WO2014180052A1 - 彩色滤光片基板及其氧化铟锡薄膜图案结构、制作方法、液晶显示器 - Google Patents

彩色滤光片基板及其氧化铟锡薄膜图案结构、制作方法、液晶显示器 Download PDF

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Publication number
WO2014180052A1
WO2014180052A1 PCT/CN2013/078246 CN2013078246W WO2014180052A1 WO 2014180052 A1 WO2014180052 A1 WO 2014180052A1 CN 2013078246 W CN2013078246 W CN 2013078246W WO 2014180052 A1 WO2014180052 A1 WO 2014180052A1
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Prior art keywords
tin oxide
indium tin
oxide film
color filter
pattern structure
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PCT/CN2013/078246
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English (en)
French (fr)
Inventor
康基善
柯智胜
何文超
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深圳市华星光电技术有限公司
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Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to US14/003,034 priority Critical patent/US20140333876A1/en
Publication of WO2014180052A1 publication Critical patent/WO2014180052A1/zh

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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1343Electrodes
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1345Conductors connecting electrodes to cell terminals
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/12Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode
    • G02F2201/121Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode common or background

Definitions

  • the present invention relates to a liquid crystal display, and more particularly to a color filter substrate and indium tin oxide
  • TFT liquid crystal displays thin film transistor liquid crystal displays
  • TFTHXD thin film transistor liquid crystal displays
  • the manufacturing process of various TFT liquid crystal displays mainly has the following parts: forming a thin film transistor array on a thin film transistor substrate; in a color filter (CF, Color fiiter ) A color filter pattern structure and an indium tin oxide film pattern structure are formed on the substrate; a liquid crystal cell is formed by using two substrates; and a module such as a peripheral circuit and a backlight is assembled.
  • CF color filter
  • Indium tin oxide thin is generally referred to as yttrium, which is a ri-type semiconductor material with high conductivity, high visible light transmittance, high mechanical hardness and good chemical stability. Therefore, it is the most commonly used thin film material for transparent electrodes of liquid crystal displays, plasma display panels (PDPs, Plasma Display Panels), electroluminescent display panels, touch panels, solar cells, and other electronic instruments.
  • yttrium is a ri-type semiconductor material with high conductivity, high visible light transmittance, high mechanical hardness and good chemical stability. Therefore, it is the most commonly used thin film material for transparent electrodes of liquid crystal displays, plasma display panels (PDPs, Plasma Display Panels), electroluminescent display panels, touch panels, solar cells, and other electronic instruments.
  • indium tin oxide thin has been commonly used to form wires connecting individual pixels on a liquid crystal display panel.
  • the indium tin oxide film patterning mainly has the following methods.
  • wet etching method the main steps include:
  • a layer of indium tin oxide film is formed on the substrate by sputtering in a vacuum coating machine; then a layer of photoresist is coated on the indium tin oxide film; and then a mask is formed by exposure, development, and the like using a mask.
  • the photoresist is then etched away by the wet etching method to remove the indium tin oxide film not covered by the photoresist, and finally the patterned photoresist is removed by the mold release liquid to form the desired indium tin oxide film pattern structure.
  • the main steps include: First, a layer of indium tin oxide film is formed on the substrate by sputtering in a vacuum coating machine; then a layer of photoresist is coated on the indium tin oxide film; and then a mask is formed by exposure, development, and the like using a mask. The photoresist is then etched by an etching gas to remove the indium tin oxide film not covered by the photoresist by a thousand etching method to form a desired indium tin oxide film pattern structure.
  • Lift-off method the main steps include:
  • Gate line, Data line and some signal lines (such as gate high level signal (Vgh), output enable signal (OE), clock signal ( CKV), etc.
  • Vgh gate high level signal
  • OE output enable signal
  • CKV clock signal
  • the resistance and capacitance (R, C) load greatly affect the display condition of the panel.
  • the resistance of the cabinet line and the signal line and the capacitive load are too large, the reaction will be on the panel, which may cause the panel to display. Poor effect, and the appearance of uneven brightness areas (Mura).
  • the HVA (wide-area vertical alignment) technology is applied to the indium tin oxide film pattern of the color filter substrate (away from the thin film transistor substrate on the side of the color filter substrate), which is a full-surface coating. Except for the indium tin oxide film of the color filter substrate corresponding to the effective display area (AA area), the indium tin oxide film of the color filter substrate corresponding to the fanout area and the Woa area is not It is necessary.
  • FIG. 1 it is a schematic top view of an indium tin oxide film pattern structure of a color filter substrate of a color filter substrate in the prior art.
  • the color filter substrate 2 is located above the corresponding thin film transistor substrate 1, and the indium tin oxide film pattern structure 3 on the side of the color filter substrate 2 is a full-surface coating film, as shown in FIG.
  • the pattern structure 3 is represented by the area where the dots are distributed, and it is seen that it covers the entire color filter substrate 2 and contains the entire corresponding effective display area 4.
  • the surrounding fan-out region and the dot array region corresponding to the line array region include the indium tin oxide film pattern structure 3 Other areas are not required.
  • the capacitance (C) of a data line in the fan-out area is about 16pF
  • the capacitance of the gate high-level signal line in the fan-out area is about 50pF. Because the load is too large, This may result in poor display of the panel and uneven areas of brightness. Summary of the invention
  • an object of the present invention is to provide a color filter substrate, which reduces the capacitance values of gate lines, data lines, and certain signal lines at the fan-out area and the line array area, thereby reducing gate lines and data lines.
  • the load of some signal lines makes the LCD panel display better.
  • Another object of the present invention is to provide an indium tin oxide thin film pattern structure of a color filter substrate, which reduces the capacitance values of gate lines, data lines, and certain signal lines at the fan-out area and the line array area, so as to reduce * The load of the polar line, data line and some signal lines makes the LCD panel display better.
  • the load on the line makes the LCD panel display better.
