WO2015095101A1 - Methods for determining a shape of a substantially cylindrical specular reflective surface - Google Patents

Methods for determining a shape of a substantially cylindrical specular reflective surface Download PDF

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Publication number
WO2015095101A1
WO2015095101A1 PCT/US2014/070450 US2014070450W WO2015095101A1 WO 2015095101 A1 WO2015095101 A1 WO 2015095101A1 US 2014070450 W US2014070450 W US 2014070450W WO 2015095101 A1 WO2015095101 A1 WO 2015095101A1
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WO
WIPO (PCT)
Prior art keywords
data
reflective surface
target structure
specular reflective
shape
Prior art date
Application number
PCT/US2014/070450
Other languages
English (en)
French (fr)
Inventor
Sergey Y POTAPENKO
Original Assignee
Corning Incorporated
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Incorporated filed Critical Corning Incorporated
Priority to KR1020167019371A priority Critical patent/KR102233060B1/ko
Priority to JP2016541522A priority patent/JP6670241B2/ja
Priority to CN201480075763.0A priority patent/CN106029585B/zh
Publication of WO2015095101A1 publication Critical patent/WO2015095101A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B17/00Forming molten glass by flowing-out, pushing-out, extruding or drawing downwardly or laterally from forming slits or by overflowing over lips
    • C03B17/06Forming glass sheets
    • C03B17/064Forming glass sheets by the overflow downdraw fusion process; Isopipes therefor
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00Technologies relating to the processing of minerals
    • Y02P40/50Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57Improving the yield, e-g- reduction of reject rates

Definitions

  • the present invention relates generally to methods for determining a shape, and more particularly, to methods for determining a shape of a substantially cylindrical specular reflective surface.
  • Glass manufacturing apparatus are commonly used to form glass ribbon that may be separated into glass sheets. In some applications, there may be a desire to determine a shape associated with a glass ribbon, a glass sheet, or other glass element.
  • a method for determining a shape of a substantially cylindrical specular reflective surface comprising the step (I) of obtaining calibration data and the step (II) of obtaining target data about a target structure, wherein the target structure comprises a spatial frequency pattern.
  • the method further includes the step (III) of capturing a reflected image of the target structure in the specular reflective surface and the step (IV) of obtaining reflected data from the reflected image.
  • the method further includes the step (V) of determining a correspondence between the target data and the reflected data and the step (VI) of using the correspondence and the calibration data to determine the shape of the specular reflective surface.
  • step (V) comprises Fast Fourier Transform.
  • the spatial frequency pattern comprises a function of a spatial location.
  • the specular reflective surface extends substantially along a plane and the target structure is substantially perpendicular to the plane.
  • the spatial frequency pattern comprises a periodical pattern in a direction substantially parallel to a generatrix of the specular reflective surface.
  • the spatial frequency pattern comprises a frequency that changes monotonically in a direction substantially perpendicular to the generatrix of the specular reflective surface.
  • the specular reflective surface comprises a major surface of a sheet of material.
  • the shape approximates a cross-profile of the specular reflective surface.
  • the method further comprises the step of determining a plurality of shapes of the specular reflective surface, wherein each shape approximates a cross-profile of the specular reflective surface.
  • the method further comprises the step of approximating a surface profile of the specular reflective surface based on the plurality of shapes.
  • the first aspect may be provided alone or in combination with one or any combination of the examples of the first aspect discussed above.
  • a method of determining a shape of a glass ribbon drawn from a quantity of molten glass comprises the step (I) of obtaining calibration data and the step (II) of obtaining target data about a target structure, wherein the target structure comprises a spatial frequency pattern.
  • the method further includes the step (III) of capturing a reflected image of the target structure in the glass ribbon and the step (IV) of obtaining reflected data from the reflected image.
  • the method further includes the step (V) of determining a correspondence between the target data and the reflected data and the step (VI) of using the correspondence and the calibration data to determine the shape of the glass ribbon.
  • step (V) comprises Fast Fourier Transform.
  • the glass ribbon extends substantially along a plane and the target structure is substantially perpendicular to the plane.
  • the spatial frequency pattern comprises a periodical pattern in a direction substantially parallel to a generatrix of the specular reflective surface.
  • the spatial frequency pattern comprises a frequency that changes monotonically in a direction substantially perpendicular to the generatrix of the specular reflective surface.
  • the glass ribbon is continuously moving in a draw direction.
  • the shape is used to control upstream parameters of a glass forming process
  • the shape is used to control parameters of a down-stream process
  • the shape is used to control upstream parameters of a glass forming process and parameters of a down-stream process.
  • the shape is used to determine an attribute of the glass ribbon, wherein a quality of the glass ribbon is categorized based on the attribute.
  • the second aspect may be provided alone or in combination with one or any combination of the examples of the second aspect discussed above.
  • FIG. 1 illustrates an example cylindrical surface
  • FIG. 2 illustrates another example cylindrical surface
  • FIG. 3 illustrates yet another example cylindrical surface
  • FIG. 4 illustrates a top view of an example configuration wherein the target structure is substantially perpendicular to the specular reflective surface
  • FIG. 5 illustrates a side view of the configuration of FIG. 4
  • FIG. 6 illustrates a perspective view of the configuration of FIG. 4;
  • FIG. 7 illustrates an example method including the steps of obtaining target data about a target structure, wherein the target structure comprises a spatial frequency pattern, capturing a reflected image of the target structure in the specular reflective surface, and obtaining reflected data from the reflected image;
  • FIG. 8 illustrates example shapes of a specular reflective surface that can be determined from the method
  • FIG. 9 illustrates other example shapes of a specular reflective surface that can be determined from the method
  • FIG. 10 illustrates an example flow chart of the method steps
  • FIG. 11 is a schematic view of an example apparatus for producing glass ribbon
  • FIG. 12 is an enlarged partial perspective cross-sectional view of the apparatus along line 2-2 of FIG. 14 illustrating an example method wherein the target structure is substantially perpendicular to the glass ribbon;
  • FIG. 13 illustrates an example method including the steps of obtaining target data about a target structure, wherein the target structure is encoded with a spatial frequency, capturing a reflected image of the target structure in the glass ribbon, and obtaining reflected data from the reflected image;
  • FIG. 14 illustrates an example method including one or more target structures.
