WO2015194170A1 - 多結晶シリコン棒の表面温度の算出方法および制御方法、多結晶シリコン棒の製造方法、多結晶シリコン棒、ならびに、多結晶シリコン塊 - Google Patents
多結晶シリコン棒の表面温度の算出方法および制御方法、多結晶シリコン棒の製造方法、多結晶シリコン棒、ならびに、多結晶シリコン塊 Download PDFInfo
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- C01B33/00—Silicon; Compounds thereof
- C01B33/02—Silicon
- C01B33/021—Preparation
- C01B33/027—Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material
- C01B33/035—Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material by decomposition or reduction of gaseous or vaporised silicon compounds in the presence of heated filaments of silicon, carbon or a refractory metal, e.g. tantalum or tungsten, or in the presence of heated silicon rods on which the formed silicon is deposited, a silicon rod being obtained, e.g. Siemens process
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/30—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of the effect of a material on X-radiation, gamma radiation or particle radiation
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- G—PHYSICS
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- the present invention relates to a technique for calculating or controlling a surface temperature in a deposition process when producing a polycrystalline silicon rod by the Siemens method.
- a high purity and high quality silicon substrate is a semiconductor material that is essential for the production of today's semiconductor devices and the like.
- Such silicon substrates are manufactured by the CZ method or FZ method using polycrystalline silicon as a raw material, and semiconductor grade polycrystalline silicon is often manufactured by the Siemens method (see, for example, Patent Document 1 532786)).
- Siemens method a polycrystalline silicon is vapor phase grown (deposited) on the surface of the silicon core wire by the CVD (Chemical Vapor Deposition) method by bringing a silane source gas such as trichlorosilane or monosilane into contact with the heated silicon core wire. ).
- reaction temperature in the bell jar is approximately 900 ° C. to 1200 ° C. in order to increase the gas concentration of trichlorosilane as much as possible to increase the productivity of polycrystalline silicon and to increase the deposition rate of polycrystalline silicon. It is controlled to the range.
- Patent Document 2 Japanese Patent Application Laid-Open No. 2001-146499 discloses one method of measuring the surface temperature of a polycrystalline silicon rod in a process of producing polycrystalline silicon by the Siemens method. The method disclosed in this document determines (i) the resistivity of the silicon rod from the diameter of the silicon rod installed in the reactor and the voltage and current applied to the silicon rod, and (ii) the resistivity To determine the temperature of the silicon rod using (iii) this temperature to determine the vapor deposition rate at a specific point in time, and (iv) determining the diameter of the silicon rod after a predetermined time has elapsed from this vapor deposition rate. And (v) repeat these procedures to determine and manage the diameter and temperature of the silicon rod at predetermined time intervals.
- the resistivity ( ⁇ ) of a silicon rod having a total length L and a diameter D is obtained from the value of the voltage (E) applied to the silicon rod and the current (I) flowing to the silicon rod Specifically, the resistivity ( ⁇ ) is determined by the following equation (1).
- the temperature (T) of the silicon rod is obtained from the resistivity ( ⁇ ) by the following equation (2).
- a, b and c are constants, and it is assumed that known ones are used or those obtained by experiments in advance are used.
- this method has at least the following drawbacks from the viewpoint of measuring the surface temperature of the polycrystalline silicon rod with high accuracy during the process of manufacturing polycrystalline silicon by the Siemens method.
- the diameter D of the polycrystalline silicon rod is based on the assumption that the temperature (T) of the polycrystalline silicon rod is determined, the difference from the actual diameter D remains unchanged. It is an error of the temperature T of the rod.
- the cross section of the polycrystalline silicon rod in the CVD process is not completely circular but slightly elliptical, and the ellipticity thereof depends on the height of the polycrystalline silicon rod, which is disclosed in reference 2
- the temperature dependence of the specific region can not be measured (estimated) because the region dependence of the diameter D of the polycrystalline silicon rod is not considered.