  • a further object of the present invention is to provide a method for fabricating a color filter substrate, which can reduce the capacitance values of the drain lines, the data lines, and some signal lines at the fan-out area and the line array area to reduce the * pole
  • the load of the line, the data line and some signal lines enables the liquid crystal panel to display a color filter substrate with better effect.
  • the present invention provides a color filter substrate comprising: a glass substrate, a black matrix and a color filter unit formed on the glass substrate, and covering the black matrix and the color filter unit Indium tin oxide film pattern structure; the indium tin oxide film pattern structure is composed of a first portion corresponding to the shape of the effective display region and a second portion corresponding to the shape of the electrode contact pad.
  • the indium tin oxide thin film pattern structure is formed by a wet etching method.
  • the indium tin oxide thin film pattern structure is formed by a thousand etching method.
  • the indium tin oxide film pattern structure is formed by a pull-up method.
  • the present invention provides an indium tin oxide thin film pattern structure of a color filter substrate, the indium tin oxide thin film pattern structure being composed of a first portion corresponding to the shape of the effective display region and a second portion corresponding to the shape of the electrode contact pad.
  • the present invention provides a liquid crystal display, comprising: a thin film transistor substrate, a color filter substrate, and a liquid crystal layer disposed between the thin film transistor substrate and the color filter substrate;
  • the color filter substrate comprises: glass a substrate, a black matrix and a color filter unit formed on the glass substrate, and an indium tin oxide film pattern structure covering the black matrix and the color filter unit; the indium tin oxide film pattern structure is correspondingly effectively displayed
  • the first portion of the shape of the region and the second portion of the shape of the corresponding electrode contact pad are formed.
  • the invention provides a method for manufacturing a color filter substrate, comprising:
  • Step 100 provides a glass substrate;
  • the structure is such that a color filter substrate is obtained, the indium tin oxide film pattern structure being composed of a first portion corresponding to the shape of the effective display region and a second portion corresponding to the shape of the electrode contact pad.
  • the step 400 includes:
  • Step 401 sputtering an indium tin oxide film on the glass substrate
  • Step 402 coating a photoresist layer on the indium tin oxide film
  • Step 403 patterning the photoresist layer, and the patterned photoresist layer is composed of a first portion corresponding to the shape of the effective display region and a second portion corresponding to the shape of the electrode pad;
  • Step 404 etching a film of indium tin oxide not covered by the photoresist by wet etching, and finally removing the patterned photoresist layer with a mold release liquid to obtain a film pattern of the desired indium tin oxide film.
  • Step 4] 2. uniformly coating a photoresist layer on the indium tin oxide film
  • Step 4i3 patterning the photoresist layer, and the patterned photoresist layer is composed of a first portion corresponding to the shape of the effective display region and a second portion corresponding to the shape of the electrode contact pad;
  • Step 414 etching a film of indium tin oxide not covered by the photoresist by a thousand etching method, and finally removing the patterned photoresist layer with a mold release liquid to obtain a glass having a desired indium tin oxide film pattern structure. Substrate.
  • the step 400 includes:
  • Step 421 Apply a photoresist on the glass substrate
  • Step 422 removing a photoresist corresponding to the required indium tin oxide film pattern on the glass substrate to form a patterned photoresist layer;
  • Step 423 sputtering an indium tin oxide film on the glass substrate with the patterned photoresist layer;
  • Step 424 performing a mold release treatment on the glass substrate including the patterned photoresist layer and the indium tin oxide film, and patterning the light
  • the engraved layer and the indium tin oxide film attached thereto are removed to obtain a glass substrate having a desired indium tin oxide film pattern structure.
  • the color filter substrate of the present invention and the indium tin oxide film pattern structure, the manufacturing method thereof and the liquid crystal display can reduce the capacitance values of the gate lines, the data lines and some signal lines at the fan-out area and the line array area, Reduce the load on the gate lines, data lines, and some signal lines to make the LCD panel display better.
  • Figure ⁇ is a top plan view of a pattern structure of an indium tin oxide film of a color filter substrate in the prior art
  • FIG. 2 is a plan view showing a pattern structure of an indium tin oxide film of a color filter substrate of the present invention
  • FIG. 2 is a top plan view showing a pattern structure of an indium tin oxide film of a color filter substrate of the present invention. From the positional relationship, the color filter substrate 20 is located above the corresponding thin film transistor substrate 10.
  • the indium tin oxide film pattern structure 30 is represented by a region where dots are distributed, and the indium tin oxide film pattern structure 30 is corresponding.
  • the first portion 31 of the effective display region 40 shape and the second portion 32 corresponding to the shape of the electrode pad (Transfer Pad, the common thin film transistor substrate side and the common (Com) electrode on the color filter substrate side) are formed.
  • the indium tin oxide film pattern structure 30 of the color filter substrate 20 of the present invention retains only the effective display area as compared with the indium tin oxide film pattern structure of the prior art color filter substrate in FIG. 40 (the pattern necessary for liquid crystal steering) and the indium tin oxide film at the corresponding electrode contact pad, remove the indium tin oxide film in the fan-out area and the line array area to reduce the fan-out area and the ⁇ -polar line at the line array , the data line and the capacitance value of some signal lines. In this way, the load on the gate lines, the data lines, and some signal lines can be reduced, which is advantageous for realizing a large size of the liquid crystal panel and improving the display effect of the large-sized liquid crystal panel.
  • the invention adjusts the pattern structure of the indium tin oxide film on the side of the color filter substrate 20
  • the value of the trace capacitance at the line array area and the fan-out area is reduced from the original ten to several hundred pF to 0pF.
  • the color filter substrate 20 - the side indium tin oxide film pattern structure 30 is modified before and after: Before, the capacitance of a data line in the fan-out area is about 16pF, and the capacitance of a gate high-level signal line in the fan-out area is about 50pF. After modification, a data line goes in the fan-out area.
