WO2018157839A1 - 一种电路板测试装置、方法及系统 - Google Patents

一种电路板测试装置、方法及系统 Download PDF

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Publication number
WO2018157839A1
WO2018157839A1 PCT/CN2018/077779 CN2018077779W WO2018157839A1 WO 2018157839 A1 WO2018157839 A1 WO 2018157839A1 CN 2018077779 W CN2018077779 W CN 2018077779W WO 2018157839 A1 WO2018157839 A1 WO 2018157839A1
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Prior art keywords
circuit board
electrical contact
unit
display component
circuit
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PCT/CN2018/077779
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English (en)
French (fr)
Inventor
张光辉
Original Assignee
惠科股份有限公司
重庆惠科金渝光电科技有限公司
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Application filed by 惠科股份有限公司, 重庆惠科金渝光电科技有限公司 filed Critical 惠科股份有限公司
Priority to US16/087,778 priority Critical patent/US11644499B2/en
Publication of WO2018157839A1 publication Critical patent/WO2018157839A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment

Definitions

  • the present disclosure relates to the field of testing technologies, and in particular, to a circuit board testing apparatus, method, and system.
  • liquid crystal display products are widely used in electronic products such as mobile phones, displays, and LCD TVs.
  • a multimeter to detect the power signal of the circuit board of the liquid crystal product, determine whether the circuit board is qualified by judging whether the voltage value or current value of the power signal meets the standard, or use a final test (FT).
  • the machine checks the power of the circuit board, and uses the probe to insert the test point of the circuit board to test the voltage of the test point, and judges whether the circuit board is qualified by judging whether the display component connected to the probe is normally displayed.
  • the final test bench test requires a dedicated final test bench for each type of board. The test cost is high.
  • Embodiments of the present disclosure provide a circuit board testing apparatus, method, and system, which can be used to turn on a circuit board and display by applying a voltage to a circuit unit so that an electrical contact of the circuit board and an electrical contact of the circuit unit are attached.
  • the electrical connection path between the components is used to judge whether the circuit board is qualified by detecting whether the display component is normally displayed, which is easy to implement, simple in structure, and low in cost.
  • An embodiment of the present disclosure provides a circuit board testing device, the circuit board being used for a display device, including a first electrical contact, the circuit board testing device includes:
  • circuit unit disposed on the display component, one end of the circuit unit is provided with a second electrical contact, the other end of the circuit unit is provided with a third electrical contact, and the third electrical contact passes through the conductive adhesive Electrically connecting with the display component;
  • the alignment portion is disposed on the test bench for defining a position of the circuit board, and the first electrical contact is aligned with the second electrical contact;
  • a pressing portion in contact with the upper surface of the circuit unit, for pressing an end of the circuit unit on which the second electrical contact is disposed, so that the second electrical contact and the first electric
  • the contacts are bonded to electrically connect the electrical connection between the circuit board and the display component.
  • the embodiment of the present disclosure further provides a circuit board testing method based on the above circuit board testing device, which includes:
  • the control pressure applying portion presses the circuit unit to bond the second electrical contact with the first electrical contact to electrically connect the electrical connection path between the circuit board and the display component;
  • the display component is normally displayed, it is determined that the circuit board is qualified, otherwise, the circuit board is determined to be unqualified.