  • FIG. 15 illustrates an example black and white spatial frequency pattern.
  • FIG. 16 illustrates an example gray scale spatial frequency pattern.
  • aspects of the disclosure include methods for determining a shape, and more particularly, methods for determining a shape of a substantially cylindrical specular reflective surface.
  • a specular reflective surface may exhibit characteristics wherein an incoming beam of light is reflected at the same angle with respect to the surface normal. For example, the angle of incidence equals the angle of reflection. Further, the incident beam, the reflected beam, and the surface normal can all lie within the same plane.
  • the principles of deflectometry, and more particularly reflectometry can be used to determine a shape of a specular reflective surface from distortion or a reflection of a specular reflective surface from specular reflection.
  • a distorted reflection of that structure in a specular reflective surface can be used to deduce the geometric properties of the specular reflective surface which produced the distorted reflection.
  • the reflection of the structure can be distorted for a variety of reasons, including due to curvature, defects, anomalies, or irregularities in the surface.
  • analyzing the reflection and, for example, determining a correspondence between a feature of the structure of known geometry and a corresponding reflection of the feature of the structure of known geometry in the specular reflective surface, one can back-calculate or recover a shape of the surface that follows from the correspondence. This shape can be used for any number of applications, controls, or calculations such as, for example, to simulate or approximate a three-dimensional profile of the actual specular reflective surface.
  • FIGS. 1-3 illustrate examples of a cylindrical surface.
  • FIG. 1 illustrates an example cylindrical surface 10a defined by a series of parallel lines 11 passing through a curve 12.
  • FIG. 2 illustrates another example cylindrical surface 10b which can be defined by moving a straight line known as a generatrix 13 along a curve or path known as a directrix 14.
  • FIG. 3 illustrates a cylindrical surface 10c which can be defined by projecting a beginning directrix 15a in a direction 16 such that the beginning directrix 15a is parallel to an ending directrix 15b.
  • the method provided herein can be used to determine a shape of a substantially cylindrical specular reflective surface.
  • the substantially cylindrical specular reflective surface can comprise a major surface of a ribbon of material or a sheet of material such as a sheet of material divided from a ribbon of material.
  • the substantially cylindrical specular reflective surface can comprise a major surface of a ribbon of glass or a sheet of glass, such as a sheet of glass divided from a ribbon of glass.
  • the substantially cylindrical specular reflective surface may comprise an outer peripheral surface of an optical fiber or other object.
  • an object comprises a substantially cylindrical specular reflective surface
  • the method can be used to determine the shape of the substantially cylindrical specular reflective surface as well as the shape of the object having the substantially cylindrical specular reflective surface.
  • a substantially cylindrical specular reflective surface it is to be understood that such surface could exist as an isolated surface or could exist as the surface of an object.
  • the method provided herein can, as noted, be used to determine a shape of such surface and/or a shape of an object having such surface.
  • the method includes the step of obtaining calibration data.
  • the calibration data can be obtained in a variety of manners, including directly or indirectly coding data into a computer, using a detection device to observe data, using a sensor to measure data, or capturing an image containing data from which the calibration data can be extracted.
  • Examples of calibration data include coordinates or other information representing a characteristic or characteristics of any of the systems, components, or structures used in or by the method.
  • calibration data can include a spatial location of components of the system, such as the spatial location of a camera, a lens, or a focal point, information about the specular reflective surface, the target structure and its associated features, or any other parameters, initial conditions, or data associated therewith.
  • the calibration data can include reference points or coordinates which can be used to determine and define spatial locations or relationships between various system components, structures, and variables.
  • the calibration data can, for instance, be transformed, via a transformation matrix or other mathematical calculation, from three-dimensional coordinates in real space into two-dimensional coordinates.
  • calibration data can be manipulated, combined, analyzed, or processed for further analysis, manipulation and/or calculations to be performed thereon.
  • the method further includes the step of obtaining target data about a target structure, wherein the target structure comprises a spatial frequency pattern.
  • the target data can be obtained in a variety of manners, including directly or indirectly coding data into a computer, using a detection device to observe data, using a sensor to measure data, or capturing an image containing data from which the target data can be extracted.
  • Examples of target data include coordinates representing a spatial location or other reference characteristics relating to the target structure and/or its associated features, as well as any other information involving the target structure.
  • the target data can include reference points which can be used to define and determine any number of a characteristic or relationship between the target structure and/or its associated features and various system components, structures, and variables.
  • reference points can be transformed, via a transformation matrix or other mathematical calculation, from three- dimensional coordinates in real space to two-dimensional coordinates.
  • target data can be manipulated, combined, analyzed, or processed for further analysis, manipulation and/or calculations to be performed thereon.
  • the specular reflective surface 20 can extend substantially along a plane 21 and the target structure 31 can be substantially perpendicular to the plane 21.
  • a target structure 31 can comprise any of a one or a plurality of geometries, shapes, structures, or sizes, including any of a plurality of features or characteristics associated therewith.
  • the target structure can be constructed from any of a variety of materials.
  • the target structure can be constructed from a material or materials having desirable properties for use in various environments.
