WO2017161644A1 - 掩模板及光配向方法 - Google Patents
掩模板及光配向方法 Download PDFInfo
- Publication number
- WO2017161644A1 WO2017161644A1 PCT/CN2016/081104 CN2016081104W WO2017161644A1 WO 2017161644 A1 WO2017161644 A1 WO 2017161644A1 CN 2016081104 W CN2016081104 W CN 2016081104W WO 2017161644 A1 WO2017161644 A1 WO 2017161644A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- baffle
- light
- mask
- alignment
- moving member
- Prior art date
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
- G02F1/133753—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers with different alignment orientations or pretilt angles on a same surface, e.g. for grey scale or improved viewing angle
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
- G02F1/13378—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation
- G02F1/133788—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation by light irradiation, e.g. linearly polarised light photo-polymerisation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/42—Alignment or registration features, e.g. alignment marks on the mask substrates
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0002—Apparatus or processes for manufacturing printed circuits for manufacturing artworks for printed circuits
Definitions
- the present invention relates to optical alignment techniques, and more particularly to a reticle and a photoalignment method.
- liquid crystal display technology has been widely used by people, and plays a vital role in industrial production and people's lives.
- Conventional methods for making the liquid crystal on the liquid crystal display panel have a pretilt angle include a contact type rubbing orientation method and a non-contact type photo alignment method.
- the rubbing orientation method is to rub the surface of the film to be aligned with a flannel roller, and the molecules to be aligned to the surface layer of the film are arranged in a specific direction by applying physical pressure.
- the roller rubs against the film to be aligned it is easy to cause dust particles and static electricity residue and other frictional defects, which affect the product yield. Therefore, more production lines currently use the optical alignment orientation method to align the alignment film.
- the alignment film on the substrate is irradiated with polarized light obtained by passing ultraviolet light through the polarizing plate, and the alignment film is aligned so that the surface of the alignment film has optical anisotropy.
- the optical alignment orientation method can effectively improve the product yield and the stability of the production equipment.
- the mask is the carrier of the original pattern during the exposure process, and is a tool for transferring the fine pattern, which is used for mass reproduction of the product and plays a key role in production.
- one substrate corresponds to one product, and different products correspond to different patterns, and different masks are needed.
- a Multi Model Group (MMG) technology in which a plurality of products are simultaneously fabricated on the same substrate has appeared.
- MMG Multi Model Group
- the same substrate contains a plurality of products of different patterns, which can reduce the number of substrates Quantity, but also makes the mask more complicated.
- the reticle is expensive and requires high precision, and the cost of designing, manufacturing, transporting, storing, and replacing the installation is high, which imposes a large burden on both the designer and the producer. How to reduce the number of masks and reduce the probability of damage becomes the key to reducing costs.
- Embodiments of the present invention provide a reticle that can correspond to different products.
- a mask comprising a plurality of baffles, a frame and a light transmissive region.
- a support member and a moving member are provided on the frame.
- the baffle is configured to block the light transmissive area.
- the support member is configured to support a baffle that blocks the light transmissive region.
- the moving member is configured to move the shutter to a position that blocks the light transmitting region.
- the reticle further includes a damper storage bin configured to store the baffle.
- the support member is a columnar structure that is fixed in position.
- the moving part is a columnar structure in which the position can be varied.
- the moving member moves in parallel between the first position and the second position, and performs a rising and falling action.
- the moving member supports the baffle as it ascends and leaves the baffle away from the support of the support member, the moving member exiting the baffle as it descends and the baffle being supported by the support member.
- the baffle includes a first baffle having a longitudinal direction along the first direction and a second baffle, the second baffle having a lengthwise direction along the second direction.
- the first direction is perpendicular to the second direction.
- adjacent baffles partially overlap when the baffle blocks the light transmissive region.
- a photoalignment method using the above mask comprising: determining a desired number of alignments according to a position of a product arranged on a substrate; and permeable of the mask at each alignment The area on the light area that needs to be occluded. The number and position of the required baffles are determined based on the area of the light-transmissive area of the mask that needs to be blocked at each alignment. And the number and position of the baffles required for the current alignment during each alignment, the movement The board reaches a corresponding position to block at least a portion of the light transmissive area of the mask, and then aligns the alignment light to the substrate via the mask.
- a mask can be applied to produce different MMG products.
