CN108919533B - Display panel testing method and device and electronic equipment - Google Patents
Display panel testing method and device and electronic equipment Download PDFInfo
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Abstract
The invention discloses a display panel testing method and device and electronic equipment, wherein the method comprises the following steps: acquiring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve; according to the relation between the test voltage and time of the voltage-transmittance curve, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve; and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve. The display panel testing method and device and the electronic equipment can obtain a relatively accurate VT curve.
Description
Technical Field
The present invention relates to the field of display technologies, and in particular, to a method and an apparatus for testing a display panel, and an electronic device.
Background
One of the mainstream of the flat panel display is a Liquid Crystal Display (LCD) panel, which has the advantages of small size, low power consumption, no radiation, low manufacturing cost, etc. An important test method in the LCD manufacturing process is the voltage-transmittance (VT) curve of the panel.
However, the DC residue (DC) with unknown magnitude and direction is inevitably introduced into the sample during the product operation or the test process, resulting in the Shift (Shift) of the test data and curve, so that the Shift (Shift) of the actual VT curve relative to the ideal curve occurs due to the DC, and the conventional test method is difficult to obtain the magnitude and the variation of the DC.
Disclosure of Invention
In view of the above, an objective of the embodiments of the present invention is to provide a method and an apparatus for testing a display panel, and an electronic device, which can obtain a more accurate VT curve.
In view of the above object, a first aspect of the embodiments of the present invention provides a display panel testing method, including:
acquiring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; wherein the voltage-transmittance curve and the time-reference optical parameter value curve are measured simultaneously;
obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve;
according to the relation between the test voltage and the time of the voltage-transmittance curve, combining the initial public voltage and the time-actual public voltage curve to obtain a test voltage-voltage offset curve;
and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve.
Optionally, the method further includes:
obtaining an initial reference optical parameter value at the auxiliary test point at an initial common voltage;
comparing the time-reference optical parameter value curve with the initial reference optical parameter value to determine whether the actual reference optical parameter value changes along with the time;
if the actual reference optical parameter value does not change along with time, determining an actual common voltage according to the common voltage-reference optical parameter value curve, and determining a voltage offset according to the actual common voltage and the initial common voltage;
if the actual reference optical parameter value changes along with time, obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve; and according to the relation between the test voltage and the time, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve.
Optionally, the test voltage-voltage offset curve is obtained by fitting.
Optionally, the reference optical parameter is flicker or brightness.
Optionally, the number of the auxiliary test points is more than two; the method further comprises the following steps:
obtaining test voltage-voltage offset curves which are respectively measured aiming at different auxiliary test points;
processing the test voltage-voltage offset curve by adopting an average value taking or normal distribution mode to obtain a corrected test voltage-voltage offset curve;
and correcting the voltage-transmittance curve according to the corrected test voltage-voltage offset curve.
Optionally, the method further includes:
obtaining a symmetrical center line of positive and negative voltages according to the corrected voltage-transmittance curve;
according to the relation between the test voltage and the time, the relation between the test voltage and the actual common voltage is obtained by combining the time-actual common voltage curve;
and according to the symmetric center lines of the positive voltage and the negative voltage and the relation between the test voltage and the actual public voltage, combining the corrected voltage-transmittance curve to obtain a jump voltage-transmittance curve.
Optionally, the method further includes:
obtaining the symmetric center of positive and negative voltages corresponding to the key transmittance;
obtaining jump voltage according to the symmetric center of the positive voltage and the negative voltage by combining the time-actual public voltage curve;
and fitting to obtain a jump voltage-transmittance curve according to the key transmittance and the corresponding jump voltage.
Optionally, the key transmittance includes: 0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, 90%.
In a second aspect of the embodiments of the present invention, there is provided a display panel testing apparatus, including:
the acquisition module is used for acquiring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; wherein the voltage-transmittance curve and the time-reference optical parameter value curve are measured simultaneously;
the processing module is used for obtaining a time-actual public voltage curve according to the time-reference optical parameter value curve and the public voltage-reference optical parameter value curve; according to the relation between the test voltage and the time of the voltage-transmittance curve, combining the initial public voltage and the time-actual public voltage curve to obtain a test voltage-voltage offset curve; and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve.
In a third aspect of the embodiments of the present invention, there is provided an electronic device, including:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein,
the memory stores instructions executable by the one processor to cause the at least one processor to perform a method as in any one of the preceding claims.
