JP5507487B2 - Inspection jig - Google Patents

Description

  The present invention relates to an inspection jig applied to an inspection device for a capacitance sensor sheet.

  2. Description of the Related Art Conventionally, a touch panel that is installed so as to overlap with a display screen and can be operated intuitively by a user is known. The touch panel is provided with a capacitance sensor sheet (hereinafter simply referred to as “sensor sheet”) having detection electrodes for detecting the proximity of a user's finger or the like.

  As a method for inspecting whether the sensor sheet can perform as specified, connect the sensor sheet to a detection circuit that detects a change in capacitance, and use an electrode as a substitute for an input body such as a user's finger. It is known to make it close to the detection electrode of the sensor sheet.

  As an example of a sensor sheet inspection apparatus, for example, Patent Document 1 discloses an inspection apparatus including an inspection jig having a plurality of electrodes (inspection electrodes) serving as an alternative to an input body. In the inspection apparatus described in Patent Document 1, the inspection jig is attached to the sensor sheet so that the inspection electrode of the inspection jig is opposed to the detection electrode (sensor electrode) of the sensor sheet (sensor module) with a certain interval. It is done.

JP 2010-86026 A

The sensor sheet may be adhered to a hard casing made of resin or glass, or may be integrally formed with a hard panel made of resin or the like by insert molding or the like. In this case, when using the sensor sheet, one surface in the thickness direction of the sensor sheet may be in contact with air. Further, when the sensor sheet is used, the sensor sheet may be supported by the protrusions, and both sides in the thickness direction of the sensor sheet may be in contact with the air.
However, in the inspection apparatus described in Patent Document 1, the sensor sheet to be inspected is placed on a flat table or a belt conveyor, and one surface in the thickness direction is in contact with air. Are tested in different states. For this reason, the inspection is performed under conditions different from the conditions in which the sensor sheet is actually used, and the reliability of the inspection result may be reduced.

  The present invention has been made in view of the above-described circumstances, and an object thereof is to provide an inspection jig capable of obtaining a highly reliable inspection result.

In order to solve the above problems, the present invention proposes the following means.
An inspection jig according to the present invention is an inspection jig applied to an inspection apparatus connected to the detection electrode in order to inspect a capacitance sensor sheet having a detection electrode. A mounting table that has a recess for generating an air layer between the capacitor sensor sheet and a thickness of the capacitance sensor sheet that is provided in the recess and mounted on the mounting table. The detection electrode is sandwiched between the columnar portion that supports the capacitance sensor sheet at a position overlapping the detection electrode when viewed from the side, and the columnar portion that is electrically connected to the inspection apparatus. An inspection jig comprising a pusher pressed against the capacitance sensor sheet.

  Moreover, it is preferable that the said columnar part has the columnar part side contact surface formed according to the shape of said one surface so that it may closely_contact | adhere to one surface of the thickness direction of the said capacitance sensor sheet.

  Further, the pusher has a pusher-side contact surface that is formed following the shape of the other surface so as to be in close contact with the other surface with respect to one surface in the thickness direction of the capacitance sensor sheet. Is preferred.

  The pusher-side contact surface is formed in a circle having a diameter of 5 mm or more and 20 mm or less, and the columnar portion-side contact surface is formed in a circle having a diameter larger than the diameter of the pusher-side contact surface. preferable.

  The inspection jig according to the present invention further includes a guide member that is detachably attached to the mounting table and guides the pusher toward the columnar portion. The guide member includes a central axis of the columnar portion. A through hole penetrating the guide member is formed coaxially, and the inner dimension of the through hole is such that the pusher is inserted in a freely reciprocating manner and the central axis of the pusher is substantially coaxial with the central axis of the columnar portion. It is preferable that the inner dimension is such that the pusher can be supported, and the outer dimension of the columnar portion-side contact surface is substantially equal to the inner dimension of the through hole.

  The pusher is electrically connected to the inspection device and has a pusher-side contact surface formed thereon, and is attachable to and detachable from the pusher body and follows the shape of the other surface. A spacer that has a presser-side second contact surface formed and creates a predetermined gap between the presser-side contact surface and the capacitance sensor sheet, and the dielectric constant of the spacer is: It is preferable that the dielectric constant of the panel stacked in the thickness direction of the capacitance sensor sheet when the capacitance sensor sheet is used is substantially the same, and the predetermined thickness is substantially equal to the thickness of the panel.

