WO2014049766A1 - Recognition device for substrate processing machine - Google Patents

Recognition device for substrate processing machine Download PDF

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Publication number
WO2014049766A1
WO2014049766A1 PCT/JP2012/074846 JP2012074846W WO2014049766A1 WO 2014049766 A1 WO2014049766 A1 WO 2014049766A1 JP 2012074846 W JP2012074846 W JP 2012074846W WO 2014049766 A1 WO2014049766 A1 WO 2014049766A1
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WO
WIPO (PCT)
Prior art keywords
maintenance
hit rate
mark
request signal
threshold
Prior art date
Application number
PCT/JP2012/074846
Other languages
French (fr)
Japanese (ja)
Inventor
裕司 勝見
Original Assignee
富士機械製造株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士機械製造株式会社 filed Critical 富士機械製造株式会社
Priority to CN201280075981.5A priority Critical patent/CN104663016B/en
Priority to JP2014537941A priority patent/JP5767754B2/en
Priority to PCT/JP2012/074846 priority patent/WO2014049766A1/en
Publication of WO2014049766A1 publication Critical patent/WO2014049766A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/0895Maintenance systems or processes, e.g. indicating need for maintenance

Definitions

  • the technology disclosed in this specification relates to a recognition apparatus for a substrate working machine.
  • the recognition apparatus disclosed in this specification includes not only those directly provided on the substrate working machine but also those provided on equipment used in connection with the substrate working machine.
  • the board working machine here performs a predetermined work on the circuit board. For example, a solder printing machine for printing cream solder on the circuit board, a mounting machine for mounting electronic components on the circuit board (surface mounting machine) Or a board inspection machine for inspecting a circuit board on which electronic components are mounted.
  • the substrate work machine recognizes the recognition target in various scenes of the work process, and performs feedback control using the recognition result.
  • a mounting machine which is an example of a board working machine is provided with a recognition device having a mark camera or a parts camera in order to improve the mounting accuracy of electronic components.
  • the mark camera recognizes the mark marked on each of the component parts and the mark marked on the circuit board to be conveyed, and confirms the position.
  • the parts camera recognizes the electronic component sucked by the suction nozzle, and performs identification of the electronic component and confirmation of the suction posture. Examples of these techniques are disclosed in Japanese Patent Application Laid-Open No. 2005-116869 and Japanese Patent Application Laid-Open No. 2010-199630.
  • the recognition device cannot recognize the mark and a recognition error occurs.
  • the suction posture of the electronic component by the suction nozzle deteriorates due to various factors, and the electronic component cannot be recognized, and a recognition error occurs.
  • the work is forcibly stopped, and maintenance of the cause is performed by the operator.
  • the method of performing the maintenance of the cause portion after the recognition error is generated by the recognition device a situation in which the production plan does not proceed as scheduled frequently occurs. In this specification, it aims at providing the recognition apparatus which can avoid the malfunction by such a recognition error.
  • One embodiment of a recognition apparatus for a substrate working machine disclosed in this specification stores a reading device that reads an object, a feature parameter creation device that creates a feature parameter from the read object, and a standard parameter related to the feature parameter. And a signal output device that outputs a maintenance request signal based on a hit rate indicating a correlation between the characteristic parameter and the standard parameter. The signal output device outputs a maintenance request signal when the hit rate does not reach the error threshold and reaches a maintenance threshold different from the error threshold.
  • the signal output device of the recognition device is configured to output a maintenance request signal before a recognition error of a recognition target occurs. For this reason, for example, if the recognition target is maintained in accordance with the non-operation period of the substrate working machine after the maintenance request signal is output, the recognition error of the recognition target can be avoided. Can be prevented from being forcibly stopped.
  • the perspective view of a mounting machine is shown.
  • the structure of a feeder is shown typically.
  • the top view of a carrier tape is shown typically.
  • suction position vicinity of a feeder is shown typically.
  • a sectional view of a parts imaging device is typically shown.
  • the top view of a nozzle stocker is shown typically.
  • a perspective view of a part of substrate transportation device is typically shown.
  • An outline of a mounting head and a mark imaging device is schematically shown.
  • the perspective view of an example of a mounting head is typically shown.
  • the perspective view of another example of a mounting head is typically shown.
  • tip vicinity of a suction nozzle is shown typically.
  • the system configuration of the mounting machine is shown.
  • An explanatory view of image processing using a seek line is shown.
  • An explanatory view of image processing using a seek line is shown (when a part of a reference mark is missing).
  • An example of how the hit rate changes with time is shown.
  • Another example of how the hit rate changes with time is shown.
  • Another example of how the hit rate changes with time is shown.
  • the flow of the fiducial mark recognition program is shown.
  • Another example of how the hit rate changes with time is shown.
  • the flow of the program which specifies the cause of the hit rate fall among reference mark recognition programs is shown.
  • the recognition device includes a reading device, a characteristic parameter creation device, a first memory, and a signal output device.
  • the reading device reads a reading target, and typically may read a mark and / or an electronic component.
  • the mark may include a pattern having a specific shape for image recognition, a barcode, a two-dimensional code, a magnetic code, an IC tag, or the like. These marks may be marked on a substrate working machine or a component of equipment used in connection with the substrate working machine. When the mark has a pattern having a specific shape for image recognition, it is desirable to use a camera, a scanner, a laser scanner, or an imaging device of a fixed image sensor such as a CCD as the reading device.
  • the feature parameter creation device creates feature parameters from the read target.
  • the read target is a pattern having a specific shape for image recognition
  • a feature parameter related to an edge of the pattern having the specific shape may be created.
  • the first memory stores standard parameters related to feature parameters. For example, when there are a plurality of types of reading targets, the first memory may store standard parameters related to the characteristic parameters of each reading target. This makes it possible to identify a specific reading object from a plurality of types of reading objects.
  • the signal output device outputs a maintenance request signal based on the hit rate indicating the correlation between the characteristic parameter and the standard parameter.
  • the hit rate may be a higher index as the similarity between the feature parameter and the standard parameter is higher, and conversely, it may be a higher index as the dissimilarity between the feature parameter and the standard parameter is higher.
  • the hit rate is an index indicating the correlation between the feature parameter and the standard parameter.
  • the hit rate is calculated as an index for determining whether or not to identify a reading target even in a known image processing technique.
  • the signal output device outputs a maintenance request signal when the hit rate does not reach the error threshold and reaches a maintenance threshold different from the error threshold.
  • various information may be included in the maintenance request signal.
  • the maintenance request signal is not limited to requesting the maintenance of the reading target, but when requesting the maintenance of the component related to the reading target together with the maintenance of the reading target, other components different from the reading target This includes the case where only maintenance is required.
  • the recognition apparatus disclosed in this specification may further include a second memory that stores time-series data of hit rates.
  • various useful processes can be performed by using the time-series data of the hit rate.
  • the signal output device can be configured to output a maintenance request signal when the change rate of the hit rate exceeds an abnormal value. An abrupt change in the hit rate change rate is likely to cause an abnormal event. For this reason, the signal output device is useful for early detection of such abnormal events.
  • the signal output device outputs a maintenance request signal with reference to the hit rate of another target when the hit rate of one target reaches the maintenance threshold. It can be constituted as follows. In this way, by referring to time-series data of other hit rates, it is possible to analyze the cause of the deteriorated hit rate.
  • the signal output device is useful for identifying the cause of the deterioration of the hit rate.
  • the reading device may be an imaging device.
  • the imaging apparatus may include a light source that irradiates the target and a measurement device that measures the illuminance irradiated on the target.
  • the signal output device may output a maintenance request signal including a light source maintenance request signal when the hit rate reaches the maintenance threshold value and the illuminance reaches the illuminance threshold value.
  • the recognition apparatus disclosed in this specification may be provided in a mounting machine that mounts electronic components on a circuit board.
  • the mounting machine has an imaging device used as a reading device.
  • the imaging apparatus may include a mark camera that captures an image of a first mark marked on a component constituting the mounting machine and a second mark marked on a circuit board on which the electronic component is mounted.
  • the maintenance threshold value may include a first maintenance threshold value for the first mark and a second maintenance threshold value for the second mark.
  • the signal output device may output a maintenance request signal including the first request signal when the hit ratio of the first mark reaches the first maintenance threshold.
  • the signal output device may output a maintenance request signal including a second request signal when the hit rate of the second mark reaches the second maintenance threshold.
  • the mark camera is configured to be able to image different marks, the first mark marked on the component and the second mark marked on the circuit board.
  • the maintenance request signal output when the hit ratio of the first mark reaches the first maintenance threshold and the maintenance request signal output when the hit ratio of the second mark reaches the second maintenance threshold. Therefore, it is possible to distinguish which mark the maintenance request signal is output to.
  • the 1st mark may be marked on the some component.
  • the type of the first mark may be different depending on the type of the plurality of component parts.
  • the plurality of component parts are divided into a plurality of groups, and the signal generator belongs to the same group when the hit rate of the first mark marked on one component part reaches the first maintenance threshold value.
  • a maintenance request signal including information on other components may be output. For example, by grouping component parts having similar mark deterioration rates, it is possible to infer the deterioration of other component parts belonging to the same group from the mark deterioration of one component part.
  • the recognition apparatus disclosed in this specification may be provided in a mounting machine that mounts electronic components on a circuit board.
  • the mounting machine has an imaging device used as a reading device.
  • the imaging device may have a parts camera that images an electronic component.
  • the parts camera may also take an image of the first mark marked on the component existing in the imaging field when imaging the electronic component.
  • the maintenance threshold value may include a third maintenance threshold value for the electronic component and a first maintenance threshold value for the first mark.
  • the signal output device may output a maintenance request signal including a third request signal when the hit rate of the electronic component reaches the third maintenance threshold. Further, the signal output device may output a maintenance request signal including the first request signal when the hit rate of the first mark reaches the first maintenance threshold value.
  • the parts camera is comprised so that imaging of the 1st mark and electronic component which are marked on the component is possible.
  • the maintenance request signal output when the hit rate of the first mark reaches the first maintenance threshold and the maintenance request signal output when the hit rate of the electronic component reaches the third maintenance threshold are provided. It is possible to distinguish whether the maintenance request signal is output to which of the first mark or the electronic component.
  • a correction request signal output device that outputs a correction request signal for a standard parameter of an electronic component based on the hit rate of the electronic component may be further provided.
  • the standard parameters of the electronic component are determined in advance according to the type of the electronic component.
  • the hit rate of the electronic component may differ depending on the manufacturing rod. In such a case, it is possible to suppress deterioration of the recognition accuracy of the electronic component by correcting the standard parameter.
  • the third memory may store time-series data of hit rates collected from recognition devices provided in at least two of the substrate working machine, the nozzle cleaning machine, the nozzle inspection machine, and the feeder maintenance unit. Good.
  • the time-series data on the hit rate for a specific recognition target is accumulated from multiple devices, so the time-series data on the hit rate is continuous without interruption and more effective management It can be performed.
  • the management system may include a prediction device that predicts when the hit rate reaches at least one of the maintenance threshold and the error threshold based on the time-series data of the hit rate stored in the third memory. Good.
  • the management system may include a fourth memory that stores production plan data describing an operation period and a non-operation period of the substrate working machine.
  • it may further include a planning device that creates maintenance plan data based on the prediction time predicted by the prediction device and the production plan data stored in the fourth memory.
  • the planning device may be configured to plan the maintenance execution time in the non-operation period before the operation period when the prediction period is included in the operation period.
  • the integrated circuit on the circuit board is formed by being sequentially conveyed through a solder printer, a mounting machine, and a reflow furnace.
  • the solder printer prints cream solder on the electronic component mounting position on the circuit board.
  • the mounting machine mounts an electronic component at a mounting position on a circuit board on which cream solder is printed.
  • the reflow furnace solders an electronic component on a circuit board by performing heat treatment on the circuit board.
  • the mounting machine 1 includes a plurality of modules 2 arranged adjacent to each other on a table 3.
  • Each of the modules 2 has a common configuration, and includes a plurality of devices in a frame 4 that functions as a housing.
  • FIG. 1 shows an example in which two modules 2 are adjacent to each other, and shows an exterior plate of one of the two modules 2 in a watermarked state.
  • the module 2 includes a component supply device 10, a parts imaging device 20 having a parts camera, a nozzle stocker 30, a substrate transfer device 40, a component transfer device 50, a mounting head 60, and a mark imaging device 70 having a mark camera.
  • Each of the modules 2 includes an input / output device 6 configured to be able to communicate with a control device described later on the surface of the exterior plate.
  • the input / output device 6 is configured to be able to receive input from an operator and to display status information of the module 2 and instructions to various operators described later.
  • the component supply device 10 is a device that supplies a plurality of types of electronic components mounted on the circuit board 5 to a component suction position, and is configured by arranging a plurality of cassette-type feeders 11 in parallel. Yes.
  • the feeder main body 12 of the feeder 11 is configured to be detachable from the frame 4.
  • the feeder 11 includes a tape reel 13 around which the carrier tape 14 is wound, a tape guide 15 that guides the carrier tape 14 drawn from the tape reel 13 to a component suction position, and the carrier tape 14 as a component.
  • a sprocket 16 that pitch-feeds to the suction position and a motor (not shown) that rotationally drives the sprocket 16 are provided.
  • a communication connector 17 connected to a connector (not shown) provided on the main body of the mounting machine 1 and positioning pins 18 and 19 for determining a mounting position with respect to the main body of the mounting machine 1 are provided on the front end surface of the feeder 11. It has been.
  • the carrier tape 14 is formed with cavities 14a for accommodating the electronic components P at a constant pitch interval.
  • the upper opening of the cavity 14a is covered with a cover tape 14b, and the electronic component P is taped by the carrier tape 14 and the cover tape 14b.
  • the cover tape 14b is peeled off from the carrier tape 14 before the component suction position.
  • a sprocket 16 is engaged with a feed hole 14 c formed in the carrier tape 14.
  • the carrier tape 14 is fed out by a predetermined pitch and sequentially supplies the electronic components P accommodated in the cavity 14a to the component suction positions.
  • an opening 12 a is formed in the upper portion of the feeder main body 12 at a position corresponding to the component suction position.
  • the electronic component P supplied to the component suction position is sucked by the suction nozzle inserted into the opening 12a and taken out from the cavity 14a.
  • a reference mark M1 is marked in the vicinity of the component suction position.
  • the reference mark M1 is imaged by a mark camera described later.
  • the mounting machine 1 uses the image data of the reference mark M1 imaged by the mark camera to identify the reference mark M1 and acquire its position information.
  • the mounting machine 1 uses the positional information of the reference mark M1 to calculate the positional deviation of the component suction position from the ideal position, moves the suction nozzle based on the positional deviation, and sucks the electronic component P.
  • the part imaging device 20 is fixed to the frame 4 and is disposed between the component supply device 10 and the board transfer device 40.
  • the parts imaging apparatus 20 includes a parts camera 21, a support base 22, a connecting member 23, an upper end member 24, a side light source 25, and a cover glass 26.
  • the parts camera 21 is fixed to the frame 4 via a support base 22.
  • a CCD camera is used as the part camera 21, for example.
  • the support base 22 and the upper end member 24 are fixed via a connecting member 23.