  • the embodiment of the present disclosure further provides a circuit board testing system based on the above circuit board testing device, the circuit board testing system includes: a circuit board testing device, a pressure applying unit, a detecting unit, and a judging unit; the circuit board is used for displaying The device includes a first electrical contact;
  • the circuit board testing device includes: a test station for carrying the circuit board; a display component disposed on the test bench; and a circuit unit disposed on the display component, one end of the circuit unit is provided with a second electrical contact is disposed on the other end of the circuit unit, the third electrical contact is electrically connected to the display component through a conductive adhesive; and the alignment portion is disposed on the test bench And a position of the circuit board for aligning the first electrical contact with the second electrical contact; a pressing portion contacting the upper surface of the circuit unit for the circuit unit Applying one end of the second electrical contact to press the second electrical contact to the first electrical contact to conduct electricity between the circuit board and the display component Sexual connection pathway
  • the pressing unit is configured to control the pressing portion to apply pressure to the circuit unit, and the second electrical contact is adhered to the first electrical contact to electrically connect the electrical connection path between the circuit board and the display component;
  • the detecting unit is configured to detect whether the display component is normally displayed
  • the determining unit is configured to determine that the circuit board is qualified if the display component is normally displayed, and otherwise determine that the circuit board is unqualified.
  • the embodiment of the present disclosure turns on the electrical connection path between the circuit board and the display component by applying pressure to the circuit unit to make the electrical contact of the circuit board and the electrical contact of the circuit unit, thereby detecting and displaying Whether the component is normally displayed to judge whether the circuit board is qualified, easy to implement, simple in structure, and low in cost.
  • FIG. 1 is a block diagram showing the basic structure of a circuit board testing apparatus according to an embodiment of the present disclosure
  • FIG. 2 is a flow chart of a circuit board testing method provided by an embodiment of the present disclosure
  • FIG. 3 is a structural block diagram of a circuit board testing system provided by an embodiment of the present disclosure.
  • FIG. 4 is a structural block diagram of a circuit board test system provided by an embodiment of the present disclosure.
  • an embodiment of the present disclosure provides a circuit board testing apparatus including a test stand 10 , a display assembly 20 , a circuit unit 30 , a matching portion 40 , and a pressing portion 50 .
  • the test bench 10 is used to carry the circuit board 100 and the display assembly 20.
  • test station 10 is an operating platform for placing corresponding test devices.
  • the circuit board in this embodiment is specifically a circuit board of a display type product, and includes a first electrical contact 101 disposed on a main portion of the circuit board 100.
  • the first electrical contact 101 may be a circuit board. Gold finger.
  • the display assembly 20 is disposed on the test bench 10.
  • the display assembly 20 is embedded in the surface of the test bench 10.
  • the display component 20 may be any component capable of realizing a basic display function, such as a liquid crystal display, a plasma display, a cathode ray tube display, an LED display, etc., and the type of the display component is not particularly limited in this embodiment.
  • the display component may refer to a liquid crystal display component capable of implementing a basic display function including a backlight, a Thin Film Transistor (TFT) array, and a corresponding array of liquid crystal pixel dots.
  • TFT Thin Film Transistor
  • the display assembly 20 is covered with a color filter.
  • the circuit unit 30 is disposed on the display component 20.
  • One end of the circuit unit 10 is provided with a second electrical contact 31.
  • the other end of the circuit unit 30 is provided with a third electrical contact 32.
  • the third electrical contact 32 passes through the conductive adhesive 60.
  • the wires 21 of the display assembly 20 are electrically connected to form an electrical connection path between the second electrical contacts 31, the circuit unit 30, the third electrical contacts 32, the conductive paste 60, and the wires 21 to the display assembly 20.
  • the second electrical contact 31 and the third electrical contact 32 can both be gold fingers.
  • the circuit unit 30 can be selected from any material having conductive properties.
  • the circuit unit specifically uses a chip on film (Chip On Flex or Chip On Film, COF).
  • the conductive adhesive may be an isotropic conductive adhesive or an anisotropic conductive adhesive.
  • the conductive adhesive is specifically selected from an anisotropic conductive adhesive, such as an anisotropic conductive film.
  • the alignment portion 40 is disposed on the test bench 10 for defining the position of the circuit board 100 such that the first electrical contact 101 faces the second electrical contact 31.
  • the alignment unit 40 may specifically be a limit pin or a limit block.