  • the target structure can be independently lighted or dependently lighted by a light source.
  • the target structure can emit light or the target structure can diffusely reflect light from a dedicated light source or diffusely reflect an ambient light.
  • the target structure can be dynamic in that, for example, the structure can include features or characteristics which can be changed, manipulated, or controlled either automatically or manually at any instance in time.
  • the target structure 31 can comprise a spatial frequency pattern 36 which can be substantially perpendicular to the specular reflective surface 20 at a distance 54 from an edge 24 of the specular reflective surface and at a distance 56 from a face 26 of the specular reflective surface 20.
  • the spatial frequency pattern 36 of the target structure 31 can also be located at an elevation 57 along a height 58 of the specular reflective surface 20.
  • the spatial frequency pattern 36 of the target structure 31 can exist at any of a location on the target structure and can extend at various angles and/or various directions relative to the specular reflective surface 20.
  • the target structure 31 can comprise a spatial frequency pattern 36 in a variety of manners.
  • the target structure 31 can be encoded with a spatial frequency pattern 36.
  • the target structure can be printed with a spatial frequency pattern 36, the target structure can be manufactured to include a spatial frequency pattern as a feature of the target structure, and/or a spatial frequency pattern can be attached or affixed to the target structure.
  • the spatial frequency pattern 36 can comprise a function of a spatial location.
  • the spatial frequency pattern 36 can be defined as a function of a spatial location.
  • the spatial frequency pattern 36 can comprise a periodical pattern in a direction 22 substantially parallel to a generatrix of the specular reflective surface.
  • the spatial frequency pattern 36 can comprise a frequency that changes monotonically in a direction 23 substantially perpendicular to the generatrix of the specular reflective surface.
  • the generatrix of the specular reflective surface lies in the plane 21 and is illustrated as the arrow representing the direction 22.
  • a spatial frequency pattern 600, 601 can comprise a periodical pattern that can be constant in a direction 605 and a frequency that can change in a direction 610.
  • direction 605 corresponds to a direction substantially parallel to a generatrix of the specular reflective surface while direction 610 corresponds to a direction substantially perpendicular to the generatrix of the specular reflective surface.
  • the spatial frequency pattern 600, 601 can be a black and white spatial frequency pattern 600 or a grayscale spatial frequency pattern 601.
  • a spatial frequency pattern can comprise any colors, curves, or features.
  • the method further includes the step of capturing a reflected image 50 of the target structure 31 in the specular reflective surface 20.
  • the reflected image 50 can be captured using an image capture device 51, including a camera or other image or video recording device. Once captured, the reflected image 50 can be analyzed or transferred to a computer 52 by which data contained within the image can be extracted, processed, and/or analyzed.
  • the method further includes the step of obtaining reflected data 55 from the reflected image 50.
  • the reflected data 55 can be obtained in a variety of manners, including extracting, processing, and/or analyzing the reflected image 50 to obtain the reflected data 55.
  • Examples of reflected data 55 include coordinates representing a spatial location or other reference characteristics relating to the reflected image 50 of the target structure and/or its associated reflected features, as well as any other information involving the reflected image 50.
  • the reflected data 55 can include information about the reflection 37 of the target structure 31 comprising the spatial frequency pattern 36.
  • the reflected data 55 can include reference points which can be used to define and determine any number of a characteristic or relationship between the reflected image 50 of the target structure and/or its associated reflected features and various system components, structures, and variables. Still further, these reference points can be transformed, via a transformation matrix or other mathematical calculation, from three- dimensional coordinates in real space to two-dimensional coordinates. In still a further example, reflected data 55 can be manipulated, combined, analyzed, or processed for further analysis, manipulation and/or calculations to be performed thereon.
  • the target structure 31 can comprise a spatial frequency pattern 36 which can include any of a feature or characteristic of the target structure 31.
  • the reflection of the target structure 31 comprising a spatial frequency pattern 36 can include any of a corresponding reflection of a feature or characteristic of the target structure 31, including a reflection 37 of the spatial frequency pattern.
  • the spatial frequency pattern 36 of the target structure 31 can be printed on the target structure 31.
  • the reflection 37 of the spatial frequency pattern 36 of the target structure 31 can be a corresponding reflection of the target structure including a reflection 37 of the printed spatial frequency pattern 36.
  • the reflected data 55 obtained from the reflected image 50 can, therefore, include any information about the corresponding reflection 37 of the spatial frequency pattern 36 in the specular reflective surface 20.
  • the method further includes the step of determining a correspondence between the target data 41 and the reflected data 55.
  • a correspondence can include, for example, a comparison, a correlation, or any other of a relationship or relationships between all or part of the target data 41 and all or part of the reflected data 55.
  • the target data 41 can be analyzed.
  • the reflected data 55 can be analyzed.
  • the target data 41 and the reflected data 55 can be analyzed.
  • a correspondence can be determined by any of a variety of techniques, including a computerized or manual process, a mathematical calculation, or any other manner of computation.
  • the correspondence can include a determination of a distortion of the reflection 37 of the spatial frequency pattern 36 from the reflected data 55 in the reflected image 50 compared to the spatial frequency pattern 36 from the target data 41 of the target structure 31.
  • the correspondence can comprise a Fast Fourier Transform.
  • a Fast Fourier Transform can be performed with respect to the spatial frequency pattern 36 of the target structure 31 about which target data 41 can be obtained and the reflection 37 of the spatial frequency pattern captured in the reflected image 50 from which reflected data 55 can be obtained.
  • a dominant frequency in the reflected image corresponding to the target data and the reflected data can be determined. For instance, starting from a known data point of the reflected data, a plurality of other data points can be calculated.