  • the capacitance of the line is about 0pF, and the capacitance of the gate high-level signal line in the fan-out area is about OpF.
  • the present invention provides a corresponding color filter substrate 20, comprising: a glass substrate, a black matrix and color filter formed on the glass substrate a unit (not shown), and an indium tin oxide film pattern structure 30 overlying the black matrix and color filter unit; the indium tin oxide film pattern structure 30 is formed by a first portion 31 corresponding to the shape of the effective display region 40 and A second portion 32 corresponding to the shape of the electrode contact pad is formed.
  • the indium tin oxide film pattern structure 30 can be formed by a wet etching method, and the method is relatively mature nowadays; the indium tin oxide film pattern structure 30 can also be formed by a thousand etching method, and the operation is relatively simple. , the environmental protection; the indium tin oxide film pattern structure 30 can also be formed by the pulling method, the operation is relatively simple and fast.
  • the invention adjusts the indium tin oxide film pattern structure 30 on the side of the color filter substrate 20 so that the trace capacitance value at the line array region and the fan-out region is reduced from 0 to several hundred pF to 0 pF.
  • the capacitance value of the original data line in the fan-out area and the *very high-level signal line in the fan-out area is taken as an example, and the color filter substrate 20 - the side indium tin oxide film pattern structure 30 is modified before and after: Before, the capacitance of a data line in the fan-out area is about 6pF, and the capacitance of a gate high-level signal line in the fan-out area is about 50pF. After the repair, a data line is in the fan. The capacitance of the area trace is about 0pF, and the capacitance of the cabinet high level signal line in the fan-out area is about OpF.
  • the present invention provides a corresponding liquid crystal display, comprising: a thin film transistor substrate 10, a color filter substrate 20, and a substrate a liquid crystal layer (not shown) between the thin film transistor substrate and the color filter substrate;
  • the color filter substrate 20 includes a glass substrate, a black matrix and a color filter unit formed on the glass substrate, and a cover
  • An indium tin oxide film pattern structure 30 on the black matrix and color filter unit; the indium tin oxide film pattern structure 30 is formed by a first portion 31 corresponding to the shape of the effective display region 40 and a second portion corresponding to the shape of the electrode contact pad 32 composition.
  • the capacitance values of the gate lines, the data lines, and some signal lines at the fan-out area and the line array are reduced.
  • the load on the gate lines, the data lines, and some signal lines can be reduced, which is advantageous for realizing the large size of the liquid crystal panel and improving the display effect of the large-sized liquid crystal panel.
  • the indium tin oxide film pattern structure 30 can be formed by a wet etching method, and the method is relatively mature nowadays; the indium tin oxide film pattern structure 30 can also be formed by a dry etching method, and the operation is relatively simple. , the environmental protection; the indium tin oxide film pattern structure 30 can also be formed by the pulling method, the operation is relatively simple and quick.
  • the invention adjusts the indium tin oxide film pattern structure 30 on the side of the color filter substrate 20 such that the trace capacitance value at the line array region and the fan-out region is reduced from the original tens to hundreds of pF to 0 pF.
  • the color filter substrate 20 - the side indium tin oxide film pattern structure 30 is modified before and after: Before, the capacitance of a data line in the fan-out area is about 16pF, and the capacitance of a gate high-level signal line in the fan-out area is about 50pF. After modification, a data line goes in the fan-out area. The capacitance of the line is approximately OpF, and the capacitance of the gate high level signal line in the fan-out area is approximately 0 pF.
  • FIG. 3 there is shown a flow chart of a method of fabricating the color filter substrate 20 of the present invention.
  • the present invention provides a method of fabricating a corresponding color filter substrate 20, including:
  • Step 100 providing a glass substrate
  • Step 200 forming a black matrix on the glass substrate according to the prior art
  • Step 300 forming a color filter unit on the glass substrate according to the prior art
  • Step 400 forming an indium tin oxide film pattern structure 30 on the black matrix and the color filter unit, to obtain a color filter substrate 20
  • the indium tin oxide thin film pattern structure 30 is composed of a first portion 31 corresponding to the shape of the effective display region 40 and a second portion 32 corresponding to the shape of the electrode pad.
  • the indium tin oxide film pattern structure 30 only retains the effective display area 40 (the pattern necessary for liquid crystal steering) and the indium tin oxide film at the corresponding electrode contact pad, and removes the fan.
  • the value of the trace capacitance at the line array region and the fan-out region is reduced from the original tens to hundreds of pF to 0 pF.
  • the capacitance value of the original data line in the fan-out area and the gate high-level signal line in the fan-out area is taken as an example, and the color filter substrate 20—the side indium tin oxide film pattern structure 30 is modified before and after: Before, the capacitance value of a data line in the fan-out area is about I 6pF, and the capacitance of a gate high-level signal line in the fan-out area is about 50pF; after modification, one data line is in the fan-out area.
  • the capacitance of the trace is about 0pF, and the capacitance of the gate high-level signal line in the fan-out area is about 0pF.
  • the indium tin oxide thin film pattern structure 30 can be formed by a wet etching method, which is now mature in development.
  • the step 400 may employ a wet etching method and may include the following substeps: Step 401, sputtering an indium tin oxide film on the glass substrate; can be realized by sputtering in a vacuum coating machine;
  • Step 402 uniformly coating a photoresist layer on the indium tin oxide film
  • Step 403 patterning the photoresist layer, and the patterned photoresist layer is composed of a first portion 3 corresponding to the shape of the effective display region 40 and a second portion 32 corresponding to the shape of the electrode pad; the mask can be exposed through the exposure , development and other steps are achieved;
  • Step 404 etching a film of indium tin oxide not covered by the photoresist by wet etching, and finally removing the patterned photoresist layer with a mold release liquid to obtain a pattern structure 30 having a desired indium tin oxide film pattern 30. glass substrate.