- the mask can be irradiated without replacement, and the mask is within its normal service life. No need to uninstall, optimize the production process, and effectively reduce costs.
- Figure 1 is a schematic plan view of a substrate of an MMG product
- Figure 2 is a schematic plan view of a mask according to a first embodiment of the present invention.
- Figure 3 is a schematic cross-sectional view of the frame of the mask of the embodiment shown in Figure 2;
- Figure 4 is a schematic view showing the operation of the moving member in the mask of the embodiment shown in Figure 2;
- Figure 5 is a schematic flow chart of a photo-alignment method according to a second embodiment of the present invention.
- Figure 6 is a schematic view showing the optical alignment of the product 2 on the substrate 3 of Figure 1;
- FIG. 7 is a schematic view showing the substrate rotation of the product 1 on the substrate 3 of FIG. 1;
- Figure 8 is a schematic view showing the optical alignment of the first product 1 on the substrate 3 of Figure 1;
- Figure 9 is a schematic view showing the shielding of the first column of products 2 on the substrate 3 of Figure 1;
- Figure 10 is a schematic view showing the optical alignment of the second column of products 1 on the substrate 3 of Figure 1;
- Figure 11 is a schematic illustration of the occlusion of the second column of products 2 on the substrate 3 of Figure 1.
- FIG. 1 is a schematic top plan view of a substrate of an MMG product. As shown in FIG. 1, a plurality of products are arranged on the same substrate. In this example, two rows of product 1 and two products 2 are arranged on the substrate 3, and in the row direction, the product 1 and the product 2 are arranged at intervals.
- the liquid crystal molecular orientations of Product 1 and Product 2, respectively, are indicated by the arrows indicated on Product 1 and Product 2 in Figure 1, requiring different alignment light for illumination. Therefore, in the prior art, it is necessary to continuously replace the mask during the processing to perform light alignment of all products. Both of these methods make the mask difficult to manufacture and costly.
- the mask 4 includes a plurality of baffles 5, a frame 6 and a light transmitting region 7.
- a support member 8 and a moving member 9 are provided on the frame.
- the baffle 5 is configured to block the light transmissive region 7.
- the support member 8 is configured to support the baffle 5 that blocks the light-transmitting region 7.
- the moving part 9 is configured to move the shutter 5 to a position blocking the light transmitting area 7.
- the mask 4 may further include a shutter storage box 10 configured to store the shutter 5.
- the baffle storage box 10 may be attached to the frame 6, or may have a recessed structure on the frame 6 to be directly formed.
- the mask 4 can block the light-transmitting region 7 by using the plurality of baffles 5 to form different light-transmitting patterns, so that the mask 4 can be applied to the production of different products. Moreover, in the production process of different products, it is not necessary to perform unloading and loading work on the mask 4, which reduces the use cost and can be well applied to the production of the MMG product.
- the specific light transmission pattern can be manually specified by the control system or automatically generated by the control program of the control system.
- the baffle 5 may further include a first baffle having a longitudinal direction along the first direction and a second baffle, the second baffle having a longitudinal direction along the second direction.
- a first baffle having a longitudinal direction along the first direction and a second baffle
- the second baffle having a longitudinal direction along the second direction.
- the adjacent baffles 5 partially overlap. In this way, it is possible to ensure that no light is leaked between the baffles 5.
- Figure 3 is a schematic cross-sectional view of the frame of the mask of the embodiment shown in Figure 2.
- the support member 8 is a columnar structure that is fixed in position and is configured to support the shutter 5 that blocks the light-transmitting region 7.
- the moving member 9 is a columnar structure whose position can be changed, and is configured to move the shutter 5.
- the moving member 9 moves in parallel between the first position and the second position, and is capable of ascending and descending, the moving member 9 supports the shutter 5 when it ascends and causes the shutter 5 to move away from the support of the support member 8, and when the moving member 9 is lowered
- the baffle 5 is separated and the baffle 5 is supported by the support member 8.
- the first position and the second position refer to two different positions in the moving direction of the shutter 5.
- any of the mechanical or electromechanical controls can be used to cause the moving member 9 to perform the above described motion.
- a system composed of a computer, a programmable logic controller (PLC), and an actuator is used for control, and the position of the shutter 5 is set and transported by program editing.
- PLC programmable logic controller
- the use of a computer and PLC enables more precise and complex control of the position of the baffle 5, extending the range of application of the reticle and increasing efficiency.
