WO2015093442A1 - 受発光素子モジュールおよびこれを用いたセンサ装置 - Google Patents
受発光素子モジュールおよびこれを用いたセンサ装置 Download PDFInfo
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- WO2015093442A1 WO2015093442A1 PCT/JP2014/083155 JP2014083155W WO2015093442A1 WO 2015093442 A1 WO2015093442 A1 WO 2015093442A1 JP 2014083155 W JP2014083155 W JP 2014083155W WO 2015093442 A1 WO2015093442 A1 WO 2015093442A1
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- light
- lens
- light emitting
- receiving element
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/04—Systems determining the presence of a target
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/42—Simultaneous measurement of distance and other co-ordinates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
- H01L25/167—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/12—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
- H01L31/16—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources
- H01L31/167—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources the light sources and the devices sensitive to radiation all being semiconductor devices characterised by at least one potential or surface barrier
- H01L31/173—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources the light sources and the devices sensitive to radiation all being semiconductor devices characterised by at least one potential or surface barrier formed in, or on, a common substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Definitions
- the present invention relates to a light emitting / receiving element module and a sensor device using the same.
- This sensor device detects the characteristics of an irradiated object by irradiating the irradiated object with light from the light emitting element, and receiving the regular reflected light and diffuse reflected light with respect to the light incident on the irradiated object by the light receiving element.
- This sensor device is used in a wide range of fields, such as photo interrupters, photocouplers, remote control units, IrDA (Infrared Data Association) communication devices, optical fiber communication devices, and document size sensors. It has been.
- a sensor device for example, a sensor device in which a light emitting element and a light receiving element are mounted on the same substrate, and lenses corresponding to each of the light emitting element and the light receiving element are provided (for example, patents) is used. No. 2939045).
- the present invention has been made in view of the above circumstances, and an object thereof is to provide a light emitting / receiving element module having high sensing performance and a sensor device using the same.
- the light emitting / receiving element module of the present invention includes a substrate, a light emitting element located on one principal surface of the substrate, and a light receiving element located on one principal surface of the substrate and arranged side by side in the first direction with the light emitting element. And an optical element having a first main surface opposite to the first main surface and a second main surface opposite to the first main surface, spaced from the one main surface of the substrate
- the optical element includes: a first lens that guides light from the light emitting element to an object; and a first lens that guides light reflected by the object to the light receiving element.
- the first lens and the second lens are arranged side by side in the first direction, and at least one main surface side of the first main surface and the second main surface is included.
- the curved surface constituting the first lens and the second lens And the curved surface intersect each other along the way.
- the sensor device of the present invention is a sensor device having the above-described light emitting / receiving element module and a control circuit that is electrically connected to the light emitting / receiving element module and controls the light emitting / receiving element module.
- a control circuit that is electrically connected to the light emitting / receiving element module and controls the light emitting / receiving element module.
- the light emitting / receiving element module of the present invention high sensing performance can be realized. Moreover, according to the sensor device using such a light receiving and emitting element module, highly accurate information can be obtained with high sensing performance.
- (A) is sectional drawing which shows an example of the light emitting / receiving element module which concerns on this embodiment
- (b) is a principal part top view.
- (A) is sectional drawing of the light emitting element which comprises the light emitting / receiving element module shown in FIG.
- (B) is sectional drawing of the light receiving element which comprises the light receiving and emitting element module shown in FIG.
- It is a schematic diagram which shows the modification of an optical element.
- (A), (b) is respectively typical sectional drawing and a top view which show the modification of the light emitting / receiving element module shown in FIG. (A)
- (b) is a schematic diagram which shows the modification of an optical element, respectively. It is a schematic diagram which shows the modification of an optical element.
- (A), (b) is a schematic diagram which shows the modification of an optical element, respectively. It is a schematic sectional drawing which shows typically an example of embodiment of the sensor apparatus using the light emitting / receiving element module shown in FIG. Correlation between the surface state of the irradiated object and the magnitude of the photocurrent detected by the light receiving element by the sensor device using the light receiving and emitting element module according to the present embodiment and the sensor apparatus using the light receiving and emitting element module according to the comparative example FIG.
- the light emitting / receiving element module 1 shown in FIGS. 1A and 1B is incorporated in an image forming apparatus such as a copying machine or a printer, for example, and position information, distance information or surface information of an irradiated object such as toner or media. It functions as a sensor device that detects the above.
- the light emitting / receiving element module 1 may be a sensor device that detects surface information such as compacted powder or biological skin, or a device that detects position information such as paper and measures the number of papers. Applicable.
- the light emitting part of the light emitting element 3a and the light receiving part of the light receiving element 3b are indicated by broken lines so that the positional relationship of each component becomes clear.
- the light emitting / receiving element module 1 includes a wiring board 2, a light emitting / receiving element 3 disposed on the upper surface of the wiring board 2, and an optical element 4.
- the light emitting / receiving element 3 includes a substrate 30 and a light emitting element 3 a and a light receiving element 3 b located on one main surface 30 s of the substrate 30.
- the optical element 4 is arranged at a distance from one main surface 30 s of the substrate 30.
- a plane parallel to the one principal surface 30s is an XY plane
- a thickness direction of the substrate 30 is a Z direction.
- the X direction may be referred to as a first direction
- the Y direction may be referred to as a second direction orthogonal to the first direction.
- a direction in which the light emitting element 3a and the light receiving element 3b are arranged on one main surface 30s is defined as a first direction (X direction).
- two light receiving elements 3b are provided for one light emitting element 3a.
- one light emitting element 3a and two light receiving elements 3b are arranged in the X direction so that the two light receiving elements 3b sandwich one light emitting element 3a in the order of the light receiving element 3b, the light emitting element 3a, and the light receiving element 3b.
- the two light receiving elements 3b may be referred to as a light receiving element 3b1 and a light receiving element 3b2.
- the light receiving element 3b1 detects regular reflected light from the irradiated object
- the light receiving element 3b2 detects diffuse (scattered) reflected light from the irradiated object.
- the light receiving element 3b1, the light emitting element 3a, and the light receiving element 3b2 are arranged in the X direction so that the centers in the Y direction are aligned.
- Such light emitting element 3a and light receiving element 3b are integrally formed on one main surface 30s of one substrate 30. By setting it as such a structure, it becomes possible to arrange
- the light emitting element 3a and the two light receiving elements 3b are integrally formed with the substrate 30, but one light emitting element 3a and one light receiving element 3b may be used, or the light emitting element 3a.
