WO2014161251A1 - 碱可溶树脂及其制备方法、含有其的光刻胶组合物 - Google Patents
碱可溶树脂及其制备方法、含有其的光刻胶组合物 Download PDFInfo
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- WO2014161251A1 WO2014161251A1 PCT/CN2013/080171 CN2013080171W WO2014161251A1 WO 2014161251 A1 WO2014161251 A1 WO 2014161251A1 CN 2013080171 W CN2013080171 W CN 2013080171W WO 2014161251 A1 WO2014161251 A1 WO 2014161251A1
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- WIPO (PCT)
- Prior art keywords
- alkali
- soluble resin
- acid
- polyether chain
- photoresist composition
- Prior art date
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Classifications
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- C08G81/02—Macromolecular compounds obtained by interreacting polymers in the absence of monomers, e.g. block polymers at least one of the polymers being obtained by reactions involving only carbon-to-carbon unsaturated bonds
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- C08F216/06—Polyvinyl alcohol ; Vinyl alcohol
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- C08F265/02—Macromolecular compounds obtained by polymerising monomers on to polymers of unsaturated monocarboxylic acids or derivatives thereof as defined in group C08F20/00 on to polymers of acids, salts or anhydrides
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0048—Photosensitive materials characterised by the solvents or agents facilitating spreading, e.g. tensio-active agents
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0388—Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F222/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
- C08F222/10—Esters
- C08F222/1006—Esters of polyhydric alcohols or polyhydric phenols
- C08F222/102—Esters of polyhydric alcohols or polyhydric phenols of dialcohols, e.g. ethylene glycol di(meth)acrylate or 1,4-butanediol dimethacrylate
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F222/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
- C08F222/10—Esters
- C08F222/1006—Esters of polyhydric alcohols or polyhydric phenols
- C08F222/104—Esters of polyhydric alcohols or polyhydric phenols of tetraalcohols, e.g. pentaerythritol tetra(meth)acrylate
Definitions
- Embodiments of the present invention relate to an alkali-soluble resin, a method of producing the same, and a photoresist composition containing the same. Background technique
- the color filter is mainly composed of a substrate, a black matrix, a color film layer, a protective layer, and a conductive layer.
- the colored photoresist composition is applied to a substrate to form a photoresist layer, and the photoresist layer is exposed to form a predetermined photoresist pattern, and the photoresist pattern is developed and post-baked to obtain a color film layer. .
- the slope angle of the film layer is primarily dependent on the film forming properties of the photoresist composition.
- the main components of the general photoresist composition include alkali-soluble resins, photoactive compounds, photoinitiators, pigment dispersions, organic solvents, and other additives.
- the photoactive compound will form a polymer after exposure and high temperature, and some polymers have high hardness and are not easy to bend and form a slope, resulting in a large gradient of the film layer, so the connection between the color film layer and the black matrix is prone to voids.
- the slope angle is too large to affect the coating and rubbing effect of the alignment layer in the liquid crystal glass cell in the subsequent process, and may also cause light leakage; it may even affect the liquid crystal orientation, thereby affecting the display quality of the picture.
- Keeping the slope angle of the color film layer in an appropriate range (23° - 60°) is the focus of development of the photoresist composition. Summary of the invention
- An embodiment of the present invention provides an alkali-soluble resin, wherein the alkali-soluble resin is a polyether chain-containing acrylic acid-soluble solvent obtained by grafting an alkali-soluble resin with a polyether chain-containing monobasic acid. Resin.
- the monobasic acid structure is as follows:
- the acryl-based soluble resin may include any one of a methacrylate, an amine-modified acrylate, a polycyclic aromatic aryl alkali-soluble resin, and a hyperbranched alkali-soluble acrylated polyester.
- the alkali-soluble resin contains less than 100 carbon atoms.
