WO2019061815A1 - 阵列基板及阵列基板测试结构 - Google Patents

阵列基板及阵列基板测试结构 Download PDF

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Publication number
WO2019061815A1
WO2019061815A1 PCT/CN2017/114601 CN2017114601W WO2019061815A1 WO 2019061815 A1 WO2019061815 A1 WO 2019061815A1 CN 2017114601 W CN2017114601 W CN 2017114601W WO 2019061815 A1 WO2019061815 A1 WO 2019061815A1
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WIPO (PCT)
Prior art keywords
test
array substrate
display area
test signal
signal receiving
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PCT/CN2017/114601
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English (en)
French (fr)
Inventor
黄耀立
贺兴龙
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武汉华星光电技术有限公司
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Application filed by 武汉华星光电技术有限公司 filed Critical 武汉华星光电技术有限公司
Priority to US15/748,852 priority Critical patent/US10726753B2/en
Publication of WO2019061815A1 publication Critical patent/WO2019061815A1/zh

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/13338—Input devices, e.g. touch panels
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/02—Constructional features of telephone sets
    • H04M1/0202—Portable telephone sets, e.g. cordless phones, mobile phones or bar type handsets
    • H04M1/026—Details of the structure or mounting of specific components
    • H04M1/0266—Details of the structure or mounting of specific components for a display module assembly
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M2250/00—Details of telephonic subscriber devices
    • H04M2250/22—Details of telephonic subscriber devices including a touch pad, a touch sensor or a touch detector

Definitions

  • the present invention relates to the field of touch technologies, and in particular, to an array substrate and an array substrate test structure.
  • Electronic devices typically include an array substrate.
  • the array substrate includes a non-display area and a display area.
  • the display area is usually provided with a functional circuit for driving the operation of the electronic device, such as a touch electrode.
  • a non-display area is disposed around the display area, and is generally used to set a test pin or the like.
  • the array substrate and the liquid crystal layer and the color filter substrate are packaged and packaged.
  • the short-circuit or open-circuit test of the functional lines of the array substrate is generally performed after the box is formed or before the box is formed.
  • the conventional method is to set a test switch circuit and a special test signal input terminal for testing the short circuit or open circuit of the array substrate function line in the non-display area of the array substrate.
  • the input signal terminal of the test switch circuit tends to be relatively large (single terminal 400um ⁇ 400um, a total of 10-20), which takes up a large space and is inconvenient for the narrow frame design of the electronic device.
  • the invention provides an array substrate.
  • An array substrate includes a display area and a non-display area, wherein the non-display area is provided with a plurality of test signal receiving pins, a plurality of pressing pins, and a plurality of transmission lines, and the test signal receiving pins Arranged in a row with the press-fit pins.
  • the test signal receiving pin has the same size as the press pin.
  • the press-fit pin is used to connect a COF module, and the test signal transmission line is electrically connected a test circuit and a test signal receiving pin, wherein the plurality of test signal receiving pins are configured to receive N test signals, and transmit the N test signals to the test circuit via the test signal transmission line, a test circuit is disposed at an end of the non-display area adjacent to the display area, configured to obtain M test signals according to the N test signals, and transmit the M test signals to the function lines in the display area, to Detecting whether the functional circuit is short-circuited or disconnected, and the distance between the test circuit and one end of the non-display area away from the display area is less than or equal to a preset distance, where N and M are both positive integers, and M is greater than N .
  • test signal receiving pins are disposed on the left and right sides of the pressing pin, and are arranged in a line in a line with the pressing pin.
  • the spacer area of the press pin and the test signal receiving pin is provided with a positioning bar for positioning the test fixture, wherein the test fixture is used to generate N test signals .
  • the positioning strip is made of a metal material, and the positioning strip serves as a common grounding end of the pressing pin and the test signal receiving pin.
  • a side of the positioning strip adjacent to the test signal receiving pin is provided with a fixing member for fixing the test fixture.