  According to the inspection jig of the present invention, the presser can be reliably brought into contact with the portion where the detection electrode is positioned while the air layer is in contact with the sensor sheet, and a highly reliable inspection result can be obtained.

It is a block diagram showing an inspection device provided with an inspection jig of one embodiment of the present invention, and a sensor sheet. It is a top view which shows the same inspection jig. It is a side view showing the inspection jig. It is a top view which shows the mounting base in the inspection jig | tool. It is sectional drawing in the AA of FIG. It is a fragmentary sectional view of an inspection jig. It is a fragmentary sectional view showing the composition of the inspection jig of the modification of the embodiment. It is sectional drawing which shows the test jig | tool of the other modification of the embodiment with the cross section similar to the AA line of FIG. It is sectional drawing which shows the test | inspection jig | tool of the further another modification of the embodiment with the cross section similar to the AA line of FIG.

An inspection jig 10 according to an embodiment of the present invention will be described using an inspection apparatus 1 including the inspection jig 10 as an example. FIG. 1 is a block diagram showing an inspection apparatus 1 and a sensor sheet 100.
As shown in FIG. 1, the inspection apparatus 1 is an apparatus that inspects a capacitance sensor sheet 100 (hereinafter simply referred to as “sensor sheet 100”) for detecting a change in capacitance. The sensor sheet 100 inspected by the inspection apparatus 1 in this embodiment includes a substrate 101 made of an insulator formed in a plate shape, a sheet shape, or a film shape, a detection electrode 102 formed on the substrate 101, and a detection The wiring 103 has one end connected to the electrode 102. The other end of the wiring 103 is disposed on the peripheral edge of the substrate 101 and serves as a terminal for connecting to a detection circuit that detects electrostatic capacitance.
The inspection apparatus 1 includes an inspection jig 10 that holds the sensor sheet 100, an inspection circuit 30 that is connected to a terminal of the sensor sheet 100, and a display unit 40 that displays an inspection result by the inspection circuit 30.

FIG. 2 is a plan view showing the inspection jig 10. FIG. 3 is a side view showing the inspection jig 10. FIG. 4 is a plan view showing the mounting table 11 in the inspection jig 10. FIG. 5 is a cross-sectional view taken along line AA in FIG.
As shown in FIGS. 2, 3, and 4, the inspection jig 10 includes a mounting table 11, a columnar portion 15, a pusher 17, and a guide member 20.
As shown in FIGS. 3 and 4, the mounting table 11 is a table on which the sensor sheet 100 is mounted, and is formed in a substantially rectangular parallelepiped shape having a mounting surface 12 on which the sensor sheet 100 is mounted.
As shown in FIGS. 4 and 5, the mounting table 11 has a recess 13 whose contour is positioned slightly inward from the periphery of the sensor sheet 100 in a plan view, and a mounting surface 12 in a direction orthogonal to the mounting surface 12. Convex part 14 which protruded from is formed.

  As shown in FIG. 5, the recess 13 is formed to be recessed from the placement surface 12 in a direction orthogonal to the placement surface 12, and a plurality of columnar portions 15 are fixed to the bottom surface of the recess 13. As shown in FIGS. 4 and 5, when the sensor sheet 100 is placed on the placement surface 12, the recess 13 is opened so as to surround at least all the detection electrodes 102 to be inspected in the sensor sheet 100. Yes. In addition, the shape of the opening of the recessed part 13 may be a shape surrounding all the detection electrodes 102 regardless of whether or not the detection electrodes 102 of the sensor sheet 100 are inspection targets.

  As shown in FIG. 5, the depth dimension d of the recess 13 is the thickness of a gap (air layer) generated between the sensor sheet 100 and the sensor sheet 100 when the sensor sheet 100 is actually used after being incorporated in an electronic device or the like. Is set in consideration of For example, the depth d of the recess 13 is set to, for example, 3 mm or more and 13 mm or less, specifically, 3 mm, 5 mm, 13 mm, or the like. Thereby, the recessed part 13 produces an air layer with a predetermined thickness between the sensor sheet 100 and the sensor sheet 100 when the sensor sheet 100 is placed on the placement surface 12. In addition, the influence which the bottom part of the recessed part 13 has on the detection sensitivity in the sensor sheet 100 is reduced, so that the depth dimension d of the recessed part 13 becomes large. For this reason, from the viewpoint of reducing the influence of the inspection jig 10 on the detection sensitivity in the sensor sheet 100, it is preferable that the depth dimension d of the recess 13 is large.