- the light receiving elements 3b may be individually mounted, or a light emitting element array in which a plurality of light emitting elements 3a are integrally formed and a light receiving element array in which a plurality of light receiving elements 3b are integrally formed are arranged. It may be present or a combination thereof.
- the optical element 4 is arranged at an interval in the Z direction from one main surface 30 s of the substrate 30.
- the optical element 4 includes a first main surface 4s1 that faces the one main surface 30s of the substrate 30 and a second main surface 4s2 that is located on the opposite side of the first main surface 4s1.
- the second main surface 4s2 is, in other words, the main surface facing the object.
- the optical element 4 is held by a holding body 5 having a side wall surrounding a region where the light emitting element 3a and the light receiving element 3b are formed.
- the holder 5 may be made of a light shielding material so that light from the outside does not enter the light receiving element 3b without passing through the optical element 4.
- the optical element 4 includes a first lens 4a for guiding light from the light emitting element 3a to the object, and a second lens 4b for guiding light reflected by the object to the light receiving element 3b.
- it has the 2nd lens 4b1 corresponding to the light receiving element 3b1, and the 2nd lens 4b2 corresponding to the light receiving element 3b2.
- the first lens 4a and the second lens 4b are arranged side by side in the first direction. Further, the curved surfaces constituting the first lens 4a and the curved surfaces constituting the second lens 4b are joined to each other in the middle of the curved surface.
- the second lens 4b1, the first lens 4a, and the second lens 4b2 are arranged side by side and joined to each other.
- the first lens 4a and the second lens 4b are formed so that the curved surface of the lens is not joined to another lens in the second direction.
- the wiring board 2 is electrically connected to the light emitting / receiving element 3 and the control circuit 101, respectively, and applies a bias to the light emitting element 3a and the light receiving element 3b formed on the light emitting / receiving element 3, or It functions as a wiring board for transmitting and receiving electrical signals to and from the control circuit 101.
- the substrate 30 is made of a semiconductor material of one conductivity type. Although there is no limitation on the impurity concentration of one conductivity type, it is desirable to have a high electric resistance.
- an n-type silicon (Si) substrate containing phosphorus (P) at a concentration of 1 ⁇ 10 17 to 2 ⁇ 10 17 atoms / cm 3 as one conductivity type impurity is used for the silicon (Si) substrate. Yes.
- n-type impurities include, in addition to phosphorus (P), nitrogen (N 2 ), arsenic (As), antimony (Sb), bismuth (Bi), and the like, and the doping concentration is 1 ⁇ 10 16 to 1 X10 20 atoms / cm 3 .
- n-type is a single conductivity type and p-type is a reverse conductivity type.
- the light emitting element 3a and the two light receiving elements 3b are arranged in a row so as to sandwich the light emitting element 3a in the first direction.
- the light emitting element 3a functions as a light source for light irradiated to the irradiated object, and the light emitted from the light emitting element 3a is reflected by the irradiated object and enters the light receiving element 3b.
- the light receiving element 3b functions as a light detection unit that detects the incidence of light.
- the light emitting element 3a is a laminated body in which a plurality of semiconductor layers are laminated as shown in FIG.
- the light emitting element 3 a is formed by laminating a plurality of semiconductor layers on the upper surface of the substrate 30. A specific configuration of the light emitting element 3a will be described below.
- a difference in lattice constant between the substrate 30 and a semiconductor layer (an n-type contact layer 30b described later in the case of the present embodiment) stacked on the upper surface of the substrate 30 is buffered.
- a buffer layer 30a is formed.
- the buffer layer 30a buffers lattice defects such as lattice strain generated between the substrate 30 and the semiconductor layer by buffering the difference in lattice constant between the substrate 30 and the semiconductor layer formed on one main surface 30s of the substrate 30. This reduces the number of lattice defects or crystal defects in the entire semiconductor layer formed on one main surface 30 s of the substrate 30.
- the buffer layer 30a and the semiconductor layer formed on the upper surface thereof may be formed by MOCVD (Metal-organic Chemical Vapor Deposition) method.
- the buffer layer 30a of this embodiment is made of gallium arsenide (GaAs) not containing impurities, and has a thickness of about 2 to 3 ⁇ m. If the difference in lattice constant between the substrate 30 and the semiconductor layer stacked on one main surface 30s of the substrate 30 is not large, the buffer layer 30a can be omitted.
- GaAs gallium arsenide
- n-type contact layer 30b is formed on the upper surface of the buffer layer 30a.
- gallium arsenide (GaAs) is doped with n-type impurities such as silicon (Si) or selenium (Se), and the doping concentration is 1 ⁇ 10 16 to 1 ⁇ 10 20 atoms / cm 3.
- the thickness is about 0.8 to 1 ⁇ m.
- silicon (Si) is doped as an n-type impurity at a doping concentration of 1 ⁇ 10 18 to 2 ⁇ 10 18 atoms / cm 3 .
- a part of the upper surface of the n-type contact layer 30b is exposed, and the exposed portion is electrically connected to the wiring substrate 2 by wire bonding or flip chip connection through the first electrode 31a on the light emitting element side. It is connected.
- the n-type contact layer 30b has a function of reducing contact resistance with the first electrode 31a on the light emitting element side connected to the n-type contact layer 30b.
- the first electrode 31a on the light emitting element side is made of, for example, a gold (Au) antimony (Sb) alloy, a gold (Au) germanium (Ge) alloy, or a Ni alloy, and has a thickness of about 0.5 to 5 ⁇ m. It is formed. At the same time, since it is disposed on the insulating layer 8 formed so as to cover the upper surface of the n-type contact layer 30b from the upper surface of the substrate 30, it is electrically connected to the semiconductor layers other than the substrate 30 and the n-type contact layer 30b. Is insulated.
- the insulating layer 8 is formed of, for example, an inorganic insulating film such as silicon nitride (SiNx) or silicon oxide (SiO 2 ), an organic insulating film such as polyimide, and the like, and has a thickness of about 0.1 to 1 ⁇ m. .
- An n-type cladding layer 30c is formed on the upper surface of the n-type contact layer 30b, and has a function of confining holes in an active layer 30d described later.
- aluminum gallium arsenide (AlGaAs) is doped with n-type impurities such as silicon (Si) or selenium (Se), and the doping concentration is 1 ⁇ 10 16 to 1 ⁇ 10 20 atoms / cm.
- the thickness is about 3 , and the thickness is about 0.2 to 0.5 ⁇ m.
