame FA passes through the loading / unloading port 58b shown in FIG. Thereafter, the drive roller 55a of the drive support portion 55 abuts on the slider F5 at the lower end of the mask frame FA. At the same time, the drive roller 55a is rotationally driven by the rotational drive motor 55e. At this time, the rotation of the drive roller 55 a by the rotation drive motor 55 e is synchronized with the rotation of the drive roller 65 a by the rotation drive unit 65 b of the conveyance drive unit 65. Thereby, the mask frame FA is transported to the position in the Y direction corresponding to the placement groove 51Aa and the placement groove 52Aa for the slider F5 of the mask frame FA. Thereby, the mask frame FA is mounted on the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab.
 このとき、搬送上支持部56が搬送上支持部66に連続して搬送経路が形成される。これにより、搬送上支持部56の上マグネット部56aによりマスクフレームFAの上端が支持される。また、マスクフレームFAの搬送中は、仕切りバルブ58aによって、成膜室4に連通する搬入出口58bの開状態を維持する。マスクフレームFAが搬入出口58bを通過した後に、搬入出口58bを閉状態とする。 At this time, the transport upper support portion 56 is continuous with the transport upper support portion 66 to form a transport path. Thus, the upper magnet portion 56 a of the transport upper support portion 56 supports the upper end of the mask frame FA. Further, while the mask frame FA is being transported, the open state of the loading / unloading port 58b in communication with the film forming chamber 4 is maintained by the partition valve 58a. After the mask frame FA passes through the loading / unloading port 58b, the loading / unloading port 58b is closed.
 これにより、図6Bに示すように、マスクフレームFCに隣接するレーンにマスクフレームFAがストックされる。 Thus, as shown in FIG. 6B, the mask frame FA is stocked in the lane adjacent to the mask frame FC.
 次に、図6Cに示すように、マスクフレームFA,FC,FDをX方向に1レーンだけレーンチェンジする。 Next, as shown in FIG. 6C, the mask frames FA, FC, and FD are changed by one lane in the X direction.
 まず、ストック上支持部53,54をX方向における開閉部58d側に移動させる。この状態で、マスクフレームFA,FC,FDの上端における両側となる位置をストック上支持部53,54によって同時に挟持する。
 この状態で、搬送上支持部66を上昇させてマスクフレームFA,FCの上端における支持を解除する。
 同時に、取り出し上支持部58hによるマスクフレームFDの上端における両側となる位置の支持を解除する。
First, the stock upper support portions 53 and 54 are moved to the opening / closing portion 58 d side in the X direction. In this state, positions on both sides of the upper ends of the mask frames FA, FC, FD are simultaneously held by the stock upper support portions 53, 54.
In this state, the transport upper support portion 66 is raised to release the support at the upper end of the mask frames FA, FC.
At the same time, the support on the both sides of the upper end of the mask frame FD by the takeout upper support 58h is released.
 この状態で、ストック下支持部51,52の溝支持基部51b,52bを上昇駆動する。これにより、支持溝51a,52aにマスクフレームFA,FC,FDの下端を同時に載置する。これにより、マスクフレームFAの下端を駆動溝51Ab,52Abに対応した駆動ローラ55a,55aから離間させる。同時に、マスクフレームFCの下端を載置溝51Aa,52Aaから離間させる。同時に、マスクフレームFDの下端を取り出し支持溝58gaから離間させる。 In this state, the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to ascend. As a result, the lower ends of the mask frames FA, FC, and FD are simultaneously placed on the support grooves 51a and 52a. Thereby, the lower end of the mask frame FA is separated from the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab. At the same time, the lower end of the mask frame FC is separated from the mounting grooves 51Aa and 52Aa. At the same time, the lower end of the mask frame FD is taken out of the support groove 58ga.
 次いで、ストック下支持部51,52およびストック上支持部53,54をX方向に同期して駆動する。これにより、図6Cに示すように、マスクフレームFCを、駆動支持部55の駆動ローラ55aに当接する位置までX方向に1レーン移動する。同時に、マスクフレームFA,FDをマスクフレームFCとともにX方向に1レーン移動する。 Then, the stock lower support portions 51 and 52 and the stock upper support portions 53 and 54 are driven synchronously in the X direction. As a result, as shown in FIG. 6C, the mask frame FC is moved by one lane in the X direction to a position where the mask frame FC contacts the drive roller 55a of the drive support portion 55. At the same time, the mask frames FA and FD are moved by one lane in the X direction together with the mask frame FC.
 この状態で、ストック下支持部51,52の溝支持基部51b,52bを下降駆動する。これにより、載置溝51Aa,52AaにマスクフレームFA,FD下端を載置する。同時に、駆動溝51Ab,52Abに対応した駆動ローラ55a,55aにマスクフレームFC下端を載置する。さらに、ストック下支持部51,52の溝支持基部51b,52bの下降を続ける。これにより、マスクフレームFA,FC,FD下端から支持溝51a,52aを離間させる。
 このとき、取り出し支持溝58gaに対応するストック位置となるレーン、および、X方向において最も裏側空間42側のストック位置となるレーンは、空いている。
In this state, the groove support bases 51b and 52b of the stock lower support portions 51 and 52 are driven to descend. Thus, the lower ends of the mask frames FA and FD are mounted on the mounting grooves 51Aa and 52Aa. At the same time, the lower end of the mask frame FC is placed on the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab. Furthermore, the descent of the groove support bases 51b and 52b of the stock lower support portions 51 and 52 is continued. Thus, the support grooves 51a and 52a are separated from the lower ends of the mask frames FA, FC and FD.
At this time, a lane serving as a stock position corresponding to the takeout support groove 58ga and a lane serving as the stock position closest to the back space 42 in the X direction are vacant.
 次いで、図6Dに示すように、ストック室50から、未使用のマスクフレームFCを成膜室4のマスク室43まで搬送する。 Next, as shown in FIG. 6D, the unused mask frame FC is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4.
 まず、搬送上支持部56を下降させる。これにより、挟持部56b、56cによってマスクフレームFA,FC,FDの上端における両側となる位置を支持する。同時に、上マグネット部56aによりマスクフレームFCの上端の上側フレーム支持体F6を支持する。
 次に、ストック上支持部53,54において挟持部53a,54aを回転駆動する。これにより、マスクフレームFA,FC,FDの上端における両側となる位置のストック上支持部53,54による支持を解除する。
First, the transport upper support portion 56 is lowered. Thus, the holding portions 56b and 56c support the positions on both sides of the upper ends of the mask frames FA, FC, and FD. At the same time, the upper magnet portion 56a supports the upper frame support F6 at the upper end of the mask frame FC.
Next, the holding portions 53a and 54a are rotationally driven in the stock upper support portions 53 and 54. As a result, the support by the stock upper support portions 53 and 54 at positions on both sides of the upper ends of the mask frames FA, FC, and FD is released.
 この状態で、駆動ローラ55a、駆動ローラ65aを駆動する。これにより、マスクフレームFCを搬送経路に沿ってストック室50から成膜室4のマスク室43まで搬送する。このとき、図3に示す搬送上支持部56の上マグネット部56aおよび搬送上支持部66によって、マスクフレームFCにおける上端の上側フレーム支持体F6が支持された状態を維持する。
 マスクフレームFCが搬入出口58bを通過して、ストック室50からマスクフレームFCが搬出される。その後、仕切りバルブ58aによって、搬入出口58bを閉状態とする。これにより、仕切りバルブ58aによって、成膜室4がストック室50から密閉される。
In this state, the drive roller 55a and the drive roller 65a are driven. Thereby, the mask frame FC is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4 along the transport path. At this time, the upper magnet portion 56a and the transport upper support portion 66 shown in FIG. 3 maintain the upper frame support F6 at the upper end of the mask frame FC.
The mask frame FC passes through the loading / unloading port 58b, and the mask frame FC is unloaded from the stock chamber 50. Thereafter, the loading / unloading port 58b is closed by the partition valve 58a. Thereby, the film forming chamber 4 is sealed from the stock chamber 50 by the dividing valve 58 a.
 マスクフレームFCは、成膜室4のマスク室43における成膜位置に到着する。マスクフレームFCは、成膜室4のマスク室43の成膜位置において、後述するようにマスクアライメント手段10によってアライメントされる。マスクフレームFCは、マスクアライメント手段10によって支持される。アライメントが完了した後、成膜室4においてスパッタリングによる成膜を開始する。
 このとき、X方向において、ストック支持部51~54に支持されたマスクフレームFAとマスクフレームFDとの間に位置するストック位置となるレーンは、空いている。
The mask frame FC arrives at the film forming position in the mask chamber 43 of the film forming chamber 4. The mask frame FC is aligned by the mask alignment means 10 at the film forming position of the mask chamber 43 of the film forming chamber 4 as described later. The mask frame FC is supported by the mask alignment means 10. After the alignment is completed, film formation by sputtering is started in the film formation chamber 4.
At this time, in the X direction, a lane serving as a stock position located between the mask frame FA supported by the stock support portions 51 to 54 and the mask frame FD is vacant.
 次いで、図6Eに示すように、ストック室50に、成膜室4Bで用いた使用済のマスクフレームFBを搬入する。 Next, as shown in FIG. 6E, the used mask frame FB used in the film forming chamber 4B is carried into the stock chamber 50.
 まず、成膜室4Bでの成膜処理が終了した後、成膜室4Bに連通する搬入出口58bを、図3に示す仕切りバルブ58aによって開状態とする。
 このとき、ストック支持部51~54によって支持されたマスクフレームFAとマスクフレームFDとの間で空いているレーンには、駆動支持部55の駆動ローラ55aが位置する。したがって、このレーンに搬入されるマスクフレームFBにおける下端のスライダF5には、駆動支持部55の駆動ローラ55aが当接する。
First, after the film forming process in the film forming chamber 4B is completed, the loading / unloading port 58b communicating with the film forming chamber 4B is opened by the partition valve 58a shown in FIG.
At this time, the drive roller 55a of the drive support portion 55 is located in a lane that is open between the mask frame FA supported by the stock support portions 51 to 54 and the mask frame FD. Therefore, the drive roller 55a of the drive support portion 55 abuts on the slider F5 at the lower end of the mask frame FB carried into the lane.
 次いで、成膜室4Bのマスク室43において、後述するマスクアライメント手段10によって支持されていた使用済のマスクフレームFBを搬出する。マスクフレームFBの搬出においては、図3に示す搬送手段60の搬送上支持部66によって上端の上側フレーム支持体F6が支持する。された状態で、マスクフレームFBの搬出においては、搬送駆動部65の回転駆動部65bによって駆動ローラ65aを駆動する。これにより、マスクフレームFBが、複数の搬送駆動部65および搬送上支持部66によって形成される搬送経路に沿って搬送される。 Next, in the mask chamber 43 of the film forming chamber 4B, the used mask frame FB supported by the mask alignment unit 10 described later is unloaded. When carrying out the mask frame FB, the upper frame support F6 at the upper end is supported by the upper transport support portion 66 of the transport means 60 shown in FIG. In the state where the mask frame FB is unloaded, the driving roller 65a is driven by the rotation driving unit 65b of the conveyance driving unit 65. Thereby, the mask frame FB is transported along the transport path formed by the plurality of transport driving units 65 and the transport upper support portion 66.
 搬送されるマスクフレームFBは、成膜室4B側の搬入出口58bを通過する。その後、図3に示す駆動支持部55の駆動ローラ55aがマスクフレームFBの下端のスライダF5に当接する。同時に、駆動ローラ55aが回転駆動モータ55eによって回転駆動される。このとき、回転駆動モータ55eによる駆動ローラ55aの回転は、搬送駆動部65の回転駆動部65bによる駆動ローラ65aの回転と同期される。これにより、マスクフレームFBのスライダF5が載置溝51Aaおよび載置溝52Aaに当接可能なY方向の位置まで、マスクフレームFBを搬送する。これにより、マスクフレームFBが駆動溝51Ab,52Abに対応した駆動ローラ55a,55aに載置される。 The transferred mask frame FB passes through the loading / unloading port 58b on the film forming chamber 4B side. Thereafter, the drive roller 55a of the drive support portion 55 shown in FIG. 3 abuts on the slider F5 at the lower end of the mask frame FB. At the same time, the drive roller 55a is rotationally driven by the rotation drive motor 55e. At this time, the rotation of the drive roller 55 a by the rotation drive motor 55 e is synchronized with the rotation of the drive roller 65 a by the rotation drive unit 65 b of the conveyance drive unit 65. As a result, the mask frame FB is transported to the position in the Y direction where the slider F5 of the mask frame FB can abut the placement groove 51Aa and the placement groove 52Aa. As a result, the mask frame FB is placed on the drive rollers 55a, 55a corresponding to the drive grooves 51Ab, 52Ab.
 これにより、図3に示すストック支持部51,52,53,54において、マスクフレームFAとマスクフレームFDとの間に位置するレーンにマスクフレームFBがストックされる。 As a result, in the stock support portions 51, 52, 53, 54 shown in FIG. 3, the mask frame FB is stocked in the lane located between the mask frame FA and the mask frame FD.
 同時に、搬送上支持部56が搬送上支持部66に連続して搬送経路が形成される。これにより、搬送上支持部56の上マグネット部56aによりマスクフレームFBの上端が支持される。また、マスクフレームFBの搬送中は、仕切りバルブ58aによって、成膜室4Bに連通する搬入出口58bを開状態に維持する。マスクフレームFBが搬入出口58bを通過した後に、この搬入出口58bを閉状態とする。 At the same time, the transport upper support portion 56 is continuous with the transport upper support portion 66 to form a transport path. Thus, the upper magnet portion 56 a of the transport upper support portion 56 supports the upper end of the mask frame FB. Further, while the mask frame FB is being transported, the loading / unloading port 58b in communication with the film forming chamber 4B is maintained in the open state by the partition valve 58a. After the mask frame FB passes through the loading / unloading port 58b, the loading / unloading port 58b is closed.
 次いで、図6Fに示すように、ストック室50から、成膜室4Bで用いる未使用のマスクフレームFDを成膜室4Bに搬送する準備状態となるように、マスクフレームFA、FB,FDをレーンチェンジする。 Next, as shown in FIG. 6F, the mask frames FA, FB, and FD are laned so as to be ready to transport the unused mask frame FD used in the film forming chamber 4B from the stock chamber 50 to the film forming chamber 4B. Change.
 このとき、成膜室4Bに連通する搬入出口58bは、仕切りバルブ58aによって、開状態または閉状態とされる。
 まず、図3に示す搬送上支持部56を上昇させる。これにより、マスクフレームFA、FB,FDにおける挟持部56b、56cでの上端支持状態を解除する。同時に、回転軸53c,54cを回転駆動して、回転軸53c,54cの周りの角度を設定する。これにより、挟持部53a,54aが、マスクフレームFA、FB,FDの上端をそれぞれ同時に支持する。
At this time, the loading / unloading port 58b in communication with the film forming chamber 4B is opened or closed by the dividing valve 58a.
First, the transport upper support portion 56 shown in FIG. 3 is raised. As a result, the upper end support state of the holding parts 56 b and 56 c in the mask frame FA, FB, and FD is released. At the same time, the rotary shafts 53c and 54c are rotationally driven to set an angle around the rotary shafts 53c and 54c. Thus, the holding portions 53a and 54a simultaneously support the upper ends of the mask frames FA, FB, and FD.
 この状態で、上記のレーンチェンジと同様に、図3に示すストック支持部51,52,53,54によって、支持溝51a,51aと挟持部53a,54aとをX方向に移動する。これにより、マスクフレームFA、FB,FDのレーンチェンジをおこなう。ここで、マスクフレームFDが駆動ローラ55aに当接するレーン状態となるようにX方向における位置を設定する。これによりマスクフレームFA、FB,FDをレーンチェンジする。
 マスクフレームFA、FB,FDのレーンチェンジ完了時においては、取り出し支持溝58gaに対応するストック位置となるレーン、および、ストック載置部51A,52AのX方向において最もスパッタ空間41側の位置となる1箇所のレーンは、空いている。このとき、X方向において裏側空間42側に最も近いストック位置となるレーンにはマスクフレームFAがストックされている。したがって、X方向において最も裏側空間42側のストック位置となるレーンは、空いていない。
In this state, the support grooves 51a, 51a and the holding portions 53a, 54a are moved in the X direction by the stock support portions 51, 52, 53, 54 shown in FIG. Thus, the lane change of the mask frames FA, FB, and FD is performed. Here, the position in the X direction is set such that the mask frame FD is in a lane state in which the mask frame FD abuts on the drive roller 55a. In this way, the mask frames FA, FB, and FD are changed lanes.
At the time of completion of the lane change of the mask frames FA, FB, and FD, the lane at the stock position corresponding to the takeout support groove 58ga, and the position closest to the sputtering space 41 in the X direction of the stock placement portions 51A and 52A. One lane is vacant. At this time, the mask frame FA is stocked in the lane which is the stock position closest to the back space 42 side in the X direction. Therefore, the lane which is the stock position closest to the back space 42 in the X direction is not vacant.
 そして、マスクフレームFA、FB,FDのレーンチェンジが完了したら、搬送上支持部56を下降させてマスクフレームFA、FB,FDの上端を挟持部56b、56cによって支持状態とする。同時に、挟持部53a,54aを回転軸53c,54cの周りに回転駆動して角度設定する。これにより、挟持部53a,54aによるマスクフレームFA、FB,FDの上端の支持を解除する。これにより、搬送上支持部56の上マグネット部56aがマスクフレームFDの上端の上側フレーム支持体F6を支持する。 When the lane change of the mask frames FA, FB, and FD is completed, the conveyance upper support portion 56 is lowered to support the upper ends of the mask frames FA, FB, and FD by the holding portions 56b and 56c. At the same time, the holding portions 53a and 54a are rotationally driven around the rotation shafts 53c and 54c to set an angle. As a result, the support of the upper ends of the mask frames FA, FB, and FD by the holding portions 53a and 54a is released. As a result, the upper magnet portion 56a of the transport upper support portion 56 supports the upper frame support F6 at the upper end of the mask frame FD.
 次いで、図7Aに示すように、ストック室50から、未使用のマスクフレームFDを成膜室4Bのマスク室43まで搬送する。 Next, as shown in FIG. 7A, the unused mask frame FD is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4B.
 まず、仕切りバルブ58aによって、成膜室4Bに連通する搬入出口58bを開状態とするか開状態を維持する。
 ここで、図3に示す搬送上支持部56は、下降している。これにより、上マグネット部56aが、マスクフレームFDの上端の上側フレーム支持体F6を支持している。また、挟持部53a,54aによるマスクフレームFDの上端の支持は、解除されている。
 この状態で、駆動ローラ55a、駆動ローラ65aを駆動する。これにより、マスクフレームFDをストック室50から成膜室4Bのマスク室43まで搬送経路に沿って搬送する。このとき、図3に示す搬送上支持部56の上マグネット部56aおよび搬送上支持部66によって、マスクフレームFDにおける上端の上側フレーム支持体F6が支持された状態を維持する。
 マスクフレームFDが搬入出口58bを通過して、ストック室50からマスクフレームFDが搬出される。この後、仕切りバルブ58aによって、搬入出口58bを閉状態とする。これにより、仕切りバルブ58aによって、成膜室4Bがストック室50から密閉される。
First, the loading / unloading port 58b in communication with the film forming chamber 4B is opened or maintained by the partition valve 58a.
Here, the transport upper support portion 56 shown in FIG. 3 is lowered. Thus, the upper magnet portion 56a supports the upper frame support F6 at the upper end of the mask frame FD. Further, the support of the upper end of the mask frame FD by the holding portions 53a and 54a is released.
In this state, the drive roller 55a and the drive roller 65a are driven. Thus, the mask frame FD is transported from the stock chamber 50 to the mask chamber 43 of the film forming chamber 4B along the transport path. At this time, the upper magnet portion 56a and the transport upper support portion 66 shown in FIG. 3 maintain the upper frame support F6 at the upper end of the mask frame FD.
