CN106415292A

CN106415292A - Radio frequency switch

Info

Publication number: CN106415292A
Application number: CN201480079388.7A
Authority: CN
Inventors: 黄涛
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2014-12-26
Filing date: 2014-12-26
Publication date: 2017-02-15
Anticipated expiration: 2034-12-26
Also published as: WO2016101265A1; CN106415292B

Abstract

Provided is a radio frequency switch, comprising: an inner chamber and a test hole formed by an insulating material, a contact chip located inside the inner chamber, a first pin and a second pin, wherein the first pin and the second pin are electrically connected to a circuit on a single board respectively, the first pin is fixedly connected to the contact chip, the second pin is in contact with and connected to the contact chip, and the inner chamber and the test hole are in mutual communication. In the test state, a test probe extends from the test hole into the inner chamber, and is in contact with the contact chip and forms an electrical connection; and the inner chamber of the radio frequency switch is provided with an insulation piece which can be opened and is used for preventing external foreign matter from entering the inner chamber.

Description

Radio frequency testing seat

Technical field

The present invention relates to electronic technology, more particularly to a kind of radio frequency testing seat.

Background technology

In electronic technology, veneer would generally be using radio frequency testing seat (radio frequency switch, abbreviation：RF SWITCH) single-board testing is carried out, RF SWITCH are welded to a kind of test bench on product single board, mainly play the tester that conducting veneer circuit is connected with test fixture.Fig. 1 is existing RF SWITCH schematic cross-section, as shown in figure 1, RF SWITCH include：Instrument connection 1 that insulating materials is surrounded, inner chamber 2, contact chip 3 in inner chamber, the first pin 4 being fixedly connected with contact chip 3, with second pin 5, wherein, instrument connection 1 is generally in funnel-form, inner chamber 2 is located at the bottom of instrument connection 1, and instrument connection 1 is interconnected, and the first pin 4 and second pin 5 are electrically connected with the circuit on veneer.Under non-test state, contact chip 3 is contacted with second pin 5 and with electrical connection, and contact chip 3, the first pin 4, second pin 5 form the loop of conducting with the circuit on veneer, enable veneer normal work；Under test mode, test probe on test fixture is put in RF SWITCH inner chamber 2 from instrument connection 1, it is connected with contact chip 3, and be pressed downward contact chip 3, it is set to be separated with second pin 5, contact chip 3 and the electrical connection of second pin 5 are disconnected i.e. under test mode, and the tester on fixture is by testing the formation of the circuit on probe, contact chip 3, the first pin 4 and veneer galvanic circle, so as to test veneer.

The problem that presently, there are is, external dust enters easily by instrument connection in RF SWTICH inner chamber, and pollute contact chip, so, it is easily caused in test process, probe and contact chip loose contact, phenomenon is surveyed by mistake so as to cause, production test efficiency is influenceed, while the analysis of meeting disturbed test problem.For the problem, generally RF SWITCH carry out dirty cleaning by the way of air gun is to air blowing in the prior art.

But, there is problems with to the dirty clean method of air blowing in this use air gun：It is clean that air gun cleaning can not protect the dirty complete cleaning such as dust；There is the device sensitive to gas pressure on portioned product veneer, such as voltage adjuster part MIC, these devices are easily damaged by the way of air gun is blown；Air gun cleaning is time-consuming longer, reduces production efficiency.

The content of the invention

The embodiment of the present invention provides a kind of radio frequency testing seat, to solve the problem of RF SWITCH of prior art carry out bad dirty cleaning effect, inefficiency and are easily damaged device sensitive to gas pressure on veneer.

The embodiment of the present invention provides a kind of radio frequency testing seat, including：The inner chamber of insulating materials formation, instrument connection, contact chip in inner chamber, first pin and second pin, wherein, first pin and the second pin are electrically connected with the circuit on veneer respectively, first pin is fixedly connected with the contact chip, the second pin with the contact chip contacts connection with described, the inner chamber and the instrument connection are interconnected, probe is tested under test mode and stretches to the inner chamber from the instrument connection, and contacted with the contact chip, form electrical connection, wherein, the inner chamber of the radio frequency testing seat is provided with openable spacer, for preventing extraneous foreign matter from entering the inner chamber.