- the diameter D of the silicon rod naturally increases as the deposition of polycrystalline silicon progresses, the larger the diameter, the easier the current I flowing in the silicon rod flows to the central region of the silicon rod. This is because the surface side of the silicon rod is cooled by the gas flow and there is a non-negligible temperature drop, but the larger the diameter of the silicon rod, the more uneven the temperature distribution inside the silicon rod Is remarkable, and it draws an attenuation curve according to the distance from the center, and the central symmetry is low.
- the current I flowing through the polycrystalline silicon rod is not uniform in the silicon rod, but flows more in the central region and less in the region near the surface, and such nonuniformity is referred to Not only the method disclosed in the document 2 but also the conventional method does not consider it at all, and as a result, a large error occurs in the temperature T of the silicon rod.
- the degree of the error of the surface temperature T of such polycrystalline silicon rod depends on the degree of the error from the true value of the diameter D of the assumed silicon rod, and therefore the error of the assumed diameter D of the silicon rod is large.
- the error of the temperature T also increases, and if the true temperature of the silicon rod becomes too high, it locally or partially reaches the melting point 1420 ° C. of the silicon, causing a crack, or the trueness of the silicon rod If the temperature is too low, there is a problem that the deposition rate is significantly reduced to lower the productivity.
- the temperature difference in the state where trichlorosilane is supplied is about several hundred degrees C. to 150 degrees C.
- the surface temperature drops rapidly. This temperature drop depends on the concentration and absolute amount of trichlorosilane gas supplied, and as the concentration and amount of trichlorosilane increase, the surface temperature of the polycrystalline silicon rod by the radiation thermometer becomes significantly lower. become.
- thermometer Furthermore, there is a fatal disadvantage that the measurement by the radiation thermometer is limited to the outermost rod in the reactor in order to be made through a "window" which is processed and attached to the reactor.
- the conventional method is insufficient from the viewpoint of accurately measuring the surface temperature of the polycrystalline silicon rod in the process of manufacturing polycrystalline silicon by the Siemens method.
- polycrystalline silicon When polycrystalline silicon is used as a raw material for single crystal silicon production by the CZ method, it has an appropriate degree of ease of cracking so that it can be easily crushed into nuggets (polycrystalline silicon lumps). Preferred.
- the present invention has been made in view of such problems, and the object of the present invention is to precisely measure the surface temperature of the polycrystalline silicon rod during the precipitation process in manufacturing the polycrystalline silicon rod by the Siemens method. It is an object of the present invention to provide a technology for manufacturing polycrystalline silicon rods based on a new method for managing.
- the method of calculating the surface temperature of a polycrystalline silicon rod is a method of calculating the surface temperature during the precipitation process of a polycrystalline silicon rod grown by the Siemens method, Collecting a plate-like sample whose main surface is a cross section perpendicular to the radial direction of the polycrystalline silicon rod from a position corresponding to a radius R from a center line of a silicon core wire for depositing a crystalline silicon rod; So that the Bragg reflection from the Miller index surface (h 1 , k 1 , l 1 ) is detected, and the X-ray irradiation area defined by the slit ⁇ scan on the main surface of the plate-like sample In-plane rotation at a rotation angle ⁇ with the center of the plate sample as a rotation center, and the angle of rotation ( ⁇ ) of the plate sample on the Bragg reflection intensity from the mirror index surface (h 1 , k 1 , l 1 ) Show sex Determining a first
- the surface temperature is calculated based on a conversion table of average diffraction intensity ratio (y) and surface temperature, which has been obtained in advance.
- x is the estimated temperature based on the resistivity of the polycrystalline silicon rod calculated from the diameter of the polycrystalline silicon rod, the current supplied to the polycrystalline silicon rod, and the applied voltage. Based on a conversion equation obtained by regression expression of the relationship between the estimated temperature x and the average diffraction intensity ratio y.
- the Miller index surface (h 1 , k 1 , l 1 ) and the Miller index surface (h 2 , k 2 , l 2 ) are (111) and (220).