- silicon (Si) is doped as an n-type impurity at a doping concentration of 1 ⁇ 10 17 to 5 ⁇ 10 17 atoms / cm 3 .
- An active layer 30d is formed on the upper surface of the n-type cladding layer 30c, and functions as a light emitting layer that emits light when carriers such as electrons and holes are concentrated and recombined.
- the active layer 30d is made of aluminum gallium arsenide (AlGaAs) containing no impurities and has a thickness of about 0.1 to 0.5 ⁇ m.
- AlGaAs aluminum gallium arsenide
- the active layer 30d of this embodiment is a layer that does not contain impurities, but may be a p-type active layer that contains p-type impurities or an n-type active layer that contains n-type impurities.
- the band gap of the layer only needs to be smaller than the band gap of the n-type cladding layer 30c and the p-type cladding layer 30e described later.
- a p-type cladding layer 30e is formed on the upper surface of the active layer 30d, and has a function of confining electrons in the active layer 30d.
- AlGaAs aluminum gallium arsenide
- p-type impurities such as zinc (Zn), magnesium (Mg), or carbon (C)
- the doping concentration is 1 ⁇ 10 16 to 1 ⁇ .
- the thickness is about 10 20 atoms / cm 3 and the thickness is about 0.2 to 0.5 ⁇ m.
- magnesium (Mg) is doped as a p-type impurity at a doping concentration of 1 ⁇ 10 19 to 5 ⁇ 10 20 atoms / cm 3 .
- a p-type contact layer 30f is formed on the upper surface of the p-type cladding layer 30e.
- the p-type contact layer 30f is formed by doping aluminum gallium arsenide (AlGaAs) with p-type impurities such as zinc (Zn), magnesium (Mg), or carbon (C), and the doping concentration is 1 ⁇ 10 16 to 1 ⁇ .
- AlGaAs aluminum gallium arsenide
- p-type impurities such as zinc (Zn), magnesium (Mg), or carbon (C)
- the thickness is about 10 20 atoms / cm 3 and the thickness is about 0.2 to 0.5 ⁇ m.
- the p-type contact layer 30f is electrically connected to the wiring board 2 by wire bonding or flip chip connection through the second electrode 31b on the light emitting element side.
- the p-type contact layer 30f has a function of reducing the contact resistance with the second electrode 31b on the light emitting element side connected to the p-type contact layer 30f.
- the first electrode 31a on the light emitting element side is provided as an individual electrode for each light emitting element, the second electrode 31b on the light emitting element side does not need to be provided for each light emitting element, and the first light emitting element side first electrode 31a is not provided. It is sufficient to provide at least one electrode 31b.
- the first electrode 31a on the light emitting element side may be provided as a common electrode, and the first electrode 31b on the light emitting element side may be provided as an individual electrode in each of the light emitting elements.
- a cap layer having a function of preventing oxidation of the p-type contact layer 30f may be formed on the upper surface of the p-type contact layer 30f.
- the cap layer may be formed of, for example, gallium arsenide (GaAs) that does not contain impurities, and the thickness thereof may be about 0.01 to 0.03 ⁇ m.
- the second electrode 31b on the light emitting element side is made of, for example, AuNi, AuCr, AuTi, which is a combination of gold (Au) or aluminum (Al) and nickel (Ni), chromium (Cr), or titanium (Ti) as an adhesion layer. It is made of an AlCr alloy or the like and has a thickness of about 0.5 to 5 ⁇ m and is disposed on the insulating layer 8 formed so as to cover the upper surface of the p-type contact layer 30f from the upper surface of the substrate 30. Therefore, the semiconductor layers other than the substrate 30 and the p-type contact layer 30f are electrically insulated.
- the active layer 30d emits light, and Functions as a light source.
- the light receiving element 3 b is configured by forming a pn junction with the n-type substrate 30 by providing a p-type semiconductor region 32 on one main surface 30 s of the substrate 30.
- the p-type semiconductor region 32 is formed by diffusing p-type impurities in the substrate 30 at a high concentration.
- the p-type impurity include zinc (Zn), magnesium (Mg), carbon (C), boron (B), indium (In), and selenium (Se).
- the doping concentration is 1 ⁇ 10 16 to 1 X10 20 atoms / cm 3 .
- boron (B) is diffused as a p-type impurity so that the thickness of the p-type semiconductor region 32 is about 0.5 to 3 ⁇ m.
- the p-type semiconductor region 32 is electrically connected to the first electrode 33a on the light receiving element side, and the second electrode 33b on the light receiving element side is electrically connected to the substrate 30 which is an n-type semiconductor, although not shown. It is connected.
- the first electrode 33a on the light receiving element side is electrically insulated from the substrate 30 because it is disposed on the upper surface of the substrate 30 with the insulating layer 8 interposed therebetween.
- the first electrode 33a on the light receiving element side and the second electrode 33b on the light receiving element side are made of, for example, gold (Au) and chromium (Cr), aluminum (Al) and chromium (Cr), or platinum (Pt) and titanium (Ti).
- An alloy or the like is formed so that its thickness is about 0.5 to 5 ⁇ m.
- the light receiving element 3b configured as described above, when light enters the p-type semiconductor region 32, a photocurrent is generated by the photoelectric effect, and this photocurrent is extracted through the first electrode 33a on the light receiving element side. Functions as a light detection unit. It is preferable to apply a reverse bias between the first electrode 33a on the light receiving element side and the second electrode 33b on the light receiving element side because the light detection sensitivity of the light receiving element 3b is increased.
- the holding body 5 is disposed on the upper surface of the wiring board 2.
- the side wall portion of the holding body 5 is joined to the upper surface of the wiring substrate 2 so as to surround the light emitting / receiving element 3.
- Adhesives may be used for joining the two, or engaging portions may be used. Then, the light emitted from the light emitting element 3a is prevented from being scattered outside the direction toward the irradiated object, or the light receiving element 3b is prevented from entering light other than the light reflected by the irradiated object, It has a function of protecting the wiring board 2 and the light emitting / receiving element 3 from the external environment.
- Such a holding body 5 is made of a general-purpose plastic such as polypropylene resin (PP), polystyrene resin (PS), vinyl chloride resin (PVC), polyethylene terephthalate resin (PET), acrylonitrile / butadiene / styrene resin (ABS), or polyamide resin.
- PP polypropylene resin
- PS polystyrene resin
- PVC vinyl chloride resin
- PET polyethylene terephthalate resin
- ABS acrylonitrile / butadiene / styrene resin
- PA polyamide resin
- An engineering plastic such as a polycarbonate resin (PC), a super engineering plastic such as a liquid crystal polymer, and a metal material such as aluminum (Al) or titanium (Ti).
