WO2016067728A1 - 脆性基板の分断方法 - Google Patents
脆性基板の分断方法 Download PDFInfo
- Publication number
- WO2016067728A1 WO2016067728A1 PCT/JP2015/073989 JP2015073989W WO2016067728A1 WO 2016067728 A1 WO2016067728 A1 WO 2016067728A1 JP 2015073989 W JP2015073989 W JP 2015073989W WO 2016067728 A1 WO2016067728 A1 WO 2016067728A1
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- WIPO (PCT)
- Prior art keywords
- line
- brittle substrate
- crack
- trench
- forming
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0017—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing using moving tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/023—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
- C03B33/037—Controlling or regulating
Definitions
- the present invention relates to a method for dividing a brittle substrate, and in particular, to a method for dividing using a scribing wheel.
- a scribe line is formed on the substrate, and then the substrate is divided along the scribe line.
- the scribe line can be formed by mechanically processing the substrate using the cutting edge.
- a trench due to plastic deformation is formed on the substrate, and at the same time, a vertical crack is formed immediately below the trench.
- stress is applied, which is called a break process.
- the substrate is divided by causing the crack to advance completely in the thickness direction by the break process.
- the process of dividing the substrate is often performed immediately after the process of forming a scribe line on the substrate.
- substrate is a process of providing a certain member on a board
- a scribe line is formed on a glass substrate for each region to be an organic EL display before mounting a sealing cap. For this reason, the contact between the sealing cap and the glass cutter, which becomes a problem when the scribe line is formed on the glass substrate after the sealing cap is provided, can be avoided.
- the brittle substrate is processed after the scribe line is formed, and then a break process is performed by applying stress.
- the substrate processing step is not performed between the scribe line formation step and the substrate break step, the substrate is usually transported or stored after the scribe line formation step and before the substrate break step. In this case, the substrate may be unintentionally divided.
- the present invention has been made in order to solve the above-described problems.
- the purpose of the present invention is to preliminarily define the position where the brittle substrate is to be divided, but to intend the brittle substrate before the time when it should be divided. It is an object of the present invention to provide a method for dividing a brittle substrate that can prevent the substrate from being divided.
- the method for dividing a brittle substrate according to the present invention is a method for dividing a brittle substrate using a scribing wheel having an outer peripheral portion provided with a cutting edge around a rotation axis, and includes the following steps.
- a brittle substrate having a first surface and a second surface opposite to the first surface and having a thickness direction perpendicular to the first surface is prepared.
- the outer periphery of the scribing wheel is pressed onto the first surface of the brittle substrate, and the scribing wheel is rolled on the first surface of the brittle substrate, thereby causing the first of the brittle substrate.
- a trench line having a groove shape is formed.
- the load has an in-plane component parallel to the first surface of the brittle substrate.
- the scribing wheel travels on the first surface in the same traveling direction as the direction of the in-plane component.
- the step of forming the trench line is performed so as to obtain a crackless state in which the brittle substrate is continuously connected in the direction intersecting the trench line immediately below the trench line.
- the crack line is formed by extending the crack of the brittle substrate in the thickness direction along the trench line in the traveling direction. Due to the crack line, the brittle substrate is disconnected continuously in the direction intersecting the trench line immediately below the trench line.
- the brittle substrate is divided along the crack line.
- a trench line having no crack is formed immediately below the line that defines the position where the brittle substrate is divided.
- the crack line to be used as a direct trigger for the division is formed by extending the crack along the trench line after the formation.
- the brittle substrate after the formation of the trench line and before the formation of the crack line is in a state in which the position to be divided is defined by the trench line, but the crack line has not yet been formed, so that the division is not easily caused. .
- this state it is possible to prevent the brittle substrate from being unintentionally divided before the time point at which it should be divided, while predefining the position where the brittle substrate is divided.
- FIG. 5A is an end view schematically showing the configuration of the trench line formed in FIG. 4A, and FIG.
- 5B is an end view schematically showing the configuration of the crack line formed in FIG. 4B.
- It is a top view (A) and (B) which shows roughly the cutting method of a brittle board in the modification of Embodiment 1 of the present invention. It is a top view which shows roughly the cutting method of the brittle board
- the cutting instrument 50 is attached to a scribe head (not shown) and moves relative to the glass substrate 4 to scribe the glass substrate 4.
- the cutting instrument 50 includes a scribing wheel 51, a pin 52, and a holder 53.
- the scribing wheel 51 has a substantially disk shape, and its diameter is typically about several mm.
