WO2015043263A1 - 有机电致发光器件的封装结构及封装方法、显示装置 - Google Patents
有机电致发光器件的封装结构及封装方法、显示装置 Download PDFInfo
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- WO2015043263A1 WO2015043263A1 PCT/CN2014/080902 CN2014080902W WO2015043263A1 WO 2015043263 A1 WO2015043263 A1 WO 2015043263A1 CN 2014080902 W CN2014080902 W CN 2014080902W WO 2015043263 A1 WO2015043263 A1 WO 2015043263A1
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- thin film
- film
- organic
- electroluminescent device
- fluorocarbon
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- 239000001301 oxygen Substances 0.000 abstract description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract description 13
- 230000000903 blocking effect Effects 0.000 abstract description 2
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- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 9
- 229920000307 polymer substrate Polymers 0.000 description 9
- 239000010453 quartz Substances 0.000 description 9
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- LIXVMPBOGDCSRM-UHFFFAOYSA-N nonylbenzene Chemical class CCCCCCCCCC1=CC=CC=C1 LIXVMPBOGDCSRM-UHFFFAOYSA-N 0.000 description 6
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- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
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- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 1
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- UHPJWJRERDJHOJ-UHFFFAOYSA-N ethene;naphthalene-1-carboxylic acid Chemical compound C=C.C1=CC=C2C(C(=O)O)=CC=CC2=C1 UHPJWJRERDJHOJ-UHFFFAOYSA-N 0.000 description 1
- 229920005570 flexible polymer Polymers 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- ZHPNWZCWUUJAJC-UHFFFAOYSA-N fluorosilicon Chemical group [Si]F ZHPNWZCWUUJAJC-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/87—Passivation; Containers; Encapsulations
- H10K59/873—Encapsulations
- H10K59/8731—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
- H10K50/8445—Encapsulations multilayered coatings having a repetitive structure, e.g. having multiple organic-inorganic bilayers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/40—Thermal treatment, e.g. annealing in the presence of a solvent vapour
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/351—Thickness
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
Definitions
- At least one embodiment of the present invention is directed to a package structure and package method of an organic electroluminescence device, and a display device. Background technique
- OLEDs organic electroluminescent diodes
- TFT-LCDs thin film transistor liquid crystal displays
- OLED devices are generally formed by using a rigid glass substrate or a flexible polymer substrate as a carrier by depositing a transparent anode, a metal cathode, and two or more organic light-emitting layers sandwiched therebetween. These organic light-emitting layers generally include a hole injection layer, a hole transport layer, a light-emitting layer, an electron transport layer, an electron injection layer, and the like. OLED devices are very sensitive to oxygen and moisture. If oxygen and moisture penetrate into the OLED device, it can cause undesirable phenomena such as black spots, pinholes, electrode oxidation, and organic material chemical reactions, which affects the lifetime of OLED devices. Therefore, packaging technology is one of the main technologies for realizing OLED industrialization.
- packaging technology mainly includes three types of metal cover packaging, glass cover packaging and thin film packaging technology. Both of the first packages require the application of a sealant around the organic light-emitting region and the placement of a moisture absorbent therein.
- the thin film encapsulation technique uses an alternating multilayer film structure of an organic polymer film and an inorganic film prepared by a vacuum coating process.
- the inorganic film has high density, is a main water-oxygen barrier layer, and the organic polymer film serves as a buffer layer, and the organic polymer film can effectively suppress the inorganic film because of high elasticity. Cracking. Summary of the invention
- the package structure and packaging method and the display device of the organic electroluminescent device provided by at least one embodiment of the present invention can effectively improve the water and oxygen barrier capability of the thin film encapsulation layer, thereby effectively extending The lifetime of OLED devices.
- At least one embodiment of the present invention provides a package structure of an organic electroluminescent device, comprising: a substrate; an organic electroluminescent device on the substrate; and at least one thin film encapsulation layer covering the organic electroluminescent device
- the thin film encapsulation layer includes an inorganic thin film and a fluorocarbon polymer film.
