WO2014054606A1 - 微細レジストパターン形成用組成物およびそれを用いたパターン形成方法 - Google Patents
微細レジストパターン形成用組成物およびそれを用いたパターン形成方法 Download PDFInfo
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- WO2014054606A1 WO2014054606A1 PCT/JP2013/076635 JP2013076635W WO2014054606A1 WO 2014054606 A1 WO2014054606 A1 WO 2014054606A1 JP 2013076635 W JP2013076635 W JP 2013076635W WO 2014054606 A1 WO2014054606 A1 WO 2014054606A1
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- composition
- pattern
- forming
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- WHNWPMSKXPGLAX-UHFFFAOYSA-N C=CN(CCC1)C1=O Chemical compound C=CN(CCC1)C1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 description 1
- OSSNTDFYBPYIEC-UHFFFAOYSA-N C=C[n]1cncc1 Chemical compound C=C[n]1cncc1 OSSNTDFYBPYIEC-UHFFFAOYSA-N 0.000 description 1
- PJMXUSNWBKGQEZ-UHFFFAOYSA-N CC(C(Oc(cc1)ccc1O)=O)=C Chemical compound CC(C(Oc(cc1)ccc1O)=O)=C PJMXUSNWBKGQEZ-UHFFFAOYSA-N 0.000 description 1
- FDYDISGSYGFRJM-UHFFFAOYSA-N CC1(C2CC(C3)CC1CC3C2)OC(C(C)=C)=O Chemical compound CC1(C2CC(C3)CC1CC3C2)OC(C(C)=C)=O FDYDISGSYGFRJM-UHFFFAOYSA-N 0.000 description 1
- DCTVCFJTKSQXED-UHFFFAOYSA-N CCC1(C2CC(C3)CC1CC3C2)OC(C(C)=C)=O Chemical compound CCC1(C2CC(C3)CC1CC3C2)OC(C(C)=C)=O DCTVCFJTKSQXED-UHFFFAOYSA-N 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
- C08F220/10—Esters
- C08F220/20—Esters of polyhydric alcohols or phenols, e.g. 2-hydroxyethyl (meth)acrylate or glycerol mono-(meth)acrylate
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F12/00—Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring
- C08F12/02—Monomers containing only one unsaturated aliphatic radical
- C08F12/04—Monomers containing only one unsaturated aliphatic radical containing one ring
- C08F12/14—Monomers containing only one unsaturated aliphatic radical containing one ring substituted by hetero atoms or groups containing heteroatoms
- C08F12/22—Oxygen
- C08F12/24—Phenols or alcohols
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F20/00—Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
- C08F20/02—Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
- C08F20/10—Esters
- C08F20/26—Esters containing oxygen in addition to the carboxy oxygen
- C08F20/30—Esters containing oxygen in addition to the carboxy oxygen containing aromatic rings in the alcohol moiety
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F220/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
- C08F220/02—Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
- C08F220/10—Esters
- C08F220/26—Esters containing oxygen in addition to the carboxy oxygen
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D129/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Coating compositions based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Coating compositions based on derivatives of such polymers
- C09D129/02—Homopolymers or copolymers of unsaturated alcohols
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D133/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Coating compositions based on derivatives of such polymers
- C09D133/04—Homopolymers or copolymers of esters
- C09D133/14—Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur or oxygen atoms in addition to the carboxy oxygen
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D137/00—Coating compositions based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a heterocyclic ring containing oxygen; Coating compositions based on derivatives of such polymers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
- G03F7/405—Treatment with inorganic or organometallic reagents after imagewise removal
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
- H01L21/0334—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
- H01L21/0338—Process specially adapted to improve the resolution of the mask
Definitions
- the present invention relates to a composition for obtaining a resist pattern having a fine size by forming a resist pattern in a manufacturing process of a semiconductor or the like and further thickening the resist pattern, and a pattern forming method using the composition. is there.
- a resist pattern is exposed using an optical developer technique, for example, a positive resist that becomes highly soluble in an alkaline developer when exposed, and after exposing the resist, using an alkaline developer. The portion is removed to form a positive pattern.
- an optical developer technique for example, a positive resist that becomes highly soluble in an alkaline developer when exposed, and after exposing the resist, using an alkaline developer. The portion is removed to form a positive pattern.