- the embodiment of the present invention further provides a method for preparing an alkali soluble resin, which comprises the following steps: 1) adipic acid, 1,3-dibromo-5,5-dimethylhydantoin in a solvent dichloromethane The reaction is carried out to obtain 1-bromohexanoic acid; 1-bromohexanoic acid is reacted with sodium hydroxide to obtain sodium 1-hydroxyhexanoate; sodium 1-hydroxyhexanoate is reacted with acryloyl chloride to obtain an adipic acid activating substance;
- the ratio of the parts by weight of the polyethylene glycol and the adipic acid activator in the step 2 ranges from 1:0.5 to 1:0.95.
- the ratio of the parts by weight of the polyether chain-containing monobasic acid and the alkali-soluble resin in the step 3 is 1:0.45 to 1:0.83.
- Embodiments of the present invention also provide a photoresist composition comprising the above-described alkali-soluble resin.
- the photoresist composition may include the following components by weight: alkali soluble resin: 7%-24%;
- Photoactive compound 10%-22%
- the photoinitiator may include one or more of a benzoin substance, a benzophenone substance, and an anthraquinone substance.
- the photoactive compound may include one or more of dipentaerythritol pentaacrylate, dipentaerythritol hexaacrylate, pentaerythritol tetraacrylate, and ethoxylated pentaerythritol tetraacrylate.
- the photoresist composition may further include a solvent component including propylenedione methyl ether acetate, propylene glycol diacetate, and ethyl 3-ethoxy-3-imidopropionate.
- a solvent component including propylenedione methyl ether acetate, propylene glycol diacetate, and ethyl 3-ethoxy-3-imidopropionate.
- 2-heptane, 3-heptane, cyclopentanone, and cyclohexanone One or more of 2-heptane, 3-heptane, cyclopentanone, and cyclohexanone.
- Figure 1 is a flow chart showing the preparation process of an alkali-soluble resin in Example 1 of the present invention.
- Figure 2 is a structural view showing a grafted polyether chain in Example 1 of the present invention.
- Fig. 3 is a schematic view showing the slope angle of the color film layer prepared in Example 1 of the present invention.
- Fig. 4 is a view showing the slope angle of the color film layer prepared in Example 2 of the present invention.
- Fig. 5 is a view showing the slope angle of the color film layer prepared in Example 3 of the present invention.
- Fig. 6 is a view showing the slope angle of the color film layer prepared in Example 4 of the present invention.
- Figure 7 is a schematic illustration of the slope angle of a color film layer prepared in accordance with a comparative example of the present invention. Detailed ways
- An embodiment of the present invention provides an alkali-soluble resin, which is a polyether chain-containing acrylic acid-soluble solvent obtained by grafting an alkali-soluble resin with an acrylic acid-containing resin. Resin.
- polyether chain-containing monobasic acid For example, the structural formula of the polyether chain-containing monobasic acid is as follows:
- n is an integer in the range 7-30.
- the acryl-based soluble resin may include any one of a methacrylate, an amine-modified acrylate, a polycyclic aromatic aryl alkali-soluble resin, and a hyperbranched alkali-soluble acrylated polyester.
- the alkali-soluble resin contains less than 100 carbon atoms.
- the polyether-linked branched acrylic acid-soluble resin of the embodiment of the present invention is added to the photoresist combination
- the alkali-soluble resin since the alkali-soluble resin has a double bond, it can participate in the polymerization reaction upon exposure and post-baking, so that a denser flexible network can be formed, and at the same time, it is still soft after baking after high temperature. Since the internal rotation barrier of the ether bond in the alkali-soluble resin is small and the dynamic flexibility is good, under gravity, it is easy to cause other components of the photoresist to bend and sink naturally, thereby forming a small slope. .
- the color film layer prepared from the photoresist composition containing the alkali-soluble resin has a small slope angle and can be controlled at 25 to 55. Within the range, the phenomenon that the connection between the color film layer and the black matrix is prone to voids and light leakage is avoided.
- the photoresist composition of the embodiment of the invention improves the coating and rubbing effect of the alignment layer in the liquid crystal glass cell in the subsequent process, improves the liquid crystal orientation, and thereby improves the display T quality of the picture.