  • the array substrate of the present invention linearly arranges the size of the test signal receiving pin and the pressing pin in a row, and rearranges the test signal receiving pin and the pressing pin.
  • the structure of the non-display area is more compact, which is beneficial to the narrow frame design of the touch device.
  • the invention also provides an array substrate test structure.
  • the array substrate test structure includes a test fixture and an array substrate, wherein the test fixture is used to generate N test signals, the array substrate includes a display area and a non-display area, and the non-display area is provided with a plurality of test signals.
  • the receiving pin, the plurality of pressing pins, and the plurality of transmission lines, the test signal receiving pin and the pressing pin are arranged in a row.
  • test signal receiving pins are disposed on the left and right sides of the pressing pin, and are arranged in a line in a line with the pressing pin.
  • the positioning area of the pressing pin and the test signal receiving pin is disposed on the positioning strip for positioning of the test fixture.
  • the invention also provides a touch device.
  • the touch device includes the array substrate as described above.
  • FIG. 1 is a schematic structural view of an array substrate according to a preferred embodiment of the present invention.
  • FIG. 2 is a schematic structural view of an array substrate according to another preferred embodiment of the present invention.
  • FIG. 3 is a schematic structural view of an array substrate according to still another preferred embodiment of the present invention.
  • FIG. 4 is a schematic structural view of a test structure of an array substrate according to a preferred embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of a test structure of an array substrate according to another preferred embodiment of the present invention.
  • FIG. 6 is a schematic structural diagram of a test structure of an array substrate according to still another preferred embodiment of the present invention.
  • FIG. 7 is a schematic structural diagram of a touch device according to a preferred embodiment of the present invention.
  • references to "an embodiment” herein mean that a particular feature, structure, or characteristic described in connection with the embodiments can be included in at least one embodiment of the invention.
  • the appearances of the phrases in various places in the specification are not necessarily referring to the same embodiments, and are not exclusive or alternative embodiments that are mutually exclusive. Those skilled in the art will understand and implicitly understand that the embodiments described herein can be combined with other embodiments.
  • FIG. 1 is a schematic structural diagram of an array substrate according to a preferred embodiment of the present invention.
  • the array substrate 10 includes a display area 100 and a non-display area 200.
  • the display area 100 is provided with a function line for driving the touch device to operate.
  • the function line may be, but not limited to, a touch electrode line, a scan line, a signal line, a common electrode line, and the like of the touch device.
  • the non-display area 200 is disposed around the display area 100, and the non-display area 200 is provided with a plurality of test signal receiving leads.
  • the test signal receiving pin 230 is sized and arranged in a row with the press-fit pins 240, and is disposed at one end of the non-display area 200 away from the display area 100.
  • the press-fit pin 240 is used to connect a COF (Chip on FPC) module, and the test signal transmission line 220 is electrically connected to the test circuit 210 and the test signal receiving pin 230, and the plurality of test signal receiving pins 230 are used. N test signals are received, and N of the test signals are transmitted to the test circuit 210 via the test signal transmission line 220.
  • COF Chip on FPC
  • the test circuit 210 is disposed at an end of the non-display area 200 adjacent to the display area 100, and is configured to obtain M test signals according to the N test signals, and transmit the M test signals to the display area 100. a functional line in the middle to detect whether the functional line is shorted or open.
  • the distance between the test circuit 210 and the end of the non-display area 200 away from the display area 100 is less than or equal to a preset distance, where N and M are both positive integers and M is greater than N.
  • the COF module refers to a module that uses an COF technology to fabricate an integrated circuit (IC) on a Flexible Printed Circuit (FPC).
  • the integrated chip may be, but is not limited to, a data chip, a timing chip (TCON), a scan data chip, or the like.
  • the distance between the test circuit 210 and the end of the non-display area 200 away from the display area 100 is less than or equal to a preset distance.
  • the present invention by modifying the larger test signal receiving terminal in the prior art into a pin structure which is similar in size to the press-fit pin 240, since the size of the test signal receiving terminal is significantly reduced, the present invention can be
  • the middle test signal receiving pin 230 and the pinch pin 240 are arranged side by side in a row, thereby greatly reducing the width of the non-display area of the panel.