  • the indium tin oxide film pattern structure 30 can also be formed by a method of engraving in a thousand ways, and the operation is relatively simple and environmentally friendly.
  • the step 400 may employ a thousand etching method and may include the following substeps:
  • Step 411 sputtering an indium tin oxide film on the glass substrate
  • Step 4] 2. uniformly coating a photoresist layer on the indium tin oxide film
  • Step 4i3 patterning the photoresist layer, the patterned photoresist layer is composed of a first portion 31 corresponding to the shape of the effective display region 40 and a second portion 32 corresponding to the shape of the electrode contact pad.
  • Step 414 etching a film of indium tin oxide not covered by the photoresist by a thousand etching method, and finally removing the patterned photoresist layer with a mold release liquid to obtain a pattern structure 30 having a desired indium tin oxide film pattern 30. glass substrate.
  • the indium tin oxide film pattern structure 30 can also be formed by a pulling method, which is simple and quick to operate.
  • the step 400 may adopt the method of pulling up, and may include the following steps:
  • Step 421 Apply a photoresist on the glass substrate
  • Step 422 removing a photoresist corresponding to the required indium tin oxide film pattern on the glass substrate to form a patterned photoresist layer;
  • Step 423 plating an indium tin oxide film on the glass substrate with the patterned photoresist layer; step 424, performing a mold release treatment on the glass substrate including the patterned photoresist layer and the indium tin oxide film, and patterning the light
  • the engraved layer and the indium tin oxide film attached thereto are removed to obtain a glass substrate having the desired indium tin oxide film pattern structure 30.
  • the color filter substrate and the indium tin oxide film pattern structure, the manufacturing method thereof and the liquid crystal display of the invention can reduce the gate lines, the data lines and some signal lines at the fan-out area and the line array area.
  • the capacitance value is used to reduce the load on the gate lines, data lines, and some signal lines, so that the liquid crystal panel displays better.

Abstract