  • the upper end member 24 has a shape in which the upper surface and the bottom surface are opened and the side portions are curved.
  • a number of side light sources 25 are provided on the inner wall surface of the upper end member 24, and the upper opening of the upper end member 24 is covered with a cover glass 26.
  • an LED is used as the side light source 25.
  • the electronic component P is disposed above the part imaging device 20 after being attracted at the component attracting position of the feeder 11 and before being mounted on the circuit board 5 positioned on the substrate transport device 40. Imaged.
  • the mounting machine 1 uses the image data of the electronic component P imaged by the parts imaging device 20 to identify the electronic component P and confirm the suction posture of the electronic component P.
  • the identification of the electronic component P is performed by comparing image data of the electronic component P with previously acquired part data and determining whether or not the electronic component P is a desired electronic component P.
  • the confirmation of the suction posture of the electronic component P uses the image data of the electronic component P to detect the positional deviation of the electronic component P from the central axis of the suction nozzle and the angular deviation of the electronic component P around the central axis of the suction nozzle. Is done by doing.
  • the suction posture of the electronic component P is corrected by rotating the suction nozzle before the electronic component P is mounted on the circuit board 5.
  • the part imaging device 20 also includes a reference mark (for example, a corner dog) marked on a component (for example, the mounting head 60) that exists in the imaging field when the electronic component P is captured as necessary. You may image simultaneously.
  • the mounting machine 1 uses the position information of the reference mark to estimate the position of the center axis of the suction nozzle that sucks the electronic component P, and detects the displacement of the electronic component P from the center axis of the suction nozzle. May be.
  • the parts imaging apparatus 20 may image a specific reference mark before imaging the electronic component P.
  • the mounting machine 1 may correct the position of the central axis of the suction nozzle when the electronic component P is imaged using the position information of the reference mark.
  • the parts imaging device 20 includes an illuminance measuring device (not shown) that measures the illuminance irradiated to the imaging target.
  • the illuminance measuring apparatus is configured to be able to measure the illuminance that decreases due to, for example, a decrease in the output of the side light source 25 and dirt on the cover glass 26.
  • the nozzle stocker 30 is provided in the vicinity of the part imaging device 20 and accommodates a plurality of types of suction nozzles (described later). As shown in FIG. 6, the nozzle stocker 30 includes a plurality of nozzle housing holes 31 for housing the suction nozzles.
  • the nozzle stocker 30 contains a non-defective product suction nozzle of the same type as the suction nozzle in use, and when the suction nozzle in use becomes defective, the good product suction nozzle stored in the nozzle stocker 30 is Replaced with defective suction nozzle.
  • the nozzle stocker 30 accommodates a plurality of types of suction nozzles, and a predetermined suction nozzle is selected according to the type of electronic component mounted on the circuit board 5.
  • a reference mark M2 and a two-dimensional code C1 are marked on the upper surface of the nozzle stocker 30.
  • the two-dimensional code C1 stores information associating the type of suction nozzle accommodated with the nozzle accommodation hole 31.
  • the reference mark M2 and the two-dimensional code C1 are imaged by a mark camera described later.
  • the mounting machine 1 uses the image data of the reference mark M2 imaged by the mark camera to identify the reference mark M2 and acquire its position information.
  • the mounting machine 1 uses the positional information of the reference mark M2 to calculate the positional deviation from the ideal position of the nozzle receiving hole 31 of the nozzle stocker 30, and based on the positional deviation, the mounting nozzle 1 of the suction nozzle from the nozzle receiving hole 31 is calculated. Take out and store in suction nozzle.
  • the mounting machine 1 selects a desired suction nozzle from a plurality of suction nozzles accommodated in the nozzle stocker 30 using information recorded in the two-dimensional code C1 captured by the mark camera.
  • the board transport device 40 is fixed to the frame 4, transports the circuit board 5 along the transport direction (X-axis direction), and positions the circuit board 5 at a predetermined work position.
  • the substrate transfer device 40 is a double conveyor type in which the first transfer device 41 and the second transfer device 41 are arranged in two rows.
  • the first transport device 41 has a pair of transport guide rails 41a and 41b arranged to face each other in parallel.
  • the second transport device 42 has a pair of transport guide rails 42a and 42b arranged to face each other in parallel.
  • each of the pair of transport guide rails 41 a and 41 b of the first transport device 41 is formed with holding plate portions 43 a and 43 b whose upper end portions protrude inward.
  • belt conveyors 44a and 44b are provided on the inner wall surfaces of the transport guide rails 41a and 41b, respectively.
  • the circuit board 5 is transported in the transport direction on the pair of belt conveyors 44a and 44b and stopped at a predetermined work position.
  • the first transport device 41 is provided with a clamp device (not shown).
  • the clamp device includes a back plate that can be moved up and down by a lifting device, and a back pin that can be replaced at a predetermined position on the back plate.
  • the clamp device raises the circuit board 5 through the back pin by raising the back plate.
  • the circuit board 5 is sandwiched between the back pins and the back surfaces of the holding plate portions 43a and 44b and positioned at a predetermined work position.
  • the opposing distance D1 between the pair of transport guide rails 41a and 41b of the first transport device 41 is configured to be changeable according to the width of the circuit board 5 to be transported.
  • the conveyance guide rail 41a on the left side in the figure is a fixed guide rail
  • the conveyance guide rail 41b on the right side in the figure is a movable guide rail.
  • the movable guide rail 41b is connected to a driving device (not shown), and is configured such that the facing distance D1 between the movable guide rail 41b and the fixed guide rail 41a can be changed.
  • a reference mark M3 is marked on the upper surface of the movable guide rail 41b.
  • the reference mark M3 is imaged by a mark camera described later.
  • the mounting machine 1 uses the image data of the reference mark M3 imaged by the mark camera to identify the reference mark M3 and acquire its position information.
  • the mounting machine 1 detects the position of the movable guide rail 41b with respect to the fixed guide rail 41a using the position information of the reference mark M3.
  • the configuration of the first transport device 41 described above is the same in the second transport device 42.
  • a reference mark M ⁇ b> 4 is marked on each of the diagonal positions on the surface of the circuit board 5.
  • the reference mark M4 is imaged by a mark camera described later.
  • the mounting machine 1 uses the image data of the reference mark M4 captured by the mark camera to identify the reference mark M4 and acquire its position information.
  • the mounting machine 1 uses the positional information of the reference mark M4 to calculate the positional deviation from the ideal position of the mounting position of the electronic component P on the surface of the circuit board 5, and moves the suction nozzle based on the positional deviation.
  • the electronic component P is mounted.
  • the component transfer device 50 is fixed to the frame 4 and is an XY robot type.
  • the component transfer device 50 includes a Y-axis slide mechanism and an X-axis slide mechanism.
  • the Y-axis slide mechanism is configured to be able to move the Y-axis slider 52 in the Y-axis direction using a Y-axis servo motor 51.
  • FIG. 8 shows an outline of the X-axis slide mechanism, the mounting head 60, and the mark imaging device 70.
  • the X-axis slide mechanism is provided on the Y-axis slider 52, and is configured to be able to move the X-axis slider 53 in the X-axis direction using an X-axis servo motor (not shown).
  • the mounting head 60 and the mark image pickup device 70 are fixed to the X-axis slider 53, and the component supply device 10, the part image pickup device 20, the nozzle stocker 30, and the substrate using the Y-axis slide mechanism and the X-axis slide mechanism. It can be moved on the XY plane above the transfer device 40.
  • the mark imaging device 70 includes a mark camera 71 and a light source (not shown).
  • the mark camera 71 for example, a CCD camera is used.
  • an LED is used as the light source.
  • the mark imaging device 70 includes an illuminance measurement device (not shown) that measures the illuminance irradiated to the imaging target.
  • the illuminance measuring apparatus is configured to be able to measure the illuminance that decreases due to, for example, a decrease in the output of the light source and dirt on the cover of the light source.
  • the mounting head 60 is configured to be detachable from the X-axis slider 53.
  • a necessary mounting head 60 is selected from a plurality of types of mounting heads 60 and used.
  • 9A and 9B illustrate two types of mounting heads 60a and 60b.
  • the mounting head 60 a shown in FIG. 9A is a revolver type and has a plurality of nozzle holders 61.
  • Each nozzle holder 61 holds the same type or different types of suction nozzles 62.
  • the plurality of nozzle holders 61 are arranged at regular intervals around the central axis, and are configured to be capable of index rotation. Further, each of the nozzle holders 61 is configured to be capable of rotating, and is configured to be movable up and down at one index position. As a result, the suction nozzle 62 held by the nozzle holder 61 is also rotated and can be moved up and down at one index position.
  • the revolver-type mounting head 60a is used, for example, to hold the suction nozzle 62 corresponding to a small electronic component.
  • the suction nozzle 62 is provided with a protruding portion 62a protruding in the radial direction, and a two-dimensional code C2 is marked on the upper surface of the protruding portion 62a (see FIG. 10).
  • the type of the suction nozzle 62 is recorded.
  • the two-dimensional code C2 is imaged by the mark camera when a desired suction nozzle 62 is selected from the plurality of suction nozzles 62 accommodated in the nozzle stocker 30.
  • the mounting machine 1 performs solid identification of the suction nozzle 62 using the information of the two-dimensional code C2.
  • the mounting head 60 b shown in FIG. 9B is a single type and has one nozzle holder 63.
  • the nozzle holder 63 is configured to be capable of rotating, whereby the suction nozzle 64 held by the nozzle holder 63 is also rotated.
  • the suction nozzle 64 is also provided with a protruding portion 64a protruding in the radial direction, and a two-dimensional code (not shown) is marked on the upper surface of the protruding portion 64a.
  • the type of the suction nozzle 64 is recorded in the two-dimensional code. This two-dimensional code is also imaged by the mark camera when a desired suction nozzle 64 is selected from the plurality of suction nozzles 64 accommodated in the nozzle stocker 30.
  • the mounting machine 1 performs solid identification of the suction nozzle 64 using the information of the two-dimensional code.
  • each of the modules 2 (see FIG. 1) of the mounting machine 1 includes an image processing unit 100.
  • the image processing unit 100 may be provided in a host computer of a management system that collectively manages a plurality of modules 2, or other substrate working machine, nozzle cleaning machine, nozzle inspection machine, feeder maintenance unit. May be provided in a host computer of a management system including
  • the image processing unit 100 includes a control device 110 and a memory 120 that stores image processing data.
  • the image processing unit 100, the part imaging device 20, and the mark imaging device 70 are collectively referred to as a recognition device.
  • the control device 110 includes a feature parameter creation device 111, a hit rate calculation device 112, a determination device 113, and a signal output device 114.
  • the feature parameter creation device 111 creates feature parameters from the reference marks M1-M4 imaged by the mark imaging device 70.
  • the feature parameters created here vary depending on the pattern of the reference marks M1-M4, and can be created using a known image recognition technique.
  • the feature parameter includes a pattern edge extracted from the image data of the reference marks M1-M4.
  • the first memory 121 of the memory 120 stores standard parameters for each of the reference marks M1-M4, and the reference marks M1-M4 are associated with the standard parameters.
  • the hit rate calculation device 112 calculates a hit rate indicating the correlation between the characteristic parameters of the captured reference marks M1-M4 and the corresponding standard parameters.
  • the hit rate indicates the similarity between the feature parameter and the standard parameter, and indicates a higher value as the similarity is higher.
  • the hit rate calculated by the hit rate calculation device 112 is stored in the second memory 122.
  • the second memory 122 stores the hit rate every time the hit rate of the reference mark M1-M4 is calculated by the hit rate calculation device 112, so that the time series of the hit rate of each of the reference marks M1-M4 is stored. Data is stored.
  • Image processing using seek lines is to perform edge extraction of an imaging target using luminance data included in image data.
  • Image processing using seek lines is superior in high-speed processing because edge extraction is performed using only luminance data on the seek lines.
  • image processing using seek lines is disclosed in Japanese Patent Application Laid-Open No. 8-180191, Japanese Patent Application Laid-Open No. 2004-279304, and Japanese Patent Application Laid-Open No. 2006-114821 that have already been filed and published by the present applicant. Technology can be applied.
  • a plurality of seek lines SL are preset in the vicinity of the position where the reference marks M1-M4 should exist, A reference point section in which the luminance changes abruptly is calculated from the luminance data of the plurality of reference points, and edge extraction of the reference marks M1-M4 is performed.
  • eight seek lines SL are illustrated, but the present invention is not limited to this example.
  • the plurality of seek lines SL are prepared in advance as templates in accordance with the types of the reference marks M1-M4, and can be referred to as standard parameters.
  • the deterioration of the reference marks M1-M4 usually progresses with time, and the hit rate also decreases.
  • the decrease in the hit rate is not limited to a linear one over time, but may decrease so as to draw a curve.
  • the elapsed time here is the total time when the mounting machine 1 is operating, the total time including when the mounting machine 1 is operating or not operating, or other reference mark M1- This is the total time that is causally related to the degradation of M4.
  • the determination device 113 determines that the reference marks M1-M4 cannot be identified.
  • the control device 110 forcibly stops the operation of the mounting machine 1.
  • the determination device 113 determines whether or not the reference marks M1 to M4 need to be maintained based on the calculated hit rate. As shown in FIGS. 14 to 16, the determination device 113 determines whether or not the hit rate has fallen below the maintenance threshold.
  • the maintenance threshold value is set to a value larger than the error threshold value of the hit rate at which the reference marks M1 to M4 cannot be identified. That is, the determination device 113 determines that the maintenance of the reference mark M1-M4 is necessary when the deterioration of the reference mark M1-M4 is progressing, even if the reference mark M1-M4 can be identified. .
  • the control device 110 When the determination device 113 determines that the maintenance of the reference marks M1-M4 is necessary, the control device 110 outputs a maintenance request signal from the signal output device 114, and the input / output device 6 (see FIG. 1) uses the reference mark M1- Notify that M4 maintenance is required.
  • the contents displayed on the input / output device 6 can specify which reference mark M1-M4 needs to be corrected.
  • the control device 110 performs maintenance of the components. The input / output device 6 notifies that it is necessary.
  • the flow of the recognition program for the reference marks M1-M4 will be described with reference to FIG.
  • the reference mark M3 (see FIG. 7) written on the upper surface of the movable guide rail 41b of the substrate transport apparatus 40 will be described as an example.
  • step S1 the mark camera 71 images the reference mark M3 written on the upper surface of the movable guide rail 41b.
  • the image data of the captured reference mark M3 is transmitted to the control device 110, and preprocessing such as noise removal is performed as necessary.
  • step S2 the feature parameter creation device 111 extracts the edge of the read image data of the reference mark M3 and creates a feature parameter.
  • step S3 the feature parameter and its standard parameter are matched and the hit rate is calculated.
  • step S2 and step S3 are performed simultaneously. That is, the control device 110 reads a plurality of seek lines (standard parameters) corresponding to the reference mark M3 stored in the first memory 121, extracts the edge (feature parameter) of the reference mark M3, and also has a hit rate. calculate.
  • step S4 the determination device 113 determines whether or not the calculated hit rate exceeds an error threshold (see FIGS. 4 to 16). If the hit rate exceeds the error threshold, it is determined that the mark has been successfully identified, and the process proceeds to step S5. The hit rate at this time is displayed on the input / output device 6 and stored in the second memory 122. If the hit rate does not exceed the error threshold, it is determined that the deterioration of the reference mark M3 has progressed to the point where it cannot be identified or that there is another cause. The control device 110 forcibly stops the mounting machine 1.