  • the size of the test signal receiving pin 230 is the same as the size of the press-fit pin 240 to conform to the process consistency, and the size of the press-fit pin 240 is a conventional reference for connecting the COF on the panel. Foot size.
  • test signal receiving pin 230 may be considered to be consistent with the dimensions of the present invention consistently larger or slightly smaller than the pinned pin 240 over a range of accuracy.
  • test signal receiving pin 230 is slightly larger or slightly smaller than the pressure Pins 240, but sufficient to achieve integration with the pinned pins 240 in this case, to facilitate the narrow frame design of the panel, are in line with the original intention of the present invention.
  • the array substrate 10 of the embodiment of the present invention has the size of the test signal receiving pin 230 and the pressing pin 240 arranged in a line in a row, and is disposed at one end of the non-display area 200 away from the display area 100.
  • the structure of the non-display area 200 is more compact, which is advantageous for the narrow bezel design of the touch device.
  • FIG. 2 is a schematic structural diagram of an array substrate according to another embodiment of the present invention.
  • the test signal receiving pins 230 are disposed at the left and right sides of the pressing pin 240, and are arranged in a line in line with the pressing pin 240.
  • a spacing strip of the press pin 240 and the test signal receiving pin 230 is provided with a positioning strip 20 for positioning of the test fixture. Wherein the test fixture is used to generate N of the test signals.
  • the positioning strip 20 is made of a metal material, and the positioning strip 20 serves as a common grounding end of the pressing pin 240 and the test signal receiving pin 230.
  • the positioning strip 20 is made of a metal material and is disposed on the interval between the pressing pin 240 and the test signal receiving pin 230 to play an identification and positioning function on the test fixture. On the other hand, it serves as a common ground terminal of the press pin 240 and the test signal receiving pin 230.
  • the positioning strip 20 may be a small metal strip or a metal sheet with a specific identifier, and the positioning strip 20 includes, but is not limited to, the above range. In the process of a specific application, the positioning bar 20 may be two or more, including but not limited to two.
  • a positioning strip 20 of a metal material is disposed at an interval between the pressing pin 240 and the test signal receiving pin 230, and the test fixture is labeled on the one hand.
  • the function of the positioning avoids the situation that the test fixture is misaligned; on the other hand, as the common grounding end of the pressing pin 240 and the test signal receiving pin 230, the space of the non-display area is further saved. Conducive to the narrow frame design of the touch device.
  • FIG. 3 is a schematic structural diagram of an array substrate according to another embodiment of the present invention.
  • the spacer area of the press pin 240 and the test signal receiving pin 230 is provided with a positioning strip 20 for positioning of the test fixture.
  • the test fixture is used to generate N of the test signals.
  • a side of the positioning strip 20 adjacent to the test signal receiving pin 230 is provided with a fixing member 40 for fixing the test fixture.
  • the fixing member 40 is a structure with a card slot, and the card slot is disposed in the The top surface of the positioning strip 20 or the card slot is disposed on a side of the positioning strip 20 adjacent to the test signal receiving pin 230. At this time, the card slot of the fixing member 40 catches the output portion of the output test signal of the test fixture, thereby functioning as a fixed test fixture.
  • the fixing member 40 is a spring pressing piece, and the spring pressing piece is disposed on a top surface of the positioning bar 20 or disposed adjacent to the test signal receiving pin 230 of the positioning bar 20 . side.
  • the output portion of the output test signal of the test fixture is pressed together with the test signal receiving pin 230 by the elastic force of the spring pressing piece to prevent the test fixture from falling off, and the fixing member 40 includes However, it is not limited to the above structure.
  • the positioning strip 20 and the fixing member 40 may be an integrated structure or two structures independent of each other. In the process of the specific application, the positioning bar 20 may be two or more, including but not limited to two, and the fixing member 40 may be two or more, including but Not limited to two.