- PC polycarbonate resin
- Ti titanium
- a combination of a plurality of materials may also be used.
- the depth and width dimensions of the holding body 5 of the present embodiment are the same as the depth and width dimensions of the wiring board 2, it is not necessarily required to be the same as the dimensions of the wiring board 2, and at least the light emitting element. It is sufficient if the dimensions are such that 3a and the light receiving element 3b are covered.
- the upper wall of the holder 5 is disposed so as to cover the wiring substrate 2 and the light emitting / receiving element 3 together with the side wall portion.
- the upper wall of this embodiment is disposed in contact with the side wall portion. It also has a function of supporting an optical element 4 described later.
- the upper wall of the holding body 5 is formed of the same material as the side wall portion.
- the side wall part and upper wall of this embodiment are integrally formed by injection molding with polycarbonate resin (PC).
- PC polycarbonate resin
- the optical element 4 is formed integrally by joining the first lens 4a and the second lens 4b to each other.
- the first lens 4a and the second lens 4b are integrally formed by joining the curved surfaces constituting each lens halfway.
- the virtual extension line describing the curvature radius of the curved surface constituting the first lens 4a and the virtual extension line depicting the curvature radius of the curved surface constituting the second lens 4b intersect.
- the second lens 4b is arranged on both sides of the first lens 4a with the center in the second direction aligned. For this reason, when the sectional view in the thickness direction passing through the centers of these lenses 4a and 4b is viewed, both sides of the first lens 4a are respectively connected to the second lens 4b in the middle of the lens curved surface.
- the light emitting element 3a and the light receiving element 3b can be arranged close to each other.
- the incident angle to the target object of the emitted light from the light emitting element 3a can be made small by arrange
- the first lens 4a and the second lens 4b may be larger in size in the second direction than in the first direction. That is, each of the first lens 4a and the second lens 4b has a larger effective diameter of the lens in the second direction than that of the lens in the first direction. In other words, the first lens 4a and the second lens 4b are asymmetric in the first direction and the second direction. As a result, the amount of light can be secured by the first lens 4a and the second lens 4b.
- the first lens 4 a and the second lens 4 b constitute a mutual lens on both main surfaces of the first main surface 4 s 1 and the second main surface 4 s 2. Curved surfaces may be joined to each other on the way. As a result, it is easy to collect light on the curved surfaces on both main surfaces of the optical element 4, and the design freedom of the light receiving / emitting element module 1 can be improved.
- the curvature radius of the curved surface on the first principal surface 4s1 side in each of the first lens 4a and the second lens 4b may be smaller than the curvature radius of the curved surface on the second principal surface 4s2 side.
- the curvature radius of the curved surface by the side of the 1st main surface 4s1 in each of the 1st lens 4a and the 2nd lens 4b is set to 3 mm or more and 12 mm or less, for example.
- the curvature radius of the curved surface on the second main surface 4s2 side in each of the first lens 4a and the second lens 4b is set to, for example, 1 m or more.
- the light emitting / receiving element module 1 can be reduced in size by arranging the light emitting element 3a and the light receiving element 3b close to each other. Furthermore, as described above, since the incident angle can be reduced, the distance to the object can be increased.
- the material of the first lens 4a and the second lens 4b is, for example, a thermosetting resin such as silicone resin, urethane resin and epoxy resin, or thermoplastic such as polycarbonate resin, polymethyl methacrylate resin and acrylic resin. Examples thereof include plastics such as resins, sapphire and inorganic glass.
- a thermosetting resin such as silicone resin, urethane resin and epoxy resin
- thermoplastic such as polycarbonate resin, polymethyl methacrylate resin and acrylic resin.
- plastics such as resins, sapphire and inorganic glass.
- first lens 4a and the second lens 4b for example, a cylindrical lens, a spherical lens, or a Fresnel lens formed of silicone resin can be used. Such lenses 4a and 4b may be attached to the upper wall of the holder 5 with an organic adhesive such as silicone resin. Further, the joint between the first lens 4a and the second lens 4b extends, for example, in a straight line parallel to the Y direction when viewed from above in the Z direction.
- the center of the first lens 4a and the center of the light emitting element 3a are shifted when viewed in the perspective direction from the Z direction (thickness direction of the substrate 30).
- the positions of the first lens 4a may be adjusted such that the center of the first lens 4a is located on an imaginary line tilted by 10 ° to 20 ° from the Z direction (normal direction) with the center of the light emitting element 3a as a starting point.
- the optical element 4 can be formed, for example, by forming bonding surfaces on the first lens 4a and the second lens 4b and bonding the bonding surfaces of the individual lenses with an adhesive such as silicone resin.
- the optical element 4 may be integrally formed by pouring the materials of the first lens 4a and the second lens 4b into a mold or the like and curing them. Further, the individual lenses may be mechanically fixed by abutting each other after cutting.
- the first lens 4a and the second lens 4b may constitute one curved surface on the second main surface 4s2 side.
- the first lens 4a and the second lens 4b may constitute one curved surface on the second main surface 4s2 side.
- the curvature radius of one curved surface constituted by the first lens 4a and the second lens 4b may be larger than the curvature radius of the curved surface on the first main surface 4s1 side of each of the first lens 4a and the second lens 4b.
- the curvature radius of the curved surface by the side of the 1st main surface 4s1 in each of the 1st lens 4a and the 2nd lens 4b is set to 3 mm or more and 12 mm or less, for example.
- the curvature radius of one curved surface comprised by the 1st lens 4a and the 2nd lens 4b is set to 1 m or more, for example.
- the light adjusting member 6 may be disposed between the optical element 4 and the light emitting element 3a and the light receiving element 3b.
- the light adjustment member 6 includes a light passage portion 61 through which light emitted from the light emitting element 3a passes through the object and through which reflected light reflected by the object and received by the light receiving element 3b passes.
- the light adjustment member 6 has a function of adjusting the optical path of light emitted from the light emitting element 3a and reducing the reception of stray light by the light receiving element 3b.
- the light adjustment member 6 is formed in a plate shape, for example.
- the light adjusting member 6 may be, for example, a general-purpose plastic such as polypropylene resin (PP), polystyrene resin (PS), vinyl chloride resin (PVC), polyethylene terephthalate resin (PET), acrylonitrile / butadiene / styrene resin (ABS), or polyamide resin.
- PP polypropylene resin
- PS polystyrene resin
- PVC vinyl chloride resin
- PET polyethylene terephthalate resin
- ABS acrylonitrile / butadiene / styrene resin
- PA An engineering plastic such as a polycarbonate resin (PC), a super engineering plastic such as a liquid crystal polymer, and a metal material such as aluminum (Al) or titanium (Ti). It is formed of a resin material or a metal material.
- the light adjusting member 6 is formed of, for example, a light transmissive material, a light absorbing material, or a light shielding material.
- the light adjusting member 6 may be provided separately from the holding body 5 and may be joined to the holding body 5. As shown in FIG. 4, the holding body 5A is used as the light adjusting member 6 and is formed on the upper wall of the holding body 5A. You may form the light passage part 61 (1st light passage part 61a, 2nd light passage part 61b).
- the light passing portion 61 of the light adjusting member 6 is located between the light emitting element 3a and the first lens 4a, and is a first light passing portion 61a that is a through hole penetrating the light adjusting member 6, and the light receiving element 3b and the second light receiving member 3b.
- the light emitting part of the light emitting element 3a, the light receiving part of the light receiving element 3b, the first light passing part 61a and the second light passing part 61b are provided. It is marked with a broken line.
- second light passage portions 61b there are a plurality of second light passage portions 61b, a second light passage portion 61b1 corresponding to the light receiving element 3b1 and the second lens 4b1, and a second light corresponding to the light receiving element 3b2 and the second lens 4b2. And a passage portion 61b2.
- the size of the first light passage portion 61a in the first direction may be smaller than the size of the first lens 4a in the first direction. As a result, for example, it can be reduced that the light from the issuing element 3a does not enter the first lens 4a and becomes stray light.
- the size of the second light passage portion 61b in the first direction may be smaller than the size of the second lens 4b in the first direction. As a result, for example, light (stray light) from other than the second lens 4b can be reduced from being received by the light receiving element 3b.
- the first light passage portion 61a and the second light passage portion 61b exist independently from each other, and the light adjusting member 6 is a light shielding region located between the first light passage portion 61a and the second light passage portion 61b. You may have.
- the optical element 4 is separated from the space where the light emitting element 3a and the light receiving element 3b are arranged. With such a light adjustment member 6, it is possible to separate light traveling from the light emitting element 3a toward the first lens 4a and light traveling from the second lens 4b toward the light receiving element 3b.
- the light adjustment member 6 has a light shielding property at portions other than the first light passage portion 61a and the second light passage portion 61b.
- the first light passage portion 61a may have a size in the second direction larger than a size in the first direction. That is, since the effective diameter in the second direction is larger than the effective diameter in the first direction of the first lens 4a, the size of the first light passage portion 61a is adjusted accordingly, and thereby the light from the light emitting element 3a is adjusted. A large amount of light can be guided to the first lens 4a.
- the shape of the first light passage portion 61a as described above may be rectangular or elliptical.
- the second light passage portion 61b may be made as large as possible corresponding to the effective diameter of the second lens 4b so as to guide much light to the light receiving element 3b.
- the light passage portion 61 is a through-hole penetrating the light adjusting member 6, for example, the light of the light emitting element 3 a is compared with the case where the light passage portion 61 is made of a translucent material. Can easily reduce the loss of light when passing through the light passage portion 61.
- the center of the first lens 4a, the center of the light emitting element 3a, and the center of the first light passage portion 61a do not coincide with each other.
- the positions of the first light passing portions 61a may be adjusted so that the centers of the first light passing portions 61a are located on an imaginary line tilted by 10 ° to 20 ° from the Z direction with the center of the light emitting element 3a as a starting point.
- the light emitting / receiving element module 1B may include optical elements 4B1 and 4B2 as shown in FIGS. 5A and 5B instead of the optical element 4 described above.
- the optical element 4B1 is provided with a groove 41 at the joint between the first lens 4a and the second lens 4b. By providing the groove 41 in this manner, it is possible to suppress the influence of unintended light from the light emitting element 3a and light on the light receiving element 3b.
- the groove 41 is not particularly limited as long as it is smaller than the distance between the first light passage portion 61a and the second light passage portion 61b.
- the first and second lenses 4a and 4b having NA of 0.5 mm are used. If it is, the width may be 100 to 300 ⁇ m and the depth may be 200 to 800 nm.
- channel 41 may be a mirror surface state, it is good also as a structure which suppresses the influence of a direct light by roughening a surface state by embossing etc.
- the groove 41 may be located on the first main surface 4s1 side of the optical element 4B2. As a result, compared with the case where the groove 41 is positioned on the second main surface 4s2 side of the optical element 4B2, it is possible to reduce dust from entering the groove 41, for example. Accordingly, loss of light and the like can be reduced.
- the filling portion 42 is provided in the groove 41 from a light shielding material, a light absorber, or a material having a smaller refractive index than the first and second optical lenses 4a and 4b. May be. Also in this case, it is possible to suppress the influence of unintended light from the light emitting element 3a and light to the light receiving element 3b and to separate the light rays.
- the material of the filling portion 42 it is preferable to use a material that can be easily filled and can relieve stress, and examples thereof include silicone-based and polycarbonate-based black organic resins.
- FIG. 6 is a top view of the main part of the light emitting / receiving element module 1 ⁇ / b> C as seen through from a direction perpendicular to the XY plane.
- the light receiving and emitting element module 1 ⁇ / b> C is an optical device in which a joint portion where the first lens 4 a and the second lens 4 b are joined extends non-parallel to the second direction (Y direction) on the XY plane.
- the element 4C may be included.
- the first lens projects from the first lens 4a side to the second lens 4b1 side as the distance from the central portion in the second direction increases.
- the diffused reflected light is received by the light receiving element 3b2, in order to increase the received light intensity, it is joined so as to protrude from the second lens 4b2 side to the first lens 4a side as the distance from the central portion in the second direction increases. May be.
- the semiconductor material is used as the substrate 30 and the light receiving element 3b is formed in a part of the substrate 30.
- the light receiving and emitting element module 1E having the substrate 30E may be used.
- the substrate 30E is not limited to a semiconductor material, and an SOI substrate, an SOS substrate, a substrate made of an insulating material, a resin substrate, or the like may be used.
- the light receiving / emitting element module 1E including the light emitting element 3a and the light receiving element 3b on the same substrate can be obtained by bonding the light receiving element 3b and the light emitting element 3a formed on different substrates.
- the substrate 30E when a material with high heat dissipation is used as the substrate 30E, a light emitting / receiving element module with high heat dissipation can be provided.
- a wiring board provided with internal wiring the electrical wiring can be easily handled and the integration can be made high.
- the board 30E can also serve as the wiring board 2. Further, by bonding the light emitting element 3a and the light receiving element 3b formed under optimum conditions to the substrate 30E, the performance of each element can be improved.
- the light emitting / receiving element 3 having one light emitting element 3a and two light receiving elements 3b is used.
- a combination of one light emitting element 3a and one light receiving element 3b may be used, or one light emitting element. It may be a combination of 3a and three or more light receiving elements 3b arranged so as to surround it.
- the light emitting element 3a array and the light receiving element 3b array may be arranged side by side.
- the optical element 4 may be formed in accordance with the arrangement of the light emitting element 3a and the light receiving element 3b.
- the light receiving element 3b is a pn type photodiode, but may be a PIn type. Furthermore, the size and shape of the light receiving elements 3b1, 3b2 may be different. Specifically, the light receiving element 3b2 that receives the scattered reflected light having a larger reflection angle and larger variation in the reflection angle than the regular reflection light may have a rectangular shape that is long in the first direction.
- the above-described configuration can sufficiently reduce the incident angle to the irradiated object as compared with the prior art, the incident angle can be further reduced by providing a prism above the optical element 4.
- the sensor device 100 including the light emitting / receiving element module 1 will be described.
- the sensor device 100 of the present embodiment includes a light receiving / emitting element module 1 and a control circuit 101 electrically connected to the light receiving / emitting element module 1.
- the control circuit 101 controls the light emitting / receiving element module 1.
- the control circuit 101 includes, for example, a drive circuit for driving the light emitting element 3a, an arithmetic circuit for processing current from the light receiving element 3b, or a communication circuit for communicating with an external device.
- the surface on which the light emitting element 3a and the light receiving element 3b of the light emitting / receiving element module 1 are formed is disposed so as to face the intermediate transfer belt V. Then, light is applied to the toner T on the intermediate transfer belt V from the light emitting element 3a. In the present embodiment, the light emitted from the light emitting element 3a is incident on the toner T on the intermediate transfer belt V through the first lens 4a. Then, the regular reflection light L2 with respect to the incident light L1 is received by the light receiving element 3b through the second lens 4b. A photocurrent is generated in the light receiving element 3b according to the intensity of the received light, and the photocurrent is detected by the control circuit 101.
- the photocurrent corresponding to the intensity of the regular reflection light from the toner T can be detected as described above. Therefore, for example, when the photocurrent value detected from the light receiving element 3b is large, the position of the toner T on the intermediate transfer belt V can be detected such that the toner T is located at this position. Note that the intensity of the specularly reflected light also corresponds to the density of the toner T. Therefore, the density of the toner T can be detected according to the magnitude of the generated photocurrent.
- the intensity of the specularly reflected light also corresponds to the distance from the light emitting / receiving element 3 to the toner T, and therefore the distance between the light receiving / emitting element 3 and the toner T is detected according to the magnitude of the generated photocurrent. It is also possible.
- corresponds to surface information, such as uneven
- the above-described effects of the light emitting / receiving element module 1 can be achieved.
- Example 1 the measurement result which measured the sensing performance of the sensor apparatus of this embodiment (it is set as Example 1) and the sensor apparatus of the comparative examples 1 and 2 in FIG. 9 is shown.
- Comparative Example 1 a shell-type light emitting component (LED component) and a PD component are arranged so that the upper surface thereof is inclined with respect to the irradiated surface at an angle of 30 °.
- Comparative Example 2 instead of the optical element 4 of the sensor device 100, a lens using independent lenses in which a plurality of lenses are not joined to each other in the middle of the radius of curvature is used. Using each of these sensor devices, the photocurrent of the light receiving element 3b1 was measured for a plurality of irradiated objects having different surface states. Thus, the reflectance of incident light can be relatively changed by varying the surface state of the irradiated object.
- the light adjusting member 6 is described as an example of a configuration in which the light adjusting member 6 is formed of a light blocking material as a modification of the light receiving and emitting element module 1. May consist of a translucent material.
- the light adjusting member 6 may be formed of a translucent resin material, and the light shielding member may be disposed at a portion to be shielded from light.
- the example in which the lenses are bonded together with an adhesive as the method of forming the optical element 4 has been described.
- the first lens 4a and the second lens 4b are bonded.
- the agent may be light-shielding.
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Abstract
Description
図1(a)および(b)に示す受発光素子モジュール1は、例えばコピー機やプリンタなどの画像形成装置に組み込まれて、トナーやメディアなどの被照射物の位置情報、距離情報または表面情報などを検出するセンサ装置として機能する。また、受発光素子モジュール1は、例えば締め固めた粉体または生物の皮膚などの表面情報を検出するセンサ装置、あるいは紙などの位置情報を検出し、紙などの数などを計測する装置としても適用可能である。なお、図1(b)において、各構成要素の位置関係が明白となるように、発光素子3aの発光部、受光素子3bの受光部は破線で示している。
図3に示すように、第1レンズ4aおよび第2レンズ4bは、第2主面4s2側において、1つの曲面を構成してもよい。その結果、光学素子4Aの第2主面4s2側において、第1レンズ4aと第2レンズ4bとの接合部における凹みがなくなり、光学素子4Aの第2主面4s2側に埃が溜まりにくくなる。また、仮に光学素子4Aの第2主面4s2に埃が付着したとしても、埃を除去しやすくなる。
図4に示すように、光学素子4と発光素子3aおよび受光素子3bとの間に光調整部材6を配置してもよい。光調整部材6は、発光素子3aが被対象物へ照射する光が通過し、かつ被対象物で反射して受光素子3bで受光される反射光が通過する光通過部61を有する。これにより、光調整部材6は、発光素子3aから発する光の光路を調整したり、受光素子3bに迷光が受光されることを低減したりする機能を有する。光調整部材6は、例えば板状に形成されている。
受発光素子モジュール1Bは、上述の光学素子4に代えて、図5(a)、図5(b)に示すように光学素子4B1、4B2を備えていてもよい。図5(a)に示すように、光学素子4B1は、第1レンズ4aと第2レンズ4bとの接合部に溝41を設けている。このように溝41を設けることにより、意図せぬ発光素子3aからの光、受光素子3bへの光の影響を抑制することができる。
図6は、XY平面に垂直な方向から透視状態で見た、受発光素子モジュール1Cの要部上面図である。受発光素子モジュール1Cは、図6に示すように、XY平面において、第1レンズ4aと第2レンズ4bとが接合される接合部が第2方向(Y方向)と非平行に延びるような光学素子4Cを有していてもよい。
受発光素子モジュール1Dは、図7(a)に示すように、第1レンズ4aおよび第2レンズ4b1のみ接合されており、第2レンズ4b2は接合されていなくてもよいし、図7(b)に示すように、第1レンズ4aおよび第2レンズ4bの曲率半径は互いに異なっていてもよい。このような構成とすることで、受発光素子モジュール1Dの設計の自由度を向上させることができる。
上述の例では、基板30として半導体材料を用い、基板30の一部に受光素子3bを作りこんだ例を用いて説明したが、基板30Eを有する受発光素子モジュール1Eとしてもよい。基板30Eは半導体材料に限定されず、SOI基板、SOS基板、絶縁性材料からなる基板、樹脂基板等を用いてもよい。この場合には、別基板に形成した受光素子3b、発光素子3aを貼り合わせることにより、同一基板上に発光素子3a、受光素子3bを備えた受発光素子モジュール1Eとすることができる。
上述の例では、1つの発光素子3aと2つの受光素子3bとを有する受発光素子3を用いたが、1つの発光素子3aと1つの受光素子3bとの組み合わせでもよいし、1つの発光素子3aとそれを囲むように配置された3以上の受光素子3bとの組み合わせとしてもよい。さらに、発光素子3aアレイと受光素子3bアレイとを並べて配置したものとしてもよい。この場合には、発光素子3aと受光素子3bとの配置に合わせ、光学素子4も形成すればよい。
次に、受発光素子モジュール1を備えたセンサ装置100について説明する。図8に示すように、本実施形態のセンサ装置100は、受発光素子モジュール1と、受発光素子モジュール1に電気的に接続された制御用回路101とを有している。制御用回路101は、受発光素子モジュール1を制御するものである。制御用回路101は、例えば、発光素子3aを駆動させるための駆動回路、受光素子3bからの電流を処理する演算回路または外部装置と通信するための通信回路等を含んでいる。
2 配線基板
3 受発光素子
3a 発光素子
3b 受光素子
4 光学素子
4s1 第1主面
4s2 第2主面
4a 第1レンズ
4b 第2レンズ
5 保持体
6 光調整部材
61 光通過部
61a 第1光通過部
61b 第2光通過部
8 絶縁層
30 基板
30s 一主面
30a バッファ層
30b n型コンタクト層
30c n型クラッド層
30d 活性層
30e p型クラッド層
30f p型コンタクト層
31a 発光素子側の第1電極
31b 発光素子側の第2電極
32 p型半導体領域
33a 受光素子側の第1電極
33b 受光素子側の第2電極
100 センサ装置
101 制御用回路
Claims (16)
- 基板と、前記基板の一主面に位置する発光素子と、前記基板の一主面に位置し、前記発光素子と第1方向に並んで配置される受光素子と、前記基板の前記一主面と間隔を空けて配置されるとともに、前記一主面に対向する第1主面と前記第1主面とは反対側の第2主面とを有する光学素子と、を有する受発光素子モジュールであって、
前記光学素子は、前記発光素子からの光を被対象物に導く第1レンズと、前記被対象物によって反射された光を前記受光素子に導く第2レンズと、を含み、
前記第1レンズと前記第2レンズとは、前記第1方向に並んで配置されるとともに、前記第1主面および前記第2主面のうち少なくとも一方主面側において前記第1レンズを構成する曲面と前記第2レンズを構成する曲面とがその途中で互いに交わっている、受発光素子モジュール。 - 前記第1レンズおよび前記第2レンズは、前記第1方向と直交し且つ前記基板の一主面に沿った第2方向における大きさが、前記第1方向における大きさに比べて大きい、請求項1に記載の受発光素子モジュール。
- 前記第1レンズと前記第2レンズとは、前記第1主面側および前記第2主面側において、互いの曲面がその途中で接合されてなる、請求項1または2に記載の受発光素子モジュール。
- 前記第1レンズおよび前記第2レンズのそれぞれにおける前記第1主面側の曲面の曲率半径は、前記第2主面側の曲面の曲率半径よりも小さい、請求項3に記載の受発光素子モジュール。
- 前記第1レンズおよび前記第2レンズは、前記第2主面側において、1つの曲面を構成する、請求項1または2に記載の受発光素子モジュール。
- 前記第1レンズおよび前記第2レンズで構成する前記1つの曲面の曲率半径は、前記第1レンズおよび前記第2レンズのそれぞれの前記第2主面側の曲面の曲率半径よりも大きい、請求項5に記載の受発光素子モジュール。
- 前記光学素子は、前記第1レンズと前記第2レンズとの接合部に溝を有する、請求項1~6のいずれかに記載の受発光素子モジュール。
- 前記溝は、前記光学素子の前記第1主面側に位置している、請求項7に記載の受発光素子モジュール
- 前記第1レンズと前記第2レンズとが接合される接合部は、前記第1方向と直交し且つ前記基板の一主面に沿った第2方向に対して非平行に延びている、請求項1~8のいずれかに記載の受発光素子モジュール。
- 前記光学素子と、前記発光素子および前記受光素子との間に配置される光調整部材をさらに有しており、
前記光調整部材は、発光素子が発する光および受光素子が受光する光が通過する光通過部を有する、請求項1~9のいずれかに記載の受発光素子モジュール。 - 前記光通過部は、前記発光素子と前記第1レンズとの間に位置する第1光通過部を有し、前記第1方向における前記第1光通過部の大きさは、前記第1方向における前記第1レンズの大きさよりも小さい、請求項10に記載の受発光素子モジュール。