The mask frame FD passes through the loading / unloading port 58b, and the mask frame FD is unloaded from the stock chamber 50. Thereafter, the loading / unloading port 58b is closed by the partition valve 58a. Thus, the film forming chamber 4B is sealed from the stock chamber 50 by the dividing valve 58a.
 マスクフレームFDは、成膜室4Bのマスク室43における成膜位置に到着する。マスクフレームFDは、成膜室4Bのマスク室43の成膜位置において、後述するようにマスクアライメント手段10によって、アライメントされる。マスクフレームFDは、マスクアライメント手段10によって支持される。アライメントが完了した後、成膜室4Bにおいてスパッタリングによる成膜を開始する。
 このとき、ストック支持部51,52,53,54に支持されたマスクフレームFBよりもスパッタ空間41側に位置するレーンは、すべて空いている。
The mask frame FD arrives at the film forming position in the mask chamber 43 of the film forming chamber 4B. The mask frame FD is aligned by the mask alignment means 10 at the film forming position of the mask chamber 43 of the film forming chamber 4B as described later. The mask frame FD is supported by the mask alignment means 10. After the alignment is completed, film formation by sputtering is started in the film formation chamber 4B.
At this time, all lanes located closer to the sputtering space 41 than the mask frame FB supported by the stock support portions 51, 52, 53, 54 are vacant.
 次いで、図7Bに示すように、ストック室50から、使用済みのマスクフレームFBを外部に搬出する準備のレーンチェンジをおこなう。 Next, as shown in FIG. 7B, a lane change of preparation for carrying out the used mask frame FB from the stock room 50 is performed.
 マスクフレームFBの搬出においては、まず、図3に示す回転軸53c,54cを回転駆動する。これにより、回転軸53c,54cの周りにおける挟持部53a,54aの角度設定をおこなう。これにより、挟持部53a,54aによってマスクフレームFA,FB上端をそれぞれ同時に支持する。同時に、搬送上支持部56を上昇させて退避状態とする。
 そして、上述したレーンチェンジと同様に、ストック支持部51,52,53,54によって、支持溝51a,52aをZ方向に上昇させる。その後、ストック支持部51,52,53,54によって、支持溝51a,52aをX方向においてスパッタ空間41に向かって移動させる。さらに、ストック支持部51,52,53,54によって、支持溝51a,52aをZ方向に下降する。同時に、支持溝51a,52aに同期して,挟持部53a,54aをX方向においてスパッタ空間41に向かって移動させる。これにより、マスクフレームFA、FBを密閉状態である開閉部58dに対して近接する方向にX方向に移動する。このように、ストック支持部51,52,53,54によって、マスクフレームFA、FBをレーンチェンジする。このとき、マスクフレームFBが、取り出し支持部58gの取り出し支持溝58gaに載置される。同時に、マスクフレームFBが、X方向における最も開閉部58d側となる載置溝51Aa,52Aaに載置されるように、X方向におけるマスクフレームFBの位置を設定する。
 このとき、マスクフレームFAは、X方向において、マスクフレームFBに隣接したストック位置となるレーンに位置する。
In carrying out the mask frame FB, first, rotary shafts 53c and 54c shown in FIG. 3 are rotationally driven. Thereby, the angle setting of the holding portions 53a and 54a around the rotation shafts 53c and 54c is performed. Thus, the upper ends of the mask frames FA and FB are simultaneously supported by the holding parts 53a and 54a. At the same time, the transport upper support portion 56 is raised to be in the retracted state.
Then, the support grooves 51a and 52a are raised in the Z direction by the stock support portions 51, 52, 53, and 54, as in the above-described lane change. Thereafter, the support grooves 51a and 52a are moved toward the sputtering space 41 in the X direction by the stock support portions 51, 52, 53, and 54. Further, the support grooves 51a, 52a are lowered in the Z direction by the stock support portions 51, 52, 53, 54. At the same time, the sandwiching portions 53a and 54a are moved toward the sputtering space 41 in the X direction in synchronization with the support grooves 51a and 52a. As a result, the mask frames FA, FB move in the X direction in the direction approaching the opening / closing portion 58 d in the sealed state. As described above, the mask frames FA and FB are changed by the stock support portions 51, 52, 53, and 54. At this time, the mask frame FB is placed on the takeout support groove 58ga of the takeout support portion 58g. At the same time, the position of the mask frame FB in the X direction is set so that the mask frame FB is placed on the placement grooves 51Aa and 52Aa closest to the opening and closing portion 58d in the X direction.
At this time, the mask frame FA is located in a lane which is a stock position adjacent to the mask frame FB in the X direction.
 次いで、マスクフレームFBの左右に位置する取り出し上支持部58hの支持片58h2をそれぞれZ軸58h1周りで内側に回動する。これにより、支持片58h2によってマスクフレームFBの上側を支持する。 Next, the support pieces 58h2 of the takeout upper support portions 58h located on the left and right of the mask frame FB are respectively pivoted inward around the Z axis 58h1. Thus, the upper side of the mask frame FB is supported by the support piece 58h2.
 次いで、図3に示す搬送上支持部56を下降させる。これにより、マスクフレームFAの上側が挟持部56b、56cによって支持される。これにより、マスクフレームFAが倒れないようになる。 Next, the transport upper support portion 56 shown in FIG. 3 is lowered. Thereby, the upper side of the mask frame FA is supported by the holding parts 56b and 56c. This prevents the mask frame FA from falling down.
 次に、図3に示すストック上支持部53,54の挟持部53a,54aを回動する。これにより、挟持部53a,54aが退避状態となる。これにより、挟持部53a,54aによるマスクフレームFA,FBの上側の支持を解除する。 Next, the holding portions 53a and 54a of the stock upper support portions 53 and 54 shown in FIG. 3 are pivoted. As a result, the holding portions 53a and 54a are in the retracted state. As a result, the upper support of the mask frames FA and FB by the holding portions 53a and 54a is released.
 この状態で、図3に示す揺動駆動部58fによって揺動軸58eの周りに開閉部58dを揺動する。これにより、図7Cに示すように、マスク取出充填口58cを開放状態とする。このとき、取り出し支持部58g,58gと取り出し上支持部58h,58hとによって、マスクフレームFBを開閉部58dに支持した状態を維持する。 In this state, the opening and closing portion 58d is rocked around the rocking shaft 58e by the rocking driving portion 58f shown in FIG. Thereby, as shown in FIG. 7C, the mask take-out and filling port 58c is brought into the open state. At this time, the mask frame FB is supported by the opening / closing portion 58d by the removal support portions 58g, 58g and the removal upper support portions 58h, 58h.
 次いで、取り出し上支持部58h,58hをZ軸58h1周りで外側に回動する。取り出し上支持部58h,58hによるマスクフレームFBの支持を解除した状態とする。この後、マスクフレームFBを開閉部58dから取り外して外部に搬出する。 Then, the takeout upper support portions 58h, 58h are pivoted outward around the Z axis 58h1. The support of the mask frame FB by the upper pick-up support portions 58h and 58h is released. Thereafter, the mask frame FB is removed from the opening / closing portion 58d and carried out to the outside.
 次いで、図3に示す揺動駆動部58fによって揺動軸58eを揺動させる。これにより、開閉部58dを立設した縦状態とする。これにより、開閉部58dでマスク取出充填口58cを密閉する。 Next, the rocking shaft 58e is rocked by the rocking drive unit 58f shown in FIG. As a result, the open / close portion 58d is set in the vertical state. As a result, the mask take-out and filling port 58c is sealed by the opening and closing portion 58d.
 さらに、上述したマスクフレームFBと同様に、マスクフレームFAをストック室50から外部に取り出す準備のレーンチェンジをおこなう。 Further, similarly to the mask frame FB described above, a lane change of preparation for taking out the mask frame FA from the stock room 50 is performed.
 マスクフレームFAの搬出においては、まず、図3に示す回転軸53c,54cの周りに回転駆動する。これにより、回転軸53c,54cの周りにおける挟持部53a,54aの角度設定をおこなう。これにより、挟持部53a,54aによってマスクフレームFA上端をそれぞれ同時に支持する。同時に、搬送上支持部56を上昇させて退避状態とする。
 そして、上述したマスクフレームFBのレーンチェンジと同様に、ストック支持部51,52,53,54によって、支持溝51a,52aをZ方向に上昇させる。その後、ストック支持部51,52,53,54によって、支持溝51a,52aをX方向においてスパッタ空間41に向かって移動させる。さらに、ストック支持部51,52,53,54によって、支持溝51a,52aをZ方向に下降する。同時に、支持溝51a,52aに同期して、挟持部53a,54aをX方向においてスパッタ空間41に向かって移動させる。これにより、マスクフレームFAを密閉状態である開閉部58dに対して近接する方向に移動する。このように、ストック支持部51,52,53,54によって、マスクフレームFAが、図7Dに示すように、取り出し支持部58gの取り出し支持溝58gaに載置される。これにより、X方向におけるマスクフレームFAの位置を設定する。これにより、マスクフレームFAをレーンチェンジする。
In carrying out the mask frame FA, first, it is rotationally driven around the rotation axes 53c and 54c shown in FIG. Thereby, the angle setting of the holding portions 53a and 54a around the rotation shafts 53c and 54c is performed. Thus, the upper end of the mask frame FA is simultaneously supported by the holding portions 53a and 54a. At the same time, the transport upper support portion 56 is raised to be in the retracted state.
Then, similar to the lane change of the mask frame FB described above, the support grooves 51a and 52a are raised in the Z direction by the stock support portions 51, 52, 53, and 54. Thereafter, the support grooves 51a and 52a are moved toward the sputtering space 41 in the X direction by the stock support portions 51, 52, 53, and 54. Further, the support grooves 51a, 52a are lowered in the Z direction by the stock support portions 51, 52, 53, 54. At the same time, the sandwiching portions 53a and 54a are moved toward the sputtering space 41 in the X direction in synchronization with the support grooves 51a and 52a. As a result, the mask frame FA is moved in the direction in which the mask frame FA approaches the open / close portion 58d in the sealed state. Thus, the mask frame FA is placed on the takeout support groove 58ga of the takeout support portion 58g by the stock support portions 51, 52, 53, 54 as shown in FIG. 7D. Thereby, the position of the mask frame FA in the X direction is set. Thus, the mask frame FA is changed.
 次いで、マスクフレームFAの左右に位置する取り出し上支持部58hの支持片58h2をそれぞれZ軸58h1周りで内側に回動する。これにより、支持片58h2によってマスクフレームFAの上側を支持する。 Next, the support pieces 58h2 of the removal upper support portions 58h positioned on the left and right of the mask frame FA are respectively pivoted inward around the Z axis 58h1. Thus, the upper side of the mask frame FA is supported by the support piece 58h2.
 次に、図3に示すストック上支持部53,54の挟持部53a,54aを回動する。これにより、挟持部53a,54aが退避状態となる。これにより、挟持部53a,54aによるマスクフレームFAの上側の支持を解除する。 Next, the holding portions 53a and 54a of the stock upper support portions 53 and 54 shown in FIG. 3 are pivoted. As a result, the holding portions 53a and 54a are in the retracted state. Thereby, the upper support of the mask frame FA by the holding parts 53a and 54a is released.
 この状態で、図3に示す揺動駆動部58fによって揺動軸58eの周りに開閉部58dを揺動する。これにより、図7Eに示すように、マスク取出充填口58cを開放状態とする。このとき、取り出し支持部58g,58gと取り出し上支持部58h,58hとによって、マスクフレームFAを開閉部58dに支持した状態を維持する。 In this state, the opening and closing portion 58d is rocked around the rocking shaft 58e by the rocking driving portion 58f shown in FIG. As a result, as shown in FIG. 7E, the mask take-out and filling port 58c is brought into the open state. At this time, the mask frame FA is supported by the opening / closing portion 58d by the removal support portions 58g, 58g and the removal upper support portions 58h, 58h.
 次いで、取り出し上支持部58h,58hをZ軸58h1周りで外側に回動する。取り出し上支持部58h,58hによるマスクフレームFAの支持を解除した状態とする。この後、マスクフレームFAを開閉部58dから取り外して外部に搬出する。
 これにより、マスク交換手段100におけるマスク交換手順を終了する。
Then, the takeout upper support portions 58h, 58h are pivoted outward around the Z axis 58h1. The support of the mask frame FA by the upper pick-up support portions 58h, 58h is released. Thereafter, the mask frame FA is removed from the opening and closing portion 58d and carried out to the outside.
Thus, the mask replacement procedure in the mask replacement unit 100 is completed.
 本実施形態のスパッタリング装置1においては、マスク交換手段100によって、未使用のマスクフレームFを複数枚ストックする。さらに、本実施形態のスパッタリング装置1においては、複数ストックされた未使用のマスクフレームFから必要に応じて一枚を選択する。本実施形態のスパッタリング装置1においては、選択した未使用のマスクフレームFを成膜位置となるマスク室43まで搬送する。これにより、本実施形態のスパッタリング装置1においては、成膜室(チャンバ)4に対するマスク交換および成膜室(チャンバ)4Bに対するマスク交換を自動化できる。本実施形態のスパッタリング装置1においては、成膜室4に対する複数のマスク交換を連続できる。本実施形態のスパッタリング装置1においては、成膜室4Bに対する複数のマスク交換を連続できる。また、本実施形態のスパッタリング装置1においては、成膜室4に対するマスク交換と成膜室4Bに対するマスク交換とを連続できる。これにより、本実施形態のスパッタリング装置1においては、マスク交換に必要な時間を短縮できる。 In the sputtering apparatus 1 of the present embodiment, a plurality of unused mask frames F are stocked by the mask exchanging unit 100. Furthermore, in the sputtering apparatus 1 of the present embodiment, one is selected from the plurality of stocked unused mask frames F as necessary. In the sputtering apparatus 1 of the present embodiment, the selected unused mask frame F is transported to the mask chamber 43 which is the film forming position. Thus, in the sputtering apparatus 1 of the present embodiment, mask exchange for the film forming chamber (chamber) 4 and mask exchange for the film forming chamber (chamber) 4B can be automated. In the sputtering apparatus 1 of the present embodiment, a plurality of mask replacements for the film forming chamber 4 can be continued. In the sputtering apparatus 1 of the present embodiment, a plurality of mask replacements for the film forming chamber 4B can be continued. Further, in the sputtering apparatus 1 of the present embodiment, the mask replacement for the film forming chamber 4 and the mask replacement for the film forming chamber 4B can be continued. Thereby, in the sputtering apparatus 1 of this embodiment, the time required for mask replacement can be shortened.
 本実施形態のスパッタリング装置1においては、これらのマスク交換が成膜室4および成膜室4Bを大気開放しないでできる。これにより、本実施形態のスパッタリング装置1においては、マスク交換に起因して、成膜室4および成膜室4Bの内部でマスクフレームFあるいは基板S等に付着するパーティクルなどを削減できる。同時に、本実施形態のスパッタリング装置1においては、大気解放した際に、カソードなど成膜室4および成膜室4Bの内部の表面に発生する悪影響を低減することができる。これにより、スパッタリング装置1における成膜品質を向上できる。 In the sputtering apparatus 1 of the present embodiment, the mask exchange can be performed without opening the film forming chamber 4 and the film forming chamber 4B to the atmosphere. Thereby, in the sputtering apparatus 1 of the present embodiment, particles and the like attached to the mask frame F or the substrate S inside the film forming chamber 4 and the film forming chamber 4B due to the mask replacement can be reduced. At the same time, in the sputtering apparatus 1 of the present embodiment, it is possible to reduce the adverse effect generated on the surface inside the film forming chamber 4 such as the cathode and the film forming chamber 4B when the atmosphere is released. Thereby, the film formation quality in the sputtering apparatus 1 can be improved.
 また、本実施形態のスパッタリング装置1においては、使用済みのマスクフレームFをストック室50にストックする。さらに、本実施形態のスパッタリング装置1においては、ストック室50を外部に対して開放できるタイミングを選んで、使用済みのマスクフレームFをストック室50から装置外部に取り出すことができる。つまり、本実施形態のスパッタリング装置1においては、成膜室4,4Bでの処理中など搬入出口58bを閉状態としている時間を選んで、使用済みのマスクフレームFをストック室50から装置外部に取り出すことができる。これにより、本実施形態のスパッタリング装置1のタクトタイムを短縮することができる。 Further, in the sputtering apparatus 1 of the present embodiment, the used mask frame F is stocked in the stock chamber 50. Further, in the sputtering apparatus 1 of the present embodiment, the used mask frame F can be taken out of the stock chamber 50 to the outside of the apparatus by selecting the timing at which the stock chamber 50 can be opened to the outside. That is, in the sputtering apparatus 1 of the present embodiment, the mask frame F used from the stock chamber 50 to the outside of the apparatus is selected by selecting a time during which the loading / unloading port 58b is closed during processing in the film forming chambers 4, 4B. It can be taken out. Thereby, the tact time of the sputtering apparatus 1 of this embodiment can be shortened.
 本実施形態のスパッタリング装置1においては、搬送上支持部56,66と上側フレーム支持体F6とが磁気回路によって互いに引き付け合う方式により、マスクフレームFを支持する構成にした。これにより、本実施形態のスパッタリング装置1においては、搬送時にマスクフレームFで振動発生等の予期せぬ動きをすることがない。同時に、本実施形態のスパッタリング装置1においては、マスクフレームFの搬送経路の上方位置におけるゴミ・パーティクルの発生を防止できる。これにより、本実施形態のスパッタリング装置1においては、マスクフレームFにゴミ・パーティクルが落下する可能性を低減できる。したがって、本実施形態のスパッタリング装置1においては、成膜品質が低下することがない。また、本実施形態のスパッタリング装置1においては、マスクフレームFを安定して搬送することが可能である。 In the sputtering apparatus 1 of the present embodiment, the mask frame F is supported by the method in which the transport upper supports 56 and 66 and the upper frame support F6 attract each other by the magnetic circuit. As a result, in the sputtering apparatus 1 of the present embodiment, the mask frame F does not perform an unexpected movement such as vibration generation at the time of transfer. At the same time, in the sputtering apparatus 1 of the present embodiment, it is possible to prevent the generation of dust and particles at the upper position of the transfer path of the mask frame F. Thus, in the sputtering apparatus 1 of the present embodiment, the possibility of dust and particles falling on the mask frame F can be reduced. Therefore, in the sputtering apparatus 1 of the present embodiment, the deposition quality does not deteriorate. Moreover, in the sputtering apparatus 1 of this embodiment, it is possible to convey the mask frame F stably.
 本実施形態のスパッタリング装置1においては、ストック支持部51,52,53,54によって、ストックしている複数枚のマスクフレームFをレーンチェンジする。本実施形態のスパッタリング装置1においては、複数枚のマスクフレームFから一枚を選択して成膜室4,4Bに搬送することができる。このため、本実施形態のスパッタリング装置1においては、複数種類の基板Sに対して異なる成膜をおこなう際に、それぞれの設定条件に対応して、所定のマスクフレームFを成膜位置に搬送することが可能となる。 In the sputtering apparatus 1 of the present embodiment, the stock support portions 51, 52, 53, 54 lane-change the plurality of mask frames F being stocked. In the sputtering apparatus 1 of the present embodiment, one of the plurality of mask frames F can be selected and transported to the film forming chambers 4, 4B. For this reason, in the sputtering apparatus 1 of the present embodiment, when performing different film formations on a plurality of types of substrates S, the predetermined mask frame F is transported to the film formation position corresponding to each setting condition. It becomes possible.
