WO2014108048A1 - Appareil de test de module d'écran tactile et module d'écran tactile - Google Patents

Appareil de test de module d'écran tactile et module d'écran tactile Download PDF

Info

Publication number
WO2014108048A1
WO2014108048A1 PCT/CN2014/070108 CN2014070108W WO2014108048A1 WO 2014108048 A1 WO2014108048 A1 WO 2014108048A1 CN 2014070108 W CN2014070108 W CN 2014070108W WO 2014108048 A1 WO2014108048 A1 WO 2014108048A1
Authority
WO
WIPO (PCT)
Prior art keywords
detection
line
drive
driving
tested
Prior art date
Application number
PCT/CN2014/070108
Other languages
English (en)
Chinese (zh)
Inventor
潘松
陈立权
赵同炜
Original Assignee
上海海尔集成电路有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 上海海尔集成电路有限公司 filed Critical 上海海尔集成电路有限公司
Publication of WO2014108048A1 publication Critical patent/WO2014108048A1/fr

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0446—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/965—Switches controlled by moving an element forming part of the switch
    • H03K2217/9651—Switches controlled by moving an element forming part of the switch the moving element acting on a force, e.g. pressure sensitive element

Definitions

  • Test device and method for touch screen module and touch screen module are Test device and method for touch screen module and touch screen module
  • the present invention relates to electrical testing techniques, and more particularly to a test device and method for a touch screen module and a touch screen module. Background technique
  • the capacitive touch screen module includes a touch screen, a control chip, and a cable or circuit board that connects the touch screen to the control chip.
  • the touch screen is generally provided with a plurality of driving lines, a plurality of detecting lines and a ground line in parallel, and the driving lines and the detecting lines are perpendicular to each other.
  • the drive and sense lines are interleaved, but not connected, and the intersection can be thought of as a capacitor.
  • a drive circuit and a detection circuit are provided in the control chip.
  • the driving circuit corresponds to the driving line, and a driving signal for generating a certain frequency is supplied to the driving line.
  • the detection circuit is connected to the detection line, and the detection signal with the same frequency but attenuated amplitude can be detected.
  • the control chip controls the driving circuit to sequentially transmit the driving signal, and the control detecting circuit detects the signal strength of the received detection signal, such as the voltage amplitude of the pulse signal.
  • the control chip completely refreshes one frame of data, that is, the entire touch screen is completely scanned, each unit surrounded by the drive line and the detection line obtains a value representative of the signal strength through the detection signal.
  • the capacitance value between the driving line and the detecting line is changed by the human body capacitance, so that the intensity of the detection signal received by the detecting line is lowered, and the control chip can detect which unit has the signal intensity change according to the detection. Thereby identifying the specific touch location.
  • the invention provides a test device and method for a touch screen module and a touch screen module, so as to flexibly and quickly test a signal path fault between the touch screen and the chip.
  • An embodiment of the present invention provides a test device for a touch screen module, including:
  • N driving switches are respectively connected in series between the N driving lines and the corresponding driving circuit
  • N detection switches are respectively connected in series between the N detection lines and the corresponding detection circuits
  • N drive capacitor switches are respectively connected in series with N drive switches and connected in parallel to the first end of the self-test capacitor
  • N detection terminal capacitor switches are respectively connected in series with N detection switches and connected in parallel to the second end of the self-test capacitor
  • control module configured to control an on/off state of the N drive switches, N detection switches, N drive capacitor switches, and N detection terminal capacitor switches according to a set path detection strategy, and control each drive circuit to send a drive Signaling, and determining a path failure between the driving line, the detecting line and the ground line on the touch screen according to the detection signals acquired by each of the detecting circuits, wherein N is a natural number.
  • the embodiment of the present invention further provides a test method for a touch screen module, which uses the test device of the touch screen module provided above, and the operations performed by the control module include:
  • the embodiment of the invention further provides a touch screen module, including a touch screen, a control chip and a connection
  • the touch screen includes a driving line, a detecting line and a grounding line
  • the control chip includes a driving circuit and a detecting circuit
  • the touch screen module further includes a testing device of the touch screen module provided by any embodiment of the present invention.
  • the technical solution of the invention utilizes the existing line and working principle in the touch screen module, and can only detect the path failure of the open circuit and the short circuit of all the lines by adding the switch and the self-test capacitance, and the operation can be based on the control chip by the control module
  • the existing functions are automatically controlled, and no manual testing is required, which significantly improves the work efficiency.
  • FIG. 1 is a schematic structural diagram of a test apparatus for a touch screen module according to a first embodiment of the present invention
  • FIG. 2 is a schematic structural diagram of a test apparatus for a touch screen module according to a second embodiment of the present invention
  • FIG. 4 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 4 of the present invention
  • FIG. 5 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 5 of the present invention
  • FIG. 6 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 6 of the present invention
  • FIG. 7 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 7 of the present invention
  • FIG. 1 is a schematic structural diagram of a test apparatus for a touch screen module according to a first embodiment of the present invention
  • FIG. 2 is a schematic structural diagram of a test apparatus for a touch screen module according to a second embodiment
  • FIG. 9 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 9 of the present invention
  • FIG. 10 is a schematic diagram of a driving method of a touch screen module according to an embodiment of the present invention. Flowchart of short circuit detection
