WO2016101265A1

WO2016101265A1 - Radio frequency switch

Info

Publication number: WO2016101265A1
Application number: PCT/CN2014/095139
Authority: WO
Inventors: 黄涛
Original assignee: 华为技术有限公司
Priority date: 2014-12-26
Filing date: 2014-12-26
Publication date: 2016-06-30
Also published as: CN106415292A; CN106415292B

Abstract

Provided is a radio frequency switch, comprising: an inner chamber and a test hole formed by an insulating material, a contact chip located inside the inner chamber, a first pin and a second pin, wherein the first pin and the second pin are electrically connected to a circuit on a single board respectively, the first pin is fixedly connected to the contact chip, the second pin is in contact with and connected to the contact chip, and the inner chamber and the test hole are in mutual communication. In the test state, a test probe extends from the test hole into the inner chamber, and is in contact with the contact chip and forms an electrical connection; and the inner chamber of the radio frequency switch is provided with an insulation piece which can be opened and is used for preventing external foreign matter from entering the inner chamber.

Description

RF test stand

Technical field

The present invention relates to electronic technology, and more particularly to an RF test socket.

Background technique

In the electronic technology, the board usually uses a radio frequency switch (RF SWITCH) to test the board. The RF SWITCH is a test socket that is soldered on the product board, and is mainly used to turn on the single board circuit. The role of the test instrument connected to the test fixture. 1 is a schematic cross-sectional view of a conventional RF SWITCH. As shown in FIG. 1, the RF SWITCH includes: a test hole 1 surrounded by an insulating material, a cavity 2, a contact piece 3 located in the cavity, and a fixed connection with the contact piece 3. The first pin 4, and the second pin 5, wherein the test hole 1 is generally funnel-shaped, the inner cavity 2 is located at the bottom of the test hole 1, and the test hole 1 is in communication with each other, the first pin 4 and the second lead Pin 5 is electrically connected to the circuit on the board. In the non-test state, the contact strip 3 is in contact with the second pin 5 and has an electrical connection, and the contact strip 3, the first pin 4, the second pin 5 and the circuit on the board form a conductive loop, so that The board can work normally; in the test state, the test probe on the test fixture protrudes from the test hole 1 into the inner cavity 2 of the RF SWITCH, is connected with the contact piece 3, and presses the contact piece 3 downward to make it The second pin 5 is separated, that is, the electrical connection between the contact piece 3 and the second pin 5 is disconnected in the test state, and the test instrument on the jig passes the test probe, the contact piece 3, the first pin 4, and the veneer The upper circuit forms a conductive loop so that the board can be tested.

A problem that exists at present is that external dust easily enters the inner cavity of the RF SWTICH through the test hole and contaminates the contact piece, which easily leads to poor contact between the probe and the contact piece during the test, thereby causing misdetection. Affects the efficiency of production testing while interfering with the analysis of test problems. In response to this problem, the prior art generally uses an air gun to clean the RF SWITCH.

However, this method of cleaning the air by using an air gun has the following problems: air gun cleaning does not protect the dust and other dirt completely clean; some product boards have gas pressure sensitive devices, such as voltage adjustment device MIC, etc. Air gun blowing is easy to damage these devices; air gun cleaning takes a long time and reduces production efficiency.

Summary of the invention

The embodiment of the invention provides a radio frequency test socket to solve the problem that the prior art RF SWITCH has poor dirty cleaning effect, low efficiency, and easy damage to the gas pressure sensitive device on the single board.

An embodiment of the present invention provides a radio frequency test socket, including: an inner cavity formed by an insulating material, a test hole, a contact piece located in the inner cavity, a first pin and a second pin, wherein the first pin and The second pins are respectively electrically connected to the circuit on the board, the first pin is fixedly connected to the contact piece, and the second pin is in contact with the contact piece, the inner side The cavity and the test hole are in communication with each other, and the test probe extends from the test hole into the inner cavity in a test state, and contacts the contact piece to form an electrical connection, wherein the radio frequency test socket is The inner cavity is provided with an openable spacer for preventing foreign matter from entering the inner cavity.

