US9443456B2 - Liquid crystal alignment test apparatus and method - Google Patents

Liquid crystal alignment test apparatus and method Download PDF

Info

Publication number
US9443456B2
US9443456B2 US14/111,800 US201314111800A US9443456B2 US 9443456 B2 US9443456 B2 US 9443456B2 US 201314111800 A US201314111800 A US 201314111800A US 9443456 B2 US9443456 B2 US 9443456B2
Authority
US
United States
Prior art keywords
signal input
input port
liquid crystal
probe
ports
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US14/111,800
Other versions
US20160098949A1 (en
Inventor
Shengpeng Mo
Wen-Pin Chiang
Zhengxing Xu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
Original Assignee
Shenzhen China Star Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen China Star Optoelectronics Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Technology Co Ltd
Assigned to SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. reassignment SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHIANG, WEN-PIN, MO, Shengpeng, XU, Zhengxing
Publication of US20160098949A1 publication Critical patent/US20160098949A1/en
Application granted granted Critical
Publication of US9443456B2 publication Critical patent/US9443456B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G02F1/13378—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation
    • G02F1/133788—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation by light irradiation, e.g. linearly polarised light photo-polymerisation
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals

Definitions

  • the present invention relates to test apparatuses, and more particularly, to a liquid crystal alignment test apparatus and a method thereof.
  • LCD liquid crystal display
  • LCD televisions A usual processing of producing the LCD panel is by using an integrated substrate to cut to a number of LCD panel.
  • a HVA photo-alignment method namely, when the substrate is applied voltage, through applying ultraviolet (UV) light to irradiate the substrate to cause monomers of the substrate to reflect, then achieving the alignment.
  • UV light ultraviolet
  • the HVA photo-alignment method is broadly used in thin film transistor (TFT) LCD industry.
  • an ultraviolet photo-alignment device (HVA device) is provided to apply voltage to the substrate via a power providing device to cause the liquid crystals to rotate to the predetermined angle.
  • the edge of the substrate includes a number of signal input ports, the signal input ports includes a color film common electrode signal input port, a blue signal input port, a green signal input port, a red signal input port, an odd gate signal input port, an even gate signal input port, and an array common electrode signal input port.
  • the UVA device applies corresponding voltages to the signal input ports of the substrate via the power providing device to execute the HVA photo-alignment.
  • the alignment test apparatus is like the HVA device and needs the voltage providing device to apply voltage to the substrate, and then determines whether the HVA photo-alignment is unqualified by check images of the substrate.
  • the alignment test apparatus determines the HVA photo-alignment is unqualified, and if the unqualified HVA photo-alignment is not caused by the HVA device, there is need to turn off the alignment test apparatus. And then need to test resistance values between each two signal input ports of the substrate by a voltmeter manually, then to determine whether there is at least two signal input ports are short circuited to determine the qualified causation.
  • the alignment test apparatus when the alignment test apparatus is turned on, it could not to test other substrates, and the general mode needs to test by a voltmeter manually, which wasting time.
  • the present invention provides a liquid crystal alignment test apparatus and method, do not need to turn off the liquid crystal alignment test apparatus which capable of testing whether the photo-alignment is qualified and testing resistance values of the signal input ports to determine the unqualified causation.
  • a liquid crystal alignment test apparatus configured to test a liquid crystal array substrate has been aligned, the liquid crystal array substrate comprises a color film common electrode signal input port, a blue signal input port, a green signal input port, a red signal input port, an odd gate signal input port, an even gate signal input port, and an array common electrode signal input port setting at edges of the liquid crystal array substrate;
  • the liquid crystal alignment test apparatus comprising: a probe tool comprising a plurality of probe ports, wherein, each probe port comprises a first probe and a second probe, the probe ports are configured to respective electrically contacted with the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port, when the liquid crystal array substrate is being tested; a power providing device comprising a plurality of voltage output ports, wherein, the voltage output ports are respectively connected to the first probe of each probe port, the power providing device applies corresponding voltage to the color film common electrode
  • the resistance detection device comprises a programmable logic circuit (PLC) switch and a voltmeter comprising two connectors
  • PLC programmable logic circuit
  • the PLC switch is connected between the two connectors of the voltmeter and the connecting ports of the resistance detection circuit, and is configured to connect the two connectors with each two connecting ports of the voltmeter in sequence; thus making the two connectors are connected to each two second probes of the probe ports in sequence and the voltmeter detects the resistance value of each two of the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate in sequence.
  • PLC programmable logic circuit
  • the resistance detection device detects the resistance value of the two signal input ports is less than a certain value, such as kilo ohm level, thus indicating the two signal input ports are short-circuited.
  • the liquid crystal alignment test apparatus further comprises a display device and programmable logic circuits, the display device is connected to the power providing device and the resistance detection device via the programmable logic circuits.
  • the voltages applied to the liquid crystal array substrate via the power providing device are also transmitted to the display device to display via the programmable logic circuit, and then are provided for the user to check whether the applied voltages are correct.
  • the resistance value detected by the resistance detection circuit is transmitted to the display device to display via the programmable logic circuit, and then is provided to the user to judge whether the signal input ports are short-circuited.
  • the display device is a liquid crystal television or a liquid crystal display.
  • a liquid crystal alignment test method comprising: connecting a liquid crystal array substrate to be tested with a liquid crystal alignment test apparatus, wherein, the liquid crystal array substrate comprises a plurality of signal input ports, the liquid crystal alignment test apparatus comprises a probe tool, a power providing device, and a resistance detection device; the probe tool comprises a plurality of probe ports, each probe port comprises a first probe and a second probe, the probe ports are respective electrically contacted with the signal input ports of the liquid crystal array substrate; applying corresponding voltages to the signal input ports of the liquid crystal array substrate via a voltage providing device and to execute an image check for the liquid crystal array substrate; and detecting resistance values of each two signal input ports of the liquid crystal array substrate via the resistance detection device to judge whether each two of the signal input ports are short-circuited.
  • the power providing device comprises a plurality of voltage output ports respectively connected to the first probe of each probe port
  • the step of applying corresponding voltages to the signal input ports of the liquid crystal array substrate via a voltage providing device and to execute an image check for the liquid crystal array substrate comprises: applying corresponding voltages to the signal input ports of the liquid crystal array substrate via the first probe of each probe and to execute the image check for the liquid crystal array substrate.
  • resistance detection device comprises a plurality of connecting ports respectively connected to the second probe of each probe port
  • the step of detecting resistance values of each two signal input ports of the liquid crystal array substrate via the resistance detection device comprises: detecting resistance values of each two second probes to obtain the resistance value of each two signal input ports of the liquid crystal array substrate via the resistance detection device.
  • the method further comprising: transmitting the resistance value detected by the resistance detection circuit to a display device to display via a programmable logic circuit.