  • the pressing portion 50 is in contact with the upper surface of the circuit unit 30 for pressing one end of the circuit unit 30 on which the two electrical contacts 31 are disposed, and the second electrical contact 31 is bonded to the first electrical contact 101.
  • the electrical connection path between the conductive circuit board 100 and the display component 20 is formed by the circuit board 100, the first electrical contact 101, the second electrical contact 31, the circuit unit 30, the third electrical contact 32, and the conductive
  • the pressing part can be selected from a press, specifically a hydraulic machine, a pneumatic press, a screw press, a crank press, etc., and the driving mode of the press can be manual or mechanical.
  • a power supply portion for providing a test power supply to the circuit board is necessarily provided on the test bench.
  • the power supply portion is not particularly limited.
  • a corresponding test power supply may be provided according to the operating voltage of the circuit.
  • the circuit board After the electrical connection path between the circuit board and the display component is turned on, the circuit board is energized, and then the display component is normally displayed by manual observation or automatic detection by the electronic device. If the display component is normally displayed, the determination circuit is determined. The board is qualified, otherwise, the board is judged to be unqualified.
  • the thin film transistor array in the display component is turned on, so that each of the liquid crystal pixel dot arrays corresponding to the thin film transistor array is connected.
  • the liquid crystal molecules in the pixels are deflected to change the polarization of the light emitted by the backlight, thereby displaying the picture; if the display component is not normally displayed, it means that the picture is not displayed or the picture quality is unstable, flickering.
  • the circuit board testing apparatus further includes a detecting portion and a control portion.
  • the detecting unit is disposed on the test bench and is configured to detect whether the display component is normally displayed.
  • the detecting portion is disposed on the test surface facing the light emitting surface of the display component; and the detecting portion may specifically select an illuminometer.
  • the control unit is connected to the detecting unit and configured to determine whether the circuit board is qualified based on the detection result of the detecting unit. If the display unit is normally displayed, it is determined that the circuit board is qualified, otherwise, the circuit board is judged to be unqualified.
  • control portion can be any device having data processing analysis and display functions, such as a personal computer (PC) terminal, a tablet computer, or a dedicated data processing analysis display device.
  • control unit may specifically be a device implemented based on a single chip or an integrated circuit.
  • the detection unit is used to detect the display condition of the display component manually, and the control unit automatically determines whether the circuit board is qualified, thereby effectively saving manpower and improving detection efficiency.
  • control portion is further connected to the pressing portion for controlling the pressing portion to apply pressure to the circuit unit.
  • the control unit by using the control unit to automatically control the pressing portion, the test efficiency can be improved.
  • an embodiment of the present disclosure provides a circuit board testing method based on the above test apparatus, including:
  • Step S01 The control pressure applying portion presses the circuit unit to bond the second electrical contact with the first electrical contact to electrically connect the electrical connection path between the circuit board and the display component.
  • step S01 can be specifically performed manually or mechanically.
  • Step S02 Detect whether the display component is normally displayed.
  • step S02 can be performed by artificial visual inspection or by an illuminometer.
  • Step S03 If the display component is normally displayed, it is determined that the circuit board is qualified, otherwise, the circuit board is determined to be unqualified.
  • the step S03 may be specifically performed by a device having a data processing analysis and display function such as a personal computer terminal, or may be determined manually.
  • an embodiment of the present disclosure provides a circuit board test system 00 based on the above-described circuit board test apparatus for performing the method steps in the embodiment shown in FIG. 2, including:
  • the pressing unit 01 is configured to control the pressing portion to apply pressure to the circuit unit, and the second electrical contact is adhered to the first electrical contact to electrically connect the electrical connection path between the circuit board and the display component;
  • the detecting unit 02 is configured to detect whether the display component is normally displayed
  • the determining unit 03 is configured to determine that the circuit board is qualified if the display component is normally displayed, and otherwise determine that the circuit board is unqualified.
  • the pressure applying unit may be a servo motor
  • the detecting unit may be an illuminometer
  • the determining unit may be a personal computer terminal.