  • a Fast Fourier Transform can be used to calculate a dominant frequency and can also include correction from nearest to maximum harmonics.
  • the target structure comprises a spatial frequency pattern exhibiting near linear dependence of the frequency from a column coordinate
  • a deviation from linear dependence in the reflected image can indicate distortion or motion of the specular reflective surface 20.
  • the method further includes the step of using the correspondence and the calibration data to determine the shape of the specular reflective surface 20.
  • all or part of the correspondence can be used.
  • all or part of the calibration data can be used.
  • all or part of the correspondence can be used and all or part of the calibration data can be used.
  • This step can comprise, for example, performing a shape recovery algorithm.
  • a shape recovery algorithm can use any of the data to determine a shape of the specular reflective surface 20. For instance, a shape of the specular reflective surface 20 can be determined by restoring, recovering, back-calculating, or otherwise deducing the contour or profile of the specular reflective surface which would produce the captured reflected image 50 of the target structure 31 based on the correspondence and the calibration data.
  • the shape can approximate a cross-profile 70 of the specular reflective surface 20.
  • a cross-profile 70 can be, for instance, a cross-section of the specular reflective surface at a plane 75, wherein the plane 75 intersects the specular reflective surface 20.
  • a cross-profile 70 can be approximated as a line or curve 71 lying in a plane 75, wherein the plane 75 intersects the specular reflective surface 20.
  • the method can further comprise the step of determining a plurality of shapes 72 of the specular reflective surface 20. For instance, each shape 73 of a plurality of shapes 72 can approximate a cross-profile 70 or curve 71 of the specular reflective surface 20.
  • the method can further comprise the step of approximating a surface profile 74 of the specular reflective surface 20 based on a plurality of shapes 72.
  • the surface profile 74 can be determined, for example, by spatially ordering and arranging the plurality of shapes 72 based on a relation thereamong.
  • a plurality of shapes 72 can be digitally assembled to create a rendered image which can approximate an entire surface profile 77 of the specular reflective surface 20.
  • the shape can approximate or simulate the actual shape of a portion of or the entire sheet of material.
  • any of the method steps can be performed at any of a same or different temporal frequency.
  • any of the method steps 500 including obtaining calibration data 501, obtaining target data 502, capturing a reflected image 503, obtaining reflected data 504, determining a correspondence 505, and using the correspondence and calibration data to determine a shape of the specular reflective surface 506 can be performed at any of a same or different temporal frequency.
  • any step can be performed at a rate of at least once per second.
  • any step can be repeated at a rate such that the period of the repetitions approaches zero.
  • any step can be performed at a rate that is substantially continuous in time when a change in shape of the cylindrical surface between repetitions is not significant.
  • any step can be performed at a rate defined by any number of variables.
  • any step can be performed once. In one example, one or more of the steps can be performed once, while others of the steps can be performed more than once.
  • Various computer, numerical, mathematical, linear, non-linear, scientific, digital, electronic, or other techniques can be used for any of the method steps 500, shown in FIG. 10, including obtaining calibration data 501, obtaining target data 502, capturing a reflected image 503, obtaining reflected data 504, determining a correspondence 505, and using the correspondence and calibration data to determine a shape of the specular reflective surface 506. Still further, any configuration, calculation, manipulation, or computation can be performed either together or alone and for any of the method steps provided herein.
  • image analysis can be used, wherein an image, captured or otherwise obtained, can be analyzed and data contained therein can be extracted therefrom.
  • a region of interest can be defined, wherein the region of interest can represent a particular region of the target structure, of the specular reflective surface, and/or of the reflected image of the target structure in the specular reflective surface.
  • the region of interest can be defined by a user and coded directly or indirectly into a computer or can be automatically determined using a software routine or other procedure.
  • a derivative convolution can be used to highlight a change in direction perpendicular to the nominal feature of the target structure. The derivative convolution can, for example, show the rate of change of data point values between data points.
  • This process finds, for example, the point of maximum absolute value, representing the greatest change with respect to data point values perpendicular to a feature of the target structure.
  • data points may be filtered such that points which deviate too far from the general direction or directional trend of the feature of the target structure are eliminated and deemed outliers.
  • sub-pixel interpolation may be used to determine the data point with the greatest maximum absolute value of derivative. From this, using at least two points on each side of this data point, a polynomial can be fit to the data points and an actual peak location can be determined. This interpolation can be performed for each data point obtained, wherein a data point can relate, for example, to a feature of the target structure or its corresponding reflection in the specular reflective surface.
  • an integration methodology can be used, wherein an integration point can be defined.
  • the integration point can be used to establish a starting point for integration over the specular reflective surface as multiple shapes of the specular reflective surface could produce the same reflection.
  • an initial condition for a differential equation recovery method can be defined.
  • three-dimensional point processing can be used to transform three-dimensional coordinates corresponding to data points of the calibration data, target data, or reflected data into two-dimensional data points which can define a location of the target structure and its corresponding reflection.
  • data filtering can be performed wherein data points of the calibration data, target data, or reflected data are processed to remove any outliers.
  • this filtering process involves fitting a polynomial line to the data points which, for example, can relate to the feature of the target structure and/or its corresponding reflection in the specular reflective surface.
  • any data points falling outside a defined distance from the fitted line are identified as outliers.
  • the outliers may be either removed from the data set or retained by the data set.
  • the process of fitting a line, identifying outliers, and removing or retaining the outliers from the data set can be repeated any number of times with the same or different polynomial fit and/or with the same or different outlier rejection limits.
  • FIG. 11 Further aspects of the disclosure include methods for determining a shape of a glass ribbon 103 drawn from a quantity of molten glass 121, as shown in FIG. 11.