- the part that depends on the exposure light source and the exposure method is large, and expensive and special equipment and peripheral materials that can provide the light source and method are necessary, which is a huge investment Is required.
- a practical method is a composition containing a water-soluble resin and, if necessary, an additive in a resist pattern formed in a range that can be stably obtained by a conventional method (hereinafter, for the sake of simplicity, a fine pattern is formed. And the resist pattern is thickened to reduce the hole diameter or separation width.
- the formed resist pattern is covered with a composition for forming a fine pattern that can be cross-linked with an acid, the acid present in the resist pattern is diffused by heating, and the cross-linked layer is used as a resist pattern coating layer at the interface with the resist.
- a method in which a resist pattern is thickened by forming and removing a non-crosslinked portion with a developer, and the hole diameter or separation width of the resist pattern is made fine see Patent Documents 1 and 2).
- a fine pattern forming composition containing a copolymer composed of a (meth) acrylic acid monomer and a water-soluble vinyl monomer is applied to the formed resist pattern, and the resist pattern is thermally contracted by heat treatment to form a pattern. (Refer to Patent Document 3).
- a composition for forming a water-soluble fine pattern for coating a photoresist pattern, which contains a polymer containing an amino group, particularly a primary amine see Patent Document 4).
- two coating operations are performed: a step of applying a resist composition on a substrate and a step of applying a composition for forming a fine pattern on the resist pattern surface.
- two coating operations are often performed using the same coating apparatus.
- the resist pattern is generally manufactured in a clean room. However, a limited space in the clean room can be saved if the coating apparatus can also be used.
- the cleaning liquid such as the edge rinse liquid
- the mixture of the composition and the cleaning liquid is also discharged as a waste liquid.
- This waste liquid passes through the piping and is discharged out of the apparatus.
- the waste liquid generally adheres and remains in the piping.
- coating of a resist composition and the composition for fine pattern formation are apply
- the present invention can form a fine pattern equivalent to or better than a conventional fine pattern forming composition, and at the same time has a fine compatibility with a general photoresist composition.
- An object of the present invention is to provide a pattern forming composition.
- a composition for forming a fine pattern according to the present invention is used to make a pattern fine by thickening the resist pattern in a method of forming a negative resist pattern using a chemically amplified resist composition. And a polymer containing a repeating unit having a hydroxyaryl group, and an organic solvent that does not dissolve the negative resist pattern.
- the method for forming a negative resist pattern includes: (1) A step of applying a chemically amplified photoresist composition on a semiconductor substrate to form a photoresist layer; (2) exposing the semiconductor substrate covered with the photoresist layer; (3) a step of developing with an organic solvent developer after the exposure; (4) applying the fine pattern forming composition to the surface of the photoresist pattern; (5) A step of heating a coated photoresist pattern, and (6) a step of washing and removing an excessive composition for forming a fine pattern.
- the composition for forming a fine pattern capable of forming a finer pattern by thickening the resist pattern.
- the resist pattern formed by this fine pattern forming composition has high dry etching resistance equal to or higher than that of a resist pattern formed by using a conventional fine pattern forming composition.
- the composition for forming a fine pattern according to the present invention is a composition for forming a fine pattern according to the present invention when the same coating apparatus as that used for applying the photoresist composition is used. Even if they are mixed with each other, the solid content does not precipitate, so clogging of pipes hardly occurs, and a semiconductor element can be manufactured efficiently.
- composition for forming a fine pattern comprises a polymer having a specific structure and a solvent.
- the polymer used in the present invention contains a hydroxyaryl group in the repeating unit.
- the hydroxyaryl group is a group in which one or more hydroxy groups (—OH) are bonded to a skeleton including an aromatic ring such as a benzene skeleton, a naphthalene skeleton, or an anthracene skeleton.
- the central skeleton is not particularly limited as long as it contains an aromatic group, but is preferably a benzene skeleton or a naphthalene skeleton from the viewpoint of solubility in a solvent.
- Two or more hydroxy groups may be bonded.
- a substituent other than a hydroxy group may be bonded as long as the effect of the present invention is not impaired.