- the method of controlling the surface temperature of a polycrystalline silicon rod according to the present invention is a method of controlling the temperature at the time of producing a polycrystalline silicon rod by the Siemens method, and the surface temperature of the polycrystalline silicon rod calculated by the above method
- the surface temperature during the deposition process is controlled by controlling the supplied current and applied voltage at the time of newly producing the polycrystalline silicon rod based on the data of the supplied current and applied voltage at the time of deposition of the polycrystalline silicon rod.
- ⁇ T during the precipitation process is consistently controlled to 70 ° C. or less.
- the grown ⁇ T may be controlled to 160 ° C. or higher to obtain a polycrystalline silicon rod grown.
- the polycrystalline silicon rod described above may be crushed to obtain a polycrystalline silicon mass.
- the grown ⁇ T may be controlled to be less than 160 ° C. to obtain a polycrystalline silicon rod grown.
- the present invention provides a new method for controlling the surface temperature of a polycrystalline silicon rod with high accuracy during the deposition process when producing a polycrystalline silicon rod by the Siemens method, and based on this, Techniques are provided for making polycrystalline silicon rods.
- the plate-like sample generally taken from the position of R 0/2 of the polycrystalline silicon rod obtained by scanning phi, a diffraction chart from Miller index face (111) and the mirror index plane (220).
- the inventors of the present invention have various objectives in order to develop a new method for controlling the surface temperature of a polycrystalline silicon rod with high accuracy during the deposition process when producing a polycrystalline silicon rod by the Siemens method.
- the crystallinity of polycrystalline silicon synthesized at the CVD temperature was evaluated by X-ray diffraction.
- FIGS. 1A and 1B are diagrams for explaining a collection example of a plate-like sample 20 for X-ray diffraction profile measurement from a polycrystalline silicon rod 10 deposited and grown by the Siemens method.
- reference numeral 1 denotes a silicon core wire for depositing polycrystalline silicon on the surface to form a silicon rod.
- three sites CTR: site near silicon core wire 1, EDG: site near side face of polycrystalline silicon rod 10) to confirm radial direction dependency of surface temperature at deposition of polycrystalline silicon rod , R 0/2: While the CTR and the intermediate portions of the EGD) is taken plate sample 20, is not limited to harvested from such sites.
- the diameter of the polycrystalline silicon rod 10 illustrated in FIG. 1A is approximately 120 mm (radius R 0 6060 mm), and from the side of the polycrystalline silicon rod 10, the rod 11 having a diameter of approximately 19 mm and a length of approximately 60 mm. , And cut out perpendicularly to the longitudinal direction of the silicon core wire 1.
- a portion (CTR) close to the silicon core wire 1 of this rod 11 a portion close to the side surface of polycrystalline silicon rod 10 (EDG), and a portion (R / 2) between CTR and EGD
- CTR silicon core wire 1 of this rod 11
- EDG polycrystalline silicon rod 10
- R / 2 a portion between CTR and EGD
- a plate-like sample (20 CTR , 20 EDG , 20 R / 2 ) having a thickness of about 2 mm, whose main surface is a cross section perpendicular to the radial direction of the polycrystalline silicon rod 10 is collected.
- the portion, length, and number of the rod 11 to be collected may be appropriately determined in accordance with the diameter of the silicon rod 10 and the diameter of the hollow rod 11.
- the disc-shaped sample 20 is also cut from any portion of the hollow rod 11 although it may be collected, it is preferable that the position of the entire silicon rod 10 (that is, the surface temperature at the time of deposition) can be reasonably estimated.
- the acquisition positions of two samples to be compared are located at a position closer to the center than a point that is 1/3 of the radius from the center and outside the point that is 2/3 of the radius from the center In the case of position, more accurate comparison can be performed.
- the plate-like sample to compare should just be 2 or more sheets, and there is no upper limit in particular.
- the diameter of the plate-like sample 20 is set to about 19 mm only, and the diameter may be appropriately determined in the range where there is no problem in X-ray diffraction measurement.