  • the positioning strip 20 is disposed at an interval between the pressing pin 240 and the test signal receiving pin 230, and the positioning bar 20 is adjacent to the test signal receiving pin 230.
  • One side of the test fixture is provided with a fixing member 40, and the positioning strip 20 plays a role of identifying and positioning the test fixture to prevent the connection from being misaligned.
  • the fixing member 40 can also be used for fixing the test fixture to prevent the test fixture from falling off during the test.
  • the present invention also provides an array substrate test structure 3.
  • the array substrate test structure 3 includes a test fixture 30 and an array substrate 10.
  • the test fixture 30 is used to generate N test signals.
  • the array substrate 10 may be an array substrate provided in any of the preceding embodiments, and details are not described herein.
  • FIG. 7 is a schematic structural diagram of a touch device according to an embodiment of the present invention.
  • the touch device 1 includes an array substrate 10, and the array substrate 10 may be an array substrate provided in any of the preceding embodiments, and details are not described herein.
  • the touch device 1 can be, but is not limited to, an e-book, a smart phone (such as an Android phone, an iOS phone, a Windows Phone, etc.), a tablet, a palmtop, a laptop, and a mobile Internet device (MID, Mobile Internet Devices). Or wearable devices, etc.

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Abstract

一种阵列基板(10)，所述阵列基板(10)包括显示区(100)及非显示区(200)，非显示区(200)设置有多个测试信号接收引脚(230)、多个压合引脚(240)以及多个传输线(220)，测试信号接收引脚(230)与压合引脚(240)排列成一排。该阵列基板降低了电子装置非显示区(200)的宽度，便于电子装置的窄边框设计。

Description

阵列基板及阵列基板测试结构
本发明要求2017年9月26日递交的发明名称为“阵列基板及阵列基板测试结构”的申请号201710879966.0的在先申请优先权，上述在先申请的内容以引入的方式并入本文本中。
技术领域
本发明涉及触控技术领域，尤其涉及一种阵列基板及阵列基板测试结构。
背景技术