- Specific examples include an alkyl group, an alkoxy group, an aryl group, a halogen, a carbonyl group, a carboxy group, a sulfo group, and an amino group.
- bonded with two carbon atoms which comprise an aryl group may form a cyclic structure.
- Such a hydroxyaryl group may be present in any part of the main chain or side chain of the polymer.
- repeating unit examples include those derived from the following monomers.
- the polymer used in the present invention can be produced by polymerizing these monomers.
- the monomer containing a hydroxyaryl group is not limited to these, and those in which a large number of hydroxy groups are bonded to the aromatic ring or other substituents may be bonded.
- the polymer in the present invention may be composed only of repeating units containing a hydroxyaryl group, but may also contain other repeating units.
- a repeating unit derived from acrylic acid, methacrylic acid, vinyl alcohol, or the like may be included.
- the effect of the present invention tends to become more prominent as the proportion of the repeating unit having a hydroxyaryl group is larger.
- the ratio of the repeating units having a hydroxyaryl group is preferably 60 mol% or more, more preferably 80 mol% or more, based on the number of moles of all repeating units constituting the polymer.
- two or more kinds of polymers can be used in combination. At this time, it is also possible to combine a polymer having a low proportion of repeating units having a hydroxyaryl group or a polymer containing no hydroxyaryl group. However, in order to ensure the effect of the present invention, it is preferable that the ratio of the repeating units having a hydroxyaryl group is the above-described ratio based on the total number of repeating units of all polymers.
- the molecular weight of the polymer used in the present invention is not particularly limited, but the weight average molecular weight is generally selected from the range of 3,000 to 200,000, preferably 5,000 to 150,000.
- a weight average molecular weight means the polystyrene conversion average weight molecular weight measured using gel permeation chromatography.
- the solvent a solvent that does not dissolve the resist pattern formed prior to applying the fine pattern forming composition is used.
- it can be selected from organic solvents such as ketones and esters in consideration of the solubility of the resist pattern.
- organic solvents such as ketones and esters in consideration of the solubility of the resist pattern.
- Specific examples include 2-heptanone, methyl isobutyl ketone (hereinafter referred to as MIBK), butyl acetate, propyl acetate, and pentyl acetate. Of these, 2-heptanone and butyl acetate are particularly preferred.
- Ethyl lactate, propylene glycol monomethyl ether acetate (hereinafter referred to as PGMEA), propylene glycol monomethyl ether (hereinafter referred to as PGMEA), cyclohexanone and the like that easily dissolve the resist pattern are not suitable.
- the composition for forming a fine pattern according to the present invention contains a polymer having a specific structure as described above, but the concentration of the polymer is arbitrary depending on the type and size of the target resist pattern, the target pattern size, etc. Can be selected. However, the concentration of the polymer containing the specific structure is generally 0.1 to 10% by weight, preferably 1.0 to 7.0% by weight, based on the total weight of the composition.
- the fine pattern forming composition according to the present invention may contain other additives as required.
- additives include surfactants, bactericides, antibacterial agents, preservatives, and fungicides.
- a typical pattern forming method to which the composition for forming a fine pattern of the present invention is applied includes the following method.
- a chemically amplified photoresist layer is formed by applying a chemically amplified photoresist to a surface of a substrate such as a silicon substrate, which has been pretreated as necessary, by a conventionally known coating method such as a spin coating method.
- a conventionally known coating method such as a spin coating method.
- an antireflection film may be formed on the substrate surface. Such an antireflection film can improve the cross-sectional shape and the exposure margin.
- a chemically amplified photoresist generates an acid upon irradiation with light such as ultraviolet rays, and forms a pattern by increasing the solubility of the light irradiated portion in an alkaline developer by a chemical change caused by the catalytic action of this acid.
- An acid-generating compound that generates an acid upon irradiation with light; and an acid-sensitive group-containing resin that decomposes in the presence of an acid to generate an alkali-soluble group such as a phenolic hydroxyl group or a carboxyl group; an alkali-soluble resin;
- an alkali-soluble resin The thing which consists of a crosslinking agent and an acid generator is mentioned.