- the embodiment of the present invention also provides a method for preparing the above alkali-soluble resin, which comprises the following steps:
- Adipic acid 1,3-dibromo-5,5-dimethylhydantoin is reacted in a solvent of dichloromethane to obtain 1-bromohexanoic acid; 1-bromohexanoic acid is reacted with sodium hydroxide to obtain 1-hydroxyl group Sodium hexate; reacting sodium 1-hydroxyhexanoate with acryloyl chloride to obtain adipic acid activator;
- the polyethylene glycol and the adipic acid activator are reacted in a solvent hydrazine, hydrazine-dimethylformamide to obtain a polybasic acid containing a polyether chain;
- the polyether chain-containing monobasic acid and the acrylic acid alkali soluble resin are reacted in a solvent hydrazine, hydrazine-dimethylformamide to obtain a polyether chain-containing acrylic alkali-soluble resin.
- the ratio of the parts by weight of the polyethylene glycol and the adipic acid activator in the step 2 ranges from 1:0.5 to 1:0.95.
- the ratio of the parts by weight of the polyether chain-containing monobasic acid and the acrylic acid alkali soluble resin in the step 3 is in the range of 1:0.45 to 1:0.83.
- Embodiments of the present invention also provide a photoresist composition comprising the above alkali-soluble resin.
- the photoresist composition comprises the following weight percentage components:
- Alkali soluble resin 7%-24%
- Photoactive compound 10%-22%
- Photoinitiator 1.3%-12.5%.
- Any photoactive compound that can be used for this purpose can include double seasons One or more of pentaerythritol pentaacrylate, dipentaerythritol hexaacrylate, pentaerythritol tetraacrylate, ethoxylated pentaerythritol tetraacrylate.
- Photoinitiators suitable for use in embodiments of the invention may be any photoinitiator known to those skilled in the art for this purpose.
- the photoinitiator may include one or more of a benzoin substance, a benzophenone substance, an anthraquinone substance.
- the photoresist composition may also include a solvent component.
- the solvent is not particularly limited as long as it can dissolve or disperse the components of the photoresist composition, does not react with the above components, and has a certain volatility.
- the solvent may be propylene glycol methyl ether acetate, propylene glycol diacetate, ethyl 3-ethoxy-3-imide propionate, 2-heptane, 3-heptane, cyclopentanone, cyclohexane One or more of the ketones.
- the solvent may be present in an amount from 3% to 21% by weight of the photoresist composition.
- pigment dispersions such as pigment dispersions, other additives such as coupling agents, antioxidants, ultraviolet diluents or crosslinking agents.
- additives such as coupling agents, antioxidants, ultraviolet diluents or crosslinking agents.
- the pigment dispersion may be present in an amount from about 40% to about 70% by weight of the photoresist composition, such as from about 48% to about 69%.
- the additive may be present in an amount from about 0.05% to about 1.5% by weight of the photoresist composition, such as from about 0.07% to about 1.0%.
- a photoresist composition containing the alkali-soluble resin includes the following components by weight: alkali-soluble resin: 7% to 24%;
- Photoactive compound 10%-22%
- Additives may be added as needed, such as: coupling agents, antioxidants, UV absorbers, crosslinkers, leveling agents or other auxiliaries, etc., not listed here.
- Example 1 The present embodiment provides an alkali soluble resin, a preparation method thereof, and a photoresist composition containing the alkali soluble resin.
- the preparation method of the alkali soluble resin is as follows (the preparation process is shown in Figure 1):
- the NMR data of the adipic acid activator are as follows: NMR (300 MHz, CDC1 3 , ppm) ⁇ : 2.11-2.72 (m, 6H), 3.82 (s, lH), 4.06 (s, lH), 4.89 (s , 2H), 5.3 ( s, lH ) , 11.8 ( s, 2H ).