- the crystallinity (that is, the surface temperature at the time of precipitation) of the plate-like sample 20 collected from the position corresponding to the radius R from the center line of the silicon core wire 1 on which the polycrystalline silicon rod 10 is deposited First, the plate-like sample 20 is placed at a position where Bragg reflection from the first mirror index surface (h 1 , k 1 , l 1 ) is detected, and the X-ray irradiation area defined by the slit is evaluated.
- FIG. 2 is a view for explaining an outline of an example of a measurement system when the X-ray diffraction profile from the plate-like sample 20 is determined by the ⁇ scan method, and in the example shown in this figure, it is emitted from the slit 30 and collimated
- a first diffraction chart showing the rotational angle ( ⁇ ) dependency of the plate-like sample 20 of the Bragg reflection intensity from h 1 , k 1 , l 1 ) is determined.
- the plate-like sample 20 is placed at the position where the Bragg reflection from the second mirror index surface (h 2 , k 2 , l 2 ) is detected by the same procedure as described above, and X determined by the slit line irradiation area rotates in the plane of the center of the plate-like sample 20 at a rotation angle ⁇ as the center of rotation to scan ⁇ on the main surface of the plate-like sample 20, the Miller index face (h 2, k 2, l 2)
- the second diffraction chart showing the rotational angle ( ⁇ ) dependency of the plate-like sample 20 of the Bragg reflection intensity from the above is determined.
- FIG. 3 is an example of a chart obtained by performing the ⁇ scan measurement on Miller index planes (111) and (220).
- the average diffraction intensity ratio (y (h 1 , k 1 , l 1 ) / (h 2 , k 2 , l 2 ) for the rotation angle ( ⁇ ) ) Is calculated, and the surface temperature at the time of deposition of polycrystalline silicon at a position corresponding to the radius R of the polycrystalline silicon rod 10 is calculated based on this average diffraction intensity ratio.
- FIG. 4 is a flowchart for explaining an outline of a method of calculating the surface temperature of a polycrystalline silicon rod according to the present invention.
- a plate-like sample having a main surface, which has a cross section perpendicular to the radial direction of the polycrystalline silicon rod is collected according to the above procedure (S101)
- the Bragg reflection intensity from the mirror index surface (h 1 , k 1 , l 1 ) of the plate-like sample is determined, and a first diffraction chart showing the rotational angle ( ⁇ ) dependency is determined (S 102).
- the Bragg reflection intensity from the mirror index surface (h 2 , k 2 , l 2 ) of the sample is determined, and a second diffraction chart showing the rotational angle ( ⁇ ) dependency is determined (S103).
- the average diffraction intensity ratio (y (h 1 , k 1 , l 1 ) / (h 2 , k 2 , l 2 ) for the rotation angle ( ⁇ ) ) Is calculated (S104), and the surface temperature at the time of deposition of polycrystalline silicon at a position corresponding to the radius R of the polycrystalline silicon rod is calculated based on the average diffraction intensity ratio (S105).
- the method of calculating the surface temperature of the polycrystalline silicon rod according to the present invention is a method of calculating the surface temperature during the deposition process of the polycrystalline silicon rod grown by the Siemens method, and Collecting a plate-shaped sample whose main surface is a cross section perpendicular to the radial direction of the polycrystalline silicon rod from a position corresponding to a radius R from the center line of the silicon core wire to be deposited;
- the plate-shaped sample is disposed at a position where Bragg reflection from (h 1 , k 1 , l 1 ) is detected, and the X-ray irradiation region defined by the slit ⁇ scans on the main surface of the plate-shaped sample In-plane rotation at a rotation angle ⁇ with the center of rotation as the rotation center, and the rotation angle ( ⁇ ) dependency of the plate-like sample of the Bragg reflection intensity from the mirror index surface (h 1 , k 1 , l 1 ) is shown 1 diffraction char And determining bets,
- the calculation of the surface temperature in step S105 is performed based on, for example, a conversion table of the average diffraction intensity ratio (y) and the surface temperature, which is obtained in advance.