- a photoresist pattern formed by a method of removing a portion where an alkali-soluble group is not generated using an organic solvent developer is used. Therefore, a negative photoresist pattern in which an exposed portion remains as a pattern is formed using a chemically amplified photoresist that functions as a positive type when developed with a normal alkaline developer.
- the chemically amplified photoresist layer formed on the substrate is pre-baked, for example, on a hot plate as necessary to remove the solvent in the chemically amplified photoresist, and the photoresist has a thickness of typically about 50 nm to 500 nm. It is made a film.
- the pre-baking temperature varies depending on the solvent used or the chemically amplified photoresist, but is usually 50 to 200 ° C., preferably about 70 to 150 ° C.
- the photoresist film is then used with a known irradiation device such as a high-pressure mercury lamp, a metal halide lamp, an ultra-high pressure mercury lamp, a KrF excimer laser, an ArF excimer laser, a soft X-ray irradiation device, an electron beam drawing device, and through a mask as necessary. Exposure is performed.
- a known irradiation device such as a high-pressure mercury lamp, a metal halide lamp, an ultra-high pressure mercury lamp, a KrF excimer laser, an ArF excimer laser, a soft X-ray irradiation device, an electron beam drawing device, and through a mask as necessary. Exposure is performed.
- the resist is developed using an organic solvent developer.
- Any organic solvent developer may be used as long as it does not dissolve the photoresist film portion solubilized in the alkaline aqueous solution by exposure, and has the effect of dissolving the unexposed photoresist film portion insoluble in the alkaline aqueous solution. Can be used.
- a photoresist film portion insoluble in an alkaline aqueous solution is easily dissolved in an organic solvent, and therefore, an organic solvent developer can be selected from a relatively wide range.
- the organic solvent that can be used as the organic solvent developer that can be used can be selected from polar solvents such as ketone solvents, ester solvents, alcohol solvents, amide solvents, ether solvents, and hydrocarbon solvents.
- ketone solvents include 1-octanone, 2-octanone, 2-nonanone, 2-nonanone, 4-heptanone, 1-hexanone, 2-hexanone, diisobutyl ketone, cyclohexanone, methyl ethyl ketone, methyl isobutyl ketone, acetophenone, and the like. Can do.
- Ester solvents include ethyl acetate, n-propyl acetate, isopropyl acetate, n-butyl acetate, propylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monoethyl ether acetate, 3-methoxybutyl Examples include ester solvents such as acetate, 3-methyl-3-methoxybutyl acetate, ethyl lactate, butyl lactate, and propyl lactate.
- Alcohol solvents include alcohols such as ethyl alcohol, n-propyl alcohol, isopropyl alcohol, n-butyl alcohol, sec-butyl alcohol, n-hexyl alcohol, n-heptyl alcohol, ethylene glycol, propylene glycol, diethylene glycol, etc.
- Examples include glycol solvents and glycol ether solvents such as ethylene glycol monomethyl ether, propylene glycol monomethyl ether, diethylene glycol monomethyl ether, triethylene glycol monoethyl ether, and methoxymethyl butanol.
- ether solvent examples include di-n-propyl ether, di-n-butyl ether, dioxane, tetrahydrofuran and the like in addition to the glycol ether solvent.
- amide solvent N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide and the like can be used.
- hydrocarbon solvent examples include aromatic hydrocarbon solvents such as toluene and xylene, and aliphatic hydrocarbon solvents such as pentane, hexane, octane and decane.
- organic solvents can be used in combination of two or more kinds, and can be used in combination with an inorganic solvent such as water as long as the effects of the present invention are not impaired.
- the resist pattern is rinsed (washed) using a rinse solution after the development treatment.
- cleaning is performed using a rinsing liquid containing at least one organic solvent selected from alkane solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents, and ether solvents. It is preferable to do.
- Examples of the rinsing liquid used in the rinsing step after development include n-hexyl alcohol, n-heptyl alcohol, and benzyl alcohol. A plurality of these solvents may be mixed, or may be used by mixing with other solvents or water.
- the water content in the rinse liquid is preferably 10% by mass or less, more preferably 5% by mass or less, and particularly preferably 3% by mass or less. By setting the water content to 10% by mass or less, good development characteristics can be obtained. An appropriate amount of a surfactant can be further added to the rinse solution.