一种彩色滤光片基板(20)包括玻璃基板,形成于该玻璃基板上的黑色矩阵和彩色滤光单元,以及覆盖在所述黑色矩阵和彩色滤光单元上的氧化铟锡薄膜图案结构(30)。氧化铟锡薄膜图案结构(30)由对应有效显示区域(40)形状的第一部分(31)以及对应电极接触垫形状的第二部分(32)组成。还提供了彩色滤光片基板的氧化铟锡薄膜图案结构(30)、制作方法和液晶显示器。所述彩色滤光片基板(20)可以降低扇出区域以及线阵列区域处的栅极线、数据线及某些信号线的电容值,以降低栅极线、数据线及某些信号线的负载,使液晶面板显示效果更佳。

Description

技术领域
本发明涉及液晶显示器, 尤其涉及一种彩色滤光片基板及其氧化铟锡
( ITO、 Indium Tin Oxides )薄膜图案 ( Pattern )结构、 制作方法, 液晶显 示器。 背景技术
由于液晶显示器 ( Liquid Crystal Display, LCD ) 具有轻薄及低功率损 耗等优点, 近年来, 已广泛地被应用于各类电子产品中, 例如: 笔记型计 算机、 行动电话、 数字相机、 投影机, 掌上型装置及随身听装置等多种产 现有 TFT液晶显示器 (薄膜晶体管液晶显示器、 TFTHXD ) 的制造工 艺主要有以下几部分: 在薄膜晶体管基板上形成薄膜晶体管阵列; 在彩色 滤光片 (CF、 Color fiiter )基板上形成彩色滤光片图案结构及氧化铟锡薄 膜图案结构; 用两块基板形成液晶盒; 安装外围电路、 组装背光源等模块 的组装。
氧化铟锡薄一般简称为 ΙΤΌ, 其是一种 ri型半导体材料, 具有高的导 电率、 高的可见光透过率、 高的机械硬度和良好的化学稳定性。 因此, 它 是液晶显示器、 等离子显示器 (PDP、 Plasma Display Panel ) 、 电致发光 显示器 ( Electroluminescent Display Panel ) 、 触摸屏 ( Touch Panel ) 、 太 阳能电池以及其他电子仪表的透明电极最常用的薄膜材料。 举例来说, 氧 化铟锡薄已普遍被用来形成液晶显示面板上连接各个像素的导线。
目前, 氧化铟锡薄膜图案化主要有以下方法。
1、 湿法蚀刻方法, 主要步骤包括:
首先在真空镀膜机中通过溅射方式在基板上形成一层氧化铟锡薄膜; 之后在氧化铟锡薄膜上均勾涂布一层光刻胶; 再使用光罩通过曝光、 显影 等步骤形成图案化光刻胶; 之后以湿法蚀刻的方法蚀刻掉没有被光刻胶所 覆盖的氧化铟锡薄膜, 最后用脱模液除去图案化的光刻胶, 形成所需要的 氧化铟锡薄膜图案结构。
2、 千法蚀刻方法, 主要步骤包括: 首先在真空镀膜机中通过溅射方式在基板上形成一层氧化铟锡薄膜; 之后在氧化铟锡薄膜上均勾涂布一层光刻胶; 再使用光罩通过曝光, 显影 等步驟形成图案化光刻胶; 之后以千法蚀刻的方法釆用蚀刻气体蚀刻掉没 有被光刻胶所覆盖的氧化铟锡薄膜, 形成所需要的氧化铟锡薄膜图案结 构。
3、 拔起 ( Lift-off )方法, 主要步骤包括:
首先在基板上涂布一层光刻胶; 接着通过曝光、 显影将基板上欲形成 的氧化铟锡薄膜图案的部分上的光刻胶去除; 之后在图案化光刻胶的基板 上, 通过真空镀膜机镀上氧化铟锡薄膜; 最后对包含有图案化光刻胶以及 氧化铟锡薄膜的基板, 进行脱模处理, 将剩余的光刻胶以及附在其上的氧 化铟锡薄膜去除, 得到所需的含有氧化铟锡薄膜图案结构的基板。
在大尺寸液晶面板的生产中, 栅极线 (Gate line ) , 数据线 (Data line ) 及某些信号线 (例如栅极高电平信号 (Vgh ) , 输出允许信号 ( OE ) , 时钟信号 (CKV ) 等) 的电阻、 电容(R、 C ) 负载极大的影响 着面板的显示状况, 当櫥极线及信号线的电阻、 电容负载过大时, 反应在 面板上, 将可能导致面板显示效果不佳, 以及亮度不均匀区域(Mura ) 的 出现。
目前釆用的 HVA (广域垂直配向)技术, 针对彩色滤光片基板的氧化 铟锡薄膜图案 (远离薄膜晶体管基板, 位于彩色滤光片基板一侧) , 均为 一整面镀膜, 然而, 除有效显示区域(AA 区) 对应的彩色滤光片基板的 氧化铟锡薄膜之外, 周边扇出区域( Fanout ) , 线阵列 ( Woa ) 区域对应 的彩色滤光片基板的氧化铟锡薄膜并非为必须。
参见图 1, 其为现有技术中彩色滤光片基板的彩色滤光片基板的氧化 铟锡薄膜图案结构的俯视示意图。 从位置关系上来看, 彩色滤光片基板 2 位于对应的薄膜晶体管基板 1 上方, 彩色滤光片基板 2侧面的氧化铟锡薄 膜图案结构 3为一整面镀膜, 如图 1 中氧化铟锡薄膜图案结构 3 以圓点所 分布的区域来表示, 可见其覆盖了整个彩色滤光片基板 2, 并且包含了整 个对应的有效显示区域 4。 实际上, 除有效显示区域 4 所对应的圓点区域 所包含的氧化铟锡薄膜图案结构 3, 周边的扇出区域、 线阵列区域对应的 圓点区域所包含的氧化铟锡薄膜图案结构 3 外, 其它的区域并不是必须 的。 现有技术中, 一条数据线的在扇出区域走线的电容 ( C ) 值约为 16pF, 柵极高电平信号线在扇出区域走线的电容值约为 50pF, 由于负载过 大, 将可能导致面板显示效杲不佳, 以及产生亮度不均匀区域。 发明内容
因此, 本发明的目的在于提供一种彩色滤光片基板, 降低扇出区域以 及线阵列区域处的柵极线、 数据线及某些信号线的电容值, 以降低柵极 线、 数据线及某些信号线的负载, 使液晶面板显示效果更佳。
本发明的又一目的在于提供一种彩色滤光片基板的氧化铟锡薄膜图案 结构, 降低扇出区域以及线阵列区域处的柵极线、 数据线及某些信号线 的电容值, 以降低 *极线、 数据线及某些信号线的负载, 使液晶面板显示 效果更.佳。
本发明的又一目的在于提供一种液晶显示器, 降低扇出区域以及线阵 列区域处的栅极线、 数据线及某些信号线的电容值, 以降低栅极线、 数据 线及某些信号线的负载, 使液晶面板显示效果更佳。