  • the liquid crystal alignment test apparatus and method do not need to turn off the liquid crystal alignment test apparatus and also capable of testing the liquid crystal alignment and testing short-circuit of signal input ports of the liquid crystal array substrate.
  • FIG. 1 is a schematic diagram of a liquid crystal alignment test apparatus of an embodiment
  • FIG. 2 is a schematic diagram of a resistance detection device of a liquid crystal alignment test apparatus of an embodiment
  • FIG. 3 is a flowchart illustrating a liquid crystal alignment test method of an embodiment.
  • a liquid crystal alignment test apparatus 100 is illustrated.
  • the liquid crystal alignment test apparatus 100 is used to test a liquid crystal array substrate 200 has been aligned.
  • the liquid crystal array substrate 200 includes a color film common electrode signal input port CP 1 , a blue signal input port CP 2 , a green signal input port CP 3 , a red signal input port CP 4 , an odd gate signal input port CP 5 , an even gate signal input port CP 6 , and an array common electrode signal input port CP 7 .
  • the liquid crystal alignment test apparatus 100 includes a probe tool 10 , a power providing device 20 , and a resistance detection device 30 .
  • the probe tool 10 includes a number of probe ports P 1 ⁇ P 7 , each probe port includes a first probe SP 1 and a second probe SP 2 .
  • the probe ports P 1 ⁇ P 7 are used to respective electrically contacted with the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 , when the liquid crystal array substrate 200 is being tested.
  • the first probe SP 1 and the second probe SP 2 of each probe port are used to connect to the same signal input port of the liquid crystal array substrate 200 .
  • the first probe SP 1 and the second probe SP 2 of the probe port P 1 are electrically contacted with the color film common electrode signal input port CP 1 .
  • the first probe SP 1 and the second probe SP 2 of the probe port P 2 are electrically contacted with the blue signal input port CP 2 .
  • the first probe SP 1 and the second probe SP 3 of the probe port P 3 are electrically contacted with the green signal input port CP 3 .
  • the first probe SP 1 and the second probe SP 2 of the probe port P 4 are electrically contacted with the red signal input port CP 4 .
  • the first probe SP 1 and the second probe SP 2 of the probe port P 5 are electrically contacted with the odd gate signal input port CP 5 .
  • the first probe SP 1 and the second probe SP 2 of the probe port P 6 are electrically contacted with the even gate signal input port CP 6 .
  • the first probe SP 1 and the second probe SP 2 of the probe port P 7 are electrically contacted with the array common electrode signal input port CP 7 .
  • the power providing device 20 includes a number of voltage output ports 21 , the voltage output ports 21 are respectively connected to the first probe SP 1 of each probe port.
  • the power providing device 20 is electrically connected to the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 via the first probes SP 1 of the probe ports P 1 ⁇ P 7 .
  • the resistance detection device 30 includes a number of connecting ports 31 , the connecting ports 31 are respectively connected to the second probe SP 1 of each probe port.
  • the resistance detection device 30 is electrically connected to the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 via the second probes SP 2 of the probe ports P 1 ⁇ P 7 .
  • the liquid crystal alignment test apparatus 100 tests the liquid crystal alignment of the liquid crystal array substrate 200 , through the power providing device to apply corresponding voltage to the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 . And then to judge whether the alignment is qualified by executing an image check for the liquid crystal array substrate 200 .
  • the image check method is the same as prior art, the detail description is omitted herein.
  • the power providing device 30 stops applying the voltage to the liquid crystal array substrate 200 .
  • the resistance detection device 30 is used to detect resistance values of each two second probes SP 2 to obtain the resistance values of each two of the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 , when the image check is finished.
  • the resistance detection device 30 includes a voltmeter VM including two connectors C 1 , C 2 , and a programmable logic circuit (PLC) switch PS.
  • the PLC switch is connected between the two connectors C 1 and C 2 , and the connecting ports 31 , and is used to connect the two connectors C 1 , C 2 with each two connecting ports 31 in sequence.
  • PLC programmable logic circuit
  • the second probes SP 2 of the probe ports P 1 ⁇ P 7 are respectively connected to the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 .
  • the two connectors C 1 and C 2 of the two connectors C 1 and C 2 are respectively connected to each two of the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 . Therefore, the resistance value detected from the voltmeter VM currently is equal to the resistance value of two second probes SP 2 connected to the two connectors C 1 , C 2 currently, and is also equal to the resistance value of the two signal input ports connected to the two second probes SP 2 currently.
  • the voltmeter VM respectively detects the resistance value of each two of the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 .
  • the resistance values are provided to judge whether there is the short-circuit between the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 .
  • the resistance value of the two signal input ports detected from the voltmeter VM is less than a certain value, such as kilo ohm level, thus indicating the two signal input ports are short-circuited.
  • the liquid crystal alignment test apparatus 100 also includes a display device 40 and programmable logic circuits 50 .
  • the display device 40 is connected to the power providing device 20 and the resistance detection device 30 via the programmable logic circuits 50 .
  • the display device 40 is connected to the power providing device 20 and the resistance detection device 30 via two different programmable logic circuits 50 .
  • the display device 40 is connected to the power providing device 20 and the resistance detection device 30 only via one programmable logic circuit 50 .
  • a detection result of the resistance detection device 30 namely the resistance value detected by the voltmeter VM is transmitted to the display device 40 to display via the programmable logic circuit 50 . Then provided to the user to judge whether the signal input ports are short-circuited. Obviously, the user also can read the resistance value of two signal input ports from the voltmeter VM to judge whether the two signal input ports are short-circuited.
  • the voltages applied to the liquid crystal array substrate 200 via the power providing device 20 is also transmitted to the display device 40 to display via the programmable logic circuit 50 , which are provided for the user to check whether the applied voltages are correct.
  • the display device 40 can be a liquid crystal television or a liquid crystal display.
  • a liquid crystal alignment testing method is illustrated.
  • the probe ports P 1 ⁇ P 7 of the probe tool 10 of the liquid crystal alignment test apparatus 100 are respective electrically contacted with the color film common electrode signal input port CP 1 , the blue signal input port CP 2 , the green signal input port CP 3 , the red signal input port CP 4 , the odd gate signal input port CP 5 , the even gate signal input port CP 6 , and the array common electrode signal input port CP 7 of the liquid crystal array substrate 200 .
  • the voltage providing device 20 applies corresponding voltages to the signal input ports of the liquid crystal array substrate 200 to execute an image check for the liquid crystal array substrate 200 (S 302 ). Therein, the voltage providing device applies corresponding voltages to the signal input ports of the liquid crystal array substrate 200 via the first probe SP 1 of each probe to execute the image check for the liquid crystal array substrate 200 (S 303 ).
  • the resistance detection device 30 detects resistance values of each two signal input ports of the liquid crystal array substrate 200 (S 305 ). In detail, the resistance detection device 30 detects resistance values of each two second probes SP 2 to obtain the resistance values of each two signal input ports of the liquid crystal array substrate 200 . When the resistance value of the two signal input ports is less than a certain value, that indicating the two signal input ports are short-circuited.
  • the method also includes: transmitting the voltages applied to the liquid crystal array substrate 200 to the display device 40 to display via the programmable logic circuit 50 , which are provided for the user to check whether the applied voltages are correct.
  • the liquid crystal alignment test apparatus 100 and method of the present invention do not need to turn off the liquid crystal alignment test apparatus 100 , also can execute the image check and a short-circuit test of the signal input ports of the liquid crystal array substrate 200 .