- Polyethylene glycol 400, adipic acid activator, hydrazine, dimethyl-dimethylformamide (DMF) as a solvent were added to a round bottom flask (the weight ratio of the three is shown in Table 1), at 80 ° C Reflux for 6 h. After the reaction was stopped, the DMF solvent was removed by steaming under reduced pressure. It was added dropwise to 30 parts by weight of acetone, and washed three times by the above method to obtain a white solid, which was dried in vacuo to give a polyether chain-containing monobasic acid, wherein the structural formula of the polyether chain is shown in Fig. 2.
- the hyperbranched alkali-soluble acrylated polyester used in this example has a structure represented by the following formula (I):
- R 2 is methyl, ethyl, phenyl, tea, polycyclic aryl, methylamino, hydrazine; hydrogen or methyl;
- m, q, p All are integers in the range of 9-15;
- a and b are integers in the range of 1-5.
- the polyether chain-containing monobasic acid, the hyperbranched alkali-soluble acrylated polyester (1) prepared in 1.2), the hydrazine, hydrazine-dimethylformamide (DMF) as a solvent are added to the round bottom flask ( The weight ratio of the three is shown in Table 1), and an appropriate amount of concentrated sulfuric acid was added as a catalyst, and refluxed at 135 ° C for 12 h. After the reaction was stopped and cooled, the DMF solvent was removed by steaming under reduced pressure. It is added dropwise to 50 parts by weight of cyclohexanone, washed three times by the above method, and dried under vacuum to obtain a white solid, that is, an alkali-soluble resin.
- the structural formula ( ⁇ ) is shown in Fig. 1, wherein, it is a methyl group or an ethyl group; 2 is any one of a methyl group, an ethyl group, a phenyl group, a tea group, a polycyclic aryl group, a methylamino group, and a biphenyl group; R 3 is hydrogen or a methyl group; and m, q, and p are all in the range of 9-15.
- An integer; a, b are integers in the range of 1-5.
- a photoresist composition was prepared according to the components and contents listed in Table 1. The components were thoroughly stirred to form a photoresist composition, which was applied to a glass substrate having a black matrix, labeled as Sample 1, and having a thickness of 2.6 ⁇ m. Baking in an oven at 80-110 ° C for 3 min, exposing with ultraviolet light with an illuminance of 125 mJ/cm 2 , developing in a developing solution at room temperature for 30 s, washing with deionized water, and drying, at 230 ° Bake at 45 ° C for 45 min.
- Example 2 The glass was sliced, sampled, and the cross section was examined by scanning electron microscopy (SEM) to observe the slope. The results are shown in Figure 3, where the slope angle is 28.3°. It can be seen that the film layer has a small slope angle and can effectively avoid light leakage.
- SEM scanning electron microscopy
- the present embodiment provides an alkali soluble resin, a preparation method thereof, and a photoresist containing the alkali soluble resin combination.
- the preparation method of the alkali soluble resin is as follows:
- the preparation method of the adipic acid activator is the same as the preparation method of the adipic acid activator in Example 1. 2.2) Preparation of monobasic acid containing polyether chain
- a photoresist composition was prepared according to the components and contents listed in Table 1. The components were thoroughly stirred to form a photoresist composition, which was applied to a glass substrate having a black matrix, labeled as Sample 2, and having a thickness of 2.6 ⁇ m. Baking in an oven at 80-110 ° C for 3 min, exposing with ultraviolet light with an illuminance of 125 mJ/cm 2 , developing in a developing solution at room temperature for 30 s, washing with deionized water, and drying, at 230 ° Bake at 45 ° C for 45 min.
- Example 3 The glass was sliced, sampled, and examined by scanning electron microscopy (SEM) to observe the cross section and observe the slope. The results are shown in Figure 4, where the slope angle is 39.5°. It can be seen that the film layer has a small slope angle and can effectively avoid light leakage.
- SEM scanning electron microscopy
- the present embodiment provides an alkali-soluble resin, a preparation method thereof, and a photoresist composition containing the alkali-soluble resin.