本发明的再一目的在于提供一种彩色滤光片基板的制作方法, 制作出 降低扇出区域以及线阵列区域处的槲极线、 数据线及某些信号线的电容 值, 以降低 *极线、 数据线及某些信号线的负载, 使液晶面板显示效果更 佳的彩色滤光片基板。
为实现上述目的, 本发明提供了一种彩色滤光片基板, 包括: 玻璃基 板, 形成于该玻璃基板上的黑色矩阵和彩色滤光单元, 以及覆盖在所述黑 色矩阵和彩色滤光单元上的氧化铟锡薄膜图案结构; 所述氧化铟锡薄膜图 案结构由对应有效显示区域形状的第一部分以及对应电极接触垫形状的第 二部分组成。
所述氧化铟锡薄膜图案结构以湿法蚀刻方法形成。
所述氧化铟锡薄膜图案结构以千法蚀刻方法形成。
所述氧化铟锡薄膜图案结构以拔起方法形成。
本发明提供一种彩色滤光片基板的氧化铟锡薄膜图案结构, 所述氧化 铟锡薄膜图案结构由对应有效显示区域形状的第一部分以及对应电极接触 垫形状的第二部分组成。
本发明提供一种液晶显示器, 包括: 薄膜晶体管基板, 彩色滤光片基 板, 以及设于所述薄膜晶体管基板和彩色滤光片基板之间的液晶层; 所述 彩色滤光片基板包括: 玻璃基板, 形成于该玻璃基板上的黑色矩阵和彩色 滤光单元, 以及覆盖在所述黑色矩阵和彩色滤光单元上的氧化铟锡薄膜图 案结构; 所述氧化铟锡薄膜图案结构由对应有效显示区域形状的第一部分 以及对应电极接触垫形状的第二部分组成。
本发明提供一种彩色滤光片基板的制作方法, 包括:
步骤 100 提供玻璃基板; 结构, 得到彩色滤光片基板, 该氧化铟锡薄膜图案结构由对应有效显示区 域形状的第一部分以及对应电极接触垫形状的第二部分组成。
所述步骤 400包括:
步骤 401 , 在所述玻璃基板上溅镀氧化铟锡薄膜;
步骤 402、 在该氧化铟锡薄膜上均勾涂布光刻胶层;
步骤 403、 图案化该光刻胶层, 图案化后的光刻胶层由对应有效显示 区域形状的第一部分以及对应电极接融垫形状的第二部分组成;
步骤 404、 以湿法蚀刻的方法蚀刻掉没有被光刻胶所覆盖的氧化铟锡 薄膜, 最后用脱模液除去图案化的光刻胶层, 得到具有所需氧化铟锡薄膜 图案
Figure imgf000006_0001
步骤 4】2、 在该氧化铟锡薄膜上均匀涂布光刻胶层;
步骤 4i3、 图案化该光刻胶层, 图案化后的光刻胶层由对应有效显示 区域形状的第一部分以及对应电极接触垫形状的第二部分组成;
步骤 414、 以千法蚀刻的方法蚀刻掉没有被光刻胶所覆盖的氧化铟锡 薄膜, 最后用脱模液除去图案化的光刻胶层, 得到具有所需氧化铟锡薄膜 图案结构的玻璃基板。
所述步骤 400包括:
步骤 421、 在玻璃基板上均勾涂布光刻胶;
步骤 422、 将玻璃基板上对应所需要氧化铟锡薄膜图案结构的光刻胶 去除, 形成图案化光刻胶层;
步骤 423、 在具有图案化光刻胶层的玻璃基 上溅镀氧化铟锡薄膜; 步骤 424、 对包含图案化光刻胶层以及氧化铟锡薄膜的玻璃基板进行 脱模处理, 将图案化光刻胶层以及附在其上的氧化铟锡薄膜去除, 得到具 有所需氧化铟锡薄膜图案结构的玻璃基板。
本发明的彩色滤光片基板及其氧化铟锡薄膜图案结构, 制作方法、 液 晶显示器, 可以降低扇出区域以及线阵列区域处的栅极线、 数据线及某些 信号线的电容值, 以降低柵极线、 数据线及某些信号线的负载, 使液晶面 板显示效果更佳。 附图说明
下面结合附图, 通过对本发明的具体实施方式详细描述, 将使本发明 的技术方案及其他有益效果显而易见。
附图中,
图 〗 为现有技术中彩色滤光片基板的氧化铟锡薄膜图案结构的俯视示 意图;
图 2 为本发明彩色滤光片基板的氧化铟锡薄膜图案结构的俯视示意
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图 3为本发明彩色滤光片基板的制作方法的流程图。 具体实旅方式
参见图 2, 为本发明彩色滤光片基板的氧化铟锡薄膜图案结构的俯视 示意图。 从位置关系上来看, 彩色滤光片基板 20位于对应的薄膜晶体管 基板 10上方, 图 2中氧化铟锡薄膜图案结构 30以圓点所分布的区域来表 示, 氧化铟锡薄膜图案结构 30由对应有效显示区域 40形状的第一部分 31 以及对应电极接融垫(Transfer Pad, 导通薄膜晶体管基板侧及彩色滤光片 基板侧的公共(Com ) 电极)形状的第二部分 32组成。 也就是说, 与图 1 中的现有技术中彩色滤光片基板的氧化铟锡薄膜图案结构相比, 本发明的 彩色滤光片基板 20 的氧化铟锡薄膜图案结构 30 仅保留有效显示区域 40(液晶转向所必需的图案)及对应电极接触垫处的氧化铟锡薄膜, 拿掉扇 出区域及线阵列区域的氧化铟锡薄膜, 以降低扇出区域以及线阵列处的楣- 极线、 数据线及某些信号线的电容值。 如此即可降低柵极线、 数据线以及 某些信号线的负载, 有利于实现液晶面板的大尺寸, 提升大尺寸液晶面板 的显示效果。
本发明经过调整彩色滤光片基板 20 —侧的氧化铟锡薄膜图案结构
30, 使得线阵列区域及扇出区域处的走线电容值由原来的儿十〜几百 pF均 降低为 0pF。 具体的, 以原数据线在扇出区域及橋极高电平信号线在扇出 区域走线的电容值为例, 彩色滤光片基板 20 —侧氧化铟锡薄膜图案结构 30修改前后: 修改前, 一条数据线在扇出区域走线的电容值约为 16pF, 一条栅极高电平信号线在扇出区域走线的电容值约为 50pF ; 修改后, 一 条数据线在扇出区域走线的电容值约为 0pF, 柵极高电平信号线在扇出区 域走线的电容值约为 OpF。
