CN104101743A - Probe, circuit detecting device and method for detecting circuit - Google Patents
Probe, circuit detecting device and method for detecting circuit Download PDFInfo
- Publication number
- CN104101743A CN104101743A CN201410338684.6A CN201410338684A CN104101743A CN 104101743 A CN104101743 A CN 104101743A CN 201410338684 A CN201410338684 A CN 201410338684A CN 104101743 A CN104101743 A CN 104101743A
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- probe
- circuit
- switch
- bad
- display panel
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- 239000000523 sample Substances 0.000 title claims abstract description 76
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000001514 detection method Methods 0.000 claims description 29
- 230000008569 process Effects 0.000 abstract description 8
- 238000012360 testing method Methods 0.000 abstract description 5
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 4
- 238000005516 engineering process Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 238000007689 inspection Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a probe, a circuit detecting device and a method for detecting a circuit. The probe comprises a probing needle, wherein the probe further comprises a first switch; the probing needle is earthed through the first switch. In comparison with the prior art, the step of finding the special position of a poor point or circuit of a liquid crystal display screen is simplified; furthermore, without processes such as backtracking, marking and the like through software, a poor circuit can be found rapidly and the detecting efficiency of a poor circuit of a display panel can be improved. Through connection between the probe and a signal source or a power source, the probe, the circuit detecting device and the method for detecting the circuit can be used for checking and testing local circuit performances.
Description
Technical field
The present invention relates to demonstration field, relate in particular to a kind of method of probe, line detection apparatus and detection line.
Background technology
Liquid crystal display has the advantages such as volume is little, low in energy consumption, radiation is low, has been widely used in the equipment such as computer monitor, notebook computer, mobile phone and LCD TV.
Liquid crystal display is mainly made up of color membrane substrates, array base palte and liquid crystal between the two, wherein, array base palte need to pass through complicated technological process manufacture, signal line on it easily forms and opens circuit and short circuit phenomenon (can cause like this and comprise a little the bad phenomenon such as bad and line be bad), detects opening circuit with short circuit and keeping in repair the yield that can improve product of circuit on substrate.At present, in the testing process of bad circuit, first need to obtain the position of bad circuit, conventional method is on tested display panel, to show " ten " spirte by software, then moving " ten " word figure overlaps with the bad viewing area on display panel, thereby obtain the position (sequence number of data line or grid line) of bad circuit, then on tested display panel, find out corresponding circuit by microscope according to the bad place on line obtaining, and date back to COF (the Chip on film being connected with this circuit along this circuit, cover thin film chip) on, make marks, finally survey the signal on this circuit according to this mark and by probe.
But above-mentioned bad circuit inspect method process is loaded down with trivial details, and operation is comparatively difficult, is unfavorable for improving the efficiency of wireline inspection.
Summary of the invention
(1) technical matters that will solve
The technical problem to be solved in the present invention is to provide a kind of method of probe, line detection apparatus and detection line, can improve the detection efficiency of bad circuit in display panel.
(2) technical scheme
For solving the problems of the technologies described above, technical scheme of the present invention provides a kind of probe, comprises probe, and wherein, described probe also comprises the first switch, and described probe is by described the first switch ground connection.
For solving the problems of the technologies described above, the present invention also provides a kind of line detection apparatus, comprises oscillograph and probe as claimed in claim 1.
Further, also comprise second switch and signal input module, described signal input module is connected with described probe by described second switch.
Further, also comprise the 3rd switch and voltage load module, described voltage load module is connected with described probe by described the 3rd switch.
For solving the problems of the technologies described above, the present invention also provides a kind of method of above-mentioned line detection apparatus detection line, it is characterized in that, comprising:
The in the situation that of tested display panel energising, described probe is placed on the output lead in described tested display panel;
Control described the first switch closed so that the corresponding panel zone of output lead contacting with described probe carries out specific demonstration;
Move described probe so that the bad viewing area in the region of described specific demonstration and described display panel coincides;
Disconnect described the first switch so that bad circuit corresponding to described bad viewing area detected.
Further, bad circuit corresponding to described bad viewing area detected and comprised: the impedance to described bad circuit is measured.
Further, described output lead is the output lead of COF in described tested display panel.
(3) beneficial effect
The present invention in the time finding the particular location of bad circuit, has simplified step compared to existing technology, and do not need by software recall, the process such as mark, can find fast bad circuit, improve the detection efficiency of the bad circuit of display panel.
Brief description of the drawings
Fig. 1 is the schematic diagram of a kind of probe of providing of embodiment of the present invention;
Fig. 2 is the schematic diagram that embodiment of the present invention provides a kind of line detection apparatus;
Fig. 3 is the schematic diagram of the another kind of line detection apparatus that provides of embodiment of the present invention.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples are used for illustrating the present invention, but are not used for limiting the scope of the invention.
Fig. 1 is the schematic diagram of a kind of probe of providing of embodiment of the present invention, and this probe comprises probe 1 and the first switch 2, and wherein, probe 1 is by described the first switch 2 ground connection.
The probe that embodiment of the present invention provides is for oscillograph, can detect by this probe the bad circuit of tested display panel, particularly, first, connect the power supply of tested display panel, probe is placed on the output lead in tested display panel, for example, can be first approximate location by the tested display panel defective region of visual inspection (bad viewing area can by being observed visually in the situation that display panel switches on power), further determine according to this approximate location the COF that bad circuit is connected, then this probe is placed on arbitrary output lead of this COF, the first switch closure is made to probe ground connection, the voltage of the circuit contacting with probe is zero, thereby and then make the corresponding panel zone demonstration of circuit being connected with probe extremely (for example carry out specific demonstration, can show a bright line for TN panel), mobile this probe between multiple output leads of COF, so that the bad viewing area on the region of specific demonstration and display panel coincides, can judge that the output lead that current probe touches is circuit corresponding to bad viewing area, then the first switch is disconnected so that oscillograph catches the signal waveform of bad circuit, circuit inspect method compared to existing technology, present embodiment is in the time finding the particular location of bad circuit, simplify step, and do not need to recall by software, the processes such as mark, by mobile described probe, directly find the particular location of bad circuit, it is simple to operate, in the time carrying out wireline inspection, can improve the detection efficiency of the bad circuit of display panel.
Referring to Fig. 2, Fig. 2 is the structural drawing of a kind of line detection apparatus of providing of embodiment of the present invention, and this line detection apparatus comprises oscillograph 3 and probe, and this probe comprises probe 1 and the first switch 2, and wherein, probe 1 is by described the first switch 2 ground connection.
Preferably, the present invention can also be used for the performance test of common line plate.Such as the characteristic impedance of certain circuit of test, or put input signal to certain with a probe of the present invention, and the response signal of testing another one point with another probe.At this moment we just can see the comparison waveform of pumping signal and response signal easily.Particularly, referring to Fig. 3, Fig. 3 is the structural drawing of the another kind of line detection apparatus that provides of embodiment of the present invention, this line detection apparatus comprises oscillograph 3 and probe, this probe comprises probe 1 and the first switch 2, wherein, probe 1 is by described the first switch 2 ground connection, and this line detection apparatus also comprises second switch 4, signal input module 5, the 3rd switch 6, voltage load module 7;
Described signal input module 5 is connected with described probe 1 by described second switch 4, and for to described probe input signal, on oscillograph, another probe is used for receiving response signal.So, just, can see easily the comparison waveform of pumping signal and/or response signal.Described voltage load module 7 is connected with described probe 1 by the 3rd switch 6, for inputting default voltage to described probe.
Wherein, for above-mentioned line detection apparatus, the first switch, second switch and the 3rd switch wherein can adopt change-over switch to realize, particularly, change-over switch is connected with probe, signal input module and voltage load module respectively, in the process using user, can by change-over switch control probe ground connection pattern, with signal input module connect pattern, with voltage load module connection pattern, Disconnected mode (and ground, signal input module and voltage load module all disconnect) between switching.
Except aforesaid way, one interface can also be set on probe, it can be for example socket, in user's use procedure, adopt the mode of plug to make this socket be connected with one of ground wire, signal input module and voltage load module or all not be connected with above-mentioned three, thus control probe ground connection pattern, and signal input module connection pattern, and voltage load module connection pattern, Disconnected mode between switch.
In addition, embodiment of the present invention also provides the method for above-mentioned line detection apparatus detection line, comprising:
S1: described probe is placed on the output lead in described tested display panel in the situation that of tested display panel energising; For example, this output lead can be the output lead of COF in tested display panel, particularly, first, connect the power supply of tested display panel, and approximate location by the tested display panel defective region of visual inspection (bad viewing area can by being observed visually in the situation that display panel switches on power), determine according to this approximate location the COF that bad circuit is connected, then this probe is placed on arbitrary output lead of this COF;
S2: control described the first switch closed so that the corresponding panel zone of output lead contacting with described probe carries out specific demonstration; The first switch closure is made to probe ground connection, and the voltage of the circuit contacting with probe is zero, thereby and then the corresponding panel zone of the circuit that is connected with probe is shown extremely carry out specific demonstration, for example, can show a bright line for TN panel;
S3: move described probe so that the bad viewing area in the region of described specific demonstration and described display panel coincides; Between multiple output leads of COF, mobile this probe, so that the bad viewing area on the region of specific demonstration and display panel coincides, can judge that the output lead that current probe touches is circuit corresponding to bad viewing area;
S4: disconnect described the first switch so that bad circuit corresponding to described bad viewing area detected; After the bad viewing area on region and the display panel of specific demonstration coincides, can judge that the output lead that current probe touches is circuit corresponding to bad viewing area, the first switch is disconnected so that oscillograph catches the signal waveform of bad circuit.In addition, can also use probe of the present invention, carry out the test of various wiring board Local Properties.
The circuit inspect method of the detection line method that embodiment of the present invention provides in compared to existing technology, in the time finding the particular location of bad circuit, simplify step, and do not need by software recall, the process such as mark, by traveling probe, directly find the particular location of bad circuit, it is simple to operate, in the time carrying out wireline inspection, can improve the detection efficiency of the bad circuit of display panel.
Above embodiment is only for illustrating the present invention; and be not limitation of the present invention; the those of ordinary skill in relevant technologies field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; therefore all technical schemes that are equal to also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.
Claims (7)
1. a probe, comprises probe, it is characterized in that, described probe also comprises the first switch, and described probe is by described the first switch ground connection.
2. a line detection apparatus, is characterized in that, comprises oscillograph and probe as claimed in claim 1.
3. line detection apparatus according to claim 2, is characterized in that, also comprises second switch and signal input module, and described signal input module is connected with described probe by described second switch.
4. line detection apparatus according to claim 2, is characterized in that, also comprises the 3rd switch and voltage load module, and described voltage load module is connected with described probe by described the 3rd switch.
5. a method for the line detection apparatus detection line as described in as arbitrary in claim 2 to 4, is characterized in that, comprising:
The in the situation that of tested display panel energising, described probe is placed on the output lead in described tested display panel;
Control described the first switch closed so that the corresponding panel zone of output lead contacting with described probe carries out specific demonstration;
Move described probe so that the bad viewing area in the region of described specific demonstration and described display panel coincides;
Disconnect described the first switch so that bad circuit corresponding to described bad viewing area detected.
6. method according to claim 5, is characterized in that, bad circuit corresponding to described bad viewing area is detected and is comprised: the impedance to described bad circuit is measured.
7. according to the method described in claim 5 or 6, it is characterized in that, described output lead is the output lead of COF in described tested display panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410338684.6A CN104101743B (en) | 2014-07-16 | 2014-07-16 | The method of probe, line detection apparatus and detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410338684.6A CN104101743B (en) | 2014-07-16 | 2014-07-16 | The method of probe, line detection apparatus and detection circuit |
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| Publication Number | Publication Date |
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| CN104101743A true CN104101743A (en) | 2014-10-15 |
| CN104101743B CN104101743B (en) | 2017-03-29 |
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| CN201410338684.6A Active CN104101743B (en) | 2014-07-16 | 2014-07-16 | The method of probe, line detection apparatus and detection circuit |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104635113A (en) * | 2015-02-09 | 2015-05-20 | 合肥鑫晟光电科技有限公司 | Method and system for determining location of line fault of panel |
| CN110426582A (en) * | 2019-08-07 | 2019-11-08 | 中国商用飞机有限责任公司北京民用飞机技术研究中心 | A kind of line detection system |
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| US8529307B1 (en) * | 2012-08-01 | 2013-09-10 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Detection circuit and manufacturing method for LCD panel |
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2014
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| JPH0365927A (en) * | 1989-08-05 | 1991-03-20 | Matsushita Electric Ind Co Ltd | Inspecting device of liquid crystal display panel and inspecting method thereof |
| US20080018338A1 (en) * | 2006-07-20 | 2008-01-24 | Microinspection, Inc. | Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same |
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Cited By (3)
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| CN104635113A (en) * | 2015-02-09 | 2015-05-20 | 合肥鑫晟光电科技有限公司 | Method and system for determining location of line fault of panel |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN104101743B (en) | 2017-03-29 |
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