As can be seen from the above description, the display panel testing method, device and electronic device provided in the embodiments of the present invention can restore the ideal VT curve after DC removal by detecting the DC-containing offset generated in the operation and testing process before the LCD panel is tested.
Drawings
FIG. 1 is a schematic diagram of a step voltage waveform when testing a VT curve;
FIG. 2 is a waveform diagram of an actual test VT curve and an ideal VT curve;
FIG. 3 is a flowchart illustrating a method for testing a display panel according to an embodiment of the present invention;
FIG. 4 is a flowchart illustrating an initial preparation process of a display panel testing method according to the present invention;
FIG. 5 is a diagram of a display panel according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of one embodiment of a common voltage-reference optical parameter value curve in an embodiment of the present invention;
FIG. 7 is a schematic diagram of one embodiment of a time-reference optical parameter value curve in an embodiment of the present invention;
FIG. 8 is a schematic flow chart diagram of one embodiment of the present invention;
FIG. 9 is a schematic flow chart diagram of one embodiment of the present invention;
FIG. 10 is a schematic flow chart diagram of one embodiment of the present invention;
FIG. 11 is a schematic flow chart diagram of one embodiment of the present invention;
FIG. 12 is a graph of transmittance versus transition voltage curves according to an embodiment of the present invention;
FIG. 13 is a schematic structural diagram of an embodiment of a display panel testing apparatus according to the present invention;
fig. 14 is a schematic structural diagram of an electronic device provided in the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two entities with the same name but different names or different parameters, and it should be noted that "first" and "second" are merely for convenience of description and should not be construed as limitations of the embodiments of the present invention, and they are not described in any more detail in the following embodiments.
A VT curve testing method generally comprising the steps of:
the Gate line (Gate) scanning signal is normally output, i.e. the pixels are opened row by row, and the pixels in the previous row are closed when the pixels in the current row are opened. The gate driving circuit outputs a gate-on voltage (Vgon) when the pixels of the current row are turned on, and outputs a gate-off voltage (Vgoff) when the pixels of the previous row are turned off.
The common voltage signal is Vcom, and the Vcom voltage can be adjusted manually.
Data line (Data) voltage signals are generally provided by an external direct current power supply, a Chip On Film (COF) of one of the Data signals is removed, and the direct current power supply is connected with a Data line pad (Data pad) of the Data line (COF) through a wire. The Data voltage signal will contain a number of step voltages, each step voltage comprising two fixed positive and negative voltage values, each symmetrical about a given Vcom, the voltage signal shown in FIG. 1. And testing the brightness of the corresponding area of the Data pad under each step voltage, taking the brightness ratio of each point to the brightest point as the transmittance, and finally forming a voltage-transmittance Curve, namely VT dark.
The LCD display screen has a jump voltage Δ Vp, which causes the Data voltage actually given by us to change after entering the pixel electrode through the semiconductor Thin Film Transistor (TFT), which causes the whole VT curve to be asymmetric with respect to the Vcom voltage, and we can ideally think that the VT curve is symmetric with respect to the Vcom + Δ Vp (i.e. Vcenter) voltage. The curve can be used to obtain Vcenter, so that the jump voltage Δ Vp of the product can be ideally considered to be Vcenter-Vcom.
However, in the VT testing method, a DC with unknown size and unknown direction is inevitably introduced into a sample in the product operation process or the testing process, so that the Shift phenomenon of the test data and curve occurs, so that an accurate Vcenter value and an accurate Δ Vp cannot be obtained, as shown in fig. 2, due to the existence of the DC, the Shift occurs in the actual test VT curve relative to the ideal curve, and the size and the change of the DC cannot be obtained by the conventional testing method, so that a relatively accurate VT curve and Δ Vp cannot be obtained.
In a first aspect of the embodiments of the present invention, a method for testing a display panel as shown in fig. 3 is provided, which includes the following steps:
step 101: acquiring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; wherein the voltage-transmittance curve and the time-reference optical parameter value curve are measured simultaneously.
Optionally, before the step 101, some initial preparation operations may be performed, as shown in fig. 4, specifically including the following steps:
step 100 a: test points, auxiliary test points and reference optical parameters (such as parameters of flicker, brightness and the like) are selected. Here, the end of selecting the test point, the auxiliary test point and the reference optical parameter may be a tester or a user who needs to perform VT curve calibration.