  • an embodiment of the present disclosure provides a circuit board test system 001, including:
  • a processor 110 a communication interface 120, a memory 130, a bus 140, and a display unit 150.
  • the processor 110, the communication interface 120, the memory 130, and the display unit 150 complete communication with each other via the bus 140.
  • the communication interface 120 is configured to communicate with external devices, such as personal computers, smart phones, and the like.
  • the processor 110 is configured to execute the program 131;
  • the display unit 150 can be a liquid crystal display or a digital tube.
  • program 131 can include program code, the program code including computer operating instructions.
  • the processor 110 may be a Central Processing Unit (CPU), or an Application Specific Integrated Circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present disclosure.
  • CPU Central Processing Unit
  • ASIC Application Specific Integrated Circuit
  • the memory 130 is configured to store the program 131.
  • the memory 130 may include a high speed RAM memory and may also include a non-volatile memory such as at least one disk memory.
  • the program 131 may specifically include:
  • the pressing unit 1311 is configured to control the pressing portion to apply pressure to the circuit unit, and the second electrical contact is adhered to the first electrical contact to electrically connect the electrical connection path between the circuit board and the display component;
  • a detecting unit 1312 configured to detect whether the display component is normally displayed
  • the determining unit 1313 is configured to determine that the circuit board is qualified if the display component is normally displayed, and otherwise determine that the circuit board is unqualified.
  • modules or sub-modules in all embodiments of the present disclosure may be implemented by a general-purpose integrated circuit, such as a CPU (Central Processing Unit), or by an ASIC (Application Specific Integrated Circuit).
  • a general-purpose integrated circuit such as a CPU (Central Processing Unit), or by an ASIC (Application Specific Integrated Circuit).