- 前記光通過部は、前記発光素子と前記第2レンズとの間に位置する第2光通過部を有し、前記第1方向における前記第2光通過部の大きさは、前記第1方向における前記第2レンズの大きさよりも小さい、請求項10または11に記載の受発光素子モジュール。
- 前記第1光通過部は、前記第1方向と直交し且つ前記基板の一主面に沿った第2方向における大きさが、前記第1方向における大きさよりも大きい、請求項11に記載の受発光素子モジュール。
- 前記光通過部は、前記光調整部材を貫通した貫通孔である、請求項10に記載の受発光素子モジュール。
- 前記基板は、一導電型の半導体材料からなり、
前記発光素子は、前記基板の前記一主面に複数の半導体層が積層された積層体であり、
前記受光素子は、前記基板の前記一主面に逆導電型の不純物を含む領域を有する、請求項1~14のいずれかに記載の受発光素子モジュール。 - 請求項1~15のいずれかに記載の受発光素子モジュールと、
前記受発光素子モジュールに電気的に接続され、前記受発光素子モジュールを制御する制御用回路と、を有するセンサ装置であって、
前記発光素子から被照射物に光を照射し、該被照射物からの反射光に応じて出力される前記受光素子からの出力電流に応じて前記被照射物の位置情報、距離情報および表面情報のうち少なくとも1つを検出する、センサ装置。
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018120961A (ja) * | 2017-01-25 | 2018-08-02 | パナソニックIpマネジメント株式会社 | 発光装置及び照明装置 |
WO2018190254A1 (ja) * | 2017-04-14 | 2018-10-18 | Tdk株式会社 | 平凸レンズ、ファイバアレイモジュール及び受光モジュール |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10705340B2 (en) * | 2017-02-14 | 2020-07-07 | Facebook Technologies, Llc | Lens assembly including a silicone fresnel lens |
CN107153199A (zh) * | 2017-03-23 | 2017-09-12 | 深圳市速腾聚创科技有限公司 | 激光雷达及激光雷达控制方法 |
JP6383460B1 (ja) | 2017-05-31 | 2018-08-29 | 浜松ホトニクス株式会社 | エンコーダ用受光モジュール及びエンコーダ |
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CN112912984A (zh) * | 2018-10-30 | 2021-06-04 | 京瓷株式会社 | 光学传感器装置 |
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JP7267304B2 (ja) * | 2018-12-25 | 2023-05-01 | 京セラ株式会社 | 光学センサ装置 |
JPWO2021085098A1 (ja) * | 2019-10-30 | 2021-05-06 | ||
KR102275369B1 (ko) * | 2020-01-02 | 2021-07-12 | 주식회사 씨티랩 | 자외선 경화 장치 |
CN115298836A (zh) * | 2020-04-28 | 2022-11-04 | 索尼集团公司 | 光学模块 |
JP7344333B1 (ja) * | 2022-03-22 | 2023-09-13 | 維沃移動通信有限公司 | 測距装置及び電子機器 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0562881U (ja) * | 1992-01-29 | 1993-08-20 | シャープ株式会社 | 反射型光電スイツチ |
JPH0832106A (ja) * | 1994-07-14 | 1996-02-02 | Toshiba Electron Eng Corp | 光半導体装置及び基板実装装置 |
JPH0888399A (ja) * | 1994-09-19 | 1996-04-02 | Oki Electric Ind Co Ltd | 光半導体装置 |
JP2939045B2 (ja) | 1992-05-06 | 1999-08-25 | シャープ株式会社 | 測距センサ |
JP2001168376A (ja) * | 1999-12-03 | 2001-06-22 | Matsushita Electronics Industry Corp | 赤外線データ通信モジュール |
JP2013131601A (ja) * | 2011-12-21 | 2013-07-04 | Kyocera Corp | 受発光素子モジュールおよびこれを用いたセンサ装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07119893B2 (ja) * | 1986-09-22 | 1995-12-20 | オリンパス光学工業株式会社 | 内視鏡光学系 |
US5488468A (en) | 1991-12-26 | 1996-01-30 | Sharp Kabushiki Kaisha | Optical distance measuring apparatus having semiconductor position sensitive photodetector |
JP3109885B2 (ja) | 1991-12-26 | 2000-11-20 | キヤノン株式会社 | 光半導体装置 |
JP3305120B2 (ja) * | 1994-06-30 | 2002-07-22 | キヤノン株式会社 | 光学素子の成形用型部材の加工方法 |
JP3778011B2 (ja) | 2001-06-19 | 2006-05-24 | ソニー株式会社 | 投受光パッケージ |
JP2003149409A (ja) | 2001-06-19 | 2003-05-21 | Rohm Co Ltd | レンズアレイおよびレンズアレイユニットの製造方法、ならびに光学装置 |
GB2486000A (en) * | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | Optical proximity detectors with arrangements for reducing internal light propagation from emitter to detector |
JP2012191097A (ja) * | 2011-03-14 | 2012-10-04 | Toshiba Corp | 固体撮像装置 |
CN103890973B (zh) | 2011-10-31 | 2016-07-20 | 京瓷株式会社 | 利用了受光发光一体型元件的受光发光装置及传感器装置 |
US9465191B2 (en) * | 2013-06-21 | 2016-10-11 | Microsoft Technology Licensing, Llc | Lenses for curved sensor systems |
-
2014
- 2014-12-15 JP JP2015553532A patent/JPWO2015093442A1/ja active Pending
- 2014-12-15 US US15/105,482 patent/US10162047B2/en active Active
- 2014-12-15 WO PCT/JP2014/083155 patent/WO2015093442A1/ja active Application Filing
- 2014-12-15 CN CN201480068544.XA patent/CN105830233B/zh active Active
- 2014-12-15 EP EP14872504.7A patent/EP3086376B1/en active Active
-
2017
- 2017-07-24 JP JP2017142947A patent/JP6438083B2/ja active Active
- 2017-07-24 JP JP2017142946A patent/JP6420423B2/ja active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0562881U (ja) * | 1992-01-29 | 1993-08-20 | シャープ株式会社 | 反射型光電スイツチ |
JP2939045B2 (ja) | 1992-05-06 | 1999-08-25 | シャープ株式会社 | 測距センサ |
JPH0832106A (ja) * | 1994-07-14 | 1996-02-02 | Toshiba Electron Eng Corp | 光半導体装置及び基板実装装置 |
JPH0888399A (ja) * | 1994-09-19 | 1996-04-02 | Oki Electric Ind Co Ltd | 光半導体装置 |
JP2001168376A (ja) * | 1999-12-03 | 2001-06-22 | Matsushita Electronics Industry Corp | 赤外線データ通信モジュール |
JP2013131601A (ja) * | 2011-12-21 | 2013-07-04 | Kyocera Corp | 受発光素子モジュールおよびこれを用いたセンサ装置 |
Non-Patent Citations (1)
Title |
---|
See also references of EP3086376A4 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018120961A (ja) * | 2017-01-25 | 2018-08-02 | パナソニックIpマネジメント株式会社 | 発光装置及び照明装置 |
WO2018190254A1 (ja) * | 2017-04-14 | 2018-10-18 | Tdk株式会社 | 平凸レンズ、ファイバアレイモジュール及び受光モジュール |
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