In a first possible implementation manner, the openable spacer is a film, and when the test probe protrudes from the test hole, the film can be pierced by the test probe, so that The test probe is in contact with the contact piece.

According to a first possible implementation manner, in a second possible implementation, the film is disposed at a boundary between the test hole and the inner cavity, and a size of the film and a size of a bottom of the test hole Matching, the inner cavity becomes a closed space.

According to a first possible implementation, in a third possible implementation, the insulating material is a plastic material, and the film is the same plastic material as the insulating material.

The RF test socket provided by the embodiment of the invention adds an openable spacer to the test hole of the RF SWITCH, so that the RF SWITCH can avoid contamination of the internal cavity by external dust in the non-test state, and the test probe is tested. Opening the spacer to contact the contact piece in the inner cavity, so that it is not necessary to clean after the RF SWITCH is dirty, the contamination of the RF SWITCH cavity is prevented at the source, and thus compared with the prior art The method of blowing air with the air gun after the RF SWITCH is dirty can avoid the problem that the gun is insensitive to the gas pressure sensitive device and the cleaning effect is bad, and the efficiency is improved.

DRAWINGS

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will The drawings used in the embodiments or the description of the prior art are briefly described. It is obvious that the drawings in the following description are some embodiments of the present invention, and are not creative to those skilled in the art. Other drawings can also be obtained from these drawings on the premise of labor.

Figure 1 is a schematic cross-sectional view of a conventional RF SWITCH;

2 is a schematic cross-sectional view of the RF SWITCH of the present invention in a non-test state;

Figure 3 is a schematic cross-sectional view of the RF SWITCH of the present invention when the test probe punctures the film.

detailed description

The technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the drawings in the embodiments of the present invention. It is a partial embodiment of the invention, and not all of the embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts are within the scope of the present invention.

In the electronics industry, the production and testing of veneers is an essential part of the production process of electronic products. RF SWITCH is a test stand that is soldered on the product board. During the test, the test probe on the fixture is inserted into RF SWITCH. Test hole 1 and contact with contact piece 3 in inner cavity 2 and press down, electrically connect test probe with contact piece 3, first pin 4, and disconnect contact piece 3 from second pin 5. The electrical connection is formed, because the contact piece 3 communicates with the circuit on the board through the first pin 4, so that the test instrument on the fixture is electrically connected to the single board circuit.

However, when there is dirt in the inner cavity 2, especially when the contact piece is dirty, it is easy to cause poor contact between the test probe and the contact piece, thereby causing misdetection. In the test environment and the production environment of the veneer, there are usually foreign substances such as dust, which can easily cause the RF SWITCH to be dirty. Especially in the vicinity of the sub-slab station, the dust will be scattered into the RF SWITCH due to the large amount of dust when the board is divided. Cavity. Embodiments of the present invention provide an RF SWITCH that prevents dust from entering the lumen. 2 is a schematic cross-sectional view of the radio frequency test socket provided by the present invention in a non-test state. As shown in FIG. 2, the radio frequency test socket of the present embodiment includes: a test hole formed by an insulating material, and a cavity 2, which is located in the inner cavity 2. a contact piece 3, a first pin 4 and a second pin 5, wherein the first pin 4 and the second pin 5 are electrically connected to circuits on the board, respectively, the first lead The foot 4 is fixedly connected to the contact piece 3, the second pin 5 is in contact with the contact piece 3, the inner cavity 2 and the The test holes 1 are connected to each other, and the test probes extend from the test holes 1 into the inner cavity 2 in a test state, and are in contact with the contact piece 3 to form an electrical connection; wherein the radio frequency test socket is The inner chamber 2 is also provided with an openable spacer 6 for preventing foreign matter from entering the inner chamber 2.

In a specific implementation, the openable spacer 6 may be a film, and when the test probe protrudes from the test hole 1, the film can be pierced by the test probe, so that the test probe The needle is in contact with the contact piece 3.

