CN204302320U - A kind of test DUT board - Google Patents
A kind of test DUT board Download PDFInfo
- Publication number
- CN204302320U CN204302320U CN201420700329.4U CN201420700329U CN204302320U CN 204302320 U CN204302320 U CN 204302320U CN 201420700329 U CN201420700329 U CN 201420700329U CN 204302320 U CN204302320 U CN 204302320U
- Authority
- CN
- China
- Prior art keywords
- socket
- printed circuit
- pcb
- circuit board
- noguchi
- Prior art date
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- 241000283690 Bos taurus Species 0.000 claims abstract description 19
- 210000003284 Horns Anatomy 0.000 claims abstract description 19
- 239000004065 semiconductor Substances 0.000 abstract description 7
- 238000000034 method Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 241000196324 Embryophyta Species 0.000 description 1
- 208000008425 Protein Deficiency Diseases 0.000 description 1
- 230000003044 adaptive Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 230000000875 corresponding Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009863 impact test Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Abstract
The utility model relates to a kind of test DUT board, belongs to semiconductor test technical field.It comprises printed circuit board (PCB) (1), described printed circuit board (PCB) (1) side is provided with multiple golden finger (2), described printed circuit board (PCB) (1) opposite side is horizontally arranged with a cattle horn socket (4), a Noguchi socket (3) is provided with between described multiple golden finger (2) and cattle horn socket (4), relay (5) is provided with between described Noguchi socket (3) and cattle horn socket (4), described printed circuit board (PCB) (1) front is provided with resistance (6), described multiple golden finger (2) is connected with the joint of Noguchi socket (3) with cattle horn socket (4) respectively by printed circuit board (PCB) (1) wiring.The utility model relates to a kind of test DUT board, and it saves the process of human weld's wire, makes simple and convenient, and stable testing is reliable, and service efficiency is high, and applicability is strong simultaneously.
Description
Technical field
The utility model relates to a kind of test DUT board, belongs to semiconductor test technical field.
Background technology
Semiconductor reliability test is one important procedure in semiconductor manufacturing, its objective is that whether the semiconductor device electrical property detecting manufacture is qualified, thus weeds out underproof product.When carrying out semiconductor reliability test, first testing sample (normally through the chip of simplified package) is inserted into DUT (device under test, DUT) on plate, again DUT board is received on tester table, corresponding test data is obtained by the test of tester table, as can be seen here, the quality of DUT board quality directly has influence on the test result of semiconductor reliability test.
Existing DUT board needs manual work welding lead when making; human weld's circuit often can cause empty short void to break; thus cause testing FAIL; a lot of resistance is used in addition because existing DUT board makes needs; along with the time one is long; the aging meeting of DUT board causes the problem of the higher or loose contact of contact resistance, thus impact test, affect the serviceable life of DUT board.And, existing DUT board be the MUX relay of test machine inside, service time has been grown, the convert resistance of relay easily increases, and uses internal relay, and measurement circuit can be very long, easily cause the change of external interference and line impedance, thus cause test unstable.
Summary of the invention
The purpose of this utility model is to overcome above-mentioned deficiency, provides a kind of making simple, reliable and stable, the test DUT board that service efficiency is high, adaptive is strong.
The purpose of this utility model is achieved in that a kind of test DUT board, it comprises printed circuit board (PCB), side, described printed circuit board (PCB) front is provided with multiple golden finger, described printed circuit board (PCB) front opposite side is horizontally arranged with a cattle horn socket, a Noguchi socket is vertically provided with between described multiple golden finger and cattle horn socket, relay is provided with between described Noguchi socket and cattle horn socket, described printed circuit board (PCB) front is provided with resistance, described multiple golden finger is connected with the joint of cattle horn socket with Noguchi socket respectively by printed circuit board wiring, described relay is connected with Noguchi receptacle terminal respectively by printed circuit board wiring with resistance.