基于本发明的氧化铟锡薄膜图案结构, 本发明提供了相应的彩色滤光 片基板 20, 包括: 玻璃基板, 形成于该玻璃基板上的黑色矩阵和彩色滤光 单元(未图示) , 以及覆盖在所述黑色矩阵和彩色滤光单元上的氧化铟锡 薄膜图案结构 30; 所述氧化铟锡薄膜图案结构 30由对应有效显示区域 40 形状的第一部分 31 以及对应电极接触垫形状的第二部分 32组成。 通过拿 掉扇出区域及线阵列区域的氧化铟锡薄膜, 以降低扇出区域以及线阵列处 的柵极线、 数据线及某些信号线的电容值。 如此即可降低柵极线、 数据线 以及某些信号线的负载, 有利于实现液晶面板的大尺寸, 提升大尺寸液晶 面板的显示效果。
其中, 所述氧化铟锡薄膜图案结构 30 可以用湿法蚀刻的方法形成, 该方法现今发展已较为成熟; 所述氧化铟锡薄膜图案结构 30 也可以用千 法蚀刻的方法形成, 操作较为简单, 环保; 所述氧化铟锡薄膜图案结构 30 还可以用拔起方法形成, 操作较为简单、 快捷。
本发明经过调整彩色滤光片基板 20 —侧的氧化铟锡薄膜图案结构 30, 使得线阵列区域及扇出区域处的走线电容值由原来的几十〜几百 pF均 降低为 0pF。 具体的, 以原数据线在扇出区域及 *极高电平信号线在扇出 区域走线的电容值为例, 彩色滤光片基板 20 —侧氧化铟锡薄膜图案结构 30修改前后: 修改前, 一条数据线在扇出区域走线的电容值约为 〗6pF, 一条柵极高电平信号线在扇出区域走线的电容值约为 50pF ; 修'改后, 一 条数据线在扇出区域走线的电容值约为 0pF, 櫥极高电平信号线在扇出区 域走线的电容值约为 OpF。
基于本发明的彩色滤光片基板的氧化铟锡薄膜图案结构及彩色滤光片 基板, 本发明提供了相应的液晶显示器, 包括: 薄膜晶体管基板 10, 彩色 滤光片基板 20, 以及设于所述薄膜晶体管基板和彩色滤光片基板之间的液 晶层 (未图示) ; 所述彩色滤光片基板 20 包括玻璃基板, 形成于该玻璃 基板上的黑色矩阵和彩色滤光单元, 以及覆盖在所述黑色矩阵和彩色滤光 单元上的氧化铟锡薄膜图案结构 30; 所述氧化铟锡薄膜图案结构 30 由对 应有效显示区域 40形状的第一部分 31 以及对应电极接触垫形状的第二部 分 32组成。 通过拿掉扇出区域及线阵列区域的氧化铟锡薄膜, 以降低扇出 区域以及线阵列处的柵极线, 数据线及某些信号线的电容值。 如此即可降 低柵极线、 数据线以及某些信号线的负载, 有利于实现液晶面板的大尺 寸, 提升大尺寸液晶面板的显示效果„
其中, 所述氧化铟锡薄膜图案结构 30 可以用湿法蚀刻的方法形成, 该方法现今发展已较为成熟; 所述氧化铟锡薄膜图案结构 30也可以用干 法蚀刻的方法形成, 操作较为简单, 环保; 所述氧化铟锡薄膜图案结构 30 还可以用拔起方法形成, 操作较为简单 快捷。 本发明经过调整彩色滤光片基板 20 —侧的氧化铟锡薄膜图案结构 30, 使得线阵列区域及扇出区域处的走线电容值由原来的几十〜几百 pF均 降低为 0pF。 具体的, 以原数据线在扇出区域及柵极高电平信号线在扇出 区域走线的电容值为例, 彩色滤光片基板 20 —侧氧化铟锡薄膜图案结构 30 修改前后: 修改前, 一条数据线在扇出区域走线的电容值约为 16pF, 一条柵极高电平信号线在扇出区域走线的电容值约为 50pF ; 修改后, 一 条数据线在扇出区域走线的电容值约为 OpF, 柵极高电平信号线在扇出区 域走线的电容值约为 0pF。
参见图 3, 其为本发明彩色滤光片基板 20的制作方法的流程图。 本发 明提供了相应的彩色滤光片基板 20的制作方法, 包括:
步骤 100、 提供玻璃基板;
步骤 200、 参照现有技术在该玻璃基板上形成黑色矩阵;
步骤 300、 参照现有技术在该玻璃基板上形成彩色滤光单元; 步骤 400、 在所述黑色矩阵和彩色滤光单元上形成氧化铟锡薄膜图案 结构 30, 得到彩色滤光片基板 20, 该氧化铟锡薄膜图案结构 30由对应有 效显示区域 40形状的第一部分 31 以及对应电极接融垫形状的第二部分 32 组成。
在本方法中, 所述氧化铟锡薄膜图案结构 30 仅保留有效显示区域 40(液晶转向所必需的图案)及对应电极接触垫处的氧化铟锡薄膜, 拿掉扇
¾线、'数据线及某 信号线 电容 。 如此! ^可^ ^棚'极线、 数据^及 某些信号线的负载, 有利于实现液晶面板的大尺寸, 提升大尺寸液晶面板 的显示效果。
经过调整彩色滤光片基板 20 —侧的氧化铟锡薄膜图案结构 30, 使得 线阵列区域及扇出区域处的走线电容值由原来的几十〜几百 pF 均降低为 0pF。 具体的, 以原数据线在扇出区域及栅极高电平信号线在扇出区域走 线的电容值为例, 彩色滤光片基板 20—侧氧化铟锡薄膜图案结构 30修改 前后: 修改前, 一条数据线在扇出区域走线的电容值约为 I 6pF, 一条柵极 高电平信号线在扇出区域走线的电容值约为 50pF ; 修改后, 一条数据线 在扇出区域走线的电容值约为 0pF, 栅极高电平信号线在扇出区域走线的 电容值约为 0pF。
所述氧化铟锡薄膜图案结构 30 可以用湿法蚀刻的方法形成, 该方法 现今发展已较为成熟。 所述步骤 400可以采用湿法蚀刻方法可以包括以下 分步骤: 步骤 401、 在所述玻璃基板上溅镀氧化铟锡薄膜; 可以在真空镀膜机 中通过溅射方式实现;
步骤 402、 在该氧化铟锡薄膜上均匀涂布光刻胶层;
步骤 403、 图案化该光刻胶层, 图案化后的光刻胶层由对应有效显示 区域 40 形状的第一部分 3 以及对应电极接融垫形状的第二部分 32 组 成; 可以使用光罩通过曝光、 显影等步骤实现;
步骤 404、 以湿法蚀刻的方法蚀刻掉没有被光刻胶所覆盖的氧化铟锡 薄膜, 最后用脱模液除去图案化的光刻胶层, 得到具有所需氧化铟锡薄膜 图案结构 30的玻璃基板。
上述采用湿法蚀刻的方法来形成氧化铟锡薄膜图案结构 30 的步骤 中, 具体的工艺流程及相关参数设定均可参照现有技术。
所述氧化铟锡薄膜图案结构 30 也可以用千法饯刻的方法形成, 操作 较为简单, 环保。 所述步骤 400可以采用千法蚀刻方法可以包括以下分步 骤:
步驟 411、 在所述玻璃基板上溅镀氧化铟锡薄膜;
步骤 4】2、 在该氧化铟锡薄膜上均匀涂布光刻胶层;
步骤 4i3、 图案化该光刻胶层, 图案化后的光刻胶层由对应有效显示 区域 40 形状的第一部分 31 以及对应电极接触垫形状的第二部分 32 组
/ ,
步骤 414、 以千法蚀刻的方法蚀刻掉没有被光刻胶所覆盖的氧化铟锡 薄膜, 最后用脱模液除去图案化的光刻胶层, 得到具有所需氧化铟锡薄膜 图案结构 30的玻璃基板。
上述采用千法蚀刻的方法来形成氧化铟锡薄膜图案结构 30 的步骤 中, 具体的工艺流程及相关参数设定均可参照现有技术。
所述氧化铟锡薄膜图案结构 30 还可以用拔起方法形成, 操作较为简 单、 快捷。 所述步骤 400可以采用拔起方法可以包括以下步驟:
步骤 421、 在玻璃基板上均勾涂布光刻胶;
步骤 422、 将玻璃基板上对应所需要氧化铟锡薄膜图案结构的光刻胶 去除, 形成图案化光刻胶层;
步骤 423、 在具有图案化光刻胶层的玻璃基板上¾镀氧化铟锡薄膜; 步骤 424、 对包含图案化光刻胶层以及氧化铟锡薄膜的玻璃基板进行 脱模处理, 将图案化光刻胶层以及附在其上的氧化铟锡薄膜去除, 得到具 有所需氧化铟锡薄膜图案结构 30的玻璃基板。
上述采用拔起方法来形成氧化铟锡薄膜图案结构 30 的步骤中, 具体 的工艺流程及相关参数设定均可参照现有技术。
综上所述, 本发明的彩色滤光片基板及其氧化铟锡薄膜图案结构、 制 作方法、 液晶显示器, 可以降低扇出区域以及线阵列区域处的柵极线、 数 据线及某些信号线的电容值, 以降低柵极线、 数据线及某些信号线的负 载, 使液晶面板显示效果更佳。
以上所述, 对于本领域的普通技术人员来说, 可以根据本发明的技术 方案和技术构思作出其他各种相应的改变和变形, 而所有这些改变和变形 都应属于本发明后附的权利要求的保护范围。

Claims

一种彩色滤光片基板, 包括: 玻璃基板, 形成于该玻璃基板上的 黑色矩阵和彩色滤光单元, 以及覆盖在所述黑色矩阵和彩色滤光单元上的 氧化铟锡薄膜图案结构; 所述氧化铟锡薄膜图案结构由对应有效显示区域 形状的第一部分以及对应电极接触垫形状的第二部分组成。
2 , 如权利要求 1 所述的彩色滤光片基板, 其中, 所述氧化铟锡薄膜 图案结构以湿法蚀刻方法形成。
3、 如权利要求 所述的彩 ,滤光片基板, 其中, 所述氧化铟锡薄膜 图案结构以千法蚀刻方法形成。
4、 如权利要求 1 所述的彩 ,滤光片基板, 其中 薄膜 图案结构以拔起方法形成。
Figure imgf000012_0001
的第二部分组成。
显示器, 包括 薄膜晶体管基板, 彩色滤光片基板, 以 -膜晶体管基板和彩色滤光片基板之间的液晶层; 所述彩色滤 光片基板包括: 玻璃基板, 形成于该玻璃基板上的黑色矩阵和彩色滤光单 元, 以及覆盖在所述黑色矩阵和彩色滤光单元上的氧化铟锡薄膜图案结 构; 所述氧化铟锡薄膜图案结构由对应有效显示区域形状的第一部分以及 对应
Figure imgf000012_0002
包括:
步骤 100 , 提供玻璃基板;
Figure imgf000012_0003
h形成氧化铟锡薄膜图案 结构, 得到彩色滤 该氧化铟锡薄膜图案结构由对应有效显示区
'I夕状的 部分以及对应电极接触垫形状的第二部力'
8 , 如权利要求 7 所述的彩色滤光片基板的制作方法, 其中, 所述步 骤. 400包括:
步骤 401、 在所述玻璃基板上溅镀氧化铟锡薄膜;
步骤 402、 在该氧化铟锡薄膜上均匀涂布光刻胶层;
步骤 403、 图案化该光刻胶层, 图案化后的光刻胶层由对应有效显示 区域形状的第一部分以及对应电极.接触垫形状的第二部分组成;
步骤 404、 以湿法蚀刻的方法蚀刻掉没有被光刻胶所覆盖的氧化铟锡 薄膜, 最后用脱模液除去图案化的光刻胶层, 得到具有所需氧化铟锡薄膜 图案结构的玻璃基板。
9、 如权利要求 7 所述的彩色滤光片基板的制作方法, 其中, 所述步 骤 400包括:
步骤 411、 在所述玻璃.基板上溅镀氧化铟锡薄膜;
步骤 412、 在该氧化铟锡薄膜上均勾涂布光刻胶层;
步骤 413、 图案化该光刻胶层, 图案化后的光刻胶层由对应有效显示 区域形状的第一部分以及对应电极接融垫形状的第二部分组成;
步骤 4】4、 以干法蚀刻的方法蚀刻掉没有被光刻胶所覆盖的氧化铟锡 薄膜, 最后用脱模液除去图案化的光刻胶层, 得到具有所需氧化铟锡薄膜 图案结构的玻璃基板
10 , 如权利要求 7所述的彩色滤光片基板的制作方法, 其中, 所述步 骤 400包括.:
步骤 421、 在所述玻璃基板上均勾涂布光刻胶;
步骤 422、 将玻璃基板上对应所需要氧化铟锡薄膜图案结构的光刻胶 去除, 形成图案化光刻胶层;
步骤 423、 在具有图案化光刻胶层的玻璃基 上溅镀氧化铟锡薄膜; 步骤 424、 对包含图案化光刻胶层以及氧化铟锡薄膜的玻璃基板进行 脱模处理, 将图案化光刻胶层以及附在其上的氧化铟锡薄膜去除, 得到具 有所需氧化铟锡薄膜图案结构的玻璃基板。
PCT/CN2013/078246 2013-05-08 2013-06-28 彩色滤光片基板及其氧化铟锡薄膜图案结构、制作方法、液晶显示器 WO2014180052A1 (zh)

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