- the composition for forming a fine pattern according to the present invention is applied to refine the pattern.
- water or an organic solvent that does not dissolve the resist pattern can be applied to the surface of the resist pattern.
- the applicability of the composition can be improved and the composition can be applied uniformly. That is, coatability can be improved without using an additive for improving coatability such as a surfactant in the composition.
- Such a process is sometimes called a pre-wet process.
- the composition for forming a fine pattern according to the present invention is applied so as to cover the resist pattern, and the resist pattern is thickened by the interaction between the resist pattern and the composition for forming a fine pattern.
- the interaction that occurs here is thought to be that the polymer permeates or adheres to the resist, thereby causing the resist pattern to thicken.
- the fine pattern forming composition according to the present invention permeates or adheres to the inner wall of the groove or hole formed on the surface of the resist pattern, and the pattern becomes thicker. It is possible to effectively reduce the size or the hole opening size to below the limit resolution.
- any method such as a spin coating method conventionally used when applying a photoresist resin composition may be used. it can.
- the resist pattern after the fine pattern forming composition is applied is pre-baked as necessary.
- Pre-baking may be performed by heating at a constant temperature or by heating while raising the temperature stepwise.
- the conditions for the heat treatment after applying the composition for forming a fine pattern are, for example, a temperature of 40 to 200 ° C., preferably 80 to 160 ° C., 10 to 300 seconds, and preferably about 30 to 120 seconds. Such heating promotes penetration and adhesion of the polymer to the resist pattern.
- the resist pattern After applying and heating the composition for forming a fine pattern, the resist pattern is thickened, the line width of the resist pattern is thickened, and the hole pattern has a small hole diameter.
- Such a change in size can be appropriately adjusted according to the temperature and time of the heat treatment, the type of the photoresist resin composition to be used, and the like. Therefore, if these conditions are set depending on how fine the resist pattern is to be made, in other words, how much the line width of the resist pattern is increased and how small the hole diameter of the hole pattern is required. Good.
- the difference before and after the application of the fine pattern forming composition is generally 5 to 30 nm.
- an excessive fine pattern forming composition that did not act on the resist can be removed by rinsing with water or a solvent as necessary.
- water or a solvent used for such rinsing treatment, an excessive composition that has low solubility and does not penetrate or adhere to the fine pattern forming composition that penetrates or adheres to the resist pattern. Is selected so as to have high solubility.
- the solvent used for the composition for forming a fine pattern, particularly pure water is preferably used for the rinsing treatment.
- the resist pattern obtained in this manner is substantially miniaturized because the pattern size of the resist pattern immediately after development is changed by the action of the composition for forming a fine pattern.
- the resist pattern manufactured using the composition for fine pattern formation by this invention is useful for manufacture of the semiconductor element etc. which have a finer pattern in manufacture of a semiconductor element.
- Example of resist pattern formation A spin coater (manufactured by Tokyo Electron Co., Ltd.) was used to apply a lower antireflection film AZ ArF-1C5D (trade name, manufactured by AZ Electronic Materials Co., Ltd.) to an 8-inch silicon wafer at 200 ° C. Baking was performed for 60 seconds to obtain an antireflection film having a thickness of 37 nm. A photosensitive resin composition AZ AX2110P (trade name, manufactured by AZ Electronic Materials Co., Ltd.) was baked at 110 ° C. for 60 seconds to obtain a film thickness of 120 nm.
- the obtained wafer was subjected to pattern exposure using an exposure apparatus (manufactured by Nikon Corporation) having an exposure wavelength of ArF line (193 nm), and baked at 110 ° C. for 60 seconds. Further, development processing (negative development) was performed for 30 seconds using 2-heptanone as a developer to obtain a resist pattern having a pitch of 110 nm and a hole size of 60 nm.
- Example of polymer synthesis (synthesis of PQMA / MAdMA (80/20) copolymer) Methyl amyl ketone (2100 parts), 4-hydroxyphenyl methacrylate (PQMA, 670 parts), 2-methyladamantan-2-yl methacrylate (MAdMA, 220 parts) in a reactor equipped with a stirrer, condenser and temperature controller Dimethyl 2,2′-azobis (2-methylisobutyrate) (radical polymerization initiator, 9 parts) was added and dissolved to prepare a monomer solution, which was purged with nitrogen gas for 30 minutes. Further, the reactor was placed in a heating apparatus maintained at 80 ° C., and the monomer solution was maintained at 80 ° C. for 6 hours.