  • FIG. 11 is a driving method for testing a touch screen module according to an embodiment of the present invention. And detecting a flowchart of the line short-circuit detecting line
  • FIG. 12 Test Method flowchart of touch screen module for short circuit between the detection line detection provided by the present embodiment of the invention;
  • FIG. 13 is a flowchart of detecting a short circuit between a detection line and a ground line in a test method of a touch screen module according to an embodiment of the present invention
  • FIG. 14 is a diagram showing driving lines and grounds in a test method for a touch screen module according to an embodiment of the present invention
  • FIG. 15 is a flowchart of a method for detecting a disconnection of a driving line in a testing method of a touch screen module according to an embodiment of the present invention
  • FIG. 16 is a flowchart of a method for testing a touch screen module according to an embodiment of the present invention
  • FIG. 1 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 1 of the present invention, which can be used for detecting a short circuit or an open circuit fault between signal lines in a capacitive touch screen.
  • the capacitive touch screen includes parallel N driving lines and N parallel detecting lines, N is a natural number, and the driving lines and the detecting lines are perpendicular to each other.
  • the touch screen also includes a ground line, and a voltage difference between the driving line and the ground line can be formed.
  • N drive lines, N test lines, and ground lines are signal lines in the touch screen, which are connected to the control chip via a cable or a circuit board. That is, as shown in FIG. 1, the signal line of the touch screen is collected at the edge, and the driving line forms DO.
  • N pins of Dn the detection lines form N pins of S0, ..., Sn, and the ground lines form GND pins.
  • Each pin can be used to connect to a control chip.
  • the control chip provides the drive circuit and the detection circuit.
  • the N drive circuits are recorded as Drivel, Driven, and N detection circuits are recorded as
  • the test device provided in this embodiment is a test circuit, and the test device can be integrated in the control chip of the touch screen module, and the working principle of the drive circuit for transmitting the drive signal in the touch screen module and the detection circuit receiving the detection signal is implemented in the touch screen. Detection of signal line paths.
  • the testing device of the touch screen module provided in this embodiment includes: N driving switches, which are recorded as
  • N detecting switches denoted as Kl Kn, respectively connected in series to the purging detection line and the corresponding detecting circuit
  • N drive capacitor switches denoted as Bl Bn, connected in series with N drive switches, and connected in parallel to the first end of self-test capacitor C
  • N sense capacitor switches denoted as Ml Mn, respectively connected in series with N detection switches, and connected in parallel to the second end of the self-test capacitor C
  • a control module (not shown), specifically implemented in hardware or software, integrated in the control chip, and each switch,
  • the driving circuit is connected to the detecting circuit, and is configured to control an on-off state of the N driving switches, N detecting switches, N driving terminal capacitor switches, and N detecting terminal capacitor switches according to a set path detecting strategy, and according to each The detection signal acquired by the detection circuit determines a path failure between the drive line, the detection line, and the ground line on the touch screen.
  • the working principle of the embodiment is: using the principle that the driving circuit can send the driving signal to each driving line, and the detecting line can return the detecting signal to the detecting circuit, and a self-testing capacitor is added between the driving line and the detecting line for
  • the sensing capacitance between the driving line and the detecting line on the touch screen is simulated, and the connection relationship between the driving line, the detecting line and the self-testing capacitor can be controlled by the driving end capacitor switch and the detecting end capacitor switch.
  • the self-test capacitor has a certain influence on the detection signal. In the normal situation, the short circuit condition and the open circuit condition, different detection signals are generated. Therefore, in this embodiment, the switch is controlled to be turned on and off.
  • the transmission and reception of the drive signal and the detection signal identify a short circuit or an open circuit failure of the signal line on the touch screen.
  • the technical solution of the embodiment utilizes the existing line and working principle in the touch screen module, and only the switch and the self-test capacitor can be added to detect the path failure of the open circuit and the short circuit of all the lines, and the operation can be controlled by the control module.
  • the existing functions of the chip are automatically controlled, and no manual testing is required, which significantly improves the work efficiency. Different control strategies can be used for different path failures of different lines, which are respectively described below by way of examples.
  • Embodiment 2 Embodiment 2
  • FIG. 2 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 2 of the present invention.
  • a control module is optimized, and a control structure for detecting a short circuit fault between drive lines is provided.
  • the switch state in the test device is as shown in FIG. 2, and the control module specifically includes a short circuit detecting unit between the driving line and the driving line, which is used for controlling the driving switch of the driving line to be tested to be closed, and the other driving switches are simultaneously closed or closed one by one.
  • the driving end capacitor switch corresponding to the driving line to be tested is closed, at least one detecting end capacitor switch is closed, and the remaining switches are
  • Replacement page (Article 26) Disconnecting, providing a driving signal to the driving line to be tested by the driving circuit corresponding to the driving line to be tested, and acquiring a detection signal at the closed detecting end capacitance switch through the detecting circuit, when determining that the obtained detection signal is smaller than When the intra-line short-circuit threshold is driven, it is determined that there is a short-circuit fault between the driving line to be tested and other driving lines.
  • the number of the drive line and the detection line are two as an example.
  • all the drive switches are simultaneously closed.
  • the current drive line to be tested is DO
  • all the drive switches AO and A1 are closed
  • the drive end capacitor switch B0 corresponding to the drive line DO to be tested is closed
  • at least one of the detection end capacitor switches is closed.
  • the detection end is specifically the detection end.
  • Capacitor switch M0 is closed, and the remaining switches, such as Bl, Ml, K1 and K2, are open.
  • the driving signal generated by the driving circuit DriveO passes through the self-test capacitor C and is detected by the detecting circuit SenseO corresponding to the detecting end capacitor switch M0 to a normal level value, and is set as a pre- Set the value V0, which is recorded as the drive line internal short-circuit threshold. If there is a short circuit between the driving line DO to be tested and the driving line D1, the driving signal of the driving circuit DriveO passes through the driving line DO to the driving line D1, and then is dispersed by the driving circuit Drivel channel in the grounded state, as shown by the dotted line in FIG. The path is shown.
  • the control module can detect a short circuit between the drive line DO to be tested and other drive lines. If the detection terminal capacitance switch M1 is selected to be closed, the corresponding detection circuit Sensel can also test whether the drive line to be tested is short-circuited based on the same principle. Short-circuit tests between drive lines can be done by testing other drive lines in sequence. Alternatively, when the test drive line is short-circuit tested, it is also possible to use the drive switches of the other drive lines to be closed one by one.
  • FIG. 3 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 3 of the present invention.
  • the control module is optimized, and the short circuit fault between the drive line and the detection line is detected. Control structure. The state of the switch in the test device is shown in Figure 3.
  • the control module specifically includes a short circuit detecting unit between the driving line and the detecting line, configured to control the driving switch corresponding to the driving line to be tested to be closed, all the detecting switches are closed, and the remaining switches are disconnected, corresponding to the driving line to be tested.
  • the driving circuit supplies a driving signal to the driving line to be tested, and acquires the detection signal through each detection circuit respectively. When it is determined that the acquired detection signal is greater than the inter-line short-circuit threshold, the driving line to be tested and the corresponding detection are determined. There is a short circuit fault between the lines. In FIG. 3, the number of the driving line and the detecting line are respectively taken as an example.
  • the driving switch AO corresponding to the driving line DO to be tested is closed, and all the detecting switches K0 and K1 are closed. Other switches, such as Dl, Bl, B2, Ml, and M2, are disconnected.
  • the driving circuit DriveO provides a driving signal. If there is no short circuit between the driving line DO and each detecting line, each detecting circuit does not measure the driving signal generated by the driving circuit DriveO through the detecting line, that is, the signal strength thereof is not greater than the set line interval. Short circuit threshold.
  • the signal between the detecting line and the driving line at the short circuit is not attenuated by the sensing capacitor, and the detecting circuit SenseO corresponding to the detecting line SO measures an abnormal detecting signal. That is, it is greater than the inter-line short-circuit threshold, as shown by the dashed path in FIG. At this time, it can be determined that there is a short circuit between the drive line DO and the detection line SO. Similarly, whether there is a short circuit between the driving line DO and the other detecting lines can be determined by the value of the detection signal appearing in other detecting circuits. Short-circuit test between the drive line and the test line can be completed by testing other drive lines in turn.
  • FIG. 4 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 4 of the present invention.
  • a control module is optimized, and a control structure for detecting a short circuit fault between detection lines is provided. .
  • the switch state in the test device is as shown in FIG.
  • control module specifically includes: a short circuit detecting unit between the detecting line and the detecting line, configured to control all detecting switches to be closed, and the detecting end capacitive switch corresponding to the detecting line to be tested is closed, at least A driving end capacitor switch is closed, and the remaining switches are turned off, and a driving signal is provided by a driving circuit corresponding to the closed driving end capacitor switch, and the detecting signals are respectively obtained by each detecting circuit, and when the detecting circuit corresponding to the non-test detecting line is determined When the acquired detection signal is greater than the detection short-circuit threshold, it is determined that there is a short-circuit fault between the non-test detection line and the detection line to be tested.
  • the detecting line is SO, all detecting switches K0 and K1 are closed, the detecting end capacitor switch M0 corresponding to the detecting detecting line so is closed, and at least one driving end capacitive switch is closed.
  • the driving end capacitor switch B0 is closed as an example. Note that the remaining switches, such as Ml, Bl, AO, and A1 are disconnected.
  • the driving circuit DriveO corresponding to the closed driving terminal capacitor switch B0 provides a driving signal. The driving signal is not supplied to the driving line DO because the driving switch AO is disconnected, but enters the detecting circuit through the self-test capacitor C. As shown by the dotted line in Figure 4.
  • the drive signal of the drive circuit DriveO passes through the self-test capacitor C and is detected by the detection circuit SenseO. If there is no short circuit between the detection line SO and the detection line S1, the detection circuit Sense1 does not measure the drive signal, that is, the acquired detection. The signal is not greater than the short-circuit threshold in the detection line; on the contrary, if there is a short circuit between the detection line SO and the non-test line S1, the detection circuit Sense1 corresponding to the non-test line to be detected will measure an abnormal driving signal. The detection signal acquired by the detection circuit Sense1 corresponding to the gp non-test line S1 is greater than the detection line internal short-circuit threshold. At this time, the control module can determine that there is a relationship between the test line SO to be tested and the non-test line S1 to be tested. Short circuit. Similar tests are performed on other test lines to measure the presence of short circuits between other test lines.
  • FIG. 5 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 5 of the present invention.
  • the control module is optimized, and the short circuit between the detection line and the ground line is involved.
  • the switch state in the test device is as shown in FIG.
  • control module specifically includes: a short circuit detecting unit between the detecting line and the ground, configured to control the detecting switch corresponding to the detecting line to be tested and the capacitive switch of the detecting end, and any one of the driving The end capacitor switch is closed, the other switches are turned off, and a driving signal is provided by a driving circuit corresponding to the closed driving end capacitor switch, and the detecting signal is obtained by the detecting circuit corresponding to the detecting line to be tested, and when the obtained detecting signal is judged When it is less than the short-circuit threshold between the detection line and the ground, it is determined that there is a short-circuit fault between the detection line to be tested and the ground.
  • the number of the driving line and the detecting line are respectively taken as an example.
  • the current detecting line to be tested is S0, and the detecting switch K0 and the detecting end capacitor switch M0 corresponding to the detecting detecting line S0 are closed, and any A driving terminal capacitor switch is closed.
  • the driving terminal capacitor switch B0 is closed as an example for description.
  • the other switches, such as A0, Al, Bl, Ml, and K1 are disconnected, and are corresponding to the closed driving terminal capacitor switch B0.
  • the drive circuit DriveO provides a drive signal.
  • the drive signal of the drive circuit DriveO is detected by the detection circuit SenseO through the self-test capacitor C. If there is a short circuit between the detection line SO to be tested and the ground GND, the detection line SO is in the ground state, and the detection circuit SenseO does not measure normal.
  • the driving signal that is, the detection signal is smaller than the short-circuit threshold between the detection line and the ground, at this time, it can be determined that there is a short circuit between the detection line SO to be tested and the ground GND.
  • a similar test is performed on other detection lines, and it is possible to sequentially test whether there is a short circuit between the other detection lines and the ground line GND.
  • FIG. 6 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 6 of the present invention.
  • the control module is optimized, and the short circuit fault between the drive line and the ground line is detected.
  • the switch state in the test device is as shown in FIG. 6.
  • the control module specifically includes: a short circuit detecting unit between the drive line and the ground line, configured to control the drive switch corresponding to the drive line to be tested and the drive end capacitor switch to be closed, and any one of the detections.
  • the end capacitor switch is closed, the other switches are turned off, and a driving signal is provided by a driving circuit corresponding to the driving line to be tested, and the detecting signal is obtained by the detecting circuit corresponding to the closed detecting end capacitor switch, and the obtained detecting signal is determined.
  • a driving signal is provided by a driving circuit corresponding to the driving line to be tested
  • the detecting signal is obtained by the detecting circuit corresponding to the closed detecting end capacitor switch, and the obtained detecting signal is determined.
  • it is less than the short-circuit threshold between the driving line and the ground it is determined that there is a short-circuit fault between the driving line to be tested and the ground.
  • the number of the driving line and the detecting line are two as an example.
  • the current driving line to be tested is DO, and the driving switch AO and the driving end capacitor switch B0 corresponding to the driving line DO to be tested are closed, any one.
  • the detection terminal capacitance switch is closed.
  • the detection terminal capacitance switch M0 is closed as an example for description.
  • the other switches such as Al, Bl, Ml, K0 and K1, are disconnected, and the drive circuit DriveO corresponding to the drive line D0 to be tested is driven.
  • a driving signal is provided, and the detection signal is obtained by the detection circuit SenseO corresponding to the closed detection terminal capacitance switch M0.
  • the drive signal of the drive circuit DriveO is measured by the detection circuit SenseO through the self-test capacitor C. If there is a short circuit between the drive line DO and the ground line GND, the drive line DO is substantially in the ground state, and the detection circuit SenseO basically cannot detect the drive signal.
  • the detection signal obtained by the detection circuit SenseO is smaller than the short-circuit threshold between the drive line and the ground, as shown by the dashed path in FIG. At this time, it can be determined that there is a short circuit between the driving line DO and the ground GND, and similar detection is performed for other driving lines, and it can be determined whether there is a short circuit between the other driving lines and the ground GND.
  • Example 7
  • FIG. 7 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 7 of the present invention.
  • a control module is optimized, and a control structure for detecting an open circuit fault of a drive line is provided.
  • the switch state in the test apparatus is as shown in FIG. 7, and the test apparatus further includes a conductive strip 10 that electrically connects the drive line, the detection line, and the ground line to each other.
  • the control module specifically includes: a driving line breaking detecting unit, configured to control a driving switch corresponding to the driving line to be tested and a driving end capacitor switch to be closed, and any one of the detecting end capacitive switches is closed, the remaining switches are disconnected, and the driving is to be tested
  • the driving circuit corresponding to the line provides a driving signal
  • the detecting circuit corresponding to the closed detecting capacitor switch acquires the detection signal.
  • the driving to be tested is determined. There is an open circuit fault in the line.
  • the number of the driving line and the detecting line are respectively taken as an example.
  • the current driving line to be tested is DO, and the driving switch AO and the driving end capacitor switch B0 corresponding to the driving line DO to be tested are controlled, and any one The detection terminal capacitance switch is closed.
  • the detection terminal capacitance switch M0 is closed as an example, and the other switches, such as Al, Bl, Ml, K0, and K1 are disconnected, and the driving circuit corresponding to the driving line DO to be tested is used.
  • DriveO provides a drive signal, and the detection signal is obtained by the detection circuit SenseO corresponding to the closed detection terminal capacitor switch M0, as shown by the dashed path in FIG.
  • a conductive strip 10 is pressed against the outer end of the signal line so that each of the signal lines and the ground line GND are connected together. Since the driving lines are all connected to the ground GND, the driving signal of the driving circuit DriveO of the driving line D0 to be tested flows away through the ground GND, and the detection circuit SenseO does not detect the driving signal. If there is an open circuit of the driving line D0, the corresponding detection circuit SenseO will measure an abnormal driving signal, that is, when the obtained detection signal is judged to be larger than the driving line breaking threshold. At this time, it can be determined that there is an open circuit of the driving line D0 to be tested. A similar test is performed on other drive lines to determine if there is an open circuit on the other drive lines. In particular, when the local line GND is open, even if the drive line is not open, the detection circuit SenseO can measure the drive signal, which will be described later. Example eight
  • FIG. 8 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 8 of the present invention.
  • an optimization module is optimized, which relates to disconnection of a detection line.
  • the control structure for fault detection is as shown in FIG. 8, and the test apparatus further includes a conductive strip 10 that electrically connects the drive line, the detection line, and the ground line to each other.
  • the control module specifically includes: a detection line disconnection detecting unit, configured to control a detection switch corresponding to the detection line to be tested and a capacitance switch of the detection end to be closed, and any one of the drive end capacitive switches is closed, the remaining switches are disconnected, and the drive is closed by
  • the driving circuit corresponding to the end capacitor switch provides a driving signal
  • the detecting circuit corresponding to the detecting line to be tested acquires the detecting signal, and when it is determined that the obtained detecting signal is greater than the detecting line breaking threshold, the detecting to be tested is determined. There is an open circuit fault in the line.
  • the number of the driving line and the detecting line are respectively taken as an example.
  • the current detecting line to be tested is SO, and the detecting switch K0 and the detecting end capacitor switch M0 corresponding to the detecting detecting line SO are controlled, and any one The driving end capacitor switch is closed.
  • the driving end capacitor switch B0 is closed as an example for description.
  • the other switches, such as A0, Al, Bl, Ml, and K1 are disconnected, and are driven by the corresponding driving end capacitor switch B0.
  • the circuit DriveO provides a driving signal, and the detection signal is acquired by the detecting circuit SenseO corresponding to the detecting line SO to be tested, as shown by the dotted line path in FIG.
  • the drive circuit DriveO's drive signal flows through the self-test capacitor C to the sense circuit SenseO.
  • the sense circuit SenseO should not detect the drive signal. If there is an open circuit in the detection line S0 to be tested as shown in FIG. 8, the detection circuit SenseO will measure an abnormal driving signal, that is, it is determined that the acquired detection signal is greater than the detection line breaking threshold value, and it can be determined at this time.
  • the detection line S0 has an open circuit. Similar tests can be performed on other test lines to determine if there are any open lines on other test lines. In particular, when the local line GND is open, even if the detection line is not open, the detection circuit SenseO can measure the drive signal, which will be described later. Example nine
  • FIG. 9 is a schematic structural diagram of a test apparatus for a touch screen module according to Embodiment 9 of the present invention.
  • the embodiment is optimized based on the foregoing Embodiments 7 and 8 to control a control module, and relates to a control structure for detecting a ground fault of a ground fault.
  • the control module further includes: a ground wire disconnection detecting unit, configured to determine that the ground wire has an open circuit fault when the disconnection detecting unit determines that all the signal lines to be tested are open, wherein the disconnection detecting unit is specifically a driving line disconnection detecting unit And/or detection line disconnection
  • the detecting unit, the signal line to be tested is a driving line to be tested and/or a detecting line to be tested.
  • the drive line and the detection line are not connected to the ground line, and the test result of the drive line open circuit detection or the detection line open circuit detection described above will display all the drive lines and There is an open circuit fault in the detection line, which can be used as a special case, and it is determined that the ground line GND has an open circuit.
  • the short circuit and/or open circuit test of the signal line path between the control chip and the touch screen can be completed by controlling the circuit inside the chip.
  • the embodiment of the invention further provides a touch screen module, which comprises a touch screen, a control chip and a connection circuit, the touch screen includes a driving line, a detection line and a ground line, and the control chip comprises a driving circuit and a detecting circuit, and the connecting circuit is The cable or other circuit is used for connecting the signal lines of the touch screen and the control chip.
  • the touch screen module further includes a test device for the touch screen module provided by any embodiment of the present invention.
  • the touch screen module can automatically complete short circuit and open circuit fault detection on each signal line on the touch screen.
  • the tenth embodiment of the present invention provides a test method for a touch screen module. The method can be implemented by using the test device of the touch screen module provided by the embodiment of the present invention, wherein the operations performed by the control module include:
  • the operation of the control module can control each switch or device to perform a corresponding action by generating a control signal. For the short circuit and open circuit faults of the drive line, test line and ground line, the following specific operation methods can be used respectively.
  • the state of the testing device can be referred to as shown in FIG. 2, and the operations performed by the control module specifically include:
  • Step 101 Control all driving switches to be closed, and the driving terminal capacitance switches corresponding to the driving lines to be tested are closed or closed one by one, at least one detecting end capacitive switch is closed, and the remaining switches are turned off;
  • Step 102 Provide a driving signal to the driving line to be tested by a driving circuit corresponding to the driving line to be tested;
  • Step 103 Acquire a detection signal at a closed detection terminal capacitance switch by using a detection circuit.
  • Step 104 When it is determined that the acquired detection signal is smaller than a driving line internal short-circuit threshold, determine the driving line to be tested and other driving There is a short circuit fault between the lines.
  • Step 111 Control the drive corresponding to the drive line to be tested. The switch is closed, all detection switches are closed, and the remaining switches are open;
  • Step 112 Provide a driving signal to the driving line to be tested by a driving circuit corresponding to the driving line to be tested;
  • Step 113 Obtain a detection signal by each detection circuit respectively.
  • Step 114 When it is determined that the acquired detection signal is greater than an inter-line short-circuit threshold, determine that there is a short-circuit fault between the driving line to be tested and the corresponding detection line. .
  • Step 121 Control all detection switches to be closed, and the detection line to be tested The corresponding detecting end capacitor switch is closed, at least one driving end capacitor switch is closed, and the remaining switches are turned off;
  • Step 122 The driving signal is provided by the driving circuit corresponding to the closed driving terminal capacitor switch.
  • Step 124 when determining that the detecting circuit corresponding to the non-testing detecting line is obtained by the detecting circuit When the detection signal is greater than the short-circuit threshold in the detection line, it is determined that there is a short-circuit fault between the non-test detection line and the detection line to be tested.
  • the detection sequence of the test device is used to detect the short circuit between the line and the ground (Details Article 26)
  • the operations performed by the control module specifically include:
  • Step 131 Control the detection switch corresponding to the detection line to be tested and the detection terminal capacitance switch to be closed, and any one of the driving end capacitance switches is closed, and the remaining switches are turned off;
  • Step 132 The driving signal is provided by the driving circuit corresponding to the closed driving terminal capacitor switch.
  • Step 133 The detecting signal is obtained by the detecting circuit corresponding to the detecting line to be tested.
  • Step 134 When it is determined that the obtained detecting signal is smaller than the detecting line When there is a short-circuit threshold between the ground and the ground, it is determined that there is a short-circuit fault between the test line to be tested and the ground.
  • control module specifically includes:
  • Step 141 Control that the driving switch corresponding to the driving line to be tested and the driving end capacitor switch are closed, and that any one of the detecting end capacitive switches is closed, and the remaining switches are turned off;
  • Step 142 A driving signal is provided by a driving circuit corresponding to the driving line to be tested;
  • Step 143 Acquire a detection signal by using a detection circuit corresponding to the closed detection terminal capacitor switch
  • Step 144 When it is determined that the acquired detection signal is smaller than a short-circuit threshold between the driving line and the ground, determining that there is a short-circuit fault between the driving line to be tested and the ground.
  • control module 7 As shown in Figure 15, for the open circuit detection process of the drive line, the status of the test device can be seen in Figure 7, and the operations performed by the control module include:
  • Step 151 The driving line, the detecting line and the ground line are electrically connected to each other by using a conductive strip; Step 152, controlling the driving switch corresponding to the driving line to be tested and the driving end capacitor switch to be closed, and any one of the detecting end capacitor switches is closed, and the remaining switches are broken. Open
  • Step 153 A driving signal is provided by a driving circuit corresponding to the driving line to be tested;
  • Step 154 Acquire a detection signal by using a detection circuit corresponding to the closed detection terminal capacitor switch
  • Step 155 When it is determined that the acquired detection signal is greater than a driving line breaking threshold, determining that the driving line to be tested has an open circuit fault.
  • the state of the test device can be as shown in FIG. 8 , and the operations performed by the control module specifically include:
  • Step 161 The driving line, the detecting line and the ground line are electrically connected to each other by using a conductive strip; Step 162, controlling the detecting switch corresponding to the detecting line to be tested and the detecting end capacitor switch to be closed, and any one of the driving end capacitor switches is closed, and the remaining switches are broken.
  • Step 163 The driving signal is provided by the driving circuit corresponding to the closed driving terminal capacitor switch; Step 164: The detecting signal is obtained by the detecting circuit corresponding to the detecting line to be tested; Step 165: When it is determined that the obtained detecting signal is greater than When the line break threshold is detected, it is determined that the test line to be tested has an open circuit fault.
  • the ground breaking detection can be further performed, that is, the operations performed by the control module further include:
  • the disconnection detecting unit determines that all the signal lines to be tested are open, it is determined that there is an open circuit fault in the ground line, wherein the signal line to be tested is a driving line to be tested and/or a detecting line to be tested.
  • the aforementioned program can be stored in a computer readable storage medium.
  • the program when executed, performs the steps including the above method embodiments; and the foregoing storage medium includes: a medium that can store program codes, such as a ROM, a RAM, a magnetic disk, or an optical disk.

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Human Computer Interaction (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

L'invention porte sur un appareil et un procédé de test d'un module d'écran tactile et sur le module d'écran tactile. L'appareil de test comprend : des commutateurs de commande (A1, A2, …, An), connectés séparément en série entre une ligne de commande et un circuit d'attaque (Pilote 1, Pilote 2, …, Pilote n); des contacteurs de détection (K1, K2, …, Kn), connectés séparément en série entre une ligne de capteurs et un circuit de capteur (Capteur 1, Capteur 2, …, Capteur n); un condensateur d'autodétection (C); des commutateurs de condensateurs à extrémité de commande (B1, B2, …, Bn), connectés séparément en série aux commutateurs de commande (A1, A2, …, An) et connectés en parallèle à une première extrémité du condensateur d'autodétection (C); des commutateurs de condensateurs à extrémité de détection (M1, M2, …, Mn), connectés séparément en série aux commutateurs de commande (K1, K2, …, Kn) et connectés en parallèle à une seconde extrémité du condensateur d'autodétection (C); un module de commande utilisée pour commander l'état de MARCHE ou ARRET de chaque commutateur selon une politique de détection de trajet prédéfinie, et pour commander chaque circuit d'attaque (Pilote 1, Pilote 2, …, et Pilote n) pour envoyer un signal de commande et pour déterminer toute défaillance de trajet d'une ligne de signaux conformément à un signal de capteur obtenu par chaque circuit de capteur (Capteur 1, Capteur 2, …, Capteur n). L'appareil et le procédé de test de module d'écran tactile de la présente invention, et la commande automatique de détection de trajet par le module d'écran tactile sur la base de fonctions existantes de la puce de commande permettent d'améliorer le rendement.
PCT/CN2014/070108 2013-01-10 2014-01-03 Appareil de test de module d'écran tactile et module d'écran tactile WO2014108048A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201310009791.X 2013-01-10
CN201310009791.XA CN103926496B (zh) 2013-01-10 2013-01-10 触摸屏模组的测试装置和方法以及触摸屏模组

Publications (1)

Publication Number Publication Date
WO2014108048A1 true WO2014108048A1 (fr) 2014-07-17

Family

ID=51144789

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2014/070108 WO2014108048A1 (fr) 2013-01-10 2014-01-03 Appareil de test de module d'écran tactile et module d'écran tactile

Country Status (2)

Country Link
CN (1) CN103926496B (fr)
WO (1) WO2014108048A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104569727A (zh) * 2015-01-23 2015-04-29 珠海隆芯电子科技有限公司 非接触式的电子线路测试装置及测试方法
CN106407068A (zh) * 2015-07-30 2017-02-15 华为终端（东莞）有限公司 一种自动控制usb线缆通断的装置及测试方法
CN112558589A (zh) * 2020-12-07 2021-03-26 天津津航计算技术研究所 一种通断控制信号故障检测方法及装置

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016136293A1 (fr) * 2015-02-27 2016-09-01 シャープ株式会社 Procédé d'inspection de substrat de commande de panneau tactile et dispositif de commande de panneau tactile
CN104732947B (zh) 2015-04-16 2017-02-22 京东方科技集团股份有限公司 一种驱动芯片、驱动板及其测试方法、显示装置
CN105021919B (zh) * 2015-06-29 2019-03-15 深圳市精智达技术有限公司 电容屏测试卡、测试系统
CN105093025B (zh) * 2015-08-18 2019-01-22 深圳市华星光电技术有限公司 In Cell触控显示面板的检测电路及检测方法
CN105116276B (zh) * 2015-09-15 2019-03-01 深圳市华星光电技术有限公司 一种电容屏的检测装置
CN105301431B (zh) * 2015-11-18 2019-02-01 蓝思科技(东莞)有限公司 一种高频冲击微断路测试方法及测试系统
CN105606948A (zh) * 2016-02-01 2016-05-25 北京集创北方科技股份有限公司 一种电路检测方法及系统
CN105676053B (zh) * 2016-02-23 2018-09-25 上海芯什达电子技术有限公司 一种触摸屏缺陷检测系统
CN106771969B (zh) * 2016-12-20 2023-04-07 深圳市燕麦科技股份有限公司 一种柔性线路板触摸屏基板Open-Short测试装置和方法
CN106771817B (zh) * 2017-01-03 2019-04-26 京东方科技集团股份有限公司 触控屏、触控屏中短路的检测方法
CN108872905A (zh) * 2017-05-08 2018-11-23 原相科技股份有限公司 电容式感测装置及对应的短路测试方法
CN107230443B (zh) * 2017-06-30 2019-10-25 武汉华星光电技术有限公司 内嵌式触摸屏测试电路
CN107462273B (zh) * 2017-07-17 2020-05-12 江苏邦融微电子有限公司 一种电容式传感器模组的量产测试装置及其方法
CN107450786B (zh) * 2017-08-07 2021-03-23 京东方科技集团股份有限公司 触控控制器、包括其的触控面板以及检测电路故障的方法
WO2019173987A1 (fr) * 2018-03-14 2019-09-19 深圳市汇顶科技股份有限公司 Procédé de détection de module d'induction, puce tactile, écran tactile et procédé d'assemblage associé
CN110517615B (zh) * 2019-08-30 2023-01-10 上海中航光电子有限公司 显示面板的检测方法及其检测装置、显示面板和显示设备
CN112557945A (zh) * 2020-11-18 2021-03-26 苏州美思迪赛半导体技术有限公司 驱动端口状态检测电路及方法
CN112506095B (zh) * 2020-11-26 2021-10-01 杭州广安汽车电器有限公司 一种触摸按键自动测试系统及方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070200831A1 (en) * 2006-02-27 2007-08-30 Texas Instruments Incorporated Method and circuitry for self testing of connectivity of touch screen panel
TW201232368A (en) * 2011-01-25 2012-08-01 Nas Technologies Corps Testing device for touch panel and capacitance-measure module
CN102809707A (zh) * 2011-05-19 2012-12-05 马克西姆综合产品公司 使用互电容器测量的触摸面板测试
JP2012242915A (ja) * 2011-05-16 2012-12-10 Kyocera Display Corp タッチパネルの検査装置およびタッチパネルの検査方法
CN102819476A (zh) * 2011-04-22 2012-12-12 原相科技股份有限公司 触控屏幕面板短路的原位检测
CN102866322A (zh) * 2012-08-29 2013-01-09 北京集创北方科技有限公司 一种触摸装置检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2672260B2 (ja) * 1994-06-07 1997-11-05 トーケン工業株式会社 Ｔｆｔ−ｌｃｄの検査方法
JP3437152B2 (ja) * 2000-07-28 2003-08-18 ウインテスト株式会社 有機ｅｌディスプレイの評価装置および評価方法
WO2011121862A1 (fr) * 2010-03-29 2011-10-06 株式会社アイテス Dispositif d'inspection de panneau tactile capacitif et procédé d'inspection
US8847612B2 (en) * 2011-09-08 2014-09-30 Atmel Corporation Integrated test system for a touch sensor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070200831A1 (en) * 2006-02-27 2007-08-30 Texas Instruments Incorporated Method and circuitry for self testing of connectivity of touch screen panel
TW201232368A (en) * 2011-01-25 2012-08-01 Nas Technologies Corps Testing device for touch panel and capacitance-measure module
CN102819476A (zh) * 2011-04-22 2012-12-12 原相科技股份有限公司 触控屏幕面板短路的原位检测
JP2012242915A (ja) * 2011-05-16 2012-12-10 Kyocera Display Corp タッチパネルの検査装置およびタッチパネルの検査方法
CN102809707A (zh) * 2011-05-19 2012-12-05 马克西姆综合产品公司 使用互电容器测量的触摸面板测试
CN102866322A (zh) * 2012-08-29 2013-01-09 北京集创北方科技有限公司 一种触摸装置检测方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104569727A (zh) * 2015-01-23 2015-04-29 珠海隆芯电子科技有限公司 非接触式的电子线路测试装置及测试方法
CN104569727B (zh) * 2015-01-23 2017-12-08 珠海隆芯电子科技有限公司 非接触式的电子线路测试装置的测试方法
CN106407068A (zh) * 2015-07-30 2017-02-15 华为终端（东莞）有限公司 一种自动控制usb线缆通断的装置及测试方法
CN112558589A (zh) * 2020-12-07 2021-03-26 天津津航计算技术研究所 一种通断控制信号故障检测方法及装置

Also Published As

Publication number Publication date
CN103926496A (zh) 2014-07-16
CN103926496B (zh) 2017-07-28

Similar Documents

Publication Publication Date Title
WO2014108048A1 (fr) Appareil de test de module d'écran tactile et module d'écran tactile
US7075307B1 (en) Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements
JP2013546229A5 (fr)
US9123442B2 (en) Testing device
CN106646195B (zh) 基于电学法的键合丝瞬时触碰的检测方法、装置和平台
CN103888885B (zh) 一种微型麦克风电容测试方法
CN1892242A (zh) 非接触测试和诊断不探查节点上的开路连接的方法和装置
WO2009056820A1 (fr) Appareil et procédé de test
CN105445604B (zh) 一种usb3.1 type‑c型线缆自动测试方法
CN202421448U (zh) 核电站继电器检测装置
TWI383160B (zh) 電性連接瑕疵偵測系統及方法
WO2021088735A1 (fr) Procédé et appareil de détection de liaison, dispositif électronique et support lisible par ordinateur
KR100897982B1 (ko) 프로브카드 니들과 패드간의 미스 얼라인 방지 패턴 및 그방법
CN107562561A (zh) 计算机硬件快速诊断测试系统
JP5452965B2 (ja) ポゴタワー電気チャネル自己検査式半導体試験システム
CN108122796A (zh) 键合损伤的检测系统
TWI763565B (zh) 自動測試機的線路自檢方法
CN102879705B (zh) 柔性线路板触摸屏ic通道短/断路测试方法
US11493549B2 (en) System and method for performing loopback test on PCIe interface
CN205910312U (zh) 一种微动开关组件的通断检测工装
CN105588957B (zh) 测试座
CN209247969U (zh) 接插板和晶圆测试设备
CN219179589U (zh) 一种应用于ic测试机的检测装置
CN111190091B (zh) Wat设备的测试头及其诊断修复方法
CN101458288A (zh) 利用容性引线框传感检测开路缺陷的装置和方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 14738258

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 14738258

Country of ref document: EP

Kind code of ref document: A1