  • the glass ribbon 103 may be separated into glass sheets 104 which may be used in a wide variety of applications.
  • glass sheets 104 produced from the glass ribbon 103 may, for example, be used in display applications.
  • the glass sheets 104 may be used to produce liquid crystal displays (LCDs), electrophoretic displays (EPD), organic light emitting diode displays (OLEDs), plasma display panels (PDPs), or other display devices.
  • LCDs liquid crystal displays
  • EPD electrophoretic displays
  • OLEDs organic light emitting diode displays
  • PDPs plasma display panels
  • Glass ribbons may be fabricated by a variety of apparatus for producing glass ribbon in accordance with the disclosure such as slot draw, float, down-draw, fusion down- draw, or up-draw.
  • Each apparatus can include a melting vessel configured to melt a batch of material into a quantity of molten glass.
  • Each apparatus further includes at least a first conditioning station positioned downstream from the melting vessel and a second conditioning station positioned downstream from the first conditioning station.
  • FIG. 11 illustrates a schematic view of just one example apparatus for producing glass ribbon according to the disclosure, wherein the apparatus comprises a fusion draw apparatus 101 for fusion drawing a glass ribbon 103 for subsequent processing into glass sheets 104.
  • the fusion draw apparatus 101 can include a melting vessel 105 configured to receive batch material 107 from a storage bin 109.
  • the batch material 107 can be introduced by a batch delivery device 111 powered by a motor 113.
  • An optional controller 115 can be configured to activate the motor 113 to introduce a desired amount of batch material 107 into the melting vessel 105, as indicated by arrow 117.
  • a glass metal probe 119 can be used to measure a glass melt 121 level within a standpipe 123 and communicate the measured information to the controller 115 by way of a communication line 125.
  • the fusion draw apparatus 101 can also include a first conditioning station such as a fining vessel 127 (e.g., a fining tube), located downstream from the melting vessel 105 and coupled to the melting vessel 105 by way of a first connecting conduit 129.
  • a first conditioning station such as a fining vessel 127 (e.g., a fining tube), located downstream from the melting vessel 105 and coupled to the melting vessel 105 by way of a first connecting conduit 129.
  • glass melt may be gravity fed from the melting vessel 105 to the fining vessel 127 by way of the first connecting conduit 129.
  • gravity may act to drive the glass melt to pass through an interior pathway of the first connecting conduit 129 from the melting vessel 105 to the fining vessel 127.
  • bubbles may be removed from the glass melt by various techniques.
  • the fusion draw apparatus can further include a second conditioning station such as a mixing vessel 131 (e.g., a stir chamber) that may be located downstream from the fining vessel 127.
  • the mixing vessel 131 can be used to provide a homogenous glass melt composition, thereby reducing or eliminating cords of inhomogeneity that may otherwise exist within the fined glass melt exiting the fining vessel.
  • the fining vessel 127 may be coupled to the mixing vessel 131 by way of a second connecting conduit 135.
  • glass melt may be gravity fed from the fining vessel 127 to the mixing vessel 131 by way of the second connecting conduit 135. For instance, gravity may act to drive the glass melt to pass through an interior pathway of the second connecting conduit 135 from the fining vessel 127 to the mixing vessel 131.
  • the fusion draw apparatus can further include another conditioning station such as a delivery vessel 133 (e.g., a bowl) that may be located downstream from the mixing vessel 131.
  • the delivery vessel 133 may condition the glass to be fed into a forming device.
  • the delivery vessel 133 can act as an accumulator and/or flow controller to adjust and provide a consistent flow of glass melt to the forming vessel.
  • the mixing vessel 131 may be coupled to the delivery vessel 133 by way of a third connecting conduit 137.
  • glass melt may be gravity fed from the mixing vessel 131 to the delivery vessel 133 by way of the third connecting conduit 137.
  • gravity may act to drive the glass melt to pass through an interior pathway of the third connecting conduit 137 from the mixing vessel 131 to the delivery vessel 133.
  • a downcomer 139 can be positioned to deliver glass melt 121 from the delivery vessel 133 to an inlet 141 of a forming vessel 143.
  • the melting vessel 105, fining vessel 127, the mixing vessel 131, delivery vessel 133, and forming vessel 143 are examples of glass melt conditioning stations that may be located in series along the fusion draw apparatus 101.
  • the melting vessel 105 is typically made from a refractory material, such as refractory (e.g. ceramic) brick.
  • the fusion draw apparatus 101 may further include components that are typically made from platinum or platinum-containing metals such as platinum-rhodium, platinum-iridium and combinations thereof, but which may also comprise such refractory metals such as molybdenum, palladium, rhenium, tantalum, titanium, tungsten, ruthenium, osmium, zirconium, and alloys thereof and/or zirconium dioxide.
  • the platinum-containing components can include one or more of the first connecting conduit 129, the fining vessel 127 (e.g., finer tube), the second connecting conduit 135, the standpipe 123, the mixing vessel 131 (e.g., a stir chamber), the third connecting conduit 137, the delivery vessel 133 (e.g., a bowl), the downcomer 139 and the inlet 141.
  • the forming vessel 143 is also made from a refractory material and is designed to form the glass ribbon 103.
  • FIG. 12 is a cross-sectional perspective view of the fusion draw apparatus 101 along line 2-2 of FIG. 11.
  • the forming vessel 143 includes a forming wedge 201 comprising a pair of downwardly inclined forming surface portions 207, 209 extending between opposed ends of the forming wedge 201.
  • the pair of downwardly inclined forming surface portions 207, 209 converge along a draw direction 211 to form a root 213.
  • a draw plane 215 extends through the root 213 wherein the glass ribbon 103 may be drawn in the draw direction 211, for example in a downstream direction, along the draw plane 215.