  • the storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

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Abstract

一种电路板测试装置、方法及系统，属于测试技术领域该电路板测试装置包括：测试台（10）、显示组件（20）、电路单元（30）、对位部（40）和施压部（50）。该电路板测试系统（00）包括上述电路板测试装置，以及施压单元（01）、检测单元（02）和判断单元（03）；所述电路板用于显示装置，该电路板包括第一电性接点（101）。

Description

一种电路板测试装置、方法及系统 技术领域
本公开涉及测试技术领域，尤其涉及一种电路板测试装置、方法及系统。
背景技术
随着科学技术的不断发展，各种液晶显示产品层出不穷，液晶显示产品在手机、显示器、液晶电视等电子产品上应用广泛。液晶显示产品在出厂之前需要利用万用表来检测液晶产品的电路板的电源信号，通过判断电源信号的电压值或电流值是否符合标准来判断电路板是否合格，或者利用最终测试(final test，FT)机台对电路板进行通电检查，利用探针插入电路板的测试点来测试测试点的电压，通过判断与探针相连的显示组件是否正常显示来判断电路板是否合格。
然而，利用万用表测试电路板的方式，步骤繁琐、效率低下并且无法测量电路板上所有的部件，利用最终测试机台测试的方式则需要为每种型号的电路板配备专门的最终测试机台，测试成本较高。
公开内容
本公开实施例提供一种电路板测试装置、方法及系统，可以通过采用对电路单元施压，使电路板的电性接点与电路单元的电性接点贴合的方式，导通电路板与显示组件之间的电性连接通路，从而通过检测显示组件是否正常显示来判断电路板是否合格，易于实施、结构简单且成本低廉。
本公开实施例提供一种电路板测试装置，所述电路板用于显示装置，其包括第一电性接点，所述电路板测试装置包括：
测试台，用于承载所述电路板；
显示组件，设置于所述测试台上；
电路单元，设置在所述显示组件上，所述电路单元的一端设置有第二电性接点，所述电路单元的另一端设置有第三电性接点，所述第三电性接点通过导 电胶与所述显示组件电性连接；
对位部，设置于所述测试台上，用于限定所述电路板的位置，使所述第一电性接点对位所述第二电性接点；
施压部，与所述电路单元的上表面接触，用于对所述电路单元上设置有所述第二电性接点的一端施压，使所述第二电性接点与所述第一电性接点贴合，以导通所述电路板与所述显示组件之间的电性连接通路。
本公开实施例还提供一种基于上述电路板测试装置的电路板测试方法，其括：
控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路；
检测所述显示组件是否正常显示；
若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
本公开实施例还提供一种基于上述电路板测试装置的电路板测试系统，所述电路板测试系统包括：电路板测试装置、施压单元、检测单元和判断单元；所述电路板用于显示装置，该电路板包括第一电性接点；
所述电路板测试装置包括：测试台，用于承载所述电路板；显示组件，设置于所述测试台上；电路单元，设置在所述显示组件上，所述电路单元的一端设置有第二电性接点，所述电路单元的另一端设置有第三电性接点，所述第三电性接点通过导电胶与所述显示组件电性连接；对位部，设置于所述测试台上，用于限定所述电路板的位置，使所述第一电性接点对位所述第二电性接点；施压部，与所述电路单元的上表面接触，用于对所述电路单元上设置有所述第二电性接点的一端施压，使所述第二电性接点与所述第一电性接点贴合，以导通所述电路板与所述显示组件之间的电性连接通路；
所述施压单元，用于控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路；
所述检测单元，用于检测所述显示组件是否正常显示；
所述判断单元，用于若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
本公开实施例通过采用对电路单元施压，使电路板的电性接点与电路单元的电性接点贴合的方式，导通电路板与显示组件之间的电性连接通路，从而通过检测显示组件是否正常显示来判断电路板是否合格，易于实施、结构简单且成本低廉。
附图说明
为了更清楚地说明本公开实施例中的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图是本公开的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1是本公开的一个实施例提供的电路板测试装置的基本结构框图；
图2是本公开的一个实施例提供的电路板测试方法的流程框图；