  • step S5 the determination device 113 determines whether or not the hit rate of the identified reference mark M3 is below the maintenance threshold (see FIGS. 14 to 16). If the hit rate falls below the maintenance threshold value, it is determined that the deterioration of the reference mark M3 has progressed to a range where maintenance is necessary or that there is another cause, and the process proceeds to step S6. If the hit rate does not fall below the maintenance threshold, the process proceeds to step S7.
  • step S6 the determination device 113 reads the time-series data of the hit rate stored in the second memory 122, calculates the change rate from the time-series data of the hit rate, and the change rate exceeds the abnormal value. It is determined whether or not.
  • the rate of change is calculated as a value in which the hit rate has decreased in a predetermined time. For example, as shown in FIG. 18, when the current time is t2 and the hit rate is h2, the hit rate h1 of the past time t1 is read, and the hit rate decreases in a predetermined time (between t1 and t2). It is determined whether or not the amount (difference between h1 and h2) exceeds an abnormal value.
  • the determination apparatus 113 proceeds to step S7 and analyzes the cause. If the change rate of the hit rate does not exceed the abnormal value, the recognition program for the reference mark M3 is terminated, and the operation of the mounting machine 1 is continued.
  • step S7 the determination device 113 analyzes the cause of the decrease in the hit rate and identifies the cause of the decrease in the hit rate.
  • the signal output device 114 outputs a maintenance request signal, and the input / output device 6 is notified so that it can be determined that the cause maintenance is necessary.
  • step S11 the illuminance of the light source is measured.
  • step S12 it is determined whether the illuminance of the light source is below the illuminance threshold. If the illuminance of the light source falls below the illuminance threshold, it is determined that the cause of the decrease in the hit rate is a decrease in the illuminance of the light source.
  • the control device 110 outputs a light source maintenance request signal from the signal output device 114, and notifies the input / output device 6 (see FIG. 1) that maintenance is necessary regarding the illuminance of the light source. If the illuminance of the light source does not fall below the illuminance threshold, it is determined that there is a cause in the reference mark M3, and the process proceeds to step S13.
  • the determination device 113 determines whether there is another component that belongs to the same group as the movable guide rail 41b that is determined to require maintenance of the reference mark M3.
  • the plurality of components are divided into a plurality of groups according to the deterioration rate of the reference marks M1-M4. For example, those with the same usage frequency may belong to the same group.
  • the substrate transfer device 40 is a double conveyor type in which the first transfer device 41 and the second transfer device 41 are arranged in two rows. For this reason, the 1st conveyance apparatus 41 and the 2nd conveyance apparatus 42 belong to the same group, and when the maintenance of the reference mark M3 of one conveyance apparatus is required, the maintenance of the reference mark of the other conveyance apparatus is also necessary. It is.
  • step S14 information on the movable guide rail of the second transport device 42 belonging to the same group is extracted, and both of them are extracted.
  • the input / output device 6 displays that maintenance is necessary. If there is no other component that belongs to the same group as the component that is determined to require correction of the fiducial mark, only the information of the component that is determined to require correction of the fiducial mark is input / output. Displayed on the device 6.
  • the maintenance instruction for the deteriorated reference mark M1-M4 is given by the input / output device 6. Informed. Therefore, it is possible to maintain the reference marks M1-M4 on which the maintenance instruction is displayed during the non-operating period of the mounting machine 1. In this way, by maintaining the reference marks M1-M4 before the identification of the reference marks M1-M4 becomes impossible, a situation where the mounting machine 1 is forcibly stopped can be avoided, and the production plan is met. Smooth production becomes possible.
  • control device 110 may calculate a prediction time when the hit rate falls below the maintenance threshold and / or the error threshold based on the time-series data of the hit rate, and display the prediction time on the input / output device 6. Such a forecast time is useful for making a reasonable production plan. Furthermore, the control device 110 compares such a predicted time with production plan data describing the operating period and the non-operating period of the mounting machine 1, and when the predicted time is included in the operating period, The maintenance time may be planned during the non-operation period and displayed on the input / output device 6. It is useful for planning a more rational production plan.
  • the determination device 113 indirectly determines whether or not the hit rate has fallen below the maintenance threshold from the change rate of the hit rate. You may judge.
  • Parts supply device 20 Parts imaging device 30: Nozzle stocker 40: Board transfer device 50: Component transfer device 70: Mark imaging device 100: Image processing unit 110: Control device 111: Feature parameter creation device 112: Hit rate calculation Device 113: Determination device 114: Signal output device 120: Memory 121: First memory 122: Second memory

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Abstract

A recognition device for substrate processing machine comprises: a reading device for reading an object; a feature parameter preparation device for preparing a feature parameter from the read object; a first memory for storing a reference parameter associated with the feature parameter; and a signal output device for outputting a maintenance request signal on the basis of the hit rate representing the correlation between the feature parameter and the reference parameter. The signal output device outputs the maintenance request signal when the hit rate reaches a maintenance threshold different from an error threshold in a stage where the hit rate does not reach the error threshold.

Description

基板作業機用の認識装置Recognition device for substrate working machine
 本明細書で開示される技術は、基板作業機用の認識装置に関する。本明細書で開示される認識装置には、基板作業機に直接的に設けられているものの他に、基板作業機に関連して使用される機器に設けられているものも含まれる。ここでいう基板作業機は、回路基板に対して所定の作業を行うものであり、例えば、回路基板にクリームはんだを印刷するはんだ印刷機、回路基板に電子部品を実装する実装機(表面実装機又はチップマウンタともいう)、電子部品が実装された回路基板を検査する基板検査機などが含まれる。 The technology disclosed in this specification relates to a recognition apparatus for a substrate working machine. The recognition apparatus disclosed in this specification includes not only those directly provided on the substrate working machine but also those provided on equipment used in connection with the substrate working machine. The board working machine here performs a predetermined work on the circuit board. For example, a solder printing machine for printing cream solder on the circuit board, a mounting machine for mounting electronic components on the circuit board (surface mounting machine) Or a board inspection machine for inspecting a circuit board on which electronic components are mounted.
 基板作業機は、作業精度を向上させるために、作業工程の様々な場面で認識対象を認識し、その認識結果を利用してフィードバック制御を行っている。例えば、基板作業機の一例である実装機には、電子部品の搭載作業精度を向上させるために、マークカメラ又はパーツカメラを有する認識装置が設けられている。マークカメラは、構成部品の各々に印されたマーク及び搬送される回路基板に印されたマークを認識し、位置の確認が行われる。パーツカメラは、吸着ノズルに吸着された電子部品を認識し、電子部品の識別及び吸着姿勢の確認が行われる。これらの技術の一例が、特開2005-116869号公報、及び特開2010-199630号公報に開示されている。 In order to improve the work accuracy, the substrate work machine recognizes the recognition target in various scenes of the work process, and performs feedback control using the recognition result. For example, a mounting machine which is an example of a board working machine is provided with a recognition device having a mark camera or a parts camera in order to improve the mounting accuracy of electronic components. The mark camera recognizes the mark marked on each of the component parts and the mark marked on the circuit board to be conveyed, and confirms the position. The parts camera recognizes the electronic component sucked by the suction nozzle, and performs identification of the electronic component and confirmation of the suction posture. Examples of these techniques are disclosed in Japanese Patent Application Laid-Open No. 2005-116869 and Japanese Patent Application Laid-Open No. 2010-199630.
 例えば、汚れ、破損等によって構成部品に印されているマークの劣化が進むと、認識装置によってマークの認識ができなくなり、認識エラーが発生する。また、基板作業機の連続稼働時間が長くなると、様々な要因で吸着ノズルによる電子部品の吸着姿勢が悪化して電子部品の認識ができなくなり、認識エラーが発生する。従来の基板作業機では、このような認識エラーが発生すると、作業を強制的に停止し、作業者による原因箇所のメンテナンスが行われる。このように、認識装置による認識エラーが発生してから原因箇所のメンテナンスを行う方法では、生産計画が予定通りに進まない事態が頻発してしまう。本明細書では、このような認識エラーによる不具合を回避することが可能な認識装置を提供することを目的としている。 For example, if the mark marked on the component is deteriorated due to dirt, damage, etc., the recognition device cannot recognize the mark and a recognition error occurs. In addition, if the continuous operation time of the substrate working machine becomes long, the suction posture of the electronic component by the suction nozzle deteriorates due to various factors, and the electronic component cannot be recognized, and a recognition error occurs. In the conventional substrate working machine, when such a recognition error occurs, the work is forcibly stopped, and maintenance of the cause is performed by the operator. As described above, in the method of performing the maintenance of the cause portion after the recognition error is generated by the recognition device, a situation in which the production plan does not proceed as scheduled frequently occurs. In this specification, it aims at providing the recognition apparatus which can avoid the malfunction by such a recognition error.
 本明細書で開示される基板作業機用の認識装置の一実施形態は、対象を読み取る読取装置、読み取られた対象から特徴パラメータを作成する特徴パラメータ作成装置、特徴パラメータに関する標準パラメータを記憶している第1メモリ、及び特徴パラメータと標準パラメータの相関を示すヒット率に基づいてメンテナンス要求信号を出力する信号出力装置を備えている。信号出力装置は、ヒット率がエラー閾値に達していない段階で、エラー閾値とは異なるメンテナンス閾値に達したときにメンテナンス要求信号を出力する。 One embodiment of a recognition apparatus for a substrate working machine disclosed in this specification stores a reading device that reads an object, a feature parameter creation device that creates a feature parameter from the read object, and a standard parameter related to the feature parameter. And a signal output device that outputs a maintenance request signal based on a hit rate indicating a correlation between the characteristic parameter and the standard parameter. The signal output device outputs a maintenance request signal when the hit rate does not reach the error threshold and reaches a maintenance threshold different from the error threshold.
 上記の認識装置の信号出力装置は、認識対象の認識エラーが発生する前に、メンテナンス要求信号を出力するように構成されている。このため、例えば、メンテナンス要求信号が出力された後に、基板作業機の非稼働期間に合わせて認識対象をメンテナンスすれば、認識対象の認識エラーが発生するのを回避することができ、基板作業機が強制的に停止される事態を回避することができる。 The signal output device of the recognition device is configured to output a maintenance request signal before a recognition error of a recognition target occurs. For this reason, for example, if the recognition target is maintained in accordance with the non-operation period of the substrate working machine after the maintenance request signal is output, the recognition error of the recognition target can be avoided. Can be prevented from being forcibly stopped.
実装機の斜視図を示す。The perspective view of a mounting machine is shown. フィーダの構成を模式的に示す。The structure of a feeder is shown typically. キャリアテープの平面図を模式的に示す。The top view of a carrier tape is shown typically. フィーダの部品吸着位置近傍の平面図を模式的に示す。The top view of the component adsorption | suction position vicinity of a feeder is shown typically. パーツ撮像装置の断面図を模式的に示す。A sectional view of a parts imaging device is typically shown. ノズルストッカの平面図を模式的に示す。The top view of a nozzle stocker is shown typically. 基板搬送装置の一部の斜視図を模式的に示す。A perspective view of a part of substrate transportation device is typically shown. 搭載ヘッド及びマーク撮像装置の概要を模式的に示す。An outline of a mounting head and a mark imaging device is schematically shown. 搭載ヘッドの一例の斜視図を模式的に示す。The perspective view of an example of a mounting head is typically shown. 搭載ヘッドの他の一例の斜視図を模式的に示す。The perspective view of another example of a mounting head is typically shown. 吸着ノズルの先端近傍の突出部分の平面図を模式的に示す。The top view of the protrusion part of the front-end | tip vicinity of a suction nozzle is shown typically. 実装機のシステム構成を示す。The system configuration of the mounting machine is shown. シークラインを用いた画像処理の説明図を示す。An explanatory view of image processing using a seek line is shown. シークラインを用いた画像処理の説明図を示す(基準マークの一部が欠損した場合)。An explanatory view of image processing using a seek line is shown (when a part of a reference mark is missing). 時間経過に伴うヒット率の変化の様子の一例を示す。An example of how the hit rate changes with time is shown. 時間経過に伴うヒット率の変化の様子の他の一例を示す。Another example of how the hit rate changes with time is shown. 時間経過に伴うヒット率の変化の様子の他の一例を示す。Another example of how the hit rate changes with time is shown. 基準マーク認識プログラムのフローを示す。The flow of the fiducial mark recognition program is shown. 時間経過に伴うヒット率の変化の様子の他の一例を示す。Another example of how the hit rate changes with time is shown. 基準マーク認識プログラムのうちのヒット率低下の原因を特定するプログラムのフローを示す。The flow of the program which specifies the cause of the hit rate fall among reference mark recognition programs is shown.
 以下、本明細書で開示される技術の特徴を整理する。なお、以下に記す事項は、各々単独で技術的な有用性を有している。 The following summarizes the features of the technology disclosed in this specification. The items described below have technical usefulness independently.
 本明細書で開示される認識装置の一実施形態は、読取装置、特徴パラメータ作成装置、第1メモリ、信号出力装置を備えている。読取装置は、読取対象を読み取るものであり、典型的には、マーク及び/又は電子部品を読み取るものであってもよい。マークには、画像認識用の特定形状を有する模様、バーコード、2次元コード、磁気コード、又はICタグ等が含まれてもよい。これらのマークは、基板作業機又は基板作業機に関連して使用される機器の構成要素に印されていてもよい。マークが画像認識用の特定形状を有する模様の場合、読取装置には、カメラ、スキャナ、レーザスキャナ、又はCCD等の固定イメージセンサの撮像装置が用いられるのが望ましい。特徴パラメータ作成装置は、読み取られた対象から特徴パラメータを作成する。読み取られた対象が画像認識用の特定形状を有する模様の場合、典型的には、その特定形状を有する模様のエッジに関する特徴パラメータが作成されてもよい。第1メモリは、特徴パラメータに関する標準パラメータを記憶している。例えば、複数種類の読取対象がある場合、第1メモリは、それぞれの読取対象の特徴パラメータに関する標準パラメータを記憶していてもよい。これにより、複数種類の読取対象から特定の読取対象を識別することが可能になる。信号出力装置は、特徴パラメータと標準パラメータの相関を示すヒット率に基づいて、メンテナンス要求信号を出力する。ここで、ヒット率は、特徴パラメータと標準パラメータの類似度が高いほど高い指標であってもよく、逆に、特徴パラメータと標準パラメータの非類似度が高いほど高い指標であってもよい。いずれの場合も、ヒット率は、特徴パラメータと標準パラメータの相関を示す指標である。ヒット率は、既知の画像処理技術においても、読取対象の識別の可否を判断するための指標として計算されているものである。信号出力装置は、ヒット率がエラー閾値に達していない段階で、エラー閾値とは異なるメンテナンス閾値に達したときにメンテナンス要求信号を出力する。ここで、メンテナンス要求信号には、様々な情報が含まれてもよい。例えば、メンテナンス要求信号には、読取対象のメンテナンスを要求する場合に限らず、読取対象と関連する構成要素のメンテナンスを読取対象のメンテナンスと合わせて要求する場合、読取対象とは異なる他の構成要素のメンテナンスのみを要求する場合が含まれる。 One embodiment of the recognition device disclosed in this specification includes a reading device, a characteristic parameter creation device, a first memory, and a signal output device. The reading device reads a reading target, and typically may read a mark and / or an electronic component. The mark may include a pattern having a specific shape for image recognition, a barcode, a two-dimensional code, a magnetic code, an IC tag, or the like. These marks may be marked on a substrate working machine or a component of equipment used in connection with the substrate working machine. When the mark has a pattern having a specific shape for image recognition, it is desirable to use a camera, a scanner, a laser scanner, or an imaging device of a fixed image sensor such as a CCD as the reading device. The feature parameter creation device creates feature parameters from the read target. When the read target is a pattern having a specific shape for image recognition, typically, a feature parameter related to an edge of the pattern having the specific shape may be created. The first memory stores standard parameters related to feature parameters. For example, when there are a plurality of types of reading targets, the first memory may store standard parameters related to the characteristic parameters of each reading target. This makes it possible to identify a specific reading object from a plurality of types of reading objects. The signal output device outputs a maintenance request signal based on the hit rate indicating the correlation between the characteristic parameter and the standard parameter. Here, the hit rate may be a higher index as the similarity between the feature parameter and the standard parameter is higher, and conversely, it may be a higher index as the dissimilarity between the feature parameter and the standard parameter is higher. In any case, the hit rate is an index indicating the correlation between the feature parameter and the standard parameter. The hit rate is calculated as an index for determining whether or not to identify a reading target even in a known image processing technique. The signal output device outputs a maintenance request signal when the hit rate does not reach the error threshold and reaches a maintenance threshold different from the error threshold. Here, various information may be included in the maintenance request signal. For example, the maintenance request signal is not limited to requesting the maintenance of the reading target, but when requesting the maintenance of the component related to the reading target together with the maintenance of the reading target, other components different from the reading target This includes the case where only maintenance is required.