Referring to fig. 5, a special area dedicated to test VT curves is usually provided in the display panel, and any point in the special area can be used as the test point;
the auxiliary test points are required to be used for correspondingly testing the reference optical parameters, so that the arrangement positions of the auxiliary test points are required to be in the normal display area of the display panel, but the specific positions of the auxiliary test points in the normal display area of the display panel can be unlimited.
Step 100 b: and measuring a common voltage-reference optical parameter value curve at the auxiliary test point. Here, the device for measuring the common voltage-reference optical parameter value curve at the auxiliary test point may be a device for testing a VT curve (e.g., a color analyzer).
Optionally, the common voltage-reference optical parameter value curve at the auxiliary test point is first tested before testing the VT curve of the display panel. Here, taking Vcom-Flicker curve as an example, the shape of the curve is as shown in fig. 6, and it can be seen that Flicker (Flicker) changes with the change of Vcom.
It should be noted that, in the present embodiment, since the Vcom shift caused by DC in the test is focused, the Vcom shift is not limited to be corrected according to the Vcom-Flicker curve, and may be characterized by other manners such as Vcom-Lum (luminance), as long as v (DC shift) is obtained.
Step 100 c: and testing the voltage-transmittance curve at the test point, simultaneously acquiring the reference optical parameter value at the auxiliary test point, and obtaining a time-reference optical parameter value curve.
Here, the testing process performed in step 100c may be measured by a device (e.g., a color analyzer) for testing VT curves. Optionally, the voltage-transmittance curve at the test point may be tested by using one device, and the reference optical parameter value at the auxiliary test point and the corresponding time-reference optical parameter value curve may be tested by using another device, that is, the test process for the test point and the auxiliary test point is completed by using two devices to respectively test. Of course, when the conditions allow, the test process for the test point and the auxiliary test point can be completed simultaneously by the device integrated with the function of performing two tests simultaneously.
In the process of performing VT curve testing on the test point, a curve of a reference optical parameter value at the auxiliary test point changing with time needs to be collected at the same time, so as to correspond the offset of Vcom at a specific time point to the change of the reference optical parameter value one by one. Therefore, after the VT curve test is completed, a set of Flicker t curves along with the test time is obtained correspondingly. Taking the reference optical parameter as Flicker as an example, as shown in fig. 7, the t-Flicker curve is measured synchronously.
At this point, the initial work of measuring each desired curve is completed.
Step 102: and obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve.
Optionally, the reference optical parameter values corresponding to the equal time intervals may be mapped to the common voltage-reference optical parameter value curve, then the actual common voltage at the corresponding time point is obtained, and then the time-actual common voltage curve is obtained by fitting a curve to the obtained multiple discrete points (with time and actual common voltage as parameters).
Step 103: and according to the relation between the test voltage and the time of the voltage-transmittance curve, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve.
Referring to fig. 1, in the test process of the VT curve, different step voltages need to be provided, and the brightness of the test point is tested under the corresponding step voltages, so that as the test time passes, the step voltages are different and have a corresponding relationship with the time.
The time-voltage offset curve can be obtained by combining the initial common voltage measured at the beginning of the test and the time-actual common voltage curve, and the test voltage and the time have a corresponding relation, so that the test voltage-voltage offset curve can be obtained.
Step 104: and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve. The relationship between the test voltage and the voltage offset is obtained in step 103, and the voltage-transmittance curve can be modified accordingly, so as to remove the DC-containing offset in the VT curve.
It can be seen from the foregoing embodiments that, the display panel testing method provided by the embodiments of the present invention can restore the ideal VT curve after DC removal by detecting the DC-containing offset generated in the operation and test processes before the LCD panel is tested.
According to the display panel testing method provided by the embodiment of the invention, a conventional testing method is broken through to obtain a DC representation mode. The DC introduced by the operation before the test or the DC generated in the test process can directly influence the Shift of the VT curve, which can be equivalent to the Shift of Vcom, and the Shift of Vcom can be detected by Flicker or brightness of the panel, so as to obtain the Vcom Shift caused by DC.
By the display panel testing method, the size (the size of the DC can refer to a region with better middle gray scale symmetry) and the change of the DC in the display panel can be effectively detected, and an ideal VT curve for removing the DC is obtained.