图3是本公开的一个实施例提供的电路板测试系统的结构框图；
图4是本公开的一个实施例提供的电路板测试系统的结构框图。
具体实施方式
为了使本技术领域的人员更好地理解本公开方案，下面将结合本公开实施例中的附图，对本公开实施例中的技术方案进行清楚地描述，显然，所描述的实施例是本公开一部分的实施例，而不是全部的实施例。基于本公开中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都应当属于本公开保护的范围。
本公开的说明书和权利要求书及上述附图中的术语“包括”以及它们任何变形，意图在于覆盖不排他的包含。例如包含一系列步骤或单元的过程、方法或系统、产品或设备没有限定于已列出的步骤或单元，而是可选地还包括没有列出的步骤或单元，或可选地还包括对于这些过程、方法、产品或设备固有的 其它步骤或单元。此外，术语“第一”、“第二”和“第三”等是用于区别不同对象，而非用于描述特定顺序。
如图1所示，本公开的一个实施例提供一种电路板测试装置，其包括测试台10、显示组件20、电路单元30、对位部40和施压部50。
测试台10，用于承载电路板100和显示组件20。
在具体应用中，测试台10为用于放置相应测试器件的操作平台。
本实施例中的电路板具体是指显示类产品的电路板，其包括设置在电路板100的主体部分上的第一电性接点101，在具体应用中第一电性接点101可以为电路板的金手指。
显示组件20，设置于测试台10上。
在本实施例中，显示组件20嵌入式测试在测试台10的表面。
在具体应用中，显示组件20可以是能够实现基本的显示功能的任意组件，例如液晶显示器、等离子体显示器、阴极射线管显示器、LED显示器等，本实施例中不对显示组件的类型作特别限定。
在本公开的一个实施例中，显示组件可以是指包括背光源、薄膜晶体管(Thin Film Transistor，TFT)阵列和对应的液晶像素点阵列在内的能够实现基本的显示功能的液晶显示组件。
在本公开的一个实施例中，显示组件20上方覆盖有彩色滤光片。
电路单元30，设置在显示组件20上，电路单元10的一端设置有第二电性接点31，电路单元30的另一端设置有第三电性接点32，第三电性接点32通过导电胶60与显示组件20的导线21电性连接，形成由第二电性接点31、电路单元30、第三电性接点32、导电胶60、导线21到显示组件20之间的电性连接通路。在具体应用中第二电性接点31和第三电性接点32均可以为金手指。
在具体应用中，电路单元30可以选用任意具有导电特性的材料实现，本实施例中，电路单元具体选用覆晶薄膜(Chip On Flex或Chip On Film，COF)。
在具体应用中，导电胶可以选用各向同性导电胶或各向异性导电胶，本实施例中，导电胶具体选用各向异性导电胶，例如异方性导电薄膜。对位部40， 设置于测试台10上，用于限定电路板100的位置，使第一电性接点101正对第二电性接点31设置。
在具体应用中，对位部40具体可以为限位销或限位块。
施压部50，与电路单元30的上表面接触，用于对电路单元30上设置有二电性接点31的一端施压，使第二电性接点31与第一电性接点101贴合，以导通电路板100与显示组件20之间的电性连接通路，形成由电路板100、第一电性接点101、第二电性接点31、电路单元30、第三电性接点32、导电胶60、导线21到显示组件20之间的电性连接通路。
在具体应用中，施压部可以选用压力机，具体可以选用液压机、气压机、螺旋压力机、曲柄压力机等，压力机的驱动方式可以为手动也可以为机械驱动。
在具体应用中，测试台上必然还设置有为电路板提供测试电源的供电部分，本实施例中不对该供电部分做特别限定，在具体应用中可以根据电路的工作电压提供相应的测试电源。
本实施例提供的电路板测试装置的测试原理为：
在导通电路板与显示组件之间的电性连接通路之后，对电路板通电，然后通过人工观察或电子设备自动检测的方式来检测显示组件是否正常显示，若显示组件正常显示，则判定电路板合格，否则，判定电路板不合格。
本实施例中，显示组件正常显示具体是指导通电路板与显示组件之间的电性连接通路之后，显示组件中的薄膜晶体管阵列开启，使得与薄膜晶体管阵列对应连接的液晶像素点阵列中各像素点中的液晶分子发生偏转从而改变背光源发射的光线的偏极性，从而显示画面；显示组件非正常显示则是指其不显示画面或者显示的画面质量不稳定、忽明忽暗。
本实施例通过采用对电路单元施压，使电路板的电性接点与电路单元的电性接点贴合的方式，导通电路板与显示组件之间的电性连接通路，从而通过检测显示组件是否正常显示来判断电路板是否合格，易于实施、结构简单且成本低廉。
在本公开的一个实施例中，电路板测试装置还包括检测部和控制部。
检测部，设置于测试台，用于检测显示组件是否正常显示。
在具体应用中，检测部设置在测试台上正对显示组件的出光面；检测部具体可以选用照度计。
控制部，与检测部连接，用于根据检测部的检测结果判断电路板是否合格，若显示组件正常显示，则判定电路板合格，否则，判定电路板不合格。
在具体应用中，控制部可以是任何具有数据处理分析和显示功能的器件，例如个人计算机(personal computer，PC)终端、平板电脑或者专用的数据处理分析显示器件。在具体应用中，控制部具体可以为基于单片机或集成电路实现的器件。
本实施通过采用检测部取代人工对显示组件的显示情况进行检测，并通过控制部自动判断电路板是否合格，可以有效节省人力，提高检测效率。
在本公开的一个实施例中，控制部还与施压部连接，用于控制施压部对电路单元施压。本实施例通过采用控制部对施压部进行自动化控制，可以提高测试效率。
如图2所示，本公开的一个实施例提供一种基于上述测试装置的电路板测试方法，其包括：
步骤S01：控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路。
在具体应用中，步骤S01具体可以由人工或机械来执行。
步骤S02：检测所述显示组件是否正常显示。
在具体应用中，步骤S02可以由人工肉眼观察或通过照度计来执行。
步骤S03：若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
在具体应用中，步骤S03具体可以通过个人计算机终端等具有数据处理分析和显示功能的器件来执行，也可以由人工自行判定。
如图3所示，本公开的一个实施例提供一种基于上述电路板测试装置的电路板测试系统00，用于执行图2所示的实施例中的方法步骤，其包括：
施压单元01，用于控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路；
检测单元02，用于检测所述显示组件是否正常显示；
判断单元03，用于若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
在具体应用中，施压单元可以为伺服电机，检测单元可以为照度计，判断单元可以为个人计算机终端。
如图4所示，本公开的一个实施例提供一种电路板测试系统001，其包括：
处理器(processor)110，通信接口(Communications Interface)120，存储器(memory)130，总线140和显示单元150。
处理器110，通信接口120，存储器130和显示单元150通过总线140完成相互间的通信。
通信接口120，用于与外界设备，例如，个人电脑、智能手机等通信。
处理器110，用于执行程序131；
在具体应用中，显示单元150可以液晶显示器或数码管。
具体地，程序131可以包括程序代码，所述程序代码包括计算机操作指令。
处理器110可能是一个中央处理器(Central Processing Unit，CPU)，或者是特定集成电路ASIC(Application Specific Integrated Circuit)，或者是被配置成实施本公开实施例的一个或多个集成电路。
存储器130，用于存放程序131。存储器130可能包含高速RAM存储器，也可能还包括非易失性存储器(non-volatile memory)，例如至少一个磁盘存储器。程序131具体可以包括：
施压单元1311，用于控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路；
检测单元1312，用于检测所述显示组件是否正常显示；
判断单元1313，用于若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
本公开所有实施例中的模块或子模块，可以通过通用集成电路，例如CPU(Central Processing Unit，中央处理器)，或通过ASIC(Application Specific Integrated Circuit，专用集成电路)来实现。
本公开实施例方法中的步骤可以根据实际需要进行顺序调整、合并和删减。
本公开实施例装置中的单元可以根据实际需要进行合并、划分和删减。
本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程，是可以通过计算机程序来指令相关的硬件来完成，所述的程序可存储于一计算机可读取存储介质中，该程序在执行时，可包括如上述各方法的实施例的流程。其中，所述的存储介质可为磁碟、光盘、只读存储记忆体(Read-Only Memory，ROM)或随机存储记忆体(Random Access Memory，RAM)等。
以上所述仅为本公开的较佳实施例而已，并不用以限制本公开，凡在本公开的精神和原则之内所作的任何修改、等同替换和改进等，均应包含在本公开的保护范围之内。

Claims (19)

  1. 一种电路板测试装置，所述电路板用于显示装置，该电路板包括第一电性接点，其中，所述电路板测试装置包括：
    测试台，用于承载所述电路板；
    显示组件，设置于所述测试台上；
    电路单元，设置在所述显示组件上，所述电路单元的一端设置有第二电性接点，所述电路单元的另一端设置有第三电性接点，所述第三电性接点通过导电胶与所述显示组件电性连接；