 本明細書で開示される認識装置では、ヒット率の時系列データを記憶する第2メモリをさらに備えていてもよい。これにより、ヒット率の時系列データを利用することで、様々な有用な処理を行うことが可能になる。例えば、ヒット率の時系列データを利用することで、信号出力装置は、ヒット率の変化率が異常値を上回ったときに、メンテナンス要求信号を出力するように構成することができる。ヒット率の変化率の急激な変化は、異常な事象が生じている可能性が高い。このため、上記信号出力装置は、そのような異常な事象の早期発見に有用である。また、ヒット率の時系列データを利用することで、信号出力装置は、一の対象のヒット率がメンテナンス閾値に達したときに、他の対象のヒット率を参照してメンテナンス要求信号を出力するように構成することができる。このように、他のヒット率の時系列データを参照することで、ヒット率が悪化した原因分析を行うことができる。上記信号出力装置は、ヒット率が悪化した原因を特定する場合に有用である。 The recognition apparatus disclosed in this specification may further include a second memory that stores time-series data of hit rates. Thereby, various useful processes can be performed by using the time-series data of the hit rate. For example, by using time-series data of hit rates, the signal output device can be configured to output a maintenance request signal when the change rate of the hit rate exceeds an abnormal value. An abrupt change in the hit rate change rate is likely to cause an abnormal event. For this reason, the signal output device is useful for early detection of such abnormal events. Further, by using the time-series data of the hit rate, the signal output device outputs a maintenance request signal with reference to the hit rate of another target when the hit rate of one target reaches the maintenance threshold. It can be constituted as follows. In this way, by referring to time-series data of other hit rates, it is possible to analyze the cause of the deteriorated hit rate. The signal output device is useful for identifying the cause of the deterioration of the hit rate.
 本明細書で開示される認識装置では、読取装置が撮像装置であってもよい。また、撮像装置は、対象を照射する光源、及び対象に照射される照度を測定する測定装置を有していてもよい。この場合、信号出力装置は、ヒット率がメンテナンス閾値に達し、且つ、照度が照度閾値に達しているときに、光源メンテナンス要求信号を含むメンテナンス要求信号を出力してもよい。ヒット率が悪化する原因は様々であるが、読取装置が撮像装置である場合、光源の照度に問題があることがある。上記実施形態では、測定された光源の照度を照度閾値と比較することで、ヒット率が悪化した原因が光源の照度にあるか否かを判断することができる。 In the recognition device disclosed in this specification, the reading device may be an imaging device. Further, the imaging apparatus may include a light source that irradiates the target and a measurement device that measures the illuminance irradiated on the target. In this case, the signal output device may output a maintenance request signal including a light source maintenance request signal when the hit rate reaches the maintenance threshold value and the illuminance reaches the illuminance threshold value. There are various causes for the deterioration of the hit rate, but when the reading device is an imaging device, there may be a problem with the illuminance of the light source. In the above embodiment, by comparing the measured illuminance of the light source with the illuminance threshold, it is possible to determine whether or not the cause of the deterioration of the hit rate is the illuminance of the light source.
 本明細書で開示される認識装置は、回路基板に電子部品を実装する実装機に設けられていてもよい。実装機は、読取装置として用いられる撮像装置を有する。撮像装置は、実装機を構成する構成部品に印されている第1マークと電子部品が実装される回路基板に印されている第2マークを撮像するマークカメラを有していてもよい。この場合、メンテナンス閾値は、第1マーク用の第1メンテナンス閾値と第2マーク用の第2メンテナンス閾値を含んでいてもよい。信号出力装置は、第1マークのヒット率が第1メンテナンス閾値に達したときに、第1要求信号を含むメンテナンス要求信号を出力してもよい。さらに、信号出力装置は、第2マークのヒット率が第2メンテナンス閾値に達したときに、第2要求信号を含むメンテナンス要求信号を出力してもよい。上記実施形態では、マークカメラが構成部品に印されている第1マークと回路基板に印されている第2マークの異なるマークを撮像可能に構成されている。上記実施形態では、第1マークのヒット率が第1メンテナンス閾値に達したときに出力されるメンテナンス要求信号と第2マークのヒット率が第2メンテナンス閾値に達したときに出力されるメンテナンス要求信号とが区別されているので、いずれのマークに対してメンテナンス要求信号が出力されたのかが区別可能になっている。また、上記実施形態では、第1マークが複数の構成部品に印されていてもよい。なお、この場合、複数の構成部品の種類に応じて、第1マークの種類が異なっていてもよい。さらに、複数の構成部品が複数のグループに分けられており、信号生成装置は、一の構成部品に印された第1マークのヒット率が第1メンテナンス閾値に達したときに、同一グループに属する他の構成部品の情報を含むメンテナンス要求信号を出力してもよい。例えば、マークの劣化速度に類似性がある構成部品をグループ化しておくことで、1つの構成部品のマークの劣化から同一グループに属する他の構成部品の劣化を推測することができる。 The recognition apparatus disclosed in this specification may be provided in a mounting machine that mounts electronic components on a circuit board. The mounting machine has an imaging device used as a reading device. The imaging apparatus may include a mark camera that captures an image of a first mark marked on a component constituting the mounting machine and a second mark marked on a circuit board on which the electronic component is mounted. In this case, the maintenance threshold value may include a first maintenance threshold value for the first mark and a second maintenance threshold value for the second mark. The signal output device may output a maintenance request signal including the first request signal when the hit ratio of the first mark reaches the first maintenance threshold. Furthermore, the signal output device may output a maintenance request signal including a second request signal when the hit rate of the second mark reaches the second maintenance threshold. In the above embodiment, the mark camera is configured to be able to image different marks, the first mark marked on the component and the second mark marked on the circuit board. In the above embodiment, the maintenance request signal output when the hit ratio of the first mark reaches the first maintenance threshold and the maintenance request signal output when the hit ratio of the second mark reaches the second maintenance threshold. Therefore, it is possible to distinguish which mark the maintenance request signal is output to. Moreover, in the said embodiment, the 1st mark may be marked on the some component. In this case, the type of the first mark may be different depending on the type of the plurality of component parts. Further, the plurality of component parts are divided into a plurality of groups, and the signal generator belongs to the same group when the hit rate of the first mark marked on one component part reaches the first maintenance threshold value. A maintenance request signal including information on other components may be output. For example, by grouping component parts having similar mark deterioration rates, it is possible to infer the deterioration of other component parts belonging to the same group from the mark deterioration of one component part.
 本明細書で開示される認識装置は、回路基板に電子部品を実装する実装機に設けられていてもよい。実装機は、読取装置として用いられる撮像装置を有する。撮像装置は、電子部品を撮像するパーツカメラを有していてもよい。この場合、パーツカメラは、電子部品を撮像するときの撮像視野内に存在する構成部品に印されている第1マークも撮像していてもよい。メンテナンス閾値は、電子部品用の第3メンテナンス閾値と第1マーク用の第1メンテナンス閾値を含んでいてもよい。信号出力装置は、電子部品のヒット率が第3メンテナンス閾値に達したときに、第3要求信号を含むメンテナンス要求信号を出力してもよい。さらに、信号出力装置は、第1マークのヒット率が第1メンテナンス閾値に達したときに、第1要求信号を含むメンテナンス要求信号を出力してもよい。上記実施形態では、パーツカメラが構成部品に印されている第1マークと電子部品を撮像可能に構成されている。上記実施形態では、第1マークのヒット率が第1メンテナンス閾値に達したときに出力されるメンテナンス要求信号と電子部品のヒット率が第3メンテナンス閾値に達したときに出力されるメンテナンス要求信号が区別されており、第1マークと電子部品のいずれに対してメンテナンス要求信号が出力されたのかが区別可能になっている。また、上記実施形態では、電子部品のヒット率に基づいて、電子部品の標準パラメータの修正要求信号を出力する修正要求信号出力装置をさらに備えていてもよい。電子部品の標準パラメータは、電子部品の種類に応じて予め定まっている。しかしながら、例えば、製造ロッドが異なる電子部品を同一の標準パラメータを用いて認識しようとすると、製造ロッドに応じて電子部品のヒット率が異なることがある。このような場合、標準パラメータを修正することによって、電子部品の認識精度が悪化するのを抑制することができる。 The recognition apparatus disclosed in this specification may be provided in a mounting machine that mounts electronic components on a circuit board. The mounting machine has an imaging device used as a reading device. The imaging device may have a parts camera that images an electronic component. In this case, the parts camera may also take an image of the first mark marked on the component existing in the imaging field when imaging the electronic component. The maintenance threshold value may include a third maintenance threshold value for the electronic component and a first maintenance threshold value for the first mark. The signal output device may output a maintenance request signal including a third request signal when the hit rate of the electronic component reaches the third maintenance threshold. Further, the signal output device may output a maintenance request signal including the first request signal when the hit rate of the first mark reaches the first maintenance threshold value. In the said embodiment, the parts camera is comprised so that imaging of the 1st mark and electronic component which are marked on the component is possible. In the above embodiment, the maintenance request signal output when the hit rate of the first mark reaches the first maintenance threshold and the maintenance request signal output when the hit rate of the electronic component reaches the third maintenance threshold are provided. It is possible to distinguish whether the maintenance request signal is output to which of the first mark or the electronic component. In the above-described embodiment, a correction request signal output device that outputs a correction request signal for a standard parameter of an electronic component based on the hit rate of the electronic component may be further provided. The standard parameters of the electronic component are determined in advance according to the type of the electronic component. However, for example, when an electronic component having a different manufacturing rod is to be recognized using the same standard parameter, the hit rate of the electronic component may differ depending on the manufacturing rod. In such a case, it is possible to suppress deterioration of the recognition accuracy of the electronic component by correcting the standard parameter.
 本明細書で開示される技術によると、上記の認識装置で得られる時系列データを記憶する第3メモリを有する管理システムを構築することができる。例えば、第3メモリは、基板作業機、ノズル洗浄機、ノズル検査機、フィーダーメンテナンスユニットのうちの少なくとも2つに設けられている認識装置から集められたヒット率の時系列データを記憶してもよい。このような管理システムを用いると、特定の認識対象のヒット率の時系列データが複数の機器から集積されるので、ヒット率の時系列データが途切れることなく連続したものとなり、より効果的な管理を行うことができる。 According to the technology disclosed in this specification, it is possible to construct a management system having a third memory that stores time-series data obtained by the above recognition device. For example, the third memory may store time-series data of hit rates collected from recognition devices provided in at least two of the substrate working machine, the nozzle cleaning machine, the nozzle inspection machine, and the feeder maintenance unit. Good. Using such a management system, the time-series data on the hit rate for a specific recognition target is accumulated from multiple devices, so the time-series data on the hit rate is continuous without interruption and more effective management It can be performed.
 上記管理システムは、第3メモリに記憶されているヒット率の時系列データに基づいて、ヒット率が前記メンテナンス閾値とエラー閾値の少なくともいずれか一方に達する時期を予測する予測装置を備えていてもよい。この管理システムでは、ヒット率の悪化速度の傾向を把握することが可能となり、生産計画スケジュールの作成に有用な情報を提供することができる。例えば、上記管理システムは、基板作業機の稼働期間と非稼働期間を記述する生産計画データを記憶している第4メモリを備えていてもよい。この場合、予測装置によって予測された予測時期と第4メモリに記憶されている生産計画データに基づいて、メンテナンス計画データを作成する計画装置と、をさらに備えていてもよい。計画装置は、予測時期が稼働期間に含まれるときに、その稼働期間より前の非稼働期間にメンテナンスの実施時期を計画するように構成されていてもよい。 The management system may include a prediction device that predicts when the hit rate reaches at least one of the maintenance threshold and the error threshold based on the time-series data of the hit rate stored in the third memory. Good. In this management system, it is possible to grasp the tendency of the hit rate deterioration rate, and it is possible to provide information useful for creating a production plan schedule. For example, the management system may include a fourth memory that stores production plan data describing an operation period and a non-operation period of the substrate working machine. In this case, it may further include a planning device that creates maintenance plan data based on the prediction time predicted by the prediction device and the production plan data stored in the fourth memory. The planning device may be configured to plan the maintenance execution time in the non-operation period before the operation period when the prediction period is included in the operation period.
 以下、図面を参照して、回路基板上に集積回路を形成する際に用いられる実装機を説明する。回路基板上の集積回路は、はんだ印刷機、実装機、及びリフロー炉を順に搬送されて形成される。はんだ印刷機は、回路基板上の電子部品の搭載位置にクリームはんだを印刷する。実装機は、クリームはんだが印刷された回路基板上の搭載位置に電子部品を搭載する。リフロー炉は、回路基板に熱処理を施すことで電子部品を回路基板上にハンダ付けする。 Hereinafter, a mounting machine used when forming an integrated circuit on a circuit board will be described with reference to the drawings. The integrated circuit on the circuit board is formed by being sequentially conveyed through a solder printer, a mounting machine, and a reflow furnace. The solder printer prints cream solder on the electronic component mounting position on the circuit board. The mounting machine mounts an electronic component at a mounting position on a circuit board on which cream solder is printed. The reflow furnace solders an electronic component on a circuit board by performing heat treatment on the circuit board.