- PLC programmable logic controller
- FIG. 3 is for illustration only, not for the present. Limitation of the invention.
- Figure 4 is a schematic illustration of the workflow of the moving parts in the mask of the embodiment of Figure 2.
- the moving member 9 in the first step, the moving member 9 is in the lowered state and moved to the first position, and the shutter 5 is supported by the support member 8.
- the moving member 9 is raised to support the baffle and the baffle 5 is moved away from the support of the support member 8.
- the moving member 9 is kept in the rising state and moved to the second position, and the shutter 5 is also moved.
- the moving member 9 is lowered at the second position to leave the shutter 5, and the shutter 5 is supported by the support member 8. Thus, one movement of the shutter 5 is achieved.
- the movement of the baffle 5 to any position of the light-transmitting region 7 can be achieved by the mutual cooperation of the plurality of moving members 9.
- One movement of the moving part 9 The range can be set between 0 and 50 mm to achieve precise control of the position of the baffle 5.
- FIG. 5 is a schematic flow chart of a photo-alignment method in accordance with a second embodiment of the present invention.
- a photo-alignment method using the mask in the first embodiment comprising: determining a required number of alignments according to product positions arranged on the substrate And a region on the light-transmitting region 7 of the mask 4 at each alignment that needs to be blocked.
- the number and position of the required baffles 5 are determined based on the areas of the light-transmissive areas 7 of the mask 4 that need to be blocked at each alignment.
- the baffle 5 is moved to a corresponding position to block at least a portion of the light-transmitting region 7 of the mask 4 according to the number and position of the baffles 5 required for the current alignment. Then, the substrate 3 is irradiated with the aligning light via the mask 4 .
- the photo-alignment method in this example it is not necessary to replace the mask 4 for the alignment of different products, and only the state of the shutter 5 needs to be changed, and the alignment for various products can be realized in a simple procedure.
- Figure 6 is a schematic illustration of the optical alignment of the product 2 on the substrate 3 of Figure 1.
- the substrate 3 moves upward from the lower direction in the drawing to enter the area covered by the mask 4.
- the alignment light causes the liquid crystal molecules on the surface of the product to be aligned in the left-right direction (ie, the direction indicated on the product 2) in the figure, and the product 2 can directly perform the light alignment.
- the products 2 are continuously arranged, and when the substrate 3 is aligned from the bottom to the top through the mask 4, it is not necessary to adjust the blocking position of the shutter 5.
- the position of the shutter 5 is set as shown in FIG. 6, and only the longitudinal direction is used in the up and down direction.
- the baffle 5 blocks the position of the product 1.
- FIG. 7 is a schematic view showing the substrate rotation of the product 1 on the substrate 3 of FIG.
- the substrate 3 is first rotated so that the alignment direction of the liquid crystal molecules required for the product 1 is the same as the direction in which the alignment light can be generated.
- the substrate 3 enters the region covered by the mask 4 again from bottom to top.
- Figure 8 is a schematic illustration of the optical alignment of the first column of products 1 on the substrate 3 of Figure 1.
- the product 2 is interposed between the products 1 in the up and down direction, and at this time, the product 2 is not capable of receiving the irradiation of the aligning light. Therefore, the light alignment of the product 1 cannot be continuously performed, and it is necessary to carry out stepwise, and it is necessary to adjust the position of the shutter 5 accordingly.
- the first column of products 1 (i.e., the first row shown in Fig. 8 after the substrate 3 is rotated) enters the light-transmitting region 7 and is optically aligned.
- the baffle 5 since the product 2 has not entered the light transmitting region 7, the baffle 5 may not be used.
- Figure 9 is a schematic illustration of the occlusion of the first column of products 2 on the substrate 3 of Figure 1. As shown in FIG. 9, as the substrate 3 moves further upward, the first row of products 2 enters the light-transmitting region 7, and therefore, the baffle 5 is completely shielded from the light-transmitting region 7.
- Figure 10 is a schematic illustration of the optical alignment of the second column of products 1 on the substrate 3 of Figure 1.
- the baffle 5 is used to partially block the light-transmitting region 7, so that the product 1 can receive the irradiation of the aligning light, and the product 2 does not receive the illuminating light.
- Figure 11 is a schematic illustration of the occlusion of the second column of products 2 on the substrate 3 of Figure 1.
- the second row of products 2 enters the light-transmitting region 7, and since the product 1 has completed the light alignment at this time, it is not necessary to irradiate the incident light, and therefore, the baffle 5 is used.