- At least one embodiment of the present invention also provides a display device comprising the package structure of the organic electroluminescent device as described above.
- At least one embodiment of the present invention also provides a method of packaging an organic electroluminescent device, comprising: providing a substrate; preparing an organic electroluminescent device on the substrate; and forming on the organic electroluminescent device At least one thin film encapsulation layer comprising an inorganic thin film and a fluorocarbon polymer film.
- FIG. 1 is a schematic diagram of a package structure of an organic electroluminescent device according to at least one embodiment of the present invention
- Fig. 2 is a schematic view showing the structure of a thin film encapsulation layer comprising an inorganic thin film, an organic polymer thin film and a fluorocarbon polymer thin film.
- both the metal cover package and the glass cover package have both types of packaging methods. It has better water and oxygen barrier ability, but the metal cover is opaque and is not suitable for many applications.
- the glass cover has the disadvantage of low mechanical strength, which makes the display device relatively thick and can not meet the people's flexibility and thinness for OLED devices. Demand.
- the inorganic film has low elasticity and large internal stress, and thus is relatively susceptible to cracking by external force or peeling off from the OLED device;
- Organic polymer films have poor barrier properties to water and oxygen, and even some organic polymers have strong water absorption properties, so water vapor has the opportunity to pass through defects of inorganic thin films adjacent to these organic polymer films into OLED devices. Internally, the lifetime of the OLED device is reduced.
- the package structure, the encapsulation method and the display device of the organic electroluminescent device provided by at least one embodiment of the present invention can effectively improve the water and oxygen barrier capability of the thin film encapsulation layer, thereby effectively extending
- the package structure includes: a substrate 3 for supporting the OLED device 2; an OLED device 2 on the substrate 3; and an OLED covering At least one thin film encapsulation layer 1 of device 2.
- the film encapsulation layer 1 comprises an inorganic film 11 and a fluorocarbon polymer film 13.
- the package structure further includes an organic polymer film 12 between the inorganic film 11 and the fluorocarbon polymer film 13.
- a dense fluorocarbon polymer film is added to the film encapsulation layer, and the fluorocarbon polymer has an extremely low surface energy and a strong hydrophobic ability, thereby being effective. Improve the ability of the film encapsulation layer to block water oxygen.
- the fluorocarbon polymer film is easy to form a relatively smooth topography, the inorganic film prepared thereon is also easy to obtain smooth, less pinhole. The morphological application of the thin film encapsulation layer in the package of the OLED device can effectively extend the lifetime of the OLED device and improve the reliability of the OLED device during storage and use.
- one or more thin film encapsulation layers may be covered on the OLED device as needed.
- the OLED device may be covered with 1 to 20 thin film encapsulation layers.
- n thin film encapsulation layers are superposed on each other over the OLED device.
- the fluorocarbon polymer film is a polymer film formed, for example, by fluorocarbon gas plasma polymerization, and the fluorocarbon gas includes CHF 3 , C 3 F 8 , C 4 F 10 , C 2 F 4 . And ⁇ 4 ? 8 One or several combinations. It should be noted that the fluorocarbon polymer film may also be formed by using other fluorocarbon compounds than the above-mentioned fluorocarbon gas, which is not limited herein.
- the inorganic thin film has a thickness of 5 nm to 200 nm
- the fluorocarbon polymer film has a thickness of 5 nm to 200 nm
- the organic polymer film has a thickness of 5 nm to 200 nm.
- the material of the inorganic thin film is selected from the group consisting of A1 2 0 3 , Ti0 2 , Zr0 2 , MgO, Hf0 2 , Ta 2 0 5 , Si 3 N 4 , A1N, SiN, SiNO, SiO, Si0 2 , SiO x . , a combination of one or more of SiC and ITO.