Abstract

A liquid crystal alignment test method includes: connecting a liquid crystal array substrate to be tested with a liquid crystal alignment test apparatus; applying corresponding voltages to signal input ports of the liquid crystal array substrate via a voltage providing device and then to execute an image check for the liquid crystal array substrate; and detecting resistance values of each two signal input ports of the liquid crystal array substrate via s resistance detection device to judge whether each two of the signal input ports are short-circuited.

Description

TECHNICAL FIELD OF THE INVENTION
The present invention relates to test apparatuses, and more particularly, to a liquid crystal alignment test apparatus and a method thereof.
BACKGROUND OF THE INVENTION
Nowadays, liquid crystal display (LCD) panel are broadly used in LCD devices and LCD televisions. A usual processing of producing the LCD panel is by using an integrated substrate to cut to a number of LCD panel. For the integrated substrate, it is need to be aligned using a HVA photo-alignment method, namely, when the substrate is applied voltage, through applying ultraviolet (UV) light to irradiate the substrate to cause monomers of the substrate to reflect, then achieving the alignment. Nowadays, the HVA photo-alignment method is broadly used in thin film transistor (TFT) LCD industry. In order to guarantee the liquid crystals to form a predetermined angle under the irradiation of the UV light, an ultraviolet photo-alignment device (HVA device) is provided to apply voltage to the substrate via a power providing device to cause the liquid crystals to rotate to the predetermined angle. Usually, the edge of the substrate includes a number of signal input ports, the signal input ports includes a color film common electrode signal input port, a blue signal input port, a green signal input port, a red signal input port, an odd gate signal input port, an even gate signal input port, and an array common electrode signal input port. Usually, the UVA device applies corresponding voltages to the signal input ports of the substrate via the power providing device to execute the HVA photo-alignment. Usually, in order to guarantee the HVA photo-alignment is qualified, there is need to use an alignment test apparatus to test whether the HVA photo-alignment is qualified. Therein, the alignment test apparatus is like the HVA device and needs the voltage providing device to apply voltage to the substrate, and then determines whether the HVA photo-alignment is unqualified by check images of the substrate. However, when alignment test apparatus determines the HVA photo-alignment is unqualified, and if the unqualified HVA photo-alignment is not caused by the HVA device, there is need to turn off the alignment test apparatus. And then need to test resistance values between each two signal input ports of the substrate by a voltmeter manually, then to determine whether there is at least two signal input ports are short circuited to determine the qualified causation.
However, when the alignment test apparatus is turned on, it could not to test other substrates, and the general mode needs to test by a voltmeter manually, which wasting time.
SUMMARY OF THE INVENTION
The present invention provides a liquid crystal alignment test apparatus and method, do not need to turn off the liquid crystal alignment test apparatus which capable of testing whether the photo-alignment is qualified and testing resistance values of the signal input ports to determine the unqualified causation.
A liquid crystal alignment test apparatus, configured to test a liquid crystal array substrate has been aligned, the liquid crystal array substrate comprises a color film common electrode signal input port, a blue signal input port, a green signal input port, a red signal input port, an odd gate signal input port, an even gate signal input port, and an array common electrode signal input port setting at edges of the liquid crystal array substrate; wherein, the liquid crystal alignment test apparatus comprising: a probe tool comprising a plurality of probe ports, wherein, each probe port comprises a first probe and a second probe, the probe ports are configured to respective electrically contacted with the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port, when the liquid crystal array substrate is being tested; a power providing device comprising a plurality of voltage output ports, wherein, the voltage output ports are respectively connected to the first probe of each probe port, the power providing device applies corresponding voltage to the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate via the first probes of the probe ports, and then to execute an image check for the liquid crystal array substrate to judge whether the alignment of the liquid crystal array substrate is qualified; and a resistance detection device comprising a plurality of connecting ports, wherein, the connecting ports are respectively connected to the second probe of each probe port, the resistance detection device is configured to detect resistance values of each two second probes to obtain resistance values of each two of the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate, when the image check is finished; thus judging whether there is a short-circuit between these signal input ports.
Therein, the resistance detection device comprises a programmable logic circuit (PLC) switch and a voltmeter comprising two connectors, the PLC switch is connected between the two connectors of the voltmeter and the connecting ports of the resistance detection circuit, and is configured to connect the two connectors with each two connecting ports of the voltmeter in sequence; thus making the two connectors are connected to each two second probes of the probe ports in sequence and the voltmeter detects the resistance value of each two of the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate in sequence.
Therein, when the resistance detection device detects the resistance value of the two signal input ports is less than a certain value, such as kilo ohm level, thus indicating the two signal input ports are short-circuited.
Therein, the liquid crystal alignment test apparatus further comprises a display device and programmable logic circuits, the display device is connected to the power providing device and the resistance detection device via the programmable logic circuits.
Therein, the voltages applied to the liquid crystal array substrate via the power providing device are also transmitted to the display device to display via the programmable logic circuit, and then are provided for the user to check whether the applied voltages are correct.