- the light-transmitting region 7 is completely blocked. At this time, the light alignment of all the products on the substrate 3 is completed, and the substrate 3 continues to move to other processes.
- the mask 4 can be applied to the production of different products, and in the production process of different products, the unloading and loading work for the mask 4 is not required, the use cost is lowered, and the application can be well applied. Production of MMG products.
- the photo-alignment is performed using the mask 4, it is only necessary to change the state of the shutter 5 for the alignment of different products, and the alignment for various products can be realized in a simple procedure.
- the terms “mounted,” “connected,” and “connected” are used in a broad sense, and may be, for example, a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection, It can also be an electrical connection; it can be directly connected, or it can be connected indirectly through an intermediate medium, which can be the internal connection of two components.
- the specific meanings of the above terms in the present invention can be understood on a case-by-case basis.
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Abstract
Description
Claims (8)
- 一种掩模板,包括多个挡板、框体和透光区域;在所述框体上设置有支撑部件和移动部件;所述挡板被配置为遮挡所述透光区域;所述支撑部件被配置为支撑遮挡所述透光区域的所述挡板;所述移动部件被配置为用于将所述挡板移动到遮挡所述透光区域的位置。
- 根据权利要求1所述的掩模板,其中,所述掩模板还包括挡板存放箱,所述挡板存放箱被配置为存放所述挡板。
- 根据权利要求1所述的掩模板,其中,所述支撑部件是位置固定的柱状结构。
- 根据权利要求1所述的掩模板,其中,所述移动部件是位置能够变化的柱状结构;所述移动部件在第一位置和第二位置之间平行移动,并且进行上升、下降动作;所述移动部件在上升时支撑所述挡板并且使所述挡板离开支撑部件的支撑,所述移动部件在下降时离开所述挡板并且使所述挡板由支撑部件支撑。
- 根据权利要求1所述的掩模板,其中,所述挡板包括第一挡板和第二挡板,所述第一挡板的长度方向沿第一方向,所述第二挡板的长度方向沿第二方向。
- 根据权利要求5所述的掩模板,其中,所述第一方向与所述第二方向垂直。
- 根据权利要求1至6中任一项所述的掩模板,其中,在所述挡板遮挡所述透光区域时,相邻的所述挡板之间部分重叠。
- 一种使用根据权利要求1所述的掩模板的光配向方法,包括:根据在基板上排列的产品的位置,确定所需的配向次数以及在每次配向时掩模板的透光区域上需要被遮挡的区域;根据每次配向时掩模板的透光区域上需要被遮挡的区域,确定所需要的挡板的数量以及位置;以及在进行每次配向时,根据当前配向所需要的挡板的数量以及位置,移动挡板到达对应的位置,以遮挡掩模板的至少一部分透光区域,然后隔着掩模板向基板照射配向光。
Priority Applications (1)
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US15/534,055 US10197863B2 (en) | 2016-03-24 | 2016-05-05 | Mask and photo alignment method |
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CN201610171864.9A CN105572975B (zh) | 2016-03-24 | 2016-03-24 | 掩模板及光配向方法 |
CN201610171864.9 | 2016-03-24 |
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CN106200132A (zh) * | 2016-08-31 | 2016-12-07 | 深圳市华星光电技术有限公司 | 一种改善套切面板光配向性的装置 |
CN106773336A (zh) * | 2017-01-03 | 2017-05-31 | 京东方科技集团股份有限公司 | 一种遮光装置、多模型组产品光配向设备及其控制方法 |
CN107748459B (zh) * | 2017-09-25 | 2020-05-22 | 惠科股份有限公司 | 一种显示面板的制造方法和制造装置 |
CN109358455A (zh) * | 2018-12-24 | 2019-02-19 | 信利(惠州)智能显示有限公司 | 一种光配向处理方法、光配向掩模板及光配向掩模板组 |
CN111552125B (zh) * | 2020-05-27 | 2022-11-22 | 成都中电熊猫显示科技有限公司 | 掩膜版及掩膜组 |
CN111856822B (zh) * | 2020-06-29 | 2022-09-27 | 南京京东方显示技术有限公司 | 双层掩膜版及其使用方法、改善双层掩膜版漏光的方法 |
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US10197863B2 (en) | 2019-02-05 |
CN105572975A (zh) | 2016-05-11 |
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