 図1に示されるように、実装機1は、テーブル3上に隣接して配置されている複数のモジュール2を備えている。モジュール2の各々は、共通した構成となっており、筐体として機能するフレーム4内に複数の装置を備えている。図1は、2つのモジュール2が隣接している例を示しており、2つのモジュール2のうちの1つのモジュール2の外装板を透かした状態で示している。モジュール2は、部品供給装置10、パーツカメラを有するパーツ撮像装置20、ノズルストッカ30、基板搬送装置40、部品移載装置50、搭載ヘッド60、及びマークカメラを有するマーク撮像装置70を備える。また、モジュール2の各々は、外装板の表面に後述する制御装置と通信可能に構成されている入出力装置6を備えている。入出力装置6は、オペレータからの入力を受け付け可能であるとともに、モジュール2のステータス情報、及び後述する各種のオペレータへの指示を表示可能に構成されている。 As shown in FIG. 1, the mounting machine 1 includes a plurality of modules 2 arranged adjacent to each other on a table 3. Each of the modules 2 has a common configuration, and includes a plurality of devices in a frame 4 that functions as a housing. FIG. 1 shows an example in which two modules 2 are adjacent to each other, and shows an exterior plate of one of the two modules 2 in a watermarked state. The module 2 includes a component supply device 10, a parts imaging device 20 having a parts camera, a nozzle stocker 30, a substrate transfer device 40, a component transfer device 50, a mounting head 60, and a mark imaging device 70 having a mark camera. Each of the modules 2 includes an input / output device 6 configured to be able to communicate with a control device described later on the surface of the exterior plate. The input / output device 6 is configured to be able to receive input from an operator and to display status information of the module 2 and instructions to various operators described later.
(部品供給装置10の構成)
 図1に示されるように、部品供給装置10は、回路基板5に搭載する複数種類の電子部品を部品吸着位置に供給する装置であり、複数のカセット式のフィーダ11が並設して構成さている。フィーダ11のフィーダ本体12は、フレーム4に着脱可能に構成されている。図2に示されるように、フィーダ11は、キャリアテープ14が巻回されたテープリール13、テープリール13から引き出されたキャリアテープ14を部品吸着位置へ案内するテープガイド15、キャリアテープ14を部品吸着位置へピッチ送りするスプロケット16、及びスプロケット16を回転駆動するモータ(図示省略)を備えている。さらに、フィーダ11の先端面には、実装機1の本体に設けられているコネクタ(図示省略)と接続される通信コネクタ17、実装機1の本体に対する取付位置を決める位置決めピン18,19が設けられている。
(Configuration of component supply apparatus 10)
As shown in FIG. 1, the component supply device 10 is a device that supplies a plurality of types of electronic components mounted on the circuit board 5 to a component suction position, and is configured by arranging a plurality of cassette-type feeders 11 in parallel. Yes. The feeder main body 12 of the feeder 11 is configured to be detachable from the frame 4. As shown in FIG. 2, the feeder 11 includes a tape reel 13 around which the carrier tape 14 is wound, a tape guide 15 that guides the carrier tape 14 drawn from the tape reel 13 to a component suction position, and the carrier tape 14 as a component. A sprocket 16 that pitch-feeds to the suction position and a motor (not shown) that rotationally drives the sprocket 16 are provided. Further, a communication connector 17 connected to a connector (not shown) provided on the main body of the mounting machine 1 and positioning pins 18 and 19 for determining a mounting position with respect to the main body of the mounting machine 1 are provided on the front end surface of the feeder 11. It has been.
 図3に示されるように、キャリアテープ14には、電子部品Pを収容するキャビティ14aが一定のピッチ間隔で形成されている。キャビティ14aの上部開口は、カバーテープ14bによって覆われており、キャリアテープ14とカバーテープ14bによって電子部品Pがテーピングされている。カバーテープ14bは、部品吸着位置の手前でキャリアテープ14から引き剥がされる。キャリアテープ14に形成された送り穴14cには、スプロケット16が係合する。これにより、キャリアテープ14は、所定ピッチずつ送り出され、キャビティ14a内に収容された電子部品Pを部品吸着位置に順次供給する。図4に示されるように、フィーダ本体12の上部には、部品吸着位置に対応した位置に開口部12aが形成されている。部品吸着位置に供給された電子部品Pは、開口部12aに挿入される吸着ノズルに吸着され、キャビティ14aから取出される。フィーダ本体12の上面には、部品吸着位置の近傍に基準マークM1が印されている。基準マークM1は、後述するマークカメラによって撮像される。実装機1は、マークカメラで撮像した基準マークM1の画像データを利用して、基準マークM1を識別するとともに、その位置情報を取得する。実装機1は、基準マークM1の位置情報を利用して、部品吸着位置の理想位置からの位置ずれを計算し、その位置ずれに基づいて吸着ノズルを移動させ、電子部品Pを吸着する。 As shown in FIG. 3, the carrier tape 14 is formed with cavities 14a for accommodating the electronic components P at a constant pitch interval. The upper opening of the cavity 14a is covered with a cover tape 14b, and the electronic component P is taped by the carrier tape 14 and the cover tape 14b. The cover tape 14b is peeled off from the carrier tape 14 before the component suction position. A sprocket 16 is engaged with a feed hole 14 c formed in the carrier tape 14. As a result, the carrier tape 14 is fed out by a predetermined pitch and sequentially supplies the electronic components P accommodated in the cavity 14a to the component suction positions. As shown in FIG. 4, an opening 12 a is formed in the upper portion of the feeder main body 12 at a position corresponding to the component suction position. The electronic component P supplied to the component suction position is sucked by the suction nozzle inserted into the opening 12a and taken out from the cavity 14a. On the upper surface of the feeder body 12, a reference mark M1 is marked in the vicinity of the component suction position. The reference mark M1 is imaged by a mark camera described later. The mounting machine 1 uses the image data of the reference mark M1 imaged by the mark camera to identify the reference mark M1 and acquire its position information. The mounting machine 1 uses the positional information of the reference mark M1 to calculate the positional deviation of the component suction position from the ideal position, moves the suction nozzle based on the positional deviation, and sucks the electronic component P.
(パーツ撮像装置20の構成)
 図1に示されるように、パーツ撮像装置20は、フレーム4に固定されており、部品供給装置10と基板搬送装置40の間に配置されている。図5に示されるように、パーツ撮像装置20は、パーツカメラ21、支持台22、連結部材23、上端部材24、側射光源25、及びカバーガラス26を有している。パーツカメラ21は、支持台22を介してフレーム4に固定されている。パーツカメラ21には、例えばCCDカメラが用いられている。支持台22と上端部材24は、連結部材23を介して固定されている。上端部材24は、上面と底面が開口するとともに側部が湾曲した形態を有している。上端部材24の内壁面には多数の側射光源25が設けられており、上端部材24の上部開口がカバーガラス26で覆われている。側射光源25には、例えばLEDが用いられる。
(Configuration of parts imaging device 20)
As shown in FIG. 1, the part imaging device 20 is fixed to the frame 4 and is disposed between the component supply device 10 and the board transfer device 40. As shown in FIG. 5, the parts imaging apparatus 20 includes a parts camera 21, a support base 22, a connecting member 23, an upper end member 24, a side light source 25, and a cover glass 26. The parts camera 21 is fixed to the frame 4 via a support base 22. As the part camera 21, for example, a CCD camera is used. The support base 22 and the upper end member 24 are fixed via a connecting member 23. The upper end member 24 has a shape in which the upper surface and the bottom surface are opened and the side portions are curved. A number of side light sources 25 are provided on the inner wall surface of the upper end member 24, and the upper opening of the upper end member 24 is covered with a cover glass 26. For example, an LED is used as the side light source 25.
 電子部品Pは、フィーダ11の部品吸着位置で吸着された後、基板搬送装置40に位置決めされている回路基板5に搭載される前に、パーツ撮像装置20の上方に配置され、パーツカメラ21で撮像される。実装機1は、パーツ撮像装置20で撮像した電子部品Pの画像データを利用して、電子部品Pを識別するとともに、電子部品Pの吸着姿勢を確認する。電子部品Pの識別は、電子部品Pの画像データと予め取得されているパーツデータを比較し、所望の電子部品Pであるか否かを判断することによって行われる。電子部品Pの吸着姿勢の確認は、電子部品Pの画像データを利用して、吸着ノズルの中心軸からの電子部品Pの位置ずれ及び吸着ノズルの中心軸回りの電子部品Pの角度ずれを検出することによって行われる。電子部品Pの吸着姿勢は、電子部品Pが回路基板5に搭載される前に吸着ノズルを自転させることによって修正される。 The electronic component P is disposed above the part imaging device 20 after being attracted at the component attracting position of the feeder 11 and before being mounted on the circuit board 5 positioned on the substrate transport device 40. Imaged. The mounting machine 1 uses the image data of the electronic component P imaged by the parts imaging device 20 to identify the electronic component P and confirm the suction posture of the electronic component P. The identification of the electronic component P is performed by comparing image data of the electronic component P with previously acquired part data and determining whether or not the electronic component P is a desired electronic component P. The confirmation of the suction posture of the electronic component P uses the image data of the electronic component P to detect the positional deviation of the electronic component P from the central axis of the suction nozzle and the angular deviation of the electronic component P around the central axis of the suction nozzle. Is done by doing. The suction posture of the electronic component P is corrected by rotating the suction nozzle before the electronic component P is mounted on the circuit board 5.
 また、パーツ撮像装置20は、必要に応じて、電子部品Pを撮像するときの撮像視野内に存在する構成部品(例えば、搭載ヘッド60)に印されている基準マーク(例えば、コーナードッグ)も同時に撮像してもよい。実装機1は、この基準マークの位置情報を利用して、電子部品Pを吸着している吸着ノズルの中心軸の位置を推定し、吸着ノズルの中心軸からの電子部品Pの位置ずれを検出してもよい。また、パーツ撮像装置20は、電子部品Pを撮像するのに先立って、特定の基準マークを撮像してもよい。実装機1は、この基準マークの位置情報を利用して、電子部品Pを撮像するときの吸着ノズルの中心軸の位置を補正するようにしてもよい。 In addition, the part imaging device 20 also includes a reference mark (for example, a corner dog) marked on a component (for example, the mounting head 60) that exists in the imaging field when the electronic component P is captured as necessary. You may image simultaneously. The mounting machine 1 uses the position information of the reference mark to estimate the position of the center axis of the suction nozzle that sucks the electronic component P, and detects the displacement of the electronic component P from the center axis of the suction nozzle. May be. Further, the parts imaging apparatus 20 may image a specific reference mark before imaging the electronic component P. The mounting machine 1 may correct the position of the central axis of the suction nozzle when the electronic component P is imaged using the position information of the reference mark.
 また、パーツ撮像装置20は、撮像対象に照射される照度を測定する照度測定装置(図示省略)を備えている。照度測定装置は、例えば、側射光源25の出力低下、カバーガラス26の汚れによって低下する照度を測定可能に構成されている。 The parts imaging device 20 includes an illuminance measuring device (not shown) that measures the illuminance irradiated to the imaging target. The illuminance measuring apparatus is configured to be able to measure the illuminance that decreases due to, for example, a decrease in the output of the side light source 25 and dirt on the cover glass 26.
(ノズルストッカ30の構成)
 図1に示されるように、ノズルストッカ30は、パーツ撮像装置20の近傍に設けられており、複数種類の吸着ノズル(後述する)が収容されている。図6に示されるように、ノズルストッカ30は、吸着ノズルを収容するための複数のノズル収容穴31を備えている。例えば、ノズルストッカ30には、使用中の吸着ノズルと同種の良品吸着ノズルが収容されており、使用中の吸着ノズルが不良となったときに、ノズルストッカ30に収容されている良品吸着ノズルを不良吸着ノズルと交換される。あるいは、ノズルストッカ30には、複数種類の吸着ノズルが収容されており、回路基板5に搭載される電子部品の種類に応じて所定の吸着ノズルが選択される。
(Configuration of nozzle stocker 30)
As shown in FIG. 1, the nozzle stocker 30 is provided in the vicinity of the part imaging device 20 and accommodates a plurality of types of suction nozzles (described later). As shown in FIG. 6, the nozzle stocker 30 includes a plurality of nozzle housing holes 31 for housing the suction nozzles. For example, the nozzle stocker 30 contains a non-defective product suction nozzle of the same type as the suction nozzle in use, and when the suction nozzle in use becomes defective, the good product suction nozzle stored in the nozzle stocker 30 is Replaced with defective suction nozzle. Alternatively, the nozzle stocker 30 accommodates a plurality of types of suction nozzles, and a predetermined suction nozzle is selected according to the type of electronic component mounted on the circuit board 5.
 図6に示されるように、ノズルストッカ30の上面には、基準マークM2と2次元コードC1が印されている。2次元コードC1には、収容されている吸着ノズルの種類とノズル収容穴31が対応付けられた情報として記憶されている。基準マークM2と2次元コードC1は、後述するマークカメラによって撮像される。実装機1は、マークカメラで撮像した基準マークM2の画像データを利用して、基準マークM2を識別するとともに、その位置情報を取得する。実装機1は、基準マークM2の位置情報を利用して、ノズルストッカ30のノズル収容穴31の理想位置からの位置ずれを計算し、その位置ずれに基づいてノズル収容穴31からの吸着ノズルの取出し及び吸着ノズルへの収容を行う。実装機1は、マークカメラで撮像した2次元コードC1に記録されている情報を利用して、ノズルストッカ30に収容されている複数の吸着ノズルから所望の吸着ノズルを選択する。 As shown in FIG. 6, a reference mark M2 and a two-dimensional code C1 are marked on the upper surface of the nozzle stocker 30. The two-dimensional code C1 stores information associating the type of suction nozzle accommodated with the nozzle accommodation hole 31. The reference mark M2 and the two-dimensional code C1 are imaged by a mark camera described later. The mounting machine 1 uses the image data of the reference mark M2 imaged by the mark camera to identify the reference mark M2 and acquire its position information. The mounting machine 1 uses the positional information of the reference mark M2 to calculate the positional deviation from the ideal position of the nozzle receiving hole 31 of the nozzle stocker 30, and based on the positional deviation, the mounting nozzle 1 of the suction nozzle from the nozzle receiving hole 31 is calculated. Take out and store in suction nozzle. The mounting machine 1 selects a desired suction nozzle from a plurality of suction nozzles accommodated in the nozzle stocker 30 using information recorded in the two-dimensional code C1 captured by the mark camera.
(基板搬送装置40の構成)
 図1に示されるように、基板搬送装置40は、フレーム4に固定されており、回路基板5を搬送方向(X軸方向)に沿って搬送するとともに、所定の作業位置で回路基板5を位置決めする。基板搬送装置40は、第1搬送装置41と第2搬送装置41を2列並設したダブルコンベアタイプである。第1搬送装置41は、平行に対向配置された一対の搬送ガイドレール41a,41bを有する。第2搬送装置42も同様に、平行に対向配置された一対の搬送ガイドレール42a,42bを有する。
(Configuration of the substrate transfer device 40)
As shown in FIG. 1, the board transport device 40 is fixed to the frame 4, transports the circuit board 5 along the transport direction (X-axis direction), and positions the circuit board 5 at a predetermined work position. To do. The substrate transfer device 40 is a double conveyor type in which the first transfer device 41 and the second transfer device 41 are arranged in two rows. The first transport device 41 has a pair of transport guide rails 41a and 41b arranged to face each other in parallel. Similarly, the second transport device 42 has a pair of transport guide rails 42a and 42b arranged to face each other in parallel.