- Such a conversion table is, for example, when the estimated temperature based on the resistivity of the polycrystalline silicon rod calculated from the diameter of the polycrystalline silicon rod, the current supplied to the polycrystalline silicon rod and the applied voltage is x, The relationship between the estimated temperature x and the average diffraction intensity ratio y is obtained based on a conversion equation obtained by regression.
- the Miller index surface (h 1 , k 1 , l 1 ) and the Miller index surface (h 2 , k 2 , l 2 ) are preferably (111) and (220).
- FIG. 5 shows the first diffraction chart from the Miller index surface (h 1 , k 1 , l 1 ) and the mirror index surface (h 2 , k 2 ,
- polycrystalline silicon rods with a diameter of about 160 mm R 0 80 80 mm
- this polycrystalline silicon rod is grown so as to make the surface temperature during deposition constant by the current value control method which is a conventional method, the ratio (111) / (220) (that is, the crystallinity) It turns out that it differs depending on the site. This means that the surface temperature of the polycrystalline silicon rod differs depending on the site. And, while the lower the surface temperature at the time of precipitation, the (111) diffraction becomes dominant, and the higher the surface temperature at the time of precipitation becomes the diffraction of (220).
- the present inventors conducted the following experiment.
- the estimated temperature x is the actual surface, where x is the estimated temperature based on the diameter of the polycrystalline silicon rod, the current supplied to the polycrystalline silicon rod, and the resistivity of the polycrystalline silicon rod calculated from the applied voltage. It is close to the temperature. That is, if the relationship between the estimated temperature x and the ratio (111) / (220) in the state where the diameter of the polycrystalline silicon rod is thin is known, (111) / ( The surface temperature in the said state can be calculated from the ratio of 220).
- FIG. 6 is a diagram showing the relationship between the estimated temperature x and the ratio of (111) / (220) in a polycrystalline silicon rod diameter range of 10 to 30 mm.
- the equation shown in the figure is a conversion equation obtained by regression expression of the relationship between the estimated temperature x and the average diffraction intensity ratio y.
- the results shown in this figure indicate that during the precipitation process of polycrystalline silicon rods grown by the Siemens method, if the relationship between the average diffraction intensity ratio (y) and the surface temperature (referred to as a “conversion table” for convenience) is obtained in advance. It shows that it is possible to calculate the surface temperature of Such a conversion table, for example, when the estimated temperature based on the resistivity of the polycrystalline silicon rod calculated from the diameter of the polycrystalline silicon rod, the current supplied to the polycrystalline silicon rod and the applied voltage is x, The relationship between the estimated temperature x and the average diffraction intensity ratio y can be based on a conversion equation obtained by regression expression.
- the surface temperature of the polycrystalline silicon rod calculated by the above-mentioned method and the supplied current and applied voltage at the time of deposition of the polycrystalline silicon rod Based on the data, it is possible to control the surface temperature during the deposition process by controlling the supplied current and applied voltage when newly producing polycrystalline silicon rods.
- ⁇ T during the precipitation process For example, consistently controlling ⁇ T during the precipitation process to 70 ° C. or less, or controlling ⁇ T to less than 160 ° C. (eg, eliminating the difference ⁇ T between the center temperature and the surface temperature), or vice versa It is also possible to grow polycrystalline silicon rods by controlling .DELTA.T to 160.degree. C. or more.
- polycrystalline silicon when the application of polycrystalline silicon is a raw material for producing single crystal silicon by the CZ method, it is suitable so that it can be easily crushed into nuggets (polycrystalline silicon lumps). Since it is preferable to have friability, a polycrystalline silicon block obtained by crushing a polycrystalline silicon rod grown with ⁇ T controlled to 160 ° C. or higher is suitable for this application.
- polycrystalline silicon rods grown with ⁇ T controlled to less than 160 ° C. are suitable for this application, since low residual stress is preferred.
- the stress remaining when the CVD process is completed and cooled to room temperature is only a compressive stress, and a tensile stress is generated. I did not.
- the measurement of the residual stress in this experiment employed a method of accurately measuring the surface separation value d by the X-ray diffraction method. As the measurement direction, three directions of a growth direction rr, a ⁇ direction perpendicular to the rr direction, and a vertical direction zz were measured.