随着科学技术的不断发展，越来越多的具有显示功能的电子装置被广泛的应用于人们的日常生活以及工作当中，为人们的日常生活以及工作带来了巨大的便利，成为当今人们不可或缺的重要工具。电子装置通常包括阵列基板。阵列基板包括非显示区以及显示区。显示区通常设置用于驱动电子装置工作的功能线路，比如触控电极等。非显示区围绕所述显示区设置，通常用于设置测试引脚等。电子装置的制作过程要将阵列基板与液晶层以及彩膜基板进行成盒，封装。而在成盒之后或者成盒之前一般会对阵列基板的功能线路进行短路或断路的测试。为了对阵列基板进行测试，传统方式是在阵列基板的非显示区域中出引脚的端口设置专门测试阵列基板功能线路短路或断路的测试开关电路及专门的测试信号输入端子。为方便扎探针，测试开关电路信号输入端子的体积往往比较大(单个端子400um×400um，共有10～20个)，会占用较大空间，不便于电子装置的窄边框设计。
发明内容
本发明提供一种阵列基板。一种阵列基板，所述阵列基板包括显示区及非显示区，所述非显示区设置有多个测试信号接收引脚、多个压合引脚以及多个传输线，所述测试信号接收引脚与所述压合引脚排列成一排。
其中，所述测试信号接收引脚与所述压合引脚尺寸一致。
其中，所述压合引脚用于连接COF模块，所述测试信号传输线电连接所 述测试电路及测试信号接收引脚，多个所述测试信号接收引脚用于接收N个测试信号，并将N个所述测试信号经由所述测试信号传输线传输至所述测试电路，所述测试电路设置于所述非显示区邻近所述显示区的一端，用于根据N个所述测试信号得到M个测试信号，并将M个测试信号传输至所述显示区中的功能线路，以检测所述功能线路是否短路或者断路，所述测试电路与所述非显示区远离所述显示区的一端的距离小于或等于预设距离，其中，N和M均为正整数，且M大于N。
其中，所述测试信号接收引脚设置在所述压合引脚的左右两侧位置上，并与所述压合引脚呈直线排列成一排。
其中，所述压合引脚与所述测试信号接收引脚的间隔区域设置有定位条，用于所述测试治具的定位，其中，所述测试治具用于产生N个所述测试信号。
可选的，所述定位条为金属材质，所述定位条作为所述压合引脚与所述测试信号接收引脚的共同的接地端。
其中，所述定位条邻近所述测试信号接收引脚的一侧设置有固定件，所述固定件用于固定测试治具。
相较于现有技术，本发明的阵列基板将所述测试信号接收引脚的尺寸与所述压合引脚呈直线排列成一排，通过对测试信号接收引脚与压合引脚的重新排列，使得非显示区的结构更加紧凑，有利于触控装置的窄边框设计。
本发明还提供一种阵列基板测试结构。所述阵列基板测试结构包括测试治具及阵列基板，所述测试治具用于产生N个测试信号，所述阵列基板包括显示区及非显示区，所述非显示区设置有多个测试信号接收引脚、多个压合引脚以及多个传输线，所述测试信号接收引脚与所述压合引脚排列成一排。
其中，所述测试信号接收引脚设置在所述压合引脚的左右两侧位置上，并与所述压合引脚呈直线排列成一排。
其中，所述压合引脚与所述测试信号接收引脚的间隔区域上设置有定位条，用于所述测试治具的定位。
本发明还提供一种触控装置。所述触控装置包括如上所述的阵列基板。
附图说明
为了更清楚地阐述本发明的构造特征和功效，下面结合附图与具体实施例来对其进行详细说明，显而易见地，下面描述中的附图是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1是本发明一较佳实施例提供的阵列基板的结构示意图。
图2是本发明另一较佳实施例提供的阵列基板的结构示意图。
图3是本发明又一较佳实施例提供的阵列基板的结构示意图。
图4是本发明一较佳实施例提供的阵列基板测试结构的结构示意图。
图5是本发明另一较佳实施例提供的阵列基板测试结构的结构示意图。
图6是本发明又一较佳实施例提供的阵列基板测试结构的结构示意图。
图7是本发明一较佳实施例提供的触控装置的结构示意图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例是本发明的一部分实施例，而不是全部实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动的前提下所获得的所有其他实施例，都应属于本发明保护的范围。
在本文中提及“实施例”意味着，结合实施例描述的特定特征、结构或特性可以包含在本发明的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例，也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是，本文所描述的实施例可以与其它实施例相结合。
为了使本发明实施例提供的技术方案更加清楚，下面结合附图对上述方案进行详细描述。