As an alternative embodiment of the present invention, as shown in fig. 8, the method for testing a display panel may further include the following steps:
step 201: obtaining an initial reference optical parameter value at the auxiliary test point at an initial common voltage;
specifically, when a VT test device is used for testing, a stable Vcom value is provided for the display panel (which may be performed by way of an external voltage, and the Vcom value of the whole panel needs to be consistent), the voltage is an initial common voltage Vcom (0), and a Flicker corresponding to the Vcom (0) at this time is an initial reference optical parameter value Flicker (0).
Step 202: and comparing the time-reference optical parameter value curve with the initial reference optical parameter value to determine whether the actual reference optical parameter value changes along with the time.
Comparing the t-Flicker curve with the initial Flicker (0) can determine whether the actual reference optical parameter value changes with time. As shown in FIG. 7, two types of t-Flicker variations are listed, the initial value being Flicker (0), Flicker type a being invariant over time, and Flicker type b being invariant over time. Step 203: and if the actual reference optical parameter value does not change along with the time, determining the actual common voltage according to the common voltage-reference optical parameter value curve, and determining the voltage offset according to the actual common voltage and the initial common voltage.
For type a: it can be seen that there was a mutation in Flicker at the beginning of the test, and no change thereafter, and it can be considered that handling and manipulation of the samples before the test produced a DC, but this DC did not change during the test. The situation is simple, and the shift quantity of Vcom corresponding to the difference of Flicker values before and after testing can be directly read on the corresponding Vcom-Flicker curve. Regarding the change direction of the Vcom offset, the change direction of Flicker to the initial value Flicker (0) can be observed by adjusting the Vcom value at this time, and we are named as v (dc shift), and at this time, we offset the actually obtained VT curve to the corresponding v (dc shift) change amount, which is the ideal VT curve.
Step 204: and if the actual reference optical parameter value changes along with time, obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve.
Step 205: and according to the relation between the test voltage and the time of the voltage-transmittance curve, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve.
For type b: flicker is the variation with test time that produces DC resulting in Vcom during the test, and v (DC shift) is a time-varying quantity. This situation is complicated, because the time for testing the VT curve and the time for testing the reference optical parameter value are synchronous, we need to calculate v (DC Shift) of each Data voltage over the corresponding time, we can still obtain the Shift amount of Vcom caused by DC under different gray scale voltages through the Vcom-Flicker curve, i.e. v (DC Shift), and press each gray scale voltage to v (DC Shift) corresponding to Shift in the corresponding direction, so we finally obtain v (DC Shift) generated by the panel under different gray scales, and finally form an ideal VT curve after fitting.
In addition, the types a and b may appear simultaneously, and the analysis method is the same type b, which is not described herein.
The number of the auxiliary test points is not limited to 1, and the auxiliary test points may be auxiliary test points at multiple positions in a display panel, which is an optional embodiment of the present invention, as shown in fig. 9, the auxiliary test points may be more than two selected auxiliary test points; the display panel testing method can also comprise the following steps:
step 301: obtaining test voltage-voltage offset curves which are respectively obtained by testing aiming at different auxiliary test points;
step 302: processing the test voltage-voltage offset curve by adopting an average value taking or normal distribution mode to obtain a corrected test voltage-voltage offset curve;
step 303: and correcting the voltage-transmittance curve according to the corrected test voltage-voltage offset curve.
Therefore, a plurality of Flicker or brightness change curves are obtained, and a relatively reasonable curve is obtained through processing modes such as averaging or normal distribution, so that an accurate DC value is obtained.
As shown in fig. 2, which is the shape of the VT curve obtained by the conventional VT curve testing method. The curve a is an actual VT curve measured after DC is mixed, the symmetric center of the curve is Vcenter (a), the curve b is an ideal VT curve after DC interference is removed, the symmetric center of the curve is Vcenter (b), and theoretically, the Delta Vp is Vcenter (b) -Vcom. However, because only Vcenter (a) can be obtained in the presence of DC, Δ Vp cannot be obtained.
Aiming at the t-Flicker curve of the type a, the jump voltage of the display panel is well calculated, and the calculation formula is as follows: Δ Vp ═ vcenter (a) -Vcom (0) + v (dc shift).