 図7に示されるように、第1搬送装置41の一対の搬送ガイドレール41a,41bの各々には、その上端部が内側に向けて突出する押さえ板部43a,43bが形成されている。また、搬送ガイドレール41a,41bの各々の内壁面には、ベルトコンベア44a,44bが設けられている。回路基板5は、一対のベルトコンベア44a,44b上を搬送方向に搬送され、所定の作業位置で停止される。また、第1搬送装置41には、クランプ装置(図示省略)が設けられている。クランプ装置は、昇降装置によって昇降可能に構成されたバックプレートと、そのバックプレート上の所定位置で取替え可能に設けられたバックピンを有する。クランプ装置は、バックプレートを上昇させることによってバックピンを介して回路基板5を上昇させる。回路基板5は、バックピンと押さえ板部43a,44bの裏面との間で挟持され、所定の作業位置で位置決めされる。 As shown in FIG. 7, each of the pair of transport guide rails 41 a and 41 b of the first transport device 41 is formed with holding plate portions 43 a and 43 b whose upper end portions protrude inward. In addition, belt conveyors 44a and 44b are provided on the inner wall surfaces of the transport guide rails 41a and 41b, respectively. The circuit board 5 is transported in the transport direction on the pair of belt conveyors 44a and 44b and stopped at a predetermined work position. The first transport device 41 is provided with a clamp device (not shown). The clamp device includes a back plate that can be moved up and down by a lifting device, and a back pin that can be replaced at a predetermined position on the back plate. The clamp device raises the circuit board 5 through the back pin by raising the back plate. The circuit board 5 is sandwiched between the back pins and the back surfaces of the holding plate portions 43a and 44b and positioned at a predetermined work position.
 第1搬送装置41の一対の搬送ガイドレール41a,41bの対向距離D1は、搬送される回路基板5の幅に応じて変更可能に構成されている。この例では、図示左側の搬送ガイドレール41aが固定ガイドレールであり、図示右側の搬送ガイドレール41bが可動ガイドレールである。可動ガイドレール41bは、駆動装置(図示省略)に接続されており、固定ガイドレール41aとの間の対向距離D1が変更可能に構成されている。可動ガイドレール41bの上面には、基準マークM3が印されている。基準マークM3は、後述するマークカメラによって撮像される。実装機1は、マークカメラで撮像した基準マークM3の画像データを利用して、基準マークM3を識別するとともに、その位置情報を取得する。実装機1は、基準マークM3の位置情報を利用して、固定ガイドレール41aに対する可動ガイドレール41bの位置を検出する。なお、上記した第1搬送装置41の構成は、第2搬送装置42においても同様である。 The opposing distance D1 between the pair of transport guide rails 41a and 41b of the first transport device 41 is configured to be changeable according to the width of the circuit board 5 to be transported. In this example, the conveyance guide rail 41a on the left side in the figure is a fixed guide rail, and the conveyance guide rail 41b on the right side in the figure is a movable guide rail. The movable guide rail 41b is connected to a driving device (not shown), and is configured such that the facing distance D1 between the movable guide rail 41b and the fixed guide rail 41a can be changed. A reference mark M3 is marked on the upper surface of the movable guide rail 41b. The reference mark M3 is imaged by a mark camera described later. The mounting machine 1 uses the image data of the reference mark M3 imaged by the mark camera to identify the reference mark M3 and acquire its position information. The mounting machine 1 detects the position of the movable guide rail 41b with respect to the fixed guide rail 41a using the position information of the reference mark M3. The configuration of the first transport device 41 described above is the same in the second transport device 42.
 図7に示されるように、回路基板5の表面の対角位置の各々には、基準マークM4が印されている。この基準マークM4は、後述するマークカメラによって撮像される。実装機1は、マークカメラで撮像した基準マークM4の画像データを利用して、基準マークM4を識別するとともに、その位置情報を取得する。実装機1は、基準マークM4の位置情報を利用して、回路基板5の表面の電子部品Pの搭載位置の理想位置からの位置ずれを計算し、その位置ずれに基づいて吸着ノズルを移動させ、電子部品Pを搭載する。 As shown in FIG. 7, a reference mark M <b> 4 is marked on each of the diagonal positions on the surface of the circuit board 5. The reference mark M4 is imaged by a mark camera described later. The mounting machine 1 uses the image data of the reference mark M4 captured by the mark camera to identify the reference mark M4 and acquire its position information. The mounting machine 1 uses the positional information of the reference mark M4 to calculate the positional deviation from the ideal position of the mounting position of the electronic component P on the surface of the circuit board 5, and moves the suction nozzle based on the positional deviation. The electronic component P is mounted.
(部品移載装置50、搭載ヘッド60、マーク撮像装置70の構成)
 図1に示されるように、部品移載装置50は、フレーム4に固定されており、XYロボットタイプである。部品移載装置50は、Y軸スライド機構及びX軸スライド機構を備えている。Y軸スライド機構は、Y軸サーボモータ51を利用してY軸スライダ52をY軸方向に移動可能に構成されている。
(Configuration of component transfer device 50, mounting head 60, and mark imaging device 70)
As shown in FIG. 1, the component transfer device 50 is fixed to the frame 4 and is an XY robot type. The component transfer device 50 includes a Y-axis slide mechanism and an X-axis slide mechanism. The Y-axis slide mechanism is configured to be able to move the Y-axis slider 52 in the Y-axis direction using a Y-axis servo motor 51.
 図8に、X軸スライド機構、搭載ヘッド60、及びマーク撮像装置70の概略を示す。X軸スライド機構は、Y軸スライダ52に設けられており、X軸サーボモータ(図示省略)を利用してX軸スライダ53をX軸方向に移動可能に構成されている。搭載ヘッド60及びマーク撮像装置70は、X軸スライダ53に固定されており、Y軸スライド機構及びX軸スライド機構を利用して、部品供給装置10、パーツ撮像装置20、ノズルストッカ30、及び基板搬送装置40の上方をXY平面で移動可能である。マーク撮像装置70は、マークカメラ71と光源(図示省略)を有している。マークカメラ71には、例えばCCDカメラが用いられる。光源には、例えばLEDが用いられる。また、マーク撮像装置70は、撮像対象に照射される照度を測定する照度測定装置(図示省略)を備えている。照度測定装置は、例えば、光源の出力低下、光源のカバーの汚れによって低下する照度を測定可能に構成されている。 FIG. 8 shows an outline of the X-axis slide mechanism, the mounting head 60, and the mark imaging device 70. The X-axis slide mechanism is provided on the Y-axis slider 52, and is configured to be able to move the X-axis slider 53 in the X-axis direction using an X-axis servo motor (not shown). The mounting head 60 and the mark image pickup device 70 are fixed to the X-axis slider 53, and the component supply device 10, the part image pickup device 20, the nozzle stocker 30, and the substrate using the Y-axis slide mechanism and the X-axis slide mechanism. It can be moved on the XY plane above the transfer device 40. The mark imaging device 70 includes a mark camera 71 and a light source (not shown). As the mark camera 71, for example, a CCD camera is used. For example, an LED is used as the light source. Further, the mark imaging device 70 includes an illuminance measurement device (not shown) that measures the illuminance irradiated to the imaging target. The illuminance measuring apparatus is configured to be able to measure the illuminance that decreases due to, for example, a decrease in the output of the light source and dirt on the cover of the light source.
 搭載ヘッド60は、X軸スライダ53に着脱可能に構成されている。実装機1では、複数種類の搭載ヘッド60から必要な搭載ヘッド60が選択されて用いられる。図9A及び図9Bに、2種類の搭載ヘッド60a,60bを例示する。 The mounting head 60 is configured to be detachable from the X-axis slider 53. In the mounting machine 1, a necessary mounting head 60 is selected from a plurality of types of mounting heads 60 and used. 9A and 9B illustrate two types of mounting heads 60a and 60b.
 図9Aに示される搭載ヘッド60aは、リボルダ型であり、複数のノズルホルダ61を有している。ノズルホルダ61の各々には、同一種類又は異なる種類の吸着ノズル62が保持される。複数のノズルホルダ61は、中心軸回りに一定間隔で配置されており、インデックス回転可能に構成されている。さらに、ノズルホルダ61の各々は、自転可能に構成されているとともに、1つのインデックス位置において昇降可能に構成されている。これにより、ノズルホルダ61に保持される吸着ノズル62も自転されるとともに、1つのインデックス位置において昇降可能に構成されている。リボルダ型の搭載ヘッド60aは、例えば、小型の電子部品に対応した吸着ノズル62を保持するために用いられる。吸着ノズル62には、径方向に突出する突出部分62aが設けられており、その突出部分62aの上面に2次元コードC2が印されている(図10参照)。2次元コードC2には、吸着ノズル62の種類が記録されている。2次元コードC2は、ノズルストッカ30に収容されている複数の吸着ノズル62から所望の吸着ノズル62を選択するときに、マークカメラによって撮像される。実装機1は、2次元コードC2の情報を利用して、吸着ノズル62の固体識別を行う。 The mounting head 60 a shown in FIG. 9A is a revolver type and has a plurality of nozzle holders 61. Each nozzle holder 61 holds the same type or different types of suction nozzles 62. The plurality of nozzle holders 61 are arranged at regular intervals around the central axis, and are configured to be capable of index rotation. Further, each of the nozzle holders 61 is configured to be capable of rotating, and is configured to be movable up and down at one index position. As a result, the suction nozzle 62 held by the nozzle holder 61 is also rotated and can be moved up and down at one index position. The revolver-type mounting head 60a is used, for example, to hold the suction nozzle 62 corresponding to a small electronic component. The suction nozzle 62 is provided with a protruding portion 62a protruding in the radial direction, and a two-dimensional code C2 is marked on the upper surface of the protruding portion 62a (see FIG. 10). In the two-dimensional code C2, the type of the suction nozzle 62 is recorded. The two-dimensional code C2 is imaged by the mark camera when a desired suction nozzle 62 is selected from the plurality of suction nozzles 62 accommodated in the nozzle stocker 30. The mounting machine 1 performs solid identification of the suction nozzle 62 using the information of the two-dimensional code C2.
 図9Bに示される搭載ヘッド60bは、シングル型であり、1つのノズルホルダ63を有している。ノズルホルダ63は、自転可能に構成されており、これにより、ノズルホルダ63に保持される吸着ノズル64も自転される。吸着ノズル64にも、径方向に突出する突出部分64aが設けられており、その突出部分64aの上面に2次元コード(図示省略)が印されている。2次元コードには、吸着ノズル64の種類が記録されている。この2次元コードも、ノズルストッカ30に収容されている複数の吸着ノズル64から所望の吸着ノズル64を選択するときに、マークカメラによって撮像される。実装機1は、2次元コードの情報を利用して、吸着ノズル64の固体識別を行う。 The mounting head 60 b shown in FIG. 9B is a single type and has one nozzle holder 63. The nozzle holder 63 is configured to be capable of rotating, whereby the suction nozzle 64 held by the nozzle holder 63 is also rotated. The suction nozzle 64 is also provided with a protruding portion 64a protruding in the radial direction, and a two-dimensional code (not shown) is marked on the upper surface of the protruding portion 64a. The type of the suction nozzle 64 is recorded in the two-dimensional code. This two-dimensional code is also imaged by the mark camera when a desired suction nozzle 64 is selected from the plurality of suction nozzles 64 accommodated in the nozzle stocker 30. The mounting machine 1 performs solid identification of the suction nozzle 64 using the information of the two-dimensional code.
(画像処理部の構成)
 以下、上述した基準マークM1-M4を認識する場合を例にして画像処理部を説明する。ここで、上述した基準マークM1-M4は、印されている構成部品の種類に応じて異なるものとする。なお、2次元コードC1-C2、電子部品Pの吸着姿勢を確認する場合にも、下記と同様の技術を適用することができる。
(Configuration of image processing unit)
Hereinafter, the image processing unit will be described by taking as an example the case of recognizing the reference marks M1-M4 described above. Here, the above-described reference marks M1-M4 are different depending on the type of the marked component. Note that the same technique as described below can also be applied to confirm the two-dimensional code C1-C2 and the suction posture of the electronic component P.
 図11に示されるように、実装機1のモジュール2(図1参照)の各々は、画像処理部100を備えている。なお、画像処理部100は、複数のモジュール2を一括して管理する管理システムのホストコンピュータに設けられていてもよく、あるいは、他の基板作業機、ノズル洗浄機、ノズル検査機、フィーダーメンテナンスユニットを含めた管理システムのホストコンピュータに設けられていてもよい。 As shown in FIG. 11, each of the modules 2 (see FIG. 1) of the mounting machine 1 includes an image processing unit 100. Note that the image processing unit 100 may be provided in a host computer of a management system that collectively manages a plurality of modules 2, or other substrate working machine, nozzle cleaning machine, nozzle inspection machine, feeder maintenance unit. May be provided in a host computer of a management system including
 画像処理部100は、制御装置110、及び画像処理用データを記憶するメモリ120を備える。なお、画像処理部100とパーツ撮像装置20とマーク撮像装置70を含めて認識装置という。制御装置110は、特徴パラメータ作成装置111、ヒット率計算装置112、判断装置113、及び信号出力装置114を有する。特徴パラメータ作成装置111は、マーク撮像装置70で撮像された基準マークM1-M4から特徴パラメータを作成する。ここで作成される特徴パラメータは、基準マークM1-M4の模様に応じて様々であり、既知の画像認識技術を利用して作成することができる。例えば、特徴パラメータは、基準マークM1-M4の画像データから抽出される模様のエッジが含まれる。 The image processing unit 100 includes a control device 110 and a memory 120 that stores image processing data. The image processing unit 100, the part imaging device 20, and the mark imaging device 70 are collectively referred to as a recognition device. The control device 110 includes a feature parameter creation device 111, a hit rate calculation device 112, a determination device 113, and a signal output device 114. The feature parameter creation device 111 creates feature parameters from the reference marks M1-M4 imaged by the mark imaging device 70. The feature parameters created here vary depending on the pattern of the reference marks M1-M4, and can be created using a known image recognition technique. For example, the feature parameter includes a pattern edge extracted from the image data of the reference marks M1-M4.
 ここで、メモリ120の第1メモリ121には、基準マークM1-M4の各々についての標準パラメータが記憶されており、基準マークM1-M4と標準パラメータが対応付けされている。ヒット率計算装置112は、撮像された基準マークM1-M4の特徴パラメータと対応する標準パラメータの相関を示すヒット率を計算する。ヒット率とは、特徴パラメータと標準パラメータの類似度を示すものであり、類似度が高いほど高い値を示す。なお、ヒット率計算装置112で計算されたヒット率は、第2メモリ122に記憶される。第2メモリ122には、ヒット率計算装置112によって基準マークM1-M4のヒット率が計算される毎にそのヒット率が記憶されることから、基準マークM1-M4の各々のヒット率の時系列データが記憶されている。 Here, the first memory 121 of the memory 120 stores standard parameters for each of the reference marks M1-M4, and the reference marks M1-M4 are associated with the standard parameters. The hit rate calculation device 112 calculates a hit rate indicating the correlation between the characteristic parameters of the captured reference marks M1-M4 and the corresponding standard parameters. The hit rate indicates the similarity between the feature parameter and the standard parameter, and indicates a higher value as the similarity is higher. Note that the hit rate calculated by the hit rate calculation device 112 is stored in the second memory 122. The second memory 122 stores the hit rate every time the hit rate of the reference mark M1-M4 is calculated by the hit rate calculation device 112, so that the time series of the hit rate of each of the reference marks M1-M4 is stored. Data is stored.
