CN106415292B

CN106415292B - Radio frequency test seat

Info

Publication number: CN106415292B
Application number: CN201480079388.7A
Authority: CN
Inventors: 黄涛
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2014-12-26
Filing date: 2014-12-26
Publication date: 2020-03-31
Anticipated expiration: 2034-12-26
Also published as: WO2016101265A1; CN106415292A

Abstract

The embodiment of the invention provides a radio frequency test seat, which comprises: the test device comprises an inner cavity, a test hole, a contact piece, a first pin and a second pin, wherein the inner cavity, the test hole and the contact piece are formed by insulating materials, the contact piece, the first pin and the second pin are located in the inner cavity, the first pin and the second pin are respectively and electrically connected with a circuit on a single board, the first pin is fixedly connected with the contact piece, the second pin is in contact connection with the contact piece, the inner cavity and the test hole are mutually communicated, a test probe extends into the inner cavity from the test hole under a test state and is in contact with the contact piece to form electrical connection, and an openable isolating piece is arranged in the inner cavity of the radio frequency test base and used for preventing external foreign matters from entering.

Description

Radio frequency test seat

Technical Field

The invention relates to the electronic technology, in particular to a radio frequency test seat.

Background

In electronic technology, a single board is usually tested by using a radio frequency SWITCH (RFSWITCH for short), which is a test socket welded on a single board of a product and mainly plays a role in connecting a single board circuit and a test instrument connected to a test fixture. Fig. 1 is a schematic cross-sectional view of a conventional RF SWITCH, as shown in fig. 1, the RF SWITCH includes: the testing hole 1, the inner chamber 2 that insulating material encloses, be located contact piece 3 in the inner chamber, with contact piece 3 fixed connection's first pin 4, and second pin 5, wherein, testing hole 1 generally is hourglass hopper-shaped, and inner chamber 2 is located the bottom of testing hole 1, and the testing hole 1 intercommunication each other, and first pin 4 and second pin 5 are connected with the circuit electricity on the veneer. In a non-test state, the contact piece 3 is in contact with and electrically connected with the second pin 5, and the contact piece 3, the first pin 4, the second pin 5 and a circuit on the single board form a conductive loop, so that the single board can normally work; in a test state, a test probe on the test fixture extends into the inner cavity 2 of the RF SWITCH from the test hole 1 to be connected with the contact piece 3, and the contact piece 3 is pressed downwards to be separated from the second pin 5, namely, the electrical connection between the contact piece 3 and the second pin 5 is disconnected in the test state, and a test instrument on the fixture forms a conductive loop through the test probe, the contact piece 3, the first pin 4 and a circuit on the single board, so that the single board can be tested.

One problem that exists at present is that external dust easily gets into the inner chamber of RF SWTICH through the test hole to pollute the contact piece, like this, lead to easily in the test procedure, probe and contact piece contact failure, thereby arouse the misdetection phenomenon, influence production efficiency of software testing, can disturb the analysis of test problem simultaneously. In response to this problem, the prior art typically employs an air gun to perform a dirty cleaning of the RF SWITCH by blowing.

However, such a method of cleaning the dirt using air blowing by an air gun has the following problems: the air gun cannot completely clean dirt such as dust and the like; devices sensitive to gas pressure, such as a voltage adjusting device MIC and the like, exist on the single plates of a part of products, and the devices are easily damaged by adopting an air gun blowing mode; the air gun is long in cleaning time, and the production efficiency is reduced.

Disclosure of Invention

The embodiment of the invention provides a radio frequency test base, which aims to solve the problems that in the prior art, the effect of cleaning the RF SWITCH by dirt is poor, the efficiency is low, and devices sensitive to gas pressure on a single board are easy to damage.

The embodiment of the invention provides a radio frequency test seat, which comprises: the test device comprises an inner cavity, a test hole, a contact piece, a first pin and a second pin, wherein the inner cavity, the test hole and the contact piece are formed by insulating materials, the contact piece, the first pin and the second pin are located in the inner cavity, the first pin and the second pin are respectively and electrically connected with a circuit on a single board, the first pin is fixedly connected with the contact piece, the second pin is in contact connection with the contact piece, the inner cavity and the test hole are mutually communicated, a test probe extends into the inner cavity from the test hole under a test state and is in contact with the contact piece to form electrical connection, and an openable isolating piece is arranged in the inner cavity of the radio frequency test base and used for preventing external foreign matters from entering the inner.

In a first possible implementation manner, the openable partition is a film, and when the test probe extends from the test hole, the film can be punctured by the test probe, so that the test probe is in contact with the contact piece.

According to the first possible implementation manner, in a second possible implementation manner, the film is arranged at a junction of the testing hole and the inner cavity, and the size of the film is matched with the size of the bottom of the testing hole, so that the inner cavity becomes a closed space.

According to a first possible implementation manner, in a third possible implementation manner, the insulating material is a plastic material, and the film is the same plastic material as the insulating material.

According to the radio frequency test socket provided by the embodiment of the invention, the openable isolating sheet is additionally arranged on the test hole of the RF SWITCH, so that the inner cavity can be prevented from being polluted by external dust in a non-test state of the RF SWITCH, and the test probe opens the isolating sheet to be contacted with the contact sheet in the inner cavity during test, so that cleaning is not required after the RF SWITCH is polluted, and the pollution of the inner cavity of the RF SWITCH is prevented from the source.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

FIG. 1 is a schematic cross-sectional view of a conventional RF SWITCH;

FIG. 2 is a cross-sectional view of the RF SWITCH of the present invention in a non-testing state;

FIG. 3 is a schematic cross-sectional view of the RF SWITCH of the present invention when the test probe pierces the film.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the electronic industry, the manufacture and test of a single board are essential links in the production process of electronic products, an RF SWITCH is a test seat welded on the single board of the product, in the test process, a test probe on a clamp is inserted into a test hole 1 of the RF SWITCH, and is contacted with a contact piece 3 in an inner cavity 2 and pressed down, so that the test probe is electrically connected with the contact piece 3 and a first pin 4, the contact piece 3 is disconnected with a second pin 5, and the electrical connection is formed, and because the contact piece 3 is communicated with a circuit on the single board through the first pin 4, a test instrument on the clamp is communicated with the circuit of the single board.