    对位部，设置于所述测试台上，用于限定所述电路板的位置，使所述第一电性接点对位所述第二电性接点；
    施压部，与所述电路单元的上表面接触，用于对所述电路单元上设置有所述第二电性接点的一端施压，使所述第二电性接点与所述第一电性接点贴合，以导通所述电路板与所述显示组件之间的电性连接通路。
  2. 如权利要求1所述的电路板测试装置，其中，所述电路板测试装置还包括：
    检测部，设置于所述测试台，用于检测所述显示组件是否正常显示；
    控制部，与所述检测部连接，用于根据所述检测部的检测结果判断所述电路板是否合格，若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
  3. 如权利要求2所述的电路板测试装置，其中，所述控制部还与所述施压部连接，用于控制所述施压部对所述电路单元施压。
  4. 如权利要求2所述的电路板测试装置，其中，所述检测部为光照度计。
  5. 如权利要求2所述的电路板测试装置，其中，所述控制部为个人计算机。
  6. 如权利要求3所述的电路板测试装置，其中，所述控制部为个人计算机。
  7. 如权利要求1所述的电路板测试装置，其中，所述对位部为限位销。
  8. 如权利要求1所述的电路板测试装置，其中，所述施压部为压力机。
  9. 如权利要求8所述的电路板测试装置，其中，所述压力机为液压机。
  10. 一种电路板测试装置的电路板测试方法，其中，所述电路板用于显示 装置，该电路板包括第一电性接点；所述电路板测试装置包括：
    测试台，用于承载所述电路板；
    显示组件，设置于所述测试台上；
    电路单元，设置在所述显示组件上，所述电路单元的一端设置有第二电性接点，所述电路单元的另一端设置有第三电性接点，所述第三电性接点通过导电胶与所述显示组件电性连接；
    对位部，设置于所述测试台上，用于限定所述电路板的位置，使所述第一电性接点对位所述第二电性接点；
    施压部，与所述电路单元的上表面接触，用于对所述电路单元上设置有所述第二电性接点的一端施压，使所述第二电性接点与所述第一电性接点贴合，以导通所述电路板与所述显示组件之间的电性连接通路；
    所述电路板测试方法包括：
    控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路；
    检测所述显示组件是否正常显示；
    若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
  11. 一种电路板测试系统，其中，所述电路板测试系统包括：电路板测试装置、施压单元、检测单元和判断单元；所述电路板用于显示装置，该电路板包括第一电性接点；
    所述电路板测试装置包括：
    测试台，用于承载所述电路板；
    显示组件，设置于所述测试台上；
    电路单元，设置在所述显示组件上，所述电路单元的一端设置有第二电性接点，所述电路单元的另一端设置有第三电性接点，所述第三电性接点通过导电胶与所述显示组件电性连接；
    对位部，设置于所述测试台上，用于限定所述电路板的位置，使所述第一 电性接点对位所述第二电性接点；
    施压部，与所述电路单元的上表面接触，用于对所述电路单元上设置有所述第二电性接点的一端施压，使所述第二电性接点与所述第一电性接点贴合，以导通所述电路板与所述显示组件之间的电性连接通路；
    所述施压单元用于控制施压部向电路单元施压，使第二电性接点与第一电性接点贴合，以导通电路板与显示组件之间的电性连接通路；
    所述检测单元用于检测所述显示组件是否正常显示；
    所述判断单元用于若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
  12. 如权利要求11所述的电路板测试系统，其中，所述电路板测试装置还包括：
    检测部，设置于所述测试台，用于检测所述显示组件是否正常显示；
    控制部，与所述检测部连接，用于根据所述检测部的检测结果判断所述电路板是否合格，若所述显示组件正常显示，则判定所述电路板合格，否则，判定所述电路板不合格。
  13. 如权利要求12所述的电路板测试系统，其中，所述控制部还与所述施压部连接，用于控制所述施压部对所述电路单元施压。
  14. 如权利要求12所述的电路板测试系统，其中，所述检测部为光照度计。
  15. 如权利要求12所述的电路板测试系统，其中，所述控制部为个人计算机。
  16. 如权利要求13所述的电路板测试系统，其中，所述控制部为个人计算机。
  17. 如权利要求11所述的电路板测试系统，其中，所述对位部为限位销。
  18. 如权利要求11所述的电路板测试系统，其中，所述施压部为压力机。
  19. 如权利要求18所述的电路板测试系统，其中，所述压力机为液压机。
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