参见图1，图1是本发明一较佳实施例提供的阵列基板的结构示意图。所述阵列基板10包括显示区100及非显示区200，所述显示区100设置有功能线路，所述功能线路用于驱动触控装置工作。所述功能线路可以为但不限于所述触控装置的触控电极线、扫描线、信号线、公共电极线等。所述非显示区200围绕所述显示区100设置，所述非显示区200设置有多个测试信号接收引 脚230、多个压合引脚240、多个测试信号传输线220以及测试电路210。所述测试信号接收引脚230与所述压合引脚240尺寸一致且排列成一排，且均设置于所述非显示区200远离所述显示区100的一端。所述压合引脚240用于连接COF(Chip on FPC)模块，所述测试信号传输线220电连接所述测试电路210及测试信号接收引脚230，多个所述测试信号接收引脚230用于接收N个测试信号，并将N个所述测试信号经由所述测试信号传输线220传输至所述测试电路210。所述测试电路210设置于所述非显示区200邻近所述显示区100的一端，用于根据N个所述测试信号得到M个测试信号，并将M个测试信号传输至所述显示区100中的功能线路，以检测所述功能线路是否短路或者断路。所述测试电路210与所述非显示区200远离所述显示区100的一端的距离小于或等于预设距离，其中，N和M均为正整数，且M大于N。
所述COF模块是指利用COF技术将集成芯片(Integrated Circuit，IC)制作在柔性电路板(Flexible Printed Circuit，FPC)上的模块。所述集成芯片可以为但不仅限于为数据芯片、时序芯片(TCON)、扫描数据芯片等。
其中，所述测试电路210与所述非显示区200远离所述显示区100的一端的距离小于或等于预设距离。
在现有技术中，外界的多种测试信号分别通过设置在非显示区的多个接收端子传输至面板内，但常规的每个接收端子尺寸过大，而无法与用于连接COF的压合引脚并排设置，只能交错设置在压合引脚的两侧，这会显著增大边框宽度不符合窄边框的设计趋势。所以本发明中通过将现有技术中较大的测试信号接收端子改进成为与压合引脚240尺寸相差不大的引脚结构，由于显著缩小了测试信号接收端子的尺寸，所以可将本发明中测试信号接收引脚230与压合引脚240并排在一行设置，进而大大减小了面板非显示区的宽度。
优选的，测试信号接收引脚230的尺寸与所述压合引脚240的尺寸一致，以符合制程工艺上的一致性，而压合引脚240的尺寸就是面板上用于连接COF的常规引脚尺寸。
可以理解的是，考虑到制造公差，测试信号接收引脚230在一定精度范围内略大于或略小于压合引脚240的仍可认为是符合本发明尺寸一致的定义。
同样，可以理解的是，若测试信号接收引脚230的尺寸略大于或略小于压 合引脚240，但足够能实现本案中与压合引脚240集成排成一行，以利于面板窄边框设计，则符合本发明的改进初衷。
本发明实施例的阵列基板10将所述测试信号接收引脚230的尺寸与所述压合引脚240呈直线排列成一排，设置于所述非显示区200远离所述显示区100的一端，通过对测试信号接收引脚230与压合引脚240的重新排列，使得非显示区200的结构更加紧凑，有利于触控装置的窄边框设计。
请参阅图2，图2是本发明另一较佳实施例提供的阵列基板的结构示意图。所述测试信号接收引脚230设置在所述压合引脚240的左右两侧位置上，并与所述压合引脚240呈直线排列成一排。所述压合引脚240与所述测试信号接收引脚230的间隔区域设置有定位条20，用于所述测试治具的定位。其中，所述测试治具用于产生N个所述测试信号。所述定位条20为金属材质，所述定位条20作为所述压合引脚240与所述测试信号接收引脚230的共同的接地端。
其中，定位条20为金属材质，设置在所述压合引脚240与所述测试信号接收引脚230之间的间隔区域上，一方面对所述测试治具起到一个标识定位的作用，另一方面作为所述压合引脚240与所述测试信号接收引脚230的共同的接地端。所述定位条20可以为细小的金属条，也可以为带有特定标识的金属片，所述定位条20包含但不限于上述范围。在具体应用的过程中，所述定位条20可以为两个，也可以为更多个，包含但不仅限于两个。
本发明实施例提供的阵列基板，通过在所述压合引脚240与所述测试信号接收引脚230的间隔区域设置金属材质的定位条20，一方面对所述测试治具起到一个标识定位的作用，避免了所述测试治具连接错位的情况；另一方面作为所述压合引脚240与所述测试信号接收引脚230的共同的接地端，进一步节省非显示区的空间，有利于触控装置的窄边框设计。