As for the t-Flicker curve of the type b, after obtaining the corresponding corrected VT curve, it is not easy to see that actually the positive and negative polarities of the curve are not completely symmetrical, and do not have a complete symmetry axis, especially when the transmittance is higher or lower, because the Δ Vp of the curve is not the same under different gray scales (or different data voltages), as an optional embodiment of the present invention, the present invention provides a characterization method for obtaining Δ Vp through VT. As shown in fig. 10, the method for testing a display panel may further include the following steps:
step 401: obtaining a symmetrical center line of positive and negative voltages according to the corrected voltage-transmittance curve;
step 402: according to the relation between the test voltage and the time, the relation between the test voltage and the actual common voltage is obtained by combining the time-actual common voltage curve;
step 403: and according to the symmetric center lines of the positive voltage and the negative voltage and the relation between the test voltage and the actual public voltage, combining the corrected voltage-transmittance curve to obtain a jump voltage-transmittance curve.
Positive and negative Data voltages corresponding to each transmittance (Tr.) are selected from the corrected VT curve, the symmetric center (average value) of the positive and negative voltages is taken as Vcenter (Tr.), and the DeltaVp under the transmittance is Vcenter (Tr.) to Vcom (actual common voltage), so that a DeltaVp curve under different transmittances (Tr.) is formed. In this way, after the ideal VT curve after DC removal is restored, Δ Vp of the display panel is obtained.
Another alternative embodiment of the present invention proposes a calculation method for the aforementioned t-Flicker curve of type b. As shown in fig. 11, the method for testing a display panel may further include the following steps:
step 501: obtaining the symmetric center of positive and negative voltages corresponding to the key transmittance; optionally, the key transmittance includes: 0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, 90%;
step 502: obtaining jump voltage according to the symmetric center of the positive voltage and the negative voltage by combining the time-actual public voltage curve;
step 503: and fitting to obtain a jump voltage-transmittance curve (as shown in fig. 12) according to the key transmittance and the jump voltage corresponding to the key transmittance.
By selecting only the Δ Vp values at the key transmittances for reference, as shown in fig. 12, we selected Δ Vp values at transmittances of 0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, and 90% as reference. The curve "Δ Vp-transmittance" shown in fig. 12 can be obtained by calculation. The delta Vp under different transmittances has important reference significance for later Gamma curve and afterimage regulation.
By the display panel testing method, the size and the change of the DC in the display panel can be effectively detected (the size of the DC can refer to an area with better middle gray scale symmetry), an ideal VT curve with the DC removed is obtained, and then correct delta Vp is obtained.
According to the display panel testing method provided by the embodiment of the invention, the DC generated in the operation before and in the testing process of the LCD panel can be detected in the VT curve test; therefore, the ideal VT curve after DC removal can be reduced, and further the accurate delta Vp of the LCD product can be obtained.
In a second aspect of the embodiments of the present invention, an embodiment of a display panel testing apparatus is provided, which can obtain a more accurate VT curve. Fig. 13 is a schematic structural diagram of a display panel testing apparatus according to an embodiment of the present invention.
The display panel testing device includes:
an obtaining module 601, configured to obtain a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; wherein the voltage-transmittance curve and the time-reference optical parameter value curve are measured simultaneously;
a processing module 602, configured to obtain a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve; according to the relation between the test voltage and the time, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve; and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve.
It should be noted that the display panel in this embodiment may be: any product or component with a display function, such as electronic paper, a mobile phone, a tablet computer, a television, a notebook computer, a digital photo frame, a navigator and the like.
As can be seen from the foregoing embodiments, the display panel testing apparatus provided in the embodiments of the present invention detects DC-containing offsets generated in the operation and test processes before the LCD panel is tested; so that the ideal VT curve after DC removal can be restored.
As an embodiment of the present invention, the obtaining module 601 is further configured to obtain an initial reference optical parameter value at the auxiliary test point at an initial common voltage;
the processing module 602 is further configured to:
comparing the time-reference optical parameter value curve with the initial reference optical parameter value to determine whether the actual reference optical parameter value changes along with the time;
if the actual reference optical parameter value does not change along with time, determining an actual common voltage according to the common voltage-reference optical parameter value curve, and determining a voltage offset according to the actual common voltage and the initial common voltage;
if the actual reference optical parameter value changes along with time, obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve; and according to the relation between the test voltage and the time, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve.
As an embodiment of the present invention, the number of the auxiliary test points is two or more; the obtaining module 601 is further configured to obtain test voltage-voltage offset curves obtained by testing different auxiliary test points respectively;
the processing module 602 is further configured to:
processing the test voltage-voltage offset curve by adopting an average value taking or normal distribution mode to obtain a corrected test voltage-voltage offset curve;
and correcting the voltage-transmittance curve according to the corrected test voltage-voltage offset curve.
As an embodiment of the present invention, the processing module 602 is further configured to:
obtaining a symmetrical center line of positive and negative voltages according to the corrected voltage-transmittance curve;
according to the relation between the test voltage and the time, the relation between the test voltage and the actual common voltage is obtained by combining the time-actual common voltage curve;
and according to the symmetric center lines of the positive voltage and the negative voltage and the relation between the test voltage and the actual public voltage, combining the corrected voltage-transmittance curve to obtain a jump voltage-transmittance curve.
As an embodiment of the present invention, the processing module 602 is further configured to:
obtaining the symmetric center of positive and negative voltages corresponding to the key transmittance;
obtaining jump voltage according to the symmetric center of the positive voltage and the negative voltage by combining the time-actual public voltage curve;
and fitting to obtain a jump voltage-transmittance curve according to the key transmittance and the corresponding jump voltage.
Optionally, the key transmittance includes: 0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, 90%.
It should be noted that any embodiment of the foregoing display panel testing apparatus can be implemented in two alternative implementations. One of them is to integrate the functions of the above-mentioned display panel testing apparatus into the existing VT testing device, such as a color analyzer, so that the color analyzer can directly complete the corresponding processing steps after measuring the initial data (e.g., the common voltage-reference optical parameter value curve and the time-reference optical parameter value curve measured at the auxiliary testing point, and the voltage-transmittance curve measured at the testing point) to obtain the corrected curve. The other method is to connect the VT testing device to obtain corresponding initial data through a device with processing function, and then to complete the corresponding subsequent processing steps to obtain the corrected curve.
For the latter implementation, an embodiment of the present invention may further provide a display panel testing system, where the display panel testing system includes: any of the embodiments of the foregoing display panel testing apparatus, and a VT testing device (e.g., a color analyzer) for measuring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve at a point of auxiliary testing, and a voltage-transmittance curve at the point of testing.
Optionally, the display panel testing apparatus may be implemented by any device with processing function, for example, a device with processing function commonly found in the prior art, such as a Personal Computer (PC), a tablet computer (PAD), a mobile phone, or a novel testing device integrated with the display panel testing apparatus. The display panel testing device completes the correction of the VT curve by the display panel testing method.
In view of the above object, a third aspect of the embodiments of the present invention provides an embodiment of an apparatus for performing the display panel testing method. Fig. 14 is a schematic diagram of a hardware structure of an embodiment of an apparatus for performing the display panel testing method according to the present invention.
As shown in fig. 14, the apparatus includes:
one or more processors 701 and a memory 702, one processor 701 being taken as an example in fig. 14.
The apparatus for performing the display panel test method may further include: an input device 703 and an output device 704.
The processor 701, the memory 702, the input device 703 and the output device 704 may be connected by a bus or other means, and fig. 14 illustrates an example of connection by a bus.
The memory 702, which is a non-volatile computer-readable storage medium, may be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as program instructions/modules (for example, the obtaining module 601 and the processing module 602 shown in fig. 13) corresponding to the display panel testing method in the embodiment of the present application. The processor 701 executes various functional applications and data processing of the server by running the nonvolatile software program, instructions and modules stored in the memory 702, that is, implements the display panel testing method of the above-described method embodiment.
The memory 702 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the display panel test apparatus, and the like. Further, the memory 702 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some embodiments, memory 702 may optionally include memory located remotely from processor 701, and such remote memory may be coupled to member user behavior monitoring devices via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The input device 703 may receive input numeric or character information and generate key signal inputs related to user settings and function control of the display panel test apparatus. The output device 704 may include a display device such as a display screen.
The one or more modules are stored in the memory 702 and, when executed by the one or more processors 701, perform a display panel testing method in any of the method embodiments described above. The technical effect of the embodiment of the device for executing the display panel testing method is the same as or similar to that of any method embodiment.
Embodiments of the present invention provide a non-transitory computer storage medium, where a computer-executable instruction is stored in the computer storage medium, and the computer-executable instruction may execute a processing method for list item operations in any of the above method embodiments. Embodiments of the non-transitory computer storage medium may be the same or similar in technical effect to any of the method embodiments described above.