In the first possible implementation, the openable spacer is film, and when the test probe is stretched into from the instrument connection, the film can be punctured by the test probe, the test probe is contacted with the contact chip.

According to the first possible implementation, in second of possible implementation, the film is arranged on the intersection of the instrument connection and the inner chamber, and the size of the film and the size of the instrument connection bottom match, and the inner chamber is turned into the space of closing.

According to the first possible implementation, in the third possible implementation, the insulating materials is plastic material, and the film is and the insulating materials identical plastic material.

Radio frequency testing seat provided in an embodiment of the present invention, by increasing an openable spacer on RF SWITCH instrument connection, so that RF SWITCH can avoid inner chamber from receiving the pollution of external dust under non-test state, probe is tested during test to open the spacer to contact with the contact chip in inner chamber, without going cleaning again after RF SWITCH are dirty, on source it is prevented that RF SWITCH inner chambers it is dirty, therefore compared to prior art after RF SWITCH are dirty again using method of the air gun to air blowing, the problem of rifle damages blowing the device and bad cleaning effect sensitive to gas pressure can be avoided, improve efficiency simultaneously.

Brief description of the drawings

In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be right The accompanying drawing used required in embodiment or description of the prior art is briefly described, apparently, drawings in the following description are some embodiments of the present invention, for those of ordinary skill in the art, without having to pay creative labor, other accompanying drawings can also be obtained according to these accompanying drawings.

Fig. 1 is existing RF SWITCH schematic cross-section；

Fig. 2 is schematic cross-sections of the RF SWITCH of the present invention under non-test state；

Fig. 3 is testing schematic cross-section when probe punctures film for the RF SWITCH of the present invention.

Embodiment

To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is a part of embodiment of the invention, rather than whole embodiments.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art are obtained under the premise of creative work is not made belongs to the scope of protection of the invention.

In electronics industry, the making and test of veneer be electronic product production process must be through link, RF SWITCH are welded to a kind of test bench on product single board, in test process, the instrument connection 1 of test probe insertion RF SWITCH on fixture, and contact and push with the contact chip 3 in inner chamber 2, test probe is set to be electrically connected with contact chip 3, the first pin 4, and contact chip 3 is disconnected with second pin 5, form electrical connection, because contact chip 3 is by the first pin 4 and the circuit communication on veneer, so that tester and veneer circuit turn-on on fixture.

But when having dirty in inner chamber 2, when especially contact chip is dirty, be easily caused test probe and contact chip loose contact, surveyed by mistake so as to cause.And the production environment of test environment and veneer generally has the foreign matters such as dust, it is easy to introduce RF SWITCH dirty, particularly near point plate station, due to dividing meeting a large amount of dust during plate, these dust can fly away RF SWITCH inner chamber.The embodiment of the present invention provides a kind of RF SWITCH that can prevent dust from entering inner chamber.Schematic cross-sections of the Fig. 2 for the radio frequency testing seat of the invention provided under non-test state, as shown in Fig. 2 the radio frequency testing seat of the present embodiment includes：The instrument connection 1 of insulating materials formation, inner chamber 2, contact chip 3, the first pin 4 and second pin 5 in inner chamber 2, wherein, first pin 4 and the second pin 5 are electrically connected with the circuit on veneer respectively, first pin 4 is fixedly connected with the contact chip 3, the second pin 5 contacts connection with the contact chip 3 with described, the inner chamber 2 and described Instrument connection 1 is interconnected, and probe is tested under test mode and stretches to the inner chamber 2 from the instrument connection 1, and is contacted with the contact chip 3, forms electrical connection；Wherein, the inner chamber 2 of the radio frequency testing seat is additionally provided with openable spacer 6, for preventing extraneous foreign matter from entering the inner chamber 2.

When implementing, the openable spacer 6 can be film, and when the test probe is stretched into from the instrument connection 1, the film can be punctured by the test probe, the test probe is contacted with the contact chip 3.