- composition for forming a fine pattern Various polymers were dissolved in various solvents to prepare a composition for forming a fine pattern.
- the components contained in each composition and the contents thereof were as shown in Table 1.
- the prepared composition was applied to resist pattern 1 using a spin coater, heated at 130 ° C. for 60 seconds, washed with 2-heptanone, and dried. The dimension of the obtained hole pattern was measured, and the reduction amount of the hole pattern by the fine pattern forming composition was measured. Moreover, the formed fine pattern shape was evaluated visually.
- the evaluation criteria are as follows. A: The pattern shape is rectangular. B: The shape is distorted, but the pattern shape can be confirmed. C: The shape cannot be confirmed when the pattern is broken.
- Photosensitive resin compositions AZ AX2110P (hereinafter referred to as resist 1) and AZ AX1120P (hereinafter referred to as resist 2) were prepared as resist compositions for solubility evaluation . .
- resist 1 AZ AX2110P
- resist 2 AZ AX1120P
- resist 2 trade names, manufactured by AZ Electronic Materials Co., Ltd.
- B Turbidity is observed in the mixture, but no precipitate or suspended matter is observed.
- C A precipitate or suspended matter is confirmed in the mixture.
- the results were as shown in Table 1. In the table, N / A indicates that measurement is not possible.
- a photosensitive resin composition (trade name, manufactured by AZ Electronic Materials Co., Ltd.) is applied to a silicon wafer with a spin coater (manufactured by Tokyo Electron Co., Ltd.), and baked at 130 ° C. for 60 seconds.
- the film thickness F1 (resist) was measured.
- the film thickness F2 (resist) after dry etching was measured.
- each fine pattern forming composition was applied to a silicon wafer, and the film thicknesses F1 and F2 before and after dry etching were measured in the same manner as in the case of the photosensitive resin composition.
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Abstract
Description
(1)形成されたレジストパターンを酸によって架橋しえる微細パターン形成用組成物で覆い、加熱によりレジストパターン中に存在する酸を拡散させ、レジストとの界面に架橋層をレジストパターンの被覆層として形成させ、現像液で非架橋部分を取り除くことでレジストパターンを太らせ、レジストパターンのホール径または分離幅が微細化される方法(特許文献1および2参照)。
(2)形成されたレジストパターンに、(メタ)アクリル酸モノマーと水溶性ビニルモノマーとからなるコポリマーを含む微細パターン形成用組成物レジストパターンに塗布し、熱処理により、レジストパターンを熱収縮させてパターンを微細化させる方法(特許文献3参照)。
(3)アミノ基、特に1級アミンを含むポリマーを含有する、フォトレジストパターンを被覆するための水溶性微細パターン形成用組成物(特許文献4参照)。
ところが、本発明者らの検討によると、レジスト組成物の塗布と微細パターン形成用組成物の塗布とを同一の塗布装置により行うと問題が起こり得ることが判明した。すなわち、塗布装置においては組成物の塗布を行うと、一般的に過剰の組成物が廃液として排出される。また、エッジリンス液などの洗浄液により過剰の組成物が除去される際、組成物と洗浄液との混合物も廃液として排出される。この廃液は配管を通過して装置外に排出されるが、その都度配管洗浄を行わない限りは廃液が配管内に付着して残留するのが一般的である。このため、レジスト組成物の塗布と、微細パターン形成用組成物とを同一の塗布装置で塗布した場合、配管内でレジスト組成物と微細パターン形成用組成物とが接触する。このとき、従来の微細パターン形成用組成物では固形物が析出することがあった。そのような固形物が発生すると、配管の詰りが起こるので生産性が低下してしまうのでその改良が求められていた。
(1)半導体基板上に化学増幅型フォトレジスト組成物を塗布してフォトレジスト層を形成する工程、
(2)前記フォトレジスト層で被覆された前記半導体基板を露光する工程、
(3)前記露光後に有機溶剤現像液で現像する工程、
(4)前記フォトレジストパターンの表面に、前記微細パターン形成用組成物を塗布する工程、
(5)塗布済みのフォトレジストパターンを加熱する工程、および
(6)過剰の微細パターン形成用組成物洗浄して除去する工程
を含んでなることを特徴とするものである。
本発明による微細パターン形成用組成物は、特定の構造を含むポリマーと溶剤とを含んでなる。本発明において用いられるポリマーは、繰り返し単位中にヒドロキシアリール基を含むものである。ここでヒドロキシアリール基とは、ベンゼン骨格、ナフタレン骨格、アントラセン骨格など、芳香環を含む骨格に、一つ以上のヒドロキシ基(-OH)が結合したものである。中心となる骨格は、芳香族を含むものであれば特に限定されないが、溶剤に対する溶解性などの観点から、ベンゼン骨格またはナフタレン骨格であることが好ましい。また、ヒドロキシ基は2以上結合していてもよい。また本発明の効果を損なわない範囲で、ヒドロキシ基以外の置換基が結合してもよい。具体的にはアルキル基、アルコキシ基、アリール基、ハロゲン、カルボニル基、カルボキシ基、スルホ基、およびアミノ基などが挙げられる。また、アリール基を構成する二つの炭素原子に結合した炭化水素鎖が環状構造を形成してもよい。
次に、本発明による微細なレジストパターンの形成方法について説明する。本発明の微細パターン形成用組成物が適用される代表的なパターン形成方法をあげると、次のような方法が挙げられる。
スピンコーター(東京エレクトロン株式会社製)にて、下層反射防止膜AZ ArF-1C5D(商品名、AZエレクトロニックマテリアルズ株式会社製)を8インチシリコンウェハーに塗布し、200℃にて、60秒間ベークを行い、膜厚37nmの反射防止膜を得た。その上に感光性樹脂組成物AZ AX2110P(商品名、AZエレクトロニックマテリアルズ株式会社製)を、110℃にて60秒間ベークを行い120nmの膜厚を得た。得られたウエハーをArF線(193nm)の露光波長を有する露光装置(株式会社ニコン製)を用いて、パターン露光を行い、110℃にて、60秒間ベークした。さらに、2-ヘプタノンを現像液として30秒間現像処理(ネガ型現像)を行い、ピッチ110nm、ホールサイズ60nmのレジストパターンを得た。
撹拌器、凝縮器および温度制御装置を取り付けた反応器にメチルアミルケトン(2100部)、4-ヒドロキシフェニルメタクリレート(PQMA、670部)、2-メチルアダマンタン-2-イルメタクリレート(MAdMA、220部)、ジメチル2,2’-アゾビス(2-メチルイソブチレート)(ラジカル重合開始剤、9部)を投入し、溶解させてモノマー溶液を調製し、窒素ガスで30分間パージした。さらに、80℃に保持された加熱装置に反応器を入れて、モノマー溶液を80℃で6時間保持した。
各種ポリマーを各種溶媒に溶解させて、微細パターン形成用組成物を調製した。それぞれの組成物に含まれる成分およびその含有量は表1に示された通りであった。
調製された組成物をレジストパターン1にスピンコーターを用いて塗布し、130℃で60秒間加熱したのち、2-ヘプタノンによって洗浄し、乾燥した。得られたホールパターンの寸法を測定し、微細パターン形成用組成物によるホールパターンの縮小量を測定した。また、形成された微細パターン形状を目視により評価した。評価基準は以下の通りである。
A: パターン形状が矩形である
B: 形状が歪んでいるが、パターン形状を確認できる
C:パターンが崩れている状態で、形状を確認することができない
レジスト組成物として、感光性樹脂組成物AZ AX2110P(以下、レジスト1という)およびAZ AX1120P(以下、レジスト2という)(いずれも商品名、AZエレクトロニックマテリアルズ株式会社製)を準備した。これらの組成物50gと微細パターン形成用組成物50gとを混合し、1時間振盪した後、混合物の状態を目視評価した。評価基準は以下に示す通りとした。
A: 混合物が透明で、沈殿、浮遊物が確認されない
B: 混合物に濁りが認められるが、沈殿物または浮遊物は認められない
C: 混合物中に沈殿物または浮遊物が確認される