 また、本実施形態のスパッタリング装置1においては、マスク交換を自動化できる。これにより本実施形態のスパッタリング装置1においては、異なる種類の基板Sに対応して、異なる種類のマスクフレームFを順次交換可能にできる。本実施形態のスパッタリング装置1においては、異なる種類の基板Sに対応して、異なる種類のマスクフレームFを用いる成膜処理を連続しておこなうことが可能となる。 Moreover, in the sputtering apparatus 1 of this embodiment, mask replacement can be automated. Thus, in the sputtering apparatus 1 of the present embodiment, different types of mask frames F can be sequentially exchanged in correspondence with different types of substrates S. In the sputtering apparatus 1 of the present embodiment, film formation processing using different types of mask frames F can be continuously performed corresponding to different types of substrates S.
 本実施形態のスパッタリング装置1においては、マスクフレームFの搬送やレーンチェンジに関して、マスクフレームFより上側に位置する駆動系が、ストック上支持部53,54、搬送上支持部56および取り出し上支持部58hとされる。これらストック上支持部53,54、搬送上支持部56および取り出し上支持部58hは、いずれもストック室50の外側に位置する。また、ストック上支持部53,54、搬送上支持部56および取り出し上支持部58hは、重量物であるマスクフレームFの重量を支持する鉛直方向にマスクフレームFを移動させる機能を有していない。さらに、この重量物であるマスクフレームFは、マスクフレームFより下側に位置する駆動支持部55の駆動ローラ55aによってチャンバ4,50内で搬送される。つまり、本実施形態のスパッタリング装置1においては、マスクフレームFより上側に位置するストック上支持部53,54、搬送上支持部56および取り出し上支持部58hが、小出力のモータを採用すればよい。同時に、マスクフレームFより下側に位置する駆動支持部55によってマスクフレームFの下側を駆動する。これらの駆動系により、本実施形態のスパッタリング装置1においては、マスク交換可能が可能とされる。これにより、本実施形態のスパッタリング装置1においては、チャンバ4,50内部の駆動系を大型化して、高出力にする必要がない。このため、本実施形態のスパッタリング装置1においては、チャンバ4,50を省スペース化できる。さらに、本実施形態のスパッタリング装置1においては、装置全体を省スペース化できる。 In the sputtering apparatus 1 of the present embodiment, the drive system located above the mask frame F with respect to the transport and the lane change of the mask frame F includes the stock upper support portion 53 and 54, the transport upper support portion 56, and the takeout upper support portion. It will be 58h. The upper stock support portions 53 and 54, the upper transfer support portion 56, and the upper removal support portion 58h are all located outside the stock chamber 50. In addition, the stock upper supports 53 and 54, the transfer upper support 56, and the removal upper support 58h do not have the function of moving the mask frame F in the vertical direction to support the weight of the mask frame F which is a heavy load. . Further, the mask frame F, which is a heavy material, is transported in the chambers 4 and 50 by the drive roller 55a of the drive support portion 55 located below the mask frame F. That is, in the sputtering apparatus 1 of the present embodiment, the stock upper support portions 53 and 54, the transport upper support portion 56, and the takeout upper support portion 58h located above the mask frame F may adopt a motor with a small output. . At the same time, the lower side of the mask frame F is driven by the drive support portion 55 located below the mask frame F. With these driving systems, mask replacement is possible in the sputtering apparatus 1 of the present embodiment. As a result, in the sputtering apparatus 1 of the present embodiment, it is not necessary to enlarge the drive system inside the chambers 4 and 50 to achieve high output. Therefore, in the sputtering apparatus 1 of the present embodiment, the chambers 4 and 50 can be saved in space. Furthermore, in the sputtering apparatus 1 of the present embodiment, the entire apparatus can be saved in space.
 以下、本実施形態におけるマスクフレームのアライメントについて説明する。 Hereinafter, alignment of the mask frame in the present embodiment will be described.
 図8は、本実施形態におけるスパッタリング装置のマスク室におけるマスクアライメント手段を示す斜視図である。
 マスクアライメント手段10は、図1に示すように、マスク室43において、図2に示すマスクフレームFを支持するとともに、マスクフレームFの面に平行な二方向およびマスクフレームFの面に直交する直交方向の三つの軸方向と、これらの三つの軸方向の軸線周りの三つの回転方向とによる六自由度にて、マスクフレームFのアライメントを可能としている。
FIG. 8 is a perspective view showing the mask alignment means in the mask chamber of the sputtering apparatus in the present embodiment.
As shown in FIG. 1, the mask alignment means 10 supports the mask frame F shown in FIG. 2 in the mask chamber 43 and is orthogonal in two directions parallel to the plane of the mask frame F and orthogonal to the plane of the mask frame F. The alignment of the mask frame F is enabled in six degrees of freedom with three axial directions of direction and three rotational directions around these three axial axes.
 具体的には、マスクアライメント手段10が、図8に示すように、マスクフレームFの下側の両端位置を支持する支持アライメント部11,12と、マスクフレームFの上側の位置をマスクフレームFの面に直交する方向に設定可能として、マスクフレームFを支持および解放可能な上部アライメント部13,14と、上側支持部16,16とを備える。 Specifically, as shown in FIG. 8, the mask alignment means 10 supports the support alignment sections 11 and 12 which support the lower end positions of the mask frame F, and the upper position of the mask frame F The upper alignment portions 13 and 14 capable of supporting and releasing the mask frame F and the upper support portions 16 and 16 are provided so as to be set in a direction orthogonal to the plane.
 マスク室43においては、図2に示すマスクフレームFがYZ面と略平行となるように成膜位置が設定されている。また、マスクアライメント手段10としては、図8に示すように、マスクフレームFの下端の両端部、つまり、Z方向における下側でY方向における両端位置に、アライメント時に用いる係合部F1および係合部F2がそれぞれ設けられる。 In the mask chamber 43, the film formation position is set such that the mask frame F shown in FIG. 2 is substantially parallel to the YZ plane. Further, as shown in FIG. 8, as the mask alignment means 10, the engagement portion F1 and the engagement used at the time of alignment at both ends of the lower end of the mask frame F, that is, both ends in the Y direction on the lower side in the Z direction. Parts F2 are provided respectively.
 図9は、本実施形態におけるスパッタリング装置の支持アライメント部を示す斜視図である。図10は、本実施形態におけるスパッタリング装置の支持アライメント部を示す斜視図である。
 支持アライメント部11は、凸部11aと、X駆動部11Xと、Y駆動部11Yと、Z駆動部11Zとを有する。凸部11aは、後述するマスクフレームFに設けられた係合部F1に係合する。凸部11aは、支持アライメント部11の頂部にて上方に突出した状態に設けられている。X駆動部11Xは、凸部11aをマスク面に垂直な略水平方向(X方向)に位置調整する際に駆動可能である。Y駆動部11Yは、凸部11aをマスク面に平行な略水平方向(Y方向)に位置調整する際に駆動可能である。Z駆動部11Zは、凸部11aを鉛直方向(Z方向)に位置調整する際に駆動可能である。
FIG. 9 is a perspective view showing a support alignment portion of the sputtering apparatus in the present embodiment. FIG. 10 is a perspective view showing a support alignment portion of the sputtering apparatus in the present embodiment.
The support alignment unit 11 has a convex portion 11a, an X drive unit 11X, a Y drive unit 11Y, and a Z drive unit 11Z. The convex portion 11a engages with an engaging portion F1 provided on a mask frame F described later. The convex portion 11 a is provided to project upward at the top of the support alignment portion 11. The X driving unit 11X can be driven when adjusting the position of the convex portion 11a in a substantially horizontal direction (X direction) perpendicular to the mask surface. The Y drive portion 11Y can be driven when adjusting the position of the convex portion 11a in a substantially horizontal direction (Y direction) parallel to the mask surface. The Z drive unit 11Z can be driven when adjusting the position of the convex portion 11a in the vertical direction (Z direction).
 支持アライメント部11は、図1に示すマスク室43内の成膜位置におけるマスクフレームFの端部に位置する。支持アライメント部11においては、凸部11aの位置が、図8に示すように、複数の搬送手段60によって規定されるマスクフレームFの搬送経路に重なるように設定される。
 具体的には、支持アライメント部11のXY方向における位置は、搬送経路に設けられた搬送駆動部65の駆動ローラ65aを結ぶ線上に、凸部11aのXY方向における位置がほぼ一致するように設定される。
The support alignment unit 11 is located at the end of the mask frame F at the film forming position in the mask chamber 43 shown in FIG. In the support alignment unit 11, the position of the convex portion 11a is set so as to overlap the transfer path of the mask frame F defined by the plurality of transfer means 60, as shown in FIG.
Specifically, the position of the support alignment unit 11 in the XY direction is set so that the position of the convex portion 11 a in the XY direction substantially coincides with the line connecting the drive rollers 65 a of the conveyance drive unit 65 provided in the conveyance path. Be done.
 また、凸部11aのZ方向における位置としては、後述するように、凸部11aが下降した状態で、搬送経路に設けられた複数の搬送駆動部65の駆動ローラ65aを結ぶ線よりも凸部11aの上側が低い位置となる。同時に、凸部11aが上昇したアライメント状態(成膜状態)では、搬送経路に設けられた複数の搬送駆動部65の駆動ローラ65aを結ぶ線よりも凸部11aの上側が高い位置となる。 Further, as the position of the convex portion 11a in the Z direction, as described later, the convex portion is lower than the line connecting the drive rollers 65a of the plurality of conveyance driving units 65 provided in the conveyance path in a state where the convex portion 11a is lowered. The upper side of 11a is a low position. At the same time, in the alignment state (film formation state) in which the convex portion 11a is raised, the upper side of the convex portion 11a is higher than the line connecting the drive rollers 65a of the plurality of transport drive units 65 provided in the transport path.
 凸部11aは、図8,図9に示すように、基部11bに対して上方向に付勢された状態で設けられている。凸部11aの上側は、球面あるいは半球面形状を有し、凸部11aは、例えば、金属で構成され、重量を有するマスクフレームFを支持可能とされている。 The convex part 11a is provided in the state urged | biased above with respect to the base 11b, as shown to FIG. 8, FIG. The upper side of the convex portion 11a has a spherical or hemispherical shape, and the convex portion 11a is made of, for example, a metal, and can support the mask frame F having a weight.
 X駆動部11Xは、図8,図9に示すように、モータ11Xaと、回転軸11Xbと、X位置規制部11Xcと、規制部11Xdとを有する。モータ11Xaは、ステッピングモータで構成される。回転軸11Xbは、X方向に延在してモータ11Xaによって回転駆動される。X位置規制部11Xcは、回転軸11Xbに螺合されて回転軸11Xbの軸線方向に相対移動可能である。規制部11Xdは、X位置規制部11Xcとモータ11Xaとの移動を規制する。 As shown in FIGS. 8 and 9, the X drive unit 11X has a motor 11Xa, a rotation shaft 11Xb, an X position regulation unit 11Xc, and a regulation unit 11Xd. The motor 11Xa is configured by a stepping motor. The rotation shaft 11Xb extends in the X direction and is rotationally driven by the motor 11Xa. The X position restricting portion 11Xc is screwed to the rotary shaft 11Xb and is relatively movable in the axial direction of the rotary shaft 11Xb. The regulating unit 11Xd regulates movement of the X position regulating unit 11Xc and the motor 11Xa.
 X駆動部11Xにおいては、モータ11Xaによって回転軸11Xbを回動することで、この回転軸11Xbの先端が回動可能な状態で回転軸11Xbの先端に接続された基部11bが、X位置規制部11Xcに対してX方向に移動するように構成されている。規制部11Xdによって、基部11bの移動方向が規制されている。 In the X drive unit 11X, the base 11b connected to the tip of the rotary shaft 11Xb in a state where the front end of the rotary shaft 11Xb can be turned by rotating the rotary shaft 11Xb by the motor 11Xa It is configured to move in the X direction with respect to 11Xc. The movement direction of the base 11b is restricted by the restriction part 11Xd.
 X位置規制部11Xcの下端は、略平板状の水平板11cに接続固定されている。水平板11c上においては、基部11bの重量が水平板11cで支持され、水平板11cに対して基部11bは、移動可能とされる。 The lower end of the X position restricting portion 11Xc is connected and fixed to a substantially flat horizontal plate 11c. On the horizontal plate 11c, the weight of the base 11b is supported by the horizontal plate 11c, and the base 11b is movable relative to the horizontal plate 11c.
 Y駆動部11Yは、図8,図9に示すように、モータ11Yaと、回転軸11Ybと、Y位置規制部11Ycと、規制部11Ydとを有する。モータ11Yaは、ステッピングモータで構成される。回転軸11Ybは、Y方向に延在しモータ11Yaによって回転駆動される。Y位置規制部11Ycは、回転軸11Ybに螺合されて回転軸11Ybの軸線方向に相対移動可能である。規制部11Ydは、Y位置規制部11Ycとモータ11Yaとの移動を規制する。 As shown in FIGS. 8 and 9, the Y driving unit 11Y includes a motor 11Ya, a rotation shaft 11Yb, a Y position regulating unit 11Yc, and a regulating unit 11Yd. The motor 11Ya is configured by a stepping motor. The rotating shaft 11Yb extends in the Y direction and is rotationally driven by the motor 11Ya. The Y position restricting portion 11Yc is screwed to the rotating shaft 11Yb and is relatively movable in the axial direction of the rotating shaft 11Yb. The regulating unit 11Yd regulates movement of the Y position regulating unit 11Yc and the motor 11Ya.
 Y駆動部11Yにおいては、モータ11Yaによって回転軸11Ybを回動することで、この回転軸11Ybの先端が回動可能な状態で回転軸11Ybの先端に接続された台座11dが、Y位置規制部11Ycに対してX方向に移動するように構成されている。規制部11Ydによって、台座11dの移動方向が規制されている。 In the Y drive unit 11Y, the pedestal 11d connected to the tip of the rotary shaft 11Yb in a state in which the distal end of the rotary shaft 11Yb can be pivoted by pivoting the rotary shaft 11Yb by the motor 11Ya 11 Yc is configured to move in the X direction. The movement direction of the pedestal 11d is restricted by the restriction part 11Yd.
 Y位置規制部11Ycの上端は、略平板状の水平板11cに接続固定されている。水平板11c上においては、水平板11c上に配置された部材の重量が台座11dで支持され、台座11dに対して水平板11cは、移動可能とされている。 The upper end of the Y position restricting portion 11Yc is connected and fixed to a substantially flat horizontal plate 11c. On the horizontal plate 11c, the weight of the members disposed on the horizontal plate 11c is supported by the pedestal 11d, and the horizontal plate 11c is movable with respect to the pedestal 11d.
 Z駆動部11Zは、図8,図9に示すように、モータ11Zaと、回転軸11Zbと、Z位置規制部11Zcと、規制部11Zdとを有する。モータ11Zaは、ステッピングモータまたはサーボモータで構成される。回転軸11Zbは、Z方向に延在しモータ11Zaによって回転駆動される。Z位置規制部11Zcは、回転軸11Zbに螺合されて回転軸11Zbの軸線方向に相対移動可能である。規制部11Zdは、Z位置規制部11Zcとモータ11Zaとの移動を規制する。 As shown in FIGS. 8 and 9, the Z driving unit 11Z has a motor 11Za, a rotating shaft 11Zb, a Z position regulating unit 11Zc, and a regulating unit 11Zd. The motor 11Za is configured by a stepping motor or a servomotor. The rotating shaft 11Zb extends in the Z direction and is rotationally driven by the motor 11Za. The Z position restricting portion 11Zc is screwed to the rotating shaft 11Zb and is relatively movable in the axial direction of the rotating shaft 11Zb. The regulating unit 11Zd regulates movement of the Z position regulating unit 11Zc and the motor 11Za.
 Z駆動部11Zにおいては、モータ11Zaによって回転軸11Zbを回動することで、この回転軸11Zbの先端が回動可能な状態で回転軸11Zbの先端に接続された台座11dが、Z位置規制部11Zcに対してZ方向に移動するように構成されている。規制部11Zdによって、台座11dの移動方向が規制されている。 In the Z drive unit 11Z, the pedestal 11d connected to the tip of the rotary shaft 11Zb in a state in which the distal end of the rotary shaft 11Zb can be pivoted by rotating the rotary shaft 11Zb by the motor 11Za 11 Zc is configured to move in the Z direction. The movement direction of the pedestal 11d is restricted by the restriction part 11Zd.
 Z位置規制部11Zcは、成膜室(チャンバ)4の底部である。支持アライメント部11は、凸部11aの位置をXYZ方向の自由度にて調整可能であり、成膜室(チャンバ)4の底部に固定されている。 The Z position control unit 11 Zc is a bottom portion of the film forming chamber (chamber) 4. The support alignment unit 11 can adjust the position of the convex portion 11 a with the degrees of freedom in the X, Y, and Z directions, and is fixed to the bottom of the film forming chamber 4.
 支持アライメント部11においては、モータ11Xa,モータ11Yaがいずれもチャンバ4内に配置され、かつ、成膜領域であるマスクフレームFよりも下側に位置している。この構成においては、X駆動部11X,Y駆動部11Yが、いずれも重量物であるマスクフレームFの重量を支持しながら駆動する機能を有しておらず、水平方向の位置合わせのみをおこなうため、小出力のモータを採用すればよいため、チャンバ4内に配置することが可能となっている。 In the support alignment unit 11, both the motor 11Xa and the motor 11Ya are disposed in the chamber 4 and positioned below the mask frame F which is a film formation region. In this configuration, neither the X drive unit 11X nor the Y drive unit 11Y has the function of driving while supporting the weight of the mask frame F, which is a heavy object, and performs only horizontal alignment. Since a small output motor may be employed, it can be disposed in the chamber 4.
 このため、X駆動部11X,Y駆動部11Yにおいては、モータ11Xa,モータ11Yaがいずれもステッピングモータで構成されているため、駆動制御性を高めることができる。同時に、X駆動部11X,Y駆動部11Yは、被駆動物であるマスクフレームFに対して、チャンバ4の内部で、近接した位置に配置することができる。このため、シャフト、アームなどを備えた駆動機構を用いる場合、たとえばチャンバ4の外部から距離を隔てて駆動をおこなう場合に比べて、X駆動部11X,Y駆動部11Yは、高精度にマスクフレームFの位置の設定をおこなうことが可能となる。 For this reason, in the X drive unit 11X and Y drive unit 11Y, since both the motor 11Xa and the motor 11Ya are formed by stepping motors, the drive controllability can be improved. At the same time, the X driving unit 11X and the Y driving unit 11Y can be disposed at a position close to the mask frame F, which is a driven object, inside the chamber 4. For this reason, when using a drive mechanism provided with a shaft, an arm, etc., the X drive unit 11X and Y drive unit 11Y are more accurate than the mask frame with high accuracy, for example, as compared to the case of driving at a distance from the outside of the chamber 4 It becomes possible to set the position of F.
 また、Z駆動部11Zは、重量物であるマスクフレームFの重量を支持しながら駆動するため、高出力である大型のモータであることが必要であり、同時に、チャンバ4の外部に配置してスペースに関して制限されることがないようになっている。 In addition, the Z drive unit 11Z needs to be a large-sized motor with high output in order to drive while supporting the weight of the mask frame F, which is a heavy load, and at the same time, it is disposed outside the chamber 4 There is no limit on space.
 支持アライメント部12は、凸部12aと、X駆動部12Xと、Y駆動部12Yと、Z駆動部12Zと、を有する。凸部12aは、後述するマスクフレームFに設けられた係合部F2に係合する。凸部12aは、支持アライメント部12の頂部にて上方に突出した状態に設けられている。X駆動部12Xは、この凸部12aをマスク面に垂直な略水平方向(X方向)に位置調整する際に駆動可能である。Y駆動部12Yは、凸部12aをマスク面に平行な略水平方向(Y方向)に位置調整する際に駆動可能である。Z駆動部12Zは、凸部12aを鉛直方向(Z方向)に位置調整する際に駆動可能である。 The support alignment unit 12 includes a convex portion 12 a, an X drive unit 12 X, a Y drive unit 12 Y, and a Z drive unit 12 Z. The convex portion 12a engages with an engaging portion F2 provided on a mask frame F described later. The convex portion 12 a is provided so as to project upward at the top of the support alignment portion 12. The X drive portion 12X can be driven when adjusting the position of the convex portion 12a in a substantially horizontal direction (X direction) perpendicular to the mask surface. The Y drive portion 12Y can be driven when adjusting the position of the convex portion 12a in a substantially horizontal direction (Y direction) parallel to the mask surface. The Z drive unit 12Z can be driven when adjusting the position of the convex portion 12a in the vertical direction (Z direction).