Therein, the resistance value detected by the resistance detection circuit is transmitted to the display device to display via the programmable logic circuit, and then is provided to the user to judge whether the signal input ports are short-circuited.
Therein, the display device is a liquid crystal television or a liquid crystal display.
A liquid crystal alignment test method, comprising: connecting a liquid crystal array substrate to be tested with a liquid crystal alignment test apparatus, wherein, the liquid crystal array substrate comprises a plurality of signal input ports, the liquid crystal alignment test apparatus comprises a probe tool, a power providing device, and a resistance detection device; the probe tool comprises a plurality of probe ports, each probe port comprises a first probe and a second probe, the probe ports are respective electrically contacted with the signal input ports of the liquid crystal array substrate; applying corresponding voltages to the signal input ports of the liquid crystal array substrate via a voltage providing device and to execute an image check for the liquid crystal array substrate; and detecting resistance values of each two signal input ports of the liquid crystal array substrate via the resistance detection device to judge whether each two of the signal input ports are short-circuited.
Therein, the power providing device comprises a plurality of voltage output ports respectively connected to the first probe of each probe port, the step of applying corresponding voltages to the signal input ports of the liquid crystal array substrate via a voltage providing device and to execute an image check for the liquid crystal array substrate comprises: applying corresponding voltages to the signal input ports of the liquid crystal array substrate via the first probe of each probe and to execute the image check for the liquid crystal array substrate.
Therein, resistance detection device comprises a plurality of connecting ports respectively connected to the second probe of each probe port, the step of detecting resistance values of each two signal input ports of the liquid crystal array substrate via the resistance detection device comprises: detecting resistance values of each two second probes to obtain the resistance value of each two signal input ports of the liquid crystal array substrate via the resistance detection device.
Therein, the method further comprising: transmitting the resistance value detected by the resistance detection circuit to a display device to display via a programmable logic circuit.
The liquid crystal alignment test apparatus and method, do not need to turn off the liquid crystal alignment test apparatus and also capable of testing the liquid crystal alignment and testing short-circuit of signal input ports of the liquid crystal array substrate.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic diagram of a liquid crystal alignment test apparatus of an embodiment;
FIG. 2 is a schematic diagram of a resistance detection device of a liquid crystal alignment test apparatus of an embodiment; and
FIG. 3 is a flowchart illustrating a liquid crystal alignment test method of an embodiment.
 DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
Referring to FIG. 1, a liquid crystal alignment test apparatus 100 is illustrated. The liquid crystal alignment test apparatus 100 is used to test a liquid crystal array substrate 200 has been aligned.
The liquid crystal array substrate 200 includes a color film common electrode signal input port CP1, a blue signal input port CP2, a green signal input port CP3, a red signal input port CP4, an odd gate signal input port CP5, an even gate signal input port CP6, and an array common electrode signal input port CP7.
The liquid crystal alignment test apparatus 100 includes a probe tool 10, a power providing device 20, and a resistance detection device 30.
The probe tool 10 includes a number of probe ports P1˜P7, each probe port includes a first probe SP1 and a second probe SP2. The probe ports P1˜P7 are used to respective electrically contacted with the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7, when the liquid crystal array substrate 200 is being tested.
The first probe SP1 and the second probe SP2 of each probe port are used to connect to the same signal input port of the liquid crystal array substrate 200. For example, the first probe SP1 and the second probe SP2 of the probe port P1 are electrically contacted with the color film common electrode signal input port CP1. The first probe SP1 and the second probe SP2 of the probe port P2 are electrically contacted with the blue signal input port CP2. The first probe SP1 and the second probe SP3 of the probe port P3 are electrically contacted with the green signal input port CP3. The first probe SP1 and the second probe SP2 of the probe port P4 are electrically contacted with the red signal input port CP4. The first probe SP1 and the second probe SP2 of the probe port P5 are electrically contacted with the odd gate signal input port CP5. The first probe SP1 and the second probe SP2 of the probe port P6 are electrically contacted with the even gate signal input port CP6. The first probe SP1 and the second probe SP2 of the probe port P7 are electrically contacted with the array common electrode signal input port CP7.
The power providing device 20 includes a number of voltage output ports 21, the voltage output ports 21 are respectively connected to the first probe SP1 of each probe port. The power providing device 20 is electrically connected to the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200 via the first probes SP1 of the probe ports P1˜P7.
The resistance detection device 30 includes a number of connecting ports 31, the connecting ports 31 are respectively connected to the second probe SP1 of each probe port. The resistance detection device 30 is electrically connected to the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200 via the second probes SP2 of the probe ports P1˜P7.
Therein, when the liquid crystal alignment test apparatus 100 tests the liquid crystal alignment of the liquid crystal array substrate 200, through the power providing device to apply corresponding voltage to the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7. And then to judge whether the alignment is qualified by executing an image check for the liquid crystal array substrate 200. The image check method is the same as prior art, the detail description is omitted herein.
When the image check for the liquid crystal array substrate 200 is finished, the power providing device 30 stops applying the voltage to the liquid crystal array substrate 200.