  The convex portion 14 creates a gap between the placement surface 12 and the guide member 20 and creates an air layer between the sensor sheet 100 and the guide member 20. The protrusion amount of the convex portion 14 is set in consideration of the influence of the inspection jig 10 on the detection sensitivity of the sensor sheet 100 as in the method of setting the depth dimension d of the concave portion 13. Thereby, the convex part 14 produces the air layer of predetermined thickness between the sensor sheet 100, when the sensor sheet 100 is mounted on the mounting surface 12. FIG. When both the convex part 14 and the above-mentioned recessed part 13 are formed in the mounting base 11, both surfaces of the thickness direction of the sensor sheet 100 are in contact with the air layer.

  In addition, when the sensor sheet 100 is used, the surface in contact with the mounting surface 12 of the inspection jig 10 out of both surfaces in the thickness direction of the sensor sheet 100 (referred to as “one surface 100a of the sensor sheet 100” in this specification). When the surface opposite to the surface (referred to as “the other surface 100b of the sensor sheet 100” in this specification) is in close contact with a panel made of resin or the like, the inspection jig 10 has the protrusion 14. May not be included.

As shown in FIGS. 4 and 5, the columnar portion 15 is a columnar member arranged at a position overlapping the detection electrode 102 of the sensor sheet 100 in plan view when the sensor sheet 100 is placed on the placement surface 12. It is. In the present embodiment, the columnar portion 15 is formed in a columnar shape, and the end surface opposite to the side fixed to the bottom of the recess 13 has a columnar portion side formed in accordance with the shape of the surface of the sensor sheet 100. The contact surface 16 is formed. In the present embodiment, the sensor sheet 100 has a flat plate shape, a sheet shape, or a film shape. Therefore, the columnar portion-side contact surface 16 in the present embodiment is a flat surface that follows the outer surface of the sensor sheet 100. Yes. Thereby, the columnar portion-side contact surface 16 is in close contact with one surface 100 a in the thickness direction of the sensor sheet 100.
The position of the columnar portion side contact surface 16 in the central axis direction of the columnar portion 15 is flush with the placement surface 12. Thereby, the columnar portion 15 can support the sensor sheet 100 placed on the placement surface 12 along the placement surface 12.

  The position of the columnar portion-side contact surface 16 when the mounting table 11 is viewed in plan is set to a position where inspection is performed within the detection electrode 102 when the sensor sheet 100 is mounted on the mounting surface 12. For example, when the inspection is performed on the center of the detection electrode 102 when the sensor sheet 100 is viewed in plan, the columnar portion-side contact surface 16 is disposed at a position overlapping the center of the detection electrode 102.

  The columnar portion-side contact surface 16 is formed to be equal to or slightly larger than the diameter of the pusher-side contact surface 18 formed on the pusher 17 described later. Further, the shape of the columnar portion side contact surface 16 is preferably the same shape as the shape of the pusher side contact surface 18 of the pusher 17. In this embodiment, the shape is a circle that follows the shape of the presser side contact surface 18. Is formed.

  In the present embodiment, the columnar portion 15 is integrally formed with the mounting table 11. As the material for the mounting table 11 and the columnar part 15, a material having a low dielectric constant is employed for the purpose of preventing unnecessary capacitance from being detected in the inspection apparatus 1. In the present embodiment, as the material for the mounting table 11 and the columnar portion 15, fluororesin, polystyrene foam, sponge, or the like can be employed.

  As shown in FIG. 1, the pusher 17 is a member made of a dielectric that is electrically connected to the inspection apparatus 1. The pusher 17 is a member simulating a finger or a stylus pen for inputting to the sensor sheet 100, and is provided for the purpose of performing an input operation for inspection on the detection electrode 102 of the sensor sheet 100.

  As shown in FIG. 5, the pusher 17 has a pusher-side contact surface 18 formed following the shape of the other surface 100 b of the sensor sheet 100. The pusher-side contact surface 18 is a surface that is in close contact with the other surface 100b of the sensor sheet 100, and has dimensions set based on, for example, the thickness of the finger of the user who uses the sensor sheet 100. Specifically, the pusher-side contact surface 18 is formed in a circular shape with a diameter of 5 mm or more and 20 mm or less that is approximately the same area as the contact area where the user's finger contacts the sensor sheet 100.