- Example 1 Surface temperature at precipitation and average diffraction intensity ratio
- a disk-shaped sample (diameter 19 mm, thickness 2 mm) used for calculation of surface temperature was sampled according to the method described in JP-A-2014-1096 (Patent Document 3).
- the diameter of the polycrystalline silicon rod obtained by depositing on the inverted U-shaped silicon core wire is 160 mm, and the height from the lower end to the upper end (near the bridge) is about 1,800 mm.
- the silicon core wire was disposed in a multi-ring type at the central portion of the furnace and in the periphery thereof, and polycrystalline silicon was deposited on these silicon core wires.
- a cylindrical core with a diameter of 19 mm centered on the perpendicular direction (growth direction) is hollowed out from each of the vicinity of the bridge of the three polycrystalline silicon rods thus obtained and 300 mm from the lower end, 8 to 12 mm
- the above disk-like samples were obtained at regular intervals of
- a polishing agent Carbon random # 300
- the electronic structure of Si is 1s 2 2s 2 2p 6 3s 2 3p 2 and there are a total of four valence electrons, ie, two outermost electrons in the 3s orbital and two in the 3p orbital. Therefore, for example, when two molecules of Si are formed by the CVD reaction, a total of eight electrons of four electrons in the outermost shell of one molecule and four electrons in the outermost shell of the other molecule are closed shells. Stabilize by taking structure.
- an electron orbit in which s orbital and p orbital are mixed forms four equivalent orbits which make the apex of a regular tetrahedron mutually angle of 109.5 °.
- the four vertices of these trajectories correspond to vertices of a regular tetrahedron, each face corresponding to ⁇ 111 ⁇ .
- the ⁇ 111 ⁇ plane of the face-centered cubic lattice is the closest surface with the largest number of atoms per unit area, and because it is the most stable crystal plane, it becomes dominant at the beginning of crystal growth, and in trichlorosilane CVD reactions Crystal growth of ⁇ 111 ⁇ plane is confirmed even at a considerably low temperature of about 600 to 700 ° C.
- ⁇ scan X-ray diffraction charts from Miller index planes (111) and (220) are obtained, and the average value of diffraction intensity is determined for each sample, and the average value is estimated temperature x shown in FIG.
- the surface temperature at the time of deposition is calculated in light of the relationship of the ratio of (111) / (220).
- the surface temperature of the portion near the bridge is higher than the surface temperature of the portion 300 mm from the lower end.
- the surface temperature difference is smaller at the center of the furnace.
- the temperature difference ⁇ T in the growth direction is lower near the bridge than at a position 300 mm from the lower end.
- the surface temperature at deposition is relatively low at the central portion (portion near the silicon core wire) and relatively high closer to the outermost surface side, and the difference ⁇ T reaches 164 ° C.
- the polycrystalline silicon rod grown under such conditions is easily cracked, and according to residual stress measurement, compressive stress and tensile stress are mixed in all parts of the polycrystalline silicon rod.
- Temperature control was performed to reduce the surface temperature difference ⁇ T, and polycrystalline silicon rods were grown with the other conditions unchanged. Specifically, current was supplied so that the surface temperature was 1180 ° C. during deposition near the silicon core wire, and the supply current was controlled so that the surface temperature was in the target temperature range of 1150 to 1180 ° C. in all steps of deposition. .
- a polycrystalline silicon rod for obtaining a polycrystalline silicon block (nugget) for growing a silicon single crystal by the CZ method it is desirable that the rod is easily broken.
- such polycrystalline silicon rods have the disadvantage that they are easily collapsed in the reactor during the cooling process after the completion of the deposition process. Therefore, the tensile stress remaining in the polycrystalline silicon rod has an appropriate upper limit.
- the surface temperature of the central portion (portion near the silicon core) during deposition and the surface temperature of the outermost surface during deposition during the deposition step The difference ⁇ T needs to be controlled to 200 ° C. or less.