The film can be disposable. This is because the RF SWITCH usage scenario is usually a single board test process. The film can prevent dirt from entering the cavity 2 before testing the board using the RF SWITCH. After the needle is pierced, the normal test is performed. After the test is completed, the RF SWITCH task is completed, and the pierced film does not affect the performance of the RF SWITCH and the performance of the board.

Optionally, the openable spacer 6 can also be a flexible switch or a push-down switch, for example, in a closed state when no external force is applied, when the test probe protrudes from the test hole 1 and is pressed downward, The spacer can be opened automatically.

Thus, in the non-test state, that is, when the test probe is not inserted, the spacer or the film is closed, so that foreign matter such as external dust can be prevented from entering the inner cavity.

Further optionally, the film may be disposed at a boundary between the test hole 1 and the inner cavity 2, and the size of the film matches the size of the bottom of the test hole 1, so that the inner cavity 2 becomes Closed space. For example, the test hole 1 of the RF SWITCH is generally funnel-shaped, and the film can be placed at the bottom of it, such as the cuff at the bottom of the funnel.

In fact, the position of the spacer or film may be placed anywhere that can isolate the inner chamber 2 from the outside, such as near the position where the inner chamber 2 communicates with the test hole 1, any position inside the test hole 1, or the test hole 1 surface. In view of the fact that the film is easily damaged by an external force when it is placed on the surface of the test hole, it is preferable to arrange the film inside the test hole 1 or at the boundary between the test hole 1 and the inner cavity 2. In the drawings, it is exemplified by setting it at the boundary between the test hole 1 and the inner cavity 2.

Further optionally, the insulating material is a plastic material, and the film may be the same plastic material as the insulating material. Specifically, the film can be fixed by an injection molding process in combination with a plastic portion of RF SWITCH.

Figure 3 is a schematic cross-sectional view of the RF SWITCH of the present invention when the test probe punctures the film. As shown in FIG. 3, the test probe can pierce the film and contact the contact piece to form an electrical connection, thereby conducting the test by conducting the test instrument on the fixture with the single-board circuit.

In the RF SWITCH provided in this embodiment, a film is added between the test hole and the inner cavity. In the non-test state, the film prevents external dust pollution. During the test, the test needle pierces the film and contacts the contact piece in the RF SWITCH. Therefore, the normal test can be performed. Therefore, the RF SWITCH of this embodiment does not need to be cleaned after the RF SWITCH is dirty, and the dirty entry is prevented at the source, which saves the process and can improve the production efficiency while avoiding The problem of easily damaging the gas pressure sensitive device caused by the air gun's dirty cleaning method of blowing.

Finally, it should be noted that the above embodiments are merely illustrative of the technical solutions of the present invention, and are not intended to be limiting; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that The technical solutions described in the foregoing embodiments may be modified, or some or all of the technical features may be equivalently replaced; and the modifications or substitutions do not deviate from the technical solutions of the embodiments of the present invention. range.

Claims

An RF test socket includes: an inner cavity formed of an insulating material, a test hole, a contact piece located in the inner cavity, a first pin and a second pin, wherein the first pin and the second lead The legs are respectively electrically connected to the circuit on the board, the first pin is fixedly connected to the contact piece, the second pin is in contact with the contact piece, the inner cavity and the test The holes are connected to each other, and the test probe protrudes from the test hole into the inner cavity in a test state, and contacts the contact piece to form an electrical connection, wherein the inner cavity of the radio frequency test socket is set There is an openable spacer for preventing foreign matter from entering the inner cavity.
The radio frequency test socket according to claim 1, wherein said openable spacer is a film, said film being capable of being said test probe when said test probe extends from said test hole Piercing causes the test probe to contact the contact sheet.
The radio frequency test socket according to claim 2, wherein the film is disposed at a boundary between the test hole and the inner cavity, and a size of the film matches a size of a bottom of the test hole, so that The inner cavity becomes a closed space.
The radio frequency test socket according to claim 2, wherein the insulating material is a plastic material, and the film is the same plastic material as the insulating material.