请参见图3，图3是本发明又一较佳实施例提供的阵列基板的结构示意图。在本实施例中，所述压合引脚240与所述测试信号接收引脚230的间隔区域设置有定位条20，用于所述测试治具的定位。其中，所述测试治具用于产生N个所述测试信号。所述定位条20邻近所述测试信号接收引脚230的一侧设置有固定件40，所述固定件40用于固定测试治具。
在一实施方式中，所述固定件40为带有卡槽的结构，所述卡槽设置于所 述定位条20的的顶面或者所述卡槽设置于所述定位条20邻近所述测试信号接收引脚230的侧面。此时所述固定件40的卡槽将所述测试治具的输出测试信号的输出部卡住，从而起到固定测试治具的作用。在另一实施方式中，所述固定件40为弹簧压片，所述弹簧压片设置在所述定位条20的顶面或者设置于所述定位条20邻近所述测试信号接收引脚230的侧面。通过弹簧压片的弹力作用，将所述测试治具的输出测试信号的输出部与所述测试信号接收引脚230压合在一起，以防所述测试治具脱落，所述固定件40包含但不仅限于上述结构。所述定位条20和所述固定件40可以为一体化的结构，也可以为相互独立的两个结构。在具体应用的过程中，所述定位条20可以为两个，也可以为更多个，包含但不仅限于两个，所述固定件40可以为两个，也可以为更多个，包含但不仅限于两个。
本发明实施例提供的阵列基板，通过在所述压合引脚240与所述测试信号接收引脚230的间隔区域设置定位条20，在所述定位条20邻近所述测试信号接收引脚230的一侧设置有固定件40，所述定位条20对所述测试治具起到标识定位的作用，防止连接错位的情况发生。且进一步地，所述固定件40还可以用于对所述测试治具进行固定，防止在测试过程中出现测试治具脱落的情况。
本发明还提供了一种阵列基板测试结构3，请参阅图4至图6，所述阵列基板测试结构3包括测试治具30及阵列基板10。所述测试治具30用于产生N个测试信号，所述阵列基板10可以为前面任意一实施例提供的阵列基板，在此不再赘述。
参见图7，图7是本发明实施例的触控装置的结构示意图。所述触控装置1包括阵列基板10，所述阵列基板10可以为前面任意一实施例提供的阵列基板，在此不再赘述。所述触控装置1可以为但不仅限于为电子书、智能手机(如Android手机、iOS手机、Windows Phone手机等)、平板电脑、掌上电脑、笔记本电脑、移动互联网设备(MID，Mobile Internet Devices)或穿戴式设备等。
以上对本发明实施例进行了详细介绍，本文中应用了具体个例对本发明的原理及实施方式进行了阐述，以上实施例的说明只是用于帮助理解本发明的方法及其核心思想；同时，对于本领域的一般技术人员，依据本发明的思想，在 具体实施方式及应用范围上均会有改变之处，综上所述，本说明书内容不应理解为对本发明的限制。

Claims (10)

  1. 一种阵列基板，其中，所述阵列基板包括显示区及非显示区，所述非显示区设置有多个测试信号接收引脚、多个压合引脚以及多个传输线，所述测试信号接收引脚与所述压合引脚排列成一排。
  2. 如权利要求1所述的阵列基板，其中，所述测试信号接收引脚与所述压合引脚尺寸一致。
  3. 如权利要求1所述的阵列基板，其中，所述压合引脚用于连接COF模块，所述测试信号传输线电连接所述测试电路及测试信号接收引脚，多个所述测试信号接收引脚用于接收N个测试信号，并将N个所述测试信号经由所述测试信号传输线传输至所述测试电路，所述测试电路设置于所述非显示区邻近所述显示区的一端，用于根据N个所述测试信号得到M个测试信号，并将M个测试信号传输至所述显示区中的功能线路，以检测所述功能线路是否短路或者断路，所述测试电路与所述非显示区远离所述显示区的一端的距离小于或等于预设距离，其中，N和M均为正整数，且M大于N。
  4. 如权利要求1所述的阵列基板，其中，所述测试信号接收引脚设置在所述压合引脚的左右两侧位置上，并与所述压合引脚呈直线排列成一排。
  5. 如权利要求1所述的阵列基板，其中，所述压合引脚与所述测试信号接收引脚的间隔区域设置有定位条，用于所述测试治具的定位，其中，所述测试治具用于产生N个所述测试信号。
  6. 如权利要求5所述的阵列基板，其中，所述定位条为金属材质，所述定位条作为所述压合引脚与所述测试信号接收引脚的共同的接地端。
  7. 如权利要求5所述的阵列基板，其中，所述定位条邻近所述测试信号接 收引脚的一侧设置有固定件，所述固定件用于固定测试治具。
  8. 一种阵列基板测试结构，其中，所述阵列基板测试结构包括测试治具及阵列基板，所述测试治具用于产生N个测试信号，所述阵列基板包括显示区及非显示区，所述非显示区设置有多个测试信号接收引脚、多个压合引脚以及多个传输线，所述测试信号接收引脚与所述压合引脚排列成一排，其中，N为正整数。