  • the draw plane 215 can bisect the root 213 although the draw plane 215 may extend at other orientations with respect to the root 213.
  • the fusion draw apparatus 101 can include a system 300 to perform a method for determining a shape of a glass ribbon 103 drawn from a quantity of molten glass 121.
  • the method can also be implemented to determine a shape of other objects with specular reflective characteristics, including optical fibers and other glass elements.
  • Methods for determining a shape of a glass ribbon 103 drawn from a quantity of molten glass 121 will now be discussed.
  • the glass ribbon 103 can be continuously moving in a draw direction 211.
  • the shape can be used to control up-stream parameters 301 of a glass forming apparatus 101.
  • the shape can be used to control parameters of a down-stream process 302.
  • the shape can be used to control up-stream parameters 301 of a glass forming apparatus 101 and parameters of a down-stream process 302. In still another example, the shape can be used to determine an attribute of the glass ribbon, wherein a quality of the glass ribbon can be categorized based on the attribute.
  • an attribute can include shape anomalies that can occur in the glass ribbon during the forming process, such as inclusions, scratches, or any other defects or irregularities. These anomalies can cause the glass ribbon to fall outside required specification characteristics or parameters wherein the glass ribbon or glass sheet may be rejected or identified for alternate uses.
  • an attribute can be signatory of motion of the glass ribbon or of a change in shape or composition of the glass ribbon.
  • the attributes can be monitored periodically, repeatedly, or continuously, for example, and can be used to produce various output information, such as plots, graphs, charts, databases, or numerical data.
  • an attribute can be associated with a particular glass sheet cut from the glass ribbon. That particular glass sheet can thereafter be discarded if its characteristics fall outside required specifications, further processed if needed, or identified based on its attribute for use in a specific application or distribution to a specific location.
  • an attribute can be used to determine those operating conditions which correspond to stable production, wherein the quality of the glass ribbon and/or the quality of the glass sheet are of a desirable quality or characteristic.
  • an attribute can be used to determine those operating conditions which correspond to undesirable production, wherein the quality of the glass ribbon and/or the quality of the glass sheet differ from those of a glass ribbon or a glass sheet exhibiting a desirable quality or characteristic.
  • an attribute can be used to notify a computer or a user when certain components, systems, or features of the glass forming apparatus are functioning properly or improperly. For example, based on a particular attribute of the glass ribbon, determined from its shape as calculated by the method disclosed herein, one could determine instances wherein certain elements of the system require replacement or repair, or instances where the various inputs for producing the molten glass could be adjusted to, for example, improve the quality of the glass ribbon and/or the glass sheet. Still further, a correlation among attributes can be determined.
  • Such a correlation can be determined over a period of time and can include any of a number of various parameters involving the glass forming process, the glass ribbon, and/or the glass sheets as determined from the method or as provided from other controls.
  • the shape of the glass ribbon and/or glass sheet can be used to understand variations in glass forming, properties of the glass ribbon, and characteristics of glass sheets, such as mechanical stress in the glass sheet. The shape can be monitored and/or analyzed, for example, to improve the quality, efficiency, or any other features, parameters, or aspects associated with the methods described herein.
  • the method includes the step of obtaining calibration data.
  • the calibration data can be obtained in a variety of manners, including directly or indirectly coding data into a computer, using a detection device to observe data, using a sensor to measure data, or capturing an image containing data from which the calibration data can be extracted.
  • Examples of calibration data include coordinates or other information representing a characteristic or characteristics of any of the systems, components, or structures used in or by the method.
  • calibration data can include a spatial location of components of the system, such as the spatial location of a camera, a lens, or a focal point, information about the glass ribbon, the target structure and its associated features, or any other parameters, initial conditions, or data associated therewith.
  • the calibration data can include reference points or coordinates which can be used to determine and define locations or relationships between various system components, structures, and variables.
  • the calibration data can, for instance, be transformed, via a transformation matrix or other mathematical calculation, from three-dimensional coordinates in real space into two- dimensional coordinates.
  • calibration data can be manipulated, combined, analyzed, or processed for further analysis, manipulation and/or calculations to be performed thereon.
  • the method further includes the step of obtaining target data about a target structure, wherein the target structure comprises a spatial frequency pattern.
  • the target data can be obtained in a variety of manners, including directly or indirectly coding data into a computer, using a detection device to observe data, using a sensor to measure data, or capturing an image containing data from which the target data can be extracted.
  • Examples of target data include coordinates representing a spatial location or other reference characteristics relating to the target structure and/or its associated features, as well as any other information involving the target structure.
  • the target data can include reference points which can be used to define and determine any number of a characteristic or relationship between various system components, structures, and variables.
  • target data can be manipulated, combined, analyzed, or processed for further analysis, manipulation and/or calculations to be performed thereon.
  • the target structure can be an existing structure within the glass forming apparatus 101 which, in addition to serving as a target structure, may serve other functions with respect to glass forming or processing.
  • the target structure can be a dedicated structure introduced into the glass forming apparatus 101 for the sole purpose of functioning as a target structure in the method provided herein.
  • the glass ribbon 103 can extend substantially along a plane 215 and the target structure 331 can be substantially perpendicular to the plane 215.
  • a target structure 331 can comprise any of a one or a plurality of geometries, shapes, structures, or sizes, including any of a plurality of features or characteristics associated therewith.
  • the target structure can be constructed from any a variety of materials for use in various environments. For instance, in a glass forming apparatus 101, the target structure may be constructed from a material suitable to withstand high temperature environments.
  • the target structure can be independently lighted or dependently lighted by a light source.