- a polycrystalline silicon rod for obtaining polycrystalline silicon for growing a silicon single crystal by FZ method or polycrystalline silicon for recharging at the time of growing a silicon single crystal by CZ method is preferably not easily crushed, and the above ⁇ T The smaller the better.
- the control of ⁇ T can also be performed with high accuracy. It is possible to do.
- a polycrystalline silicon rod for obtaining a polycrystalline silicon block (nugget) for growing a silicon single crystal by CZ method by controlling a residual stress value to manufacture a polycrystalline silicon rod, and a silicon single crystal growth by FZ method It is also possible to separately produce polycrystalline silicon rods for obtaining polycrystalline silicon for use or polycrystalline silicon for recharging at the time of growing a silicon single crystal by the CZ method.
- the above ⁇ T is controlled to be 160 ° C. or higher.
- the above ⁇ T is less than 160 ° C. Control and foster.
- the above ⁇ T is controlled to 70 ° C. or less consistently.
- Example 2 Control of surface temperature during deposition process
- a polycrystalline silicon rod 160 mm in diameter was newly grown while controlling the current and applied voltage to control the surface temperature during the deposition process.
- the residual stress in the polycrystalline silicon rod was only compressive stress in any of the three directions described above.
- a silicon single crystal was grown by the FZ method using polycrystalline silicon rods grown under the same conditions as a raw material, problems such as collapse and drop did not occur.
- Example 3 (Surface temperature difference ⁇ T and residual stress during precipitation process) The relationship between the surface temperature difference ⁇ T (° C.) and the residual stress during the precipitation process was determined. The results are summarized in Table 2.
- the present invention relates to a technology for manufacturing polycrystalline silicon rods based on a new method for controlling the surface temperature of polycrystalline silicon rods with high accuracy during the deposition process when manufacturing polycrystalline silicon rods by the Siemens method. provide.
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Abstract
Description
式(2):T=a×ln(ρ/b)-c
表面温度の算出に用いる円板状試料(直径19mm、厚み2mm)を、特開2014-1096号公報(特許文献3)に記載の方法に従いサンプリングした。逆U字状に組んだシリコン芯線上に析出させて得た多結晶シリコン棒の直径は160mmであり、下端部から上端部(ブリッジ近傍)までの高さは約1,800mmである。また、上記シリコン芯線は、炉内中央部およびその周辺に多環式ロッド配置し、これらのシリコン芯線上に多結晶シリコンを析出させた。
図5に示した結果に基づき算出された多結晶シリコン棒の表面温度と該多結晶シリコン棒の析出時の供給電流と印加電圧のデータに基づき、多結晶シリコン棒を新たに製造する際の供給電流と印加電圧を制御して析出プロセス中の表面温度を制御しながら、新たに、直径160mmの多結晶シリコン棒を育成した。