Compared with prior art, the utility model has following beneficial effect:
1, this DUT board directly by traverse design in the printed circuit boards, saves the process of human weld's wire, avoids the wire bonds loosely problem because artificial bonding wire produces, thus impact is electrically connected, product test result;
2, the circuit of this DUT board all designs in the printed circuit boards, and surface has green varnished insulation layer to protect, so this DUT board long service life, there will not be the improper wire short circuit that causes of the manual operation because wire exposes or open circuit problem;
3, the circuit flexible design of this DUT board is in the printed circuit boards, so this DUT board suitability is stronger, and can by the test realizing different product of the different Noguchi sockets in printed circuit board (PCB);
4, this DUT board uses outside relay, shortens measurement circuit, reduces line impedance and external interference, thus makes stable testing reliable;
5, this DUT board uses simple to operate, only needs to install golden finger during use before DUT board, reduces debug time, improves testing efficiency.
Accompanying drawing explanation
fig. 1 is a kind of structural representation testing DUT board of the utility model.
Wherein:
Printed circuit board (PCB) 1
Golden finger 2
Noguchi socket 3
Cattle horn socket 4
Relay 5
Resistance 6.
Embodiment
See Fig. 1, the utility model one test DUT board, it comprises printed circuit board (PCB) 1, side, described printed circuit board (PCB) 1 front is provided with multiple golden finger 2, described printed circuit board (PCB) 1 front opposite side is horizontally arranged with a cattle horn socket 4, a Noguchi socket 3 is vertically provided with between described multiple golden finger 2 and cattle horn socket 4, relay 5 is provided with between described Noguchi socket 3 and cattle horn socket 4, described printed circuit board (PCB) 1 front is provided with resistance 6, described resistance 6 is positioned at below cattle horn socket 4, described multiple golden finger 2 is connected up by printed circuit board (PCB) 1 and is connected with the joint of Noguchi socket 3 with cattle horn socket 4 respectively, described relay 5 is connected with Noguchi socket 3 joint respectively by printed circuit board (PCB) 1 wiring with resistance 6.
During detection, cattle horn socket is connected with the motherboard of test machine by winding displacement, and golden finger is connected with Test handler, can test.
Claims (1)
1. a test DUT board, it is characterized in that: it comprises printed circuit board (PCB) (1), described printed circuit board (PCB) (1) side, front is provided with multiple golden finger (2), described printed circuit board (PCB) (1) front opposite side is horizontally arranged with a cattle horn socket (4), a Noguchi socket (3) is vertically provided with between described multiple golden finger (2) and cattle horn socket (4), relay (5) is provided with between described Noguchi socket (3) and cattle horn socket (4), described printed circuit board (PCB) (1) front is provided with resistance (6), described multiple golden finger (2) is connected with the joint of Noguchi socket (3) with cattle horn socket (4) respectively by printed circuit board (PCB) (1) wiring, described relay (5) is connected with Noguchi socket (3) joint respectively by printed circuit board (PCB) (1) wiring with resistance (6).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420700329.4U CN204302320U (en) | 2014-11-20 | 2014-11-20 | A kind of test DUT board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420700329.4U CN204302320U (en) | 2014-11-20 | 2014-11-20 | A kind of test DUT board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204302320U true CN204302320U (en) | 2015-04-29 |
Family
ID=53107851
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420700329.4U Active CN204302320U (en) | 2014-11-20 | 2014-11-20 | A kind of test DUT board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204302320U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109425810A (en) * | 2017-08-18 | 2019-03-05 | 台湾积体电路制造股份有限公司 | Semiconductor test apparatus, semiconductor test system and semiconductor test method |
-
2014
- 2014-11-20 CN CN201420700329.4U patent/CN204302320U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109425810A (en) * | 2017-08-18 | 2019-03-05 | 台湾积体电路制造股份有限公司 | Semiconductor test apparatus, semiconductor test system and semiconductor test method |
| CN109425810B (en) * | 2017-08-18 | 2021-08-24 | 台湾积体电路制造股份有限公司 | Semiconductor test apparatus, semiconductor test system, and semiconductor test method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |