WO2014139896A2 - Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus - Google Patents

Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus Download PDF

Info

Publication number
WO2014139896A2
WO2014139896A2 PCT/EP2014/054487 EP2014054487W WO2014139896A2 WO 2014139896 A2 WO2014139896 A2 WO 2014139896A2 EP 2014054487 W EP2014054487 W EP 2014054487W WO 2014139896 A2 WO2014139896 A2 WO 2014139896A2
Authority
WO
WIPO (PCT)
Prior art keywords
mirror
effective surface
optically effective
mirror substrate
arrangement according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2014/054487
Other languages
English (en)
French (fr)
Other versions
WO2014139896A3 (en
Inventor
Markus Hauf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss SMT GmbH
Original Assignee
Carl Zeiss SMT GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss SMT GmbH filed Critical Carl Zeiss SMT GmbH
Priority to KR1020157026654A priority Critical patent/KR102211633B1/ko
Priority to CN201480014966.9A priority patent/CN105190443B/zh
Priority to JP2015562046A priority patent/JP6483626B2/ja
Publication of WO2014139896A2 publication Critical patent/WO2014139896A2/en
Publication of WO2014139896A3 publication Critical patent/WO2014139896A3/en
Priority to US14/848,593 priority patent/US9798254B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70883Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
    • G03F7/70891Temperature
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70258Projection system adjustments, e.g. adjustments during exposure or alignment during assembly of projection system
    • G03F7/70266Adaptive optics, e.g. deformable optical elements for wavefront control, e.g. for aberration adjustment or correction
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0825Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/181Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors with means for compensating for changes in temperature or for controlling the temperature; thermal stabilisation
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70883Environment aspects, e.g. pressure of beam-path gas, temperature of optical system

Definitions

  • the invention concerns an arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus.
  • Microlithography is used for the production of microstructured components, such as for example integrated circuits or LCDs.
  • the microlithographic process is carried out in what is known as a projection exposure apparatus, which has an illumination device and a projection lens.
  • a projection exposure apparatus which has an illumination device and a projection lens.
  • mirrors are used as optical components for the imaging process because of the lack of availability of suitable light-transmissive refractive materials.
  • a problem that arises in practice is that, in particular as a result of absorption of the radiation emitted by the EUV light source, the EUV mirrors undergo heating and an accompanying thermal expansion or deformation, which in turn may have the consequence of impairing the imaging properties of the optical system.
  • the heat inputs brought about by the EUV radiation can be varied over the optically effective cross section of mirrors close to the pupil, so that an inhomogeneous heat input into the mirror takes place.
  • a problem that arises in practice in the thermal actuation or deformation of a mirror is that, on the one hand, for the introduction of deformations into the mirror substrate material by way of thermal expansion or contraction, there must in principle be sufficient sensitivity of the mirror substrate material to thermal loads but, on the other hand, sensitivities to the optical loads, and the associated temperature effects, occurring during the "normal" operation of the projection exposure apparatus, are desired.
  • sensitivities to the optical loads, and the associated temperature effects, occurring during the "normal" operation of the projection exposure apparatus are desired.
  • without further measures in the design of the mirror to obtain an increasing sensitivity to thermal loads introduced for the purpose of producing deformation there is an increasing occurrence of thermally induced aberrations during the operation of the projection exposure apparatus as a result of the unavoidable optical loads due to the (for example EUV) radiation that is used.
  • An object of the present invention is to provide an arrangement for the thermal actuation of a mirror in an optical system that makes efficient thermal actuation possible with at the same time low sensitivity to the optical loads occurring during normal operation.
  • the invention concerns an arrangement for the thermal actuation of a mirror in an optical system, in particular in a microlithographic projection exposure apparatus, the mirror having a mirror substrate and an optically effective surface and also at least one access channel extending from a surface of the mirror not corresponding to the optically effective surface in the direction of this effective surface,
  • At least one heat source for coupling heating power that can be set variably into a region of the mirror substrate that is adjoining the optically effective surface is provided;
  • the invention is based in particular on the concept of using cooling elements that are variable with regard to their cooling power in combination with a heat source that can be set variably with regard to its heating power to provide two degrees of freedom in the thermal actuation that can be set independently of one another in terms of automatic control.
  • an entirely different temperature can be set in the region of the mirror substrate material that is more remote from the optically effective surface, a temperature at which a comparatively greater sensitivity to thermal loads is obtained for the material concerned, as is desired for specific thermal actuation or deformation.
  • the present invention is based in particular on the concept of creating, using the independently realizable adjustability of the cooling power of a cooling element on the one hand and the heating power of at least one heat source on the other hand, a thermal flux between the optically effective surface and said surface of the mirror not corresponding to the optically effective surface (e.g. the backside of the mirror).
  • This thermal flux results in a temperature gradient and a related local variation of a value of the coefficient of thermal expansion in the mirror substrate, which leads to a behaviour of said mirror substrate being comparable, in terms of thermal sensitivity or the locally varying coefficient of thermal expansion (CTE), to a bimetal.
  • this behaviour makes it possible to maintain the optically effective surface of the mirror at a temperature for which the mirror material is substantially insensitive against thermal loads occurring during operation of the optical system (namely the so-called zero crossing temperature explained below in more detail), while at the same time enabling a region in the mirror substrate remote from said optically effective surface to be more sensitive or thermally actuable due to the different CTE-value in order to create a desired specific deformation of the mirror.
  • the invention also circumvents or avoids the conflicting aspects that an actuator, which is desired to be insensitive against thermal loads, will also behave insensitive against thermal actuation.
  • the heating power of the heat source may be reduced - with unchanged cooling power of the cooling element -, with the consequence that the thermal balance in the direct vicinity of the optically effective surface is preserved, whereas an efficient thermal actuation or deformation can take place in the region remote from the optically effective surface that is at a temperature well below the zero-crossing temperature, as a result of the greater, and no longer negligible, coefficient of linear expansion in this remote region.
  • the temperature in the region remote from the optically effective surface can be specifically manipulated at any time, while the temperature in the direct vicinity of the optically effective surface is kept substantially constant (that is preferably at the aforementioned zero-crossing temperature).
  • the sensitivity to changes in temperature that there consequently is in the region remote from the optically effective surface mirror deformations can be generated there, while at the same time in the region of the optically effective surface the mirror remains largely insensitive to the impinging electromagnetic radiation of unavoidable optical loads occurring during the operation of the optical system.
  • the arrangement has a plurality of access channels.
  • each of these access channels may in particular be respectively assigned a cooling element, the cooling elements preferably being able to be set independently of one another in their cooling power.
  • the at least one cooling element has a tubular geometry.
  • the heat source has at least one heat emitter for coupling heating radiation into the at least one access channel.
  • each of the access channels may be respectively assigned a heat emitter, the heat emitters preferably being able to be set independently of one another in their heating power.
  • the at least one heat emitter may be arranged in the end portion of the access channel that is facing the optically effective surface.
  • the heat emitter may, for example, also be arranged in the region of the rear side of the mirror, in order to couple in the heating radiation by way of reflection along the access channel (preferably with what is known as a "grazing incidence").
  • the heating radiation may, for example, have a wavelength of at least 2.5 ⁇ , in particular at least 5 ⁇ .
  • the heat source may also have at least one heating wire or at least one heat-dissipating conductor track (for example in the form of a structured electrically conducting layer), which is arranged between the mirror substrate and the reflective coating of the mirror.
  • the access channel extends from the surface of the mirror that is opposite from the optically effective surface in the direction of the optically effective surface.
  • the mirror has a first mirror substrate region of a first mirror substrate material and a second mirror substrate region of a second mirror substrate material, different from the first mirror substrate material, the second mirror substrate region being more remote from the optically effective surface of the mirror than the first mirror substrate region.
  • the first mirror substrate material preferably has a lower coefficient of linear expansion at a prescribed temperature than the second mirror substrate material.
  • the described greater sensitivity of the mirror substrate material that is desired for the purpose of specific deformation is obtained in the region more remote from the optically effective surface not only because of the temperature gradient forming within the mirror substrate material but also because of the transition between different mirror substrate materials, which is of advantage in particular whenever the temperature gradient forming in the mirror substrate alone is not yet sufficient to achieve the sensitivity to thermal loads desired for the deformation while at the same time maintaining the zero- crossing temperature at the optically effective surface.
  • the first mirror substrate material is a material with ultra-low thermal expansion "ultra-low expansion material", for example a titanium- silicate glass sold under the name ULETM by the company Corning Inc.
  • the second mirror substrate material may, for example, be amorphous or crystalline quartz (S1O 2 ).
  • the mirror has a reflective coating, an absorbent layer for the absorption of heating radiation that is coupled into the access channel being arranged between the mirror substrate and the reflective coating.
  • the invention also concerns a method for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus, the mirror having a mirror substrate, an optically effective surface and at least one access channel extending from a surface of the mirror not corresponding to the optically effective surface in the direction of this effective surface and also a cooling element with a cooling power that can be set variably protruding into the at least one access channel,
  • heating power is coupled into a region of the mirror substrate that is adjoining the optically effective surface
  • This constant value preferably corresponds to the zero-crossing temperature of the mirror substrate material in the region concerned.
  • the constant value lies, for example, in the range of 22°C to 55°C, in particular in the range of 22°C to 40°C.
  • the variation of the heating power of the heat source may be performed in such a way that a heat input into the optically effective surface that is caused by optical loads during the operation of the projection exposure apparatus is at least partially compensated. In this way, the temperature of the optically effective surface can be kept constant even under variable optical loads.
  • a deformation in that region of the mirror substrate facing away from the optically effective surface is effected, wherein said deformation mechanically transfers to the optically effective surface.
  • Figures 1 -2 show schematic representations for explaining the structure of an arrangement according to the invention for the thermal actuation of a mirror in a first embodiment of the invention
  • Figure 3 shows a diagram in which the temperature dependence of the coefficient of linear expansion for different mirror substrate materials is plotted;
  • Figures 4a-b show schematic representations for explaining the structure of an arrangement according to the invention for the thermal actuation of a mirror in a further exemplary embodiment of the invention;
  • Figures 5a-b show schematic representations of further embodiments of the invention;
  • Figure 6 shows a schematic representation of a projection lens of a microlithographic projection exposure apparatus designed for operation in EUV, in which the invention can be realized for example;
  • Figure 7 shows a schematic representation illustrating a concept of the present invention.
  • the mirror 100 has a plurality of access channels 1 10, 1 1 1 , 1 12,..., which extend from the rear side of the mirror (i.e. the side of the mirror 100 that is opposite from the optically effective surface 101 ) through the mirror substrate denoted by "102" into the vicinity of the optically effective surface 101 , the access channels 1 10, 1 1 1 , 1 12,... according to Fig. 1 being in a matrix-like arrangement.
  • Fig. 2a-b only one access channel 1 10 is shown in section, the mirror 100 and the other access channels 1 1 1 , 1 12,... being configured in an analogous way.
  • a cooling element 120 of a tubular geometry in the exemplary embodiment extends into the access channel 1 10, this cooling element 120 being able to be set variably in its cooling power (by connection to a controllable cooler that is not shown).
  • the arrangement also has a heat source in the form of a heat emitter 130, which in the exemplary embodiment is arranged in the end portion of the access channel 1 10 that is facing the optically effective surface 101 and has a heating power that can likewise be set variably.
  • the heat emitter 130 may also be arranged in a different region of the access channel 1 10, in particular also in the region of the rear side of the mirror, in order in this case to couple in the heating radiation by way of the access channel 1 10 or reflection on the side walls of the access channel 1 10, preferably sufficiently shallow reflection angles with what is known as "grazing incidence”.
  • the heat source may also be configured in the form of at least one heating wire.
  • the electromagnetic radiation that is radiated - once again with reference to Fig. 1 and 2a, b - by way of the heat emitter 130 and coupled into the mirror substrate material may, for example, have a wavelength of at least 2.5 ⁇ , more particularly a wavelength of at least 5 ⁇ , as may be realized for instance by way of what is known as a low-temperature emitter at temperatures of up to 400°C, in particular in the range up to 200°C.
  • a high-temperature emitter such as for example a spiral-wound filament (with an operating temperature of typically up to 3000°C) may also be used.
  • heating radiation for example infrared radiation
  • the combined use of the cooling element 120, on the one hand, and the heat emitter 130, on the other hand, allows the temperature of the mirror substrate material in the region of the optically effective surface 101 to be kept constantly at a value that corresponds substantially to the zero-crossing temperature of the mirror substrate material concerned (for example when there is an increasing optical load in the region of the optically effective surface 101 as a result of the impinging electromagnetic (EUV) radiation during the operation of the projection exposure apparatus).
  • EUV impinging electromagnetic
  • a temperature that deviates from the zero-crossing temperature and makes sufficient sensitivity of the mirror substrate material to thermal loads possible, and consequently specific thermal actuation or deformation of the mirror 100 can be set in a region remote therefrom (that is in the "lower" region in Fig. 2a-b).
  • the temperature set in the region of the optically effective surface 101 may be 30°C and in the region remote from the optically effective surface 101 may be -15°C, in which case there is already a significant change in the coefficient of linear expansion depending on the mirror substrate material.
  • the inventive concept in particular involves creating, using the independently realizable adjustability of the cooling power of a cooling element on the one hand and the heating power of at least one heat source on the other hand, a thermal flux between the optically effective surface and said surface of the mirror not corresponding to the optically effective surface (e.g. the backside of the mirror).
  • the access channel 1 10 and the created temperature gradient between the optically effective surface 101 and the backside of the mirror 100 makes it possible to maintain the optically effective surface 101 of the mirror 100 at a temperature for which the mirror material is substantially insensitive against thermal loads occurring during operation of the optical system (namely the so-called zero crossing temperature), while at the same time enabling a region in the mirror substrate remote from said optically effective surface to be more sensitive or thermally actuable due to the different CTE-value in order to create a desired specific deformation of the mirror.
  • a temperature variation is created in a region of the mirror substrate facing away from the optically effective surface (e.g. at the backside of the mirror) such that, due to the thermal sensitivity achieved by the value of the coefficient of thermal expansion in that region of the mirror substrate, a deformation in the mirror substrate is effected, said deformation being mechanically transferred to the optically effective surface (having a substantially constant temperature close to the zero crossing temperature).
  • the corresponding impact matrices (and the resultant temperature base functions and deformation base functions) can be suitably combined to set a desired (as homogeneous as possible) temperature profile and also a desired deformation profile.
  • the region of the mirror substrate 102 in the vicinity of the optically effective surface 101 is at this zero-crossing temperature, optical loads caused by the electromagnetic radiation impinging on the optically effective surface 101 during the operation of the projection exposure apparatus do not result in any deformation, since the coefficient of linear expansion of the mirror substrate material is equal to zero.
  • Fig. 3 when there is a deviation from this temperature, there is an increasing sensitivity of the respective mirror substrate material to temperature changes, which can be used for the thermal actuation or deformation of the mirror 100 that is described above.
  • the embodiment according to Fig. 4 differs from that according to Fig. 2 in that the mirror substrate 202 is produced from two different mirror substrate materials, the mirror 200 is therefore formed as a "composite mirror".
  • the mirror substrate 202 has a first mirror substrate region 202a and a second mirror substrate region 202b, which is more remote in relation thereto from the optically effective surface
  • the mirror substrate regions 202a, 202b being produced from different materials.
  • the mirror substrate material of the first mirror substrate region is ULETM and the mirror substrate material of the second mirror substrate region 202b is quartz glass (S1O2).
  • the invention is not restricted to these materials, so that in further embodiments the mirror substrate regions 202a, 202b may also be produced from different mirror substrate materials, the mirror substrate material in the second mirror substrate region 202b in each case having a coefficient of linear expansion that is greater in terms of the absolute amount at a prescribed temperature than the mirror substrate material in the first mirror substrate region.
  • the desired greater sensitivity of the mirror substrate material that is described above and is desired for the purpose of specific deformation is obtained in the region more remote from the optically effective surface 201 not only because of the temperature gradient forming within the mirror substrate material but also because of the transition between different mirror substrate materials, so that the embodiment according to Fig. 4 is suitable in particular in situations in which the said temperature gradient alone is not yet sufficient to achieve the sensitivity to thermal loads desired for the deformation while at the same time maintaining the zero-crossing temperature at the optically effective surface.
  • Fig. 5a and 5b serve for explaining further embodiments of the invention.
  • an absorbent layer 530 for the at least partial absorption of the heating radiation that is coupled into the access channel 1 10 is arranged between the mirror substrate 102 and the reflective coating 550.
  • an arrangement 540 of heating wires is provided as the heat source, by which the region between the mirror substrate 102 and the reflective coating 550 can be heated directly with heating power that can be set variably.
  • An arrangement according to the invention for the thermal actuation of a mirror may be used both in conjunction with a mirror in the illumination device and in conjunction with a mirror in the projection lens of a microlithographic projection exposure apparatus.
  • FIG. 6 shows merely as an example of an application the path of rays of a projection lens 600, which is disclosed in US 2008/0170310 A1 (see Fig. 2 there).
  • the projection lens 500 is designed for operation in EUV and has six mirrors M1 to M6.
  • the mirrors M2 and M6 that are respectively close to the pupil or else another of the mirrors according to one of the embodiments described above may be configured as thermally actuable.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Toxicology (AREA)
  • Atmospheric Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
PCT/EP2014/054487 2013-03-14 2014-03-07 Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus Ceased WO2014139896A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020157026654A KR102211633B1 (ko) 2013-03-14 2014-03-07 거울의 열적 작동을 위한 배열
CN201480014966.9A CN105190443B (zh) 2013-03-14 2014-03-07 用于反射镜的热致动的装置
JP2015562046A JP6483626B2 (ja) 2013-03-14 2014-03-07 特にマイクロリソグラフィー投影露光装置内のミラーの熱作動用装置
US14/848,593 US9798254B2 (en) 2013-03-14 2015-09-09 Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201361781280P 2013-03-14 2013-03-14
DE102013204427.5A DE102013204427A1 (de) 2013-03-14 2013-03-14 Anordnung zur thermischen Aktuierung eines Spiegels, insbesondere in einer mikrolithographischen Projektionsbelichtungsanlage
US61/781,280 2013-03-14
DE102013204427.5 2013-03-14

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US14/848,593 Continuation US9798254B2 (en) 2013-03-14 2015-09-09 Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus

Publications (2)

Publication Number Publication Date
WO2014139896A2 true WO2014139896A2 (en) 2014-09-18
WO2014139896A3 WO2014139896A3 (en) 2014-11-06

Family

ID=51418762

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2014/054487 Ceased WO2014139896A2 (en) 2013-03-14 2014-03-07 Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus

Country Status (6)

Country Link
US (1) US9798254B2 (enExample)
JP (1) JP6483626B2 (enExample)
KR (1) KR102211633B1 (enExample)
CN (1) CN105190443B (enExample)
DE (1) DE102013204427A1 (enExample)
WO (1) WO2014139896A2 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106324792A (zh) * 2015-06-19 2017-01-11 中国科学院大连化学物理研究所 一种适用高功率激光使用的相变冷却反射镜
JP2017536579A (ja) * 2014-11-20 2017-12-07 カール・ツァイス・エスエムティー・ゲーエムベーハー 少なくとも1つのマニピュレータを有する投影露光装置
DE102019219231A1 (de) 2019-12-10 2020-01-23 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Halbleiterlithographie
DE102021213458A1 (de) 2021-11-30 2022-08-18 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Halbleiterlithografie

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013219808A1 (de) * 2013-09-30 2015-04-02 Heraeus Quarzglas Gmbh & Co. Kg Spiegelblank für EUV Lithographie ohne Ausdehnung unter EUV-Bestrahlung
DE102015225509A1 (de) 2015-12-16 2017-06-22 Carl Zeiss Smt Gmbh Reflektives optisches Element
CN106125298A (zh) * 2016-08-31 2016-11-16 中国科学院长春光学精密机械与物理研究所 非接触式空间光学遥感器反射镜面形控制系统
CN110546573B (zh) * 2017-04-11 2022-10-04 Asml荷兰有限公司 光刻设备
CN107390346A (zh) * 2017-09-19 2017-11-24 北京仿真中心 一种低辐射红外场镜装置
DE102019219289A1 (de) 2019-12-11 2021-06-17 Carl Zeiss Smt Gmbh Optisches System, sowie Heizanordnung und Verfahren zum Heizen eines optischen Elements in einem optischen System
DE102020201724A1 (de) * 2020-02-12 2021-08-12 Carl Zeiss Smt Gmbh Optisches system und lithographieanlage
WO2022028710A1 (en) * 2020-08-07 2022-02-10 Carl Zeiss Smt Gmbh Optical system and method of operating an optical system
EP4244676A1 (en) * 2020-11-11 2023-09-20 ASML Netherlands B.V. A method and apparatus for thermally deforming an optical element
EP4002009A1 (en) * 2020-11-11 2022-05-25 ASML Netherlands B.V. A method and apparatus for thermally deforming an optical surface of an optical element
DE102021201258A1 (de) 2021-02-10 2022-08-11 Carl Zeiss Smt Gmbh Verfahren zum Heizen eines optischen Elements in einer mikrolithographischen Projektionsbelichtungsanlage, sowie optisches System
DE102021214366A1 (de) * 2021-12-15 2023-06-15 Carl Zeiss Smt Gmbh Vorrichtung und Verfahren zur Vermeidung einer Degradation einer optischen Nutzoberfläche eines Spiegelmoduls, Projektionssystem, Beleuchtungssystem sowie Projektionsbelichtungsanlage
CN114924378B (zh) * 2022-05-30 2023-10-27 深圳综合粒子设施研究院 一种反射镜面形控制结构及光束线装置
DE102022211636A1 (de) 2022-11-04 2024-05-08 Carl Zeiss Smt Gmbh Optisches System, sowie Verfahren zum Betreiben eines optischen Systems
WO2024145826A1 (zh) * 2023-01-04 2024-07-11 深圳综合粒子设施研究院 反射镜的面形优化方法及装置
CN116203722A (zh) * 2023-01-04 2023-06-02 深圳综合粒子设施研究院 反射镜的面形优化方法及装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040051984A1 (en) 2002-06-25 2004-03-18 Nikon Corporation Devices and methods for cooling optical elements in optical systems, including optical systems used in vacuum environments
WO2008034636A2 (de) 2006-09-21 2008-03-27 Carl Zeiss Smt Ag Optisches element und verfahren
US20080170310A1 (en) 2007-01-17 2008-07-17 Carl Zeiss Smt Ag Imaging optical system
WO2009046955A2 (en) 2007-10-09 2009-04-16 Carl Zeiss Smt Ag Device for controlling temperature of an optical element
DE102009024118A1 (de) 2008-06-17 2010-02-11 Carl Zeiss Smt Ag Vorrichtung zur thermischen Manipulation eines optischen Elementes
WO2010018753A1 (en) 2008-08-11 2010-02-18 Nikon Corporation Deformable mirror, mirror apparatus, and exposure apparatus
WO2012041744A1 (en) 2010-09-28 2012-04-05 Carl Zeiss Smt Gmbh Arrangement for mirror temperature measurement and/or thermal actuation of a mirror in a microlithographic projection exposure apparatus