- the material of the organic polymer is selected from the group consisting of PET (polyethylene terephthalate), PEN (ethylene naphthalate), PC (polycarbonate), PI (polyamide) Amine), PVC (polyvinyl chloride), PS (polystyrene), PMMA (polyalkyl methacrylate), PBT (polybutylene terephthalate), PSO (polysulfone), PES (poly) P-Diethyl sulfone), PE (polyethylene), PP (polypropylene), silicone (polysiloxane), PA (polyamide), PVDF (polyvinylidene fluoride), EVA (ethylene-vinyl acetate copolymerization ), EVAL (ethylene-vinyl alcohol copolymer), PAN (polypropylene cyanide), PVAc (polyvinyl acetate), Parylene (poly(p-phenylene) phenyl), Polyurethane
- the package structure of the OLED device is the same as the above embodiment, and will not be described herein. In addition, the structure of other parts of the display device will not be described in detail herein.
- the display device can be: a product or a component having any display function such as electronic paper, television, display, digital photo frame, mobile phone, tablet, and the like.
- At least one embodiment of the present invention also provides a method of packaging an organic electroluminescent device, comprising: providing a substrate; preparing the OLED device on the substrate; and forming at least one thin film package on the OLED device
- the layer, the thin film encapsulation layer comprises an inorganic thin film and a fluorocarbon polymer film.
- the thin film encapsulation layer may further include an organic polymer film between the inorganic thin film and the fluorocarbon polymer film.
- a dense fluorocarbon polymer film is added to the film encapsulation layer, and the fluorocarbon polymer is effective because of its extremely low surface energy and strong hydrophobic ability. Improve the ability of the film encapsulation layer to block water oxygen.
- the fluorocarbon polymer film is easy to form a relatively smooth topography, the inorganic film prepared thereon is also easy to obtain smooth, less pinhole. Morphology, the thin film encapsulation layer is applied to the package of the OLED device, which can effectively extend the OLED The lifetime of the device is beneficial to improve the reliability of the OLED device during storage and use.
- forming a thin film encapsulation layer on the OLED device includes depositing, for example, a layer of an inorganic material on the OLED device to form the inorganic thin film; and forming the fluorocarbon polymerization, for example, by fluorocarbon gas plasma polymerization. Film.
- forming the thin film encapsulation layer on the OLED device further comprises: depositing, for example, a layer of an organic polymer on the inorganic film to form the organic polymer film.
- depositing, for example, a layer of inorganic material on the OLED device to form the inorganic thin film comprises: depositing on the OLED device by ion beam sputtering or magnetron sputtering deposition or atomic layer deposition, for example A layer of inorganic material forms the inorganic film.
- Depositing, for example, a layer of an organic polymer on the inorganic film to form the organic polymer film comprises: depositing, for example, a layer of an organic polymer on the inorganic film by a solution film forming method or a chemical vapor deposition method.
- An organic polymer film For example, the organic polymer film is formed on the inorganic film by chemical vapor deposition.
- the forming the fluorocarbon polymer film on the organic polymer film comprises: performing radio frequency discharge on a fluorocarbon gas to generate a fluorocarbon gas plasma.
- the RF source frequency is 13.56 MHz
- the RF source power is 50-200 W
- the ambient pressure is 300-400 mTorr
- the fluorocarbon gas flow rate is 20-80 sccm.
- the fluorocarbon gas comprises a combination of one or more of CHF 3 , C 3 F 8 , C 4 F 10 , C 2 F 4 , and ⁇ 4 8 .
- radio frequency source frequency and the like in the embodiments of the present invention are merely used to exemplarily describe conditions for radio frequency discharge of a fluorocarbon gas to generate a fluorocarbon gas plasma, but embodiments of the present invention are not limited thereto.
- the fluorocarbon polymer film may be formed by using a fluorocarbon compound other than the above fluorocarbon gas, which is not limited herein.
- the organic polymer film has poor barrier property against water and oxygen, and even some organic polymers themselves have strong water absorption, so water vapor has a chance to pass through the phase.
- the defects of the adjacent inorganic thin film enter the inside of the OLED device, so that the lifetime of the OLED device is lowered.
- the fluorine atom has a smaller atomic size and Larger electronegativity can form stable chemical bonds with other atoms (such as carbon atoms), so the fluorine atoms can effectively reduce the surface energy of the material.