- the preparation method of the alkali soluble resin is as follows:
- Polyethylene glycol 1200, adipic acid activator, hydrazine, dimethyl-dimethylformamide (DMF) as a solvent were added to a round bottom flask (the weight ratio of the three is shown in Table 1), at 100 ° C Reflux for 6-10h. After the reaction was stopped, the DMF solvent was distilled off under reduced pressure. It was added dropwise to 70 parts by weight of acetone, and washed three times by the above method to obtain a white solid, which was dried in vacuo to give a polyether chain-containing monobasic acid, wherein the structural formula of the polyether chain is shown in Fig. 2.
- a photoresist composition was prepared according to the components and contents listed in Table 1. The components were thoroughly stirred to form a photoresist composition, which was applied to a glass substrate having a black matrix, labeled as Sample 3, and having a thickness of 2.6 ⁇ m. Baking in an oven at 80-110 ° C for 3 min, exposing with ultraviolet light with an illuminance of 125 mJ/cm 2 , developing in a developing solution at room temperature for 30 s, washing with deionized water, and drying, at 230 ° Bake at 45 ° C for 45 min.
- Example 4 The glass was sliced, sampled, and examined by scanning electron microscopy (SEM) to observe the cross section and observe the slope. The results are shown in Figure 5, where the slope angle is 51.7°. It can be seen that the film layer has a small slope angle and can effectively avoid light leakage.
- SEM scanning electron microscopy
- the present embodiment provides an alkali-soluble resin, a preparation method thereof, and a photoresist composition containing the alkali-soluble resin.
- the preparation method of the alkali soluble resin is as follows:
- the preparation method of the adipic acid activator is the same as the preparation method of the adipic acid activator in Example 1.
- the polyether chain-containing monobasic acid, methacrylate, and hydrazine, dimethyl-dimethylformamide (DMF) as a solvent were added to a round bottom flask (the weight ratio of the three is shown in Table 1).
- the DMF solvent was distilled off under reduced pressure.
- 80 parts by weight of cyclohexanone was added dropwise, washed three times by the above method, and dried under vacuum to give a white solid, that is, an alkali-soluble resin.
- a photoresist composition was prepared according to the components and contents listed in Table 1. The components were thoroughly stirred to form a photoresist composition, which was applied to a glass substrate having a black matrix, labeled as Sample 4, and having a thickness of 2.6 ⁇ m. Bake in an oven at 80-110 ° C for 3 min, expose to ultraviolet light with an illuminance of 125 mJ/cm 2 , and then develop in a developing solution at room temperature for 30 s, rinse with deionized water, and blow dry at 230 ° C. Bake for 45 min under temperature conditions.
- the glass was sliced, sampled, and examined by scanning electron microscopy (SEM) to observe the cross section and observe the slope. Obtain the slope angle of the film as shown in Fig. 7, where the slope angle is 45.0°. It can be seen that the slope angle of the film layer is small, and light leakage can be effectively avoided. Comparative example
- the alkali-soluble resin in the photoresist composition of Example 4 was replaced with an equivalent weight percentage of an alkali-soluble resin, and the other components and contents were the same as in Example 4 to prepare a photoresist composition.
- the other steps were the same as in Example 4, and the slope angle of the film layer was obtained as shown in Fig. 7, wherein the slope angle was 76.0. It can be seen that the film layer has a large slope angle and is easy to leak light.
- Each reactant contains a polyether chain of monobasic acid:
- the acrylic acid used in the examples can be reduced to a high-branched alkali-soluble amine-modified epoxy aromatic acid methyl methacrylate type acrylated acrylate acrylate half ester ester polyester
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Abstract
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KR20100099048A (ko) * | 2009-03-02 | 2010-09-10 | 주식회사 동진쎄미켐 | 감광성 수지 조성물 |
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- 2013-04-03 CN CN201310116385.3A patent/CN103232603B/zh active Active
- 2013-07-26 WO PCT/CN2013/080171 patent/WO2014161251A1/zh active Application Filing
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CN103232603B (zh) | 2015-03-18 |
CN103232603A (zh) | 2013-08-07 |
US9279037B2 (en) | 2016-03-08 |
US20150152210A1 (en) | 2015-06-04 |
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