The resistance detection device 30 is used to detect resistance values of each two second probes SP2 to obtain the resistance values of each two of the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200, when the image check is finished. Thus judging whether there is a short-circuit between the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7, according to the resistance value of each two of these signal input ports. If there is the short-circuit, then determines the two signal input ports which are short circuited, which is provided to a user to repair.
Referring also to FIG. 2. In detail, the resistance detection device 30 includes a voltmeter VM including two connectors C1, C2, and a programmable logic circuit (PLC) switch PS. The PLC switch is connected between the two connectors C1 and C2, and the connecting ports 31, and is used to connect the two connectors C1, C2 with each two connecting ports 31 in sequence. Thus making the two connectors C1, C2 are connected to each two second probes SP2 of the probe ports P1˜P7 in sequence. As described above, the second probes SP2 of the probe ports P1˜P7 are respectively connected to the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200. Therefore, the two connectors C1 and C2 of the two connectors C1 and C2 are respectively connected to each two of the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200. Therefore, the resistance value detected from the voltmeter VM currently is equal to the resistance value of two second probes SP2 connected to the two connectors C1, C2 currently, and is also equal to the resistance value of the two signal input ports connected to the two second probes SP2 currently.
The voltmeter VM respectively detects the resistance value of each two of the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200. The resistance values are provided to judge whether there is the short-circuit between the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7.
In detail, when the resistance value of the two signal input ports detected from the voltmeter VM is less than a certain value, such as kilo ohm level, thus indicating the two signal input ports are short-circuited.
Therein, as shown in FIG. 1, the liquid crystal alignment test apparatus 100 also includes a display device 40 and programmable logic circuits 50. The display device 40 is connected to the power providing device 20 and the resistance detection device 30 via the programmable logic circuits 50. As shown in FIG. 1, in the embodiment, the display device 40 is connected to the power providing device 20 and the resistance detection device 30 via two different programmable logic circuits 50. In another embodiment, the display device 40 is connected to the power providing device 20 and the resistance detection device 30 only via one programmable logic circuit 50.
Therein, a detection result of the resistance detection device 30, namely the resistance value detected by the voltmeter VM is transmitted to the display device 40 to display via the programmable logic circuit 50. Then provided to the user to judge whether the signal input ports are short-circuited. Obviously, the user also can read the resistance value of two signal input ports from the voltmeter VM to judge whether the two signal input ports are short-circuited.
The voltages applied to the liquid crystal array substrate 200 via the power providing device 20 is also transmitted to the display device 40 to display via the programmable logic circuit 50, which are provided for the user to check whether the applied voltages are correct.
The display device 40 can be a liquid crystal television or a liquid crystal display.
Referring to FIG. 3, a liquid crystal alignment testing method is illustrated. At first, connecting the liquid crystal alignment test apparatus 100 with the liquid crystal array substrate 200 to be tested (S301). Therein, the probe ports P1˜P7 of the probe tool 10 of the liquid crystal alignment test apparatus 100 are respective electrically contacted with the color film common electrode signal input port CP1, the blue signal input port CP2, the green signal input port CP3, the red signal input port CP4, the odd gate signal input port CP5, the even gate signal input port CP6, and the array common electrode signal input port CP7 of the liquid crystal array substrate 200.
The voltage providing device 20 applies corresponding voltages to the signal input ports of the liquid crystal array substrate 200 to execute an image check for the liquid crystal array substrate 200 (S302). Therein, the voltage providing device applies corresponding voltages to the signal input ports of the liquid crystal array substrate 200 via the first probe SP1 of each probe to execute the image check for the liquid crystal array substrate 200 (S303).
The resistance detection device 30 detects resistance values of each two signal input ports of the liquid crystal array substrate 200 (S305). In detail, the resistance detection device 30 detects resistance values of each two second probes SP2 to obtain the resistance values of each two signal input ports of the liquid crystal array substrate 200. When the resistance value of the two signal input ports is less than a certain value, that indicating the two signal input ports are short-circuited.
Transmitting the resistance value detected by the resistance detection device 30 to the display device 40 to display via the programmable logic circuit 50, which is provided to the user to judge whether the signal input ports of the liquid crystal array substrate 200 are short-circuited (S307).
In the embodiment, the method also includes: transmitting the voltages applied to the liquid crystal array substrate 200 to the display device 40 to display via the programmable logic circuit 50, which are provided for the user to check whether the applied voltages are correct.
The liquid crystal alignment test apparatus 100 and method of the present invention, do not need to turn off the liquid crystal alignment test apparatus 100, also can execute the image check and a short-circuit test of the signal input ports of the liquid crystal array substrate 200.
The present invention may be embodied in other forms without departing from the spirit or novel characteristics thereof. The embodiments disclosed in this application are to be considered in all respects as illustrative and not limitative. The scope of the invention is indicated by the appended claims rather than by the foregoing description; and all changes which come within the meaning and range of equivalency of the claims are intended to be embraced therein.