析出プロセス中の表面温度差ΔT(℃)と残留応力の関係を求めた。その結果を表2に纏めた。
10 多結晶シリコン棒
11 ロッド
20 板状試料
30 スリット
40 X線ビーム
Claims (10)
- シーメンス法により育成される多結晶シリコン棒の析出プロセス中の表面温度の算出方法であって、
前記多結晶シリコン棒を析出させるシリコン芯線の中心線から半径Rに対応する位置から、前記多結晶シリコン棒の径方向に垂直な断面を主面とする板状試料を採取するステップと、
前記板状試料をミラー指数面(h1,k1,l1)からのブラッグ反射が検出される位置に配置し、スリットにより定められるX線照射領域が前記板状試料の主面上をφスキャンするように該板状試料の中心を回転中心として回転角度φで面内回転させ、前記ミラー指数面(h1,k1,l1)からのブラッグ反射強度の前記板状試料の回転角度(φ)依存性を示す第1の回折チャートを求めるステップと、
前記板状試料をミラー指数面(h2,k2,l2)からのブラッグ反射が検出される位置に配置し、スリットにより定められるX線照射領域が前記板状試料の主面上をφスキャンするように該板状試料の中心を回転中心として回転角度φで面内回転させ、前記ミラー指数面(h2,k2,l2)からのブラッグ反射強度の前記板状試料の回転角度(φ)依存性を示す第2の回折チャートを求めるステップと、
前記第1の回折チャートと前記第2の回折チャートから、前記回転角度(φ)についての平均回折強度比(y=(h1,k1,l1)/(h2,k2,l2))を求めるステップと、
前記平均回折強度比に基づいて、前記多結晶シリコン棒の半径Rに対応する位置の多結晶シリコンの析出時の表面温度を算出するステップと、を備えていることを特徴とする多結晶シリコン棒の表面温度の算出方法。 - 前記表面温度の算出は、予め求めておいた、平均回折強度比(y)と表面温度の換算表に基づいてなされる、請求項1に記載の多結晶シリコン棒の表面温度の算出方法。
- 前記換算表は、多結晶シリコン棒の径、該多結晶シリコン棒への供給電流と印加電圧から算出した前記多結晶シリコン棒の抵抗率に基づく推定温度をxとしたときに、該推定温度xと前記平均回折強度比yの関係を回帰式化して得られる換算式に基づく、請求項1または2に記載の多結晶シリコン棒の表面温度の算出方法。
- 前記ミラー指数面(h1,k1,l1)および前記ミラー指数面(h2,k2,l2)は(111)および(220)である、請求項1または2に記載の多結晶シリコン棒の表面温度の算出方法。
- シーメンス法により多結晶シリコン棒を製造する際の温度制御方法であって、
請求項1~4の何れか1項に記載の方法で算出された多結晶シリコン棒の表面温度と該多結晶シリコン棒の析出時の供給電流と印加電圧のデータに基づき、
多結晶シリコン棒を新たに製造する際の供給電流と印加電圧を制御して、析出プロセス中の表面温度を制御する、多結晶シリコン棒の表面温度の制御方法。 - 請求項5に記載の温度制御方法を用い、析出プロセス中における多結晶シリコン棒の中心温度Tcと表面温度Tsの差ΔT(=Tc-Ts)を制御して、前記多結晶シリコン棒中の残留応力値を制御する、多結晶シリコン棒の製造方法。
- 前記析出プロセス中におけるΔTを、一貫して70℃以下に制御する、請求項6に記載の多結晶シリコン棒の製造方法。
- 請求項6に記載の多結晶シリコン棒の製造方法において、前記ΔTを160℃以上に制御して育成された、多結晶シリコン棒。
- 請求項8に記載の多結晶シリコン棒を破砕して得られた多結晶シリコン塊。
- 請求項6に記載の多結晶シリコン棒の製造方法において、前記ΔTを160℃未満に制御して育成された、多結晶シリコン棒。
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Citations (2)
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JP2013217653A (ja) * | 2012-04-04 | 2013-10-24 | Shin Etsu Chem Co Ltd | 多結晶シリコンの結晶配向度評価方法、多結晶シリコン棒の選択方法、および単結晶シリコンの製造方法 |
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US20020187096A1 (en) | 2001-06-08 | 2002-12-12 | Kendig James Edward | Process for preparation of polycrystalline silicon |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011037699A (ja) * | 2009-07-15 | 2011-02-24 | Mitsubishi Materials Corp | 多結晶シリコンの製造方法、製造装置及び多結晶シリコン |
JP2013217653A (ja) * | 2012-04-04 | 2013-10-24 | Shin Etsu Chem Co Ltd | 多結晶シリコンの結晶配向度評価方法、多結晶シリコン棒の選択方法、および単結晶シリコンの製造方法 |
Non-Patent Citations (1)
Title |
---|
AKIRA KAWABATA: "Si technology and electronic materials", JOURNAL OF THE SOCIETY OF MATERIALS SCIENCE , JAPAN, vol. 35, no. 391, 15 April 1986 (1986-04-15), pages 329 - 336 * |
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CN111206279B (zh) * | 2020-02-26 | 2023-09-22 | 江苏鑫华半导体科技股份有限公司 | 制备低内应力区熔用电子级多晶硅的系统和方法 |
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