- the scribing wheel 51 is held by a holder 53 via a pin 52 so as to be rotatable around a rotation axis AX.
- the scribing wheel 51 has an outer peripheral portion PF provided with a cutting edge.
- the outer peripheral portion PF extends in an annular shape around the rotation axis AX. As shown in FIG. 2A, the outer peripheral portion PF stands up like a ridgeline at the visual level, thereby forming a cutting edge composed of a ridgeline and an inclined surface.
- the ridge line of the outer peripheral portion PF has a fine surface shape MS in the portion that actually acts as the scribing wheel 51 enters the glass substrate 4 (below the two-dot chain line in FIG. 2B).
- the surface shape MS preferably has a curved shape having a finite radius of curvature when viewed from the front (FIG.
- the scribing wheel 51 is formed using a hard material such as cemented carbide, sintered diamond, polycrystalline diamond, or single crystal diamond.
- the entire scribing wheel 51 may be made of single crystal diamond from the viewpoint of reducing the surface roughness of the ridgeline and the inclined surface.
- a glass substrate 4 having an upper surface SF1 (first surface) and a lower surface SF2 (second surface opposite to the first surface) is prepared (FIG. 1).
- the glass substrate 4 has a thickness direction DT perpendicular to the upper surface SF1.
- the glass substrate 4 has sides ED1 and ED2 facing each other.
- the scribing wheel 51 proceeds on the upper surface SF1 in the traveling direction DP. Progression by this rolling is performed while pressing the outer peripheral portion PF of the scribing wheel 51 onto the upper surface SF ⁇ b> 1 of the glass substrate 4 by applying a load F to the scribing wheel 51. Thereby, by generating plastic deformation on the upper surface SF1 of the glass substrate 4, a trench line TL having a groove shape is formed (FIG. 3: step S20).
- the load F has a vertical component Fp parallel to the thickness direction DT of the glass substrate 4 and an in-plane component Fi parallel to the upper surface SF1.
- the traveling direction DP is the same as the direction of the in-plane component Fi.
- the above-described step of forming trench line TL is a crack in a state in which glass substrate 4 is continuously connected in a direction DC intersecting trench line TL immediately below trench line TL. It is performed so that a less state is obtained.
- the trench line TL is formed by plastic deformation, but no crack is formed along the trench line TL. Therefore, even when a bending moment is applied to the glass substrate 4, the division along the trench line TL does not easily occur.
- the vertical component Fp (FIG. 1) should not be excessively increased.
- the trench line TL is formed from the start point N1 to the end point N3 through the intermediate point N2.
- the trench line TL is preferably formed away from the edge of the upper surface SF1. This eliminates the need for the scribing wheel 51 to contact the edge of the upper surface SF1.
- the assist line AL is formed next.
- a crack line CL is formed along the trench line TL (FIG. 3: step S30).
- the direction DC intersects the extending direction of the trench line TL (the lateral direction in FIGS. 4A and 4B) immediately below the trench line TL by the crack line CL.
- the continuous connection is broken.
- “continuous connection” means a connection that is not interrupted by a crack.
- the portions of the glass substrate 4 may be in contact with each other through the cracks of the crack line CL. Formation of the crack line CL is performed by extending a crack (see FIG. 5B) of the glass substrate 4 in the thickness direction DT along the trench line TL toward the traveling direction DP.
- the assist line AL is formed on the upper surface SF1 of the glass substrate 4 so as to be in contact with the trench line TL, and is formed so as to intersect with the trench line TL in the present embodiment.
- the assist line AL is a general scribe line, and is therefore accompanied by a crack that penetrates in the thickness direction DT of the glass substrate 4.
- the cutting tool 50 used for forming the trench line TL may be used. In this case, a load larger than the load F at the time of forming the trench line TL is required.
- other instruments may be used to form the assist line AL more reliably. For example, a scribing wheel provided with an uneven shape along the outer peripheral portion PF may be used.
- the formation of the crack line CL is considered to start when the internal stress distortion in the vicinity of the trench line TL is released. Specifically, it is considered that this internal stress is released by the stress applied to the glass substrate 4 when the assist line AL is formed.
- the process that triggers the formation of the crack line CL is not limited to the process of forming the assist line AL, but may be any process that triggers the release of internal stress.
- step S40 the glass substrate 4 is divided along the crack line CL by a so-called break process.