Claims (11)

What is claimed is:
1. A liquid crystal alignment test apparatus, configured to test a liquid crystal array substrate that has been aligned, the liquid crystal array substrate comprises a color film common electrode signal input port, a blue signal input port, a green signal input port, a red signal input port, an odd gate signal input port, an even gate signal input port, and an array common electrode signal input port setting at edges of the liquid crystal array substrate; wherein, the liquid crystal alignment test apparatus comprising;
a probe tool comprising a plurality of probe ports, wherein, each probe port comprises a first probe and a second probe, the probe ports are configured to be respectively electrically contacted with the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port, when the liquid crystal array substrate is being tested;
a power providing device comprising a plurality of voltage output ports, wherein, the voltage output ports are respectively connected to the first probe of each probe port, the power providing device applies corresponding voltage to the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate via the first probes of the probe ports, and then to execute an image check for the liquid crystal array substrate to judge whether the alignment of the liquid crystal array substrate is qualified; and
a resistance detection device comprising a plurality of connecting ports, wherein, the connecting ports are respectively connected to the second probe of each probe port, the resistance detection device is configured to detect resistance values between each two second probes to obtain resistance values MAI between each two of the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate, when the image check is finished; thus judging whether there is a short-circuit between these signal input ports.
2. A liquid crystal alignment test apparatus, configured to test a liquid crystal array substrate that has been aligned, the liquid crystal array substrate comprises a color film common electrode signal input port, a blue signal input port, a green signal input port, a red signal input port, an odd gate signal input port an even gate signal input port, and an array common electrode signal input port setting at edges of the liquid crystal array substrate: wherein, the liquid crystal alignment test apparatus comprising:
a probe tool comprising a plurality of probe ports, wherein, each probe port comprises a first probe and a second probe, the probe ports are configured to be respectively electrically contacted with the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port, when the liquid crystal array substrate is being tested;
a power providing device comprising a plurality of voltage output ports, wherein, the voltage output ports are respectively connected to the first probe of each probe port, the power providing device applies corresponding voltage to the color film common electrode signal input port the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate via the first probes of the probe ports, and then to execute an image check for the liquid crystal array substrate to judge whether the alignment of the liquid crystal array substrate is qualified; and
a resistance detection device comprising a plurality of connecting ports, wherein, the connecting ports are respectively connected to the second probe of each probe port, the resistance detection device is configured to detect resistance values between each two second probes to obtain resistance values between each two of the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate, when the image check is finished; thus judging whether there is a short-circuit between these signal input ports, wherein the resistance detection device comprises a programmable logic circuit (PLC) switch and a voltmeter comprising two connectors, the PLC switch is connected between the two connectors of the voltmeter and the connecting ports of the resistance detection circuit, and is configured to connect the two connectors with each two connecting ports of the voltmeter in sequence; thus making the two connectors be connected to each two of the second probes of the probe ports in sequence and the voltmeter detects the resistance value between each two of the color film common electrode signal input port, the blue signal input port, the green signal input port, the red signal input port, the odd gate signal input port, the even gate signal input port, and the array common electrode signal input port of the liquid crystal array substrate in sequence.
3. The test apparatus of claim 1 or 2, wherein when the resistance detection device detects the resistance value of the two signal input ports is less than a certain value, such as kilo ohm level, thus indicating the two signal input ports are short-circuited.
4. The test apparatus of claim 1, wherein the liquid crystal alignment test apparatus further comprises a display device and programmable logic circuits, the display device is connected to the power providing device and the resistance detection device via the programmable logic circuits.
5. The test apparatus of claim 4, wherein the voltages applied to the liquid crystal array substrate via the power providing device are also transmitted to the display device to display via the programmable logic circuit, and then are provided for the user to check whether the applied voltages are correct.
6. The test apparatus of claim 3, wherein the resistance value detected by the resistance detection circuit is transmitted to the display device to display via the programmable logic circuit, and then is provided to the user to judge whether the signal input ports are short-circuited.
7. The test apparatus of claim 4, wherein the display device is a liquid crystal television or a liquid crystal display.
8. A liquid crystal alignment test method, comprising:
connecting a liquid crystal array substrate to be tested with a liquid crystal alignment test apparatus, wherein, the liquid crystal array substrate comprises a plurality of signal input ports, the liquid crystal alignment test apparatus comprises a probe tool, a power providing device, and a resistance detection device; the probe tool comprises a plurality of probe ports, each probe port comprises a first probe and a second probe, the probe ports are respective electrically contacted with the signal input ports of the liquid crystal array substrate;
applying corresponding voltages to the signal input ports of the liquid crystal array substrate via a voltage providing device and to execute an image check for the liquid crystal array substrate; and
detecting resistance values between each two signal input ports of the liquid crystal array substrate via the resistance detection device to judge whether any two of the signal input ports are short-circuited.
9. The method of claim 8, wherein the power providing device comprises a plurality of voltage output ports respectively connected to the first probe of each probe port, the step of applying corresponding voltages to the signal input ports of the liquid crystal array substrate via a voltage providing device and to execute an image check for the liquid crystal array substrate comprises:
applying corresponding voltages to the signal input ports of the liquid crystal array substrate via the first probe of each probe and to execute the image check for the liquid crystal array substrate.
10. The method of claim 8, wherein resistance detection device comprises a plurality of connecting ports respectively connected to the second probe of each probe port, the step of detecting resistance values between each two signal input ports of the liquid crystal allay substrate via the resistance detection device comprises:
detecting resistance values between each two second probes to obtain the resistance value between each two signal input ports of the liquid crystal array substrate via the resistance detection device.
11. The method of claim 8, further comprising:
transmitting the resistance value detected by the resistance detection circuit to a display device to display via a programmable logic circuit.
US14/111,800 2013-06-26 2013-06-30 Liquid crystal alignment test apparatus and method Active US9443456B2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
CN201310260939 2013-06-26
CN201310260939.7A CN103293771B (en) 2013-06-26 2013-06-26 LCD alignment inspection machine and method
CN201310260939.7 2013-06-26
PCT/CN2013/078549 WO2014205857A1 (en) 2013-06-26 2013-06-30 Liquid crystal alignment detecting machine and method

Publications (2)

Publication Number Publication Date
US20160098949A1 US20160098949A1 (en) 2016-04-07
US9443456B2 true US9443456B2 (en) 2016-09-13

Family

ID=49094919

Family Applications (1)

Application Number Title Priority Date Filing Date
US14/111,800 Active US9443456B2 (en) 2013-06-26 2013-06-30 Liquid crystal alignment test apparatus and method

Country Status (3)

Country Link
US (1) US9443456B2 (en)
CN (1) CN103293771B (en)
WO (1) WO2014205857A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104317107B (en) * 2014-09-26 2017-05-24 深圳市华星光电技术有限公司 Orienting ultraviolet optical radiation machine
CN104298005B (en) * 2014-10-11 2017-02-22 深圳市华星光电技术有限公司 Method for manufacturing liquid crystal display panel
JP6430858B2 (en) * 2015-02-27 2018-11-28 理想科学工業株式会社 Substrate connection system and inkjet recording apparatus
CN105679216B (en) * 2016-01-04 2018-05-22 京东方科技集团股份有限公司 The detection device and detection method of a kind of display device
CN106097941B (en) * 2016-06-08 2019-04-02 深圳市华星光电技术有限公司 The test method of display panel, test system for display panel and display panel
CN106444162B (en) * 2016-08-22 2019-07-30 厦门天马微电子有限公司 Glass substrate, liquid crystal display device and electronic equipment
CN106548737A (en) * 2016-12-09 2017-03-29 曾周 A kind of detection method for preventing LCD products to lack section and short circuit
CN106647044B (en) * 2016-12-14 2019-08-13 深圳市华星光电技术有限公司 Light alignment apparatus for liquid crystal display panel
CN107561746B (en) * 2017-10-12 2020-06-09 京东方科技集团股份有限公司 Method and device for detecting alignment capability of photo-alignment film and storage medium
CN108008579B (en) * 2017-11-30 2020-06-30 深圳市华星光电技术有限公司 Optical alignment method of liquid crystal display panel
CN109935181A (en) * 2017-12-19 2019-06-25 上海和辉光电有限公司 A kind of driving circuit, the method and display for detecting connecting component impedance
CN108873490A (en) * 2018-08-27 2018-11-23 惠科股份有限公司 Ultraviolet light orientation irradiation system and its detection device
CN109061952B (en) * 2018-09-12 2021-03-23 Tcl华星光电技术有限公司 Liquid crystal panel alignment system and liquid crystal panel alignment method
WO2020087519A1 (en) * 2018-11-02 2020-05-07 大族激光科技产业集团股份有限公司 Quality test device, method, and system, and integrated probe assembly
CN110187529A (en) * 2019-05-22 2019-08-30 深圳市华星光电半导体显示技术有限公司 Display panel processing method and display panel processing system
CN112212782B (en) * 2019-06-25 2023-01-17 合肥欣奕华智能机器股份有限公司 Glass substrate detection method, device and system
CN112201186A (en) * 2020-10-10 2021-01-08 深圳市华星光电半导体显示技术有限公司 Test component group
CN114035355B (en) * 2021-11-22 2023-06-27 深圳市华星光电半导体显示技术有限公司 Detection method and detection system for display panel
CN114137437B (en) * 2021-12-07 2023-05-30 Tcl华星光电技术有限公司 Line short circuit detection method for sub-millimeter light-emitting diode backlight substrate

Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5473261A (en) * 1993-06-11 1995-12-05 Sharp Kabushiki Kaisha Inspection apparatus and method for display device
US5639390A (en) * 1993-12-24 1997-06-17 Tokyo Electron Limited Conductor pattern check apparatus for locating and repairing open circuits
JP2000035442A (en) 1998-07-15 2000-02-02 Toshiba Corp Probe for electrical characteristic measurement of flat display device substrate
US6028442A (en) * 1996-04-24 2000-02-22 Samsung Electronics, Co., Ltd. Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof
US6137300A (en) 1997-08-22 2000-10-24 Nec Corporation Test probe device for a display panel and test probe positioning method
JP2004325319A (en) 2003-04-25 2004-11-18 Toray Eng Co Ltd Probe device
US20040239364A1 (en) * 2003-06-02 2004-12-02 Lg.Philips Lcd Co., Ltd. Method and apparatus for inspecting and repairing liquid crystal display device
CN1712975A (en) 2004-06-22 2005-12-28 瀚宇彩晶股份有限公司 Connected impedance measurement and structure
US20060290371A1 (en) 2005-06-24 2006-12-28 Innolux Display Corp. Testing apparatus and testing method using the same
US20090215347A1 (en) * 2008-02-21 2009-08-27 Chae-Hyun Lee Test apparatus for liquid crystal display device and test method using the same
US7616004B1 (en) * 2004-10-25 2009-11-10 The United States Of America As Represented By The Department Of The Navy Backplane tester and method of use
CN101661169A (en) 2008-08-27 2010-03-03 北京京东方光电科技有限公司 Method and device for detecting bright spot and dark spot of liquid crystal display
US20100052713A1 (en) * 2008-08-26 2010-03-04 Epson Imaging Devices Corporation Display device and test probe for testing display device
US20100134137A1 (en) * 2007-04-25 2010-06-03 Kazutoshi Kida Liquid crystal display panel and its inspecting method
CN101750785A (en) 2008-12-12 2010-06-23 奇美电子股份有限公司 The wild display device of double vision, bilateral-visual display panel and manufacture method thereof
US20110175800A1 (en) * 2008-08-06 2011-07-21 Sharp Kabushiki Kaisha Method for testing liquid crystal display device and liquid crystal display device
CN102841464A (en) 2012-08-23 2012-12-26 深圳市华星光电技术有限公司 Liquid crystal light alignment applied voltage circuit and liquid crystal light alignment panel
JP2013096758A (en) 2011-10-28 2013-05-20 Shimadzu Corp Tft array inspection device
CN103135268A (en) 2013-03-20 2013-06-05 深圳市华星光电技术有限公司 Detection device of liquid crystal display panel
US20140159759A1 (en) * 2011-08-31 2014-06-12 Sharp Kabushiki Kaisha Wiring fault detection method, wiring fault detection apparatus, and method for manufacturing semiconductor substrate
US20140267200A1 (en) * 2011-12-01 2014-09-18 JVC Kenwood Corporation Description liquid crystal display device and pixel inspection method therefor