Finally, it should be noted that, as will be understood by those skilled in the art, all or part of the processes in the methods of the above embodiments may be implemented by a computer program that can be stored in a computer-readable storage medium and that, when executed, can include the processes of the embodiments of the methods described above. The storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like. The technical effect of the embodiment of the computer program is the same as or similar to that of any of the method embodiments described above.
Those of ordinary skill in the art will understand that: the invention is not to be considered as limited to the specific embodiments thereof, but is to be understood as being modified in all respects, all changes and equivalents that come within the spirit and scope of the invention.
Claims (10)
1. A display panel testing method is characterized by comprising the following steps:
acquiring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; wherein the voltage-transmittance curve and the time-reference optical parameter value curve are measured simultaneously, and the reference optical parameter is an optical parameter capable of reflecting voltage deviation;
obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve;
according to the relation between the test voltage and the time of the voltage-transmittance curve, combining the initial public voltage and the time-actual public voltage curve to obtain a test voltage-voltage offset curve;
and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve.
2. The method of claim 1, further comprising:
obtaining an initial reference optical parameter value at the auxiliary test point at an initial common voltage;
comparing the time-reference optical parameter value curve with the initial reference optical parameter value to determine whether the actual reference optical parameter value changes along with the time;
if the actual reference optical parameter value does not change along with time, determining an actual common voltage according to the common voltage-reference optical parameter value curve, and determining a voltage offset according to the actual common voltage and the initial common voltage;
if the actual reference optical parameter value changes along with time, obtaining a time-actual common voltage curve according to the time-reference optical parameter value curve and the common voltage-reference optical parameter value curve; and according to the relation between the test voltage and the time, combining the initial common voltage and the time-actual common voltage curve to obtain a test voltage-voltage offset curve.
3. The method of claim 1, wherein the test voltage-voltage offset curve is obtained by fitting.
4. The method of claim 1, wherein the reference optical parameter is flicker or brightness.
5. The method of claim 1, wherein the auxiliary test points are two or more; the method further comprises the following steps:
obtaining test voltage-voltage offset curves which are respectively measured aiming at different auxiliary test points;
processing the test voltage-voltage offset curve by adopting an average value taking or normal distribution mode to obtain a corrected test voltage-voltage offset curve;
and correcting the voltage-transmittance curve according to the corrected test voltage-voltage offset curve.
6. The method of any one of claims 1-5, further comprising:
obtaining a symmetrical center line of positive and negative voltages according to the corrected voltage-transmittance curve;
according to the relation between the test voltage and the time, the relation between the test voltage and the actual common voltage is obtained by combining the time-actual common voltage curve;
and according to the symmetric center lines of the positive voltage and the negative voltage and the relation between the test voltage and the actual public voltage, combining the corrected voltage-transmittance curve to obtain a jump voltage-transmittance curve.
7. The method of any one of claims 1-5, further comprising:
obtaining the symmetric center of positive and negative voltages corresponding to the key transmittance;
obtaining jump voltage according to the symmetric center of the positive voltage and the negative voltage by combining the time-actual public voltage curve;
and fitting to obtain a jump voltage-transmittance curve according to the key transmittance and the corresponding jump voltage.
8. The method of claim 7, wherein the key transmittances comprise: 0.4%, 1.2%, 4%, 10%, 20%, 35%, 53%, 74%, 90%.
9. A display panel testing apparatus, comprising:
the acquisition module is used for acquiring a common voltage-reference optical parameter value curve and a time-reference optical parameter value curve measured at an auxiliary test point of the display panel, and a voltage-transmittance curve measured at the test point of the display panel; wherein the voltage-transmittance curve and the time-reference optical parameter value curve are measured simultaneously, and the reference optical parameter is an optical parameter capable of reflecting voltage deviation;
the processing module is used for obtaining a time-actual public voltage curve according to the time-reference optical parameter value curve and the public voltage-reference optical parameter value curve; according to the relation between the test voltage and the time of the voltage-transmittance curve, combining the initial public voltage and the time-actual public voltage curve to obtain a test voltage-voltage offset curve; and correcting the voltage-transmittance curve according to the test voltage-voltage offset curve.
10. An electronic device, comprising:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein,
the memory stores instructions executable by the one processor to cause the at least one processor to perform the method of any one of claims 1-8.