The position of the pusher 17 is guided by a guide member 20 described later, and the pusher-side contact surface 18 is pressed against the sensor sheet 100 so that the detection electrode 102 is sandwiched between the pusher 17 and the columnar part 15.
A cord for electrically connecting to the inspection circuit 30 of the inspection apparatus 1 is attached to the end surface of the pusher 17 opposite to the pusher-side contact surface 18. In the present embodiment, the pusher 17 is connected to the ground in the inspection circuit 30 of the inspection device 1.

As shown in FIGS. 3 and 5, the guide member 20 is a plate-like member that is detachably attached to the mounting table 11, and has a through hole 21 for guiding the pusher 17 toward the columnar portion 15. .
As shown in FIG. 3, the guide member 20 is supported by the convex portion 14 of the mounting table 11 in a state where a gap is left between the mounting surface 11 and the mounting surface 12.

  As shown in FIG. 5, the through hole 21 formed in the guide member 20 passes through the guide member 20 coaxially with the central axis of the columnar portion 15. The inner dimension of the through hole 21 is an inner dimension through which the pusher 17 is inserted so as to be able to advance and retreat, and supports the pusher 17 so that the central axis of the pusher 17 is substantially coaxial with the central axis of the columnar portion 15. The inner dimensions are possible. Furthermore, the inner dimension of the through hole 21 and the outer dimension of the columnar portion-side contact surface 16 are substantially equal.

  When the sensor sheet 100 is placed on the placement surface 12, the guide member 20 guides the pusher-side contact surface 18 to a position for inspection within the detection electrode 102. For example, when the inspection is performed on the center of the detection electrode 102 when the sensor sheet 100 is viewed in plan, the guide member 20 is pushed to a position that overlaps the center of the detection electrode 102 and faces the columnar portion-side contact surface 16. The child side contact surface 18 is guided.

  The through hole 21 formed in the guide member 20 preferably has an appropriate clearance between the pusher 17. The appropriate clearance is a size that allows the pusher 17 to be slightly inclined in the through hole 21 so that the pusher-side contact surface 18 is in close contact with the other surface 100 b of the sensor sheet 100.

The operation of the inspection jig 10 having the above-described configuration will be described. FIG. 6 is a partial cross-sectional view of the inspection jig 10.
The inspection jig 10 is used together with the inspection apparatus 1 including an inspection circuit 30 that detects a change in capacitance. Hereinafter, a case where the inspection apparatus 1 inspects the self-capacitance type sensor sheet 100 will be described as an example.

  When the inspection apparatus 1 is used, first, the sensor sheet 100 is attached to the inspection jig 10, the terminals of the sensor sheet 100 are connected to the inspection circuit 30, and the pusher 17 of the inspection jig 10 is connected to the inspection circuit 30 (FIG. 1). Thereby, in the inspection circuit 30, the change in the electrostatic capacitance in the detection electrode 102 can be detected by bringing the pusher 17 close to the detection electrode 102 of the sensor sheet 100.

As shown in FIG. 6, in order to attach the sensor sheet 100 to the inspection jig 10, first, the sensor sheet 100 is placed on the placement surface 12. At this time, the sensor sheet 100 is placed so that the outer edge of the sensor sheet 100 is positioned slightly outside the opening of the recess 13 in plan view, and the detection electrode 102 to be inspected in the sensor sheet 100 is positioned in the recess 13 in plan view. Place.
As shown in FIG. 5, the outer edge of the sensor sheet 100 is supported by the placement surface 12. Further, the detection electrode 102 of the sensor sheet 100 is supported by the columnar portion side contact surface 16 of the columnar portion 15. One surface 100 a of the sensor sheet 100 is in contact with an air layer generated by the recess 13.

  Subsequently, the guide member 20 is attached to the mounting table 11, and thereafter, the detection of the electrostatic capacitance in each detection electrode 102 is started by the inspection circuit 30 of the inspection apparatus 1. The state where the pusher 17 is not inserted into the guide member 20 corresponds to the state where the input operation to the detection electrode 102 is not performed.