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0868898A (ja) * 1994-08-29 1996-03-12 Nikon Corp 反射鏡およびその製造方法
JP2004056125A (ja) * 2002-06-20 2004-02-19 Nikon Corp 個別アクチュエータを有する反射投影光学系
US6880942B2 (en) * 2002-06-20 2005-04-19 Nikon Corporation Adaptive optic with discrete actuators for continuous deformation of a deformable mirror system
JP2005019628A (ja) * 2003-06-25 2005-01-20 Nikon Corp 光学装置、露光装置、並びにデバイス製造方法
EP1522892B1 (en) * 2003-10-09 2007-08-29 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4537087B2 (ja) * 2004-02-12 2010-09-01 キヤノン株式会社 露光装置、デバイスの製造方法
US7894038B2 (en) * 2007-03-14 2011-02-22 Asml Netherlands B.V. Device manufacturing method, lithographic apparatus, and a computer program
EP2181357A1 (en) * 2007-08-24 2010-05-05 Carl Zeiss SMT AG Controllable optical element and method for operating an optical element with thermal actuators and projection exposure apparatus for semiconductor lithography
US7740362B1 (en) * 2008-02-19 2010-06-22 Jefferson Science Associates Mirror with thermally controlled radius of curvature
DE102009039400A1 (de) 2009-08-31 2011-03-03 Carl Zeiss Laser Optics Gmbh Reflektives optisches Element zur Verwendung in einem EUV-System
JP5732257B2 (ja) * 2010-01-15 2015-06-10 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置、デバイス製造方法およびコンピュータ読取可能媒体
JP5785419B2 (ja) * 2010-04-07 2015-09-30 エーエスエムエル ネザーランズ ビー.ブイ. 光学要素を冷却する方法、リソグラフィ装置、およびデバイスを製造する方法
TWI475330B (zh) * 2010-07-30 2015-03-01 卡爾蔡司Smt有限公司 超紫外線曝光裝置
DE102011005778A1 (de) 2011-03-18 2012-09-20 Carl Zeiss Smt Gmbh Optisches Element
DE102011005840A1 (de) 2011-03-21 2012-09-27 Carl Zeiss Smt Gmbh Steuerbare Mehrfachspiegelanordnung, optisches System mit einer steuerbaren Mehrfachspiegelanordnung sowie Verfahren zum Betreiben einer steuerbaren Mehrfachspiegelanordnung