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101866073A (en) * | 2009-04-17 | 2010-10-20 | 西铁城控股株式会社 | The drive unit of liquid crystal light modulator and use its variable optical attenuator |
| CN102213848A (en) * | 2010-04-09 | 2011-10-12 | 北京京东方光电科技有限公司 | Method and system for measuring transmissivity of liquid crystal display panel |
| CN102467862A (en) * | 2010-11-17 | 2012-05-23 | 京东方科技集团股份有限公司 | Voltage regulation method and device of liquid crystal display panel |
| CN102542959A (en) * | 2010-12-07 | 2012-07-04 | 北京京东方光电科技有限公司 | Method for measuring voltage transmittance under influence of direct-current bias voltage and equipment |
| CN103676231A (en) * | 2013-11-08 | 2014-03-26 | 深圳市华星光电技术有限公司 | Method and device for measuring Flicker value of liquid crystal module |
| CN104036742A (en) * | 2014-05-26 | 2014-09-10 | 京东方科技集团股份有限公司 | Gamma reference voltage generation circuit, V-T (Voltage-Transmittance) curve test method and display device |
| CN104216188A (en) * | 2014-09-05 | 2014-12-17 | 京东方科技集团股份有限公司 | Display panel and display device |
| CN104282249A (en) * | 2014-10-23 | 2015-01-14 | 京东方科技集团股份有限公司 | Method for testing voltage-transmittance curve |
| WO2016072363A1 (en) * | 2014-11-06 | 2016-05-12 | シャープ株式会社 | Optical apparatus |
| CN106648261A (en) * | 2017-03-06 | 2017-05-10 | 京东方科技集团股份有限公司 | Array substrate and display panel, display device |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060187160A1 (en) * | 2005-02-24 | 2006-08-24 | Lai Chih C | Method for solving feed-through effect |
| KR20070048514A (en) * | 2005-11-04 | 2007-05-09 | 삼성전자주식회사 | Liquid crystal display and method for driving there of |
| KR101329505B1 (en) * | 2010-05-28 | 2013-11-13 | 엘지디스플레이 주식회사 | Liquid crystal display and method of driving the same |
| KR102287833B1 (en) * | 2014-11-14 | 2021-08-10 | 삼성디스플레이 주식회사 | Method of driving display panel and display apparatus for performing the same |
-
2018
- 2018-08-07 CN CN201810892523.XA patent/CN108919533B/en not_active Expired - Fee Related
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101866073A (en) * | 2009-04-17 | 2010-10-20 | 西铁城控股株式会社 | The drive unit of liquid crystal light modulator and use its variable optical attenuator |
| CN102213848A (en) * | 2010-04-09 | 2011-10-12 | 北京京东方光电科技有限公司 | Method and system for measuring transmissivity of liquid crystal display panel |
| CN102467862A (en) * | 2010-11-17 | 2012-05-23 | 京东方科技集团股份有限公司 | Voltage regulation method and device of liquid crystal display panel |
| CN102542959A (en) * | 2010-12-07 | 2012-07-04 | 北京京东方光电科技有限公司 | Method for measuring voltage transmittance under influence of direct-current bias voltage and equipment |
| CN103676231A (en) * | 2013-11-08 | 2014-03-26 | 深圳市华星光电技术有限公司 | Method and device for measuring Flicker value of liquid crystal module |
| CN104036742A (en) * | 2014-05-26 | 2014-09-10 | 京东方科技集团股份有限公司 | Gamma reference voltage generation circuit, V-T (Voltage-Transmittance) curve test method and display device |
| CN104216188A (en) * | 2014-09-05 | 2014-12-17 | 京东方科技集团股份有限公司 | Display panel and display device |
| CN104282249A (en) * | 2014-10-23 | 2015-01-14 | 京东方科技集团股份有限公司 | Method for testing voltage-transmittance curve |
| WO2016072363A1 (en) * | 2014-11-06 | 2016-05-12 | シャープ株式会社 | Optical apparatus |
| CN106648261A (en) * | 2017-03-06 | 2017-05-10 | 京东方科技集团股份有限公司 | Array substrate and display panel, display device |
Non-Patent Citations (2)
| Title |
|---|
| Analysis of the Time-dependent optical properties of the Entire LCD panel;Lee, Doyoung等;《Journal of information display》;20091231;第10卷(第2期);第62-67页 * |
| LCD面板TFT特性相关残像研究;许卓等;《液晶与显示》;20180331(第3(2018)期);第195-201页 * |
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