Subsequently, as shown in FIG. 6, the pusher 17 is inserted into the through hole 21 formed in the guide member 20. The operation of inserting the pusher 17 into the through hole 21 of the guide member 20 may be performed manually or using a manipulator (not shown).
When inspecting only one detection electrode 102 of the sensor sheet 100, only one pusher 17 is inserted into the through hole 21. Further, when inspecting the plurality of detection electrodes 102 of the sensor sheet 100, the pushers 17 are respectively inserted into the through holes 21 corresponding to the parts to be inspected. Furthermore, when inspecting simultaneous input to a plurality of positions of one detection electrode 102, the pushers 17 are inserted into the through holes 21 corresponding to the positions to be inspected.

  In the pusher 17 inserted into the through hole 21 of the guide member 20, the pusher-side contact surface 18 formed on the pusher 17 is guided to the other surface 100 b of the sensor sheet 100. As a result, the detection electrode 102 of the sensor sheet 100 is sandwiched between the pusher-side contact surface 18 and the columnar portion-side contact surface 16.

  Since the pusher 17 is connected to the ground of the inspection circuit 30, the detection circuit detects a change in the capacitance of the detection electrode 102 due to the pusher-side contact surface 18 being in close contact with the sensor sheet 100. The inspection circuit 30 determines whether or not the amount of change in capacitance is within a range determined by the specifications, and outputs the inspection result to the display unit 40, for example.

The pusher 17 is brought into intimate contact with all the detection electrodes 102 to be inspected to detect a change in capacitance, and the inspection result is output to end the inspection.
When the inspection is completed, the pusher 17 and the guide member 20 are removed, the sensor sheet 100 is removed from the mounting table 11 and the inspection circuit 30, and the series of operations is completed.

  As described above, according to the inspection jig 10 of the present embodiment, the capacitance sensor sheet 100 can be inspected under conditions close to the actual usage of the capacitance sensor sheet 100.

  In addition, since the columnar portion side contact surface 16 having a shape following the surface shape of the capacitance sensor sheet 100 is formed on the columnar portion 15, there is no gap between the capacitance sensor sheet 100 and the columnar portion 15. Does not occur. Thereby, the change in electrostatic capacitance can be accurately measured by the inspection circuit 30.

  Further, since the pusher-side contact surface 18 having a shape following the shape of the surface of the capacitance sensor sheet 100 is formed on the pusher 17, the pusher 17 is brought into contact with the capacitance sensor sheet 100 without a gap. Can do. Thereby, the change in electrostatic capacitance can be accurately measured by the inspection circuit 30.

  Further, since the pusher-side contact surface 18 is formed in a circular shape having a diameter of 5 mm or more and 20 mm or less, the sensor sheet 100 can be inspected under a condition close to that when a human finger is brought into contact with the sensor sheet 100. . Thereby, it is possible to reproduce the situation where the sensor sheet 100 is used by the user in the inspection of the sensor sheet 100.

  When the guide member 20 is not provided, the position where the pusher 17 is pressed against the detection electrode 102 may be different for each inspection. In this embodiment, since the pusher 17 can be guided to the columnar portion 15 by the guide member 20, the accuracy of the position where the pusher 17 is pressed against the detection electrode 102 is high. Thereby, compared with the case where the pressing position of the pusher 17 to the detection electrode 102 differs for every sensor sheet 100, the precision of a test | inspection can be improved.

(Modification 1)
Next, a modified example of the inspection jig 10 described in the above embodiment will be described. FIG. 7 is a partial cross-sectional view showing an inspection jig of this modification.
The inspection jig 10 </ b> A of the present modification is different from the above-described inspection jig 10 in that it includes a pusher 17 </ b> A instead of the pusher 17 and a guide member 20 </ b> A instead of the guide member 20.

The pusher 17A includes a pusher main body 17A1 electrically connected to the inspection apparatus 1, and a spacer 19 that can be attached to and detached from the pusher main body 17A1.
The pusher main body 17A1 includes a shaft portion formed in a columnar shape and a columnar insertion portion that is inserted into the through hole 21A of the guide member 20A that is thinner than the diameter of the shaft portion. A pusher-side contact surface 18 similar to the above-described pusher-side contact surface 18 is formed on the end surface of the insertion portion of the presser body 17A1.

The spacer 19 is formed in a cylindrical shape with one side closed. In the present modification, the spacer 19 has an opening 19a having a circular cross section into which the tip of the pusher body 17A1 can be inserted. An annular flange 19 b is formed in the opening of the spacer 19 so as to expand in the radial direction of the spacer 19.
Further, the spacer 19 has a presser side second close contact formed by following the shape of the spacer inner contact surface 19c that is in close contact with the presser side close contact surface 18 of the presser body 17A1 and the other surface 100b of the sensor sheet 100. A surface 19d is formed.

  The in-spacer contact surface 19c and the pusher side second contact surface 19d are parallel to each other, and both have a smooth surface state. The pusher-side second contact surface 19d is in close contact with the surface of the capacitance sensor sheet 100 in the same manner as the pusher-side contact surface 18 formed on the above-described pusher 17, thereby accurately changing the capacitance. The inspection circuit 30 can detect it.

  The dielectric constant of the spacer 19 is substantially the same as the dielectric constant of the panel stacked in the thickness direction of the capacitance sensor sheet 100 when the capacitance sensor sheet 100 is used. In order to make the dielectric constant of the spacer 19 substantially the same as the dielectric constant of the panel, the spacer 19 may be made of the same material as that of the panel. Further, when the spacer 19 is formed using a material different from the material of the panel, the thickness of the spacer 19 is adjusted, or a plurality of materials are mixed to make the spacer 19 material. The dielectric constant can be close to the dielectric constant of the panel.

  The spacer 19 attached to the pusher main body 17A1 creates a predetermined gap between the pusher-side contact surface 18 and the capacitance sensor sheet 100. The size of the predetermined gap is substantially equal to the thickness of the panel.

The guide member 20A is formed with a through hole 21A having a shape different from that of the through hole 21 of the guide member 20 described in the above embodiment.
The through hole 21 </ b> A has a locking portion 22 for locking the spacer 19. The locking portion 22 includes a step formed on the inner surface of the through hole 21A so as to be larger than the outer dimension of the flange 19b on the upper surface side of the guide member 20A and smaller than the outer dimension of the flange 19b on the lower surface side of the guide member 20A. .
In a state where the spacer 19 is locked to the locking portion 22, the pusher side second contact surface 19 d protrudes from the lower surface of the guide member 20 </ b> A to the extent that it can come into contact with the columnar portion side contact surface 16. Thereby, in the state where the spacer 19 is attached to the pusher 17, the spacer 19 can be pressed against the sensor sheet 100 without the spacer 19 falling between the guide member 20 </ b> A and the mounting table 11.

  In this modification, the spacer 19 is provided to reproduce the situation where the sensor sheet 100 is fixed to the panel and used, and the function of the detection electrode 102 when an operation input is performed through the panel. Can be inspected.

  Note that the pusher 17A of the present modification can be used even when the spacer 19 is not attached. Thereby, the test | inspection of the electrostatic capacitance sensor sheet 100 can also be carried out on the conditions which do not provide a panel.

(Modification 2)
Next, another modification of the above-described embodiment will be described. FIG. 8 is a cross-sectional view showing the inspection jig of this modification in the same cross section as the AA line of FIG.
The inspection jig 10B of this modification is different from the above-described inspection jig 10 in that a positioning member 11B for positioning the sensor sheet 100 is provided on the placement surface 12.
The positioning member 11B is formed in the shape of a plurality of protrusions provided at predetermined intervals along the periphery of the opening of the recess 13 formed in the mounting table 11, for example. The sensor sheet 100 can be positioned on the placement surface 12 by inserting the sensor sheet 100 into a region surrounded by the positioning member 11B.

(Modification 3)
Next, still another modification of the above-described embodiment will be described. FIG. 9 is a cross-sectional view showing the inspection jig of this modification in the same cross section as the AA line of FIG.
As shown in FIG. 9, the inspection jig 10 </ b> C according to the present modification can position the sensor sheet 100 and can adjust the distance between the bottom of the recess 13 and the sensor sheet 100. Is different.
In this modification, the recess 13 is opened in a shape that can accommodate the sensor sheet 100 therein. In addition to the columnar portion 15, a support member 11 </ b> C that supports the outer edge of the sensor sheet 100 is further provided.
The columnar portion 15 and the support member 11C are detachable from the mounting table 11, and a plurality of types having different lengths in the central axis direction are prepared.
In the present modification, one type is selected from the columnar portion 15 and the support member 11 </ b> C having different lengths in the central axis direction and attached to the mounting table 11. Thereby, the upper ends of the columnar portions 15 are aligned on one plane, and a placement surface 12A for supporting the sensor sheet 100 is generated. Further, the position of the detection electrode 102 in the sensor sheet 100 is positioned by the support member 11C. By mounting the sensor sheet 100 on the mounting surface 12A, it is possible to inspect the detection electrode 102 of the sensor sheet 100 in the same manner as in the above-described embodiment and modification.

As mentioned above, although embodiment of this invention was explained in full detail with reference to drawings, the concrete structure is not restricted to this embodiment, The design change etc. of the range which does not deviate from the summary of this invention are included.
For example, in the above-described modification, an example in which the spacer inner contact surface and the pusher side second contact surface are flat surfaces has been shown. However, the spacer inner contact surface and the pusher side second contact surface are formed in the shape of the sensor sheet. It can also be a three-dimensional shape following the above. Thereby, it can test | inspect with high precision also in the sensor sheet shape | molded in three dimensions.
Further, the constituent elements shown in the above-described embodiments and modifications can be combined as appropriate.

DESCRIPTION OF SYMBOLS 1 Inspection apparatus 10, 10A, 10B, 10C Inspection jig 11 Mounting base 12, 12A Mounting surface 13 Concave part 14 Convex part 15 Columnar part 16 Columnar part side contact surface 17, 17A Pusher 17A1 Pusher main body 18 Pusher side contact | adherence Surface 19 Spacer 19d Pusher side second contact surface 20, 20A Guide member 21, 21A Through hole 22 Locking portion 30 Inspection circuit 40 Display portion 100 Sensor sheet (capacitance sensor sheet)
100a One surface 100b The other surface 102 Detection electrode

Claims (6)

An inspection jig applied to an inspection apparatus connected to the detection electrode in order to inspect a capacitance sensor sheet having the detection electrode,
A mounting table on which the capacitance sensor sheet is mounted, having a recess that creates an air layer between the capacitance sensor sheet and
A columnar portion that is provided in the recess and supports the capacitance sensor sheet at a position overlapping the detection electrode when viewed from the thickness direction of the capacitance sensor sheet placed on the mounting table;
A pusher that is pressed against the capacitance sensor sheet so that the detection electrode is sandwiched between the columnar part and electrically connected to the inspection device;
An inspection jig comprising: The inspection jig according to claim 1,
The columnar portion has a columnar portion-side contact surface formed so as to follow the shape of the one surface so as to be in close contact with one surface in the thickness direction of the capacitance sensor sheet. Ingredients.   The inspection jig according to claim 1 or 2, wherein the pusher has a shape of the other surface so as to be in close contact with the other surface with respect to the one surface in the thickness direction of the capacitance sensor sheet. An inspection jig having a pusher-side contact surface formed by copying. The inspection jig according to claim 3,
The pusher-side contact surface is formed in a circular shape having a diameter of 5 mm to 20 mm,
The columnar part-side contact surface is formed in a circular shape having a diameter larger than the diameter of the pusher-side contact surface. The inspection jig according to claim 4,
A guide member that is detachably attached to the mounting table and guides the pusher toward the columnar part,
The guide member is formed with a through-hole penetrating the guide member coaxially with the central axis of the columnar portion,
The inner dimension of the through hole is an inner dimension capable of supporting the pusher so that the pusher is inserted in a freely movable manner and the central axis of the pusher is substantially coaxial with the central axis of the columnar portion. ,
The inspection jig characterized in that an outer dimension of the columnar part-side contact surface is substantially equal to an inner dimension of the through hole. The inspection jig according to any one of claims 3 to 5,
The pusher is
A pusher body electrically connected to the inspection device and formed with the pusher-side contact surface;
A pusher-side second contact surface that is detachably attached to the presser body and is formed following the shape of the other surface, and is predetermined between the presser-side contact surface and the capacitance sensor sheet. A spacer that creates a gap between
Have
The dielectric constant of the spacer is substantially the same as the dielectric constant of the panel stacked in the thickness direction of the capacitance sensor sheet when the capacitance sensor sheet is used.
The size of the predetermined gap is substantially equal to the thickness of the panel.

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