The film can be disposable, this is due to that RF SWITCH usage scenario is usually the test process of veneer, the film can prevent dirty entrance inner chamber 2 before being tested using the RF SWITCH veneer, test after probe is punctured and normally tested during test, RF SWITCH task has just been completed after test is completed, and influence will not be produced to RF SWITCH performance and the performance of veneer by puncturing the film of state.

Alternatively, the openable spacer 6 can also be that elastic switch or press-down type are switched, such as be closure state when no external force is acted on, and when test probe is stretched into and is pressed downward from instrument connection 1, the spacer can be automatically opened up.

So, under non-test state, i.e., when not testing probe and stretching into, the spacer or film are closure state, therefore can prevent the foreign matters such as external dust from entering inner chamber.

Still optionally further, the film can be arranged on the intersection of the instrument connection 1 and the inner chamber 2, and the size of the film and the size of the bottom of instrument connection 1 match, and the inner chamber 2 is turned into the space of closing.For example, RF SWITCH instrument connection 1 is generally in funnel-form, the film can be arranged at its bottommost, such as closing in of funnel bottom.

In fact, the position of spacer or film can be arranged on the surface of any one that inner chamber 2 can be made to be hedged off from the outer world is local, such as near the position that inner chamber 2 is connected with instrument connection 1, inside instrument connection 1 optional position or instrument connection 1.If easily damaged by external force during surface in view of film to be arranged on to instrument connection, it is therefore preferred that film can be arranged on to inside or instrument connection 1 and the intersection of the inner chamber 2 of instrument connection 1.Illustrated in accompanying drawing exemplified by being disposed at intersection of the instrument connection 1 with the inner chamber 2.

Still optionally further, the insulating materials is plastic material, and the film can be and the insulating materials identical plastic material.Specifically, the film can be combined by Shooting Technique and RF SWITCH plastic portions and fixed.

Fig. 3 is testing schematic cross-section when probe punctures film for the RF SWITCH of the present invention. As shown in figure 3, test probe can contact with contact chip after film is punctured and form electrical connection, so as to by the tester on fixture and veneer circuit turn-on, be tested.

The RF SWITCH that the present embodiment is provided, increase a film between instrument connection and inner chamber, film, which is played, under non-test state prevents external dust from polluting, testing needle punctures the contact chip contact in film and RF SWITCH when test, so as to normally be tested, therefore, the RF SWITCH of the present embodiment need not go cleaning again after RF SWITCH are dirty, it is prevented that dirty enter on source, process is saved to improve production efficiency, simultaneously avoid using air gun the dirty clean method of air blowing is brought the problem of being easily damaged gas pressure Sensitive Apparatus.

Finally it should be noted that：Various embodiments above is merely illustrative of the technical solution of the present invention, rather than its limitations；Although the present invention is described in detail with reference to foregoing embodiments, it will be understood by those within the art that：It can still modify to the technical scheme described in foregoing embodiments, or carry out equivalent substitution to which part or all technical characteristic；And these modifications or replacement, the essence of appropriate technical solution is departed from the scope of various embodiments of the present invention technical scheme.

Claims

A kind of radio frequency testing seat, including：The inner chamber of insulating materials formation, instrument connection, contact chip in inner chamber, first pin and second pin, wherein, first pin and the second pin are electrically connected with the circuit on veneer respectively, first pin is fixedly connected with the contact chip, the second pin with the contact chip contacts connection with described, the inner chamber and the instrument connection are interconnected, probe is tested under test mode and stretches to the inner chamber from the instrument connection, and contacted with the contact chip, form electrical connection, it is characterized in that, the inner chamber of the radio frequency testing seat is provided with openable spacer, for preventing extraneous foreign matter from entering the inner chamber.
Radio frequency testing seat according to claim 1, characterized in that, the openable spacer is film, when the test probe is stretched into from the instrument connection, the film can be punctured by the test probe, the test probe is contacted with the contact chip.
Radio frequency testing seat according to claim 2, it is characterised in that the film is arranged on the intersection of the instrument connection and the inner chamber, and the size of the film and the size of the instrument connection bottom match, and makes the inner chamber turn into the space of closing.
Radio frequency testing seat according to claim 2, it is characterised in that the insulating materials is plastic material, the film is and the insulating materials identical plastic material.