 ここで、シークラインを用いた画像処理の一例を例示する。シークラインを用いた画像処理は、画像データに含まれる輝度データを利用して撮像対象のエッジ抽出を行うものである。シークラインを用いた画像処理では、シークライン上の輝度データのみを利用してエッジ抽出を行うことから、高速処理に優れている。なお、シークラインを用いた画像処理は、本特許出願人が既に出願して公開されている特開平8-180191号公報、特開2004-279304号公報、及び特開2006-114821号公報に開示される技術を適用することができる。 Here, an example of image processing using seek lines is illustrated. Image processing using seek lines is to perform edge extraction of an imaging target using luminance data included in image data. Image processing using seek lines is superior in high-speed processing because edge extraction is performed using only luminance data on the seek lines. Note that image processing using seek lines is disclosed in Japanese Patent Application Laid-Open No. 8-180191, Japanese Patent Application Laid-Open No. 2004-279304, and Japanese Patent Application Laid-Open No. 2006-114821 that have already been filed and published by the present applicant. Technology can be applied.
 図12に示されるように、基準マークM1-M4が円形模様の場合、基準マークM1-M4が存在すべき位置の近傍に複数のシークラインSLが予め設定されており、それぞれのシークラインSL上の複数の基準点の輝度データから輝度が急激に変化する基準点区間を算出し、基準マークM1-M4のエッジ抽出を行う。この例では、8本のシークラインSLを例示しているが、この例に限られない。複数のシークラインSLは、基準マークM1-M4の種類に応じて予めテンプレートとして用意されており、標準パラメータと言い換えることができる。 As shown in FIG. 12, when the reference marks M1-M4 have a circular pattern, a plurality of seek lines SL are preset in the vicinity of the position where the reference marks M1-M4 should exist, A reference point section in which the luminance changes abruptly is calculated from the luminance data of the plurality of reference points, and edge extraction of the reference marks M1-M4 is performed. In this example, eight seek lines SL are illustrated, but the present invention is not limited to this example. The plurality of seek lines SL are prepared in advance as templates in accordance with the types of the reference marks M1-M4, and can be referred to as standard parameters.
 ヒット率は、基準マークM1-M4の汚れ、破損等による劣化の影響を受ける。例えば、図13に示されるように、基準マークM1-M4の一部が欠落すると、その欠落箇所(ハッチングで示す)に対応するシークラインSLではエッジの抽出ができない。図13の例では、1つのシークラインSLにおいてエッジ抽出ができないので、ヒット率が7/8=87.5%と算出される。このように、基準マークM1-M4の汚れ、破損等による劣化が進むと、基準マークM1-M4のエッジ(特徴パラメータともいう)とシークラインSL(標準パラメータともいう)の類似度が低下し、ヒット率が低下する。 The hit rate is affected by deterioration due to dirt, breakage, etc. of the reference marks M1-M4. For example, as shown in FIG. 13, when a part of the reference marks M1-M4 is missing, the edge cannot be extracted on the seek line SL corresponding to the missing part (shown by hatching). In the example of FIG. 13, since edge extraction cannot be performed in one seek line SL, the hit rate is calculated as 7/8 = 87.5%. As described above, when the reference mark M1-M4 is further deteriorated due to dirt, breakage, etc., the similarity between the edge of the reference mark M1-M4 (also referred to as a characteristic parameter) and the seek line SL (also referred to as a standard parameter) decreases. Hit rate decreases.
 図14に示されるように、通常、時間経過に沿って基準マークM1-M4の劣化が進み、ヒット率も低下する。図15及び図16に示されるように、ヒット率の低下は、時間経過に沿って直線的なものに限らず、カーブを描くように低下する場合もある。なお、ここでの経過時間は、実装機1が稼働しているときの総時間、実装機1が稼働しているとき及び稼働していないときも含めた総時間、又はその他の基準マークM1-M4の劣化に対して因果関係のある総時間である。 As shown in FIG. 14, the deterioration of the reference marks M1-M4 usually progresses with time, and the hit rate also decreases. As shown in FIG. 15 and FIG. 16, the decrease in the hit rate is not limited to a linear one over time, but may decrease so as to draw a curve. The elapsed time here is the total time when the mounting machine 1 is operating, the total time including when the mounting machine 1 is operating or not operating, or other reference mark M1- This is the total time that is causally related to the degradation of M4.
 図14~図16に示されるように、ヒット率がエラー閾値(識別限界値)よりも低くなると、判断装置113は、基準マークM1-M4の識別が不能と判断する。制御装置110は、ヒット率が基準マークM1-M4の劣化によってエラー閾値よりも低くなると、実装機1の作業を強制的に停止する。 As shown in FIG. 14 to FIG. 16, when the hit rate is lower than the error threshold (identification limit value), the determination device 113 determines that the reference marks M1-M4 cannot be identified. When the hit rate becomes lower than the error threshold due to the deterioration of the reference marks M1-M4, the control device 110 forcibly stops the operation of the mounting machine 1.
 判断装置113は、計算されたヒット率に基づいて、基準マークM1-M4のメンテナンスが必要であるか否かを判断する。図14~図16に示されるように、判断装置113は、ヒット率がメンテナンス閾値を下回ったか否かを判断する。メンテナンス閾値は、基準マークM1-M4の識別が不能となるヒット率のエラー閾値よりも大きい値に設定されている。すなわち、判断装置113は、基準マークM1-M4の識別が可能な範囲であっても、基準マークM1-M4の劣化が進んでいる場合に基準マークM1-M4のメンテナンスが必要であると判断する。制御装置110は、判断装置113が基準マークM1-M4のメンテナンスが必要であると判断すると、信号出力装置114からメンテナンス要求信号を出力させ、入出力装置6(図1参照)において基準マークM1-M4のメンテナンスが必要であることを報知する。なお、入出力装置6で表示される内容は、どの基準マークM1-M4の修正が必要であるかが特定可能である。また、後述するように、基準マークM1-M4のヒット率低下の原因が基準マークM1-M4の劣化ではなく、他の構成要素の劣化である場合、制御装置110は、その構成要素のメンテナンスが必要であることを入出力装置6において報知させる。 The determination device 113 determines whether or not the reference marks M1 to M4 need to be maintained based on the calculated hit rate. As shown in FIGS. 14 to 16, the determination device 113 determines whether or not the hit rate has fallen below the maintenance threshold. The maintenance threshold value is set to a value larger than the error threshold value of the hit rate at which the reference marks M1 to M4 cannot be identified. That is, the determination device 113 determines that the maintenance of the reference mark M1-M4 is necessary when the deterioration of the reference mark M1-M4 is progressing, even if the reference mark M1-M4 can be identified. . When the determination device 113 determines that the maintenance of the reference marks M1-M4 is necessary, the control device 110 outputs a maintenance request signal from the signal output device 114, and the input / output device 6 (see FIG. 1) uses the reference mark M1- Notify that M4 maintenance is required. The contents displayed on the input / output device 6 can specify which reference mark M1-M4 needs to be corrected. As will be described later, when the cause of the decrease in the hit rate of the reference mark M1-M4 is not the deterioration of the reference mark M1-M4 but the deterioration of other components, the control device 110 performs maintenance of the components. The input / output device 6 notifies that it is necessary.
 次に、図17を参照し、基準マークM1-M4の認識プログラムのフローを説明する。以下では、基板搬送装置40の可動ガイドレール41bの上面に記された基準マークM3(図7参照)を例に説明する。 Next, the flow of the recognition program for the reference marks M1-M4 will be described with reference to FIG. Hereinafter, the reference mark M3 (see FIG. 7) written on the upper surface of the movable guide rail 41b of the substrate transport apparatus 40 will be described as an example.
 ステップS1では、可動ガイドレール41bの上面に記された基準マークM3をマークカメラ71が撮像する。撮像された基準マークM3の画像データは制御装置110に送信され、必要に応じて、ノイズ除去等の前処理が行われる。 In step S1, the mark camera 71 images the reference mark M3 written on the upper surface of the movable guide rail 41b. The image data of the captured reference mark M3 is transmitted to the control device 110, and preprocessing such as noise removal is performed as necessary.
 ステップS2では、特徴パラメータ作成装置111が、読み取られた基準マークM3の画像データのエッジを抽出し、特徴パラメータを作成する。 In step S2, the feature parameter creation device 111 extracts the edge of the read image data of the reference mark M3 and creates a feature parameter.
 ステップS3では、特徴パラメータとその標準パラメータをマッチングし、ヒット率を計算する。ここで、上記したシークラインを用いた画像処理では、ステップS2とステップS3が同時に行われる。すなわち、制御装置110は、第1メモリ121に記憶されている基準マークM3に対応した複数のシークライン(標準パラメータ)を読み出し、基準マークM3のエッジ(特徴パラメータ)を抽出するとともに、ヒット率も計算する。 In step S3, the feature parameter and its standard parameter are matched and the hit rate is calculated. Here, in the image processing using the above-described seek line, step S2 and step S3 are performed simultaneously. That is, the control device 110 reads a plurality of seek lines (standard parameters) corresponding to the reference mark M3 stored in the first memory 121, extracts the edge (feature parameter) of the reference mark M3, and also has a hit rate. calculate.
 ステップS4では、判断装置113において、計算されたヒット率が、エラー閾値(図4~図16参照)を上回るか否かが判断される。ヒット率がエラー閾値を上回れば、マークの識別が成功したと判断され、ステップS5に進む。このときのヒット率は、入出力装置6で表示されるとともに、第2メモリ122に記憶される。ヒット率がエラー閾値を上回らなかった場合、基準マークM3の劣化が識別不能にまで進んでいる又は他の原因が存在すると判断される。制御装置110は、実装機1を強制的に停止する。 In step S4, the determination device 113 determines whether or not the calculated hit rate exceeds an error threshold (see FIGS. 4 to 16). If the hit rate exceeds the error threshold, it is determined that the mark has been successfully identified, and the process proceeds to step S5. The hit rate at this time is displayed on the input / output device 6 and stored in the second memory 122. If the hit rate does not exceed the error threshold, it is determined that the deterioration of the reference mark M3 has progressed to the point where it cannot be identified or that there is another cause. The control device 110 forcibly stops the mounting machine 1.
 ステップS5では、判断装置113において、識別された基準マークM3のヒット率がメンテナンス閾値(図14~図16参照)を下回るか否かが判断される。ヒット率がメンテナンス閾値を下回れば、基準マークM3の劣化がメンテナンスの必要な範囲にまで進んでいる又は他の原因があると判断され、ステップS6に進む。ヒット率がメンテナンス閾値を下回らなかった場合、ステップS7に進む。 In step S5, the determination device 113 determines whether or not the hit rate of the identified reference mark M3 is below the maintenance threshold (see FIGS. 14 to 16). If the hit rate falls below the maintenance threshold value, it is determined that the deterioration of the reference mark M3 has progressed to a range where maintenance is necessary or that there is another cause, and the process proceeds to step S6. If the hit rate does not fall below the maintenance threshold, the process proceeds to step S7.
 ステップS6では、判断装置113において、第2メモリ122に記憶されているヒット率の時系列データが読み出され、ヒット率の時系列データから変化率を計算し、その変化率が異常値を上回るか否かが判断される。ここで、変化率は、ヒット率が所定時間で低下した値として計算される。例えば、図18に示されるように、現在の時間がt2であり、ヒット率がh2の場合、過去の時間t1のヒット率h1を読み出し、所定時間(t1とt2の間)でヒット率の低下量(h1とh2の差)が異常値を越えたか否かが判断される。ヒット率の変化率が異常値を上回った場合、通常とは異なる現象が生じたと推測される。このため、判断装置113は、ステップS7に進み、その原因を分析する。ヒット率の変化率が異常値を上回らない場合、基準マークM3の認識プログラムが終了し、実装機1の作業が継続される。 In step S6, the determination device 113 reads the time-series data of the hit rate stored in the second memory 122, calculates the change rate from the time-series data of the hit rate, and the change rate exceeds the abnormal value. It is determined whether or not. Here, the rate of change is calculated as a value in which the hit rate has decreased in a predetermined time. For example, as shown in FIG. 18, when the current time is t2 and the hit rate is h2, the hit rate h1 of the past time t1 is read, and the hit rate decreases in a predetermined time (between t1 and t2). It is determined whether or not the amount (difference between h1 and h2) exceeds an abnormal value. When the rate of change in the hit rate exceeds the abnormal value, it is estimated that a phenomenon different from normal has occurred. For this reason, the determination apparatus 113 proceeds to step S7 and analyzes the cause. If the change rate of the hit rate does not exceed the abnormal value, the recognition program for the reference mark M3 is terminated, and the operation of the mounting machine 1 is continued.
 ステップS7では、判断装置113において、ヒット率低下の原因が分析され、ヒット率低下の原因が特定される。ヒット率低下の原因が特定されると、信号出力装置114がメンテナンス要求信号を出力し、その原因のメンテナンスが必要であることを判別できるように入出力装置6で報知される。 In step S7, the determination device 113 analyzes the cause of the decrease in the hit rate and identifies the cause of the decrease in the hit rate. When the cause of the decrease in the hit rate is specified, the signal output device 114 outputs a maintenance request signal, and the input / output device 6 is notified so that it can be determined that the cause maintenance is necessary.
 ここで、図19を参照し、ステップS7におけるヒット率の低下原因を分析するためのプログラムの一例を説明する。この例では、光源の照度に原因があるか否かを検討する。 Here, with reference to FIG. 19, an example of a program for analyzing the cause of the decrease in the hit rate in step S7 will be described. In this example, it is examined whether there is a cause in the illuminance of the light source.
 ステップS11において、光源の照度が測定される。ステップS12において、光源の照度が照度閾値を下回るか否かが判断される。光源の照度が照度閾値を下回れば、ヒット率が低下した原因が光源の照度の低下であると判断される。制御装置110は、信号出力装置114から光源メンテナンス要求信号を出力させ、入出力装置6(図1参照)において光源の照度に関してメンテナンスが必要であることを報知する。光源の照度が照度閾値を下回らなければ、基準マークM3に原因があると判断され、ステップS13に進む。 In step S11, the illuminance of the light source is measured. In step S12, it is determined whether the illuminance of the light source is below the illuminance threshold. If the illuminance of the light source falls below the illuminance threshold, it is determined that the cause of the decrease in the hit rate is a decrease in the illuminance of the light source. The control device 110 outputs a light source maintenance request signal from the signal output device 114, and notifies the input / output device 6 (see FIG. 1) that maintenance is necessary regarding the illuminance of the light source. If the illuminance of the light source does not fall below the illuminance threshold, it is determined that there is a cause in the reference mark M3, and the process proceeds to step S13.
 ステップS13では、判断装置113において、基準マークM3のメンテナンスが必要であると判断された可動ガイドレール41bと同一グループに属する他の構成部品が存在するか否かが判断される。ここで、複数の構成部品は、基準マークM1-M4の劣化速度に応じて複数のグループに分けられている。例えば、使用頻度が同程度のものは同一のグループに属していてもよい。実装機1では、基板搬送装置40が第1搬送装置41と第2搬送装置41を2列並設したダブルコンベアタイプである。このため、第1搬送装置41と第2搬送装置42は同一グループに属しており、一方の搬送装置の基準マークM3のメンテナンスが必要であるときは、他方の搬送装置の基準マークのメンテナンスも必要である。このように、第1搬送装置41の可動ガイドレール41bの基準マークM3の例では、ステップS14において、同一グループに属する第2搬送装置42の可動ガイドレールの情報を抽出するとともに、それらの双方のメンテナンスが必要であることを入出力装置6で表示する。なお、基準マークの修正が必要であると判断された構成要素と同一グループに属する他の構成部品が存在しない場合、基準マークの修正が必要であると判断された構成要素の情報のみを入出力装置6で表示する。 In step S13, the determination device 113 determines whether there is another component that belongs to the same group as the movable guide rail 41b that is determined to require maintenance of the reference mark M3. Here, the plurality of components are divided into a plurality of groups according to the deterioration rate of the reference marks M1-M4. For example, those with the same usage frequency may belong to the same group. In the mounting machine 1, the substrate transfer device 40 is a double conveyor type in which the first transfer device 41 and the second transfer device 41 are arranged in two rows. For this reason, the 1st conveyance apparatus 41 and the 2nd conveyance apparatus 42 belong to the same group, and when the maintenance of the reference mark M3 of one conveyance apparatus is required, the maintenance of the reference mark of the other conveyance apparatus is also necessary. It is. Thus, in the example of the reference mark M3 of the movable guide rail 41b of the first transport device 41, in step S14, information on the movable guide rail of the second transport device 42 belonging to the same group is extracted, and both of them are extracted. The input / output device 6 displays that maintenance is necessary. If there is no other component that belongs to the same group as the component that is determined to require correction of the fiducial mark, only the information of the component that is determined to require correction of the fiducial mark is input / output. Displayed on the device 6.
 上記したマークの認識プログラムによれば、基準マークM1-M4がエラー閾値に達して実装機1が強制的に停止される前に、劣化した基準マークM1-M4のメンテナンス指示が入出力装置6で報知される。このため、実装機1の非稼働期間のときに、メンテナンス指示が表示された基準マークM1-M4をメンテナンスすることができる。このように、基準マークM1-M4の識別が不能となる前に基準マークM1-M4をメンテナンスしておくことで、実装機1が強制的に停止となる事態が避けられ、生産計画に沿った円滑な生産が可能となる。 According to the above-described mark recognition program, before the reference mark M1-M4 reaches the error threshold and the mounting machine 1 is forcibly stopped, the maintenance instruction for the deteriorated reference mark M1-M4 is given by the input / output device 6. Informed. Therefore, it is possible to maintain the reference marks M1-M4 on which the maintenance instruction is displayed during the non-operating period of the mounting machine 1. In this way, by maintaining the reference marks M1-M4 before the identification of the reference marks M1-M4 becomes impossible, a situation where the mounting machine 1 is forcibly stopped can be avoided, and the production plan is met. Smooth production becomes possible.
 また、制御装置110は、ヒット率の時系列データに基づいて、ヒット率がメンテナンス閾値及び/又はエラー閾値を下回る予測時期を計算し、その予測時期を入出力装置6で表示してもよい。このような予測時期は、合理的な生産計画の立案に有用である。さらに、制御装置110は、そのような予測時期を実装機1の稼働期間と非稼働期間を記述する生産計画データと比較し、予測時期が稼働期間に含まれるときに、その稼働期間より前の非稼働期間にメンテナンスの実施時期を計画し、入出力装置6で表示してもよい。より合理的な生産計画の立案に有用である。 Further, the control device 110 may calculate a prediction time when the hit rate falls below the maintenance threshold and / or the error threshold based on the time-series data of the hit rate, and display the prediction time on the input / output device 6. Such a forecast time is useful for making a reasonable production plan. Furthermore, the control device 110 compares such a predicted time with production plan data describing the operating period and the non-operating period of the mounting machine 1, and when the predicted time is included in the operating period, The maintenance time may be planned during the non-operation period and displayed on the input / output device 6. It is useful for planning a more rational production plan.
 なお、図15及び図16のように、ヒット率がカーブを描くように低下する場合、判断装置113は、ヒット率がメンテナンス閾値を下回ったか否かの判断をヒット率の変化率から間接的に判断してもよい。 15 and 16, when the hit rate decreases so as to draw a curve, the determination device 113 indirectly determines whether or not the hit rate has fallen below the maintenance threshold from the change rate of the hit rate. You may judge.
 以上、本技術の具体例を詳細に説明したが、これらは例示にすぎず、請求の範囲を限定するものではない。請求の範囲に記載の技術には、以上に例示した具体例を様々に変形、変更したものが含まれる。本明細書または図面に説明した技術要素は、単独であるいは各種の組み合わせによって技術的有用性を発揮するものであり、出願時の請求項に記載の組み合わせに限定されるものではない。また、本明細書または図面に例示した技術は複数目的を同時に達成するものであり、そのうちの一つの目的を達成すること自体で技術的有用性を持つものである。 As mentioned above, although the specific example of this technique was demonstrated in detail, these are only illustrations and do not limit a claim. The technology described in the claims includes various modifications and changes of the specific examples illustrated above. The technical elements described in this specification or the drawings exhibit technical usefulness alone or in various combinations, and are not limited to the combinations described in the claims at the time of filing. In addition, the technology illustrated in the present specification or the drawings achieves a plurality of objects at the same time, and has technical utility by achieving one of the objects.
10:部品供給装置
20:パーツ撮像装置
30:ノズルストッカ
40:基板搬送装置
50:部品移載装置
70:マーク撮像装置
100:画像処理部
110:制御装置
111:特徴パラメータ作成装置
112:ヒット率計算装置
113:判断装置
114:信号出力装置
120:メモリ
121:第1メモリ
122:第2メモリ
10: Parts supply device 20: Parts imaging device 30: Nozzle stocker 40: Board transfer device 50: Component transfer device 70: Mark imaging device 100: Image processing unit 110: Control device 111: Feature parameter creation device 112: Hit rate calculation Device 113: Determination device 114: Signal output device 120: Memory 121: First memory 122: Second memory

Claims (15)

  1.  基板作業機用の認識装置であって、
     対象を読み取る読取装置と、
     読み取られた前記対象から特徴パラメータを作成する特徴パラメータ作成装置と、
     前記特徴パラメータに関する標準パラメータを記憶している第1メモリと、
     前記特徴パラメータと前記標準パラメータの相関を示すヒット率に基づいてメンテナンス要求信号を出力する信号出力装置と、を備えており、
     前記信号出力装置は、前記ヒット率がエラー閾値に達していない段階で、前記エラー閾値とは異なるメンテナンス閾値に達したときに前記メンテナンス要求信号を出力する認識装置。
    A recognition device for a substrate working machine,
    A reading device for reading an object;
    A feature parameter creation device for creating a feature parameter from the read target;
    A first memory storing standard parameters relating to the characteristic parameters;
    A signal output device that outputs a maintenance request signal based on a hit rate indicating a correlation between the characteristic parameter and the standard parameter,
    The signal output device is a recognition device that outputs the maintenance request signal when the hit rate has not reached the error threshold and reaches a maintenance threshold different from the error threshold.
  2.  前記ヒット率の時系列データを記憶する第2メモリをさらに備えている請求項1に記載の認識装置。 The recognition device according to claim 1, further comprising a second memory for storing time-series data of the hit rate.
  3.  前記信号出力装置は、前記ヒット率の変化率が異常値を上回ったときにも、前記メンテナンス要求信号を出力する請求項2に記載の認識装置。 The recognition device according to claim 2, wherein the signal output device outputs the maintenance request signal even when a change rate of the hit rate exceeds an abnormal value.
  4.  前記信号出力装置は、一の前記対象の前記ヒット率が前記メンテナンス閾値に達したときに、他の前記対象のヒット率を参照して前記メンテナンス要求信号を出力する請求項2又は3に記載の認識装置。 4. The signal output device according to claim 2, wherein when the hit rate of one target reaches the maintenance threshold, the signal output device outputs the maintenance request signal with reference to the hit rate of another target. Recognition device.
  5.  前記読取装置は、撮像装置である請求項1~4のいずれか一項に記載の認識装置。 The recognition device according to any one of claims 1 to 4, wherein the reading device is an imaging device.
  6.  前記撮像装置は、前記対象を照射する光源と、前記対象に照射される照度を測定する測定装置と、を有しており、
     前記信号出力装置は、前記ヒット率が前記メンテナンス閾値に達し、且つ、前記照度が照度閾値に達しているときに、光源メンテナンス要求信号を含む前記メンテナンス要求信号を出力する請求項5に記載の認識装置。
    The imaging apparatus includes a light source that irradiates the target, and a measuring device that measures the illuminance irradiated to the target.
    The recognition according to claim 5, wherein the signal output device outputs the maintenance request signal including a light source maintenance request signal when the hit rate reaches the maintenance threshold and the illuminance reaches an illuminance threshold. apparatus.
  7.  前記基板作業機が、回路基板に電子部品を実装する実装機であり、
     前記撮像装置は、前記実装機を構成する構成部品に印されている第1マークと電子部品が実装される回路基板に印されている第2マークを撮像するマークカメラを有しており、
     前記メンテナンス閾値は、前記第1マーク用の第1メンテナンス閾値と前記第2マーク用の第2メンテナンス閾値を含み、
     前記信号出力装置は、
      前記第1マークの前記ヒット率が前記第1メンテナンス閾値に達したときに、第1要求信号を含む前記メンテナンス要求信号を出力し、
      前記第2マークの前記ヒット率が前記第2メンテナンス閾値に達したときに、第2要求信号を含む前記メンテナンス要求信号を出力する請求項5又は6に記載の認識装置。
    The board working machine is a mounting machine for mounting electronic components on a circuit board,
    The imaging apparatus includes a mark camera that images a first mark marked on a component part constituting the mounting machine and a second mark marked on a circuit board on which an electronic component is mounted,
    The maintenance threshold includes a first maintenance threshold for the first mark and a second maintenance threshold for the second mark,
    The signal output device is:
    When the hit rate of the first mark reaches the first maintenance threshold, the maintenance request signal including a first request signal is output;
    The recognition apparatus according to claim 5 or 6, wherein when the hit rate of the second mark reaches the second maintenance threshold, the maintenance request signal including a second request signal is output.
  8.  前記第1マークが複数の構成部品に印されており、
     前記複数の構成部品が複数のグループに分けられており、
     前記信号出力装置は、一の前記構成部品に印された前記第1マークの前記ヒット率が前記第1メンテナンス閾値に達したときに、同一グループに属する他の前記構成部品の情報を含む前記メンテナンス要求信号を出力する請求項7に記載の認識装置。
    The first mark is marked on a plurality of components;
    The plurality of components are divided into a plurality of groups;
    The signal output device includes information on other component parts belonging to the same group when the hit ratio of the first mark marked on one component part reaches the first maintenance threshold. The recognition device according to claim 7 which outputs a request signal.
  9.  前記基板作業機が、回路基板に電子部品を実装する実装機であり、
     前記撮像装置は、前記電子部品を撮像するパーツカメラを有する請求項5又は6に記載の認識装置。
    The board working machine is a mounting machine for mounting electronic components on a circuit board,
    The recognition apparatus according to claim 5, wherein the imaging apparatus includes a parts camera that images the electronic component.
  10.  前記パーツカメラは、前記電子部品を撮像するときの撮像視野内に存在する前記構成部品に印されている第1マークも撮像しており、
     前記メンテナンス閾値は、前記電子部品用の第3メンテナンス閾値と前記第1マーク用の第1メンテナンス閾値を含み、
     前記信号出力装置は、
      前記電子部品の前記ヒット率が前記第3メンテナンス閾値に達したときに、第3要求信号を含む前記メンテナンス要求信号を出力し、
      前記第1マークの前記ヒット率が前記第1メンテナンス閾値に達したときに、第1要求信号を含む前記メンテナンス要求信号を出力する請求項9に記載の認識装置。
    The parts camera is also imaging a first mark marked on the component existing in the imaging field when imaging the electronic component,
    The maintenance threshold includes a third maintenance threshold for the electronic component and a first maintenance threshold for the first mark,
    The signal output device is:
    When the hit rate of the electronic component reaches the third maintenance threshold, the maintenance request signal including a third request signal is output,
    The recognition apparatus according to claim 9, wherein the maintenance request signal including a first request signal is output when the hit rate of the first mark reaches the first maintenance threshold.
  11.  前記電子部品の前記ヒット率に基づいて、前記電子部品の前記標準パラメータの修正要求信号を出力する修正要求信号出力装置をさらに備える請求項9又は10に記載の認識装置。 The recognition apparatus according to claim 9 or 10, further comprising a correction request signal output device that outputs a correction request signal of the standard parameter of the electronic component based on the hit rate of the electronic component.
  12.  請求項1に記載の少なくとも1つの認識装置と、
     前記少なくとも1つの認識装置で得られたヒット率の時系列データを記憶する第3メモリと、を備える管理システム。
    At least one recognition device according to claim 1;
    And a third memory for storing time-series data of hit rates obtained by the at least one recognition device.
  13.  前記第3メモリは、基板作業機、ノズル洗浄機、ノズル検査機、フィーダーメンテナンスユニットのうちの少なくとも2つに設けられている前記認識装置から集められたヒット率の時系列データを記憶する請求項12に記載の管理システム。 The said 3rd memory memorize | stores the time series data of the hit rate collected from the said recognition apparatus provided in at least 2 of a substrate working machine, a nozzle cleaning machine, a nozzle tester, and a feeder maintenance unit. 12. The management system according to 12.
  14.  前記第3メモリに記憶されている前記ヒット率の時系列データに基づいて、前記ヒット率が前記メンテナンス閾値と前記エラー閾値の少なくともいずれか一方に達する時期を予測する予測装置と、を備える請求項12又は13に記載の管理システム。 A prediction device that predicts when the hit rate reaches at least one of the maintenance threshold and the error threshold based on the time-series data of the hit rate stored in the third memory. The management system according to 12 or 13.
  15.  前記基板作業機の稼働期間と非稼働期間を記述する生産計画データを記憶している第4メモリと、
     前記予測装置によって予測された予測時期と第4メモリに記憶されている生産計画データに基づいて、メンテナンス計画データを作成する計画装置と、をさらに備えており、
     前記計画装置は、前記予測時期が前記稼働期間に含まれるときに、その稼働期間より前の非稼働期間にメンテナンスの実施時期を計画する請求項14に記載の管理システム。
    A fourth memory storing production plan data describing the operation period and non-operation period of the substrate work machine;
    A planning device for creating maintenance plan data based on the prediction time predicted by the prediction device and the production plan data stored in the fourth memory;
    The management system according to claim 14, wherein when the predicted time is included in the operation period, the planning device plans a maintenance execution time in a non-operation period before the operation period.
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