However, if there is contamination in the cavity 2, particularly if the contact piece is contaminated, the contact between the test probe and the contact piece is poor, and erroneous measurement is easily caused. Foreign matters such as dust and the like usually exist in the test environment and the production environment of the single board, the RFSWITCH is easy to introduce dirt, and especially in the vicinity of the board dividing station, a large amount of dust can float to the inner cavity of the RFSWITCH due to the fact that the dust is large in quantity during board dividing. The embodiment of the invention provides an RF SWITCH capable of preventing dust from entering an inner cavity. Fig. 2 is a schematic cross-sectional view of the rf test socket provided by the present invention in a non-test state, as shown in fig. 2, the rf test socket of the present embodiment includes: the testing device comprises a testing hole 1 and an inner cavity 2 which are made of insulating materials, and a contact piece 3, a first pin 4 and a second pin 5 which are positioned in the inner cavity 2, wherein the first pin 4 and the second pin 5 are respectively and electrically connected with a circuit on a single board, the first pin 4 is fixedly connected with the contact piece 3, the second pin 5 is in contact connection with the contact piece 3, the inner cavity 2 is mutually communicated with the testing hole 1, and a testing probe extends into the inner cavity 2 from the testing hole 1 in a testing state and is in contact with the contact piece 3 to form electrical connection; the inner cavity 2 of the radio frequency test seat is further provided with an openable isolation sheet 6 for preventing external foreign matters from entering the inner cavity 2.

In a specific implementation, the openable spacer 6 may be a film, and when the test probe is inserted into the test hole 1, the film can be punctured by the test probe, so that the test probe contacts the contact sheet 3.

The film can be disposable, because the use scene of the RF SWITCH is generally the test process of the single plate, the film can prevent dirt from entering the inner cavity 2 before the RF SWITCH is used for testing the single plate, a test probe is used for puncturing the film and then carrying out normal test during the test, the task of the RF SWITCH is completed after the test is completed, and the punctured film does not influence the performance of the RF SWITCH and the performance of the single plate.

Alternatively, the openable partition 6 may be an elastic switch or a push-down switch, for example, which is closed when no external force is applied and automatically opens when the test probe is inserted from the test well 1 and pushed down.

Thus, in a non-test state, i.e., when no test probe is inserted, the spacer or the film is in a closed state, so that foreign matters such as external dust can be prevented from entering the inner cavity.

Further optionally, the film may be disposed at a junction of the test hole 1 and the inner cavity 2, and a size of the film matches a size of a bottom of the test hole 1, so that the inner cavity 2 becomes a closed space. For example, the test well 1 of the RFSWITCH is generally funnel-shaped, and the membrane may be disposed at the bottom thereof, e.g., at the bottom of the funnel.

In fact, the position of the spacer or the membrane may be set at any place where the inner chamber 2 can be isolated from the outside, for example, near the position where the inner chamber 2 communicates with the test well 1, at any position inside the test well 1, or at the surface of the test well 1. In view of the fact that the thin film is easily damaged by external force when it is disposed on the surface of the test well, it is preferable that the thin film be disposed inside the test well 1 or at the boundary between the test well 1 and the inner cavity 2. The figure shows the test hole 1 and the inner cavity 2 arranged at the junction of the test hole for example.

Further optionally, the insulating material is a plastic material, and the film may be the same plastic material as the insulating material. Specifically, the film may be fixed by injection molding process in combination with the plastic part of the RF SWITCH.

FIG. 3 is a schematic cross-sectional view of the RF SWITCH of the present invention when the test probe pierces the film. As shown in fig. 3, the test probe can contact and electrically connect with the contact sheet after piercing the film, so as to conduct the test instrument on the fixture and the single board circuit for testing.

The RF SWITCH provided by the embodiment has the advantages that the film is additionally arranged between the test hole and the inner cavity, the film can prevent external dust pollution in a non-test state, and the test needle punctures the film to be contacted with the contact piece in the RF SWITCH in the test process, so that normal test can be carried out.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A radio frequency test socket, comprising: the test device comprises an inner cavity, a test hole, a contact piece, a first pin and a second pin, wherein the inner cavity, the test hole and the contact piece are formed by insulating materials, the contact piece, the first pin and the second pin are positioned in the inner cavity, the first pin and the second pin are respectively and electrically connected with a circuit on a single board, the first pin is fixedly connected with the contact piece, the second pin is in contact connection with the contact piece, the inner cavity and the test hole are mutually communicated, and a test probe extends into the inner cavity from the test hole under a test state and is in contact with the contact piece to form electrical connection;

the openable separation sheet is a film, and when the test probe extends from the test hole, the film can be punctured by the test probe, so that the test probe is contacted with the contact sheet;

the film is arranged at the junction of the testing hole and the inner cavity, and the size of the film is matched with that of the bottom of the testing hole, so that the inner cavity becomes a closed space.

2. The rf test socket according to claim 1, wherein the insulating material is a plastic material, and the film is the same plastic material as the insulating material.