得られた結果は表1に示す通りであった。
スピンコーター(東京エレクトロン株式会社製)にて、感光性樹脂組成物(商品名、AZエレクトロニックマテリアルズ株式会社製)をシリコンウェハーに塗布し、130℃にて、60秒間ベークを行い、膜厚F1(レジスト)を測定した。つぎにドライエッチング装置(株式会社アルバック製)を用い、エッチングを行った後に、ドライエッチング後の膜厚F2(レジスト)を測定した。
(エッチング耐性)=(F1-F2)/(F1(レジスト1)-F2(レジスト1))
Claims (9)
- 化学増幅型レジスト組成物を用いてネガ型レジストパターンを形成させる方法において、レジストパターンを太らせることによってパターンを微細化するために用いられる微細パターン形成用組成物であって、ヒドロキシアリール基を有する繰り返し単位を含むポリマーと、前記ネガ型レジストパターンを溶解させない有機溶剤とを含んでなることを特徴とする微細パターン形成用組成物。
- 前記ヒドロキシアリール基が、モノヒドロキシフェニル基、ジヒドロキシフェニル基、モノヒドロキシナフチル基、ジヒドロキシナフチル基からなる群から選択される、請求項1に記載の微細パターン形成用組成物。
- 前記ポリマーを構成する全繰り返し単位のモル数を基準として、ヒドロキシアリール基を有する繰り返し単位の割合が60モル%以上である、請求項1~3のいずれか1項に記載の微細パターン形成用組成物。
- 前記有機溶剤が、2-ヘプタノン、または酢酸ブチルを含んでなる、請求項1~4のいずれか1項に記載の微細パターン形成用組成物。
- 前記組成物が、2-ヘプタノン、または酢酸ブチルを80重量%以上含んでなる、請求項5に記載の組成物。
- (1)半導体基板上に化学増幅型フォトレジスト組成物を塗布してフォトレジスト層を形成する工程、
(2)前記フォトレジスト層で被覆された前記半導体基板を露光する工程、
(3)前記露光後に有機溶剤現像液で現像する工程、
(4)前記フォトレジストパターンの表面に、請求項1~6のいずれか1項に記載の微細パターン形成用組成物を塗布する工程、
(5)塗布済みのフォトレジストパターンを加熱する工程、および
(6)過剰の微細パターン形成用組成物洗浄して除去する工程
を含んでなることを特徴とする微細化されたネガ型レジストパターンの形成方法。 - 前記工程(1)と、前記工程(4)とで、同一の塗布装置を用いる、請求項7に記載の方法。
- 前記工程(6)において、2-ヘプタノンあるいは酢酸ブチルを使用する、請求項7または8に記載の方法。
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JP6455370B2 (ja) * | 2014-10-30 | 2019-01-23 | 信越化学工業株式会社 | パターン形成方法及びシュリンク剤 |
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WO2016158507A1 (ja) * | 2015-03-31 | 2016-10-06 | 日産化学工業株式会社 | レジストパターン被覆用塗布液及びパターンの形成方法 |
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- 2013-10-01 TW TW102135507A patent/TWI564663B/zh not_active IP Right Cessation
- 2013-10-01 WO PCT/JP2013/076635 patent/WO2014054606A1/ja active Application Filing
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- 2013-10-01 SG SG11201501629VA patent/SG11201501629VA/en unknown
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Also Published As
Publication number | Publication date |
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SG11201501629VA (en) | 2015-04-29 |
KR20150064150A (ko) | 2015-06-10 |
TWI564663B (zh) | 2017-01-01 |
EP2905657A1 (en) | 2015-08-12 |
CN104737077A (zh) | 2015-06-24 |
EP2905657A4 (en) | 2016-06-01 |
KR101738376B1 (ko) | 2017-05-22 |
US20150253669A1 (en) | 2015-09-10 |
CN104737077B (zh) | 2019-06-04 |
TW201421160A (zh) | 2014-06-01 |
US9360756B2 (en) | 2016-06-07 |
JP2014071424A (ja) | 2014-04-21 |
JP6075724B2 (ja) | 2017-02-08 |
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