  • the target structure can emit light or the target structure can diffusely reflect light from a dedicated light source or diffusely reflect an ambient light.
  • a target structure 331 can be located within the fusion draw apparatus 101, wherein a window or other aperture can be included to provide a viewport for a light source to illuminate the target structure.
  • the window or other aperture can be an existing window or aperture located in the fusion draw apparatus or can be a dedicated window or aperture included for the sole purpose of providing a viewport for a light source to illuminate the target structure.
  • the target structure can be dynamic in that, for example, the target structure can include features or characteristics which can be changed, manipulated, or controlled either automatically or manually at any instance in time.
  • the target structure 331 can comprise a spatial frequency pattern 336 which can be substantially perpendicular to the glass ribbon 103 at a distance 354 from an edge 324 of the glass ribbon and at a distance 356 from a face 326 of the glass ribbon 103.
  • the spatial frequency pattern 336 of the target structure 330 can also be located at an elevation 357 along a height 358 of the glass ribbon 103.
  • the spatial frequency pattern 336 of the target structure 331 can exist at any of a location on the target structure and can extend at various angles and/or various directions relative to the glass ribbon 103.
  • the spatial frequency pattern 336 can comprise a function of a spatial location.
  • the spatial frequency pattern 336 can be defined as a function of a spatial location.
  • the spatial frequency pattern 336 can comprise a periodical pattern in a direction 322 substantially parallel to a generatrix of the glass ribbon.
  • the spatial frequency pattern 336 can comprise a frequency that changes monotonically in a direction 323 substantially perpendicular to the generatrix of the glass ribbon.
  • the generatrix of the glass ribbon lies in the plane 215 and is illustrated as the arrow representing the direction 211.
  • the method further includes the step of capturing a reflected image 350 of the target structure 331 in the glass ribbon 103.
  • the reflected image As noted, the reflected image
  • the reflected image 350 can be analyzed or transferred to a computer 352 by which data contained within the image can be extracted, processed, and/or analyzed.
  • one or more image capture devices 351 may be used to capture one or more reflected images 350 of one or more target structures 331.
  • one or more reflected images 350 may be captured at various locations of the glass ribbon 103.
  • the reflected images 350 may include any or all of the reflection of the target structure as well as any or all of the reflection of the feature of the target structure.
  • an image capture device 351, such as a camera may be located at a side of the glass ribbon 103 such that the image capture device
  • the image capture device may capture a reflected image 350 of the target structure of the glass ribbon on the side of the glass ribbon opposite the location of the image capture device capturing the image.
  • the image capture device may capture a reflected image over approximately half of the width of the glass ribbon 103.
  • a second image capture device 351 such as a second camera, may be located at an opposite side of the glass ribbon at a same or similar vertical elevation with respect to the first image capture device such that the second image capture device also captures a reflected image of the target structure on the side of the glass ribbon opposite the location of the image capture device capturing the image.
  • this image capture device may capture a reflected image over approximately half of the width of the glass ribbon.
  • the first image capture device and second image capture device can, for example, capture a reflected image of the target structure over the entire width of the glass ribbon.
  • the first and second image capture devices can be configured to capture a reflected image including an overlapping region of the glass ribbon.
  • the overlapping region can, for example, be used for calibration or other configuration calculations where multiple data points corresponding to the same spatial location of the glass ribbon are advantageous.
  • the properties or aspects of the reflected image 350 can be captured based on a location or angle of the image capture device or image capture devices in relation to the glass ribbon 103.
  • obstructions or limitations may prevent placement of the image capture devices for ideal capture of the reflected image.
  • the image capture device 351 may, for example, be mounted on an adjustable mechanism such that the location and/or angle of the image capture device can be adjusted or altered manually or automatically to accommodate such obstructions or limitations and such that the image capture device may be removed to provide access to the fusion draw apparatus 101 for inspection, cleaning, or repair thereof.
  • the same or different image capture device may be arranged to capture an image of the glass ribbon 103, the target structure 331 and any other components used in or by the glass forming apparatus 101 or processing steps.
  • the image capture device 351 can be arranged to view the glass ribbon 103, target structure 331, or other components through the aforementioned existing or dedicated viewport windows in the fusion draw apparatus 101.
  • the image capture device can be located in proximity to a light source wherein the light from the light source can illuminate the target structure and the glass ribbon to improve a quality of image capture as well as to provide light or illumination to enhance the reflective characteristics of the glass ribbon 103.
  • the method further includes the step of obtaining reflected data 355 from the reflected image 350.
  • the reflected data 355 can be obtained in a variety of manners, including extracting, processing, and/or analyzing the reflected image 350 to obtain the reflected data 355.
  • Examples of reflected data 355 include coordinates representing a spatial location or other reference characteristics relating to the reflected image 350 of the target structure and/or its associated features, as well as any other information involving the reflected image 350.
  • the reflected data 355 can include information about the reflection 337 of the target structure 331 comprising a spatial frequency pattern 336.
  • the reflected data 355 can include reference points which can be used to define and determine any number of a relationship or characteristic between the reflected image 350 of the target structure and/or its associated features and various system components, structures, and variables. Still further, these reference points can be transformed, via a transformation matrix or other mathematical calculation, from three-dimensional coordinates in real space to two-dimensional coordinates. In still a further example, reflected data 355 can be manipulated, combined, analyzed, or processed for further analysis, manipulation and/or calculations to be performed thereon.
  • the target structure 331 can comprise a spatial frequency pattern 336 which can include any of a feature or characteristic of the target structure 331.
  • the reflection of the target structure 331 comprising a spatial frequency pattern 336 can include any of a corresponding reflection of a feature or characteristic of the target structure 331, including a reflection 337 of the spatial frequency pattern.