- Materials for example, inorganic materials, organic polymers
- CHF 3 gas is polymerized after surface plasma treatment to form a CFx layer on the ITO surface, which makes the ITO hydrophobic and can improve the flatness of the ITO surface.
- the plasma generated by CF 4 gas and The chemical bond changes after the surface of the silicone rubber acts, and a fluorocarbon functional group and a fluorosilicon functional group are formed on the surface of the silicone rubber, which can improve the hydrophobicity of the silicone rubber.
- At least one embodiment of the present invention provides a method of adding a dense fluorocarbon polymer film to a thin film encapsulation layer, since the fluorocarbon has both extremely low surface energy and strong The hydrophobic ability, therefore, the thin film encapsulation method is applied to the packaging of the OLED, and the water blocking ability of the thin film encapsulation layer can be greatly improved.
- Example 1 Al 2 O 3 (50 nm) / polychlorinated p-nonylbenzene (50 nm) / CFx (10 nm)
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c ⁇ depositing a layer of A1 2 0 3 film on the substrate subjected to step b by ion beam sputtering deposition, the vacuum degree in the deposition chamber is l (T 6 Pa, deposition time is 10 min, A1 2 0 3 film) The thickness is 50 ⁇ ;
- Step d depositing a layer of polychlorinated p-terphenylbenzene on the A1 2 0 3 film by chemical vapor deposition, for example, first sublimating solid C-type polychlorinated p-benzoquinone at 100 Q C , the C-type polychlorinated p-terphenylbenzene cleaves two side chain carbon-carbon bonds at 630 ° C to form a stable active monomer, and then the active monomer is introduced into the deposition chamber through a catheter and deposited in A1 2 0 3 On the film, the vacuum in the deposition chamber is 1 (T 6 Pa, deposition time is 5 min, and the deposited C-type polychlorinated p-benzoquinone is 50 nm thick;
- Step e Application on polychlorinated p-phenylene layer deposition thickness manner
- CHF 3 gas plasma polymerized polymer film is 10nm CFx example, may be a radio frequency discharge of CHF 3 gas, CHF 3
- a plurality of thin film encapsulation layers can be formed on the OLED device to obtain a package structure of the OLED device. If it is necessary to form M thin film encapsulation layers on the OLED device, then The above steps are repeated M times. For example, this embodiment can repeat the above steps ce three times to form a thin film encapsulation layer having a three-layer fluorocarbon polymer film.
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c depositing a SiO film on the substrate subjected to step b by magnetron sputtering, the vacuum in the deposition chamber is 10 -5 Pa, the deposition time is 10 min, and the thickness of the SiO film is 100 nm;
- the solid C-type polychloro-p-quinone is sublimed at 100 ° C to make the C-type polychlorinated
- the two side chain carbon-carbon bonds at 630 ° C are broken to form a stable active monomer, and the active monomer is introduced into the deposition chamber through a catheter and deposited on the SiO film.
- the vacuum in the deposition chamber is l (T 6 Pa, deposition time is 20 min, deposited C-type polychlorinated p-quinone benzene thickness is 200 nm;
- Step e deposition on the polychlorinated p-phenylene layer by CHF 3 gas plasma polymerization CFx polymer film having a thickness of 20nm to form a package structure of the OLED device.
- radio frequency discharge CHF 3 gas, CHF 3 gas plasma is generated, in one example, the RF source frequency 13.56MHz, the RF power source 50 -200W, for example 200W, ambient pressure is 300-400m Torr, for example, 350 mTorr, CHF 3 gas flow rate is 20-80 sccm, for example 20 sccm.
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c depositing a layer of SiON film on the substrate subjected to step b by magnetron sputtering, the vacuum in the deposition chamber is 10 -5 Pa, the deposition time is 10 min, and the thickness of the SiON film is 100 nm; ⁇
- a method of chemical vapor deposition is used to deposit a layer of polychlorinated p-terphenylbenzene on the SiON film.