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040051984A1 (en) 2002-06-25 2004-03-18 Nikon Corporation Devices and methods for cooling optical elements in optical systems, including optical systems used in vacuum environments
WO2008034636A2 (de) 2006-09-21 2008-03-27 Carl Zeiss Smt Ag Optisches element und verfahren
US20080170310A1 (en) 2007-01-17 2008-07-17 Carl Zeiss Smt Ag Imaging optical system
WO2009046955A2 (en) 2007-10-09 2009-04-16 Carl Zeiss Smt Ag Device for controlling temperature of an optical element
DE102009024118A1 (de) 2008-06-17 2010-02-11 Carl Zeiss Smt Ag Vorrichtung zur thermischen Manipulation eines optischen Elementes
WO2010018753A1 (en) 2008-08-11 2010-02-18 Nikon Corporation Deformable mirror, mirror apparatus, and exposure apparatus
WO2012041744A1 (en) 2010-09-28 2012-04-05 Carl Zeiss Smt Gmbh Arrangement for mirror temperature measurement and/or thermal actuation of a mirror in a microlithographic projection exposure apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017536579A (ja) * 2014-11-20 2017-12-07 カール・ツァイス・エスエムティー・ゲーエムベーハー 少なくとも1つのマニピュレータを有する投影露光装置
CN106324792A (zh) * 2015-06-19 2017-01-11 中国科学院大连化学物理研究所 一种适用高功率激光使用的相变冷却反射镜
DE102019219231A1 (de) 2019-12-10 2020-01-23 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Halbleiterlithographie
WO2021115789A1 (en) 2019-12-10 2021-06-17 Carl Zeiss Smt Gmbh Projection exposure apparatus for semiconductor lithography
US12436361B2 (en) 2019-12-10 2025-10-07 Carl Zeiss Smt Gmbh Projection exposure apparatus for semiconductor lithography
DE102021213458A1 (de) 2021-11-30 2022-08-18 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Halbleiterlithografie

Also Published As

Publication number Publication date
KR20150132203A (ko) 2015-11-25
DE102013204427A1 (de) 2014-09-18
US9798254B2 (en) 2017-10-24
JP6483626B2 (ja) 2019-03-13
JP2016517028A (ja) 2016-06-09
US20160041480A1 (en) 2016-02-11
CN105190443A (zh) 2015-12-23
KR102211633B1 (ko) 2021-02-04
CN105190443B (zh) 2019-04-23
WO2014139896A3 (en) 2014-11-06

Similar Documents

Publication Publication Date Title
US9798254B2 (en) Arrangement for the thermal actuation of a mirror, in particular in a microlithographic projection exposure apparatus
US10684551B2 (en) EUV exposure apparatus with reflective elements having reduced influence of temperature variation
US12085780B2 (en) Optical system, heating arrangement, and method for heating an optical element in an optical system
CN104081284B (zh) Euv光刻的光学布置
JP2022023178A (ja) リソグラフィ装置のオブジェクトを保持するためのチャック及びクランプ、並びにリソグラフィ装置のクランプによって保持されるオブジェクトの温度を制御する方法
KR101452534B1 (ko) 광학 시스템의 결상 특성을 향상시키기 위한 방법 및 광학 시스템
US9470872B2 (en) Reflective optical element
CN116324621A (zh) 光学系统与操作光学系统的方法
US9500957B2 (en) Arrangement for thermal actuation of a mirror in a microlithographic projection exposure apparatus
US20170315452A1 (en) Method For Producing An Optical Element For An Optical System, In Particular For A Microlithographic Projection Exposure Apparatus
US11029515B2 (en) Optical element, and method for correcting the wavefront effect of an optical element
CN112513739A (zh) 用于确定微光刻光学系统的光学元件的加热状态的方法和装置
CN114651213A (zh) 半导体光刻的投射曝光设备
JP4305003B2 (ja) Euv光学系及びeuv露光装置
US20250102920A1 (en) Method for heating an optical element, and optical system
CN116830003A (zh) 光学系统和用于操作光学系统的方法
US20250264712A1 (en) Adaptive mirror with mechanical mediator layer and microlithographic projection exposure apparatus
US20250216792A1 (en) Method for operating a projection exposure system

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 201480014966.9

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 14713392

Country of ref document: EP

Kind code of ref document: A2

ENP Entry into the national phase

Ref document number: 2015562046

Country of ref document: JP

Kind code of ref document: A

ENP Entry into the national phase

Ref document number: 20157026654

Country of ref document: KR

Kind code of ref document: A

122 Ep: pct application non-entry in european phase

Ref document number: 14713392

Country of ref document: EP

Kind code of ref document: A2