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201138366Y (en) * 2008-01-10 2008-10-22 环国科技股份有限公司 Panel test structure
CN101750765B (en) * 2008-12-18 2011-12-28 北京京东方光电科技有限公司 Poor-line-breaking detection method of liquid crystal display common electrode line

Patent Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5473261A (en) * 1993-06-11 1995-12-05 Sharp Kabushiki Kaisha Inspection apparatus and method for display device
US5639390A (en) * 1993-12-24 1997-06-17 Tokyo Electron Limited Conductor pattern check apparatus for locating and repairing open circuits
US6028442A (en) * 1996-04-24 2000-02-22 Samsung Electronics, Co., Ltd. Test circuit for identifying open and short circuit defects in a liquid crystal display and method thereof
US6137300A (en) 1997-08-22 2000-10-24 Nec Corporation Test probe device for a display panel and test probe positioning method
JP2000035442A (en) 1998-07-15 2000-02-02 Toshiba Corp Probe for electrical characteristic measurement of flat display device substrate
JP2004325319A (en) 2003-04-25 2004-11-18 Toray Eng Co Ltd Probe device
US20040239364A1 (en) * 2003-06-02 2004-12-02 Lg.Philips Lcd Co., Ltd. Method and apparatus for inspecting and repairing liquid crystal display device
CN1712975A (en) 2004-06-22 2005-12-28 瀚宇彩晶股份有限公司 Connected impedance measurement and structure
US7616004B1 (en) * 2004-10-25 2009-11-10 The United States Of America As Represented By The Department Of The Navy Backplane tester and method of use
US20060290371A1 (en) 2005-06-24 2006-12-28 Innolux Display Corp. Testing apparatus and testing method using the same
US20100134137A1 (en) * 2007-04-25 2010-06-03 Kazutoshi Kida Liquid crystal display panel and its inspecting method
US20090215347A1 (en) * 2008-02-21 2009-08-27 Chae-Hyun Lee Test apparatus for liquid crystal display device and test method using the same
US20110175800A1 (en) * 2008-08-06 2011-07-21 Sharp Kabushiki Kaisha Method for testing liquid crystal display device and liquid crystal display device
US20100052713A1 (en) * 2008-08-26 2010-03-04 Epson Imaging Devices Corporation Display device and test probe for testing display device
CN101661169A (en) 2008-08-27 2010-03-03 北京京东方光电科技有限公司 Method and device for detecting bright spot and dark spot of liquid crystal display
CN101750785A (en) 2008-12-12 2010-06-23 奇美电子股份有限公司 The wild display device of double vision, bilateral-visual display panel and manufacture method thereof
US20140159759A1 (en) * 2011-08-31 2014-06-12 Sharp Kabushiki Kaisha Wiring fault detection method, wiring fault detection apparatus, and method for manufacturing semiconductor substrate
JP2013096758A (en) 2011-10-28 2013-05-20 Shimadzu Corp Tft array inspection device
US20140267200A1 (en) * 2011-12-01 2014-09-18 JVC Kenwood Corporation Description liquid crystal display device and pixel inspection method therefor
CN102841464A (en) 2012-08-23 2012-12-26 深圳市华星光电技术有限公司 Liquid crystal light alignment applied voltage circuit and liquid crystal light alignment panel
CN103135268A (en) 2013-03-20 2013-06-05 深圳市华星光电技术有限公司 Detection device of liquid crystal display panel

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Liu YaLi, the International Searching Authority written comments, Apr. 2014, CN.

Also Published As

Publication number Publication date
CN103293771A (en) 2013-09-11
US20160098949A1 (en) 2016-04-07
CN103293771B (en) 2015-11-25
WO2014205857A1 (en) 2014-12-31

Similar Documents

Publication Publication Date Title
US9443456B2 (en) Liquid crystal alignment test apparatus and method
US10416812B2 (en) Display substrate and method for testing the same, display apparatus
US9099023B2 (en) Display driver circuit, operating method thereof, and user device including the same
US9424792B2 (en) Test method and test device for line defect of display panel
US10325535B2 (en) Circuit for testing display panel, method for testing display panel, and display panel
KR20020050037A (en) Liquid Crystal Display for Examination of Signal Line
US20090146678A1 (en) Substrate testing circuit
WO2018196473A1 (en) Liquid crystal display panel packaging structure and bonding test method thereof
US10365741B2 (en) Touch display screen testing method and touch display screen testing device
TW201439560A (en) Apparatus and method for identifying a defect in an electronic circuit
US20170194222A1 (en) Test element group, array substrate, test device and test method
US9520076B2 (en) Method and system for adjusting white balance, method for making liquid crystal display
CN105589226B (en) Obtain the adjustment method and device of the best FLK value of liquid crystal display
US20180308447A1 (en) Turn-on voltage supplying circuit and method, defect analyzing method and display device
US8786305B2 (en) Test circuit and test method for detecting electrical defect in TFT-LCD
WO2020133883A1 (en) Panel test method
CN107064773B (en) ATE voltage testing system and ATE voltage test method
US9360690B2 (en) Liquid crystal alignment control system and method
US9465241B2 (en) Apparatus for applying curing voltages to liquid crystal substrate
US20070176623A1 (en) Method and apparatus for testing a TFT array for a liquid crystal panel
KR20070066916A (en) Method and apparatus for testing a liquid crystal cell
US9761162B2 (en) Array substrate for display panel and method for inspecting array substrate for display panel
JP3591713B2 (en) Liquid crystal display device and inspection method thereof
CN105259691A (en) Manufacturing method and system of liquid crystal panel and liquid crystal substrate
KR102068074B1 (en) Test device for substrate

Legal Events

Date Code Title Description
AS Assignment

Owner name: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO.

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:MO, SHENGPENG;CHIANG, WEN-PIN;XU, ZHENGXING;REEL/FRAME:031405/0218

Effective date: 20130828

STCF Information on status: patent grant

Free format text: PATENTED CASE

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 4

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 8