  • the spatial frequency pattern 336 of the target structure 331 can be encoded on the target structure 331.
  • the spatial frequency pattern 336 of the target structure 331 can be printed on the target structure 331.
  • the reflection 337 of the spatial frequency pattern 336 of the target structure 331 can be a corresponding reflection of the target structure including a reflection 337 of the spatial frequency pattern 336.
  • the reflected data 355 obtained from the reflected image 350 can, therefore, include any information about the corresponding reflection 337 of the spatial frequency pattern 336 in the glass ribbon 103.
  • the method further includes the step of determining a correspondence between the target data 341 and the reflected data 355.
  • a correspondence can include, for example, a comparison, a correlation, or any other of a relationship or relationships between all or part of the target data 341 and all or part of the reflected data 355.
  • the target data 341 can be analyzed.
  • the reflected data 355 can be analyzed.
  • the target data 341 and the reflected data 355 can be analyzed.
  • a correspondence can be determined by any of a variety of techniques, including a computerized or manual process, a mathematical calculation, or any other manner of computation.
  • the correspondence can include a determination of a distortion of the reflection 337 of the spatial frequency pattern 336 from the reflected data 355 in the reflected image 350 compared to the spatial frequency pattern 336 from the target data 341 of the target structure 331.
  • the correspondence can comprise a Fast Fourier Transform.
  • a Fast Fourier Transform can be performed with respect to the spatial frequency pattern 336 of the target structure 331 about which target data 341 can be obtained and the reflection 337 of the spatial frequency pattern captured in the reflected image 350 from which reflected data 355 can be obtained.
  • a dominant frequency in the reflected image corresponding to the target data and the reflected data can be determined. For instance, starting from a known data point of the reflected data, a plurality of other data points can be calculated.
  • a Fast Fourier Transform can be used to calculate a dominant frequency and can also include correction from nearest to maximum harmonics.
  • the target structure comprises a spatial frequency pattern exhibiting near linear dependence of the frequency from a column coordinate
  • a deviation from linear dependence in the reflected image can indicate distortion or motion of the glass ribbon 103.
  • the method further includes the step of using the correspondence and the calibration data to determine the shape of the glass ribbon 103.
  • all or part of the correspondence can be used.
  • all or part of the calibration data can be used.
  • all or part of the correspondence can be used and all or part of the calibration data can be used.
  • This step can comprise, for example, performing a shape recovery algorithm.
  • a shape recovery algorithm can use any of the data to determine a shape of the glass ribbon 103. For instance, a shape of the glass ribbon 103 can be determined by restoring, recovering, back-calculating, or otherwise deducing the contour or profile of the glass ribbon which would produce the captured reflected image 350 of the target structure 331 based on the correspondence and the calibration data.
  • the shape can approximate a cross-profile 70 of the glass ribbon 103.
  • a cross-profile 70 can be, for instance, a cross-section of the glass ribbon 103 at a plane 75, wherein the plane 75 intersects the glass ribbon 103.
  • a cross-profile 70 can be approximated as a line or curve 71 lying in a plane 75, wherein the plane 75 intersects the glass ribbon 103.
  • the method can further comprise the step of determining a plurality of shapes 72 of the glass ribbon 103. For instance, each shape 73 of a plurality of shapes 72 can approximate a cross-profile 70 or curve 71 of the glass ribbon 103.
  • the method can further comprise the step of approximating a surface profile 74 of the glass ribbon 103 based on a plurality of shapes 72.
  • the surface profile 74 can be determined, for example, by spatially ordering and arranging the plurality of shapes 72 based on a relation thereamong.
  • a plurality of shapes 72 can be digitally assembled to create a rendered image which can approximate an entire surface profile 77 of the glass ribbon 103.
  • the shape can approximate or simulate the actual shape of a portion of or the entire glass ribbon 103 and/or the actual shape of a portion of or the entire glass sheet 104 cut therefrom.
  • any of the above steps can be performed at any of a same or different temporal frequency.
  • any of the method steps 500 including obtaining calibration data 501, obtaining target data 502, capturing a reflected image 503, obtaining reflected data 504, determining a correspondence 505, and using the correspondence and calibration data to determine a shape of the specular reflective surface 506 can be performed at any of a same or different temporal frequency.
  • any step can be performed at a rate of at least once per second.
  • any step can be repeated at a rate such that the period of the repetitions approaches zero.
  • any step can be performed at a rate that is substantially continuous in time when a change in shape of the glass ribbon between repetitions is not significant.
  • any step can be performed at a rate defined by any number of variables. In one example, any of the steps can be performed at a rate coinciding with once per glass sheet. In another example, any of the steps can be performed at a rate adjusted based on the size of the glass sheet, the quality of the glass sheets being produced or already produced, or any other factors which may contribute to or alter the glass forming apparatus and other processes. Still further, any step can be performed once. In one example, one or more of the steps can be performed once, while others of the steps can be performed more than once.
  • Various computer, numerical, mathematical, linear, non-linear, scientific, digital, electronic, or other techniques can be used for any of the steps of the method, including obtaining calibration data, obtaining target data, defining a target line from the target data, capturing a reflected image, obtaining reflected data, defining a reflected line, determining a correspondence, and using the correspondence and calibration data to determine a shape of the glass ribbon. Any configuration, calculation, manipulation, or computation can be performed either together or alone and for any of the method steps provided herein.
PCT/US2014/070450 2013-12-19 2014-12-16 Methods for determining a shape of a substantially cylindrical specular reflective surface WO2015095101A1 (en)

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JP2016541522A JP6670241B2 (ja) 2013-12-19 2014-12-16 実質的に円筒形の鏡面反射面の形状を決定するための方法
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