- the break process can be performed, for example, by bending the glass substrate 4 by applying an external force. Note that, when the crack line CL is completely advanced in the thickness direction DT at the time of formation, the formation of the crack line CL and the division of the glass substrate 4 may occur at the same time. In this case, the break process is omitted.
- a trench line TL (FIG. 5A) that does not have a crack is formed immediately below the line that defines the position at which the glass substrate 4 is divided.
- the crack line CL (FIG. 5B) to be used as a direct trigger for the division is formed by extending the crack along the trench line TL after the formation.
- the glass substrate 4 (FIG. 4A) after the formation of the trench line TL and before the formation of the crack line CL is aligned with the position where the glass substrate 4 is divided by the trench line TL. It is in a crackless state in which no cracks have yet been formed. The crackless state is easily maintained unless an excessively large stress is applied to the glass substrate 4. Therefore, during this crackless state, the glass substrate 4 can be stably stored and transported, and processing such as film formation and etching on the glass substrate 4 can be performed without causing unintended cracks.
- the glass substrate 4 is unintentionally divided before a desired point in time, while the position where the glass substrate 4 is divided is defined in advance. Can be prevented.
- the formation process of the crack line CL in the present embodiment is essentially different from the generation of cracks in a so-called break process.
- the break process is to completely separate the substrate by further extending the cracks already formed in the thickness direction.
- the formation process of the crack line CL involves a qualitative change from a crackless state obtained by forming the trench line TL to a state having cracks along the trench line TL. This change is considered to be caused by the release of internal stress that the crackless state has.
- the crack line CL along the trench line TL may not be formed only by forming the assist line AL.
- the formation of the crack line CL can be started by separating the glass substrate 4 along the assist line AL.
- the assist line AL in the present modification may be formed by the same method as the crack line CL described above. That is, it may be formed by forming a crack along the trench line after it is formed.
- trench line TL (FIG. 4A) is formed on upper surface SF1 of glass substrate 4 by the same method as in the first embodiment.
- an assist line AL is formed on the lower surface SF2 of the glass substrate 4.
- the assist line AL intersects with the trench line TL in the planar layout.
- the assist line AL and the trench line TL are formed on different surfaces of the glass substrate 4 and are not in direct contact with each other.
- the glass substrate 4 is separated along the assist line AL in substantially the same manner as in FIG. 6B of the first embodiment. Thereby, formation of the crack line CL is started. Thereafter, similarly to the first embodiment, the glass substrate 4 is divided along the crack line CL.
- trench line TL (FIG. 4A) is formed on upper surface SF1 of glass substrate 4 by the same method as in the first embodiment.
- the assist line AL is formed on the upper surface SF1 of the glass substrate 4 so as to partially overlap the trench line TL.
- the assist line AL is formed so as to overlap a portion between the start point N1 and the midpoint N2 in the trench line TL and away from the end point N3.
- the length of the assist line AL is, for example, about 0.5 mm.
- the crack line CL is formed by using the assist line AL as a trigger.
- trench line TL (FIG. 4A) is formed on upper surface SF1 of glass substrate 4 by the same method as in the first embodiment.
- laser light is irradiated to a part of trench line TL.
- the laser beam is irradiated to a portion of the trench line TL between the start point N1 and the midpoint N2 away from the end point N3.
- a crack line CL is formed in a portion of the trench line TL between the start point N1 and the midpoint N2, and as a trigger, the crack line CL is formed from the midpoint N2 to the end point N3.
- the method for dividing a brittle substrate according to each of the above embodiments is particularly preferably applied to a glass substrate, but the brittle substrate may be made of a material other than glass.
- the brittle substrate may be made of a material other than glass.
- ceramics, silicon, a compound semiconductor, sapphire, or quartz may be used as a material other than glass.