 支持アライメント部12は、図1に示すマスク室43内の成膜位置において、マスクフレームFの端部に位置する。支持アライメント部12のXY方向における配置は、図8に示すように、複数の搬送手段60の配置によって規定されたマスクフレームFの搬送経路と、凸部12aのXY方向における位置とが重なるように設定されている。
 具体的な支持アライメント部12のXY方向における位置としては、搬送経路に設けられた複数の搬送駆動部65において、駆動ローラ65aを結ぶ直線上に凸部12aのXY方向における位置がほぼ一致するように設定される。
The support alignment unit 12 is located at the end of the mask frame F at the film forming position in the mask chamber 43 shown in FIG. The arrangement of the support alignment unit 12 in the X and Y directions is such that, as shown in FIG. It is set.
As a specific position of the support alignment unit 12 in the XY direction, in the plurality of transport driving units 65 provided in the transport path, the positions of the convex portions 12 a in the XY direction substantially coincide with a straight line connecting the drive rollers 65 a Set to
 また、凸部12aのZ方向における位置としては、後述するように、凸部12aが下降した状態で、搬送経路に設けられた複数の搬送駆動部65の駆動ローラ65aを結ぶ線よりも凸部12aの上側が低い位置となる。同時に、凸部12aが上昇したアライメント状態(成膜状態)では、搬送経路に設けられた複数の搬送駆動部65の駆動ローラ65aを結ぶ線よりも凸部12aの上側が高い位置となる。 Further, as the position of the convex portion 12a in the Z direction, as described later, the convex portion is lower than the line connecting the drive rollers 65a of the plurality of conveyance drive units 65 provided in the conveyance path in a state where the convex portion 12a is lowered. The upper side of 12a is a low position. At the same time, in the alignment state (film formation state) in which the convex portion 12a is raised, the upper side of the convex portion 12a is higher than the line connecting the drive rollers 65a of the plurality of conveyance drive units 65 provided in the conveyance path.
 凸部12aは、凸部11aと同等の構成とされ、図8,図10に示すように、基部12bに対して上方向に付勢された状態で設けられている。凸部12aの上側は、球面あるいは半球面形状を有し、凸部12aは、例えば、金属で構成され、重量を有するマスクフレームFを支持可能とされている。 The convex portion 12a has a configuration equivalent to that of the convex portion 11a, and is provided in a state of being biased upward with respect to the base 12b, as shown in FIGS. The upper side of the convex portion 12a has a spherical or hemispherical shape, and the convex portion 12a is made of, for example, a metal, and can support the mask frame F having a weight.
 X駆動部12Xは、図8,図10に示すように、モータ12Xaと、回転軸12Xbと、X位置規制部12Xcと、規制部12Xdとを有する。モータ12Xaは、ステッピングモータで構成される。回転軸12Xbは、X方向に延在しモータ12Xaによって回転駆動される。X位置規制部12Xcは、回転軸12Xbに螺合されて回転軸12Xbの軸線方向に相対移動可能である。規制部12Xdは、X位置規制部12Xcとモータ12Xaとの移動を規制する。 As shown in FIGS. 8 and 10, the X drive unit 12X has a motor 12Xa, a rotation shaft 12Xb, an X position control unit 12Xc, and a control unit 12Xd. The motor 12Xa is configured by a stepping motor. The rotation shaft 12Xb extends in the X direction and is rotationally driven by the motor 12Xa. The X position restricting portion 12Xc is screwed to the rotation shaft 12Xb and is relatively movable in the axial direction of the rotation shaft 12Xb. The regulating unit 12Xd regulates movement of the X position regulating unit 12Xc and the motor 12Xa.
 X駆動部12Xにおいては、モータ12Xaによって回転軸12Xbを回動することで、この回転軸12Xbの先端が回動可能な状態で回転軸12Xbの先端に接続された基部12bが、X位置規制部12Xcに対してX方向に移動するように構成されている。規制部12Xdによって、基部12bの移動方向が規制されている。 In the X drive unit 12X, the base 12b connected to the tip of the rotary shaft 12Xb in a state in which the tip of the rotary shaft 12Xb can turn by rotating the rotary shaft 12Xb by the motor 12Xa It is configured to move in the X direction with respect to 12Xc. The movement direction of the base 12b is restricted by the restriction part 12Xd.
 X位置規制部12Xcの下端は、略平板状の水平板12cに接続固定されている。水平板12c上においては、基部12bの重量が水平板12cで支持され、水平板12cに対して基部12bは、移動可能とされている。 The lower end of the X position restricting portion 12Xc is connected and fixed to a substantially flat horizontal plate 12c. On the horizontal plate 12c, the weight of the base 12b is supported by the horizontal plate 12c, and the base 12b is movable relative to the horizontal plate 12c.
 Y駆動部12Yは、図8,図10に示すように、モータ12Yaと、回転軸12Ybと、Y位置規制部12Ycと、規制部12Ydとを有する。モータ12Yaは、ステッピングモータで構成される。回転軸12Ybは、Y方向に延在しモータ12Yaによって回転駆動される。Y位置規制部12Ycは、回転軸12Ybに螺合されて回転軸12Ybの軸線方向に相対移動可能である。規制部12Ydは、Y位置規制部12Ycとモータ12Yaとの移動を規制する。 As shown in FIGS. 8 and 10, the Y drive unit 12Y has a motor 12Ya, a rotation shaft 12Yb, a Y position control unit 12Yc, and a control unit 12Yd. The motor 12Ya is configured by a stepping motor. The rotating shaft 12Yb extends in the Y direction and is rotationally driven by the motor 12Ya. The Y position restricting portion 12Yc is screwed to the rotation shaft 12Yb and is relatively movable in the axial direction of the rotation shaft 12Yb. The regulating unit 12Yd regulates movement of the Y position regulating unit 12Yc and the motor 12Ya.
 Y駆動部12Yにおいては、モータ12Yaによって回転軸12Ybを回動することで、この回転軸12Ybの先端が回動可能な状態で回転軸12Ybの先端に接続された台座12dが、Y位置規制部12Ycに対してX方向に移動するように構成されている。規制部12Ydによって、台座12dの移動方向が規制されている。 In the Y drive unit 12Y, the pedestal 12d connected to the tip of the rotary shaft 12Yb in a state where the tip of the rotary shaft 12Yb can be turned by pivoting the rotary shaft 12Yb by the motor 12Ya It is configured to move in the X direction with respect to 12Yc. The movement direction of the pedestal 12d is restricted by the restriction part 12Yd.
 Y位置規制部12Ycの上端は、略平板状の水平板12cに接続固定されている。台座12d上においては、水平板12c上に配置された部材の重量が台座12dで支持され、台座12dに対して水平板12cは、移動可能とされている。 The upper end of the Y position restricting portion 12Yc is connected and fixed to a substantially flat horizontal plate 12c. On the pedestal 12d, the weight of the member disposed on the horizontal plate 12c is supported by the pedestal 12d, and the horizontal plate 12c is movable with respect to the pedestal 12d.
 Z駆動部12Zは、図8,図10に示すように、モータ12Zaと、回転軸12Zbと、Z位置規制部12Zcと、規制部12Zdとを有する。モータ12Zaは、ステッピングモータまたはサーボモータで構成される。回転軸12Zbは、Z方向に延在しモータ12Zaによって回転駆動される。Z位置規制部12Zcは、回転軸12Zbに螺合されて回転軸12Zbの軸線方向に相対移動可能である。規制部12Zdは、Z位置規制部12Zcとモータ12Zaとの移動を規制する。 As shown in FIGS. 8 and 10, the Z driving unit 12Z has a motor 12Za, a rotating shaft 12Zb, a Z position regulating unit 12Zc, and a regulating unit 12Zd. The motor 12Za is configured by a stepping motor or a servomotor. The rotating shaft 12Zb extends in the Z direction and is rotationally driven by the motor 12Za. The Z position restricting portion 12Zc is screwed to the rotation shaft 12Zb and is relatively movable in the axial direction of the rotation shaft 12Zb. The regulating unit 12Zd regulates movement of the Z position regulating unit 12Zc and the motor 12Za.
 Z駆動部12Zにおいては、モータ12Zaによって回転軸12Zbを回動することで、この回転軸12Zbの先端が回動可能な状態で回転軸12Zbの先端に接続された台座12dが、Z位置規制部12Zcに対してZ方向に移動するように構成されている。規制部12Zdによって、台座12dの移動方向が規制されている。 In the Z drive unit 12Z, the pedestal 12d connected to the tip of the rotation shaft 12Zb in a state in which the tip of the rotation shaft 12Zb can be rotated by rotating the rotation shaft 12Zb by the motor 12Za It is configured to move in the Z direction with respect to 12Zc. The movement direction of the pedestal 12d is restricted by the restriction part 12Zd.
 Z位置規制部12Zcは、成膜室(チャンバ)4の底部である。支持アライメント部12は、凸部12aの位置をXYZ方向の自由度にて調整可能であり、成膜室(チャンバ)4の底部に固定されている。 The Z position restricting portion 12Zc is a bottom portion of the film forming chamber (chamber) 4. The support alignment unit 12 can adjust the position of the convex portion 12 a with the degrees of freedom in the X, Y, and Z directions, and is fixed to the bottom of the film forming chamber 4.
 支持アライメント部12においては、モータ12Xa,モータ12Yaがいずれもチャンバ4内に配置され、かつ、成膜領域であるマスクフレームFよりも下側に位置している。この構成においては、X駆動部12X,Y駆動部12Yが、いずれも重量物であるマスクフレームFの重量を支持しながら駆動する機能を有しておらず、水平方向の位置合わせのみをおこなうため、小出力のモータを採用すればよいため、チャンバ4内に配置することが可能となっている。 In the support alignment unit 12, both the motor 12Xa and the motor 12Ya are disposed in the chamber 4 and located below the mask frame F which is a film formation region. In this configuration, neither the X drive unit 12X nor the Y drive unit 12Y has the function of driving while supporting the weight of the mask frame F, which is a heavy object, and performs only horizontal alignment. Since a small output motor may be employed, it can be disposed in the chamber 4.
 このため、X駆動部12X,Y駆動部12Yにおいては、モータ12Xa,モータ12Yaがいずれもステッピングモータで構成されているため、駆動制御性を高めることができる。同時に、X駆動部12X,Y駆動部12Yは、被駆動物であるマスクフレームFに対して、チャンバ4内で、近接した位置に配置することができる。このため、シャフト、アームなどを備えた駆動機構を用いる場合、たとえばチャンバ4の外部から距離を隔てて駆動をおこなう場合に比べて、X駆動部12X,Y駆動部12Yは、高精度にマスクフレームFの位置の設定をおこなうことが可能となる。 For this reason, in the X drive unit 12X and Y drive unit 12Y, since both the motor 12Xa and the motor 12Ya are configured by stepping motors, the drive controllability can be improved. At the same time, the X driving unit 12X and the Y driving unit 12Y can be disposed at a position close to each other in the chamber 4 with respect to the mask frame F which is a driven object. Therefore, when using a drive mechanism provided with a shaft, an arm, etc., the X drive unit 12X and Y drive unit 12Y can achieve a mask frame with high accuracy as compared with, for example, driving at a distance from the outside of the chamber 4 It becomes possible to set the position of F.
 また、Z駆動部12Zは、重量物であるマスクフレームFの重量を支持しながら駆動するため、高出力である大型のモータであることが必要であり、同時に、チャンバ4の外部に配置してスペースに関して制限されることがないようになっている。 In addition, the Z drive unit 12Z needs to be a large-sized motor with high output in order to drive while supporting the weight of the mask frame F, which is a heavy load, and at the same time, it is disposed outside the chamber 4 There is no limit on space.
 支持アライメント部11と支持アライメント部12とは、略同一の構成とされ、マスクフレームFにおける成膜位置の左右方向における両端側となる位置に配置されている。 The support alignment unit 11 and the support alignment unit 12 have substantially the same configuration, and are disposed at positions on both sides in the left-right direction of the film formation position of the mask frame F.
 図11は、本実施形態におけるスパッタリング装置の上部アライメント部を示す斜視図である。図12は、本実施形態におけるスパッタリング装置の上部アライメント部を示す斜視図である。
 上部アライメント部13は、挟持部13Aと、X駆動部13Xと、回転駆動部13Rと、を有する。挟持部13Aは、マスクフレームFの上端における左右方向(Y方向)における端部である角部の付近の部位を挟持して係止可能である。X駆動部13Xは、挟持部13Aをマスク面に垂直な略水平方向(X方向)に駆動して位置調整するように駆動可能である。回転駆動部13Rは、挟持部13Aをマスク面に略平行なYZ面内で回動可能である。
FIG. 11 is a perspective view showing the upper alignment portion of the sputtering apparatus in the present embodiment. FIG. 12 is a perspective view showing the upper alignment portion of the sputtering apparatus in the present embodiment.
The upper alignment unit 13 includes a holding unit 13A, an X drive unit 13X, and a rotation drive unit 13R. The holding portion 13A can hold and lock a portion in the vicinity of a corner which is an end portion in the left-right direction (Y direction) at the upper end of the mask frame F. The X drive unit 13X is drivable so as to adjust the position by driving the holding unit 13A in a substantially horizontal direction (X direction) perpendicular to the mask surface. The rotation drive unit 13R can rotate the holding unit 13A in the YZ plane substantially parallel to the mask surface.
 挟持部13Aは、図8,図11に示すように、挟持片13Aa,13Abと、基部13Acと、を有している。挟持片13Aa,13Abは、マスクフレームFの端部において、マスクフレームFの表面および裏面のそれぞれに当接する。基部13Acは、挟持片13Aa,13Abを平行状態に維持し、挟持片13Aa,13Abの間の距離をマスクフレームFの厚さとほぼ同等に設定する。基部13Acには、挟持片13Aa,13Abの基端が固定される。 As shown in FIGS. 8 and 11, the sandwiching portion 13A includes sandwiching pieces 13Aa and 13Ab and a base 13Ac. The clamping pieces 13Aa and 13Ab abut on the front and back surfaces of the mask frame F at the end of the mask frame F, respectively. The base 13Ac maintains the sandwiching pieces 13Aa and 13Ab in parallel, and sets the distance between the sandwiching pieces 13Aa and 13Ab substantially equal to the thickness of the mask frame F. The base ends of the holding pieces 13Aa and 13Ab are fixed to the base 13Ac.
 また、挟持部13Aの基部13Acにおいて、挟持片13Aa,13Abの延在方向における凸部13Ad,13Aeとは反対側の位置には、これら挟持片13Aa,13Abと略直交するように交差して回転軸13Bの先端が接続される。
 挟持片13Aa,13Abの先端には、互いに対向する内側面に位置するように凸部13Ad,13Aeが設けられている。
In the base 13Ac of the sandwiching portion 13A, the sandwiching pieces 13Aa and 13Ae intersect at a position opposite to the protrusions 13Ad and 13Ae in the extending direction of the sandwiching pieces 13Aa and 13Ab so as to intersect the sandwiching pieces 13Aa and 13Ab substantially orthogonally and rotate. The tip of the shaft 13B is connected.
Convex parts 13Ad and 13Ae are provided at the tips of the holding pieces 13Aa and 13Ab so as to be positioned on the inner side surfaces facing each other.
 凸部13Ad,13Aeは、挟持片13Aa,13AbがマスクフレームFを挟持した状態で、挟持片13Aa,13AbとマスクフレームFとがX方向にずれないように、互いに近接する方向に付勢されている。また、凸部13Ad,13Aeは、挟持片13Aa,13AbがマスクフレームFを挟持する際に、挟持片13Aa,13AbとマスクフレームFとがX方向にずれていた際に、このずれを吸収して挟持片13Aaと挟持片13Abとの間にマスクフレームFを維持することが可能なように、互いに近接する方向に付勢されている。
 凸部13Ad,13Aeは、いずれも、互いに近接する方向に突出する球面あるいは半球面形状を有し、例えば、金属で構成され、マスクフレームFの重量を支持可能とされている。
The convex portions 13Ad and 13Ae are biased in the direction in which the holding pieces 13Aa and 13Ab and the mask frame F are close to each other so that the holding members 13Aa and 13Ab and the mask frame F do not shift in the X direction. There is. Further, when the holding pieces 13Aa and 13Ab hold the mask frame F, the convex portions 13Ad and 13Ae absorb the deviation when the holding members 13Aa and 13Ab and the mask frame F are shifted in the X direction. In order to be able to maintain the mask frame F between the sandwiching piece 13Aa and the sandwiching piece 13Ab, they are urged in the direction in which they approach each other.
Each of the convex portions 13Ad and 13Ae has a spherical or hemispherical shape projecting in a direction close to each other, and is made of, for example, a metal, and can support the weight of the mask frame F.
 回転軸13Bは、マスク面に垂直な略水平方向(X方向)に延在して、回転軸13Bの軸線の周りに回動可能とされる。また、回転軸13Bは、軸線方向(X方向)に進退可能とされている。
 回転軸13Bの先端には、挟持部13Aの基部13Acが径方向に突出するように接続固定される。回転軸13Bの基端には、回転駆動部13Rのモータ13Raが接続され、回転軸13Bの軸線周りに駆動可能とされている。
The rotation axis 13B extends in a substantially horizontal direction (X direction) perpendicular to the mask surface, and is rotatable around the axis of the rotation axis 13B. Further, the rotary shaft 13B can be advanced and retracted in the axial direction (X direction).
The base 13Ac of the holding portion 13A is connected and fixed to the tip of the rotary shaft 13B so as to project in the radial direction. The motor 13Ra of the rotation drive unit 13R is connected to the base end of the rotation shaft 13B, and can be driven around the axis of the rotation shaft 13B.
 回転駆動部13Rのモータ13Raは、マスク面と平行に延在する平板部13Cに固定されている。この平板部13Cに対してX位置規制部13XcがX駆動部13Xによって駆動されることで、回転軸13Bおよび挟持部13Aが回転軸13Bの軸線方向に駆動可能とされている。 The motor 13Ra of the rotational drive unit 13R is fixed to a flat plate portion 13C extending in parallel with the mask surface. The rotation shaft 13B and the sandwiching portion 13A can be driven in the axial direction of the rotation shaft 13B by driving the X position control unit 13Xc with respect to the flat plate portion 13C by the X drive unit 13X.
 X駆動部13Xは、図8,図11に示すように、モータ13Xaと、回転軸13Xbと、X位置規制部13Xcと、規制部13Xdとを有する。
モータ13Xaは、ステッピングモータで構成される。回転軸13Xbは、X方向に延在しモータ13Xaによって回転駆動される。X位置規制部13Xcは、回転軸13Xbに螺合されて回転軸13Xbの軸線方向に相対移動可能である。規制部13Xdは、X位置規制部13Xcとモータ13Xaとの移動をX方向に規制する。
As shown in FIGS. 8 and 11, the X drive unit 13X has a motor 13Xa, a rotation shaft 13Xb, an X position control unit 13Xc, and a control unit 13Xd.
The motor 13Xa is configured by a stepping motor. The rotation shaft 13Xb extends in the X direction and is rotationally driven by the motor 13Xa. The X position restricting portion 13Xc is screwed to the rotation shaft 13Xb and is relatively movable in the axial direction of the rotation shaft 13Xb. The regulating unit 13Xd regulates movement of the X position regulating unit 13Xc and the motor 13Xa in the X direction.
 X駆動部13Xにおいては、モータ13Xaによって回転軸13Xbを回動することで、この回転軸13Xbの基端側が接続されたX位置規制部13Xcが、平板部13Cに対してX方向に移動するように構成されている。規制部13Xdによって、X位置規制部13Xcの移動方向が規制されている。
 平板部13Cは、成膜室(チャンバ)4の側部である。上部アライメント部13は、挟持部13Aの位置をX方向の自由度にて調整可能であり、成膜室(チャンバ)4の側部に固定されている。
In the X drive unit 13X, by rotating the rotation shaft 13Xb by the motor 13Xa, the X position regulation unit 13Xc connected to the base end side of the rotation shaft 13Xb moves in the X direction with respect to the flat plate portion 13C. Is configured. The moving direction of the X position restricting portion 13Xc is restricted by the restricting portion 13Xd.
The flat plate portion 13C is a side portion of the film forming chamber (chamber) 4. The upper alignment unit 13 can adjust the position of the sandwiching unit 13A with a degree of freedom in the X direction, and is fixed to the side of the film forming chamber (chamber) 4.
 上部アライメント部13においては、まず、回転駆動部13Rのモータ13Raによって回転軸13Bを軸線周りに駆動する。これにより、挟持部13Aが、成膜位置とされるマスクフレームFと干渉しない位置となるように、回転軸13Bの軸線周りの角度位置を設定する。 In the upper alignment unit 13, first, the rotation shaft 13B is driven around the axis by the motor 13Ra of the rotation drive unit 13R. As a result, the angular position around the axis of the rotation shaft 13B is set so that the sandwiching portion 13A does not interfere with the mask frame F, which is the film formation position.
 次に、図11に示すように、X駆動部13Xのモータ13Xaによって回転軸13Xbを回動して、X位置規制部13XcをX方向に移動させる。これにより、回転軸13Bを軸線方向に駆動して挟持部13AのX方向における位置を設定し、挟持片13Aa,13Abの間にマスクフレームFの上端が位置するようにする。 Next, as shown in FIG. 11, the rotary shaft 13Xb is rotated by the motor 13Xa of the X drive unit 13X to move the X position regulation unit 13Xc in the X direction. As a result, the rotary shaft 13B is driven in the axial direction to set the position of the holding portion 13A in the X direction so that the upper end of the mask frame F is positioned between the holding pieces 13Aa and 13Ab.
 この状態で、図12に示すように、回転駆動部13Rのモータ13Raによって回転軸13Bを軸線周りに回動することで、挟持部13Aにおける挟持片13Aa,13Abの間にマスクフレームFの上端が位置するように、挟持部13Aにおける回転軸13Bの軸線周りの角度位置を設定する。これにより、凸部13Ad,13AeがそれぞれマスクフレームFの表面および裏面に当接して、マスクフレームFが挟持片13Aa,13Abによって挟持された状態となる。 In this state, as shown in FIG. 12, the upper end of the mask frame F is held between the holding pieces 13Aa and 13Ab in the holding portion 13A by rotating the rotation shaft 13B around the axis by the motor 13Ra of the rotation driving portion 13R. The angular position around the axis of the rotary shaft 13B in the sandwiching portion 13A is set so as to be positioned. Thereby, convex part 13Ad, 13Ae each contact | abuts on the surface and back surface of the mask frame F, and the mask frame F will be in the state clamped by clamping piece 13Aa, 13Ab.
 この状態で、X駆動部13Xのモータ13Xaによって回転軸13Xbを回動して、X位置規制部13XcをX方向に移動させることで、回転軸13Bを軸線方向に駆動してマスクフレームFの上端におけるX方向における位置を微調整することが可能となる。 In this state, the rotary shaft 13Xb is rotated by the motor 13Xa of the X drive unit 13X to move the X position regulating unit 13Xc in the X direction, thereby driving the rotary shaft 13B in the axial direction to move the upper end of the mask frame F It is possible to finely adjust the position in the X direction in.
 上部アライメント部13においては、回転駆動部13Rのモータ13Raが成膜室(チャンバ)4の外側位置に配置されており、また、X駆動部13Xのモータ13Xaが成膜室(チャンバ)4の外側位置に配置されている。したがって、回転軸13Bの軸線周りにおける挟持部13Aの角度位置の調整は、成膜室(チャンバ)4の外側からおこなわれる。また、回転軸13Bの軸線方向における挟持部13Aの位置の調整も、成膜室(チャンバ)4の外側からおこなわれる。これにより、チャンバ4内に発生したゴミが拡散することを防止できる。 In the upper alignment unit 13, the motor 13 Ra of the rotation drive unit 13 R is disposed at the outer position of the film forming chamber 4, and the motor 13 Xa of the X drive unit 13 X is at the outer side of the film forming chamber 4. It is placed in position. Therefore, the adjustment of the angular position of the sandwiching portion 13A around the axis of the rotation shaft 13B is performed from the outside of the film forming chamber (chamber) 4. Further, adjustment of the position of the sandwiching portion 13A in the axial direction of the rotating shaft 13B is also performed from the outside of the film forming chamber (chamber) 4. Thereby, the dust generated in the chamber 4 can be prevented from diffusing.
 上部アライメント部13,14は、左右方向であるY方向において並ぶように配置されている。上部アライメント部13,14は、図8に示すように、マスクフレームFの中心線(Z方向、重力方向)に対して、略対称な構成を有するように設けられている。このため、上部アライメント部14は、以下に符号のみ記載され、図において隠れている構成もある。 The upper alignment portions 13 and 14 are arranged in line in the Y direction which is the left and right direction. The upper alignment portions 13 and 14 are provided so as to have a substantially symmetrical configuration with respect to the center line (Z direction, gravity direction) of the mask frame F, as shown in FIG. For this reason, the upper alignment unit 14 is described only with reference numerals below, and there is also a configuration in which it is hidden in the figure.
 上部アライメント部14は、挟持部14Aと、X駆動部14Xと、回転駆動部14Rと、を有する。挟持部14Aは、マスクフレームFの上端における左右方向(Y方向)における端部である角部の付近の部位を挟持して係止可能である。X駆動部14Xは、挟持部14Aをマスク面に垂直な略水平方向(X方向)に駆動して位置調整する際に駆動可能である。回転駆動部14Rは、挟持部14Aをマスク面に略平行なYZ面内で回動可能である。 The upper alignment unit 14 includes a holding unit 14A, an X drive unit 14X, and a rotation drive unit 14R. The holding portion 14A can hold and lock a portion in the vicinity of a corner which is an end portion in the left-right direction (Y direction) at the upper end of the mask frame F. The X drive unit 14X can be driven when adjusting the position by driving the sandwiching unit 14A in a substantially horizontal direction (X direction) perpendicular to the mask surface. The rotation drive unit 14R is capable of rotating the holding unit 14A in the YZ plane substantially parallel to the mask surface.
 挟持部14Aは、図8に示すように、挟持片14Aa,14Abと、基部14Acと、を有している。挟持片14Aa,14Abは、マスクフレームFの端部において、マスクフレームFの表面および裏面のそれぞれに当接する。基部14Acは、挟持片14Aa,14Abを平行状態に維持し、挟持片14Aa,14Abの間の距離をマスクフレームFの厚さとほぼ同等に設定する。基部14Acには、挟持片14a,14Abの基端が固定されている。 As shown in FIG. 8, the sandwiching portion 14A includes sandwiching pieces 14Aa and 14Ab and a base 14Ac. The clamping pieces 14Aa and 14Ab abut on the front surface and the back surface of the mask frame F at the end of the mask frame F, respectively. The base 14Ac maintains the sandwiching pieces 14Aa and 14Ab in parallel, and sets the distance between the sandwiching pieces 14Aa and 14Ab substantially equal to the thickness of the mask frame F. The base ends of the sandwiching pieces 14a and 14Ab are fixed to the base 14Ac.
 また、挟持部14Aの基部14Acにおいて、挟持片14Aa,14Abの延在方向における凸部14Ad,14Aeとは反対側の位置には、これら挟持片14Aa,14Abと略直交するように交差して回転軸14Bの先端が接続される。
 挟持片14Aa,14Abの先端には、互いに対向する内側面に位置するように凸部14Ad,14Aeが設けられている。
Further, at the base 14Ac of the holding portion 14A, the holding pieces 14Aa and 14Ab cross at a position opposite to the convex portions 14Ad and 14Ae in the extension direction so as to intersect the holding pieces 14Aa and 14Ab substantially orthogonally The tip of the shaft 14B is connected.
Convex parts 14Ad and 14Ae are provided at the tips of the sandwiching pieces 14Aa and 14Ab so as to be positioned on the inner side surfaces facing each other.
 凸部14Ad,14Aeは、挟持片14Aa,14AbがマスクフレームFを挟持した状態で、挟持片14Aa,14AbとマスクフレームFとがX方向にずれないように、互いに近接する方向に付勢されている。また、凸部14Ad,14Aeは、挟持片14Aa,14AbがマスクフレームFを挟持する際に、挟持片14Aa,14AbとマスクフレームFとがX方向にずれていた際にこのずれを吸収して、挟持片14Aaと挟持片14Abとの間にマスクフレームFを維持することが可能なように、互いに近接する方向に付勢されている。
 凸部14Ad,14Aeは、いずれも、互いに近接する方向に突出する球面あるいは半球面形状を有し、例えば、金属で構成され、マスクフレームFの重量を支持可能とされている。
The convex portions 14Ad and 14Ae are biased in a direction in which the holding pieces 14Aa and 14Ab and the mask frame F move close to each other in the X direction while the holding pieces 14Aa and 14Ab hold the mask frame F. There is. In addition, when the sandwiching pieces 14Aa and 14Ab sandwich the mask frame F, the convex portions 14Ad and 14Ae absorb the misalignment when the sandwiching pieces 14Aa and 14Ab shift from the mask frame F in the X direction, In order to be able to maintain the mask frame F between the sandwiching piece 14Aa and the sandwiching piece 14Ab, they are urged in the direction in which they approach each other.
Each of the convex portions 14Ad and 14Ae has a spherical or hemispherical shape projecting in a direction close to each other, and is made of, for example, a metal, and can support the weight of the mask frame F.
 回転軸14Bは、マスク面に垂直な略水平方向(X方向)に延在して、回転軸14Bの軸線周りに回動可能とされる。また、回転軸14Bは、軸線方向(X方向)に進退可能とされている。
 回転軸14Bの先端には、挟持部14Aの基部14Acが径方向に突出するように接続固定される。回転軸14Bの基端には、回転駆動部14Rのモータ14Raが接続され、回転軸14Bの軸線周りに駆動可能とされている。
The rotation axis 14B extends in a substantially horizontal direction (X direction) perpendicular to the mask surface, and is rotatable around the axis of the rotation axis 14B. Further, the rotation shaft 14B can be advanced and retracted in the axial direction (X direction).
The base 14Ac of the holding portion 14A is connected and fixed to the tip of the rotation shaft 14B so as to project in the radial direction. The motor 14Ra of the rotation drive unit 14R is connected to the base end of the rotation shaft 14B, and can be driven around the axis of the rotation shaft 14B.
 回転駆動部14Rのモータ14Raは、マスク面と平行に延在する平板部14Cに固定されている。この平板部14Cに対してX位置規制部14XcがX駆動部14Xによって駆動されることで、回転軸14Bおよび挟持部14Aが回転軸14Bの軸線方向に駆動可能とされている。 The motor 14Ra of the rotational drive unit 14R is fixed to a flat plate portion 14C extending in parallel with the mask surface. The rotation shaft 14B and the sandwiching portion 14A can be driven in the axial direction of the rotation shaft 14B by driving the X position control unit 14Xc with respect to the flat plate portion 14C by the X drive unit 14X.
 X駆動部14Xは、図8に示すように、モータ14Xaと、回転軸14Xbと、X位置規制部14Xcと、規制部14Xdとを有する。モータ14Xaは、ステッピングモータで構成される。回転軸14Xbは、X方向に延在しモータ14Xaによって回転駆動される。X位置規制部14Xcは、回転軸14Xbに螺合されて回転軸14Xbの軸線方向に相対移動可能である。規制部14Xdは、X位置規制部14Xcとモータ14Xaとの移動をX方向に規制する。 As shown in FIG. 8, the X drive unit 14X includes a motor 14Xa, a rotation shaft 14Xb, an X position control unit 14Xc, and a control unit 14Xd. The motor 14Xa is configured by a stepping motor. The rotating shaft 14Xb extends in the X direction and is rotationally driven by the motor 14Xa. The X position restricting portion 14Xc is screwed to the rotary shaft 14Xb and is relatively movable in the axial direction of the rotary shaft 14Xb. The restricting unit 14Xd restricts the movement of the X position restricting unit 14Xc and the motor 14Xa in the X direction.
 X駆動部14Xにおいては、モータ14Xaによって回転軸14Xbを回動することで、この回転軸14Xbの基端側が接続されたX位置規制部14Xcが、平板部14Cに対してX方向に移動するように構成されている。規制部14Xdによって、X位置規制部14Xcの移動方向が規制されている。
 平板部14Cは、成膜室(チャンバ)4の側部である。上部アライメント部14は、挟持部14Aの位置をX方向の自由度にて調整可能であり、成膜室(チャンバ)4の側部に固定されている。
In the X drive unit 14X, by rotating the rotation shaft 14Xb by the motor 14Xa, the X position regulation unit 14Xc to which the base end side of the rotation shaft 14Xb is connected moves in the X direction with respect to the flat plate portion 14C. Is configured. The moving direction of the X position restricting portion 14Xc is restricted by the restricting portion 14Xd.
The flat plate portion 14C is a side portion of the film formation chamber (chamber) 4. The upper alignment unit 14 can adjust the position of the holding unit 14A with the freedom in the X direction, and is fixed to the side of the film forming chamber (chamber) 4.
 上部アライメント部14においては、まず、回転駆動部14Rのモータ14Raによって回転軸14Bを軸線周りに駆動する。これにより、挟持部14Aが、成膜位置とされるマスクフレームFと干渉しない位置となるように、回転軸14Bの軸線周りの角度位置を設定する。 In the upper alignment unit 14, first, the rotation shaft 14B is driven around the axis by the motor 14Ra of the rotation drive unit 14R. As a result, the angular position around the axis of the rotation shaft 14B is set so that the sandwiching portion 14A does not interfere with the mask frame F, which is the film formation position.
 次に、X駆動部14Xのモータ14Xaによって回転軸14Xbを回動して、X位置規制部14XcをX方向に移動させる。これにより、回転軸14Bを軸線方向に駆動して挟持部14AのX方向における位置を設定し、挟持片14Aa,14Abの間にマスクフレームFの上端が位置するようにする。 Next, the rotary shaft 14Xb is rotated by the motor 14Xa of the X drive unit 14X to move the X position regulation unit 14Xc in the X direction. Thus, the rotary shaft 14B is driven in the axial direction to set the position of the holding portion 14A in the X direction so that the upper end of the mask frame F is positioned between the holding pieces 14Aa and 14Ab.
 この状態で、回転駆動部14Rのモータ14Raによって回転軸14Bを軸線周りに回動する。これにより、図8に示すように、挟持部14Aにおける挟持片14Aa,14Abの間にマスクフレームFの上端が位置となるように、挟持部13Aにおける回転軸13Bの軸線周りの角度位置を設定する。これにより、凸部14Ad,14AeがそれぞれマスクフレームFの表面および裏面に当接して、マスクフレームFが挟持片14Aa,14Abによって挟持された状態となる。 In this state, the rotary shaft 14B is pivoted about the axis by the motor 14Ra of the rotary drive unit 14R. Thereby, as shown in FIG. 8, the angular position around the axis of the rotation shaft 13B in the holding portion 13A is set so that the upper end of the mask frame F is positioned between the holding pieces 14Aa and 14Ab in the holding portion 14A. . Thereby, convex part 14Ad, 14Ae each contact | abuts on the surface and back surface of the mask frame F, and the mask frame F will be in the state clamped by clamping piece 14Aa, 14Ab.
 この状態で、X駆動部14Xのモータ14Xaによって回転軸14Xbを回動して、X位置規制部14XcをX方向に移動させることで、回転軸14Bを軸線方向に駆動してマスクフレームFの上端におけるX方向における位置を微調整することが可能となる。 In this state, the rotary shaft 14Xb is rotated by the motor 14Xa of the X drive unit 14X to move the X position regulating unit 14Xc in the X direction, thereby driving the rotary shaft 14B in the axial direction to move the upper end of the mask frame F It is possible to finely adjust the position in the X direction in.
 上部アライメント部14においても、回転駆動部14Rのモータ14Raが成膜室(チャンバ)4の外側位置に配置されており、また、X駆動部14Xのモータ14Xaが成膜室(チャンバ)4の外側位置に配置されている。したがって、挟持部14Aにおける回転軸14Bの軸線周りの角度位置調整、および、挟持部14Aにおける回転軸14Bの軸線方向の位置調整は、いずれも、成膜室(チャンバ)4の外側からおこなわれる。これにより、チャンバ4内に発生したゴミが拡散することを防止できる。 In the upper alignment unit 14 as well, the motor 14Ra of the rotational drive unit 14R is disposed at the outside position of the film forming chamber 4 and the motor 14Xa of the X drive unit 14X is outside the film forming chamber 4 It is placed in position. Therefore, angular position adjustment around the axis of the rotary shaft 14B in the sandwiching portion 14A and axial position adjustment of the rotary shaft 14B in the sandwiching portion 14A are both performed from the outside of the film forming chamber (chamber) 4. Thereby, the dust generated in the chamber 4 can be prevented from diffusing.
 図13は、本実施形態におけるマスクフレームの係合部を示す斜視図である。図14は、本実施形態におけるマスクフレームの係合部を示す斜視図である。図15は、本実施形態におけるスパッタリング装置における支持アライメント部とマスクフレームにおける係合部との係合状態を示す斜視図である。図16は、本実施形態におけるスパッタリング装置における支持アライメント部とマスクフレームにおける係合部との係合状態を示す斜視図である。
 マスクフレームFは、図2,図8,図13,図14に示すように、略矩形の枠体Faの下端の両端部、つまり、Z方向における下側でY方向における両端位置に、係合部F1および係合部F2がそれぞれ設けられている。
FIG. 13 is a perspective view showing the engaging portion of the mask frame in the present embodiment. FIG. 14 is a perspective view showing the engagement portion of the mask frame in the present embodiment. FIG. 15 is a perspective view showing an engaged state of the support alignment portion in the sputtering apparatus in the present embodiment and the engagement portion in the mask frame. FIG. 16 is a perspective view showing an engaged state of the support alignment portion in the sputtering apparatus in the present embodiment and the engagement portion in the mask frame.
As shown in FIGS. 2, 8, 13 and 14, the mask frame F is engaged at both ends of the lower end of the substantially rectangular frame Fa, that is, at both ends in the Y direction on the lower side in the Z direction. The part F1 and the engaging part F2 are provided, respectively.
 係合部F1は、図8,図13に示すように、マスクフレームFの一端側に設けられ、枠体Faの下端よりも下側に突出する。係合部F1の底面には、係合凹部F1aが設けられている。 The engaging portion F1 is provided on one end side of the mask frame F, as shown in FIGS. 8 and 13, and protrudes below the lower end of the frame body Fa. An engagement recess F1a is provided on the bottom surface of the engagement portion F1.
 係合凹部F1aは、図13に示すように、略球面状の表面形状を有しており、支持アライメント部11の凸部11aが係合して、XY方向に位置規制が可能なように形成されている。 As shown in FIG. 13, the engagement recess F1a has a substantially spherical surface shape, and is formed so that the projection 11a of the support alignment portion 11 can be engaged and position regulation can be performed in the X and Y directions. It is done.
 すなわち、平面視において、係合凹部F1aの中心位置に対して凸部11aの中心位置が径方向にずれた状態で、凸部11aが係合凹部F1aに当接した場合でも、Z方向において凸部11aと係合凹部F1aとが近接することに伴って、凸部11aの外面が係合凹部F1aの内面に沿ってXY方向に移動する。 That is, even when the convex portion 11a abuts on the engaging concave portion F1a in a state where the central position of the convex portion 11a is shifted in the radial direction with respect to the central position of the engaging concave portion F1a in plan view, the convex in the Z direction As the portion 11a and the engagement recess F1a approach each other, the outer surface of the projection 11a moves in the X and Y directions along the inner surface of the engagement recess F1a.
 そして、最終的に、図15に示すように、Z方向において凸部11aと係合凹部F1aとが最も近接した状態、すなわち、係合凹部F1aが凸部11aに載置された状態で、凸部11aの全周が係合凹部F1aの全周に、円を形成するように線接触する。これにより、平面視において、係合凹部F1aの中心位置に対して凸部11aの中心位置がXY方向に一致した状態となるように、マスクフレームFの位置が設定される。 Then, finally, as shown in FIG. 15, the convex portion 11a and the engaging concave portion F1a are closest to each other in the Z direction, that is, in the state where the engaging concave portion F1a is placed on the convex portion 11a, The entire circumference of the portion 11a is in line contact with the entire circumference of the engagement recess F1a so as to form a circle. Thereby, the position of the mask frame F is set so that the center position of the convex portion 11a matches the XY position with respect to the central position of the engagement concave portion F1a in plan view.
 なお、係合凹部F1aおよび凸部11aの形状は、それぞれが互いに中心位置をXY方向における位置を設定可能な形状であれば、上述した形状に限られるものではなく、他の形状を用いることも可能である。
 例えば、係合凹部F1aおよび凸部11aが互いに嵌合する凹凸形状が上述した実施形態とは逆に設定されている構造が採用されてもよい。具体的に、マスクフレームFに凸形状の部材が設けられ、支持アライメント部11に凹形状の部材が設けられている構造が採用されてもよい。また、係合凹部F1aと凸部11aとのいずれかの形状として、球面形状ではなく円錐状に形成された形状、または、多角錐などの形状を採用することもできる。
The shapes of the engagement concave portion F1a and the convex portion 11a are not limited to the above-described shapes as long as they can set the center position in the X and Y directions with each other, and other shapes may be used. It is possible.
For example, a structure may be employed in which the concavo-convex shape in which the engagement concave portion F1a and the convex portion 11a are fitted to each other is set reverse to the embodiment described above. Specifically, a structure in which a convex member is provided on the mask frame F and a concave member is provided on the support alignment unit 11 may be employed. Also, as the shape of either the engagement concave portion F1a or the convex portion 11a, a shape formed in a conical shape instead of a spherical shape, or a shape such as a polygonal pyramid may be adopted.
 係合部F2は、図8,図14に示すように、マスクフレームFの一端側に設けられ、枠体Faの下端よりも下側に突出する。係合部F2の底面には、係合溝部F2aが設けられている。 The engaging portion F2 is provided on one end side of the mask frame F, as shown in FIGS. 8 and 14, and protrudes below the lower end of the frame body Fa. An engagement groove F2a is provided on the bottom surface of the engagement portion F2.
 係合溝部F2aは、図14に示すように、枠体Faの下端が延在する方向、つまり、Y方向に略同一形状を有するように延在している。さらに係合溝部F2aは、係合溝部F2aのXZ方向の断面が、係合溝部F2aの延在する方向において略同一である、円弧状の表面形状を有する。係合溝部F2aの円弧形状は、支持アライメント部12の凸部12aが係合して、Y方向に自由度を有して、X方向における凸部12aの位置が設定可能なように形成されている。 As shown in FIG. 14, the engagement groove F2a extends so as to have substantially the same shape in the direction in which the lower end of the frame Fa extends, that is, in the Y direction. Furthermore, the engaging groove F2a has an arc-shaped surface shape in which the cross section in the XZ direction of the engaging groove F2a is substantially the same in the extending direction of the engaging groove F2a. The arc shape of the engagement groove F2a is formed so that the convex portion 12a of the support alignment portion 12 engages and has freedom in the Y direction so that the position of the convex portion 12a in the X direction can be set. There is.
 すなわち、平面視において、係合溝部F2aの中心位置に対して凸部12aの中心位置が凸部12aの径方向であるX方向またはY方向のいずれかにずれた状態で、凸部12aが係合溝部F2aに当接した場合でも、Z方向において凸部12aと係合溝部F2aとが近接することに伴って、凸部12aの外面が係合溝部F2aの内面に沿ってXY方向に移動する。 That is, in a plan view, the convex portion 12a is engaged with the central position of the convex portion 12a in either the X direction or Y direction which is the radial direction of the convex portion 12a with respect to the central position of the engagement groove portion F2a. Even when contacting the mating groove F2a, the outer surface of the convex 12a moves in the X and Y directions along the inner surface of the engagement groove F2a as the convex 12a and the engagement groove F2a approach in the Z direction. .
 そして、最終的に、図16に示すように、Z方向において凸部12aと係合溝部F2aとが最も近接した状態、すなわち、係合溝部F2aが凸部12aに載置された状態で、凸部12aのX方向に沿う断面における円弧が、係合溝部F2aの内面に、係合溝部F2aのX方向に沿う断面と一致するように線接触する。これにより、平面視において、係合溝部F2aのX方向中心位置に対して凸部12aの中心位置がX方向に一致した状態となるように、マスクフレームFの位置が設定される。同時に、Y方向に延在する係合溝部F2aに対して凸部12aのY方向における位置は、係合溝部F2aのY方向の長さに対応する自由度を有してY方向の位置に設定される。 Then, finally, as shown in FIG. 16, the convex portion 12a and the engaging groove portion F2a are closest to each other in the Z direction, that is, in the state where the engaging groove portion F2a is mounted on the convex portion 12a, An arc in a cross section along the X direction of the portion 12a makes line contact with the inner surface of the engagement groove F2a so as to coincide with the cross section along the X direction of the engagement groove F2a. Thereby, the position of the mask frame F is set such that the central position of the convex portion 12a coincides with the X direction with respect to the X direction central position of the engagement groove F2a in a plan view. At the same time, the position of the protrusion 12a in the Y direction with respect to the engagement groove F2a extending in the Y direction has a degree of freedom corresponding to the length of the engagement groove F2a in the Y direction and is set to the position in the Y direction Be done.
 上側支持部16,16は、図8に示すように、マスクフレームFの上側の中央位置で、Y方向の上部アライメント部13および上部アライメント部14の間に位置して設けられる。
 上側支持部16,16は、支持アライメント部11,12によってマスクフレームFを支持し、上部アライメント部13,14によってマスクフレームFを支持・アライメントする直前に、マスクフレームFが倒れないようにマスクフレームFの上側を支持する。
The upper support portions 16 are provided between the upper alignment portion 13 and the upper alignment portion 14 in the Y direction at a central position on the upper side of the mask frame F, as shown in FIG.
The upper support portions 16, 16 support the mask frame F by the support alignment portions 11, 12, and the mask frame F is prevented from falling immediately before the upper alignment portions 13, 14 support and align the mask frame F. Support the upper side of F.
 上側支持部16,16は、図8に示すように、マグネット部16aと、Z駆動部16Zとを有する。マグネット部16aは、マスクフレームFの上端の中央部を含む部分、具体的には、マスクフレームFの左右両端の位置を除くマスクフレームFの全長に設けられている。マグネット部16aは、マスクフレームFを構成するマグネット等の上側フレーム支持体F6と引き付け合って、マスクフレームFの重量を支持可能である。Z駆動部16Zは、マグネット部16aをZ方向に駆動可能である。 The upper side support parts 16 and 16 have the magnet part 16a and the Z drive part 16Z, as shown in FIG. The magnet portion 16 a is provided in a portion including the central portion of the upper end of the mask frame F, specifically, the entire length of the mask frame F excluding the positions of both left and right ends of the mask frame F. The magnet portion 16 a can support the weight of the mask frame F by attracting the upper frame support F 6 such as a magnet that constitutes the mask frame F. The Z drive unit 16Z can drive the magnet unit 16a in the Z direction.
 上側支持部16,16においては、図8に示すように、X方向におけるマグネット部16aの位置が、平面視において、複数の搬送手段60によって規定されるマスクフレームFの搬送経路とマグネット部16aとが重なるように設定されている。
 さらに、Z方向における上側支持部16の位置が、搬送経路に設けられた搬送上支持部66を結ぶ線上に、最下降位置とされたマグネット部16aがほぼ一致するように設定される。
In the upper support portions 16 and 16, as shown in FIG. 8, the transport path of the mask frame F and the magnet portion 16a, in which the position of the magnet portion 16a in the X direction is defined by the plurality of transport means 60 in plan view Are set to overlap.
Further, the position of the upper support portion 16 in the Z direction is set so that the magnet portion 16a in the lowermost position substantially coincides with the line connecting the transport upper support portion 66 provided in the transport path.
 上側支持部16,16においては、マグネット部16aのXZ面における断面構成が、前述した搬送上支持部56,66と同等のXZ面における断面構成を有するように設定される。マグネット部16aは、マスクフレームF上端に設けられた上側フレーム支持体F6と互いに引き付け合う。マグネット部16aと上側フレーム支持体F6とは、マスクフレームFの面内方向(YZ面内方向)と略直交する鉛直面内(XZ面内)で磁気回路を形成するものとされる。
 なお、上側支持部16のマグネット部16aは、図3に示す搬送上支持部56の上マグネット部56aと同等の構成とされ、図における符号56aを16aと読み替えるものとされる。
In the upper support portions 16, 16, the cross-sectional configuration in the XZ plane of the magnet portion 16a is set to have the cross-sectional configuration in the XZ plane equivalent to the above-described transport upper support portions 56, 66. The magnet portion 16a attracts each other with the upper frame support F6 provided at the upper end of the mask frame F. The magnet portion 16a and the upper frame support F6 form a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
The magnet portion 16a of the upper support portion 16 has a configuration equivalent to that of the upper magnet portion 56a of the transport upper support portion 56 shown in FIG. 3, and the symbol 56a in the figure should be read as 16a.
 マグネット部16aは、前述した上マグネット部56aと同様に、マスクフレームFの搬送方向と平行なY方向に延在する複数のマグネットを有する。マグネット部16aのマグネットは、マスクフレームF上端に設けられた上側フレーム支持体F6と互いに引き付け合う。マグネット部16aのマグネットは、マスクフレームFの面内方向(YZ面内方向)と略直交する鉛直面内(XZ面内)で磁気回路を形成する。 The magnet unit 16a includes a plurality of magnets extending in the Y direction parallel to the conveyance direction of the mask frame F, as in the upper magnet unit 56a described above. The magnets of the magnet portion 16a attract each other with the upper frame support F6 provided at the upper end of the mask frame F. The magnet of the magnet unit 16a forms a magnetic circuit in a vertical plane (in the XZ plane) substantially orthogonal to the in-plane direction (in the YZ plane direction) of the mask frame F.
 マグネット部16aは、Y方向における上側支持部16の全長において、断面構成が略同一とされる。これにより、上側フレーム支持体F6とマグネット部16aとの間で形成される磁気回路が、Y方向における上側支持部16の全長において、ほぼ同一に形成される。したがって、Y方向における上側支持部16の全長において、上側フレーム支持体F6とマグネット部16aとが互いに引き付け合う引力をほぼ等しくできる。 The magnet section 16a has substantially the same cross-sectional configuration over the entire length of the upper support section 16 in the Y direction. Thus, the magnetic circuit formed between the upper frame support F6 and the magnet portion 16a is formed substantially the same over the entire length of the upper support portion 16 in the Y direction. Therefore, in the entire length of the upper support portion 16 in the Y direction, it is possible to substantially equalize the attraction of the upper frame support F6 and the magnet portion 16a to attract each other.
 上側支持部16によってマスクフレームFの上側を支持するには、マグネット部16aと上側フレーム支持体F6とのZ方向距離を所定の範囲に設定することが必要である。同時に、上側支持部16によってマスクフレームFの上側を支持するには、マグネット部16aの直下に上側フレーム支持体F6が位置することが必要である。これらの条件を満たした場合に、マグネット部16aと上側フレーム支持体F6とが互いに引き付け合って、上側支持部16によってマスクフレームFが支持される。 In order to support the upper side of the mask frame F by the upper support portion 16, it is necessary to set the Z-direction distance between the magnet portion 16a and the upper frame support F6 within a predetermined range. At the same time, in order to support the upper side of the mask frame F by the upper support portion 16, the upper frame support F6 needs to be positioned directly below the magnet portion 16a. When these conditions are satisfied, the magnet portion 16 a and the upper frame support F 6 attract each other, and the mask frame F is supported by the upper support 16.
 上側支持部16,16においては、Y方向に延在する搬送経路に位置するマスクフレームFの上端に沿って、複数のマグネット部16aが配置されてもよい。上側支持部16,16において、例えば、図8に示すように、マグネット部16aが2分割されることができる。さらに、上側支持部16,16において、マグネット部16aが3分割されるか、それより多数に分割されていてもよい。 In the upper support portions 16 and 16, the plurality of magnet portions 16a may be disposed along the upper end of the mask frame F located in the transport path extending in the Y direction. For example, as shown in FIG. 8, in the upper support portions 16 and 16, the magnet portion 16 a can be divided into two. Furthermore, in the upper support portions 16, 16, the magnet portion 16a may be divided into three or more.
 Z駆動部16Zは、図8,図11に示すように、モータ16Zaと、回転軸16Zbと、Z板部16cと、規制部16Zdと、接続部16bと、Z位置規制部16Zcと、を有する。モータ16Zaは、ステッピングモータまたはサーボモータで構成される。回転軸16Zbは、Z方向に延在しモータ16Zaによって回転駆動される。Z板部16cは、回転軸16Zbに螺合されて回転軸16Zbの軸線方向に相対移動可能である。規制部16Zdは、Z板部16cとモータ16Zaとの移動を規制する。接続部16bは、Z板部16cとマグネット部16aとを接続する。Z位置規制部16Zcには、回転軸16Zbの下端(先端)が接続される。 As shown in FIGS. 8 and 11, the Z driving unit 16Z has a motor 16Za, a rotating shaft 16Zb, a Z plate unit 16c, a regulating unit 16Zd, a connecting unit 16b, and a Z position regulating unit 16Zc. . The motor 16Za is configured by a stepping motor or a servomotor. The rotating shaft 16Zb extends in the Z direction and is rotationally driven by the motor 16Za. The Z plate portion 16c is screwed to the rotary shaft 16Zb and is relatively movable in the axial direction of the rotary shaft 16Zb. The restricting portion 16Zd restricts the movement of the Z plate portion 16c and the motor 16Za. The connection part 16b connects the Z plate part 16c and the magnet part 16a. The lower end (front end) of the rotating shaft 16Zb is connected to the Z position restricting portion 16Zc.
 Z駆動部16Zにおいては、回転軸16Zbの下端(先端)は、回動可能な状態でZ位置規制部16Zcに接続されている。モータ16Zaによって回転軸16Zbを回動することで、Z位置規制部16Zcに対してZ方向には移動しないように回転軸16Zbは、回動する。規制部16Zdによって、Z板部16cの移動方向が規制されている。Z板部16cは、Z位置規制部16Zcに対してZ方向に移動するように構成されている。これにより、Z板部16cと接続部16bによって接続されたマグネット部16aとがZ方向に往復移動可能とされている。 In the Z drive unit 16Z, the lower end (tip) of the rotary shaft 16Zb is connected to the Z position restricting unit 16Zc in a rotatable state. By rotating the rotation shaft 16Zb by the motor 16Za, the rotation shaft 16Zb is rotated so as not to move in the Z direction with respect to the Z position restricting portion 16Zc. The moving direction of the Z plate portion 16c is restricted by the restricting portion 16Zd. The Z plate portion 16c is configured to move in the Z direction with respect to the Z position restricting portion 16Zc. Thus, the Z plate portion 16c and the magnet portion 16a connected by the connection portion 16b can be reciprocated in the Z direction.
 Z位置規制部16Zcは、成膜室(チャンバ)4の頂部である。Z駆動部16Zは、マグネット部16aをZ方向への伸張または後退させることが可能であり、成膜室(チャンバ)4の頂部に固定されている。 The Z position control unit 16 Zc is a top of the film forming chamber (chamber) 4. The Z drive unit 16Z can extend or retract the magnet unit 16a in the Z direction, and is fixed to the top of the film forming chamber (chamber) 4.
 上側支持部16,16においては、モータ16Zaが、成膜室(チャンバ)4の頂部に位置するZ位置規制部16Zcの外側、つまりチャンバ4の外部に配置されている。接続部16bが密閉状態に維持されたままZ方向に伸退可能とされていることで、チャンバ4の内部で発生したゴミが拡散することを防止できる。 In the upper side supports 16 and 16, the motor 16 Za is disposed outside the Z position restricting portion 16 Zc located at the top of the film forming chamber 4, that is, outside the chamber 4. By being able to extend and retract in the Z direction while the connection portion 16 b is maintained in a sealed state, it is possible to prevent the dust generated inside the chamber 4 from being diffused.
 図17は、本実施形態におけるスパッタリング装置のマスク室におけるアライメント前の状態を示す正面図である。図18は、本実施形態におけるスパッタリング装置のマスク室におけるアライメント状態を示す正面図である。
 本実施形態に係るスパッタリング装置1において、マスクフレームFのアライメントをおこなう際には、まず、図2に示すストック室50からマスク室43において駆動ローラ65a,65a等によって駆動されたマスクフレームFを、これら駆動ローラ65a,65aによって下端部のスライダF5を支持した状態で、かつ、搬送上支持部66によってマスクフレームF上側を引きつけて倒れないように保持した状態で、搬送経路に沿って搬送し、搬送してきたマスクフレームFをマスク室43の成膜位置の付近に位置する。
FIG. 17 is a front view showing a state before alignment in the mask chamber of the sputtering apparatus in the present embodiment. FIG. 18 is a front view showing the alignment state in the mask chamber of the sputtering apparatus in the present embodiment.
When performing alignment of the mask frame F in the sputtering apparatus 1 according to the present embodiment, first, the mask frame F driven by the drive rollers 65a and 65a in the mask chamber 43 from the stock chamber 50 shown in FIG. While the slider F5 at the lower end is supported by the drive rollers 65a and 65a, and the upper side of the mask frame F is held by the transport upper support portion 66 so as not to fall down, it is transported along the transport path The transferred mask frame F is located near the film forming position of the mask chamber 43.
 ここで、マスクフレームFの搬送時には、上側支持部16,16において、図17に示すように、Z駆動部16Zを駆動して、マグネット部16aをマスクフレームF上端に近接させる。同時に、マグネット部16aを最下位置まで下降させる。これにより、マグネット部16aが搬送上支持部66を結ぶ線上に位置する。 Here, at the time of conveyance of the mask frame F, as shown in FIG. 17, the Z driving unit 16Z is driven in the upper side support portions 16 and 16 to bring the magnet portion 16a close to the upper end of the mask frame F. At the same time, the magnet unit 16a is lowered to the lowermost position. Thereby, the magnet portion 16 a is positioned on the line connecting the transport upper support portion 66.
 このとき、マスクフレームFの上端では、上側支持部16とマグネット部26とが互いに引きつけ合う。これにより、マスクフレームFの上端が倒れないように支持されている。また、マスクフレームFの下部では、スライダF5が支持アライメント部11,12に当接しておらず、スライダF5が搬送駆動部65の駆動ローラ65a,65aに当接している。これにより、マスクフレームFの下部が支持されている。
 搬送経路を形成する複数の駆動ローラ65aの頂部を結んだ直線は、Z方向位置において、支持アライメント部11,12の凸部11a,12aの位置よりも高い位置に設定されるとともに、後述する支持アライメント部11,12のアライメント動作にともなって上昇する凸部11a,12aの上止点よりも低い位置となるように設定できる。
At this time, at the upper end of the mask frame F, the upper support portion 16 and the magnet portion 26 attract each other. Thus, the upper end of the mask frame F is supported so as not to fall down. In the lower part of the mask frame F, the slider F5 is not in contact with the support alignment portions 11, 12, and the slider F5 is in contact with the drive rollers 65a, 65a of the transport drive portion 65. Thereby, the lower part of the mask frame F is supported.
The straight line connecting the tops of the plurality of drive rollers 65a forming the conveyance path is set at a position higher than the positions of the convex portions 11a and 12a of the support alignment portions 11 and 12 at the Z direction position. It can set so that it may become a position lower than the upper stop point of convex part 11a, 12a which rises with alignment operation of alignment parts 11 and 12.
 マスクフレームFのアライメント動作前において、支持アライメント部11,12は、図17に示すように、凸部11a,12aの位置がZ方向の最低位置になるようにZ駆動部11Z,12Zにおいて設定されている。X駆動部11X,12XおよびY駆動部11Y,12Yにおいては、凸部11a,12aがXY面内方向において成膜位置の近い位置にあればよい。これは、凸部11aの上昇に伴って、係合凹部F1aの内面のいずれかの位置に凸部11aが当接可能であること、および、凸部12aの上昇に伴って、係合溝部F2a内面のいずれかの位置に凸部12aが当接可能であることを意味する。 Before the alignment operation of the mask frame F, the support alignment units 11 and 12 are set in the Z drive units 11Z and 12Z such that the positions of the convex portions 11a and 12a become the lowest position in the Z direction as shown in FIG. ing. In the X driving units 11X and 12X and the Y driving units 11Y and 12Y, the convex portions 11a and 12a may be located close to the film forming position in the in-plane direction of the XY plane. This is because the protrusion 11a can contact any position of the inner surface of the engagement recess F1a with the rise of the protrusion 11a, and the engagement groove F2a with the rise of the protrusion 12a. It means that the convex part 12a can abut on any position on the inner surface.
 同時に、マスクフレームFのアライメント動作前において、上部アライメント部13は、図17に示すように、回転駆動部13Rにおいて回転軸13Bの軸線周りにおける挟持部13Aの角度が、マスクフレームFを成膜位置の付近に位置する際に、マスクフレームFに干渉しない角度とされている。具体的には、挟持部13AがマスクフレームFの近くに位置するとともに、回転軸13Bの軸線周りで挟持部13Aが少なくとも上向きに傾くような角度で挟持部13Aの位置が設定されることが好ましい。 At the same time, before the alignment operation of the mask frame F, as shown in FIG. 17, the upper alignment unit 13 forms the mask frame F at the deposition position where the angle of the sandwiching portion 13A around the axis of the rotation shaft 13B in the rotational drive unit 13R. When it is located in the vicinity of, the angle does not interfere with the mask frame F. Specifically, it is preferable that the position of the holding portion 13A be set such that the holding portion 13A is positioned near the mask frame F and the holding portion 13A is inclined at least upward around the axis of the rotation shaft 13B. .
 また、上部アライメント部13では、X駆動部13Xにおいて、挟持部13Aにおける挟持片13Aa,13Abの間にマスクフレームFの上端が位置するように設定しておく。 In the upper alignment unit 13, the upper end of the mask frame F is set so as to be located between the holding pieces 13Aa and 13Ab in the holding unit 13A in the X drive unit 13X.
 同様に、マスクフレームFのアライメント動作前において、上部アライメント部14は、図14に示すように、回転駆動部14Rにおいて回転軸14Bの軸線周りにおける挟持部14Aの角度が、マスクフレームFを成膜位置の付近に位置する際に、マスクフレームFに干渉しない角度とされている。具体的には、挟持部14AがマスクフレームFの近くに位置するとともに、回転軸14Bの軸線周りで挟持部14Aが少なくとも上向きに傾くような角度で挟持部13Aの位置が設定されることが好ましい。 Similarly, before the alignment operation of the mask frame F, as shown in FIG. 14, the upper alignment unit 14 forms a film of the mask frame F with the angle of the sandwiching portion 14A around the axis of the rotation shaft 14B in the rotation drive unit 14R. When positioned near the position, the angle does not interfere with the mask frame F. Specifically, it is preferable that the position of the sandwiching portion 13A be set such that the sandwiching portion 14A is located near the mask frame F and the sandwiching portion 14A is inclined at least upward around the axis of the rotation shaft 14B. .
 また、上部アライメント部14では、X駆動部14Xにおいて、挟持部14Aにおける挟持片14Aa,14Abの間にマスクフレームFの上端が位置するように設定しておく。 Further, in the upper alignment unit 14, the upper end of the mask frame F is set to be positioned between the sandwiching pieces 14Aa and 14Ab in the sandwiching part 14A in the X drive unit 14X.
 次いで、アライメント動作をおこなうには、図18に示すように、上部アライメント部13の回転駆動部13Rを駆動して、図18の矢印r13で示すように、挟持部13Aを回転軸13Bの軸線周りに回動する。これにより、挟持部13Aの角度は、挟持片13Aaおよび挟持片13Abの間に位置する2つの対向面に設けられた凸部13Adおよび凸部13AeがマスクフレームFの表面および裏面にそれぞれ当接して支持可能な角度とする。 Next, in order to perform the alignment operation, as shown in FIG. 18, the rotation drive unit 13R of the upper alignment unit 13 is driven to hold the holding unit 13A around the axis of the rotation shaft 13B as shown by the arrow r13 in FIG. To rotate. Thereby, the angle of the holding portion 13A is determined by bringing the convex portion 13Ad and the convex portion 13Ae provided on the two opposing surfaces located between the holding piece 13Aa and the holding piece 13Ab into contact with the front and back surfaces of the mask frame F, respectively. Supportable angle.
 同時に、アライメント動作をおこなうには、図18に示すように、上部アライメント部14の回転駆動部14Rを駆動して、図18の矢印r14で示すように、挟持部14Aを回転軸14Bの軸線周りに回動する。これにより、挟持部14Aの角度は、挟持片14Aaおよび挟持片14Abの間に位置する2つの対向面に設けられた凸部14Adおよび凸部14AeがマスクフレームFの表面および裏面にそれぞれ当接して支持可能な角度とする。 At the same time, in order to perform the alignment operation, as shown in FIG. 18, the rotation drive portion 14R of the upper alignment portion 14 is driven to hold the holding portion 14A around the axis of the rotation shaft 14B as shown by arrow r14 in FIG. To rotate. Thereby, the angle of the holding portion 14A is determined by bringing the convex portion 14Ad and the convex portion 14Ae provided on the two opposing surfaces located between the holding piece 14Aa and the holding piece 14Ab into contact with the front and back surfaces of the mask frame F, respectively. Supportable angle.
 さらに、図18の矢印r13,r14で示す上部アライメント部13,14における回転駆動部13R,14Rの動作の後に、あるいは、この動作と同時に、支持アライメント部11,12において、Z駆動部11Z,12Zを駆動する。これにより、図18の矢印r11,r12で示すように、凸部11a,12aを上昇させ、凸部11aを係合凹部F1aの内面に当接させるとともに、凸部12aを係合溝部F2aの内面に当接させる。 Further, after or simultaneously with the operation of the rotary drive units 13R and 14R in the upper alignment units 13 and 14 shown by arrows r13 and r14 in FIG. 18, the Z drive units 11Z and 12Z in the support alignment units 11 and 12 respectively. Drive. As a result, as shown by arrows r11 and r12 in FIG. 18, the raised portions 11a and 12a are raised to bring the raised portion 11a into contact with the inner surface of the engaging recessed portion F1a, and the raised portion 12a is provided on the inner surface of the engaging groove F2a. Abut on.
 この図18の矢印r11,r12で示すZ駆動部11Z,12Zの動作により、マスクフレームFの下端では、スライダF5が搬送手段60の駆動ローラ65a,65aから離間する。同時に、支持アライメント部11,12によって、マスクフレームFの重量が支持された状態となる。 At the lower end of the mask frame F, the slider F5 is separated from the drive rollers 65a and 65a of the transport means 60 by the operations of the Z drive units 11Z and 12Z indicated by arrows r11 and r12 in FIG. At the same time, the weight of the mask frame F is supported by the support alignment units 11 and 12.
 図18の矢印r11,r12で示すZ駆動部11Z,12Zの動作に同期して、上側支持部16,16におけるZ駆動部16Zを駆動する。これにより、図18の矢印r16で示すように、マグネット部16aを上昇させ、マグネット部16aが、上昇するマスクフレームFに当接しないように動作させる。 In synchronization with the operation of the Z drive units 11Z and 12Z shown by arrows r11 and r12 in FIG. 18, the Z drive unit 16Z in the upper support units 16 and 16 is driven. As a result, as shown by arrow r16 in FIG. 18, the magnet unit 16a is lifted, and the magnet unit 16a is operated so as not to abut on the rising mask frame F.
 このように、図18の矢印r11,r12で示すように、凸部11aが係合凹部F1aの内面に当接するとともに、凸部12aが係合溝部F2aの内面に当接する。これにより、マスクフレームFの下端は、凸部11a,12aによって設定されるXY面内の位置に規制されることになる。
 同時に、図18の矢印r13で示すように、挟持片13Aaの凸部13Adおよび挟持片13Abの凸部13AeがそれぞれマスクフレームFの表面および裏面に当接する。また、図18の矢印r14で示すように、挟持片14Aa凸部14Adおよび挟持片14Abの凸部14AeがそれぞれマスクフレームFの表面および裏面に当接する。これにより、マスクフレームFの上端は、挟持部13A,14Aによって設定されるX方向位置に規制されることになる。
Thus, as shown by arrows r11 and r12 in FIG. 18, the convex portion 11a abuts on the inner surface of the engagement recess F1a, and the convex portion 12a abuts on the inner surface of the engagement groove F2a. As a result, the lower end of the mask frame F is restricted to the position in the XY plane set by the convex portions 11a and 12a.
At the same time, as shown by arrow r13 in FIG. 18, the convex portion 13Ad of the holding piece 13Aa and the convex portion 13Ae of the holding piece 13Ab respectively abut the front and back surfaces of the mask frame F. Further, as shown by the arrow r14 in FIG. 18, the holding piece 14Aa convex portion 14Ad and the convex portion 14Ae of the holding piece 14Ab respectively abut on the front surface and the back surface of the mask frame F. Thus, the upper end of the mask frame F is restricted to the X direction position set by the holding portions 13A and 14A.
 さらに、図示しないカメラ等の検出手段によって検出されたガラス基板Sと、マスクフレームFとの位置関係の情報から、図示しない制御部等の演算手段によって演算されるとともに出力されるアライメント信号に基づいて、マスクアライメント手段10を動作させる。これによって、ガラス基板Sと、マスクフレームFとの位置関係をあらかじめ設定されたスパッタリングの成膜位置となるように制御する。 Furthermore, based on the alignment signal that is calculated and output by calculation means such as a control unit (not shown) from information on the positional relationship between the glass substrate S detected by detection means such as a camera (not shown) and the mask frame F. , The mask alignment means 10 is operated. As a result, the positional relationship between the glass substrate S and the mask frame F is controlled to be at a predetermined film formation position for sputtering.
 このとき、支持アライメント部11,12において、X駆動部11X,12X、Y駆動部11Y,12Y、Z駆動部11Z,12Zを駆動する。さらに、上部アライメント部13,14におけるX駆動部13Xを駆動する。これによって、マスクフレームFのZY面における二方向の位置、および、マスクフレームFのZY面に直交するX方向の位置、即ち、三つの軸方向における位置と、三つの軸方向の軸線周りの三つの回転方向(角度)とによる六自由度にて、マスクフレームFのアライメントをおこなう。 At this time, in the support alignment units 11 and 12, the X drive units 11X and 12X, the Y drive units 11Y and 12Y, and the Z drive units 11Z and 12Z are driven. Furthermore, the X drive unit 13X in the upper alignment units 13 and 14 is driven. Thereby, the positions in two directions of the mask frame F in the ZY plane and the positions in the X direction orthogonal to the ZY plane of the mask frame F, that is, the positions in the three axial directions and three around the three axial axes. Alignment of the mask frame F is performed in six degrees of freedom with one rotation direction (angle).
 具体的には、支持アライメント部11によるマスクフレームFの下端における係合部F1の側端部のXYZ方向となる三方向の位置設定、および、支持アライメント部12によるマスクフレームFの下端における係合部F2の側端部のXYZ方向となる三方向の位置設定、上部アライメント部13によるマスクフレームFの上端における係合部F1の側端部のX方向となる位置設定、上部アライメント部14によるマスクフレームFの上端における係合部F2の側端部のX方向となる位置設定、をおこなうことになる。 Specifically, position setting in three directions in the X, Y, and Z directions of the side end of the engagement portion F1 at the lower end of the mask frame F by the support alignment portion 11 and engagement at the lower end of the mask frame F by the support alignment portion 12 Position setting in three directions in the X, Y, and Z directions of the side end of the portion F 2, position setting in the X direction of the side end of the engaging portion F 1 at the upper end of the mask frame F by the upper alignment portion 13, mask by the upper alignment portion 14 The position setting which becomes the X direction of the side edge part of the engaging part F2 in the upper end of the flame | frame F is performed.
 これにより、ガラス基板SとマスクフレームFとの面内方向の位置設定と、ガラス基板SとマスクフレームFとの面どうしの傾き設定とを同時におこなうことが可能となる。 Thereby, it becomes possible to simultaneously perform the position setting of the in-plane direction of the glass substrate S and the mask frame F and the inclination setting of the surfaces of the glass substrate S and the mask frame F at the same time.
 本実施形態においては、支持アライメント部11,12において、X駆動部11X,12X、Y駆動部11Y,12Yが、チャンバ4内に設けられている。これにより、駆動部11X,12X,11Y,12Yがチャンバ4の外部に設けられている場合に比べて、駆動部11X,12X,11Y,12Yから当該駆動部によって位置が制御されるマスクフレームFまでの距離を短縮することができる。これにより、マスクフレームFの位置の制御を、より高精度におこなうことが可能となる。同時に、駆動部11X,12X,11Y,12Yにステッピングモータを用いることが可能となる。これにより、高出力なサーボモータを用いる場合に比べて、マスクフレームFの位置の制御を、より高精度におこなうことが可能となる。 In the present embodiment, in the support alignment units 11 and 12, the X driving units 11X and 12X and the Y driving units 11Y and 12Y are provided in the chamber 4. Thus, compared to the case where the drive units 11X, 12X, 11Y, and 12Y are provided outside the chamber 4, from the drive units 11X, 12X, 11Y, and 12Y to the mask frame F whose position is controlled by the drive units. Distance can be shortened. This makes it possible to control the position of the mask frame F with higher precision. At the same time, it becomes possible to use a stepping motor for the drive units 11X, 12X, 11Y and 12Y. This makes it possible to control the position of the mask frame F more accurately than when using a high output servomotor.
 さらに、駆動部11X,12X,11Y,12Yに省スペース型のステッピングモータを用いて、チャンバ4内で密閉することが可能となる。このため、駆動部11X,12X,11Y,12Yの駆動に関してゴミ等の発生を防止することが可能となる。これにより、ガラス基板Sに対するスパッタリングの成膜特性を向上するとともに、歩留まりを向上し、製造コストを低減することが可能となる。 Furthermore, the drive units 11X, 12X, 11Y, and 12Y can be sealed in the chamber 4 using a space-saving type stepping motor. For this reason, it is possible to prevent the generation of dust and the like with respect to the driving of the driving units 11X, 12X, 11Y, and 12Y. As a result, it is possible to improve the film formation characteristics of sputtering on the glass substrate S, to improve the yield, and to reduce the manufacturing cost.
 本実施形態においては、支持アライメント部11,12におけるZ駆動部11Z,12Z、および、上部アライメント部13,14における回転駆動部13R,14RとX駆動部13X,14Xが、チャンバ4の外部に設けられる。これにより、500kg以上となる場合もある重量を有するマスクフレームFを支持して、マスクフレームFを直接駆動する際に、チャンバ4内のスペースを気にせずに高出力のモータを用いることが可能となる。さらに、Z駆動部11Z,12Zから発生したゴミは、重力によって下方に落下するが、成膜特性に影響するマスクフレームFの上側位置に配置されている回転駆動部13R,14R、および、X駆動部13X,14Xがチャンバ4の外側に位置することで、このゴミが発生することがなく、ガラス基板Sに対するスパッタリング成膜特性に悪影響を及ぼすことが防止できる。 In the present embodiment, the Z drive units 11Z and 12Z in the support alignment units 11 and 12 and the rotational drive units 13R and 14R and the X drive units 13X and 14X in the upper alignment units 13 and 14 are provided outside the chamber 4. Be Thereby, it is possible to support the mask frame F having a weight which may be 500 kg or more, and to use a high output motor without worrying about the space in the chamber 4 when directly driving the mask frame F It becomes. Furthermore, dust generated from the Z drive units 11Z and 12Z falls downward by gravity, but the rotation drive units 13R and 14R disposed at the upper position of the mask frame F affecting the film formation characteristics, and X drive Since the portions 13X and 14X are located outside the chamber 4, this dust is not generated, and it is possible to prevent the adverse influence on the sputtering film forming characteristics for the glass substrate S.
 本実施形態においては、係合部F1,F2および支持アライメント部11,12の凸部11a,12aが、上記の構成を有することにより、マスクフレームFを凸部11a,12aで支持し、これを支持アライメント部11,12におけるZ駆動部11Z,12Zの駆動のみで、マスクフレームFの下端部における位置設定をおこなうことが可能となる。さらに、係合凹部F1aおよび係合溝部F2aを支持アライメント部11,12の凸部11a,12aに係合させることのみによって、マスクフレームFを微調整可能に支持することが可能となる。 In the present embodiment, the mask frame F is supported by the convex portions 11 a and 12 a by the engagement portions F 1 and F 2 and the convex portions 11 a and 12 a of the support alignment portions 11 and 12 having the above configuration. The position setting at the lower end portion of the mask frame F can be performed only by driving the Z driving units 11Z and 12Z in the support alignment units 11 and 12. Furthermore, the mask frame F can be supported finely adjustable only by engaging the engagement recess F1a and the engagement groove F2a with the projections 11a and 12a of the support alignment portions 11 and 12, respectively.
 本実施形態においては、上部アライメント部13,14が上記の構成を有することにより、X駆動部13X,14Xが挟持部13A,14Aを回転軸13B,14Bに沿って移動することで、X方向にマスクフレームFの位置を制御することができ、これにより、上述した六自由度にてマスクフレームFをアライメント可能とすることができる。 In the present embodiment, when the upper alignment units 13 and 14 have the above-described configuration, the X drive units 13X and 14X move the sandwiching units 13A and 14A along the rotation axes 13B and 14B, thereby moving in the X direction. The position of the mask frame F can be controlled, whereby the mask frame F can be aligned in the six degrees of freedom described above.
 本実施形態においては、省スペース化されたスパッタリング装置1において、簡単な構成、かつ、ゴミのでない状態で、容易にマスクフレームFをアライメント可能とすることができ、優れた成膜特性を低コストに実現することが可能となる。 In the present embodiment, in the space-saving sputtering apparatus 1, the mask frame F can be easily aligned with a simple configuration and no dust, and excellent film forming characteristics can be reduced. Can be realized.
 なお、本実施形態においては、マスク交換手段100によるマスク交換、および、マスクアライメント手段10によるマスクフレームFのアライメントを、上記のようにおこなうことが可能であれば、マスクフレームFをそれぞれ駆動および制御する手段としては、この構成に限定されるものではない。 In the present embodiment, if mask exchange by the mask exchange unit 100 and alignment of the mask frame F by the mask alignment unit 10 can be performed as described above, the mask frame F is driven and controlled, respectively. As a means to do, it is not limited to this composition.