  9. 如权利要求8所述的阵列基板测试结构，其中，所述测试信号接收引脚设置在所述压合引脚的左右两侧位置上，并与所述压合引脚呈直线排列成一排。
  10. 如权利要求8所述的阵列基板测试结构，其中，所述压合引脚与所述测试信号接收引脚的间隔区域上设置有定位条，用于所述测试治具的定位。
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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109994042B (zh) * 2019-04-11 2024-05-03 武汉华星光电技术有限公司 驱动芯片及显示面板
CN210429262U (zh) 2019-10-10 2020-04-28 北京京东方显示技术有限公司 显示面板驱动电路、显示面板及显示装置
CN112540229A (zh) * 2020-12-02 2021-03-23 Tcl华星光电技术有限公司 显示装置以及显示装置的阻抗的检测方法
CN114170937B (zh) * 2021-12-15 2024-05-24 深圳市华星光电半导体显示技术有限公司 一种显示面板及其测试方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008046384A (ja) * 2006-08-17 2008-02-28 Sony Corp 画像表示装置
CN101276526A (zh) * 2007-03-30 2008-10-01 中华映管股份有限公司 显示面板及其制作方法
CN102122478A (zh) * 2010-11-12 2011-07-13 友达光电股份有限公司 显示器及其接合阻抗的检测系统以及检测方法
CN105632382A (zh) * 2016-01-04 2016-06-01 京东方科技集团股份有限公司 显示装置及其检测绑定区域绑定情况的方法
CN105954899A (zh) * 2016-07-08 2016-09-21 武汉华星光电技术有限公司 液晶显示面板以及液晶显示器
CN106990630A (zh) * 2017-05-24 2017-07-28 厦门天马微电子有限公司 显示面板及显示装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4803692B2 (ja) * 2001-07-31 2011-10-26 オプトレックス株式会社 液晶表示パネルの点灯検査方法
KR20060075173A (ko) * 2004-12-28 2006-07-04 삼성전자주식회사 액정 표시 장치의 테스트 장치 및 그 테스트 방법
KR20070103990A (ko) * 2006-04-21 2007-10-25 삼성전자주식회사 표시 패널의 검사 장치 및 검사 방법
JP4890100B2 (ja) * 2006-05-25 2012-03-07 ゲットナー・ファンデーション・エルエルシー 画像表示装置
TWI442360B (zh) * 2010-10-28 2014-06-21 Au Optronics Corp 顯示器及其接合阻抗的檢測系統以及檢測方法
CN204287637U (zh) * 2014-11-19 2015-04-22 上海天马微电子有限公司 阵列基板、显示面板和显示装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008046384A (ja) * 2006-08-17 2008-02-28 Sony Corp 画像表示装置
CN101276526A (zh) * 2007-03-30 2008-10-01 中华映管股份有限公司 显示面板及其制作方法
CN102122478A (zh) * 2010-11-12 2011-07-13 友达光电股份有限公司 显示器及其接合阻抗的检测系统以及检测方法
CN105632382A (zh) * 2016-01-04 2016-06-01 京东方科技集团股份有限公司 显示装置及其检测绑定区域绑定情况的方法
CN105954899A (zh) * 2016-07-08 2016-09-21 武汉华星光电技术有限公司 液晶显示面板以及液晶显示器
CN106990630A (zh) * 2017-05-24 2017-07-28 厦门天马微电子有限公司 显示面板及显示装置

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