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Dicing (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
図1、図2(A)および図2(B)を参照して、はじめに本実施の形態のガラス基板4(脆性基板)の分断方法に用いられるカッティング器具50について、以下に説明する。
本実施の形態のガラス基板4の分断方法においても、まず上記実施の形態1と同様の方法により、ガラス基板4の上面SF1上にトレンチラインTL(図4(A))が形成される。
本実施の形態のガラス基板4の分断方法においても、まず上記実施の形態1と同様の方法により、ガラス基板4の上面SF1上にトレンチラインTL(図4(A))が形成される。
本実施の形態のガラス基板4の分断方法においても、まず上記実施の形態1と同様の方法により、ガラス基板4の上面SF1上にトレンチラインTL(図4(A))が形成される。
50 カッティング器具
51 スクライビングホイール
52 ピン
53 ホルダ
AL アシストライン
AX 回転軸
CL クラックライン
DP 進行方向
DT 厚さ方向
F 荷重
Fi 面内成分
Fp 垂直成分
MS 鏡面
N1 始点
N2 中点
N3 終点
PF 外周部
SF1 上面(第1の面)
SF2 下面(第2の面)
TL トレンチライン
Claims (7)
- 刃先が設けられた外周部を回転軸周りに有するスクライビングホイールを用いた脆性基板の分断方法であって、
第1の面と前記第1の面と反対の第2の面とを有し、前記第1の面に垂直な厚さ方向を有する脆性基板を準備する工程と、
前記スクライビングホイールに荷重を加えることによって前記スクライビングホイールの前記外周部を前記脆性基板の第1の面上へ押し付けながら前記脆性基板の前記第1の面上で前記スクライビングホイールを転動させることによって前記脆性基板の前記第1の面上に塑性変形を発生させることで、溝形状を有するトレンチラインを形成する工程を備え、前記荷重は、前記脆性基板の前記第1の面に平行な面内成分を有し、前記トレンチラインを形成する工程において前記スクライビングホイールは前記第1の面上を前記面内成分の方向と同じ進行方向に向かって進行し、前記トレンチラインを形成する工程は、前記トレンチラインの直下において前記脆性基板が前記トレンチラインと交差する方向において連続的につながっている状態であるクラックレス状態が得られるように行なわれ、さらに
前記厚さ方向における前記脆性基板のクラックを前記トレンチラインに沿って前記進行方向に向かって伸展させることによって、クラックラインを形成する工程を備え、前記クラックラインによって前記トレンチラインの直下において前記脆性基板は前記トレンチラインと交差する方向において連続的なつながりが断たれており、さらに
前記クラックラインに沿って前記脆性基板を分断する工程を備える、脆性基板の分断方法。 - 前記クラックラインを形成する工程は、前記脆性基板の前記厚さ方向に浸透するクラックを伴い前記脆性基板の前記第1の面上において前記トレンチラインに接するアシストラインを形成する工程を含む、請求項1に記載の脆性基板の分断方法。
- 前記アシストラインを形成する工程において前記アシストラインは、前記脆性基板の前記第1の面上において前記トレンチラインと交差するように形成される、請求項2に記載の脆性基板の分断方法。
- 前記クラックラインを形成する工程は、前記アシストラインに沿って前記脆性基板を分離する工程を含む、請求項3に記載の脆性基板の分断方法。
- 前記アシストラインを形成する工程において前記アシストラインは、前記脆性基板の前記第1の面上において前記トレンチラインと部分的に重なるように形成される、請求項2に記載の脆性基板の分断方法。
- 前記脆性基板の前記第2の面上にアシストラインを形成する工程をさらに備え、前記アシストラインは平面レイアウトにおいて前記トレンチラインと交差しており、
前記クラックラインを形成する工程は、前記アシストラインに沿って前記脆性基板を分離する工程を含む、請求項1に記載の脆性基板の分断方法。 - 前記クラックラインを形成する工程は、前記トレンチラインの一部にレーザ光を照射する工程を含む、請求項1に記載の脆性基板の分断方法。
Priority Applications (3)
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CN201580058145.XA CN107108322B (zh) | 2014-10-29 | 2015-08-26 | 脆性衬底的分断方法 |
KR1020177011745A KR101866824B1 (ko) | 2014-10-29 | 2015-08-26 | 취성 기판의 분단 방법 |
JP2016556408A JP6288293B2 (ja) | 2014-10-29 | 2015-08-26 | 脆性基板の分断方法 |
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JP2014219929 | 2014-10-29 |
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KR (1) | KR101866824B1 (ja) |
CN (1) | CN107108322B (ja) |
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- 2015-08-26 WO PCT/JP2015/073989 patent/WO2016067728A1/ja active Application Filing
- 2015-08-26 CN CN201580058145.XA patent/CN107108322B/zh not_active Expired - Fee Related
- 2015-08-26 KR KR1020177011745A patent/KR101866824B1/ko active IP Right Grant
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TWI656102B (zh) | 2019-04-11 |
TW201615579A (zh) | 2016-05-01 |
CN107108322B (zh) | 2020-01-14 |
JP6288293B2 (ja) | 2018-03-07 |
CN107108322A (zh) | 2017-08-29 |
KR101866824B1 (ko) | 2018-07-17 |
KR20170067805A (ko) | 2017-06-16 |
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