- the solid C-type polychloro-p-quinone is sublimed at 100 ° C to make C-type polychlorinated
- the two side chain carbon-carbon bonds at 630 ° C are broken to form a stable active monomer, and the active monomer is introduced into the deposition chamber through a catheter and deposited on the SiON film.
- the vacuum in the deposition chamber is l (T 6 Pa, deposition time is 20 min, deposited C-type polychlorinated p-quinone benzene thickness is 200 nm;
- Step e deposition on the polychlorinated p-phenylene layer by CHF 3 gas plasma polymerization
- a CFx polymer film having a thickness of 20 nm forms a package structure of the OLED device.
- the CHF 3 gas can be subjected to radio frequency discharge to generate a CHF 3 gas plasma.
- the RF source frequency is 13.56 MHz
- the RF source power is 50-200 W, for example, 100 W
- the ambient pressure is 300-400 mTorr, for example
- the 400 mTorr, CHF 3 gas flow rate is 20-80 sccm, for example 50 sccm.
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c depositing a SiN film on the substrate subjected to step b by magnetron sputtering, the vacuum in the deposition chamber is 10 -6 Pa, the deposition time is 10 min, and the thickness of the SiN film is 30 nm;
- the solid C-type polychloro-p-quinone is sublimed at 100 ° C to make C-type polychlorinated
- the two side chain carbon-carbon bonds at 630 ° C are broken to form a stable active monomer, and the active monomer is introduced into the deposition chamber through a catheter and deposited on the SiN film.
- the vacuum in the deposition chamber is 10 _6 Pa, deposition time is 5 min, deposited C-type polychlorinated p-quinone benzene thickness is 50 nm;
- Step e A CFx polymer film having a thickness of 10 nm was deposited by a plasma polymerization of CHF 3 gas on a polychlorinated p-benzoquinone layer.
- RF gas discharge can be performed on CHF 3 gas to generate 0 ⁇ 3 gas plasma.
- the RF source frequency is 13.56 MHz
- the RF source power is 50-200 W, for example 150 W
- the ambient pressure is 300-400 mTorr, for example.
- the CHF 3 gas flow rate is 20-80 sccm, for example 40 sccm.
- a plurality of thin film encapsulation layers can be formed on the OLED device to obtain a package structure of the OLED device. If it is desired to form M thin film encapsulation layers on the OLED device, the above steps are repeated M times. For example, this embodiment can repeat the above steps c-e three times to form a thin film encapsulation layer having a three-layer fluorocarbon polymer film.
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c depositing a SiN film on the substrate subjected to step b by magnetron sputtering, the vacuum in the deposition chamber is 10 -5 Pa, the deposition time is 10 min, and the thickness of the SiN film is 30 nm;
- Step d pouring a mixture of an acrylic epoxy resin and a photoinitiator onto the SiN film, casting into a film (a solution film forming method), and polymerizing by ultraviolet light irradiation to form a ring having a thickness of 200 nm.
- Oxygen resin film
- Step e depositing a CFx polymer film having a thickness of 20 nm on a film of epoxy resin by C 2 F 4 gas plasma polymerization to form a package structure of the OLED device.
- a C 2 F 4 gas can be radio-discharged to generate a C 2 F 4 gas plasma.
- the RF source frequency is 13.56 MHz
- the RF source power is 50-200 W, for example 150 W
- the ambient pressure is 300- 400 mTorr, for example 300 mTorr
- C 2 F 4 gas flow rate is 20-80 sccm, for example 50 sccm.
- Example 6 Al 2 0 3 (5 bandit) / polychlorotrifluoroethylene (50nm) / CFx (10 bandit) p-phenylene Yue
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c ⁇ depositing a layer of A1 2 0 3 film on the substrate subjected to step b by ion beam sputtering deposition, the vacuum degree in the deposition chamber is l (T 6 Pa, deposition time is lmin, A1 2 0 3 film The thickness is 5 nm;
- Step d depositing a layer of polychlorinated p-terphenylbenzene on the A1 2 0 3 film by chemical vapor deposition, for example, first sublimating solid C-type polychlorinated p-benzoquinone at 100 Q C , the C-type polychlorinated p-terphenylbenzene cleaves two side chain carbon-carbon bonds at 630 ° C to form a stable active monomer, and then the active monomer is introduced into the deposition chamber through a catheter and deposited in A1 2 0 3 On the film, the vacuum in the deposition chamber is 1 (T 6 Pa, deposition time is 5 min, and the deposited C-type polychlorinated p-benzoquinone is 50 nm thick;
- Step e Application on polychlorinated p-phenylene layer deposition thickness manner
- CHF 3 gas plasma polymerized polymer film is 10nm CFx example, may be a radio frequency discharge of CHF 3 gas, CHF 3
- a plurality of thin film encapsulation layers can be formed on the OLED device to obtain a package structure of the OLED device. If it is desired to form M thin film encapsulation layers on the OLED device, the above steps are repeated M times. For example, in the present embodiment, the above steps ce may be repeated twenty times to form a thin film encapsulation layer having twenty layers of fluorocarbon polymer film.
- Example 7 Al 2 O 3 (200 nm) / polychloro-p-diphenylene (100 nm) / CFx (5 nm)
- the packaging method of the OLED device of the present embodiment includes the following steps:
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c depositing a layer on the substrate subjected to step b by ion beam sputtering deposition
- the vacuum degree in the deposition chamber is l (T 6 Pa, deposition time is 40 min, thickness of A1 2 0 3 film is 200 ⁇ ;
- Step d depositing a layer of polychlorinated p-terphenylbenzene on the A1 2 0 3 film by chemical vapor deposition, for example, first sublimating solid C-type polychlorinated p-benzoquinone at 100 Q C , the C-type polychlorinated p-terphenylbenzene cleaves two side chain carbon-carbon bonds at 630 ° C to form a stable active monomer, and then the active monomer is introduced into the deposition chamber through a catheter and deposited in A1 2 0 3 On the film, the vacuum in the deposition chamber is 1 (T 6 Pa, deposition time is 10 min, and the deposited C-type polychlorinated p-benzoquinone has a thickness of 100 nm; Step e: on the polychlorinated p-phenylene layer deposition thickness manner CHF 3 gas plasma polymerized polymer film is 5nm CFx example, may be a radio frequency discharge of CHF 3 gas, CHF 3
- a plurality of thin film encapsulation layers can be formed on the OLED device to obtain a package structure of the OLED device. If it is desired to form M thin film encapsulation layers on the OLED device, the above steps are repeated M times. For example, this embodiment can perform only the above steps c-e-times to form a thin film encapsulation layer having a fluorocarbon polymer film.
- Example 8 Al 2 O 3 (50 nm) / polychlorinated p-nonylbenzene (5 nm) / CFx (200 nm)
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c ⁇ depositing a layer of A1 2 0 3 film on the substrate subjected to step b by ion beam sputtering deposition, the vacuum degree in the deposition chamber is l (T 6 Pa, deposition time is 10 min, A1 2 0 3 film) The thickness is 50 ⁇ ;
- Step d depositing a layer of polychlorinated p-terphenylbenzene on the A1 2 0 3 film by chemical vapor deposition, for example, first sublimating solid C-type polychlorinated p-benzoquinone at 100 Q C , making C
- the type of polychlorinated p-terphenylbenzene cleaves two side chain carbon-carbon bonds at 630 ° C to form a stable active monomer, and then the active monomer is introduced into the deposition chamber through a catheter and deposited on the A1 2 0 3 film.
- the vacuum in the deposition chamber is 1 (T 6 Pa, the deposition time is 0.5 min, and the deposited C-type polychlorinated p-benzoquinone has a thickness of 5 nm;
- Step e A CFx polymer film having a thickness of 200 nm was deposited on the polychlorinated p-benzoquinone layer by means of CHF 3 gas plasma polymerization.
- RF gas discharge can be performed on CHF 3 gas to generate 0 ⁇ 3 gas plasma.
- the RF source frequency is 13.56 MHz
- the RF source power is 50-200 W, for example 150 W
- the ambient pressure is 300-400 mTorr, for example.
- the CHF 3 gas flow rate is 20-80 sccm, for example 50 sccm.
- a plurality of thin film encapsulation layers can be formed on the OLED device to obtain a package structure of the OLED device. If it is desired to form M thin film encapsulation layers on the OLED device, the above steps are repeated M times. For example, this embodiment can repeat the above steps c-e three times to form a thin film encapsulation layer having a three-layer fluorocarbon polymer film.
- Example 9 Al 2 O 3 (50 nm) / polychlorinated p-nonylbenzene (5 nm) / CFx (200 nm)
- Step a providing a substrate, the substrate may be a quartz substrate, a glass substrate or a polymer substrate; etc.; Step b: preparing the OLED device onto the substrate;
- Step c ⁇ depositing a layer of A1 2 0 3 film on the substrate subjected to step b by atomic layer deposition, the thickness of the A1 2 0 3 film is 50 nm, according to the atomic layer deposition method, the A1 2 0 3 film is less than 100 Generated at a temperature of Celsius to avoid damage to the OLED device;
- Step d depositing a layer of polychlorinated p-terphenylbenzene on the A1 2 0 3 film by chemical vapor deposition, for example, first sublimating solid C-type polychlorinated p-benzoquinone at 100 Q C , the C-type polychlorinated p-terphenylbenzene cleaves two side chain carbon-carbon bonds at 630 ° C to form a stable active monomer, and then the active monomer is introduced into the deposition chamber through a catheter and deposited in A1 2 0 3 On the film, the vacuum in the deposition chamber is 1 (T 6 Pa, the deposition time is 0.5 min, and the deposited C-type polychlorinated p-benzoquinone has a thickness of 5 nm;
- Step e A CFx polymer film having a thickness of 200 nm was deposited on the polychlorinated p-benzoquinone layer by means of CHF 3 gas plasma polymerization.
- the CHF 3 gas can be subjected to radio frequency discharge to generate a CHF 3 gas plasma.
- the RF source frequency is 13.56 MHz
- the RF source power is 50-200 W, for example, 150 W
- the ambient pressure is 300-400 mTorr, for example.
- the 300 mTorr, CHF 3 gas flow rate is 20-80 sccm, for example 50 sccm.
- a plurality of thin film encapsulation layers can be formed on the OLED device, The package structure of the OLED device. If it is desired to form M thin film encapsulation layers on the OLED device, the above steps are repeated M times. For example, in the present embodiment, the above steps ce may be repeated three times to form a thin film encapsulation layer having a three-layer fluorocarbon polymer film.
- the above embodiment is described by taking a thin film encapsulation layer including an inorganic thin film, an organic polymer thin film, and a fluorocarbon polymer thin film as an example.
- the thin film encapsulation layer comprises an inorganic thin film and a fluorocarbon polymer film
- the thin film encapsulation layer includes, for example, an ITO thin film and a fluorocarbon polymer film formed by plasma polymerization of CHF 3 , see the above related description, of course, the embodiment of the present invention does not Limited to this.
- the fluorocarbon polymer film in the above embodiment may be formed by a fluorocarbon plasma polymerization method, or may be formed by a fluorocarbon plasma modification method, for example, the above-mentioned CF 4 gas-generated plasma-enhanced silicon.
- a fluorocarbon plasma polymerization method or may be formed by a fluorocarbon plasma modification method, for example, the above-mentioned CF 4 gas-generated plasma-enhanced silicon.
- An example of rubber hydrophobicity is not limited herein.
- the fluorocarbon compound may be a fluorocarbon gas or other fluorocarbon material, and will not be described herein.
- one or more layers of dense fluorocarbon polymer film are added to the film encapsulation layer, and the fluorocarbon polymer has extremely low surface energy and strong hydrophobic ability, Therefore, the ability of the thin film encapsulation layer to block water oxygen can be effectively improved, and the thin film encapsulation layer is applied to the packaging of the OLED device, which can effectively extend the life of the OLED device and improve the reliability of the OLED device during storage and use.
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