 また、本実施形態においては、基板SおよびマスクフレームFが立位とされる縦型搬送・縦型成膜として説明したが、マスクフレームFが水平位とされる水平搬送とすることもできる。 Further, in the present embodiment, the vertical conveyance / vertical film formation in which the substrate S and the mask frame F are in the standing position has been described, but horizontal conveyance in which the mask frame F is in the horizontal position may be used.
 以下、本発明に係るスパッタリング装置の第2実施形態を、図面に基づいて説明する。
 図19は、本実施形態におけるスパッタリング装置の一部を示す模式平面図であり、本実施形態において、上述した第1実施形態と異なるのは、ストック室および成膜室の配置に関する点であり、これ以外の上述した第1実施形態と対応する構成には同一の符号を付してその説明を省略する。
Hereinafter, a second embodiment of the sputtering apparatus according to the present invention will be described based on the drawings.
FIG. 19 is a schematic plan view showing a part of the sputtering apparatus in the present embodiment. In the present embodiment, the difference from the first embodiment described above relates to the arrangement of the stock chamber and the film forming chamber, The same code | symbol is attached | subjected to the structure corresponding to 1st Embodiment mentioned above other than this, and the description is abbreviate | omitted.
 本実施形態においては、図19に示すように、1つの成膜室4に対して、2つのストック室50,50Aが接続されている。なお、図において、ロード・アンロード室2、搬送室3等は、省略してある。
 このように構成することにより、片方のストック室50を、あたかもマスクフレームFに対するロード室として、外部から所定種類、所定枚数とされるマスクフレームFを成膜室4に順次搬入することができる。また、もう一方のストック室50Aを、あたかもマスクフレームFに対するアンロード室として、所定種類、所定枚数とされるマスクフレームFを成膜室4から順次搬出することができる。
In the present embodiment, as shown in FIG. 19, two stock chambers 50 and 50A are connected to one film forming chamber 4. In the drawing, the load / unload chamber 2, the transfer chamber 3 and the like are omitted.
With this configuration, the mask frame F having a predetermined type and a predetermined number of sheets can be sequentially carried into the film forming chamber 4 from the outside as one of the stock chambers 50 as a load chamber for the mask frame F. Further, the mask frame F having a predetermined type and a predetermined number of sheets can be sequentially taken out from the film forming chamber 4 as an unloading chamber for the mask frame F on the other stock chamber 50A.
 この場合、成膜室4を大気開放しないで、自動化したマスク交換をおこなうことができる。同時に、成膜前のマスクフレームFに対して、成膜後のマスクフレームFが異なるロード・アンロード室に搬送される。このため、成膜前のマスクフレームFに対するパーティクルの付着を低減し、スパッタリングにおけるパーティクルの影響を抑えられるという効果を奏することが可能となる。 In this case, automated mask replacement can be performed without opening the film formation chamber 4 to the atmosphere. At the same time, the mask frame F after film formation is transported to different load / unload chambers with respect to the mask frame F before film formation. For this reason, it is possible to reduce adhesion of particles to the mask frame F before film formation and to suppress the influence of particles in sputtering.
 本発明の好ましい実施形態を説明し、上記で説明してきたが、これらは本発明の例示的なものであり、限定するものとして考慮されるべきではないことを理解すべきである。追加、省略、置換、およびその他の変更は、本発明の範囲から逸脱することなく行うことができる。従って、本発明は、前述の説明によって限定されていると見なされるべきではなく、請求の範囲によって制限されている。 Although preferred embodiments of the present invention have been described and described above, it should be understood that they are exemplary of the present invention and should not be considered as limiting. Additions, omissions, substitutions, and other modifications can be made without departing from the scope of the present invention. Accordingly, the present invention should not be considered limited by the foregoing description, but rather by the scope of the claims.
 本発明の活用例として、蒸着、CVD、エッチング等を挙げることができる。 Vapor deposition, CVD, etching and the like can be mentioned as application examples of the present invention.
1…スパッタリング装置
2…ロード・アンロード室(チャンバ)
3…搬送室(チャンバ)
4,4B…チャンバ(成膜室)
41…スパッタ空間
42…裏側空間
43…マスク室
6…バッキングプレート(カソード電極)
7…ターゲット
8…ガス導入手段
9…高真空排気手段
S…ガラス基板(基板)
F,FA,FB,FC,FD…マスクフレーム
Fa…枠体
F1,F2…係合部
F1a…係合凹部
F2a…係合溝部
F5…スライダ
F6…上側フレーム支持体
F6a,F6b,F6c,F6d…マグネット
F6f…非磁性部
F6e…磁性部
F6g…保護層
100…マスク交換手段
50…ストック室
50a…底部
50b…側部
50c…頂部
51,52…ストック下支持部(ストック支持部)
51A,52A…ストック載置部(ストック支持部)
51Aa,52Aa…載置溝
51Ab,52Ab…駆動溝
51a,52a…支持溝
51b,52b…溝支持基部(ストック位置交換駆動部)
51b1,52b1…X駆動軸
51b2,52b2…X駆動モータ
51c,52c…X方向規制部(ストック位置交換駆動部)
51d,52d…Z駆動軸(ストック位置交換駆動部)
51e,52e…Z駆動モータ(ストック位置交換駆動部)
51f,52f…Z方向規制部(ストック位置交換駆動部)
53,54…ストック上支持部(ストック支持部)
53a,54a…挟持部
53b,54b…挟持片
53c,54c…回転軸
53e,54e…凸部
53rx,54rx…X回転駆動部
55…駆動支持部
55a…駆動ローラ
55b…回転駆動部
55c…当接解除駆動部
55d…Z位置規制部
55e…回転駆動モータ
55f…回転駆動部
55g…駆動軸
56…搬送上支持部
56a…上マグネット部
56b,56c…挟持部
56b1,56c1…挟持片
56b2,56c2…接続部
56d…Z支持部
56e…凸部
56f…Z駆動部
58…密閉手段
58a…仕切りバルブ
58b…搬入出口
58c…マスク取出充填口
58d…開閉部
58e…揺動軸
58f…揺動駆動部
58g…取り出し支持部
58ga…取り出し支持溝
58h…取り出し上支持部
58h1…Z軸
58h2…支持片
60…搬送手段
65…搬送駆動部
65a…駆動ローラ
65b…回転駆動部
66…搬送上支持部
661,662,663,664…マグネット
665…磁性部
666…非磁性部
667…下面
10…マスクアライメント手段
11,12…支持アライメント部
11a,12a…凸部
13,14…上部アライメント部
13A,14A…挟持部
16…上側支持部
16a…マグネット部
1 ... Sputtering device 2 ... Load / unload chamber (chamber)
3 ... Transfer chamber (chamber)
4, 4 B: Chamber (film forming chamber)
41: Sputtering space 42: Back side space 43: Mask chamber 6: Backing plate (cathode electrode)
7: Target 8: Gas introduction means 9: High vacuum evacuation means S: Glass substrate (substrate)
F, FA, FB, FC, FD ... Mask frame Fa ... Frame body F1, F2 ... Engagement part F1a ... Engagement recess F2a ... Engagement groove F5 ... Slider F6 ... Upper frame support F6a, F6b, F6c, F6d ... Magnet F6 f Nonmagnetic part F6e Magnetic part F6g Protective layer 100 Mask exchange means 50 Stock room 50a Bottom 50b Side 50c Top 51, 52 Stock lower support (stock support)
51A, 52A ... stock mounting portion (stock support portion)
51Aa, 52Aa ... mounting groove 51Ab, 52Ab ... drive groove 51a, 52a ... support groove 51b, 52b ... groove support base (stock position exchange drive part)
51b1, 52b1 ... X drive shaft 51b 2, 52b 2 ... X drive motor 51c, 52c ... X direction regulation unit (stock position exchange drive unit)
51d, 52d ... Z drive shaft (stock position exchange drive unit)
51e, 52e ... Z drive motor (stock position exchange drive unit)
51f, 52f ... Z direction control unit (stock position exchange drive unit)
53, 54 ... Stock upper support (stock support)
53a, 54a: pinching portion 53b, 54b: pinching piece 53c, 54c: rotation shaft 53e, 54e: convex portion 53rx, 54rx: X rotation drive portion 55: drive support portion 55a: drive roller 55b: rotation drive portion 55c: contact Release drive unit 55d: Z position regulation unit 55e: rotation drive motor 55f: rotation drive unit 55g: drive shaft 56: transport upper support unit 56a: upper magnet unit 56b, 56c: clamping unit 56b1, 56c1 ... clamping piece 56b2, 56c2 ... Connecting part 56d: Z supporting part 56e: Convex part 56f: Z driving part 58: Sealing means 58a: Partitioning valve 58b: Loading port 58c: Mask taking out filling port 58d: opening and closing part 58e: rocking shaft 58f: rocking driving part 58g .. Take-out support part 58 ga ... Take-out support groove 58 h Drive portion 65a: Drive roller 65b: Rotational drive portion 66: Transport upper support portion 661, 662, 663, 664: Magnet 665: Magnetic portion 666: Nonmagnetic portion 667: Lower surface 10: Mask alignment means 11, 12: Support alignment portion 11a, 12a: convex portion 13, 14: upper alignment portion 13A, 14A: pinching portion 16: upper support portion 16a: magnet portion

Claims (10)

  1.  スパッタリング装置であって、
     チャンバ内でスパッタリングにより成膜する基板に対し、略垂直保持されたマスクフレームを交換可能とするマスク交換手段を有し、
     前記マスク交換手段が、
     複数の前記マスクフレームを前記マスクフレームの面どうしが略平行な状態に複数ストック可能とする密閉可能なストック室と、
     複数ストックされた前記マスクフレームから選択された一枚のマスクフレームを前記チャンバ内の成膜位置となるマスク室まで搬送する搬送手段と、
    を有し、
     前記ストック室には、
     複数の前記マスクフレームを前記マスクフレームの前記面どうしが略平行な状態に複数支持可能とされるとともにこれら複数の前記マスクフレームを前記マスクフレームの前記面に略直交する方向に前後移動可能とするストック支持部と、
     前記ストック支持部にストックされた前記マスクフレームから選択された一枚のマスクフレームを前記マスクフレームの前記面に平行な略水平方向に駆動可能とする駆動支持部と、
     前記駆動支持部により前記マスクフレームが移動される際に前記マスクフレームの上端を傾かないように支持可能とする搬送上支持部と、
     が設けられる、
     スパッタリング装置。
    A sputtering apparatus,
    A mask exchanging unit that can exchange a substantially vertically held mask frame with respect to a substrate to be deposited by sputtering in a chamber;
    The mask exchanging unit
    A closeable stock chamber that allows a plurality of the mask frames to be stocked in a plurality of substantially parallel faces of the mask frames;
    Transport means for transporting one mask frame selected from the plurality of stocked mask frames to a mask chamber which is a deposition position in the chamber;
    Have
    The stock room is
    A plurality of the mask frames can be supported so that the faces of the mask frame are substantially parallel to each other, and the plurality of mask frames can be moved back and forth in a direction substantially orthogonal to the face of the mask frame With stock support department,
    A drive support portion capable of driving a single mask frame selected from the mask frames stocked in the stock support portion in a substantially horizontal direction parallel to the surface of the mask frame;
    An upper transport supporting portion capable of supporting the upper end of the mask frame so as not to tilt when the mask frame is moved by the drive supporting portion;
    Is provided,
    Sputtering equipment.
  2.  前記ストック支持部が、
     複数の前記マスクフレームの下端を支持可能とされた複数のストック溝を有するストック載置部と、
     上昇、下降および前後移動可能とされ、上昇時に前記ストック載置部の前記ストック溝に載置された複数の前記マスクフレームの下端に当接して複数の前記マスクフレームを持ち上げ、前記ストック載置部から離間した状態である上昇位置として複数の前記マスクフレームを支持するとともに、前記上昇位置として支持している複数の前記マスクフレームを前記マスクフレームの前記面に略直交する方向に前後移動した後に、前記マスクフレームの下端から離間するまで下降して、複数の前記マスクフレームを前記ストック載置部の前記ストック溝に載置可能とするストック下支持部と、
     前記ストック載置部にストックされた複数の前記マスクフレームの上側の位置を支持および解放可能とされるとともに、前記ストック下支持部と同じ前記マスクフレームの前記面に略直交する方向に前後移動可能なストック上支持部と、
     を有する、
     請求項1に記載のスパッタリング装置。
    The stock support unit is
    A stock placement portion having a plurality of stock grooves capable of supporting the lower ends of the plurality of mask frames;
    It is possible to ascend, descend and move back and forth, and when it ascends, it abuts on the lower ends of the plurality of mask frames placed in the stock grooves of the stock placement portion to lift the plurality of mask frames, and the stock placement portion After the plurality of mask frames supported as the elevated position being supported as the elevated position in a state of being separated from the back and forth in the direction substantially orthogonal to the surface of the mask frame, A stock lower support portion which is lowered until it is separated from the lower end of the mask frame, and a plurality of the mask frames can be placed on the stock grooves of the stock placement portion;
    The upper position of the plurality of mask frames stocked in the stock mounting portion can be supported and released, and can be moved back and forth in the direction substantially orthogonal to the surface of the mask frame same as the stock lower support portion Stock top support,
    Have
    The sputtering apparatus according to claim 1.
  3.  前記ストック下支持部が、
     ストックされた前記マスクフレームの前記面に略平行な方向に延在して前記マスクフレームの下端を支持する複数の支持溝と、
     これら複数の前記支持溝を、略鉛直方向および前記マスクフレームの面に略直交する方向に前後移動可能とするストック位置交換駆動部と、
     を有する、
     請求項2に記載のスパッタリング装置。
    The stock lower support portion is
    A plurality of support grooves extending in a direction substantially parallel to the surface of the stocked mask frame to support the lower end of the mask frame;
    A stock position exchange driving unit capable of moving the plurality of support grooves back and forth in a substantially vertical direction and a direction substantially orthogonal to the surface of the mask frame
    Have
    The sputtering apparatus according to claim 2.
  4.  前記ストック上支持部が、
     前記マスクフレームの前記面に直交する方向に延在する軸線周りに回動可能とされるとともに、前記マスクフレームの上端を前記マスクフレームの前記面に直交する方向の両側から挟持可能な挟持部を有し、
     前記挟持部が、前記軸線と平行な方向に沿って前後移動可能とされる、
     請求項2に記載のスパッタリング装置。
    The stock upper support portion is
    A clamping portion which is rotatable around an axis extending in a direction perpendicular to the surface of the mask frame and which can clamp the upper end of the mask frame from both sides in a direction orthogonal to the surface of the mask frame Have
    The holding portion is movable back and forth along a direction parallel to the axis.
    The sputtering apparatus according to claim 2.
  5.  前記ストック支持部が、
     複数の前記マスクフレームの下端の位置を支持可能とされた複数のストック溝を有するストック載置部を有し、
     前記駆動支持部が、
     前記マスクフレームの前記面に略直交する方向と平行な軸線を有するとともに回転駆動部により駆動可能な駆動ローラを有し、
     前記回転駆動部により前記駆動ローラを回転駆動することによって、前記ストック載置部の前記ストック溝に載置されている前記マスクフレームのうち、前記駆動ローラに当接している前記マスクフレームを選択して前記マスクフレームの前記面に平行な方向に前記マスクフレームを駆動可能とされる、
     請求項1に記載のスパッタリング装置。
    The stock support unit is
    It has a stock placement portion having a plurality of stock grooves capable of supporting the positions of the lower ends of the plurality of mask frames,
    The drive support portion is
    It has an axis parallel to a direction substantially orthogonal to the surface of the mask frame and has a drive roller which can be driven by a rotational drive unit,
    By driving the drive roller to rotate by the rotary drive unit, the mask frame in contact with the drive roller is selected from the mask frames placed in the stock groove of the stock placement unit. Drive the mask frame in a direction parallel to the surface of the mask frame,
    The sputtering apparatus according to claim 1.
  6.  前記搬送上支持部が上マグネット部を有し、
     前記上マグネット部には、前記マスクフレームの上端に設けられたマグネット部と互いに引き付け合うとともに、前記マスクフレームの前記面に平行な方向と略直交する鉛直面内に形成される磁気回路を有するようにマグネットが配置される、
     請求項1に記載のスパッタリング装置。
    The transport upper support portion has an upper magnet portion,
    The upper magnet portion has a magnetic circuit formed in a vertical plane substantially perpendicular to a direction parallel to the surface of the mask frame while attracting each other with the magnet portion provided on the upper end of the mask frame. The magnet is placed on the
    The sputtering apparatus according to claim 1.
  7.  前記ストック室が、
     前記マスクフレームが未使用であるか使用済みであるかにかかわらず、
     前記ストック室にストックされた前記マスクフレームと前記チャンバ内の成膜位置となる前記マスク室にある前記マスクフレームとの交換を行う場合には、外部に対して前記ストック室を密閉し、かつ、前記チャンバに連通した状態で前記マスクフレームを搬送可能とするとともに、
     前記ストック室にストックされた前記マスクフレームを外部に対して搬入または搬出する場合には、前記チャンバを密閉するとともに前記外部に対して前記ストック室を連通した状態で前記マスクフレームを搬入可能または搬出可能とする密閉手段を有する、
     請求項1に記載のスパッタリング装置。
    The stock room is
    Regardless of whether the mask frame is unused or used,
    When exchanging the mask frame stocked in the stock chamber and the mask frame in the mask chamber which is a deposition position in the chamber, the stock chamber is sealed from the outside and While being able to convey the mask frame in communication with the chamber,
    When the mask frame stocked in the stock chamber is carried in or out with respect to the outside, the mask frame can be carried in or out with the chamber sealed and the stock chamber communicated with the outside. With sealing means to enable
    The sputtering apparatus according to claim 1.
  8.  前記ストック室が、ストックされた前記マスクフレームを交換可能なように複数の前記チャンバに対してそれぞれ接続される、
     請求項7に記載のスパッタリング装置。
    The stock chamber is respectively connected to a plurality of the chambers so as to exchange the stocked mask frame.
    The sputtering apparatus according to claim 7.
  9.  前記チャンバ内の成膜位置となる前記マスク室において、前記マスクフレームの前記面に平行な二方向および前記マスクフレームの前記面に直交する直交方向の三つの軸方向と、前記三つの軸方向の軸線周りの三つの回転方向とによる六自由度にて、前記マスクフレームをアライメント可能とするマスクアライメント手段を有する、
     請求項1に記載のスパッタリング装置。
    In the mask chamber which is a film forming position in the chamber, three axial directions in two directions parallel to the surface of the mask frame and in orthogonal directions orthogonal to the surface of the mask frame, and the three axial directions Mask alignment means for enabling alignment of the mask frame in six degrees of freedom with three rotational directions about an axis,
    The sputtering apparatus according to claim 1.
  10.  請求項6に記載のスパッタリング装置における前記ストック室と前記マスク室との間で搬送可能なマスクフレームであって、
     前記搬送上支持部に設けられた前記上マグネット部と互いに引き付け合うとともに、前記マスクフレームの前記面に平行な方向と略直交する鉛直面内に形成される磁気回路を有するようにマグネットが配置されたマグネット部を有する、
     マスクフレーム。
    A mask frame which can be transported between the stock chamber and the mask chamber in the sputtering apparatus according to claim 6.
    The magnet is disposed so as to attract each other with the upper magnet portion provided on the transport upper support portion and to have a magnetic circuit formed in a vertical plane substantially orthogonal to a direction parallel to the surface of the mask frame Have a magnet part,
    Mask frame.
PCT/JP2018/037229 2017-10-05 2018-10-04 Sputtering device WO2019070031A1 (en)

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